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WO2025095803A1 - Filtre de protection contre la lumière local adaptatif - Google Patents

Filtre de protection contre la lumière local adaptatif Download PDF

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Publication number
WO2025095803A1
WO2025095803A1 PCT/RU2023/000358 RU2023000358W WO2025095803A1 WO 2025095803 A1 WO2025095803 A1 WO 2025095803A1 RU 2023000358 W RU2023000358 W RU 2023000358W WO 2025095803 A1 WO2025095803 A1 WO 2025095803A1
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WIPO (PCT)
Prior art keywords
channel
coordinate
light
modulator
along
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PCT/RU2023/000358
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English (en)
Russian (ru)
Inventor
Василий Александрович ЕЖОВ
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"3d Tekhvidenie" LLC
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"3d Tekhvidenie" LLC
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Priority claimed from RU2023128449A external-priority patent/RU2817108C1/ru
Application filed by "3d Tekhvidenie" LLC filed Critical "3d Tekhvidenie" LLC
Publication of WO2025095803A1 publication Critical patent/WO2025095803A1/fr
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    • GPHYSICS
    • G02OPTICS
    • G02CSPECTACLES; SUNGLASSES OR GOGGLES INSOFAR AS THEY HAVE THE SAME FEATURES AS SPECTACLES; CONTACT LENSES
    • G02C7/00Optical parts
    • G02C7/10Filters, e.g. for facilitating adaptation of the eyes to the dark; Sunglasses
    • GPHYSICS
    • G02OPTICS
    • G02FOPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/133Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements

Definitions

  • the invention relates to light-protective means for human vision (eyes) and for light-sensitive sensors of technical vision, in particular to mobile light-protective devices (for example, sunglasses), and can be used to ensure normal conditions for visual perception of the surrounding environment in the presence of interfering light of excessive brightness, for example, direct light from the solar disk in the field of vision (perception) of an external scene.
  • a locally adaptive light-protective filter is known [1], containing at least one light-protective modulator, at least one mini video camera and a processor unit, the control output of which is connected to the electrical input of the light-protective modulator, the input of the processor unit is connected to the output of the mini video camera, wherein the light-protective modulator contains in its aperture a matrix of MxN addressable modulation segments.
  • the input distribution of light brightness coming from the external scene passes through the light-protective modulator to the input of the pupil of the eye (the protected light-sensitive sensor). Simultaneously, the input distribution of light brightness is recorded using a mini video camera, at the output of which an electric video signal is formed with information on the distribution of light brightness in MxN local areas of the scene.
  • a control voltage is supplied from the output of the processor unit to the electric input of the light-protective modulator, causing the transition of its corresponding tn-th segment to the closed optical state, blocking the passage of excessively bright light into the pupil of the eye.
  • the disadvantage of the known device is the narrow dynamic range of recording the distribution of light brightness due to the limited dynamic range of the photosensitive matrix in the mini video camera, which, as a rule, is made on complex photoelectric structures with non-uniform physical properties across the aperture of the CCD (charge-coupled device) or CMOS (CMOS structure) type. "complementary metal-oxide-semiconductor").
  • CCD charge-coupled device
  • CMOS CMOS structure
  • the dynamic range of such structures in a miniature design required for use in a mobile sun protection device is insufficient for correct analysis of the distribution of light brightness in an external scene in the presence of direct sunlight, when the differences in light brightness are about 1000:1 or more.
  • the output of the light-protective modulator is connected to the input of the protected light-sensitive sensor, in the aperture of which all optical axes of the view intersect, while the matrix two-coordinate angle meter contains a sequentially located auxiliary matrix modulator with MxN modulation elements and a photodetector with uniform physical properties along the aperture, the shape of which corresponds to a quasi-point (“pinhole”) diaphragm, while the tn-th optical axis of the view intersects in the tn-th local region of the external scene with the tn-th central measuring axis, passing through the tn-th element of the auxiliary modulator into the aperture of the photodetector.
  • the matrix two-coordinate angle meter contains a sequentially located auxiliary matrix modulator with MxN modulation elements and a photodetector with uniform physical properties along the aperture, the shape of which corresponds to a quasi-point (“pinhole”) diaphragm, while the tn-th optical axis of the view intersect
  • each of the auxiliary matrix modulator opens in turn (changes from a closed optical state with maximum darkening to an open optical state with maximum enlightenment).
  • auxiliary matrix modulator opening different paths for light rays to pass into the photodetector at corresponding angles (determined by the location of each modulator element relative to the central optical axis of the quasi-point aperture of the photodetector).
