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WO2025178179A1 - Appareil d'inspection de batterie secondaire utilisant une mfc - Google Patents

Appareil d'inspection de batterie secondaire utilisant une mfc

Info

Publication number
WO2025178179A1
WO2025178179A1 PCT/KR2024/008809 KR2024008809W WO2025178179A1 WO 2025178179 A1 WO2025178179 A1 WO 2025178179A1 KR 2024008809 W KR2024008809 W KR 2024008809W WO 2025178179 A1 WO2025178179 A1 WO 2025178179A1
Authority
WO
WIPO (PCT)
Prior art keywords
secondary battery
value
section
processor
parameter
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
PCT/KR2024/008809
Other languages
English (en)
Korean (ko)
Inventor
김철훈
이승훈
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Bumyeong Inc
Original Assignee
Bumyeong Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from KR1020240043800A external-priority patent/KR20250129501A/ko
Priority claimed from KR1020240043801A external-priority patent/KR20250129502A/ko
Priority claimed from KR1020240043799A external-priority patent/KR20250129500A/ko
Application filed by Bumyeong Inc filed Critical Bumyeong Inc
Publication of WO2025178179A1 publication Critical patent/WO2025178179A1/fr
Pending legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/10—Measuring sum, difference or ratio
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/165—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/30—Measuring the maximum or the minimum value of current or voltage reached in a time interval
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R23/00—Arrangements for measuring frequencies; Arrangements for analysing frequency spectra
    • G01R23/02—Arrangements for measuring frequency, e.g. pulse repetition rate; Arrangements for measuring period of current or voltage
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/36—Arrangements for testing, measuring or monitoring the electrical condition of accumulators or electric batteries, e.g. capacity or state of charge [SoC]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/36—Arrangements for testing, measuring or monitoring the electrical condition of accumulators or electric batteries, e.g. capacity or state of charge [SoC]
    • G01R31/367—Software therefor, e.g. for battery testing using modelling or look-up tables
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • G01R31/52—Testing for short-circuits, leakage current or ground faults
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01M—PROCESSES OR MEANS, e.g. BATTERIES, FOR THE DIRECT CONVERSION OF CHEMICAL ENERGY INTO ELECTRICAL ENERGY
    • H01M50/00—Constructional details or processes of manufacture of the non-active parts of electrochemical cells other than fuel cells, e.g. hybrid cells
    • H01M50/10—Primary casings; Jackets or wrappings
    • H01M50/102—Primary casings; Jackets or wrappings characterised by their shape or physical structure
    • H01M50/103—Primary casings; Jackets or wrappings characterised by their shape or physical structure prismatic or rectangular
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
    • Y02E60/00—Enabling technologies; Technologies with a potential or indirect contribution to GHG emissions mitigation
    • Y02E60/10—Energy storage using batteries

Definitions

  • a pouch-type secondary battery is a secondary battery in which battery cells are sealed inside a case (pouch), and can have a high energy density.
  • the pouch-type secondary battery may include a lead tab for supplying power.
  • the lead tab serves to electrically connect the electrodes (e.g., the positive and negative electrodes) of the secondary battery to an external device, and power can be supplied through the lead tab.
  • the sensor module may include a processor configured to control the transport device, obtain the measurement values from the detection circuit, and identify a crack in the secondary battery based on one of the plurality of parameters.
  • the sensor module may include a memory that stores instructions and information related to the secondary battery. The instructions, when individually or collectively executed by the processor, may cause the secondary battery inspection device to select one parameter from among the plurality of parameters, identify a measurement value of the one parameter, distinguish the measurement value of the one parameter with respect to the total number of measurements of the second signal into a plurality of sections including a first section and a second section, identify whether a first defect exists within the first section by comparing a first measurement value included in the first section with a first reference value, identify whether a second defect exists within the second section by comparing a second measurement value included in the second section with a second reference value, and identify a defect in the secondary battery based on identifying at least one of the first defect or the second defect.
  • the above instructions when individually or collectively executed by the processor, may be configured to cause the secondary battery inspection device to select one parameter from among the plurality of parameters, identify a measurement value of the one parameter, distinguish the measurement value of the one parameter into a plurality of sections, and, for each of the plurality of sections, convert the measurement value of the one parameter based on the following [mathematical formula], thereby obtaining a conversion value for the measurement value of the one parameter, and identifying a defect in the secondary battery based on the conversion value.
  • Figure 1b is an exploded view of the secondary battery of Figure 1a.
  • FIGS. 3A and 3B illustrate examples of a transport device of a secondary battery inspection device according to one embodiment.
  • Figure 11a is a graph showing measurement values for the number of measurements.
  • Figure 12 schematically illustrates a secondary battery inspection device according to one embodiment.
  • PVDF polyvinylidene fluoride
  • PAA polyacrylic acid
  • SBR styrene-butadiene rubber
  • CMC carboxymethylcellulose
  • the electrode (12) may include an electrode tab (14).
  • the electrode tab (14) may include a first electrode tab (14-1) extending from the anode (12-1) and a second electrode tab (14-2) extending from the cathode (12-2).
  • the first electrode tab (14-1) may be referred to as the anode (12-1) tab
  • the second electrode tab (14-2) may be referred to as the cathode (12-2) tab.
  • the electrode tabs (14) of each of the plurality of electrodes (12) may be coupled to a lead tab (13).
  • the bonding force between the lead tab (13) and the electrode tab (14) may be affected by the difference in the physical properties of the lead tab (13) and the electrode tab (14).
  • the lead tab (13) may include a conductive material (e.g., metal). If the electrode tab (14) coupled to the lead tab (13) includes a non-conductive material (e.g., polymer), the bonding force may be weakened due to the difference in the physical properties of the conductive material of the lead tab (13) and the non-conductive material of the electrode tab (14).
