WO2024234852A1 - Heating assembly, atomizer, and electronic atomization apparatus - Google Patents
Heating assembly, atomizer, and electronic atomization apparatus Download PDFInfo
- Publication number
- WO2024234852A1 WO2024234852A1 PCT/CN2024/085344 CN2024085344W WO2024234852A1 WO 2024234852 A1 WO2024234852 A1 WO 2024234852A1 CN 2024085344 W CN2024085344 W CN 2024085344W WO 2024234852 A1 WO2024234852 A1 WO 2024234852A1
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- WIPO (PCT)
- Prior art keywords
- liquid
- heating component
- substrate
- holes
- heating
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- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Classifications
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- A—HUMAN NECESSITIES
- A24—TOBACCO; CIGARS; CIGARETTES; SIMULATED SMOKING DEVICES; SMOKERS' REQUISITES
- A24D—CIGARS; CIGARETTES; TOBACCO SMOKE FILTERS; MOUTHPIECES FOR CIGARS OR CIGARETTES; MANUFACTURE OF TOBACCO SMOKE FILTERS OR MOUTHPIECES
- A24D1/00—Cigars; Cigarettes
- A24D1/20—Cigarettes specially adapted for simulated smoking devices
-
- A—HUMAN NECESSITIES
- A24—TOBACCO; CIGARS; CIGARETTES; SIMULATED SMOKING DEVICES; SMOKERS' REQUISITES
- A24F—SMOKERS' REQUISITES; MATCH BOXES; SIMULATED SMOKING DEVICES
- A24F40/00—Electrically operated smoking devices; Component parts thereof; Manufacture thereof; Maintenance or testing thereof; Charging means specially adapted therefor
- A24F40/40—Constructional details, e.g. connection of cartridges and battery parts
- A24F40/42—Cartridges or containers for inhalable precursors
-
- A—HUMAN NECESSITIES
- A24—TOBACCO; CIGARS; CIGARETTES; SIMULATED SMOKING DEVICES; SMOKERS' REQUISITES
- A24F—SMOKERS' REQUISITES; MATCH BOXES; SIMULATED SMOKING DEVICES
- A24F40/00—Electrically operated smoking devices; Component parts thereof; Manufacture thereof; Maintenance or testing thereof; Charging means specially adapted therefor
- A24F40/40—Constructional details, e.g. connection of cartridges and battery parts
- A24F40/46—Shape or structure of electric heating means
-
- A—HUMAN NECESSITIES
- A24—TOBACCO; CIGARS; CIGARETTES; SIMULATED SMOKING DEVICES; SMOKERS' REQUISITES
- A24F—SMOKERS' REQUISITES; MATCH BOXES; SIMULATED SMOKING DEVICES
- A24F40/00—Electrically operated smoking devices; Component parts thereof; Manufacture thereof; Maintenance or testing thereof; Charging means specially adapted therefor
- A24F40/40—Constructional details, e.g. connection of cartridges and battery parts
- A24F40/48—Fluid transfer means, e.g. pumps
- A24F40/485—Valves; Apertures
Definitions
- the present application relates to the technical field of electronic atomization, and in particular to a heating component, an atomizer and an electronic atomization device.
- the electronic atomization device is composed of a heating component, a battery, a control circuit and other parts.
- the heating component is the core component of the electronic atomization device, and its characteristics determine the atomization effect and user experience of the electronic atomization device.
- the more common atomization method of existing heating components is resistive heating.
- the heating component includes a substrate and a heating film arranged on the surface of the substrate; wherein, the substrate is provided with a plurality of through holes, and the through holes are used to guide the aerosol to generate the matrix.
- the multiple through holes are distributed independently of each other. When the aperture of the through hole is small, the liquid conduction resistance is large, and it is easy to have insufficient liquid supply or gas return, causing the heating film to burn out; when the aperture of the through hole is large, the liquid supply is sufficient, and it is easy to have liquid explosion accompanied by noise.
- the heating component, atomizer and electronic atomization device provided in the present application can reduce the return air and avoid the explosion of liquid while ensuring sufficient liquid supply.
- the first technical solution provided in the present application is: to provide a heating component, applied to an electronic atomization device, for atomizing an aerosol to generate a matrix, the heating component includes a substrate, the substrate includes a liquid absorption surface and an atomization surface arranged opposite to each other; the substrate is provided with at least one liquid conduction channel passing through the liquid absorption surface and the atomization surface; wherein the liquid conduction channel includes at least two liquid conduction holes, the liquid conduction holes passing through the liquid absorption surface and the atomization surface; the ports of two adjacent liquid conduction holes in the liquid conduction channel located on the atomization surface overlap with each other, and the ports located on the liquid absorption surface are arranged at intervals from each other.
- the cross-sectional shape of the liquid guiding hole is the same at all locations; and the cross-sectional area of the liquid guiding hole gradually decreases along the direction from the atomization surface to the liquid absorption surface.
- the longitudinal section of the liquid guiding hole is an isosceles trapezoid, and the cross-sectional shape of the liquid guiding hole is a circle.
- the substrate is provided with a plurality of the liquid conducting channels.
- the fluid conducting channels are arranged in multiple rows and columns.
- the spacing between any two adjacent rows of the liquid-conducting channels is the same, and the spacing between any two adjacent columns of the liquid-conducting channels is the same.
- the number of the liquid conducting holes in each of the liquid conducting channels is the same.
- all of the liquid conducting holes in each of the liquid conducting channels in the same row are arranged in a one-dimensional array.
- the center distance between adjacent liquid conducting holes in the liquid conducting channel is greater than or equal to 20 ⁇ m and less than or equal to 60 ⁇ m; and/or the center distance between two adjacent rows of liquid conducting channels is greater than or equal to 60 ⁇ m and less than or equal to 140 ⁇ m.
- the equivalent diameter of the liquid guide hole located at the atomization surface is greater than or equal to 30 ⁇ m and less than or equal to 70 ⁇ m; and/or the equivalent diameter of the liquid guide hole located at the liquid absorption surface is greater than or equal to 10 ⁇ m and less than or equal to 50 ⁇ m.
- the matrix is a dense matrix or a porous matrix.
- the substrate is a dense substrate, and the material of the substrate is at least one of glass and dense ceramic; or,
- the substrate is a porous substrate, and the material of the substrate is porous ceramic.
- the thickness of the substrate is 0.5 mm-2.5 mm.
- the heating component also includes a heating layer, a pin conductive layer and a protective layer; the heating layer is arranged on the atomized surface; a pin conductive layer is respectively provided at two opposite ends of the heating layer, and the pin conductive layer is connected to the heating layer; the protective layer is arranged on the surface of the heating layer away from the substrate, and the protective layer is used to protect the heating layer.
- the substrate includes a microporous area and a blank area adjacent to the microporous area; the microporous area is provided with a plurality of the liquid conduction holes; the blank area is not provided with the liquid conduction holes; the heat generating layer is at least partially provided in the microporous area, and the pin conductive layer is at least partially provided in the blank area.
- the second technical solution provided in the present application is: to provide a nebulizer, comprising a liquid storage chamber and a heating component; the liquid storage chamber is used to store an aerosol generating matrix; the heating component is fluidly connected to the liquid storage chamber, and the heating component is used to atomize the aerosol generating matrix; the heating component is a heating component described in any one of the above.
- the third technical solution provided in this application is: to provide an electronic atomization device, comprising: the atomizer and the host as described above; the host is used to provide electrical energy for the heating component of the atomizer and control the heating component of the atomizer to atomize the aerosol generating matrix.
- the present application discloses a heating component, an atomizer and an electronic atomization device;
- the heating component comprises a substrate;
- the substrate comprises a liquid absorbing surface and an atomizing surface arranged opposite to each other, and the substrate is provided with at least one liquid guide penetrating the liquid absorbing surface and the atomizing surface Channel;
- the liquid guiding channel includes at least two liquid guiding holes, which penetrate the liquid suction surface and the atomization surface; the ports of two adjacent liquid guiding holes in the liquid guiding channel located on the atomization surface overlap each other, and the ports located on the liquid suction surface are arranged at intervals.
- the ports of two adjacent liquid guiding holes in the liquid guiding channel located on the atomization surface overlap each other, the volume porosity on the atomization surface is increased, the liquid supply effect is improved, and sufficient liquid supply is ensured; by making the ports of two adjacent liquid guiding holes in the liquid guiding channel located on the liquid suction surface be arranged at intervals, the liquid supply on the atomization surface is avoided to be too large, thereby avoiding liquid explosion, and helping to reduce return air during heating atomization.
- FIG1 is a schematic structural diagram of an embodiment of an electronic atomization device provided by the present application.
- FIG2 is a schematic diagram of the structure of an atomizer provided in one embodiment of the present application.
- FIG3 is a schematic diagram of the structure of a heating component provided in an embodiment of the present application.
- FIG4 is a schematic cross-sectional view of the heating component shown in FIG3 along line A-A;
- FIG5a is a schematic diagram of a partial structure of an embodiment of a base of the heating component shown in FIG3 ;
- Fig. 5b is a schematic cross-sectional view of the substrate shown in Fig. 5a along line B-B;
- FIG6a is a schematic diagram of a partial structure of another embodiment of the base of the heating component shown in FIG3 ;
- Fig. 6b is a schematic cross-sectional view of the substrate shown in Fig. 6a along line C-C;
- FIG7a is a schematic diagram of a partial structure of another embodiment of the base of the heating component shown in FIG3 ;
- Fig. 7b is a schematic cross-sectional view of the substrate shown in Fig. 7a along line D-D;
- FIG8a is a schematic top view of another embodiment of the base of the heating component shown in FIG3 ;
- Fig. 8b is a schematic cross-sectional view of the substrate shown in Fig. 8a along line E-E;
- FIG9 is a schematic top view of another embodiment of the base of the heating component shown in FIG3 ;
- FIG10 is a schematic top view of another embodiment of the base of the heating component shown in FIG3 ;
- FIG11 is a schematic top view of another embodiment of the base of the heating component shown in FIG3 ;
- FIG12 is a schematic top view of another embodiment of the base of the heating component shown in FIG3 ;
- FIG. 13 is a top view of another embodiment of the base of the heating component shown in FIG. 3 intention;
- FIG. 14 is a comparison diagram of the atomization amount of different embodiments of the substrate.
- first”, “second”, and “third” in this application are only used for descriptive purposes, and cannot be understood as indicating or implying relative importance or implicitly indicating the number of indicated technical features.
- the features defined as “first”, “second”, and “third” can explicitly or implicitly include at least one of the features.
- the meaning of “multiple” is at least two, such as two, three, etc., unless otherwise clearly and specifically defined. All directional indications in the embodiments of this application (such as up, down, left, right, front, back%) are only used to explain the relative position relationship, movement, etc. between the components under a certain specific posture (as shown in the accompanying drawings). If the specific posture changes, the directional indication also changes accordingly.
- FIG. 1 is a schematic structural diagram of an embodiment of an electronic atomization device provided in the present application.
- an electronic atomization device 100 is provided.
- the electronic atomization device 100 can be used for atomization of an aerosol-generating substrate.
- the electronic atomization device 100 includes an atomizer 1 and a host 2 that are electrically connected to each other.
- the atomizer 1 is used to store the aerosol-generating substrate and atomize the aerosol-generating substrate to form an aerosol that can be inhaled by the user.
- the atomizer 1 can be used in different fields, such as medical treatment, beauty, leisure inhalation, etc.
- the atomizer 1 can be It is used in an electronic aerosolization device to atomize an aerosol-generating matrix and generate an aerosol for a smoker to inhale. The following embodiments all take this leisure smoking as an example.
- the specific structure and function of the atomizer 1 may refer to the specific structure and function of the atomizer 1 involved in the following embodiments, and the same or similar technical effects can be achieved, which will not be repeated here.
- the host 2 includes a battery (not shown) and a controller (not shown).
- the battery is used to provide electrical energy for the operation of the atomizer 1, so that the atomizer 1 can atomize the aerosol-generating substrate to form an aerosol;
- the controller is used to control the operation of the atomizer 1, that is, to control the atomizer 1 to atomize the aerosol-generating substrate.
- the host 2 also includes other components such as a battery holder and an airflow sensor.
- the atomizer 1 and the host 2 can be integrally arranged or detachably connected, and can be designed according to specific needs.
- FIG. 2 is a schematic diagram of the structure of an atomizer provided in an embodiment of the present application.
- the atomizer 1 includes a housing 10, a heating component 11, and an atomizer seat 12.
- the atomizer seat 12 has an installation cavity (not shown), and the heating component 11 is arranged in the installation cavity; the heating component 11 and the atomizer seat 12 are arranged in the housing 10 together.
- the housing 10 is formed with a mist outlet channel 13, and the inner surface of the housing 10, the outer surface of the mist outlet channel 13 and the top surface of the atomizer seat 12 cooperate to form a liquid storage cavity 14, which is used to store liquid aerosol generating matrix.
- the heating component 11 is electrically connected to the host 2 to generate aerosol by atomizing the aerosol generating matrix.
- the atomizing seat 12 includes an upper seat 121 and a lower seat 122, and the upper seat 121 and the lower seat 122 cooperate to form an installation cavity; the surface of the heating component 11 away from the liquid storage cavity 14 cooperates with the cavity wall of the installation cavity to form an atomizing cavity 120.
- a lower liquid channel 1211 is provided on the upper seat 121; the aerosol generating matrix channel in the liquid storage cavity 14 flows into the heating component 11 through the lower liquid channel 1211, that is, the heating component 11 is in fluid communication with the liquid storage cavity 14.
- An air inlet channel 15 is provided on the lower seat 122, and external gas enters the atomizing cavity 120 through the air inlet channel 15, carrying the aerosol atomized by the heating component 11 to flow to the mist outlet channel 13, and the user inhales the aerosol through the port of the mist outlet channel 13.
- Figure 3 is a schematic diagram of the structure of a heating component provided in an embodiment of the present application.
