WO2025234697A1 - Resin composition, and insulating film and printed circuit board including same - Google Patents
Resin composition, and insulating film and printed circuit board including sameInfo
- Publication number
- WO2025234697A1 WO2025234697A1 PCT/KR2025/005982 KR2025005982W WO2025234697A1 WO 2025234697 A1 WO2025234697 A1 WO 2025234697A1 KR 2025005982 W KR2025005982 W KR 2025005982W WO 2025234697 A1 WO2025234697 A1 WO 2025234697A1
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- WO
- WIPO (PCT)
- Prior art keywords
- resin
- resin composition
- epoxy resin
- present application
- parts
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
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Classifications
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- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08G—MACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
- C08G59/00—Polycondensates containing more than one epoxy group per molecule; Macromolecules obtained by polymerising compounds containing more than one epoxy group per molecule using curing agents or catalysts which react with the epoxy groups
- C08G59/18—Macromolecules obtained by polymerising compounds containing more than one epoxy group per molecule using curing agents or catalysts which react with the epoxy groups ; e.g. general methods of curing
- C08G59/20—Macromolecules obtained by polymerising compounds containing more than one epoxy group per molecule using curing agents or catalysts which react with the epoxy groups ; e.g. general methods of curing characterised by the epoxy compounds used
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08G—MACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
- C08G59/00—Polycondensates containing more than one epoxy group per molecule; Macromolecules obtained by polymerising compounds containing more than one epoxy group per molecule using curing agents or catalysts which react with the epoxy groups
- C08G59/18—Macromolecules obtained by polymerising compounds containing more than one epoxy group per molecule using curing agents or catalysts which react with the epoxy groups ; e.g. general methods of curing
- C08G59/40—Macromolecules obtained by polymerising compounds containing more than one epoxy group per molecule using curing agents or catalysts which react with the epoxy groups ; e.g. general methods of curing characterised by the curing agents used
- C08G59/62—Alcohols or phenols
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08K—Use of inorganic or non-macromolecular organic substances as compounding ingredients
- C08K3/00—Use of inorganic substances as compounding ingredients
- C08K3/01—Use of inorganic substances as compounding ingredients characterized by their specific function
- C08K3/013—Fillers, pigments or reinforcing additives
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- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08K—Use of inorganic or non-macromolecular organic substances as compounding ingredients
- C08K3/00—Use of inorganic substances as compounding ingredients
- C08K3/34—Silicon-containing compounds
- C08K3/36—Silica
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08L—COMPOSITIONS OF MACROMOLECULAR COMPOUNDS
- C08L29/00—Compositions of homopolymers or copolymers of compounds having one or more unsaturated aliphatic radicals, each having only one carbon-to-carbon double bond, and at least one being terminated by an alcohol, ether, aldehydo, ketonic, acetal or ketal radical; Compositions of hydrolysed polymers of esters of unsaturated alcohols with saturated carboxylic acids; Compositions of derivatives of such polymers
- C08L29/14—Homopolymers or copolymers of acetals or ketals obtained by polymerisation of unsaturated acetals or ketals or by after-treatment of polymers of unsaturated alcohols
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08L—COMPOSITIONS OF MACROMOLECULAR COMPOUNDS
- C08L63/00—Compositions of epoxy resins; Compositions of derivatives of epoxy resins
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K1/00—Printed circuits
- H05K1/02—Details
- H05K1/03—Use of materials for the substrate
Definitions
- the present application relates to a resin composition, an insulating film comprising the same, and a printed circuit board.
- One commonly used method for suppressing thermal expansion coefficient is to add inorganic fillers to the resin composition.
- the composition contains a large amount of inorganic filler, not only is it difficult to control the viscosity of the coating solution itself, but the inorganic filler is exposed to a greater extent on the surface after roughening, which reduces the peel strength (peeling strength) of the conductive layer formed by plating.
- Patent Document 1 Republic of Korea Patent Publication No. 2012-0107277
- the present application seeks to provide a resin composition, an insulating film comprising the same, and a printed circuit board.
- One embodiment of the present application provides a resin composition
- a resin composition comprising an epoxy resin; two or more kinds of phenolic resins; a thermoplastic resin; and an inorganic filler, wherein the ratio of an epoxy group of the epoxy resin to a hydroxyl group of the phenolic resin is 1:0.5 to 1:0.01, the epoxy resin includes a bisphenol-type epoxy resin; a phenol novolac-type epoxy resin; and a bixylenol-type epoxy resin, and the phenolic resin includes a naphthalene-containing phenolic resin and a triazine-containing phenolic resin, and the weight ratio of the naphthalene-containing phenolic resin and the triazine-containing phenolic resin is 1:2 to 2:1.
- another embodiment of the present application provides an insulating film comprising the resin composition or a cured product thereof.
- another embodiment of the present application provides a printed circuit board including the insulating film.
- a resin composition according to one embodiment of the present application comprises a naphthalene-containing phenolic resin and a triazine-containing phenolic resin as a curing agent at a specific weight ratio, comprises three specific epoxy resins, and applies the epoxy resin and the phenolic resin such that the composition ratio of the epoxy group of the epoxy resin and the hydroxyl group of the phenolic resin is a specific ratio, thereby appropriately lowering the coefficient of thermal expansion even if an inorganic filler is included in a high content, thereby minimizing reliability problems such as thermal cycles in future multilayer printed circuit boards.
- an excellent insulating layer having a peel strength of a conductor layer at an appropriate level or higher can be formed.
- a multilayer printed circuit board manufactured using a resin composition according to one embodiment of the present application has excellent thermal expansion coefficient properties and has an appropriate surface roughness through desmear treatment, thereby providing excellent copper foil adhesion.
- 'A to B' means a range of A to B.
- a method of manufacturing multilayer printed circuit boards by alternately laminating conductor layers and insulating films has been developed, and is currently being used for semiconductor packaging purposes.
- the manufacturing process of the multilayer printed circuit board first vacuum-laminated a build-up insulating film on the inner layer circuit, and then goes through the steps of precure ⁇ drilling ⁇ desmear ⁇ electroless plating ⁇ electroplating ⁇ postcure ⁇ outer layer circuit formation.
- the desmear process removes smear with an acid solution and simultaneously forms surface roughness by eroding the surface of the insulating film by a certain amount, which serves to increase adhesion with the copper foil layer formed in the subsequent process.
- a resin composition for the above build-up insulating film As a resin composition for the above build-up insulating film, a composition was used in which an inorganic filler was added to an epoxy resin and a phenolic hardener. However, as the amount of inorganic filler added is increased to obtain the desired thermal expansion coefficient, it becomes difficult to control the viscosity of the coating solution, and after the harmonization treatment, the inorganic filler is excessively exposed on the surface, resulting in a decrease in peel strength.
- the present application seeks to provide a resin composition having high peel strength while obtaining a desired thermal expansion coefficient by using an appropriate amount of inorganic filler, and a printed circuit board including the same.
- a resin composition according to one embodiment of the present application comprises an epoxy resin; two or more kinds of phenolic resins; a thermoplastic resin; and an inorganic filler, wherein a ratio (composition ratio) of an epoxy group of the epoxy resin and a hydroxyl group of the phenolic resin is 1:0.5 to 1:0.01, and the epoxy resin comprises a bisphenol-based epoxy resin; a phenol novolac-type epoxy resin; and a bixylenol-type epoxy resin, and the phenolic resin comprises a naphthalene-containing phenolic resin and a triazine-containing phenolic resin, and the weight ratio of the naphthalene-containing phenolic resin and the triazine-containing phenolic resin is 1:2 to 2:1.
- the epoxy resin includes a bisphenol-based epoxy resin; a phenol novolac-type epoxy resin; and a bixylenol-type epoxy resin.
- the bisphenol-based epoxy resin may be a bisphenol A type epoxy resin, a bisphenol F type epoxy resin, or a bisphenol S type epoxy resin.
- the bisphenol-based epoxy resin may be selected from YD-113, YD-114, YD-114E, YD-114F, YD-115, YD-115G, YD-115CA, KD-1818, YD-127, YD-128, YD-128S, YD-134, YD-136 (Kukdo Chemical), EXA-4850-150, EXA-4850-1000 (DIC), etc., but is not limited thereto.
- the phenol novolac type epoxy resin may be selected from YDPN-638, YDPN-639, KT-7804 (Kukdo Chemical), etc., but is not limited thereto.
- the bixylenol-type epoxy resin may be selected from YX-4000H, YX-4000, YX-4000HK, YL-7890 (Mitsubishi Chemical), etc., but is not limited thereto.
- the resin composition may include four or more types of the epoxy resin.
- the resin composition may further include an additional epoxy resin other than the bisphenol-based epoxy resin; the phenol novolac-type epoxy resin; and the bixylenol-type epoxy resin.
- the additional epoxy resin may be any one known in the art without limitation, but it is preferred that two or more epoxy groups exist in one molecule. More specifically, the epoxy resin may be selected from naphthalene-type epoxy resin; anthracene-type epoxy resin; biphenyl-type epoxy resin; tetramethyl biphenyl-type epoxy resin; cresol novolac-type epoxy resin; bisphenol A novolac-type epoxy resin; bisphenol S novolac-type epoxy resin; biphenyl novolac-type epoxy resin; naphthol novolac-type epoxy resin; naphthol phenol cocondensed novolac-type epoxy resin; naphthol coresol cocondensed novolac-type epoxy resin; aromatic hydrocarbon formaldehyde resin-modified phenol resin-type epoxy resin; triphenyl methane-type epoxy resin; tetraphenylethane-type epoxy resin; dicyclopentadiene phenol addition-reaction epoxy resin; phenol aralkyl-
- the total content of the epoxy resin may be 10 to 30 parts by weight based on 100 parts by weight of the total solid content of the resin composition.
- the total content of the epoxy resin may be 20 to 27 parts by weight based on 100 parts by weight of the total solid content of the resin composition.
- the content of the epoxy resin in the resin composition is within the above range, the formability and processability are improved, and the properties necessary for forming an appropriate roughness during the desmear process can be secured.
- the content of each of the bisphenol-based epoxy resin; phenol novolac-type epoxy resin; and bixylenol-type epoxy resin is not limited as long as it satisfies the total content range of the epoxy resin and the ratio range of the epoxy group of the epoxy resin and the hydroxyl group of the phenol-based resin.
- the resin composition may include 10 to 30 parts by weight of the bisphenol-based epoxy resin; 40 to 60 parts by weight of the phenol novolac-type epoxy resin; and 20 to 40 parts by weight of the bixylenol-type epoxy resin, based on 100 parts by weight of the total epoxy resin.
- the resin composition may include 10 to 30 parts by weight of the bisphenol-based epoxy resin; 20 to 40 parts by weight of the phenol novolac-type epoxy resin; and 40 to 60 parts by weight of the bixylenol-type epoxy resin, based on 100 parts by weight of the total epoxy resin.
- the resin composition includes two or more kinds of phenolic resins
- the phenolic resins include a naphthalene-containing phenolic resin and a triazine-containing phenolic resin
- the weight ratio of the naphthalene-containing phenolic resin and the triazine-containing phenolic resin is 1:2 to 2:1.
- the phenolic resin acts as a curing agent in the resin composition and may be referred to as a phenolic curing agent.
- the above resin composition provides an effect of preventing a decrease in peel strength due to the use of an inorganic filler by using two types of specific phenolic resins as a hardener within the above weight ratio range.
- the weight ratio of the naphthalene-containing phenolic resin and the triazine-containing phenolic resin may be 1:1 to 2:1, and preferably 1:1 to 1.8:1.
- the naphthalene-containing phenolic resin may include a structure represented by the following structural formula 1.
- X1 and X2 are the same or different from each other, and each independently represents a divalent organic group
- a and b are equal to or different from each other and are each independently an integer from 1 to 6,
- n is an integer from 1 to 20.
- X1 and X2 may be the same as or different from each other, and may each independently be a substituted or unsubstituted alkylene group; a substituted or unsubstituted arylene group; or a substituted or unsubstituted divalent amine group.
- X1 and X2 may be the same as or different from each other, and may each independently be a substituted or unsubstituted C1 to C30 alkylene group; a substituted or unsubstituted C6 to C30 arylene group; or a substituted or unsubstituted divalent amine group.
- a and b are the same or different from each other, and are each independently an integer from 1 to 6, preferably an integer from 1 to 4, more preferably 1 or 2, and most preferably 1.
- n is an integer greater than or equal to 2
- the structures of the repeating units within the parentheses may be the same or different from each other.
- the terminal group of the naphthalene-containing phenolic resin may be, but is not limited to, hydrogen; a hydroxyl group; an ester group; a cyanate ester group; a substituted or unsubstituted alkyl group; or a substituted or unsubstituted aryl group.
- ester group may refer to an active ester group.
- the active ester group is an ester functional group that is susceptible to nucleophilic attack, and may be a modified form of the acyl or alkoxy component of a normal ester.
- the terminal group of the naphthalene-containing phenolic resin may be, but is not limited to, hydrogen; a substituted or unsubstituted C1 to C30 alkyl group; or a substituted or unsubstituted C6 to C30 aryl group.
- the naphthalene-containing phenolic resin includes, but is not limited to, SN-395, SN-485, SN-395 (Nippon Steel Chemical Co., Ltd.).
- the triazine-containing phenolic resin may include a structure represented by the following structural formula 2.
- X3 and X4 are the same or different from each other, and each independently represents a divalent organic group
- R1 is hydrogen; a substituted or unsubstituted alkyl group; a substituted or unsubstituted aryl group; or a substituted or unsubstituted amine group,
- c and d are the same or different from each other, and are each independently an integer from 1 to 4,
- n is an integer from 1 to 20.
- R1 may be hydrogen; a substituted or unsubstituted C1 to C30 alkyl group; a substituted or unsubstituted C6 to C30 aryl group; or a substituted or unsubstituted amine group.
- X3 and X4 may be the same as or different from each other, and may each independently be a substituted or unsubstituted alkylene group; a substituted or unsubstituted arylene group; or a substituted or unsubstituted divalent amine group.
- X3 and X4 may be the same as or different from each other, and may each independently be a substituted or unsubstituted C1 to C30 alkylene group; a substituted or unsubstituted C6 to C30 arylene group; or a substituted or unsubstituted divalent amine group.
- c and d are the same or different from each other, and are each independently an integer from 1 to 4, preferably an integer from 1 to 3, more preferably 1 or 2, and most preferably 1.
- the terminal group of the triazine-containing phenolic resin may be hydrogen; a substituted or unsubstituted alkyl group; or a substituted or unsubstituted aryl group, and preferably may be hydrogen or a methyl group.
- the terminal group of the triazine-containing phenolic resin may be hydrogen; a substituted or unsubstituted C1 to C30 alkyl group; or a substituted or unsubstituted C6 to C30 aryl group.