  • a defect e.g., a crack
  • a non-destructive inspection device using X-ray imaging may be used.
  • secondary battery inspection devices have a long inspection time for identifying cracks and low resolution, making accurate identification difficult.
  • mass production is difficult, and thus they may not be suitable as inspection devices for inspecting cracks in small pouch-type secondary batteries.
  • X-ray photography of the entire area of the secondary battery (10) may be required in order to identify the presence or absence of cracks in the secondary battery (10) as a whole.
  • the case (11) includes a conductive material (e.g., a metal), an induced electromotive force may be formed on the surface of the case (11), which is a conductor, and a current (E) may be formed by the induced electromotive force.
  • a conductive material e.g., a metal
  • the second signal generated through the second coil (112a) may include a signal regarding a current and/or voltage applied to the second coil (112a) by the second magnetic field (M2).
  • the second magnetic field (M2) formed by the current (E) may induce a current flowing along the second coil (112a).
  • the second coil (112a) may be configured to generate a signal in the form of a sine wave regarding the current.
  • the plurality of parameters may include a first parameter and a second parameter.
  • the first parameter may include a voltage difference between the first signal and the second signal, and a phase difference between the first signal and the second signal, as a primary sensing parameter obtained through the detection circuit (120).
  • the second parameter may include a resistance of the second coil (112a) and an impedance of the second coil (112a), which are calculated based on the first parameter.
  • the voltage difference may be expressed as an amplitude due to a potential difference.
  • the first transport device (141) may be configured to move the sensor module (110) in an up-and-down direction (e.g., a direction parallel to the z-axis) with respect to the secondary battery (10).
  • the first transport device (141) may be configured to be able to adjust the distance between the secondary battery (10) and the sensor module (110).
  • the first transport device (141) may be configured to move the sensor module (110) on the same plane.
  • the first transport device (141) may be configured to move the sensor module (110) in a direction parallel to the x-axis and a direction parallel to the y-axis.
  • the processor (130) may be configured to control the second transport device (142) to increase the driving speed when the area of the secondary battery (10) corresponding to the interval between the measured values of the plurality of parameters exceeds the designated area. If the transport speed is too slow, the area of the secondary battery (10) may increase, making it difficult to distinguish the plurality of parameters based on the second signal, and the sensing speed of the secondary battery (10) may be slow.
  • the processor (130) may compare the area of the secondary battery (10) with the designated area, and increase the driving speed so that the area of the secondary battery (10) corresponds to the designated area.
  • the processor (130) may be configured to identify a defect in the secondary battery (10) based on identifying that a difference between the first parameter and a reference parameter exceeds a specified threshold value when the first parameter is selected.
  • the processor (130) may select, from among a plurality of parameters, the difference between the phase of the first signal, which is a first parameter, and the phase of the second signal.
  • the first graph (510) of FIG. 5A may be referred to as a graph representing the difference in phase that can be obtained from a secondary battery (10) in a normal state.
  • the second graph (520) of FIG. 5B may be referred to as a graph representing the difference in phase that can be obtained from a secondary battery (10) in which a defect exists.
  • the measurement values for one parameter may be multiple.
  • the parameter obtained based on the second signal measured by the sensor module (110) may be expressed as a measurement value for the number of measurements of the sensor module (110).
  • the first value may be referred to as the smallest value among the measurement values of one parameter
  • the second value may be referred to as the smallest value among the remaining measurement values excluding the first value, and as a value next to the first value.
  • the processor (130) may be configured to identify the first value and the second value with respect to the entire measurement values for the inspection results provided from the detection circuit (120).
  • the graph (810) for a measurement value of one parameter for the total number of measurements is illustrated.
  • the graph (810) can be obtained by having the detection circuit (120) convert the second signal measured by the sensor module (110) into measurement values for each of a plurality of parameters, and having the processor (130) represent this as a graph (810) for the total number of measurements.
  • the total number of measurements illustrated in FIG. 8 can be, for example, 371.
  • the fact that the total number of measurements is 371 means that the sensor module (110) performed a measurement operation 371 times to obtain the second signal.
  • a first value and a second value may be identified.
  • the first value may be a measurement value obtained when the number of measurements is c
  • the second value may be a measurement value obtained when the number of measurements is d.
  • the processor (130) may identify the first measurement number corresponding to the first value as d, and the second measurement number corresponding to the second value as c.
  • the first measurement number corresponding to the first value may be d
  • the second measurement number corresponding to the second value may be c.
  • the processor (130) may be configured to identify an interval between c and d.
  • the processor (130) may be configured to divide the measured values of one parameter for the total number of measurements of the second signal into a plurality of intervals including a first interval and a second interval. For example, the processor (130) may divide the interval between the first measurement number and the second measurement number into a plurality of intervals including a first interval and a second interval.
  • the processor (130) may be configured to divide the section between c and d into a plurality of sections.
  • the plurality of sections may include five sections.
  • the first section (801), the second section (802), the third section (803), the fourth section (804), and the fifth section (805) may be sequentially set according to the number of measurements.
  • the first section (801), the second section (802), the third section (803), the fourth section (804), and the fifth section (805) may each be referred to as sections that border each other.
  • the second section (802) may be between the first section (801) and the third section (803), and the fourth section (804) may be between the third section (803) and the fifth section (805).
  • the processor (130) may be configured to compare the measured values of the parameters with reference values, thereby dividing the entire section into a plurality of sections, and identifying defects for the entire section and each of the plurality of sections.
  • the secondary battery inspection device can precisely identify a defect by performing an inspection on the entire section and each of a plurality of sections. If the defect is identified only within the entire section, accurate analysis of the measurement values within the section may be difficult.