  • a light beam from a source of excessively bright light located, for example, in the tn-th local region of the external scene, passes through the tn-th element of the aperture of the auxiliary matrix modulator to the input of the photodetector, which causes an information signal with an amplitude higher than a specified threshold level to appear at its output (in the corresponding tn-th working cycle of the device).
  • the photodetector of the device is made, for example, on the basis of a photosensitive pin structure operating at reverse polarity of the bias electric voltage on the resistor load, which ensures a linear dependence of the output (measuring) voltage in a very wide (about 10 5 : 1) dynamic range of the input light [3].
  • the pin photodetector quickly returns to the working state immediately after removing this overload, since the presence of a depleted i-semiconductor between the p- and n-semiconductors promotes rapid absorption of charge carriers and the exit of the entire pin junction from the state of temporary saturation.
  • the main disadvantage of the known device is the insufficient optical efficiency of obtaining samples of the input light brightness distribution in each of the MxN optical paths (measuring channels).
  • the reason is that in each working cycle only one of the elements of the auxiliary matrix modulator is open.
  • the energy of light passing through one such element of the aperture of the auxiliary matrix modulator is determined by the area of the aperture of this element, which is MN times smaller than the area of the full aperture of the auxiliary matrix modulator. Consequently, in each working cycle only 1/MN part of the input light energy gets to the input of the photo receiver.
  • Another disadvantage of the known device is the difficulty of obtaining a sufficiently large darkening difference in each element of the auxiliary matrix modulator.
  • a voltage of, for example, +U/2 is simultaneously applied to the m-th row and -U/2 to the n-th column of the matrix.
  • the m-th element of the normally closed (initially in the closed optical state) auxiliary modulator at the absolute value of voltage U, must go into the open optical state (into the state of complete enlightenment), while all the others the elements of the m-th row and n-n technically column of the matrix modulator, which are automatically under voltage U/2, must remain in the initial, closed optical state (in the state of maximum darkening).
  • the layer of the electro-optical working substance of the modulator must in this case be characterized by a very steep transient response, so that when the absolute value of the voltage changes in a narrow range from U/2 to U, it passes from one extreme optical state (corresponding to complete darkening of the modulator element) to another extreme state (corresponding to complete enlightenment of the element), which is problematic to implement in practice. Therefore, with passive row-column addressing, the actually achievable optical contrast is not high enough to ensure sufficient selective properties, taking into account the wide range of brightness of the input light.
  • each subsequent M x N element of the aperture of the auxiliary matrix modulator should be switched over the time t open from the closed to the open optical state only after the transition of the previous element from the open to the closed state over the time t close . Therefore, the total time of the two-coordinate measurement of the angles of the position of the source of excessively bright light is equal to a sufficiently long time MN (t open ++ t close ) of sequential sorting of all elements of the auxiliary matrix modulator.
  • the characteristic value of t open is a time of the order of tens to hundreds of milliseconds [4], which even for small values of MN (from 10 to 100) leads to a sufficiently long total time (units to tens of seconds) of measuring the brightness of light from the external scene.
  • the closest in technical essence to the claimed device is a locally adaptive light-protective filter [5], containing a light-protective modulator, an M-channel angle meter along the y coordinate, an N-channel angle meter along the x coordinate and a processor unit, wherein the M-channel angle meter along the y coordinate is made in the form of a sequentially located first cylindrical lens having a spherical curvature along the y coordinate, and a lattice of M linear uniform in aperture photodetectors located along the y coordinate at the focus of the first cylindrical lens, an N-channel angle meter along the x coordinate is made in the form of a sequentially arranged second cylindrical lens having a spherical curvature along the x coordinate, and an array of N linear uniform in aperture photodetectors located along the x coordinate at the focus of the second cylindrical lens, the light-protective modulator contains M addressable conductive line buses and N addressable conductive column buses, at the intersections of which MxN modulation segments are located, to which
  • each photodetector is filled with uniform physical properties across its aperture, which potentially allows for a high dynamic range of recording the intensity of the input light [3].
  • the speed of this device is determined better than in the known device [2], since the number of required working cycles in the first known device is determined by the larger of the numbers M and N, and in the second known device - by the number MxN.
  • Another disadvantage of the known device is the insufficiently wide dynamic range of suppression of interfering light.
  • the device adopted as a prototype uses active row-column addressing (with a separate electrically controlled transistor switch for each of the M*N modulation segments of the light-protective modulator in order to obtain a full voltage drop from 0 to U max on each modulation segment), then it is necessary to provide gaps (with a width of about 100 micrometers) between all modulation elements to accommodate the active elements
  • the known device is characterized by insufficient accuracy in determining the coordinates of the source of interfering light and a low dynamic range of suppression of interfering light.
