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WO2025146678A1 - Caméra holographique et masque de codeur associé - Google Patents

Caméra holographique et masque de codeur associé Download PDF

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Publication number
WO2025146678A1
WO2025146678A1 PCT/IL2024/051188 IL2024051188W WO2025146678A1 WO 2025146678 A1 WO2025146678 A1 WO 2025146678A1 IL 2024051188 W IL2024051188 W IL 2024051188W WO 2025146678 A1 WO2025146678 A1 WO 2025146678A1
Authority
WO
WIPO (PCT)
Prior art keywords
unit cells
encoder
symmetry
pattern
encoder mask
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
PCT/IL2024/051188
Other languages
English (en)
Inventor
Igor GERSHENZON
Yoav Avraham BERLATZKY
Yanir HAINICK
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
PXE Computational Imaging Ltd
Original Assignee
PXE Computational Imaging Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by PXE Computational Imaging Ltd filed Critical PXE Computational Imaging Ltd
Publication of WO2025146678A1 publication Critical patent/WO2025146678A1/fr
Pending legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G01J3/2823—Imaging spectrometer
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/0205—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
    • G01J3/0208—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows using focussing or collimating elements, e.g. lenses or mirrors; performing aberration correction
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/12—Generating the spectrum; Monochromators
    • G01J3/18—Generating the spectrum; Monochromators using diffraction elements, e.g. grating
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J9/00—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength
    • G01J9/02—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength by interferometric methods
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G01J3/2823—Imaging spectrometer
    • G01J2003/2826—Multispectral imaging, e.g. filter imaging

