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WO2024247596A1 - Appareil d'imagerie à particules magnétiques - Google Patents

Appareil d'imagerie à particules magnétiques Download PDF

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Publication number
WO2024247596A1
WO2024247596A1 PCT/JP2024/016705 JP2024016705W WO2024247596A1 WO 2024247596 A1 WO2024247596 A1 WO 2024247596A1 JP 2024016705 W JP2024016705 W JP 2024016705W WO 2024247596 A1 WO2024247596 A1 WO 2024247596A1
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WO
WIPO (PCT)
Prior art keywords
coil
magnetic field
compensation
detection coil
magnetic
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
PCT/JP2024/016705
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English (en)
Japanese (ja)
Inventor
航大 野村
将臣 鷲野
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Mitsubishi Electric Corp
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Mitsubishi Electric Corp
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Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Publication of WO2024247596A1 publication Critical patent/WO2024247596A1/fr
Anticipated expiration legal-status Critical
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/72—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
    • G01R33/10—Plotting field distribution ; Measuring field distribution
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01V—GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
    • G01V3/00—Electric or magnetic prospecting or detecting; Measuring magnetic field characteristics of the earth, e.g. declination, deviation
    • G01V3/08—Electric or magnetic prospecting or detecting; Measuring magnetic field characteristics of the earth, e.g. declination, deviation operating with magnetic or electric fields produced or modified by objects or geological structures or by detecting devices
    • G01V3/10—Electric or magnetic prospecting or detecting; Measuring magnetic field characteristics of the earth, e.g. declination, deviation operating with magnetic or electric fields produced or modified by objects or geological structures or by detecting devices using induction coils