  • the problem to be solved by the invention is to increase the accuracy of the device's operation by increasing the dynamic range of suppression of interfering light while maintaining a high quality of view of the surrounding space.
  • N-channel angle meter along the x-coordinate and a processor unit N-channel angle meter along the x-coordinate and a processor unit
  • the M-channel angle meter along the y-coordinate is made in the form of a sequentially located angular selector of ⁇ -channels and the first photoreceiver module,
  • the N-channel angle meter along the x-coordinate is made in the form of a sequentially located x-channel angular selector and a second photodetector module, wherein the first and second inputs of the processor unit are connected to the outputs of the first and second photodetector modules, respectively, and at least one information output of the processor unit is connected to the electrical input of the light-shielding modulator, containing in its aperture MxN modulation segments, to which MxN optical viewing axes correspond, the tn-th of which passes through the tn-th segment of the light-shielding modulator and the tn-th local region of the external scene (t 1, 2, ..., M; n
  • the output of the light-shielding modulator is optically coupled to the input of the protected light-sensitive sensor, in the aperture of which M x N optical viewing axes intersect, is solved in that the angular selector of the y-channels is made in the form of a shadow y-selector, the angular selector of the x-channels is made in the form of a shadow x-selector, wherein in the shadow y-selector M central measuring planes for the angle along the y coordinate (hereinafter referred to as y-CMP) mutually intersect, and in the shadow x-selector N central measuring planes for the angle along the x coordinate (hereinafter referred to as x-CMP) mutually intersect, wherein the light-shielding modulator is made with individual electrical addressing of each of the M x N modulation segments, the processor unit is made with M x N information outputs, which are connected to the corresponding electrical inputs MXN of
  • the shadow y-selector is implemented in the form of a sequentially located M-channel auxiliary modulator and a rear slit diaphragm with selection along the y coordinate (hereinafter referred to as the rear slit diaphragm with ⁇ -selection), and the shadow x-selector is implemented in the form of a sequentially located N-channel auxiliary modulator and a rear slit diaphragm with selection along the x coordinate (hereinafter referred to as the rear slit diaphragm with x-selection), the first (second) photodetector module is implemented in the form of a first (second) photodetector, wherein the M-channel auxiliary modulator (N-channel auxiliary modulator) is implemented with at least one group of M modulation elements (N modulation elements), M y-CIP (N x-CIP) intersect on the long central line of the rear slit diaphragm with y-se
  • the light-shielding modulator, the M-channel auxiliary modulator and the N-channel auxiliary modulator contain a front linear polarizer, a front LC layer, an intermediate linear polarizer, a rear LC layer and a rear linear polarizer, wherein the polarization direction of the intermediate linear polarizer is orthogonal to the polarization directions of the front and rear linear polarizers.
  • the M-channel auxiliary modulator is implemented with a first group of M address strip electrodes for the front LC layer and with a second group of M address strip electrodes for the rear LC layer
  • the N-channel auxiliary modulator is implemented with a first group of N address strip electrodes for the front LC layer and with a second group of N address strip electrodes for the rear LC layer
  • the long central lines of the m-th address strip electrodes for the front and rear LC layers of the M-channel auxiliary modulator, corresponding to its m-th modulation element are in the m-th y-CIP
  • the long central lines of the n-th address strip electrodes for the front and rear LC layers of the N-channel auxiliary modulator, corresponding to its n-th modulation element are in the n-th x-CIP
  • the length and width of each address strip electrode of the M-channel auxiliary modulator is directly
  • the shadow y-selector is made in the form of a front slit diaphragm with y-selection
  • the shadow x-selector is made in the form of a front slit diaphragm with x-selection
  • M y-CIPs intersect on the long central line of the front slit diaphragm with y-selection
  • N x-CIPs intersect on the long central line of the front slit diaphragm with x-selection
  • the first photodetector module is made in the form of an M-channel array of photodetectors
  • the second photodetector module is made in the form of an N-channel array of photodetectors, wherein the center of the aperture of the m-th photodetector of the M-channel array of photodetectors is located in the m-th y-CIP, and the center of the aperture of the i-th photodetector of the N-
  • the photodetectors of the M-channel array of photodetectors are located in the first plane, and the photodetectors of the N-channel array of photodetectors are located in the second plane, orthogonal to the first plane.
  • the photodetectors of the M-channel array of photodetectors are located along the first circle with the center in the middle of the slit of the front slit diaphragm with y-selection, and the photodetectors of the N-channel array of photodetectors are located along the second circles with the center in the middle of the slit of the frontal slit diaphragm with x-selection, where the plane of the first circle is orthogonal to the plane of the second circle.
