[go: up one dir, main page]

WO2025144955A1 - Ensembles de microscopie - Google Patents

Ensembles de microscopie Download PDF

Info

Publication number
WO2025144955A1
WO2025144955A1 PCT/US2024/061984 US2024061984W WO2025144955A1 WO 2025144955 A1 WO2025144955 A1 WO 2025144955A1 US 2024061984 W US2024061984 W US 2024061984W WO 2025144955 A1 WO2025144955 A1 WO 2025144955A1
Authority
WO
WIPO (PCT)
Prior art keywords
stage
assembly
microscopy
optical
sensor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
PCT/US2024/061984
Other languages
English (en)
Inventor
Philip N. Harju
John H. Mcgibbon
Spencer Franklin MCELWAIN
Stephan Hersey
Caleb Sheehan NILES
Jason Harris Karp
Michael R. Moon
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Idexx Laboratories Inc
Original Assignee
Idexx Laboratories Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from US18/999,341 external-priority patent/US20250216663A1/en
Application filed by Idexx Laboratories Inc filed Critical Idexx Laboratories Inc
Publication of WO2025144955A1 publication Critical patent/WO2025144955A1/fr
Pending legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/24—Base structure
    • G02B21/26—Stages; Adjusting means therefor
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/0008—Microscopes having a simple construction, e.g. portable microscopes
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/34—Microscope slides, e.g. mounting specimens on microscope slides
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/36—Microscopes arranged for photographic purposes or projection purposes or digital imaging or video purposes including associated control and data processing arrangements
    • G02B21/362—Mechanical details, e.g. mountings for the camera or image sensor, housings

