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WO2025160751A1 - Ultrasonic detection base plate and ultrasonic imaging apparatus - Google Patents

Ultrasonic detection base plate and ultrasonic imaging apparatus

Info

Publication number
WO2025160751A1
WO2025160751A1 PCT/CN2024/074725 CN2024074725W WO2025160751A1 WO 2025160751 A1 WO2025160751 A1 WO 2025160751A1 CN 2024074725 W CN2024074725 W CN 2024074725W WO 2025160751 A1 WO2025160751 A1 WO 2025160751A1
Authority
WO
WIPO (PCT)
Prior art keywords
line
signal line
partition
signal
adapter
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
PCT/CN2024/074725
Other languages
French (fr)
Chinese (zh)
Inventor
刘立伟
佟月
曹永刚
冯煊
李卓
张慧
韩承佑
杨明
张定昌
王迎姿
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
BOE Technology Group Co Ltd
Beijing BOE Technology Development Co Ltd
Original Assignee
BOE Technology Group Co Ltd
Beijing BOE Technology Development Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by BOE Technology Group Co Ltd, Beijing BOE Technology Development Co Ltd filed Critical BOE Technology Group Co Ltd
Priority to PCT/CN2024/074725 priority Critical patent/WO2025160751A1/en
Publication of WO2025160751A1 publication Critical patent/WO2025160751A1/en
Pending legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • AHUMAN NECESSITIES
    • A61MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61BDIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B8/00Diagnosis using ultrasonic, sonic or infrasonic waves
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/22Details, e.g. general constructional or apparatus details
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01SRADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
    • G01S15/00Systems using the reflection or reradiation of acoustic waves, e.g. sonar systems
    • G01S15/88Sonar systems specially adapted for specific applications
    • G01S15/89Sonar systems specially adapted for specific applications for mapping or imaging