  • the first technical result achieved consists of increasing the accuracy of operation of single-coordinate angle meters along the y-coordinate and x-coordinate due to the absence of optical aberrations in the shadow y-selector and shadow x-selector for any values of the angles of light arrival.
  • the second technical result achieved consists in increasing the maximum darkening value in each element of the light-protective modulator in its closed state while maintaining the maximum value of its transparency in the open state due to individual electrical control of each modulation element of the light-protective modulator from the corresponding output of the processor unit.
  • a minimum width (from units to tens of micrometers) of gaps between the segments is required, which corresponds to the minimum value of the transmitted light in the darkened state of the light-protective modulator (insignificant for the perception of the light-sensitive sensor).
  • a minimum value of about 0.1% of optical transmission is ensured in a significantly wider (at least 5 times) angular range of selection by angles of arrival of light rays from the external scene compared to modulators on single-layer LC structures.
  • this is mainly due to the multiplication of the characteristics of two sequentially located single-layer amplitude modulators.
  • the combination of the first technical result (increasing the accuracy of single-coordinate angle meters) and the second technical result (increasing the degree of darkening of the light-shielding modulator in the closed state while maintaining the maximum transparency of the light-shielding modulator in the open state) ensures the solution of the stated problem of increasing the accuracy of measuring the angles of arrival of interfering light while expanding the dynamic range of suppression of interfering light while maintaining the quality of the view of the surrounding space for the protected light-sensitive sensor.
  • Fig. 1 general diagram of the device.
  • Fig. 2 general view of corner selectors.
  • FIG. 3 diagram of the first particular version of the device.
  • Fig. 4 diagram of optical paths in the n-th modulation segment of the light-shielding modulator.
  • Fig. 5 diagram of optical paths in the m-th channel of the M-channel angle of arrival meter of light along the y coordinate.
  • Fig. 6 diagram of optical paths in the n-th channel of the N-channel angle of arrival meter of light along the x coordinate.
  • Fig. 7 - an example of a specific implementation of the n-th channel of the N-channel angle of arrival meter of light along the x coordinate.
  • Fig. 8 optical diagram of the channels for measuring the angle of arrival of light along the x coordinate.
  • Fig. 9 optical diagram of the channels for measuring the angle of arrival of light along the coordinate
  • Fig. 10 geometry of addressable conductive segments and modulation segments in the front and rear LC layers of the light-protective modulator when operating with one closed modulation segment and the remaining modulation segments open.
  • Fig. 11 distribution maps of the characteristic value of the minimum optical transmission (darkening) of a closed LC modulator depending on the value of the angle of arrival of light in the presence of one or two LC layers in the modulator.
  • Fig. 12, 13 optical diagrams of the M-channel angle meter along the y coordinate (with a shadow y-selector) and the N-channel angle meter along the x coordinate (with a shadow x-selector) in the first example of a specific implementation of the second particular version of the device.
  • Fig. 14, 15 optical diagrams of the M-channel angle meter along the y coordinate (with a shadow y-selector) and the N-channel angle meter along the x coordinate (with a shadow x-selector) in the second example of a specific implementation of the second particular version of the device.
  • the device (Fig. 1) contains at least one light-protective modulator 1,
  • N-channel ⁇ x -meter 3 of the angle ( ⁇ x , of light arrival along the x-coordinate (hereinafter referred to as N-channel ⁇ x -meter 3) and processor unit 4.
  • N-channel ⁇ x -meter 3 of the angle ( ⁇ x , of light arrival along the x-coordinate
  • processor unit 4 At the output of light-shielding modulator 1 there is a protected light-sensitive sensor 5, for example, the pupil of the human eye.
  • Optical viewing axis with number tn, with an angle along the x-coordinate and with an angle along the y-coordinate passes successively through the center of the aperture (pupil) of the protected light-sensitive sensor 5, the center of the m-th modulation segment of the light-protective modulator 1 and the center of the m-th local region of the external scene.
  • the direction of the x-coordinate and the direction of the y-coordinate coincide with the direction of orientation of the virtual lines and virtual matrices of the individually electrically MxN modulation segments in the aperture of the light-protective modulator 1.
  • Fig. 2 shows the M-channel ⁇ y -meter 2 (on the left in the figure), containing a sequentially located shadow y-selector 21 and the first photodetector module 2 2 , as well as an N-channel ⁇ x meter 3 (on the right), containing a shadow x-selector 31 and a second photodetector module 3 2 .
  • the first and second inputs of the processor unit 4 are connected to the outputs of the first photoreceiving module of the M-channel ⁇ y -meter 2 and the second photoreceiving module of the N-channel ⁇ x -meter 3, respectively.