Definitions

  • This disclosure relates to a magnetic particle imaging device.
  • a thread is cut between the surface of the coil bobbin of the compensation coil and the inner wall of the coil bobbin of the excitation coil, and by rotating the compensation coil, the compensation coil can be moved slightly along the inside of the excitation coil.
  • the compensation coil frame is brought into contact with the excitation coil frame, and the compensation coil frame is supported by the excitation coil frame while the position of the compensation coil is changed.
  • the compensation coil frame is brought into contact with the excitation coil frame, and the compensation coil frame is supported by the excitation coil frame while the position of the compensation coil is changed.
  • the object of the present disclosure is to provide a magnetic particle imaging device that can change the position of the compensation coil relative to the detection coil without the compensation coil spool coming into contact with the excitation coil spool.
  • a magnetic particle imaging device for determining the spatial distribution of magnetic particles in an inspection area within an object to be inspected, comprising an AC magnetic field application coil for generating an AC magnetic field that changes the magnetism of magnetic particles, a DC magnetic field applicator for generating an area with a low magnetic field strength so as to change only the magnetism of magnetic particles in an arbitrary area of the object to be inspected, a detection coil for detecting the magnetic change of the magnetic particles, a compensation coil having a common central axis with the detection coil and connected with the opposite polarity to the detection coil, a first winding frame for holding the detection coil, and a second winding frame for holding the compensation coil.
  • the device is configured so that the distance between the detection coil and the compensation coil in the direction of the central axis can be changed by increasing or decreasing the contact area between the first winding frame and the second winding frame.
  • the position of the compensation coil relative to the detection coil can be changed without the compensation coil winding frame coming into contact with the excitation coil winding frame.
  • FIG. 1 is a diagram showing a configuration of a magnetic particle imaging device according to a first embodiment
  • 1A is a diagram showing the AC magnetic field applying coil 5, the detection coil 3, and the compensation coil 4 according to the first embodiment as viewed from a certain direction
  • FIG. 1B is a diagram showing the AC magnetic field applying coil 5, the detection coil 3, and the compensation coil 4 according to the first embodiment as viewed from another direction
  • 2 is a diagram showing the structure of a first winding frame 21 and a second winding frame 22.
  • FIG. 2 is a diagram showing the structure of a first winding frame 21 and a second winding frame 22.
  • FIG. 1 is a diagram showing a state in which a first winding frame 21 and a second winding frame 22 are in contact with each other.
  • FIG. 1 is a diagram showing a state in which a first winding frame 21 and a second winding frame 22 are in contact with each other.
  • FIG. 13 is a view of the first winding frame 21 as seen from a different direction.
  • FIG. FIG. 11 is a diagram showing the configuration of a magnetic particle imaging device according to a second embodiment.
  • 1A is a diagram showing the AC magnetic field applying coils 5a and 5b, the detection coils 3a and 3b, and the compensation coils 4a and 4b of the second embodiment as viewed from one direction
  • FIG. 1B is a diagram showing the AC magnetic field applying coils 5a and 5b, the detection coils 3a and 3b, and the compensation coils 4a and 4b of the second embodiment as viewed from another direction.
  • 2 is a diagram showing the structure of a first winding frame 42 and a second winding frame 62.
  • FIG. 2 is a diagram showing the structure of a first winding frame 42 and a second winding frame 62.
  • FIG. 13 is a diagram showing a state in which the first winding frame 42 and the second winding frame 62 are in contact with each other.
  • FIG. 1 is a diagram showing the configuration of a magnetic particle imaging apparatus according to a first embodiment.
  • the magnetic particle imaging device determines the spatial distribution of magnetic particles within the object under test in the examination area.
  • the magnetic particle imaging device includes an AC magnetic field applicator 11, a DC magnetic field applicator 6, and a magnetization distribution measuring device 12.
  • the AC magnetic field applicator 11 applies an AC magnetic field to the imaging area in which the object 2 to be inspected is placed.
  • the AC magnetic field changes the magnetism of the magnetic particles 1.
  • the AC magnetic field applicator 11 includes an AC power supply 10 and an AC magnetic field applying coil 5 that is connected to the AC power supply 10 and excites the AC magnetic field.
  • the DC magnetic field applicator 6 generates a region having a low magnetic field strength so as to change only the magnetism of the magnetic particles 1 in a given region of the object to be inspected 2. Specifically, the DC magnetic field applicator 6 generates a low magnetic field region such as a linear zero approximation magnetic field region FFL so as to change the magnetism of the magnetic particles 1 contained in the object to be inspected 2. The DC magnetic field applicator 6 forms a linear zero approximation magnetic field region FFL in the imaging region in which the object to be inspected 2 is placed.
  • the DC magnetic field applicator 6 is, for example, composed of two permanent magnets arranged facing each other with their magnetization directions reversed. Alternatively, the DC magnetic field applicator 6 may be two permanent magnets with yokes, or an electromagnet, whose magnetizations are opposed by the yokes.
  • the magnetization distribution measuring instrument 12 measures the magnetic change of the magnetic particle 1.
  • the magnetization distribution measuring instrument 12 includes a detection coil 3, a compensation coil 4, and a measuring instrument 13.
  • the detection coil 3 detects the change in magnetism of the magnetic particles 1 .
