AU2001241479A1 - Method and apparatus for depositing films - Google Patents
Method and apparatus for depositing filmsInfo
- Publication number
- AU2001241479A1 AU2001241479A1 AU2001241479A AU4147901A AU2001241479A1 AU 2001241479 A1 AU2001241479 A1 AU 2001241479A1 AU 2001241479 A AU2001241479 A AU 2001241479A AU 4147901 A AU4147901 A AU 4147901A AU 2001241479 A1 AU2001241479 A1 AU 2001241479A1
- Authority
- AU
- Australia
- Prior art keywords
- depositing films
- depositing
- films
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Abandoned
Links
- 238000000151 deposition Methods 0.000 title 1
- 238000000034 method Methods 0.000 title 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32009—Arrangements for generation of plasma specially adapted for examination or treatment of objects, e.g. plasma sources
- H01J37/32082—Radio frequency generated discharge
- H01J37/321—Radio frequency generated discharge the radio frequency energy being inductively coupled to the plasma
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/34—Sputtering
- C23C14/3407—Cathode assembly for sputtering apparatus, e.g. Target
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/34—Sputtering
- C23C14/3435—Applying energy to the substrate during sputtering
- C23C14/345—Applying energy to the substrate during sputtering using substrate bias
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/34—Sputtering
- C23C14/35—Sputtering by application of a magnetic field, e.g. magnetron sputtering
- C23C14/354—Introduction of auxiliary energy into the plasma
- C23C14/358—Inductive energy
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/34—Gas-filled discharge tubes operating with cathodic sputtering
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Plasma & Fusion (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Analytical Chemistry (AREA)
- Physical Vapour Deposition (AREA)
- Physical Deposition Of Substances That Are Components Of Semiconductor Devices (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US18506800P | 2000-02-25 | 2000-02-25 | |
| US60185068 | 2000-02-25 | ||
| PCT/US2001/004563 WO2001063000A2 (fr) | 2000-02-25 | 2001-02-14 | Procede et appareil permettant le depot de films |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| AU2001241479A1 true AU2001241479A1 (en) | 2001-09-03 |
Family
ID=22679439
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| AU2001241479A Abandoned AU2001241479A1 (en) | 2000-02-25 | 2001-02-14 | Method and apparatus for depositing films |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US6758948B2 (fr) |
| AU (1) | AU2001241479A1 (fr) |
| TW (1) | TW584905B (fr) |
| WO (1) | WO2001063000A2 (fr) |
Families Citing this family (75)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6530342B1 (en) * | 1998-12-30 | 2003-03-11 | Tokyo Electron Limited | Large area plasma source |
| US7469558B2 (en) * | 2001-07-10 | 2008-12-30 | Springworks, Llc | As-deposited planar optical waveguides with low scattering loss and methods for their manufacture |
| US7404877B2 (en) * | 2001-11-09 | 2008-07-29 | Springworks, Llc | Low temperature zirconia based thermal barrier layer by PVD |
| US20030175142A1 (en) * | 2002-03-16 | 2003-09-18 | Vassiliki Milonopoulou | Rare-earth pre-alloyed PVD targets for dielectric planar applications |
| US6884327B2 (en) * | 2002-03-16 | 2005-04-26 | Tao Pan | Mode size converter for a planar waveguide |
| US7378356B2 (en) * | 2002-03-16 | 2008-05-27 | Springworks, Llc | Biased pulse DC reactive sputtering of oxide films |
| US8431264B2 (en) | 2002-08-09 | 2013-04-30 | Infinite Power Solutions, Inc. | Hybrid thin-film battery |
| US9793523B2 (en) | 2002-08-09 | 2017-10-17 | Sapurast Research Llc | Electrochemical apparatus with barrier layer protected substrate |