  • M central measuring planes for the angle ⁇ y (hereinafter referred to as CMP for ⁇ n ) pass through the M-channel ⁇ y -meter 2
  • M central measuring planes for the angle ⁇ y (hereinafter referred to as CMP for ⁇ n ) pass through the
  • An N-channel angle meter ⁇ passes through N central measuring planes for the angle ⁇ x (hereinafter referred to as CMP for ⁇ x ).
  • CMP for ⁇ x N central measuring planes for the angle ⁇ x
  • the m-th CMP for ⁇ and the n-th CMP for ⁇ x intersect at the center of the m-th local region of the external scene.
  • the optical axis with the angle ⁇ m y (as part of the m-th CMP for ⁇ m y ) and the optical axis with the angle ⁇ x n (as part of the n-th CMP for ⁇ x ) intersect at the center of the m-th local region of the external scene.
  • the shadow y-selector 7 is made in the form of a sequentially located M-channel auxiliary modulator 7 1 (equipped with at least one group of M modulation elements) of the rear slit diaphragm 7 2 with selection along the y coordinate (hereinafter referred to as the front diaphragm 7 2 with y-selection), the first photodetector module is made in the form of the first photodetector 8, the shadow x-selector 9 is made in the form of a sequentially located N-channel auxiliary modulator 9 (equipped with at least one group of N modulation elements), and the second photodetector module is made in the form of a rear slit diaphragm 9 2 with selection along the x coordinate (hereinafter referred to as the front diaphragm 9 2 with x-selection) and the second photodetector 10.
  • the M CIPs for f intersect on the long central line of the rear diaphragm 7 2 with y-selection
  • N CIPs for ⁇ x intersect at the center line of the rear slit diaphragm 9 2 with x-selection.
  • the long center line of the m-th modulation element of the M-channel auxiliary modulator 71 is directed along the x-coordinate and is located in the m-th CIP for the long center line of the n-th modulation element of the N-channel auxiliary modulator 9 1 is directed along the y-coordinate and is located in the n-th CIP for ⁇ x
  • N-channel auxiliary modulator 91 are connected to the control output of the processor unit 4.
  • the m-th channel of the M-channel angle meter along the y coordinate corresponds to the optical path from the aperture of the m-th modulation element M-channel auxiliary modulator to the aperture of the first photodetector
  • the n-th channel of the N-channel angle meter along the y coordinate corresponds to the optical path from the aperture of the n-th modulation element of the N-channel auxiliary modulator to the aperture of the second photodetector.
  • the light-shielding modulator 1, the M-channel auxiliary modulator 71 and the N-channel auxiliary modulator 91 contain a front linear polarizer, a front liquid crystal layer LCD1 (hereinafter referred to as the LCD1 layer), an intermediate linear polarizer, a rear liquid crystal layer LCD2 (hereinafter referred to as the LCD2 layer) and a rear linear polarizer, wherein the polarization direction of the intermediate linear polarizer is orthogonal to the polarization directions of the front and rear linear polarizers.
  • the light-shielding modulator 1 includes a first group of MxN address segment electrodes for the LCD1 layer and a second group of MxN address segment electrodes for the LCD2 layer, electrical addressing of the tn-th modulating segment (Fig. 4) is carried out using the first tn-th address segment electrode in the LCD1 layer and using the second tn-th address segment electrode - in the LC2 layer (for simplicity, the LC layers and polarizers are not shown).
  • H horizontal (vertical ) the size of the second address segment electrode is directly proportional to the distances and these A address electrodes to the aperture of the protected light-sensitive sensor 5.
  • Angles 6 are the full angles of perception (viewing) of objects of the external scene protected by the light-sensitive sensor (the pupil of the eye) 5 along the coordinates x and y, respectively.
  • the M-channel auxiliary modulator 71 includes a first group of M address strip electrodes for the layer LC1 and a second group of M address strip electrodes for the layer LC2, wherein electrical addressing in the m-th strip modulation segment of the M-channel auxiliary modulator 71 (Fig. 5) is carried out using the first m-th address strip electrode in the layer LC1 and with the help of the second m-th address strip electrode in the layer LCD2.
  • the central axis of the m -th channel for measuring the angular position of the source b of excessively bright light along the y-coordinate, connecting the center of the input of the first photodetector 8 with the center of the m-th local region of the external scene, has an angular coordinate and passes through the centers of the address strip electrodes
  • the angular coordinate can take any value in the corresponding partial (within the m-th channel) viewing angle Full horizontal angle ⁇ x
  • the perception range for the first photodetector 8 covers the entire external scene horizontally and is the same for each of the M channels for measuring the angle ⁇ y .
