WO2024111643A1 - Photoelectric conversion element, solar cell module, and method for manufacturing photoelectric conversion element - Google Patents
Photoelectric conversion element, solar cell module, and method for manufacturing photoelectric conversion element Download PDFInfo
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- WO2024111643A1 WO2024111643A1 PCT/JP2023/042051 JP2023042051W WO2024111643A1 WO 2024111643 A1 WO2024111643 A1 WO 2024111643A1 JP 2023042051 W JP2023042051 W JP 2023042051W WO 2024111643 A1 WO2024111643 A1 WO 2024111643A1
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- H—ELECTRICITY
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- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K30/00—Organic devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation
- H10K30/40—Organic devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation comprising a p-i-n structure, e.g. having a perovskite absorber between p-type and n-type charge transport layers
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- H—ELECTRICITY
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- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K30/00—Organic devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation
- H10K30/50—Photovoltaic [PV] devices
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K30/00—Organic devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation
- H10K30/80—Constructional details
- H10K30/84—Layers having high charge carrier mobility
- H10K30/86—Layers having high hole mobility, e.g. hole-transporting layers or electron-blocking layers
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
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- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
- Y02E10/549—Organic PV cells
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
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- Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
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Definitions
- This disclosure relates to a photoelectric conversion element, a solar cell module, and a method for manufacturing a photoelectric conversion element.
- Photoelectric conversion elements are used, for example, in optical sensors, copiers, solar cell modules, etc.
- solar cell modules are becoming increasingly popular as a representative method of using renewable energy.
- the most widely used solar cell modules are those that use inorganic photoelectric conversion elements (for example, silicon-based solar cell modules, CIGS-based solar cell modules, and CdTe-based solar cell modules, etc.).
- solar cell modules using organic photoelectric conversion elements for example, organic thin-film solar cell modules and dye-sensitized solar cell modules
- Such solar cell modules using organic photoelectric conversion elements can be manufactured using a coating process without using a vacuum process, which has the potential to significantly reduce manufacturing costs. For this reason, solar cell modules using organic photoelectric conversion elements are expected to be the next generation of solar cell modules.
- organic photoelectric conversion elements that use compounds having a perovskite crystal structure (hereinafter sometimes referred to as perovskite compounds) in the light absorption layer have been studied (see, for example, Patent Document 1).
- perovskite compounds include lead complexes.
- Photoelectric conversion elements that use perovskite compounds in the light absorption layer have excellent photoelectric conversion efficiency.
- the present disclosure has been made in view of the above circumstances, and provides a photoelectric conversion element having excellent photoelectric conversion efficiency and excellent durability.
- the present disclosure provides a photoelectric conversion element comprising a transparent substrate, a transparent conductive film provided on the transparent substrate, a hole blocking layer provided on the transparent conductive film, a photoelectric conversion layer provided on the hole blocking layer, an electron blocking layer provided on the photoelectric conversion layer, and a back electrode provided on the electron blocking layer, the photoelectric conversion layer including perovskite compound crystals and filler particles, the photoelectric conversion layer including a reflective region in which the filler particles are unevenly distributed, and the reflective region disposed adjacent to the electron blocking layer.
- the photoelectric conversion layer includes the reflection region in which the filler particles are unevenly distributed, and this reflection region is disposed adjacent to the electron blocking layer, so that the photoelectric conversion layer can have two layers: a layer mainly composed of perovskite compound crystals, and a layer containing a large number of filler particles and having perovskite compound crystals between the particles. Therefore, the light that passes through the layer mainly composed of perovskite compound crystals and reaches the reflection region is diffusely reflected by the reflection region, so that the layer mainly composed of perovskite compound crystals can absorb reflected light or scattered light.
- the perovskite compound crystals are present between the particles in the reflection region, the perovskite compound crystals can also absorb reflected light or scattered light. Therefore, the number of electrons and holes generated by photoexcitation in the perovskite compound crystals can be increased, and the photoelectric conversion efficiency of the photoelectric conversion element can be increased. In addition, the film thickness of the photoelectric conversion layer can be reduced, and the open circuit voltage and FF characteristics (recombination reduction) can be improved. Since the photoelectric conversion layer contains filler particles, the solvent evaporation rate during the formation of the photoelectric conversion layer can be slowed down.
- the crystal growth rate of the perovskite compound crystal can be slowed down, and defects at the crystal interface of the perovskite compound crystal can be reduced. Therefore, the intrusion of water molecules into the perovskite compound crystal can be suppressed, and the durability of the photoelectric conversion element can be improved.
- FIG. 1 is a schematic cross-sectional view of a photoelectric conversion element according to an embodiment of the present disclosure.
- FIG. 2 is a diagram showing a band structure of a photoelectric conversion element according to an embodiment of the present disclosure.
- FIG. 2 is a schematic cross-sectional view of a filler particle having a surface coating layer of an electron blocking material.
- 1A is a schematic diagram of a photoelectric conversion layer in which filler particles are unevenly distributed, and an enlarged view in which the filler particles are closely packed (face-centered cubic arrangement).
- FIG. 1 is a schematic diagram of a photoelectric conversion layer having a surface coating layer of an electron blocking material and in which filler particles are unevenly distributed, and an enlarged view of the filler particles in close packing (face-centered cubic arrangement).
- FIG. 1 is a schematic diagram of a photoelectric conversion layer having a surface coating layer of an electron blocking material and in which filler particles are unevenly distributed, and an enlarged view of the filler particles in close packing (face-centered cubic arrangement
- 1 is an explanatory diagram of a manufacturing method for forming a photoelectric conversion layer by applying and drying a perovskite compound solution containing filler particles.
- 1 is a schematic cross-sectional view of a solar cell module according to an embodiment of the present disclosure.
- 1 is a partial cross-sectional view of a solar cell module according to an embodiment of the present disclosure.
- 1 is an equivalent circuit of a solar cell module according to an embodiment of the present disclosure.
- the photoelectric conversion element disclosed herein comprises a transparent substrate, a transparent conductive film provided on the transparent substrate, a hole blocking layer provided on the transparent conductive film, a photoelectric conversion layer provided on the hole blocking layer, an electron blocking layer provided on the photoelectric conversion layer, and a back electrode provided on the electron blocking layer, the photoelectric conversion layer including perovskite compound crystals and filler particles, the photoelectric conversion layer including a reflective region in which the filler particles are unevenly distributed, and the reflective region being disposed adjacent to the electron blocking layer.
- the filler particles preferably contain inorganic material particles.
- the thickness of the reflective region is preferably 0.04 to 0.3 times the thickness of the photoelectric conversion layer.
- the thickness of the reflective region is preferably 40 nm or more and 150 nm or less.
- the reflective region is preferably a region in which 50 wt % or more of the filler particles contained in the photoelectric conversion layer are unevenly distributed.
- the average particle diameter D50 of the filler particles is preferably 10 nm or more and 50 nm or less.
- the effective refractive index on the back electrode side is lowered, and light is efficiently reflected to the photoelectric conversion layer, thereby reducing the light absorption loss by the back electrode and realizing a highly efficient solar cell.
- the reflective region can suppress local current leakage between the transparent conductive film and the back electrode.
- the filler particles preferably include at least one of silica particles, alumina particles, titanium oxide particles, zirconia particles, nickel oxide particles, Cu 2 O particles, CuO particles, and zinc oxide particles.
- the filler particles have a surface coating layer, and the material of the surface coating layer is an electron blocking material that blocks electrons generated in the perovskite compound crystal and transports holes generated in the perovskite compound crystal to the electron blocking layer. This makes it possible to block the propagation of electrons to the back electrode side, and efficiently propagate holes to the back electrode. As a result, high efficiency of the photoelectric conversion element can be achieved.
- the contact area between the perovskite compound crystal and the electron blocking material is wide, so that photoexcited carriers can be efficiently extracted to the back electrode. This allows efficient separation of photoexcited carriers (conduction electrons and holes), and high efficiency, low cost, and high rigidity can be achieved.
- the electron blocking material is preferably Cu2O or NiO.
- the electron blocking layer is disposed adjacent to the reflective region, and the thickness of the electron blocking layer is preferably 50 nm or more and 100 nm or less.
- the material of the back electrode is preferably a metal having a work function of 5.0 eV or more. This makes it possible to block the propagation of electrons to the back electrode side and to efficiently propagate holes to the back electrode. As a result, a high efficiency of the photoelectric conversion element can be achieved.
- the thickness of the photoelectric conversion layer is preferably 500 nm to 1 ⁇ m. Since the photoelectric conversion layer having a reflective region can efficiently absorb light, the thickness of the photoelectric conversion layer can be made thin, thereby improving the open circuit voltage and FF characteristics (recombination reduction).
- the present disclosure also provides a solar cell module that includes a plurality of photoelectric conversion elements of the present disclosure, the plurality of photoelectric conversion elements being integrated together.
- the solar cell module that integrates the photoelectric conversion elements as solar cells can efficiently absorb light due to the light reflection structure described above, allowing the thickness of the photoelectric conversion layer to be thin, thereby improving the open circuit voltage and FF characteristics (recombination reduction).
- the present disclosure also provides a method for manufacturing a photoelectric conversion element, comprising a coating step of coating a coating liquid containing a perovskite compound and filler particles on a hole blocking layer provided on a transparent substrate, and a drying step of drying the coating film formed by the coating step, characterized in that in the drying step, the transparent substrate is heated from the side opposite to the coated surface in the coating step.
- FIG. 1 is a schematic cross-sectional view of a photoelectric conversion element according to the present embodiment.
- the photoelectric conversion element 20 of this embodiment includes a transparent substrate 2, a transparent conductive film 3 provided on the transparent substrate 2, a hole blocking layer 4 provided on the transparent conductive film 3, a photoelectric conversion layer 5 provided on the hole blocking layer 4, an electron blocking layer 9 provided on the photoelectric conversion layer 5, and a back electrode 10 provided on the electron blocking layer 9.
- the photoelectric conversion layer 5 includes perovskite compound crystals 7 and filler particles 8.
- the photoelectric conversion layer 5 includes a reflective region 6 in which the filler particles 8 are unevenly distributed, and the reflective region 6 is disposed adjacent to the electron blocking layer 9.
- FIG. 2 is a diagram showing the band structure of the photoelectric conversion element 20 for explaining the flow of conduction electrons and holes generated by photoexcitation in the perovskite compound crystals 7 contained in the photoelectric conversion layer 5.
- the transparent substrate 2 is a base of the photoelectric conversion element 20 and is made of a transparent material.
- the transparent substrate 2 is disposed on the light receiving surface side of the photoelectric conversion element 20.
- a hole blocking layer 4, a photoelectric conversion layer 5, etc. are laminated on the transparent substrate 2 in the manufacturing process of the photoelectric conversion element 20.
- materials for the transparent substrate 2 include transparent glass (more specifically, soda-lime glass, non-alkali glass, etc.) and heat-resistant transparent resins.
- the photoelectric conversion element 20 may have a barrier layer on the transparent substrate 2. This can prevent moisture and the like from penetrating into the photoelectric conversion layer 5.
- the transparent conductive film 3 corresponds to the cathode of the photoelectric conversion element 20.
- materials constituting the transparent conductive film 3 include transparent conductive materials (particularly, transparent conductive oxides (TCO)) and non-transparent conductive materials.
- transparent conductive materials include copper iodide (CuI), indium tin oxide (ITO), tin oxide (SnO 2 ), fluorine-doped tin oxide (FTO), aluminum-doped zinc oxide (AZO), indium zinc oxide (IZO), and gallium-doped zinc oxide (GZO).
- CuI copper iodide
- ITO indium tin oxide
- SnO 2 tin oxide
- FTO fluorine-doped tin oxide
- AZO aluminum-doped zinc oxide
- IZO indium zinc oxide
- GZO gallium-doped zinc oxide
- the transparent conductive film 3 is shown as TCO, and conductive electrons generated by photoexcitation in the perovskite compound crystal 7 (Perovskite) move to the transparent conductive film 3 through the hole blocking layer 4 and are extracted to the outside of the photoelectric conversion element 20.
- Perovskite perovskite compound crystal 7
- the hole blocking layer 4 is a layer that transports electrons generated by photoexcitation in the perovskite compound crystals 7 of the photoelectric conversion layer 5 to the transparent conductive film 3, while blocking holes generated by photoexcitation in the perovskite compound crystals 7.
- the hole blocking layer 4 preferably contains a material that easily moves electrons generated in the perovskite compound crystals 7 to the transparent conductive film 3.
- the hole blocking layer 4 can contain titanium oxide.
- the hole blocking layer 4 can include a dense titanium oxide layer having a relatively small porosity and a porous titanium oxide layer that is a porous layer having a higher porosity than the dense titanium oxide layer.
- the dense titanium oxide layer can be provided on the transparent conductive film 3, and the porous titanium oxide layer can be provided on the dense titanium oxide layer.
- the dense titanium oxide layer and the porous titanium oxide layer that constitute the hole blocking layer 4 will be described.
- the dense titanium oxide layer Since the dense titanium oxide layer has a low porosity, the perovskite compound-containing coating liquid used to form the photoelectric conversion layer 5 during the manufacture of the photoelectric conversion element 20 does not easily penetrate into the layer. Therefore, by providing the photoelectric conversion element 20 with a dense titanium oxide layer, contact between the perovskite compound crystals 7 and the transparent conductive film 3 is suppressed. Furthermore, by providing the photoelectric conversion element 20 with a dense titanium oxide layer, contact between the transparent conductive film 3 and the back electrode 10, which is a cause of a decrease in electromotive force, is suppressed.
- the film thickness of the dense titanium oxide layer is preferably 5 nm or more and 200 nm or less, and more preferably 10 nm or more and 100 nm or less. Furthermore, the filling rate in terms of mass is preferably 90% or more.
- porous titanium oxide layer Since the porous titanium oxide layer has a high porosity, the perovskite compound-containing coating liquid used to form the photoelectric conversion layer 5 during the manufacture of the photoelectric conversion element 20 can easily penetrate into the pores in the layer. Therefore, by providing the photoelectric conversion element 20 with a porous titanium oxide layer, the contact area between the perovskite compound crystals 7 and the hole blocking layer 4 can be increased. This allows electrons generated by photoexcitation in the perovskite compound crystals 7 to be efficiently transferred to the hole blocking layer 4 and holes to be blocked.
