| Structural properties of Bi2Te3 topological insulator thin films grown by molecular beam epitaxy on (111) BaF2 substrates CI Fornari, PHO Rappl, SL Morelhão, E Abramof Journal of Applied Physics 119 (16), 2016 | 68 | 2016 |
| Computer simulation tools for x-ray analysis: scattering and diffraction methods SL Morelhão | 56 | 2016 |
| Usage of Scherrer's formula in X-ray diffraction analysis of size distribution in systems of monocrystalline nanoparticles A Valério, SL Morelhao arXiv preprint arXiv:1911.00701, 2019 | 52 | 2019 |
| X-ray multiple diffraction phenomenon in the evaluation of semiconductor crystalline perfection SL Morelhão, LP Cardoso Applied Crystallography 29 (4), 446-456, 1996 | 46 | 1996 |
| Molecular beam epitaxy of antiferromagnetic (MnBi2Te4)(Bi2Te3) thin films on BaF2 (111) P Kagerer, CI Fornari, S Buchberger, SL Morelhão, RC Vidal, A Tcakaev, ... Journal of Applied Physics 128 (13), 2020 | 43 | 2020 |
| Preservation of pristine Bi2Te3 thin film topological insulator surface after ex situ mechanical removal of Te capping layer CI Fornari, PHO Rappl, SL Morelhão, TRF Peixoto, H Bentmann, ... APL Materials 4 (10), 2016 | 43 | 2016 |
| Structural properties of heteroepitaxial systems using hybrid multiple diffraction in Renninger scans SL Morelhao, LP Cardoso Journal of applied physics 73 (9), 4218-4226, 1993 | 42 | 1993 |
| Sensitivity of Bragg surface diffraction to analyze ion-implanted semiconductors MA Hayashi, SL Morelhão, LH Avanci, LP Cardoso, JM Sasaki, LC Kretly, ... Applied Physics Letters 71 (18), 2614-2616, 1997 | 34 | 1997 |
| X‐ray imaging in advanced studies of ophthalmic diseases A Antunes, AMV Safatle, PSM Barros, SL Morelhão Medical physics 33 (7Part1), 2338-2343, 2006 | 32 | 2006 |
| Nanoscale characterization of bismuth telluride epitaxial layers by advanced X-ray analysis SL Morelhao, CI Fornari, PHO Rappl, E Abramof Applied Crystallography 50 (2), 399-410, 2017 | 31 | 2017 |
| Strain effects on the magnetic order of epitaxial FeRh thin films H Kumar, DR Cornejo, SL Morelhao, S Kycia, IM Montellano, NR Alvarez, ... Journal of Applied Physics 124 (8), 2018 | 30 | 2018 |
| Nanostructure of sol–gel films by x-ray specular reflectivity SL Morelhão, GES Brito, E Abramof Applied physics letters 80 (3), 407-409, 2002 | 30 | 2002 |
| A versatile X-ray diffraction station at LNLS (Brazil) C Cusatis, M Kobayashi Franco, E Kakuno, C Giles, S Morelhão, V Mello, ... Synchrotron Radiation 5 (3), 491-493, 1998 | 29 | 1998 |
| Hybrid multiple diffraction in Renninger scan for heteroepitaxial layers SL Morelhão, LP Cardoso, JM Sasaki, MMG De Carvalho Journal of applied physics 70 (5), 2589-2593, 1991 | 27 | 1991 |
| X-ray phase measurements as a probe of small structural changes in doped nonlinear optical crystals SL Morelhao, CMR Remédios, RO Freitas, AO dos Santos Applied Crystallography 44 (1), 93-101, 2011 | 26 | 2011 |
| Synchrotron X‐ray Renninger scanning for studying strain in InAs/GaAs quantum dot system RO Freitas, TE Lamas, AA Quivy, SL Morelhão physica status solidi (a) 204 (8), 2548-2554, 2007 | 26 | 2007 |
| Enhanced X-ray phase determination by three-beam diffraction SL Morelhão, S Kycia Physical review letters 89 (1), 015501, 2002 | 26 | 2002 |
| Strength tuning of multiple waves in crystals SL Morelhão, LH Avanci Foundations of Crystallography 57 (2), 192-196, 2001 | 26 | 2001 |
| Hybrid reciprocal space for X-ray diffraction in epitaxic layers SL Morelhao, JK Domagala Applied Crystallography 40 (3), 546-551, 2007 | 25 | 2007 |
| An X-ray diffractometer for accurate structural invariant phase determination SL Morelhao Synchrotron Radiation 10 (3), 236-241, 2003 | 23 | 2003 |
Lisandro Pavie CardosoProfessor Titular Aposentado do Instituto de Física Gleb Wataghin da Universidade Estadual deVerified email at ifi.unicamp.br