- Figure 4 is a schematic diagram of a cross-section of the heating component shown in Figure 3 along the A-A line.
- Figure 5a is a schematic diagram of a partial structure of an embodiment of a substrate of the heating component shown in Figure 3.
- Figure 5b is a schematic diagram of a cross-section of the substrate shown in Figure 5a along the B-B line.
- Figure 6a is a schematic diagram of a partial structure of another embodiment of the substrate of the heating component shown in Figure 3.
- Figure 6b is a schematic diagram of a cross-section of the substrate shown in Figure 6a along the C-C line.
- Figure 7a is a schematic diagram of a partial structure of another embodiment of the substrate of the heating component shown in Figure 3.
- Figure 7b is a schematic diagram of a cross-section of the substrate shown in Figure 7a along the D-D line.
- Figure 8a is a schematic diagram of a partial structure of another embodiment of the substrate of the heating component shown in Figure 3.
- Figure 8b is a schematic diagram of a cross-section of the substrate shown in Figure 8a along the E-E line.
- Figure 9 is a schematic diagram of a top view of the structure of another embodiment of the substrate of the heating component shown in Figure 3.
- Figure 10 is a schematic diagram of a top view of the structure of another embodiment of the substrate of the heating component shown in Figure 3.
- Figure 11 is a top view structural schematic diagram of another embodiment of the base of the heating component shown in Figure 3
- Figure 12 is a top view structural schematic diagram of another embodiment of the base of the heating component shown in Figure 3
- Figure 13 is a top view structural schematic diagram of another embodiment of the base of the heating component shown in Figure 3.
- the heating component 11 includes a substrate 111.
- the substrate 111 includes a liquid absorption surface 1111 and an atomization surface 1112 that are arranged opposite to each other.
- the substrate 111 is provided with at least one liquid guide channel 1113 that penetrates the liquid absorption surface 1111 and the atomization surface 1112.
- the liquid guide channel 1113 includes at least two liquid guide holes 1113a, and the liquid guide holes 1113a penetrate the liquid absorption surface 1111 and the atomization surface 1112.
- the liquid guide holes 1113a have capillary force, and the liquid guide holes 1113a are used to guide the aerosol generation matrix from the liquid absorption surface 1111 to the atomization surface 1112; that is, the liquid guide channel 1113 is used to guide the aerosol generation matrix from the liquid absorption surface 1111 to the atomization surface 1112. Among them, the liquid guide hole 1113a extends along a straight line.
- the ports of two adjacent liquid guide holes 1113a in the liquid guide channel 1113 on the atomizing surface 1112 overlap each other, and the ports of two adjacent liquid guide holes 1113a in the liquid guide channel 1113 on the liquid suction surface 1111 are arranged at intervals. Since the ports of two adjacent liquid guide holes 1113a in the liquid guide channel 1113 on the atomizing surface 1112 overlap each other, the two adjacent liquid guide holes 1113a in the liquid guide channel 1113 are connected to each other.
- the ports of the two liquid guide holes 1113a on the atomizing surface 1112 overlap each other, which means that the ports of the two liquid guide holes 1113a on the atomizing surface 1112 overlap partially, so that the hole sections of the two liquid guide holes 1113a close to the atomizing surface 1112 are partially connected.
- the parts of the two liquid guide holes 1113a above the dotted line L are connected to each other, and the parts of the two liquid guide holes 1113a below the dotted line L are independent of each other.
- the volume porosity on the atomizing surface 1112 is increased, the liquid supply effect is improved, and sufficient liquid supply is ensured, which is beneficial to the increase of the atomization amount; in addition, it does not affect the passage of current in the heating layer 112 (introduced in subsequent content) on the atomizing surface 1112.
- the liquid guiding hole 1113a extends in a straight line, and the ports of two adjacent liquid guiding holes 1113a in the liquid guiding channel 1113 located on the atomizing surface 1112 overlap with each other, and the ports located on the liquid suction surface 1111 are arranged at intervals from each other.
- the equivalent diameter of the port of the liquid guiding hole 1113a located on the liquid suction surface 1111 is smaller than the equivalent diameter of the port of the liquid guiding hole 1113a located on the atomizing surface 1112, which increases the resistance of the return gas bubble and helps to reduce the return gas;
- the equivalent diameter of the port of the liquid guiding hole 1113a located on the liquid suction surface 1111 is set to be smaller than the equivalent diameter of the port of the liquid guiding hole 1113a located on the atomizing surface 1112, and the capillary pressure of the liquid guiding hole 1113a increases along the direction of the atomizing surface 1112 pointing to the liquid suction surface 1111, which can avoid the phenomenon of liquid explosion on the atomizing surface 1112 caused by excessive liquid supply.
- the equivalent diameter of the port of the liquid-conducting hole 1113a located on the atomizing surface 1112 is greater than or equal to 30 ⁇ m and less than or equal to 70 ⁇ m; and/or the equivalent diameter of the port of the liquid-conducting hole 1113a located on the liquid-absorbing surface 1111 is greater than or equal to 10 ⁇ m and less than or equal to 50 ⁇ m.
- the equivalent diameter of the port of the liquid-conducting hole 1113a located on the atomizing surface 1112 affects the aerosol particle size distribution range, and the smaller the equivalent diameter, the smaller the particle size; the equivalent diameter of the port of the liquid-conducting hole 1113a located on the atomizing surface 1112 is set to be greater than or equal to 30 ⁇ m and less than or equal to 70 ⁇ m, so that the aerosol particle size distribution is within a more optimal range and maintains a better taste.
- the equivalent diameter of the port of the liquid-conducting hole 1113a located on the liquid-absorbing surface 1111 affects the flow resistance of the aerosol generating matrix, The smaller the equivalent diameter, the more favorable it is to reduce the return air and avoid the generation of bubbles on the liquid suction surface 1111; the equivalent diameter of the port of the liquid guide hole 1113a located on the liquid suction surface 1111 is set to be greater than or equal to 10 ⁇ m and less than or equal to 50 ⁇ m, which reduces the return air and ensures smooth and sufficient liquid supply.
- a laser etching process is used to form a tapered liquid conducting hole 1113a (the cross-sectional shape of the liquid conducting hole 1113a is circular, and the longitudinal cross-sectional shape of the liquid conducting hole 1113a is an isosceles trapezoid), the aperture of the port of the liquid conducting hole 1113a located on the atomizing surface 1112 is larger than the aperture of the port of the liquid conducting hole 1113a located on the liquid absorbing surface 1111, and the difference between the aperture of the port of the liquid conducting hole 1113a located on the atomizing surface 1112 and the aperture of the port of the liquid conducting hole 1113a located on the liquid absorbing surface 1111 can be controlled within 20 ⁇ m.
- the aperture of the port of the liquid guiding hole 1113a located on the atomizing surface 1112 is less than 30 ⁇ m, and the aperture of the port of the liquid guiding hole 1113a located on the liquid absorbing surface 1111 is less than 10 ⁇ m, which is prone to insufficient liquid supply; the aperture of the port of the liquid guiding hole 1113a located on the atomizing surface 1112 is greater than 70 ⁇ m, and the aperture of the port of the liquid guiding hole 1113a located on the liquid absorbing surface 1111 is greater than 50 ⁇ m, which is prone to leakage.
- the heating component 11 also includes a heating layer 112, a pin conductive layer 113 and a protective layer 114.
- the heating layer 112 is used to electrically heat the atomized aerosol to generate the matrix.
- the heating layer 112 is arranged on the atomizing surface 1112 of the substrate 111.
- a pin conductive layer 113 is respectively provided at the opposite ends of the heating layer 112, and the pin conductive layer 113 is connected to the heating layer 112; the pin conductive layer 113 is used to be electrically connected to the host 2, and the heating layer 112 is electrically connected to the host 2 through the pin conductive layer 113.
- the contact resistance of the heating layer 112 to achieve electrical connection is reduced; for example, the heating component 11 is electrically connected to the host 2 through the elastic pin, and the elastic pin is in contact with the pin conductive layer 113.
- the pin conductive layer 113 has a large contact area, which reduces the contact resistance between the heating layer 112 and the elastic pin.
- the protective layer 114 is disposed on the surface of the heating layer 112 away from the substrate 111 . The protective layer 114 is used to prevent or reduce the risk of corrosion and oxidation of the heating layer 112 after heating, thereby extending the service life of the heating layer 112 .
- the heating layer 112 is formed by a physical vapor deposition process (for example, a magnetron sputtering process) or a chemical vapor deposition process or by a screen printing process; the thickness of the heating layer 112 formed by the physical vapor deposition process or the chemical vapor deposition process is smaller than the thickness of the heating layer 112 formed by the screen printing process.
- a physical vapor deposition process for example, a magnetron sputtering process
- the thickness of the heating layer 112 formed by the physical vapor deposition process or the chemical vapor deposition process is smaller than the thickness of the heating layer 112 formed by the screen printing process.
- the heating layer 112 is in the shape of a long strip and extends in a straight line.
- Two pin conductive layers 113 are respectively disposed at opposite ends of the heating layer 112, and the current flow direction of the heating layer 112 is the direction from one pin conductive layer 113 to the other pin conductive layer 113.
- the pin conductive layer 113 covers a portion of the heating layer 112. The remaining portion of the heating layer 112 not covered by the pin conductive layer 113 is covered by the protective layer 114.
- the substrate 111 includes a microporous area 1114 and a blank area 1115 adjacent to the microporous area 1114.
- the microporous area 1114 is provided with a plurality of liquid conducting holes 1113a, and the plurality of liquid conducting holes 1113a may be liquid conducting channels 1113 or independent liquid conducting holes 1113a; specifically, the plurality of liquid conducting holes 1113a of the microporous area 1114 may be formed by laser, etching or other processes.
- the blank area 1115 is not provided with liquid conducting holes 1113a.
- the blank area 1115 in the present application is a liquid conducting hole that can be formed.
- the blank area 1115 is not provided with liquid conducting holes 1113a, which reduces the number of liquid conducting holes 1113a on the substrate 111, thereby improving the strength of the substrate 111 and reducing the production cost of providing liquid conducting holes 1113a on the substrate 111.
- the heating layer 112 is at least partially provided in the microporous area 1114; the heating layer 112 is used to atomize the aerosol generating matrix on the atomizing surface 1112.
- the pin conductive layer 113 is at least partially provided in the blank area 1115 to ensure the continuity and stability of the pin conductive layer 113.
- the blank area 1115 is arranged around the microporous area 1114.
- a portion of the heating layer 112 is arranged in the microporous area 1114, and another portion extends to the blank area 1115.
- a portion of the pin conductive layer 113 is arranged in the blank area 1115, and another portion extends to the microporous area 1114.
- the heating layer 112 and the pin conductive layer 113 have overlapping portions in the blank area 1115 and the microporous area 1114.
- the liquid-conducting channel 1113 is provided in the microporous area 1114.
- a part of the area in the microporous area 1114 is provided with a liquid-conducting channel 1113, and the remaining area in the microporous area 1114 where the liquid-conducting channel 1113 is not provided is provided with a plurality of mutually independent liquid-conducting holes 1113a (as shown in FIG. 3); wherein, when the number of liquid-conducting channels 1113 provided in the microporous area 1114 is multiple, the plurality of liquid-conducting channels 1113 can be arranged regularly (for example, in an array) or in an irregular arrangement.
- all areas in the microporous area 1114 are used to set the liquid-conducting channel 1113, that is, the microporous area 1114 is provided with a plurality of liquid-conducting channels 1113, and no mutually independent liquid-conducting holes 1113a are provided; wherein, the plurality of liquid-conducting channels 1113 can be arranged regularly (for example, in an array) or in an irregular arrangement, and the specific design is based on the needs.
- the following is a detailed introduction to the plurality of liquid-conducting channels 1113 provided on the substrate 111.
- a plurality of liquid conducting channels 1113 are provided on the substrate 111, and the plurality of liquid conducting channels 1113 are arranged in multiple rows and columns (as shown in FIG. 5a to FIG. 13). That is, in the specific embodiment of the present application, isolated liquid conducting holes 1113a are not included.
- the spacing between any two adjacent rows of liquid-conducting channels 1113 is the same, and the spacing between any two adjacent columns of liquid-conducting channels 1113 is the same, which is convenient for processing and helps to reduce the difficulty of processing. It can be understood that the spacing between any two adjacent rows of liquid-conducting channels 1113 can be different, and the spacing between any two adjacent columns of liquid-conducting channels 1113 can be the same or different, which is specifically designed according to needs.
- the number of the liquid conducting holes 1113a in each liquid conducting channel 1113 is the same, which is convenient for processing and helps to reduce the processing difficulty. It is understandable that the number of the liquid conducting holes 1113a in each liquid conducting channel 1113 can also be different, and it is specifically designed according to needs.
- all the liquid guide holes 1113a in each liquid guide channel 1113 in the same row are arranged in a one-dimensional array, which is convenient for processing and helps to reduce the difficulty of processing.
- the multiple liquid guide holes 1113a of each liquid guide channel 1113 are arranged in a one-dimensional array along the current flow direction of the heating layer 112. This arrangement does not affect the current flow in the heating layer 112 on the atomization surface 1112. It is understood that the arrangement of the multiple liquid conducting holes 1113a in each liquid conducting channel 1113 is not limited to a one-dimensional array arrangement, and can be designed specifically according to needs.
- the cross-sectional shape of each part of the liquid-guiding hole 1113a is the same; along the direction from the atomizing surface 1112 to the liquid-absorbing surface 1111, the cross-sectional area of the liquid-guiding hole 1113a gradually decreases.
- the cross-sectional shape of the liquid-guiding hole 1113a is circular, and the longitudinal cross-sectional shape of the liquid-guiding hole 1113a is an isosceles trapezoid (as shown in Figures 3-7b).