  • the secondary battery inspection device may be configured to divide the entire section into a plurality of sections, as well as the entire section, and to perform an inspection on each of the plurality of sections.
  • the processor (130) may determine a defect in the secondary battery (10).
  • the processor (130) may be configured to identify, based on the comparison result, whether a first defect exists within a first section (801) and whether a second defect exists within a second section (802).
  • the secondary battery inspection device may be configured to identify a defect in the secondary battery (10) when a defect is identified in any one of a plurality of sections.
  • the secondary battery (10) may be configured to identify a defect based on identifying at least one of a first defect in a first section (801) or a second defect in a second section (802).
  • the secondary battery inspection device may precisely identify a defect by determining a defect when a defect exists in any one of the plurality of sections.
  • the processor (130) may be configured to obtain information related to a secondary battery (10) stored in a memory (150).
  • the secondary battery inspection device may cause the secondary battery inspection device to obtain information related to the secondary battery (10) stored in the memory (150).
  • the memory (150) can store information related to the secondary battery (10) to be inspected.
  • the memory (150) can store information related to the secondary battery (10).
  • the memory (150) can store size information of the secondary battery (10), position information of the lead tab (13), manufacturer information of the secondary battery (10), specification (e.g., capacity) information of the secondary battery (10), etc.
  • the position information of the lead tab (13) can include first position information corresponding to the first lead tab (13-1) and second position information corresponding to the second lead tab (13-2).
  • the processor (130) may be configured to obtain first location information corresponding to the first lead tab (13-1) and second location information corresponding to the second lead tab (13-2).
  • the secondary battery inspection device may cause the secondary battery inspection device to obtain first location information corresponding to the first lead tab (13-1) and second location information corresponding to the second lead tab (13-2).
  • the first position information corresponding to the first lead tab (13-1) may be referenced as the coordinates of the secondary battery (10) where the first lead tab (13-1) is positioned
  • the second position information corresponding to the second lead tab (13-2) may be referenced as the coordinates of the secondary battery (10) where the second lead tab (13-2) is positioned.
  • the position of the lead tab (13) may be different.
  • the lead tab (13) may be a part where defects easily occur because it is welded with the electrode tab.
  • the processor (130) may obtain the first position information and the second position information stored in the memory (150) to set a plurality of sections based on the position of the first lead tab (13-1) and the position of the second lead tab (13-2).
  • the processor (130) may be configured to identify a third measurement number obtained at a timing when the sensor module (110) is positioned at a position corresponding to the first location information and a fourth measurement number obtained at a timing when the sensor module (110) is positioned at a position corresponding to the first location information.
  • the processor (130) may cause the secondary battery inspection device to identify a third measurement number obtained at a timing when the sensor module (110) is located at a position corresponding to the first location information and a fourth measurement number obtained at a timing when the sensor module (110) is located at a position corresponding to the second location information when executing instructions stored in the memory (150).
  • the position corresponding to the first position information may be referred to as a position where the sensor module (110) is placed on the first lead tab (13-1), and the position corresponding to the second position information may be referred to as a position where the sensor module (110) is placed on the second lead tab (13-2).
  • the transport device (140) transports the sensor module (110) (e.g., the first transport device (141))
  • the positions may be referred to as positions where the sensor module (110) is placed at a position overlapping the first lead tab (13-1) or the second lead tab (13-2) when the sensor module (110) is transported.
  • the above positions may be referenced as positions where the sensor module (110) is placed in a position overlapping the first lead tab (13-1) or the second lead tab (13-2) when the secondary battery (10) is being transported by the transport device (140) (e.g., the second transport device (142)).
  • the third measurement number may be referenced as the number of measurements at which the sensor module (110) acquires (or measures) the second signal at the timing (e.g., the first timing) at which the sensor module (110) is placed on the first lead tab (13-1), and which measurement number is the measurement number acquired at the first timing among the total number of measurements.
  • the fourth measurement number is a measurement number at which the sensor module (110) acquires (or measures) the second signal at a timing (e.g., the second timing) at which the sensor module (110) is placed on the second lead tab (13-2), and can be referred to as the measurement number among the total number of measurements at which the measurement number acquired at the timing (e.g., the second timing) is. Since the processor (130) acquires the first location information and the second location information from the memory (150), the processor (130) can identify the third measurement number acquired (or measured) at a location corresponding to the first location information and the fourth measurement number acquired (or measured) at a location corresponding to the second location information.
  • a graph (910) is shown for the measurement values of one parameter for the total number of measurements described above.
  • the x-axis of the graph (910) can be normalized by dividing each measurement number by the total number of measurements. For example, if the total number of measurements is 371, as in the graph (910)(810) illustrated in FIG. 8, each measurement number can be normalized from 0 to 1 by dividing each measurement number by 371.
  • the first measurement number can be 1/371
  • the 30th measurement number can be 30/371
  • the 371st measurement number can be 371/371. The normalization will be described later.
  • the processor (130) can identify the third measurement number and the fourth measurement number.
  • the processor (130) can identify the third measurement number measured when the sensor module (110) coupled to the transport device (140) corresponds to the first lead tab (13-1) based on the first location information, and can identify the fourth measurement number measured when the sensor module (110) coupled to the transport device (140) corresponds to the second lead tab (13-2) based on the second location information.
  • the third measurement number may be a
  • the fourth measurement number may be b.
  • the first location information and the second location information may vary depending on the secondary battery (10), and the third measurement number and the fourth measurement number may also vary depending on the secondary battery (10).
  • the processor (130) may cause the secondary battery inspection device to set a plurality of sections to partially overlap when executing instructions stored in the memory (150).