Definitions

  • the present disclosure relates to the field of ultrasonic detection technology, and in particular to an ultrasonic detection substrate and an ultrasonic imaging device.
  • Ultrasound imaging is an important non-destructive testing method in medicine. With technological advancements, ultrasound imaging is developing towards faster, clearer, and more three-dimensional imaging. High definition and high resolution are a constant pursuit, facilitating earlier disease detection and prompt treatment.
  • the present disclosure provides an ultrasonic detection substrate, comprising a base substrate, and a detection area and a peripheral area provided on one side of the base substrate, wherein the peripheral area is located on at least one side of the detection area;
  • the detection area includes: a plurality of array elements arranged in a row direction and a column direction, and a plurality of signal lines arranged in the row direction and extending in the column direction, the signal lines being connected to the array elements, the plurality of signal lines including a plurality of partition signal lines, the plurality of partition signal lines being divided into a plurality of signal line groups, the signal line groups including at least one of the partition signal lines;
  • the peripheral area includes a patch cord extending along a row direction, and the patch cord includes a plurality of patch cord segments arranged along the row direction and spaced apart;
  • Partition signal lines belonging to the same signal line group are connected to the same patch cord segment, and partition signal lines belonging to different signal line groups are connected to different patch cord segments.
  • the peripheral area further comprises:
  • a fan-out line and a binding terminal wherein the fan-out line is connected between the binding terminal and the patch line segment, and different patch line segments are connected to different binding terminals through different fan-out lines.
  • a connection point between the patch line segment and the fan-out line is centered relative to the patch line segment in a row direction.
  • the fan-out line and the patch line are provided on the same layer; or
  • the fan-out lines are arranged in different layers from the transfer lines and the partition signal lines.
  • different patch cord segments belonging to the same patch cord are connected to the same number of partitioned signal lines; and/or
  • Different patch cord segments belonging to the same patch cord have the same width along the row direction.
  • the plurality of signal lines further include a jumper signal line, the jumper signal line and the patch line segment are provided in different layers and their orthographic projections on the base substrate overlap, and there is no connection between the jumper signal line and the patch line segment;
  • the number of the overlapping jumper signal lines is the same as that of the two patch cord segments belonging to the same patch cord.
  • the plurality of signal lines further include a jumper signal line, wherein the jumper signal line and the adapter line segment are arranged in different layers and are not connected to each other;
  • a first hollow hole is provided on the adapter wire segment, and the first hollow hole overlaps with the orthographic projection of the jumper signal wire on the base substrate.
  • the plurality of first hollow holes are spaced apart from each other and arranged along the column direction, and the orthographic projections of the first hollow holes on the base substrate cover the orthographic projections of the jumper signal lines on the base substrate in the row direction.
  • the signal line and the adapter line are arranged in different layers;
  • the detection area includes two partition signal lines arranged in the same layer and separated from each other, the two partition signal lines are a first partition signal line and a second partition signal line, and the first partition signal line and the second partition signal line are used to provide different signals to the array element;
  • the peripheral area includes two adapter wires arranged in the same layer and separated from each other, the two adapter wires are a first adapter wire and a second adapter wire, the adapter wire segment in the first adapter wire is connected to the first partition signal line, and the adapter wire segment in the second adapter wire is connected to the second partition signal line, and the first adapter wire is located on the side of the second adapter wire close to the detection area.
  • the number of the first partition signal lines is greater than or equal to the number of the second partition signal lines.
  • the plurality of array elements are divided into a plurality of detection units, and the detection unit includes a plurality of array elements arranged along a row direction;
  • Different array elements belonging to the same detection unit are connected to different first partition signal lines, and different array elements belonging to the same detection unit are connected to the same second partition signal line.
  • the first partition signal line is an enable signal line
  • the second partition signal line is a reset control signal line
  • the first partition signal line is a reset control signal line
  • the second partition signal line is an enable signal line
  • the array element includes an ultrasonic sensor
  • the enable signal line is used to provide an enable signal to the array element, so that the array element responds to the enable signal and collects the induced voltage on the ultrasonic sensor
  • the reset control signal line is used to provide a reset control signal to the array element, so that the array element responds to the reset control signal and writes a reset signal into the array element.
  • the plurality of signal lines further include a power signal line, and the power signal line is used to provide a power signal to the array element;
  • the peripheral area further includes: a first transmission line extending in a row direction and connected to the plurality of power signal lines, wherein the first transmission lines located on the same side of the detection area are interconnected as an integrated structure; and
  • the first transmission line is located between the first patch line and the second patch line, or the first transmission line is located on a side of the second patch line away from the first patch line.
  • two first transmission lines are arranged on opposite sides of the detection area along a column direction, and the peripheral area further includes:
  • the second transmission line extends along the column direction, is arranged in a different layer from the first transmission line and is connected to each other at the intersection position. Two second transmission lines are arranged opposite to each other on both sides of the detection area along the row direction.
  • the peripheral area further comprises:
  • the first transfer pattern is located on a side of the first transfer line close to the detection area, is arranged on the same layer as the first transfer line, and is respectively connected to the first transfer line and the first partition signal line.
  • the orthographic projections of the first partition signal line and the first transfer line on the base substrate do not overlap.
  • the peripheral area further comprises:
  • a second transfer pattern located on a side of the first transfer line close to the detection area, arranged on the same layer as the first transfer line and spaced apart from each other, wherein two adjacent second partition signal lines are connected to the same second transfer pattern through a via;
  • the partition signal line and the adapter line have overlapping orthographic projections on the base substrate, and the partition signal line and the adapter line are connected through a via.
  • both opposite ends of the partition signal line along the column direction are connected to the adapter line, and the adapter line is arranged on two opposite sides of the detection area along the column direction.
  • the present disclosure provides an ultrasonic imaging device, comprising:
  • the ultrasonic detection substrate according to any one of the embodiments.
  • a driving circuit is connected to the ultrasonic detection substrate and is used to provide a driving signal to the signal line.
  • FIG1 exemplarily shows a schematic diagram of a planar structure of an ultrasonic detection substrate
  • FIG2 exemplarily shows a schematic planar structural diagram of an ultrasonic detection substrate provided by the present disclosure
  • FIG3 exemplarily shows a circuit layout diagram of a first peripheral area provided by the present disclosure
  • FIG4 exemplarily shows a circuit layout diagram at the junction of the detection area and the peripheral area
  • FIG5 exemplarily shows a connection diagram of a first patch line and a first fan-out line
  • FIG6 exemplarily shows a connection diagram of a second patch line and a second fan-out line
  • FIG7 exemplarily shows a circuit layout diagram of a second peripheral area provided by the present disclosure
  • FIG8 exemplarily shows a circuit layout diagram on the opposite side of the first peripheral area provided by the present disclosure
  • FIG9 exemplarily shows a circuit layout diagram at four corner positions in an ultrasonic detection substrate
  • FIG10 exemplarily shows a circuit layout diagram of a third peripheral area provided by the present disclosure
  • FIG11 exemplarily shows a circuit layout diagram of a fourth peripheral area provided by the present disclosure
  • FIG12 exemplarily shows a circuit layout diagram of a fifth peripheral area provided by the present disclosure
  • FIG13 exemplarily shows a schematic diagram of an equivalent circuit of an array element.
  • the present disclosure provides an ultrasonic testing substrate, as shown in FIG1 , comprising a base substrate 11, a detection area AA and a peripheral area NA disposed on one side of the base substrate 11, wherein the peripheral area NA is located on at least one side of the detection area AA. As shown in FIG1 , the peripheral area NA is located around the detection area AA.
  • the detection area AA includes: a plurality of array elements 12 arranged in an array along the row direction f1 and the column direction f2, and a plurality of signal lines 20 arranged along the row direction f1 and extending along the column direction f2.
  • the signal lines 20 are connected to the array elements 12.
  • the plurality of signal lines 20 include a plurality of partition signal lines 21.
  • the plurality of partition signal lines 21 are divided into a plurality of signal line groups GP.
  • the signal line group GP includes at least one partition signal line 21.
  • the array element 12 includes an ultrasonic sensor SS. In response to a signal provided by the signal line 20 , the array element 12 can generate and output a detection signal according to an induced voltage on the ultrasonic sensor SS.
  • the peripheral area NA includes a transfer line ZL extending along a row direction f1 .
  • the transfer line ZL includes a plurality of transfer line segments LS arranged along the row direction f1 and spaced apart.
  • the partitioned signal lines 21 belonging to the same signal line group GP are connected to the same patch line segment LS, and the partitioned signal lines 21 belonging to different signal line groups GP are connected to different patch line segments LS.
  • a patch cord segment LS corresponds to a partition signal line 21 in a signal line group GP, and the partition signal lines 21 in different signal line groups GP are provided with signals by different patch cord segments LS.
  • the partition signal line 21 in each signal line group GP corresponds to a sub-area B1 in the detection area AA.
  • the technical solution provided by this disclosure facilitates large-area two-dimensional array ultrasonic testing of substrates.
  • the large-area two-dimensional array element design can achieve improved resolution, with recognition resolution reaching 0.5mm to 1mm.
  • a sub-area B1 in the detection area AA may include one or more columns of array elements 12 , and the partition signal lines 21 connected to the array elements 12 in one sub-area B1 constitute a signal line group GP.
  • the detection area AA may include at least one partition signal line 21 (two types as shown in FIG3 ), and at least one partition signal line 21 includes a first partition signal line 211.
  • the peripheral area NA may include at least one adapter line ZL (two types as shown in FIG3 ), and at least one adapter line ZL includes a first adapter line ZL1.
  • the adapter line segment LS in the first adapter line ZL1 is a first adapter line segment LS1.
  • the first adapter line segment LS1 is connected to the first partition signal line 211, and the first partition signal lines 211 belonging to the same signal line group GP are connected to the same first adapter line segment LS1, and the first partition signal lines 211 belonging to different signal line groups GP are connected to different first adapter line segments LS1.
  • At least one partition signal line 21 also includes a second partition signal line 212
  • at least one adapter line ZL also includes a second adapter line ZL2
  • the adapter line segment LS in the second adapter line ZL2 is the second adapter line segment LS2
  • the second adapter line segment LS2 is connected to the second partition signal line 212
  • the second partition signal lines 212 belonging to the same signal line group GP are connected to the same second adapter line segment LS2
  • the second partition signal lines 212 belonging to different signal line groups GP are connected to different second adapter line segments LS2.
  • the first partition signal line 211 and the second partition signal line 212 are used to provide different signals to the array element 12 , and the array element 12 is connected to both the first partition signal line 211 and the second partition signal line 212 .
  • the adapter line ZL and the signal line 20 are disposed in different layers.
  • the first partition signal line 211 is located in the third metal layer M3 , extends from the detection area AA to the peripheral area NA along the column direction f2 , and is connected to the first transfer line ZL1 located in the second metal layer M2 through a via.
  • the second partition signal line 212 is located in the third metal layer M3 and extends from the detection area AA to the peripheral area NA along the column direction f2, crossing the first transfer line ZL1 (as shown in FIG7 ).
  • the first transfer line ZL1 and the first transmission line 31 are connected to the second transfer line ZL2 located on the second metal layer M2 through a via.
  • a plurality of partition signal lines 21 may be arranged on the same layer (e.g., all located on the third metal layer M3) and separated from each other, and a plurality of transfer lines ZL may be arranged on the same layer (e.g., all located on the second metal layer M2) and spaced apart along the column direction f2.
  • the first patch cable ZL1 includes a first number of patch cable segments LS
  • the second patch cable ZL2 includes a second number of patch cable segments LS.
  • the first number can be equal to the second number.
  • the first number can also be greater than or less than the second number, and this disclosure is not limited to this. Both the first number and the second number are positive integers greater than 1.
  • a plurality of switching line segments LS located in the same switching line ZL have the same position and height in the column direction f2 .
  • the peripheral area NA further includes: a fan-out line 51 and a binding terminal PIN.
  • the fan-out line 51 is connected between the binding terminal PIN and the patch line segment LS. Different patch line segments LS are connected to different binding terminals PIN via different fan-out lines 51.
  • the binding terminal PIN is used to bind and connect to the driving circuit of the ultrasonic detection substrate, and the driving circuit is used to provide a driving signal to the signal line 20.
  • the fan-out line 51 and the transfer line ZL are provided on the same layer, or the fan-out line 51 and the transfer line ZL and the partition signal line 21 are provided on different layers.
  • the fan-out line 51 connected to the first transfer line ZL1 is the first fan-out line 511.
  • the first fan-out line 511 is arranged on different layers from the first transfer line ZL1 and the first partition signal line 211, respectively.
  • the first fan-out line 511 is located, for example, in the first metal layer M1.
  • the first fan-out line 511 is connected to the first transfer line segment LS1 located in the second metal layer M2 through a via (as shown in the dotted box X1 in Figure 5).
  • a first transmission line 31, a second transfer line ZL2, and a ground line GND are sequentially arranged on the side of the first transfer line ZL1 away from the detection area AA, wherein the first transmission line 31 and the second transfer line ZL2 are arranged on the same layer as the first transfer line ZL1 and are located on the second metal layer M2, and the ground line GND is arranged on the same layer as the first partition signal line 211 and is located on the third metal layer M3.
  • the first fan-out line 511 extends downward through the first transmission line 31, the second transfer line ZL2, and the ground line GND.
  • the first fan-out line 511 By arranging the first fan-out line 511 on different layers from the first transfer line ZL1 and the first partition signal line 211, the first fan-out line 511 is connected to the first transmission line 31, the second transfer line ZL2, and the ground line GND.
  • the ground line GND is arranged in different layers, thereby avoiding a short circuit between the first fan-out line 511 and the first transmission line 31, the second transfer line ZL2 and the ground line GND, and saving wiring space.
  • first adapter line segments LS1 are connected to different first fan-out lines 511 .
  • first adapter line segments LS1 and the first fan-out lines 511 are connected in a one-to-one correspondence.
  • the fan-out line 51 connected to the second transfer line ZL2 is the second fan-out line 512
  • the second fan-out line 512 is located, for example, in the second metal layer M2, that is, the second fan-out line 512 and the second transfer line ZL2 are arranged on the same layer, and the interconnected second fan-out line 512 and the second transfer line segment LS2 are an integrated structure.
  • a ground line GND is also provided on the side of the second transfer line ZL2 away from the detection area AA.
  • the ground line GND is provided on the same layer as the second partition signal line 212 and is located on the third metal layer M3.
  • the second fan-out line 512 passes through the ground line GND.
  • different second adapter line segments LS2 are connected to different second fan-out lines 512 .
  • the second adapter line segments LS2 and the second fan-out lines 512 are connected in a one-to-one correspondence.
  • connection point between the switch line segment LS and the fan-out line 51 is centered relative to the switch line segment LS in the row direction f1 .
  • connection point O1 between the first patch line segment LS1 and the first fan-out line 511 is centered relative to the first patch line segment LS1 in the row direction f1.
  • connection point O2 between the second patch line segment LS2 and the second fan-out line 512 is centered relative to the second patch line segment LS2 in the row direction f1.
  • This embodiment can ensure that the signal input point of the fan-out line 51 is located in the middle position of the patch line segment LS along the row direction f1, thereby reducing the delay time difference between the far and near ends of the signal input point of the patch line segment LS and further improving the accuracy of ultrasonic imaging.
  • the fan-out lines 51 (such as the first fan-out lines 511 shown in FIG. 5 and the second fan-out lines 512 shown in FIG. 6 ) at least partially extend along the column direction f2 .
  • the two opposite ends of the partition signal line 21 along the column direction f2 are both connected to the adapter line ZL, and the adapter line ZL is arranged on both sides of the detection area AA along the column direction f2.
  • the partition signal line 21 can be driven on both sides.
  • the delay time difference between the far and near ends of the signal input point of the partition signal line 21 is further reduced, and the accuracy of ultrasonic imaging is further improved.
  • FIG. 3 and 4 show the circuit layout diagrams of the peripheral area NA located below the detection area AA
  • FIG. 8 shows the circuit layout diagram of the peripheral area NA located above the detection area AA.
  • the first partition signal line 211 extends upward and downward along the column direction f2, respectively, and connects to the first patch line ZL1 located above and below the detection area AA.
  • the second partition signal line 212 extends upward and downward along the column direction f2, respectively, and connects to the second patch line ZL2 located above and below the detection area AA.
  • different patch cord segments LS belonging to the same patch cord ZL are connected to the same number of partition signal lines 21. This can reduce the load differences between different patch cord segments LS, thereby reducing the delay time differences between different patch cord segments LS, and further improving the accuracy of ultrasonic imaging.
  • different adapter line segments LS belonging to the same adapter line ZL may be, for example, different first adapter line segments LS1 belonging to the same first adapter line ZL1 , or different second adapter line segments LS2 belonging to the same second adapter line ZL2 .
  • different patch cord segments LS belonging to the same patch cord ZL connect to the same number of array elements 12. This can reduce the load differences between different patch cord segments LS, thereby reducing the delay time differences between different patch cord segments LS, and further improving the accuracy of ultrasonic imaging.
  • different patch line segments LS belonging to the same patch line ZL have the same width along the row direction f1. This can reduce the load difference between different patch line segments LS, thereby reducing the delay time difference between different patch line segments LS, and further improving the accuracy of ultrasonic imaging.
  • the plurality of signal lines 20 further include jumper signal lines 41.
  • the jumper signal lines 41 are disposed on a different layer from the patch line segments LS and overlap in their orthographic projections on the base substrate 11. There is no connection between the jumper signal lines 41 and the patch line segments LS. In their orthographic projections on the base substrate 11, the number of jumper signal lines 41 that overlap with two patch line segments LS belonging to the same patch line ZL is the same.
  • a coupling capacitor can be formed between the jumper signal line 41 and the transfer line segment LS.
  • its jumper signal line 41 includes, for example, the second partition signal line 212, the power signal line 22, and the data signal line 23.
  • its jumper signal line 41 includes, for example, the data signal line 23.
  • its jumper signal line 41 includes, for example, the power signal line 22 and the data signal line 23.
  • the plurality of signal lines 20 further include a jumper signal line 41.
  • the jumper signal line 41 is disposed on a different layer from the patch line segment LS and is not connected to each other.
  • the patch line segment LS is provided with a first hollow hole H1, which overlaps with the orthographic projection of the jumper signal line 41 on the base substrate 11.
  • the overlapping area between the jumper signal line 41 and the adapter line segment LS can be reduced, thereby reducing the coupling capacitance, thereby reducing the signal delay time, and improving the accuracy of ultrasonic imaging.
  • a plurality of first hollow holes H1 are spaced apart from each other and arranged along the column direction f2 , and the orthographic projections of the first hollow holes H1 on the base substrate 11 cover the orthographic projections of the jumper signal lines 41 on the base substrate 11 in the row direction f1 .
  • the width of the first hollow hole H1 along the row direction f1 is greater than the width of the jumper signal line 41 along the row direction f1 .
  • the first adapter line ZL1 is located on a side of the second adapter line ZL2 close to the detection area AA. Furthermore, the plurality of adapter lines ZL can be sequentially arranged along the column direction f2 in the peripheral area NA.
  • the number of the first partition signal lines 211 is greater than or equal to the number of the second partition signal lines 212 .
  • first partition signal lines 211 When the number of first partition signal lines 211 is greater than the number of second partition signal lines 212, by setting the first adapter line ZL1 to be located on the side of the second adapter line ZL2 close to the detection area AA, the cross-over between the first partition signal line 211 and other lateral extension lines can be reduced, thereby reducing the coupling capacitance, reducing signal delay, and further improving the accuracy of ultrasonic imaging.
  • a plurality of array elements 12 are divided into a plurality of detection units U.
  • the detection unit U includes a plurality of array elements 12 arranged along the row direction f1.
  • the same array element 12 is connected to different first partition signal lines 211 , and different array elements 12 belonging to the same detection unit U are connected to the same second partition signal line 212 .
  • the detection unit U includes two array elements 12 arranged along the row direction f1 .
  • the two array elements 12 are connected to different first partition signal lines 211 and to the same second partition signal line 212 .
  • the first partition signal lines 211 connecting different array elements 12 in the same detection unit U are located in the same signal line group GP and connected to the same first patch line segment LS1 .
  • a sub-area B1 includes n columns of detection units U, and the detection unit U includes two array elements 12 arranged along the row direction f1.
  • the number of first partition signal lines 211 connecting the sub-area B1 is 2n, and the 2n first partition signal lines 211 are connected to the same first switching line segment LS1.
  • the number of second partition signal lines 212 connecting the sub-area B1 is n, and the n second partition signal lines 212 are connected to the same second switching line segment LS2.
  • the first partition signal line 211 is the enable signal line ENL
  • the second partition signal line 212 is the reset control signal line RL; or the first partition signal line 211 is the reset control signal line RL, and the second partition signal line 212 is the enable signal line ENL.
  • array element 12 includes an ultrasonic sensor SS.
  • An enable signal line ENL is used to provide an enable signal to array element 12, so that array element 12 responds to the enable signal and collects the induced voltage on ultrasonic sensor SS.
  • a reset control signal line RL is used to provide a reset control signal to array element 12, so that array element 12 responds to the reset control signal and writes a reset signal into array element 12.
  • the plurality of signal lines 20 further include a power signal line 22, which is used to provide a power signal to the array element 12.
  • the peripheral area NA further includes a first transmission line 31 extending along the row direction f1 and connected to the plurality of power signal lines 22.
  • the first transmission lines 31 located on the same side of the detection area AA are interconnected and form an integrated structure.
  • the first transmission lines 31 located below the detection area AA are interconnected integral structures. As shown in FIG8 , the first transmission lines 31 located above the detection area AA are interconnected integral structures.
  • the first transmission line 31 is located between the first patch line ZL1 and the second patch line ZL2 (as shown in FIG3 ), or the first transmission line 31 is located on a side of the second patch line ZL2 away from the first patch line ZL1 (as shown in FIG7 ).
  • the two first transmission lines 31 are relatively arranged on both sides (e.g., the upper side and the lower side) of the detection area AA along the column direction f2, and the peripheral area NA further includes: a second transmission line 91, which extends along the column direction f2, is arranged in a different layer from the first transmission line 31 and is connected to each other at the intersection position, and the two second transmission lines 91 are relatively arranged on both sides (e.g., the left side and the right side) of the detection area AA along the row direction f1.
  • the power signal is a DC signal.
  • the power signal line 22 is located in the third metal layer M3, extends upward and downward from the detection area AA to the peripheral area NA along the column direction f2, and is connected to the first transmission line 31 located in the second metal layer M2 through a via, and the first transmission line 31 is connected to the second transmission line 91 located in the third metal layer M3 through a via.
  • the first transmission line 31 located on the upper and lower sides of the detection area AA is connected to the second transmission line 91 located on the left and right sides of the detection area AA through vias at the intersection, forming a closed route surrounding the detection area AA.
  • a second hollow hole H2 is provided on the first transmission line 31, and the second hollow hole H2 overlaps with the orthographic projection of the coupling signal line 24 on the base substrate 11, wherein the coupling signal line 24 refers to a signal line 20 that is arranged in a different layer from the first transmission line 31 and has an overlapping orthographic projection on the base substrate 11, and the coupling signal line 24 and the first transmission line 31 are not connected to each other.
  • the coupled signal line 24 of the first transmission line 31 includes the second partition signal line 212 and the data signal line 23. As shown in FIG7 , the coupled signal line 24 of the first transmission line 31 is the data signal line 23.
  • the width of the second hollow hole H2 along the row direction f1 is greater than the width of the coupling signal line 24 along the row direction f1 .
  • the peripheral area NA also includes: a first transfer pattern 101, located on the side of the first transfer line ZL1 close to the detection area AA, and connected to the first transfer line ZL1 and the first partition signal line 211 respectively, and the first partition signal line 211 and the first transfer line ZL1 have no overlapping orthographic projections on the base substrate 11.
  • the first switching pattern 101 and the first switching line ZL1 are provided on the same layer.
  • the peripheral area NA further includes a second transfer pattern 121 located on a side of the first transfer line ZL1 near the detection area AA, arranged on the same layer as the first transfer line ZL1 and spaced apart from each other.
  • Two adjacent second partitioned signal lines 212 are connected to the same second transfer pattern 121 via a via. Of the two adjacent second partitioned signal lines 212, one crosses the first transfer line ZL1 and is connected to the second transfer line ZL2 via a via, while the other does not overlap with either the first transfer line ZL1 or the second transfer line ZL2 in their orthographic projections on the base substrate 11.
  • the overlapping area between the second partition signal line 212 and the first transfer line ZL1 can be reduced, thereby reducing the coupling capacitance and shortening the signal delay time.
  • the orthographic projections of the partition signal line 21 and the adapter line ZL on the base substrate 11 overlap, and the partition signal line 21 and the adapter line ZL are connected through a via.
  • the first partition signal line 211 is connected to the first transfer line ZL1 through a via hole
  • the second partition signal line 212 is connected to the second transfer line ZL2 through a via hole.
  • the width of the portion of the partition signal line 21 connected to the adapter line ZL is increased, which can increase the contact area between the partition signal line 21 and the adapter line ZL and reduce the contact resistance.
  • the width of the portion of the first partition signal line 211 connected to the first transition line ZL1 is increased, and the width of the portion of the second partition signal line 212 connected to the second transition line ZL2 is increased.
  • the vias connecting the partition signal lines 21 and the adapter lines ZL are arranged in an array along the row direction f1 and the column direction f2 .
  • the ultrasonic sensor SS may be a vinylidene fluoride piezoelectric film sensor (ie, a PVDF sensor), a capacitive micromachined ultrasonic sensor SS (ie, a CMUT sensor),
  • the piezoelectric micromachined ultrasonic transducer ie, PMUT sensor
  • the array element 12 includes an ultrasonic sensor SS and an array element circuit.
  • the array element circuit adopts a 4T1C design, that is, it includes four transistors and one capacitor.
  • the four transistors are a first transistor T1, a second transistor T2, a third transistor T3, and a fourth transistor T4, and the one capacitor is a first capacitor C1.
  • the gate of the first transistor T1 is connected to the reset control signal line RL, the first electrode is connected to the reset signal line BL, and the second electrode is connected to the first node N1, which is connected to the ultrasonic sensor SS.
  • the gate of the second transistor T2 is connected to the enable signal line ENL, the first electrode is connected to the first node N1, and the second electrode is connected to the second node N2.
  • the gate of the third transistor T3 is connected to the second node N2, the first electrode is connected to the power signal line 22, and the second electrode is connected to the first electrode of the fourth transistor T4.
  • the gate of the fourth transistor T4 is connected to the scan signal line SCL, and the second electrode is connected to the data signal line 23.
  • the first capacitor C1 is connected between the first electrode of the first transistor T1 and the second node N2.
  • the scan signal line SCL is used to provide a scan signal GT.
  • the array element 12 can respond to the scan signal GT and generate a detection signal based on the induced voltage on the ultrasonic sensor SS.
  • the detection signal is then loaded onto the data signal line 23.
  • the data signal line 23 is used to output the detection signal.
  • the power signal line 22 is used to provide a power signal to the array element 12.
  • the enable signal line ENL is used to provide an enable signal to the array element 12, so that the array element 12 responds to the enable signal and collects the induced voltage on the ultrasonic sensor SS.
  • the reset control signal line RL is used to provide a reset control signal to the array element 12, so that the array element 12 responds to the reset control signal and writes the reset signal input from the reset signal line BL to the first node N1.
  • the first node N1 may be reset before collecting the induced voltage on the ultrasonic sensor SS. For example, a reset control signal may be provided to the reset control signal line RL first, and then an enable signal may be provided to the enable signal line ENL. This may improve the accuracy of collection.
  • the data signal lines 23 are connected to the binding terminals in a one-to-one correspondence.
  • different array elements 12 belonging to the same detection unit U are connected to different data signal lines 23, and different array elements 12 belonging to the same detection unit U are connected to the same power signal line 22.
  • a sub-area B1 includes n columns of detection units U
  • the number of data signal lines 23 connected to the sub-area B1 is 2n
  • the number of power signal lines 22 connected to the sub-area B1 is n.
  • the present disclosure provides an ultrasonic imaging device, comprising an ultrasonic detection substrate as provided in any embodiment, and a driving circuit connected to the ultrasonic detection substrate and configured to provide a driving signal to the signal line.
  • the ultrasonic imaging device provided by the present disclosure has the advantages of the above-mentioned ultrasonic detection substrate.
  • the peripheral area of the ultrasonic detection substrate includes binding terminals, which are connected to signal lines.
  • the binding terminals are, for example, bound and connected to one end of a flexible circuit board, and the other end of the flexible circuit board can be connected to a driving circuit (such as a printed circuit board).
  • the ultrasonic imaging device may also include an ultrasonic generator for emitting an ultrasonic signal.
  • the ultrasonic sensor in the ultrasonic detection substrate receives the ultrasonic signal reflected back by the object to be detected and generates an induced voltage.
  • the array element can generate a detection signal based on the induced voltage on the ultrasonic sensor.
  • the ultrasonic imaging device or ultrasonic detection substrate provided by the present disclosure can be used for medical ultrasonic imaging detection, and can also be applied to other fields that utilize ultrasonic imaging, such as ultrasonic flaw detection.
  • a plurality of means two or more, and “at least one” means one or more, unless otherwise clearly defined.
  • the orientation or positional relationship indicated by the terms “upper” and “lower” is based on the orientation or positional relationship shown in the accompanying drawings, and is only for the convenience of describing the present disclosure and simplifying the description, and does not indicate or imply that the device or element referred to must have a specific orientation, be constructed and operate in a specific orientation. Therefore, it should not be understood as a limitation on the present disclosure.
  • references in this disclosure to "one embodiment,” “some embodiments,” “exemplary embodiments,” “one or more embodiments,” “an example,” “an example,” “some examples,” and the like are intended to indicate that a particular feature, structure, material, or characteristic associated with that embodiment or example is included in at least one embodiment or example of the disclosure. Schematic representations of the above terms do not necessarily refer to the same embodiment or example. Furthermore, the particular features, structures, materials, or characteristics described may be included in any one or more embodiments or examples in any suitable manner.
  • the expressions “coupled” and “connected” may be used.
  • the term “connected” may be used to indicate that two or more components are in direct physical or electrical contact with each other.
  • the term “coupled” may be used to indicate that two or more components are in direct physical or electrical contact.
  • the term “coupled” or “communicatively coupled” may also mean that two or more components are not in direct contact with each other, but still cooperate or interact with each other. The embodiments disclosed herein are not necessarily limited to the present disclosure.
  • At least one of A, B and C has the same meaning as “at least one of A, B or C” and both include the following combinations of A, B and C: A only, B only, C only, the combination of A and B, the combination of A and C, the combination of B and C, and the combination of A, B and C.
  • a and/or B includes the following three combinations: A only, B only, and a combination of A and B.
  • the term “if” is optionally interpreted to mean “when” or “upon” or “in response to determining” or “in response to detecting,” depending on the context.
  • the phrases “if it is determined that” or “if [stated condition or event] is detected” are optionally interpreted to mean “upon determining” or “in response to determining” or “upon detecting [stated condition or event]” or “in response to detecting [stated condition or event],” depending on the context.
  • parallel As used in this disclosure, “parallel”, “perpendicular”, “equal”, and “flush” include the situations described and situations similar to the situations described, and the range of the similar situations is within an acceptable deviation range, wherein the acceptable deviation range is as determined by a person of ordinary skill in the art taking into account the measurement in question and the errors associated with the measurement of the specific quantity (i.e., the limitations of the measurement system).
  • parallel includes absolute parallelism and approximate parallelism, wherein the acceptable deviation range of approximate parallelism can be, for example, a deviation within 5°;
  • perpendicular includes absolute perpendicularity and approximate perpendicularity, wherein the acceptable deviation range of approximate perpendicularity can also be, for example, a deviation within 5°.
  • Equal includes absolute equality and approximate equality, wherein the acceptable deviation range of approximate equality can be, for example, the difference between the two being equal is less than or equal to 5% of either one.
  • Flush includes absolute flushness and approximate flushness, wherein the acceptable deviation range of approximate flushness can be, for example, the distance between the two being flush is less than or equal to 5% of either one's size.
  • the present disclosure describes exemplary embodiments with reference to cross-sectional and/or plan views that are idealized exemplary drawings.
  • the thicknesses of layers and regions are exaggerated for clarity. Therefore, variations in shape relative to the drawings due to, for example, manufacturing techniques and/or tolerances are contemplated. Therefore, the exemplary embodiments should not be construed as limited to the shapes of the regions shown in this disclosure, but rather include deviations in shape due to, for example, manufacturing.
  • an etched region shown as a rectangle will typically have curved features. Therefore, the regions shown in the drawings are schematic in nature, and their shapes are not intended to illustrate the actual shape of regions of the device and are not intended to limit the scope of the exemplary embodiments.

