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WO2025058071A1 - Scintillator and radiation detector - Google Patents

Scintillator and radiation detector Download PDF

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Publication number
WO2025058071A1
WO2025058071A1 PCT/JP2024/032946 JP2024032946W WO2025058071A1 WO 2025058071 A1 WO2025058071 A1 WO 2025058071A1 JP 2024032946 W JP2024032946 W JP 2024032946W WO 2025058071 A1 WO2025058071 A1 WO 2025058071A1
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Prior art keywords
scintillator
light
less
crystal
amount
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French (fr)
Japanese (ja)
Inventor
公治 佐藤
健之 柳田
範明 河口
大介 中内
宏之 福嶋
優馬 竹渕
賢政 市場
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Kyocera Corp
Nara Institute of Science and Technology NUC
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Kyocera Corp
Nara Institute of Science and Technology NUC
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    • CCHEMISTRY; METALLURGY
    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09KMATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FOR ELSEWHERE
    • C09K11/00Luminescent, e.g. electroluminescent, chemiluminescent materials
    • CCHEMISTRY; METALLURGY
    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09KMATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FOR ELSEWHERE
    • C09K11/00Luminescent, e.g. electroluminescent, chemiluminescent materials
    • C09K11/08Luminescent, e.g. electroluminescent, chemiluminescent materials containing inorganic luminescent materials
    • C09K11/77Luminescent, e.g. electroluminescent, chemiluminescent materials containing inorganic luminescent materials containing rare earth metals
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01TMEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16Measuring radiation intensity
    • G01T1/20Measuring radiation intensity with scintillation detectors
    • G01T1/202Measuring radiation intensity with scintillation detectors the detector being a crystal