Definitions

  • Various techniques utilizing holographic cameras include for example:
  • US 11,293,806 assigned to the assignee of the present application, describes an optical detection system for detecting data on the optical mutual coherence function of input field.
  • the system comprising an encoder having similar unit cells, and an array of sensor cells located at a distance downstream of said unit cells with respect to a general direction of propagation of input light.
  • the array defines a plurality of sub-array unit cells, each sub-array corresponding to a unit cell of the encoder, and each sub-array comprising a predetermined number M of sensor elements.
  • the encoder applies predetermined modulation to input light collected by the system, such that each unit cell of said encoder directs a portion of the collected input light incident thereon onto sub-array unit cell corresponding therewith and one or more neighboring sub-array unit cells within a predetermined proximity region.
  • the number M is determined in accordance with a predetermined number of sub-arrays unit cells within the proximity region.
  • An optical, speckle-based imaging system may comprise an illumination unit comprising at least one coherent light source to illuminate a sample; a collection unit for collecting input light from the sample, the collection unit consisting of an imaging optics and a wavefront imaging sensor; and a control unit coupled to the illumination unit and the collection unit for analyzing the input light and generating a speckle wavefront image, wherein the at least one coherent light source is to generate primary speckles in the sample or thereon, and the imaging optics is to capture a secondary speckle pattern induced by the illumination unit in the sample or thereon.
  • An optical system may comprise an optical imaging unit, to form an optical image near an image plane of the optical system; a wavefront imaging sensor unit located near the image plane, to provide raw digital data on an optical field and image output near the image plane; and a control unit for processing the raw digital data and the image output to provide deblurred image output, wherein the control unit comprises a storage unit that stores instructions and a processing unit to execute the instructions to receive the image input and the raw digital data of the optical field impinging on the wavefront imaging sensor and generate a deblurred image based on an analysis of the optical mutual coherence function at the imaging plane.
  • the present disclosure provides a camera system and encoder mask for us in holographic camera, enabling collection of input wavefront and determining image pattern including wavefront structure and coherence data of the wavefront.
  • the encoder mask of the present disclosure further enables reconstruction of spectral components of the collected wavefront. Providing accurate color reproduction of the collected wavefront.
  • the present disclosure provides a camera system, comprising:
  • an encoder mask comprising an array of a plurality of similar unit cells having selected encoder pattern
  • each of said plurality of similar unit cells carries an encoding pattern having at least first and second axes of symmetry.
  • the unit cells of the encoder carry the same encoder pattern between them. In some embodiments, the encoder pattern of the unit cells is equal for the unit cells.
  • the encoding pattern of said plurality of similar unit cells comprises a phase affecting pattern comprising one or more regions configured to provide phase variation of 2it or more between radiation components.
  • the encoding pattern of said plurality of similar unit cells comprises etched pattern having etching depth larger than wavelength of light for which the camera is designed for.
  • the camera system may be configured for wavefront imaging in visible and near IR wavelength range, the etched pattern having etching depth greater than 1.2 micrometer.
  • the encoding pattern of said similar unit cells is characterized by reflection symmetry about at least first and second different axes.
  • the encoding pattern of said similar unit cells is characterized by 180° rotation symmetry.
  • an encoder mask comprising an array of a plurality of encoders, each of said plurality of encoders comprises an array of a plurality of similar unit cells;
  • a lens arrangement comprising one or more optical lenses positioned for imaging input light onto said encoder mask; wherein the unit cells of said encoder mask are larger than a diffraction limited spot defined by said lens arrangement and wherein said encoder mask is displaced from image plane defined by the lens arrangement thereby allowing for optical spot to cover a unit cell of said encoder mask.
  • the unit cells of the encoder carry the same encoder pattern between them. In some embodiments, the encoder pattern of the unit cells is equal for the unit cells.
  • the present disclosure provides an encoder mask, comprising a periodic arrangement of repeating unit cell, each of the repeating unit cells comprises an encoding pattern having at least first and second axes of symmetry.
  • the repeating unit cells are similar unit cells.
  • the similar unit cells generally carry an equal encoder pattern between them.
  • the encoder pattern of the unit cells is typically equal between them.
  • the arrangement of said plurality of unit cells defines a global encoding pattern having at least one additional symmetry beyond the at least first and second axes of symmetry of the unit cells.
  • design of the encoding pattern of unit cells 122, and replication of the unit cells in an array forming the encoder mask, provide selected diffraction properties, and cross-talk between light components impinging on different unit cells 122.
  • the camera system utilizes cross talk between light components passing through neighboring unit cells of the encoder and generating interference on the detector array to determine phase relation and coherence matrix of the collected light. Additionally, symmetrical properties of the encoding patern of the different unit cells enables selective reconstruction of the collected image and determining spectral components of the collected light.
  • the encoder design having different symmetry properties with respect to different axes Al and A2, enables determining spectral components of the collected light to reconstruct collected image including intensity, coherence matrix, and selected spectral bands such as RGB spectral bands.
  • the exemplary unit cell encodings illustrated in Figs. 2A to 2D provide reflection or rotation symmetry, such that encodings of Figs. 2A, 2B and 2D indicate reflection symmetry about first and second axe resulting in variation in interference pattern collected by the detector along the respective axes.
  • the example of Fig. 2C illustrates rotation symmetry of 180°, providing corresponding variation in interference pattern collected by the detector array with respect to axes Al and A2 projected on the detector plane.
  • encoding patern in the unit cell 122 due to variation in diffraction properties of light components in accordance with wavelength of light, variation in symmetry properties of the encoding patern in the unit cell 122 cause respective diffraction of light components of different wavelengths.
  • different detector elements of the detector sub-array associated with a given unit cell 122 of the encoder provide data indicative of respective spectral components of the collected wavefront.