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Abstract

The present application relates to the field of ultrasonic detection technology, and in particular, to an ultrasonic detection base plate and an ultrasonic imaging apparatus. The ultrasonic detection base plate comprises a substrate, and a detection region and a peripheral region arranged on one side of the substrate. The peripheral region is located on at least one side of the detection region. The detection region comprises: a plurality of array elements arranged in an array in a row direction and a column direction, and a plurality of signal lines arranged in the row direction and extending in the column direction. The signal lines are connected to the array elements. The plurality of signal lines comprise a plurality of partition signal lines divided into a plurality of signal line sets. Each signal line set comprises at least one partition signal line. The peripheral region comprises an adapter line extending in the row direction. The adapter line comprises a plurality of adapter line segments arranged in the row direction at intervals. The partition signal lines of a same signal line set are connected to a same adapter line segment, and the partition signal lines of different signal line sets are connected to different adapter line segments.

Description

超声检测基板以及超声成像装置Ultrasonic testing substrate and ultrasonic imaging device 技术领域Technical Field

本公开涉及超声检测技术领域,特别是涉及一种超声检测基板以及超声成像装置。The present disclosure relates to the field of ultrasonic detection technology, and in particular to an ultrasonic detection substrate and an ultrasonic imaging device.

背景技术Background Art

超声成像是医疗中一种重要的无损检测方式,随着技术的更新,超声成像向着更快速、更清晰以及三维的方向发展。高清晰和高分辨是人们一直探索和追求的目标,这有利于更早地发现疾病,以便及时治疗。Ultrasound imaging is an important non-destructive testing method in medicine. With technological advancements, ultrasound imaging is developing towards faster, clearer, and more three-dimensional imaging. High definition and high resolution are a constant pursuit, facilitating earlier disease detection and prompt treatment.

概述Overview

本公开提供了一种超声检测基板,包括衬底基板,以及设置在所述衬底基板一侧的检测区和周边区,所述周边区位于所述检测区的至少一侧;The present disclosure provides an ultrasonic detection substrate, comprising a base substrate, and a detection area and a peripheral area provided on one side of the base substrate, wherein the peripheral area is located on at least one side of the detection area;

所述检测区包括:沿行方向和列方向阵列排布的多个阵元,以及沿行方向排布且沿列方向延伸的多个信号线,所述信号线与所述阵元连接,所述多个信号线包括多个分区信号线,所述多个分区信号线划分为多个信号线组,所述信号线组包括至少一个所述分区信号线;The detection area includes: a plurality of array elements arranged in a row direction and a column direction, and a plurality of signal lines arranged in the row direction and extending in the column direction, the signal lines being connected to the array elements, the plurality of signal lines including a plurality of partition signal lines, the plurality of partition signal lines being divided into a plurality of signal line groups, the signal line groups including at least one of the partition signal lines;

所述周边区包括沿行方向延伸的转接线,所述转接线包括沿行方向排布且间隔设置的多个转接线段;The peripheral area includes a patch cord extending along a row direction, and the patch cord includes a plurality of patch cord segments arranged along the row direction and spaced apart;

其中,同属一个信号线组的分区信号线连接同一个转接线段,分属不同信号线组的分区信号线连接不同的转接线段。Partition signal lines belonging to the same signal line group are connected to the same patch cord segment, and partition signal lines belonging to different signal line groups are connected to different patch cord segments.

在一些实施方式中,所述周边区还包括:In some embodiments, the peripheral area further comprises:

扇出线以及绑定端子,所述扇出线连接在所述绑定端子与所述转接线段之间,不同的转接线段通过不同的扇出线连接至不同的绑定端子。A fan-out line and a binding terminal, wherein the fan-out line is connected between the binding terminal and the patch line segment, and different patch line segments are connected to different binding terminals through different fan-out lines.

在一些实施方式中,所述转接线段与所述扇出线的连接点在行方向上相对于所述转接线段居中设置。In some embodiments, a connection point between the patch line segment and the fan-out line is centered relative to the patch line segment in a row direction.

在一些实施方式中,所述扇出线与所述转接线同层设置;或者In some embodiments, the fan-out line and the patch line are provided on the same layer; or

所述扇出线分别与所述转接线以及所述分区信号线异层设置。 The fan-out lines are arranged in different layers from the transfer lines and the partition signal lines.

在一些实施方式中,同属一个转接线的不同转接线段连接相同数量的分区信号线;和/或In some embodiments, different patch cord segments belonging to the same patch cord are connected to the same number of partitioned signal lines; and/or

同属一个转接线的不同转接线段连接相同数量的阵元;和/或Different patch cord segments belonging to the same patch cord are connected to the same number of array elements; and/or

同属一个转接线的不同转接线段沿行方向上的宽度相同。Different patch cord segments belonging to the same patch cord have the same width along the row direction.

在一些实施方式中,所述多个信号线还包括跨接信号线,所述跨接信号线与所述转接线段异层设置且在所述衬底基板上的正投影有交叠,所述跨接信号线与所述转接线段之间无连接;In some embodiments, the plurality of signal lines further include a jumper signal line, the jumper signal line and the patch line segment are provided in different layers and their orthographic projections on the base substrate overlap, and there is no connection between the jumper signal line and the patch line segment;

在所述衬底基板上的正投影中,与同属一个转接线的两个转接线段分别有交叠的跨接信号线数量相同。In the orthographic projection on the base substrate, the number of the overlapping jumper signal lines is the same as that of the two patch cord segments belonging to the same patch cord.

在一些实施方式中,所述多个信号线还包括跨接信号线,所述跨接信号线与所述转接线段异层设置且相互无连接;In some embodiments, the plurality of signal lines further include a jumper signal line, wherein the jumper signal line and the adapter line segment are arranged in different layers and are not connected to each other;

所述转接线段上设置有第一镂空孔,所述第一镂空孔与所述跨接信号线在所述衬底基板上的正投影有交叠。A first hollow hole is provided on the adapter wire segment, and the first hollow hole overlaps with the orthographic projection of the jumper signal wire on the base substrate.

在一些实施方式中,多个所述第一镂空孔相互间隔设置且沿列方向排布,所述第一镂空孔在所述衬底基板上的正投影在行方向上覆盖所述跨接信号线在所述衬底基板上的正投影。In some embodiments, the plurality of first hollow holes are spaced apart from each other and arranged along the column direction, and the orthographic projections of the first hollow holes on the base substrate cover the orthographic projections of the jumper signal lines on the base substrate in the row direction.

在一些实施方式中,所述信号线与所述转接线异层设置;In some embodiments, the signal line and the adapter line are arranged in different layers;

所述检测区包括同层设置且相互分隔开的两种所述分区信号线,两种所述分区信号线为第一分区信号线和第二分区信号线,所述第一分区信号线和所述第二分区信号线用于向所述阵元提供不同的信号;The detection area includes two partition signal lines arranged in the same layer and separated from each other, the two partition signal lines are a first partition signal line and a second partition signal line, and the first partition signal line and the second partition signal line are used to provide different signals to the array element;

所述周边区包括同层设置且相互分隔开的两个所述转接线,两个所述转接线为第一转接线和第二转接线,所述第一转接线中的转接线段与所述第一分区信号线连接,所述第二转接线中的转接线段与所述第二分区信号线连接,所述第一转接线位于所述第二转接线靠近所述检测区的一侧。The peripheral area includes two adapter wires arranged in the same layer and separated from each other, the two adapter wires are a first adapter wire and a second adapter wire, the adapter wire segment in the first adapter wire is connected to the first partition signal line, and the adapter wire segment in the second adapter wire is connected to the second partition signal line, and the first adapter wire is located on the side of the second adapter wire close to the detection area.

在一些实施方式中,所述第一分区信号线的数量大于或等于所述第二分区信号线的数量。In some embodiments, the number of the first partition signal lines is greater than or equal to the number of the second partition signal lines.

在一些实施方式中,所述多个阵元划分为多个检测单元,所述检测单元包括沿行方向排布的多个阵元;In some embodiments, the plurality of array elements are divided into a plurality of detection units, and the detection unit includes a plurality of array elements arranged along a row direction;

同属一个检测单元的不同阵元连接不同的第一分区信号线,同属一个检测单元的不同阵元连接同一个第二分区信号线。 Different array elements belonging to the same detection unit are connected to different first partition signal lines, and different array elements belonging to the same detection unit are connected to the same second partition signal line.

在一些实施方式中,所述第一分区信号线为使能信号线,所述第二分区信号线为复位控制信号线;或者In some embodiments, the first partition signal line is an enable signal line, and the second partition signal line is a reset control signal line; or

所述第一分区信号线为复位控制信号线,所述第二分区信号线为使能信号线;The first partition signal line is a reset control signal line, and the second partition signal line is an enable signal line;

其中,所述阵元包括超声传感器,所述使能信号线用于向所述阵元提供使能信号,以使所述阵元响应于所述使能信号,采集所述超声传感器上的感应电压,所述复位控制信号线用于向所述阵元提供复位控制信号,以使所述阵元响应于所述复位控制信号,将复位信号写入所述阵元。The array element includes an ultrasonic sensor, the enable signal line is used to provide an enable signal to the array element, so that the array element responds to the enable signal and collects the induced voltage on the ultrasonic sensor, and the reset control signal line is used to provide a reset control signal to the array element, so that the array element responds to the reset control signal and writes a reset signal into the array element.

在一些实施方式中,所述多条信号线还包括电源信号线,所述电源信号线用于向所述阵元提供电源信号;In some embodiments, the plurality of signal lines further include a power signal line, and the power signal line is used to provide a power signal to the array element;

所述周边区还包括:第一传输线,沿行方向延伸,与多条所述电源信号线连接,位于所述检测区同一侧的第一传输线为相互连通的一体结构;并且The peripheral area further includes: a first transmission line extending in a row direction and connected to the plurality of power signal lines, wherein the first transmission lines located on the same side of the detection area are interconnected as an integrated structure; and

所述第一传输线位于所述第一转接线与所述第二转接线之间,或者所述第一传输线位于所述第二转接线远离所述第一转接线的一侧。The first transmission line is located between the first patch line and the second patch line, or the first transmission line is located on a side of the second patch line away from the first patch line.

在一些实施方式中,两个所述第一传输线沿列方向相对设置在所述检测区的两侧,所述周边区还包括:In some embodiments, two first transmission lines are arranged on opposite sides of the detection area along a column direction, and the peripheral area further includes:

第二传输线,沿列方向延伸,与所述第一传输线异层设置且在交叉位置处相互连接,两个所述第二传输线沿行方向相对设置在所述检测区的两侧。The second transmission line extends along the column direction, is arranged in a different layer from the first transmission line and is connected to each other at the intersection position. Two second transmission lines are arranged opposite to each other on both sides of the detection area along the row direction.

在一些实施方式中,所述周边区还包括:In some embodiments, the peripheral area further comprises:

第一转接图案,位于所述第一转接线靠近所述检测区的一侧,与所述第一转接线同层设置,分别与所述第一转接线以及所述第一分区信号线连接,所述第一分区信号线与所述第一转接线在所述衬底基板上的正投影无交叠。The first transfer pattern is located on a side of the first transfer line close to the detection area, is arranged on the same layer as the first transfer line, and is respectively connected to the first transfer line and the first partition signal line. The orthographic projections of the first partition signal line and the first transfer line on the base substrate do not overlap.