| US8021778B2 (en) | 2002-08-09 | 2011-09-20 | Infinite Power Solutions, Inc. | Electrochemical apparatus with barrier layer protected substrate |
| US8236443B2 (en) | 2002-08-09 | 2012-08-07 | Infinite Power Solutions, Inc. | Metal film encapsulation |
| US8394522B2 (en) | 2002-08-09 | 2013-03-12 | Infinite Power Solutions, Inc. | Robust metal film encapsulation |
| US8445130B2 (en) | 2002-08-09 | 2013-05-21 | Infinite Power Solutions, Inc. | Hybrid thin-film battery |
| US8404376B2 (en) | 2002-08-09 | 2013-03-26 | Infinite Power Solutions, Inc. | Metal film encapsulation |
| US20070264564A1 (en) | 2006-03-16 | 2007-11-15 | Infinite Power Solutions, Inc. | Thin film battery on an integrated circuit or circuit board and method thereof |
| US7826702B2 (en) * | 2002-08-27 | 2010-11-02 | Springworks, Llc | Optically coupling into highly uniform waveguides |
| US7088046B2 (en) * | 2002-09-30 | 2006-08-08 | Tokyo Electron Limited | Integrated process tube and electrostatic shield, assembly thereof and manufacture thereof |
| EP1597408B1 (fr) | 2003-02-27 | 2012-12-05 | Symmorphix, Inc. | Methode de fabrication de films en couches barrieres dielectriques |
| US8728285B2 (en) * | 2003-05-23 | 2014-05-20 | Demaray, Llc | Transparent conductive oxides |
| US7238628B2 (en) * | 2003-05-23 | 2007-07-03 | Symmorphix, Inc. | Energy conversion and storage films and devices by physical vapor deposition of titanium and titanium oxides and sub-oxides |
| US7049751B2 (en) * | 2003-07-16 | 2006-05-23 | Advanced Energy Industries, Inc | Termination of secondary frequencies in RF power delivery |
| US6888313B2 (en) * | 2003-07-16 | 2005-05-03 | Advanced Energy Industries, Inc. | Impedance matching network with termination of secondary RF frequencies |
| US7425093B2 (en) * | 2003-07-16 | 2008-09-16 | Cabot Corporation | Thermography test method and apparatus for bonding evaluation in sputtering targets |
| JP4796965B2 (ja) * | 2004-07-02 | 2011-10-19 | 株式会社アルバック | エッチング方法及び装置 |
| US7959769B2 (en) | 2004-12-08 | 2011-06-14 | Infinite Power Solutions, Inc. | Deposition of LiCoO2 |
| CN101931097B (zh) * | 2004-12-08 | 2012-11-21 | 希莫菲克斯公司 | LiCoO2的沉积 |
| KR20060073737A (ko) * | 2004-12-24 | 2006-06-29 | 삼성전자주식회사 | 플라즈마 장치 |
| US7588669B2 (en) * | 2005-07-20 | 2009-09-15 | Ascentool, Inc. | Single-process-chamber deposition system |
| US7534080B2 (en) * | 2005-08-26 | 2009-05-19 | Ascentool, Inc. | Vacuum processing and transfer system |
| US20070078398A1 (en) * | 2005-08-27 | 2007-04-05 | Dextradeur Alan J | Multi-branched anti-reflux valve |
| US7838133B2 (en) * | 2005-09-02 | 2010-11-23 | Springworks, Llc | Deposition of perovskite and other compound ceramic films for dielectric applications |
| US20070108041A1 (en) * | 2005-11-11 | 2007-05-17 | Guo George X | Magnetron source having increased usage life |
| US7638022B2 (en) * | 2006-02-27 | 2009-12-29 | Ascentool, Inc | Magnetron source for deposition on large substrates |
| US20080000768A1 (en) * | 2006-06-30 | 2008-01-03 | Stimson Bradley O | Electrically Coupled Target Panels |
| JP4864586B2 (ja) | 2006-08-01 | 2012-02-01 | 新明和工業株式会社 | 真空成膜装置および真空成膜方法 |
| US8062708B2 (en) | 2006-09-29 | 2011-11-22 | Infinite Power Solutions, Inc. | Masking of and material constraint for depositing battery layers on flexible substrates |
| US8197781B2 (en) | 2006-11-07 | 2012-06-12 | Infinite Power Solutions, Inc. | Sputtering target of Li3PO4 and method for producing same |
| US20080121620A1 (en) * | 2006-11-24 | 2008-05-29 | Guo G X | Processing chamber |
| US8236152B2 (en) * | 2006-11-24 | 2012-08-07 | Ascentool International Ltd. | Deposition system |
| US7789993B2 (en) * | 2007-02-02 | 2010-09-07 | Applied Materials, Inc. | Internal balanced coil for inductively coupled high density plasma processing chamber |