- the photoelectric conversion layer 5 is a layer that generates electrons and holes by photoexcitation, and includes perovskite compound crystals 7 and filler particles 8.
- the thickness of the photoelectric conversion layer 5 is preferably 500 nm or more and 1 ⁇ m or less, and more preferably 700 nm or more and 800 nm or less.
- the photoelectric conversion layer 5 may have a structure in which a light absorbing region mainly composed of perovskite compound crystals 7 and a reflection region 6 containing perovskite compound crystals 7 and filler particles 8, in which the filler particles of the photoelectric conversion layer 5 are unevenly distributed, are laminated.
- the light absorbing region may be provided adjacent to the hole blocking layer 4.
- the light absorbing region may be a layered region.
- the light absorbing region may be a region in which the perovskite compound crystals 7 account for 95 wt % or more.
- the light absorbing region may also contain filler particles 8.
- the perovskite compound crystal 7 contained in the photoelectric conversion layer 5 is preferably a crystal of a compound (perovskite compound) represented by the general formula: ABX3 (1).
- A is an organic molecule
- B is a metal atom
- X is a halogen atom.
- the three Xs may be the same or different from each other.
- Perovskite compounds are organic-inorganic hybrid compounds.
- Organic-inorganic hybrid compounds are compounds composed of inorganic materials and organic materials. Photoelectric conversion elements using perovskite compounds, which are organic-inorganic hybrid compounds, are also called organic-inorganic hybrid photoelectric conversion elements.
- examples of the organic molecule represented by A include alkylamines, alkylammoniums, and nitrogen-containing heterocyclic compounds.
- the organic molecule represented by A may be only one type of organic molecule, or may be two or more types of organic molecules.
- alkylamines include methylamine, ethylamine, propylamine, butylamine, pentylamine, hexylamine, dimethylamine, diethylamine, dipropylamine, dibutylamine, dipentylamine, dihexylamine, trimethylamine, triethylamine, tripropylamine, tributylamine, tripentylamine, trihexylamine, ethylmethylamine, methylpropylamine, butylmethylamine, methylpentylamine, hexylmethylamine, ethylpropylamine, and ethylbutylamine.
- the alkyl ammonium is an ionized product of the above-mentioned alkyl amine.
- the alkyl ammonium include methyl ammonium ( CH3NH3 ), ethyl ammonium, propyl ammonium, butyl ammonium, pentyl ammonium, hexyl ammonium, dimethyl ammonium, diethyl ammonium, dipropyl ammonium, dibutyl ammonium, dipentyl ammonium, dihexyl ammonium, trimethyl ammonium, triethyl ammonium, tripropyl ammonium, tributyl ammonium, tripentyl ammonium, trihexyl ammonium, ethyl methyl ammonium, methyl propyl ammonium, butyl methyl ammonium, methyl pentyl ammonium, hexyl methyl ammonium, ethyl propyl ammonium, and ethyl
- nitrogen-containing heterocyclic compound examples include imidazole, azole, pyrrole, aziridine, azirine, azetidine, azeto, azole, imidazoline, and carbazole.
- the nitrogen-containing heterocyclic compound may be an ionized compound. Phenethylammonium is a preferred example of the nitrogen-containing heterocyclic compound that is an ionized compound.
- the organic molecule represented by A is preferably methylamine, ethylamine, propylamine, butylamine, pentylamine, hexylamine, methylammonium, ethylammonium, propylammonium, butylammonium, pentylammonium, hexylammonium or phenethylammonium, more preferably methylamine, ethylamine, propylamine, methylammonium, ethylammonium or propylammonium, and even more preferably methylammonium.
- examples of the metal atom represented by B include lead, tin, zinc, titanium, antimony, bismuth, nickel, iron, cobalt, silver, copper, gallium, germanium, magnesium, calcium, indium, aluminum, manganese, chromium, molybdenum, and europium.
- the metal atom represented by B may be only one type of metal atom, or may be two or more types of metal atoms. From the viewpoint of improving the light absorption characteristics and charge generation characteristics of the perovskite compound crystal 7, the metal atom represented by B is preferably a lead atom.
- examples of halogen atoms represented by X include fluorine atoms, chlorine atoms, bromine atoms, and iodine atoms.
- the halogen atom represented by X may be one type of halogen atom, or may be two or more types of halogen atoms.
- the halogen atom represented by X is preferably an iodine atom.
- a compound represented by the general formula " CH3NH3PbX3 (wherein X represents a halogen atom)" is preferred, and CH3NH3PbI3 is more preferred.
- CH3NH3PbX3 particularly CH3NH3PbI3
- conduction electrons and holes can be generated more efficiently in the perovskite compound crystal 7 , and as a result, the photoelectric conversion efficiency of the photoelectric conversion element 20 can be further improved.
- the filler particles 8 are particles mixed in the perovskite compound crystals 7.
- the filler particles 8 are, for example, inorganic material particles.
- the filler particles 8 preferably include at least one of silica particles, alumina particles, titanium oxide particles, zirconia particles, nickel oxide particles, Cu2O particles, CuO particles, and zinc oxide particles, and are more preferably silica particles, nickel oxide particles, or Cu2O particles.
- the filler particle 8 may have a core particle 12 and a surface coating layer 11 that covers the surface of the core particle 12.
- the core particle 12 is, for example, an inorganic material particle, more specifically, for example, silica particles, alumina particles, titanium oxide particles, zirconia particles, nickel oxide particles, Cu 2 O particles, CuO particles, zinc oxide particles, etc.
- the material of the surface coating layer 11 is an electron blocking material that blocks electrons generated in the perovskite compound crystal 7 and transports holes generated in the perovskite compound crystal 7 to the electron blocking layer 9.
- the material of the surface coating layer 11 is, for example, Cu 2 O, NiO, etc.
- the film thickness of the surface coating layer 11 can be 5 nm or more and 20 nm or less.
- the filler particles 8 and the core-shell type filler particles 8 can be produced by an RF thermal plasma method.
- organic filler particles such as organic polystyrene, cellulose, polyacrylic acid, etc. can be produced by a suspension polymerization method, the pH of the solution in which the produced organic filler is dispersed can be adjusted, and the surface of the organic filler can be coated with inorganic nanoparticles to produce the core-shell type filler particles 8.
- the average particle diameter D50 of the filler particles 8 contained in the photoelectric conversion layer 5 is preferably 10 nm or more and 50 nm or less, and more preferably 10 nm or more and 30 nm or less. This allows the filler particles 8 to be unevenly distributed on the surface when the perovskite compound is coated and dried, and allows the filler particles 8 to form a closely packed structure. This improves the durability of the perovskite compound crystals 7 against the intrusion of water molecules.
- the average particle diameter D50 of the filler particles 8 can be calculated from the measurement results, for example, by measuring the particle diameters of about 100 filler particles 8 from a photograph of the cross section of the photoelectric conversion layer 5.
- the reflective region 6 is a region where the filler particles 8 contained in the photoelectric conversion layer 5 are unevenly distributed, and is disposed adjacent to the electron blocking layer 9 . Since the photoelectric conversion layer 5 has the reflection region 6, the light that passes through the light absorption region and reaches the reflection region 6 is diffusely reflected by the reflection region 6, so that the light absorption region can absorb the reflected light or scattered light and generate conductive electrons and holes. In addition, since the perovskite compound crystals 7 exist between the particles in the reflection region 6, the perovskite compound crystals 7 can also absorb the reflected light or scattered light.
- the number of conductive electrons and holes generated by photoexcitation in the perovskite compound crystals 7 can be increased, and the photoelectric conversion efficiency of the photoelectric conversion element 20 can be increased.
- the thickness of the photoelectric conversion layer 5 can be reduced, and the open circuit voltage and FF characteristics (recombination reduction) can be improved.
- the reflection region 6 may be a layer in which the filler particles 8 occupy 20 wt % or more.
- the reflection region 6 is preferably a region in which 50 wt % or more of the filler particles 8 of all the filler particles 8 contained in the photoelectric conversion layer 5 are unevenly distributed, more preferably a region in which 70 wt % or more of the filler particles 8 of all the filler particles 8 contained in the photoelectric conversion layer 5 are unevenly distributed, and even more preferably a region in which 90 wt % or more of the filler particles 8 of all the filler particles 8 contained in the photoelectric conversion layer 5 are unevenly distributed. This allows a remarkable light reflection effect to be obtained.
- the reflective region 6 may be a region in which the filler particles 8 are stacked.
- the reflective region 6 may include a region in which the filler particles 8 are stacked in a close-packed structure.
- FIG. 4 and 5 are schematic diagrams of a photoelectric conversion layer 5 in which filler particles are unevenly distributed, and enlarged views of filler particles 8 in close packing (face-centered cubic arrangement).
- the filler particles 8 contained in the photoelectric conversion layer 5 shown in Fig. 4 are inorganic material particles
- the filler particles 8 contained in the photoelectric conversion layer 5 shown in Fig. 5 are particles in which the surface of a core particle 12 is covered with a surface coating layer 11. As shown in FIG.
- the reflective region 6 has a configuration in which filler particles 8 having a surface coating layer 11 are closely packed (in a face-centered cubic arrangement), so that electrons generated in the perovskite compound crystals 7 can be blocked from propagating to the rear surface electrode 10, and holes generated in the perovskite compound crystals 7 can be efficiently propagated to the rear surface electrode 10.
- the reflective region 6 may be a layered region.
- the thickness of the reflective region 6 is preferably 0.04 to 0.3 times the thickness of the photoelectric conversion layer 5, and more preferably 0.04 to 0.15 times the thickness of the photoelectric conversion layer 5.
- the thickness of the reflective region 6 may be 40 nm to 150 nm. This can prevent the internal resistance of the photoelectric conversion element 20 from increasing. Furthermore, the light that passes through the light absorption region and reaches the reflective region 6 can be efficiently diffused and reflected by the reflective region 6.
- FIG. 6 is a schematic diagram showing a manufacturing method for forming a photoelectric conversion layer 5 by applying and drying a perovskite compound solution containing filler particles 8.
- the manufacturing method of the photoelectric conversion layer 5 includes a coating step of coating a coating liquid containing a perovskite compound and filler particles on the hole blocking layer 4 provided on the transparent substrate 2, and a drying step of drying the coating film formed by the coating step.
- a coating liquid in which the filler particles 8 are dispersed in the perovskite compound solution can be prepared by mixing/stirring/dispersing a solution (A) of the perovskite compound and a dispersion (B) of the filler particles 8 in a container (C).
- the coating liquid is preferably a dispersion containing 3 to 10 wt % of the filler particles 8 in the perovskite compound solution so that the film thickness of the reflective region 6 in which the filler particles 8 are closely packed (face-centered cubic arrangement) is 1 ⁇ 3 of the film thickness of the photoelectric conversion layer 5.
- the weight ratio of the solids that will become the perovskite compound crystals in the perovskite compound solution before the filler particles 8 are dispersed to the solvent is preferably 20/80, and the solids concentration is 20% or less.
- the weight ratio of the filler particles 8 to the coating liquid can be 3 to 10 wt%.
- the thickness of the photoelectric conversion layer 5 is 540 nm and the thickness of the reflective region 6 is 90 nm.
- the thickness of the photoelectric conversion layer 5 is 580 nm and the thickness of the reflective region 6 is 180 nm.
- the coating liquid is applied onto the hole blocking layer 4 to form a coating film.
- the coating method is not particularly limited, but can be slit die coating. It is preferable that the coating environment is maintained in a low humidity environment, and the coating environment may be sealed with an inert gas such as nitrogen gas.
- the transparent substrate 2, the transparent conductive film 3, and the hole blocking layer 4 may be arranged such that the transparent substrate 2 is located on the top side and the hole blocking layer 4 is located on the ground side, and the coating liquid may be applied onto the hole blocking layer 4 from the ground side of the laminate. This can prevent dripping from the slit die.
- the drying step when the transparent substrate 2 is heated from the opposite side to the coating surface, the occurrence of convection in the coating film can be suppressed, and a reflective region 6 in which the filler particles 8 are unevenly distributed can be formed.
- the solvent contained in the coating film evaporates.
- the concentration of the perovskite compound in the coating film increases, and the crystallization of the perovskite compound advances from the hole blocking layer 4 side.
- a light absorbing region (a region mainly composed of the perovskite compound crystals 7) adjacent to the hole blocking layer 4 is formed.
- the crystallization of the perovskite compound advances on the coating film surface containing many filler particles 8, and a reflection region 6 in which the filler particles 8 are unevenly distributed is formed.
- the coating liquid contains the filler particles 8, the solvent evaporation rate in the drying step can be slowed down. This makes it possible to slow down the crystal growth rate of the perovskite compound crystals 7 and reduce defects at the crystal interface of the perovskite compound crystals 7. This makes it possible to suppress the intrusion of water molecules into the perovskite compound crystals 7, thereby improving the durability of the photoelectric conversion element 20.
- the specific gravity of the filler particles 8 (e.g., 2.5 to 3.5 g/cm 3 ) is preferably lower than the specific gravity of the perovskite compound (e.g., 4.16 g/cm 3 ). This makes it possible to form the reflective region 6 in which the filler particles 8 are unevenly distributed on the surface of the photoelectric conversion layer 5.
- the coating liquid surface at the bottom of the laminate is subjected to negative pressure, causing the solvent in the coating liquid to evaporate, and the coating liquid surface is cooled by the heat of evaporation, which diffuses the latent heat generated during crystallization of the perovskite compound crystals from the coating liquid side, thereby making the local temperature gradient uniform and realizing uniform crystallization.
- the coating film is not directly heated, the occurrence of a large temperature distribution in the coating film can be suppressed.
- the electron blocking layer 9 is a layer that captures holes generated in the photoelectric conversion layer 5, transports them to the back electrode 10 which is an anode, and blocks electrons generated in the perovskite compound crystal 7.