在一些实施方式中,所述周边区还包括:In some embodiments, the peripheral area further comprises:

第二转接图案,位于所述第一转接线靠近所述检测区的一侧,与所述第一转接线同层设置且相互间隔设置,相邻的两条第二分区信号线与同一个第二转接图案通过过孔连接;a second transfer pattern, located on a side of the first transfer line close to the detection area, arranged on the same layer as the first transfer line and spaced apart from each other, wherein two adjacent second partition signal lines are connected to the same second transfer pattern through a via;

在所述相邻的两条第二分区信号线中,一条跨过所述第一转接线并与所述第二转接线通过过孔连接,另一条与所述第一转接线以及所述第二转接线在所述衬底基板上的正投影均无交叠。 Of the two adjacent second partition signal lines, one crosses the first transfer line and is connected to the second transfer line through a via, and the other has no overlap with the orthographic projections of the first transfer line and the second transfer line on the base substrate.

在一些实施方式中,所述分区信号线与所述转接线在所述衬底基板上的正投影有交叠,且所述分区信号线与所述转接线通过过孔连接。In some embodiments, the partition signal line and the adapter line have overlapping orthographic projections on the base substrate, and the partition signal line and the adapter line are connected through a via.

在一些实施方式中,所述分区信号线沿列方向相对的两端均与所述转接线连接,所述转接线沿列方向相对设置在所述检测区的两侧。In some embodiments, both opposite ends of the partition signal line along the column direction are connected to the adapter line, and the adapter line is arranged on two opposite sides of the detection area along the column direction.

本公开提供了一种超声成像装置,包括:The present disclosure provides an ultrasonic imaging device, comprising:

如任一实施方式所述的超声检测基板;以及The ultrasonic detection substrate according to any one of the embodiments; and

驱动电路,与所述超声检测基板连接,用于向所述信号线提供驱动信号。A driving circuit is connected to the ultrasonic detection substrate and is used to provide a driving signal to the signal line.

上述说明仅是本公开技术方案的概述,为了能够更清楚了解本公开的技术手段,而可依照说明书的内容予以实施,并且为了让本公开的上述和其它目的、特征和优点能够更明显易懂,以下特举本公开的具体实施方式。The above description is only an overview of the technical solution of the present disclosure. In order to more clearly understand the technical means of the present disclosure, it can be implemented in accordance with the contents of the specification. In order to make the above and other purposes, features and advantages of the present disclosure more obvious and easy to understand, the specific implementation methods of the present disclosure are listed below.

附图简述BRIEF DESCRIPTION OF THE DRAWINGS

为了更清楚地说明本公开实施例或相关技术中的技术方案,下面将对实施例或相关技术描述中所需要使用的附图作一简单地介绍,显而易见地,下面描述中的附图是本公开的一些实施例,对于本领域普通技术人员来讲,在不付出创造性劳动的前提下,还可以根据这些附图获得其他的附图。需要说明的是,附图中的比例仅作为示意并不代表实际比例。In order to more clearly illustrate the technical solutions in the embodiments of the present disclosure or related technologies, the following is a brief introduction to the drawings required for the description of the embodiments or related technologies. Obviously, the drawings described below are some embodiments of the present disclosure. For those skilled in the art, other drawings can be obtained based on these drawings without inventive efforts. It should be noted that the scales in the drawings are for illustration only and do not represent the actual scale.

图1示例性地示出了一种超声检测基板的平面结构示意图;FIG1 exemplarily shows a schematic diagram of a planar structure of an ultrasonic detection substrate;

图2示例性地示出了本公开提供的一种超声检测基板的平面结构示意图;FIG2 exemplarily shows a schematic planar structural diagram of an ultrasonic detection substrate provided by the present disclosure;

图3示例性地示出了本公开提供的第一种周边区的线路布局图;FIG3 exemplarily shows a circuit layout diagram of a first peripheral area provided by the present disclosure;

图4示例性地示出了检测区与周边区交界处的线路布局图;FIG4 exemplarily shows a circuit layout diagram at the junction of the detection area and the peripheral area;

图5示例性地示出了第一转接线与第一扇出线的连接线路图;FIG5 exemplarily shows a connection diagram of a first patch line and a first fan-out line;

图6示例性地示出了第二转接线与第二扇出线的连接线路图;FIG6 exemplarily shows a connection diagram of a second patch line and a second fan-out line;

图7示例性地示出了本公开提供的第二种周边区的线路布局图;FIG7 exemplarily shows a circuit layout diagram of a second peripheral area provided by the present disclosure;

图8示例性地示出了本公开提供的第一种周边区对侧的线路布局图;FIG8 exemplarily shows a circuit layout diagram on the opposite side of the first peripheral area provided by the present disclosure;

图9示例性地示出了超声检测基板中四个角位置处的线路布局图;FIG9 exemplarily shows a circuit layout diagram at four corner positions in an ultrasonic detection substrate;

图10示例性地示出了本公开提供的第三种周边区的线路布局图;FIG10 exemplarily shows a circuit layout diagram of a third peripheral area provided by the present disclosure;

图11示例性地示出了本公开提供的第四种周边区的线路布局图; FIG11 exemplarily shows a circuit layout diagram of a fourth peripheral area provided by the present disclosure;

图12示例性地示出了本公开提供的第五种周边区的线路布局图;FIG12 exemplarily shows a circuit layout diagram of a fifth peripheral area provided by the present disclosure;

图13示例性地示出了一种阵元的等效电路示意图。FIG13 exemplarily shows a schematic diagram of an equivalent circuit of an array element.

详细描述Detailed description

为使本公开实施例的目的、技术方案和优点更加清楚,下面将结合本公开实施例中的附图,对本公开实施例中的技术方案进行清楚、完整地描述,显然,所描述的实施例是本公开一部分实施例,而不是全部的实施例。基于本公开中的实施例,本领域普通技术人员在没有作出创造性劳动前提下所获得的所有其他实施例,都属于本公开保护的范围。To make the objectives, technical solutions, and advantages of the embodiments of the present disclosure more clear, the technical solutions in the embodiments of the present disclosure will be clearly and completely described below in conjunction with the accompanying drawings. Obviously, the described embodiments are only part of the embodiments of the present disclosure, not all of the embodiments. All other embodiments obtained by ordinary technicians in this field based on the embodiments of the present disclosure without making any creative efforts shall fall within the scope of protection of the present disclosure.

本公开提供了一种超声检测基板,如图1所示,该超声检测基板包括衬底基板11,以及设置在衬底基板11一侧的检测区AA和周边区NA,周边区NA位于检测区AA的至少一侧。如图1所示,周边区NA位于检测区AA的四周。The present disclosure provides an ultrasonic testing substrate, as shown in FIG1 , comprising a base substrate 11, a detection area AA and a peripheral area NA disposed on one side of the base substrate 11, wherein the peripheral area NA is located on at least one side of the detection area AA. As shown in FIG1 , the peripheral area NA is located around the detection area AA.

如图1和图2所示,检测区AA包括:沿行方向f1和列方向f2阵列排布的多个阵元12,以及沿行方向f1排布且沿列方向f2延伸的多个信号线20,信号线20与阵元12连接,多个信号线20包括多个分区信号线21,多个分区信号线21划分为多个信号线组GP,信号线组GP包括至少一个分区信号线21。As shown in Figures 1 and 2, the detection area AA includes: a plurality of array elements 12 arranged in an array along the row direction f1 and the column direction f2, and a plurality of signal lines 20 arranged along the row direction f1 and extending along the column direction f2. The signal lines 20 are connected to the array elements 12. The plurality of signal lines 20 include a plurality of partition signal lines 21. The plurality of partition signal lines 21 are divided into a plurality of signal line groups GP. The signal line group GP includes at least one partition signal line 21.

其中,阵元12包括超声传感器SS,响应于信号线20提供的信号,阵元12能够根据超声传感器SS上的感应电压生成并输出检测信号。The array element 12 includes an ultrasonic sensor SS. In response to a signal provided by the signal line 20 , the array element 12 can generate and output a detection signal according to an induced voltage on the ultrasonic sensor SS.

如图2所示,周边区NA包括沿行方向f1延伸的转接线ZL,转接线ZL包括沿行方向f1排布且间隔设置的多个转接线段LS。As shown in FIG. 2 , the peripheral area NA includes a transfer line ZL extending along a row direction f1 . The transfer line ZL includes a plurality of transfer line segments LS arranged along the row direction f1 and spaced apart.

其中,同属一个信号线组GP的分区信号线21连接同一个转接线段LS,分属不同信号线组GP的分区信号线21连接不同的转接线段LS。The partitioned signal lines 21 belonging to the same signal line group GP are connected to the same patch line segment LS, and the partitioned signal lines 21 belonging to different signal line groups GP are connected to different patch line segments LS.

本公开提供的超声检测基板中,一个转接线段LS对应连接一个信号线组GP中的分区信号线21,不同信号线组GP中的分区信号线21由不同的转接线段LS提供信号,每个信号线组GP中的分区信号线21对应连接检测区AA中的一个子区B1,这种分区驱动方式可以减小分区信号线21中信号的负载C,由于延迟时间t=R*C,因此可以减小信号切换的延迟时间,有利于提升检测信号的准确性,提高超声成像的准确度。 In the ultrasonic detection substrate provided by the present invention, a patch cord segment LS corresponds to a partition signal line 21 in a signal line group GP, and the partition signal lines 21 in different signal line groups GP are provided with signals by different patch cord segments LS. The partition signal line 21 in each signal line group GP corresponds to a sub-area B1 in the detection area AA. This partition driving method can reduce the load C of the signal in the partition signal line 21. Since the delay time t=R*C, the delay time of the signal switching can be reduced, which is beneficial to improving the accuracy of the detection signal and improving the accuracy of ultrasonic imaging.

采用本公开提供的技术方案,有利于实现大面积的二维阵列超声检测基板。采用声像法,从波阵面的空间分布特征出发,大面积的二维阵元设计可以实现分辨率的提升,识别分辨率可达到0.5mm~1mm。The technical solution provided by this disclosure facilitates large-area two-dimensional array ultrasonic testing of substrates. Using the acoustic imaging method, based on the spatial distribution characteristics of the wavefront, the large-area two-dimensional array element design can achieve improved resolution, with recognition resolution reaching 0.5mm to 1mm.

示例性地,如图2所示,检测区AA中的一个子区B1可以包括一列或多列阵元12,与一个子区B1中的阵元12连接的分区信号线21构成一个信号线组GP。Exemplarily, as shown in FIG. 2 , a sub-area B1 in the detection area AA may include one or more columns of array elements 12 , and the partition signal lines 21 connected to the array elements 12 in one sub-area B1 constitute a signal line group GP.

示例性地,如图3所示,检测区AA可以包括至少一种分区信号线21(如图3所示的两种),至少一种分区信号线21包括第一分区信号线211。相应地,周边区NA可以包括至少一个转接线ZL(如图3所示的两个),至少一个转接线ZL包括第一转接线ZL1,第一转接线ZL1中的转接线段LS为第一转接线段LS1,第一转接线段LS1与第一分区信号线211连接,并且,同属一个信号线组GP的第一分区信号线211连接同一个第一转接线段LS1,分属不同信号线组GP的第一分区信号线211连接不同的第一转接线段LS1。Exemplarily, as shown in FIG3 , the detection area AA may include at least one partition signal line 21 (two types as shown in FIG3 ), and at least one partition signal line 21 includes a first partition signal line 211. Correspondingly, the peripheral area NA may include at least one adapter line ZL (two types as shown in FIG3 ), and at least one adapter line ZL includes a first adapter line ZL1. The adapter line segment LS in the first adapter line ZL1 is a first adapter line segment LS1. The first adapter line segment LS1 is connected to the first partition signal line 211, and the first partition signal lines 211 belonging to the same signal line group GP are connected to the same first adapter line segment LS1, and the first partition signal lines 211 belonging to different signal line groups GP are connected to different first adapter line segments LS1.

示例性地,如图3所示,至少一种分区信号线21还包括第二分区信号线212,至少一个转接线ZL还包括第二转接线ZL2,第二转接线ZL2中的转接线段LS为第二转接线段LS2,第二转接线段LS2与第二分区信号线212连接,并且,同属一个信号线组GP的第二分区信号线212连接同一个第二转接线段LS2,分属不同信号线组GP的第二分区信号线212连接不同的第二转接线段LS2。Exemplarily, as shown in Figure 3, at least one partition signal line 21 also includes a second partition signal line 212, at least one adapter line ZL also includes a second adapter line ZL2, the adapter line segment LS in the second adapter line ZL2 is the second adapter line segment LS2, the second adapter line segment LS2 is connected to the second partition signal line 212, and the second partition signal lines 212 belonging to the same signal line group GP are connected to the same second adapter line segment LS2, and the second partition signal lines 212 belonging to different signal line groups GP are connected to different second adapter line segments LS2.

其中,第一分区信号线211和第二分区信号线212用于向阵元12提供不同的信号,阵元12与第一分区信号线211以及第二分区信号线212均有连接。The first partition signal line 211 and the second partition signal line 212 are used to provide different signals to the array element 12 , and the array element 12 is connected to both the first partition signal line 211 and the second partition signal line 212 .

在一些实施方式中,如图4所示,转接线ZL与信号线20异层设置。In some embodiments, as shown in FIG. 4 , the adapter line ZL and the signal line 20 are disposed in different layers.

示例性地,如图3或图4所示,第一分区信号线211位于第三金属层M3,沿列方向f2从检测区AA延伸至周边区NA,与位于第二金属层M2的第一转接线ZL1通过过孔连接。3 or 4 , the first partition signal line 211 is located in the third metal layer M3 , extends from the detection area AA to the peripheral area NA along the column direction f2 , and is connected to the first transfer line ZL1 located in the second metal layer M2 through a via.

示例性地,如图3所示,第二分区信号线212位于第三金属层M3,沿列方向f2从检测区AA延伸至周边区NA,跨过第一转接线ZL1(如图7所 示)或者跨过第一转接线ZL1以及第一传输线31(如图3所示),与位于第二金属层M2的第二转接线ZL2通过过孔连接。For example, as shown in FIG3 , the second partition signal line 212 is located in the third metal layer M3 and extends from the detection area AA to the peripheral area NA along the column direction f2, crossing the first transfer line ZL1 (as shown in FIG7 ). The first transfer line ZL1 and the first transmission line 31 (as shown in FIG. 3 ) are connected to the second transfer line ZL2 located on the second metal layer M2 through a via.

示例性地,如图3或图7所示,多种分区信号线21可以同层设置(如均位于第三金属层M3)且相互分隔开设置,多个转接线ZL可以同层设置(如均位于第二金属层M2)且沿列方向f2间隔排布。3 or 7 , a plurality of partition signal lines 21 may be arranged on the same layer (e.g., all located on the third metal layer M3) and separated from each other, and a plurality of transfer lines ZL may be arranged on the same layer (e.g., all located on the second metal layer M2) and spaced apart along the column direction f2.

示例性地,第一转接线ZL1包括第一数量个转接线段LS,第二转接线ZL2包括第二数量个转接线段LS。为了简化设计,第一数量可以等于第二数量。当然,第一数量也可以大于或小于第二数量,本公开对此不作限定。其中,第一数量和第二数量均为大于1的正整数。For example, the first patch cable ZL1 includes a first number of patch cable segments LS, and the second patch cable ZL2 includes a second number of patch cable segments LS. To simplify the design, the first number can be equal to the second number. Of course, the first number can also be greater than or less than the second number, and this disclosure is not limited to this. Both the first number and the second number are positive integers greater than 1.

示例性地,如图3或图7所示,位于同一个转接线ZL内的多个转接线段LS在列方向f2上的位置和高度相同。Exemplarily, as shown in FIG. 3 or FIG. 7 , a plurality of switching line segments LS located in the same switching line ZL have the same position and height in the column direction f2 .