  • the N-channel auxiliary modulator 9 includes a first group of N address strip electrodes for the LCD1 layer and a second group of N address strip electrodes for the LCD2 layer, wherein electrical addressing in the n-M strip modulation segment (Fig. 6) is carried out using the first address strip electrode in the LCD1 layer and using the second address vertical electrode in the LC2 layer (LC layers and polarizers are not shown).
  • the length (width of the first address strip electrode and length (width of the second address strip electrode are directly proportional to the distances of these electrodes to the rear slit diaphragm with x-filtration. Long central the lines of n-th address strip electrodes are located on the n-th CIP for ⁇ x .
  • the central axis of the n-th channel for measuring the angular position of the source 6 of excessively bright light, connecting the center of the input of the second photodetector 10 with the center of the n-th local region of the external scene, has an angular coordinate and passes through the centers addressable strip electrodes e
  • the angular coordinate can take any value in the partial (within the n -th channel) viewing angle
  • the full vertical angle ⁇ y of perception for the second photodetector 10 covers the entire external scene vertically and is the same for each of the N angle measurement channels along the x coordinate.
  • the structure of the n-th angle measurement channel (Fig. 7) contains a frontal linear polarizer P1, layer LC1, intermediate linear polarizer P2, layer
  • Layers LCD1 and LCD2 are provided with first and second address strip electrodes, respectively, located on one side corresponding layers of LC1 and LC2. On the opposite side of each of the layers of LC1 and LC2 there are common electrodes with zero potential. Each address electrode has an electrical input for supplying a control voltage U, creating the lines of force of the electric field E across those sections of the layers LC1 and LC2 that are located under the corresponding address electrodes.
  • the topologies of all the strip modulation elements in the layers LC1 and LC2 for each of the M and N channels for measuring the angle along the x coordinate are determined by the topologies of the corresponding address strip electrodes in these channels.
  • the n-th measuring channel contains the n-th LC modulation element of the N-channel auxiliary modulator 9 1 which consists of two successively located n-th LC modulation subelements.
  • the first n-th LC modulation subelement of the N-channel auxiliary modulator 91 contains sections of the input linear polarizer P1, the LC1 layer and the second linear polarizer P2 corresponding to each other, where the topology of the section of the LC1 layer is determined by the topology of the first address strip electrode.
  • the second n-th LC modulation the subelement of the N-channel auxiliary modulator 9 1 contains sections of the second linear polarizer P2, the layer LCD2 and the third linear polarizer P3 corresponding to each other, where the topology of the section of the layer LCD2 is determined by the topology of the second address strip electrode
  • the width of the address strip electrodes increases as they move away from the central channel to the peripheral ones with a flat configuration of the LC layers (modulators).
  • the transmittance value T on the map on the left refers to a modulator on a single LC layer, and the transmittance value T on the right refers to a modulator on two LC layers.
  • the M-channel ⁇ x -meter is made with a shadow x-selector in the form of a front slit diaphragm x-selection and with N-channel photodetector array located in the first plane PL1 , where N CIP for ⁇ x mutually intersect on the long central line of the front slit diaphragm S x , the center of the aperture of the n-th photodetector is located in the n-th CPC for ⁇ x , and the N-channel ⁇ -meter is made with a shadow y-selector (Fig. 13) in the form of a frontal slit diaphragm with y-selection and with an M-channel array of photodetectors located in the plane PL2, where M
  • the CIPs for ⁇ y intersect each other on the long central line of the front slit diaphragm with y-selection, the center of the aperture of the m -th photodetector is located in the m-th CIP for , and the plane PL1 is orthogonal to the plane PL2.
  • the second example of a specific implementation of the second particular variant of the device differs from the first specific implementation variant in that the photodetectors of the N-channel photodetector array are arranged circle 01 (Fig. 14), and the photo receivers of the M-channel array of photo receivers are located along the circle 02 (Fig. 15), while the plane the location of circle 01 is orthogonal to the plane of location of circle 02, the plane of aperture of n -th photodetector orthogonal to the 77th CIP for f x , and the aperture plane of the m-th photodetector orthogonal to the m -th CIP for ⁇ y .
  • the operation of the device is carried out as follows.
  • the distribution of the brightness of the input light from the external scene is modulated by the light-shielding modulator 1 and simultaneously the input light enters the M-channel ⁇ y -meter 2 and the N-channel ⁇ x -meter 3 (Fig. 1, 2), from the outputs of which the electrical signals enter the first and second inputs of the processor unit 4.
  • the modulated light from the output of the light-shielding modulator 1 goes to the input of the light-sensitive sensor (pupil of the eye) 5.
  • the m -th and 77 -th electrical signals with amplitudes exceeding the specified threshold level at the inputs of the processor unit are formed, respectively.
