WO2025017774A1 - Signal processing method for phase otdr - Google Patents
Signal processing method for phase otdr Download PDFInfo
- Publication number
- WO2025017774A1 WO2025017774A1 PCT/JP2023/026036 JP2023026036W WO2025017774A1 WO 2025017774 A1 WO2025017774 A1 WO 2025017774A1 JP 2023026036 W JP2023026036 W JP 2023026036W WO 2025017774 A1 WO2025017774 A1 WO 2025017774A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- scattered light
- frequency
- optical
- signal processing
- time
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
- G01D5/00—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable
- G01D5/26—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable characterised by optical transfer means, i.e. using infrared, visible, or ultraviolet light
- G01D5/32—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable characterised by optical transfer means, i.e. using infrared, visible, or ultraviolet light with attenuation or whole or partial obturation of beams of light
- G01D5/34—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable characterised by optical transfer means, i.e. using infrared, visible, or ultraviolet light with attenuation or whole or partial obturation of beams of light the beams of light being detected by photocells
- G01D5/353—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable characterised by optical transfer means, i.e. using infrared, visible, or ultraviolet light with attenuation or whole or partial obturation of beams of light the beams of light being detected by photocells influencing the transmission properties of an optical fibre
Definitions
- the present invention relates to a phase OTDR (Optical Time Domain Reflectometer) that measures the phase of scattered light signals from each point in a measured optical fiber.
- phase OTDR Optical Time Domain Reflectometer
- DAS Distributed Acoustic Sensing
- step S01 the details of step S01 are as follows: where t is the sampling interval of vibration, M points of measurement data from measurement time 0 to (M-1)t (M is a natural number) are used, the scattered light vector of the reference optical frequency (let it be f 1 ) at each time mt (m is an integer from 0 to (M-1)) is r 1 (mt, z) (dependent on the distance z from the input end since it depends on the optical fiber position), and the scattered light vector of each other optical frequency f i (i is an integer from 2 to N, N represents the number of frequency multiplexing) is r i (mt, z).
- the reference optical frequency can be set arbitrarily.
- Step S01-1 Calculate the angle ⁇ 1 (mt,z) of the scattered light vector r 1 (mt,z) of the reference light frequency at each time and each optical fiber point. If the scattered light vector r 1 (mt,z) is considered to be a complex vector on the complex plane, that is, a complex number, the angle ⁇ 1 (mt,z) can be calculated by arg[r 1 (mt,z)], where arg is an operator that gives the argument of a complex number.
- Step S01-2 Rotate the scattered light vector r i (mt,z) of each optical frequency at each time and each optical fiber point by an angle - ⁇ 1 (mt,z) to obtain r i _rot (mz,t). If the scattered light vector r i (mt,z) is a complex vector on a complex plane, the rotated vector r i _rot (mz,t) can be calculated as exp[- ⁇ 1 (mt,z)] ⁇ r i (mt,z).
- Step S01-3 After rotating the scattered light vector of each optical frequency at each optical fiber point, the vector r i _ rot (mt, z) is averaged over M points, where m is the measurement data used, from 0 to (M-1), to calculate the time-averaged vector r i _ avet (z). In actual calculations, vector summation may be used instead of the vector average over M points. Regardless of which method is used, the same results will be obtained in subsequent processing.
- Step S01-4 Calculate the phase rotation angle ⁇ i (z) when rotating the scattered light vector of each optical frequency at each optical fiber point in step S02 as ⁇ arg[r i _ avet (z)] using the angle of the time-averaged vector. Since the value of +arg[r i _ avet (z)] is the difference in phase offset value, it is possible to correct the difference in phase offset by rotating by ⁇ arg[r i _ avet (z)].
- phase rotation angle ⁇ i (z) given in step S01-4 is a value in which noise has been efficiently reduced due to the time averaging performed by the steps up to step S01-3.
- step S01 of conventional technology 1 the phase rotation angle of each optical frequency is calculated using M points of measurement data from measurement time 0 to (M-1)t (M is a natural number), and in step S02, the calculated phase rotation angle is used to perform frequency averaging on M points of measurement data from measurement time 0 to (M-1)t (M is a natural number) and on measurement data at other times.
- the optimal value of the phase rotation angle calculated by the method of step S01 in prior art 1 varies over time due to changes over time in optical properties such as the laser oscillation frequency, temperature changes in the measured optical fiber itself, and application of large dynamic strain to the measured optical fiber. Therefore, in long-term distributed vibration measurements, it is necessary to continuously update the optimal value of the phase rotation angle and perform the processes from step S02 onwards.
- prior art 1 does not disclose a method for performing the processes from step S02 onwards while continuously updating the optimal value of the phase rotation angle.
- Prior Application 1 PCT/JP2022/34477.
- the processes from step S02 onwards are carried out while continuously updating the optimum value of the phase rotation angle.
- Prior Application Invention 1 the method described in Prior Application 1 will be referred to as Prior Application Invention 1.
- the phase rotation angle is calculated and updated for each block with a time length of Mt (M is a natural number corresponding to the number of data points), so the value of the phase rotation angle changes discontinuously each time it moves to the next block. Therefore, a phenomenon is observed in which the final vibration waveform also changes discontinuously between the measurement data points at which the next block is switched to. For example, a phenomenon occurs in which the vibration waveform changes discontinuously between time (MK-1)t, which is the last measurement data point of block K, and time MKt, which is the first measurement data point of block K+1.
- a time window of window length Mt (M is a natural number corresponding to the number of data points) used in signal processing is set in advance, and the phase rotation angle is calculated using the measurement data contained in the time window while moving the time window, and this phase rotation angle is used to average the scattered light vectors of the frequency components at the center of the time window or at a time that is a preset number of measurement data points behind.
- Calculating the phase rotation angle while moving the time window is a moving average in a broad sense, and it is possible to obtain a smoothly changing phase rotation angle that does not include the discontinuous changes.
- a smoothly changing phase rotation angle discontinuous changes in the vibration waveform can be removed.
- Prior Art 1 Prior Invention 1, and Prior Invention 2, when averaging scattered light vectors of different optical frequencies, an arbitrary optical frequency is used as a reference, and the scattered light vectors of the different optical frequencies are rotated, and then the scattered light vectors of the different optical frequencies are averaged.
- Prior Invention 1 and Prior Invention 2 focus on the fact that the difference between the phase offset of the scattered light vector of an optical frequency different from the reference optical frequency and the phase offset of the scattered light vector of the reference optical frequency changes over time when large vibrations, temperature changes, etc. occur, and by updating the phase rotation angle in accordance with these changes, highly sensitive phase calculations are possible throughout the entire measurement time.
- the vibration waveform finally obtained by updating the phase rotation angle in Prior Application Invention 1 and Prior Application Invention 2 has reduced phase noise and reduced effects of noise-induced phase connection errors compared to a vibration waveform obtained using a signal of only one of the selected reference optical frequency or any other optical frequency, even in the event of large vibrations or temperature changes.
- Vibration waveform distortion not caused by noise mainly includes vibration waveform distortion caused by interference between scattered light from Rayleigh scatterers randomly distributed in the optical fiber, and is difficult to remove by improving the device configuration, etc. Therefore, Prior Application Invention 1 and Prior Application Invention 2 have the problem of being unable to faithfully measure vibrations occurring in the optical fiber.
- each of the multiplexed optical frequencies is selected as a reference optical frequency
- an oscillatory waveform is calculated using the method of prior invention 1 or prior invention 2
- the waveforms obtained by the calculation for the number of multiplexed frequencies are averaged to obtain a final oscillatory waveform.
- the oscillatory waveform distortion of the oscillatory waveform obtained when each of the multiplexed optical frequencies is selected as a reference optical frequency corresponds to the waveform distortion when the optical frequency selected as the reference optical frequency is used alone, so the oscillatory waveform distortion can be reduced by switching and averaging the reference optical frequencies.
- Prior Application Invention 1 and Prior Application Invention 2 update the phase rotation angle used in step S02 and onward, and are therefore affected by temporal fluctuations in the phase rotation angle due to measurement noise.
- a reference optical frequency is selected at each point on the optical fiber, but if the optical intensity of the selected reference optical frequency is low, the estimation accuracy of the phase rotation angle deteriorates.
- Prior Application Invention 1 and Prior Application Invention 2 also devise ways to improve the estimation accuracy of the phase rotation angle by performing time averaging within the window length Mt, but it is not possible to completely eliminate the deterioration of the estimation accuracy of the phase rotation angle. Therefore, assuming that the optical intensities of optical frequencies other than the reference optical frequency are the same, the smaller the optical intensity of the selected reference optical frequency, the greater the noise-induced fluctuations included in the time change of the phase rotation angle.
- the orientation of the scattered light vector after rotation also fluctuates significantly with respect to the orientation of an ideal scattered light vector that is not affected by noise.
- the scattered light vector with a fluctuating orientation is added to the scattered light vector of a reference optical frequency with low optical intensity (i.e., short vector length) to calculate the optical frequency average vector, so the orientation of the optical frequency average vector also fluctuates significantly. Therefore, the influence of this fluctuation is reflected in the vibration waveform calculated based on the angle of the optical frequency average vector, resulting in vibration waveform distortion.
- the vibration waveform when each of the multiplexed optical frequencies is selected as the reference optical frequency is calculated and averaged, so the vibration waveform when a reference optical frequency with low optical intensity is selected is also included in the average and is similarly affected by the temporal fluctuations of the phase rotation angle.
- Patent Publication No. 2020-169904 (NTT, registered)
- the present invention aims to reduce vibration waveform distortion caused by noise-induced fluctuations in the phase rotation angle used to average frequency-multiplexed scattered light signals.
- the phase OTDR system of the present invention comprises a measurement device that measures scattered light signals resulting from reflection or scattering of frequency-multiplexed optical pulses in an optical fiber, and a signal processing device that calculates a vibration waveform in the optical fiber using the scattered light signals measured by the measurement device.
- the signal processing device of the present invention executes a signal processing method for generating a final vibration waveform from the scattered light signals of the multiple optical frequencies, in which vibration waveform distortion due to fluctuations in the phase rotation angle is reduced.
- the signal processing device of the present invention comprises a functional unit which selects a reference optical frequency from a plurality of frequency-multiplexed optical frequencies, rotates scattered light vectors of other optical frequencies among scattered light vectors obtained from measurement data of the plurality of optical frequencies using the reference optical frequency as a reference, and then averages the scattered light vectors of the plurality of optical frequencies;
- the functional unit dynamically selects the reference light frequency by tracking over time the light frequency at which the intensity of the scattered light is greater.
- the functional unit also averages the scattered light vectors of the multiple optical frequencies at different times using the scattered light vector of the selected reference optical frequency, and performs signal processing based on the change between the optical frequency average vectors at different times obtained by the averaging.
- the signal processing device of the present invention includes the functional unit and obtains a vibration waveform based on the angle change of the optical frequency average vector obtained by the averaging.
- the signal processing device of the present invention provides a selection rule whereby, when selecting the reference optical frequency, optical frequencies with low scattered light intensity and short vector length are excluded from the selection of the reference optical frequency, and only optical frequencies with high scattered light intensity and long vector length are included in the selection of the reference optical frequency. Since the scattered light intensity varies over time, the selection of whether to exclude or include a frequency in the selection of the reference optical frequency is dynamically updated as necessary along the time axis at each point on the fiber.
- the present invention when the present invention is applied to a method of selecting one reference optical frequency at each point on a fiber, the optical frequency with the greatest measured scattered light intensity is dynamically selected as the reference optical frequency. For example, this corresponds to the case where the present invention is applied to Prior Application Invention 1 or Prior Application Invention 2.
- a selection rule is established such that a threshold is set based on the magnitude of the measurement instrument noise, and only optical frequencies equal to or greater than this threshold are included in the dynamic selection of the reference optical frequency. For example, this corresponds to the case where the present invention is applied to Prior Application Invention 3.
- the functional unit may average the scattered light vectors of the multiple optical frequencies with the scattered light vectors included in a predetermined time window.
- the reference optical frequency may be selected with respect to the scattered light vectors included in the time window.
- the functional unit may average the scattered light vectors of the multiple optical frequencies using two or more optical frequencies among the multiple optical frequencies included in a predetermined time window as a reference.
- the reference optical frequency may be selected from the scattered light vectors included in the time window.
- the present invention when selecting the reference optical frequency, an optical frequency with a greater scattered light intensity is selected, so that optical frequencies with a smaller scattered light intensity can be excluded from the selection of the reference optical frequency.
- the present invention can reduce vibration waveform distortion caused by noise-induced fluctuations in the phase rotation angle used to average the frequency-multiplexed scattered light signal.
- FIG. 1 is a configuration example of a measurement system.
- 3 is an explanatory diagram of an optical pulse output from an optical modulator.
- FIG. 2 shows an example of the configuration of a signal processing device.
- 4 shows an example of processing by the signal processing device.
- 4 shows an example of processing by the signal processing device.
- 4 shows an example of processing by the signal processing device.
- 4 shows an example of processing by the signal processing device.
- 4 shows an example of processing by the signal processing device. 4 shows an example of processing by the signal processing device.
- 4 shows an example of processing by the signal processing device.
- the measurement system comprises a measurement device 31 and a signal processing device 17.
- the measurement device 31 is a phase OTDR that measures the phase of scattered light from each point of the optical fiber 6 to be measured.
- the phase OTDR of this embodiment uses frequency multiplexing to measure phases at a plurality of different optical frequencies.
- the phase OTDR outputs an in-phase component and a quadrature component, which are used by the signal processing device 17 to calculate a scattered light vector signal representing the phase, and the scattered light vector signal is used to calculate a vibration waveform.
- the measurement system comprises the following configuration.
- a continuous light with a single wavelength and an optical frequency of f0 is emitted from a CW light source 1, and is branched into a reference light and a probe light by a coupler 2.
- the probe light is shaped by an optical modulator 3 into an optical pulse 4 shown in FIG. 2.
- f i is selected so that the intensity of the scattered light at each time and each point is sufficiently separated to be considered uncorrelated between different i.
- the pulse width P corresponds to the spatial resolution.
- optical modulator 3 There is no specific specification for the type of optical modulator 3 as long as it can generate an optical pulse 4, and there may be more than one.
- an SSB (Single Side Band amplitude modulation) modulator or a frequency-tunable AO (Acousto-Optics) modulator may be used, and intensity modulation may be performed using a semiconductor optical amplifier (SOA) or the like to increase the extinction ratio in pulsing.
- SOA semiconductor optical amplifier
- the pulsed probe light 4 is input to the optical fiber 6 under test via the circulator 5.
- Light scattered or reflected at each point along the length of the optical fiber 6 under test returns to the circulator 5 as backscattered light and is input to one input terminal of the optical 90-degree hybrid 7.
- the reference light branched by the coupler 2 is input to the other input terminal of the optical 90-degree hybrid 7.
- the method of signal processing for separation but for example, it is possible to pass I digital and Q digital through a digital bandpass filter with a center frequency of ⁇ f i and a passband of 2/P and then compensate for the phase delay. If the filter characteristics of the digital bandpass filter are set to specifications that allow streaming processing of measurement data, taking into account the memory size of the computer used, the measurement data will be streamed up to the signal processing unit 17c.
- Signal processing units 17d, 17e, 17f, and 17g continue to perform phase calculations.
- Signal processing unit 17d is a functional unit that executes step S01
- signal processing unit 17e is a functional unit that executes step S02
- signal processing units 17f and 17g are functional units that execute step S03.
- the signal processing unit 17d is a functional unit that selects a reference optical frequency from among the multiple optical frequencies that are frequency-multiplexed, and calculates the phase rotation angles of the scattered light vectors of other optical frequencies based on the reference optical frequency among the scattered light vectors obtained from the measurement data of the multiple optical frequencies.
- the signal processing unit 17e is a functional unit that, after rotating the phase rotation angle, calculates an optical frequency average vector by averaging the scattered light vectors of the multiple optical frequencies, and calculates the angular change of the optical frequency average vector.