- the cross-sectional shape of the liquid-guiding hole 1113a is circular, and the longitudinal cross-sectional shape of the liquid-guiding hole 1113a is a right-angled trapezoid (as shown in Figures 8a and 8b), wherein the cross-sectional shape refers to the cross-sectional shape along the direction parallel to the atomizing surface 1112, and the longitudinal cross-sectional shape refers to the cross-sectional shape along the thickness direction parallel to the substrate 111.
- a plurality of liquid conducting channels 1113 are provided on the substrate 111, and the plurality of liquid conducting channels 1113 are arranged in a plurality of rows and columns, the row direction is the same as the current flow direction of the heating layer 112, the spacing between two adjacent rows of liquid conducting channels 1113 is the same, the spacing between two adjacent columns of liquid conducting channels 1113 is the same, and each liquid conducting channel 1113 includes two liquid conducting holes 1113a, and the two liquid conducting holes 1113a are arranged in one dimension along the current flow direction of the heating layer 112.
- the cross-sectional shape of the liquid guiding hole 1113a is an isosceles trapezoid (as shown in FIGS. 5a and 5b), or the cross-sectional shape of the liquid guiding hole 1113a is a right-angled trapezoid (as shown in FIGS. 8a and 8b).
- a plurality of liquid conducting channels 1113 are provided on the substrate 111, and the plurality of liquid conducting channels 1113 are arranged in a plurality of rows and columns, and the row direction is the same as the current flow direction of the heating layer 112, and the spacing between two adjacent rows of liquid conducting channels 1113 is the same, and the spacing between two adjacent columns of liquid conducting channels 1113 is the same, and each liquid conducting channel 1113 includes five liquid conducting holes 1113a, and the five liquid conducting holes 1113a are arranged in one dimension along the current flow direction of the heating layer 112.
- the cross-sectional shape of the liquid conducting hole 1113a is an isosceles trapezoid.
- a plurality of liquid conducting channels 1113 are provided on the substrate 111, and the plurality of liquid conducting channels 1113 are arranged in a plurality of rows and columns, and the row direction is the same as the current flow direction of the heating layer 112, and the spacing between two adjacent rows of liquid conducting channels 1113 is the same, and the spacing between two adjacent columns of liquid conducting channels 1113 is the same, and each liquid conducting channel 1113 includes twelve liquid conducting holes 1113a, and the twelve liquid conducting holes 1113a are arranged in one dimension along the current flow direction of the heating layer 112.
- the cross-sectional shape of the liquid conducting hole 1113a is an isosceles trapezoid.
- a plurality of liquid conducting channels 1113 are provided on the base body 111, and the plurality of liquid conducting channels 1113 are arranged into a plurality of rows and columns, the row direction is the same as the current flow direction of the heating layer 112, the spacing between two adjacent rows of liquid conducting channels 1113 is the same, the spacing between two adjacent columns of liquid conducting channels 1113 is the same, each liquid conducting channel 1113 includes two liquid conducting holes 1113a, and an acute angle is formed between the arrangement direction of the two liquid conducting holes 1113a and the current flow direction of the heating layer 112, the angle formed between the arrangement direction of the two liquid conducting holes 1113a of each liquid conducting channel 1113 and the current flow direction of the heating layer 112 is the same, and the ports of the two liquid conducting holes 1113a of each liquid conducting channel 1113 on the atomizing surface 1112 overlap with each other, and the ports on the liquid absorption surface 1111 are spaced apart from each other.
- a plurality of liquid-conducting channels 1113 are provided on the substrate 111, and the plurality of liquid-conducting channels 1113 are arranged in a plurality of rows and columns, the row direction is the same as the current flow direction of the heating layer 112, the spacing between two adjacent rows of liquid-conducting channels 1113 is the same, the spacing between two adjacent columns of liquid-conducting channels 1113 is the same, each liquid-conducting channel 1113 includes two liquid-conducting holes 1113a, and an acute angle is formed between the arrangement direction of the two liquid-conducting holes 1113a and the current flow direction of the heating layer 112, and the liquid-conducting channels 1113 in odd-numbered columns are arranged axially symmetrically with the liquid-conducting channels 1113 in even-numbered columns.
- the ports of the two liquid-conducting holes 1113a of each liquid-conducting channel 1113 on the atomizing surface 1112 overlap each other, and the ports on the liquid-absorbing surface 1111 are
- a plurality of liquid-conducting channels 1113 are provided on the substrate 111, and the plurality of liquid-conducting channels 1113 are arranged in a plurality of rows and columns, the row direction is the same as the current flow direction of the heating layer 112, the spacing between two adjacent rows of liquid-conducting channels 1113 is the same, the spacing between two adjacent columns of liquid-conducting channels 1113 is the same, and each liquid-conducting channel 1113 includes two liquid-conducting holes 1113a, the arrangement direction of the two liquid-conducting holes 1113a in the liquid-conducting channels 1113 in the odd-numbered columns is parallel to the current flow direction of the heating layer 112, and the arrangement direction of the two liquid-conducting holes 1113a in the liquid-conducting channels 1113 in the even-numbered columns is perpendicular to the current flow direction of the heating layer 112.
- a plurality of liquid-conducting channels 1113 are provided on the substrate 111, and the plurality of liquid-conducting channels 1113 are arranged in a plurality of rows and columns, the row direction is the same as the current flow direction of the heating layer 112, the spacing between two adjacent rows of liquid-conducting channels 1113 is the same, the spacing between two adjacent columns of liquid-conducting channels 1113 is the same, and each liquid-conducting channel 1113 includes three liquid-conducting holes 1113a, and the ports of any two adjacent liquid-conducting holes 1113a among the three liquid-conducting holes 1113a overlap each other on the atomizing surface 1112, and the ports on the liquid-absorbing surface 1111 are arranged at intervals from each other.
- the lines connecting the centers of the three liquid-conducting holes 1113a form an equilateral triangle.
- a plurality of liquid conducting channels 1113 are provided on the substrate 111 , and the plurality of liquid conducting channels 1113 are arranged in a plurality of rows and columns, and the row direction is the same as the current flow direction of the heating layer 112 , and the spacing between two adjacent rows of liquid conducting channels 1113 is the same, and the spacing between two adjacent columns of liquid conducting channels 1113 is the same, and each liquid conducting channel 1113 includes four liquid conducting holes 1113a, the lines connecting the centers of the four liquid-conducting holes 1113a form a square, the four liquid-conducting holes 1113a are arranged in a two-dimensional array, and the two liquid-conducting holes 1113a on the diagonal line do not overlap.
- the hole center distance L1 between adjacent liquid conducting holes 1113a in the liquid conducting channel 1113 is greater than or equal to 20 ⁇ m and less than or equal to 60 ⁇ m; it can be understood that the hole center distance L1 between adjacent liquid conducting holes 1113a in each group of liquid conducting holes 1113a affects the porosity of the substrate 111, thereby affecting the liquid supply capacity. Setting the hole center distance L1 to be greater than or equal to 20 ⁇ m and less than or equal to 60 ⁇ m allows the substrate 111 to have a better liquid supply capacity and can ensure the strength of the substrate 111.
- the hole center distance L2 between two adjacent rows of liquid conducting channels 1113 is greater than or equal to 60 ⁇ m and less than or equal to 140 ⁇ m; it can be understood that the hole center distance L2 between two adjacent rows of liquid conducting channels 1113 affects the current flow area on the heating layer 112, and thus affects the resistance of the heating layer 112.
- the hole center distance L2 is set to be greater than or equal to 60 ⁇ m and less than or equal to 140 ⁇ m, which is used to ensure the effective width of part of the heating layer 112 between two adjacent rows of liquid conducting channels 1113.
- the substrate 111 has a large porosity, it avoids excessive resistance of the heating layer 112 and causes excessive local temperature, thereby avoiding problems such as breakage or melting of the heating layer 112.
- the aperture of the liquid guiding hole 1113a is greater than or equal to 20 ⁇ m and less than or equal to 60 ⁇ m, and the hole center distance L1 between adjacent liquid guiding holes 1113a in the liquid guiding channel 1113 is greater than or equal to 20 ⁇ m and less than or equal to 60 ⁇ m.
- the aperture of the liquid guiding hole 1113a and the hole center distance L1 between adjacent liquid guiding holes 1113a in the liquid guiding channel 1113 are designed as above to facilitate controlling the overlapping area of adjacent liquid guiding holes 1113a in the liquid guiding channel 1113 on the atomizing surface 1112.
- the hole center distance L1 between adjacent liquid guide holes 1113a in the liquid guide channel 1113 is greater than or equal to 20 ⁇ m and less than or equal to 40 ⁇ m.
- the hole center distance L1 between adjacent liquid guide holes 1113a in the liquid guide channel 1113 is 30 ⁇ m.
- the hole center distance L1 between adjacent liquid guide holes 1113a in the liquid guide channel 1113 is 50 ⁇ m.
- the hole center distance L2 between two adjacent rows of liquid guide channels 1113 is greater than or equal to 60 ⁇ m and less than or equal to 100 ⁇ m.
- the hole center distance L2 between two adjacent rows of liquid guide channels 1113 is greater than or equal to 80 ⁇ m and less than or equal to 120 ⁇ m.
- the substrate 111 is a dense substrate.
- the material of the substrate 111 is at least one of glass and dense ceramics. It is understandable that the material of the substrate 111 includes but is not limited to glass and dense ceramics, and is specifically designed according to needs.
- the substrate 111 made of dense materials such as glass has a smooth surface, so a continuous and stable metal film can be deposited on the surface of the substrate 111 by physical vapor deposition or chemical vapor deposition to form a heating layer 112.
- the thickness of the heating layer 112 is within the range of a few microns or nanometers, which can not only miniaturize the heating component 11, but also save the material of the heating layer 112.
- the substrate 111 is a porous substrate.
- the material of the substrate 111 is porous ceramics; porous ceramics are prepared by molding and special high-temperature sintering processes of raw materials. A porous ceramic material with an open pore size and a high open porosity. The porous ceramic forms a plurality of disordered pores during the preparation process.
- the thickness of the substrate 111 is 0.5mm-2.5mm.
- the thickness of the substrate 111 is greater than 2.5mm, the liquid supply demand cannot be met, resulting in a decrease in the amount of aerosol, and a large amount of heat loss is caused. It is not easy to penetrate when forming the liquid guide hole 1113a, and the cost of setting the liquid guide hole 1113a is high; when the thickness of the substrate 111 is less than 0.5mm, the strength of the substrate 111 cannot be guaranteed, which is not conducive to improving the performance of the electronic atomization device.
- the thickness of the substrate 111 is 0.5mm-1mm.
- the thickness of the substrate 111 is 1.5mm-2.5mm.
- liquid absorption surface 1111 and the atomization surface 1112 are arranged in parallel to facilitate processing and assembly.
- FIG. 14 is a comparison diagram of the atomization amount of different embodiments of the substrate.
- the present application also conducts experimental comparisons on different implementations of the substrate 111, including a first experimental piece, a second experimental piece, a third experimental piece, and a fourth experimental piece.
- the first experimental piece is a substrate structure in the prior art, and the multiple liquid guide holes on the substrate are independent of each other, and the multiple liquid guide holes are arranged in multiple rows and columns.
- the second experimental piece is the substrate 111 shown in Figures 5a and 5b.
- the third experimental piece is the substrate 111 shown in Figures 6a and 6b.
- the fourth experimental piece is the substrate 111 shown in Figures 7a and 7b.
- Table 1 and Figure 14 below The experimental results are shown in Table 1 and Figure 14 below.
- D1 is the port aperture of the liquid guide hole 1113a on the atomizing surface 1112.
- D2 is the port aperture of the liquid guide hole 1113a on the liquid suction surface 1111.
- L1 is the spacing between two adjacent columns of liquid guide holes, and L2 is the spacing between two adjacent rows of liquid guide holes.
- L1 is the hole center distance between adjacent liquid guide holes 1113a in each group of liquid guide channels 1113, and L2 is the hole center distance between two adjacent rows of liquid guide channels 1113.
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Abstract
Description
相关申请的交叉引用CROSS-REFERENCE TO RELATED APPLICATIONS
本申请基于2023年05月17日提交的中国专利申请202321201643.3主张其优先权,此处通过参照引入其全部的记载内容。This application claims priority based on Chinese patent application 202321201643.3 filed on May 17, 2023, and all its contents are incorporated herein by reference.
本申请涉及电子雾化技术领域,具体涉及一种发热组件、雾化器及电子雾化装置。The present application relates to the technical field of electronic atomization, and in particular to a heating component, an atomizer and an electronic atomization device.
电子雾化装置由发热组件、电池和控制电路等部分组成,发热组件作为电子雾化装置的核心元件,其特性决定了电子雾化装置的雾化效果和使用体验。The electronic atomization device is composed of a heating component, a battery, a control circuit and other parts. The heating component is the core component of the electronic atomization device, and its characteristics determine the atomization effect and user experience of the electronic atomization device.
现有的发热组件较为常见的雾化方式为电阻加热。具体地,发热组件包括基体和设于基体的表面的发热膜;其中,基体上设有多个贯穿孔,贯穿孔用于导引气溶胶生成基质。多个贯穿孔之间相互独立分布。贯穿孔的孔径较小时,导液阻力较大,容易出现供液不足或返气的现象,造成发热膜烧断;贯穿孔的孔径较大时,供液充足,容易出现炸液同时伴有噪音。The more common atomization method of existing heating components is resistive heating. Specifically, the heating component includes a substrate and a heating film arranged on the surface of the substrate; wherein, the substrate is provided with a plurality of through holes, and the through holes are used to guide the aerosol to generate the matrix. The multiple through holes are distributed independently of each other. When the aperture of the through hole is small, the liquid conduction resistance is large, and it is easy to have insufficient liquid supply or gas return, causing the heating film to burn out; when the aperture of the through hole is large, the liquid supply is sufficient, and it is easy to have liquid explosion accompanied by noise.