  • a second section (912) can be set based on the first lead tab (13-1), and a fourth section (914) can be set based on the second lead tab (13-2).
  • the processor (130) may be configured to set the boundary of the second section (912) outside a first range specified from the third measurement number such that the second section (912) overlaps with the first section (911).
  • the first range may be pre-specified by the user or may be set based on information related to the secondary battery (10). For example, the first range may be set such that the boundary of the second section (912) may be included within the first section (911).
  • the processor (130) may be configured to set the boundary of the fourth section (914) outside a second range specified from the fourth measurement number such that the fourth section (914) overlaps with the fifth section (915).
  • the second range may be pre-specified by the user or may be set based on information related to the secondary battery (10). For example, the second range may be set such that the boundary of the fourth section (914) can be included within the fifth section (915).
  • the processor (130) may be configured to set the third section (913) to be between the third measurement number and the fourth measurement number.
  • a first section (911) may overlap a second section (912), a third section (913) may overlap a second section (912) and a fourth section (914), and a fourth section (914) may overlap a fifth section (915).
  • a measurement value indicating a defect exists on a boundary between the plurality of sections, it may be difficult to identify the defect.
  • a measurement value indicating a defect exists on a boundary between the first section (911) and the second section (912
  • a secondary battery inspection device can accurately identify a defect by setting a plurality of sections to partially overlap, even if a measurement value indicating a defect is located on a boundary between the sections.
  • FIG. 10 is a flowchart showing an operation of a secondary battery inspection device according to one embodiment to identify a defect.
  • the operations described in FIG. 10 may be operations caused by the secondary battery inspection device when instructions stored in the memory (150) are executed by the processor (130).
  • the processor (130) may be configured to divide the measurement values of one parameter for the total number of measurements into a plurality of intervals.
  • the processor (130) when executing instructions stored in the memory (150), may cause the secondary battery inspection device to divide the measurement values of one parameter for the total number of measurements into a plurality of intervals.
  • the processor (130) may be configured to divide the measurement values of one parameter for the total number of measurements into a plurality of intervals.
  • the plurality of intervals may include a first interval and a second interval.
  • the processor (130) may be configured to identify a difference value corresponding to the skewness, kurtosis, and maximum and maximum value difference for each of the plurality of intervals.
  • the processor (130) may be configured to identify skewness, kurtosis, and difference between maximum and maximum values, respectively.
  • the processor (130) may identify skewness, kurtosis, and difference between maximum and maximum values, respectively, for each of a plurality of intervals.
  • the processor (130) may be configured to identify a first difference value corresponding to a first skewness, a first kurtosis, and a difference between maximum and minimum values for a first measured value within a first interval.
  • the processor (130) may be configured to identify a second skewness, a second kurtosis, and a difference between maximum and minimum values for a second measured value within a second interval, respectively.
  • skewness is a measure of how symmetrical the distribution of measured values is. For example, if the distribution of measured values is completely symmetrical, the skewness is 0. If a physical defect exists in the secondary battery (10), the skewness can be reduced because the measured values appear symmetrical about the defect. The skewness of the measured values of the parameters obtained from the secondary battery (10) including the defect can be smaller than the reference value for the skewness corresponding to the normal state. The skewness can be calculated based on the following [Mathematical Formula 5].
  • kurtosis is a measure of how peaked or flat a distribution of measured values is. For example, the kurtosis of a normal distribution is 0. If the distribution of measured values is peaked more than a normal distribution, the kurtosis is greater than 0, and if the distribution of measured values is flatter than a normal distribution, the kurtosis is less than 0. In other words, the higher the kurtosis (kurtosis value), the more peaked the distribution of measured values can be. Kurtosis can quantify the peak of measured values. The kurtosis of measured values of parameters obtained from a secondary battery (10) including a defect can be higher than a reference value for kurtosis corresponding to a normal state. Kurtosis can be calculated based on the following [Mathematical Formula 6].
  • a difference value corresponding to the difference between the maximum and minimum values of measured values within an interval may be used to control over-detection.
  • the difference value may be obtained by calculating the difference between the maximum and minimum values within a specific interval.
  • the difference value of the measured values of the parameters obtained from a secondary battery (10) including a defect may be greater than the reference value for the difference value corresponding to a normal state.
  • the processor (130) may be configured to identify a first skewness, a first kurtosis, and a first difference value for a first measurement value within the first interval.
  • the processor (130) may be configured to identify a second skewness, a second kurtosis, and a second difference value for a second measurement value within the second interval.
  • the processor (130) may be configured to identify a defect in the secondary battery (10) based on the asymmetry, kurtosis, and maximum and difference values.
  • Fig. 11a is a graph showing measurement values for the number of measurements.
  • Fig. 11b illustrates a process for converting a graph for measurement values of the first section of Fig. 11a.
  • Fig. 11c illustrates graphs for measurement values of the second and fourth sections of Fig. 11a.
  • Fig. 11d illustrates a graph for measurement values of the third section of Fig. 11a.
  • Fig. 11e illustrates a process for converting a graph for measurement values of the fifth section of Fig. 11a.
  • the processor (130) may inspect each of the multiple sections to identify a defect. If inspection is performed on the entire section, it may be difficult to determine the defect. For example, if a defect is detected in a section where a curve slope of the graph exists, the defect reduces the asymmetry, making it difficult to accurately determine the defect based on the asymmetry of the entire section.
  • the secondary battery inspection device may divide the entire section into multiple sections and set a separate detection method for each section.
  • the processor (130) can acquire a graph (1101c) by acquiring a certain section based on a minimum value within the graph (1101b).