- the triazine-containing phenolic resin includes, but is not limited to, LA-1356, LA-7052, LA-7054, LA-3018-80P, etc.
- the total content of the phenolic resin may be 5 to 20 parts by weight based on 100 parts by weight of the total solid content of the resin composition.
- the total content of the phenolic resin may be 5 to 15 parts by weight based on 100 parts by weight of the total solid content of the resin composition.
- the content of the phenolic resin in the resin composition is within the above range, heat resistance and dielectric properties are improved, and properties necessary for forming an appropriate roughness during a desmear process can be secured.
- the content of each of the naphthalene-containing phenolic resin and the triazine-containing phenolic resin is not limited as long as it satisfies the total content range of the phenolic resin and the ratio range of the epoxy group of the epoxy resin and the hydroxyl group of the phenolic resin.
- the resin composition may include 50 to 70 parts by weight of the naphthalene-containing phenolic resin and 30 to 50 parts by weight of the triazine-containing phenolic resin based on 100 parts by weight of the total phenolic resin.
- the composition when the ratio (composition ratio) of the epoxy group of the epoxy resin and the hydroxyl group of the phenolic resin is 1:0.5 to 1:0.01, the composition has excellent thermal expansion coefficient properties and has appropriate surface roughness through desmear treatment, thereby providing excellent peel strength.
- the number of hydroxyl groups of the phenolic resin exceeds 0.5 per epoxy group of the epoxy resin, it may have an excellent thermal expansion coefficient, but it may not be able to improve the peel strength, which may cause problems with blistering and reliability on the substrate.
- the ratio of the epoxy group of the epoxy resin and the hydroxyl group of the phenolic resin may be 1:0.5 to 1:0.1, 1:0.5 to 1:0.2, or 1:0.5 to 1:0.3.
- the inorganic filler is meant to be used to control desired physical properties, such as hygroscopicity suppression, high storage modulus, low coefficient of thermal expansion (CTE), viscosity, and improved curability exhibited by the curable resin composition.
- desired physical properties such as hygroscopicity suppression, high storage modulus, low coefficient of thermal expansion (CTE), viscosity, and improved curability exhibited by the curable resin composition.
- the average particle diameter of the inorganic filler may be 0.01 ⁇ m or more and 5 ⁇ m or less.
- the inorganic filler may be surface-treated with a surface treatment agent such as a coupling agent.
- the inorganic filler may be silica, silicate, barium sulfate, alumina, etc., but is not limited thereto.
- the silica may include, but is not limited to, spherical silica, fused silica, hollow silica, crystalline silica, amorphous silica, etc., and commercially available silica such as SOC1 and SOC2 (Admatex) may be used.
- the inorganic filler may include silica particles.
- the inorganic filler may include only silica particles and may not include any other inorganic filler other than the silica particles.
- the average particle diameter of the above silica particles may be 0.3 ⁇ m or less, 0.2 ⁇ m or less, or 0.05 ⁇ m or more.
- the content of the inorganic filler may be 60 to 75 parts by weight based on 100 parts by weight of the total solid content of the resin composition.
- the content of the inorganic filler may be 60 to 70 parts by weight based on 100 parts by weight of the total solid content of the resin composition.
- a higher content of inorganic filler in a resin composition reduces the thermal expansion coefficient of the resin composition, thereby preventing cracking between the copper wiring and the insulating layer.
- the resin composition contains excessive amounts of inorganic filler, viscosity control becomes difficult, and the exposed portion of the inorganic filler on the surface after the blending process increases, resulting in reduced peel strength.
- the resin composition can have a low thermal expansion coefficient due to the inorganic filler, while having an appropriate surface roughness due to the composition of the epoxy resin and phenolic resin, and can provide excellent peel strength.
- the thermal expansion coefficient can be further reduced, but an appropriate peel strength cannot be obtained, and when the above-mentioned inorganic filler is included in an amount less than 60 parts by weight, the thermal expansion coefficient is high, which causes a problem in reliability in a thermal cycle test.
- the resin composition may further include a thermoplastic resin to improve the mechanical strength, film moldability, etc. of the cured product.
- the thermoplastic resin is not particularly limited as long as it is widely known in the art, and may include, for example, one or more selected from phenoxy resin, polyimide resin, polyamideimide resin, polyetherimide resin, polysulfone resin, polyethersulfone resin, polyphenylene ether resin, polycarbonate resin, polyetheretherketone resin, polyester resin, and polyvinyl acetal resin. It is more preferable that the thermoplastic resin include a polyvinyl acetal resin.
- the thermoplastic resin may be a polyvinyl acetal resin.
- the total content of the thermoplastic resin may be 0.1 to 5 parts by weight based on 100 parts by weight of the total solid content of the resin composition.
- the resin composition may additionally include a curing accelerator.
- the epoxy resin, phenolic resin, etc. in the resin composition can be cured efficiently, thereby shortening the curing time.
- the curing accelerator is not particularly limited as long as it is known in the art, but may include at least one selected from a phosphorus-based curing accelerator, an amine-based curing accelerator, and an imidazole-based curing accelerator.
- Examples of the above-mentioned curing accelerator include, but are not limited to, triphenyl phosphine.
- amine-based curing accelerators include, but are not limited to, triethylamine, tributylamine, 4-dimethylaminopyridine, benzyldimethylamine, 2,4,6-tris(dimethylaminomethyl)phenol, and 1,8-diazabicyclo(5,4,0)-undecene.
- the above imidazole-based curing accelerators are 2-methylimidazole, 2-undecylimidazole, 2-heptadecylimidazole, 1,2-dimethylimidazole, 2-ethyl-4-methylimidazole, 1,2-dimethylimidazole, 2-ethyl-4-methylimidazole, 2-phenylimidazole, 2-phenyl-4-methylimidazole, 1-benzyl-2-methylimidazole, 1-benzyl-2-phenylimidazole, 1-cyanoethyl-2-methylimidazole, 1-cyanoethyl-2-undecylimidazole, 1-cyanoethyl-2-ethyl-4-methylimidazole, 1-cyanoethyl-2-phenylimidazole, 1-cyanoethyl-2-undecylimidazolium trimellitate, 1-Cyanoethyl-2-phenylimidazolium trimellitate
- the content of the curing accelerator may be 0.01 to 0.5 parts by weight based on 100 parts by weight of the total solid content of the resin composition.
- the resin composition may additionally include a solvent.
- the solvent may be applied without special limitation as long as it is known in the technical field to which the present invention pertains to enable the formation of a resin composition.
- the solvent may be one or more compounds selected from the group consisting of esters, ethers, ketones, aromatic hydrocarbons, and sulfoxides.
- ester solvents are ethyl acetate, n-butyl acetate, isobutyl acetate, amyl formate, isoamyl acetate, isobutyl acetate, butyl propionate, isopropyl butyrate, ethyl butyrate, butyl butyrate, methyl lactate, ethyl lactate, gamma-butyrolactone, epsilon-caprolactone, delta-valerolactone, alkyl oxyacetic acids (e.g., methyl oxyacetic acid, ethyl oxyacetic acid, butyl oxyacetic acid (e.g., methyl methoxyacetic acid, ethyl methoxyacetic acid, butyl methoxyacetic acid, methyl ethoxyacetic acid, ethyl ethoxyacetic acid, etc.)), alkyl 3-oxypropionic acid esters (e.g.
- 2-oxypropionic acid alkyl esters e.g., methyl 2-oxypropionate, ethyl 2-oxypropionate, propyl 2-oxypropionate, etc.
- the above ether solvent may be diethylene glycol dimethyl ether, tetrahydrofuran, ethylene glycol monomethyl ether, ethylene glycol monoethyl ether, methyl cellosolve acetate, ethyl cellosolve acetate, diethylene glycol monomethyl ether, diethylene glycol monoethyl ether, diethylene glycol monobutyl ether, propylene glycol monomethyl ether, propylene glycol monomethyl ether acetate, propylene glycol monoethyl ether acetate, propylene glycol monopropyl ether acetate, etc.
- the above ketone solvent may be methyl ethyl ketone (MEK), cyclohexanone, cyclopentanone, 2-heptanone, 3-heptanone, N-methyl-2-pyrrolidone, etc.
- MEK methyl ethyl ketone
- cyclohexanone cyclopentanone
- 2-heptanone 3-heptanone
- N-methyl-2-pyrrolidone etc.
- the above aromatic hydrocarbon solvent may be toluene, xylene, anisole, limonene, etc.
- the above sulfoxide solvent may be dimethyl sulfoxide, etc.
- the resin composition may include the solvent such that the solids concentration of the resin composition is 60% to 80%.
- the solids concentration of the resin composition satisfies the above range, it has an appropriate viscosity, facilitates coating, and can form a uniform insulating layer.
- the resin composition may further include additives known in the art.
- the additives may include, but are not limited to, one or more selected from a leveling agent, a wetting agent, and an antistatic agent.
- the leveling agent controls the flowability of the resin composition when used in the future, so that when applied to a surface in the future, defects such as craters are eliminated.
- the leveling agent known in the art include, but are not particularly limited to, BYK 350, BYK 354, BYK 356, BYK 359, and BYK 399.
- one type or two or more types of the leveling agent may be used in combination, and the content thereof may be appropriately changed as long as it does not deviate from the scope of the present invention.
- the wetting agent is a substance known in the art that accelerates wetting and aids in the coagulation of the inorganic filler.
- the wetting agent is not particularly limited to a specific substance. If necessary, one type of wetting agent may be used alone or in combination of two or more types, and the content may be appropriately varied without departing from the scope of the present invention.
- the antistatic agent is a substance known in the art that provides an antistatic effect, and is not particularly limited. Depending on the need, one type of antistatic agent may be used alone or in combination of two or more types, and the content may be appropriately varied without departing from the scope of the present invention.
- the resin composition may be applied to a printed circuit board. More specifically, the resin composition may be applied as an insulating film for a printed circuit board.
- the insulating film may be used as an interlayer insulating material for a multilayer printed circuit board.
- another embodiment of the present application provides an insulating film comprising the resin composition or a cured product thereof.
- the cured product can be obtained by thermal curing.
- the thermal curing may be performed by conditions and a heating device known in the art, and may be performed by curing and drying for a certain period of time under conditions of 100°C or higher, for example.
- the thickness of the insulating film according to one embodiment of the present application may be 5 ⁇ m or more, 10 ⁇ m or more, or 15 ⁇ m or more, and 50 ⁇ m or less, 40 ⁇ m or less, or 35 ⁇ m or less.
- the coefficient of thermal expansion of the insulating film according to one embodiment of the present application may be 25 ppm/°C or less.
- the lower limit of the thermal expansion coefficient value of the insulating film is not limited, but may be, for example, 0 ppm/°C or more.
- thermo mechanical analyzer TMA
- the above thermal expansion coefficient is a value measured using a thermo mechanical analyzer (TMA) in the range of 25°C to 120°C after heat-curing the insulating film at 190°C for 90 minutes.
- Insulating films that fall within the above-mentioned range of thermal expansion coefficients will not experience deformation such as peeling or cracking, as there will be little difference in expansion rate with the support in the future.
- the peel strength of the insulating film according to one embodiment of the present application may be 0.4 kgf/cm or more.
- the insulating film may have a peel strength of 0.4 kgf/cm or more when measured according to the ASTM D6862 method.
- the peel strength of the above insulating film is less than 0.4 kgf/cm, problems with blistering and reliability occur on the substrate.
- the above peel strength is obtained by measuring the 90-degree peel strength of the copper plating layer using a Stable Micro Systems Texture Analyzer (TA-XT Plus) after copper plating the insulating film as described below.
- TA-XT Plus Stable Micro Systems Texture Analyzer
- the surface roughness (Ra) of the insulating film according to one embodiment of the present application may be 200 nm or more and 400 nm or less, or 300 nm or more and 400 nm or less.
- the above surface roughness is obtained by laminating the insulating film on a CCL (copper clad laminate) substrate using a vacuum pressurized laminator at a temperature of 100°C and a pressure of 0.7 MPa for 30 seconds, followed by pre-cure in a hot air oven at 100°C for 30 minutes and then at 170°C for 30 minutes, and then peeling off the supporting film (PET film) of the insulator to expose the insulating layer, followed by desmear treatment.
- CCL copper clad laminate
- the desmear treatment is performed in three steps: swelling solution treatment (60°C, 5 minutes) - oxidation solution treatment (80°C, 20 minutes) - neutralizing solution treatment (50°C, 4 minutes) using Atotech's Securiganth MV series treatment solution.
- the surface of the insulating layer treated with desmear is measured 5 times per sample using an Optical Profiler (Nanoview 3D surface profiler NV-2700, Nanosystem) (WSI mode, 20x lens), and the surface roughness (Ra) is calculated as the average value.
- the above insulating film uses the above-described resin composition as is or a cured product thereof, the contents regarding the resin composition can be applied.
- another embodiment of the present application provides a printed circuit board including the insulating film.
- the above printed circuit board may be a multilayer printed circuit board, and the number of layers included in the multilayer printed circuit board is not limited.
- the multilayer printed circuit board may include a structure of 2 to 20 layers.
- epoxy resin 22 parts by weight of bisphenol-based epoxy resin (YD-128, Kukdo Chemical), 66 parts by weight of phenol novolac-type epoxy resin (YDPN-639, Kukdo Chemical), 33 parts by weight of bixylenol-type epoxy resin (YX-4000H), 31 parts by weight of naphthalene-containing phenol-based resin (SN-485), 22 parts by weight of triazine-containing phenol-based resin (LA-1356, DIC), 315 parts by weight of silica slurry (SOC2) having an average particle size of 0.1 ⁇ m, and 10 parts by weight of polyvinyl acetal resin (KS-1) were mixed in MEK (methyl ethyl ketone) solvent to a total solid concentration of 70%, and stirred with a mechanical stirrer at 250 rpm for 3 hours, and 2.5 parts by weight of a curing accelerator (DMAP) was mixed using a paste mixer to prepare a coating solution. It was manufactured.
- MEK methyl eth
- the manufactured coating solution was coated on a 38 ⁇ m thick PET film using an applicator, and then dried at 100 °C for 8 minutes to manufacture an insulating film (Example 1) having a thickness of 30 ⁇ m.
- the composition ratio of the epoxy group of the epoxy resin and the hydroxyl group of the phenolic resin is 1:0.48, and the weight ratio of the naphthalene-containing phenolic resin and the triazine-containing phenolic resin is 1.4:1.
- An insulating film was manufactured using the same method as Manufacturing Example 1, except that the composition and content (parts by weight) described in Table 1 below were changed.
- the insulating film was cut into samples with a width of 4.8 mm, a length of 16 mm, and a thickness of 30 ⁇ m, and after heat curing at 190°C for 90 minutes, the thermal expansion coefficient was measured in the range of 25°C to 120°C using a thermo mechanical analyzer (TMA).