Definitions

  • the present invention relates to a scintillator and a radiation detector.
  • Scintillators are substances that emit light when exposed to radiation such as X-rays and gamma rays, and are used to measure radiation in combination with a photodetector.
  • Patent Document 1 describes a single crystal for scintillators that contains a cerium-activated orthosilicate compound as one such scintillator material.
  • the scintillator according to the present disclosure has a composition represented by the following formula (I) and contains Ce and Al, with the Al content being 0.001 mass % or more and 0.01 mass % or less.
  • x satisfies 0.05 ⁇ x ⁇ 0.4
  • y satisfies 0.15 ⁇ y ⁇ 0.40.
  • the radiation detector according to the present disclosure includes the above-mentioned scintillator and a light receiving element.
  • the main characteristics of a scintillator are its light emission output and its scintillation decay time constant.
  • scintillators are used for medical imaging diagnostics such as CT (computed tomography) and PET (positron emission tomography)
  • CT computed tomography
  • PET positron emission tomography
  • scintillators that have a large light emission output and a short scintillation decay time constant (short fluorescence lifetime).
  • the wiring board according to the present disclosure has the configuration described in the section on means for solving the above problems, which allows for a large amount of light emission and a short fluorescence lifetime.
  • a scintillator is a substance that emits light when irradiated with radiation such as X-rays and gamma rays.
  • a scintillator is used in combination with a photodetector to measure radiation.
  • the main characteristics of a scintillator are its light emission output and its scintillation decay time constant. As mentioned above, when a scintillator is used for medical imaging diagnosis, it is required to improve image quality, reduce the subject's exposure to radiation, and shorten the examination time. To meet these demands, the scintillator must have a high light emission output and a short scintillation decay time constant (short fluorescence lifetime).
  • the light yield of a scintillator means the number of photons generated from the scintillator per unit energy of the irradiated radiation.
  • the unit of emission is photons/MeV.
  • the light yield is measured by evaluating the light emitted from the scintillator irradiated with radiation by a single photon counting method.
  • the "light yield” means the light yield measured by irradiating the scintillator with gamma rays of about 662 keV from a 137 Cs source.
  • the scintillation decay time constant is obtained from the fluorescence decay curve (scintillation decay curve) of the scintillator when it is irradiated with radiation.
  • the luminescence intensity of the scintillator generally decays exponentially.
  • the scintillation decay time is calculated by detecting the luminescence obtained by irradiating the scintillator with gamma rays of about 662 keV from a 137 Cs source with a high-speed PMT and measuring the output with an oscilloscope.
  • a scintillator has a composition represented by formula (I) and contains Ce and Al, with the Al content being 0.001 mass % or more and 0.01 mass % or less.
  • x satisfies 0.05 ⁇ x ⁇ 0.4
  • y satisfies 0.15 ⁇ y ⁇ 0.40.
  • the ratio of rare earth metals (Lu, Gd, and Y), Si, and oxygen does not have to match the stoichiometric ratio (2:1:5).
  • the amount of Si may be 0.8 or more and 1.1 or less when the amount of rare earth metal is 2.
  • oxygen does not have to match the stoichiometric composition ratio (5).
  • the reality is that it is difficult to accurately evaluate the amount of oxygen.
  • the scintillator of one embodiment can increase the amount of light emitted and shorten the fluorescent lifetime. If the Al content exceeds 0.01% by mass, a crystal that can be used as a scintillator cannot be obtained.
  • x satisfies 0.05 ⁇ x ⁇ 0.4
  • y satisfies 0.15 ⁇ y ⁇ 0.40.
  • the ratio of Y is higher than that of conventional scintillators.
  • the scintillator according to one embodiment can emit a greater amount of light and have a shorter fluorescence lifetime than conventional scintillators.
  • the fluorescence lifetime of conventional scintillators is 40 nanoseconds or longer, whereas the fluorescence lifetime of the scintillator according to one embodiment can be approximately 30 to 35 nanoseconds.
  • y When the value of y is 0.15 or more and 0.40 or less, it is presumed that the effect of reducing lattice defects and crystal distortion due to the addition of Al is obtained. Therefore, a scintillator crystal with a large amount of light emission and a short fluorescence lifetime is obtained.
  • the value of y may be 0.17 or more and 0.36 or less.
  • the element ratio (y/x) between Gd and Y is not limited as long as it satisfies the above range.
  • the element ratio (y/x) between Gd and Y may be, for example, 0.5 or more and 3 or less.
  • the element ratio (y/x) is 0.5 or more and 3 or less, lattice defects and crystal distortion can be further reduced. As a result, the amount of Al added can be increased.
  • the element ratio (y/x) is 1 or more and 3 or less, the amount of light emitted is greater.
  • the scintillator according to one embodiment may further contain a Group 2 element such as Ca.
  • a Group 2 element such as Ca
  • the fluorescence lifetime may be shortened and coloration of the resulting scintillator may be reduced.
  • the content of the Group 2 element may be less than the content of Al.
  • the crystals forming the scintillator according to one embodiment are single crystals.
  • Methods for producing such single crystals include, for example, the FZ (floating zone) method and the CZ (Czochralski) method.
  • the FZ method is a method for producing single crystals by moving the molten liquid in one direction to precipitate a single crystal from the melt.
  • the molten liquid is formed by forming the raw material into a rod shape, holding it vertically suspended, and heating and melting a portion of it.
  • the CZ method is a method for producing large bulk single crystals by pulling the raw materials molten in a crucible upward under a temperature gradient.
  • the raw materials are prepared so that the ratio of each element falls within the range described above, and the crystals that form the scintillator of one embodiment are formed by employing the FZ method or the CZ method.
  • the scintillator according to one embodiment is used, for example, in a radiation detector.
  • the radiation detector according to one embodiment of the present disclosure includes the scintillator according to the above-described embodiment and a light receiving element.
  • light emitted from the scintillator according to one embodiment is converted into an electrical signal by the light receiving element.
  • the radiation detector according to one embodiment detects the presence or absence of radiation and the amount of radiation as an electrical signal. Examples of radiation include, but are not limited to, gamma rays and X-rays.
  • the scintillator may be processed into a shape suitable for combination with a light receiving element.
  • a cutting machine such as a known blade saw or wire saw, a grinding machine, or a polishing disk may be used.
  • the shape is not particularly limited.
  • a light exit surface is located facing the light receiving element, and the light exit surface may be flat or may be optically polished. The light generated from the scintillator is efficiently incident on the light receiving element by the light exit surface being located.
  • the shape of the light exit surface is not limited. Examples of the shape of the light exit surface include a rectangle with a side length of several mm to several hundred mm, or a circle with a diameter of several mm to several hundred mm, and the shape may be appropriately selected depending on the application.
  • the size of the light exit surface may be smaller than the light receiving surface of the light receiving element, since less light is scattered without reaching the light receiving surface.
  • a light reflective film containing aluminum, barium sulfate, polytetrafluoroethylene, or the like may be located on the surface that does not face the light receiving element. The presence of a light reflective film can better prevent the light generated by the scintillator from scattering.
  • the light receiving element is not limited, and any light receiving element can be used.
  • a Geiger mode APD Anavalanche Photodiode
  • An example of such a light receiving element is the MPPC (Multi-Pixel Photon Counter, manufactured by Hamamatsu Photonics K.K.).
  • the MPPC is also called a SiPM (Si-Photo-Multiplier), and is a Geiger mode APD that has been made into a multi-pixel.
  • the photodetector can be used with high sensitivity by applying a voltage, and the output electrical signal can be observed to confirm the presence of radiation such as gamma rays or X-rays.
  • the electrical signal output from the photodetector can be input to a preamplifier, waveform shaping amplifier, or multiple pulse height analyzer, and measured by single photon counting. By connecting it to any current measuring device (e.g., a picoammeter) and examining the change in the current value, the change in the amount of light received can also be confirmed by the change in the current value.
  • the light receiving element may be covered with any light-blocking material that is difficult for light to pass through, in order to prevent the incidence of light from the environment.
  • the scintillator according to the present disclosure will be specifically described with reference to examples. However, the scintillator according to the present disclosure is not limited in any way to these examples.
  • a single crystal for a scintillator was produced by the CZ method so as to have the composition shown in Table 1.
  • the production of a single crystal for a scintillator by the CZ method was performed in the following procedure. First, high-purity raw material (Gd 2 O 3 , Lu 2 O 3 , Y 2 O 3 , CeO 2 , SiO 2 and Al 2 O 3 ) powders were prepared so that the composition of the resulting single crystal would be the composition shown in Table 1. After mixing the raw material powders, they were filled into an iridium crucible and heated to melt. After immersing the seed crystal in the melt, it was pulled up at a predetermined pulling speed and rotation speed to grow a single crystal having a cylindrical straight body. By appropriately selecting the crystal orientation of the seed crystal, a single crystal with a desired crystal orientation can be produced.
  • samples No. 1 to No. 8 were evaluated for samples No. 1 to No. 8.
  • the amount of light emitted was measured by a single photon counting method. Specifically, the obtained sample was attached to the optical window of a photomultiplier tube using optical grease. The sample was then irradiated with gamma rays from a 137 Cs source to emit light. The signal from the photomultiplier tube was amplified and shaped by a preamplifier and a waveform shaping amplifier, and a pulse height spectrum was obtained through a multichannel analyzer. The amount of light emitted was measured by comparing the peak position of the photoelectric absorption peak observed in the obtained pulse height spectrum with the peak position of the photoelectric absorption peak of sample No. 7.
  • the amount of light emitted by the reference sample No. 7 was calculated by comparing the photoelectric absorption peak obtained by pulse height spectrum measurement using a silicon APD held at 20°C with the peak obtained by directly detecting gamma rays from a 59 Fe source using the same silicon APD.
  • the number of electron-hole pairs generated was determined by comparing with the value of this directly detected peak, and the amount of light emitted was measured from the wavelength sensitivity characteristics of the silicon APD used.
  • the amount of light emitted by each sample is shown relatively to the amount of light emitted by sample No. 7, which is taken as 100%, and is shown in Table 1 as light emission intensity.
  • the scintillation decay time was measured by the following procedure. First, a gamma ray of about 662 keV from a 137 Cs source was irradiated onto a scintillator, and the resulting light emission was detected by a high-speed PMT. The output was then measured by an oscilloscope. The data was plotted on a graph, and the decay time was calculated by fitting using software.
  • samples No. 1 to No. 6, which correspond to the scintillators according to the present disclosure have stronger luminescence intensity (larger amount of light emitted) and shorter fluorescence lifetimes than the reference conventional scintillator (sample No. 7), all of which have a fluorescence lifetime of 35 nanoseconds or less.
  • the conventional scintillators examples No. 7 and No. 8 all have a longer fluorescence lifetime, exceeding 35 nanoseconds.
  • a scintillator according to the present disclosure has a composition represented by the following formula (I), and contains Ce and Al, with the Al content being 0.001 mass % or more and 0.01 mass % or less.
  • x satisfies 0.05 ⁇ x ⁇ 0.4
  • y satisfies 0.15 ⁇ y ⁇ 0.40.
  • the element ratio of Gd to Y (y/x) is 0.5 or more and 3 or less.
  • an element ratio (y/x) is 1 or more and 3 or less.
  • a radiation detector according to the present disclosure includes the scintillator according to any one of (1) to (6) above and a light receiving element.