  • using a selected number of different symmetry axes e.g., axes Al and A2
  • the encoding pattern of Fig. 2B has similar symmetry about axes Al and A2, and can thus provide image reconstruction using RGB spectral components.
  • the encoding paterns of Figs. 2A, 2C or 2D have different symmetry about axes Al and A2, and can support image reconstruction with an additional spectral band such as infrared.
  • Figs. 3A to 3C exemplify the relation between symmetry of encoding pattern of a unit cell in Fig. 3A, arrangement of detector elements associated with a respect unit cell in Fig. 3B, and global arrangement of detector elements associated with a plurality of unit calls of the encoder mask in Fig. 3C.
  • Fig. 3A illustrates a unit cell 122 of the encoder mask having encoding pattern.
  • the encoding pattern has symmetry for reflection about vertical and horizontal axes Al and A2, and also has symmetry for reflection about diagonal axes DI and D2.
  • the encoding pattern is formed of main region R1 and phase affecting regions R2 and R’2 arranged within the unit call 122. Regions R2 and R’2 may be similar or different, determining symmetry levels and accordingly number of spectral bands that can be reconstructed in the wavefront data.
  • Fig. 3B exemplifies an arrangement of detector elements 144 forming a sub-array 142 of detector elements, associated with a unit cell 122 of the encoder.
  • the detector elements 144 of the sub-array 142 collect light components with symmetrical properties that are generally similar to those of the encoded unit cell.
  • Pixels P2 and P’2 relate to symmetry of the encoder along vertical and horizontal axes Al and A2 and may be similar or different in accordance with symmetry of the encoding of the unit cell 122, and similarly for diagonal regions P3 and P’3.
  • the encoding pattern has symmetry for reflection about vertical and horizontal axes Al and A2, and may have similar symmetry if regions R2 and R’2 are of equal dimensions, or both diagonals DI and D2, light components collected by pixels P2 and P’2 (or P3 and P’3) are expected to be similar.
  • CMOS complementary metal-oxide-semiconductor
  • CMOS complementary metal-oxide-semiconductor
  • the camera system can provide spectral data to obtain RGB image, this is while if P2 is different than P’2, and P3 is different than P’3, as resulting from the encoder examples of Fig. 2A to 2D, the camera system can also determine infrared spectral band in wavefront reconstruction.
  • This expected symmetry in detection of light components may be further used in reconstruction of collected wavefront including intensity, coherence matrix and spectral components. More specifically, as detector sub-arrays associated with the different unit cells of the encoder mask have cross talk between them, interference of light components causes variation between the detector array allowing to reconstruct the shape of a collected wavefront.
  • Fig. 3C exemplifies an arrangement of detector array 140 including a number of sub-arrays 144 associated with a number of unit cells of the encoder. Detector elements 142 associated with common symmetry such as P2, P’2, P3 and P’3 are marked in Fig. 3C by different patterns.
  • filling pattern of the detector elements exemplifies a situation of different symmetry for reflection about Al an A2 axes, i.e., P2 P’2
  • Fig. 3C also illustrates symmetry within sub-array 144 marked by LI and symmetry relation shared by neighboring sub-arrays marked by L2.
  • the symmetry conditions LI enable wavefront reconstruction providing RGB and/or RGB+IR in accordance with symmetry variations. Additionally, variation of collected intensity from expected symmetry condition can be used for reconstruction of depth data of the collected wavefront. This enables to determine three-dimensional structure of an object, or a scene based on reconstruction of the collected wavefront.
  • variation in intensity collected between pixels along a common symmetry axis may be used to determine edges, and depth variation in reconstruction of collected wavefront data.
  • intensity collected at the right P2 pixel may differ from the intensity collected at the left P2 pixel.
  • the actual intensity collected by each pixel may relate also to light components passing through neighboring unit cells of the encoder mask. Accordingly, depth information may be obtained in image reconstruction based on variation from symmetry conditions within a number of pixels. This is exemplified in Fig. 3C using path L2 associated with pixels of a number (e.g., four) of sub-arrays associated with neighboring unit cells of the encoder. Variation in collected intensity along path L2, or variation in collected intensity from expected symmetry determined by encoding pattern of the mask 120 thus indicates depth information and may be used for reconstruction of three-dimensional data of the object/scene being imaged.
  • a field of view of the camera system 100 may be determined in accordance with f-number (f/#) of the lens arrangement 110. Additionally, the f-number may also determine size of a diffraction limited spot/pixel of the camera system.
  • image resolution and/or sampling ratio can be determined by a relation between diffraction limited spot size and unit cell 122 size.
  • the camera system 100 may operate with a size of unit cell 122 determined to be larger than diffraction limited spot of the lens arrangement 110, thereby providing certain under sampling of the collected wavefront.
  • arrangement of the camera system, and positions of the encoder mask with respect to focal length of the lens arrangement may be used to generate selected spot dilation, improving wavefront collection properties.
  • Figs. 4A and 4C exemplifying arrangement of camera system 100 including lens arrangement 110, encoder mask 120 and detector array 130 with respect to focal plane of the lens arrangement 110.
  • the encoder mask 120 is placed at a focal plane, or image plane for a selected focusing conditions of lens arrangement 110.
  • the encoder mask 120 is displaced from the focal/image plane and is placed at a location f+A, being further from focal plane f of the lens arrangement 110.
  • the encoder mask 120 is located at a location f-A, being closer to the lens arrangement 110 than the focal plane f. Displacement of the encoder mask with respect to the focal plane f provides selected spot dilation and can improve and/or simplify wavefront reconstruction quality.
  • lens arrangement 110 may typically include a focusing arrangement capable of varying optical focusing conditions.
  • focal plane relates to imaging of objects located at large distance (infinity) and should be understood as relating to image plane for a selected imaging conditions. More specifically, the lens arrangement 110 may be used to adjust focal length thereof to bring the image plane of a selected imaging conditions onto the plane marked f in Figs. 4A to 4C.
  • the present disclosure provides a camera system, operable as a holographic camera system and capable of generating output data indicative of phase and/or coherence of a collected wavefront, and an encoding mask for use in such camera system.
  • the camera system utilizes symmetry conditions of the encoding mask to determine a selected number of spectral bands within collected wavefront and may utilize variation from the symmetry conditions for determining depth information of the collected wavefront.