  • the processor (130) can be configured to identify a first defect by acquiring kurtosis for the graph (1101c). Since a measurement value indicating a defect, which is difficult to detect within the graph (1101a), can be clearly identified within the graph (1101c), the secondary battery inspection device can accurately identify the first defect within the first section (1101). For example, the processor (130) can calculate kurtosis for the graph (1101c) of the first section (1101). Since peaks and valleys are clearly expressed, defect determination based on kurtosis can be facilitated.
  • the processor (130) may calculate asymmetry for the second section (1102) and the fourth section (1104).
  • the graph (1102a) of FIG. 11c is a graph displayed in the second section (1102).
  • the graph (1104a) of FIG. 11c is a graph displayed in the fourth section (1104).
  • the second section (1102) and the fourth section (1104) may correspond to the lead tap (13).
  • the second section (1102) may correspond to the first lead tap (13-1), and the fourth section (1104) may correspond to the second lead tap (13-2).
  • the processor (130) may convert the graph (1105b) into a graph (1105c) once more by repeating the same process.
  • the processor (130) may obtain a graph (1105d) by obtaining a certain section based on a minimum value within the graph (1105c).
  • the processor (130) may be configured to identify the first defect by obtaining kurtosis for the graph (1105d). Since the measurement value indicating a defect, which is difficult to detect within the graph (1105a), can be clearly identified within the graph (1105d), the secondary battery inspection device can accurately identify the fifth defect within the fifth section (1105). Since the peaks and valleys are clearly expressed, defect determination based on kurtosis may be easy.
  • the secondary battery inspection device can accurately identify defects and enable rapid inspection by selecting different inspection methods for each section.
  • Fig. 12 schematically illustrates a secondary battery inspection device according to one embodiment.
  • Fig. 13 is a flowchart illustrating a process of converting a measurement value by a secondary battery inspection device according to one embodiment.
  • the transport device (140) may be configured to be coupled with the sensor module (110) and transport the sensor module (110). Referring to FIG. 12, the transport device (140) may transport the sensor module (110) relative to the secondary battery (10).
  • the processor (130) may be configured to control the transport device (140).
  • the transport device (140) may transport the sensor module (110) horizontally or vertically along the surface of the secondary battery (10).
  • the transport device (140) may be configured to adjust the distance between the sensor module (110) and the secondary battery (10). For example, the transport device (140) may decrease the distance between the sensor module (110) and the secondary battery (10) so that the sensor module (110) is positioned closer to the secondary battery (10). For example, the transport device (140) may increase the distance between the sensor module (110) and the secondary battery (10) so that the sensor module (110) is positioned farther away from the secondary battery (10).
  • the intensity of the second signal obtained may vary depending on the distance between the sensor module (110) and the secondary battery (10).
  • the intensity of the second signal may change the intensity of the measured values for a plurality of parameters. If the distance between the sensor module (110) and the secondary battery (10) is too far, the intensity of the second signal may be weak, and thus the intensity of the measured values may be weak. If the intensity is weak, it may be difficult to determine a defect from a graph of the measured values.
  • the processor (130) may be configured to obtain a measurement value of one parameter among a plurality of parameters.
  • the processor (130) may cause the secondary battery inspection device to obtain a measurement value of one parameter among a plurality of parameters when executing instructions stored in the memory (150).
  • the processor (130) may be configured to divide the measurement value of the one parameter into a plurality of intervals.
  • the processor (130) may be configured to obtain a conversion value for a measurement value for each of the plurality of sections.
  • the processor (130) can obtain a conversion value by converting a measurement value of one parameter so that it represents a measurement value of a constant intensity independently of the distance between the sensor module (110) and the secondary battery (10).
  • the processor (130) can obtain a conversion value for the measurement value based on the following [Mathematical Formula 7].
  • the conversion value can be obtained for the measurement value included in each of the plurality of intervals.
  • the processor (130) may be configured to identify a defect in the secondary battery (10) based on the conversion value.
  • the processor (130) may cause the secondary battery inspection device to identify a defect in the secondary battery (10) based on the conversion value when executing instructions stored in the memory (150).
  • the processor (130) may be configured to compare a conversion value with a designated reference value and identify a defect in the secondary battery (10) based on the comparison.
  • the reference value may be designated for the conversion value.
  • the processor (130) may obtain a first conversion value for a first measurement value within a first interval and compare the first conversion value with a first reference value.
  • the processor (130) may identify that a defect exists within the first interval if a difference between the first conversion value and the first reference value is outside a designated range.
  • the processor (130) can accurately identify a defect in the secondary battery (10) by converting the measurement value to identify the defect.
  • the processor (130) can obtain a conversion value and determine a defect.
  • the processor (130) may be configured to obtain the measurement value of one parameter within a state where the distance between the sensor module (110) and the secondary battery (10) is a first distance.
  • the processor (130) may be configured to obtain a conversion value based on identifying that the difference between the maximum value and the minimum value of the measurement value of one parameter is less than a reference value.
  • the measurement value may vary depending on the number of measurements.
  • the processor (130) may calculate a conversion value if the difference is less than the reference value. If the difference is greater than the reference value, the processor (130) may not calculate a conversion value because a defect can be determined from the measured value of the parameter.
  • the processor (130) may be configured to adjust the transfer device (140) to change the first distance to a second distance smaller than the first distance based on identifying that a difference between a maximum value and a minimum value of the measured value of the one parameter is less than a reference value.
  • the intensity of the second signal may increase, and the intensity of the measured value of the parameter may increase.
  • a graph may be obtained more clearly, thereby facilitating the determination of a defect.
  • Figures 14a, 14b, and 14c illustrate graphs of measured values according to changes in the distance between the sensor module and the secondary battery.
