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AU2001270952A1 - Probe, systems and methods for integrated circuit board testing - Google Patents

Probe, systems and methods for integrated circuit board testing

Info

Publication number
AU2001270952A1
AU2001270952A1 AU2001270952A AU7095201A AU2001270952A1 AU 2001270952 A1 AU2001270952 A1 AU 2001270952A1 AU 2001270952 A AU2001270952 A AU 2001270952A AU 7095201 A AU7095201 A AU 7095201A AU 2001270952 A1 AU2001270952 A1 AU 2001270952A1
Authority
AU
Australia
Prior art keywords
probe
systems
methods
circuit board
integrated circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
AU2001270952A
Inventor
Meir Dror
Ilan Makmel
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
TESTSHIP AUTOMATIC TEST SOLUTI
Testship Automatic Test Solutions Ltd
Original Assignee
TESTSHIP AUTOMATIC TEST SOLUTI
Testship Automatic Test Solutions Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by TESTSHIP AUTOMATIC TEST SOLUTI, Testship Automatic Test Solutions Ltd filed Critical TESTSHIP AUTOMATIC TEST SOLUTI
Publication of AU2001270952A1 publication Critical patent/AU2001270952A1/en
Abandoned legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07364—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/60—Specific applications or type of materials
    • G01N2223/611—Specific applications or type of materials patterned objects; electronic devices
    • G01N2223/6113—Specific applications or type of materials patterned objects; electronic devices printed circuit board [PCB]

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
AU2001270952A 2000-06-30 2001-06-29 Probe, systems and methods for integrated circuit board testing Abandoned AU2001270952A1 (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US21566800P 2000-06-30 2000-06-30
US60215668 2000-06-30
PCT/IL2001/000602 WO2002003045A2 (en) 2000-06-30 2001-06-29 Probe, systems and methods for integrated circuit board testing

Publications (1)

Publication Number Publication Date
AU2001270952A1 true AU2001270952A1 (en) 2002-01-14

Family

ID=22803889

Family Applications (1)

Application Number Title Priority Date Filing Date
AU2001270952A Abandoned AU2001270952A1 (en) 2000-06-30 2001-06-29 Probe, systems and methods for integrated circuit board testing

Country Status (2)

Country Link
AU (1) AU2001270952A1 (en)
WO (1) WO2002003045A2 (en)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2005036148A1 (en) * 2003-10-14 2005-04-21 Mirtec Co., Ltd. Printed circuit board inspection system combining x-ray inspection and visual inspection
FR2944894B1 (en) * 2009-04-22 2012-03-23 Regie Autonome Transports SYSTEM AND METHOD FOR CONDUCTING AUTOMATED TESTS
TWI497092B (en) * 2013-12-05 2015-08-21 Inventec Corp Detection script reading system for circuit board and method thereof
JP6535755B2 (en) * 2015-04-15 2019-06-26 エクスロン インターナショナル ゲゼルシャフト ミット ベシュレンクテル ハフツングＹｘｌｏｎ Ｉｎｔｅｒｎａｔｉｏｎａｌ Ｇｍｂｈ How to test electronic components
CN109769389A (en) * 2019-01-23 2019-05-17 浙江灵杰智控科技有限公司 One kind being based on the surface-pasted controller production technology of tin cream
US11125807B2 (en) * 2019-11-07 2021-09-21 Kuan-Hung Chen Support fixture and probe station having the same
CN118425744B (en) * 2024-07-04 2024-09-10 成都云绎智创科技有限公司 Slide testing method, slide testing device, slide testing equipment, slide testing storage medium and slide testing program product

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4476433A (en) * 1982-09-07 1984-10-09 Logan John K Electronic test fixture
US4544889A (en) * 1983-09-12 1985-10-01 International Business Machines Corporation Robot precision probe positioner with guidance optics
US5039938A (en) * 1990-06-21 1991-08-13 Hughes Aircraft Company Phosphor glow testing of hybrid substrates
US5469064A (en) * 1992-01-14 1995-11-21 Hewlett-Packard Company Electrical assembly testing using robotic positioning of probes
US5394100A (en) * 1993-05-06 1995-02-28 Karl Suss America, Incorporated Probe system with automatic control of contact pressure and probe alignment
KR0176627B1 (en) * 1995-12-30 1999-05-15 김광호 Probe device for conducting inspection of printed circuit boards

Also Published As

Publication number Publication date
WO2002003045A2 (en) 2002-01-10
WO2002003045A3 (en) 2002-04-25

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