- the material constituting the electron blocking layer 9 is a material having an energy level (Eebc) of the conduction electron band that satisfies Eebc ⁇ Eopc+0.5 eV compared to the energy level (Eopc) of the conduction electron band of the perovskite compound crystal 7.
- Specific examples of the material for the electron blocking layer 9 include inorganic compounds such as Cu2O , NiO, and ZnS.
- the electron blocking layer 9 blocks electrons and allows holes to propagate to the rear electrode 10 (Ni).
- the electron blocking layer 9 is preferably disposed adjacent to the reflective region 6.
- the thickness of the electron blocking layer 9 is preferably 50 nm or more and 100 nm or less, and more preferably 70 nm or more and 80 nm or less. This makes it possible to block the propagation of electrons toward the rear electrode side, and to efficiently propagate holes to the rear electrode 10. As a result, high efficiency of the photoelectric conversion element 20 can be achieved.
- the back electrode 10 corresponds to the anode of the photoelectric conversion element 20.
- materials constituting the back electrode 10 include metals, transparent conductive inorganic materials, conductive fine particles, and conductive polymers (particularly, transparent conductive polymers).
- metals include nickel, gold, silver, and platinum.
- transparent conductive inorganic materials include copper iodide (CuI), indium tin oxide (ITO), tin oxide (SnO 2 ), fluorine-doped tin oxide (FTO), aluminum-doped zinc oxide (AZO), indium zinc oxide (IZO), and gallium-doped zinc oxide (GZO).
- Examples of conductive fine particles include silver nanowires and carbon nanofibers.
- transparent conductive polymers include polymers containing poly(3,4-ethylenedioxythiophene) and polystyrene sulfonic acid (PEDOT/PSS).
- a photoelectric conversion element 20 (20a to 20e) of this embodiment includes a transparent substrate 2, a transparent conductive film 3 (3a to 3e) provided on the transparent substrate 2, a hole blocking layer 4 (4a to 4e) provided on the transparent conductive film 3, a photoelectric conversion layer 5 (5a to 5e) provided on the hole blocking layer 4, an electron blocking layer 9 (9a to 9e) provided on the photoelectric conversion layer 5, a back electrode 10 (10a to 10e) provided on the electron blocking layer 9, and a second barrier layer 22 provided to cover a side portion of the photoelectric conversion layer 5, the second barrier layer 22 being a dense inorganic material layer.
- the solar cell module 50 of this embodiment includes a plurality of photoelectric conversion elements 20 (20a to 20e), a first terminal 37, and a second terminal 38.
- the plurality of photoelectric conversion elements 20 are connected in series, with the photoelectric conversion element 20a at one end of the plurality of photoelectric conversion elements 20 connected in series being connected to the first terminal 37, and the photoelectric conversion element 20e at the other end being connected to the second terminal 38.
- the transparent substrate 2 is a substrate of the solar cell module 50.
- the transparent substrate 2 may be a glass substrate or a transparent organic film. This allows light to enter the inside of the photoelectric conversion element 20.
- the solar cell module 50 becomes a flexible solar cell module.
- Specific examples of materials for the organic film that will become the transparent substrate 2 include polyethylene terephthalate (PET), polybutylene terephthalate (PBT), polyphenylene sulfide (PPS), polyetherimide (PEI), polytetrafluoroethylene (PTFE), polyamideimide (PAI), polyethylene naphthalate (PEN), etc., but other resins can also be used as long as they satisfy the requirements.
- the thickness of the organic film that will become the transparent substrate 2 is preferably 50 to 100 ⁇ m.
- the first barrier layer 21 may be provided on one of the main surfaces of the transparent substrate 2.
- the first barrier layer 21 is a layer of a material with high gas barrier properties. This can prevent deterioration inside the photoelectric conversion element 20 (20a to 20e) due to moisture and oxygen in the air.
- the first barrier layer 21 is also a layer of an insulating material. This can suppress leakage current from flowing.
- the film thickness of the first barrier layer 21 can be several tens to 100 nm. This allows the first barrier layer 21 to have light transmissibility.
- the photoelectric conversion element 20 can have flexibility. Specific examples of materials for the first barrier layer 21 include silicon oxide and aluminum oxide.
- first barrier layer 21 has gas barrier properties, insulating properties, and light transmissivity, other oxide substances and insulators can also be used as the material for the first barrier layer 21.
- Main methods for forming the first barrier layer 21 include sputtering film formation and vacuum deposition.
- the transparent conductive film 3 (3a to 3e) is provided on the transparent substrate 2 (or on the first barrier layer 21) and is an electrode for extracting a current generated by the photovoltaic power of the photoelectric conversion element 20 (20a to 20e).
- the transparent conductive film 3 is made of a conductive transparent material such as aluminum-doped zinc oxide (AZO), indium zinc oxide (IZO), gallium-doped zinc oxide (GZO), fluorine-doped tin oxide (FTO), indium tin oxide (ITO), or the like.
- the transparent conductive film 3 preferably has a sheet resistance of 10 ⁇ /sq or less, and a light transmittance of 30% or more. Examples of a method for forming the transparent conductive film 3 include a sputtering method and a vacuum deposition method.
- the transparent conductive film 3 formed on the transparent substrate 2 is divided for each photoelectric conversion element 20.
- the solar cell module 50 shown in FIG. 7 includes five photoelectric conversion elements 20a to 20e, so the transparent conductive film 3 is divided to form five transparent conductive films 3a to 3e.
- the grooves that divide two adjacent transparent conductive films 3 may be filled with a photoelectric conversion layer 5 or the like.
- the first terminal 37 of the solar cell module 50 is formed on the organic film that is the transparent substrate 2, and a part of the first terminal 37 penetrates the organic film (transparent substrate 2) and the first barrier layer 21, and is in contact with or electrically connected to the transparent conductive film 3a of the end photoelectric conversion element 20a of the serially connected photoelectric conversion elements 20a to 20e.
- This first terminal 37 can be used to extract the current generated by the photovoltaic power of the solar cell module 50.
- An example of the material for the first terminal 37 is a SnZn-based solder paste. Other conductive pastes and electrode materials can also be used as long as they meet the requirements.
- the hole blocking layer 4 is a layer that transports electrons generated by photoexcitation in the photoelectric conversion layer 5 to the transparent conductive film 3. Therefore, the hole blocking layer 4 is made of a material that allows electrons generated in the photoelectric conversion layer 5 to easily move to the hole blocking layer 4 and allows electrons in the hole blocking layer 4 to easily move to the transparent conductive film 3.
- the hole blocking layer 4 may also be a seed layer for oriented growth of the perovskite compound crystals 7 inside the photoelectric conversion layer 5. This can improve the quality of the perovskite compound crystals 7 contained in the photoelectric conversion layer 5.
- the hole blocking layer 4 is, for example, a titanium oxide (TiO 2 ) layer. A TiN layer or a TiO 2-x N x layer may be formed on the surface of the titanium oxide contained in the titanium oxide layer.
- a TiN (NaCl structure) layer having a thickness of 5 to 30 nm may be formed on the surface of the TiO 2 of the porous titanium oxide layer on the transparent conductive film 3 as a seed layer to be the hole blocking layer 4 by subjecting the surface of the TiO 2 to a surface modification treatment using nitrogen plasma.
- the lattice constants of TiO2 (rutile structure) and TiN (NaCl structure) are relatively well matched, and a good interface with few defects is formed between the TiO2 layer made of TiO2 and the TiN layer made of TiN.
- the mixed crystal material TiO2 -xNx is formed near the interface, which changes the lattice constant continuously and suppresses the occurrence of interface defects.
- a cut (L1) is made in the transparent conductive film by laser scribing.
- the wavelength of the laser used is preferably in the infrared region.
- the cut (L1) is made in the transparent conductive film, and the transparent conductive films 3a to 3e are formed. No cut is made in the first barrier layer 21.
- the photoelectric conversion layer 5 can be formed by forming the perovskite compound crystal 7 on the transparent substrate 2 having a notch (L1) made thereon by laser scribing.
- Perovskite compounds have a basic tetragonal unit cell, which has an organic group (organic molecule) A at each vertex, a metal atom B at the body center, and a halogen atom X at each face center, and is represented by the general formula A-B- X3 .
- organic solvents (contained in the coating solution) used in the coating method for forming the photoelectric conversion layer 5 include aromatic hydrocarbons such as toluene, xylene, mesitylene, tetralin, diphenylmethane, dimethoxybenzene, and dichlorobenzene; halogenated hydrocarbons such as dichloromethane, dichloroethane, and tetrachloropropane; ethers such as tetrahydrofuran (THF), dioxane, dibenzyl ether, dimethoxymethyl ether, and 1,2-dimethoxyethane; ketones such as methyl ethyl ketone, cyclohexanone, acetophenone, and isophorone; esters such as methyl benzoate, ethyl acetate, and butyl acetate; sulfur-containing solvents such as diphenyl sulfide; fluorine-based solvents such as hexa
- the coating liquid may contain additives such as an antioxidant, a viscoelasticity modifier, a preservative, and a curing catalyst.
- the coating method is not particularly limited, but for example, a dip coating method, a spray coating method, a slide hopper coating method, etc. are preferable.
- a cut (L2) is made in part of the photoelectric conversion layer 5 by laser scribing in order to connect the transparent conductive film 3 of one of two adjacent photoelectric conversion elements 20 (20a to 20e) to the electron block layer 9 and back electrode 10 of the other photoelectric conversion element 20.
- the wavelength of the laser used is preferably in the visible light region.
- the cut (L2) is made in the photoelectric conversion layer 5, and the photoelectric conversion layers 5a to 5e are formed. With this laser scribing, the photoelectric conversion layer 5 is removed, but the transparent conductive film 3 and the first barrier layer 21 are not removed.
- the back electrode 10 (10a to 10e) is provided on the photoelectric conversion layer 5 and is an electrode for extracting a current generated by the photovoltaic power of the photoelectric conversion layer 5 of the photoelectric conversion element 20 (20a to 20e).
- the back electrode 10 is, for example, a metal film with a work function of 5 eV or more. By making the back electrode 10 out of a metal with a deep work function (5 eV or more), a bending of the band structure occurs at the interface between the photoelectric conversion layer 5 and the back electrode 10, which makes the flow of holes smooth. Examples of materials for the back electrode 10 include metals such as Ni, Pt, and Pd.
- the film thickness of the back electrode 10 is preferably 50 nm to 150 nm.
- the photoelectric conversion layer 5 or the back electrode 10 can be formed by a sputtering deposition method, a vacuum deposition method, or the like.
- a cut (L3) is made in a part of the electron blocking layer 9 and the back electrode 10 by laser scribing in order to form a series connection circuit of adjacent photoelectric conversion elements 20a to 20e on the transparent substrate 2.
- a cut (L4) is made in the hole blocking layer 4, the photoelectric conversion layer 5, the electron blocking layer 9, and the back electrode 10.
- the wavelength of the laser used is preferably in the ultraviolet region.
- the cut (L3) is made in the electron blocking layer 9 and the back electrode 10 to form the electron blocking layers 9a to 9e and the back electrodes 10a to 10e.
- a cut (L4) for forming the varistor 31 can be made. Note that if the part with the cut (L3) functions as the varistor 31, the cut (L4) can be omitted.
- the second barrier layer 22 is a dense inorganic material layer and is provided so as to cover the side of the photoelectric conversion layer 5 (5a to 5e).
- the second barrier layer 22 can be provided so as to cover the entire periphery of the photoelectric conversion layer 5.
- the second barrier layer 22 can be provided so as to cover the upper surface of the back electrode 10.
- This second barrier layer 22 can prevent moisture (such as water vapor) from entering the photoelectric conversion layer 5, and can prevent the photoelectric conversion element 20 from deteriorating.
- the second barrier layer 22 is a dense inorganic material layer, it is possible to prevent the barrier function of the second barrier layer 22 from being reduced by ultraviolet rays, temperature changes, etc.
- the transparent conductive film 3, the transparent substrate 2, etc. the barrier properties against water vapor can be improved.
- the second barrier layer 22 may be made of a material that exhibits varistor characteristics.
- the second barrier layer 22 can be provided so as to be connected to the transparent conductive film 3 and the back electrode 10 so that the second barrier layer 22 and the photoelectric conversion layer 5 are connected in parallel.
- the varistor characteristics are voltage-current characteristics (current nonlinearity) in which a current suddenly starts to flow at a certain constant voltage.
- the thickness of the second barrier layer 22 can be, for example, not less than 30 nm and not more than 100 nm.
- the second barrier layer 22 is formed on the back electrode 10 after laser scribing.
- the second barrier layer 22 can be formed so as to fill the notch (L3). This allows the periphery and upper surface of the photoelectric conversion layer 5 to be covered with the second barrier layer 22.
- the second barrier layer 22 can be formed so as to fill the notch (L4). This allows the second barrier layer 22 to be connected to the transparent conductive film 3 and the back electrode 10 such that the second barrier layer 22 and the photoelectric conversion layer 5 are connected in parallel.
- the second barrier layer 22 may contain, for example, zinc oxide (ZnO) as a main material, and may contain, as additive materials, silicon oxide, aluminum oxide, titanium oxide, etc.
- the rear substrate 24 is a substrate disposed on the upper part of the second barrier layer 22, and the photoelectric conversion layer 5 is located between the transparent substrate 2 and the rear substrate 24.
- the rear substrate 24 may be a substrate of the solar cell module 50.
- the rear substrate 24 may be a glass substrate, a transparent organic film, or an opaque organic film.
- a third barrier layer 23 may be provided on one of the main surfaces of the rear substrate 24.
- the third barrier layer 23 is a layer of a material with high gas barrier properties. This can prevent deterioration inside the photoelectric conversion element 20 (20a to 20e) due to moisture or oxygen in the air.
- the third barrier layer 23 is also a layer of an insulating material. This can suppress the flow of leakage current.
- the film thickness of the third barrier layer 23 can be several tens to 100 nm. Specific examples of materials for the third barrier layer 23 include silicon oxide and aluminum oxide.
- the second terminal 38 of the solar cell module 50 is formed on the organic film that is the rear substrate 24, and a part of the second terminal 38 penetrates the organic film (rear substrate 24) and the third barrier layer 23, and is in contact with the rear electrode 10e of the end photoelectric conversion element 20e of the photoelectric conversion elements 20a to 20e connected in series or is connected via the second barrier layer 22.