Definitions

  • the present disclosure generally relates to microscopy assemblies, and more specifically, to microscopy assemblies having any, some, or all of a stage having a retention arm and a pair of biased compression members, an optical target, an objective dust cover, and/or a sensor and a sensing target.
  • Optical systems of microscope assemblies require calibration. Moreover, placement of a microscope stage of the microscope assembly with respect to other components of the microscope assembly, such as the objective lens or objective lenses, is important to interrogate samples on the microscope stage. In some circumstances, such as when microscope assemblies are utilized at a point-of-care, the microscope assemblies may spend much of the time not in use, and components of the microscope assembly, such as the objective lens can collect debris or dust, impacting the performance of the microscope assembly. In some instances, such as when interrogating biological samples, it is necessary to maintain specific orientation of the sample with respect to components of the microscope assembly and the biological sample may need to be maintained at certain environmental conditions, such as temperature and the like. Accordingly, a need exists for improved microscope assemblies.
  • a microscopy assembly includes: a stage for receiving an optical cartridge, the stage comprising: a platform defining a planar surface and a window extending through the platform; and a retention arm defining a retention face and a rounded release face opposite the retention face, wherein the retention face at least partially faces the planar surface of the platform and is configured to engage a complementary cartridge engagement surface of the optical cartridge inserted into the microscope assembly.
  • a microscopy assembly includes: a stage for receiving an optical cartridge, the stage comprising: a platform defining a planar surface and a window extending through the platform, a retention arm defining a retention face and a rounded release face opposite the retention face, wherein the retention face at least partially faces the planar surface of the platform and is configured to engage a complementary cartridge engagement surface of the optical cartridge inserted into the microscope assembly; and an optical target.
  • a microscopy assembly includes: a stage for receiving an optical cartridge, the stage comprising: a platform defining a planar surface and a window extending through the platform, a retention arm defining a retention face and a rounded release face opposite the retention face, wherein the retention face at least partially faces the planar surface of the platform and is configured to engage a complementary cartridge engagement surface of the optical cartridge inserted into the microscope assembly; and an objective dust cover coupled to the stage.
  • a microscopy assembly includes: a stage for receiving an optical cartridge, the stage comprising: a platform defining a planar surface and a window extending through the platform, a retention arm defining a retention face and a rounded release face opposite the retention face, wherein the retention face at least partially faces the planar surface of the platform and is configured to engage a complementary cartridge engagement surface of the optical cartridge inserted into the microscope assembly; a sensor; and a sensing target, wherein: one of the sensor and the sensing target is fixed to the stage, and the other of the sensor and the sensing target is spaced apart from the stage.
  • FIG. 2A schematically depicts a side view of a sensor and a sensing target coupled to a positioning arm of the microscope assembly of FIG. 1 , according to one or more embodiments shown and described herein;
  • FIG. 2B schematically depicts a top view of sensor and a sensing target of the microscope assembly of FIG. 1, according to one or more embodiments shown and described herein;
  • FIG. 3 schematically depicts a top view of a cartridge holder of a stage of the microscope assembly of FIG. 1, according to one or more embodiments shown and described herein;
  • FIG. 4 schematically depicts a bottom view of a platform and a cartridge holder of a stage of the microscope assembly of FIG. 1, according to one or more embodiments shown and described herein;
  • FIG. 5 A schematically depicts an objective dust cover coupled to the stage of the microscope assembly of FIG. 1, according to one or more embodiments shown and described herein;
  • FIG. 5B schematically depicts another objective dust cover, according to one or more embodiments shown and described herein;
  • FIG. 6 schematically depicts an objective lens and a stage of the microscope assembly of FIG. 1, according to one or more embodiments shown and described herein;
  • FIG. 7A schematically depicts an optical target sample and an optical target optical cartridge on the stage of the microscope assembly of FIG. 1, according to one or more embodiments shown and described herein;
  • FIG. 7B schematically depicts a plurality of patterns on an optical target optical cartridge, according to one or more embodiments shown and described herein;
  • FIG. 7C schematically depicts a pinhole aperture of an optical target sample, according to one or more embodiments shown and described herein;
  • FIG. 8 depicts an image of a pinhole aperture of an optical target sample, according to one or more embodiments shown and described herein.
  • microscopy assemblies described herein include a stage having a retention arm and a pair of biased compression members.
  • microscopy assemblies described herein include a stage having a retention arm and a pair of biased compression members and an optical target.
  • microscopy assemblies described herein include a stage having a retention arm and a pair of biased compression members and an objective dust cover.
  • microscopy assemblies described herein include a stage having a retention arm and a pair of biased compression members, a sensor, and a sensor target. In embodiments, microscopy assemblies described herein include a stage having a retention arm and a pair of biased compression members, an optical target, and an objective dust cover. In embodiments, microscopy assemblies described herein include a stage having a retention arm and a pair of biased compression members, an optical target, a sensor, and a sensing target. In embodiments, microscopy assemblies described herein include a stage having a retention arm and a pair of biased compression members, an optical target, an objective dust cover, a sensor, and a sensing target.
  • microscopy assemblies described herein include a stage having a retention arm and a pair of biased compression members, an objective dust cover, a sensor, and a sensing target.
  • microscopy assemblies described herein include an optical target.
  • microscopy assemblies described herein include an optical target and an objective dust cover.
  • microscopy assemblies described herein include an optical target, a sensor, and a sensing target.
  • microscopy assemblies described herein include an optical target, an objective dust cover, a sensor, and a sensing target.
  • microscopy assemblies described herein include an objective dust cover.
  • microscopy assemblies described herein include an objective dust cover, a sensor, and a sensing target.
  • microscopy assemblies described herein include a sensor and a sensing target.
  • Microscopy assemblies described herein may improve upon conventional microscopy assemblies in that, in embodiments, microscopy assemblies described herein may include an optical target including a pinhole aperture.