在一些实施方式中,如图2图所示,周边区NA还包括:扇出线51以及绑定端子PIN,扇出线51连接在绑定端子PIN与转接线段LS之间,不同的转接线段LS通过不同的扇出线51连接至不同的绑定端子PIN。其中,绑定端子PIN用于与超声检测基板的驱动电路绑定连接,驱动电路用于向信号线20提供驱动信号。In some embodiments, as shown in FIG2 , the peripheral area NA further includes: a fan-out line 51 and a binding terminal PIN. The fan-out line 51 is connected between the binding terminal PIN and the patch line segment LS. Different patch line segments LS are connected to different binding terminals PIN via different fan-out lines 51. The binding terminal PIN is used to bind and connect to the driving circuit of the ultrasonic detection substrate, and the driving circuit is used to provide a driving signal to the signal line 20.

在一些实施方式中,扇出线51与转接线ZL同层设置,或者扇出线51分别与转接线ZL以及分区信号线21异层设置。In some embodiments, the fan-out line 51 and the transfer line ZL are provided on the same layer, or the fan-out line 51 and the transfer line ZL and the partition signal line 21 are provided on different layers.

示例性地,如图5中的a图所示,与第一转接线ZL1连接的扇出线51为第一扇出线511,第一扇出线511分别与第一转接线ZL1以及第一分区信号线211异层设置,该第一扇出线511例如位于第一金属层M1,第一扇出线511与位于第二金属层M2的第一转接线段LS1之间通过过孔连接(如图5中的虚线框X1所示)。Exemplarily, as shown in Figure a in Figure 5, the fan-out line 51 connected to the first transfer line ZL1 is the first fan-out line 511. The first fan-out line 511 is arranged on different layers from the first transfer line ZL1 and the first partition signal line 211, respectively. The first fan-out line 511 is located, for example, in the first metal layer M1. The first fan-out line 511 is connected to the first transfer line segment LS1 located in the second metal layer M2 through a via (as shown in the dotted box X1 in Figure 5).

如图5中的a图所示,在第一转接线ZL1远离检测区AA的一侧还依次设置有第一传输线31、第二转接线ZL2以及接地线GND,其中,第一传输线31以及第二转接线ZL2与第一转接线ZL1同层设置且位于第二金属层M2,接地线GND与第一分区信号线211同层设置且位于第三金属层M3。第一扇出线511穿过第一传输线31、第二转接线ZL2以及接地线GND向下延伸,通过将第一扇出线511分别与第一转接线ZL1以及第一分区信号线211异层设置,使得第一扇出线511分别与第一传输线31、第二转接线ZL2 以及接地线GND异层设置,从而可以避免第一扇出线511与第一传输线31、第二转接线ZL2以及接地线GND发生短路,同时节省布线空间。As shown in Figure a of Figure 5, a first transmission line 31, a second transfer line ZL2, and a ground line GND are sequentially arranged on the side of the first transfer line ZL1 away from the detection area AA, wherein the first transmission line 31 and the second transfer line ZL2 are arranged on the same layer as the first transfer line ZL1 and are located on the second metal layer M2, and the ground line GND is arranged on the same layer as the first partition signal line 211 and is located on the third metal layer M3. The first fan-out line 511 extends downward through the first transmission line 31, the second transfer line ZL2, and the ground line GND. By arranging the first fan-out line 511 on different layers from the first transfer line ZL1 and the first partition signal line 211, the first fan-out line 511 is connected to the first transmission line 31, the second transfer line ZL2, and the ground line GND. The ground line GND is arranged in different layers, thereby avoiding a short circuit between the first fan-out line 511 and the first transmission line 31, the second transfer line ZL2 and the ground line GND, and saving wiring space.

如图5中的b图所示,不同的第一转接线段LS1连接不同的第一扇出线511,第一转接线段LS1与第一扇出线511例如为一一对应连接。As shown in FIG. 5 b , different first adapter line segments LS1 are connected to different first fan-out lines 511 . For example, the first adapter line segments LS1 and the first fan-out lines 511 are connected in a one-to-one correspondence.

示例性地,如图6中的a图所示,与第二转接线ZL2连接的扇出线51为第二扇出线512,该第二扇出线512例如位于第二金属层M2,即第二扇出线512与第二转接线ZL2同层设置,相互连接的第二扇出线512与第二转接线段LS2之间为一体结构。Exemplarily, as shown in Figure a in Figure 6, the fan-out line 51 connected to the second transfer line ZL2 is the second fan-out line 512, and the second fan-out line 512 is located, for example, in the second metal layer M2, that is, the second fan-out line 512 and the second transfer line ZL2 are arranged on the same layer, and the interconnected second fan-out line 512 and the second transfer line segment LS2 are an integrated structure.

如图6中的a图所示,在第二转接线ZL2远离检测区AA的一侧还设置有接地线GND,且接地线GND与第二分区信号线212同层设置且位于第三金属层M3。第二扇出线512穿过接地线GND,通过将第二扇出线512与第二转接线ZL2同层设置,使得接地线GND与第二扇出线512异层设置,从而可以避免第二扇出线512与接地线GND发生短路,同时节省布线空间。As shown in Figure 6(a), a ground line GND is also provided on the side of the second transfer line ZL2 away from the detection area AA. The ground line GND is provided on the same layer as the second partition signal line 212 and is located on the third metal layer M3. The second fan-out line 512 passes through the ground line GND. By providing the second fan-out line 512 and the second transfer line ZL2 on the same layer, the ground line GND and the second fan-out line 512 are provided on different layers. This prevents short circuits between the second fan-out line 512 and the ground line GND, while saving wiring space.

如图6中的b图所示,不同的第二转接线段LS2连接不同的第二扇出线512,第二转接线段LS2与第二扇出线512例如为一一对应连接。As shown in FIG. 6 b , different second adapter line segments LS2 are connected to different second fan-out lines 512 . For example, the second adapter line segments LS2 and the second fan-out lines 512 are connected in a one-to-one correspondence.

在一些实施方式中,如图2所示,转接线段LS与扇出线51的连接点在行方向f1上相对于转接线段LS居中设置。In some embodiments, as shown in FIG. 2 , the connection point between the switch line segment LS and the fan-out line 51 is centered relative to the switch line segment LS in the row direction f1 .

如图5中的b图所示,第一转接线段LS1与第一扇出线511的连接点O1在行方向f1上相对于第一转接线段LS1居中设置。如图6中的b图所示,第二转接线段LS2与第二扇出线512的连接点O2在行方向f1上相对于第二转接线段LS2居中设置。As shown in FIG5(b), the connection point O1 between the first patch line segment LS1 and the first fan-out line 511 is centered relative to the first patch line segment LS1 in the row direction f1. As shown in FIG6(b), the connection point O2 between the second patch line segment LS2 and the second fan-out line 512 is centered relative to the second patch line segment LS2 in the row direction f1.

本实施方式可以确保扇出线51的信号给入点位于转接线段LS沿行方向f1上的中间位置,从而可以减少转接线段LS的信号给入点远近端的延迟时间差异,进一步提高超声成像的准确度。This embodiment can ensure that the signal input point of the fan-out line 51 is located in the middle position of the patch line segment LS along the row direction f1, thereby reducing the delay time difference between the far and near ends of the signal input point of the patch line segment LS and further improving the accuracy of ultrasonic imaging.

示例性地,扇出线51(如图5所示的第一扇出线511以及如图6所示的第二扇出线512)至少部分沿列方向f2延伸。Exemplarily, the fan-out lines 51 (such as the first fan-out lines 511 shown in FIG. 5 and the second fan-out lines 512 shown in FIG. 6 ) at least partially extend along the column direction f2 .

在一些实施方式中,如图2所示,分区信号线21沿列方向f2相对的两端(如图2所示的上端和下端)均与转接线ZL连接,转接线ZL沿列方向f2相对设置在检测区AA的两侧。这样,可以对分区信号线21进行双边驱动, 进一步降低分区信号线21的信号给入点远近端的延迟时间差异,进一步提高超声成像的准确度。In some embodiments, as shown in FIG2 , the two opposite ends of the partition signal line 21 along the column direction f2 (the upper end and the lower end as shown in FIG2 ) are both connected to the adapter line ZL, and the adapter line ZL is arranged on both sides of the detection area AA along the column direction f2. In this way, the partition signal line 21 can be driven on both sides. The delay time difference between the far and near ends of the signal input point of the partition signal line 21 is further reduced, and the accuracy of ultrasonic imaging is further improved.

参照图3和图4示出了位于检测区AA下侧的周边区NA的线路布局图,图8示出了位于检测区AA上侧的周边区NA的线路布局图。3 and 4 show the circuit layout diagrams of the peripheral area NA located below the detection area AA, and FIG. 8 shows the circuit layout diagram of the peripheral area NA located above the detection area AA.

如图3、图4和图8所示,第一分区信号线211沿列方向f2分别向上和向下延伸,与位于检测区AA上侧和下侧的第一转接线ZL1连接。第二分区信号线212沿列方向f2分别向上和向下延伸,与位于检测区AA上侧和下侧的第二转接线ZL2连接。As shown in Figures 3, 4, and 8, the first partition signal line 211 extends upward and downward along the column direction f2, respectively, and connects to the first patch line ZL1 located above and below the detection area AA. The second partition signal line 212 extends upward and downward along the column direction f2, respectively, and connects to the second patch line ZL2 located above and below the detection area AA.

在一些实施方式中,同属一个转接线ZL的不同转接线段LS连接相同数量的分区信号线21。这样,可以降低不同转接线段LS之间的负载差异,进而减少不同转接线段LS之间的延迟时间差异,进一步提高超声成像的准确度。In some embodiments, different patch cord segments LS belonging to the same patch cord ZL are connected to the same number of partition signal lines 21. This can reduce the load differences between different patch cord segments LS, thereby reducing the delay time differences between different patch cord segments LS, and further improving the accuracy of ultrasonic imaging.

本公开中,同属一个转接线ZL的不同转接线段LS,例如可以为同属第一转接线ZL1的不同第一转接线段LS1,还可以为同属第二转接线ZL2的不同第二转接线段LS2。In the present disclosure, different adapter line segments LS belonging to the same adapter line ZL may be, for example, different first adapter line segments LS1 belonging to the same first adapter line ZL1 , or different second adapter line segments LS2 belonging to the same second adapter line ZL2 .

在一些实施方式中,同属一个转接线ZL的不同转接线段LS连接相同数量的阵元12。这样,可以降低不同转接线段LS之间的负载差异,进而减少不同转接线段LS之间的延迟时间差异,进一步提高超声成像的准确度。In some embodiments, different patch cord segments LS belonging to the same patch cord ZL connect to the same number of array elements 12. This can reduce the load differences between different patch cord segments LS, thereby reducing the delay time differences between different patch cord segments LS, and further improving the accuracy of ultrasonic imaging.

在一些实施方式中,同属一个转接线ZL的不同转接线段LS沿行方向f1上的宽度相同。这样,可以降低不同转接线段LS之间的负载差异,进而减少不同转接线段LS之间的延迟时间差异,进一步提高超声成像的准确度。In some embodiments, different patch line segments LS belonging to the same patch line ZL have the same width along the row direction f1. This can reduce the load difference between different patch line segments LS, thereby reducing the delay time difference between different patch line segments LS, and further improving the accuracy of ultrasonic imaging.

在一些实施方式中,如图4所示,多个信号线20还包括跨接信号线41,跨接信号线41与转接线段LS异层设置且在衬底基板11上的正投影有交叠,跨接信号线41与转接线段LS之间无连接。在衬底基板11上的正投影中,与同属一个转接线ZL的两个转接线段LS有交叠的跨接信号线41数量相同。In some embodiments, as shown in FIG4 , the plurality of signal lines 20 further include jumper signal lines 41. The jumper signal lines 41 are disposed on a different layer from the patch line segments LS and overlap in their orthographic projections on the base substrate 11. There is no connection between the jumper signal lines 41 and the patch line segments LS. In their orthographic projections on the base substrate 11, the number of jumper signal lines 41 that overlap with two patch line segments LS belonging to the same patch line ZL is the same.

由于跨接信号线41与转接线段LS异层设置且在衬底基板11上的正投影有交叠,因此跨接信号线41与转接线段LS之间可以形成耦合电容,通过设置与同属一个转接线ZL的两个转接线段LS有交叠的跨接信号线41数量 相同,可以降低不同转接线段LS之间的耦合电容差异,进而减少不同转接线段LS之间的延迟时间差异,进一步提高超声成像的准确度。Since the jumper signal line 41 and the transfer line segment LS are arranged in different layers and their orthographic projections on the base substrate 11 overlap, a coupling capacitor can be formed between the jumper signal line 41 and the transfer line segment LS. By setting the number of jumper signal lines 41 that overlap with the two transfer line segments LS belonging to the same transfer line ZL, The same can reduce the coupling capacitance difference between different adapter line segments LS, thereby reducing the delay time difference between different adapter line segments LS, and further improving the accuracy of ultrasonic imaging.

如图4所示,对于第一转接线ZL1,其跨接信号线41例如包括第二分区信号线212、电源信号线22以及数据信号线23。如图3所示,对于第二转接线ZL2,其跨接信号线41例如包括数据信号线23。如图7所示,对于第二转接线ZL2,其跨接信号线41例如包括电源信号线22以及数据信号线23。As shown in FIG4 , for the first patch cable ZL1, its jumper signal line 41 includes, for example, the second partition signal line 212, the power signal line 22, and the data signal line 23. As shown in FIG3 , for the second patch cable ZL2, its jumper signal line 41 includes, for example, the data signal line 23. As shown in FIG7 , for the second patch cable ZL2, its jumper signal line 41 includes, for example, the power signal line 22 and the data signal line 23.

为了降低耦合电容,在一些实施方式中,如图4所示,多个信号线20还包括跨接信号线41,跨接信号线41与转接线段LS异层设置且相互无连接。转接线段LS上设置有第一镂空孔H1,第一镂空孔H1与跨接信号线41在衬底基板11上的正投影有交叠。To reduce coupling capacitance, in some embodiments, as shown in FIG4 , the plurality of signal lines 20 further include a jumper signal line 41. The jumper signal line 41 is disposed on a different layer from the patch line segment LS and is not connected to each other. The patch line segment LS is provided with a first hollow hole H1, which overlaps with the orthographic projection of the jumper signal line 41 on the base substrate 11.

通过设置第一镂空孔H1,可以降低跨接信号线41与转接线段LS的交叠面积,从而降低耦合电容,进而可以减少信号延迟时间,提高超声成像的准确度。By providing the first hollow hole H1 , the overlapping area between the jumper signal line 41 and the adapter line segment LS can be reduced, thereby reducing the coupling capacitance, thereby reducing the signal delay time, and improving the accuracy of ultrasonic imaging.

在一些实施方式中,如图4所示,多个第一镂空孔H1相互间隔设置且沿列方向f2排布,第一镂空孔H1在衬底基板11上的正投影在行方向f1上覆盖跨接信号线41在衬底基板11上的正投影。In some embodiments, as shown in FIG4 , a plurality of first hollow holes H1 are spaced apart from each other and arranged along the column direction f2 , and the orthographic projections of the first hollow holes H1 on the base substrate 11 cover the orthographic projections of the jumper signal lines 41 on the base substrate 11 in the row direction f1 .