- the first terminal 37 and the second terminal 38 can be used to extract the current generated by the photovoltaic power of the solar cell module 50.
- the second terminal 38 can be made of a SnZn-based solder paste. Other conductive pastes and electrode materials can also be used as long as they meet the requirements.
- an organic film (back substrate 24) on which the second terminal 38 is formed is attached to the second barrier layer 22 via a laminate sheet 35, and then heat-laminated to complete a solar cell module 50 in which a plurality of photoelectric conversion elements 20a to 20e are connected in series.
- a hole is drilled at the location of the second terminal 38 of the laminate sheet 35 sandwiched between the second barrier layer 22 and the back substrate 24. Therefore, the second terminal 38 and the second barrier layer 22 are well connected during lamination. As a result, a varistor is formed between the back electrode 10e and the second terminal 38.
- the laminate sheet 35 may be a general laminate material, and is preferably a resin film that has a high waterproof property and can be laminated at a temperature of 130° C. or less.
- FIG. 8 is a diagram in which a schematic cross-sectional view of one photoelectric conversion element 20 included in a solar cell module 50 and an equivalent circuit of the photoelectric conversion element 20 are superimposed, and FIG. 9 is an equivalent circuit of the solar cell module 50.
- the hole blocking layer 4, the photoelectric conversion layer 5 and the electron blocking layer 9 can be represented by a current source 32 and a diode 33.
- the second barrier layer 22 in the notch of L4 is represented by a varistor 31, which is connected to the transparent conductive film 3 and the back electrode 10 so as to be connected in parallel with the photoelectric conversion layer 5.
- Photoelectric conversion devices 1 to 34 as shown in FIG. 1 were manufactured. Methylamine iodide (1.14 M), lead iodide (1.2 M), 5-aminovaleric acid hydroiodide (0.06 M), silica particles (filler particles), and ⁇ -butyrolactone (solvent) were mixed and stirred to prepare a perovskite compound precursor solution containing filler particles.
- perovskite compound precursor solutions 1 to 7 were prepared using silica particles having an average particle size of 10 nm, 20 nm, 30 nm, 40 nm, 50 nm, 60 nm, or 70 nm, and the dispersibility of the silica particles in the perovskite compound precursor solutions was evaluated.
- the evaluation results are shown in Table 1. From these results, it was found that by preparing a perovskite compound precursor solution using silica particles having an average particle size of 50 nm or less, the silica particles can be uniformly dispersed in the precursor solution. Furthermore, in the production of photoelectric conversion elements 1 to 34, silica particles having an average particle size of 10 nm were used.
- a glass substrate having a fluorine-doped tin oxide film was used for the transparent substrate 2 and the transparent conductive film 3.
- a titanium oxide dense layer (hole blocking layer 4) was formed on the fluorine-doped tin oxide film using a spray pyrolysis method.
- a titanium oxide paste was applied onto the titanium oxide dense layer and dried to form a titanium oxide porous layer (hole blocking layer 4).
- the prepared perovskite compound precursor solution was applied onto the titanium oxide porous layer using a coating device such as that shown in Figure 6, and the coating film was dried to form the photoelectric conversion layer 5.
- the coating film dries, the filler particles become unevenly distributed as shown in Figure 1, forming the reflective region 6.
- the thickness of the electron blocking layer 9 was 30 nm, 50 nm, 70 nm, 80 nm, 90 nm, or 110 nm.
- the thickness of the electron blocking layer 9 was 70 nm.
- a Ni vapor deposition film (rear electrode 10) was formed on the electron blocking layer 9 by vacuum deposition. In this manner, a plurality of photoelectric conversion elements were fabricated.
- Table 3 shows an evaluation of the short-circuit current Jsc of photoelectric conversion elements 8 to 14 with different thicknesses of the reflective region.
- the thickness of the reflective region was changed by adjusting the amount of silica particles mixed in the preparation of the perovskite compound precursor solution.
- the thickness of the photoelectric conversion layer was also set to 800 nm. From the results shown in Table 3, it was found that the short-circuit current of the photoelectric conversion element can be increased by setting the thickness of the reflective region to 40 nm or more and 150 nm or less.
- Table 4 shows the evaluation of the short-circuit current Jsc of photoelectric conversion elements 15 to 20 in which the ratio (uneven distribution ratio) of filler particles unevenly distributed in the reflective region among all the filler particles contained in the photoelectric conversion layer was changed.
- the uneven distribution ratio was changed by controlling the particle size and drying (crystallization) speed of the filler particles.
- the thickness of the photoelectric conversion layer was set to 800 nm. From the results shown in Table 4, it was found that the short-circuit current of the photoelectric conversion element can be increased by setting the ratio of the filler particles unevenly distributed in the reflective region to 50 wt % or more.
- Table 5 shows an evaluation of the short-circuit current Jsc of photoelectric conversion elements 21 to 26 with different thicknesses of the electron blocking layer. The results shown in Table 5 show that the short-circuit current of the photoelectric conversion element can be increased by setting the thickness of the electron blocking layer to 50 nm or more and 100 nm or less.
- Table 6 shows the evaluation of the open circuit voltage Voc of photoelectric conversion elements 27 to 34 in which the thickness of the photoelectric conversion layer was changed.
- the thickness of the photoelectric conversion layer was adjusted by changing the coating amount of the perovskite compound precursor solution.
- photoelectric conversion elements in which the open circuit voltage was 1.3 V or more were evaluated with " ⁇ ”
- photoelectric conversion elements in which the open circuit voltage was less than 1.3 V and 1.2 V or more were evaluated with " ⁇ ”
- photoelectric conversion elements in which the open circuit voltage was less than 1.2 V and 1.1 V or more were evaluated with " ⁇ ”. From the results shown in Table 6, it was found that the open circuit voltage of the photoelectric conversion element can be increased by setting the thickness of the photoelectric conversion layer to be 500 nm or more and 1 ⁇ m or less.
- the photoelectric conversion element and solar cell module according to the embodiments of the present disclosure can be used in solar power generation systems such as mega solar systems, solar cells, and power sources for small portable devices.
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Abstract
Description
本開示は、光電変換素子、太陽電池モジュール及び光電変換素子の製造方法に関する。 This disclosure relates to a photoelectric conversion element, a solar cell module, and a method for manufacturing a photoelectric conversion element.
光電変換素子は、例えば、光センサー、複写機、太陽電池モジュール等に用いられている。この中で、太陽電池モジュールは、再生可能エネルギーの代表的な利用方法として本格的に普及しつつある。太陽電池モジュールとしては、無機系光電変換素子を用いた太陽電池モジュール(例えば、シリコン系太陽電池モジュール、CIGS系太陽電池モジュール、及びCdTe系太陽電池モジュール等)が普及している。 Photoelectric conversion elements are used, for example, in optical sensors, copiers, solar cell modules, etc. Among these, solar cell modules are becoming increasingly popular as a representative method of using renewable energy. The most widely used solar cell modules are those that use inorganic photoelectric conversion elements (for example, silicon-based solar cell modules, CIGS-based solar cell modules, and CdTe-based solar cell modules, etc.).
一方、太陽電池モジュールとしては、有機系光電変換素子を用いた太陽電池モジュール(例えば、有機薄膜太陽電池モジュール及び色素増感太陽電池モジュール)も検討されている。このような有機系光電変換素子を用いた太陽電池モジュールは、真空プロセスを使用せずに塗布処理で製造できるため、製造コストを大幅に低減できる可能性がある。そのため、有機系光電変換素子を用いた太陽電池モジュールは、次世代の太陽電池モジュールとして期待されている。 Meanwhile, solar cell modules using organic photoelectric conversion elements (for example, organic thin-film solar cell modules and dye-sensitized solar cell modules) are also being considered. Such solar cell modules using organic photoelectric conversion elements can be manufactured using a coating process without using a vacuum process, which has the potential to significantly reduce manufacturing costs. For this reason, solar cell modules using organic photoelectric conversion elements are expected to be the next generation of solar cell modules.
近年では、有機系光電変換素子として、ペロブスカイト型結晶構造を有する化合物(以下、ペロブスカイト化合物と記載することがある)を光吸収層に用いた光電変換素子が検討されている(例えば、特許文献1参照)。ペロブスカイト化合物としては、例えば鉛錯体が挙げられる。ペロブスカイト化合物を光吸収層に用いた光電変換素子は、光電変換効率に優れる。 In recent years, organic photoelectric conversion elements that use compounds having a perovskite crystal structure (hereinafter sometimes referred to as perovskite compounds) in the light absorption layer have been studied (see, for example, Patent Document 1). Examples of perovskite compounds include lead complexes. Photoelectric conversion elements that use perovskite compounds in the light absorption layer have excellent photoelectric conversion efficiency.
ペロブスカイト化合物を光吸収層に用いた光電変換素子の光電変換効率及び耐久性をさらに高くすることが望まれている。
本開示は、このような事情に鑑みてなされたものであり、優れた光電変換効率及び優れた耐久性を有する光電変換素子を提供する。
It is desirable to further improve the photoelectric conversion efficiency and durability of a photoelectric conversion element using a perovskite compound in a light absorption layer.
The present disclosure has been made in view of the above circumstances, and provides a photoelectric conversion element having excellent photoelectric conversion efficiency and excellent durability.
本開示は、透明基板と、前記透明基板上に設けられた透明導電膜と、前記透明導電膜上に設けられたホールブロック層と、前記ホールブロック層上に設けられた光電変換層と、前記光電変換層上に設けられた電子ブロック層と、前記電子ブロック層上に設けられた裏面電極とを備え、前記光電変換層は、ペロブスカイト化合物結晶と、フィラー粒子とを含み、前記光電変換層は、前記フィラー粒子が偏在している反射領域を含み、前記反射領域は、前記電子ブロック層に隣接して配置されていることを特徴とする光電変換素子を提供する。 The present disclosure provides a photoelectric conversion element comprising a transparent substrate, a transparent conductive film provided on the transparent substrate, a hole blocking layer provided on the transparent conductive film, a photoelectric conversion layer provided on the hole blocking layer, an electron blocking layer provided on the photoelectric conversion layer, and a back electrode provided on the electron blocking layer, the photoelectric conversion layer including perovskite compound crystals and filler particles, the photoelectric conversion layer including a reflective region in which the filler particles are unevenly distributed, and the reflective region disposed adjacent to the electron blocking layer.
前記光電変換層は前記フィラー粒子が偏在している前記反射領域を含み、この反射領域が電子ブロック層に隣接して配置されているため、光電変換層は、ペロブスカイト化合物結晶を主成分とする層と、フィラー粒子を多数含み粒子間にペロブスカイト化合物結晶が存在する層の2つの層を有することができる。このため、ペロブスカイト化合物結晶を主成分とする層を通過し反射領域に到達した光が反射領域により拡散反射されるため、ペロブスカイト化合物結晶を主成分とする層が反射光又は散乱光を吸収することができる。また、反射領域において粒子間にペロブスカイト化合物結晶が存在するため、このペロブスカイト化合物結晶でも反射光又は散乱光を吸収することができる。このため、ペロブスカイト化合物結晶における光励起により生じる電子及びホールの数を多くすることができ、光電変換素子の光電変換効率を高くすることができる。また、光電変換層の膜厚を薄くでき、開放電圧やFF特性(再結合低減)を改善することができる。
前記光電変換層がフィラー粒子を含むため、光電変換層の形成時における溶媒蒸発速度を緩やかにすることができる。このため、ペロブスカイト化合物結晶の結晶成長速度を遅くすることができ、ペロブスカイト化合物結晶の結晶界面の欠陥を少なくすることができる。このため、ペロブスカイト化合物結晶に水分子が侵入することを抑制することができ、光電変換素子の耐久性を向上させることができる。
The photoelectric conversion layer includes the reflection region in which the filler particles are unevenly distributed, and this reflection region is disposed adjacent to the electron blocking layer, so that the photoelectric conversion layer can have two layers: a layer mainly composed of perovskite compound crystals, and a layer containing a large number of filler particles and having perovskite compound crystals between the particles. Therefore, the light that passes through the layer mainly composed of perovskite compound crystals and reaches the reflection region is diffusely reflected by the reflection region, so that the layer mainly composed of perovskite compound crystals can absorb reflected light or scattered light. In addition, since the perovskite compound crystals are present between the particles in the reflection region, the perovskite compound crystals can also absorb reflected light or scattered light. Therefore, the number of electrons and holes generated by photoexcitation in the perovskite compound crystals can be increased, and the photoelectric conversion efficiency of the photoelectric conversion element can be increased. In addition, the film thickness of the photoelectric conversion layer can be reduced, and the open circuit voltage and FF characteristics (recombination reduction) can be improved.
Since the photoelectric conversion layer contains filler particles, the solvent evaporation rate during the formation of the photoelectric conversion layer can be slowed down. Therefore, the crystal growth rate of the perovskite compound crystal can be slowed down, and defects at the crystal interface of the perovskite compound crystal can be reduced. Therefore, the intrusion of water molecules into the perovskite compound crystal can be suppressed, and the durability of the photoelectric conversion element can be improved.
本開示の光電変換素子は、透明基板と、前記透明基板上に設けられた透明導電膜と、前記透明導電膜上に設けられたホールブロック層と、前記ホールブロック層上に設けられた光電変換層と、前記光電変換層上に設けられた電子ブロック層と、前記電子ブロック層上に設けられた裏面電極とを備え、前記光電変換層は、ペロブスカイト化合物結晶と、フィラー粒子とを含み、前記光電変換層は、前記フィラー粒子が偏在している反射領域を含み、前記反射領域は、前記電子ブロック層に隣接して配置されていることを特徴とする。 The photoelectric conversion element disclosed herein comprises a transparent substrate, a transparent conductive film provided on the transparent substrate, a hole blocking layer provided on the transparent conductive film, a photoelectric conversion layer provided on the hole blocking layer, an electron blocking layer provided on the photoelectric conversion layer, and a back electrode provided on the electron blocking layer, the photoelectric conversion layer including perovskite compound crystals and filler particles, the photoelectric conversion layer including a reflective region in which the filler particles are unevenly distributed, and the reflective region being disposed adjacent to the electron blocking layer.