  • a pinhole aperture of an optical target may be inexpensively created (by, for example, boring a hole in an optical sample).
  • a pinhole aperture of an optical target of a microscopy assembly may advantageously provide a mechanism for making resolution measurements of such optical devices.
  • an optical target comprising a pinhole aperture may be integrally formed from or otherwise attached to a stage or other component of a microscopy assembly, advantageously enabling calibration and/or measurement of resolution of one or more optical device(s) of the microscopy assembly throughout the lifespan of the microscopy assembly.
  • Microscopy assemblies described herein may improve upon conventional microscopy assemblies in that, in embodiments, microscopy assemblies described herein may include an optical target having one or more patterns and/or features that may be used to make resolution measurements of one or more optical device(s) of such microscopy assemblies.
  • optical targets having such patterns and/or features may, advantageously, be integrally formed from a stage or other component of such microscopy assemblies and/or provided on an optical cartridge of such microscopy assemblies, thereby advantageously enabling calibration and/or measurement of resolution of one or more optical device(s) of the microscopy assembly throughout the lifespan of the microscopy assembly.
  • optical targets having such patterns and/or features may be periodically inspected and compared against, for example, an optical target of known quality to ensure that calibration and/or resolution measurements made from such optical targets are within an acceptable accuracy threshold.
  • Microscopy assemblies described herein may improve upon conventional microscopy assemblies in that, in embodiments, microscopy assemblies described herein may include an objective dust cover.
  • an objective dust cover may advantageously be attached to a stage or other component of a microscopy assembly to, for example, shield an optical device (for example, an objective lens) of the microscopy assembly from dust while not in use.
  • Microscopy assemblies described herein may improve upon conventional microscopy assemblies in that, in embodiments, microscopy assemblies described herein may include a sensor and a sensing target. Such a sensor and a sensing target may be used to position and/or detect the position of a stage or other component of a microscopy assembly (in, for example, either or both of an x- and/or y-coordinate scheme). In embodiments, either such sensors or such sensing targets may be directly attached to the stage or other component, thereby advantageously enabling the direct measurement of a position of the stage or other component and/or reducing a part count and/or assembly time of a microscopy assembly thereof.
  • such sensors may provide an absolute measurement of a position of the stage or other component, thereby advantageously not requiring the need of a reference input and/or a homing process and/or device (for example, a positional feedback process and/or device) to measure a position of the stage or other component.
  • a homing process and/or device for example, a positional feedback process and/or device
  • such sensors may continue to provide an electronic feedback signal even if power to the sensor is disconnected or interrupted, thereby advantageously providing a positioning mechanism for which the function has a reduced reliance on constant and/or uninterrupted power.
  • Microscopy assemblies described herein may improve upon conventional microscopy assemblies in that, in embodiments, microscopy assemblies described herein may include a cartridge holder which may hold a cartridge to a stage of such microscopy assemblies and/or position a heatsink and/or heater to control a temperature of a sample of such microscopy assemblies during imaging.
  • the cartridge holder may be a single injection molded part, thereby advantageously reducing part count and/or manufacturing time of such microscopy assemblies, reducing a cost associated with manufacturing a mechanism for holding the cartridge to the stage and/or a mechanism for positioning a heatsink and/or heater near the sample, and/or positioning the sample such that a sampling plane defined by the sample is substantially parallel to a focusing plane of an optical device (for example, an objective lens) of such microscopy assemblies.
  • an optical device for example, an objective lens
  • FIG. 1 depicts an embodiment of a microscopy assembly 100, which includes a stage 110.
  • the stage 110 includes a platform 310 which defines a planar surface 311 and a window 312 extending through the platform 310.
  • an optical cartridge (for example, an optical cartridge 305, depicted in FIG. 3 and described elsewhere herein) may be received by the stage 110 and positioned upon the platform 310 to be viewed by an optical device (for example, one or more lens(es), mirror(s), and/or light source(s), such as an objective lens 610, depicted in FIG. 6 and described elsewhere herein) of the microscopy assembly 100.
  • the optical cartridge made be held in place by a cartridge holder 320, which is described in further detail elsewhere herein with reference to FIGS. 3-4.
  • the optical cartridge (and, thereby, at least some of the stage 110) must be optically coupled to an optical device (for example, an objective lens 610, depicted in FIG. 6 and described elsewhere herein).
  • an optical device for example, an objective lens 610, depicted in FIG. 6 and described elsewhere herein.
  • the term “optically coupled,” as used herein with reference to one or more optical devices and one or more other component(s) (for example, one or more other optical device(s) and/or an optical cartridge) are positioned, oriented, and/or designed such that an optical signal (for example, for example, visible light, ultraviolet light, blue light, white light, fluorescence light, infrared light, other electromagnetic waves, and/or any combination thereof) the one or more optical device(s) and the one or more other components may be propagated therebetween.
  • an optical signal for example, for example, visible light, ultraviolet light, blue light, white light, fluorescence light, infrared light, other electromagnetic waves, and/or any combination thereof
  • optical devices and/or components may be said to be “optically coupled” when each device and/or component is within the same optical path of an optical signal transmitted between, through, to, and/or from the devices and/or components.
  • optical path when used herein with respect to an optical signal is the path of the optical signal transmitted by, to, from, between, and/or through one or more devices and/or components.
  • a process for optically coupling an optical device of the microscopy assembly 100 with the stage 110 may include moving the stage 110 (for example, in either or both of the +/-x- and/or +/-y-dir ections of the coordinate scheme of FIG. 1).
  • the microscopy assembly 100 may include either or both of a first motor assembly 120 A (which may, in embodiments, move the stage 110 in the +/-x-direction of the coordinate scheme of FIG. 1) and/or a second motor assembly 120B (which may, in embodiments, move the stage 110 in the +/-y-direction of the coordinate scheme of FIG. 1).
  • the first motor assembly 120 A may move the stage 110 by operating a first motor 121 A to rotate a first motor shaft 122 A.