发明内容Summary of the invention
本申请提供的发热组件、雾化器及电子雾化装置,以在保证供液充足的同时减少返气、避免出现炸液。The heating component, atomizer and electronic atomization device provided in the present application can reduce the return air and avoid the explosion of liquid while ensuring sufficient liquid supply.
为了解决上述技术问题,本申请提供的第一个技术方案为:提供一种发热组件,应用于电子雾化装置,用于雾化气溶胶生成基质,所述发热组件包括基体,所述基体包括相对设置的吸液面和雾化面;所述基体上设有至少一个贯穿所述吸液面和所述雾化面的导液通道;其中,所述导液通道包括至少两个导液孔,所述导液孔贯穿所述吸液面和所述雾化面;所述导液通道中的相邻两个所述导液孔位于所述雾化面上的端口相互交叠且位于所述吸液面上的端口相互间隔设置。In order to solve the above-mentioned technical problems, the first technical solution provided in the present application is: to provide a heating component, applied to an electronic atomization device, for atomizing an aerosol to generate a matrix, the heating component includes a substrate, the substrate includes a liquid absorption surface and an atomization surface arranged opposite to each other; the substrate is provided with at least one liquid conduction channel passing through the liquid absorption surface and the atomization surface; wherein the liquid conduction channel includes at least two liquid conduction holes, the liquid conduction holes passing through the liquid absorption surface and the atomization surface; the ports of two adjacent liquid conduction holes in the liquid conduction channel located on the atomization surface overlap with each other, and the ports located on the liquid absorption surface are arranged at intervals from each other.
在一实施方式中,所述导液孔在各处的横截面形状相同;沿着从所述雾化面指向所述吸液面的方向上,所述导液孔的横截面面积逐渐减小。In one embodiment, the cross-sectional shape of the liquid guiding hole is the same at all locations; and the cross-sectional area of the liquid guiding hole gradually decreases along the direction from the atomization surface to the liquid absorption surface.
在一实施方式中,所述导液孔的纵截面形状为等腰梯形,且所述导液孔的横截面形状为圆形。In one embodiment, the longitudinal section of the liquid guiding hole is an isosceles trapezoid, and the cross-sectional shape of the liquid guiding hole is a circle.
在一实施方式中,所述基体上设有多个所述导液通道,多个所述 导液通道排列成多行多列。In one embodiment, the substrate is provided with a plurality of the liquid conducting channels. The fluid conducting channels are arranged in multiple rows and columns.
在一实施方式中,任意相邻两行所述导液通道之间的间距相同,任意相邻两列所述导液通道之间的间距相同。In one embodiment, the spacing between any two adjacent rows of the liquid-conducting channels is the same, and the spacing between any two adjacent columns of the liquid-conducting channels is the same.
在一实施方式中,每个所述导液通道中的所述导液孔的数量相同。In one embodiment, the number of the liquid conducting holes in each of the liquid conducting channels is the same.
在一实施方式中,同一行的每个所述导液通道中的所有所述导液孔呈一维阵列排布。In one embodiment, all of the liquid conducting holes in each of the liquid conducting channels in the same row are arranged in a one-dimensional array.
在一实施方式中,所述导液通道中相邻的所述导液孔之间的孔中心距大于等于20μm且小于等于60μm;和/或相邻两行的所述导液通道之间的孔中心距大于等于60μm且小于等于140μm。In one embodiment, the center distance between adjacent liquid conducting holes in the liquid conducting channel is greater than or equal to 20 μm and less than or equal to 60 μm; and/or the center distance between two adjacent rows of liquid conducting channels is greater than or equal to 60 μm and less than or equal to 140 μm.
在一实施方式中,所述导液孔位于所述雾化面的端口的当量直径大于等于30μm且小于等于70μm;和/或所述导液孔位于所述吸液面的端口的当量直径大于等于10μm且小于等于50μm。In one embodiment, the equivalent diameter of the liquid guide hole located at the atomization surface is greater than or equal to 30 μm and less than or equal to 70 μm; and/or the equivalent diameter of the liquid guide hole located at the liquid absorption surface is greater than or equal to 10 μm and less than or equal to 50 μm.
在一实施方式中,所述基体为致密基体或多孔基体。In one embodiment, the matrix is a dense matrix or a porous matrix.
在一实施方式中,所述基体为致密基体,所述基体的材料为玻璃、致密陶瓷中的至少一种;或,In one embodiment, the substrate is a dense substrate, and the material of the substrate is at least one of glass and dense ceramic; or,
所述基体为多孔基体,所述基体的材料为多孔陶瓷。The substrate is a porous substrate, and the material of the substrate is porous ceramic.
在一实施方式中,所述基体的厚度为0.5mm-2.5mm。In one embodiment, the thickness of the substrate is 0.5 mm-2.5 mm.
在一实施方式中,所述发热组件还包括发热层、引脚导电层和保护层;所述发热层设于所述雾化面;所述发热层相对的两端分别设有一个所述引脚导电层,所述引脚导电层与所述发热层连接;所述保护层设于所述发热层远离所述基体的表面,所述保护层用于保护所述发热层。In one embodiment, the heating component also includes a heating layer, a pin conductive layer and a protective layer; the heating layer is arranged on the atomized surface; a pin conductive layer is respectively provided at two opposite ends of the heating layer, and the pin conductive layer is connected to the heating layer; the protective layer is arranged on the surface of the heating layer away from the substrate, and the protective layer is used to protect the heating layer.
在一实施方式中,所述基体包括微孔区和邻近所述微孔区的留白区;所述微孔区设有多个所述导液孔;所述留白区未设所述导液孔;所述发热层至少部分设于所述微孔区,所述引脚导电层至少部分设于所述留白区。In one embodiment, the substrate includes a microporous area and a blank area adjacent to the microporous area; the microporous area is provided with a plurality of the liquid conduction holes; the blank area is not provided with the liquid conduction holes; the heat generating layer is at least partially provided in the microporous area, and the pin conductive layer is at least partially provided in the blank area.
为了解决上述技术问题,本申请提供的第二个技术方案为:提供一种雾化器,包括储液腔和发热组件;所述储液腔用于储存气溶胶生成基质;所述发热组件与所述储液腔流体连通,所述发热组件用于雾化所述气溶胶生成基质;所述发热组件为上述任意一项所述的发热组件。In order to solve the above technical problems, the second technical solution provided in the present application is: to provide a nebulizer, comprising a liquid storage chamber and a heating component; the liquid storage chamber is used to store an aerosol generating matrix; the heating component is fluidly connected to the liquid storage chamber, and the heating component is used to atomize the aerosol generating matrix; the heating component is a heating component described in any one of the above.
为了解决上述技术问题,本申请提供的第三个技术方案为:提供一种电子雾化装置,包括:上述所述的雾化器和主机;所述主机用于为所述雾化器的发热组件工作提供电能和控制所述雾化器的发热组件雾化所述气溶胶生成基质。In order to solve the above technical problems, the third technical solution provided in this application is: to provide an electronic atomization device, comprising: the atomizer and the host as described above; the host is used to provide electrical energy for the heating component of the atomizer and control the heating component of the atomizer to atomize the aerosol generating matrix.
本申请的有益效果:区别于现有技术,本申请公开了一种发热组件、雾化器及电子雾化装置;发热组件包括基体;基体包括相对设置的吸液面和雾化面,基体上设有至少一个贯穿吸液面和雾化面的导液 通道;其中,导液通道包括至少两个导液孔,导液孔贯穿吸液面和雾化面;导液通道中的相邻两个导液孔位于雾化面上的端口相互交叠且位于吸液面上的端口相互间隔设置。通过使导液通道中的相邻两个导液孔位于雾化面上的端口相互交叠,增加雾化面上的体积孔隙率,提升供液效果,保证供液充足;通过使导液通道中相邻两个导液孔位于吸液面上的端口相互间隔设置,避免雾化面的供液量过大,进而避免出现炸液,且有助于加热雾化时减少返气。Beneficial effects of the present application: Different from the prior art, the present application discloses a heating component, an atomizer and an electronic atomization device; the heating component comprises a substrate; the substrate comprises a liquid absorbing surface and an atomizing surface arranged opposite to each other, and the substrate is provided with at least one liquid guide penetrating the liquid absorbing surface and the atomizing surface Channel; wherein the liquid guiding channel includes at least two liquid guiding holes, which penetrate the liquid suction surface and the atomization surface; the ports of two adjacent liquid guiding holes in the liquid guiding channel located on the atomization surface overlap each other, and the ports located on the liquid suction surface are arranged at intervals. By making the ports of two adjacent liquid guiding holes in the liquid guiding channel located on the atomization surface overlap each other, the volume porosity on the atomization surface is increased, the liquid supply effect is improved, and sufficient liquid supply is ensured; by making the ports of two adjacent liquid guiding holes in the liquid guiding channel located on the liquid suction surface be arranged at intervals, the liquid supply on the atomization surface is avoided to be too large, thereby avoiding liquid explosion, and helping to reduce return air during heating atomization.
为了更清楚地说明本申请实施例中的技术方案,下面将对实施例描述中所需要使用的附图作简单地介绍,显而易见地,下面描述中的附图仅仅是本申请的一些实施例,对于本领域普通技术人员来讲,在不付出创造性劳动的前提下,还可以根据这些附图获得其它的附图。In order to more clearly illustrate the technical solutions in the embodiments of the present application, the drawings required for use in the description of the embodiments will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying any creative work.
图1是本申请提供的电子雾化装置的一实施例的结构示意图;FIG1 is a schematic structural diagram of an embodiment of an electronic atomization device provided by the present application;
图2是本申请一实施例提供的雾化器的结构示意图;FIG2 is a schematic diagram of the structure of an atomizer provided in one embodiment of the present application;
图3是本申请实施例提供的发热组件的结构示意图;FIG3 is a schematic diagram of the structure of a heating component provided in an embodiment of the present application;
图4是图3所示的发热组件沿A-A线的截面示意图;FIG4 is a schematic cross-sectional view of the heating component shown in FIG3 along line A-A;
图5a是图3所示的发热组件的基体一实施方式的局部结构示意图;FIG5a is a schematic diagram of a partial structure of an embodiment of a base of the heating component shown in FIG3 ;
图5b是图5a所示的基体沿B-B线的截面示意图;Fig. 5b is a schematic cross-sectional view of the substrate shown in Fig. 5a along line B-B;
图6a是图3所示的发热组件的基体另一实施方式的局部结构示意图;FIG6a is a schematic diagram of a partial structure of another embodiment of the base of the heating component shown in FIG3 ;
图6b是图6a所示的基体沿C-C线的截面示意图;Fig. 6b is a schematic cross-sectional view of the substrate shown in Fig. 6a along line C-C;
图7a是图3所示的发热组件的基体又一实施方式的局部结构示意图;FIG7a is a schematic diagram of a partial structure of another embodiment of the base of the heating component shown in FIG3 ;
图7b是图7a所示的基体沿D-D线的截面示意图;Fig. 7b is a schematic cross-sectional view of the substrate shown in Fig. 7a along line D-D;
图8a是图3所示的发热组件的基体又一实施方式的俯视结构示意图;FIG8a is a schematic top view of another embodiment of the base of the heating component shown in FIG3 ;
图8b是图8a所示的基体沿E-E线的截面示意图;Fig. 8b is a schematic cross-sectional view of the substrate shown in Fig. 8a along line E-E;
图9是图3所示的发热组件的基体又一实施方式的俯视结构示意图;FIG9 is a schematic top view of another embodiment of the base of the heating component shown in FIG3 ;
图10是图3所示的发热组件的基体又一实施方式的俯视结构示意图;FIG10 is a schematic top view of another embodiment of the base of the heating component shown in FIG3 ;
图11是图3所示的发热组件的基体又一实施方式的俯视结构示意图;FIG11 is a schematic top view of another embodiment of the base of the heating component shown in FIG3 ;
图12是图3所示的发热组件的基体又一实施方式的俯视结构示意图;FIG12 is a schematic top view of another embodiment of the base of the heating component shown in FIG3 ;
图13是图3所示的发热组件的基体又一实施方式的俯视结构示 意图;FIG. 13 is a top view of another embodiment of the base of the heating component shown in FIG. 3 intention;
图14是基体不同实施方式的雾化量对比图。FIG. 14 is a comparison diagram of the atomization amount of different embodiments of the substrate.
下面将结合本申请实施例中的附图,对本申请实施例中的技术方案进行清楚、完整地描述,显然,所描述的实施例仅是本申请的一部分实施例,而不是全部的实施例。基于本申请中的实施例,本领域普通技术人员在没有做出创造性劳动前提下所获得的所有其他实施例,都属于本申请保护的范围。The following will be combined with the drawings in the embodiments of the present application to clearly and completely describe the technical solutions in the embodiments of the present application. Obviously, the described embodiments are only part of the embodiments of the present application, not all of the embodiments. Based on the embodiments in the present application, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of this application.
以下描述中,为了说明而不是为了限定,提出了诸如特定系统结构、接口、技术之类的具体细节,以便透彻理解本申请。In the following description, for the purpose of explanation rather than limitation, specific details such as specific system structures, interfaces, and technologies are provided to facilitate a thorough understanding of the present application.