前記フィラー粒子は、無機材料粒子を含むことが好ましい。
前記反射領域の厚さは、前記光電変換層の厚さの0.04倍以上0.3倍以下であることが好ましい。
前記反射領域の厚さは、40nm以上150nm以下であることが好ましい。
前記反射領域は、前記光電変換層に含まれるすべてのフィラー粒子のうち50wt%以上のフィラー粒子が偏在する領域であることが好ましい。
前記フィラー粒子の平均粒子径D50は、10nm以上50nm以下であることが好ましい。このようなフィラー粒子が反射領域において細密充填構造で配列することにより、ペロブスカイト化合物結晶中への水分子侵入に対する耐久性を改善することができる。また、細密充填されたフィラー粒子の配列構造にペロブスカイト化合物結晶が入り込むことで、裏面電極側に実効的な屈折率が低くなることで光電変換層に効率よく光反射することで裏面電極による光吸収ロスを低減し高効率太陽電池を実現することができる。また、反射領域により透明導電膜と裏面電極との間の局所的な電流リークを抑制することができる。
The filler particles preferably contain inorganic material particles.
The thickness of the reflective region is preferably 0.04 to 0.3 times the thickness of the photoelectric conversion layer.
The thickness of the reflective region is preferably 40 nm or more and 150 nm or less.
The reflective region is preferably a region in which 50 wt % or more of the filler particles contained in the photoelectric conversion layer are unevenly distributed.
The average particle diameter D50 of the filler particles is preferably 10 nm or more and 50 nm or less. By arranging such filler particles in a close-packed structure in the reflective region, it is possible to improve the durability against the intrusion of water molecules into the perovskite compound crystal. In addition, by the perovskite compound crystal entering the arrangement structure of the close-packed filler particles, the effective refractive index on the back electrode side is lowered, and light is efficiently reflected to the photoelectric conversion layer, thereby reducing the light absorption loss by the back electrode and realizing a highly efficient solar cell. In addition, the reflective region can suppress local current leakage between the transparent conductive film and the back electrode.
前記フィラー粒子は、シリカ粒子、アルミナ粒子、酸化チタン粒子、ジルコニア粒子、酸化ニッケル粒子、Cu2O粒子、CuO粒子及び酸化亜鉛粒子のうち少なくとも1つを含むことが好ましい。
好ましくは、前記フィラー粒子は、表面被覆層を有し、前記表面被覆層の材料は、前記ペロブスカイト化合物結晶で生じた電子をブロックし前記ペロブスカイト化合物結晶で生じたホールを前記電子ブロック層へ輸送するような電子ブロック材料である。このことにより、裏面電極側へ電子が伝搬することをブロックすることができ効率よくホールを裏面電極へ伝搬させることができる。この結果、光電変換素子の高効率を実現することができる。また、ペロブスカイト化合物結晶に光が照射された場合に、ペロブスカイト化合物結晶と電子ブロック材料との接触面積が広くなっていることから効率よく光励起キャリアを裏面電極に取り出すことができる。このことにより、光励起キャリア(伝導電子及びホール)を効率よく分離することができ、高効率、低コスト、高剛性を実現することができる。
前記電子ブロック材料は、Cu2O又はNiOであることが好ましい。
The filler particles preferably include at least one of silica particles, alumina particles, titanium oxide particles, zirconia particles, nickel oxide particles, Cu 2 O particles, CuO particles, and zinc oxide particles.
Preferably, the filler particles have a surface coating layer, and the material of the surface coating layer is an electron blocking material that blocks electrons generated in the perovskite compound crystal and transports holes generated in the perovskite compound crystal to the electron blocking layer. This makes it possible to block the propagation of electrons to the back electrode side, and efficiently propagate holes to the back electrode. As a result, high efficiency of the photoelectric conversion element can be achieved. In addition, when light is irradiated to the perovskite compound crystal, the contact area between the perovskite compound crystal and the electron blocking material is wide, so that photoexcited carriers can be efficiently extracted to the back electrode. This allows efficient separation of photoexcited carriers (conduction electrons and holes), and high efficiency, low cost, and high rigidity can be achieved.
The electron blocking material is preferably Cu2O or NiO.
好ましくは、前記電子ブロック層は、前記反射領域に隣接して配置され、前記電子ブロック層の厚さは、50nm以上100nm以下であることが好ましい。このことにより、裏面電極側へ電子が伝搬することをブロックすることができ効率よくホールを裏面電極へ伝搬させることができる。この結果、光電変換素子の高効率を実現することができる。
前記裏面電極の材料は、仕事関数が5.0eV以上の金属であることが好ましい。このことにより、裏面電極側へ電子が伝搬することをブロックすることができ効率よくホールを裏面電極へ伝搬させることができる。この結果、光電変換素子の高効率を実現することができる。
前記光電変換層の厚さは、500nm以上1μm以下であることが好ましい。反射領域を有する光電変換層により効率よく光吸収できるため、光電変換層の膜厚を薄くできこれにより開放電圧やFF特性(再結合低減)が改善することができる。
Preferably, the electron blocking layer is disposed adjacent to the reflective region, and the thickness of the electron blocking layer is preferably 50 nm or more and 100 nm or less. This makes it possible to block the propagation of electrons to the back electrode side, and to efficiently propagate holes to the back electrode. As a result, a high efficiency of the photoelectric conversion element can be achieved.
The material of the back electrode is preferably a metal having a work function of 5.0 eV or more. This makes it possible to block the propagation of electrons to the back electrode side and to efficiently propagate holes to the back electrode. As a result, a high efficiency of the photoelectric conversion element can be achieved.
The thickness of the photoelectric conversion layer is preferably 500 nm to 1 μm. Since the photoelectric conversion layer having a reflective region can efficiently absorb light, the thickness of the photoelectric conversion layer can be made thin, thereby improving the open circuit voltage and FF characteristics (recombination reduction).
本開示は、本開示の光電変換素子を複数含み、複数の光電変換素子は集積化されている太陽電池モジュールも提供する。前記光電変換素子を太陽電池として用い集積化した太陽電池モジュールにより、上記の光反射構造により効率よく光吸収できるため、光電変換層の膜厚を薄くできこれにより開放電圧やFF特性(再結合低減)を改善することができる。 The present disclosure also provides a solar cell module that includes a plurality of photoelectric conversion elements of the present disclosure, the plurality of photoelectric conversion elements being integrated together. The solar cell module that integrates the photoelectric conversion elements as solar cells can efficiently absorb light due to the light reflection structure described above, allowing the thickness of the photoelectric conversion layer to be thin, thereby improving the open circuit voltage and FF characteristics (recombination reduction).
本開示は、透明基板上に設けられたホールブロック層上にペロブスカイト化合物とフィラー粒子とを含む塗布液を塗工する塗工ステップと、前記塗工ステップにより形成された塗膜を乾燥させる乾燥ステップとを含み、前記乾燥ステップにおいて、前記塗工ステップにおける塗工面と反対側から前記透明基板を加熱することを特徴とする光電変換素子の製造方法も提供する。フィラー粒子を含有したペロブスカイト化合物溶液の塗布乾燥により、光電変換層にフィラー粒子が偏在した反射領域を形成できる、また、良好なペロブスカイト化合物結晶の界面を形成することができる。この結果、FF特性(再結合低減)を改善することができる。 The present disclosure also provides a method for manufacturing a photoelectric conversion element, comprising a coating step of coating a coating liquid containing a perovskite compound and filler particles on a hole blocking layer provided on a transparent substrate, and a drying step of drying the coating film formed by the coating step, characterized in that in the drying step, the transparent substrate is heated from the side opposite to the coated surface in the coating step. By coating and drying the perovskite compound solution containing filler particles, a reflective region in which the filler particles are unevenly distributed can be formed in the photoelectric conversion layer, and a good interface of the perovskite compound crystals can be formed. As a result, the FF characteristic (recombination reduction) can be improved.
以下、図面を用いて本開示の一実施形態を説明する。図面や以下の記述中で示す構成は、例示であって、本開示の範囲は、図面や以下の記述中で示すものに限定されない。 Below, one embodiment of the present disclosure will be described with reference to the drawings. The configurations shown in the drawings and the following description are merely examples, and the scope of the present disclosure is not limited to those shown in the drawings and the following description.
光電変換素子
図1は、本実施形態の光電変換素子の概略断面図である。
本実施形態の光電変換素子20は、透明基板2と、透明基板2上に設けられた透明導電膜3と、透明導電膜3上に設けられたホールブロック層4と、ホールブロック層4上に設けられた光電変換層5と、光電変換層5上に設けられた電子ブロック層9と、電子ブロック層9上に設けられた裏面電極10とを備え、光電変換層5は、ペロブスカイト化合物結晶7と、フィラー粒子8とを含み、光電変換層5は、フィラー粒子8が偏在している反射領域6を含み、反射領域6は、電子ブロック層9に隣接して配置されていることを特徴とする。
図2は、光電変換層5に含まれるペロブスカイト化合物結晶7における光励起により生じた伝導電子とホールの流れを説明するための光電変換素子20のバンド構造を示す図である。
Photoelectric conversion element FIG. 1 is a schematic cross-sectional view of a photoelectric conversion element according to the present embodiment.
The photoelectric conversion element 20 of this embodiment includes a transparent substrate 2, a transparent conductive film 3 provided on the transparent substrate 2, a hole blocking layer 4 provided on the transparent conductive film 3, a photoelectric conversion layer 5 provided on the hole blocking layer 4, an electron blocking layer 9 provided on the photoelectric conversion layer 5, and a back electrode 10 provided on the electron blocking layer 9. The photoelectric conversion layer 5 includes perovskite compound crystals 7 and filler particles 8. The photoelectric conversion layer 5 includes a reflective region 6 in which the filler particles 8 are unevenly distributed, and the reflective region 6 is disposed adjacent to the electron blocking layer 9.
FIG. 2 is a diagram showing the band structure of the photoelectric conversion element 20 for explaining the flow of conduction electrons and holes generated by photoexcitation in the perovskite compound crystals 7 contained in the photoelectric conversion layer 5.
[透明基板]
透明基板2は、光電変換素子20の基体であり、透明材料からなる。透明基板2は、光電変換素子20の受光面側に配置される。また、光電変換素子20の製造工程においてホールブロック層4、光電変換層5などが透明基板2上に積層される。
透明基板2の材料としては、透明ガラス(より具体的には、ソーダライムガラス、及び無アルカリガラス等)、及び耐熱性を有する透明樹脂などが挙げられる。
透明基板2の材料が透明樹脂である場合、光電変換素子20は、透明基板2上にバリア層を有してもよい。このことにより、水分などが光電変換層5に侵入することを抑制することができる。
[Transparent substrate]
The transparent substrate 2 is a base of the photoelectric conversion element 20 and is made of a transparent material. The transparent substrate 2 is disposed on the light receiving surface side of the photoelectric conversion element 20. In addition, a hole blocking layer 4, a photoelectric conversion layer 5, etc. are laminated on the transparent substrate 2 in the manufacturing process of the photoelectric conversion element 20.
Examples of materials for the transparent substrate 2 include transparent glass (more specifically, soda-lime glass, non-alkali glass, etc.) and heat-resistant transparent resins.
When the material of the transparent substrate 2 is a transparent resin, the photoelectric conversion element 20 may have a barrier layer on the transparent substrate 2. This can prevent moisture and the like from penetrating into the photoelectric conversion layer 5.
[透明導電膜]
透明導電膜3は、光電変換素子20の陰極に相当する。透明導電膜3を構成する材料としては、例えば、透明導電性材料(特に、透明導電性酸化物(TCO))及び非透明導電性材料が挙げられる。透明導電性材料としては、例えば、ヨウ化銅(CuI)、酸化インジウムスズ(ITO)、酸化スズ(SnO2)、フッ素ドープ酸化スズ(FTO)、アルミニウムドープ酸化亜鉛(AZO)、インジウム亜鉛酸化物(IZO)、及びガリウムドープ酸化亜鉛(GZO)等が挙げられる。図2では、透明導電膜3はTCOで示されており、ペロブスカイト化合物結晶7(Perovskite)における光励起により生成した伝導電子がホールブロック層4を介して透明導電膜3に移動し光電変換素子20の外部へ引き出される。
[Transparent conductive film]
The transparent conductive film 3 corresponds to the cathode of the photoelectric conversion element 20. Examples of materials constituting the transparent conductive film 3 include transparent conductive materials (particularly, transparent conductive oxides (TCO)) and non-transparent conductive materials. Examples of transparent conductive materials include copper iodide (CuI), indium tin oxide (ITO), tin oxide (SnO 2 ), fluorine-doped tin oxide (FTO), aluminum-doped zinc oxide (AZO), indium zinc oxide (IZO), and gallium-doped zinc oxide (GZO). In FIG. 2, the transparent conductive film 3 is shown as TCO, and conductive electrons generated by photoexcitation in the perovskite compound crystal 7 (Perovskite) move to the transparent conductive film 3 through the hole blocking layer 4 and are extracted to the outside of the photoelectric conversion element 20.
[ホールブロック層]
ホールブロック層4は、図2に示したように、光電変換層5のペロブスカイト化合物結晶7における光励起により発生した電子を透明導電膜3に輸送し、一方でペロブスカイト化合物結晶7における光励起により発生したホールをブロックする層である。このため、ホールブロック層4は、ペロブスカイト化合物結晶7で発生した電子を透明導電膜3に移動させ易い材料を含有することが好ましい。光電変換素子20においては、ホールブロック層4は、酸化チタンを含有することができる。具体的には、ホールブロック層4は、比較的空隙率の小さい緻密質酸化チタン層と、緻密質酸化チタン層よりも空隙率が高い多孔質層である多孔質酸化チタン層とを含むことができる。緻密質酸化チタン層は透明導電膜3上に設けることができ、多孔質酸化チタン層は緻密質酸化チタン層上に設けることができる。ホールブロック層4を構成する緻密質酸化チタン層、及び多孔質酸化チタン層について説明する。
[Hole block layer]
As shown in FIG. 2, the hole blocking layer 4 is a layer that transports electrons generated by photoexcitation in the perovskite compound crystals 7 of the photoelectric conversion layer 5 to the transparent conductive film 3, while blocking holes generated by photoexcitation in the perovskite compound crystals 7. For this reason, the hole blocking layer 4 preferably contains a material that easily moves electrons generated in the perovskite compound crystals 7 to the transparent conductive film 3. In the photoelectric conversion element 20, the hole blocking layer 4 can contain titanium oxide. Specifically, the hole blocking layer 4 can include a dense titanium oxide layer having a relatively small porosity and a porous titanium oxide layer that is a porous layer having a higher porosity than the dense titanium oxide layer. The dense titanium oxide layer can be provided on the transparent conductive film 3, and the porous titanium oxide layer can be provided on the dense titanium oxide layer. The dense titanium oxide layer and the porous titanium oxide layer that constitute the hole blocking layer 4 will be described.