  • the first motor shaft 122A may be mechanically coupled to a first positioning arm 130A of the stage 110, by being positioned within a first positioning arm nut 131 A of the first positioning arm I 30A.
  • both the first motor shaft 122 A and the first positioning arm nut 131 A may be threaded such that rotation of the first motor shaft 122 A moves the first positioning arm nut 131 A (and, thereby, the first positioning arm 130 A and the stage 110) along the first motor shaft 122 A (for example, in motion parallel to the x-axis of FIG. 1).
  • the second motor assembly 120B may move the stage 110 by operating a second motor 12 IB to rotate a second motor shaft 122B.
  • the second motor shaft 122B may be mechanically coupled to a second positioning arm I 30B of the stage 110, by being positioned within a second positioning arm nut 13 IB of the second positioning arm I 30B.
  • both the second motor shaft 122B and the second positioning arm nut 13 IB may be threaded such that rotation of the second motor shaft 122B moves the second positioning arm nut 13 IB (and, thereby, the second positioning arm BOB and the stage 110) along the second motor shaft 122B (for example, in motion parallel to the y-axis of FIG. 1).
  • the microscopy assembly 100 may include only one motor assembly (for example, only one of the motor assemblies BOA, BOB). In embodiments, the microscopy assembly 100 may include any plurality of motor assemblies, such as three, four, or even five or more motor assemblies.
  • the microscopy assembly 100 may include either or both of a first sensor assembly 200A (for, example, measuring an x-coordinate of a position of the stage 110) and/or a second sensor assembly 200B (for, example, measuring a y-coordinate of a position of the stage 110).
  • the sensing target 220 may have a gradient defined by any, some, or all of the sloped edge 224, the lateral face 221, and/or one or more other face(s) and/or edge(s) of the sensing target 220, and, in embodiments, a gradient defined by the sensing target 220 may be a gradient in any, some, or all directions, such as, for example, any, some, or all of the +/-x-, +/-y-, and/or +/-z directions of the coordinate schemes of FIGS. 2A-2B.
  • measurements of the sensor 210 may vary with a temperature of the sensing coil 211.
  • the sensor assembly 200 may also include a temperature sensor (for example, positioned on and/or electrically coupled to a circuit board of the sensor 210) which may measure a temperature of at least part of the sensor assembly 200 (for example, a temperature of the sensing coil 211 and/or a temperature of the sensing target 220).
  • variances in measurements (for example, inductance) of the sensor assembly 200 due to variances in temperature of components of the sensor assembly 200 may be used in calculating a position of a stage mechanically coupled to either or both of the sensor 210 and/or the sensing target 220, thereby, in embodiments, reducing and/or eliminating uncertainty in such measurements due to temperature variations of one or more component(s) of the sensor assembly 200.
  • either or both of the sensor assemblies 200A, 200B may be configured as any embodiment of the sensor assembly 200 described herein (for example, the embodiment of FIG. 2A, wherein the sensing target 220 is mechanically coupled to the positioning arm 130, or other embodiments, such as embodiments wherein either the sensor 210 or the sensing target 220 is mechanically coupled to the stage 110 and/or any component thereof).
  • aposition of the stage 110 may be measured by either or both of the sensor assemblies 200A, 200B to, for example, enable an optical device of the microscopy assembly (for example, an objective lens 610, as depicted in FIG. 6 and described elsewhere herein) to be optically coupled to an optical cartridge received by the stage 110 and positioned upon the platform 310.
  • an optical device of the microscopy assembly for example, an objective lens 610, as depicted in FIG. 6 and described elsewhere herein
  • the cartridge holder 320 of the stage 110 includes a pair of retention arms 340A, each defining a retention face 341 A and a rounded release face 342A opposite the retention face 341 A.
  • the retention face 341 A at least partially faces the planar surface 311.
  • the insertion of the optical cartridge 305 may lift the retention arms 340A (for example, in the +z direction of the coordinate scheme of FIG. 3 and away from the platform 310), thereby removing a force exerted (in, for example, the -z direction of the coordinate scheme of FIG. 3 and toward the platform 310) by the retention arms 340A.
  • the retention arms 340A may be positioned opposite one another (relative to, for example, the optical cartridge 305) such that the respective retention face 341 A of each of the retention arms 340A faces the planar surface 311. Accordingly, in embodiments, when the stage 110 is receiving the optical cartridge 305, the retention face 341 A of each of the retention arms 340A engages a respective one of a pair of complementary cartridge engagement surfaces 306A of the optical cartridge 305. In embodiments, a position of the optical cartridge 305 (in the embodiment of FIG. 3, in the z- direction of the coordinate scheme of FIG.
  • one or more hard stops 750 (FIG. 7A) alone or in conjunction with the retention arms 340A restrict movement of the optical cartridge 305 in the x and y directions.
  • the microscopy assembly 100 may include a heatsink 400 (depicted in FIG. 4).
  • the heatsink 400 may rest within the window 312 and, in embodiments, provide a partially opened surface through which heat may be delivered to and/or emanate from, for example, the optical cartridge 305.
  • the cartridge holder 320 may also include a pair of biased compression members 340B, each of which may, in embodiments, be coupled to the heatsink 400.
  • a position of the heatsink 400 in, for example, the z-direction of the coordinate schemes of FIGS.
  • the biased compression members 340B may each comprise a heatsink snap 34 IB, and, in embodiments, the heatsink 400 may comprise a pair of heatsink retention flanges 405.
  • each of the heatsink snaps 34 IB may be configured to engage a respective one of the heatsink retention flanges 405, thereby coupling the heatsink 400 to the stage 110.
  • the coupling of the biased compression members 340B and the heatsink 400 may bias the heatsink 400 upward (in, for example, the +z direction of the coordinate schemes of FIGS. 3-4), thereby making the heatsink 400 movable in, for example, the +/-z-dir ection of the coordinate schemes of FIGS. 3-4.
  • the biased compression members 340B may be elastically deformable, thereby, in embodiments, providing the biasing force acting upon the heatsink 400.
  • the biased compression members 340B may be monolithically formed.
  • the heatsink 400 may be formed from a metal (for example, aluminum 6061) and/or any other material(s), such as, for example, materials with high coefficients of thermal expansion.
  • the heatsink 400 is anodized to restrict scratching or damage from the cartridge 305.
  • the cartridge holder 320 may include only one, none, or any plurality (such as, for example, three, four, or even five or more) of the retention arms 340A. In embodiments, the cartridge holder 320 may include only one, none, or any plurality (such as, for example, three, four, or even five or more) of the biased compression members 340B. In embodiments, the heatsink 400 may include only one, none, or any plurality (such as, for example, three, four, or even five or more) of the heatsink retention flanges 405.