- TMA thermo mechanical analyzer
- the insulating film was laminated on a CCL (copper clad laminate) substrate by pressing it for 30 seconds using a vacuum pressurized laminator at a temperature of 100°C and a pressure of 0.7 MPa, and then pre-cured in a hot air oven at 100°C for 30 minutes and then at 170°C for 30 minutes.
- CCL copper clad laminate
- the supporting film (PET film) of the insulator was peeled off to expose the insulating layer, and then desmear treatment was performed.
- the desmear treatment was performed in three steps: swelling solution treatment (60°C, 5 minutes) - oxidation solution treatment (80°C, 20 minutes) - neutralizing solution treatment (50°C, 4 minutes) using Atotech's Securiganth MV series treatment solution.
- the surface of the desmear-treated insulating layer was measured five times per sample using an Optical Profiler (Nanoview 3D surface profiler NV-2700, Nanosystem) (WSI mode, 20x lens), and the surface roughness (Ra) was calculated as the average value.
- Optical Profiler Nanoview 3D surface profiler NV-2700, Nanosystem
- WSI mode 20x lens
- Ra surface roughness
- Electroless chemical copper plating was performed using Atotech's Printoganth MV product to a plating thickness of 0.5 to 1.0 ⁇ m, and after treatment, it was dried in a hot air oven at 150°C for 30 minutes.
- Electroplating was performed using Atotech's Expt Inpro SAP6 chemical to a plating thickness of approximately 20 ⁇ m, and after treatment, heat treatment was performed in a hot air oven at 190 °C for 1 hour.
- the 90-degree peel strength of the copper plating layer was measured using a Stable Micro Systems Texture Analyzer (TA-XT Plus).
- the insulating films of Examples 1 to 3 exhibited excellent properties as insulating films by satisfying a thermal expansion coefficient of 25 ppm/°C or less, having a high peel strength of 0.4 kgf/cm or more, and implementing an appropriate surface roughness value of 200 nm or more and 400 nm or less.
- Comparative Example 1 does not satisfy the range of the present invention in the ratio (composition ratio) of the epoxy group of the epoxy resin and the hydroxyl group of the phenolic resin, so although the thermal expansion coefficient is appropriate, the surface roughness is low and the peel strength has a value of less than 0.4 kgf/cm, so that a short circuit occurs in a future reliability test, and therefore it can be seen that it is unsuitable as an insulating film.
- Comparative Examples 2 and 3 used only one type of phenolic resin
- Comparative Example 4 used two types of phenolic resins, but used a biphenyl aralkyl-containing phenolic resin and a triazine-containing phenolic resin, that is, did not use a naphthalene-containing phenolic resin.
- Comparative Example 2 it can be seen that it is unsuitable for use as an insulating film due to the occurrence of blisters, and Comparative Examples 3 and 4 have a coefficient of thermal expansion exceeding 25 ppm/°C, making it difficult to secure minimal warpage and may cause low yield problems, and the peel strength does not reach 0.4 kgf/cm, causing short circuits in future reliability tests, so it can be seen that it is highly unsuitable for use as an insulating film.
- Comparative Example 5 used two types of epoxy resin instead of three, and the use of a phenol novolac-type epoxy resin was omitted. Therefore, although the composition of the phenol hardener and the composition ratio of the epoxy group and the hydroxyl group satisfied the present invention, it was confirmed that the peel strength was less than 0.4 kgf/cm, making it unsuitable for use as an insulating film. Comparative Example 6 did not include a thermoplastic resin, and it was confirmed that the peel strength was less than 0.4 kgf/cm, making it unsuitable for use as an insulating film.
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Abstract
Description
본 출원은 수지 조성물, 이를 포함하는 절연 필름 및 인쇄회로기판에 관한 것이다.The present application relates to a resin composition, an insulating film comprising the same, and a printed circuit board.
본 출원은 2024년 5월 7일 한국 특허청에 제출된 한국특허출원 제10-2024-0059982호 및 2025년 4월 30일 한국 특허청에 제출된 한국특허출원 제10-2025-0057668호의 출원일의 이익을 주장하며, 그 내용은 전부 본 명세서에 포함된다.This application claims the benefit of the filing dates of Korean Patent Application No. 10-2024-0059982, filed with the Korean Intellectual Property Office on May 7, 2024, and Korean Patent Application No. 10-2025-0057668, filed with the Korean Intellectual Property Office on April 30, 2025, the contents of which are incorporated herein in their entirety.
전자기기의 소형화, 고성능화가 진행되어 다층 인쇄회로기판의 빌드업층이 다층화되고 있다. 이러한 다층 인쇄회로기판에서는 구리 배선과 절연층과의 열팽창계수가 크게 다르기 때문에, 서멀 사이클 등의 신뢰성 시험을 실시하면 구리 배선 또는 절연층에 균열이 생기는 등의 문제가 발생한다. 따라서, 절연층을 구성하는 수지 조성물의 열팽창율을 낮게 억제하는 것이 급선무가 되고 있다.As electronic devices become increasingly miniaturized and higher-performance, the buildup layers of multilayer printed circuit boards are becoming more multilayered. In these multilayer printed circuit boards, the coefficients of thermal expansion of the copper wiring and the insulating layer differ significantly. Therefore, reliability tests such as thermal cycling can lead to problems such as cracking in the copper wiring or the insulating layer. Therefore, suppressing the thermal expansion of the resin composition that constitutes the insulating layer has become an urgent task.
열팽창율을 억제하는 수단의 하나로서 수지 조성물 중에 무기 충전재를 첨가하는 방법이 일반적으로 사용되고 있으며, 무기 충전재의 첨가량이 많을수록 열팽창율을 저하시키는 효과가 있다. 그러나, 조성물의 무기 충전재가 다량 포함되게 되면, 코팅액 자체의 점도 조절이 힘들뿐만 아니라 조화처리 후의 표면에 무기 충전재가 노출되는 부분이 많아져, 도금에 의해 형성되는 도체층의 필(peel) 강도(박리강도)가 저하되는 문제가 있다. One commonly used method for suppressing thermal expansion coefficient is to add inorganic fillers to the resin composition. The greater the amount of inorganic filler added, the more effective it is in lowering the thermal expansion coefficient. However, if the composition contains a large amount of inorganic filler, not only is it difficult to control the viscosity of the coating solution itself, but the inorganic filler is exposed to a greater extent on the surface after roughening, which reduces the peel strength (peeling strength) of the conductive layer formed by plating.
이를 해결하기 위해 적정 함량의 무기 충전재를 사용하여 열팽창율을 저하시키면서도 우수한 필 강도를 가지는 조성물에 대한 연구가 필요하다.To solve this problem, research is needed on a composition that has excellent peel strength while reducing the thermal expansion coefficient by using an appropriate amount of inorganic filler.
[선행기술문헌][Prior Art Literature]
(특허문헌 1) 대한민국 특허공개공보 제2012-0107277호(Patent Document 1) Republic of Korea Patent Publication No. 2012-0107277
본 출원은 수지 조성물, 이를 포함하는 절연 필름 및 인쇄회로기판을 제공하고자 한다.The present application seeks to provide a resin composition, an insulating film comprising the same, and a printed circuit board.
본 출원의 일 실시상태는, 에폭시 수지; 2종 이상의 페놀계 수지; 열가소성 수지; 및 무기 충전재를 포함하는 수지 조성물을 제공하고, 상기 에폭시 수지의 에폭시기와 상기 페놀계 수지의 하이드록시기의 비율이 1:0.5 내지 1:0.01이며, 상기 에폭시 수지는 비스페놀계 에폭시 수지; 페놀노볼락형 에폭시 수지; 및 비크실레놀형 에폭시 수지를 포함하고, 상기 페놀계 수지는 나프탈렌 함유 페놀계 수지 및 트리아진 함유 페놀계 수지를 포함하고, 상기 나프탈렌 함유 페놀계 수지와 상기 트리아진 함유 페놀계 수지의 중량비가 1:2 내지 2:1이다.One embodiment of the present application provides a resin composition comprising an epoxy resin; two or more kinds of phenolic resins; a thermoplastic resin; and an inorganic filler, wherein the ratio of an epoxy group of the epoxy resin to a hydroxyl group of the phenolic resin is 1:0.5 to 1:0.01, the epoxy resin includes a bisphenol-type epoxy resin; a phenol novolac-type epoxy resin; and a bixylenol-type epoxy resin, and the phenolic resin includes a naphthalene-containing phenolic resin and a triazine-containing phenolic resin, and the weight ratio of the naphthalene-containing phenolic resin and the triazine-containing phenolic resin is 1:2 to 2:1.
또한, 본 출원의 다른 실시상태는, 상기 수지 조성물 또는 이의 경화물을 포함하는 절연 필름을 제공한다.In addition, another embodiment of the present application provides an insulating film comprising the resin composition or a cured product thereof.
또한 본 출원의 다른 실시상태는, 상기 절연 필름을 포함하는 인쇄회로기판을 제공한다.In addition, another embodiment of the present application provides a printed circuit board including the insulating film.
본 출원의 일 실시상태에 따른 수지 조성물은, 경화제로서 나프탈렌 함유 페놀계 수지와 트리아진 함유 페놀계 수지를 특정 중량비로 포함하고, 에폭시 수지로서 특정 3종을 포함하며, 에폭시 수지의 에폭시기와 페놀계 수지의 하이드록시기의 조성비가 특정 비율이 되도록 에폭시 수지와 페놀계 수지를 적용함으로써, 무기 충전재가 높은 함량으로 포함되더라도, 열팽창계수를 적절히 낮춰 향후 다층 인쇄회로기판에서 서멀 사이클 등의 신뢰성 문제를 최소화할 수 있다. 또한, 도체층의 필 강도가 적정 수준 이상인 우수한 절연층을 형성할 수 있다.A resin composition according to one embodiment of the present application comprises a naphthalene-containing phenolic resin and a triazine-containing phenolic resin as a curing agent at a specific weight ratio, comprises three specific epoxy resins, and applies the epoxy resin and the phenolic resin such that the composition ratio of the epoxy group of the epoxy resin and the hydroxyl group of the phenolic resin is a specific ratio, thereby appropriately lowering the coefficient of thermal expansion even if an inorganic filler is included in a high content, thereby minimizing reliability problems such as thermal cycles in future multilayer printed circuit boards. In addition, an excellent insulating layer having a peel strength of a conductor layer at an appropriate level or higher can be formed.
따라서, 본 출원의 일 실시상태에 따른 수지 조성물을 이용하여 제조된 다층 인쇄회로기판은 우수한 열팽창율 물성을 가지면서 디스미어 처리에 의해 적절한 표면 조도를 가지게 되어 우수한 동박 밀착력을 제공할 수 있다.Therefore, a multilayer printed circuit board manufactured using a resin composition according to one embodiment of the present application has excellent thermal expansion coefficient properties and has an appropriate surface roughness through desmear treatment, thereby providing excellent copper foil adhesion.
이하, 본 출원에 대하여 더욱 상세하게 설명한다.Hereinafter, the present application will be described in more detail.
본 출원에 있어서, 어떤 부재가 다른 부재 “상에” 위치하고 있다고 할 때, 이는 어떤 부재가 다른 부재에 접해 있는 경우뿐 아니라 두 부재 사이에 또 다른 부재가 존재하는 경우도 포함한다.In the present application, when it is said that a member is located “on” another member, this includes not only cases where a member is in contact with another member, but also cases where another member exists between the two members.
본 출원에서 어떤 부분이 어떤 구성요소를 "포함" 한다고 할 때, 이는 특별히 반대되는 기재가 없는 한 다른 구성요소를 제외하는 것이 아니라 다른 구성 요소를 더 포함할 수 있는 것을 의미한다.When a part in this application is said to "include" a certain component, this does not mean that it excludes other components, but rather that it may include other components, unless specifically stated otherwise.
본 출원에 있어서, 'A 내지 B'는 A 이상 B 이하의 범위를 의미한다.In this application, 'A to B' means a range of A to B.
다층 인쇄회로기판을 제조하는 방식으로 도체층과 절연 필름을 교대로 적층하는 방식이 개발되어, 현재 반도체패키징 용도로 사용되고 있다. 상기 다층 인쇄회로기판의 제조공정은 먼저 내층 회로 위에 빌드업 절연 필름을 진공 합지한 후, 프리큐어(Precure)→드릴링→디스미어(Desmear)→무전해 도금→전해도금→포스트큐어(Postcure)→외층 회로 형성의 과정을 거친다. 여기서 디스미어(Desmear) 공정은 산성 용액으로 smear를 제거함과 동시에 절연 필름의 표면을 일정량 침식시켜 표면 조도를 형성하는 작용을 하는데, 이는 이후 공정에서 형성되는 동박층과의 밀착력을 높이는 역할을 한다.A method of manufacturing multilayer printed circuit boards by alternately laminating conductor layers and insulating films has been developed, and is currently being used for semiconductor packaging purposes. The manufacturing process of the multilayer printed circuit board first vacuum-laminated a build-up insulating film on the inner layer circuit, and then goes through the steps of precure → drilling → desmear → electroless plating → electroplating → postcure → outer layer circuit formation. Here, the desmear process removes smear with an acid solution and simultaneously forms surface roughness by eroding the surface of the insulating film by a certain amount, which serves to increase adhesion with the copper foil layer formed in the subsequent process.
상기 빌드업 절연 필름을 위한 수지 조성물로는 에폭시 수지와 페놀계 경화제에 무기 충전재를 첨가한 조성물이 사용되었으나, 목적하는 열팽창율을 얻기 위해 무기 충전재의 첨가량을 늘릴수록, 코팅액의 점도 조절에 어려움이 있고, 조화 처리 후 표면에 무기 충전재가 과하게 노출되어 필 강도가 저하되게 된다.As a resin composition for the above build-up insulating film, a composition was used in which an inorganic filler was added to an epoxy resin and a phenolic hardener. However, as the amount of inorganic filler added is increased to obtain the desired thermal expansion coefficient, it becomes difficult to control the viscosity of the coating solution, and after the harmonization treatment, the inorganic filler is excessively exposed on the surface, resulting in a decrease in peel strength.
이에, 본 출원에서는 적정 함량의 무기 충전재를 사용하여 원하는 열팽창율을 얻으면서 높은 필 강도를 갖는 수지 조성물 및 이를 포함하는 인쇄회로기판을 제공하고자 한다.Accordingly, the present application seeks to provide a resin composition having high peel strength while obtaining a desired thermal expansion coefficient by using an appropriate amount of inorganic filler, and a printed circuit board including the same.