- the signal processing units 17f and 17g are functional units that use the angle change to calculate the phase difference between two points separated by the gauge length, perform phase unwrapping processing, and calculate a vibration waveform.
- optical frequencies with higher scattered light intensity are tracked over time and dynamically selected in the selection of the reference optical frequency.
- the pulse incidence interval i.e., the vibration sampling rate
- the signal processing device 17 acquires measurement data at time kt using an integer k.
- the distance from the incidence end of the measured optical fiber 6 at which the probe light 4 is incident is defined as z. That is, signals Ii (kt,z) and Qi (kt,z) are input to the signal processing unit 17d.
- the signal processing unit 17d calculates the phase rotation angle ⁇ i (z) of each optical frequency f i from the scattered light vector r i (kt, z) in the same manner as in the prior art 1.
- the signal processing unit 17d in the prior invention 1 divides the measurement data into blocks of the number of time points, and calculates and updates the phase rotation angle in block units of the measurement time Mt.
- K is used as a number symbol to distinguish the blocks.
- the Kth block is the measurement data where k is from M(K ⁇ 1) to MK ⁇ 1.
- phase rotation angle ⁇ i (z,K) Since the phase rotation angle is calculated for each block, the value changes according to the block K, and the phase rotation angle is expressed as ⁇ i (z,K).
- the calculation method of the phase rotation angle ⁇ i (z,K) for each block is the same as step S01 in the conventional technique 1 in the present invention, but the present invention adds a process of selecting a reference light frequency.
- a flowchart of the signal processing unit 17d is shown in Figure 4.
- the measurement data obtained by the signal processing unit 17c is sent to the signal processing unit 17d.
- Step S101-2 Data of the scattered light vector r i in one time block is stored, and the sum of the vector length
- the optical frequency with the largest calculated sum is selected as the reference optical frequency.
- the reference optical frequency is set to f ref .
- the reference optical frequency f ref depends on the distance z from the input end and the time block K. When it is necessary to take these dependencies into consideration, it will be described below as f ref (z,K), f ref (z), or f ref (K).
- Step S101-4 The scattered light vector r i (kt,z) of each optical frequency at each optical fiber point at time kt in the time block is rotated by an angle ⁇ ref (kt,z) to obtain r i _rot (kt,z).
- r i_rot (kt, z) exp[-j ⁇ ref (kt, z)] ⁇ r i (kt, z) (114)
- j is the imaginary unit.
- Step S101-6 Using the obtained r i — avet (z, K), calculate the phase rotation angle ⁇ i (z, K) of each optical frequency using the measurement data of the Kth block.
- ⁇ i (z, K) -arg[r i_avet (z, K)] (116)
- ⁇ i (z, K) is passed to the signal processing unit 17e.
- Signal processing unit 17e rotates and averages the scattered light vector r i of each optical frequency f i using the phase rotation angle ⁇ i calculated by signal processing unit 17d to calculate an optical frequency average vector.
- the phase rotation angle ⁇ i used when calculating the frequency average of the scattered light vectors belonging to a certain block K is the phase rotation angle ⁇ i calculated by signal processing unit 17d in the previous block K-1. That is, detailed processing by signal processing unit 17e for the Kth block is as follows:
- Step S102-1 The signal processing unit 17e rotates the scattered light vector r i (kt, z) of each optical frequency at time kt by the phase rotation angle ⁇ i (z, K-1) calculated in the K-1th block, and calculates the rotated vector R i (kt, z).
- the calculation method can be exemplified as follows.
- R i (kt, z) exp (j ⁇ i (z, K-1)) ⁇ r i (kt, z) (121)
- Step S102-2 The signal processing unit 17e calculates a vector obtained by averaging the frequency of the rotated vector R i (kt,z). Note that since the final result is the same whether it is vector averaging or vector synthesis (simple vector sum), in the actual calculation procedure, the vectors are synthesized to obtain the optical frequency average vector R avef (kt,z).
- the calculation method is as follows.
- Step S102-3 Calculate the angle ⁇ avef (kt,z) of the optical frequency average vector R avef (kt,z) and transfer it to the downstream signal processing unit 17f.
- the measurement time of the first Mt is treated as a preliminary measurement, and no processing after the signal processing unit 17e is performed.
- the phase difference between two points separated by the gauge length is calculated using the change in the angle ⁇ avef (kt, z) of the obtained optical frequency average vector, and a vibration waveform is calculated by performing phase unwrapping processing, etc.
- a specific calculation method that can be used is the same as the calculation method of the vibration waveform from the phase in a general phase OTDR.
- the optical frequency serving as the reference for the phase rotation angle used by signal processing unit 17e of block K is f ref (K-1) selected in step S101-2 using the data of block K-1
- the optical frequency serving as the reference for the phase rotation angle used by signal processing unit 17e of block K+1 is f ref (K) selected in step S101-2 using the data of block K.
- the phase offset of the angle ⁇ avef (kt, z) of block K is based on the reference optical frequency f ref (K-1), and the phase offset of the angle ⁇ avef (kt, z) of block K+1 is based on the reference optical frequency f ref (K). Therefore, when the reference optical frequencies f ref (K-1) and f ref (K) are different, the change over time in the angle ⁇ avef from MK-1 to MK at time kt includes the effect of the difference in phase offset between the different optical frequencies.
- each block is set to (M+1)t
- adjacent blocks share a data point
- the data point is corrected.
- block K is set to include (M+1)t pieces of data with k ranging from M(K-1) to MK
- block K+1 is set to include (M+1)t pieces of data with k ranging from MK to (M+1)K.
- the former is set to ⁇ avef (MKt,z,K) and the latter is set to ⁇ avef (MKt,z,K+1) to distinguish them.
- ⁇ avef (MKt,z,K+1) - ⁇ avef (MKt,z,K) is a value that reflects the difference in offset of the reference optical frequency.
- this method of setting the time length of each block to (M+1)t, sharing a data point with adjacent blocks, and performing correction at that data point also has the effect of compensating for the shortcoming of Prior Invention 1, namely, phase discontinuity caused by discontinuity in the phase rotation angle, even if the reference optical frequency is the same in adjacent blocks.
- the signal processing unit 17e transfers the value of the angle ⁇ avef (kt, z) itself to the signal processing unit 17f.
- the signal processing unit 17e may transfer the time difference of the angle expressed by the following equation, and the time difference of the angle may be processed by the signal processing unit 17f. ⁇ avef ((k+1)t,z) ⁇ avef (kt,z)
- the signal processing unit 17f calculates the angle change of the optical frequency average vector due to the change in time from (MK-1)t to MKt using the following equation. ⁇ avef (MKt, z, K) - ⁇ avef ((MK-1)t, z, K)
- procedure S101-2 allows for streaming processing of data
- procedure S101-2 creates a new need to hold all scattered light data within one block. If it is desired to maintain the streaming processing characteristics of Prior Invention 1, it is possible to devise a method such as limiting the data points used to add the vector lengths in procedure S101-2 to the first few points of each block that can be held by the memory of the computer.
- the feature of the present invention is step S101-2.
- the signal processing unit 17d divides the measurement data into blocks of M time points, and calculates and updates the phase rotation angle in units of blocks of measurement time Mt, thereby dealing with temporal changes in the optimal value due to changes in optical characteristics such as the oscillation frequency of the laser, changes in temperature of the measured optical fiber itself, and application of large dynamic strain to the measured optical fiber.
- the measurement time Mt per block By making the measurement time Mt per block small relative to the time scale of changes in optical characteristics such as the oscillation frequency of the laser, changes in temperature of the measured optical fiber itself, and application of large dynamic strain to the measured optical fiber, it is possible to update the phase rotation angle with sufficient precision, and there is no problem in using the phase rotation angle calculated by the signal processing unit 17d in block K-1 as the phase rotation angle used when the signal processing unit 17e calculates the frequency average of the scattered light vectors belonging to block K.
- Mt is set to about 100, sufficient accuracy of the phase rotation angle can be guaranteed, and if the pulse transmission period t is 1 ms, Mt will be 100 ms or less, which is sufficient to handle cases where the time scale of the optimal phase rotation angle change is 1 s or more.
- the order of this setting value for Mt is about the same as the order of the time width at which the magnitude relationship of the scattered light intensity of each optical frequency can be considered constant within each block.
- step S101-2 by applying the present invention in step S101-2, selecting a reference optical frequency from the K-1th block, calculating the phase rotation angle, and using it to process the frequency average of the Kth block, it is possible to reduce vibration waveform distortion caused by the influence of angular fluctuations in the phase rotation angle derived from the measurement device noise.
- a time window of window length Mt (M is a natural number corresponding to the number of data points) used in signal processing is set in advance, and then the time window is moved while calculating a phase rotation angle using the measurement data included in the time window, and the phase rotation angle is used to average the scattered light vectors of the frequency components at the center of the time window or at a time located a preset number of measurement data points behind.
- the window length Mt may be set in the same manner as the block length in the first embodiment.
- the method of applying the present invention to Prior Application Invention 2 is generally the same as the method of applying the present invention to Prior Application Invention 1.
- Prior Application Invention 2 continuously updates the phase rotation angle at each time, and by applying the present invention, the reference optical frequency may also be changed at any time. Therefore, it is necessary to continuously correct the difference in phase offset due to the difference in reference optical frequency, which is different from the case of applying to Prior Application Invention 1.
- the scattered light vector r i (kt,z) is calculated and continuously streamed to the signal processing unit 17e.
- the scattered light vector from time (k-W)t to (k+W)t is used to calculate the phase rotation angle ⁇ i (kt,z) of each optical frequency f i used for frequency averaging.
- the calculated phase rotation angle ⁇ i (kt,z) is continuously streamed to the signal processing unit 17e.
- phase rotation angle ⁇ i (kt, z) is used not only at time kt but also for the frequency average at time (k+1)t in the signal processor 17e, and the time change of the phase is transmitted to the signal processor 17f.
- Step S201-2 The scattered light vector lengths
- the reference optical frequency f ref depends on the distance z from the incident end and the time kt. When it is necessary to take these dependencies into consideration, it will be written as f ref (kt, z), f ref (z), or f ref (kt) below.
- Step S201-4 The scattered light vector r i (kt,z) of each optical frequency at each optical fiber point at time kt is rotated by an angle ⁇ ref (kt,z) to obtain r i _rot (kt,z).
- r i_rot (kt, z) exp[-j ⁇ ref (kt, z)] ⁇ r i (kt, z) (214)
- Step S201-5 r i _rot (kt, z) from time (k-2W)t to time kt is averaged to calculate the time average vector r i _avet ((k-W)t, z).
- the argument time of the time average vector is the center time of the time window.
- Step S201-6 Calculate the phase rotation angle ⁇ i ((k ⁇ W)t, z) using the angle of the calculated time-averaged vector r i — avet ((k ⁇ W)t, z).
- ⁇ i ((k-W)t, z) -arg[r i_avet ((k-W)t, z)] (216)
- the calculated phase rotation angles ⁇ i ((k ⁇ W)t, z) are sequentially streamed to the signal processing unit 17 e.
- the scattered light vector ri of each optical frequency fi is rotated and averaged using the phase rotation angle ⁇ i calculated in the signal processing unit 17d to calculate the optical frequency average vector.
- the angle of the optical frequency average vector is transmitted to the signal processing unit 17f as is, but in the present invention, as a measure against the dynamic replacement of the reference optical frequency, the change in angle (phase) at adjacent times over time is calculated and then transmitted to the signal processing unit 17f.
- a specific example of the calculation procedure is described below. The calculation procedure is shown in FIG. 6.
- Step S202-1 The signal processing unit 17e rotates the scattered light vectors r i (kt,z) and r i ((k+1)t,z) streamed in step S201-1 by the phase rotation angle ⁇ i (kt,z) streamed in step S201-6, and calculates the rotated vectors R i (kt,z) and R i ((k+1)t,z).
- the calculation method can be exemplified as follows.
- R i (kt, z) exp(j ⁇ i (kt, z)) ⁇ r i (kt, z) (221-1)
- R i ((k+1)t, z) exp(j ⁇ i (kt, z)) ⁇ r i ((k+1)t, z) (221-2)
- phase rotation angle calculated using the same reference optical frequency is used to calculate the optical frequency average vectors R i ((k+1)t,z) and R i (kt,z).
- a phase rotation angle for rotating the scattered light vector r i ((k+1)t,z) may be calculated separately using the measurement data from time (k-W+1)t to time (k+W+1)t based on the reference optical frequency f ref (kt,z), and used in place of ⁇ i (kt,z) in (221-2).
- the method of calculating the phase rotation angle for rotating r i ((k+1)t,z) using the measurement data from time (k-W+1)t to time (k+W+1)t based on f ref (kt,z) is to keep the reference optical frequency at f ref (kt,z) in steps S201-2 to S201-6, and replace the measurement data to be calculated with the measurement data from time (k-W+1)t to time (k+W+1)t, instead of the measurement data from time (k-W)t to time (k+W)t.
- Step S202-2 The signal processing unit 17e calculates a vector obtained by frequency averaging the rotated vector R i (kt,z). Note that since the final result is the same whether it is vector averaging or vector synthesis (simple vector sum), in the actual calculation procedure, vector synthesis is performed to obtain the optical frequency average vector R avef (kt,z).
- the calculation method can be exemplified as follows.
- Step S202-3 The signal processing unit 17e calculates the angle ⁇ avef (kt,z) of the optical frequency average vector R avef (kt,z) and the angle ⁇ avef ((k+1)t,z) of the optical frequency average vector R avef ((k+1)t,z), and passes the change ⁇ avef ((k+1)t,z) - ⁇ avef (kt,z) to the downstream signal processing unit 17f.
- signal processing unit 17f uses the change in phase over time ⁇ avef ((k+1)t,z)- ⁇ avef (kt,z) obtained by signal processing unit 17e to calculate the spatial difference in phase between two points separated by the gauge length, and performs phase unwrapping processing, etc. to calculate a vibration waveform.
- a calculation method similar to that of a general DAS-P can be used.
- the length of the time window used to select the reference optical frequency is the same as the length of the time window used to update the optimal phase rotation angle used for frequency averaging.
- the present invention can be implemented in the same manner as this embodiment, as long as the gist of the present invention is not changed.
- the phase rotation angle ⁇ i ((k-W)t,z) can be used for frequency averaging at times (k-W+Delay)t and (k-W+Delay+1)t after time (k-W)t, depending on the memory requirements of the calculator, etc.
- the variable Delay is an integer reflecting the amount of delay.
- a phase rotation angle calculated using measurement data within a time window having a window length of 2W+1 can be used for frequency averaging at a time after the center time of the time window.
- Step S301-1 Calculate the scattered light vector r i (kt,z) from the signal I i (kt,z) and the signal Q i (kt,z).
- r i (kt, z) I i (kt, z)+j ⁇ Q i (kt, z) (311)
- the calculated scattered light vector r i (kt,z) data is continuously streamed to a signal processor 17e.
- Step S301-2 Calculate an index L i (kt,z) which is the sum of vector lengths
- X be a set of optical frequencies f i for which L i (kt,z) is greater than the threshold L T. It should be noted that since X depends on the position of the time window, sets X calculated using time windows centered on different times are not necessarily the same. In the following steps, an element of X is selected as the reference optical frequency, which is a feature of the present invention.
- the set value of the threshold L T depends on the required specifications of the measurement, but for example, the magnitude of the noise of the measuring device can be set as the threshold L T.
- Step S301-4 For the scattered light vectors from time (k-2W)t to kt, rotate the scattered light vector r i (kt,z) of each optical frequency f i by a phase rotation angle - ⁇ x (kt,z) when each optical frequency f x is the reference optical frequency, to calculate r i _rot,x (kt,z). For example, it can be calculated as follows.