  • the heatsink 400 may include a number of heatsink retention flanges 405 equal to, greater than, or less than a number of biased compression members 340B and/or a number of heatsink snaps 341B.
  • the stage 110 may further comprise padding to, for example, prevent damage to the optical cartridge 305 by the biasing of, for example, any, some, or all of the retention arms 340A and/or the biased compression members 340B.
  • the stage 110 may further comprise one or more pads positioned on the planar surface 311 and opposite any, some, or all of the retention faces 341 A such that, in embodiments, either or both of the retention arms 340A engage the optical cartridge 305 between the respective retention face 341 A of the retention arm 340A and the one or more pads.
  • the cartridge holder 320 may be integrally formed from the platform 310. However, in other embodiments, the cartridge holder 320 may be mechanically coupled to the platform 310. Accordingly, in embodiments, the cartridge holder 320 may comprise a pair of biased bosses 360 positioned opposite one another and extending laterally relative to the platform 310. In embodiments, the platform 310 may comprise a pair of boss retention members 365, wherein each of the boss retention members 365 is positioned relative to a respective one of the biased bosses 360 such that a laterally-facing compression face 361 of each of the biased bosses 360 engages a respective one of the boss retention members 365.
  • the engagement of the laterally-facing compression faces 361 against the boss retention members 365 may retain a position (in, for example, either or both of the x- and/or y-directions of the coordinate scheme of FIG. 3 and relative to the platform 310) of the cartridge holder 320.
  • the cartridge holder 320 may be, for example, an injection- molded part.
  • the cartridge holder 320 may be formed from any, some, or all of silicon, an Acetal ® polymer, a polycarbonate, a plastic (for example, an acrylonitrile butadiene styrene (“ABS”) plastic), and/or one or more other materials.
  • the cartridge holder 320 may be a monolithic structure. It should be understood that the term “monolithic” as used herein with reference to components refers to a component being formed from a singular part. That is, monolithic structures lack separate parts and/or sub-components and, instead, comprise only a single component.
  • the cartridge holder 320 is a monolithic structure at least because all of the subcomponents thereof (for example, the retention arms 340A, the biased compression members 340B, the downwardly-extending snap members 350A, 350B, and the biased bosses 360) are formed from the cartridge holder 320 rather than, for example, being mechanically coupled, welded to, or otherwise attached to the cartridge holder 320. Accordingly, assembly of the cartridge holder 320 and/or one or more other components described herein which, in embodiments, may be monolithic structure (such as, for example, the heatsink 410 and/or the objective dust cover, depicted in FIGS.
  • 5A-5B may, in embodiments, not require assembly of sub-components thereof, as, in embodiments wherein the cartridge holder 320 and/or such other one or more components are monolithic structures, the cartridge holder 320 and/or such other one or more components are monolithic structures and, thereby, each contains no sub-components.
  • the platform 310 (which is depicted in FIG. 3 in an underneath view) may define a first pair of snap-receiving spaces 313A and a first pair of snap mount surfaces 314A, each of which may be positioned adjacent to a respective one of the first pair of snap-receiving spaces 313A.
  • the platform 310 may further define a second pair of snap-receiving spaces 313B and a second pair of snap mount surfaces 314B, each of which may be positioned adjacent to a respective one of the second pair of snapreceiving spaces 313B.
  • the cartridge holder 320 may comprise a first pair of downwardly- extending snap members 350A each comprising a first flange 351 A, and, in embodiments, each of the first flanges 351 A may extend through a respective one of the first pair of snap-receiving spaces 313A and bias the respective first downwardly-extending snap member 350A against a respective one of the first snap mount surfaces 314A. Accordingly, in embodiments, each of the first downwardly-extending snap members 350 A may snap into a respective one of the first pair of snap-receiving spaces 313A and, thereafter, fix a position of the cartridge holder 320 (in, for example, the z-direction of FIGS. 3-4 and relative to the platform 310) by moving each of the first pair of flanges 351 A through a respective one of the first pair of snap-receiving spaces 313A.
  • the cartridge holder 320 may comprise a second pair of downwardly-extending snap members 350B each comprising a second flange 35 IB, and, in embodiments, each of the second flanges 35 IB may extend through a respective one of the second pair of snap-receiving spaces 313B and bias the respective second downwardly-extending snap member 350B against a respective one of the second snap mount surfaces 314B. Accordingly, in embodiments, each of the second downwardly-extending snap members 350B may snap into a respective one of the second pair of snap-receiving spaces 313B and, thereafter, fix a position of the cartridge holder 320 (in, for example, the z-direction of FIGS. 3-4 and relative to the platform 310) by moving each of the second pair of flanges 35 IB through a respective one of the second pair of snap-receiving spaces 313B.
  • the cartridge holder 320 may only comprise only one of the first pair of downwardly-extending snap members 350A or the second pair of downwardly-extending snap members 350B. In embodiments, the cartridge holder 320 may comprise one, none, or any plurality (such as three, four, or even five or more) of either or both of the first downwardly- extending snap members 350A and/or the second downwardly-extending snap members 350B.
  • a position of the cartridge holder 320 may be fixed (in, for example, any, some, or all of the x-, y-, or z-directions of the coordinate scheme of FIG. 3) relative to the platform 310.
  • the stage 110 may comprise a pair of dust cover retaining members 140, and, in embodiments and when the objective dust cover 500 is mechanically coupled to the stage 110, each of the retention members 520 may bias the objective dust cover against a respective one of the dust cover retaining members 140 (by, for example, extending about each of the dust cover retaining members 140), thereby, in embodiments, mechanically coupling the objective dust cover 500 to the stage.
  • the compressible removal members 510 may, when compressed (for example, wherein each of the compressible removal members 510 are pushed toward the other of the compressible removal members 510), separate each of the retention members 520 from the respective one of the dust cover retaining members 140, thereby, in embodiments, decoupling the objective dust cover 500 from the stage 110.
  • the objective dust cover 500 may be, for example, an injection- molded part.
  • the objective dust cover 500 may be formed from any, some, or all of an elastomer, silicon, ethylene propylene diene monomer (“EPDM”) rubber, polyether block amide (“PEBA”), polyvinyl chloride (“PVC”), thermoplastic elastomer (“TPE”), thermoplastic polyurethane (“TPU”), thermoplastic vulcanizates (“TPV”), liquid silicone rubber (“LSR”), other rubbers, and/or one or more other materials and may be compressible.
  • the objective dust cover 500 may be a monolithic structure.