본 출원의 일 실시상태에 따른 수지 조성물은, 에폭시 수지; 2종 이상의 페놀계 수지; 열가소성 수지; 및 무기 충전재를 포함하고, 상기 에폭시 수지의 에폭시기와 상기 페놀계 수지의 하이드록시기의 비율(조성비)이 1:0.5 내지 1:0.01이며, 상기 에폭시 수지는 비스페놀계 에폭시 수지; 페놀노볼락형 에폭시 수지; 및 비크실레놀형 에폭시 수지를 포함하고, 상기 페놀계 수지는 나프탈렌 함유 페놀계 수지 및 트리아진 함유 페놀계 수지를 포함하고, 상기 나프탈렌 함유 페놀계 수지와 상기 트리아진 함유 페놀계 수지의 중량비가 1:2 내지 2:1인 것이 특징이다.A resin composition according to one embodiment of the present application comprises an epoxy resin; two or more kinds of phenolic resins; a thermoplastic resin; and an inorganic filler, wherein a ratio (composition ratio) of an epoxy group of the epoxy resin and a hydroxyl group of the phenolic resin is 1:0.5 to 1:0.01, and the epoxy resin comprises a bisphenol-based epoxy resin; a phenol novolac-type epoxy resin; and a bixylenol-type epoxy resin, and the phenolic resin comprises a naphthalene-containing phenolic resin and a triazine-containing phenolic resin, and the weight ratio of the naphthalene-containing phenolic resin and the triazine-containing phenolic resin is 1:2 to 2:1.
이하 각 구성에 대해 설명한다.Each component is described below.
에폭시 수지epoxy resin
본 출원의 일 실시상태에 있어서, 상기 에폭시 수지는 비스페놀계 에폭시 수지; 페놀노볼락형 에폭시 수지; 및 비크실레놀형 에폭시 수지를 포함한다.In one embodiment of the present application, the epoxy resin includes a bisphenol-based epoxy resin; a phenol novolac-type epoxy resin; and a bixylenol-type epoxy resin.
본 출원의 일 실시상태에 있어서, 상기 비스페놀계 에폭시 수지는 비스페놀 A형 에폭시 수지, 비스페놀 F형 에폭시 수지, 또는 비스페놀 S형 에폭시 수지일 수 있다.In one embodiment of the present application, the bisphenol-based epoxy resin may be a bisphenol A type epoxy resin, a bisphenol F type epoxy resin, or a bisphenol S type epoxy resin.
본 출원의 일 실시상태에 있어서, 상기 비스페놀계 에폭시 수지는 YD-113, YD-114, YD-114E, YD-114F, YD-115, YD-115G, YD-115CA, KD-1818, YD-127, YD-128, YD-128S, YD-134, YD-136 (국도화학), EXA-4850-150, EXA-4850-1000 (DIC) 등에서 선택될 수 있으나, 이에 한정되지 않는다.In one embodiment of the present application, the bisphenol-based epoxy resin may be selected from YD-113, YD-114, YD-114E, YD-114F, YD-115, YD-115G, YD-115CA, KD-1818, YD-127, YD-128, YD-128S, YD-134, YD-136 (Kukdo Chemical), EXA-4850-150, EXA-4850-1000 (DIC), etc., but is not limited thereto.
본 출원의 일 실시상태에 있어서, 상기 페놀노볼락형 에폭시 수지는 YDPN-638, YDPN-639, KT-7804 (국도화학) 등에서 선택될 수 있으나, 이에 한정되지 않는다.In one embodiment of the present application, the phenol novolac type epoxy resin may be selected from YDPN-638, YDPN-639, KT-7804 (Kukdo Chemical), etc., but is not limited thereto.
본 출원의 일 실시상태에 있어서, 상기 비크실레놀형 에폭시 수지는 YX-4000H, YX-4000, YX-4000HK, YL-7890 (미쯔비시 화학) 등에서 선택될 수 있으나, 이에 한정되지 않는다.In one embodiment of the present application, the bixylenol-type epoxy resin may be selected from YX-4000H, YX-4000, YX-4000HK, YL-7890 (Mitsubishi Chemical), etc., but is not limited thereto.
본 출원의 일 실시상태에 있어서, 상기 수지 조성물은 상기 에폭시 수지를 4종 이상 포함할 수 있다.In one embodiment of the present application, the resin composition may include four or more types of the epoxy resin.
본 출원의 일 실시상태에 있어서, 상기 수지 조성물은 상기 비스페놀계 에폭시 수지; 페놀노볼락형 에폭시 수지; 및 비크실레놀형 에폭시 수지 이외의 추가의 에폭시 수지를 더 포함할 수 있다.In one embodiment of the present application, the resin composition may further include an additional epoxy resin other than the bisphenol-based epoxy resin; the phenol novolac-type epoxy resin; and the bixylenol-type epoxy resin.
본 출원의 일 실시상태에 있어서, 상기 추가의 에폭시 수지는 당업계에 알려진 것을 제한 없이 사용할 수 있으나, 1 분자 내에 에폭시기가 2개 이상 존재하는 것이 바람직하다. 보다 구체적으로, 상기 에폭시 수지는 나프탈렌형 에폭시 수지; 안트라센형 에폭시 수지; 비페닐형 에폭시 수지; 테트라메틸 비페닐형 에폭시 수지; 크레졸 노볼락형 에폭시 수지; 비스페놀 A 노볼락형 에폭시 수지; 비스페놀 S 노볼락형 에폭시 수지; 비페닐 노볼락형 에폭시 수지; 나프톨 노볼락형 에폭시 수지; 나프톨 페놀 공축 노볼락형 에폭시 수지; 나프톨 코레졸 공축 노볼락형 에폭시 수지; 방향족 탄화수소 포름알데히드 수지 변성 페놀 수지형 에폭시 수지; 트리페닐 메탄형 에폭시 수지; 테트라 페닐에탄형 에폭시 수지; 디시클로펜타디엔 페놀 부가반응형 에폭시 수지; 페놀 아랄킬형 에폭시 수지; 나프톨 아랄킬형 에폭시 수지 등에서 선택될 수 있다.In one embodiment of the present application, the additional epoxy resin may be any one known in the art without limitation, but it is preferred that two or more epoxy groups exist in one molecule. More specifically, the epoxy resin may be selected from naphthalene-type epoxy resin; anthracene-type epoxy resin; biphenyl-type epoxy resin; tetramethyl biphenyl-type epoxy resin; cresol novolac-type epoxy resin; bisphenol A novolac-type epoxy resin; bisphenol S novolac-type epoxy resin; biphenyl novolac-type epoxy resin; naphthol novolac-type epoxy resin; naphthol phenol cocondensed novolac-type epoxy resin; naphthol coresol cocondensed novolac-type epoxy resin; aromatic hydrocarbon formaldehyde resin-modified phenol resin-type epoxy resin; triphenyl methane-type epoxy resin; tetraphenylethane-type epoxy resin; dicyclopentadiene phenol addition-reaction epoxy resin; phenol aralkyl-type epoxy resin; naphthol aralkyl-type epoxy resin, etc.
본 출원의 일 실시상태에 있어서, 상기 에폭시 수지의 총 함량은 상기 수지 조성물 전체 고형분 100 중량부 기준 10 중량부 내지 30 중량부일 수 있다.In one embodiment of the present application, the total content of the epoxy resin may be 10 to 30 parts by weight based on 100 parts by weight of the total solid content of the resin composition.
본 출원의 일 실시상태에 있어서, 상기 에폭시 수지의 총 함량은 상기 수지 조성물 전체 고형분 100 중량부 기준 20 중량부 내지 27 중량부일 수 있다.In one embodiment of the present application, the total content of the epoxy resin may be 20 to 27 parts by weight based on 100 parts by weight of the total solid content of the resin composition.
상기 수지 조성물 내 상기 에폭시 수지의 함량이 상기 범위 내에 있을 경우, 성형성 및 가공성이 개선되고, 디스미어 공정시 적절한 조도 형성에 필요한 물성을 확보할 수 있다.When the content of the epoxy resin in the resin composition is within the above range, the formability and processability are improved, and the properties necessary for forming an appropriate roughness during the desmear process can be secured.
본 출원의 일 실시상태에 있어서, 상기 비스페놀계 에폭시 수지; 페놀노볼락형 에폭시 수지; 및 비크실레놀형 에폭시 수지의 각 함량은 상기 에폭시 수지의 총 함량 범위를 만족하고, 상기 에폭시 수지의 에폭시기와 상기 페놀계 수지의 하이드록시기의 비율 범위를 만족하는 것이라면 한정되지 않는다.In one embodiment of the present application, the content of each of the bisphenol-based epoxy resin; phenol novolac-type epoxy resin; and bixylenol-type epoxy resin is not limited as long as it satisfies the total content range of the epoxy resin and the ratio range of the epoxy group of the epoxy resin and the hydroxyl group of the phenol-based resin.
본 출원의 일 실시상태에 있어서, 상기 수지 조성물은 상기 에폭시 수지 전체 100 중량부 기준 상기 비스페놀계 에폭시 수지 10 중량부 내지 30 중량부; 상기 페놀노볼락형 에폭시 수지 40 중량부 내지 60 중량부; 및 비크실레놀형 에폭시 수지 20 중량부 내지 40 중량부를 포함할 수 있다.In one embodiment of the present application, the resin composition may include 10 to 30 parts by weight of the bisphenol-based epoxy resin; 40 to 60 parts by weight of the phenol novolac-type epoxy resin; and 20 to 40 parts by weight of the bixylenol-type epoxy resin, based on 100 parts by weight of the total epoxy resin.
본 출원의 일 실시상태에 있어서, 상기 수지 조성물은 상기 에폭시 수지 전체 100 중량부 기준 상기 비스페놀계 에폭시 수지 10 중량부 내지 30 중량부; 상기 페놀노볼락형 에폭시 수지 20 중량부 내지 40 중량부; 및 비크실레놀형 에폭시 수지 40 중량부 내지 60 중량부를 포함할 수 있다.In one embodiment of the present application, the resin composition may include 10 to 30 parts by weight of the bisphenol-based epoxy resin; 20 to 40 parts by weight of the phenol novolac-type epoxy resin; and 40 to 60 parts by weight of the bixylenol-type epoxy resin, based on 100 parts by weight of the total epoxy resin.
페놀계 수지phenolic resin
본 출원의 일 실시상태에 있어서, 상기 수지 조성물은 2종 이상의 페놀계 수지를 포함하고, 상기 페놀계 수지는 나프탈렌 함유 페놀계 수지 및 트리아진 함유 페놀계 수지를 포함하며, 상기 나프탈렌 함유 페놀계 수지와 상기 트리아진 함유 페놀계 수지의 중량비는 1:2 내지 2:1이다.In one embodiment of the present application, the resin composition includes two or more kinds of phenolic resins, the phenolic resins include a naphthalene-containing phenolic resin and a triazine-containing phenolic resin, and the weight ratio of the naphthalene-containing phenolic resin and the triazine-containing phenolic resin is 1:2 to 2:1.
본 출원의 일 실시상태에 있어서, 상기 페놀계 수지는 수지 조성물 내에서 경화제 역할을 하는 것으로, 페놀계 경화제로 지칭될 수 있다.In one embodiment of the present application, the phenolic resin acts as a curing agent in the resin composition and may be referred to as a phenolic curing agent.
상기 수지 조성물은 경화제로서 특정 종류의 페놀계 수지 2종을 상기 중량비 범위 내로 사용함으로써, 무기 충전재 사용에 따른 필 강도 저하를 방지하는 효과를 제공한다.The above resin composition provides an effect of preventing a decrease in peel strength due to the use of an inorganic filler by using two types of specific phenolic resins as a hardener within the above weight ratio range.
본 출원의 일 실시상태에 있어서, 상기 나프탈렌 함유 페놀계 수지와 상기 트리아진 함유 페놀계 수지의 중량비는 1:1 내지 2:1일 수 있고, 바람직하게는 1:1 내지 1.8:1일 수 있다.In one embodiment of the present application, the weight ratio of the naphthalene-containing phenolic resin and the triazine-containing phenolic resin may be 1:1 to 2:1, and preferably 1:1 to 1.8:1.
본 출원의 일 실시상태에 있어서, 상기 나프탈렌 함유 페놀계 수지는 하기 구조식 1로 표시되는 구조를 포함할 수 있다.In one embodiment of the present application, the naphthalene-containing phenolic resin may include a structure represented by the following structural formula 1.
[구조식 1] [Structural formula 1]
상기 구조식 1에 있어서,In the above structural formula 1,
는 다른 구조와의 연결 부위이고, is a connection point with other structures,
X1 및 X2는 서로 동일 또는 상이하고, 각각 독립적으로 2가의 유기기이고, X1 and X2 are the same or different from each other, and each independently represents a divalent organic group,
a 및 b는 서로 동일 또는 상이하고, 각각 독립적으로 1 내지 6의 정수이고, a and b are equal to or different from each other and are each independently an integer from 1 to 6,
n은 1 내지 20의 정수이다.n is an integer from 1 to 20.
본 출원의 일 실시상태에 있어서, X1 및 X2는 서로 동일 또는 상이하고, 각각 독립적으로 치환 또는 비치환된 알킬렌기; 치환 또는 비치환된 아릴렌기; 또는 치환 또는 비치환된 2가의 아민기일 수 있다.In one embodiment of the present application, X1 and X2 may be the same as or different from each other, and may each independently be a substituted or unsubstituted alkylene group; a substituted or unsubstituted arylene group; or a substituted or unsubstituted divalent amine group.
본 출원의 일 실시상태에 있어서, X1 및 X2는 서로 동일 또는 상이하고, 각각 독립적으로 치환 또는 비치환된 C1 내지 C30의 알킬렌기; 치환 또는 비치환된 C6 내지 C30의 아릴렌기; 또는 치환 또는 비치환된 2가의 아민기일 수 있다.In one embodiment of the present application, X1 and X2 may be the same as or different from each other, and may each independently be a substituted or unsubstituted C1 to C30 alkylene group; a substituted or unsubstituted C6 to C30 arylene group; or a substituted or unsubstituted divalent amine group.
본 출원의 일 실시상태에 있어서, a 및 b는 서로 동일 또는 상이하고, 각각 독립적으로 1 내지 6의 정수이고, 바람직하게는 1 내지 4의 정수, 더 바람직하게는 1 또는 2, 가장 바람직하게는 1일 수 있다.In one embodiment of the present application, a and b are the same or different from each other, and are each independently an integer from 1 to 6, preferably an integer from 1 to 4, more preferably 1 or 2, and most preferably 1.
본 출원의 일 실시상태에 있어서, n이 2 이상의 정수일 경우 괄호 내 반복단위의 구조가 서로 동일하거나 상이할 수 있다.In one embodiment of the present application, when n is an integer greater than or equal to 2, the structures of the repeating units within the parentheses may be the same or different from each other.