(緻密質酸化チタン層)
緻密質酸化チタン層は、空隙率が低いため、光電変換素子20の製造時に、光電変換層5の形成に用いるペロブスカイト化合物含有塗布液が層内に浸透し難い。そのため、光電変換素子20が緻密質酸化チタン層を備えることで、ペロブスカイト化合物結晶7と透明導電膜3との接触が抑制される。また、光電変換素子20が緻密質酸化チタン層を備えることで、起電力低下の要因となる透明導電膜3及び裏面電極10の接触が抑制される。緻密質酸化チタン層の膜厚としては、5nm以上200nm以下が好ましく、10nm以上100nm以下がより好ましい。また質量換算での充填率としては90%以上が望ましい。
(Dense titanium oxide layer)
Since the dense titanium oxide layer has a low porosity, the perovskite compound-containing coating liquid used to form the photoelectric conversion layer 5 during the manufacture of the photoelectric conversion element 20 does not easily penetrate into the layer. Therefore, by providing the photoelectric conversion element 20 with a dense titanium oxide layer, contact between the perovskite compound crystals 7 and the transparent conductive film 3 is suppressed. Furthermore, by providing the photoelectric conversion element 20 with a dense titanium oxide layer, contact between the transparent conductive film 3 and the back electrode 10, which is a cause of a decrease in electromotive force, is suppressed. The film thickness of the dense titanium oxide layer is preferably 5 nm or more and 200 nm or less, and more preferably 10 nm or more and 100 nm or less. Furthermore, the filling rate in terms of mass is preferably 90% or more.
(多孔質酸化チタン層)
多孔質酸化チタン層は、空隙率が高いため、光電変換素子20の製造時に、光電変換層5の形成に用いるペロブスカイト化合物含有塗布液が層内の細孔に浸透し易い。そのため、光電変換素子20が多孔質酸化チタン層を備えることで、ペロブスカイト化合物結晶7とホールブロック層4との接触面積を増大できる。これにより、ペロブスカイト化合物結晶7における光励起により発生した電子を、効率よくホールブロック層4に移動させ且つ、ホールをブロックすることができる。
(Porous titanium oxide layer)
Since the porous titanium oxide layer has a high porosity, the perovskite compound-containing coating liquid used to form the photoelectric conversion layer 5 during the manufacture of the photoelectric conversion element 20 can easily penetrate into the pores in the layer. Therefore, by providing the photoelectric conversion element 20 with a porous titanium oxide layer, the contact area between the perovskite compound crystals 7 and the hole blocking layer 4 can be increased. This allows electrons generated by photoexcitation in the perovskite compound crystals 7 to be efficiently transferred to the hole blocking layer 4 and holes to be blocked.
[光電変換層]
光電変換層5は、光励起により電子とホールを生成する層であり、ペロブスカイト化合物結晶7とフィラー粒子8とを含む。光電変換層5の厚さは、500nm以上1μm以下であることが好ましく、700nm以上800nm以下であることがより好ましい。
光電変換層5は、ペロブスカイト化合物結晶7を主成分とする光吸収領域と、ペロブスカイト化合物結晶7及びフィラー粒子8を含み光電変換層5のフィラー粒子が偏在している反射領域6とが積層した構造を有することができる。光吸収領域は、ホールブロック層4と隣接するように設けることができる。光吸収領域は層状の領域であってもよい。また、光吸収領域は、ペロブスカイト化合物結晶7が95wt%以上を占める領域とすることができる。また、光吸収領域にフィラー粒子8が含まれていてもよい。
ペロブスカイト化合物結晶7の価電子帯の電子が伝導帯へ光励起されることにより、伝導帯に伝導電子が生成し、価電子帯にホールが生成する。この伝導電子及びホールが図2に示したように移動する。
[Photoelectric conversion layer]
The photoelectric conversion layer 5 is a layer that generates electrons and holes by photoexcitation, and includes perovskite compound crystals 7 and filler particles 8. The thickness of the photoelectric conversion layer 5 is preferably 500 nm or more and 1 μm or less, and more preferably 700 nm or more and 800 nm or less.
The photoelectric conversion layer 5 may have a structure in which a light absorbing region mainly composed of perovskite compound crystals 7 and a reflection region 6 containing perovskite compound crystals 7 and filler particles 8, in which the filler particles of the photoelectric conversion layer 5 are unevenly distributed, are laminated. The light absorbing region may be provided adjacent to the hole blocking layer 4. The light absorbing region may be a layered region. The light absorbing region may be a region in which the perovskite compound crystals 7 account for 95 wt % or more. The light absorbing region may also contain filler particles 8.
When electrons in the valence band of the perovskite compound crystal 7 are photoexcited to the conduction band, conduction electrons are generated in the conduction band and holes are generated in the valence band. These conduction electrons and holes move as shown in FIG.
光電変換層5に含まれるペロブスカイト化合物結晶7は、一般式:ABX3・・・(1)で表される化合物(ペロブスカイト化合物)の結晶であることが好ましい。一般式(1)中、Aは有機分子であり、Bは金属原子であり、Xはハロゲン原子である。一般式(1)中、3つのXは、互いに同一でも異なっていてもよい。
ペロブスカイト化合物は、有機無機ハイブリッド化合物である。有機無機ハイブリッド化合物とは、無機材料と有機材料とで構成される化合物である。有機無機ハイブリッド化合物であるペロブスカイト化合物を用いた光電変換素子は、有機無機ハイブリッド光電変換素子とも呼ばれる。
The perovskite compound crystal 7 contained in the photoelectric conversion layer 5 is preferably a crystal of a compound (perovskite compound) represented by the general formula: ABX3 (1). In the general formula (1), A is an organic molecule, B is a metal atom, and X is a halogen atom. In the general formula (1), the three Xs may be the same or different from each other.
Perovskite compounds are organic-inorganic hybrid compounds. Organic-inorganic hybrid compounds are compounds composed of inorganic materials and organic materials. Photoelectric conversion elements using perovskite compounds, which are organic-inorganic hybrid compounds, are also called organic-inorganic hybrid photoelectric conversion elements.
一般式(1)中、Aで表される有機分子としては、例えば、アルキルアミン、アルキルアンモニウム、及び含窒素複素環式化合物等が挙げられる。ペロブスカイト化合物(1)において、Aで表される有機分子は、1種の有機分子のみであってもよく、2種以上の有機分子であってもよい。
アルキルアミンとしては、例えば、メチルアミン、エチルアミン、プロピルアミン、ブチルアミン、ペンチルアミン、ヘキシルアミン、ジメチルアミン、ジエチルアミン、ジプロピルアミン、ジブチルアミン、ジペンチルアミン、ジヘキシルアミン、トリメチルアミン、トリエチルアミン、トリプロピルアミン、トリブチルアミン、トリペンチルアミン、トリヘキシルアミン、エチルメチルアミン、メチルプロピルアミン、ブチルメチルアミン、メチルペンチルアミン、ヘキシルメチルアミン、エチルプロピルアミン、及びエチルブチルアミン等が挙げられる。
In the general formula (1), examples of the organic molecule represented by A include alkylamines, alkylammoniums, and nitrogen-containing heterocyclic compounds. In the perovskite compound (1), the organic molecule represented by A may be only one type of organic molecule, or may be two or more types of organic molecules.
Examples of alkylamines include methylamine, ethylamine, propylamine, butylamine, pentylamine, hexylamine, dimethylamine, diethylamine, dipropylamine, dibutylamine, dipentylamine, dihexylamine, trimethylamine, triethylamine, tripropylamine, tributylamine, tripentylamine, trihexylamine, ethylmethylamine, methylpropylamine, butylmethylamine, methylpentylamine, hexylmethylamine, ethylpropylamine, and ethylbutylamine.
アルキルアンモニウムは、上述のアルキルアミンのイオン化物である。アルキルアンモニウムとしては、例えば、メチルアンモニウム(CH3NH3)、エチルアンモニウム、プロピルアンモニウム、ブチルアンモニウム、ペンチルアンモニウム、ヘキシルアンモニウム、ジメチルアンモニウム、ジエチルアンモニウム、ジプロピルアンモニウム、ジブチルアンモニウム、ジペンチルアンモニウム、ジヘキシルアンモニウム、トリメチルアンモニウム、トリエチルアンモニウム、トリプロピルアンモニウム、トリブチルアンモニウム、トリペンチルアンモニウム、トリヘキシルアンモニウム、エチルメチルアンモニウム、メチルプロピルアンモニウム、ブチルメチルアンモニウム、メチルペンチルアンモニウム、ヘキシルメチルアンモニウム、エチルプロピルアンモニウム、及びエチルブチルアンモニウム等が挙げられる。 The alkyl ammonium is an ionized product of the above-mentioned alkyl amine. Examples of the alkyl ammonium include methyl ammonium ( CH3NH3 ), ethyl ammonium, propyl ammonium, butyl ammonium, pentyl ammonium, hexyl ammonium, dimethyl ammonium, diethyl ammonium, dipropyl ammonium, dibutyl ammonium, dipentyl ammonium, dihexyl ammonium, trimethyl ammonium, triethyl ammonium, tripropyl ammonium, tributyl ammonium, tripentyl ammonium, trihexyl ammonium, ethyl methyl ammonium, methyl propyl ammonium, butyl methyl ammonium, methyl pentyl ammonium, hexyl methyl ammonium, ethyl propyl ammonium, and ethyl butyl ammonium.
含窒素複素環式化合物としては、例えば、イミダゾール、アゾール、ピロール、アジリジン、アジリン、アゼチジン、アゼト、アゾール、イミダゾリン、及びカルバゾール等が挙げられる。含窒素複素環式化合物は、イオン化物であってもよい。イオン化物である含窒素複素環式化合物としては、フェネチルアンモニウムが好ましい。 Examples of the nitrogen-containing heterocyclic compound include imidazole, azole, pyrrole, aziridine, azirine, azetidine, azeto, azole, imidazoline, and carbazole. The nitrogen-containing heterocyclic compound may be an ionized compound. Phenethylammonium is a preferred example of the nitrogen-containing heterocyclic compound that is an ionized compound.
Aで表される有機分子としては、メチルアミン、エチルアミン、プロピルアミン、ブチルアミン、ペンチルアミン、ヘキシルアミン、メチルアンモニウム、エチルアンモニウム、プロピルアンモニウム、ブチルアンモニウム、ペンチルアンモニウム、ヘキシルアンモニウム又はフェネチルアンモニウムが好ましく、メチルアミン、エチルアミン、プロピルアミン、メチルアンモニウム、エチルアンモニウム、又はプロピルアンモニウムがより好ましく、メチルアンモニウムが更に好ましい。 The organic molecule represented by A is preferably methylamine, ethylamine, propylamine, butylamine, pentylamine, hexylamine, methylammonium, ethylammonium, propylammonium, butylammonium, pentylammonium, hexylammonium or phenethylammonium, more preferably methylamine, ethylamine, propylamine, methylammonium, ethylammonium or propylammonium, and even more preferably methylammonium.
一般式(1)中、Bで表される金属原子としては、例えば、鉛、スズ、亜鉛、チタン、アンチモン、ビスマス、ニッケル、鉄、コバルト、銀、銅、ガリウム、ゲルマニウム、マグネシウム、カルシウム、インジウム、アルミニウム、マンガン、クロム、モリブデン、及びユーロピウム等が挙げられる。ペロブスカイト化合物において、Bで表される金属原子は、1種の金属原子のみであってもよく、2種以上の金属原子であってもよい。ペロブスカイト化合物結晶7の光吸収特性及び電荷発生特性を向上させる観点から、Bで表される金属原子としては、鉛原子が好ましい。 In general formula (1), examples of the metal atom represented by B include lead, tin, zinc, titanium, antimony, bismuth, nickel, iron, cobalt, silver, copper, gallium, germanium, magnesium, calcium, indium, aluminum, manganese, chromium, molybdenum, and europium. In the perovskite compound, the metal atom represented by B may be only one type of metal atom, or may be two or more types of metal atoms. From the viewpoint of improving the light absorption characteristics and charge generation characteristics of the perovskite compound crystal 7, the metal atom represented by B is preferably a lead atom.
一般式(1)中、Xで表されるハロゲン原子としては、例えば、フッ素原子、塩素原子、臭素原子、及びヨウ素原子等が挙げられる。ペロブスカイト化合物において、Xで表されるハロゲン原子は、1種のハロゲン原子であってもよく、2種以上のハロゲン原子であってもよい。Xで表されるハロゲン原子としては、ペロブスカイト化合物のエネルギーバンドギャップを狭くする観点から、ヨウ素原子が好ましい。詳しくは、3つのXのうち、少なくとも1つのXがヨウ素原子を表すことが好ましく、3つのXがヨウ素原子を表すことがより好ましい。 In general formula (1), examples of halogen atoms represented by X include fluorine atoms, chlorine atoms, bromine atoms, and iodine atoms. In the perovskite compound, the halogen atom represented by X may be one type of halogen atom, or may be two or more types of halogen atoms. From the viewpoint of narrowing the energy band gap of the perovskite compound, the halogen atom represented by X is preferably an iodine atom. In particular, of the three Xs, it is preferable that at least one X represents an iodine atom, and it is more preferable that three Xs represent iodine atoms.