  • the compensation coil 4 has a common central axis with the detection coil 3, and is connected with the polarity opposite to that of the detection coil 3.
  • the winding direction of the detection coil 3 and the winding direction of the compensation coil 4 are opposite to each other.
  • the compensation coil 4 makes it possible to cancel out and ignore the influence of the magnetic flux generated by the AC magnetic field application coil 5.
  • the measurement position is scanned by changing the relative position of the linear zero approximation magnetic field region FFL formed by the DC magnetic field applicator 6 with respect to the object to be inspected 2.
  • To change the relative position there is a method of mechanically moving the DC magnetic field applicator 6, the AC magnetic field applying coil 5, the detection coil 3, and the compensation coil 4, and a method of mechanically moving the object to be inspected 2.
  • the signal generated in the detection coil 3 by the AC magnetic field applicator 11 is designated as AC1.
  • the signal generated in the compensation coil 4 by the AC magnetic field applicator 11 is designated as AC2.
  • a signal generated in the detection coil 3 by the magnetic particle 1 is designated as M1.
  • the signal generated in the compensation coil 4 by the magnetic particle 1 is designated as M2.
  • the signal V2 generated by the compensation coil 4 is expressed as follows:
  • the measuring instrument 13 outputs a signal ⁇ V that represents the difference between a signal V 1 generated by the detection coil 3 and a signal V 2 generated by the compensation coil 4 .
  • FIG. 2A is a diagram showing the AC magnetic field applying coil 5, the detection coil 3, and the compensation coil 4 according to the first embodiment, as viewed from a certain direction.
  • FIG. 2 is a view of the application coil 5, the detection coil 3, and the compensation coil 4 as viewed from another direction.
  • the object to be inspected 2 includes magnetic particles 1.
  • An AC magnetic field application coil 5 is arranged to sandwich the magnetic particles 1, the object to be inspected 2, the detection coil 3, and the compensation coil 4.
  • the direction of the common central axis CA of the AC magnetic field application coil 5, the detection coil 3, and the compensation coil 4 is the X-axis direction.
  • a magnetic particle 1 is disposed inside the detection coil 3.
  • the direction of the line of the linear zero approximation magnetic field region FFL formed by the DC magnetic field application device 6 is the Y-axis direction.
  • the DC magnetic field applicator 6, the AC magnetic field applying coil 5, the detection coil 3, and the compensation coil 4 are configured to be rotatable in the YZ plane so that the coil's central axis CA and the linear zero approximation magnetic field region FFL rotate on the XY plane.
  • the object 2 to be inspected which contains the magnetic particles 1, may rotate in the YZ plane.
  • the magnetic imaging device of this embodiment has a structure that allows the distance between the detection coil 3 and the compensation coil 4 in the direction of the central axis CA to be changed. The details are described below.
  • FIGS. 3 to 6 are diagrams for explaining a structure configured to enable the distance between the detection coil 3 and the compensation coil 4 in the direction of the central axis CA to be changed.
  • FIG. 3 and FIG. 4 are diagrams showing the structures of the first winding frame 21 and the second winding frame 22.
  • FIG. 5 is a diagram showing the state in which the first winding frame 21 and the second winding frame 22 are in contact.
  • FIG. 6 is a diagram showing the first winding frame 21 as viewed from a different direction.
  • the first winding frame 21 holds the detection coil 3.
  • the second winding frame 22 holds the compensation coil 4.
  • the first winding frame 21 and the second winding frame 22 are made of an insulating material. By increasing or decreasing the contact area between the first winding frame 21 and the second winding frame 22, the distance between the detection coil 3 and the compensation coil 4 in the direction of the central axis CA can be changed.
  • the first winding frame 21 has a recess 23.
  • the second winding frame 22 has a protrusion 24.
  • the recess 23 and the protrusion 24 face each other.
  • the central axis of the recess 23 and the protrusion 24 is CA.
  • the recess 23 is formed in the direction of the central axis CA toward the second winding frame 22.
  • the protrusion 24 is formed in the direction of the central axis CA toward the first winding frame 21.
  • the side of the recess 23 and the side of the protrusion 24 come into contact with each other, and the degree of penetration of the protrusion 24 into the recess 23 is configured to be variable, so that the contact area between the first winding frame 21 and the second winding frame 22 can be increased or decreased.
  • a first groove 26 is formed on the side of the convex portion 24.
  • the convex portion 24 is a male thread with a thread cut on the outer periphery.
  • a second groove 25 is formed on the side of the concave portion 23.
  • the concave portion 23 is a female thread with a thread cut on the inner periphery.
  • the first groove 26 and the second groove 25 are formed in a spiral shape. With the crests of the first groove 26 in contact with the valleys of the second groove 25 and with the valleys of the first groove 26 in contact with the crests of the second groove 25, the convex portion 24 can be pushed into the concave portion 23 or pulled out of the concave portion 23 while rotating the convex portion 24, thereby continuously changing the distance between the detection coil 3 and the compensation coil 4 in the direction of the central axis CA.
  • a viscous solid material may be attached to the surfaces of the first groove 26 and the second groove 25.
  • the solid material may be, for example, sealing tape. This can increase the force with which the grooves can be held in position.
  • the position of one of the first winding frame 21 and the second winding frame 22 may be fixed, and the position of the other may be variable.
  • the first winding frame 21 may be fixed in position by being fixed to a winding frame (not shown) that holds the AC magnetic field applying coil 5, and the position of the second winding frame 22 may be configured to be variable.