  • Figures 15a, 15b, and 15c illustrate graphs of converted values for measured values.
  • the shape of the graph may change depending on the distance between the sensor module (110) and the secondary battery (10). For example, when the distance changes, although the shape of the graph is maintained, the intensity of the measured value changes, so the difference between the maximum and minimum values may change. As the distance gets closer, the intensity of the measured value increases, so the difference between the maximum and minimum values of the graph increases, and the shape of the graph can be clearly distinguished. As the distance gets longer, the intensity of the measured value decreases, so the difference between the maximum and minimum values of the graph decreases, and the shape of the graph may be difficult to distinguish.
  • the graph (1410) of FIG. 14a is a graph showing the measurement value of one parameter against the number of measurements when the distance between the sensor module (110) and the secondary battery (10) is about 1 mm.
  • the graph (1420) of FIG. 14b is a graph showing the measurement value of one parameter against the number of measurements when the distance between the sensor module (110) and the secondary battery (10) is about 0.75 mm.
  • the graph (1430) of FIG. 14c is a graph showing the measurement value of one parameter against the number of measurements when the distance between the sensor module (110) and the secondary battery (10) is about 0.5 mm. Comparing the graphs (1410, 1420, 1430), as the distance between the sensor module (110) and the secondary battery (10) increases, the difference between the maximum and minimum values of the graphs may decrease.
  • the difference (1401) between the maximum and minimum values may be smaller than the difference (1402) between the maximum and minimum values within the graph (1420) of FIG. 14b and the difference (1403) between the maximum and minimum values within the graph (1430) of FIG. 14c.
  • the distance increases, it may be difficult to determine a defect because the measured values are not clearly distinguished.
  • the graph (1510) of Fig. 15a is a graph obtained by converting the measurement values of the graph (1410) of Fig. 14a.
  • the graph (1520) of Fig. 15b is a graph obtained by converting the measurement values of the graph (1420) of Fig. 14b.
  • the graph (1530) of Fig. 15c is a graph obtained by converting the measurement values of the graph (1430) of Fig. 14c. Comparing the above graphs (1510, 1520, 1530), even if the distance between the sensor module (110) and the secondary battery (10) changes, the difference between the maximum and minimum values of the graphs can be substantially maintained. For example, in the graph (1510) of FIG. 15a, the difference (1501) between the maximum and minimum values, in the graph (1520) of FIG.
  • the difference (1502) between the maximum and minimum values, and in the graph (1530) of FIG. 15c, the difference (1503) between the maximum and minimum values may be similar or substantially the same.
  • Figure 16a is a graph showing the measured value of one parameter against the number of measurements.
  • Figure 16b is a normalized graph of the graph of Figure 16a.
  • the processor (130) may normalize a graph for the measured values. For example, depending on the operation of the transport device (140), the speed at which the sensor module (110) is transported along the secondary battery (10) or the secondary battery (10) is transported below the sensor module (110) may be different. For example, in the case of the second transport device (142), when the conveyor belt (142a) is operated, since the speed has not yet reached the maximum speed in the initial section, a large number of measurements may be performed within a narrow area of the secondary battery (10), and since the speed is reduced in the later section, a large number of measurements may be performed within a narrow area of the secondary battery (10). In this case, since the graph for the measured values shows a distribution concentrated in a specific area, it may be difficult to determine a defect.
  • a secondary battery inspection device can normalize a measurement result and divide the normalized result into a plurality of sections.
  • the x-axis of a graph (1610) for a measurement value represents the number of measurements.
  • the x-axis of the graph (1610) may have a range of 0 to 371.
  • the initial section e.g., 0 to 40
  • the later section e.g., 330 to 371
  • the measurement values may be concentrated within a narrow area. Therefore, the graph for the parameter may be distorted, making it difficult to identify a defect in the secondary battery (10).
  • the processor (130) can provide a graph (1620) that is a conversion of the graph (1610) of FIG. 16A.
  • the processor (130) can provide a graph (1620) of conversion values by converting measurement values for a plurality of sections.
  • the x-axis of the graph (1620) can have a range between 0 and 1.
  • the processor (130) can obtain the converted graph (1620) based on the following [Mathematical Formula 8].
  • a secondary battery inspection device can obtain a conversion value for a measurement value and provide a graph (1620) based on the conversion value. Since the graph (1620) is a graph based on a normal distribution of the number of measurements, a defect can be accurately determined.
  • Figure 17 shows a graph obtained when dispersion occurs.
  • the secondary battery (10) in the case of the second transport device (142), the secondary battery (10) may be transported on a conveyor belt (142a). If the secondary battery (10) is incorrectly placed on the conveyor belt (142a), scattering may occur.
  • the scattering refers to a case where the secondary battery (10) is inspected while incorrectly placed on the conveyor belt (142a). In this case, distorted results may be obtained, as in the graph (1700) illustrated in FIG. 17.
  • the processor (130) when dispersion occurs, can divide the graph (1700) into a plurality of sections (1710, 1720, 1730) and perform an inspection only on the remaining sections (1710, 1720) excluding some sections (1720). For example, the processor (130) can divide the graph (1700) in which dispersion occurs into a first section (1710), a second section (1720), and a third section (1730). The processor (130) can identify the presence of a defect by calculating kurtosis for the first section (1710) and the third section (1730).
  • the secondary battery inspection device may include a sensor module.
  • the sensor module may include a first sensor including a first coil that applies an induced magnetic field to the secondary battery based on a first signal, and a second sensor including a second coil configured to measure a second signal based on the induced magnetic field by interacting with the induced magnetic field.
  • the sensor module may include a detection circuit configured to obtain the second signal from the second sensor and obtain measurement values of each of a plurality of parameters based on the second signal.