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  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)

Abstract

L'invention concerne un système de caméra et un masque de codeur correspondant. Le système de caméra comprend : un réseau de détecteurs comprenant une pluralité de pixels sensibles à la lumière, un masque de codeur comprenant un réseau d'une pluralité de cellules unitaires similaires ayant un motif de codeur sélectionné, et un agencement de lentille comprenant une ou plusieurs lentilles optiques positionnées pour imager une lumière d'entrée sur ledit masque de codeur. Chacune de la pluralité de cellules unitaires similaires porte un motif de codage ayant au moins des premier et second axes de symétrie. En variante, ou en outre, les cellules unitaires dudit masque de codeur sont supérieures à un point limité de diffraction défini par l'agencement de lentille et le masque de codeur est déplacé du plan d'image défini par l'agencement de lentille, ce qui permet à un point optique de recouvrir une cellule unitaire dudit masque de codeur.
PCT/IL2024/051188 2024-01-04 2024-12-16 Caméra holographique et masque de codeur associé Pending WO2025146678A1 (fr)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US202463617481P 2024-01-04 2024-01-04
US63/617,481 2024-01-04

Publications (1)

Publication Number Publication Date
WO2025146678A1 true WO2025146678A1 (fr) 2025-07-10

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Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20180052050A1 (en) * 2015-03-24 2018-02-22 University Of Utah Research Foundation Imaging device with image dispersing to create a spatially coded image
US20200278257A1 (en) * 2017-04-06 2020-09-03 Pxe Computational Imaging Ltd Wavefront sensor and method of using it
WO2022225975A1 (fr) * 2021-04-20 2022-10-27 The Regents Of The University Of California Imagerie de compression hyperspectrale avec photonique intégrée

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20180052050A1 (en) * 2015-03-24 2018-02-22 University Of Utah Research Foundation Imaging device with image dispersing to create a spatially coded image
US20200278257A1 (en) * 2017-04-06 2020-09-03 Pxe Computational Imaging Ltd Wavefront sensor and method of using it
WO2022225975A1 (fr) * 2021-04-20 2022-10-27 The Regents Of The University Of California Imagerie de compression hyperspectrale avec photonique intégrée

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