本申请中的术语“第一”、“第二”、“第三”仅用于描述目的,而不能理解为指示或暗示相对重要性或者隐含指明所指示的技术特征的数量。由此,限定有“第一”、“第二”、“第三”的特征可以明示或者隐含地包括至少一个所述特征。本申请的描述中,“多个”的含义是至少两个,例如两个,三个等,除非另有明确具体的限定。本申请实施例中所有方向性指示(诸如上、下、左、右、前、后……)仅用于解释在某一特定姿态(如附图所示)下各部件之间的相对位置关系、运动情况等,如果所述特定姿态发生改变时,则所述方向性指示也相应地随之改变。本申请实施例中的术语“包括”和“具有”以及它们任何变形,意图在于覆盖不排他的包含。例如包含了一系列步骤或单元的过程、方法、系统、产品或设备没有限定于已列出的步骤或单元,而是可选地还包括没有列出的步骤或单元,或可选地还包括对于这些过程、方法、产品或设备固有的其它步骤或组件。The terms "first", "second", and "third" in this application are only used for descriptive purposes, and cannot be understood as indicating or implying relative importance or implicitly indicating the number of indicated technical features. Thus, the features defined as "first", "second", and "third" can explicitly or implicitly include at least one of the features. In the description of this application, the meaning of "multiple" is at least two, such as two, three, etc., unless otherwise clearly and specifically defined. All directional indications in the embodiments of this application (such as up, down, left, right, front, back...) are only used to explain the relative position relationship, movement, etc. between the components under a certain specific posture (as shown in the accompanying drawings). If the specific posture changes, the directional indication also changes accordingly. The terms "including" and "having" in the embodiments of this application and any of their variations are intended to cover non-exclusive inclusions. For example, a process, method, system, product, or device that includes a series of steps or units is not limited to the listed steps or units, but optionally also includes steps or units that are not listed, or optionally also includes other steps or components inherent to these processes, methods, products, or devices.
在本文中提及“实施例”意味着,结合实施例描述的特定特征、结构或特性可以包含在本申请的至少一个实施例中。在说明书中的各个位置出现所述短语并不一定均是指相同的实施例,也不是与其它实施例互斥的独立的或备选的实施例。本领域技术人员显式地和隐式地理解的是,本文所描述的实施例可以与其它实施例相结合。Reference to "embodiments" herein means that a particular feature, structure, or characteristic described in conjunction with the embodiments may be included in at least one embodiment of the present application. The appearance of the phrase in various locations in the specification does not necessarily refer to the same embodiment, nor is it an independent or alternative embodiment that is mutually exclusive with other embodiments. It is explicitly and implicitly understood by those skilled in the art that the embodiments described herein may be combined with other embodiments.
下面结合附图和实施例对本申请进行详细的说明。The present application is described in detail below with reference to the accompanying drawings and embodiments.
请参阅图1,图1是本申请提供的电子雾化装置的一实施例的结构示意图。Please refer to FIG. 1 , which is a schematic structural diagram of an embodiment of an electronic atomization device provided in the present application.
在本实施例中,提供一种电子雾化装置100。该电子雾化装置100可用于气溶胶生成基质的雾化。电子雾化装置100包括相互电连接的雾化器1和主机2。In this embodiment, an electronic atomization device 100 is provided. The electronic atomization device 100 can be used for atomization of an aerosol-generating substrate. The electronic atomization device 100 includes an atomizer 1 and a host 2 that are electrically connected to each other.
其中,雾化器1用于存储气溶胶生成基质并雾化气溶胶生成基质以形成可供用户吸食的气溶胶。该雾化器1具体可用于不同的领域,比如,医疗、美容、休闲吸食等。在一具体实施例中,该雾化器1可 用于电子气溶胶化装置,用于雾化气溶胶生成基质并产生气溶胶,以供抽吸者抽吸,以下实施例均以此休闲吸食为例。The atomizer 1 is used to store the aerosol-generating substrate and atomize the aerosol-generating substrate to form an aerosol that can be inhaled by the user. The atomizer 1 can be used in different fields, such as medical treatment, beauty, leisure inhalation, etc. In a specific embodiment, the atomizer 1 can be It is used in an electronic aerosolization device to atomize an aerosol-generating matrix and generate an aerosol for a smoker to inhale. The following embodiments all take this leisure smoking as an example.
雾化器1的具体结构与功能可参见以下实施例所涉及的雾化器1的具体结构与功能,且可实现相同或相似的技术效果,在此不再赘述。The specific structure and function of the atomizer 1 may refer to the specific structure and function of the atomizer 1 involved in the following embodiments, and the same or similar technical effects can be achieved, which will not be repeated here.
主机2包括电池(图未示)和控制器(图未示)。电池用于为雾化器1的工作提供电能,以使得雾化器1能够雾化气溶胶生成基质形成气溶胶;控制器用于控制雾化器1工作,即,控制雾化器1雾化气溶胶生成基质。主机2还包括电池支架、气流传感器等其他元件。The host 2 includes a battery (not shown) and a controller (not shown). The battery is used to provide electrical energy for the operation of the atomizer 1, so that the atomizer 1 can atomize the aerosol-generating substrate to form an aerosol; the controller is used to control the operation of the atomizer 1, that is, to control the atomizer 1 to atomize the aerosol-generating substrate. The host 2 also includes other components such as a battery holder and an airflow sensor.
雾化器1与主机2可以是一体设置,也可以是可拆卸连接,可以根据具体需要进行设计。The atomizer 1 and the host 2 can be integrally arranged or detachably connected, and can be designed according to specific needs.
请参阅图2,图2是本申请一实施例提供的雾化器的结构示意图。Please refer to FIG. 2 , which is a schematic diagram of the structure of an atomizer provided in an embodiment of the present application.
雾化器1包括壳体10、发热组件11、雾化座12。雾化座12具有安装腔(图未标),发热组件11设于该安装腔内;发热组件11同雾化座12一起设于壳体10内。壳体10形成有出雾通道13,壳体10的内表面、出雾通道13的外表面与雾化座12的顶面配合形成储液腔14,储液腔14用于存储液态气溶胶生成基质。其中,发热组件11与主机2电连接,以雾化气溶胶生成基质生成气溶胶。The atomizer 1 includes a housing 10, a heating component 11, and an atomizer seat 12. The atomizer seat 12 has an installation cavity (not shown), and the heating component 11 is arranged in the installation cavity; the heating component 11 and the atomizer seat 12 are arranged in the housing 10 together. The housing 10 is formed with a mist outlet channel 13, and the inner surface of the housing 10, the outer surface of the mist outlet channel 13 and the top surface of the atomizer seat 12 cooperate to form a liquid storage cavity 14, which is used to store liquid aerosol generating matrix. Among them, the heating component 11 is electrically connected to the host 2 to generate aerosol by atomizing the aerosol generating matrix.
雾化座12包括上座121和下座122,上座121与下座122配合形成安装腔;发热组件11背离储液腔14的表面与安装腔的腔壁配合形成雾化腔120。上座121上设有下液通道1211;储液腔14内的气溶胶生成基质通道下液通道1211流入发热组件11,即,发热组件11与储液腔14流体连通。下座122上设有进气通道15,外界气体经进气通道15进入雾化腔120,携带发热组件11雾化好的气溶胶流至出雾通道13,用户通过出雾通道13的端口吸食气溶胶。The atomizing seat 12 includes an upper seat 121 and a lower seat 122, and the upper seat 121 and the lower seat 122 cooperate to form an installation cavity; the surface of the heating component 11 away from the liquid storage cavity 14 cooperates with the cavity wall of the installation cavity to form an atomizing cavity 120. A lower liquid channel 1211 is provided on the upper seat 121; the aerosol generating matrix channel in the liquid storage cavity 14 flows into the heating component 11 through the lower liquid channel 1211, that is, the heating component 11 is in fluid communication with the liquid storage cavity 14. An air inlet channel 15 is provided on the lower seat 122, and external gas enters the atomizing cavity 120 through the air inlet channel 15, carrying the aerosol atomized by the heating component 11 to flow to the mist outlet channel 13, and the user inhales the aerosol through the port of the mist outlet channel 13.
请参阅图3-图13,图3是本申请实施例提供的发热组件的结构示意图,图4是图3所示的发热组件沿A-A线的截面示意图,图5a是图3所示的发热组件的基体一实施方式的局部结构示意图,图5b是图5a所示的基体沿B-B线的截面示意图,图6a是图3所示的发热组件的基体另一实施方式的局部结构示意图,图6b是图6a所示的基体沿C-C线的截面示意图,图7a是图3所示的发热组件的基体又一实施方式的局部结构示意图,图7b是图7a所示的基体沿D-D线的截面示意图,图8a是图3所示的发热组件的基体又一实施方式的局部结构示意图,图8b是图8a所示的基体沿E-E线的截面示意图,图9是图3所示的发热组件的基体又一实施方式的俯视结构示意图,图10是图3所示的发热组件的基体又一实施方式的俯视结构示意图,Please refer to Figures 3 to 13. Figure 3 is a schematic diagram of the structure of a heating component provided in an embodiment of the present application. Figure 4 is a schematic diagram of a cross-section of the heating component shown in Figure 3 along the A-A line. Figure 5a is a schematic diagram of a partial structure of an embodiment of a substrate of the heating component shown in Figure 3. Figure 5b is a schematic diagram of a cross-section of the substrate shown in Figure 5a along the B-B line. Figure 6a is a schematic diagram of a partial structure of another embodiment of the substrate of the heating component shown in Figure 3. Figure 6b is a schematic diagram of a cross-section of the substrate shown in Figure 6a along the C-C line. Figure 7a is a schematic diagram of a partial structure of another embodiment of the substrate of the heating component shown in Figure 3. Figure 7b is a schematic diagram of a cross-section of the substrate shown in Figure 7a along the D-D line. Figure 8a is a schematic diagram of a partial structure of another embodiment of the substrate of the heating component shown in Figure 3. Figure 8b is a schematic diagram of a cross-section of the substrate shown in Figure 8a along the E-E line. Figure 9 is a schematic diagram of a top view of the structure of another embodiment of the substrate of the heating component shown in Figure 3. Figure 10 is a schematic diagram of a top view of the structure of another embodiment of the substrate of the heating component shown in Figure 3.
图11是图3所示的发热组件的基体又一实施方式的俯视结构示意图,图12是图3所示的发热组件的基体又一实施方式的俯视结构示意图,图13是图3所示的发热组件的基体又一实施方式的俯视结构示意图。 Figure 11 is a top view structural schematic diagram of another embodiment of the base of the heating component shown in Figure 3, Figure 12 is a top view structural schematic diagram of another embodiment of the base of the heating component shown in Figure 3, and Figure 13 is a top view structural schematic diagram of another embodiment of the base of the heating component shown in Figure 3.
发热组件11包括基体111。基体111包括相对设置的吸液面1111和雾化面1112。基体111上设有至少一个贯穿吸液面1111和雾化面1112的导液通道1113。导液通道1113包括至少两个导液孔1113a,导液孔1113a贯穿吸液面1111和雾化面1112,导液孔1113a具有毛细作用力,导液孔1113a用于将气溶胶生成基质从吸液面1111导引至雾化面1112;也就是说,导液通道1113用于将气溶胶生成基质从吸液面1111导引至雾化面1112。其中,导液孔1113a沿直线延伸。The heating component 11 includes a substrate 111. The substrate 111 includes a liquid absorption surface 1111 and an atomization surface 1112 that are arranged opposite to each other. The substrate 111 is provided with at least one liquid guide channel 1113 that penetrates the liquid absorption surface 1111 and the atomization surface 1112. The liquid guide channel 1113 includes at least two liquid guide holes 1113a, and the liquid guide holes 1113a penetrate the liquid absorption surface 1111 and the atomization surface 1112. The liquid guide holes 1113a have capillary force, and the liquid guide holes 1113a are used to guide the aerosol generation matrix from the liquid absorption surface 1111 to the atomization surface 1112; that is, the liquid guide channel 1113 is used to guide the aerosol generation matrix from the liquid absorption surface 1111 to the atomization surface 1112. Among them, the liquid guide hole 1113a extends along a straight line.
在本实施例中,导液通道1113中的相邻两个导液孔1113a位于雾化面1112上的端口相互交叠,导液通道1113中的相邻两个导液孔1113a位于吸液面1111上的端口相互间隔设置。由于导液通道1113中的相邻两个导液孔1113a位于雾化面1112上的端口相互交叠,导液通道1113中的相邻两个导液孔1113a相互连通。两个导液孔1113a位于雾化面1112的端口相互交叠,指的是两个导液孔1113a位于雾化面1112的端口部分重叠,从而使得两个导液孔1113a靠近雾化面1112的孔段部分连通。例如,参见图5b,两个导液孔1113a位于虚线L以上的部分相互连通,两个导液孔1113a位于虚线L以下的部分相互独立。In this embodiment, the ports of two adjacent liquid guide holes 1113a in the liquid guide channel 1113 on the atomizing surface 1112 overlap each other, and the ports of two adjacent liquid guide holes 1113a in the liquid guide channel 1113 on the liquid suction surface 1111 are arranged at intervals. Since the ports of two adjacent liquid guide holes 1113a in the liquid guide channel 1113 on the atomizing surface 1112 overlap each other, the two adjacent liquid guide holes 1113a in the liquid guide channel 1113 are connected to each other. The ports of the two liquid guide holes 1113a on the atomizing surface 1112 overlap each other, which means that the ports of the two liquid guide holes 1113a on the atomizing surface 1112 overlap partially, so that the hole sections of the two liquid guide holes 1113a close to the atomizing surface 1112 are partially connected. For example, referring to Figure 5b, the parts of the two liquid guide holes 1113a above the dotted line L are connected to each other, and the parts of the two liquid guide holes 1113a below the dotted line L are independent of each other.