  • the sensor module may include a transport device coupled to the sensor module and configured to transport the sensor module.
  • the sensor module may include a processor configured to control the transport device, obtain the measurement values from the detection circuit, and identify a crack in the secondary battery based on one of the plurality of parameters.
  • the sensor module may include a memory that stores instructions and information related to the secondary battery. The instructions, when individually or collectively executed by the processor, may cause the secondary battery inspection device to select one parameter from among the plurality of parameters, identify a measurement value of the one parameter, distinguish the measurement value of the one parameter with respect to the total number of measurements of the second signal into a plurality of sections including a first section and a second section, identify whether a first defect exists within the first section by comparing a first measurement value included in the first section with a first reference value, identify whether a second defect exists within the second section by comparing a second measurement value included in the second section with a second reference value, and identify a defect in the secondary battery based on identifying at least one of the first defect or the second defect.
  • the instructions when individually or collectively executed by the processor, may cause the secondary battery inspection device to identify, among the measurement values of the one parameter, a smallest first value and a second value next to the first value, identify an interval between a first measurement number corresponding to the first value and a second measurement number corresponding to the second value, and distinguish an interval between the first measurement number and the second measurement number into the plurality of intervals.
  • the instructions when individually or collectively executed by the processor, may cause the secondary battery inspection device to compare the measured value of the one parameter included in the interval between the first measured number and the second measured number with a reference value, and to identify the defect in the secondary battery based on the comparison.
  • the information related to the secondary battery may include first position information corresponding to a first lead tab of the secondary battery and second position information corresponding to a second lead tab.
  • the instructions when individually or collectively executed by the processor, may cause the secondary battery inspection device to identify a third measurement number obtained at a timing when the sensor module is positioned at a position corresponding to the first position information and a fourth measurement number obtained at a timing when the sensor module is positioned at a position corresponding to the second position information, and to sequentially set the plurality of sections into five sections including the first section, the second section, the third section, the fourth section, and the fifth section according to the measurement numbers.
  • the instructions when individually or collectively executed by the processor, may cause the secondary battery inspection device to set a boundary of the second section outside a first range specified from the third measurement number so that the second section overlaps the first section, set a boundary of the fourth section outside a second range specified from the fourth measurement number so that the fourth section overlaps the fifth section, and set the third section between the third measurement number and the fourth measurement number.
  • the secondary battery inspection device may include a sensor module.
  • the sensor module may include a first sensor including a first coil that applies an induced magnetic field to the secondary battery based on a first signal, and a second sensor including a second coil configured to measure a second signal based on the induced magnetic field by interacting with the induced magnetic field.
  • the secondary battery inspection device may include a detection circuit configured to obtain the second signal from the second sensor and obtain measurement values of each of a plurality of parameters based on the second signal.
  • the secondary battery inspection device may include a transport device coupled to the sensor module and configured to transport the sensor module.
  • the secondary battery inspection device may include a processor configured to control the transport device, obtain the measurement values from the detection circuit, and identify a crack in the secondary battery based on one of the plurality of parameters.
  • the secondary battery inspection device may include a memory that stores instructions and information related to the secondary battery.
  • the instructions when individually or collectively executed by the processor, cause the secondary battery inspection device to select one parameter from among the plurality of parameters, identify a measurement value of the one parameter, distinguish the measurement value of the one parameter for the total number of measurements that measured the second signal into a plurality of sections including a first section and a second section, identify a first skewness, a first kurtosis, and a first difference value corresponding to a difference between maximum and minimum values for a first measurement value within the first section, identify a second skewness, a second kurtosis, and a second difference value corresponding to a difference between maximum and minimum values for a second measurement value within the second section, identify whether a first defect exists within the first section based on the first skewness, the first kurtosis, and the first difference value, identify whether a second defect exists within the second section based on the second skewness, the second kurtosis, and the second difference value, and determine whether at least one of the first defect or the second defect exists
  • the asymmetry can be calculated based on the above [Mathematical Formula 5].
  • the kurtosis can be calculated based on the above [Mathematical Formula 6].
  • the instructions when individually or collectively executed by the processor, may cause the secondary battery inspection device to compare the measured value of the one parameter for the total number of measurements with a reference value, and to identify, based on the comparison, whether a third defect in the secondary battery for the total number of measurements exists.
  • the instructions when individually or collectively executed by the processor, may cause the secondary battery inspection device to identify the first defect based on comparing the first asymmetry with a first reference value of the asymmetry, comparing the first kurtosis with a second reference value of the kurtosis, comparing the first difference value with a third reference value of the difference value, and identifying the first asymmetry being less than the first reference value, the first kurtosis being greater than the second reference value, and the first difference value being greater than the third reference value.
  • the secondary battery inspection device may include a sensor module.
  • the sensor module may include a first sensor including a first coil that applies an induced magnetic field to the secondary battery based on a first signal, and a second sensor including a second coil configured to measure a second signal based on the induced magnetic field by interacting with the induced magnetic field.
  • the secondary battery inspection device may include a detection circuit configured to obtain the second signal from the second sensor and obtain measurement values of each of a plurality of parameters based on the second signal.
  • the secondary battery inspection device may include a transport device coupled to the sensor module and configured to transport the sensor module.
  • the secondary battery inspection device may include a processor configured to control the transport device, obtain the measurement values from the detection circuit, and identify a crack in the secondary battery based on one of the plurality of parameters.
  • the secondary battery inspection device may include a memory that stores instructions and information related to the secondary battery.
