NL1036272A1 - Radiation source, lithographic apparatus and device manufacturing method. - Google Patents
Radiation source, lithographic apparatus and device manufacturing method. Download PDFInfo
- Publication number
- NL1036272A1 NL1036272A1 NL1036272A NL1036272A NL1036272A1 NL 1036272 A1 NL1036272 A1 NL 1036272A1 NL 1036272 A NL1036272 A NL 1036272A NL 1036272 A NL1036272 A NL 1036272A NL 1036272 A1 NL1036272 A1 NL 1036272A1
- Authority
- NL
- Netherlands
- Prior art keywords
- fuel
- electrode
- radiation source
- device manufacturing
- lithographic apparatus
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05G—X-RAY TECHNIQUE
- H05G2/00—Apparatus or processes specially adapted for producing X-rays, not involving X-ray tubes, e.g. involving generation of a plasma
- H05G2/001—Production of X-ray radiation generated from plasma
- H05G2/002—Supply of the plasma generating material
- H05G2/0023—Constructional details of the ejection system
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05G—X-RAY TECHNIQUE
- H05G2/00—Apparatus or processes specially adapted for producing X-rays, not involving X-ray tubes, e.g. involving generation of a plasma
- H05G2/001—Production of X-ray radiation generated from plasma
- H05G2/002—Supply of the plasma generating material
- H05G2/0027—Arrangements for controlling the supply; Arrangements for measurements
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70008—Production of exposure light, i.e. light sources
- G03F7/70033—Production of exposure light, i.e. light sources by plasma extreme ultraviolet [EUV] sources
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/027—Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34
- H01L21/0271—Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34 comprising organic layers
- H01L21/0273—Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34 comprising organic layers characterised by the treatment of photoresist layers
- H01L21/0274—Photolithographic processes
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05G—X-RAY TECHNIQUE
- H05G2/00—Apparatus or processes specially adapted for producing X-rays, not involving X-ray tubes, e.g. involving generation of a plasma
- H05G2/001—Production of X-ray radiation generated from plasma
- H05G2/003—Production of X-ray radiation generated from plasma the plasma being generated from a material in a liquid or gas state
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05G—X-RAY TECHNIQUE
- H05G2/00—Apparatus or processes specially adapted for producing X-rays, not involving X-ray tubes, e.g. involving generation of a plasma
- H05G2/001—Production of X-ray radiation generated from plasma
- H05G2/009—Auxiliary arrangements not involved in the plasma generation
Landscapes
- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Plasma & Fusion (AREA)
- Optics & Photonics (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
- X-Ray Techniques (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US611707P | 2007-12-19 | 2007-12-19 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| NL1036272A1 true NL1036272A1 (nl) | 2009-06-22 |
Family
ID=40427194
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| NL1036272A NL1036272A1 (nl) | 2007-12-19 | 2008-12-03 | Radiation source, lithographic apparatus and device manufacturing method. |
Country Status (8)
| Country | Link |
|---|---|
| US (1) | US8416391B2 (nl) |
| EP (1) | EP2220915B1 (nl) |
| JP (1) | JP2011508377A (nl) |
| KR (1) | KR20100102170A (nl) |
| CN (1) | CN101911839B (nl) |
| NL (1) | NL1036272A1 (nl) |
| TW (1) | TWI414213B (nl) |
| WO (1) | WO2009078722A1 (nl) |
Families Citing this family (16)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| NL1036614A1 (nl) * | 2008-03-21 | 2009-09-22 | Asml Netherlands Bv | A target material, a source, an EUV lithographic apparatus and a device manufacturing method using the same. |
| JP5257480B2 (ja) * | 2011-03-28 | 2013-08-07 | ウシオ電機株式会社 | 光処理装置 |
| JP6047573B2 (ja) * | 2011-09-02 | 2016-12-21 | エーエスエムエル ネザーランズ ビー.ブイ. | 放射源 |
| KR20140060559A (ko) * | 2011-09-02 | 2014-05-20 | 에이에스엠엘 네델란즈 비.브이. | 방사선 소스 및 리소그래피 장치 |
| KR101938707B1 (ko) * | 2011-09-02 | 2019-01-15 | 에이에스엠엘 네델란즈 비.브이. | 디바이스 제조용 리소그래피 장치에 대한 방법 및 방사선 소스 |
