| Internal short circuit detection in Li-ion batteries using supervised machine learning Arunava Naha, Ashish Khandelwal, Samarth Agarwal, Piyush Tagade, Krishnan S ... Nature Scientific Reports 10, 2020 | 167* | 2020 |
| Leakage-reduction design concepts for low-power vertical tunneling field-effect transistors S Agarwal, G Klimeck, M Luisier IEEE Electron Device Letters 31 (6), 621-623, 2010 | 116 | 2010 |
| An incremental voltage difference based technique for online state of health estimation of li-ion batteries A Naha, S Han, S Agarwal, A Guha, A Khandelwal, P Tagade, ... Scientific reports 10 (1), 9526, 2020 | 78 | 2020 |
| Random dopant fluctuation induced variability in undoped channel Si gate all around nanowire n-MOSFET K Nayak, S Agarwal, M Bajaj, KVRM Murali, VR Rao IEEE Transactions on Electron Devices 62 (2), 685-688, 2015 | 66 | 2015 |
| Metal-gate granularity-induced threshold voltage variability and mismatch in Si gate-all-around nanowire n-MOSFETs K Nayak, S Agarwal, M Bajaj, PJ Oldiges, KVRM Murali, VR Rao IEEE Transactions on Electron Devices 61 (11), 3892-3895, 2014 | 43 | 2014 |
| Ab initio study of metal grain orientation-dependent work function and its impact on FinFET variability S Agarwal, RK Pandey, JB Johnson, A Dixit, M Bajaj, SS Furkay, ... IEEE transactions on electron devices 60 (9), 2728-2733, 2013 | 35 | 2013 |
| Diagnosing various failures of lithium-ion batteries using artificial neural network enhanced by likelihood mapping S Lee, S Han, KH Han, Y Kim, S Agarwal, KS Hariharan, B Oh, J Yoon Journal of Energy Storage 40, 102768, 2021 | 31 | 2021 |
| Transfer learning based generalized framework for state of health estimation of Li-ion cells S Sahoo, KS Hariharan, S Agarwal, SB Swernath, R Bharti, S Han, S Lee Scientific Reports 12 (1), 13173, 2022 | 30 | 2022 |
| Rowhammer for Spin Torque based Memory: Problem or not? S Agarwal, H Dixit, D Datta, M Tran, D Houssameddine, D Shum, ... IEEE International Magnetics Conference (INTERMAG), Singapore, 2018, 2018 | 18 | 2018 |
| Tunneling field-effect transistor with low leakage current M Luisier, S Agarwal, G Klimeck US Patent 8,309,989, 2012 | 17 | 2012 |
| On-device personalized charging strategy with an aging model for lithium-ion batteries using deep reinforcement learning A Yadu, SS Brahmadathan, S Agarwal, S DB, S Lee, Y Kim IEEE Transactions on Automation Science and Engineering, 2023 | 13 | 2023 |
| Design guidelines for true green LEDs and high efficiency photovoltaics using ZnSe/GaAs digital alloys S Agarwal, KH Montgomery, TB Boykin, G Klimeck, JM Woodall Electrochemical and Solid-State Letters 13 (1), H5, 2009 | 11 | 2009 |
| Resonant tunneling diode simulation with NEGF HH Park, Z Jiang, AG Akkala, S Steiger, M Povolotskyi, TC Kubis, ... Retrieved on January 12, 2021, 2008 | 10 | 2008 |
| Transistor matching and fin angle variation in FinFET technology S Agarwal, TB Hook, M Bajaj, K McStay, W Wang, Y Zhang IEEE Transactions on Electron Devices 62 (4), 1357-1359, 2015 | 9 | 2015 |
| Communication—Precursors to abrupt capacity loss in Li-ion batteries S Agarwal, SS Brahmadathan, KS Hariharan, SH Han, A Kaushik, ... Journal of The Electrochemical Society 167 (14), 140502, 2020 | 7 | 2020 |
| Quantitative model for switching asymmetry in perpendicular MTJ: A material-device-circuit co-design D Datta, H Dixit, S Agarwal, A Dasgupta, M Tran, D Houssameddine, ... 2017 IEEE International Electron Devices Meeting (IEDM), 31.5. 1-31.5. 4, 2017 | 6 | 2017 |
| Adaptive quadrature for sharply spiked integrands S Agarwal, M Povolotskyi, T Kubis, G Klimeck Journal of computational electronics 9 (3), 252-255, 2010 | 6 | 2010 |
| Method and electronic device for evaluating remaining useful life (rul) of battery SB SWERNATH, KS HARIHARAN, S Agarwal, S Han US Patent App. 17/968,348, 2023 | 4 | 2023 |
| A real time adaptive charging approach for cycle life extension of Li ion cells S Swernath, KS Hariharan, J Battle, A Kaushik, AR Mandli, S Agarwal, ... Journal of The Electrochemical Society 168 (5), 050528, 2021 | 4 | 2021 |
| Modeling charge distribution on FinFET sidewalls S Agarwal, M Bajaj, TB Hook US Patent 9,064,976, 2015 | 3 | 2015 |
Gerhard KlimeckProfessor of Electrical and Computer Engineering, Purdue UniversityVerified email at purdue.edu