示例性地,如图4所示,第一镂空孔H1沿行方向f1的宽度大于跨接信号线41沿行方向f1的宽度。Exemplarily, as shown in FIG. 4 , the width of the first hollow hole H1 along the row direction f1 is greater than the width of the jumper signal line 41 along the row direction f1 .

在一些实施方式中,如图3或图7所示,第一转接线ZL1位于第二转接线ZL2靠近检测区AA的一侧。进一步地,多个转接线ZL在周边区NA内可以沿列方向f2依次间隔排布。In some embodiments, as shown in Figure 3 or Figure 7, the first adapter line ZL1 is located on a side of the second adapter line ZL2 close to the detection area AA. Furthermore, the plurality of adapter lines ZL can be sequentially arranged along the column direction f2 in the peripheral area NA.

在一些实施方式中,如图3或图7所示,第一分区信号线211的数量大于或等于第二分区信号线212的数量。In some embodiments, as shown in FIG. 3 or FIG. 7 , the number of the first partition signal lines 211 is greater than or equal to the number of the second partition signal lines 212 .

在第一分区信号线211的数量大于第二分区信号线212的数量的情况下,通过设置第一转接线ZL1位于第二转接线ZL2靠近检测区AA的一侧,可以减少第一分区信号线211与其它横向延伸线之间的交叉跨线,从而可以降低耦合电容,减小信号延迟,进一步提高超声成像的准确性。When the number of first partition signal lines 211 is greater than the number of second partition signal lines 212, by setting the first adapter line ZL1 to be located on the side of the second adapter line ZL2 close to the detection area AA, the cross-over between the first partition signal line 211 and other lateral extension lines can be reduced, thereby reducing the coupling capacitance, reducing signal delay, and further improving the accuracy of ultrasonic imaging.

在一些实施方式中,如图4所示,多个阵元12划分为多个检测单元U,检测单元U包括沿行方向f1排布的多个阵元12。同属一个检测单元U的不 同阵元12连接不同的第一分区信号线211,同属一个检测单元U的不同阵元12连接同一个第二分区信号线212。In some embodiments, as shown in FIG4 , a plurality of array elements 12 are divided into a plurality of detection units U. The detection unit U includes a plurality of array elements 12 arranged along the row direction f1. The same array element 12 is connected to different first partition signal lines 211 , and different array elements 12 belonging to the same detection unit U are connected to the same second partition signal line 212 .

示例性地,如图4所示,检测单元U包括沿行方向f1排布的两个阵元12,两个阵元12连接不同的第一分区信号线211,且连接同一个第二分区信号线212。Exemplarily, as shown in FIG. 4 , the detection unit U includes two array elements 12 arranged along the row direction f1 . The two array elements 12 are connected to different first partition signal lines 211 and to the same second partition signal line 212 .

示例性地,如图4所示,连接同一个检测单元U中不同阵元12的第一分区信号线211位于同一个信号线组GP中,连接同一个第一转接线段LS1。Exemplarily, as shown in FIG4 , the first partition signal lines 211 connecting different array elements 12 in the same detection unit U are located in the same signal line group GP and connected to the same first patch line segment LS1 .

示例性地,如图2所示,一个子区B1包括n列检测单元U,且检测单元U包括沿行方向f1排布的两个阵元12,连接该子区B1的第一分区信号线211数量为2n,且该2n个第一分区信号线211连接同一个第一转接线段LS1,连接该子区B1的第二分区信号线212数量为n,该n个第二分区信号线212连接同一个第二转接线段LS2。Exemplarily, as shown in Figure 2, a sub-area B1 includes n columns of detection units U, and the detection unit U includes two array elements 12 arranged along the row direction f1. The number of first partition signal lines 211 connecting the sub-area B1 is 2n, and the 2n first partition signal lines 211 are connected to the same first switching line segment LS1. The number of second partition signal lines 212 connecting the sub-area B1 is n, and the n second partition signal lines 212 are connected to the same second switching line segment LS2.

在一些实施方式中,第一分区信号线211为使能信号线ENL,第二分区信号线212为复位控制信号线RL;或者第一分区信号线211为复位控制信号线RL,第二分区信号线212为使能信号线ENL。In some embodiments, the first partition signal line 211 is the enable signal line ENL, and the second partition signal line 212 is the reset control signal line RL; or the first partition signal line 211 is the reset control signal line RL, and the second partition signal line 212 is the enable signal line ENL.

参照图13示例性地示出了一种阵元的等效电路图。如图13所示,阵元12包括超声传感器SS,使能信号线ENL用于向阵元12提供使能信号,以使阵元12响应于使能信号,采集超声传感器SS上的感应电压,复位控制信号线RL用于向阵元12提供复位控制信号,以使阵元12响应于复位控制信号,将复位信号写入阵元12。An equivalent circuit diagram of an array element is shown in Figure 13. As shown in Figure 13, array element 12 includes an ultrasonic sensor SS. An enable signal line ENL is used to provide an enable signal to array element 12, so that array element 12 responds to the enable signal and collects the induced voltage on ultrasonic sensor SS. A reset control signal line RL is used to provide a reset control signal to array element 12, so that array element 12 responds to the reset control signal and writes a reset signal into array element 12.

在一些实施方式中,如图3或图7所示,多个信号线20还包括电源信号线22,电源信号线22用于向阵元12提供电源信号。周边区NA还包括:第一传输线31,沿行方向f1延伸,与多个电源信号线22连接,位于检测区AA同一侧的第一传输线31为相互连通的一体结构。In some embodiments, as shown in FIG3 or FIG7 , the plurality of signal lines 20 further include a power signal line 22, which is used to provide a power signal to the array element 12. The peripheral area NA further includes a first transmission line 31 extending along the row direction f1 and connected to the plurality of power signal lines 22. The first transmission lines 31 located on the same side of the detection area AA are interconnected and form an integrated structure.

如图3和图7所示,位于检测区AA下侧的第一传输线31为相互连通的一体结构,如图8所示,位于检测区AA上侧的第一传输线31为相互连通的一体结构。 As shown in FIG3 and FIG7 , the first transmission lines 31 located below the detection area AA are interconnected integral structures. As shown in FIG8 , the first transmission lines 31 located above the detection area AA are interconnected integral structures.

在一些实施方式中,第一传输线31位于第一转接线ZL1与第二转接线ZL2之间(如图3所示出的),或者第一传输线31位于第二转接线ZL2远离第一转接线ZL1的一侧(如图7所示出的)。In some embodiments, the first transmission line 31 is located between the first patch line ZL1 and the second patch line ZL2 (as shown in FIG3 ), or the first transmission line 31 is located on a side of the second patch line ZL2 away from the first patch line ZL1 (as shown in FIG7 ).

在一些实施方式中,如图9所示,两个第一传输线31沿列方向f2相对设置在检测区AA的两侧(如上侧和下侧),周边区NA还包括:第二传输线91,沿列方向f2延伸,与第一传输线31异层设置且在交叉位置处相互连接,两个第二传输线91沿行方向f1相对设置在检测区AA的两侧(如左侧和右侧)。In some embodiments, as shown in FIG9 , the two first transmission lines 31 are relatively arranged on both sides (e.g., the upper side and the lower side) of the detection area AA along the column direction f2, and the peripheral area NA further includes: a second transmission line 91, which extends along the column direction f2, is arranged in a different layer from the first transmission line 31 and is connected to each other at the intersection position, and the two second transmission lines 91 are relatively arranged on both sides (e.g., the left side and the right side) of the detection area AA along the row direction f1.

示例性地,第一传输线31与转接线ZL同层设置,第二传输线91与电源信号线22同层设置。Exemplarily, the first transmission line 31 and the adapter line ZL are provided on the same layer, and the second transmission line 91 and the power signal line 22 are provided on the same layer.

本公开中,电源信号为直流信号。In the present disclosure, the power signal is a DC signal.

示例性地,如图9所示,电源信号线22位于第三金属层M3,沿列方向f2从检测区AA向上和向下延伸至周边区NA,与位于第二金属层M2的第一传输线31通过过孔连接,第一传输线31与位于第三金属层M3的第二传输线91通过过孔连接。Exemplarily, as shown in FIG9 , the power signal line 22 is located in the third metal layer M3, extends upward and downward from the detection area AA to the peripheral area NA along the column direction f2, and is connected to the first transmission line 31 located in the second metal layer M2 through a via, and the first transmission line 31 is connected to the second transmission line 91 located in the third metal layer M3 through a via.

如图9所示,位于检测区AA上侧和下侧的第一传输线31,与位于检测区AA左侧和右侧的第二传输线91在交叉位置处通过过孔连接,形成环绕检测区AA的闭合走线。As shown in FIG9 , the first transmission line 31 located on the upper and lower sides of the detection area AA is connected to the second transmission line 91 located on the left and right sides of the detection area AA through vias at the intersection, forming a closed route surrounding the detection area AA.

为了进一步降低的耦合电容,示例性地,如图3或图7所示,第一传输线31上设置有第二镂空孔H2,第二镂空孔H2与耦合信号线24在衬底基板11上的正投影交叠,其中,耦合信号线24是指与第一传输线31异层设置且在衬底基板11上的正投影有交叠的信号线20,耦合信号线24与第一传输线31相互无连接。In order to further reduce the coupling capacitance, illustratively, as shown in Figure 3 or Figure 7, a second hollow hole H2 is provided on the first transmission line 31, and the second hollow hole H2 overlaps with the orthographic projection of the coupling signal line 24 on the base substrate 11, wherein the coupling signal line 24 refers to a signal line 20 that is arranged in a different layer from the first transmission line 31 and has an overlapping orthographic projection on the base substrate 11, and the coupling signal line 24 and the first transmission line 31 are not connected to each other.

如图3所示,第一传输线31的耦合信号线24包括第二分区信号线212以及数据信号线23。如图7所示,第一传输线31的耦合信号线24为数据信号线23。As shown in FIG3 , the coupled signal line 24 of the first transmission line 31 includes the second partition signal line 212 and the data signal line 23. As shown in FIG7 , the coupled signal line 24 of the first transmission line 31 is the data signal line 23.

如图3或图7所示,多个第二镂空孔H2相互间隔设置且沿列方向f2排布,第二镂空孔H2在衬底基板11上的正投影在行方向f1上覆盖耦合信号线24在衬底基板11上的正投影。 As shown in FIG3 or FIG7 , a plurality of second hollow holes H2 are spaced apart from each other and arranged along the column direction f2 , and the orthographic projections of the second hollow holes H2 on the base substrate 11 cover the orthographic projections of the coupling signal lines 24 on the base substrate 11 in the row direction f1 .

示例性地,如图3或图7所示,第二镂空孔H2沿行方向f1的宽度大于耦合信号线24沿行方向f1的宽度。Exemplarily, as shown in FIG. 3 or FIG. 7 , the width of the second hollow hole H2 along the row direction f1 is greater than the width of the coupling signal line 24 along the row direction f1 .

在一些实施方式中,如图10或图11所示,周边区NA还包括:第一转接图案101,位于第一转接线ZL1靠近检测区AA的一侧,分别与第一转接线ZL1以及第一分区信号线211连接,第一分区信号线211与第一转接线ZL1在衬底基板11上的正投影无交叠。In some embodiments, as shown in Figure 10 or Figure 11, the peripheral area NA also includes: a first transfer pattern 101, located on the side of the first transfer line ZL1 close to the detection area AA, and connected to the first transfer line ZL1 and the first partition signal line 211 respectively, and the first partition signal line 211 and the first transfer line ZL1 have no overlapping orthographic projections on the base substrate 11.

示例性地,第一转接图案101与第一转接线ZL1同层设置。Exemplarily, the first switching pattern 101 and the first switching line ZL1 are provided on the same layer.

在一些实施方式中,如图12所示,周边区NA还包括:第二转接图案121,位于第一转接线ZL1靠近检测区AA的一侧,与第一转接线ZL1同层设置且相互间隔设置,相邻的两个第二分区信号线212与同一个第二转接图案121通过过孔连接。在相邻的两条第二分区信号线212中,一条跨过第一转接线ZL1并与第二转接线ZL2通过过孔连接,另一条与第一转接线ZL1以及第二转接线ZL2在衬底基板11上的正投影均无交叠。In some embodiments, as shown in FIG12 , the peripheral area NA further includes a second transfer pattern 121 located on a side of the first transfer line ZL1 near the detection area AA, arranged on the same layer as the first transfer line ZL1 and spaced apart from each other. Two adjacent second partitioned signal lines 212 are connected to the same second transfer pattern 121 via a via. Of the two adjacent second partitioned signal lines 212, one crosses the first transfer line ZL1 and is connected to the second transfer line ZL2 via a via, while the other does not overlap with either the first transfer line ZL1 or the second transfer line ZL2 in their orthographic projections on the base substrate 11.

本实施方式,可以减少第二分区信号线212与第一转接线ZL1的交叠面积,从而降低耦合电容,减小信号延迟时间。In this embodiment, the overlapping area between the second partition signal line 212 and the first transfer line ZL1 can be reduced, thereby reducing the coupling capacitance and shortening the signal delay time.

在一些实施方式中,如图3或图7所示,分区信号线21与转接线ZL在衬底基板11上的正投影有交叠,且分区信号线21与转接线ZL通过过孔连接。In some embodiments, as shown in FIG. 3 or FIG. 7 , the orthographic projections of the partition signal line 21 and the adapter line ZL on the base substrate 11 overlap, and the partition signal line 21 and the adapter line ZL are connected through a via.

如图3或图7所示,第一分区信号线211与第一转接线ZL1通过过孔连接,第二分区信号线212与第二转接线ZL2通过过孔连接。As shown in FIG. 3 or FIG. 7 , the first partition signal line 211 is connected to the first transfer line ZL1 through a via hole, and the second partition signal line 212 is connected to the second transfer line ZL2 through a via hole.

示例性地,如图3或图7所示,分区信号线21中与转接线ZL连接的部分宽度加大,这样可以增大分区信号线21与转接线ZL的接触面积,降低接触电阻。Exemplarily, as shown in FIG3 or FIG7 , the width of the portion of the partition signal line 21 connected to the adapter line ZL is increased, which can increase the contact area between the partition signal line 21 and the adapter line ZL and reduce the contact resistance.

如图3或图7所示,第一分区信号线211中与第一转接线ZL1连接的部分宽度加大,第二分区信号线212中与第二转接线ZL2连接的部分宽度加大。As shown in FIG3 or FIG7 , the width of the portion of the first partition signal line 211 connected to the first transition line ZL1 is increased, and the width of the portion of the second partition signal line 212 connected to the second transition line ZL2 is increased.

示例性地,如图3或图7所示,连接分区信号线21与转接线ZL的过孔沿行方向f1与列方向f2阵列排布。Exemplarily, as shown in FIG. 3 or FIG. 7 , the vias connecting the partition signal lines 21 and the adapter lines ZL are arranged in an array along the row direction f1 and the column direction f2 .

在一些实施方式中,超声传感器SS可以为偏二氟乙烯压电薄膜传感器(即PVDF传感器)、电容式微加工超声传感器SS(即CMUT传感器)、 压电微机械超声换能器(即PMUT传感器),还可以为其他能够实现超声波-电压转换的换能传感器。In some embodiments, the ultrasonic sensor SS may be a vinylidene fluoride piezoelectric film sensor (ie, a PVDF sensor), a capacitive micromachined ultrasonic sensor SS (ie, a CMUT sensor), The piezoelectric micromachined ultrasonic transducer (ie, PMUT sensor) may also be other transducer sensors capable of realizing ultrasonic-voltage conversion.