| US20080188090A1 (en) * | 2007-02-02 | 2008-08-07 | Applied Materials, Inc. | Internal balanced coil for inductively coupled high density plasma processing chamber |
| US7572647B2 (en) * | 2007-02-02 | 2009-08-11 | Applied Materials, Inc. | Internal balanced coil for inductively coupled high density plasma processing chamber |
| US8152975B2 (en) * | 2007-03-30 | 2012-04-10 | Ascentool International | Deposition system with improved material utilization |
| JP5551612B2 (ja) | 2007-12-21 | 2014-07-16 | インフィニット パワー ソリューションズ, インコーポレイテッド | 電解質膜のための標的をスパッタリングする方法 |
| US8268488B2 (en) | 2007-12-21 | 2012-09-18 | Infinite Power Solutions, Inc. | Thin film electrolyte for thin film batteries |
| KR101606183B1 (ko) | 2008-01-11 | 2016-03-25 | 사푸라스트 리써치 엘엘씨 | 박막 배터리 및 기타 소자를 위한 박막 캡슐화 |
| US8350519B2 (en) | 2008-04-02 | 2013-01-08 | Infinite Power Solutions, Inc | Passive over/under voltage control and protection for energy storage devices associated with energy harvesting |
| US20100012481A1 (en) * | 2008-07-21 | 2010-01-21 | Guo G X | Deposition system having improved material utilization |
| US8500962B2 (en) | 2008-07-21 | 2013-08-06 | Ascentool Inc | Deposition system and methods having improved material utilization |
| US8906523B2 (en) | 2008-08-11 | 2014-12-09 | Infinite Power Solutions, Inc. | Energy device with integral collector surface for electromagnetic energy harvesting and method thereof |
| KR20110065480A (ko) | 2008-08-28 | 2011-06-15 | 가부시키가이샤 이엠디 | 스퍼터링 박막형성장치 |
| WO2010030743A1 (fr) | 2008-09-12 | 2010-03-18 | Infinite Power Solutions, Inc. | Dispositif d'énergie ayant une surface conductrice intégrée pour une communication de données par l'intermédiaire d'une énergie électromagnétique et procédé associé |
| WO2010042594A1 (fr) | 2008-10-08 | 2010-04-15 | Infinite Power Solutions, Inc. | Module de capteurs sans fil alimenté par l’environnement |
| US8557088B2 (en) * | 2009-02-19 | 2013-10-15 | Fujifilm Corporation | Physical vapor deposition with phase shift |
| US8540851B2 (en) | 2009-02-19 | 2013-09-24 | Fujifilm Corporation | Physical vapor deposition with impedance matching network |
| CN102576828B (zh) | 2009-09-01 | 2016-04-20 | 萨普拉斯特研究有限责任公司 | 具有集成薄膜电池的印刷电路板 |
| US8642974B2 (en) | 2009-12-30 | 2014-02-04 | Fei Company | Encapsulation of electrodes in solid media for use in conjunction with fluid high voltage isolation |
| EP2341525B1 (fr) | 2009-12-30 | 2013-10-23 | FEI Company | Source de plasma pour système de faisceau à particules chargées |
| US8987678B2 (en) * | 2009-12-30 | 2015-03-24 | Fei Company | Encapsulation of electrodes in solid media |
| US20110300432A1 (en) | 2010-06-07 | 2011-12-08 | Snyder Shawn W | Rechargeable, High-Density Electrochemical Device |
| WO2012040986A1 (fr) * | 2010-09-27 | 2012-04-05 | 北京北方微电子基地设备工艺研究中心有限责任公司 | Appareil de traitement par plasma |
| US20120152727A1 (en) * | 2010-11-24 | 2012-06-21 | Applied Materials, Inc. | Alkali Metal Deposition System |
| US20130098871A1 (en) | 2011-10-19 | 2013-04-25 | Fei Company | Internal Split Faraday Shield for an Inductively Coupled Plasma Source |
| DE102011086111B4 (de) * | 2011-11-10 | 2016-03-17 | Fhr Anlagenbau Gmbh | Anordnung zur Einspeisung von HF-Strom für Rohrkathoden |
| US9269544B2 (en) | 2013-02-11 | 2016-02-23 | Colorado State University Research Foundation | System and method for treatment of biofilms |
| TWI495746B (zh) * | 2013-11-13 | 2015-08-11 | Mingdao University | 沉積系統 |
| WO2015178968A1 (fr) * | 2014-05-20 | 2015-11-26 | Seagate Technology Llc | Cible profilée pour pulvérisation cathodique |
| US9531167B2 (en) * | 2014-06-02 | 2016-12-27 | Nxp Usa, Inc. | Device and method for connecting an RF generator to a coaxial conductor |
| US9518555B2 (en) | 2014-12-04 | 2016-12-13 | Freescale Semiconductor, Inc. | Radiation devices |
| US9909207B1 (en) * | 2015-08-18 | 2018-03-06 | Cametoid Technologies, Inc. | Ion vapor deposition of aluminum on non-metallic materials |