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Abstract

A scintillator according to the present disclosure has a composition represented by formula (I), contains Ce and Al, and contains 0.001 mass%-0.01 mass% inclusive of Al: (I): Lu(2-x-y)GdxYySiO5. In formula (I), x satisfies 0.05≤x≤0.4, and y satisfies 0.15≤y≤0.40.

Description

シンチレータおよび放射線検出器Scintillators and Radiation Detectors

 本発明は、シンチレータおよび放射線検出器に関する。 The present invention relates to a scintillator and a radiation detector.

 シンチレータは、X線およびγ線などの放射線を照射すると発光する物質であり、光検出器と組み合わせて、放射線の計測に使用される。このようなシンチレータ材料として、例えば、特許文献1には、セリウム付活オルト珪酸塩化合物を含むシンチレータ用単結晶が記載されている。 Scintillators are substances that emit light when exposed to radiation such as X-rays and gamma rays, and are used to measure radiation in combination with a photodetector. For example, Patent Document 1 describes a single crystal for scintillators that contains a cerium-activated orthosilicate compound as one such scintillator material.

特開2009-7545号公報JP 2009-7545 A

 本開示に係るシンチレータは、下記の式(I)で示される組成を有し、CeおよびAlを含み、Alが0.001質量%以上0.01質量%以下の割合で含まれる。
   Lu(2-x-y)GdSiO ・・・(I)
 式(I)中、xは0.05≦x≦0.4を満足し、yは0.15≦y≦0.40を満足する。
The scintillator according to the present disclosure has a composition represented by the following formula (I) and contains Ce and Al, with the Al content being 0.001 mass % or more and 0.01 mass % or less.
Lu (2-x-y) Gd x Y y SiO 5 ...(I)
In formula (I), x satisfies 0.05≦x≦0.4, and y satisfies 0.15≦y≦0.40.

 本開示に係る放射線検出器は、上記のシンチレータと受光素子とを含む。 The radiation detector according to the present disclosure includes the above-mentioned scintillator and a light receiving element.

 シンチレータの主要な特性として、発光量およびシンチレーション減衰時定数がある。特に、シンチレータが、CT(computed tomography)およびPET(positron emission tomography)などの医用画像診断用途として使用される場合、画質の向上、被験者の被ばく量低減および検査時間の短縮が要求される。そのため、発光量が大きくてシンチレーション減衰時定数が短い(蛍光寿命が短い)シンチレータが求められる。 The main characteristics of a scintillator are its light emission output and its scintillation decay time constant. In particular, when scintillators are used for medical imaging diagnostics such as CT (computed tomography) and PET (positron emission tomography), there is a demand for improved image quality, reduced exposure to subjects, and shorter examination times. For this reason, there is a demand for scintillators that have a large light emission output and a short scintillation decay time constant (short fluorescence lifetime).

 本開示に係る配線基板は、上記の課題を解決するための手段の欄に記載のような構成を有することによって、発光量が大きく、蛍光寿命も短くすることができる。 The wiring board according to the present disclosure has the configuration described in the section on means for solving the above problems, which allows for a large amount of light emission and a short fluorescence lifetime.

 以下、本開示に係るシンチレータについて説明する。シンチレータは、上述のように、X線およびγ線などの放射線を照射すると発光する物質である。シンチレータは、光検出器と組み合わせて、放射線の計測に使用される。 The scintillator according to the present disclosure will be described below. As described above, a scintillator is a substance that emits light when irradiated with radiation such as X-rays and gamma rays. A scintillator is used in combination with a photodetector to measure radiation.