- r i_rot, x (kt, z) exp [-j ⁇ x (kt, z)] ⁇ r i (kt, z) (314)
- i and x (i, x) only optical frequencies belonging to set X are calculated for x, and all possible cases are calculated for i.
- Step S301-5 For data from (k-2W)t to kt , calculate the time-averaged vector r i _ avet,x ((k-W)t,z) by adding r i _ rot,x when the reference optical frequency is f x.
- the calculation formula can be exemplified as follows.
- Step S301-6 Calculate the phase rotation angle ⁇ i, x ((k ⁇ W)t,z) of each optical frequency f i when each optical frequency f x is the reference optical frequency from the time-averaged vector r i _avet, x ( (k ⁇ W)t,z), and stream it to the signal processing unit 17 e.
- FIG. 8 shows a flowchart of the process executed by the signal processors 17e, 17f, and 17g.
- the signal processing unit 17e rotates and averages the scattered light vector r i of each optical frequency f i using the phase rotation angle ⁇ i,x calculated by the signal processing unit 17d to calculate an optical frequency average vector.
- the calculation is performed for the reference optical frequency f x selected according to the procedure of the present invention. Specifically, the procedure includes the following steps.
- Step S302-1 The scattered light vectors r i (kt,z) and r i ((k+1)t,z) streamed in step S301-1 are rotated by the phase rotation angle ⁇ i,x (kt,z) streamed in step S301-6 to calculate the rotated vector R i,x (kt,z) when the reference light frequency is f x .
- the calculation method can be exemplified as follows.
- R i,x (kt, z) exp(j ⁇ i,x (kt, z)) ⁇ r i (kt, z) (321-1)
- R i,x ((k+1)t,z) exp(j ⁇ i,x (kt,z)) ⁇ ri ((k+1)t,z) (321-2)
- phase rotation angle calculated using the same reference optical frequency f x is used for the calculation of R i,x ((k+1)t,z) and R i,x (kt,z)
- a phase rotation angle for rotating r i ,x ((k+1)t,z) may be calculated separately using the measurement data from time (k-W+1)t to time (k+W+1)t based on f x and used in place of ⁇ i,x (kt,z) in equation (321-2).
- the method for calculating the phase rotation angle for rotating r i,x ((k+1)t,z) using the measurement data from time (k-W+1)t to time (k+W+1)t based on f x may be the same as the method described in Prior Application 3.
- Step S302-2 Calculate a vector obtained by averaging the frequency of the rotated vector R i,x (kt,z). Note that since the final result is the same whether it is vector averaging or vector synthesis (simple vector sum), in the actual calculation procedure, vector synthesis is performed to obtain the optical frequency average vector R avef,x (kt,z).
- the calculation method can be exemplified as follows.
- Step S302-3 Calculate the angle ⁇ avef ,x (kt,z) of the optical frequency average vector R avef, x (kt,z) and the angle ⁇ avef,x ((k+1)t,z) of the optical frequency average vector R avef,x ( (k+1)t,z) when the reference optical frequency is f x, and transfer the change over time ⁇ avef,x ((k+1)t,z) - ⁇ avef,x (kt,z) to the signal processing unit 17f.
- the following is an example of a method for calculating the angle ⁇ avef .
- Each optical frequency belonging to the set X is calculated as a reference optical frequency fx .
- Step S303 The signal processing unit 17f calculates the difference in phase between two points separated by a gauge length using the time change ⁇ avef ,x ((k+1)t,z) - ⁇ avef,x (kt,z) of the angle ⁇ avef,x of the reference optical frequency f x. If the magnitude exceeds ⁇ , an integer multiple of 2 ⁇ is added to correct the magnitude to be equal to or less than ⁇ . This operation corresponds to phase unwrapping.
- Step S304 The signal processing unit 17g averages the change over time ⁇ x ((k+1)t,z) - ⁇ x (kt,z) for x to calculate the change over time ⁇ ((k+1)t,z) - ⁇ (kt,z) of the final vibration waveform ⁇ (kt,z).
- the change over time is cumulatively added to obtain the final vibration waveform ⁇ (kt,z).
- the offset value at the start time of the cumulative addition can be set in the same way as the offset setting for vibration waveforms in a general phase OTDR.
- the signal processing unit 17f and the signal processing unit 17g perform calculations based on the change in angle ⁇ avef,x and the vibration waveform ⁇ x over time.
- both the angle ⁇ avef,x ( kt,z) and the angle ⁇ avef,x ((k+1)t,z) are calculated using the phase rotation angle ⁇ i,x (kt,z).
- Step S401-4 Using the time-average vector r i _rot,x (kt,z) when the reference optical frequency is f x , calculated using data from time (k-2W-1)t to time (k-1)t, r i _rot, x ((k-2W-1)t,z) at time (k-2W-1)t, and r i _rot,x (kt,z) at time kt, calculate the time-average vector r i _avet,x ((k-W)t,z) when the reference optical frequency is f x .
- the calculation formula can be exemplified as follows.
- r i_avet,x ((k-W)t,z) r i_avet,x ((k-W-1)t,z) -r i_rot,x ((k-2W-1)t,z)+r i_rot,x (kt,z) (414)
- a preliminary measurement is performed, or the time-averaged vector is calculated using the conventional technique 1.
- r i_avet, x (Wt, z) 416
- Steps S401-5 and S401-6 From the time-averaged vector r i_avet,x ((k ⁇ W)t,z), calculate the phase rotation angle ⁇ i,x ((k ⁇ W)t,z) of each optical frequency f i when each optical frequency f x is the reference optical frequency for all possible (i, x), and stream the result to the signal processing unit 17 e.
- the vibration waveforms that have been subjected to the phase unwrapping process are averaged in the processing by the signal processing units 17f and 17g.
- the order of the specific calculation steps can be changed within the scope that does not impair the essence of the present invention, for example, by carrying out averaging before carrying out the phase unwrapping process and then carrying out the phase unwrapping process.
- the length of the time window used to select the reference optical frequency is the same as the length of the time window used to update the optimal phase rotation angle used for frequency averaging.
- the present invention can be implemented in the same manner as this embodiment, as long as the gist of the present invention is not changed.
- this embodiment describes a specific implementation procedure for applying the present invention when prior application invention 3 is implemented based on prior application invention 2.
- prior application invention 3 is not limited to being based on prior application invention 2, and can be widely applied to cases where prior application invention 1 or other methods of averaging frequency multiplexed signals in a vector state are used as a base, and the present invention can be applied to each of these calculation methods.
- the signal processing device of the present disclosure can also be realized by a computer and a program, and the program can be recorded on a recording medium or provided via a network.
- the program of the present disclosure is a program for realizing a computer as each functional unit of the signal processing device of the present disclosure, and is a program for causing a computer to execute each step of the method executed by the signal processing device of the present disclosure.
- CW light source 2 Coupler 3: Optical modulator 4: Optical pulse 5: Circulator 6: Optical fiber to be measured 7: 90 degree optical hybrid 13, 14: Balance detector 15, 16: Electrical signal 17: Signal processing device 17a, 17b: AD conversion function element 17c, 17d, 17e, 17f, 17g: Signal processing unit 31: Measuring device
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Measurement Of Mechanical Vibrations Or Ultrasonic Waves (AREA)
Abstract
Description
本発明は、被測定光ファイバの各地点からの散乱光信号の位相を測定する位相OTDR(Optical Time Domain Reflectometer)に関する。 The present invention relates to a phase OTDR (Optical Time Domain Reflectometer) that measures the phase of scattered light signals from each point in a measured optical fiber.
光ファイバに加わった物理的な振動を、光ファイバ長手方向に分布的に計測する手段として、被測定光ファイバにパルス試験光を入射し、レイリー散乱による後方散乱光を検出するDAS(Distributed Acoustic Sensing)と呼ばれる手法が知られている(非特許文献1)。 As a means of measuring the physical vibrations applied to an optical fiber in a distributed manner along the length of the optical fiber, a method known as Distributed Acoustic Sensing (DAS) is known in which a pulsed test light is injected into the optical fiber under test and backscattered light due to Rayleigh scattering is detected (Non-Patent Document 1).
被測定光ファイバの各地点からの散乱光信号の位相を測定し、位相の時間変化を測定する手法であるDAS-P(DAS-phase)がある。DAS-Pは、振動による光ファイバの光路長変化に対して位相が線形に変化し、その変化率も光ファイバ長手方向の各地点でおよそ同一とみなせるため、振動の定量的な測定が可能となり、被測定光ファイバに加わった振動波形を忠実に再現することができる(例えば非特許文献2)。 There is a method called DAS-P (DAS-phase) that measures the phase of the scattered light signal from each point of the optical fiber under test and measures the change in phase over time. With DAS-P, the phase changes linearly with respect to the change in the optical path length of the optical fiber due to vibration, and the rate of change can be considered to be approximately the same at each point along the optical fiber's length, making it possible to quantitatively measure vibration and faithfully reproduce the vibration waveform applied to the optical fiber under test (for example, Non-Patent Document 2).
単一周波数のパルスを用いたDAS-Pでは、パルス幅内の散乱光同士の干渉効果により、散乱光強度が小さい地点が発生し、感度の劣化が生じる。感度の劣化を防ぐ方法として、周波数多重を行い、異なる周波数で信号を平均する方法がある(特許文献1)。以降特許文献1に開示された方法を従来技術1とする。従来技術1は、異なる周波数では散乱光強度が小さくなる地点が変化することを利用している。
In DAS-P, which uses a single-frequency pulse, interference between scattered lights within the pulse width creates points where the scattered light intensity is low, resulting in a deterioration of sensitivity. One method of preventing this deterioration in sensitivity is to perform frequency multiplexing and average the signals at different frequencies (Patent Document 1). Hereinafter, the method disclosed in
従来技術1では効率的な平均方法として具体的に以下の散乱光ベクトル状態での平均を行う。
手順S01:測定した複数の時刻のデータを使用して、多重した周波数成分の内基準として選んだ周波数成分(以下、「基準光周波数」と称する。)の散乱光ベクトルと、その他周波数成分の散乱光ベクトルとの、位相オフセット値の違いを計算する。計算した位相オフセット値の違いを用いて、各光周波数の位相オフセットを補正するための位相回転角度を計算する。
手順S02:各時刻における各周波数成分の散乱光ベクトルを前記位相回転角度だけ回転させた上で、異なる光周波数の回転後の散乱光ベクトルを平均することで光周波数平均ベクトルを計算し、光周波数平均ベクトルの角度変化を計算する。
手順S03:前記角度変化を用いて、ゲージ長だけ離れた2点の位相の差分を計算し、位相接続処理などを行い、振動波形を計算する。
In the
Step S01: Using measured data at multiple times, calculate the difference in phase offset value between the scattered light vector of a frequency component selected as an internal reference of the multiplexed frequency components (hereinafter referred to as the "reference light frequency") and the scattered light vectors of the other frequency components. Using the calculated difference in phase offset value, calculate the phase rotation angle for correcting the phase offset of each light frequency.
Step S02: The scattered light vector of each frequency component at each time is rotated by the phase rotation angle, and then the scattered light vectors after rotation of different optical frequencies are averaged to calculate an optical frequency average vector, and the angular change of the optical frequency average vector is calculated.
Step S03: Using the angle change, the phase difference between two points separated by the gauge length is calculated, and a phase unwrapping process is performed to calculate a vibration waveform.
特に手順S01の詳細は以下の具体的な手順を行う。ただし、振動のサンプリング間隔をtとして、測定時刻0から(M-1)t(Mは自然数)のM点の測定データを使用するとして、各時刻mt(mは0から(M-1)の整数)における前記基準光周波数(f1とおく)の散乱光ベクトルをr1(mt,z)(光ファイバ位置に依存するため入射端からの距離zに依存)として、その他各光周波数fi(iは2からNまでの整数でNは周波数多重数を表す)の散乱光ベクトルをri(mt,z)とする。従来技術1では、基準光周波数は任意に設定できる。
In particular, the details of step S01 are as follows: where t is the sampling interval of vibration, M points of measurement data from measurement time 0 to (M-1)t (M is a natural number) are used, the scattered light vector of the reference optical frequency (let it be f 1 ) at each time mt (m is an integer from 0 to (M-1)) is r 1 (mt, z) (dependent on the distance z from the input end since it depends on the optical fiber position), and the scattered light vector of each other optical frequency f i (i is an integer from 2 to N, N represents the number of frequency multiplexing) is r i (mt, z). In
手順S01-1:各時刻・各光ファイバ地点における基準光周波数の散乱光ベクトルr1(mt,z)の角度θ1(mt,z)を計算する。散乱光ベクトルr1(mt,z)を、複素平面上の複素ベクトル、つまり複素数だと考えれば、角度θ1(mt,z)はarg[r1(mt,z)]で計算できる。ここでargは複素数の偏角を与える演算子である。 Step S01-1: Calculate the angle θ 1 (mt,z) of the scattered light vector r 1 (mt,z) of the reference light frequency at each time and each optical fiber point. If the scattered light vector r 1 (mt,z) is considered to be a complex vector on the complex plane, that is, a complex number, the angle θ 1 (mt,z) can be calculated by arg[r 1 (mt,z)], where arg is an operator that gives the argument of a complex number.
手順S01-2:各時刻・各光ファイバ地点における各光周波数の散乱光ベクトルri(mt,z)を角度-θ1(mt,z)だけ回転させ、ri_rot(mz,t)とする。散乱光ベクトルri(mt,z)を、複素平面上の複素ベクトルとすれば、回転後のベクトルri_rot(mz,t)はexp[-θ1(mt,z)]×ri(mt,z)と計算できる。 Step S01-2: Rotate the scattered light vector r i (mt,z) of each optical frequency at each time and each optical fiber point by an angle -θ 1 (mt,z) to obtain r i _rot (mz,t). If the scattered light vector r i (mt,z) is a complex vector on a complex plane, the rotated vector r i _rot (mz,t) can be calculated as exp[-θ 1 (mt,z)] × r i (mt,z).
手順S01-3:各光ファイバ地点における各光周波数の散乱光ベクトルを回転した後のベクトルri_rot(mt,z)を、使用する測定データであるmが0から(M-1)のM点分平均し、時間平均ベクトルri_avet(z)を計算する。実際の計算においてはM点分のベクトル平均ではなくてベクトル合計でも良い。どちらを使用しても引き続く処理で同一の結果が得られる。 Step S01-3: After rotating the scattered light vector of each optical frequency at each optical fiber point, the vector r i _ rot (mt, z) is averaged over M points, where m is the measurement data used, from 0 to (M-1), to calculate the time-averaged vector r i _ avet (z). In actual calculations, vector summation may be used instead of the vector average over M points. Regardless of which method is used, the same results will be obtained in subsequent processing.
手順S01-4:各光ファイバ地点における各光周波数の散乱光ベクトルを前記手順S02で回転させる際の位相回転角度αi(z)を、前記時間平均ベクトルの角度を用いて-arg[ri_avet(z)]と計算する。+arg[ri_avet(z)]の値が位相オフセット値の違いとなるので、-arg[ri_avet(z)]だけ回転させることで、位相オフセットの違いを補正することが可能である。 Step S01-4: Calculate the phase rotation angle α i (z) when rotating the scattered light vector of each optical frequency at each optical fiber point in step S02 as −arg[r i _ avet (z)] using the angle of the time-averaged vector. Since the value of +arg[r i _ avet (z)] is the difference in phase offset value, it is possible to correct the difference in phase offset by rotating by −arg[r i _ avet (z)].
手順S01-4で与えられる位相回転角度αi(z)は手順S01-3までの手順により時間平均を行っていることから雑音が効率的に低減された値となっており、その位相回転角度αi(z)を用いて手順S02で光周波数平均ベクトルを計算することにより、最終的な振動波形のSN比が向上し、波形歪みを抑えることができる。 The phase rotation angle α i (z) given in step S01-4 is a value in which noise has been efficiently reduced due to the time averaging performed by the steps up to step S01-3. By using this phase rotation angle α i (z) to calculate the optical frequency average vector in step S02, the signal-to-noise ratio of the final vibration waveform is improved and waveform distortion can be suppressed.