| CN107369602B (zh) | 2016-05-12 | 2019-02-19 | 北京北方华创微电子装备有限公司 | 反应腔室及半导体加工设备 |
| US10954598B2 (en) * | 2017-02-28 | 2021-03-23 | George Xinsheng Guo | High throughput vacuum deposition sources and system |
| CN109989030A (zh) * | 2017-12-30 | 2019-07-09 | 魏永强 | 活动磁场电弧离子镀与高功率脉冲磁控溅射复合沉积方法 |
| US10867776B2 (en) * | 2018-05-09 | 2020-12-15 | Applied Materials, Inc. | Physical vapor deposition in-chamber electro-magnet |
| TWI829156B (zh) * | 2021-05-25 | 2024-01-11 | 大陸商北京屹唐半導體科技股份有限公司 | 電漿源陣列、電漿處理設備、電漿處理系統以及用於在電漿處理設備中加工工件的方法 |
| JP7417569B2 (ja) * | 2021-10-29 | 2024-01-18 | 株式会社Kokusai Electric | 基板処理装置、半導体装置の製造方法及びプログラム |
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4041353A (en) | 1971-09-07 | 1977-08-09 | Telic Corporation | Glow discharge method and apparatus |
| US3995187A (en) | 1971-09-07 | 1976-11-30 | Telic Corporation | Electrode type glow discharge apparatus |
| US3884793A (en) | 1971-09-07 | 1975-05-20 | Telic Corp | Electrode type glow discharge apparatus |
| US3878085A (en) | 1973-07-05 | 1975-04-15 | Sloan Technology Corp | Cathode sputtering apparatus |
| US4116794A (en) | 1974-12-23 | 1978-09-26 | Telic Corporation | Glow discharge method and apparatus |
| US4918031A (en) | 1988-12-28 | 1990-04-17 | American Telephone And Telegraph Company,At&T Bell Laboratories | Processes depending on plasma generation using a helical resonator |
| US5234529A (en) | 1991-10-10 | 1993-08-10 | Johnson Wayne L | Plasma generating apparatus employing capacitive shielding and process for using such apparatus |
| US5625526A (en) | 1993-06-01 | 1997-04-29 | Tokyo Electron Limited | Electrostatic chuck |
| US5688357A (en) | 1995-02-15 | 1997-11-18 | Applied Materials, Inc. | Automatic frequency tuning of an RF power source of an inductively coupled plasma reactor |
| US5763851A (en) | 1995-11-27 | 1998-06-09 | Applied Materials, Inc. | Slotted RF coil shield for plasma deposition system |
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| JP3846970B2 (ja) * | 1997-04-14 | 2006-11-15 | キヤノンアネルバ株式会社 | イオン化スパッタリング装置 |
| US5800688A (en) | 1997-04-21 | 1998-09-01 | Tokyo Electron Limited | Apparatus for ionized sputtering |
| ATE352123T1 (de) | 1997-09-17 | 2007-02-15 | Tokyo Electron Ltd | System und verfahren zur anpassung von elektrischen impedanzen |
| EP1030745A4 (fr) | 1997-11-14 | 2006-12-13 | Tokyo Electron Ltd | Source de plasma a frequence radioelectrique et a protection electrostatique, polarisable sur toutes ses faces et/ou a regulation de temperature |
| US5976327A (en) * | 1997-12-12 | 1999-11-02 | Applied Materials, Inc. | Step coverage and overhang improvement by pedestal bias voltage modulation |
| US6146508A (en) * | 1998-04-22 | 2000-11-14 | Applied Materials, Inc. | Sputtering method and apparatus with small diameter RF coil |
| WO2000003055A1 (fr) * | 1998-07-13 | 2000-01-20 | Tokyo Electron Arizona, Inc. | Ecran pour appareil de depot physique en phase vapeur ionisee |
| US6679981B1 (en) * | 2000-05-11 | 2004-01-20 | Applied Materials, Inc. | Inductive plasma loop enhancing magnetron sputtering |
| US6358376B1 (en) * | 2000-07-10 | 2002-03-19 | Applied Materials, Inc. | Biased shield in a magnetron sputter reactor |
-
2001
- 2001-02-06 TW TW090102530A patent/TW584905B/zh not_active IP Right Cessation
- 2001-02-14 AU AU2001241479A patent/AU2001241479A1/en not_active Abandoned
- 2001-02-14 WO PCT/US2001/004563 patent/WO2001063000A2/fr not_active Ceased
-
2002
- 2002-08-26 US US10/227,526 patent/US6758948B2/en not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| US20030042131A1 (en) | 2003-03-06 |
| US6758948B2 (en) | 2004-07-06 |
| WO2001063000A3 (fr) | 2002-01-10 |
| TW584905B (en) | 2004-04-21 |
| WO2001063000A2 (fr) | 2001-08-30 |
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