 シンチレータの主要な特性として、発光量およびシンチレーション減衰時定数がある。上記のように、シンチレータが医用画像診断用途として使用される場合、画質の向上、被験者の被ばく量低減および検査時間の短縮が要求される。このような要求を満足するためには、シンチレータに発光量の高さおよびシンチレーション減衰時定数の短さ(蛍光寿命の短さ)が求められる。 The main characteristics of a scintillator are its light emission output and its scintillation decay time constant. As mentioned above, when a scintillator is used for medical imaging diagnosis, it is required to improve image quality, reduce the subject's exposure to radiation, and shorten the examination time. To meet these demands, the scintillator must have a high light emission output and a short scintillation decay time constant (short fluorescence lifetime).

 シンチレータの発光量(Light Yield)は、照射した放射線の単位エネルギーあたりにシンチレータから生じる光子数のことを意味する。発行量の単位としては、photons/MeVが使用される。発光量は、放射線を照射したシンチレータからの発光を、単一光子計数法で評価することによって測定される。一実施形態に係るシンチレータにおいて「発光量」は、137Cs線源からの約662keVのガンマ線を、シンチレータに照射して測定した発光量のことを意味する。 The light yield of a scintillator means the number of photons generated from the scintillator per unit energy of the irradiated radiation. The unit of emission is photons/MeV. The light yield is measured by evaluating the light emitted from the scintillator irradiated with radiation by a single photon counting method. In the scintillator according to one embodiment, the "light yield" means the light yield measured by irradiating the scintillator with gamma rays of about 662 keV from a 137 Cs source.

 シンチレーション減衰時定数は、放射照射時のシンチレータの蛍光減衰曲線(シンチレーション減衰曲線)から得られる。シンチレータの発光強度は、一般に指数関数的に減衰する。シンチレーション減衰時間は、137Cs線源からの約662keVのガンマ線をシンチレータに照射して得られた発光を高速のPMTで検出し、その出力をオシロスコープで測定することで算出される。 The scintillation decay time constant is obtained from the fluorescence decay curve (scintillation decay curve) of the scintillator when it is irradiated with radiation. The luminescence intensity of the scintillator generally decays exponentially. The scintillation decay time is calculated by detecting the luminescence obtained by irradiating the scintillator with gamma rays of about 662 keV from a 137 Cs source with a high-speed PMT and measuring the output with an oscilloscope.

 本開示の一実施形態に係るシンチレータは、上記のように、式(I)で示される組成を有し、CeおよびAlを含み、Alが0.001質量%以上0.01質量%以下の割合で含まれる。
   Lu(2-x-y)GdSiO ・・・(I)
 式(I)中、xは0.05≦x≦0.4を満足し、yは0.15≦y≦0.40を満足する。
As described above, a scintillator according to one embodiment of the present disclosure has a composition represented by formula (I) and contains Ce and Al, with the Al content being 0.001 mass % or more and 0.01 mass % or less.
Lu (2-x-y) Gd x Y y SiO 5 ...(I)
In formula (I), x satisfies 0.05≦x≦0.4, and y satisfies 0.15≦y≦0.40.

 希土類金属(Lu、GdおよびY)とSiと酸素の比は、化学量論比(2:1:5)に一致していなくてもよい。例えば、希土類金属を2としたときのSiの量が0.8以上1.1以下であってもよい。酸素もSiと同様、化学量論組成比(5)に完全に一致していなくてもよい。酸素の量について、正確に評価するのが難しいのが実情である。 The ratio of rare earth metals (Lu, Gd, and Y), Si, and oxygen does not have to match the stoichiometric ratio (2:1:5). For example, the amount of Si may be 0.8 or more and 1.1 or less when the amount of rare earth metal is 2. Like Si, oxygen does not have to match the stoichiometric composition ratio (5). The reality is that it is difficult to accurately evaluate the amount of oxygen.

 通常、多種の元素を組み合わせた結晶に、Alのような第13族元素を添加しようとすると、格子欠陥および結晶の歪みが増大する。そのため、結晶育成が難しくなったり、格子欠陥によって蛍光出力が低下したりする。一実施形態に係るシンチレータは、Alを0.001質量%以上0.01質量%以下の割合で含むことによって、発光量を大きくすることができ、蛍光寿命も短くすることができる。Alの含有量が0.01質量%を超える場合、シンチレータとして使用できる結晶が得られない。 Normally, when trying to add a Group 13 element such as Al to a crystal that combines many different elements, lattice defects and crystal distortion increase. This makes crystal growth difficult and lattice defects can reduce the fluorescent output. By including Al in a proportion of 0.001% by mass or more and 0.01% by mass or less, the scintillator of one embodiment can increase the amount of light emitted and shorten the fluorescent lifetime. If the Al content exceeds 0.01% by mass, a crystal that can be used as a scintillator cannot be obtained.

 さらに、一実施形態に係るシンチレータは、上記の式(I)で示される組成において、xは0.05≦x≦0.4を満足し、yは0.15≦y≦0.40を満足する。特に、yが0.15≦y≦0.40を満足していることから、従来のシンチレータに比べてYの比率が高い。 Furthermore, in the composition of the scintillator according to one embodiment, represented by the above formula (I), x satisfies 0.05≦x≦0.4, and y satisfies 0.15≦y≦0.40. In particular, since y satisfies 0.15≦y≦0.40, the ratio of Y is higher than that of conventional scintillators.