본 출원의 일 실시상태에 있어서, 상기 나프탈렌 함유 페놀계 수지의 말단기는 수소; 히드록시기; 에스터기; 시아네이트에스터기; 치환 또는 비치환된 알킬기; 또는 치환 또는 비치환된 아릴기일 수 있으나, 이에 제한되는 것은 아니다. In one embodiment of the present application, the terminal group of the naphthalene-containing phenolic resin may be, but is not limited to, hydrogen; a hydroxyl group; an ester group; a cyanate ester group; a substituted or unsubstituted alkyl group; or a substituted or unsubstituted aryl group.
본 명세서에서, 상기 에스터기는 활성 에스터기를 의미할 수 있다. 활성 에스터기는 친핵성 공격에 민감한 에스터 작용기로서, 노르말 에스터의 아실 또는 알콕시 성분이 변형된 형태일 수 있다.In the present specification, the ester group may refer to an active ester group. The active ester group is an ester functional group that is susceptible to nucleophilic attack, and may be a modified form of the acyl or alkoxy component of a normal ester.
본 출원의 일 실시상태에 있어서, 상기 나프탈렌 함유 페놀계 수지의 말단기는 수소; 치환 또는 비치환된 C1 내지 C30의 알킬기; 또는 치환 또는 비치환된 C6 내지 C30의 아릴기일 수 있으나, 이에 제한되는 것은 아니다.In one embodiment of the present application, the terminal group of the naphthalene-containing phenolic resin may be, but is not limited to, hydrogen; a substituted or unsubstituted C1 to C30 alkyl group; or a substituted or unsubstituted C6 to C30 aryl group.
본 출원의 일 실시상태에 있어서, 상기 나프탈렌 함유 페놀계 수지는 SN-395, SN-485, SN-395 (신닛테츠가가쿠 사) 등이 있으나, 이에 제한되는 것은 아니다.In one embodiment of the present application, the naphthalene-containing phenolic resin includes, but is not limited to, SN-395, SN-485, SN-395 (Nippon Steel Chemical Co., Ltd.).
본 출원의 일 실시상태에 있어서, 상기 트리아진 함유 페놀계 수지는 하기 구조식 2로 표시되는 구조를 포함할 수 있다.In one embodiment of the present application, the triazine-containing phenolic resin may include a structure represented by the following structural formula 2.
[구조식 2] [Structural formula 2]
상기 구조식 2에 있어서,In the above structural formula 2,
는 다른 구조와의 연결 부위이고, is a connection point with other structures,
X3 및 X4는 서로 동일 또는 상이하고, 각각 독립적으로 2가의 유기기이고, X3 and X4 are the same or different from each other, and each independently represents a divalent organic group,
R1은 수소; 치환 또는 비치환된 알킬기; 치환 또는 비치환된 아릴기; 또는 치환 또는 비치환된 아민기이고,R1 is hydrogen; a substituted or unsubstituted alkyl group; a substituted or unsubstituted aryl group; or a substituted or unsubstituted amine group,
c 및 d는 서로 동일 또는 상이하고, 각각 독립적으로 1 내지 4의 정수이고, c and d are the same or different from each other, and are each independently an integer from 1 to 4,
m은 1 내지 20의 정수이다.m is an integer from 1 to 20.
본 출원의 일 실시상태에 있어서, R1은 수소; 치환 또는 비치환된 C1 내지 C30의 알킬기; 치환 또는 비치환된 C6 내지 C30의 아릴기; 또는 치환 또는 비치환된 아민기일 수 있다.In one embodiment of the present application, R1 may be hydrogen; a substituted or unsubstituted C1 to C30 alkyl group; a substituted or unsubstituted C6 to C30 aryl group; or a substituted or unsubstituted amine group.
본 출원의 일 실시상태에 있어서, X3 및 X4는 서로 동일 또는 상이하고, 각각 독립적으로 치환 또는 비치환된 알킬렌기; 치환 또는 비치환된 아릴렌기; 또는 치환 또는 비치환된 2가의 아민기일 수 있다.In one embodiment of the present application, X3 and X4 may be the same as or different from each other, and may each independently be a substituted or unsubstituted alkylene group; a substituted or unsubstituted arylene group; or a substituted or unsubstituted divalent amine group.
본 출원의 일 실시상태에 있어서, X3 및 X4는 서로 동일 또는 상이하고, 각각 독립적으로 치환 또는 비치환된 C1 내지 C30의 알킬렌기; 치환 또는 비치환된 C6 내지 C30 아릴렌기; 또는 치환 또는 비치환된 2가의 아민기일 수 있다.In one embodiment of the present application, X3 and X4 may be the same as or different from each other, and may each independently be a substituted or unsubstituted C1 to C30 alkylene group; a substituted or unsubstituted C6 to C30 arylene group; or a substituted or unsubstituted divalent amine group.
본 출원의 일 실시상태에 있어서, c 및 d는 서로 동일 또는 상이하고, 각각 독립적으로 1 내지 4의 정수이고, 바람직하게는 1 내지 3의 정수, 더 바람직하게는 1 또는 2, 가장 바람직하게는 1일 수 있다.In one embodiment of the present application, c and d are the same or different from each other, and are each independently an integer from 1 to 4, preferably an integer from 1 to 3, more preferably 1 or 2, and most preferably 1.
본 출원의 일 실시상태에 있어서, 상기 트리아진 함유 페놀계 수지의 말단기는 수소; 치환 또는 비치환된 알킬기; 또는 치환 또는 비치환된 아릴기일 수 있고, 바람직하게는 수소 또는 메틸기일 수 있다.In one embodiment of the present application, the terminal group of the triazine-containing phenolic resin may be hydrogen; a substituted or unsubstituted alkyl group; or a substituted or unsubstituted aryl group, and preferably may be hydrogen or a methyl group.
본 출원의 일 실시상태에 있어서, 상기 트리아진 함유 페놀계수지의 말단기는 수소; 치환 또는 비치환된 C1 내지 C30의 알킬기; 또는 치환 또는 비치환된 C6 내지 C30의 아릴기일 수 있다.In one embodiment of the present application, the terminal group of the triazine-containing phenolic resin may be hydrogen; a substituted or unsubstituted C1 to C30 alkyl group; or a substituted or unsubstituted C6 to C30 aryl group.
본 출원의 일 실시상태에 있어서, 상기 트리아진 함유 페놀계 수지는 LA-1356, LA-7052, LA-7054, LA-3018-80P 등이 있으나, 이에 제한되는 것은 아니다. In one embodiment of the present application, the triazine-containing phenolic resin includes, but is not limited to, LA-1356, LA-7052, LA-7054, LA-3018-80P, etc.
본 출원의 일 실시상태에 있어서, 상기 페놀계 수지의 총 함량은 상기 수지 조성물 전체 고형분 100 중량부 기준 5 중량부 내지 20 중량부일 수 있다.In one embodiment of the present application, the total content of the phenolic resin may be 5 to 20 parts by weight based on 100 parts by weight of the total solid content of the resin composition.
본 출원의 일 실시상태에 있어서, 상기 페놀계 수지의 총 함량은 상기 수지 조성물 전체 고형분 100 중량부 기준 5 중량부 내지 15 중량부일 수 있다.In one embodiment of the present application, the total content of the phenolic resin may be 5 to 15 parts by weight based on 100 parts by weight of the total solid content of the resin composition.
상기 수지 조성물 내 상기 페놀계 수지의 함량이 상기 범위 내에 있을 경우, 내열성, 유전 특성이 개선되고, 디스미어 공정시 적절한 조도 형성에 필요한 물성 등을 확보할 수 있다.When the content of the phenolic resin in the resin composition is within the above range, heat resistance and dielectric properties are improved, and properties necessary for forming an appropriate roughness during a desmear process can be secured.
본 출원의 일 실시상태에 있어서, 상기 나프탈렌 함유 페놀계 수지; 및 트리아진 함유 페놀계 수지의 각 함량은 상기 페놀계 수지의 총 함량 범위를 만족하고, 상기 에폭시 수지의 에폭시기와 상기 페놀계 수지의 하이드록시기의 비율 범위를 만족하는 것이라면 한정되지 않는다.In one embodiment of the present application, the content of each of the naphthalene-containing phenolic resin and the triazine-containing phenolic resin is not limited as long as it satisfies the total content range of the phenolic resin and the ratio range of the epoxy group of the epoxy resin and the hydroxyl group of the phenolic resin.
본 출원의 일 실시상태에 있어서, 상기 수지 조성물은 상기 페놀계 수지 전체 100 중량부 기준 상기 나프탈렌 함유 페놀계 수지 50 중량부 내지 70 중량부; 및 상기 트리아진 함유 페놀계 수지 30 중량부 내지 50 중량부를 포함할 수 있다.In one embodiment of the present application, the resin composition may include 50 to 70 parts by weight of the naphthalene-containing phenolic resin and 30 to 50 parts by weight of the triazine-containing phenolic resin based on 100 parts by weight of the total phenolic resin.
본 출원의 일 실시상태에 있어서, 상기 에폭시 수지의 에폭시기와 상기 페놀계 수지의 하이드록시기의 비율(조성비)이 1:0.5 내지 1:0.01인 경우, 우수한 열팽창율 물성을 가지면서 디스미어 처리에 의해 적절한 표면 조도를 가지게 되어 우수한 필 강도를 제공한다.In one embodiment of the present application, when the ratio (composition ratio) of the epoxy group of the epoxy resin and the hydroxyl group of the phenolic resin is 1:0.5 to 1:0.01, the composition has excellent thermal expansion coefficient properties and has appropriate surface roughness through desmear treatment, thereby providing excellent peel strength.
상기 에폭시 수지의 에폭시기 1개 기준 상기 페놀계 수지의 하이드록시기가 0.5개를 초과하는 경우, 우수한 열팽창계수를 가질 수 있으나, 필 강도를 개선할 수 없어 기판에서의 블리스터 및 신뢰성에 문제가 생길 수 있다.When the number of hydroxyl groups of the phenolic resin exceeds 0.5 per epoxy group of the epoxy resin, it may have an excellent thermal expansion coefficient, but it may not be able to improve the peel strength, which may cause problems with blistering and reliability on the substrate.
본 출원의 일 실시상태에 있어서, 상기 에폭시 수지의 에폭시기와 상기 페놀계 수지의 하이드록시기의 비율은 1:0.5 내지 1:0.1, 1:0.5 내지 1:0.2, 또는 1:0.5 내지 1:0.3일 수 있다.In one embodiment of the present application, the ratio of the epoxy group of the epoxy resin and the hydroxyl group of the phenolic resin may be 1:0.5 to 1:0.1, 1:0.5 to 1:0.2, or 1:0.5 to 1:0.3.
무기 충전재Weapon refills
본 명세서에서, 상기 무기 충전재는 흡습성 억제, 경화성 수지 조성물이 나타내는 높은 저장 모듈러스, 낮은 열팽창계수(CTE), 점도, 개선된 경화성과 같이, 원하는 물성으로 제어하기 위해 사용되는 것을 의미한다.In this specification, the inorganic filler is meant to be used to control desired physical properties, such as hygroscopicity suppression, high storage modulus, low coefficient of thermal expansion (CTE), viscosity, and improved curability exhibited by the curable resin composition.
본 출원의 일 실시상태에 있어서, 상기 무기 충전재의 평균 입자 직경은 0.01 ㎛ 이상 5 ㎛ 이하일 수 있다.In one embodiment of the present application, the average particle diameter of the inorganic filler may be 0.01 ㎛ or more and 5 ㎛ or less.
본 출원의 일 실시상태에 있어서, 상기 무기 충전재는 커플링제 등과 같은 표면 처리제로 표면 처리될 수 있다.In one embodiment of the present application, the inorganic filler may be surface-treated with a surface treatment agent such as a coupling agent.
본 출원의 일 실시상태에 있어서, 상기 무기 충전재는 실리카, 규산염, 황산 바륨, 알루미냐 등일 수 있으나, 이에 제한되는 것은 아니다.In one embodiment of the present application, the inorganic filler may be silica, silicate, barium sulfate, alumina, etc., but is not limited thereto.
본 명세서에서, 상기 실리카는 구상 실리카, 용융 실리카, 중공 실리카, 결정 실리카, 무정형 실리카 등을 예로 들 수 있으나, 이에 제한되는 것은 아니나, SOC1, SOC2(애드마텍스) 등이 상업적으로 입수 가능하다.In this specification, the silica may include, but is not limited to, spherical silica, fused silica, hollow silica, crystalline silica, amorphous silica, etc., and commercially available silica such as SOC1 and SOC2 (Admatex) may be used.
본 출원의 일 실시상태에 있어서, 상기 무기 충전재는 실리카 입자를 포함할 수 있다.In one embodiment of the present application, the inorganic filler may include silica particles.
본 출원의 일 실시상태에 있어서, 상기 무기 충전재는 실리카 입자만을 포함하고, 상기 실리카 입자 이외에 다른 무기 충전재는 포함하지 않을 수 있다.In one embodiment of the present application, the inorganic filler may include only silica particles and may not include any other inorganic filler other than the silica particles.
상기 실리카 입자의 평균 입경은 0.3㎛ 이하일 수 있고, 0.2㎛ 이하일 수 있으며, 0.05㎛ 이상일 수 있다.The average particle diameter of the above silica particles may be 0.3 ㎛ or less, 0.2 ㎛ or less, or 0.05 ㎛ or more.
본 출원의 일 실시상태에 있어서, 상기 무기 충전재의 함량은 상기 수지 조성물 전체 고형분 100 중량부 기준 60 중량부 내지 75 중량부일 수 있다.In one embodiment of the present application, the content of the inorganic filler may be 60 to 75 parts by weight based on 100 parts by weight of the total solid content of the resin composition.
본 출원의 일 실시상태에 있어서, 상기 무기 충전재의 함량은 상기 수지 조성물 전체 고형분 100 중량부 기준 60 중량부 내지 70 중량부일 수 있다.In one embodiment of the present application, the content of the inorganic filler may be 60 to 70 parts by weight based on 100 parts by weight of the total solid content of the resin composition.
수지 조성물 내 무기 충전재의 함량이 높을수록 수지 조성물의 열팽창율이 저하되어 구리 배선과 절연층 사이의 균열을 방지할 수 있다. 그러나, 상기 수지 조성물이 무기 충전재를 지나치게 많이 포함하는 경우, 점도 조절이 용이하지 않고, 조화 처리 후의 표면에 무기 충전재가 노출되는 부분이 많아져서 필 강도가 저하되는 문제가 있다.A higher content of inorganic filler in a resin composition reduces the thermal expansion coefficient of the resin composition, thereby preventing cracking between the copper wiring and the insulating layer. However, if the resin composition contains excessive amounts of inorganic filler, viscosity control becomes difficult, and the exposed portion of the inorganic filler on the surface after the blending process increases, resulting in reduced peel strength.