通过使导液通道1113中的相邻两个导液孔1113a位于雾化面1112上的端口相互交叠,且基体111上设有至少一个导液通道1113,增大了雾化面1112上的体积孔隙率,提升供液效果,保证供液充足,利于雾化量的提升;另外,还不影响雾化面1112上的发热层112(后续内容中介绍)内的电流通过。导液孔1113a呈直线延伸,导液通道1113中的相邻的两个导液孔1113a位于雾化面1112上的端口相互交叠且位于吸液面1111上的端口相互间隔设置,由此可知导液孔1113a位于吸液面1111上的端口的当量直径小于导液孔1113a位于雾化面1112上的端口的当量直径,增大了返气气泡的阻力,利于减少返气;导液孔1113a位于吸液面1111上的端口的当量直径设置为小于导液孔1113a位于雾化面1112上的端口的当量直径,沿着雾化面1112指向吸液面1111的方向,导液孔1113a的毛细压力增加,可以避免供液量过大造成的雾化面1112出现炸液等现象。By making the ports of two adjacent liquid guide holes 1113a in the liquid guide channel 1113 on the atomizing surface 1112 overlap with each other, and providing at least one liquid guide channel 1113 on the substrate 111, the volume porosity on the atomizing surface 1112 is increased, the liquid supply effect is improved, and sufficient liquid supply is ensured, which is beneficial to the increase of the atomization amount; in addition, it does not affect the passage of current in the heating layer 112 (introduced in subsequent content) on the atomizing surface 1112. The liquid guiding hole 1113a extends in a straight line, and the ports of two adjacent liquid guiding holes 1113a in the liquid guiding channel 1113 located on the atomizing surface 1112 overlap with each other, and the ports located on the liquid suction surface 1111 are arranged at intervals from each other. It can be seen that the equivalent diameter of the port of the liquid guiding hole 1113a located on the liquid suction surface 1111 is smaller than the equivalent diameter of the port of the liquid guiding hole 1113a located on the atomizing surface 1112, which increases the resistance of the return gas bubble and helps to reduce the return gas; the equivalent diameter of the port of the liquid guiding hole 1113a located on the liquid suction surface 1111 is set to be smaller than the equivalent diameter of the port of the liquid guiding hole 1113a located on the atomizing surface 1112, and the capillary pressure of the liquid guiding hole 1113a increases along the direction of the atomizing surface 1112 pointing to the liquid suction surface 1111, which can avoid the phenomenon of liquid explosion on the atomizing surface 1112 caused by excessive liquid supply.
导液孔1113a位于雾化面1112的端口的当量直径大于等于30μm且小于等于70μm;和/或导液孔1113a位于吸液面1111的端口的当量直径大于等于10μm且小于等于50μm。需要说明的是,导液孔1113a位于雾化面1112的端口的当量直径影响着气溶胶粒径分布范围,当量直径越小,粒径尺寸越小;将导液孔1113a位于雾化面1112的端口的当量直径设置为大于等于30μm且小于等于70μm,使得气溶胶粒径分布在较优的范围内,保持较好的口感。导液孔1113a位于吸液面1111的端口的当量直径影响着气溶胶生成基质的流动阻力, 当量直径越小,越有利减少返气,避免在吸液面1111产生气泡;导液孔1113a位于吸液面1111的端口的当量直径设置为大于等于10μm且小于等于50μm,减少返气,供液顺畅,供液充足。The equivalent diameter of the port of the liquid-conducting hole 1113a located on the atomizing surface 1112 is greater than or equal to 30 μm and less than or equal to 70 μm; and/or the equivalent diameter of the port of the liquid-conducting hole 1113a located on the liquid-absorbing surface 1111 is greater than or equal to 10 μm and less than or equal to 50 μm. It should be noted that the equivalent diameter of the port of the liquid-conducting hole 1113a located on the atomizing surface 1112 affects the aerosol particle size distribution range, and the smaller the equivalent diameter, the smaller the particle size; the equivalent diameter of the port of the liquid-conducting hole 1113a located on the atomizing surface 1112 is set to be greater than or equal to 30 μm and less than or equal to 70 μm, so that the aerosol particle size distribution is within a more optimal range and maintains a better taste. The equivalent diameter of the port of the liquid-conducting hole 1113a located on the liquid-absorbing surface 1111 affects the flow resistance of the aerosol generating matrix, The smaller the equivalent diameter, the more favorable it is to reduce the return air and avoid the generation of bubbles on the liquid suction surface 1111; the equivalent diameter of the port of the liquid guide hole 1113a located on the liquid suction surface 1111 is set to be greater than or equal to 10μm and less than or equal to 50μm, which reduces the return air and ensures smooth and sufficient liquid supply.
示例性的,采用激光腐蚀工艺形成锥形(导液孔1113a的横截面形状为圆形,导液孔1113a的纵截面形状为等腰梯形)的导液孔1113a,导液孔1113a位于雾化面1112上的端口的孔径大于导液孔1113a位于吸液面1111上的端口的孔径,且导液孔1113a位于雾化面1112上的端口的孔径与导液孔1113a位于吸液面1111上的端口的孔径的差值可以控制在20μm以内。导液孔1113a位于雾化面1112上的端口的孔径小于30μm,导液孔1113a位于吸液面1111上的端口的孔径小于10μm,容易供液不足;导液孔1113a位于雾化面1112上的端口的孔径大于70μm,导液孔1113a位于吸液面1111上的端口的孔径大于50μm,容易造成漏液。Exemplarily, a laser etching process is used to form a tapered liquid conducting hole 1113a (the cross-sectional shape of the liquid conducting hole 1113a is circular, and the longitudinal cross-sectional shape of the liquid conducting hole 1113a is an isosceles trapezoid), the aperture of the port of the liquid conducting hole 1113a located on the atomizing surface 1112 is larger than the aperture of the port of the liquid conducting hole 1113a located on the liquid absorbing surface 1111, and the difference between the aperture of the port of the liquid conducting hole 1113a located on the atomizing surface 1112 and the aperture of the port of the liquid conducting hole 1113a located on the liquid absorbing surface 1111 can be controlled within 20μm. The aperture of the port of the liquid guiding hole 1113a located on the atomizing surface 1112 is less than 30 μm, and the aperture of the port of the liquid guiding hole 1113a located on the liquid absorbing surface 1111 is less than 10 μm, which is prone to insufficient liquid supply; the aperture of the port of the liquid guiding hole 1113a located on the atomizing surface 1112 is greater than 70 μm, and the aperture of the port of the liquid guiding hole 1113a located on the liquid absorbing surface 1111 is greater than 50 μm, which is prone to leakage.
继续参阅图3和图4,发热组件11还包括发热层112、引脚导电层113和保护层114。发热层112用于通电加热雾化气溶胶生成基质。发热层112设于基体111的雾化面1112。发热层112相对的两端分别设有一个引脚导电层113,引脚导电层113与发热层112连接;引脚导电层113用于与主机2电连接,发热层112通过引脚导电层113与主机2电连接。通过设置引脚导电层113,减小了发热层112实现电连接的接触电阻;例如,发热组件11通过弹针与主机2电连接,弹针与引脚导电层113接触,引脚导电层113具有较大的接触面积,减小了发热层112与弹针的接触电阻。保护层114设于发热层112远离基体111的表面,保护层114用于预防或减小发热层112加热后腐蚀和氧化的风险,延长发热层112的使用寿命。Continuing to refer to Figures 3 and 4, the heating component 11 also includes a heating layer 112, a pin conductive layer 113 and a protective layer 114. The heating layer 112 is used to electrically heat the atomized aerosol to generate the matrix. The heating layer 112 is arranged on the atomizing surface 1112 of the substrate 111. A pin conductive layer 113 is respectively provided at the opposite ends of the heating layer 112, and the pin conductive layer 113 is connected to the heating layer 112; the pin conductive layer 113 is used to be electrically connected to the host 2, and the heating layer 112 is electrically connected to the host 2 through the pin conductive layer 113. By providing the pin conductive layer 113, the contact resistance of the heating layer 112 to achieve electrical connection is reduced; for example, the heating component 11 is electrically connected to the host 2 through the elastic pin, and the elastic pin is in contact with the pin conductive layer 113. The pin conductive layer 113 has a large contact area, which reduces the contact resistance between the heating layer 112 and the elastic pin. The protective layer 114 is disposed on the surface of the heating layer 112 away from the substrate 111 . The protective layer 114 is used to prevent or reduce the risk of corrosion and oxidation of the heating layer 112 after heating, thereby extending the service life of the heating layer 112 .
在一实施方式中,发热层112采用物理气相沉积工艺(例如,磁控溅射工艺)或化学气相沉积工艺形成或采用丝网印刷工艺形成;采用物理气相沉积工艺或化学气相沉积工艺形成的发热层112的厚度要小于采用丝网印刷工艺形成的发热层112的厚度。In one embodiment, the heating layer 112 is formed by a physical vapor deposition process (for example, a magnetron sputtering process) or a chemical vapor deposition process or by a screen printing process; the thickness of the heating layer 112 formed by the physical vapor deposition process or the chemical vapor deposition process is smaller than the thickness of the heating layer 112 formed by the screen printing process.
在一实施方式中,发热层112呈长条状且沿直线延伸。两个引脚导电层113分别设于发热层112相对的两端,发热层112的电流流动方向为一个引脚导电层113指向另一个引脚导电层113的方向。引脚导电层113覆盖部分发热层112。发热层112未被引脚导电层113覆盖的其余部分被保护层114覆盖。In one embodiment, the heating layer 112 is in the shape of a long strip and extends in a straight line. Two pin conductive layers 113 are respectively disposed at opposite ends of the heating layer 112, and the current flow direction of the heating layer 112 is the direction from one pin conductive layer 113 to the other pin conductive layer 113. The pin conductive layer 113 covers a portion of the heating layer 112. The remaining portion of the heating layer 112 not covered by the pin conductive layer 113 is covered by the protective layer 114.
在一实施方式中,基体111包括微孔区1114和邻近微孔区1114的留白区1115。微孔区1114设有多个导液孔1113a,多个导液孔1113a可以是导液通道1113,也可以是独立的导液孔1113a;具体地,可采用激光、腐蚀等工艺形成微孔区1114的多个导液孔1113a。留白区1115未设导液孔1113a。本申请中的留白区1115是可以形成导液孔 1113a而没有形成导液孔1113a的区域,而非微孔区1114周边的无法形成导液孔1113a的区域。留白区1115并未设置导液孔1113a,减少了基体111上导液孔1113a的数量,以此提高基体111的强度,降低在基体111上设置导液孔1113a的生产成本。发热层112至少部分设于微孔区1114;发热层112用于雾化雾化面1112上的气溶胶生成基质。引脚导电层113至少部分设于留白区1115,以保证引脚导电层113的连续性和稳定性。In one embodiment, the substrate 111 includes a microporous area 1114 and a blank area 1115 adjacent to the microporous area 1114. The microporous area 1114 is provided with a plurality of liquid conducting holes 1113a, and the plurality of liquid conducting holes 1113a may be liquid conducting channels 1113 or independent liquid conducting holes 1113a; specifically, the plurality of liquid conducting holes 1113a of the microporous area 1114 may be formed by laser, etching or other processes. The blank area 1115 is not provided with liquid conducting holes 1113a. The blank area 1115 in the present application is a liquid conducting hole that can be formed. 1113a is an area where no liquid conducting hole 1113a is formed, and the area around the non-microporous area 1114 where the liquid conducting hole 1113a cannot be formed. The blank area 1115 is not provided with liquid conducting holes 1113a, which reduces the number of liquid conducting holes 1113a on the substrate 111, thereby improving the strength of the substrate 111 and reducing the production cost of providing liquid conducting holes 1113a on the substrate 111. The heating layer 112 is at least partially provided in the microporous area 1114; the heating layer 112 is used to atomize the aerosol generating matrix on the atomizing surface 1112. The pin conductive layer 113 is at least partially provided in the blank area 1115 to ensure the continuity and stability of the pin conductive layer 113.
示例性的,留白区1115环绕微孔区1114一周设置。发热层112的一部分设于微孔区1114,另一部分延伸至留白区1115。引脚导电层113的一部分设于留白区1115,另一部分延伸至微孔区1114。发热层112和引脚导电层113在留白区1115和微孔区1114均有层叠的部分。Exemplarily, the blank area 1115 is arranged around the microporous area 1114. A portion of the heating layer 112 is arranged in the microporous area 1114, and another portion extends to the blank area 1115. A portion of the pin conductive layer 113 is arranged in the blank area 1115, and another portion extends to the microporous area 1114. The heating layer 112 and the pin conductive layer 113 have overlapping portions in the blank area 1115 and the microporous area 1114.
需要说明的是,导液通道1113设于微孔区1114。在一实施方式中,微孔区1114中的部分区域设有导液通道1113,微孔区1114中未设导液通道1113的其余区域设有多个相互独立的导液孔1113a(如图3所示);其中,微孔区1114中设置的导液通道1113的数量为多个时,多个导液通道1113可以呈规则排布(例如,阵列排布),也可以呈无规则排布。在一实施方式中,微孔区1114中的所有区域均用于设置导液通道1113,即,微孔区1114设有多个导液通道1113,未设相互独立的导液孔1113a;其中,多个导液通道1113可以呈规则排布(例如,阵列排布),也可以呈无规则排布,具体根据需要进行设计。下面对基体111上设有多个导液通道1113进行详细介绍。It should be noted that the liquid-conducting channel 1113 is provided in the microporous area 1114. In one embodiment, a part of the area in the microporous area 1114 is provided with a liquid-conducting channel 1113, and the remaining area in the microporous area 1114 where the liquid-conducting channel 1113 is not provided is provided with a plurality of mutually independent liquid-conducting holes 1113a (as shown in FIG. 3); wherein, when the number of liquid-conducting channels 1113 provided in the microporous area 1114 is multiple, the plurality of liquid-conducting channels 1113 can be arranged regularly (for example, in an array) or in an irregular arrangement. In one embodiment, all areas in the microporous area 1114 are used to set the liquid-conducting channel 1113, that is, the microporous area 1114 is provided with a plurality of liquid-conducting channels 1113, and no mutually independent liquid-conducting holes 1113a are provided; wherein, the plurality of liquid-conducting channels 1113 can be arranged regularly (for example, in an array) or in an irregular arrangement, and the specific design is based on the needs. The following is a detailed introduction to the plurality of liquid-conducting channels 1113 provided on the substrate 111.