 一実施形態に係るシンチレータを形成している結晶は、Gd、Lu、YおよびCeの希土類金属サイトと、Siのサイトと、Oのサイトとで構成されている。Alは、主としてSiを置換するように結晶中に取り込まれる(一部は、希土類金属サイトまたは格子間に入る可能性がある)と推測される。Alのイオン半径はSiのイオン半径よりも大きい。上述のように、Alの添加量が多くなるほど、格子欠陥および結晶の歪みが増大する。Ceは、例えば、結晶中に0.001質量%以上0.1質量%以下の割合で含まれていてもよい。 The crystal forming the scintillator according to one embodiment is composed of rare earth metal sites of Gd, Lu, Y and Ce, Si sites and O sites. It is speculated that Al is incorporated into the crystal mainly to substitute for Si (some may enter the rare earth metal sites or interstitial spaces). The ionic radius of Al is larger than that of Si. As mentioned above, the more Al is added, the greater the lattice defects and crystal distortion. Ce may be contained in the crystal in a ratio of, for example, 0.001% by mass or more and 0.1% by mass or less.

 一実施形態に係るシンチレータは、Yの比率を比較的高くすることによって金属サイトの元素比を調整し、格子欠陥および結晶の歪みが低減され、上記のような含有量でAlが含まれる。その結果、多元素重畳効果(カクテル効果)と称される多様な構成原子間の非線形相互作用に起因する特性発現が生じている可能性が高い。 In one embodiment of the scintillator, the element ratio of the metal sites is adjusted by making the ratio of Y relatively high, lattice defects and crystal distortion are reduced, and Al is contained at the above-mentioned content. As a result, it is highly likely that characteristics are expressed due to nonlinear interactions between various constituent atoms, known as the multi-element superposition effect (cocktail effect).

 したがって、一実施形態に係るシンチレータは、従来のシンチレータと比べて発光量を大きくすることができ、蛍光寿命も短くすることができる。具体的には、従来のシンチレータの蛍光寿命は40ナノ秒以上であるのに対し、一実施形態に係るシンチレータの蛍光寿命は30~35ナノ秒程度とすることができる。 Therefore, the scintillator according to one embodiment can emit a greater amount of light and have a shorter fluorescence lifetime than conventional scintillators. Specifically, the fluorescence lifetime of conventional scintillators is 40 nanoseconds or longer, whereas the fluorescence lifetime of the scintillator according to one embodiment can be approximately 30 to 35 nanoseconds.

 yの値が0.15以上0.40以下の場合、Al添加による格子欠陥および結晶の歪みを低減する効果が得られると推測される。そのため、発光量が大きく、蛍光寿命が短いシンチレータ結晶が得られる。yの値は、0.17以上0.36以下であってもよい。 When the value of y is 0.15 or more and 0.40 or less, it is presumed that the effect of reducing lattice defects and crystal distortion due to the addition of Al is obtained. Therefore, a scintillator crystal with a large amount of light emission and a short fluorescence lifetime is obtained. The value of y may be 0.17 or more and 0.36 or less.

 GdとYとの元素比(y/x)は、上記の範囲を満足していれば限定されない。GdとYとの元素比(y/x)は、例えば、0.5以上3以下であってもよい。元素比(y/x)が0.5以上3以下であると、格子欠陥および結晶の歪みをより低減することができる。その結果、Alの添加量をより多くすることができる。さらに、元素比(y/x)が1以上3以下であると、発光量がより大きくなる。 The element ratio (y/x) between Gd and Y is not limited as long as it satisfies the above range. The element ratio (y/x) between Gd and Y may be, for example, 0.5 or more and 3 or less. When the element ratio (y/x) is 0.5 or more and 3 or less, lattice defects and crystal distortion can be further reduced. As a result, the amount of Al added can be increased. Furthermore, when the element ratio (y/x) is 1 or more and 3 or less, the amount of light emitted is greater.

 一実施形態に係るシンチレータは、Caなどの第2族元素を、さらに含んでいてもよい。第2族元素を含むことによって、蛍光寿命をより短くすることができたり、得られるシンチレータの着色が低減できる場合がある。例えば、シンチレータの着色を低減しつつ、蛍光寿命をより短くするために、第2族元素の含有量は、Alの含有量よりも少なくてもよい。 The scintillator according to one embodiment may further contain a Group 2 element such as Ca. By including a Group 2 element, the fluorescence lifetime may be shortened and coloration of the resulting scintillator may be reduced. For example, in order to shorten the fluorescence lifetime while reducing coloration of the scintillator, the content of the Group 2 element may be less than the content of Al.

 一実施形態に係るシンチレータを形成している結晶は単結晶である。このような単結晶を製造する方法は、例えば、FZ(フローティングゾーン)法およびCZ(チョクラルスキ)法などが挙げられる。FZ法は、融液部を一方向に移動させることによって融液から単結晶を析出させ、単結晶を製造する方法である。融液部は、原材料を棒状に成形して鉛直方向にぶら下げて保持し、一部を加熱溶融させることによって形成される。 The crystals forming the scintillator according to one embodiment are single crystals. Methods for producing such single crystals include, for example, the FZ (floating zone) method and the CZ (Czochralski) method. The FZ method is a method for producing single crystals by moving the molten liquid in one direction to precipitate a single crystal from the melt. The molten liquid is formed by forming the raw material into a rod shape, holding it vertically suspended, and heating and melting a portion of it.

 CZ法は、るつぼ内で溶融させた原料を、温度勾配下で上方に引き上げることによって、大型のバルク単結晶を製造する方法である。各元素の比率が上述のような範囲となるように原料を準備し、FZ法またはCZ法を採用することによって、一実施形態に係るシンチレータを形成している結晶が形成される。 The CZ method is a method for producing large bulk single crystals by pulling the raw materials molten in a crucible upward under a temperature gradient. The raw materials are prepared so that the ratio of each element falls within the range described above, and the crystals that form the scintillator of one embodiment are formed by employing the FZ method or the CZ method.