상기 무기 충전재가 상기 함량 범위 내로 수지 조성물에 포함될 경우, 무기 충전재에 의해 낮은 열팽창율을 가지면서도, 상기 에폭시 수지 및 페놀계 수지의 구성에 의해 적절한 표면 조도를 갖게 되고, 우수한 필 강도를 제공할 수 있다.When the above-mentioned inorganic filler is included in the resin composition within the above content range, the resin composition can have a low thermal expansion coefficient due to the inorganic filler, while having an appropriate surface roughness due to the composition of the epoxy resin and phenolic resin, and can provide excellent peel strength.
상기 무기 충전재가 75 중량부를 초과하여 포함될 경우, 열팽창율을 더 낮출 수 있으나 적절한 필 강도를 얻을 수 없고, 상기 무기 충전재가 60 중량부 미만으로 포함될 경우, 열팽창율이 높아 서멀 사이클 테스트에서 신뢰성에 문제가 생기게 된다.When the above-mentioned inorganic filler is included in an amount exceeding 75 parts by weight, the thermal expansion coefficient can be further reduced, but an appropriate peel strength cannot be obtained, and when the above-mentioned inorganic filler is included in an amount less than 60 parts by weight, the thermal expansion coefficient is high, which causes a problem in reliability in a thermal cycle test.
열가소성 수지thermoplastic resin
본 출원의 일 실시상태에 있어서, 상기 수지 조성물은 경화물의 기계 강도, 필름 성형능 등을 향상시키기 위하여 열가소성 수지를 추가로 포함할 수 있다. 상기 열가소성 수지는 당업계에서 널리 알려진 것인 한 특별히 제한되는 것은 아니며, 예를 들어 페녹시 수지, 폴리이미드 수지, 폴리아미드이미드 수지, 폴리에테르이미드 수지, 폴리설폰 수지, 폴리에테르설폰 수지, 폴리페닐렌에테르 수지, 폴리카보네이트 수지, 폴리에테르에테르케톤 수지, 폴리에스테르 수지 및 폴리비닐아세탈 수지 중에서 선택되는 1종 이상을 포함할 수 있다. 상기 열가소성 수지는 폴리비닐아세탈 수지를 포함하는 것이 보다 바람직하다.In one embodiment of the present application, the resin composition may further include a thermoplastic resin to improve the mechanical strength, film moldability, etc. of the cured product. The thermoplastic resin is not particularly limited as long as it is widely known in the art, and may include, for example, one or more selected from phenoxy resin, polyimide resin, polyamideimide resin, polyetherimide resin, polysulfone resin, polyethersulfone resin, polyphenylene ether resin, polycarbonate resin, polyetheretherketone resin, polyester resin, and polyvinyl acetal resin. It is more preferable that the thermoplastic resin include a polyvinyl acetal resin.
본 출원의 일 실시상태에 있어서, 상기 열가소성 수지는 폴리비닐아세탈 수지일 수 있다.In one embodiment of the present application, the thermoplastic resin may be a polyvinyl acetal resin.
본 출원의 일 실시상태에 있어서, 상기 열가소성 수지의 총 함량은 상기 수지 조성물 전체 고형분 100 중량부 기준 0.1 중량부 내지 5 중량부일 수 있다.In one embodiment of the present application, the total content of the thermoplastic resin may be 0.1 to 5 parts by weight based on 100 parts by weight of the total solid content of the resin composition.
경화 촉진제Curing accelerator
본 출원의 일 실시상태에 있어서, 상기 수지 조성물은 경화 촉진제를 추가로 포함할 수 있다.In one embodiment of the present application, the resin composition may additionally include a curing accelerator.
상기 경화 촉진제를 포함함으로써, 수지 조성물 내 에폭시 수지, 페놀계 수지 등을 효율적으로 경화시켜 경화 시간을 단축시킬 수 있다.By including the above curing accelerator, the epoxy resin, phenolic resin, etc. in the resin composition can be cured efficiently, thereby shortening the curing time.
본 출원의 일 실시상태에 있어서, 상기 경화 촉진제는 당업계에 공지된 것이라면 특별히 제한되지는 않으나, 인계 경화 촉진제, 아민계 경화 촉진제, 및 이미다졸계 경화 촉진제에서 선택되는 1 이상을 포함할 수 있다.In one embodiment of the present application, the curing accelerator is not particularly limited as long as it is known in the art, but may include at least one selected from a phosphorus-based curing accelerator, an amine-based curing accelerator, and an imidazole-based curing accelerator.
상기 인계 경화 촉진제로 트리페닐 포스핀 등이 있으나, 이에만 한정되는 것은 아니다.Examples of the above-mentioned curing accelerator include, but are not limited to, triphenyl phosphine.
상기 아민계 경화 촉진제로는 트리에틸아민, 트리부틸아민, 4-디메틸아미노피리딘, 벤질디메틸아민, 2,4,6,-트리스(디메틸아미노메틸)페놀 및 1,8-디아자비사이클로(5,4,0)-운데센 등이 있으나, 이에만 한정되는 것은 아니다.Examples of the above amine-based curing accelerators include, but are not limited to, triethylamine, tributylamine, 4-dimethylaminopyridine, benzyldimethylamine, 2,4,6-tris(dimethylaminomethyl)phenol, and 1,8-diazabicyclo(5,4,0)-undecene.
상기 이미다졸계 경화 촉진제는 2-메틸이미다졸, 2-운데실이미다졸, 2-헵타데실이미다졸, 1,2-디메틸이미다졸, 2-에틸-4-메틸이미다졸, 1,2-디메틸이미다졸, 2-에틸-4-메틸이미다졸, 2-페닐이미다졸, 2-페닐-4-메틸이미다졸, 1-벤질-2-메틸이미다졸, 1-벤질-2-페닐이미다졸, 1-시아노에틸-2-메틸이미다졸, 1-시아노에틸-2-운데실이미다졸, 1-시아노에틸-2-에틸-4-메틸이미다졸, 1-시아노에틸-2-페닐이미다졸, 1-시아노에틸-2-운데실이미다졸륨트리멜리테이트, 1-시아노에틸-2-페닐이미다졸륨트리멜리테이트, 2,4-디아미노-6-[2'-메틸이미다졸릴-(1')]-에틸-s-트리아진, 2,4-디아미노-6-[2'-운데실이미다졸릴-(1')]-에틸-s-트리아진, 2,4-디아미노-6-[2'-에틸-4'-메틸이미다졸릴-(1')]-에틸-s-트리아진, 2,4-디아미노-6-[2'-메틸이미다졸릴-(1')]-에틸-s-트리아진이소시아눌산 부가물, 2-페닐이미다졸이소시아눌산 부가물, 2-페닐-4,5-디하이드록시메틸이미다졸, 2-페닐-4-메틸-5-하이드록시메틸이미다졸, 2,3-디하이드로-1H-피로로[1,2-a]벤즈이미다졸, 1-도데실-2-메틸-3-벤질이미다졸륨클로라이드, 2-메틸이미다졸린, 및 2-페닐이미다졸린 등이 있으나, 이에만 한정되는 것은 아니다.The above imidazole-based curing accelerators are 2-methylimidazole, 2-undecylimidazole, 2-heptadecylimidazole, 1,2-dimethylimidazole, 2-ethyl-4-methylimidazole, 1,2-dimethylimidazole, 2-ethyl-4-methylimidazole, 2-phenylimidazole, 2-phenyl-4-methylimidazole, 1-benzyl-2-methylimidazole, 1-benzyl-2-phenylimidazole, 1-cyanoethyl-2-methylimidazole, 1-cyanoethyl-2-undecylimidazole, 1-cyanoethyl-2-ethyl-4-methylimidazole, 1-cyanoethyl-2-phenylimidazole, 1-cyanoethyl-2-undecylimidazolium trimellitate, 1-Cyanoethyl-2-phenylimidazolium trimellitate, 2,4-diamino-6-[2'-methylimidazolyl-(1')]-ethyl-s-triazine, 2,4-diamino-6-[2'-undecylimidazolyl-(1')]-ethyl-s-triazine, 2,4-diamino-6-[2'-ethyl-4'-methylimidazolyl-(1')]-ethyl-s-triazine, 2,4-diamino-6-[2'-methylimidazolyl-(1')]-ethyl-s-triazineisocyanuric acid adduct, 2-phenylimidazoleisocyanuric acid adduct, 2-phenyl-4,5-dihydroxymethylimidazole, 2-phenyl-4-methyl-5-hydroxymethylimidazole, Examples include, but are not limited to, 2,3-dihydro-1H-pyrrolo[1,2-a]benzimidazole, 1-dodecyl-2-methyl-3-benzylimidazolium chloride, 2-methylimidazoline, and 2-phenylimidazoline.
본 출원의 일 실시상태에 있어서, 상기 경화 촉진제의 함량은 상기 수지 조성물의 고형분 전체 100 중량부 기준으로, 상기 경화 촉진제의 함량은 0.01 중량부 내지 0.5 중량부 일 수 있다.In one embodiment of the present application, the content of the curing accelerator may be 0.01 to 0.5 parts by weight based on 100 parts by weight of the total solid content of the resin composition.
용매menstruum
본 출원의 일 실시상태에 있어서, 상기 수지 조성물은 용매를 추가로 포함할 수 있다.In one embodiment of the present application, the resin composition may additionally include a solvent.
본 출원의 일 실시상태에 있어서, 상기 용매는 본 발명이 속하는 기술분야에서 수지 조성물의 형성을 가능하게 하는 것으로 공지되는 한 특별한 제한 없이 적용될 수 있다. 비 제한적인 예로, 상기 용매는 에스터류, 에테르류, 케톤류, 방향족 탄화수소류 및 설폭사이드류로 이루어진 군으로부터 선택된 1종 이상의 화합물일 수 있다.In one embodiment of the present application, the solvent may be applied without special limitation as long as it is known in the technical field to which the present invention pertains to enable the formation of a resin composition. As a non-limiting example, the solvent may be one or more compounds selected from the group consisting of esters, ethers, ketones, aromatic hydrocarbons, and sulfoxides.
상기 에스터류 용매는 아세트산 에틸, 아세트산-n-부틸, 아세트산 이소 부틸, 폼산 아밀, 아세트산 이소아밀, 아세트산 이소 부틸, 프로피온산 부틸, 부티르산 이소프로필, 부티르산 에틸, 부티르산 부틸, 락트산 메틸, 락트산 에틸, 감마-부티로락톤, 엡실론-카프로락톤, 델타-발레로락톤, 옥시아세트산 알킬(예: 옥시아세트산 메틸, 옥시아세트산 에틸, 옥시아세트산 부틸(예를 들면, 메톡시아세트산 메틸, 메톡시아세트산 에틸, 메톡시아세트산 뷰틸, 에톡시아세트산 메틸, 에톡시아세트산 에틸 등)), 3-옥시프로피온산 알킬에스터류(예: 3-옥시프로피온산 메틸, 3-옥시프로피온산 에틸 등(예를 들면, 3-메톡시프로피온산 메틸, 3-메톡시프로피온산 에틸, 3-에톡시프로피온산 메틸, 3-에톡시프로피온산 에틸 등)), 2-옥시 프로피온산 알킬에스터류(예: 2-옥시프로피온산 메틸, 2-옥시프로피온산 에틸, 2-옥시프로피온산 프로필 등(예를 들면, 2-메톡시프로피온산 메틸, 2-메톡시프로피온산 에틸, 2-메톡시프로피온산 프로필, 2-에톡시프로피온산 메틸, 2-에톡시프로피온산 에틸)), 2-옥시-2-메틸프로피온산 메틸 및 2-옥시-2-메틸프로피온산 에틸(예를 들면, 2-메톡시-2-메틸프로피온산 메틸, 2-에톡시-2-메틸프로피온산 에틸 등), 피루브산 메틸, 피루브산 에틸, 피루브산 프로필, 아세토아세트산 메틸, 아세토아세트산 에틸, 2-옥소뷰탄산 메틸, 2-옥소뷰탄산 에틸 등일 수 있다.The above ester solvents are ethyl acetate, n-butyl acetate, isobutyl acetate, amyl formate, isoamyl acetate, isobutyl acetate, butyl propionate, isopropyl butyrate, ethyl butyrate, butyl butyrate, methyl lactate, ethyl lactate, gamma-butyrolactone, epsilon-caprolactone, delta-valerolactone, alkyl oxyacetic acids (e.g., methyl oxyacetic acid, ethyl oxyacetic acid, butyl oxyacetic acid (e.g., methyl methoxyacetic acid, ethyl methoxyacetic acid, butyl methoxyacetic acid, methyl ethoxyacetic acid, ethyl ethoxyacetic acid, etc.)), alkyl 3-oxypropionic acid esters (e.g., methyl 3-oxypropionate, ethyl 3-oxypropionate, etc. (e.g., 3-methoxypropionate methyl, 3-methoxypropionate ethyl, 3-ethoxypropionate methyl, 3-ethoxypropionate ethyl, etc.), 2-oxypropionic acid alkyl esters (e.g., methyl 2-oxypropionate, ethyl 2-oxypropionate, propyl 2-oxypropionate, etc. (e.g., methyl 2-methoxypropionate, ethyl 2-methoxypropionate, propyl 2-methoxypropionate, methyl 2-ethoxypropionate, ethyl 2-ethoxypropionate)), 2-oxy-2-methylpropionate methyl and 2-oxy-2-methylpropionate ethyl (e.g., methyl 2-methoxy-2-methylpropionate, ethyl 2-ethoxy-2-methylpropionate, etc.), methyl pyruvate, It can be ethyl pyruvate, propyl pyruvate, methyl acetoacetate, ethyl acetoacetate, methyl 2-oxobutanoate, ethyl 2-oxobutanoate, etc.
상기 에테르류 용매는 디에틸렌글리콜 디메틸 에테르, 테트라하이드로퓨란, 에틸렌글리콜 모노메틸 에테르, 에틸렌글리콜 모노에틸 에테르, 메틸셀로솔브 아세테이트, 에틸셀로솔브 아세테이트, 디에틸렌글리콜 모노메틸 에테르, 디에틸렌글리콜 모노에틸 에테르, 디에틸렌글리콜 모노뷰틸 에테르, 프로필렌글리콜모노메틸 에테르, 프로필렌글리콜 모노메틸 에테르아세테이트, 프로필렌글리콜 모노에틸 에테르아세테이트, 프로필렌글리콜 모노프로필 에테르아세테이트 등일 수 있다.The above ether solvent may be diethylene glycol dimethyl ether, tetrahydrofuran, ethylene glycol monomethyl ether, ethylene glycol monoethyl ether, methyl cellosolve acetate, ethyl cellosolve acetate, diethylene glycol monomethyl ether, diethylene glycol monoethyl ether, diethylene glycol monobutyl ether, propylene glycol monomethyl ether, propylene glycol monomethyl ether acetate, propylene glycol monoethyl ether acetate, propylene glycol monopropyl ether acetate, etc.