従来技術1の手順S01では測定時刻0から(M-1)t(Mは自然数)のM点の測定データを使用して各光周波数の位相回転角度を計算し、計算した位相回転角度を使用して手順S02で測定時刻0から(M-1)t(Mは自然数)のM点の測定データおよびその他の時刻の測定データに対して周波数平均を行う。
In step S01 of
従来技術1の手順S01の方法で計算する位相回転角度の最適値は、レーザの発振周波数などの光学特性の時間的な変化や被測定光ファイバ自体の温度変化、大きな動的歪みの被測定光ファイバへの印加などにより時間的に変動する。したがって、長時間での分布振動測定においては、位相回転角度の最適値を連続的に更新し、手順S02以降の処理を行う必要がある。しかし、従来技術1においては、位相回転角度の最適値を連続的に更新しながら手順S02以降の処理を行う方法は示されていない。
The optimal value of the phase rotation angle calculated by the method of step S01 in
この問題については、先願1(PCT/JP2022/34477)にて対策が提案されている。先願1に記載の方法では位相回転角度の最適値を連続的に更新しながら手順S02以降の処理を行う。以降、先願1に記載の手法を先願発明1とする。先願発明1を用いれば、前記位相回転角度の最適値の変化に対応できる。
A solution to this problem has been proposed in Prior Application 1 (PCT/JP2022/34477). In the method described in
しかし、先願発明1では、位相回転角度を時間長がMt(Mは自然数でデータポイント数に対応)のブロックごとに計算して更新するため、位相回転角度の値は、隣のブロックに移動する度に不連続に変化する。したがって、隣のブロックに切り替わる測定データ点の間で、最終的な振動波形も不連続に変化する現象が観測される。例えば、ブロックKの最後の測定データ点である時刻(MK-1)tと、ブロックK+1の最初の測定データ点である時刻MKtとの間で、振動波形が不連続に変化する現象が生じる。
However, in
この対策として、先願2(PCT/JP2023/4382)に記載の方法(先願発明2)では、異なる周波数成分の散乱光ベクトルの平均に用いる位相回転角度の不連続な変化を取り除くため、予め信号処理に用いる窓長Mt(Mは自然数でデータポイント数に対応)の時間窓を設定した上で、時間窓を動かしながら、時間窓内に含まれる測定データを用いて位相回転角度を計算していき、その位相回転角度を使用して、時間窓の中心、あるいは、予め設定した測定データ数分だけ後方に位置する時刻における周波数成分の散乱光ベクトルの平均を行っていく。時間窓を動かしながら位相回転角度を計算するのは、広義の移動平均であり、前記不連続な変化の含まれない、滑らかに変化する位相回転角度を取得することが可能である。滑らかに変化する位相回転角度を使用することにより、振動波形の不連続な変化を取り除くことができる。 As a countermeasure to this, in the method (prior application invention 2) described in prior application 2 (PCT/JP2023/4382), in order to remove discontinuous changes in the phase rotation angle used to average the scattered light vectors of different frequency components, a time window of window length Mt (M is a natural number corresponding to the number of data points) used in signal processing is set in advance, and the phase rotation angle is calculated using the measurement data contained in the time window while moving the time window, and this phase rotation angle is used to average the scattered light vectors of the frequency components at the center of the time window or at a time that is a preset number of measurement data points behind. Calculating the phase rotation angle while moving the time window is a moving average in a broad sense, and it is possible to obtain a smoothly changing phase rotation angle that does not include the discontinuous changes. By using a smoothly changing phase rotation angle, discontinuous changes in the vibration waveform can be removed.
従来技術1、先願発明1、先願発明2ではいずれも、異なる光周波数の散乱光ベクトルを平均する際に、ある任意の光周波数を基準として、その基準光周波数とは異なる光周波数の散乱光ベクトルを回転させた後に、異なる光周波数の散乱光ベクトルを平均する。特に先願発明1や先願発明2は、基準光周波数とは異なる光周波数の散乱光ベクトルの位相オフセットと基準光周波数の散乱光ベクトルの位相オフセットの違いが、大きな振動や温度変化等が発生すると時間的に変化することに着目し、位相回転角度をその変化に合わせて更新することで、測定時間全体で高感度な位相計算を可能としている。
In
つまり、先願発明1や先願発明2において位相回転角度の更新を通して最終的に得られる振動波形は、大きな振動や温度変化などが起きた場合でも、選定した基準光周波数やそれ以外の光周波数のどれか一つのみの信号を用いて得られる振動波形に対して、位相雑音が抑えられ、雑音起因の位相接続誤りの影響も減少する。
In other words, the vibration waveform finally obtained by updating the phase rotation angle in
しかし、雑音の影響を除けば、最終的に得られる振動波形は基準光周波数の振動波形に追随することになるため、雑音起因ではない振動波形歪みについては、基準光周波数の振動波形歪みがそのまま残ることになり、先願発明1や先願発明2では効果的には抑えられない。雑音起因ではない振動波形歪みには、光ファイバ中にランダムに分布しているレイリー散乱体からの散乱光同士の干渉効果による振動波形歪みなどが主に含まれ、装置構成の改善などで取り除くことは困難である。したがって、先願発明1や先願発明2では光ファイバに生じた振動を忠実に測定できないという問題が生じる。
However, if the effects of noise are removed, the final vibration waveform will follow the vibration waveform of the reference optical frequency, and therefore vibration waveform distortion not caused by noise will remain the vibration waveform distortion of the reference optical frequency, and cannot be effectively suppressed by
この対策として、先願3(PCT/JP2023/11104)に記載の方法(先願発明3)では、多重した光周波数のそれぞれを基準光周波数に選んで先願発明1や先願発明2の方法により振動波形を計算し、計算して得られた多重数分の波形を平均することで最終的な振動波形とする。多重した光周波数のそれぞれを基準光周波数に選んだ際に得られる振動波形の前記振動波形歪みは、基準光周波数に選ばれた光周波数単体を用いた場合の波形歪みに対応するため、基準光周波数を入れ替えて平均することで、前記振動波形歪みを低減することができる。
As a countermeasure to this, in the method (prior invention 3) described in prior application 3 (PCT/JP2023/11104), each of the multiplexed optical frequencies is selected as a reference optical frequency, an oscillatory waveform is calculated using the method of
しかし、先願発明1や先願発明2や先願発明3の方法では、従来技術1とは異なり、手順S02以降で用いる前記位相回転角度を更新するため、測定雑音による位相回転角度の時間的な揺らぎの影響を受ける。先願発明1や先願発明2では基準光周波数を光ファイバ上各地点で一つ選定するが、選定した基準光周波数の光強度が小さい場合には、位相回転角度の推定精度が劣化する。先願発明1や先願発明2でも窓長Mt内で時間平均を行い位相回転角度の推定精度を高める工夫はなされているが、位相回転角度の推定精度の劣化を完全に取り除くことはできない。したがって、基準光周波数以外の光周波数の光強度が同一の場合を仮定すると、選定した基準光周波数の光強度が小さいほど、位相回転角度の時間変化に含まれる雑音起因の揺らぎが大きくなる。
However, unlike
大きい揺らぎが含まれる位相回転角度を使用して基準光周波数以外の光周波数の散乱光ベクトルを回転させると、回転後の散乱光ベクトルの向きも、雑音の影響がない理想的な散乱光ベクトルの向きに対して、大きく揺らぐことになる。向きが揺らいだ散乱光ベクトルを、光強度が小さい(つまりベクトル長が短い)基準光周波数の散乱光ベクトルに加算して、光周波数平均ベクトルを計算するため、光周波数平均ベクトルの向きも大きく揺らぐ。したがって、光周波数平均ベクトルの角度に基づいて計算される振動波形にも、この揺らぎの影響が反映され、振動波形歪みが生じる。先願発明3では、多重した光周波数それぞれを基準光周波数に選んだ際の振動波形を計算して平均しているため、光強度が小さい基準光周波数を選んだ場合の振動波形も平均に含まれており、位相回転角度の時間的な揺らぎの影響を同様にして受ける。
When a scattered light vector of an optical frequency other than the reference optical frequency is rotated using a phase rotation angle that includes large fluctuations, the orientation of the scattered light vector after rotation also fluctuates significantly with respect to the orientation of an ideal scattered light vector that is not affected by noise. The scattered light vector with a fluctuating orientation is added to the scattered light vector of a reference optical frequency with low optical intensity (i.e., short vector length) to calculate the optical frequency average vector, so the orientation of the optical frequency average vector also fluctuates significantly. Therefore, the influence of this fluctuation is reflected in the vibration waveform calculated based on the angle of the optical frequency average vector, resulting in vibration waveform distortion. In the
本発明は、周波数多重した散乱光信号の平均に用いる位相回転角度の雑音起因の揺らぎの影響による振動波形歪みを低減することを目的とする。 The present invention aims to reduce vibration waveform distortion caused by noise-induced fluctuations in the phase rotation angle used to average frequency-multiplexed scattered light signals.
本発明の位相OTDRシステムは、周波数多重された光パルスが光ファイバで反射又は散乱された散乱光信号を測定する測定装置と、前記測定装置で測定された散乱光信号を用いて前記光ファイバにおける振動波形を計算する信号処理装置と、を備える。本発明の信号処理装置は、前記複数の光周波数の散乱光信号から、前記位相回転角度の揺らぎによる振動波形歪みを低減した最終的な振動波形を生成するための、信号処理方法を実行する。 The phase OTDR system of the present invention comprises a measurement device that measures scattered light signals resulting from reflection or scattering of frequency-multiplexed optical pulses in an optical fiber, and a signal processing device that calculates a vibration waveform in the optical fiber using the scattered light signals measured by the measurement device. The signal processing device of the present invention executes a signal processing method for generating a final vibration waveform from the scattered light signals of the multiple optical frequencies, in which vibration waveform distortion due to fluctuations in the phase rotation angle is reduced.
本発明の信号処理装置は、周波数多重されている複数の光周波数のなかから基準光周波数を選択し、前記複数の光周波数の測定データで得られる散乱光ベクトルのうちの該基準光周波数を基準として他の光周波数の散乱光ベクトルを回転させた後に、前記複数の光周波数の散乱光ベクトルの平均化を行う機能部を備え、
前記機能部は、前記基準光周波数の選択において、前記散乱光の強度がより大きい光周波数を時間的に追跡して動的に選択する。
The signal processing device of the present invention comprises a functional unit which selects a reference optical frequency from a plurality of frequency-multiplexed optical frequencies, rotates scattered light vectors of other optical frequencies among scattered light vectors obtained from measurement data of the plurality of optical frequencies using the reference optical frequency as a reference, and then averages the scattered light vectors of the plurality of optical frequencies;
In selecting the reference light frequency, the functional unit dynamically selects the reference light frequency by tracking over time the light frequency at which the intensity of the scattered light is greater.
また前記機能部は、選択された前記基準光周波数の散乱光ベクトルを用いて、異なる時刻の前記複数の光周波数の散乱光ベクトルの平均化を行い、前記平均化によって得られた異なる時刻の光周波数平均ベクトルの間の変化分に基づいて信号処理を行う。これにより、本発明の信号処理装置は、前記機能部を備え、前記平均化によって得られた光周波数平均ベクトルの角度変化に基づき、振動波形を取得する。 The functional unit also averages the scattered light vectors of the multiple optical frequencies at different times using the scattered light vector of the selected reference optical frequency, and performs signal processing based on the change between the optical frequency average vectors at different times obtained by the averaging. As a result, the signal processing device of the present invention includes the functional unit and obtains a vibration waveform based on the angle change of the optical frequency average vector obtained by the averaging.
ここで、本発明の信号処理装置は、前記基準光周波数を選定する際に、散乱光強度が小さくベクトル長が短い光周波数については基準光周波数の選定から除外し、散乱光強度が大きくベクトル長が長い光周波数のみ基準光周波数の選定に含める選択則を設ける。散乱光強度は時間的に変動するため、基準光周波数の選定に除外するか含めるかの選択は、ファイバ上の各地点で時間軸に沿って必要に応じて動的に更新する。 The signal processing device of the present invention provides a selection rule whereby, when selecting the reference optical frequency, optical frequencies with low scattered light intensity and short vector length are excluded from the selection of the reference optical frequency, and only optical frequencies with high scattered light intensity and long vector length are included in the selection of the reference optical frequency. Since the scattered light intensity varies over time, the selection of whether to exclude or include a frequency in the selection of the reference optical frequency is dynamically updated as necessary along the time axis at each point on the fiber.
具体的には、ファイバ上の各地点で基準光周波数を一つ選ぶ手法に本発明を適用する場合には、測定される散乱光強度が一番大きい光周波数を基準光周波数として動的に選定する。例えば先願発明1や先願発明2に本発明を適用する場合などがこれに該当する。ファイバ上の各地点で基準光周波数を複数選んで処理する手法に本発明を適用する場合には、測定器雑音の大きさを基準とした閾値を設定して、その閾値以上となる光周波数のみ基準光周波数の動的な選定に含めるなどの選択則を設ける。先願発明3に本発明を適用する場合などがこれに該当する。
Specifically, when the present invention is applied to a method of selecting one reference optical frequency at each point on a fiber, the optical frequency with the greatest measured scattered light intensity is dynamically selected as the reference optical frequency. For example, this corresponds to the case where the present invention is applied to
例えば、先願発明1や先願発明2のように、前記機能部は、前記複数の光周波数の散乱光ベクトルの平均化を、予め定められた時間窓に含まれる散乱光ベクトルで行ってもよい。このとき、前記基準光周波数の選択が、前記時間窓内に含まれる散乱光ベクトルにおいて行われてもよい。
For example, as in
例えば、先願発明3のように、前記機能部は、予め定められた時間窓に含まれる前記複数の光周波数のうちの2以上の光周波数を基準に用いて、前記複数の光周波数の散乱光ベクトルの平均化を行ってもよい。このとき、前記基準光周波数の選択が、前記時間窓内に含まれる散乱光ベクトルにおいて行われてもよい。
For example, as in
本発明は、前記基準光周波数を選定する際に、散乱光の強度がより大きい光周波数を選択するため、散乱光強度が小さい光周波数を基準光周波数の選定から除外することができる。これにより、本発明は、周波数多重した散乱光信号の平均に用いる位相回転角度の雑音起因の揺らぎの影響による振動波形歪みを低減することができる。 In the present invention, when selecting the reference optical frequency, an optical frequency with a greater scattered light intensity is selected, so that optical frequencies with a smaller scattered light intensity can be excluded from the selection of the reference optical frequency. As a result, the present invention can reduce vibration waveform distortion caused by noise-induced fluctuations in the phase rotation angle used to average the frequency-multiplexed scattered light signal.
以下、本発明の実施形態について、図面を参照しながら詳細に説明する。なお、本開示は、以下に示す実施形態に限定されるものではない。これらの実施の例は例示に過ぎず、本開示は当業者の知識に基づいて種々の変更、改良を施した形態で実施することができる。なお、本明細書及び図面において符号が同じ構成要素は、相互に同一のものを示すものとする。 Below, an embodiment of the present invention will be described in detail with reference to the drawings. Note that the present disclosure is not limited to the embodiment shown below. These implementation examples are merely illustrative, and the present disclosure can be implemented in various forms with various modifications and improvements based on the knowledge of those skilled in the art. Note that components with the same reference numerals in this specification and drawings are mutually identical.