 一実施形態に係るシンチレータは、例えば、放射線検出器などに使用される。本開示の一実施形態に係る放射線検出器は、上述の一実施形態に係るシンチレータと受光素子とを含む。一実施形態に係る放射線検出器において、一実施形態に係るシンチレータから発せられた光は、受光素子によって電気信号に変換される。その結果、一実施形態に係る放射線検出器は、放射線の有無および放射線の量を、電気信号として捉える。放射線としては、限定されず、例えば、γ線およびX線などが挙げられる。 The scintillator according to one embodiment is used, for example, in a radiation detector. The radiation detector according to one embodiment of the present disclosure includes the scintillator according to the above-described embodiment and a light receiving element. In the radiation detector according to one embodiment, light emitted from the scintillator according to one embodiment is converted into an electrical signal by the light receiving element. As a result, the radiation detector according to one embodiment detects the presence or absence of radiation and the amount of radiation as an electrical signal. Examples of radiation include, but are not limited to, gamma rays and X-rays.

 一実施形態に係るシンチレータは、受光素子との組み合わせに適した形状に加工してもよい。加工に際しては、公知のブレードソーおよびワイヤーソーなどの切断機、研削機、あるいは研磨盤などが使用される。形状は特に限定されない。受光素子に対向する光出射面が位置し、当該光出射面は平坦であってもよく、光学研磨が施されていてもよい。光出射面が位置していることによって、シンチレータから生じた光が、効率よく受光素子に入射される。 The scintillator according to one embodiment may be processed into a shape suitable for combination with a light receiving element. For processing, a cutting machine such as a known blade saw or wire saw, a grinding machine, or a polishing disk may be used. The shape is not particularly limited. A light exit surface is located facing the light receiving element, and the light exit surface may be flat or may be optically polished. The light generated from the scintillator is efficiently incident on the light receiving element by the light exit surface being located.

 光出射面の形状は限定されない。光出射面の形状としては、例えば、一辺が数mm以上数百mm以下の長さを有する四角形、あるいは数mm以上数百mm以下の直径を有する円形などが挙げられ、用途に応じて適宜選択すればよい。受光面に届かずに散逸する発光が少なくなるため、光出射面の大きさは受光素子の受光面よりも小さくてもよい。受光素子に対向しない面に、アルミニウム、硫酸バリウムまたはポリテトラフルオロエチレンなどを含む光反射膜が位置していてもよい。光反射膜が位置していることによって、シンチレータで生じた光の散逸を、より防止することができる。 The shape of the light exit surface is not limited. Examples of the shape of the light exit surface include a rectangle with a side length of several mm to several hundred mm, or a circle with a diameter of several mm to several hundred mm, and the shape may be appropriately selected depending on the application. The size of the light exit surface may be smaller than the light receiving surface of the light receiving element, since less light is scattered without reaching the light receiving surface. A light reflective film containing aluminum, barium sulfate, polytetrafluoroethylene, or the like may be located on the surface that does not face the light receiving element. The presence of a light reflective film can better prevent the light generated by the scintillator from scattering.

 受光素子は限定されず、任意の受光素子が使用される。例えば、大きな利得が実現できるガイガーモードAPD(アバランシェ・フォトダイオード)は、高感度にシンチレータの光を受光できる。このような受光素子としては、例えば、MPPC(Multi-Pixel Photon Counter、浜松ホトニクス株式会社製)が挙げられる。MPPCは、SiPM(Si-Photo-Multiplier)とも称され、ガイガーモードAPDをマルチピクセル化したものである。 The light receiving element is not limited, and any light receiving element can be used. For example, a Geiger mode APD (Avalanche Photodiode), which can achieve a large gain, can receive the light from the scintillator with high sensitivity. An example of such a light receiving element is the MPPC (Multi-Pixel Photon Counter, manufactured by Hamamatsu Photonics K.K.). The MPPC is also called a SiPM (Si-Photo-Multiplier), and is a Geiger mode APD that has been made into a multi-pixel.

 受光素子は、電圧を印加することで高感度に用いることができ、出力される電気信号を観測することで、ガンマ線またはX線などの放射線が確認される。受光素子から出力される電気信号は、前置増幅器、波形成形増幅器または多重波高分析器などに入力し、単一光子計数法によって測定してもよい。任意の電流測定器(例えば、ピコアンメーター)に接続して電流値の変化を調べることによって、受光量の変化も電流値の変化によって確認し得る。 The photodetector can be used with high sensitivity by applying a voltage, and the output electrical signal can be observed to confirm the presence of radiation such as gamma rays or X-rays. The electrical signal output from the photodetector can be input to a preamplifier, waveform shaping amplifier, or multiple pulse height analyzer, and measured by single photon counting. By connecting it to any current measuring device (e.g., a picoammeter) and examining the change in the current value, the change in the amount of light received can also be confirmed by the change in the current value.

 一実施形態に係る放射線検出器は、環境中の光の入射を防ぐ目的で、光を通しにくい任意の材質の遮光材で、受光素子を覆ってもよい。 In one embodiment of the radiation detector, the light receiving element may be covered with any light-blocking material that is difficult for light to pass through, in order to prevent the incidence of light from the environment.

 以下、本開示に係るシンチレータを実施例を挙げて具体的に説明する。しかし、本開示に係るシンチレータは、これらの実施例によって何ら限定されるものではない。 Below, the scintillator according to the present disclosure will be specifically described with reference to examples. However, the scintillator according to the present disclosure is not limited in any way to these examples.

