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Yuichi HAYASHI
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A threat for tablet pcs in public space: Remote visualization of screen images using em emanation
Y Hayashi, N Homma, M Miura, T Aoki, H Sone
Proceedings of the 2014 ACM SIGSAC Conference on Computer and Communications …, 2014
1132014
Analysis of electromagnetic information leakage from cryptographic devices with different physical structures
YI Hayashi, N Homma, T Mizuki, T Aoki, H Sone, L Sauvage, JL Danger
IEEE Transactions on Electromagnetic Compatibility 55 (3), 571-580, 2012
972012
Em attack is non-invasive?-design methodology and validity verification of em attack sensor
N Homma, Y Hayashi, N Miura, D Fujimoto, D Tanaka, M Nagata, T Aoki
International Workshop on Cryptographic Hardware and Embedded Systems, 1-16, 2014
792014
Card-based protocols for any boolean function
T Nishida, Y Hayashi, T Mizuki, H Sone
International Conference on Theory and Applications of Models of Computation …, 2015
782015
The minimum number of cards in practical card-based protocols
J Kastner, A Koch, S Walzer, D Miyahara, Y Hayashi, T Mizuki, H Sone
International Conference on the Theory and Application of Cryptology and …, 2017
742017
A local EM-analysis attack resistant cryptographic engine with fully-digital oscillator-based tamper-access sensor
N Miura, D Fujimoto, D Tanaka, Y Hayashi, N Homma, T Aoki, M Nagata
2014 symposium on VLSI circuits digest of technical papers, 1-2, 2014
552014
Practical card-based implementations of Yao's millionaire protocol
D Miyahara, Y Hayashi, T Mizuki, H Sone
Theoretical computer science 803, 207-221, 2020
532020
Efficient evaluation of EM radiation associated with information leakage from cryptographic devices
Y Hayashi, N Homma, T Mizuki, H Shimada, T Aoki, H Sone, L Sauvage, ...
IEEE Transactions on Electromagnetic Compatibility 55 (3), 555-563, 2012
532012
Transient IEMI threats for cryptographic devices
Y Hayashi, N Homma, T Mizuki, T Aoki, H Sone
IEEE transactions on Electromagnetic Compatibility 55 (1), 140-148, 2012
532012
Introduction to the special section on electromagnetic information security
YI Hayashi, N Homma, T Watanabe, WO Price, WA Radasky
IEEE Transactions on Electromagnetic Compatibility 55 (3), 539-546, 2013
512013
Non-invasive EMI-based fault injection attack against cryptographic modules
Y Hayashi, N Homma, T Sugawara, T Mizuki, T Aoki, H Sone
2011 IEEE International Symposium on Electromagnetic Compatibility, 763-767, 2011
512011
Secure implementations of a random bisection cut
I Ueda, D Miyahara, A Nishimura, Y Hayashi, T Mizuki, H Sone
International journal of information security 19 (4), 445-452, 2020
462020
How to implement a random bisection cut
I Ueda, A Nishimura, Y Hayashi, T Mizuki, H Sone
International Conference on Theory and Practice of Natural Computing, 58-69, 2016
462016
A 286 F2/Cell Distributed Bulk-Current Sensor and Secure Flush Code Eraser Against Laser Fault Injection Attack on Cryptographic Processor
K Matsuda, T Fujii, N Shoji, T Sugawara, K Sakiyama, Y Hayashi, ...
IEEE Journal of Solid-State Circuits 53 (11), 3174-3182, 2018
432018
Pile-shifting scramble for card-based protocols
A Nishimura, Y Hayashi, T Mizuki, H Sone
IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and …, 2018
382018
Buffer overflow attack with multiple fault injection and a proven countermeasure
S Nashimoto, N Homma, Y Hayashi, J Takahashi, H Fuji, T Aoki
Journal of Cryptographic Engineering 7 (1), 35-46, 2017
382017
Remote visualization of screen images using a pseudo-antenna that blends into the mobile environment
Y Hayashi, N Homma, Y Toriumi, K Takaya, T Aoki
IEEE Transactions on Electromagnetic Compatibility 59 (1), 24-33, 2016
382016
EM information security threats against RO-based TRNGs: The frequency injection attack based on IEMI and EM information leakage
S Osuka, D Fujimoto, Y Hayashi, N Homma, A Beckers, J Balasch, ...
IEEE Transactions on Electromagnetic Compatibility 61 (4), 1122-1128, 2018
362018
Spectrum analysis on cryptographic modules to counteract side-channel attacks
T Sugawara, Y Hayashi, N Homma, T Mizuki, T Aoki, H Sone, A Satoh
EMC 9, 21-24, 2009
362009
A demonstration of a HT-detection method based on impedance measurements of the wiring around ICs
D Fujimoto, S Nin, YI Hayashi, N Miura, M Nagata, T Matsumoto
IEEE Transactions on Circuits and Systems II: Express Briefs 65 (10), 1320-1324, 2018
342018
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