  • a control voltage is generated that ensures the transition of this modulation segment from open into a closed (completely darkened) optical state, which ensures blocking the entry of light with excess brightness from the mn -th local region of the external scene into the light-sensitive sensor 5.
  • the peculiarity of the operation of the device in the first particular embodiment consists in the specific operation of the M-channel ⁇ y -meter 2 and the N-channel ⁇ y -meter 3, consisting in sequentially switching to the open state of each of the M band modulation elements in the M-channel auxiliary modulator 7 1 and each of the N band modulation elements in the N-channel auxiliary modulator 9 1 while implementing, respectively, y-selection using the diaphragm 7 2 and x-selection using the diaphragm 9 2 with registration in the memory of the processor unit 4 of the results of the selection of levels of electrical signals exceeding a specified threshold level, in each of the M channels at the output of the photodetector 8 and in each of the N channels at the output of the photodetector 10.
  • This rotation is caused, for example, by the waveguide effect of optical activity in the layer of nematic LC molecules twisted by 90° with positive dielectric anisotropy [7].
  • the linear polarization vector of the light at the output of the first linear polarizer P1 is directed, for example, horizontally (according to the drawing in Fig. 7)
  • the section of the LC1 layer located under the first address strip electrode will provide a rotation vector of linear polarization of the output light in the direction orthogonal to the plane of the drawing and coinciding with the direction of polarization of the second linear polarizer P2. Therefore, from the output of the considered section of the layer LC1, the light will pass the second linear polarizer P2 without noticeable attenuation.
  • the first LCn-modulation subelement of the N-channel auxiliary modulator 91, corresponding to the first address strip electrode is in the open optical state (Fig.
  • the second n-th LCD modulation subelement of the N-channel auxiliary modulator 9c corresponding to the second address strip electrode is also in the open optical state, since the corresponding section of the layer LC2 rotates the linear polarization vector of the light coming from the output of the second linear polarizer P2 by 90°, ensuring parallelism of the linear polarization vector of the transmitted light to the direction of the linear polarization of the third linear polarizer P3.
  • the remaining N-1 LC modulation elements of the N-channel auxiliary modulator 91 are in a closed optical state, since the control voltage is applied to the corresponding address strip electrodes relative to the common electrodes (Fig.
  • each of the corresponding N-1 modulation elements of the N-channel auxiliary modulator 9 1 turns out to be closed due to strong attenuation of light in two pairs of linear polarizers Pl, P2 and P2, P3 with mutually crossed polarization directions in each pair.
  • the m-th strip modulation element (consisting of the first and second m-th LCD modulation subelements corresponding to the first and second address strip electrodes of the M-channel auxiliary modulator 7,), is in an open optical state for light coming from source 6 with excess brightness, which corresponds to a partial central angle along the y coordinate, which is in the range of angles (Fig. 9).
  • the open optical state of the considered m-th LC modulation subelements is ensured in the m-th working cycle due to the low (zero) level of the control voltage U, which is below the threshold of reorientation of LC molecules in the corresponding sections of the layers LC1 and LC2.
  • the remaining M-1 pairs of address electrodes are in the closed state, since the control voltage is applied to them creating an electric field E, the lines of force of which cause the reorientation of the LC molecules in the direction across the planes of the LC1 and LC2 layers.
  • This voltage is supplied to the individually electrically addressed tn-th modulation segment of the light-protective modulator 1, transferring this segment to a closed optical state with maximum darkening, which ensures the blocking of the optical path from the tn-th local region of the scene, where the source 6 of the interfering light is located, to the protected light-sensitive sensor 5
  • Fig. 8 shows the situation with open modulation elements of the four-channel auxiliary modulator 91 (five-channel auxiliary modulator 71), corresponding to the address strip electrodes, when light from the external scenes with excessive brightness levels come at a central angle within partial angle to the input of the photodetector 8 (at a central angle of within the partial angle at the photodetector input 10).
  • the processor unit 4 for optical closing of the corresponding modulation LCD segment of the light-protective modulator 1, the processor unit 4 generates a control voltage supplied to the corresponding address segment electrodes (Fig.
  • the angular dimensions of the source 6 of excessively bright light exceed the partial viewing angles for the n-th and/or m-th angle measurement channels, respectively along the coordinates x and/or y, then simultaneously at the output of at least one of the other adjacent channels for measuring angular coordinates (into whose partial viewing angle the interfering light from source 6 will fall) an electrical signal with an amplitude level higher than the threshold level will appear, which will lead, in addition to the darkening of the m-th modulation segment of the light-protective modulator 1, to the simultaneous darkening of the corresponding adjacent modulation segments.
  • modulator (Fig. 11, right) with the angle measured at 0° from the normal to the modulator aperture.