 表1に示す構成となるように、シンチレータ用の単結晶を、CZ法によって作製した。CZ法によるシンチレータ用の単結晶の作製は、次の手順で行った。まず、得られる単結晶の組成が表1に示す組成となるように、高純度の原料(Gd、Lu、Y、CeO2、SiOおよびAl)粉末を準備した。原料粉末を混合した後、イリジウム製の坩堝に充填し、加熱して溶融させた。種結晶を融液に浸した後、所定の引上げ速度と回転速度で引き上げることで、円筒状の直胴部を有する単結晶を育成した。種結晶の結晶方位を適宜選択することで、所望の結晶方位の単結晶を製造できる。 A single crystal for a scintillator was produced by the CZ method so as to have the composition shown in Table 1. The production of a single crystal for a scintillator by the CZ method was performed in the following procedure. First, high-purity raw material (Gd 2 O 3 , Lu 2 O 3 , Y 2 O 3 , CeO 2 , SiO 2 and Al 2 O 3 ) powders were prepared so that the composition of the resulting single crystal would be the composition shown in Table 1. After mixing the raw material powders, they were filled into an iridium crucible and heated to melt. After immersing the seed crystal in the melt, it was pulled up at a predetermined pulling speed and rotation speed to grow a single crystal having a cylindrical straight body. By appropriately selecting the crystal orientation of the seed crystal, a single crystal with a desired crystal orientation can be produced.

 得られた単結晶棒を切断および研磨して、1.5mmの厚みを有する薄板状に加工し、評価用の試料No.1~No.8(シンチレータ)を得た。試料No.1~No.6は、本開示に係るシンチレータに相当し、試料No.7およびNo.8は、比較例に相当するシンチレータである。試料No.1~No.8について、発光量およびシンチレーション減衰時定数を評価した。 The obtained single crystal ingot was cut and polished to be processed into a thin plate having a thickness of 1.5 mm to obtain samples No. 1 to No. 8 (scintillators) for evaluation. Samples No. 1 to No. 6 correspond to the scintillators according to the present disclosure, and samples No. 7 and No. 8 correspond to comparative examples. The amount of light emitted and the scintillation decay time constant were evaluated for samples No. 1 to No. 8.

<発光量>
 発光量は単一光子計数法により測定した。具体的には、得られた試料を、光電子増倍管の光学窓に、光学グリースを用いて接着した。次いで、サンプルに137Cs線源によるガンマ線を照射して発光させた。光電子増倍管からの信号は、前置増幅器および波形整形増幅器によって増幅整形し、マルチチャネルアナライザを通してパルス波高スペクトルを得た。得られたパルス波高スペクトルにおいて観察された光電吸収ピークのピーク位置を、試料No.7の光電吸収ピークのピーク位置と比較することで、発光量を測定した。
<Light output>
The amount of light emitted was measured by a single photon counting method. Specifically, the obtained sample was attached to the optical window of a photomultiplier tube using optical grease. The sample was then irradiated with gamma rays from a 137 Cs source to emit light. The signal from the photomultiplier tube was amplified and shaped by a preamplifier and a waveform shaping amplifier, and a pulse height spectrum was obtained through a multichannel analyzer. The amount of light emitted was measured by comparing the peak position of the photoelectric absorption peak observed in the obtained pulse height spectrum with the peak position of the photoelectric absorption peak of sample No. 7.

 基準として用いた試料No.7の発光量は、20℃に保持したシリコンAPDを用いたパルス波高スペクトル測定によって得られた光電吸収ピークを、59Fe線源によるガンマ線を同シリコンAPDで直接検出して得られたピークと比較する方法により算出した。Si中で1個の電子正孔対を作るのに必要な光子のエネルギーは3.6eVである。したがって、55Fe線源からの5.9keVのガンマ線を照射すると、5900/3.6=1640個の電子正孔対が生成する。この直接検出ピークの値との比較により、発生した電子正孔対の数を求め、用いたシリコンAPDの波長感度特性から発光量を測定した。試料No.7の発光量を100%とした場合の各試料の発光量を相対的に示し、発光強度として表1に示す。 The amount of light emitted by the reference sample No. 7 was calculated by comparing the photoelectric absorption peak obtained by pulse height spectrum measurement using a silicon APD held at 20°C with the peak obtained by directly detecting gamma rays from a 59 Fe source using the same silicon APD. The photon energy required to create one electron-hole pair in silicon is 3.6 eV. Therefore, when irradiated with 5.9 keV gamma rays from a 55 Fe source, 5900/3.6 = 1640 electron-hole pairs are generated. The number of electron-hole pairs generated was determined by comparing with the value of this directly detected peak, and the amount of light emitted was measured from the wavelength sensitivity characteristics of the silicon APD used. The amount of light emitted by each sample is shown relatively to the amount of light emitted by sample No. 7, which is taken as 100%, and is shown in Table 1 as light emission intensity.

<シンチレーション減衰時定数>
 シンチレーション減衰時間は、次のような手順で測定した。まず、137Cs線源からの約662keVのガンマ線をシンチレータに照射して、得られた発光を高速のPMTで検出した。次いで、その出力をオシロスコープで測定した。データをグラフ上にプロットし、ソフトウェアを用いてフィッティングをすることで減衰時間を算出した。
<Scintillation decay time constant>
The scintillation decay time was measured by the following procedure. First, a gamma ray of about 662 keV from a 137 Cs source was irradiated onto a scintillator, and the resulting light emission was detected by a high-speed PMT. The output was then measured by an oscilloscope. The data was plotted on a graph, and the decay time was calculated by fitting using software.