  • the microscopy assembly 100 may include an objective lens 610 which, in the depiction of FIG. 6, is optically coupled to the platform 310 in a viewing position.
  • the objective lens 610 may define an imaging path axis 612 extending through the stage 110.
  • the stage 110 may be movable in an imaging plane 620 (for example, parallel to the x/y plane of the coordinate scheme of FIG. 6 and which, for example and referring to FIG. 1, may be defined by or parallel to the planar surface 311 of the platform 310).
  • the stage 110 may be moved (in the embodiment of FIGS.
  • the objective dust cover 500 covers the objective lens 610 (by, for example, the objective dust cover 500 occupying a position, in FIG. 5A, depicted therein as being occupied by the platform 310). Accordingly, in embodiments and when, for example, the microscopy assembly 100 is not in use, the objective lens 610 may be moved from the viewing position to the covered position such that the objective lens 610 may be shielded from dust and/or other particles and/or radiation.
  • the first sensor 210A of the first sensor assembly 200A may detect a first measurement of the first sensing target 220A.
  • a second sensor of the second sensor assembly 200B may detect a second measurement of a second sensing target of the second sensor assembly 200B.
  • sensors of additional sensor assemblies of the microscopy assembly 100 may detect additional measurements of sensing targets of such sensor assemblies.
  • measurements detected by any, some, or all of the sensor assemblies 200A, 200B and/or other sensor assemblies may be indicative of a position of a stage along a respective axis in the imaging plane 620 of FIG.
  • the first measurement detected by the first sensor 210A of the first sensor assembly 200 A is, in the embodiment of FIG. 1, indicative of an x-position of the stage (that is to say, a position of the stage 110 in the x-coordinates of the coordinate schemes of FIGS. 1 and 6).
  • the second measurement detected by the second sensor of the second sensor assembly 200B is, in the embodiment of FIG.
  • any, some, or all of the sensor assemblies 200 A, 200B, and/or one or more other sensor assemblies of the microscopy assembly 100 may enable the objective lens 610 to precisely image of some or all of an optical cartridge (for example, the optical cartridge 305) positioned upon the platform 310.
  • the microscopy assembly 100 may include one or more optical targets which may, in embodiments, be usable for calibrating and/or testing an imaging resolution of optical devices of the microscopy assembly 100.
  • the microscopy assembly 100 may further comprise a printed circuit board assembly and an imaging sensor (not depicted in FIG. 6) optically coupled to the objective lens 610 (by, for example, being positioned along the imaging path axis 612 and below, in the -z-direction, the objective lens 610) and, thereby, optically coupled to one or more optical targets of the microscopy assembly 100.
  • the imaging sensor may, thereby, be enabled to capture an image of an optical target of the microscopy assembly 100, and, using the image, a resolution and/or calibration of the image, the imaging sensor, the objective lens 610, and/or one or more other optical device(s) of the microscopy assembly 100 may be calculated by the printed circuit board.
  • a resolution and/or calibration of the image of the optical target may be compared to a previously -measured resolution to calculate a potential change in resolution, thereby enabling the measurement of a calibration and/or a resolution of optical devices of the microscopy assembly 100 across the lifetime of the microscopy assembly 100.
  • the surface 731 and/or another portion of the optical target optical cartridge 720 may include a unique identifier (comprising, for example, a serial number; formed by, for example, being printed and/or carved into the optical target optical cartridge 720 and/or the substrate 730) so that previously- taken images of the optical targets 732 may be appropriately identified for comparison against newly-taken images of the optical targets 732, thereby avoiding potentially erroneous comparisons of such images.
  • a unique identifier comprising, for example, a serial number; formed by, for example, being printed and/or carved into the optical target optical cartridge 720 and/or the substrate 730
  • the optical target optical cartridge 720 includes two substrates 730; however, in other embodiments, the optical target optical cartridge 720 may include one substrate 730 or any plurality of substrates 730, such as three, four, or even five or more substrates 730.
  • the substrate 730 includes 4 optical targets 732; however, in other embodiments, any, some, or all of the substrates 730 of the optical target optical cartridge 720 may comprise one optical target 732 or any plurality of optical targets 732, such as two, three, or even five or more optical targets 732.
  • each of the optical targets 732 comprises a different pattern.
  • the optical target sample 712 and the stage 110 may be the same component (for example, a monolithic structure), and, in certain such embodiments, any, some, or all of the pinhole apertures 740 may, thereby, be defined by the stage.
  • the stage 110 may be movable (by, for example, the motor assemblies 120A, 120B of FIG. 1) from a viewing position (as described elsewhere herein) to an optical target position, wherein the imaging path axis 612 extends through the optical target sample 712 and/or wherein the objective lens 610 is otherwise optically coupled to one or more of the pinhole apertures 740.
  • the optical target sample 712 defines four pinhole apertures 740; however, in other embodiments, either or both of the stage 110 and/or the optical target sample 712 may define one, none, or any plurality (such as, for example, two, three, or even five or more) of the pinhole apertures 740.
  • the pinhole apertures 740 may be formed by, for example, boring holes into the optical target sample 712 and/or the stage 110.
  • the optical target sample 712 and/or the stage 110 may define or otherwise have printed thereon one or more optical targets configured as the optical targets 732.
  • one or more of the optical targets 732 of the optical target optical cartridge 720 may, rather than comprise a pattern, instead comprise a pinhole aperture defined by the optical target optical cartridge 720.
  • the pinhole apertures 740 may be precisely formed such that the optical target sample 712 and/or the stage 110 defines a precise edge of one or more of the pinhole apertures 740, such that images of one or more of the pinhole apertures 740 may, in embodiments, indicate a sharp contrast between one or more of the pinhole apertures 740 and the optical target sample 712 and/or the stage 110.
  • the pinhole aperture 740 comprises an edge 741 and a diameter 742.
  • the pinhole aperture 740 comprises a substantially circular shape; however, in other embodiments, the pinhole aperture 740 may comprise any shape, as long as the shape has a precisely slanted and/or curved edge and/or size which may, in an image and as described in further detail below, be used to measure a calibration and/or resolution of an image of an optical device of the microscopy assembly 100.
  • the diameter 742 of the pinhole aperture 740 may be greater than or equal to 20 pm (microns) and less than or equal to 620 pm. In some embodiments, the diameter 742 of the pinhole aperture 740 is about 500 pm.
  • FIG. 8 depicts an image 800 of the pinhole aperture 740 captured by, for example, an imaging device of the microscopy assembly 100 and through the objective lens 610.