ペロブスカイト化合物としては、一般式「CH3NH3PbX3(但し、Xはハロゲン原子を表す)」で表される化合物が好ましく、CH3NH3PbI3がより好ましい。ペロブスカイト化合物として一般式「CH3NH3PbX3」で表される化合物(特に、CH3NH3PbI3)を用いることで、ペロブスカイト化合物結晶7において伝導電子とホールとをより効率良く発生させることができ、その結果、光電変換素子20の光電変換効率をより向上できる。 As the perovskite compound, a compound represented by the general formula " CH3NH3PbX3 (wherein X represents a halogen atom)" is preferred, and CH3NH3PbI3 is more preferred. By using a compound represented by the general formula " CH3NH3PbX3 " ( particularly CH3NH3PbI3 ) as the perovskite compound, conduction electrons and holes can be generated more efficiently in the perovskite compound crystal 7 , and as a result, the photoelectric conversion efficiency of the photoelectric conversion element 20 can be further improved.
フィラー粒子8は、ペロブスカイト化合物結晶7に混入されている粒子である。フィラー粒子8は、例えば、無機材料粒子である。フィラー粒子8は、シリカ粒子、アルミナ粒子、酸化チタン粒子、ジルコニア粒子、酸化ニッケル粒子、Cu2O粒子、CuO粒子及び酸化亜鉛粒子のうち少なくとも1つを含むことが好ましく、シリカ粒子、酸化ニッケル粒子又はCu2O粒子であることがより好ましい。
フィラー粒子8は、図3に示したように、コア粒子12と、コア粒子12の表面を覆う表面被覆層11とを有してもよい。コア粒子12は、例えば、無機材料粒子であり、より具体的には、例えば、シリカ粒子、アルミナ粒子、酸化チタン粒子、ジルコニア粒子、酸化ニッケル粒子、Cu2O粒子、CuO粒子、酸化亜鉛粒子などである。表面被覆層11の材料は、ペロブスカイト化合物結晶7で生じた電子をブロックしペロブスカイト化合物結晶7で生じたホールを電子ブロック層9へ輸送するような電子ブロック材料である。表面被覆層11の材料は、例えば、Cu2O、NiOなどである。また、表面被覆層11の膜厚は、5nm以上20nm以下とすることができる。このようなフィラー粒子8を用いることにより、ペロブスカイト化合物結晶7で生じた伝導電子が裏面電極へ移動することをブロックすることができ、かつ、ペロブスカイト化合物結晶7で生じたホールを効率よく裏面電極へ伝搬させることができる。このため、光電変換素子20の高い光電変換効率を実現することができる。また、ペロブスカイト化合物結晶7とホールブロック材料との接触界面を広くすることができ、ペロブスカイト化合物結晶7で生じたホールを効率よく裏面電極へと伝搬させることができる。この結果、ペロブスカイト化合物結晶7で生じた伝導電子及びホールを効率よく分離することができ、光電変換素子20の光電変換効率を向上させることができる。
The filler particles 8 are particles mixed in the perovskite compound crystals 7. The filler particles 8 are, for example, inorganic material particles. The filler particles 8 preferably include at least one of silica particles, alumina particles, titanium oxide particles, zirconia particles, nickel oxide particles, Cu2O particles, CuO particles, and zinc oxide particles, and are more preferably silica particles, nickel oxide particles, or Cu2O particles.
As shown in FIG. 3, the filler particle 8 may have a core particle 12 and a surface coating layer 11 that covers the surface of the core particle 12. The core particle 12 is, for example, an inorganic material particle, more specifically, for example, silica particles, alumina particles, titanium oxide particles, zirconia particles, nickel oxide particles, Cu 2 O particles, CuO particles, zinc oxide particles, etc. The material of the surface coating layer 11 is an electron blocking material that blocks electrons generated in the perovskite compound crystal 7 and transports holes generated in the perovskite compound crystal 7 to the electron blocking layer 9. The material of the surface coating layer 11 is, for example, Cu 2 O, NiO, etc. In addition, the film thickness of the surface coating layer 11 can be 5 nm or more and 20 nm or less. By using such a filler particle 8, it is possible to block the conductive electrons generated in the perovskite compound crystal 7 from moving to the back electrode, and to efficiently propagate the holes generated in the perovskite compound crystal 7 to the back electrode. This makes it possible to realize high photoelectric conversion efficiency of the photoelectric conversion element 20. In addition, the contact interface between the perovskite compound crystal 7 and the hole blocking material can be widened, and holes generated in the perovskite compound crystal 7 can be efficiently propagated to the back electrode. As a result, the conduction electrons and holes generated in the perovskite compound crystal 7 can be efficiently separated, and the photoelectric conversion efficiency of the photoelectric conversion element 20 can be improved.
フィラー粒子8並びにコアシェル状のフィラー粒子8の作製方法としては、RF熱プラズマ法などが挙げられる。コアシェル構造については、懸濁重合法により作製した有機のポリスチレン、セルロース、ポリアクリル酸、等の有機フィラー粒子を作製し、作製した有機フィラーを分散した溶液のpHを調整し、無機ナノ微粒子を有機フィラー表面に被覆することで、コアシェル状のフィラー粒子8を作製することもできる。 The filler particles 8 and the core-shell type filler particles 8 can be produced by an RF thermal plasma method. For the core-shell structure, organic filler particles such as organic polystyrene, cellulose, polyacrylic acid, etc. can be produced by a suspension polymerization method, the pH of the solution in which the produced organic filler is dispersed can be adjusted, and the surface of the organic filler can be coated with inorganic nanoparticles to produce the core-shell type filler particles 8.
光電変換層5に含まれるフィラー粒子8の平均粒子径D50は、10nm以上50nm以下であることが好ましく、10nm以上30nm以下であることがより好ましい。このことにより、ペロブスカイト化合物の塗工乾燥時にフィラー粒子8を表面に偏在させることができ且つフィラー粒子8の細密充填構造を形成することができる。これによりペロブスカイト化合物結晶7中への水分子侵入にたいする耐久性を改善することができる。フィラー粒子8の平均粒子径D50は、例えば、光電変換層5の断面の写真から100個程度のフィラー粒子8の粒子径を計測し、この計測結果から算出することができる。 The average particle diameter D50 of the filler particles 8 contained in the photoelectric conversion layer 5 is preferably 10 nm or more and 50 nm or less, and more preferably 10 nm or more and 30 nm or less. This allows the filler particles 8 to be unevenly distributed on the surface when the perovskite compound is coated and dried, and allows the filler particles 8 to form a closely packed structure. This improves the durability of the perovskite compound crystals 7 against the intrusion of water molecules. The average particle diameter D50 of the filler particles 8 can be calculated from the measurement results, for example, by measuring the particle diameters of about 100 filler particles 8 from a photograph of the cross section of the photoelectric conversion layer 5.
反射領域6は、光電変換層5に含まれるフィラー粒子8が偏在している領域であり、電子ブロック層9に隣接して配置されている。
光電変換層5が反射領域6を有することにより、光吸収領域を通過し反射領域6に到達した光が反射領域6により拡散反射されるため、光吸収領域が反射光又は散乱光を吸収し伝導電子およびホールを生成することができる。また、反射領域6において粒子間にペロブスカイト化合物結晶7が存在するため、このペロブスカイト化合物結晶7でも反射光又は散乱光を吸収することができる。このため、ペロブスカイト化合物結晶7における光励起により生じる伝導電子及びホールの数を多くすることができ、光電変換素子20の光電変換効率を高くすることができる。また、光電変換層5の厚さを薄くすることが可能になり、開放電圧やFF特性(再結合低減)を改善することができる。
The reflective region 6 is a region where the filler particles 8 contained in the photoelectric conversion layer 5 are unevenly distributed, and is disposed adjacent to the electron blocking layer 9 .
Since the photoelectric conversion layer 5 has the reflection region 6, the light that passes through the light absorption region and reaches the reflection region 6 is diffusely reflected by the reflection region 6, so that the light absorption region can absorb the reflected light or scattered light and generate conductive electrons and holes. In addition, since the perovskite compound crystals 7 exist between the particles in the reflection region 6, the perovskite compound crystals 7 can also absorb the reflected light or scattered light. Therefore, the number of conductive electrons and holes generated by photoexcitation in the perovskite compound crystals 7 can be increased, and the photoelectric conversion efficiency of the photoelectric conversion element 20 can be increased. In addition, the thickness of the photoelectric conversion layer 5 can be reduced, and the open circuit voltage and FF characteristics (recombination reduction) can be improved.
反射領域6は、フィラー粒子8が20wt%以上を占める層であってもよい。また、反射領域6は、光電変換層5に含まれるすべてのフィラー粒子8のうち50wt%以上のフィラー粒子8が偏在する領域であることが好ましく、光電変換層5に含まれるすべてのフィラー粒子8のうち70wt%以上のフィラー粒子8が偏在する領域であることがより好ましく、光電変換層5に含まれるすべてのフィラー粒子8のうち90wt%以上のフィラー粒子8が偏在する領域であることがさらに好ましい。このことにより、光反射効果が顕著に得られる。また、反射領域6では、フィラー粒子8の粒子間にペロブスカイト化合物結晶7が存在する。
反射領域6は、フィラー粒子8が積み重なった領域であってもよい。例えば、反射領域6は、フィラー粒子8が細密充填構造で積み重なった領域を含むことができる。
細密充填されたフィラー粒子8の配列構造にペロブスカイト化合物結晶が入り込むことで、光電変換層5の裏面電極側の実効的な屈折率を低くすることができ、光吸収領域に効率よく光反射することで裏面電極10による光吸収ロスを低減し高効率太陽電池を実現することができる。
図4、図5はフィラー粒子が偏在分布した光電変換層5の模式図とフィラー粒子8が細密充填(面心立方配置)されている拡大図である。図4に示した光電変換層5に含まれるフィラー粒子8は無機材料粒子であり、図5に示した光電変換層5に含まれるフィラー粒子8はコア粒子12の表面を表面被覆層11が覆っている粒子である。
図5に示すように、反射領域6が表面被覆層11を有するフィラー粒子8が細密充填(面心立方配置)されて構成を有することにより、ペロブスカイト化合物結晶7で生じた電子が裏面電極10へ伝搬することをブロックすることができ、ペロブスカイト化合物結晶7で生じたホールを裏面電極10へ効率よく伝搬することができる。
The reflection region 6 may be a layer in which the filler particles 8 occupy 20 wt % or more. In addition, the reflection region 6 is preferably a region in which 50 wt % or more of the filler particles 8 of all the filler particles 8 contained in the photoelectric conversion layer 5 are unevenly distributed, more preferably a region in which 70 wt % or more of the filler particles 8 of all the filler particles 8 contained in the photoelectric conversion layer 5 are unevenly distributed, and even more preferably a region in which 90 wt % or more of the filler particles 8 of all the filler particles 8 contained in the photoelectric conversion layer 5 are unevenly distributed. This allows a remarkable light reflection effect to be obtained. In addition, in the reflection region 6, perovskite compound crystals 7 are present between the particles of the filler particles 8.
The reflective region 6 may be a region in which the filler particles 8 are stacked. For example, the reflective region 6 may include a region in which the filler particles 8 are stacked in a close-packed structure.
By incorporating the perovskite compound crystals into the array structure of the close-packed filler particles 8, the effective refractive index on the back electrode side of the photoelectric conversion layer 5 can be lowered, and by efficiently reflecting light to the light absorption region, the light absorption loss by the back electrode 10 can be reduced, thereby realizing a highly efficient solar cell.
4 and 5 are schematic diagrams of a photoelectric conversion layer 5 in which filler particles are unevenly distributed, and enlarged views of filler particles 8 in close packing (face-centered cubic arrangement). The filler particles 8 contained in the photoelectric conversion layer 5 shown in Fig. 4 are inorganic material particles, and the filler particles 8 contained in the photoelectric conversion layer 5 shown in Fig. 5 are particles in which the surface of a core particle 12 is covered with a surface coating layer 11.
As shown in FIG. 5 , the reflective region 6 has a configuration in which filler particles 8 having a surface coating layer 11 are closely packed (in a face-centered cubic arrangement), so that electrons generated in the perovskite compound crystals 7 can be blocked from propagating to the rear surface electrode 10, and holes generated in the perovskite compound crystals 7 can be efficiently propagated to the rear surface electrode 10.
反射領域6は、層状の領域であってもよい。また、反射領域6の厚さは、光電変換層5の厚さの0.04倍以上0.3倍以下であることが好ましく、光電変換層5の厚さの0.04倍以上0.15倍以下であることがより好ましい。また、反射領域6の厚さは、40nm以上150nm以下であってもよい。このことにより、光電変換素子20の内部抵抗が上昇することを抑制することができる。また、光吸収領域を通過し反射領域6に到達した光を反射領域6により効率よく拡散反射することができる。 The reflective region 6 may be a layered region. The thickness of the reflective region 6 is preferably 0.04 to 0.3 times the thickness of the photoelectric conversion layer 5, and more preferably 0.04 to 0.15 times the thickness of the photoelectric conversion layer 5. The thickness of the reflective region 6 may be 40 nm to 150 nm. This can prevent the internal resistance of the photoelectric conversion element 20 from increasing. Furthermore, the light that passes through the light absorption region and reaches the reflective region 6 can be efficiently diffused and reflected by the reflective region 6.
図6にフィラー粒子8を含有したペロブスカイト化合物溶液を塗布乾燥し光電変換層5を形成する製造方法の模式図を示す。
光電変換層5の製造方法は、透明基板2上に設けられたホールブロック層4上にペロブスカイト化合物とフィラー粒子とを含む塗布液を塗工する塗工ステップと、塗工ステップにより形成された塗膜を乾燥させる乾燥ステップとを含む。
具体的には、ペロブスカイト化合物の溶液(A)とフィラー粒子8の分散液(B)とを容器(C)で混合/撹拌/分散することにより、フィラー粒子8がペロブスカイト化合物溶液に分散した塗布液を調製することができる。フィラー粒子8が細密充填(面心立方配置)されている反射領域6の膜厚が光電変換層5の膜厚の1/3になるように、塗布液は、ペロブスカイト化合物の溶液に対して、3~10wt%のフィラー粒子8を含む分散液であることが好ましい。
FIG. 6 is a schematic diagram showing a manufacturing method for forming a photoelectric conversion layer 5 by applying and drying a perovskite compound solution containing filler particles 8.