如图13所示,阵元12包括超声传感器SS以及阵元电路,阵元电路采用4T1C设计,即包括四个晶体管和一个电容。其中,四个晶体管分别为第一晶体管T1、第二晶体管T2、第三晶体管T3和第四晶体管T4,一个电容分别为第一电容C1。As shown in FIG13 , the array element 12 includes an ultrasonic sensor SS and an array element circuit. The array element circuit adopts a 4T1C design, that is, it includes four transistors and one capacitor. The four transistors are a first transistor T1, a second transistor T2, a third transistor T3, and a fourth transistor T4, and the one capacitor is a first capacitor C1.

如图13所示,第一晶体管T1的栅极连接复位控制信号线RL,第一极连接复位信号线BL,第二极连接第一节点N1,第一节点N1与超声传感器SS连接。第二晶体管T2的栅极连接使能信号线ENL,第一极连接第一节点N1,第二极连接第二节点N2。第三晶体管T3的栅极连接第二节点N2,第一极连接电源信号线22,第二极连接第四晶体管T4的第一极。第四晶体管T4的栅极连接扫描信号线SCL,第二极连接数据信号线23。第一电容C1连接在第一晶体管T1的第一极以及第二节点N2之间。As shown in Figure 13, the gate of the first transistor T1 is connected to the reset control signal line RL, the first electrode is connected to the reset signal line BL, and the second electrode is connected to the first node N1, which is connected to the ultrasonic sensor SS. The gate of the second transistor T2 is connected to the enable signal line ENL, the first electrode is connected to the first node N1, and the second electrode is connected to the second node N2. The gate of the third transistor T3 is connected to the second node N2, the first electrode is connected to the power signal line 22, and the second electrode is connected to the first electrode of the fourth transistor T4. The gate of the fourth transistor T4 is connected to the scan signal line SCL, and the second electrode is connected to the data signal line 23. The first capacitor C1 is connected between the first electrode of the first transistor T1 and the second node N2.

示例性地,扫描信号线SCL与复位信号线BL沿行方向f1延伸。复位控制信号线RL、使能信号线ENL、电源信号线22以及数据信号线23沿列方向f2延伸。位于同一行的阵元12连接同一条扫描信号线SCL以及复位信号线BL,位于同一列的阵元12连接同一条复位控制信号线RL、使能信号线ENL、电源信号线22以及数据信号线23。Exemplarily, the scan signal line SCL and the reset signal line BL extend along the row direction f1. The reset control signal line RL, the enable signal line ENL, the power signal line 22, and the data signal line 23 extend along the column direction f2. Array elements 12 in the same row are connected to the same scan signal line SCL and reset signal line BL, while array elements 12 in the same column are connected to the same reset control signal line RL, the enable signal line ENL, the power signal line 22, and the data signal line 23.

其中,扫描信号线SCL用于提供扫描信号GT,阵元12能够响应于扫描信号GT,根据超声传感器SS上的感应电压,生成检测信号并加载至数据信号线23。数据信号线23用于输出检测信号,电源信号线22用于向阵元12提供电源信号,使能信号线ENL用于向阵元12提供使能信号,以使阵元12响应于使能信号,采集超声传感器SS上的感应电压,复位控制信号线RL用于向阵元12提供复位控制信号,以使阵元12响应于复位控制信号,将复位信号线BL输入的复位信号写入第一节点N1。The scan signal line SCL is used to provide a scan signal GT. The array element 12 can respond to the scan signal GT and generate a detection signal based on the induced voltage on the ultrasonic sensor SS. The detection signal is then loaded onto the data signal line 23. The data signal line 23 is used to output the detection signal. The power signal line 22 is used to provide a power signal to the array element 12. The enable signal line ENL is used to provide an enable signal to the array element 12, so that the array element 12 responds to the enable signal and collects the induced voltage on the ultrasonic sensor SS. The reset control signal line RL is used to provide a reset control signal to the array element 12, so that the array element 12 responds to the reset control signal and writes the reset signal input from the reset signal line BL to the first node N1.

示例性地,可以在采集超声传感器SS上的感应电压之前,对第一节点N1进行复位,例如可以先向复位控制信号线RL提供复位控制信号,之后再向使能信号线ENL提供使能信号,这样可以提高采集的准确性。For example, before collecting the induced voltage on the ultrasonic sensor SS, the first node N1 may be reset. For example, a reset control signal may be provided to the reset control signal line RL first, and then an enable signal may be provided to the enable signal line ENL. This may improve the accuracy of collection.

示例性地,由于每个阵元12生成的检测信号是独立的,因此数据信号线23与绑定端子一一对应连接。 Exemplarily, since the detection signal generated by each array element 12 is independent, the data signal lines 23 are connected to the binding terminals in a one-to-one correspondence.

示例性地,同属一个检测单元U的不同阵元12连接不同的数据信号线23,同属一个检测单元U的不同阵元12连接同一个电源信号线22。在一个子区B1包括n列检测单元U的情况中,连接该子区B1的数据信号线23数量为2n,连接该子区B1的电源信号线22数量为n。Exemplarily, different array elements 12 belonging to the same detection unit U are connected to different data signal lines 23, and different array elements 12 belonging to the same detection unit U are connected to the same power signal line 22. In the case where a sub-area B1 includes n columns of detection units U, the number of data signal lines 23 connected to the sub-area B1 is 2n, and the number of power signal lines 22 connected to the sub-area B1 is n.

本公开提供了一种超声成像装置,包括如任一实施方式提供的超声检测基板,以及驱动电路,与所述超声检测基板连接,用于向所述信号线提供驱动信号。The present disclosure provides an ultrasonic imaging device, comprising an ultrasonic detection substrate as provided in any embodiment, and a driving circuit connected to the ultrasonic detection substrate and configured to provide a driving signal to the signal line.

本领域技术人员可以理解,本公开提供的超声成像装置具有上述超声检测基板的优点。Those skilled in the art will appreciate that the ultrasonic imaging device provided by the present disclosure has the advantages of the above-mentioned ultrasonic detection substrate.

示例性地,超声检测基板的周边区包括绑定端子,绑定端子与信号线连接,绑定端子例如与柔性电路板的一端绑定连接,柔性电路板的另一端可以连接驱动电路(如印刷电路板)。Exemplarily, the peripheral area of the ultrasonic detection substrate includes binding terminals, which are connected to signal lines. The binding terminals are, for example, bound and connected to one end of a flexible circuit board, and the other end of the flexible circuit board can be connected to a driving circuit (such as a printed circuit board).

示例性地,本公开提供的超声成像装置还可以包括超声发生器,用于发出超声信号,超声检测基板中的超声传感器接收被检测物体反射回来的超声信号,并生成感应电压,阵元能够根据所述超声传感器上的感应电压生成检测信号。Exemplarily, the ultrasonic imaging device provided by the present disclosure may also include an ultrasonic generator for emitting an ultrasonic signal. The ultrasonic sensor in the ultrasonic detection substrate receives the ultrasonic signal reflected back by the object to be detected and generates an induced voltage. The array element can generate a detection signal based on the induced voltage on the ultrasonic sensor.

本公开提供的超声成像装置或超声检测基板可以用于医疗超声成像检测,还可以应用于其它利用超声成像的领域,例如超声探伤等。The ultrasonic imaging device or ultrasonic detection substrate provided by the present disclosure can be used for medical ultrasonic imaging detection, and can also be applied to other fields that utilize ultrasonic imaging, such as ultrasonic flaw detection.

本公开中,“多个”的含义是两个或两个以上,“至少一个”的含义是一个或一个以上,除非另有明确具体的限定。In the present disclosure, “a plurality of” means two or more, and “at least one” means one or more, unless otherwise clearly defined.

本公开中,术语“上”、“下”等指示的方位或位置关系为基于附图所示的方位或位置关系,仅是为了便于描述本公开和简化描述,而不是指示或暗示所指的装置或元件必须具有特定的方位、以特定的方位构造和操作,因此不能理解为对本公开的限制。In the present disclosure, the orientation or positional relationship indicated by the terms "upper" and "lower" is based on the orientation or positional relationship shown in the accompanying drawings, and is only for the convenience of describing the present disclosure and simplifying the description, and does not indicate or imply that the device or element referred to must have a specific orientation, be constructed and operate in a specific orientation. Therefore, it should not be understood as a limitation on the present disclosure.

本公开中,术语“包括”、“包含”或者其任何其他变体意在涵盖非排他性的包含,从而使得包括一系列要素的过程、方法、商品或者设备不仅包括那些要素,而且还包括没有明确列出的其他要素,或者是还包括为这种过程、方法、产品或者设备所固有的要素。在没有更多限制的情况下,由语句“包 括一个……”限定的要素,并不排除在包括所述要素的过程、方法、商品或者设备中还存在另外的相同要素。In this disclosure, the terms "comprises,""includes," or any other variations thereof are intended to cover non-exclusive inclusion, such that a process, method, article, or apparatus that includes a list of elements includes not only those elements but also other elements not expressly listed or inherent to such process, method, article, or apparatus. "…" does not exclude the existence of other identical elements in the process, method, product or equipment that includes the elements.

本公开中所称的“一个实施例”、“一些实施例”、“示例性实施例”、“一个或者多个实施例”、“示例”、“一个示例”、“一些示例”等旨在表明与该实施例或示例相关的特定特征、结构、材料或特性包括在本公开的至少一个实施例或示例中。上述术语的示意性表示不一定是指同一实施例或示例。此外,所述的特定特征、结构、材料或特点可以以任何适当方式包括在任何一个或多个实施例或示例中。References in this disclosure to "one embodiment," "some embodiments," "exemplary embodiments," "one or more embodiments," "an example," "an example," "some examples," and the like are intended to indicate that a particular feature, structure, material, or characteristic associated with that embodiment or example is included in at least one embodiment or example of the disclosure. Schematic representations of the above terms do not necessarily refer to the same embodiment or example. Furthermore, the particular features, structures, materials, or characteristics described may be included in any one or more embodiments or examples in any suitable manner.

在本公开中,诸如第一和第二等之类的关系术语仅仅用来将一个实体或者操作与另一个实体或操作区分开来,而不一定要求或者暗示这些实体或操作之间存在任何这种实际的关系或者顺序。In this disclosure, relational terms such as first and second, etc. are used merely to distinguish one entity or operation from another entity or operation, but do not necessarily require or imply any actual relationship or order between these entities or operations.

在描述一些实施例时,可能使用了“耦接”和“连接”的表达。例如,描述一些实施例时可能使用了术语“连接”以表明两个或两个以上部件彼此间有直接物理接触或电接触。又如,描述一些实施例时可能使用了术语“耦接”以表明两个或两个以上部件有直接物理接触或电接触。然而,术语“耦接”或“通信耦合(communicatively coupled)”也可能指两个或两个以上部件彼此间并无直接接触,但仍彼此协作或相互作用。这里所公开的实施例并不必然限制于本公开内容。When describing some embodiments, the expressions "coupled" and "connected" may be used. For example, when describing some embodiments, the term "connected" may be used to indicate that two or more components are in direct physical or electrical contact with each other. For another example, when describing some embodiments, the term "coupled" may be used to indicate that two or more components are in direct physical or electrical contact. However, the term "coupled" or "communicatively coupled" may also mean that two or more components are not in direct contact with each other, but still cooperate or interact with each other. The embodiments disclosed herein are not necessarily limited to the present disclosure.

“A、B和C中的至少一个”与“A、B或C中的至少一个”具有相同含义,均包括以下A、B和C的组合:仅A,仅B,仅C,A和B的组合,A和C的组合,B和C的组合,及A、B和C的组合。“At least one of A, B and C” has the same meaning as “at least one of A, B or C” and both include the following combinations of A, B and C: A only, B only, C only, the combination of A and B, the combination of A and C, the combination of B and C, and the combination of A, B and C.

“A和/或B”,包括以下三种组合:仅A,仅B,及A和B的组合。“A and/or B” includes the following three combinations: A only, B only, and a combination of A and B.

如本公开中所使用,根据上下文,术语“如果”任选地被解释为意思是“当……时”或“在……时”或“响应于确定”或“响应于检测到”。类似地,根据上下文,短语“如果确定……”或“如果检测到[所陈述的条件或事件]”任选地被解释为是指“在确定……时”或“响应于确定……”或“在检测到[所陈述的条件或事件]时”或“响应于检测到[所陈述的条件或事件]”。As used in this disclosure, the term "if" is optionally interpreted to mean "when" or "upon" or "in response to determining" or "in response to detecting," depending on the context. Similarly, the phrases "if it is determined that" or "if [stated condition or event] is detected" are optionally interpreted to mean "upon determining" or "in response to determining" or "upon detecting [stated condition or event]" or "in response to detecting [stated condition or event]," depending on the context.

本公开中“用于”或“被配置为”的使用意味着开放和包容性的语言,其不排除适用于或被配置为执行额外任务或步骤的设备。 The use of "for" or "configured to" in this disclosure is intended to be open and inclusive language that does not exclude devices adapted or configured to perform additional tasks or steps.

本公开中“基于”或“根据”的使用意味着开放和包容性。基于一个或多个所述条件或值的过程、步骤、计算或其他动作,在实践中可以基于其它条件或超出所述的值。根据一个或多个所述条件或值的过程、步骤、计算或其他动作,在实践中可以根据其它条件或超出所述的值。The use of "based on" or "according to" in this disclosure is intended to be open and inclusive. A process, step, calculation, or other action based on one or more stated conditions or values may, in practice, be based on other conditions or values beyond the stated values. A process, step, calculation, or other action based on one or more stated conditions or values may, in practice, be based on other conditions or values beyond the stated values.

如本公开所使用的那样,“约”、“大致”或“近似”包括所阐述的值以及处于特定值的可接受偏差范围内的平均值,其中所述可接受偏差范围如由本领域普通技术人员考虑到正在讨论的测量以及与特定量的测量相关的误差(即,测量系统的局限性)所确定。As used in this disclosure, "about," "substantially," or "approximately" includes the stated value and an average value that is within an acceptable range of deviation from the particular value as determined by one of ordinary skill in the art taking into account the measurements in question and the errors associated with the measurement of the particular quantity (i.e., the limitations of the measurement system).

如本公开所使用的那样,“平行”、“垂直”、“相等”、“齐平”包括所阐述的情况以及与所阐述的情况相近似的情况,该相近似的情况的范围处于可接受偏差范围内,其中所述可接受偏差范围如由本领域普通技术人员考虑到正在讨论的测量以及与特定量的测量相关的误差(即,测量系统的局限性)所确定。例如,“平行”包括绝对平行和近似平行,其中近似平行的可接受偏差范围例如可以是5°以内偏差;“垂直”包括绝对垂直和近似垂直,其中近似垂直的可接受偏差范围例如也可以是5°以内偏差。“相等”包括绝对相等和近似相等,其中近似相等的可接受偏差范围内例如可以是相等的两者之间的差值小于或等于其中任一者的5%。“齐平”包括绝对齐平和近似齐平,其中近似齐平的可接受偏差范围内例如可以是齐平的两者之间的距离小于或等于其中任一者尺寸的5%。As used in this disclosure, "parallel", "perpendicular", "equal", and "flush" include the situations described and situations similar to the situations described, and the range of the similar situations is within an acceptable deviation range, wherein the acceptable deviation range is as determined by a person of ordinary skill in the art taking into account the measurement in question and the errors associated with the measurement of the specific quantity (i.e., the limitations of the measurement system). For example, "parallel" includes absolute parallelism and approximate parallelism, wherein the acceptable deviation range of approximate parallelism can be, for example, a deviation within 5°; "perpendicular" includes absolute perpendicularity and approximate perpendicularity, wherein the acceptable deviation range of approximate perpendicularity can also be, for example, a deviation within 5°. "Equal" includes absolute equality and approximate equality, wherein the acceptable deviation range of approximate equality can be, for example, the difference between the two being equal is less than or equal to 5% of either one. "Flush" includes absolute flushness and approximate flushness, wherein the acceptable deviation range of approximate flushness can be, for example, the distance between the two being flush is less than or equal to 5% of either one's size.