상기 케톤류 용매는 메틸에틸케톤(MEK), 시클로헥산온, 시클로펜탄온, 2-헵탄온, 3-헵탄온, N-메틸-2-피롤리돈 등일 수 있다.The above ketone solvent may be methyl ethyl ketone (MEK), cyclohexanone, cyclopentanone, 2-heptanone, 3-heptanone, N-methyl-2-pyrrolidone, etc.
상기 방향족 탄화수소류 용매는 톨루엔, 자일렌, 아니솔, 리모넨 등 일 수 있다.The above aromatic hydrocarbon solvent may be toluene, xylene, anisole, limonene, etc.
상기 설폭사이드류 용매는 디메틸설폭사이드 등일 수 있다.The above sulfoxide solvent may be dimethyl sulfoxide, etc.
본 출원의 일 실시상태에 있어서, 상기 수지 조성물은 상기 용매를 상기 수지 조성물의 고형분 농도가 60% 내지 80%가 되도록 포함할 수 있다. 상기 수지 조성물의 고형분 농도가 상기 범위를 만족하는 경우, 적절한 점도를 가져 코팅이 용이하고, 균일한 절연층을 형성할 수 있다.In one embodiment of the present application, the resin composition may include the solvent such that the solids concentration of the resin composition is 60% to 80%. When the solids concentration of the resin composition satisfies the above range, it has an appropriate viscosity, facilitates coating, and can form a uniform insulating layer.
그 외 첨가제Other additives
본 출원의 일 실시상태에 있어서, 상기 수지 조성물은 당 기술분야에 알려진 첨가제를 추가로 포함할 수 있다. 상기 첨가제는 레벨링제, 습윤제 및 대전방지제 중에서 선택되는 1종 이상을 포함할 수 있으나, 이에만 한정되는 것은 아니다.In one embodiment of the present application, the resin composition may further include additives known in the art. The additives may include, but are not limited to, one or more selected from a leveling agent, a wetting agent, and an antistatic agent.
본 출원의 일 실시상태에 있어서, 상기 레벨링제는 향후 수지 조성물의 사용 시 흐름성을 조절하여 향후 표면 상에 적용 시 크레이터 등의 결함을 물질로서, 당 업계에 공지된 것으로 BYK 350, BYK 354, BYK 356, BYK 359, BYK 399 등이 있으나, 특별히 제한되지는 않는다. 경우에 따라, 레벨링제는 1종 또는 2종 이상 혼합 사용할 수 있고, 그 함량은 본 발명 범위를 벗어나지 않는 한 적절히 변경 가능하다.In one embodiment of the present application, the leveling agent controls the flowability of the resin composition when used in the future, so that when applied to a surface in the future, defects such as craters are eliminated. Examples of the leveling agent known in the art include, but are not particularly limited to, BYK 350, BYK 354, BYK 356, BYK 359, and BYK 399. In some cases, one type or two or more types of the leveling agent may be used in combination, and the content thereof may be appropriately changed as long as it does not deviate from the scope of the present invention.
본 출원의 일 실시상태에 있어서, 상기 습윤제는 습윤을 가속하여 상기 무기 충전재의 응집을 돕는 역할을 하는 물질로서, 당 업계에 공지된 것으로 특별히 제한되지는 않는다. 필요에 따라, 습윤제 1종을 단독으로 사용하거나 또는 2종 이상을 조합하여 사용할 수 있고, 그 함량은 본 발명 범위를 벗어나지 않는 한 적절히 변경 가능하다.In one embodiment of the present application, the wetting agent is a substance known in the art that accelerates wetting and aids in the coagulation of the inorganic filler. The wetting agent is not particularly limited to a specific substance. If necessary, one type of wetting agent may be used alone or in combination of two or more types, and the content may be appropriately varied without departing from the scope of the present invention.
본 출원의 일 실시상태에 있어서, 상기 대전방지제는 대전 방지 효과를 부여하는 물질로서, 당 업계에 공지된 것으로 특별히 제한되지는 않는다. 필요에 따라, 대전방지제 1종을 단독으로 사용하거나 또는 2종 이상을 조합하여 사용할 수 있고, 그 함량은 본 발명 범위를 벗어나지 않는 한 적절히 변경 가능하다.In one embodiment of the present application, the antistatic agent is a substance known in the art that provides an antistatic effect, and is not particularly limited. Depending on the need, one type of antistatic agent may be used alone or in combination of two or more types, and the content may be appropriately varied without departing from the scope of the present invention.
본 출원의 일 실시상태에 있어서, 상기 수지 조성물은 인쇄회로기판용으로 적용될 수 있다. 보다 구체적으로, 상기 수지 조성물은 인쇄회로기판의 절연 필름으로 적용될 수 있다. 상기 절연 필름은 다층 인쇄회로기판의 층간 절연재료로 사용될 수 있다.In one embodiment of the present application, the resin composition may be applied to a printed circuit board. More specifically, the resin composition may be applied as an insulating film for a printed circuit board. The insulating film may be used as an interlayer insulating material for a multilayer printed circuit board.
절연 필름insulating film
또한, 본 출원의 다른 실시상태는 상기 수지 조성물 또는 이의 경화물을 포함하는 절연 필름을 제공한다.In addition, another embodiment of the present application provides an insulating film comprising the resin composition or a cured product thereof.
본 출원의 일 실시상태에 있어서, 상기 경화물은 열 경화에 의해 얻어질 수 있다. In one embodiment of the present application, the cured product can be obtained by thermal curing.
본 출원의 일 실시상태에 있어서, 상기 열 경화는 당 업계에 공지되는 조건 및 히팅 장치에 의할 수 있으며, 예컨대 100 ℃ 이상의 조건에서 일정 시간 동안 경화 및 건조하여 수행될 수 있다.In one embodiment of the present application, the thermal curing may be performed by conditions and a heating device known in the art, and may be performed by curing and drying for a certain period of time under conditions of 100°C or higher, for example.
본 출원의 일 실시상태에 따른 절연 필름의 두께는 5㎛ 이상, 10㎛ 이상, 또는 15㎛ 이상이고, 50㎛ 이하, 40㎛ 이하, 또는 35㎛ 이하일 수 있다. The thickness of the insulating film according to one embodiment of the present application may be 5 ㎛ or more, 10 ㎛ or more, or 15 ㎛ or more, and 50 ㎛ or less, 40 ㎛ or less, or 35 ㎛ or less.
본 출원의 일 실시상태에 따른 절연 필름의 열팽창계수(Coefficient of Thermal expansion) 값은 25 ppm/℃이하일 수 있다. The coefficient of thermal expansion of the insulating film according to one embodiment of the present application may be 25 ppm/℃ or less.
본 출원의 일 실시상태에 있어서, 상기 절연 필름의 열팽창계수 값의 하한은 한정하지 않으나, 예컨대, 0 ppm/℃이상일 수 있다.In one embodiment of the present application, the lower limit of the thermal expansion coefficient value of the insulating film is not limited, but may be, for example, 0 ppm/℃ or more.
상기 열팽창계수는 절연 필름을 190℃에서 90분간 열경화한 후, TMA(thermos mechanical analyzer)를 이용하여 25 ℃ 내지 120 ℃ 구간에서의 측정한 값이다.The above thermal expansion coefficient is a value measured using a thermo mechanical analyzer (TMA) in the range of 25°C to 120°C after heat-curing the insulating film at 190°C for 90 minutes.
상기와 같은 열팽창계수의 범위에 속하는 절연 필름은 향후 지지체와의 팽창률 차이가 거의 없으므로, 박리 또는 크랙 등의 변형이 발생되지 않는다.Insulating films that fall within the above-mentioned range of thermal expansion coefficients will not experience deformation such as peeling or cracking, as there will be little difference in expansion rate with the support in the future.
반대로, 열팽창계수가 25 ppm/℃를 초과하는 경우, 서머 사이클 테스트에서 신뢰성에 문제가 생길 수 있다.Conversely, if the coefficient of thermal expansion exceeds 25 ppm/℃, reliability problems may arise in summer cycle tests.
본 출원의 일 실시상태에 따른 절연 필름의 필 강도(Peel strength)는 0.4 kgf/cm 이상일 수 있다.The peel strength of the insulating film according to one embodiment of the present application may be 0.4 kgf/cm or more.
본 출원의 일 실시상태에 있어서, 상기 절연 필름은 ASTM D6862법에 의거하여 측정 시 필 강도가 0.4 kgf/cm 이상일 수 있다.In one embodiment of the present application, the insulating film may have a peel strength of 0.4 kgf/cm or more when measured according to the ASTM D6862 method.
상기 절연 필름의 필 강도가 0.4 kgf/cm 미만일 경우, 기판에서의 블리스터 및 신뢰성에 문제가 발생한다.If the peel strength of the above insulating film is less than 0.4 kgf/cm, problems with blistering and reliability occur on the substrate.
상기 필 강도는 상기 절연 필름에 하기와 같이 동도금 처리한 후 Stable Micro Systems社 Texture Analyzer (TA-XT Plus)를 이용하여 동도금층의 90도 박리력을 측정하여 얻는다.The above peel strength is obtained by measuring the 90-degree peel strength of the copper plating layer using a Stable Micro Systems Texture Analyzer (TA-XT Plus) after copper plating the insulating film as described below.
1) 1차 동도금처리(무전해 화학동도금)1) Primary copper plating treatment (electroless chemical copper plating)
Atotech社 Printoganth MV 제품을 사용하여 도금 두께가 0.5㎛ 내지 1.0㎛가 되도록 처리한 후, 150 ℃의 열풍오븐에서 30분간 건조한다.After processing to a plating thickness of 0.5㎛ to 1.0㎛ using Atotech's Printoganth MV product, dry in a hot air oven at 150℃ for 30 minutes.
2) 2차 동도금처리(전기동도금)2) Secondary copper plating treatment (electroplating)
Atotech社 Expt Inpro SAP6 약품을 사용하여 도금 두께가 약 20㎛가 되도록 처리한 후, 190 ℃의 열풍오븐에서 1시간 동안 열처리한다.After processing to a plating thickness of approximately 20㎛ using Atotech Expt Inpro SAP6, heat treatment is performed in a hot air oven at 190℃ for 1 hour.
본 출원의 일 실시상태에 따른 절연 필름의 표면 조도(Ra)는 200 nm 이상 400 nm 이하, 또는 300 nm 이상 400 nm 이하일 수 있다.The surface roughness (Ra) of the insulating film according to one embodiment of the present application may be 200 nm or more and 400 nm or less, or 300 nm or more and 400 nm or less.
상기 표면 조도는 절연 필름을 CCL(copper clad laminate) 기판 위에 진공 가압 라미네이터를 사용하여 온도 100 ℃, 압력 0.7 Mpa의 조건으로 30초간 압착하여 적층한 후, 열풍오븐에서 100 ℃ 30분간, 이어서 170 ℃ 30분간 프리큐어(pre-cure)를 실시한 다음, 절연체의 지지필름(PET 필름)을 박리하여 절연층이 노출되게 한 후에 디스미어 처리를 진행한다. 구체적으로, 디스미어 처리는 Atotech社 Securiganth MV 시리즈 처리액을 사용하여 팽윤액 처리(60 ℃, 5분) - 산화액 처리(80 ℃, 20분) - 중화액 처리(50 ℃, 4분)의 3단계로 진행한다. 이와 같이 디스미어 처리된 절연층 표면을 Optical Profiler (Nanoview 3D surface profiler NV-2700, Nanosystem)(WSI 모드, 20배 렌즈)를 이용하여 시료 당 5회 측정하여 그 평균값으로 표면조도(Ra)를 구한다.The above surface roughness is obtained by laminating the insulating film on a CCL (copper clad laminate) substrate using a vacuum pressurized laminator at a temperature of 100°C and a pressure of 0.7 MPa for 30 seconds, followed by pre-cure in a hot air oven at 100°C for 30 minutes and then at 170°C for 30 minutes, and then peeling off the supporting film (PET film) of the insulator to expose the insulating layer, followed by desmear treatment. Specifically, the desmear treatment is performed in three steps: swelling solution treatment (60°C, 5 minutes) - oxidation solution treatment (80°C, 20 minutes) - neutralizing solution treatment (50°C, 4 minutes) using Atotech's Securiganth MV series treatment solution. The surface of the insulating layer treated with desmear is measured 5 times per sample using an Optical Profiler (Nanoview 3D surface profiler NV-2700, Nanosystem) (WSI mode, 20x lens), and the surface roughness (Ra) is calculated as the average value.
상기 절연 필름은 상술한 수지 조성물을 그대로 사용하거나, 이의 경화물을 사용하므로 수지 조성물에 대한 내용이 적용될 수 있다.Since the above insulating film uses the above-described resin composition as is or a cured product thereof, the contents regarding the resin composition can be applied.
인쇄회로기판printed circuit board
또한, 본 출원의 다른 실시상태는 상기 절연 필름을 포함하는 인쇄회로기판을 제공한다.In addition, another embodiment of the present application provides a printed circuit board including the insulating film.
상기 인쇄회로기판은 다층 인쇄회로기판일 수 있고, 상기 다층 인쇄회로기판에 포함된 층의 수가 한정되는 것은 아니다. 예컨대, 상기 다층 인쇄회로기판의 사용목적, 용도 등에 따라서, 상기 다층 인쇄회로기판은 2층 내지 20층의 구조를 포함할 수 있다.The above printed circuit board may be a multilayer printed circuit board, and the number of layers included in the multilayer printed circuit board is not limited. For example, depending on the purpose of use, use, etc. of the multilayer printed circuit board, the multilayer printed circuit board may include a structure of 2 to 20 layers.
이하, 본 출원을 구체적으로 설명하기 위해 실시예를 들어 상세하게 설명하기로 한다. 그러나, 본 출원에 따른 실시예들은 여러 가지 다른 형태로 변형될 수 있으며, 본 출원의 범위가 아래에서 기술하는 실시예들에 한정되는 것으로 해석되지 않는다. 본 출원의 실시예들은 당업계에서 평균적인 지식을 가진 자에게 본 출원을 보다 완전하게 설명하기 위해 제공되는 것이다.Hereinafter, examples will be provided to specifically explain the present application. However, the embodiments according to the present application may be modified in various ways, and the scope of the present application is not construed as being limited to the embodiments described below. The embodiments of the present application are provided to more fully explain the present application to those of average skill in the art.