| TWI596384B (zh) * | 2012-01-18 | 2017-08-21 | Asml荷蘭公司 | 光源收集器元件、微影裝置及元件製造方法 |
| DE102013002064A1 (de) * | 2012-02-11 | 2013-08-14 | Media Lario S.R.L. | Quell-kollektor-module für euv-lithographie unter verwendung eines gic-spiegels und einer lpp-quelle |
| WO2013131706A1 (en) * | 2012-03-07 | 2013-09-12 | Asml Netherlands B.V. | Radiation source and lithographic apparatus |
| EP2816876B1 (en) * | 2013-06-21 | 2016-02-03 | Ushio Denki Kabushiki Kaisha | EUV discharge lamp with moving protective component |
| DE102013109048A1 (de) * | 2013-08-21 | 2015-02-26 | Ushio Denki Kabushiki Kaisha | Verfahren und Vorrichtung zur Kühlung von Strahlungsquellen auf Basis eines Plasmas |
| EP3152983A1 (de) * | 2014-06-06 | 2017-04-12 | TRUMPF Lasersystems for Semiconductor Manufacturing GmbH | Vorrichtung und verfahren zur überwachung eines laserstrahls |
| JP6477179B2 (ja) * | 2015-04-07 | 2019-03-06 | ウシオ電機株式会社 | 放電電極及び極端紫外光光源装置 |
| CN105376919B (zh) * | 2015-11-06 | 2017-08-01 | 华中科技大学 | 一种激光诱导液滴靶放电产生等离子体的装置 |
| JP7156331B2 (ja) * | 2020-05-15 | 2022-10-19 | ウシオ電機株式会社 | 極端紫外光光源装置 |
| JP7405000B2 (ja) * | 2020-05-15 | 2023-12-26 | ウシオ電機株式会社 | 極端紫外光光源装置および極端紫外光の生成方法 |
| KR102893593B1 (ko) * | 2022-11-23 | 2025-12-04 | 주식회사 월드빔솔루션 | 전자빔 기반 극자외선 광원 장치 |
Family Cites Families (13)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5523193A (en) * | 1988-05-31 | 1996-06-04 | Texas Instruments Incorporated | Method and apparatus for patterning and imaging member |
| ATE123885T1 (de) * | 1990-05-02 | 1995-06-15 | Fraunhofer Ges Forschung | Belichtungsvorrichtung. |
| EP0956516B1 (en) | 1997-01-29 | 2002-04-10 | Micronic Laser Systems Ab | Method and apparatus for the production of a structure by focused laser radiation on a photosensitively coated substrate |
| SE509062C2 (sv) | 1997-02-28 | 1998-11-30 | Micronic Laser Systems Ab | Dataomvandlingsmetod för en laserskrivare med flera strålar för mycket komplexa mikrokolitografiska mönster |
| JP2001108799A (ja) * | 1999-10-08 | 2001-04-20 | Nikon Corp | X線発生装置、x線露光装置及び半導体デバイスの製造方法 |
| JP2002006096A (ja) * | 2000-06-23 | 2002-01-09 | Nikon Corp | 電磁波発生装置、これを用いた半導体製造装置並びに半導体デバイスの製造方法 |
| BRPI0407155A (pt) * | 2003-01-31 | 2006-02-07 | Dow Corning Ireland Ltd | Conjunto de eletrodo de geração de plasma |
| DE10342239B4 (de) * | 2003-09-11 | 2018-06-07 | Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. | Verfahren und Vorrichtung zum Erzeugen von Extrem-Ultraviolettstrahlung oder weicher Röntgenstrahlung |
| JP2006253122A (ja) * | 2005-02-09 | 2006-09-21 | Ideal Star Inc | プラズマ源、イオン源、及び、イオン生成方法 |
| DE102005030304B4 (de) * | 2005-06-27 | 2008-06-26 | Xtreme Technologies Gmbh | Vorrichtung und Verfahren zur Erzeugung von extrem ultravioletter Strahlung |
| DE102005039849B4 (de) * | 2005-08-19 | 2011-01-27 | Xtreme Technologies Gmbh | Vorrichtung zur Strahlungserzeugung mittels einer Gasentladung |
| JP2007200919A (ja) * | 2006-01-23 | 2007-08-09 | Ushio Inc | 極端紫外光光源装置 |
| JP2007305908A (ja) * | 2006-05-15 | 2007-11-22 | Ushio Inc | 極端紫外光光源装置 |
-
2008
- 2008-12-03 NL NL1036272A patent/NL1036272A1/nl active Search and Examination
- 2008-12-16 TW TW097148944A patent/TWI414213B/zh not_active IP Right Cessation
- 2008-12-19 JP JP2010539335A patent/JP2011508377A/ja not_active Ceased
- 2008-12-19 WO PCT/NL2008/050820 patent/WO2009078722A1/en not_active Ceased
- 2008-12-19 US US12/809,427 patent/US8416391B2/en not_active Expired - Fee Related
- 2008-12-19 EP EP08863152A patent/EP2220915B1/en not_active Not-in-force
- 2008-12-19 CN CN200880124729.2A patent/CN101911839B/zh not_active Expired - Fee Related
- 2008-12-19 KR KR1020107016125A patent/KR20100102170A/ko not_active Ceased
Also Published As
| Publication number | Publication date |
|---|---|
| KR20100102170A (ko) | 2010-09-20 |
| WO2009078722A1 (en) | 2009-06-25 |
| US8416391B2 (en) | 2013-04-09 |
| CN101911839A (zh) | 2010-12-08 |
| CN101911839B (zh) | 2013-01-23 |
| EP2220915B1 (en) | 2012-06-27 |
| TW200934308A (en) | 2009-08-01 |
| JP2011508377A (ja) | 2011-03-10 |
| EP2220915A1 (en) | 2010-08-25 |
| US20110134405A1 (en) | 2011-06-09 |
| TWI414213B (zh) | 2013-11-01 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| AD1A | A request for search or an international type search has been filed |