  • the above instructions when individually or collectively executed by the processor, may be configured to cause the secondary battery inspection device to select one parameter from among the plurality of parameters, identify a measurement value of the one parameter, distinguish the measurement value of the one parameter into a plurality of sections, and, for each of the plurality of sections, convert the measurement value of the one parameter based on [Mathematical Formula 7], thereby obtaining a conversion value for the measurement value of the one parameter, and identifying a defect in the secondary battery based on the conversion value.
  • the transport device may be configured to adjust the distance between the sensor module and the secondary battery.
  • the processor may be configured to obtain the measured value of the one parameter while the distance between the sensor module and the secondary battery is the first distance, and to obtain the converted value based on identifying that a difference between a maximum value and a minimum value of the measured value of the one parameter is less than a reference value.
  • the processor may be configured to adjust the transport device to change the first distance to a second distance less than the first distance based on identifying that a difference between a maximum value and a minimum value of the measured values of the one parameter is less than a reference value.
  • the processor may be configured to obtain a graph based on the above [Mathematical Formula 8] and to divide the graph into the plurality of sections in order to normalize the measured value of the one parameter with respect to the total number of measurements.
  • the plurality of parameters may include a first parameter including a difference between a voltage of the first signal and a voltage of the second signal and a difference between a phase of the first signal and a phase of the second signal; and a second parameter including a resistance of the second coil and an impedance of the second coil obtained from the first parameter.
  • the devices described above may be implemented as hardware components, software components, and/or a combination of hardware components and software components.
  • the devices and components described in the embodiments may be implemented using one or more general-purpose computers or special-purpose computers, such as, for example, a processor, a controller, an arithmetic logic unit (ALU), a digital signal processor, a microcomputer, a field programmable gate array (FPGA), a programmable logic unit (PLU), a microprocessor, or any other device capable of executing instructions and responding.
  • ALU arithmetic logic unit
  • FPGA field programmable gate array
  • PLU programmable logic unit
  • the processing unit is sometimes described as being used alone, but one of ordinary skill in the art will recognize that the processing unit may include multiple processing elements and/or multiple types of processing elements.
  • the processing unit may include multiple processors, or one processor and one controller.
  • the method according to the embodiment may be implemented in the form of program commands that can be executed through various computer means and recorded on a computer-readable medium.
  • the computer-readable medium may include program commands, data files, data structures, etc., alone or in combination.
  • the program commands recorded on the medium may be those specially designed and configured for the embodiment or may be those known and available to those skilled in the art of computer software.
  • Examples of the computer-readable recording medium include magnetic media such as hard disks, floppy disks, and magnetic tapes, optical media such as CD-ROMs and DVDs, magneto-optical media such as floptical disks, and hardware devices specially configured to store and execute program commands, such as ROMs, RAMs, and flash memories.
  • Examples of the program commands include not only machine language codes generated by a compiler, but also high-level language codes that can be executed by a computer using an interpreter, etc.
  • the hardware devices described above may be configured to operate as one or more software modules to perform the operations of the embodiment, and vice versa.

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Abstract

Le présent appareil d'inspection de batterie secondaire peut comprendre un module de capteur, un circuit de détection, un dispositif de transfert, un processeur et une mémoire. Le processeur peut être conçu pour diviser une valeur mesurée d'un paramètre obtenu par l'intermédiaire du circuit de détection en une pluralité de sections, et identifier un défaut d'une batterie secondaire pour la pluralité de sections.
PCT/KR2024/008809 2024-02-21 2024-06-25 Appareil d'inspection de batterie secondaire utilisant une mfc Pending WO2025178179A1 (fr)

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KR20240025148 2024-02-21
KR20240025149 2024-02-21
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KR10-2024-0025148 2024-02-21
KR20240025150 2024-02-21
KR10-2024-0043800 2024-03-29
KR10-2024-0043799 2024-03-29
KR1020240043800A KR20250129501A (ko) 2024-02-21 2024-03-29 Mfc를 이용하는 이차 전지 검사 장치
KR1020240043801A KR20250129502A (ko) 2024-02-21 2024-03-29 Mfc를 이용하는 이차 전지 검사 장치
KR10-2024-0043801 2024-03-29
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Citations (5)

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Publication number Priority date Publication date Assignee Title
KR20080000701A (ko) * 2006-06-28 2008-01-03 한양대학교 산학협력단 축전지 진단장치 및 방법
KR101937995B1 (ko) * 2015-06-04 2019-01-11 주식회사 엘지화학 전지팩 기능 검사장치
WO2019177288A1 (fr) * 2018-03-13 2019-09-19 삼성에스디아이주식회사 Dispositif d'inspection de fuite d'élément de batterie et procédé d'inspection de fuite d'élément de batterie
KR20210019447A (ko) * 2018-06-01 2021-02-22 엘렉트디스 에이비 무선전력장치의 검사를 위한 시스템 및 방법
KR20220041830A (ko) * 2019-08-06 2022-04-01 가부시키가이샤 인테그랄 지오메트리 사이언스 축전지 검사 장치 및 축전지 검사 방법

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20080000701A (ko) * 2006-06-28 2008-01-03 한양대학교 산학협력단 축전지 진단장치 및 방법
KR101937995B1 (ko) * 2015-06-04 2019-01-11 주식회사 엘지화학 전지팩 기능 검사장치
WO2019177288A1 (fr) * 2018-03-13 2019-09-19 삼성에스디아이주식회사 Dispositif d'inspection de fuite d'élément de batterie et procédé d'inspection de fuite d'élément de batterie
KR20210019447A (ko) * 2018-06-01 2021-02-22 엘렉트디스 에이비 무선전력장치의 검사를 위한 시스템 및 방법
KR20220041830A (ko) * 2019-08-06 2022-04-01 가부시키가이샤 인테그랄 지오메트리 사이언스 축전지 검사 장치 및 축전지 검사 방법

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