<제조예 1> 실시예 1의 절연 필름 제조<Manufacturing Example 1> Manufacturing of insulating film of Example 1
에폭시 수지로서 비스페놀계 에폭시 수지(YD-128, 국도화학) 22 중량부, 페놀 노볼락형 에폭시 수지(YDPN-639, 국도화학) 66 중량부, 비크실레놀형 에폭시 수지(YX-4000H) 33 중량부, 나프탈렌 함유 페놀계 수지(SN-485) 31 중량부, 트리아진 함유 페놀계 수지(LA-1356, DIC) 22 중량부, 평균 입경이 0.1㎛인 실리카 슬러리(SOC2) 315 중량부, 폴리비닐아세탈 수지(KS-1) 10 중량부를 MEK(methyl ethyl ketone) 용제에 전체 고형분 농도가 70%가 되도록 혼합한 후 mechanical stirrer로 250rpm, 3시간 동안 교반하였고, 공자전 믹서(paste mixer)를 사용하여 경화 촉진제(DMAP) 2.5 중량부를 혼합하여 코팅액을 제조하였다.As epoxy resin, 22 parts by weight of bisphenol-based epoxy resin (YD-128, Kukdo Chemical), 66 parts by weight of phenol novolac-type epoxy resin (YDPN-639, Kukdo Chemical), 33 parts by weight of bixylenol-type epoxy resin (YX-4000H), 31 parts by weight of naphthalene-containing phenol-based resin (SN-485), 22 parts by weight of triazine-containing phenol-based resin (LA-1356, DIC), 315 parts by weight of silica slurry (SOC2) having an average particle size of 0.1㎛, and 10 parts by weight of polyvinyl acetal resin (KS-1) were mixed in MEK (methyl ethyl ketone) solvent to a total solid concentration of 70%, and stirred with a mechanical stirrer at 250 rpm for 3 hours, and 2.5 parts by weight of a curing accelerator (DMAP) was mixed using a paste mixer to prepare a coating solution. It was manufactured.
제조된 코팅액은 38㎛ 두께의 PET 필름 위에 애플리케이터를 이용해서 코팅한 후, 100 ℃에서 8분 간 건조하여 두께 30㎛의 절연 필름(실시예 1)을 제조하였다.The manufactured coating solution was coated on a 38 ㎛ thick PET film using an applicator, and then dried at 100 ℃ for 8 minutes to manufacture an insulating film (Example 1) having a thickness of 30 ㎛.
상기 실시예 1에서 에폭시 수지의 에폭시기와 페놀계 수지의 하이드록시기의 조성비는 1:0.48이고, 나프탈렌 함유 페놀계 수지와 트리아진 함유 페놀계 수지의 중량비는 1.4:1이다.In the above Example 1, the composition ratio of the epoxy group of the epoxy resin and the hydroxyl group of the phenolic resin is 1:0.48, and the weight ratio of the naphthalene-containing phenolic resin and the triazine-containing phenolic resin is 1.4:1.
<제조예 2, 3 및 비교 제조예 1 내지 6> 실시예 2, 3 및 비교예 1 내지 6의 절연 필름 제조<Manufacturing Examples 2, 3 and Comparative Manufacturing Examples 1 to 6> Manufacturing of insulating films of Examples 2, 3 and Comparative Examples 1 to 6
하기 표 1에 기재된 조성 및 함량(중량부)으로 변경한 것 외에는, 상기 제조예 1과 동일한 방법으로 절연 필름을 제조하였다.An insulating film was manufactured using the same method as Manufacturing Example 1, except that the composition and content (parts by weight) described in Table 1 below were changed.
수지(A)epoxy
Suzy (A)
경화제(B)phenol
Hardener (B)
충전재(C)weapon
Filler (C)
*GPH-63: 바이페닐 아랄킬 함유 페놀계 수지*GPH-63: Biphenyl aralkyl-containing phenolic resin
*상기 중량부는 고형분 기준*The above weight is based on solid content
<실험예 1>Experimental Example 1
상기 실시예 1 내지 3 및 비교예 1 내지 6의 절연 필름의 특성을 평가하여 하기 표 2에 나타내었다. 하기 표 2에 기재된 특성들의 평가방법은 아래와 같다.The properties of the insulating films of Examples 1 to 3 and Comparative Examples 1 to 6 were evaluated and shown in Table 2 below. The evaluation method for the properties described in Table 2 below is as follows.
열팽창계수(CTE(coefficient of thermal expansion), ppm/℃)Coefficient of thermal expansion (CTE (coefficient of thermal expansion), ppm/℃)
절연 필름을 4.8 mm의 넓이, 16 mm의 길이 및 30 ㎛의 두께의 샘플로 재단하고, 190 ℃에서 90분간 열경화한 후, TMA(thermos mechanical analyzer)를 이용하여 25 ℃ 내지 120 ℃ 구간에서의 열팽창계수를 측정하였다.The insulating film was cut into samples with a width of 4.8 mm, a length of 16 mm, and a thickness of 30 ㎛, and after heat curing at 190°C for 90 minutes, the thermal expansion coefficient was measured in the range of 25°C to 120°C using a thermo mechanical analyzer (TMA).
표면조도(Ra, nm)Surface roughness (Ra, nm)
1) 디스미어 처리1) Desmear treatment
절연 필름을 CCL(copper clad laminate) 기판 위에 진공 가압 라미네이터를 사용하여 온도 100 ℃, 압력 0.7 Mpa의 조건으로 30초간 압착하여 적층한 후, 열풍오븐에서 100 ℃ 30분간, 이어서 170 ℃ 30분간 프리큐어(pre-cure)를 실시하였다.The insulating film was laminated on a CCL (copper clad laminate) substrate by pressing it for 30 seconds using a vacuum pressurized laminator at a temperature of 100°C and a pressure of 0.7 MPa, and then pre-cured in a hot air oven at 100°C for 30 minutes and then at 170°C for 30 minutes.
이어 절연체의 지지필름(PET 필름)을 박리하여 절연층이 노출되게 한 후에 디스미어 처리를 진행하였다. 디스미어 처리는 Atotech社 Securiganth MV 시리즈 처리액을 사용하여 팽윤액 처리(60 ℃, 5분) - 산화액 처리(80 ℃, 20분) - 중화액 처리(50 ℃, 4분)의 3단계로 진행하였다.Afterwards, the supporting film (PET film) of the insulator was peeled off to expose the insulating layer, and then desmear treatment was performed. The desmear treatment was performed in three steps: swelling solution treatment (60°C, 5 minutes) - oxidation solution treatment (80°C, 20 minutes) - neutralizing solution treatment (50°C, 4 minutes) using Atotech's Securiganth MV series treatment solution.
2) 표면조도(Ra, nm) 측정2) Surface roughness (Ra, nm) measurement
디스미어 처리된 절연층 표면을 Optical Profiler (Nanoview 3D surface profiler NV-2700, Nanosystem)(WSI 모드, 20배 렌즈)를 이용하여 시료 당 5회 측정하여 그 평균값으로 표면조도(Ra)를 구하였다.The surface of the desmear-treated insulating layer was measured five times per sample using an Optical Profiler (Nanoview 3D surface profiler NV-2700, Nanosystem) (WSI mode, 20x lens), and the surface roughness (Ra) was calculated as the average value.
필 강도Phil Kang-do
1) 동도금 처리1) Copper plating treatment
동도금은 무전해 화학동도금과 전기동도금의 2단계로 진행하였다. 무전해 화학동도금은 Atotech社 Printoganth MV 제품을 사용하여 도금 두께가 0.5㎛ 내지 1.0㎛가 되도록 처리하였고, 처리 후에는 150 ℃의 열풍오븐에서 30분간 건조하였다.Copper plating was performed in two stages: electroless chemical copper plating and electrolytic copper plating. Electroless chemical copper plating was performed using Atotech's Printoganth MV product to a plating thickness of 0.5 to 1.0 μm, and after treatment, it was dried in a hot air oven at 150°C for 30 minutes.
전기동도금은 Atotech社 Expt Inpro SAP6 약품을 사용하여 도금 두께가 약 20㎛가 되도록 처리하였고, 처리 후에는 190 ℃의 열풍오븐에서 1시간 동안 열처리하였다.Electroplating was performed using Atotech's Expt Inpro SAP6 chemical to a plating thickness of approximately 20 ㎛, and after treatment, heat treatment was performed in a hot air oven at 190 ℃ for 1 hour.
2) 필 강도(kgf/cm) 측정2) Measurement of peel strength (kgf/cm)
Stable Micro Systems社 Texture Analyzer (TA-XT Plus)를 이용하여 동도금층의 90도 박리력을 측정하였다. The 90-degree peel strength of the copper plating layer was measured using a Stable Micro Systems Texture Analyzer (TA-XT Plus).
(CTE, ppm/℃)Coefficient of thermal expansion
(CTE, ppm/℃)
(Ra, nm)Surface roughness
(Ra, nm)
(kgf/cm)Phil Kang-do
(kgf/cm)
상기 표 2의 결과를 살펴보면, 실시예 1 내지 3의 절연 필름은 25 ppm/℃ 이하의 열팽창계수를 만족하면서 0.4 kgf/cm 이상의 높은 필 강도를 가지고 200 nm 이상 400 nm 이하의 적절한 표면조도 값을 구현함으로써, 절연 필름으로서 우수한 물성들을 나타내는 것을 확인하였다.Looking at the results in Table 2 above, it was confirmed that the insulating films of Examples 1 to 3 exhibited excellent properties as insulating films by satisfying a thermal expansion coefficient of 25 ppm/℃ or less, having a high peel strength of 0.4 kgf/cm or more, and implementing an appropriate surface roughness value of 200 nm or more and 400 nm or less.
반면, 비교예 1은 에폭시 수지의 에폭시기와 페놀계 수지의 하이드록시기의 비율(조성비)이 본 발명의 범위를 만족하지 않음으로써, 열팽창계수는 적당하나, 표면 조도가 낮고, 필 강도가 0.4 kgf/cm 미만의 값을 가짐으로써, 향후 신뢰성 테스트에서 쇼트 발생이 야기되므로, 절연 필름으로서 부적합한 것을 알 수 있다. On the other hand, Comparative Example 1 does not satisfy the range of the present invention in the ratio (composition ratio) of the epoxy group of the epoxy resin and the hydroxyl group of the phenolic resin, so although the thermal expansion coefficient is appropriate, the surface roughness is low and the peel strength has a value of less than 0.4 kgf/cm, so that a short circuit occurs in a future reliability test, and therefore it can be seen that it is unsuitable as an insulating film.
또한, 비교예 2와 3은 1종의 페놀계 수지만 사용한 것이고, 비교예 4는 2종의 페놀계 수지를 사용하였으나 바이페닐 아랄킬 함유 페놀계 수지와 트리아진 함유 페놀계 수지를 사용한 것으로, 즉 나프탈렌 함유 페놀계 수지를 사용하지 않은 것이다. 비교예 2의 경우, 블리스터의 발생으로 절연 필름으로서 사용이 부적합함을 알 수 있고, 비교예 3 및 4는 열팽창계수가 25 ppm/℃을 초과하여 최소한의 휨(warpage) 확보가 어렵고 저수율 문제를 야기할 수 있으며 필 강도가 0.4 kgf/cm에 도달하지 못하여 향후 신뢰성 테스트에서 쇼트 발생이 야기되므로 절연 필름으로 사용하기에 매우 부적합함을 알 수 있다.In addition, Comparative Examples 2 and 3 used only one type of phenolic resin, and Comparative Example 4 used two types of phenolic resins, but used a biphenyl aralkyl-containing phenolic resin and a triazine-containing phenolic resin, that is, did not use a naphthalene-containing phenolic resin. In the case of Comparative Example 2, it can be seen that it is unsuitable for use as an insulating film due to the occurrence of blisters, and Comparative Examples 3 and 4 have a coefficient of thermal expansion exceeding 25 ppm/℃, making it difficult to secure minimal warpage and may cause low yield problems, and the peel strength does not reach 0.4 kgf/cm, causing short circuits in future reliability tests, so it can be seen that it is highly unsuitable for use as an insulating film.
마지막으로, 비교예 5는 에폭시 수지를 3종이 아닌 2종 사용한 것으로, 페놀노볼락형 에폭시 수지의 사용이 생략됨으로써, 페놀경화제 조성 및 에폭시기와 하이드록시기의 조성비가 본 발명을 만족함에도 불구하고 필 강도가 0.4 kgf/cm 미만의 값을 가져 절연 필름으로 사용되기 적절하지 않음을 확인하였고, 비교예 6은 열가소성 수지를 포함하지 않은 것으로, 마찬가지로 필 강도가 0.4 kgf/cm 미만의 값을 가져 절연 필름으로 사용되기 적절하지 않음을 확인하였다.Finally, Comparative Example 5 used two types of epoxy resin instead of three, and the use of a phenol novolac-type epoxy resin was omitted. Therefore, although the composition of the phenol hardener and the composition ratio of the epoxy group and the hydroxyl group satisfied the present invention, it was confirmed that the peel strength was less than 0.4 kgf/cm, making it unsuitable for use as an insulating film. Comparative Example 6 did not include a thermoplastic resin, and it was confirmed that the peel strength was less than 0.4 kgf/cm, making it unsuitable for use as an insulating film.
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| KR1020250057668A KR20250160827A (en) | 2024-05-07 | 2025-04-30 | Resin composition, insulating film comprising same and printed circuit board |
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20050255270A1 (en) * | 2003-02-18 | 2005-11-17 | Hitachi Chemical Co., Ltd. | Method for preparing an insulating resin composition, insulating resin composition, multilayer wiring board and process for producing the same |
| KR20160016664A (en) * | 2014-07-31 | 2016-02-15 | 아지노모토 가부시키가이샤 | Resin sheet |
| KR20170017777A (en) * | 2015-08-07 | 2017-02-15 | 아지노모토 가부시키가이샤 | Resin composition |
| KR101897955B1 (en) * | 2012-01-23 | 2018-09-12 | 아지노모토 가부시키가이샤 | Resin composition |
| KR102128231B1 (en) * | 2013-02-14 | 2020-06-30 | 아지노모토 가부시키가이샤 | Curable resin composition |
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20050255270A1 (en) * | 2003-02-18 | 2005-11-17 | Hitachi Chemical Co., Ltd. | Method for preparing an insulating resin composition, insulating resin composition, multilayer wiring board and process for producing the same |
| KR101897955B1 (en) * | 2012-01-23 | 2018-09-12 | 아지노모토 가부시키가이샤 | Resin composition |
| KR102128231B1 (en) * | 2013-02-14 | 2020-06-30 | 아지노모토 가부시키가이샤 | Curable resin composition |
| KR20160016664A (en) * | 2014-07-31 | 2016-02-15 | 아지노모토 가부시키가이샤 | Resin sheet |
| KR20170017777A (en) * | 2015-08-07 | 2017-02-15 | 아지노모토 가부시키가이샤 | Resin composition |
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