  • a moving surface of an area having a low magnetic field strength such as a linear zero approximation magnetic field region FFL is formed in the detection coil 3.
  • the distance between the detection coil 3 and the compensation coil 4 in the direction of the central axis CA can be changed by increasing or decreasing the contact area between the first winding frame 21 and the second winding frame 22. This makes it possible to change the position of the compensation coil 4 relative to the detection coil 3 without the second winding frame 22 holding the compensation coil 4 coming into contact with the winding frame (not shown) that holds the AC magnetic field application coil 5.
  • first winding frame 21 has the recess 23 and the second winding frame 22 has the protrusion 24, but this is not limited to this.
  • the first winding frame 21 may have the protrusion 24 and the second winding frame 22 may have the recess 23.
  • the second groove 25 is formed on the side of the recess 23, and the first groove 26 is formed on the side of the protrusion 24, but this is not limited to this. It is also possible that no grooves are formed on the side of the recess 23 and the side of the protrusion 24, and the distance between the detection coil 3 and the compensation coil 4 in the direction of the central axis CA can be changed by inserting the protrusion 24 into or removing it from the recess 23 like a piston. This is because the recess 23 and the protrusion 24 can be held in place by friction or a fixing screw, even without a groove, to prevent them from shifting position.
  • the second spiral groove 25 is formed on the side of the recess 23, and the first spiral groove 26 is formed on the side of the protrusion 24, so that the distance between the detection coil 3 and the compensation coil 4 can be changed continuously, but this is not limited to this.
  • the distance between the detection coil 3 and the compensation coil 4 may also be changed in several stages.
  • Embodiment 2. 7 is a diagram showing the configuration of a magnetic particle imaging apparatus of embodiment 2.
  • the magnetic particle imaging apparatus comprises a DC magnetic field applicator 6, an AC magnetic field applicator 11A, and a magnetization distribution measuring instrument 12A.
  • the AC magnetic field applicator 11A applies an AC magnetic field to the imaging area in which the object 2 to be inspected is placed.
  • the AC magnetic field applicator 11A includes an AC power supply 10 and an AC magnetic field application coil pair 51 that is connected to the AC power supply 10 and excites the AC magnetic field.
  • the AC magnetic field application coil pair 51 is made up of AC magnetic field application coils 5a and 5b connected in series.
  • the magnetization distribution measuring instrument 12A measures the magnetic changes of magnetic particles.
  • the magnetization distribution measuring instrument 12A is equipped with a detection coil pair 31, a compensation coil pair 41, and a measuring instrument 13A.
  • the detection coil pair 31 consists of detection coils 3a and 3b connected in series.
  • the compensation coil pair 41 consists of compensation coils 4a and 4b connected in series.
  • the detection coils 3 a and 3 b detect the change in magnetism of the magnetic particles 1 .
  • the compensation coils 4a, 4b have a common central axis CB with the detection coils 3a, 3b, and are connected with the detection coils 3a, 3b with opposite polarity.
  • the winding directions of the detection coils 3a, 3b and the compensation coils 4a, 4b are opposite to each other.
  • the compensation coils 4a, 4b can cancel out and ignore the influence of the magnetic flux generated by the AC magnetic field application coils 5a, 5b.
  • the measurement position is scanned by changing the relative position of the linear zero approximation magnetic field region FFL formed by the DC magnetic field applicator 6 with respect to the object to be inspected 2.
  • To change the relative position there is a method of mechanically moving the DC magnetic field applicator 6, the AC magnetic field applying coil pair 51, the detection coil pair 31, and the compensation coil pair 41, and a method of mechanically moving the object to be inspected 2.
  • the signal generated in the detection coil pair 31 by the AC magnetic field applicator 11A is designated as AC1.
  • the signal generated in the compensation coil pair 41 by the AC magnetic field applicator 11A is designated as AC2.
  • a signal generated in the detection coil pair 31 by the magnetic particle 1 is designated as M1.
  • the signal generated in the compensation coil pair 41 by the magnetic particle 1 is designated as M2.
  • V2 generated by the compensation coil pair 41 is expressed as follows:
  • the measuring instrument 13A outputs a signal ⁇ V that indicates the difference between a signal V 1 generated by the detection coil pair 31 and a signal V 2 generated by the compensation coil pair 41 .
  • ..(3) 8A is a diagram showing the AC magnetic field applying coils 5a and 5b, the detection coils 3a and 3b, and the compensation coils 4a and 4b of the second embodiment as viewed from a certain direction.
  • 13 is a diagram showing the AC magnetic field applying coils 5a and 5b, the detection coils 3a and 3b, and the compensation coils 4a and 4b of the second embodiment as viewed from a different direction.
  • a detection coil pair 31 is arranged to sandwich the magnetic particle 1 and the test object 2 containing the magnetic particle 1.
  • the detection coil pair 31 includes detection coils 3a and 3b.
  • the detection coil 3a and the detection coil 3b sandwich the magnetic particle 1 and the test object 2.
  • the compensation coil pair 41 is arranged to sandwich the magnetic particle 1, the object to be inspected 2, and the detection coil pair 31.
  • the compensation coil pair 41 includes compensation coils 4a and 4b.
  • the compensation coil 4a and the compensation coil 4b sandwich the magnetic particle 1, the object to be inspected 2, the detection coil 3a, and the detection coil 3b.
  • the AC magnetic field application coil pair 51 is arranged to sandwich the magnetic particle 1, the object to be inspected 2, the detection coil pair 31, and the compensation coil pair 41.
  • the AC magnetic field application coil pair 51 includes AC magnetic field application coils 5a and 5b.