(システム構成)
図1に本発明での測定システムの構成例を示す。本発明の測定システムは、測定装置31と、信号処理装置17と、を備える。測定装置31は、被測定光ファイバ6の各地点からの散乱光の位相を測定する位相OTDRである。本実施形態の位相OTDRは、周波数多重を用いて、互いに異なる複数の光周波数における位相を測定する。本実施形態では、位相OTDRが同相成分と直交成分を出力し、信号処理装置17がこれらを用いて位相を表す散乱光ベクトル信号を計算し、散乱光ベクトル信号を用いて振動波形を計算する。具体的には以下の構成を備える。
(System Configuration)
1 shows an example of the configuration of a measurement system according to the present invention. The measurement system according to the present invention comprises a
CW光源1から光周波数がf0の単一波長の連続光が射出され、カプラ2により参照光とプローブ光に分岐される。プローブ光は、光変調器3によって、図2に示す光パルス4のように整形される。光パルス4は、光周波数がfi=f0+Δfi(iは整数)かつパルス幅が光ファイバ長手方向での測定の空間分解能に対応する値Pに設定されたパルスが、i=1,2,…,N(Nは整数で周波数多重を表す)だけ並んだ構成となっている。fiは、各時刻・各地点における散乱光の強度が、異なるi同士で無相関とみなせる程度まで十分に離れているように選択をする。パルス幅Pが空間分解能に対応する。
A continuous light with a single wavelength and an optical frequency of f0 is emitted from a CW
光変調器3の種類は光パルス4を生成できるならば具体的な指定はなく、数が複数の場合もある。例えば、SSB(Single Side Band amplitude modulation)変調器や周波数可変なAO(Acousto-Optics)変調器などを用いても良いし、パルス化における消光比を大きくするためにさらに半導体光増幅器(SOA:Semiconductor Optical Amplifier)などによる強度変調を行っても良い。
There is no specific specification for the type of
パルス化されたプローブ光4は、サーキュレータ5を介して、被測定光ファイバ6に入射される。被測定光ファイバ6の長手方向の各地点で散乱又は反射された光が、後方散乱光としてサーキュレータ5に戻り、光90度ハイブリッド7の一方の入力端子に入射される。カプラ2により分岐された参照光は、光90度ハイブリッド7のもう一方の入力端子に入射される。
The
光90度ハイブリッドの内部構成は、光90度ハイブリッドの機能さえ備えていれば、なんでもよい。光90度ハイブリッドの4つの出力の内、2つの出力がバランス検出器13によって検出され、アナログの同相成分Ianalogである電気信号15を取得する。光90度ハイブリッドの残り2つの出力がバランス検出器14によって検出され、アナログの直交成分Qanalogである電気信号16を取得する。電気信号15と電気信号16は、信号の周波数帯域をエイリアシングなくサンプリングが可能なAD変換機能素子17aとAD変換機能素子17bを備えた信号処理装置17に送られる。
The internal configuration of the optical 90-degree hybrid may be any as long as it has the function of an optical 90-degree hybrid. Two of the four outputs of the optical 90-degree hybrid are detected by a
図3に信号処理装置17の構成例を示す。信号処理装置17は、周波数多重された光パルスが光ファイバで反射又は散乱された散乱光の測定データを用いて振動波形を計算する装置である。具体的には、信号処理装置17は、信号処理装置17は、AD変換機能素子17a及び17b、信号処理部17c、17d、17e、17f、17gを備える。
FIG. 3 shows an example of the configuration of the
信号処置装置17では、AD変換機能素子17aとAD変換機能素子17bから出力されたデジタル化された同相成分の信号Idigitalと直交成分の信号Qdigitalの信号に対して、信号処理部17cによって光パルス4を構成する各光周波数fi(i=1,2,…,N)のパルスによる散乱光による信号Iiと信号Qiを分離する。分離する信号処理の方法に具体的な制約はないが、例えばIdigitalとQdigitalを中心周波数がΔfiであり通過帯域が2/Pであるデジタルバンドパスフィルタに通した上で位相遅延を補償するなどが考えられる。使用する計算機のメモリサイズなどを考慮して、デジタルバンドパスフィルタのフィルタ特性を測定データがストリーミング処理可能な仕様に設定しておけば、信号処理部17cまでは測定データはストリーミング処理される。
In the
信号処理部17dと信号処理部17eと信号処理部17fと信号処理部17gが引き続き位相計算を行う。信号処理部17dは手順S01を実行する機能部であり、信号処理部17eは手順S02を実行する機能部であり、信号処理部17f及び17gは手順S03を実行する機能部である。
具体的には、信号処理部17dは、周波数多重されている複数の光周波数のなかから基準光周波数を選択し、前記複数の光周波数の測定データで得られる散乱光ベクトルのうちの該基準光周波数を基準として他の光周波数の散乱光ベクトルの位相回転角度を計算する機能部である。
信号処理部17eは、前記位相回転角度を回転させた後に、前記複数の光周波数の散乱光ベクトルの平均化を行うことで光周波数平均ベクトルを計算し、光周波数平均ベクトルの角度変化を計算する機能部である。
信号処理部17f及び17gは、前記角度変化を用いて、ゲージ長だけ離れた2点の位相の差分を計算し、位相接続処理などを行い、振動波形を計算する機能部である。
Specifically, the
The
The
本開示では、散乱光強度が小さい光周波数を基準光周波数の選定から除外するために、前記基準光周波数の選択において、前記散乱光の強度がより大きい光周波数を時間的に追跡して動的に選択する。本発明を用いれば、大きな振動等を高感度に測定ができるという位相回転角度を更新することで得られる特徴を維持しつつ、散乱光強度が小さい光周波数を基準光周波数の選定から除外することで、測定器雑音由来の位相回転角度の角度揺らぎの影響による振動波形歪みの低減ができ、より正確な振動波形の測定が可能となる。 In the present disclosure, in order to exclude optical frequencies with low scattered light intensity from the selection of the reference optical frequency, optical frequencies with higher scattered light intensity are tracked over time and dynamically selected in the selection of the reference optical frequency. By using the present invention, it is possible to reduce vibration waveform distortion caused by the influence of angular fluctuations in the phase rotation angle resulting from measurement instrument noise, by excluding optical frequencies with low scattered light intensity from the selection of the reference optical frequency while maintaining the characteristic obtained by updating the phase rotation angle that large vibrations, etc. can be measured with high sensitivity, and it becomes possible to measure the vibration waveform more accurately.
以下、パルスの入射間隔、つまり振動のサンプリングレートをtとし、整数kを用いて時刻ktで信号処置装置17が測定データを取得しているとする。また、プローブ光4が入射された被測定光ファイバ6の入射端からの距離をzとする。つまり、信号処理部17dには、信号Ii(kt,z)及び信号Qi(kt,z)が入力される。
Hereinafter, the pulse incidence interval, i.e., the vibration sampling rate, is defined as t, and the
(第1の実施形態)
本実施形態では、先願発明1に本発明を適用する例について説明する。先願発明1では位相回転角度の最適値を連続的に更新しながら手順S02以降の処理を行う。先願発明1に本発明を適用する場合の実施形態例を述べる。
(First embodiment)
In this embodiment, an example of applying the present invention to the
先願発明1でも、従来技術1と同様に、信号処理部17dは、散乱光ベクトルri(kt,z)から各光周波数fiの位相回転角度αi(z)を計算する。ただし、従来技術1と違い、先願発明1の信号処理部17dは、測定データを時間ポイント数 のブロックに区切り、測定時間Mtのブロック単位で位相回転角度を計算・更新する。
In the
すなわち、仮にk=0を測定データの1点目として、1点目から位相回転角度の計算を開始するとすれば、例えばkが0からM-1の散乱光ベクトルr1(kt,z)の測定データが一つ目のブロックとなり、kがMから2M-1が二つ目のブロックとなる。ブロックを区別する番号の記号としてKを用いる。例えば上記の例では、kが0からM-1はK=1のブロック、kがMから2M-1がK=2のブロックである。Kブロック目は、kがM(K-1)からMK-1の測定データである。各ブロックで位相回転角度を計算するため、ブロックKに応じて値は変化し、位相回転角度をαi(z,K)と表記する。それぞれのブロックでの位相回転角度αi(z,K)の計算方法は本発明も従来技術1の手順S01と同様に行うが、本発明では基準光周波数の選定のプロセスを追加する。
That is, if k=0 is the first point of the measurement data and the calculation of the phase rotation angle is started from the first point, for example, the measurement data of the scattered light vector r 1 (kt,z) where k is from 0 to M−1 is the first block, and where k is from M to 2M−1 is the second block. K is used as a number symbol to distinguish the blocks. For example, in the above example, k from 0 to M−1 is the block where K=1, and k from M to 2M−1 is the block where K=2. The Kth block is the measurement data where k is from M(K−1) to
Kブロック目の測定データの信号処理に関して、要点を以下に説明する。信号処理部17dのフローチャートを図4に示す。測定開始とともに、信号処理部17cで得られた測定データが、信号処理部17dへ送られてくる。
The main points regarding the signal processing of the measurement data of the Kth block are explained below. A flowchart of the
手順S101-1:時刻ktの信号Ii(kt,z)と信号Qi(kt,z)から散乱光ベクトルri(kt,z)を計算する。例えば、虚数単位をjとして、以下で計算できる。
ri(kt,z)=Ii(kt,z)+j・Qi(kt,z) (111)
計算した散乱光ベクトルri(kt,z)のデータは順次信号処理部17eにストリーミングされる。
Step S101-1: Calculate scattered light vector r i (kt,z) from signal I i (kt,z) and signal Q i (kt,z) at time kt. For example, with the imaginary unit j, it can be calculated as follows.
r i (kt, z)=I i (kt, z)+j・Q i (kt, z) (111)
The calculated scattered light vector r i (kt,z) data is sequentially streamed to the
手順S101-2:一つの時間ブロック内での散乱光ベクトルriのデータを保持しておき、散乱光ベクトルri(kt,z)のベクトル長|ri(kt,z)|の当該ブロック内での合計値を計算する。つまり、Kブロック目の場合には、|ri(kt,z)|を、kがM(K-1)からMK-1までについて、和を計算する。計算した合計値が最も大きい光周波数を基準光周波数に選定する。ここでは、基準光周波数をfrefとおく。基準光周波数frefは、入射端からの距離zや時間ブロックKに依存する。これらの依存性を考慮する必要がある場合には、fref(z,K)やfref(z)やfref(K)と以下記載する。 Step S101-2: Data of the scattered light vector r i in one time block is stored, and the sum of the vector length |r i (kt,z)| of the scattered light vector r i (kt,z) in the block is calculated. That is, in the case of the Kth block, the sum of |r i (kt,z)| is calculated for k from M(K-1) to MK-1. The optical frequency with the largest calculated sum is selected as the reference optical frequency. Here, the reference optical frequency is set to f ref . The reference optical frequency f ref depends on the distance z from the input end and the time block K. When it is necessary to take these dependencies into consideration, it will be described below as f ref (z,K), f ref (z), or f ref (K).
手順S101-3:同じブロック内のデータに対して、時刻ktの各光ファイバ地点における基準光周波数の散乱光ベクトルrref(kt,z)の角度θref(kt,z)を計算する。例えば、以下を計算する。
θref(kt,z)=arg[rref(kt,z)] (113)
Step S101-3: For data in the same block, calculate the angle θ ref (kt, z) of the scattered light vector r ref (kt, z) of the reference light frequency at each optical fiber point at time kt. For example, the following is calculated.
θ ref (kt, z)=arg[r ref (kt, z)] (113)
手順S101-4:前記時間ブロック内の時刻ktの各光ファイバ地点における各光周波数の散乱光ベクトルri(kt,z)を角度-θref(kt,z)だけ回転させ、ri_rot(kt,z)とする。例えば、以下を計算する。
ri_rot(kt,z)=exp[-jθref(kt,z)]×ri(kt,z)
(114)
ここで、jは虚数単位である。
Step S101-4: The scattered light vector r i (kt,z) of each optical frequency at each optical fiber point at time kt in the time block is rotated by an angle −θ ref (kt,z) to obtain r i _rot (kt,z).
r i_rot (kt, z)=exp[-jθ ref (kt, z)]×r i (kt, z)
(114)
Here, j is the imaginary unit.
手順S101-5:計算されたri_rot(kt,z)の前記時間ブロック内での加算ベクトルを計算する。例えば、以下を計算する。
ri_avet(z,K)=Σri_rot(kt,z) (115)
手順S101-6:得られたri_avet(z,K)を使用して、Kブロック目の測定データを使用した各光周波数の位相回転角度αi(z,K)を計算する。計算式は、以下が例示できる。
αi(z,K)=-arg[ri_avet(z,K)] (116)
Step S101-5: Calculate a sum vector within the time block of the calculated r i _rot (kt,z). For example, the following is calculated.
r i_avet (z, K)=Σr i_rot (kt, z) (115)
Step S101-6: Using the obtained r i — avet (z, K), calculate the phase rotation angle α i (z, K) of each optical frequency using the measurement data of the Kth block.