Figure JPOXMLDOC01-appb-T000001
Figure JPOXMLDOC01-appb-T000001

 表1に示すように、本開示に係るシンチレータに相当する試料No.1~No.6は、基準となる従来のシンチレータ(試料No.7)と比べて、発光強度が強く(発光量が大きく)、蛍光寿命も短く、いずれも35ナノ秒以下の蛍光寿命であることがわかる。一方、従来のシンチレータ(試料No.7およびNo.8)は、いずれも蛍光寿命が長く、35ナノ秒を超えていることがわかる。 As shown in Table 1, samples No. 1 to No. 6, which correspond to the scintillators according to the present disclosure, have stronger luminescence intensity (larger amount of light emitted) and shorter fluorescence lifetimes than the reference conventional scintillator (sample No. 7), all of which have a fluorescence lifetime of 35 nanoseconds or less. On the other hand, the conventional scintillators (samples No. 7 and No. 8) all have a longer fluorescence lifetime, exceeding 35 nanoseconds.

 以上、本開示の実施形態について説明した。しかし、本開示に係る発明は上述の実施形態に限定されるものではなく、下記の(1)~(7)に示す本開示の範囲内で種々の変更および改良が可能である。 The above describes the embodiments of the present disclosure. However, the invention of this disclosure is not limited to the above-described embodiments, and various modifications and improvements are possible within the scope of the present disclosure as shown in (1) to (7) below.

 (1)本開示に係るシンチレータは、下記の式(I)で示される組成を有し、CeおよびAlを含み、Alが0.001質量%以上0.01質量%以下の割合で含まれる。
   Lu(2-x-y)GdSiO ・・・(I)
 式(I)中、xは0.05≦x≦0.4を満足し、yは0.15≦y≦0.40を満足する。
 (2)上記(1)に記載のシンチレータにおいて、GdとYとの元素比(y/x)が、0.5以上3以下である。
 (3)上記(2)に記載のシンチレータにおいて、元素比(y/x)が、1以上3以下である。
 (4)上記(1)~(3)のいずれかに記載のシンチレータにおいて、第2族元素を、さらに含む。
 (5)上記(4)のいずれかに記載のシンチレータにおいて、第2族元素がCaである。
 (6)上記(4)または(5)に記載のシンチレータにおいて、第2族元素の含有量は、Alの含有量よりも少ない。
 (7)本開示に係る放射線検出器は、上記(1)~(6)のいずれかに記載のシンチレータと受光素子とを含む。
(1) A scintillator according to the present disclosure has a composition represented by the following formula (I), and contains Ce and Al, with the Al content being 0.001 mass % or more and 0.01 mass % or less.
Lu (2-x-y) Gd x Y y SiO 5 ...(I)
In formula (I), x satisfies 0.05≦x≦0.4, and y satisfies 0.15≦y≦0.40.
(2) In the scintillator according to (1) above, the element ratio of Gd to Y (y/x) is 0.5 or more and 3 or less.
(3) In the scintillator according to (2) above, an element ratio (y/x) is 1 or more and 3 or less.
(4) The scintillator according to any one of (1) to (3) above, further comprising a Group 2 element.
(5) In the scintillator according to any one of (4) above, the Group 2 element is Ca.
(6) In the scintillator according to (4) or (5) above, the content of the Group 2 element is less than the content of Al.
(7) A radiation detector according to the present disclosure includes the scintillator according to any one of (1) to (6) above and a light receiving element.

Claims (7)

 下記の式(I)で示される組成を有し、CeおよびAlを含み、前記Alが0.001質量%以上0.01質量%以下の割合で含まれる、シンチレータ。
   Lu(2-x-y)GdSiO ・・・(I)
 式(I)中、xは0.05≦x≦0.4を満足し、yは0.15≦y≦0.40を満足する。
A scintillator having a composition represented by the following formula (I), containing Ce and Al, the Al being contained in an amount of 0.001 mass % or more and 0.01 mass % or less.
Lu (2-x-y) Gd x Y y SiO 5 ...(I)
In formula (I), x satisfies 0.05≦x≦0.4, and y satisfies 0.15≦y≦0.40.
 前記Gdと前記Yとの元素比(y/x)が、0.5以上3以下である、請求項1に記載のシンチレータ。 The scintillator of claim 1, in which the element ratio (y/x) of Gd to Y is 0.5 or more and 3 or less.  前記元素比(y/x)が、1以上3以下である、請求項2に記載のシンチレータ。 The scintillator according to claim 2, wherein the element ratio (y/x) is 1 or more and 3 or less.  第2族元素を、さらに含む、請求項1~3のいずれかに記載のシンチレータ。 The scintillator according to any one of claims 1 to 3, further comprising a Group 2 element.  前記第2族元素がCaである、請求項4に記載のシンチレータ。 The scintillator according to claim 4, wherein the Group 2 element is Ca.  前記第2族元素の含有量は、前記Alの含有量よりも少ない、請求項4または5に記載のシンチレータ。 The scintillator according to claim 4 or 5, wherein the content of the Group 2 element is less than the content of Al.  請求項1~6のいずれかに記載のシンチレータと受光素子とを含む、放射線検出器。 A radiation detector comprising a scintillator according to any one of claims 1 to 6 and a light receiving element.
PCT/JP2024/032946 2023-09-14 2024-09-13 Scintillator and radiation detector Pending WO2025058071A1 (en)

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JP2011026547A (en) * 2009-06-29 2011-02-10 Hitachi Chem Co Ltd Single crystal for scintillator, method of heat treatment for manufacturing single crystal for scintillator, and method of manufacturing single crystal for scintillator
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