  • a resolution of the edge 741 in the image 800 may be measured in, for example, a region 810 of the image 800.
  • a resolution of the edge 741 in, for example, the region 810 of the image 800 may be compared to a previously-measured resolution of a region corresponding to the region 810 in a previously-taken image of the pinhole aperture 740, in a manner similar to that described elsewhere herein with respect to usage of the optical targets 732.
  • a resolution of the edge 741 and/or the pinhole aperture 740 in the image 800 may be compared to a known and/or expected value of, for example, an angle of curvature of the edge 741, a magnitude of the diameter 742, or other such measurements of any, some, or all of the pinhole aperture 740 measured at the time of and/or by the process of the formation of the pinhole aperture 740 in the optical target sample 712 and/or the stage 110.
  • the pinhole aperture 740 may, by being defined by the optical target sample 712 and/or the stage 110, be used to measure a resolution and/or calibration of one or more optical device(s) (for example, an imaging sensor and/or the objective lens 610) of the microscopy assembly 100 over the lifetime of the microscopy assembly 100.
  • one or more optical device(s) for example, an imaging sensor and/or the objective lens 610
  • a resolution of the image 800 may be calculated by a modulation transfer function (“MTF”).
  • MTF modulation transfer function
  • an MTF may use the edge 741 of the pinhole aperture 740 in the image 800 to calculate a resolution (for example, in the region 810 and/or in one or more other region(s) including some or all of the edge 741) of the image 800.
  • the resolution of the edge 741 in the image 800 may be compared against an expected resolution or measurement of the edge 741 (from, for example a measurement of a previously-taken image of the edge 741 and/or a known measurement, such as an angle of curvature, of the edge 741 recorded at and/or by the process by which the pinhole aperture 740 was formed) thereby indicating a calibration and/or resolution of the image 800 and/or one or more optical devices of the microscopy assembly 100 (for example, an imaging sensor and/or the objective lens 610).
  • an expected resolution or measurement of the edge 741 from, for example a measurement of a previously-taken image of the edge 741 and/or a known measurement, such as an angle of curvature, of the edge 741 recorded at and/or by the process by which the pinhole aperture 740 was formed
  • the microscopy assembly 100 may include and/or otherwise use any combination of one, none, or any plurality of either or both of the pinhole apertures 740 and or the optical targets 732 positioned on and/or defined by any, some, or all of the stage 110, the optical target optical cartridge 720, and/or the optical target sample 712.
  • microscopy assemblies that include any, some, or all of a stage having a retention arm and a pair of biased compression members, an optical target, an objective dust cover, and/or a sensor and a sensing target.
  • a microscopy assembly comprising: a stage for receiving an optical cartridge, the stage comprising: a platform defining a planar surface and a window extending through the platform, and a retention arm defining a retention face and a rounded release face opposite the retention face, wherein the retention face at least partially faces the planar surface of the platform and is configured to engage a complementary cartridge engagement surface of the optical cartridge inserted into the microscope assembly.
  • microscopy assembly of any preceding clause further comprising a pad positioned on the platform and facing the retention face, wherein the retention face is configured to engage the optical cartridge between the retention face and the pad.
  • stage further comprises a pair of boss retention members and a pair of biased bosses opposite one another, each of the biased bosses extending laterally relative to the platform and comprising a laterally-facing compression face that engages a respective boss retention member of the pair of boss retention members.
  • the platform defines: a first pair of snap-receiving spaces and a first snap mount surface positioned adjacent to each of the first snap-receiving spaces, and a second pair of snap-receiving spaces and a second snap mount surface positioned adjacent to each of the second snap-receiving spaces; and the stage further comprises: a first pair of downwardly-extending snap members each comprising a first flange, each flange extending through a respective snap-receiving space of the first pair of snapreceiving spaces and biasing the first downwardly-extending snap member against the first snap mount surface of the respective snap-receiving space, and a second pair of downwardly-extending snap members each comprising a second flange, each flange extending through a respective snapreceiving space of the second pair of snap-receiving spaces and biasing the second downwardly- extending snap member against the second snap mount surface of the respective snap-receiving space.
  • microscopy assembly of any preceding clause further comprising a heatsink coupled to the stage, wherein: the stage further comprises a biased compression member including a heatsink snap; the heatsink comprises a heatsink retention flange; the heatsink retention snap is configured to engage the heatsink retention flange and couple the heatsink to the stage.
  • microscopy assembly of any preceding clause further comprising an objective lens optically coupled to the stage, wherein: the objective lens defines an imaging path axis extending through the stage; the stage is movable in an imaging plane transverse to the imaging path axis; the stage is movable between an optical target position and a viewing position; when the stage is in the optical target position, the imaging path axis extends through the optical target; and when the stage is in the viewing position, the imaging path axis extends through the platform of the stage.
  • the printed circuit board assembly receives an image of the optical target from the imaging sensor; and the printed circuit board assembly calculates a resolution of the image of the optical target.
  • the pinhole aperture comprises a diameter greater than or equal to 20 pm and less than or equal to 620 pm.
  • microscopy assembly of any preceding clause further comprising: a printed circuit board assembly; and an imaging sensor optically coupled to the optical target and electrically coupled to the printed circuit board assembly.
  • the printed circuit board assembly receives an image of the pinhole aperture from the imaging sensor; and the printed circuit board assembly calculates a resolution of the image of the pinhole aperture.
  • microscopy assembly of any preceding clause, wherein the printed circuit board assembly compares the resolution of the image of the pinhole aperture to a previously- measured resolution to calculate a potential change in resolution.
  • the objective dust cover comprises one or more compressible removal members and one or more retention members
  • the stage comprises one or more dust cover retaining members
  • each of the one or more retention members bias the objective dust cover against a respective dust cover retaining member of the one or more dust cover retaining members
  • each of the one or more retention members are separated from the respective dust cover retaining members of the one or more dust cover retaining members.