应当理解的是,当层或元件被称为在另一层或基板上时,可以是该层或元件直接在另一层或基板上,或者也可以是该层或元件与另一层或基板之间存在中间层。It will be understood that when a layer or element is referred to as being on another layer or substrate, it can be directly on the other layer or substrate, or intervening layers may be present therebetween.

本公开参照作为理想化示例性附图的剖视图和/或平面图描述了示例性实施方式。在附图中,为了清楚,放大了层和区域的厚度。因此,可设想到由于例如制造技术和/或公差引起的相对于附图的形状的变动。因此,示例性实施方式不应解释为局限于本公开示出的区域的形状,而是包括因例如制造而引起的形状偏差。例如,示为矩形的蚀刻区域通常将具有弯曲的特征。因此,附图中所示的区域本质上是示意性的,且它们的形状并非旨在示出设备的区域的实际形状,并且并非旨在限制示例性实施方式的范围。 The present disclosure describes exemplary embodiments with reference to cross-sectional and/or plan views that are idealized exemplary drawings. In the drawings, the thicknesses of layers and regions are exaggerated for clarity. Therefore, variations in shape relative to the drawings due to, for example, manufacturing techniques and/or tolerances are contemplated. Therefore, the exemplary embodiments should not be construed as limited to the shapes of the regions shown in this disclosure, but rather include deviations in shape due to, for example, manufacturing. For example, an etched region shown as a rectangle will typically have curved features. Therefore, the regions shown in the drawings are schematic in nature, and their shapes are not intended to illustrate the actual shape of regions of the device and are not intended to limit the scope of the exemplary embodiments.

最后应说明的是:以上实施例仅用以说明本公开的技术方案,而非对其限制;尽管参照前述实施例对本公开进行了详细的说明,本领域的普通技术人员应当理解:其依然可以对前述各实施例所记载的技术方案进行修改,或者对其中部分技术特征进行等同替换;而这些修改或者替换,并不使相应技术方案的本质脱离本公开各实施例技术方案的精神和范围。 Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present disclosure, rather than to limit them. Although the present disclosure has been described in detail with reference to the aforementioned embodiments, those skilled in the art should understand that they can still modify the technical solutions described in the aforementioned embodiments, or make equivalent replacements for some of the technical features therein. However, these modifications or replacements do not deviate the essence of the corresponding technical solutions from the spirit and scope of the technical solutions of the various embodiments of the present disclosure.

Claims (19)

一种超声检测基板,包括衬底基板,以及设置在所述衬底基板一侧的检测区和周边区,所述周边区位于所述检测区的至少一侧;An ultrasonic detection substrate comprises a base substrate, and a detection area and a peripheral area arranged on one side of the base substrate, wherein the peripheral area is located on at least one side of the detection area; 所述检测区包括:沿行方向和列方向阵列排布的多个阵元,以及沿行方向排布且沿列方向延伸的多个信号线,所述信号线与所述阵元连接,所述多个信号线包括多个分区信号线,所述多个分区信号线划分为多个信号线组,所述信号线组包括至少一个所述分区信号线;The detection area includes: a plurality of array elements arranged in a row direction and a column direction, and a plurality of signal lines arranged in the row direction and extending in the column direction, the signal lines being connected to the array elements, the plurality of signal lines including a plurality of partition signal lines, the plurality of partition signal lines being divided into a plurality of signal line groups, the signal line groups including at least one of the partition signal lines; 所述周边区包括沿行方向延伸的转接线,所述转接线包括沿行方向排布且间隔设置的多个转接线段;The peripheral area includes a patch cord extending along a row direction, and the patch cord includes a plurality of patch cord segments arranged along the row direction and spaced apart; 其中,同属一个信号线组的分区信号线连接同一个转接线段,分属不同信号线组的分区信号线连接不同的转接线段。Partition signal lines belonging to the same signal line group are connected to the same patch cord segment, and partition signal lines belonging to different signal line groups are connected to different patch cord segments. 根据权利要求1所述的超声检测基板,其中,所述周边区还包括:The ultrasonic detection substrate according to claim 1, wherein the peripheral area further comprises: 扇出线以及绑定端子,所述扇出线连接在所述绑定端子与所述转接线段之间,不同的转接线段通过不同的扇出线连接至不同的绑定端子。A fan-out line and a binding terminal, wherein the fan-out line is connected between the binding terminal and the patch line segment, and different patch line segments are connected to different binding terminals through different fan-out lines. 根据权利要求2所述的超声检测基板,其中,所述转接线段与所述扇出线的连接点在行方向上相对于所述转接线段居中设置。The ultrasonic detection substrate according to claim 2, wherein the connection point between the patch line segment and the fan-out line is centered relative to the patch line segment in the row direction. 根据权利要求2所述的超声检测基板,其中,所述扇出线与所述转接线同层设置;或者The ultrasonic detection substrate according to claim 2, wherein the fan-out line and the adapter line are provided on the same layer; or 所述扇出线分别与所述转接线以及所述分区信号线异层设置。The fan-out lines are arranged in different layers from the transfer lines and the partition signal lines. 根据权利要求1所述的超声检测基板,其中,同属一个转接线的不同转接线段连接相同数量的分区信号线;和/或The ultrasonic detection substrate according to claim 1, wherein different adapter wire segments belonging to the same adapter wire are connected to the same number of partition signal lines; and/or 同属一个转接线的不同转接线段连接相同数量的阵元;和/或Different patch cord segments belonging to the same patch cord are connected to the same number of array elements; and/or 同属一个转接线的不同转接线段沿行方向上的宽度相同。Different patch cord segments belonging to the same patch cord have the same width along the row direction. 根据权利要求1所述的超声检测基板,其中,所述多个信号线还包括跨接信号线,所述跨接信号线与所述转接线段异层设置且在所述衬底基板上的正投影有交叠,所述跨接信号线与所述转接线段之间无连接;The ultrasonic detection substrate according to claim 1, wherein the plurality of signal lines further include a jumper signal line, the jumper signal line and the adapter line segment are arranged in different layers and their orthographic projections on the base substrate overlap, and there is no connection between the jumper signal line and the adapter line segment; 在所述衬底基板上的正投影中,与同属一个转接线的两个转接线段有交叠的跨接信号线数量相同。 In the orthographic projection on the substrate, the number of the overlapping jumper signal lines is the same as that of the two patch cord segments belonging to the same patch cord. 根据权利要求1所述的超声检测基板,其中,所述多个信号线还包括跨接信号线,所述跨接信号线与所述转接线段异层设置且相互无连接;The ultrasonic detection substrate according to claim 1, wherein the plurality of signal lines further include a jumper signal line, the jumper signal line and the adapter line segment are arranged in different layers and are not connected to each other; 所述转接线段上设置有第一镂空孔,所述第一镂空孔与所述跨接信号线在所述衬底基板上的正投影有交叠。A first hollow hole is provided on the adapter wire segment, and the first hollow hole overlaps with the orthographic projection of the jumper signal wire on the base substrate. 根据权利要求7所述的超声检测基板,其中,多个所述第一镂空孔相互间隔设置且沿列方向排布,所述第一镂空孔在所述衬底基板上的正投影在行方向上覆盖所述跨接信号线在所述衬底基板上的正投影。The ultrasonic detection substrate according to claim 7, wherein the plurality of first hollow holes are spaced apart from each other and arranged along the column direction, and the orthographic projection of the first hollow hole on the base substrate covers the orthographic projection of the jumper signal line on the base substrate in the row direction. 根据权利要求1所述的超声检测基板,其中,所述信号线与所述转接线异层设置;The ultrasonic detection substrate according to claim 1, wherein the signal line and the adapter line are arranged in different layers; 所述检测区包括同层设置且相互分隔开的两种所述分区信号线,两种所述分区信号线为第一分区信号线和第二分区信号线,所述第一分区信号线和所述第二分区信号线用于向所述阵元提供不同的信号;The detection area includes two partition signal lines arranged in the same layer and separated from each other, the two partition signal lines are a first partition signal line and a second partition signal line, and the first partition signal line and the second partition signal line are used to provide different signals to the array element; 所述周边区包括同层设置且相互分隔开的两个所述转接线,两个所述转接线为第一转接线和第二转接线,所述第一转接线中的转接线段与所述第一分区信号线连接,所述第二转接线中的转接线段与所述第二分区信号线连接,所述第一转接线位于所述第二转接线靠近所述检测区的一侧。The peripheral area includes two adapter wires arranged in the same layer and separated from each other, the two adapter wires are a first adapter wire and a second adapter wire, the adapter wire segment in the first adapter wire is connected to the first partition signal line, and the adapter wire segment in the second adapter wire is connected to the second partition signal line, and the first adapter wire is located on the side of the second adapter wire close to the detection area. 根据权利要求9所述的超声检测基板,其中,所述第一分区信号线的数量大于或等于所述第二分区信号线的数量。The ultrasonic detection substrate according to claim 9, wherein the number of the first partition signal lines is greater than or equal to the number of the second partition signal lines. 根据权利要求9所述的超声检测基板,其中,所述多个阵元划分为多个检测单元,所述检测单元包括沿行方向排布的多个阵元;The ultrasonic detection substrate according to claim 9, wherein the plurality of array elements are divided into a plurality of detection units, and the detection unit comprises a plurality of array elements arranged along a row direction; 同属一个检测单元的不同阵元连接不同的第一分区信号线,同属一个检测单元的不同阵元连接同一个第二分区信号线。Different array elements belonging to the same detection unit are connected to different first partition signal lines, and different array elements belonging to the same detection unit are connected to the same second partition signal line. 根据权利要求9所述的超声检测基板,其中,所述第一分区信号线为使能信号线,所述第二分区信号线为复位控制信号线;或者The ultrasonic detection substrate according to claim 9, wherein the first partition signal line is an enable signal line, and the second partition signal line is a reset control signal line; or 所述第一分区信号线为复位控制信号线,所述第二分区信号线为使能信号线;The first partition signal line is a reset control signal line, and the second partition signal line is an enable signal line; 其中,所述阵元包括超声传感器,所述使能信号线用于向所述阵元提供使能信号,以使所述阵元响应于所述使能信号,采集所述超声传感器上的感应电压,所述复位控制信号线用于向所述阵元提供复位控制信号,以使所述阵元响应于所述复位控制信号,将复位信号写入所述阵元。 The array element includes an ultrasonic sensor, the enable signal line is used to provide an enable signal to the array element, so that the array element responds to the enable signal and collects the induced voltage on the ultrasonic sensor, and the reset control signal line is used to provide a reset control signal to the array element, so that the array element responds to the reset control signal and writes a reset signal into the array element. 根据权利要求9所述的超声检测基板,其中,所述多条信号线还包括电源信号线,所述电源信号线用于向所述阵元提供电源信号;The ultrasonic detection substrate according to claim 9, wherein the plurality of signal lines further comprise a power signal line, and the power signal line is used to provide a power signal to the array element; 所述周边区还包括:第一传输线,沿行方向延伸,与多条所述电源信号线连接,位于所述检测区同一侧的第一传输线为相互连通的一体结构;并且The peripheral area further includes: a first transmission line extending in a row direction and connected to the plurality of power signal lines, wherein the first transmission lines located on the same side of the detection area are interconnected as an integrated structure; and 所述第一传输线位于所述第一转接线与所述第二转接线之间,或者所述第一传输线位于所述第二转接线远离所述第一转接线的一侧。The first transmission line is located between the first patch line and the second patch line, or the first transmission line is located on a side of the second patch line away from the first patch line. 根据权利要求13所述的超声检测基板,其中,两个所述第一传输线沿列方向相对设置在所述检测区的两侧,所述周边区还包括:The ultrasonic detection substrate according to claim 13, wherein the two first transmission lines are arranged on opposite sides of the detection area along a column direction, and the peripheral area further includes: 第二传输线,沿列方向延伸,与所述第一传输线异层设置且在交叉位置处相互连接,两个所述第二传输线沿行方向相对设置在所述检测区的两侧。The second transmission line extends along the column direction, is arranged in a different layer from the first transmission line and is connected to each other at the intersection position. Two second transmission lines are arranged opposite to each other on both sides of the detection area along the row direction. 根据权利要求9所述的超声检测基板,其中,所述周边区还包括:The ultrasonic detection substrate according to claim 9, wherein the peripheral area further comprises: 第一转接图案,位于所述第一转接线靠近所述检测区的一侧,与所述第一转接线同层设置,分别与所述第一转接线以及所述第一分区信号线连接,所述第一分区信号线与所述第一转接线在所述衬底基板上的正投影无交叠。The first transfer pattern is located on a side of the first transfer line close to the detection area, is arranged on the same layer as the first transfer line, and is respectively connected to the first transfer line and the first partition signal line. The orthographic projections of the first partition signal line and the first transfer line on the base substrate do not overlap. 根据权利要求9所述的超声检测基板,其中,所述周边区还包括:The ultrasonic detection substrate according to claim 9, wherein the peripheral area further comprises: 第二转接图案,位于所述第一转接线靠近所述检测区的一侧,与所述第一转接线同层设置且相互间隔设置,相邻的两条第二分区信号线与同一个第二转接图案通过过孔连接;a second transfer pattern, located on a side of the first transfer line close to the detection area, arranged on the same layer as the first transfer line and spaced apart from each other, wherein two adjacent second partition signal lines are connected to the same second transfer pattern through a via; 在所述相邻的两条第二分区信号线中,一条跨过所述第一转接线并与所述第二转接线通过过孔连接,另一条与所述第一转接线以及所述第二转接线在所述衬底基板上的正投影均无交叠。Of the two adjacent second partition signal lines, one crosses the first transfer line and is connected to the second transfer line through a via, and the other has no overlap with the orthographic projections of the first transfer line and the second transfer line on the base substrate. 根据权利要求1所述的超声检测基板,其中,所述分区信号线与所述转接线在所述衬底基板上的正投影有交叠,且所述分区信号线与所述转接线通过过孔连接。The ultrasonic detection substrate according to claim 1, wherein the partition signal line and the adapter line have overlapping orthographic projections on the base substrate, and the partition signal line and the adapter line are connected through a via. 根据权利要求1所述的超声检测基板,其中,所述分区信号线沿列方向相对的两端均与所述转接线连接,所述转接线沿列方向相对设置在所述检测区的两侧。The ultrasonic detection substrate according to claim 1, wherein both opposite ends of the partition signal line along the column direction are connected to the adapter line, and the adapter line is arranged on both sides of the detection area along the column direction. 一种超声成像装置,包括:An ultrasonic imaging device, comprising: 如权利要求1至18任一项所述的超声检测基板;以及 The ultrasonic detection substrate according to any one of claims 1 to 18; and 驱动电路,与所述超声检测基板连接,用于向所述信号线提供驱动信号。 A driving circuit is connected to the ultrasonic detection substrate and is used to provide a driving signal to the signal line.
PCT/CN2024/074725 2024-01-30 2024-01-30 Ultrasonic detection base plate and ultrasonic imaging apparatus Pending WO2025160751A1 (en)

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