  • the AC magnetic field application coil 5a and the AC magnetic field application coil 5b sandwich the magnetic particle 1, the object to be inspected 2, the detection coil 3a, the detection coil 3b, the compensation coil 4a, and the compensation coil 4b.
  • the AC magnetic field application coil pair 51, the detection coil pair 31, and the compensation coil pair 41 have a common central axis CB.
  • the direction of the AC magnetic field is the first direction (X-axis direction).
  • the axes perpendicular to the X-axis are the Y-axis and Z-axis.
  • the line direction of the linear zero approximation magnetic field region FFL formed by the DC magnetic field applicator 6 can be approximately parallel to the first direction (X-axis direction). That is, the angle between the line direction of the linear zero approximation magnetic field region FFL and the first direction (X-axis direction) can be in the range of ⁇ 5°. More preferably, the line direction of the linear zero approximation magnetic field region FFL may be the first direction (X-axis direction). Furthermore, the basic position of the linear zero approximation magnetic field region FFL overlaps with the common central axis CB.
  • the distance between the AC magnetic field applying coil 5a and the AC magnetic field applying coil 5b is D1.
  • the distance between the compensation coil 4a and the compensation coil 4b is D2.
  • the distance between the detection coil 3a and the detection coil 3b is D3.
  • the coil radius of the AC magnetic field applying coil 5a and the AC magnetic field applying coil 5b is R1.
  • the coil radius of the compensation coil 4a and the compensation coil 4b is R2.
  • the coil radius of the detection coil 3a and the detection coil 3b is R3.
  • R1>R2 R3.
  • the DC magnetic field applicator 6, the AC magnetic field applying coil pair 51, the detection coil pair 31, and the compensation coil pair 41 are configured to be rotatable within the XZ plane so that the central axis CB, the direction of the AC magnetic field, and the linear zero approximation magnetic field region FFL rotate on the XZ plane.
  • the object 2 to be inspected, which contains the magnetic particles 1 may rotate within the XZ plane.
  • the DC magnetic field applicator 6 moves so that the linear zero approximation magnetic field region FFL not only rotates but also translates left and right around the base position.
  • the magnetic imaging device of this embodiment has a structure that allows the distance between the detection coil 3a and the compensation coil 4a in the direction of the central axis CB to be changed. The details are described below.
  • FIGS. 9 to 11 are diagrams for explaining a structure configured to enable the distance between the detection coil 3a and the compensation coil 4a in the direction of the central axis CB to be changed.
  • FIG. 9 and FIG. 10 are diagrams showing the structures of the first winding frame 42 and the second winding frame 62.
  • FIG. 11 is a diagram showing the state in which the first winding frame 42 and the second winding frame 62 are in contact.
  • the first winding frame 42 holds the detection coil 3a, the detection coil 3b, and the compensation coil 4b.
  • the second winding frame 62 holds the compensation coil 4a.
  • the first winding frame 42 and the second winding frame 62 are made of an insulating material.
  • the first winding frame 42 has a protruding portion 34.
  • the second winding frame 62 has a recessed portion 33.
  • the protruding portion 34 and the recessed portion 33 face each other.
  • the central axis of the recessed portion 33 and the protruding portion 34 is CB.
  • the protruding portion 34 is formed in the direction of the central axis CB toward the second winding frame 62.
  • the recessed portion 33 is formed in the direction of the central axis CB toward the first winding frame 42.
  • the side of the protruding portion 34 and the side of the recessed portion 33 are in contact with each other, and the degree of penetration of the protruding portion 34 into the recessed portion 33 is configured to be variable, so that the contact area between the first winding frame 42 and the second winding frame 62 can be increased or decreased.
  • a first groove 36 is formed on the side of the convex portion 34.
  • the convex portion 34 is a male thread with a thread cut on the outer periphery.
  • a second groove 35 is formed on the side of the concave portion 33.
  • the concave portion 33 is a female thread with a thread cut on the inner periphery.
  • the first groove 36 and the second groove 35 are formed in a spiral shape.
  • the peaks 34 can be pushed into the recesses 33 while rotating the peaks 34, or pulled out of the recesses 33, thereby continuously changing the distance between the detection coil 3a and the compensation coil 4a in the direction of the central axis CB.
  • the distance between the detection coil 3b and the compensation coil 4a in the direction of the central axis CB and the distance between the compensation coil 4a and the compensation coil 4b in the direction of the central axis CB also continuously changes.
  • a viscous solid material may be attached to the surfaces of the first groove 36 and the second groove 35.
  • the solid material may be, for example, sealing tape. This can increase the force with which the grooves can be held in position.
  • the position of one of the first winding frame 42 and the second winding frame 62 may be fixed, and the position of the other may be variable.
  • the position of the first winding frame 42 may be fixed, and the position of the second winding frame 62 may be configured to be variable.
  • a moving surface of an area having a low magnetic field strength such as a linear zero approximation magnetic field region FFL is formed in the detection coils 3a and 3b.
  • the distance between the detection coil 3a and the compensation coil 4a in the direction of the central axis CB can be changed by increasing or decreasing the contact area between the first winding frame 42 and the second winding frame 62. This makes it possible to change the position of the compensation coil 4a relative to the detection coil 3a without the second winding frame 62 holding the compensation coil 4a coming into contact with the winding frame (not shown) holding the AC magnetic field application coils 5a, 5b.

