Vasileios Tenentes

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Daniele RossiUniversity of Pisa, ItalyVerified email at unipi.it
Bashir M. Al-HashimiProfessor of Computer Engineering, King’s College LondonVerified email at kcl.ac.uk
S KhursheedLecturer (Assistant Professor), University of Liverpool, UKVerified email at liv.ac.uk
Xrysovalantis KavousianosUniversity of IoanninaVerified email at cs.uoi.gr
yang shengPhD of electronics engineering, University of SouthamptonVerified email at worldprogramming.com
Emmanouil KalligerosAssociate Professor, University of the AegeanVerified email at aegean.gr
Krishnendu ChakrabartyFulton Professor of Microelectronics, School of Electrical and Computer and Energy EngineeringVerified email at asu.edu
Tom J KazmierskiAssociate Professor, Southampton UniversityVerified email at ecs.soton.ac.uk
Christos ZoniosCentre for Research and Technology Hellas (CERTH), University of IoanninaVerified email at uoi.gr
Shidhartha DasAMDVerified email at amd.com
Geoff V MerrettProfessor of Electronic and Software Systems, University of SouthamptonVerified email at ecs.soton.ac.uk
Athanasios XynosPhD Candidate, Computer Science & Engineering, University of IoanninaVerified email at uoi.gr
Steve GunnProfessor of Electronics and Computer Science, University of SouthamptonVerified email at ecs.soton.ac.uk
Yiorgos TsiatouhasUniversity of IoanninaVerified email at cse.uoi.gr
Dr Basel HalakAssociate Professor,University of SouthamptonVerified email at ecs.soton.ac.uk
Panayiotis KotzanikolaouDepartment of Informatics, University of Piraeus, GreeceVerified email at unipi.gr
Mihalis PsarakisProfessor,University of Piraeus, Dept. of InformaticsVerified email at unipi.gr
Vangelis MalamasHellenic Ministry of Digital Governance consultant | Post-doc researcherVerified email at unipi.gr
Milosch MeriacTechnology Innovation InstitueVerified email at meriac.com
Hussam AmrouchProfessor (W3) of AI Processor Design, Technical University of MunichVerified email at tum.de

Vasileios Tenentes

Associate Professor, University of Ioannina

Verified email at arm.com

hardware security energy efficient computing VLSI design and test electronic design automation


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Sensitivity and evaluation of current fire risk and future projections due to climate change: the case study of Greece A Karali, M Hatzaki, C Giannakopoulos, A Roussos, G Xanthopoulos, ... Natural Hazards and Earth System Science 14 (1), 143-153, 2014	102	2014
Aging Benefits in Nanometer CMOS Designs D Rossi, V Tenentes, S Yang, S Khursheed, B Al-Hashimi IEEE Transactions on Circuits and Systems II: Express Briefs 64 (3), 324-328, 2017	44	2017
Reliable power gating with NBTI aging benefits D Rossi, V Tenentes, S Yang, S Khursheed, B Al-Hashimi IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 1-10, 2016	34	2016
Coarse-Grained Online Monitoring of BTI Aging by Reusing Power-Gating Infrastructure V Tenentes, D Rossi, S Yang, S Khursheed, BM Al-Hashimi, SR Gunn IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 2017	32	2017
State skip LFSRs: Bridging the gap between test data compression and test set embedding for IP cores V Tenentes, X Kavousianos, E Kalligeros Proceedings of the conference on Design, automation and test in Europe, 474-479, 2008	30	2008
Single and variable-state-skip LFSRs: bridging the gap between test data compression and test set embedding for IP cores V Tenentes, X Kavousianos, E Kalligeros IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2010	29	2010
Defect aware x-filling for low-power scan testing S Balatsouka, V Tenentes, X Kavousianos, K Chakrabarty 2010 Design, Automation & Test in Europe Conference & Exhibition (DATE 2010 …, 2010	25	2010
NBTI and leakage aware sleep transistor design for reliable and energy efficient power gating D Rossi, V Tenentes, S Khursheed, B Al-Hashimi 20th IEEE European Test Symposium (ETS 2015), 2015	22	2015
BTI and leakage aware dynamic voltage scaling for reliable low power cache memories D Rossi, V Tenentes, S Khursheed, BM Al-Hashimi IEEE international on-Line testing symposium (IOLTS'15), 2015	19	2015
Defect-Oriented LFSR Reseeding to Target Unmodeled Defects Using Stuck-at Test Sets X Kavousianos, V Tenentes, K Chakrabarty, E Kalligeros IEEE Transactions on Very Large Scale Integration (VLSI) Systems 19 (12 …, 2011	18	2011
High-quality statistical test compression with narrow ATE interface V Tenentes, X Kavousianos IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2013	17	2013
Recycled IC detection through aging sensor D Rossi, V Tenentes, S Khursheed, SM Reddy 2018 IEEE 23rd European Test Symposium (ETS), 1-2, 2018	14	2018
Exploiting aging benefits for the design of reliable drowsy cache memories D Rossi, V Tenentes, SM Reddy, BM Al-Hashimi, A Brown IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 2018	13	2018
BTI aware thermal management for reliable DVFS designs H Chahal, V Tenentes, D Rossi, BM Al-Hashimi 2016 IEEE International Symposium on Defect and Fault Tolerance in VLSI and …, 2016	13	2016
Online tuning of Dynamic Power Management for efficient execution of interactive workloads J Bantock, R Benjamin, V Tenentes, B Al-Hashimi, G Merrett IEEE/ACM International Symposium on Low Power Electronics and Design …, 2017	11	2017
Low power test-compression for high test-quality and low test-data volume V Tenentes, X Kavousianos 2011 Asian Test Symposium, 46-53, 2011	11	2011
Energy efficient speech command recognition for private smart home iot applications C Zonios, V Tenentes 2021 10th International Conference on Modern Circuits and Systems …, 2021	10	2021
High quality testing of grid style power gating V Tenentes, S Khursheed, BM Al-Hashimi, S Zhong, S Yang 2014 IEEE 23rd Asian Test Symposium, 186-191, 2014	10	2014
Test-data volume and scan-power reduction with low ATE interface for multi-core SoCs V Tenentes, X Kavousianos 2011 IEEE/ACM International Conference on Computer-Aided Design (ICCAD), 747-754, 2011	10	2011
The impact of BTI aging on the reliability of level shifters in nano-scale CMOS technology B Halak, V Tenentes, D Rossi Microelectronics Reliability 67, 74-81, 2016	9	2016

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