α i (z, K)=-arg[r i_avet (z, K)] (116)
手順S101-6が終了した段階でαi(z,K)を信号処理部17eに引き渡す。
信号処理部17eは、信号処理部17dで計算した位相回転角度αiを用いて、各光周波数fiの散乱光ベクトルriを回転させた上で平均し、光周波数平均ベクトルを計算する。あるブロックKに属する散乱光ベクトルの周波数平均を計算する際に用いる位相回転角度αiは、一つ前のブロックK-1において信号処理部17dで計算した位相回転角度αiを用いる。すなわち、信号処理部17eの詳細処理はKブロック目について、以下となる。
When step S101-6 is completed, α i (z, K) is passed to the
手順S102-1:信号処理部17eは、時刻ktの各光周波数の散乱光ベクトルri(kt,z)を、K-1番目のブロックで計算した位相回転角度αi(z,K-1)だけ回転させ、回転後のベクトルRi(kt,z)を計算する。計算方法は、以下が例示できる。
Ri(kt,z)=exp(j・αi(z,K-1))・ri(kt,z)
(121)
Step S102-1: The
R i (kt, z) = exp (j・α i (z, K-1))・r i (kt, z)
(121)
手順S102-2:信号処理部17eは、回転後のベクトルRi(kt,z)を周波数平均したベクトルを計算する。尚、ベクトル平均でもベクトル合成(単純なベクトル和)でも最終的な結果は変わらないため、実際の計算手順ではベクトル合成して光周波数平均ベクトルRavef(kt,z)とする。計算方法は、以下のとおりである。
手順S102-3:光周波数平均ベクトルRavef(kt,z)の角度θavef(kt,z)を計算し、後段の信号処理部17fに引き渡す。計算方法は、以下のとおりである。
θavef(kt,z)=arg[Ravef(kt,z)] (123)
Step S102-3: Calculate the angle θ avef (kt,z) of the optical frequency average vector R avef (kt,z) and transfer it to the downstream
θ avef (kt, z)=arg[R avef (kt, z)] (123)
尚、K=1の最初のブロックにおいては、それ以前のブロックのデータがないため位相回転角度が未取得の状態であり、信号処理部17eの手順を行うことができない。したがって、最初のMtの測定時間分は予備測定として、信号処理部17e以降の処理は行わない。あるいは、最初のMtの測定時間分のri(kt,z)だけ別途計算機内で保存し、従来技術1により振動波形まで計算することも可能である。
In the first block where K=1, since there is no data from the previous blocks, the phase rotation angle is not yet obtained, and the procedure of the
後段の信号処理部17fでは、得られた光周波数平均ベクトルの角度θavef(kt,z)の変化を用いて、ゲージ長だけ離れた2点の位相の差分を計算し、位相接続処理などを行い、振動波形を計算する。具体的な計算方法は一般的な位相OTDRにおける位相から振動波形の計算方法と同様の手法が使用できる。
In the
ただし、隣り合うブロック同士で角度θavef(kt,z)を計算するのに使用した基準光周波数が異なる場合には、それらブロックのうち時間的に若いブロックの最後の時刻から次のブロックの最初の時刻への振動変化の計算値に、基準光周波数の位相オフセットの違いが含まれ、正しい値を反映できない。例えば、ブロックKの信号処理部17eに用いる位相回転角度の基準となる光周波数はブロックK-1のデータを用いて手順S101-2で選定したfref(K-1)であり、ブロックK+1の信号処理部17eに用いる位相回転角度の基準となる光周波数はブロックKのデータを用いて手順S101-2で選定したfref(K)である。つまり、ブロックKの角度θavef(kt,z)の位相オフセットは基準光周波数fref(K-1)を基準としており、ブロックK+1の角度θavef(kt,z)の位相オフセットは基準光周波数fref(K)を基準としているため、基準光周波数fref(K-1)とfref(K)が異なる場合には、時刻ktがMK-1からMKへの角度θavefの時間による変化分には、異なる光周波数間の位相オフセットの違いの影響が含まれる。
However, if the reference optical frequencies used to calculate the angle θ avef (kt,z) are different between adjacent blocks, the calculated value of the vibration change from the last time of the younger block to the first time of the next block will include a difference in the phase offset of the reference optical frequency, and the correct value cannot be reflected. For example, the optical frequency serving as the reference for the phase rotation angle used by
この影響を回避するために、各ブロックの時間長を(M+1)tに設定しておき、隣り合うブロックでデータ点を共有しておき、そのデータ点において補正する方法が考えられる。例えば、ブロックKをkがM(K-1)からMKまでの(M+1)t個のデータが含まれるようにし、ブロックK+1をkがMKから(M+1)Kまでの(M+1)t個のデータが含まれるようにしておく。このようなブロックの区切りを設定することで、kt=MKtのデータ点は、K番目のブロックとK+1番目のブロックの双方に含まれる。したがって、ブロック長の設定以外を信号処理部17dと信号処理部17eと同様に実施すれば、時刻kt=MKtの角度θavef(MKt,z)として、ブロックK番目の最後のデータと、ブロックK+1番目の最初のデータの2種類のデータが得られる。前者をθavef(MKt,z,K)とおき、後者をθavef(MKt,z,K+1)とおいて区別する。θavef(MKt,z,K+1)-θavef(MKt,z,K)は前記基準光周波数のオフセットの違いを反映した値となる。したがって、ブロックK+1番目に含まれる全ての角度θavef(kt,z)を、θavef(kt,z)-[θavef(MKt,z,K+1)-θavef(MKt,z,K)]と補正すれば、基準光周波数が異なることによる位相オフセットの違いの影響を低減することができる。
In order to avoid this effect, a method is conceivable in which the time length of each block is set to (M+1)t, adjacent blocks share a data point, and the data point is corrected. For example, block K is set to include (M+1)t pieces of data with k ranging from M(K-1) to MK, and block K+1 is set to include (M+1)t pieces of data with k ranging from MK to (M+1)K. By setting such block divisions, the data point of kt=MKt is included in both the Kth block and the K+1th block. Therefore, if the
本実施形態ではブロックK+1番目の処理について述べたが、ブロックが小さい順から同様の処理を実施することで、全ての時刻で前記影響を低減することができる。尚、このような各ブロックの時間長を(M+1)tに設定しておき、隣り合うブロックでデータ点を共有しておき、そのデータ点において補正する方法は、隣り合うブロックで基準光周波数が同じであったとしても、位相回転角度の不連続性に起因する位相の不連続性という先願発明1の欠点を補う効果もある。
In this embodiment, the processing of the K+1th block has been described, but by carrying out similar processing starting from the smallest block, the above-mentioned effects can be reduced at all times. Incidentally, this method of setting the time length of each block to (M+1)t, sharing a data point with adjacent blocks, and performing correction at that data point also has the effect of compensating for the shortcoming of
尚、本実施形態では信号処理部17eで角度θavef(kt,z)の値そのものを信号処理部17fに転送しているが、信号処理部17eは、次式で表される角度の時間差分を転送し、角度の時間差分を信号処理部17fで処理してもよい。
θavef((k+1)t,z)-θavef(kt,z)
In this embodiment, the
θ avef ((k+1)t,z)−θ avef (kt,z)
その場合には、信号処理部17fは、異なる光周波数間の位相オフセットの違いの影響を低減するためには、時刻が(MK-1)tからMKtへ変化することによる光周波数平均ベクトルの角度変化分を次式で計算する。
θavef(MKt,z,K)-θavef((MK-1)t,z,K)
In that case, in order to reduce the influence of the difference in phase offset between different optical frequencies, the
θ avef (MKt, z, K) - θ avef ((MK-1)t, z, K)
また、先願発明1の手順ではデータをストリーミング処理することが可能だが、本発明による手順S101-2が加わることで、一ブロック内の全ての散乱光データを保持する必要が新たに生じる。先願発明1のストリーミング処理の特徴を保持したい場合には、手順S101-2のベクトル長の加算に用いるデータ点を計算器のメモリが保持可能な各ブロックの初めの数点に限定するなどの工夫をすることも可能である。
In addition, while the procedure of
本発明の特徴は手順S101-2にある。先願発明1では、信号処理部17dで、測定データを時間ポイント数Mのブロックに区切り、測定時間Mtのブロック単位で位相回転角度を計算・更新することで、レーザの発振周波数などの光学特性の時間的な変化や被測定光ファイバ自体の温度変化、大きな動的歪みの被測定光ファイバへの印加などによる最適値の時間的な変化に対応する。一ブロックあたりの測定時間Mtを、レーザの発振周波数などの光学特性の時間的な変化や被測定光ファイバ自体の温度変化、大きな動的歪みの被測定光ファイバへの印加の時間スケールに対して小さくとることで、十分な細かさでの位相回転角度の更新を可能としており、信号処理部17eでブロックKに属する散乱光ベクトルの周波数平均を計算する際に用いる位相回転角度としてブロックK-1で信号処理部17dが計算した位相回転角度を用いても問題なくなる。
The feature of the present invention is step S101-2. In the
先願発明1によれば、Mを100程度にとれば、十分な位相回転角度の精度を保証することができ、パルスの送出周期tが1msの条件であれば、Mtは100ms以下となり、最適な位相回転角度の変化の時間スケールが1s以上となるような場合に十分に対応できる。このMtの設定値のオーダーは、各光周波数の散乱光強度の大小関係が各ブロック内では一定とみなすことができる時間幅のオーダーと同程度となっている。このため、手順S101-2において本発明を適用し、K-1番目のブロックのなかから基準光周波数を選定して位相回転角度を計算し、K番目のブロックの周波数平均の処理に使用することで、測定器雑音由来の位相回転角度の角度揺らぎの影響による振動波形歪みを低減することができる。
According to the
ただし、基準光周波数の選定に用いる時間ブロック長の長さと、周波数平均に用いる最適な位相回転角度の更新に使用する時間ブロック長の長さが同一でなくとも、本発明の趣旨を変更しない範囲で、本実施形態例と同様に本発明を実施することが可能である。 However, even if the length of the time block length used to select the reference optical frequency and the length of the time block length used to update the optimal phase rotation angle used for frequency averaging are not the same, it is possible to implement the present invention in the same manner as this embodiment, as long as the spirit of the present invention is not changed.
(第2の実施形態)
本実施形態では、先願発明2に本発明を適用する例について説明する。先願発明2では予め信号処理に用いる窓長Mt(Mは自然数でデータポイント数に対応)の時間窓を設定した上で、時間窓を動かしながら、時間窓内に含まれる測定データを用いて位相回転角度を計算していき、その位相回転角度を使用して、時間窓の中心、あるいは、予め設定した測定データ数分だけ後方に位置する時刻における周波数成分の散乱光ベクトルの平均を行っていく。窓長Mtについては、第1の実施形態におけるブロック長の設定と同様にして設定すればよい。
Second Embodiment
In this embodiment, an example of applying the present invention to
本発明の先願発明2への適用方法の概要は、本発明の先願発明1への適用方法と同じであるが、先願発明2では位相回転角度の更新を各時間で連続的に行っており、本発明を適用することで基準光周波数も随時切り替わる可能性があるため、基準光周波数が異なることによる位相オフセットの違いを連続的に補正する必要がある点が、先願発明1に適用する場合と異なる。
The method of applying the present invention to
信号処理部17dでは、先願発明2と同様に、散乱光ベクトルri(kt,z)を計算して、信号処理部17eに連続的にストリーミングする。また、時刻が(k-W)tから(k+W)tまでの散乱光ベクトルを使用して、周波数平均に用いる各光周波数fiの位相回転角度αi(kt,z)を計算する。つまり、前記窓長Mtは、Mt=(2W+1)tを満たす。計算した位相回転角度αi(kt,z)を信号処理部17eに連続的にストリーミングする。
In the
本発明においては、基準光周波数の選定を動的に連続して更新するプロセスを加える。また、基準光周波数を動的に更新することで生じる位相オフセットの違いを連続的に補正するため、位相回転角度αi(kt,z)は、信号処理部17eで時刻ktだけでなく、時刻(k+1)tの周波数平均にも使用し、位相の時間変化を信号処理部17fに送信する。
In the present invention, a process for dynamically and continuously updating the selection of the reference optical frequency is added. Also, in order to continuously correct the difference in phase offset caused by dynamically updating the reference optical frequency, the phase rotation angle α i (kt, z) is used not only at time kt but also for the frequency average at time (k+1)t in the
まず、信号処理部17dの計算手順の具体例を以下に記載する。k=0から測定を開始しているとする。信号処理部17dのフローチャートを図5に示す。
手順S201-1:時刻ktの信号Ii(kt,z)と信号Qi(kt,z)から散乱光ベクトルri(kt,z)を計算する。例えば、虚数単位をjとして、以下で計算できる。
ri(kt,z)=Ii(kt,z)+j・Qi(kt,z) (211)
計算した散乱光ベクトルのデータを順次信号処理部17eにストリーミングする。
First, a specific example of the calculation procedure of the
Step S201-1: Calculate scattered light vector r i (kt,z) from signal I i (kt,z) and signal Q i (kt,z) at time kt. For example, with the imaginary unit j, it can be calculated as follows.
r i (kt, z)=I i (kt, z)+j・Q i (kt, z) (211)
The calculated scattered light vector data is sequentially streamed to the
手順S201-2:時刻(k-2W)tから時刻ktまでの散乱光ベクトル長|ri(kt,z)|を合計し、合計値が最も大きい光周波数を基準光周波数frefとする。基準光周波数frefは、入射端からの距離zや時刻ktに依存する。これらの依存性を考慮する必要がある場合には、fref(kt,z)やfref(z)やfref(kt)と以下記載する。 Step S201-2: The scattered light vector lengths |r i (kt, z)| from time (k-2W)t to time kt are summed up, and the optical frequency with the largest sum is set as the reference optical frequency f ref . The reference optical frequency f ref depends on the distance z from the incident end and the time kt. When it is necessary to take these dependencies into consideration, it will be written as f ref (kt, z), f ref (z), or f ref (kt) below.
手順S201-3:時刻ktの各光ファイバ地点における基準光周波数fref(kt,z)の散乱光ベクトルrref(kt,z)の角度θref(kt,z)を計算する。例えば、以下で計算できる。
θref(kt,z)=arg[rref(kt,z)] (213)
Step S201-3: Calculate the angle θ ref (kt,z) of the scattered light vector r ref (kt,z) of the reference light frequency f ref (kt,z) at each optical fiber point at time kt. For example, it can be calculated as follows.
θ ref (kt, z)=arg[r ref (kt, z)] (213)
手順S201-4:時刻ktの各光ファイバ地点における各光周波数の散乱光ベクトルri(kt,z)を角度-θref(kt,z)だけ回転させ、ri_rot(kt,z)とする。例えば、以下で計算できる。
ri_rot(kt,z)=exp[-jθref(kt,z)]×ri(kt,z)
(214)
Step S201-4: The scattered light vector r i (kt,z) of each optical frequency at each optical fiber point at time kt is rotated by an angle −θ ref (kt,z) to obtain r i _rot (kt,z).
r i_rot (kt, z)=exp[-jθ ref (kt, z)]×r i (kt, z)
(214)
手順S201-5:時刻(k-2W)tから時刻ktまでのri_rot(kt,z)を平均し、時間平均ベクトルri_avet((k-W)t,z)を計算する。時間平均ベクトルの引数の時刻は時間窓の中心の時刻である。また、平均でも単純加算でも最終的な結果に変わりはないため、以下のように加算として時間平均ベクトルを計算する。
ri_avet(kt,z)=ri_avet(Wt,z) (215-2)
Step S201-5: r i _rot (kt, z) from time (k-2W)t to time kt is averaged to calculate the time average vector r i _avet ((k-W)t, z). The argument time of the time average vector is the center time of the time window. In addition, since the final result is the same whether averaging or simple addition is performed, the time average vector is calculated as an addition as follows.
r i_avet (kt, z)=r i_avet (Wt, z) (215-2)
手順S201-6:計算した時間平均ベクトルri_avet((k-W)t,z)の角度を使用して、位相回転角度αi((k-W)t,z)を計算する。計算式は、以下が例示できる。
αi((k-W)t,z)=-arg[ri_avet((k-W)t,z)]
(216)
計算した位相回転角度αi((k-W)t,z)を順次信号処理部17eにストリーミングする。
Step S201-6: Calculate the phase rotation angle α i ((k−W)t, z) using the angle of the calculated time-averaged vector r i — avet ((k−W)t, z).
α i ((k-W)t, z)=-arg[r i_avet ((k-W)t, z)]
(216)
The calculated phase rotation angles α i ((k−W)t, z) are sequentially streamed to the
信号処理部17eでは、信号処理部17dで計算した位相回転角度αiを用いて、各光周波数fiの散乱光ベクトルriを回転させた上で平均し、光周波数平均ベクトルを計算する。先願発明2では光周波数平均ベクトルの角度をそのまま信号処理部17fに送信するが、本発明では基準光周波数が動的に入れ替わることの対策として、隣り合う時刻の角度(位相)の時間による変化分を計算してから信号処理部17fに送信する。計算手順の具体例を以下に記載する。計算手順を図6に示す。
In the
手順S202-1:信号処理部17eは、手順S201-1でストリーミングされた散乱光ベクトルri(kt,z)とri((k+1)t,z)とを、手順S201-6でストリーミングされた位相回転角度αi(kt,z)だけ回転させて、回転後のベクトルRi(kt,z)とRi((k+1)t,z)を計算する。計算方法は、以下が例示できる。
Ri(kt,z)=exp(j・αi(kt,z))・ri(kt,z)
(221-1)
Ri((k+1)t,z)=exp(j・αi(kt,z))・ri((k+1)t,z)
(221-2)
Step S202-1: The
R i (kt, z)=exp(j・α i (kt, z))・r i (kt, z)
(221-1)
R i ((k+1)t, z)=exp(j・α i (kt, z))・r i ((k+1)t, z)
(221-2)
尚、光周波数平均ベクトルであるRi((k+1)t,z)とRi(kt,z)の計算に同じ基準光周波数を使用して計算した位相回転角度を用いることが特徴であるが、同一の位相回転角度を使用する必要は必ずしもないため、基準光周波数fref(kt,z)を基準にした上で時刻(k-W+1)tから時刻(k+W+1)tまでの測定データを使用して散乱光ベクトルri((k+1)t,z)を回転する用の位相回転角度を別途計算しておいて当該(221-2)のαi(kt,z)に代えて使用してもよい。その場合のfref(kt,z)を基準にした上での時刻(k-W+1)tから時刻(k+W+1)tまでの測定データを使用してri((k+1)t,z)を回転する用の位相回転角度の計算方法は、手順S201-2から手順S201-6までで、基準光周波数はfref(kt,z)のままで、演算の対象となる測定データを、時刻(k-W)tから時刻(k+W)tまでの測定データではなく、時刻(k-W+1)tから時刻(k+W+1)tまでの測定データに置き換える方法になる。 Note that a feature of this method is that the phase rotation angle calculated using the same reference optical frequency is used to calculate the optical frequency average vectors R i ((k+1)t,z) and R i (kt,z). However, it is not always necessary to use the same phase rotation angle. Therefore, a phase rotation angle for rotating the scattered light vector r i ((k+1)t,z) may be calculated separately using the measurement data from time (k-W+1)t to time (k+W+1)t based on the reference optical frequency f ref (kt,z), and used in place of α i (kt,z) in (221-2). In this case, the method of calculating the phase rotation angle for rotating r i ((k+1)t,z) using the measurement data from time (k-W+1)t to time (k+W+1)t based on f ref (kt,z) is to keep the reference optical frequency at f ref (kt,z) in steps S201-2 to S201-6, and replace the measurement data to be calculated with the measurement data from time (k-W+1)t to time (k+W+1)t, instead of the measurement data from time (k-W)t to time (k+W)t.