  • a modulator on a single LC layer of a similar type with two (input and output) crossed linear polarizers provides significantly smaller operating ranges of these angles - up to ⁇ 15° (Fig. 9, left), but with greater optical efficiency in the open state due to a smaller number of light-modulating layers.
  • the specific values of the maximum operating ranges of angles and optical efficiency of the light-shielding modulator 1 depend on the electro-optical material used for the light-modulating layer.
  • the choice of the slit width of the slit diaphragms is a compromise; a smaller the width of each slit leads to a smaller value of the angular spread of the rays (to a further increase in the accuracy of determining the angle along the corresponding coordinate), but reduces the optical efficiency of the measuring channels.
  • the device can be made, for example, in the form of light-protective glasses or as a light-protective (sun-protective) filter at the input of an augmented reality device.
  • nematic LC structures for example, in the form of twist, supertwist or ⁇ (pi) structures [7-9].
  • Any other optical material with suitable electro-optical characteristics can be used as a working electro-optical substance in the light-protective modulator and in auxiliary modulators.
  • Photodiode TEMD5510FX01 // Vishay Semiconductors data sheet.

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Abstract

L'invention concerne des dispositifs mobiles de protection contre la lumière pour la vision d'une personne et pour des capteurs photosensibles de vision technique. Le filtre comprend au moins un modulateur de protection contre la lumière, au moins une unité de mesure à M canaux de l'angle d'incidence de la lumière le long des coordonnées x se présentant sous forme d'un sélecteur y d'ombre et d'un premier module photo-récepteur disposés en série, une unité de mesure à N canaux de l'angle d'incidence de la lumière le long des coordonnées y se présentant sous forme d'un sélecteur x d'ombre et d'un second module photo-récepteur disposés en série, ainsi qu'une unité de processeur dont les entrées sont connectées aux sorties des unités de mesure dangle, tandis que les sorties sont connectées à M x N éléments de modulation adressables individuellement du modulateur de protection contre la lumière auxquels correspondent M x N axes optiques d'observation dont le mnème passe par le mnème segment du modulateur de protection contre la lumière et la mnème région locale de la scène externe (m=1, 2,..., М; n=1, 2,..., N), et la sortie du modulateur de protection contre la lumière est connectée optiquement à l'entrée du capteur photosensible à protéger; la fonction de transfert de l'unité de processeur pour le mn-ème élément de modulation du modulateur de protection contre la lumière correspond à la fonction logique N depuis la sortie du mème canal de l'unité de mesure de à M canaux de l'angle le long des coordonnées y et depuis la sortie du nème canal de l'unité de mesure à N canaux de l'angle le long des coordonnées х. Le résultat technique consiste en une augmentation de la précision de fonctionnement du dispositif grâce à l'absence d'aberrations optiques dans les sélecteurs x- et y d'ombre, et une augmentation de la plage dynamique de suppression de la lumière interférente grâce à l'organisation de l'adresse individuelle des M x N éléments de modulation du modulateur de protection contre la lumière et l'organisation des M x N sorties de l'unité de processeur avec les fonctions correspondantes.
PCT/RU2023/000358 2023-11-02 2023-12-14 Filtre de protection contre la lumière local adaptatif Pending WO2025095803A1 (fr)

Applications Claiming Priority (2)

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RU2023128449A RU2817108C1 (ru) 2023-11-02 Локально-адаптивный светозащитный фильтр
RU2023128449 2023-11-02

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Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20100026917A1 (en) * 2008-08-04 2010-02-04 Wen Walter Y Automatic darkening and glare reducing liquid crystal mirror
RU2482526C1 (ru) * 2011-10-13 2013-05-20 Василий Александрович ЕЖОВ Способ светозащитной фильтрации с зональной адаптацией и устройство для его осуществления
RU2600509C2 (ru) * 2015-02-19 2016-10-20 Геннадий Викторович Мамаев Противоослепляющее устройство
US20170023802A1 (en) * 2015-07-23 2017-01-26 Valeo Vision Anti-glare spectacles provided with an automatic switching device

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20100026917A1 (en) * 2008-08-04 2010-02-04 Wen Walter Y Automatic darkening and glare reducing liquid crystal mirror
RU2482526C1 (ru) * 2011-10-13 2013-05-20 Василий Александрович ЕЖОВ Способ светозащитной фильтрации с зональной адаптацией и устройство для его осуществления
RU2600509C2 (ru) * 2015-02-19 2016-10-20 Геннадий Викторович Мамаев Противоослепляющее устройство
US20170023802A1 (en) * 2015-07-23 2017-01-26 Valeo Vision Anti-glare spectacles provided with an automatic switching device

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