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Abstract

L'invention concerne un appareil d'imagerie à particules magnétiques comprenant une bobine de détection (3) pour détecter des changements dans le magnétisme d'une particule magnétique (1) ; une bobine de compensation (4) avec un axe central (CA) partagé par la bobine de détection (3) et connectée à la bobine de détection (3) de façon à avoir une polarité opposée à celle-ci ; un premier cadre d'enroulement (21) pour maintenir la bobine de détection (3) ; et un second cadre d'enroulement (22) pour maintenir la bobine de compensation (4). L'appareil d'imagerie à particules magnétiques est configuré de sorte que la distance entre la bobine de détection (3) et la bobine de compensation (4) dans la direction le long de l'axe central (CA) puisse être modifiée en augmentant ou en diminuant une partie de contact entre le premier cadre d'enroulement (21) et le second cadre d'enroulement (22).
PCT/JP2024/016705 2023-06-01 2024-04-30 Appareil d'imagerie à particules magnétiques Pending WO2024247596A1 (fr)

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JP2023090755 2023-06-01

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Citations (8)

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Publication number Priority date Publication date Assignee Title
JPH08338864A (ja) * 1995-06-13 1996-12-24 Iwatsu Electric Co Ltd 磁気センサ
JPH112625A (ja) * 1997-06-11 1999-01-06 Ee One Kk 異品検出装置
JP2008519268A (ja) * 2004-11-09 2008-06-05 メティス・インストルメンツ・アンド・エクィップメント・ナムローゼ・フエンノートシャップ 磁束を測定するためのセンサ
JP2010088683A (ja) * 2008-10-08 2010-04-22 Toshiba Corp 磁性微粒子イメージング装置
US20160223626A1 (en) * 2013-08-30 2016-08-04 Koninklijke Philips N.V. Coil arrangement of mpi system or apparatus
JP2019052852A (ja) * 2017-09-12 2019-04-04 株式会社 マトリックス細胞研究所 磁性体定量装置及びその製造方法
JP2020028427A (ja) * 2018-08-22 2020-02-27 三菱電機株式会社 駆動回路および磁気粒子イメージング装置
WO2022220113A1 (fr) * 2021-04-13 2022-10-20 三菱電機株式会社 Dispositif d'imagerie par particules magnétiques fines

Patent Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH08338864A (ja) * 1995-06-13 1996-12-24 Iwatsu Electric Co Ltd 磁気センサ
JPH112625A (ja) * 1997-06-11 1999-01-06 Ee One Kk 異品検出装置
JP2008519268A (ja) * 2004-11-09 2008-06-05 メティス・インストルメンツ・アンド・エクィップメント・ナムローゼ・フエンノートシャップ 磁束を測定するためのセンサ
JP2010088683A (ja) * 2008-10-08 2010-04-22 Toshiba Corp 磁性微粒子イメージング装置
US20160223626A1 (en) * 2013-08-30 2016-08-04 Koninklijke Philips N.V. Coil arrangement of mpi system or apparatus
JP2019052852A (ja) * 2017-09-12 2019-04-04 株式会社 マトリックス細胞研究所 磁性体定量装置及びその製造方法
JP2020028427A (ja) * 2018-08-22 2020-02-27 三菱電機株式会社 駆動回路および磁気粒子イメージング装置
WO2022220113A1 (fr) * 2021-04-13 2022-10-20 三菱電機株式会社 Dispositif d'imagerie par particules magnétiques fines

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