手順S202-2:信号処理部17eは、回転後のベクトルRi(kt,z)を周波数平均したベクトルを計算する。尚、ベクトル平均でもベクトル合成(単純なベクトル和)でも最終的な結果は変わらないため、実際の計算手順ではベクトル合成して光周波数平均ベクトルRavef(kt,z)とする。計算方法は、以下が例示できる。
手順S202-3:信号処理部17eは、光周波数平均ベクトルRavef(kt,z)の角度θavef(kt,z)、および、光周波数平均ベクトルRavef((k+1)t,z)の角度θavef((k+1)t,z)を計算し、その変化分θavef((k+1)t,z)-θavef(kt,z)を後段の信号処理部17fに引き渡す。角度θavefの計算方法は、以下が例示できる。
θavef(kt,z)=arg[Ravef(kt,z)] (223-1)
θavef((k+1)t,z)=arg[Ravef((k+1)t,z)]
(223-2)
Step S202-3: The
θ avef (kt, z)=arg[R avef (kt, z)] (223-1)
θ avef ((k+1)t, z)=arg[R avef ((k+1)t, z)]
(223-2)
さらに信号処理部17fでは、信号処理部17eで得られた位相の時間による変化分θavef((k+1)t,z)-θavef(kt,z)を用いて、ゲージ長だけ離れた2点の位相の空間差分を計算し、位相接続処理などを行い、振動波形を計算する。具体的な計算方法は一般的なDAS-Pと同様の計算方法が使用可能である。
Furthermore,
尚、本実施形態例では、基準光周波数の選定に用いる時間窓の長さと、周波数平均に用いる最適な位相回転角度の更新に使用する時間窓の長さを同一としたが、同一としない場合であっても、本発明の趣旨を変更しない範囲で、本実施形態例と同様に本発明を実施することができる。 In this embodiment, the length of the time window used to select the reference optical frequency is the same as the length of the time window used to update the optimal phase rotation angle used for frequency averaging. However, even if they are not the same, the present invention can be implemented in the same manner as this embodiment, as long as the gist of the present invention is not changed.
先願発明2と同様に、計算器のメモリの要求要件などに応じて、前記位相回転角度αi((k-W)t,z)を、時刻(k-W)tより後方の時刻(k-W+Delay)tと時刻(k-W+Delay+1)tの周波数平均に用いることもできる(変数Delayは遅延量を反映する整数とする)。すなわち、窓長2W+1を持つ時間窓の範囲内の測定データを用いて計算した位相回転角度を、時間窓の中心時刻よりも後方の時刻の周波数平均に用いることができる。中心に対してどれくらい後方とするかは(Delayをどのくらいの値とするかは)、時間的な差分量Delayが大きくなるほど、時刻(k-W+Delay)tにおける最適な位相回転角度αi((k-W+Delay)t,z)と使用する位相回転角度αi((k-W)t,z)の差も大きくなるため、メモリ容量等から決まる最小限の値に留めるのが望ましい。
As in the
(第3の実施形態)
本実施形態では、先願発明3に本発明を適用する例について説明する。信号処理部17dから信号処理部17gの役割を以下とする。
Third Embodiment
In this embodiment, an example will be described in which the present invention is applied to the
(信号処理部17d)
計算手順の具体例を以下に記載する。k=0から測定を開始しているとする。信号処理部17dのフローチャートも図7に示す。
手順S301-1:信号Ii(kt,z)と信号Qi(kt,z)から散乱光ベクトルri(kt,z)を計算する。計算式は以下が例示できる。
ri(kt,z)=Ii(kt,z)+j・Qi(kt,z) (311)
計算した散乱光ベクトルri(kt,z)データは信号処理部17eに連続的にストリーミングされる。
(
A specific example of the calculation procedure is described below. It is assumed that the measurement starts from k = 0. The flowchart of the
Step S301-1: Calculate the scattered light vector r i (kt,z) from the signal I i (kt,z) and the signal Q i (kt,z).
r i (kt, z)=I i (kt, z)+j・Q i (kt, z) (311)
The calculated scattered light vector r i (kt,z) data is continuously streamed to a
手順S301-2:時刻が(k-2W)tからktまでの散乱光ベクトルのベクトル長|ri(kt,z)|を合計したLi(kt,z)という指標を計算する。ここで、窓長Mtは、Mt=(2W+1)tを満たす。Li(kt,z)が閾値LTより大きくなる光周波数fiの集合をXとする。Xは時間窓の位置に依存するので、異なる時刻を中心とする時間窓で計算した集合Xは互いに同一とは限らないことに留意する。以降の手順でXの元(要素)を基準光周波数に選定するが、それが本発明の特徴となる。閾値LTの設定値は測定の要求仕様に依存するが、例えば、測定器雑音の大きさを閾値LTに設定するなどできる。 Step S301-2: Calculate an index L i (kt,z) which is the sum of vector lengths |r i (kt,z)| of scattered light vectors from time (k-2W)t to kt. Here, the window length Mt satisfies Mt=(2W+1)t. Let X be a set of optical frequencies f i for which L i (kt,z) is greater than the threshold L T. It should be noted that since X depends on the position of the time window, sets X calculated using time windows centered on different times are not necessarily the same. In the following steps, an element of X is selected as the reference optical frequency, which is a feature of the present invention. The set value of the threshold L T depends on the required specifications of the measurement, but for example, the magnitude of the noise of the measuring device can be set as the threshold L T.
手順S301-3:時刻が(k-2W)tからktまでの散乱光ベクトルについて、集合Xに含まれる各光周波数fiの散乱光ベクトルri(kt,z)の角度θi(kt,z)を計算する。例えば、以下で計算できる。
θi(kt,z)=arg[ri(kt,z)] (313)
Step S301-3: For the scattered light vectors from time (k-2W)t to kt, calculate the angle θ i (kt,z) of the scattered light vector r i (kt,z) of each light frequency f i included in set X. For example, it can be calculated as follows.
θ i (kt, z)=arg[r i (kt, z)] (313)
手順S301-4:時刻が(k-2W)tからktまでの散乱光ベクトルについて、各光周波数fiの散乱光ベクトルri(kt,z)を、各光周波数fxを基準光周波数とした場合の位相回転角度-θx(kt,z)だけ回転させri_rot,x(kt,z)を計算する。例えば、以下で計算できる。
ri_rot,x(kt,z)=exp[-jθx(kt,z)]×ri(kt,z)
(314)
上式におけるiとxとの組み合わせ(i,x)は、xについては集合Xに属する光周波数のみ、iについては全ての取り得る場合を計算する。
Step S301-4: For the scattered light vectors from time (k-2W)t to kt, rotate the scattered light vector r i (kt,z) of each optical frequency f i by a phase rotation angle -θ x (kt,z) when each optical frequency f x is the reference optical frequency, to calculate r i _rot,x (kt,z). For example, it can be calculated as follows.
r i_rot, x (kt, z) = exp [-jθ x (kt, z)] × r i (kt, z)
(314)
In the above formula, for the combination of i and x (i, x), only optical frequencies belonging to set X are calculated for x, and all possible cases are calculated for i.
手順S301-5:時刻が(k-2W)tからktまでのデータについて、基準光周波数がfxの時のri_rot,xを加算することで、時間平均ベクトルri_avet,x((k-W)t,z)を計算する。計算式は、以下が例示できる。
ただし、kt=0からkt=2Wtまで測定することで窓長(2W+1)t以上のデータが得られるようになるため、ri_avet,x(kt,z)のktがWt未満の場合には計算ができない。そのため、時刻ktがWt未満の測定データは予備測定にするか、k=Wの時間平均ベクトルにそろえることができる。後者の場合、k<Wについて、次式とする。
ri_avet,x(kt,z)=ri_avet,x(Wt,z) (315-2)
上式におけるiとxとの組み合わせ(i,x)は、xについては集合Xに属する光周波数のみ、iについては全ての取り得る場合を計算する。
However, since data with a window length of (2W+1)t or more can be obtained by measuring from kt=0 to kt=2Wt, calculation is not possible if kt of ri_avet,x (kt,z) is less than Wt. Therefore, measurement data with a time kt less than Wt can be used as a preliminary measurement, or can be aligned to a time average vector of k=W. In the latter case, for k<W, the following equation is used.
r i_avet, x (kt, z) = r i_avet, x (Wt, z) (315-2)
In the above formula, for the combination of i and x (i, x), only optical frequencies belonging to set X are calculated for x, and all possible cases are calculated for i.
手順S301-6:時間平均ベクトルri_avet,x((k-W)t,z)から各光周波数fxが基準光周波数のときの各光周波数fiの位相回転角度αi,x((k-W)t,z)を計算し、信号処理部17eにストリーミングする。計算式は、以下が例示できる。
αi,x((k-W)t,z)=-arg[ri_avet,x((k-W)t,z)]
(316)
上式におけるiとxとの組み合わせ(i,x)は、xについては集合Xに属する光周波数のみ、iについては全ての取り得る場合を計算する。
Step S301-6: Calculate the phase rotation angle α i, x ((k−W)t,z) of each optical frequency f i when each optical frequency f x is the reference optical frequency from the time-averaged vector r i _avet, x ( (k−W)t,z), and stream it to the
α i,x ((kW)t,z)=-arg[r i_avet,x ((kW)t,z)]
(316)
In the above formula, for the combination of i and x (i, x), only optical frequencies belonging to set X are calculated for x, and all possible cases are calculated for i.
図8に、信号処理部17e、17f及び17gが実行するフローチャートを示す。
(信号処理部17e)
信号処理部17eは、信号処理部17dで計算した位相回転角度αi,xを用いて、各光周波数fiの散乱光ベクトルriを回転させた上で平均し、光周波数平均ベクトルを計算する。本発明の手順に従い選定された基準光周波数fxについて計算を実行する。具体的には以下の手順を備える。
手順S302-1:手順S301-1でストリーミングされた散乱光ベクトルri(kt,z)とri((k+1)t,z)とを、手順S301-6でストリーミングされた位相回転角度αi,x(kt,z)だけ回転させて、基準光周波数がfxの時の、回転後のベクトルRi,x(kt,z)を計算する。計算方法は、以下が例示できる。
Ri,x(kt,z)=exp(j・αi,x(kt,z))・ri(kt,z)
(321-1)
Ri,x((k+1)t,z)=exp(j・αi,x(kt,z))・ri((k+1)t,z)
(321-2)
FIG. 8 shows a flowchart of the process executed by the
(
The
Step S302-1: The scattered light vectors r i (kt,z) and r i ((k+1)t,z) streamed in step S301-1 are rotated by the phase rotation angle α i,x (kt,z) streamed in step S301-6 to calculate the rotated vector R i,x (kt,z) when the reference light frequency is f x . The calculation method can be exemplified as follows.
R i,x (kt, z)=exp(j・α i,x (kt, z))・r i (kt, z)
(321-1)
R i,x ((k+1)t,z)=exp(j・α i,x (kt,z))・ri ((k+1)t,z)
(321-2)
尚、Ri,x((k+1)t,z)とRi,x(kt,z)の計算に同じ基準光周波数fxを使用して計算した位相回転角度を用いることが特徴であるが、同一の位相回転角度を使用する必要は必ずしもないため、fxを基準にした上で時刻(k-W+1)tから時刻(k+W+1)tまでの測定データを使用してri,x((k+1)t,z)を回転する用の位相回転角度を別途計算しておいて式(321-2)のαi,x(kt,z)に代えて使用してもよい。その場合のfxを基準にした上での時刻(k-W+1)tから時刻(k+W+1)tまでの測定データを使用してri,x((k+1)t,z)を回転する用の位相回転角度の計算方法は先願3に記載の方法と同様の方法が使用できる。
Note that, although it is a feature that the phase rotation angle calculated using the same reference optical frequency f x is used for the calculation of R i,x ((k+1)t,z) and R i,x (kt,z), it is not necessarily necessary to use the same phase rotation angle, so a phase rotation angle for rotating r i ,x ((k+1)t,z) may be calculated separately using the measurement data from time (k-W+1)t to time (k+W+1)t based on f x and used in place of α i,x (kt,z) in equation (321-2). In that case, the method for calculating the phase rotation angle for rotating r i,x ((k+1)t,z) using the measurement data from time (k-W+1)t to time (k+W+1)t based on f x may be the same as the method described in
手順S302-2:回転後のベクトルRi,x(kt,z)を周波数平均したベクトルを計算する。尚、ベクトル平均でもベクトル合成(単純なベクトル和)でも最終的な結果は変わらないため、実際の計算手順ではベクトル合成して光周波数平均ベクトルRavef,x(kt,z)とする。計算方法は、以下が例示できる。
手順S302-3:基準光周波数がfxの時の、光周波数平均ベクトルRavef,x(kt,z)の角度θavef,x(kt,z)、および、光周波数平均ベクトルRavef,x((k+1)t,z)の角度θavef,x((k+1)t,z)を計算し、時間による変化分θavef,x((k+1)t,z)-θavef,x(kt,z)を信号処理部17fに引き渡す。角度θavefの計算方法は、以下が例示できる。
θavef,x(kt,z)=arg[Ravef,x(kt,z)]
(323-1)
θavef,x((k+1)t,z)=arg[Ravef,x((k+1)t,z)]
(323-2)
集合Xに属する各光周波数を基準光周波数fxとして計算する。
Step S302-3: Calculate the angle θ avef ,x (kt,z) of the optical frequency average vector R avef, x (kt,z) and the angle θ avef,x ((k+1)t,z) of the optical frequency average vector R avef,x ( (k+1)t,z) when the reference optical frequency is f x, and transfer the change over time θ avef,x ((k+1)t,z) - θ avef,x (kt,z) to the
θ avef,x (kt,z)=arg[R avef,x (kt,z)]
(323-1)
θ avef,x ((k+1)t,z)=arg[R avef,x ((k+1)t,z)]
(323-2)
Each optical frequency belonging to the set X is calculated as a reference optical frequency fx .