在一实施方式中,基体111上设有多个导液通道1113,多个导液通道1113排列成多行多列(如图5a-图13所示)。即,本申请具体实施例中,不包括孤立的导液孔1113a。In one embodiment, a plurality of liquid conducting channels 1113 are provided on the substrate 111, and the plurality of liquid conducting channels 1113 are arranged in multiple rows and columns (as shown in FIG. 5a to FIG. 13). That is, in the specific embodiment of the present application, isolated liquid conducting holes 1113a are not included.
可选的,任意相邻两行导液通道1113之间的间距相同,任意相邻两列导液通道1113之间的间距相同,便于加工,利于降低加工难度。可以理解,任意相邻两行导液通道1113之间的间距可以不同,任意相邻两列导液通道1113之间的间距相同可以不同,具体根据需要进行设计。Optionally, the spacing between any two adjacent rows of liquid-conducting channels 1113 is the same, and the spacing between any two adjacent columns of liquid-conducting channels 1113 is the same, which is convenient for processing and helps to reduce the difficulty of processing. It can be understood that the spacing between any two adjacent rows of liquid-conducting channels 1113 can be different, and the spacing between any two adjacent columns of liquid-conducting channels 1113 can be the same or different, which is specifically designed according to needs.
可选的,每个导液通道1113中的导液孔1113a的数量相同,便于加工,利于降低加工难度。可以理解,每个导液通道1113中的导液孔1113a的数量也可以不同,具体根据需要进行设计。Optionally, the number of the liquid conducting holes 1113a in each liquid conducting channel 1113 is the same, which is convenient for processing and helps to reduce the processing difficulty. It is understandable that the number of the liquid conducting holes 1113a in each liquid conducting channel 1113 can also be different, and it is specifically designed according to needs.
可选的,同一行的每个导液通道1113中的所有导液孔1113a呈一维阵列排布,便于加工,利于降低加工难度。每个导液通道1113的多个导液孔1113a沿着发热层112的电流流动方向呈一维阵列排布,该设置方式不影响雾化面1112上的发热层112内的电流通过。可以 理解,每个导液通道1113中的多个导液孔1113a的排布方式并不限于一维阵列排布,具体根据需要进行设计。Optionally, all the liquid guide holes 1113a in each liquid guide channel 1113 in the same row are arranged in a one-dimensional array, which is convenient for processing and helps to reduce the difficulty of processing. The multiple liquid guide holes 1113a of each liquid guide channel 1113 are arranged in a one-dimensional array along the current flow direction of the heating layer 112. This arrangement does not affect the current flow in the heating layer 112 on the atomization surface 1112. It is understood that the arrangement of the multiple liquid conducting holes 1113a in each liquid conducting channel 1113 is not limited to a one-dimensional array arrangement, and can be designed specifically according to needs.
在一实施方式中,导液孔1113a各处的横截面形状相同;沿着雾化面1112指向吸液面1111的方向,导液孔1113a的横截面面积逐渐减小。可选的,导液孔1113a的横截面形状为圆形,导液孔1113a的纵截面形状为等腰梯形(如图3-图7b所示)。可选的,导液孔1113a的横截面形状为圆形,导液孔1113a的纵截面形状为直角梯形(如图8a和8b所示)其中,横截面指的是沿着平行于雾化面1112的方向的截面,纵截面指的是沿着平行于基体111的厚度方向的截面。In one embodiment, the cross-sectional shape of each part of the liquid-guiding hole 1113a is the same; along the direction from the atomizing surface 1112 to the liquid-absorbing surface 1111, the cross-sectional area of the liquid-guiding hole 1113a gradually decreases. Optionally, the cross-sectional shape of the liquid-guiding hole 1113a is circular, and the longitudinal cross-sectional shape of the liquid-guiding hole 1113a is an isosceles trapezoid (as shown in Figures 3-7b). Optionally, the cross-sectional shape of the liquid-guiding hole 1113a is circular, and the longitudinal cross-sectional shape of the liquid-guiding hole 1113a is a right-angled trapezoid (as shown in Figures 8a and 8b), wherein the cross-sectional shape refers to the cross-sectional shape along the direction parallel to the atomizing surface 1112, and the longitudinal cross-sectional shape refers to the cross-sectional shape along the thickness direction parallel to the substrate 111.
示例性的,如图5a和图5b所示,以及如图8a和图8b所示,基体111上设有多个导液通道1113,多个导液通道1113排列成多行多列,行方向与发热层112的电流流动方向相同,相邻两行导液通道1113之间的间距相同,相邻两列导液通道1113之间的间距相同,每个导液通道1113包括两个导液孔1113a,两个导液孔1113a沿着发热层112的电流流动方向一维排列。每个导液通道1113的两个导液孔1113a在雾化面1112上的端口相互交叠,在吸液面1111上的端口相互间隔设置。沿着雾化面1112指向吸液面1111的方向,导液孔1113a的截面形状为等腰梯形(如图5a和图5b所示),或导液孔1113a的截面形状为直角梯形(如图8a和图8b所示)。Exemplarily, as shown in Fig. 5a and Fig. 5b, and as shown in Fig. 8a and Fig. 8b, a plurality of liquid conducting channels 1113 are provided on the substrate 111, and the plurality of liquid conducting channels 1113 are arranged in a plurality of rows and columns, the row direction is the same as the current flow direction of the heating layer 112, the spacing between two adjacent rows of liquid conducting channels 1113 is the same, the spacing between two adjacent columns of liquid conducting channels 1113 is the same, and each liquid conducting channel 1113 includes two liquid conducting holes 1113a, and the two liquid conducting holes 1113a are arranged in one dimension along the current flow direction of the heating layer 112. The ports of the two liquid conducting holes 1113a of each liquid conducting channel 1113 on the atomizing surface 1112 overlap with each other, and the ports on the liquid absorbing surface 1111 are arranged at intervals from each other. Along the direction from the atomizing surface 1112 to the liquid absorbing surface 1111, the cross-sectional shape of the liquid guiding hole 1113a is an isosceles trapezoid (as shown in FIGS. 5a and 5b), or the cross-sectional shape of the liquid guiding hole 1113a is a right-angled trapezoid (as shown in FIGS. 8a and 8b).
示例性的,如图6a和图6b所示,基体111上设有多个导液通道1113,多个导液通道1113排列成多行多列,行方向与发热层112的电流流动方向相同,相邻两行导液通道1113之间的间距相同,相邻两列导液通道1113之间的间距相同,每个导液通道1113包括五个导液孔1113a,五个导液孔1113a沿着发热层112的电流流动方向一维排列。每个导液通道1113的五个导液孔1113a中相邻的两个导液孔1113a在雾化面1112上的端口相互交叠,在吸液面1111上的端口相互间隔设置。沿着雾化面1112指向吸液面1111的方向,导液孔1113a的截面形状为等腰梯形。Exemplarily, as shown in FIG. 6a and FIG. 6b, a plurality of liquid conducting channels 1113 are provided on the substrate 111, and the plurality of liquid conducting channels 1113 are arranged in a plurality of rows and columns, and the row direction is the same as the current flow direction of the heating layer 112, and the spacing between two adjacent rows of liquid conducting channels 1113 is the same, and the spacing between two adjacent columns of liquid conducting channels 1113 is the same, and each liquid conducting channel 1113 includes five liquid conducting holes 1113a, and the five liquid conducting holes 1113a are arranged in one dimension along the current flow direction of the heating layer 112. The ports of two adjacent liquid conducting holes 1113a on the atomizing surface 1112 overlap with each other, and the ports on the liquid absorbing surface 1111 are arranged at intervals from each other. Along the direction from the atomizing surface 1112 to the liquid absorbing surface 1111, the cross-sectional shape of the liquid conducting hole 1113a is an isosceles trapezoid.
示例性的,如图7a和图7b所示,基体111上设有多个导液通道1113,多个导液通道1113排列成多行多列,行方向与发热层112的电流流动方向相同,相邻两行导液通道1113之间的间距相同,相邻两列导液通道1113之间的间距相同,每个导液通道1113包括十二个导液孔1113a,十二个导液孔1113a沿着发热层112的电流流动方向一维排列。每个导液通道1113的十二个导液孔1113a中相邻的两个导液孔1113a在雾化面1112上的端口相互交叠,在吸液面1111上的端口相互间隔设置。沿着雾化面1112指向吸液面1111的方向,导液孔1113a的截面形状为等腰梯形。 Exemplarily, as shown in FIG. 7a and FIG. 7b, a plurality of liquid conducting channels 1113 are provided on the substrate 111, and the plurality of liquid conducting channels 1113 are arranged in a plurality of rows and columns, and the row direction is the same as the current flow direction of the heating layer 112, and the spacing between two adjacent rows of liquid conducting channels 1113 is the same, and the spacing between two adjacent columns of liquid conducting channels 1113 is the same, and each liquid conducting channel 1113 includes twelve liquid conducting holes 1113a, and the twelve liquid conducting holes 1113a are arranged in one dimension along the current flow direction of the heating layer 112. The ports of two adjacent liquid conducting holes 1113a in the twelve liquid conducting holes 1113a of each liquid conducting channel 1113 overlap with each other on the atomizing surface 1112, and the ports on the liquid absorbing surface 1111 are arranged at intervals from each other. Along the direction from the atomizing surface 1112 to the liquid absorbing surface 1111, the cross-sectional shape of the liquid conducting hole 1113a is an isosceles trapezoid.
示例性的,如图9所示,基体111上设有多个导液通道1113,多个导液通道1113排列成多行多列,行方向与发热层112的电流流动方向相同,相邻两行导液通道1113之间的间距相同,相邻两列导液通道1113之间的间距相同,每个导液通道1113包括两个导液孔1113a,两个导液孔1113a的排列方向与发热层112的电流流动方向之间形成锐角,每个导液通道1113的两个导液孔1113a的排列方向与发热层112的电流流动方向之间形成夹角相同,每个导液通道1113的两个导液孔1113a在雾化面1112上的端口相互交叠,在吸液面1111上的端口相互间隔设置。Exemplarily, as shown in Figure 9, a plurality of liquid conducting channels 1113 are provided on the base body 111, and the plurality of liquid conducting channels 1113 are arranged into a plurality of rows and columns, the row direction is the same as the current flow direction of the heating layer 112, the spacing between two adjacent rows of liquid conducting channels 1113 is the same, the spacing between two adjacent columns of liquid conducting channels 1113 is the same, each liquid conducting channel 1113 includes two liquid conducting holes 1113a, and an acute angle is formed between the arrangement direction of the two liquid conducting holes 1113a and the current flow direction of the heating layer 112, the angle formed between the arrangement direction of the two liquid conducting holes 1113a of each liquid conducting channel 1113 and the current flow direction of the heating layer 112 is the same, and the ports of the two liquid conducting holes 1113a of each liquid conducting channel 1113 on the atomizing surface 1112 overlap with each other, and the ports on the liquid absorption surface 1111 are spaced apart from each other.
示例性的,如图10所示,基体111上设有多个导液通道1113,多个导液通道1113排列成多行多列,行方向与发热层112的电流流动方向相同,相邻两行导液通道1113之间的间距相同,相邻两列导液通道1113之间的间距相同,每个导液通道1113包括两个导液孔1113a,两个导液孔1113a的排列方向与发热层112的电流流动方向之间形成锐角,奇数列的导液通道1113与偶数列的导液通道1113轴对称设置。每个导液通道1113的两个导液孔1113a在雾化面1112上的端口相互交叠,在吸液面1111上的端口相互间隔设置。Exemplarily, as shown in FIG10 , a plurality of liquid-conducting channels 1113 are provided on the substrate 111, and the plurality of liquid-conducting channels 1113 are arranged in a plurality of rows and columns, the row direction is the same as the current flow direction of the heating layer 112, the spacing between two adjacent rows of liquid-conducting channels 1113 is the same, the spacing between two adjacent columns of liquid-conducting channels 1113 is the same, each liquid-conducting channel 1113 includes two liquid-conducting holes 1113a, and an acute angle is formed between the arrangement direction of the two liquid-conducting holes 1113a and the current flow direction of the heating layer 112, and the liquid-conducting channels 1113 in odd-numbered columns are arranged axially symmetrically with the liquid-conducting channels 1113 in even-numbered columns. The ports of the two liquid-conducting holes 1113a of each liquid-conducting channel 1113 on the atomizing surface 1112 overlap each other, and the ports on the liquid-absorbing surface 1111 are arranged at intervals from each other.
示例性的,如图11所示,基体111上设有多个导液通道1113,多个导液通道1113排列成多行多列,行方向与发热层112的电流流动方向相同,相邻两行导液通道1113之间的间距相同,相邻两列导液通道1113之间的间距相同,每个导液通道1113包括两个导液孔1113a,奇数列的导液通道1113中的两个导液孔1113a的排列方向与发热层112的电流流动方向平行,偶数列的导液通道1113中的两个导液孔1113a的排列方向与发热层112的电流流动方向垂直。每个导液通道1113的两个导液孔1113a在雾化面1112上的端口相互交叠,在吸液面1111上的端口相互间隔设置。Exemplarily, as shown in FIG. 11 , a plurality of liquid-conducting channels 1113 are provided on the substrate 111, and the plurality of liquid-conducting channels 1113 are arranged in a plurality of rows and columns, the row direction is the same as the current flow direction of the heating layer 112, the spacing between two adjacent rows of liquid-conducting channels 1113 is the same, the spacing between two adjacent columns of liquid-conducting channels 1113 is the same, and each liquid-conducting channel 1113 includes two liquid-conducting holes 1113a, the arrangement direction of the two liquid-conducting holes 1113a in the liquid-conducting channels 1113 in the odd-numbered columns is parallel to the current flow direction of the heating layer 112, and the arrangement direction of the two liquid-conducting holes 1113a in the liquid-conducting channels 1113 in the even-numbered columns is perpendicular to the current flow direction of the heating layer 112. The ports of the two liquid-conducting holes 1113a of each liquid-conducting channel 1113 on the atomizing surface 1112 overlap with each other, and the ports on the liquid-absorbing surface 1111 are arranged at intervals from each other.