Landscapes

  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • Microscoopes, Condenser (AREA)

Abstract

Un ensemble de microscopie comprend : un étage de réception (110) d'une cartouche optique (305), l'étage comprenant une plateforme définissant une surface plane et une fenêtre s'étendant à travers la plateforme (310) et un bras de retenue (340A) définissant une face de retenue (341A) et une face de relâchement arrondie (342A) opposée à la face de retenue, la face de retenue faisant face au moins partiellement à la surface plane de la plateforme et étant configurée pour venir en prise avec une surface de mise en prise de cartouche complémentaire (306A) de la cartouche optique insérée dans l'ensemble de microscopie.
PCT/US2024/061984 2023-12-27 2024-12-26 Ensembles de microscopie Pending WO2025144955A1 (fr)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
US202363614979P 2023-12-27 2023-12-27
US63/614,979 2023-12-27
US18/999,341 US20250216663A1 (en) 2023-12-27 2024-12-23 Microscopy assemblies
US18/999,341 2024-12-23

Publications (1)

Publication Number Publication Date
WO2025144955A1 true WO2025144955A1 (fr) 2025-07-03

Family

ID=94341088

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/US2024/061984 Pending WO2025144955A1 (fr) 2023-12-27 2024-12-26 Ensembles de microscopie

Country Status (1)

Country Link
WO (1) WO2025144955A1 (fr)

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20020131167A1 (en) * 2000-11-09 2002-09-19 Nguyen Francis T. Sample holder for an imaging system
CN107688232A (zh) * 2017-10-19 2018-02-13 江苏硕世生物科技股份有限公司 一种显微镜载物台、显微镜及抓取载玻片的方法
US20180136448A1 (en) * 2016-11-12 2018-05-17 Caliber Imaging & Diagnostics, Inc. Confocal microscope with positionable imaging head
CN107810404B (zh) * 2015-03-24 2020-11-10 伊鲁米那股份有限公司 用于对样品成像用于生物或化学分析的方法、载体组件和系统

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20020131167A1 (en) * 2000-11-09 2002-09-19 Nguyen Francis T. Sample holder for an imaging system
CN107810404B (zh) * 2015-03-24 2020-11-10 伊鲁米那股份有限公司 用于对样品成像用于生物或化学分析的方法、载体组件和系统
US20180136448A1 (en) * 2016-11-12 2018-05-17 Caliber Imaging & Diagnostics, Inc. Confocal microscope with positionable imaging head
CN107688232A (zh) * 2017-10-19 2018-02-13 江苏硕世生物科技股份有限公司 一种显微镜载物台、显微镜及抓取载玻片的方法

Similar Documents

Publication Publication Date Title
KR102221965B1 (ko) 기질을 정렬하기 위한 방법 및 장치
KR101300353B1 (ko) 손떨림 보정장치
US20090219547A1 (en) Method and Device for Position Sensing in an Imaging System
KR20130073465A (ko) 카메라 모듈
KR102520401B1 (ko) 노광 장치 및 물품 제조 방법
SG187095A1 (en) Projection system with metrology
KR20060031694A (ko) 주사형 프로브 현미경의 탐침 교환방법
WO2018025606A1 (fr) Caméra stéréoscopique
KR100708770B1 (ko) 위치검출장치, 표면형상 추정장치, 그리고, 노광장치 및 이것을 이용한 디바이스의 제조방법
US20250216663A1 (en) Microscopy assemblies
Meng et al. ACute3D: a compact, cost-effective, 3-D printed laser autocollimator
WO2025144955A1 (fr) Ensembles de microscopie
KR101678362B1 (ko) 계측기를 구비한 프로젝션 시스템
CN119629460A (zh) 一种摄像模组
CN109195735A (zh) 光学漂移校正系统以及方法
US20210382259A1 (en) Positioning system for components of optical systems
JPH07253335A (ja) 光学式変位センサ
CN222838825U (zh) 一种位置误差识别与补偿装置
CN120292974B (zh) 一种具有阻尼功能的扫描测头及三坐标测量机
CN222418961U (zh) 一种光纤基板的边角检测系统
CN220525679U (zh) 一种检测设备以及检焦装置
US10371930B2 (en) Stage apparatus and microscope
JPH07159418A (ja) 走査型プローブ顕微鏡
JPH06180847A (ja) 対物レンズ変位検出装置
JP2005147945A (ja) 偏心測定装置及び偏心測定方法

Legal Events

Date Code Title Description
121 Ep: the epo has been informed by wipo that ep was designated in this application

Ref document number: 24841660

Country of ref document: EP

Kind code of ref document: A1