(信号処理部17f)
手順S303:信号処理部17fは、基準光周波数fxの角度θavef,xの時間による変化分θavef,x((k+1)t,z)-θavef,x(kt,z)を用いて、さらにゲージ長だけ離れた2点の位相の差分を計算する。そして、大きさがπを超える場合には2πの整数倍だけ加算してπ以下となるように補正するなどする。この動作は位相接続処理に対応する。最終的に得られた値は、基準光周波数をfxとした際の振動波形ψx(kt,z)の時間による変化分ψx((k+1)t,z)-ψx(kt,z)となる。尚、具体的な計算方法は一般的な位相OTDRにおける位相から振動波形の計算方法と同様の手法が使用できる。集合Xに属する各光周波数を基準光周波数fxとして計算を実行する。振動波形ψx(kt,z)の時間による変化分ψx((k+1)t,z)-ψx(kt,z)を信号処理部17gにストリーミングする。
(
Step S303: The
(信号処理部17g)
手順S304:信号処理部17gは、時間による変化分ψx((k+1)t,z)-ψx(kt,z)をxについて平均し、最終的な振動波形ψ(kt,z)の時間による変化分ψ((k+1)t,z)-ψ(kt,z)を計算する。時間による変化分を累積加算していくことで最終的な振動波形ψ(kt,z)を得る。累積加算する際の開始時刻でのオフセット値は一般的な位相OTDRにおける振動波形におけるオフセット設定と同様の設定が使用できる。
(
Step S304: The
本発明では、手順S301-2で基準光周波数の役割を果たす光周波数を散乱光強度に基づき選定することで、位相回転角度αiの雑音起因の角度揺らぎの影響による振動波形歪みを低減することができる。また、本実施形態例の場合も基準光周波数に選定される光周波数の組み合わせは動的に変化し得るため、基準光周波数が異なる場合に位相オフセットの違いが影響する可能性がある。この問題に対処するため、本実施形態では、信号処理部17fや信号処理部17gで角度θavef,xや振動波形ψxの時間による変化分ベースで計算を進めている。このような時間による変化分ベースの計算を実行するために、本実施形態では、位相回転角度αi,x(kt,z)を用いて角度θavef,x(kt,z)と角度θavef,x((k+1)t,z)の両方を計算する。これは、ある時刻ktの角度θavef,xが、位相回転角度αi,x(kt,z)と位相回転角度αi,x((k-1)t,z)の二つを用いてそれぞれ計算されていることを意味しており、このような2回計算するところが特徴となる。
In the present invention, by selecting the optical frequency that plays the role of the reference optical frequency in step S301-2 based on the scattered light intensity, it is possible to reduce vibration waveform distortion due to the influence of angle fluctuation caused by noise of the phase rotation angle α i . Also, in the case of this embodiment, the combination of optical frequencies selected as the reference optical frequency can change dynamically, so that when the reference optical frequency is different, the difference in phase offset may have an effect. To address this problem, in this embodiment, the
(第4の実施形態)
本実施形態では、図9を参照しながら、第3の実施形態の手順S302-1において、信号処理部17dが、基準光周波数fxを基準にして、取り得る全ての(i,x)について位相回転角度αi,xを計算する計算方法について説明する。
(Fourth embodiment)
In this embodiment, a calculation method in which the
手順S401-1:信号Ii(kt,z)と信号Qi(kt,z)から散乱光ベクトルri(kt,z)を計算する。例えば、虚数単位をjとして、以下で計算できる。
ri(kt,z)=Ii(kt,z)+j・Qi(kt,z) (411)
計算した散乱光ベクトルのデータを順次信号処理部17eにストリーミングする。
Step S401-1: Calculate scattered light vector r i (kt,z) from signal I i (kt,z) and signal Q i (kt,z). For example, with the imaginary unit j, it can be calculated as follows.
r i (kt, z)=I i (kt, z)+j・Q i (kt, z) (411)
The calculated scattered light vector data is sequentially streamed to the
手順S401-2:時刻ktの各光ファイバ地点における各光周波数fiの散乱光ベクトルri(kt,z)の角度θi(kt,z)を計算する。例えば、以下で計算できる。
θi(kt,z)=arg[ri(kt,z)] (412)
Step S401-2: Calculate the angle θ i (kt, z) of the scattered light vector r i (kt, z) of each optical frequency f i at each optical fiber point at time kt. For example, it can be calculated as follows.
θ i (kt, z)=arg[r i (kt, z)] (412)
手順S401-3:時刻ktの各光ファイバ地点における各光周波数fiの散乱光ベクトルri(kt,z)を、各光周波数fxを基準光周波数とした場合の位相回転角度-θx(kt,z)だけ回転させri_rot,x(kt,z)を計算する。例えば、以下で計算できる。
ri_rot,x(kt,z)=exp[-jθx(kt,z)]×ri(kt,z)
(413)
組み合わせ(i,x)について、全ての取りえる場合を計算する。
Step S401-3: Rotate the scattered light vector r i (kt, z) of each optical frequency f i at each optical fiber point at time kt by a phase rotation angle −θ x (kt, z) when each optical frequency f x is set as a reference optical frequency to calculate r i _rot,x (kt, z). For example, it can be calculated as follows.
r i_rot, x (kt, z) = exp [-jθ x (kt, z)] × r i (kt, z)
(413)
For the combination (i, x), all possible cases are calculated.
手順S401-4:時刻(k-2W-1)tから時刻(k-1)tまでのデータで計算した、基準光周波数がfxの時の時間平均ベクトルri_rot,x(kt,z)と、時刻(k-2W-1)tにおけるri_rot,x((k-2W-1)t,z)と、時刻ktにおけるri_rot,x(kt,z)とを用いて、基準光周波数がfxの時の時間平均ベクトルri_avet,x((k-W)t,z)を計算する。計算式は、以下が例示できる。
ri_avet,x((k-W)t,z)=ri_avet,x((k-W-1)t,z)
-ri_rot,x((k-2W-1)t,z)+ri_rot,x(kt,z)
(414)
Step S401-4: Using the time-average vector r i _rot,x (kt,z) when the reference optical frequency is f x , calculated using data from time (k-2W-1)t to time (k-1)t, r i _rot, x ((k-2W-1)t,z) at time (k-2W-1)t, and r i _rot,x (kt,z) at time kt, calculate the time-average vector r i _avet,x ((k-W)t,z) when the reference optical frequency is f x . The calculation formula can be exemplified as follows.
r i_avet,x ((k-W)t,z)=r i_avet,x ((k-W-1)t,z)
-r i_rot,x ((k-2W-1)t,z)+r i_rot,x (kt,z)
(414)
ただし、k=0からk=2Wまで測定することで窓長(2W+1)t以上時間窓のデータが得られるようになるため、k=2Wの場合には、時間平均ベクトルをk≦2Wまでのri_rot,x(kt,z)の加算として得る。計算式は、以下が例示できる。
k<2Wのデータについては予備測定とするか、従来技術1を使用し時間平均ベクトルを計算する。従来技術1を使用する場合、k<2Wの全ての時刻の時間平均ベクトルを、k=2Wにおける時間平均ベクトルに揃えることなどができる。つまり、次式が成立する。
ri_avet,x(kt,z)=ri_avet,x(Wt,z) (416)
組み合わせ(i,x)について、全ての取り得る場合を計算する。
For data of k<2W, a preliminary measurement is performed, or the time-averaged vector is calculated using the
r i_avet, x (kt, z) = r i_avet, x (Wt, z) (416)
For the combination (i, x), all possible cases are calculated.
手順S401-5、S401-6:時間平均ベクトルri_avet,x((k-W)t,z)から各光周波数fxが基準光周波数のときの各光周波数fiの位相回転角度αi,x((k-W)t,z)を、取り得る全ての(i,x)について計算し、信号処理部17eにストリーミングする。
Steps S401-5 and S401-6: From the time-averaged vector r i_avet,x ((k−W)t,z), calculate the phase rotation angle α i,x ((k−W)t,z) of each optical frequency f i when each optical frequency f x is the reference optical frequency for all possible (i, x), and stream the result to the
(その他の実施形態)
尚、上記実施形態例では、信号処理部17fと信号処理部17gの処理では、位相接続処理まで行った振動波形を平均しているが、位相接続処理を行う前に平均化を実施し、位相接続処理をする等して、本発明の本質を損なわない範囲で、具体的な計算手順の順序を入れ替えることもできる。
Other Embodiments
In the above embodiment, the vibration waveforms that have been subjected to the phase unwrapping process are averaged in the processing by the
尚、本実施形態例では、基準光周波数の選定に用いる時間窓の長さと、周波数平均に用いる最適な位相回転角度の更新に使用する時間窓の長さを同一としたが、同一としない場合であっても、本発明の趣旨を変更しない範囲で、本実施形態例と同様に本発明を実施することができる。 In this embodiment, the length of the time window used to select the reference optical frequency is the same as the length of the time window used to update the optimal phase rotation angle used for frequency averaging. However, even if they are not the same, the present invention can be implemented in the same manner as this embodiment, as long as the gist of the present invention is not changed.
尚、本実施形態例は、先願発明2をベースに先願発明3を実装した際に、さらに本発明を適用する具体的な実施手順を記載した。しかし、先願発明3は先願発明2をベースとするものに限定されず、先願発明1やその他の周波数多重の信号をベクトル状態で平均する手法をベースとする場合に広く適用が可能であり、それらの各計算方法に対して、本発明を適用することが可能である。
In addition, this embodiment describes a specific implementation procedure for applying the present invention when
本開示の信号処理装置はコンピュータとプログラムによっても実現でき、プログラムを記録媒体に記録することも、ネットワークを通して提供することも可能である。本開示のプログラムは、本開示に係る信号処理装置に備わる各機能部としてコンピュータを実現させるためのプログラムであり、本開示に係る信号処理装置が実行する方法に備わる各ステップをコンピュータに実行させるためのプログラムである。 The signal processing device of the present disclosure can also be realized by a computer and a program, and the program can be recorded on a recording medium or provided via a network. The program of the present disclosure is a program for realizing a computer as each functional unit of the signal processing device of the present disclosure, and is a program for causing a computer to execute each step of the method executed by the signal processing device of the present disclosure.
1:CW光源
2:カプラ
3:光変調器
4:光パルス
5:サーキュレータ
6:被測定光ファイバ
7:90度光ハイブリッド
13、14:バランス検出器
15、16:電気信号
17:信号処置装置
17a、17b:AD変換機能素子
17c、17d、17e、17f、17g:信号処理部
31:測定装置
1: CW light source 2: Coupler 3: Optical modulator 4: Optical pulse 5: Circulator 6: Optical fiber to be measured 7: 90 degree
Claims (4)
前記信号処理装置は、周波数多重されている複数の光周波数のなかから基準光周波数を選択し、前記複数の光周波数の測定データで得られる散乱光ベクトルのうちの該基準光周波数を基準として他の光周波数の散乱光ベクトルを回転させた後に、前記複数の光周波数の散乱光ベクトルの平均化を行う機能部を備え、
前記機能部は、前記基準光周波数の選択において、前記散乱光の強度がより大きい光周波数を時間的に追跡して動的に選択する、
装置。 a signal processing device that calculates a vibration waveform using measurement data of scattered light that is generated when the frequency-multiplexed optical pulse is reflected or scattered by an optical fiber;
the signal processing device comprises a functional unit which selects a reference optical frequency from among a plurality of frequency-multiplexed optical frequencies, rotates scattered light vectors of other optical frequencies among scattered light vectors obtained from measurement data of the plurality of optical frequencies using the reference optical frequency as a reference, and then averages the scattered light vectors of the plurality of optical frequencies;
The functional unit dynamically selects a reference light frequency by tracking a light frequency at which the intensity of the scattered light is greater over time in selecting the reference light frequency.
Device.
選択された前記基準光周波数の散乱光ベクトルを用いて、異なる時刻の前記複数の光周波数の散乱光ベクトルの平均化を行い、
前記平均化によって得られた異なる時刻の光周波数平均ベクトルの間の変化分に基づいて信号処理を行う、
請求項1に記載の装置。 The functional unit includes:
using the scattered light vector of the selected reference light frequency, averaging the scattered light vectors of the plurality of light frequencies at different times;
signal processing based on the change between the optical frequency average vectors at different times obtained by the averaging;
2. The apparatus of claim 1.
前記基準光周波数の選択が、前記時間窓内に含まれる散乱光ベクトルにおいて行われる、
請求項1に記載の装置。 The functional unit averages the scattered light vectors of the plurality of optical frequencies with scattered light vectors included in a predetermined time window,
the selection of the reference light frequency is performed on a scattered light vector included within the time window;
2. The apparatus of claim 1.
前記基準光周波数の選択が、前記時間窓内に含まれる散乱光ベクトルにおいて行われる、
請求項1に記載の装置。 the functional unit averages scattered light vectors of the plurality of optical frequencies using two or more optical frequencies among the plurality of optical frequencies included in a predetermined time window as a reference; and
the selection of the reference light frequency is performed on a scattered light vector included within the time window;
2. The apparatus of claim 1.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| PCT/JP2023/026036 WO2025017774A1 (en) | 2023-07-14 | 2023-07-14 | Signal processing method for phase otdr |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| PCT/JP2023/026036 WO2025017774A1 (en) | 2023-07-14 | 2023-07-14 | Signal processing method for phase otdr |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| WO2025017774A1 true WO2025017774A1 (en) | 2025-01-23 |
Family
ID=94281956
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| PCT/JP2023/026036 Pending WO2025017774A1 (en) | 2023-07-14 | 2023-07-14 | Signal processing method for phase otdr |
Country Status (1)
| Country | Link |
|---|---|
| WO (1) | WO2025017774A1 (en) |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2020169904A (en) * | 2019-04-03 | 2020-10-15 | 日本電信電話株式会社 | Phase measurement method and signal processing device |
| WO2020234989A1 (en) * | 2019-05-21 | 2020-11-26 | 日本電信電話株式会社 | Phase measurement method and signal processing device |
| JP2021512340A (en) * | 2018-06-28 | 2021-05-13 | エヌイーシー ラボラトリーズ アメリカ インクNEC Laboratories America, Inc. | Spatial noise removal for distributed sensors |
-
2023
- 2023-07-14 WO PCT/JP2023/026036 patent/WO2025017774A1/en active Pending
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2021512340A (en) * | 2018-06-28 | 2021-05-13 | エヌイーシー ラボラトリーズ アメリカ インクNEC Laboratories America, Inc. | Spatial noise removal for distributed sensors |
| JP2020169904A (en) * | 2019-04-03 | 2020-10-15 | 日本電信電話株式会社 | Phase measurement method and signal processing device |
| WO2020234989A1 (en) * | 2019-05-21 | 2020-11-26 | 日本電信電話株式会社 | Phase measurement method and signal processing device |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN112152725B (en) | Method and device for suppressing noise generated by instability of transmission signal | |
| US20170276470A1 (en) | Optical frequency domain reflectometer and optical frequency domain reflectometry | |
| US7009691B2 (en) | System and method for removing the relative phase uncertainty in device characterizations performed with a polarimeter | |
| KR20080042883A (en) | Apparatus, method and storage medium for performing polarization based orthogonal demodulation in optical coherence tomography | |
| EP2972409A1 (en) | System and method for increasing coherence length in lidar systems | |
| EP2136486A1 (en) | Optical receiving apparatus and method | |
| JP2004138615A (en) | System and method for making PMD measurements from coherent spectral analysis | |
| JP2003322588A (en) | Reflection type method and instrument for measuring brillouin spectrum distribution | |
| JP5412209B2 (en) | Optical frequency domain reflection measurement method and optical frequency domain reflection measurement apparatus | |
| WO2025017774A1 (en) | Signal processing method for phase otdr | |
| US7796326B1 (en) | Apparent incoherence method | |
| WO2019198485A1 (en) | Optical spectral line width calculation method, device, and program | |
| WO2024195025A1 (en) | Signal processing method in phase otdr | |
| WO2024166298A1 (en) | Signal processing method for phase-sensitive otdr | |
| JP7758212B2 (en) | Signal processing method in phase OTDR | |
| JP3866082B2 (en) | Method and apparatus for measuring characteristics of optical modulator | |
| NO330324B1 (en) | Method of calculating a template for the light propagation time difference for two light propagating pathways through a light propagating medium | |
| JP7405270B2 (en) | Vibration detection device and vibration detection method | |
| EP2972555A1 (en) | System and method for increasing coherence length in lidar systems | |
| JP2008039759A (en) | Optical measuring device and optical measuring method | |
| EP0702804A1 (en) | Optical beam amplitude modulation rate amplification device | |
| JP7648245B1 (en) | Relative phase difference compensation device, relative phase difference compensation method, and program | |
| WO2025191766A1 (en) | Signal processing device used in phase otdr | |
| WO2022024217A1 (en) | Sound measurement method | |
| WO2024028939A1 (en) | Optical line testing device and optical line testing method |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| 121 | Ep: the epo has been informed by wipo that ep was designated in this application |
Ref document number: 23945779 Country of ref document: EP Kind code of ref document: A1 |