示例性的,如图12所示,基体111上设有多个导液通道1113,多个导液通道1113排列成多行多列,行方向与发热层112的电流流动方向相同,相邻两行导液通道1113之间的间距相同,相邻两列导液通道1113之间的间距相同,每个导液通道1113包括三个导液孔1113a,三个导液孔1113a中任意相邻的两个导液孔1113a在雾化面1112上的端口相互交叠,在吸液面1111上的端口相互间隔设置。三个导液孔1113a的中心的连线形成等边三角形。Exemplarily, as shown in FIG. 12 , a plurality of liquid-conducting channels 1113 are provided on the substrate 111, and the plurality of liquid-conducting channels 1113 are arranged in a plurality of rows and columns, the row direction is the same as the current flow direction of the heating layer 112, the spacing between two adjacent rows of liquid-conducting channels 1113 is the same, the spacing between two adjacent columns of liquid-conducting channels 1113 is the same, and each liquid-conducting channel 1113 includes three liquid-conducting holes 1113a, and the ports of any two adjacent liquid-conducting holes 1113a among the three liquid-conducting holes 1113a overlap each other on the atomizing surface 1112, and the ports on the liquid-absorbing surface 1111 are arranged at intervals from each other. The lines connecting the centers of the three liquid-conducting holes 1113a form an equilateral triangle.
示例性的,如图13所示,基体111上设有多个导液通道1113,多个导液通道1113排列成多行多列,行方向与发热层112的电流流动方向相同,相邻两行导液通道1113之间的间距相同,相邻两列导液通道1113之间的间距相同,每个导液通道1113包括四个导液孔 1113a,四个导液孔1113a的中心的连线形成正方形,四个导液孔1113a呈二维阵列排布,位于对角线上两个导液孔1113a没有交叠。Exemplarily, as shown in FIG13 , a plurality of liquid conducting channels 1113 are provided on the substrate 111 , and the plurality of liquid conducting channels 1113 are arranged in a plurality of rows and columns, and the row direction is the same as the current flow direction of the heating layer 112 , and the spacing between two adjacent rows of liquid conducting channels 1113 is the same, and the spacing between two adjacent columns of liquid conducting channels 1113 is the same, and each liquid conducting channel 1113 includes four liquid conducting holes 1113a, the lines connecting the centers of the four liquid-conducting holes 1113a form a square, the four liquid-conducting holes 1113a are arranged in a two-dimensional array, and the two liquid-conducting holes 1113a on the diagonal line do not overlap.
需要说明的是,同一行的每个导液通道1113中的所有导液孔1113a呈一维阵列排布时(例如,图5a-图7b所示的实施方式),导液通道1113中相邻的导液孔1113a之间的孔中心距L1大于等于20μm且小于等于60μm;可以理解,每组导液孔1113a中的相邻的导液孔1113a之间孔中心距L1影响着基体111的孔隙率,从而影响供液能力,将孔中心距L1设置为大于等于20μm且小于等于60μm,使得基体111具有较好的供液能力,且能够保证基体111的强度。和/或相邻两行导液通道1113之间的孔中心距L2大于等于60μm且小于等于140μm;可以理解,相邻两行导液通道1113之间的孔中心距L2影响着发热层112上的电流流通面积,进而影响着发热层112的电阻,将孔中心距L2设置为大于等于60μm且小于等于140μm,用于保证相邻两行导液通道1113之间的部分发热层112的有效宽度,基体111具有较大的孔隙率的同时避免发热层112的电阻过大而造成局部温度过高,进而避免出现发热层112断裂或熔断等问题。It should be noted that when all the liquid conducting holes 1113a in each liquid conducting channel 1113 in the same row are arranged in a one-dimensional array (for example, the embodiments shown in Figures 5a to 7b), the hole center distance L1 between adjacent liquid conducting holes 1113a in the liquid conducting channel 1113 is greater than or equal to 20μm and less than or equal to 60μm; it can be understood that the hole center distance L1 between adjacent liquid conducting holes 1113a in each group of liquid conducting holes 1113a affects the porosity of the substrate 111, thereby affecting the liquid supply capacity. Setting the hole center distance L1 to be greater than or equal to 20μm and less than or equal to 60μm allows the substrate 111 to have a better liquid supply capacity and can ensure the strength of the substrate 111. And/or the hole center distance L2 between two adjacent rows of liquid conducting channels 1113 is greater than or equal to 60μm and less than or equal to 140μm; it can be understood that the hole center distance L2 between two adjacent rows of liquid conducting channels 1113 affects the current flow area on the heating layer 112, and thus affects the resistance of the heating layer 112. The hole center distance L2 is set to be greater than or equal to 60μm and less than or equal to 140μm, which is used to ensure the effective width of part of the heating layer 112 between two adjacent rows of liquid conducting channels 1113. While the substrate 111 has a large porosity, it avoids excessive resistance of the heating layer 112 and causes excessive local temperature, thereby avoiding problems such as breakage or melting of the heating layer 112.
导液孔1113a的孔径大于等于20μm且小于等于60μm,导液通道1113中相邻的导液孔1113a之间的孔中心距L1大于等于20μm且小于等于60μm,对导液孔1113a的孔径和导液通道1113中相邻的导液孔1113a之间的孔中心距L1做如上设计,便于控制导液通道1113中相邻的导液孔1113a在雾化面1112上的交叠面积。The aperture of the liquid guiding hole 1113a is greater than or equal to 20 μm and less than or equal to 60 μm, and the hole center distance L1 between adjacent liquid guiding holes 1113a in the liquid guiding channel 1113 is greater than or equal to 20 μm and less than or equal to 60 μm. The aperture of the liquid guiding hole 1113a and the hole center distance L1 between adjacent liquid guiding holes 1113a in the liquid guiding channel 1113 are designed as above to facilitate controlling the overlapping area of adjacent liquid guiding holes 1113a in the liquid guiding channel 1113 on the atomizing surface 1112.
示例性的,导液通道1113中相邻的导液孔1113a之间的孔中心距L1大于等于20μm且小于等于40μm。示例性的,导液通道1113中相邻的导液孔1113a之间的孔中心距L1为30μm。示例性的,导液通道1113中相邻的导液孔1113a之间的孔中心距L1为50μm。示例性的,相邻两行导液通道1113之间的孔中心距L2大于等于60μm且小于等于100μm。示例性的,相邻两行导液通道1113之间的孔中心距L2大于等于80μm且小于等于120μm。Exemplarily, the hole center distance L1 between adjacent liquid guide holes 1113a in the liquid guide channel 1113 is greater than or equal to 20μm and less than or equal to 40μm. Exemplarily, the hole center distance L1 between adjacent liquid guide holes 1113a in the liquid guide channel 1113 is 30μm. Exemplarily, the hole center distance L1 between adjacent liquid guide holes 1113a in the liquid guide channel 1113 is 50μm. Exemplarily, the hole center distance L2 between two adjacent rows of liquid guide channels 1113 is greater than or equal to 60μm and less than or equal to 100μm. Exemplarily, the hole center distance L2 between two adjacent rows of liquid guide channels 1113 is greater than or equal to 80μm and less than or equal to 120μm.
在一实施方式中,基体111为致密基体。可选的,基体111的材料为玻璃、致密陶瓷中的至少一种。可以理解,基体111的材料包括但不限于玻璃、致密陶瓷,具体根据需要进行设计。采用玻璃等致密材料制得的基体111,由于基体111的表面光滑,因此可以采用物理气相沉积或化学气相沉积的方式,在基体111的表面沉积连续稳定的金属膜形成发热层112,发热层112的厚度在几微米或纳米级厚度范围内,不仅可以使得发热组件11小型化,而且可以节省发热层112材料。In one embodiment, the substrate 111 is a dense substrate. Optionally, the material of the substrate 111 is at least one of glass and dense ceramics. It is understandable that the material of the substrate 111 includes but is not limited to glass and dense ceramics, and is specifically designed according to needs. The substrate 111 made of dense materials such as glass has a smooth surface, so a continuous and stable metal film can be deposited on the surface of the substrate 111 by physical vapor deposition or chemical vapor deposition to form a heating layer 112. The thickness of the heating layer 112 is within the range of a few microns or nanometers, which can not only miniaturize the heating component 11, but also save the material of the heating layer 112.
在一实施方式中,基体111为多孔基体。可选的,基体111的材料为多孔陶瓷;多孔陶瓷是对原料经过成型和特殊高温烧结工艺制备 的一种具有开孔孔径、高开口气孔率的一种多孔性陶瓷材料,多孔陶瓷在制备过程中形成多个无序孔。In one embodiment, the substrate 111 is a porous substrate. Optionally, the material of the substrate 111 is porous ceramics; porous ceramics are prepared by molding and special high-temperature sintering processes of raw materials. A porous ceramic material with an open pore size and a high open porosity. The porous ceramic forms a plurality of disordered pores during the preparation process.
在一实施方式中,基体111的厚度为0.5mm-2.5mm。基体111的厚度大于2.5mm时,无法满足供液需求,导致气溶胶量下降,且造成的热损失多,形成导液孔1113a时不易穿透,设置导液孔1113a的成本高;基体111的厚度小于0.5mm时,无法保证基体111的强度,不利于提高电子雾化装置的性能。可选的,基体111的厚度为0.5mm-1mm。可选的,基体111的厚度为1.5mm-2.5mm。In one embodiment, the thickness of the substrate 111 is 0.5mm-2.5mm. When the thickness of the substrate 111 is greater than 2.5mm, the liquid supply demand cannot be met, resulting in a decrease in the amount of aerosol, and a large amount of heat loss is caused. It is not easy to penetrate when forming the liquid guide hole 1113a, and the cost of setting the liquid guide hole 1113a is high; when the thickness of the substrate 111 is less than 0.5mm, the strength of the substrate 111 cannot be guaranteed, which is not conducive to improving the performance of the electronic atomization device. Optionally, the thickness of the substrate 111 is 0.5mm-1mm. Optionally, the thickness of the substrate 111 is 1.5mm-2.5mm.
在一实施方式中,吸液面1111与雾化面1112平行设置,便于加工以及便于装配。In one embodiment, the liquid absorption surface 1111 and the atomization surface 1112 are arranged in parallel to facilitate processing and assembly.
请参阅图14,图14是基体不同实施方式的雾化量对比图。Please refer to FIG. 14 , which is a comparison diagram of the atomization amount of different embodiments of the substrate.
本申请还对基体111的不同实施方式进行了实验对比,包括第一实验件、第二实验件、第三实验件和第四实验件。第一实验件为现有技术中的基体结构,基体上的多个导液孔相互独立,多个导液孔排列成多行多列。第二实验件为图5a和图5b所示的基体111。第三实验件为图6a和图6b所示的基体111。第四实验件为图7a和图7b所示的基体111。实验结果如下表1和图14所示。The present application also conducts experimental comparisons on different implementations of the substrate 111, including a first experimental piece, a second experimental piece, a third experimental piece, and a fourth experimental piece. The first experimental piece is a substrate structure in the prior art, and the multiple liquid guide holes on the substrate are independent of each other, and the multiple liquid guide holes are arranged in multiple rows and columns. The second experimental piece is the substrate 111 shown in Figures 5a and 5b. The third experimental piece is the substrate 111 shown in Figures 6a and 6b. The fourth experimental piece is the substrate 111 shown in Figures 7a and 7b. The experimental results are shown in Table 1 and Figure 14 below.
表1
Table 1
其中,D1为导液孔1113a在雾化面1112上的端口孔径。D2为导液孔1113a在吸液面1111上的端口孔径。对于第一实验件,L1为相邻两列导液孔之间的间距,L2为相邻两行导液孔之间的间距。对于第二实验件至第四实验件,L1为每组导液通道1113中相邻的导液孔1113a的孔中心距,L2为相邻两行导液通道1113的孔中心距。Wherein, D1 is the port aperture of the liquid guide hole 1113a on the atomizing surface 1112. D2 is the port aperture of the liquid guide hole 1113a on the liquid suction surface 1111. For the first experimental piece, L1 is the spacing between two adjacent columns of liquid guide holes, and L2 is the spacing between two adjacent rows of liquid guide holes. For the second to fourth experimental pieces, L1 is the hole center distance between adjacent liquid guide holes 1113a in each group of liquid guide channels 1113, and L2 is the hole center distance between two adjacent rows of liquid guide channels 1113.
根据表1和图14可知,本申请提供的基体111的导液孔1113a的设置方式,提高了孔隙率,且提高了雾化量。It can be seen from Table 1 and FIG. 14 that the arrangement of the liquid-conducting holes 1113a of the substrate 111 provided in the present application increases the porosity and the atomization amount.
以上仅为本申请的实施方式,并非因此限制本申请的专利范围,凡是利用本申请说明书及附图内容所作的等效结构或等效流程变换,或直接或间接运用在其他相关的技术领域,均同理包括在本申请的专利保护范围内。 The above are only implementation methods of the present application, and are not intended to limit the patent scope of the present application. Any equivalent structure or equivalent process transformation made using the contents of the present application specification and drawings, or directly or indirectly applied in other related technical fields, are also included in the patent protection scope of the present application.
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| WO2023004793A1 (en) * | 2021-07-30 | 2023-02-02 | 深圳麦克韦尔科技有限公司 | Electronic atomization device, atomizer, and atomization assembly of electronic atomization device |
| WO2023039751A1 (en) * | 2021-09-15 | 2023-03-23 | 深圳麦克韦尔科技有限公司 | Atomizing core, atomizer, and electronic atomization device |
| CN220343691U (en) * | 2023-05-17 | 2024-01-16 | 思摩尔国际控股有限公司 | Heating components, atomizers and electronic atomization devices |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2025145765A1 (en) * | 2024-01-05 | 2025-07-10 | 深圳易佳特科技有限公司 | Heating piece, atomization core, atomizer and electronic cigarette |
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| Publication number | Publication date |
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| CN220343691U (en) | 2024-01-16 |
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