The manufacturing method of the photoelectric conversion layer 5 includes a coating step of coating a coating liquid containing a perovskite compound and filler particles on the hole blocking layer 4 provided on the transparent substrate 2, and a drying step of drying the coating film formed by the coating step.
Specifically, a coating liquid in which the filler particles 8 are dispersed in the perovskite compound solution can be prepared by mixing/stirring/dispersing a solution (A) of the perovskite compound and a dispersion (B) of the filler particles 8 in a container (C). The coating liquid is preferably a dispersion containing 3 to 10 wt % of the filler particles 8 in the perovskite compound solution so that the film thickness of the reflective region 6 in which the filler particles 8 are closely packed (face-centered cubic arrangement) is ⅓ of the film thickness of the photoelectric conversion layer 5.
フィラー粒子8を分散前のペロブスカイト化合物溶液のペロブスカイト化合物結晶となる固形分と溶媒の重量比は、20/80となり固形分濃度は20%以下になることが望ましい。また、フィラー粒子8の塗布液に対しての重量比率は3~10wt%とすることができる。例えば、5wt%のSiO2フィラー粒子を分散したペロブスカイト化合物塗布液を塗布し形成した塗膜を乾燥させた場合、光電変換層5の膜厚は540nmで反射領域6の膜厚は90nmとなる。10wt%のSiO2フィラー粒子8を分散したペロブスカイト化合物塗布液を乾燥させた場合、光電変換層5の膜厚は580nmで、反射領域6の膜厚は180nmとなる。 The weight ratio of the solids that will become the perovskite compound crystals in the perovskite compound solution before the filler particles 8 are dispersed to the solvent is preferably 20/80, and the solids concentration is 20% or less. The weight ratio of the filler particles 8 to the coating liquid can be 3 to 10 wt%. For example, when a coating film formed by coating a perovskite compound coating liquid in which 5 wt% of SiO 2 filler particles are dispersed is dried, the thickness of the photoelectric conversion layer 5 is 540 nm and the thickness of the reflective region 6 is 90 nm. When a perovskite compound coating liquid in which 10 wt% of SiO 2 filler particles 8 are dispersed is dried, the thickness of the photoelectric conversion layer 5 is 580 nm and the thickness of the reflective region 6 is 180 nm.
塗布液をホールブロック層4上に塗工することにより塗膜を形成する。塗工方法は、特に限定されないが、スリットダイ塗工とすることができる。塗工環境は低湿度環境で維持されていることが望ましく、窒素ガスなどの不活性化ガスで封止されていてもよい。透明基板2が天側に位置し、ホールブロック層4が地面側に位置するように透明基板2、透明導電膜3、ホールブロック層4の積層体を配置し、積層体の地面側から塗布液をホールブロック層4上に塗工してもよい。このことにより、スリットダイからの液だれを防止することができる。また、塗布液がフィラー粒子8を含むことにより、塗膜における塗布液の移動を抑制することができ、均一な厚さを有する塗膜を形成することができ、ピンホールが生じることを抑制することができる。また、乾燥ステップにおいて、コーヒーリング効果が生じることを抑制することができる。また、乾燥ステップにおいて、塗工面と反対側から透明基板2を加熱した際に、塗膜において対流が生じることを抑制することができ、フィラー粒子8が偏在している反射領域6を形成することができる。 The coating liquid is applied onto the hole blocking layer 4 to form a coating film. The coating method is not particularly limited, but can be slit die coating. It is preferable that the coating environment is maintained in a low humidity environment, and the coating environment may be sealed with an inert gas such as nitrogen gas. The transparent substrate 2, the transparent conductive film 3, and the hole blocking layer 4 may be arranged such that the transparent substrate 2 is located on the top side and the hole blocking layer 4 is located on the ground side, and the coating liquid may be applied onto the hole blocking layer 4 from the ground side of the laminate. This can prevent dripping from the slit die. In addition, by including the filler particles 8 in the coating liquid, the movement of the coating liquid in the coating film can be suppressed, a coating film having a uniform thickness can be formed, and the occurrence of pinholes can be suppressed. In addition, the occurrence of the coffee ring effect can be suppressed in the drying step. In addition, in the drying step, when the transparent substrate 2 is heated from the opposite side to the coating surface, the occurrence of convection in the coating film can be suppressed, and a reflective region 6 in which the filler particles 8 are unevenly distributed can be formed.
乾燥ステップでは、塗膜に含まれる溶剤が蒸発していく。このことにより、塗膜におけるペロブスカイト化合物の濃度が高くなっていき、ホールブロック層4側からペロブスカイト化合物の結晶化が進む。この際、フィラー粒子8の多くは液相に残り、ホールブロック層4に隣接する光吸収領域(ペロブスカイト化合物結晶7を主成分とする領域)が形成される。光吸収領域が形成された後、フィラー粒子8を多く含む塗膜表面においてペロブスカイト化合物の結晶化が進み、フィラー粒子8が偏在している反射領域6が形成される。反射領域6に、光電変換層5に含まれるフィラー粒子8のうち50wt%以上のフィラー粒子8が偏在していることが好ましく、光電変換層5に含まれるフィラー粒子8のうち70wt%以上のフィラー粒子8が偏在していることがより好ましく、光電変換層5に含まれるフィラー粒子8のうち90wt%以上のフィラー粒子8が偏在していることがさらに好ましい。このことにより、光反射効果が顕著に得られる。
また、塗布液がフィラー粒子8を含むため、乾燥ステップにおける溶媒蒸発速度を緩やかにすることができる。このため、ペロブスカイト化合物結晶7の結晶成長速度を遅くすることができ、ペロブスカイト化合物結晶7の結晶界面の欠陥を少なくすることができる。このため、ペロブスカイト化合物結晶7に水分子が侵入することを抑制することができ、光電変換素子20の耐久性を向上させることができる。
In the drying step, the solvent contained in the coating film evaporates. As a result, the concentration of the perovskite compound in the coating film increases, and the crystallization of the perovskite compound advances from the hole blocking layer 4 side. At this time, most of the filler particles 8 remain in the liquid phase, and a light absorbing region (a region mainly composed of the perovskite compound crystals 7) adjacent to the hole blocking layer 4 is formed. After the light absorbing region is formed, the crystallization of the perovskite compound advances on the coating film surface containing many filler particles 8, and a reflection region 6 in which the filler particles 8 are unevenly distributed is formed. It is preferable that 50 wt% or more of the filler particles 8 contained in the photoelectric conversion layer 5 are unevenly distributed in the reflection region 6, more preferably 70 wt% or more of the filler particles 8 contained in the photoelectric conversion layer 5 are unevenly distributed, and even more preferably 90 wt% or more of the filler particles 8 contained in the photoelectric conversion layer 5 are unevenly distributed. This provides a remarkable light reflection effect.
In addition, since the coating liquid contains the filler particles 8, the solvent evaporation rate in the drying step can be slowed down. This makes it possible to slow down the crystal growth rate of the perovskite compound crystals 7 and reduce defects at the crystal interface of the perovskite compound crystals 7. This makes it possible to suppress the intrusion of water molecules into the perovskite compound crystals 7, thereby improving the durability of the photoelectric conversion element 20.
フィラー粒子8の比重(例えば、2.5~3.5g/cm3)はペロブスカイト化合物の比重(例えば、4.16g/cm3)よりも軽いことが好ましい。このことにより、光電変換層5の表面にフィラー粒子8が偏在した反射領域6を形成することができる。
乾燥ステップにおいて、塗工ステップにおける塗工面と反対側から透明基板2を加熱することが好ましい。積層体下部の塗布液面は、負圧になることで塗布液の溶媒が蒸発し蒸発熱による塗布液表面の冷却により、ペロブスカイト化合物結晶の結晶化の際の潜熱を塗布液側から拡散することで局所的な温度勾配を均一化して、均一な結晶化を実現することが出来る。
また、塗膜を直接加熱しないため、塗膜に大きな温度分布が生じることを抑制することができる。
The specific gravity of the filler particles 8 (e.g., 2.5 to 3.5 g/cm 3 ) is preferably lower than the specific gravity of the perovskite compound (e.g., 4.16 g/cm 3 ). This makes it possible to form the reflective region 6 in which the filler particles 8 are unevenly distributed on the surface of the photoelectric conversion layer 5.
In the drying step, it is preferable to heat the transparent substrate 2 from the side opposite to the coated surface in the coating step. The coating liquid surface at the bottom of the laminate is subjected to negative pressure, causing the solvent in the coating liquid to evaporate, and the coating liquid surface is cooled by the heat of evaporation, which diffuses the latent heat generated during crystallization of the perovskite compound crystals from the coating liquid side, thereby making the local temperature gradient uniform and realizing uniform crystallization.
In addition, since the coating film is not directly heated, the occurrence of a large temperature distribution in the coating film can be suppressed.
[電子ブロック層]
電子ブロック層9は、光電変換層5で発生したホールを捉えて、陽極である裏面電極10に輸送し、ペロブスカイト化合物結晶7で発生した電子をブロックする層である。電子ブロック層9を構成する材料としては、伝導電子帯のエネルギー準位(Eebc)が、ペロブスカイト化合物結晶7の伝導電子帯のエネルギー準位(Eopc)に比べ、Eebc≧Eopc + 0.5eVの材料で構成される。具体的な電子ブロック層9の材料として、Cu2O、NiO、ZnS等の無機化合物が挙げられる。これによりペロブスカイト化合物結晶7における光励起により生成した電子を効率良くブロックすることができ、高効率光電変換素子20を実現することができる。
例えば、図2に示したバンド構造のように、電子ブロック層9は電子をブロックし、ホールを裏面電極10(Ni)へ伝搬させる。
また、電子ブロック層9は、反射領域6に隣接して配置されることが好ましい。電子ブロック層9の厚さは、50nm以上100nm以下であることが好ましく、70nm以上80nm以下であることがより好ましい。このことにより、裏面電極側へ電子が伝搬することをブロックすることができ効率よくホールを裏面電極10へ伝搬させることができる。この結果、光電変換素子20の高効率を実現することができる。
[Electron Blocking Layer]
The electron blocking layer 9 is a layer that captures holes generated in the photoelectric conversion layer 5, transports them to the back electrode 10 which is an anode, and blocks electrons generated in the perovskite compound crystal 7. The material constituting the electron blocking layer 9 is a material having an energy level (Eebc) of the conduction electron band that satisfies Eebc≧Eopc+0.5 eV compared to the energy level (Eopc) of the conduction electron band of the perovskite compound crystal 7. Specific examples of the material for the electron blocking layer 9 include inorganic compounds such as Cu2O , NiO, and ZnS. This makes it possible to efficiently block electrons generated by photoexcitation in the perovskite compound crystal 7, thereby realizing a highly efficient photoelectric conversion element 20.
For example, as shown in the band structure of FIG. 2, the electron blocking layer 9 blocks electrons and allows holes to propagate to the rear electrode 10 (Ni).
Moreover, the electron blocking layer 9 is preferably disposed adjacent to the reflective region 6. The thickness of the electron blocking layer 9 is preferably 50 nm or more and 100 nm or less, and more preferably 70 nm or more and 80 nm or less. This makes it possible to block the propagation of electrons toward the rear electrode side, and to efficiently propagate holes to the rear electrode 10. As a result, high efficiency of the photoelectric conversion element 20 can be achieved.
[裏面電極]
裏面電極10は、光電変換素子20の陽極に相当する。裏面電極10を構成する材料としては、例えば、金属、透明導電性無機材料、導電性微粒子及び導電性ポリマー(特に、透明導電性ポリマー)等が挙げられる。金属としては、例えば、ニッケル、金、銀、及び白金等が挙げられる。透明導電性無機材料としては、例えば、ヨウ化銅(CuI)、インジウムスズ酸化物(ITO)、酸化スズ(SnO2)、フッ素ドープ酸化スズ(FTO)、アルミニウムドープ酸化亜鉛(AZO)、インジウム亜鉛酸化物(IZO)及びガリウムドープ酸化亜鉛(GZO)等が挙げられる。導電性微粒子としては、例えば、銀ナノワイヤー及びカーボンナノファイバー等が挙げられる。透明導電性ポリマーとしては、例えば、ポリ(3,4-エチレンジオキシチオフェン)とポリスチレンスルホン酸とを含むポリマー(PEDOT/PSS)等が挙げられる。
[Back electrode]
The back electrode 10 corresponds to the anode of the photoelectric conversion element 20. Examples of materials constituting the back electrode 10 include metals, transparent conductive inorganic materials, conductive fine particles, and conductive polymers (particularly, transparent conductive polymers). Examples of metals include nickel, gold, silver, and platinum. Examples of transparent conductive inorganic materials include copper iodide (CuI), indium tin oxide (ITO), tin oxide (SnO 2 ), fluorine-doped tin oxide (FTO), aluminum-doped zinc oxide (AZO), indium zinc oxide (IZO), and gallium-doped zinc oxide (GZO). Examples of conductive fine particles include silver nanowires and carbon nanofibers. Examples of transparent conductive polymers include polymers containing poly(3,4-ethylenedioxythiophene) and polystyrene sulfonic acid (PEDOT/PSS).
光電変換層5に効率よく内臓電位を印加するためには、上記裏面電極10の材料を仕事関数Φ≧5.0eVの金属とすることが望ましい。これにより透明基板2側の透明導電膜3から電子を、裏面電極10側からホールを取り出す構造になり、ホール取り出し側の電子ブロック層9と裏面電極10との界面でスムーズなホールの流れが実現でき高効率の光電変換素子が実現される。 In order to efficiently apply a built-in potential to the photoelectric conversion layer 5, it is desirable to use a metal with a work function Φ≧5.0 eV as the material for the back electrode 10. This results in a structure in which electrons are extracted from the transparent conductive film 3 on the transparent substrate 2 side, and holes are extracted from the back electrode 10 side, allowing a smooth flow of holes at the interface between the electron blocking layer 9 on the hole extraction side and the back electrode 10, resulting in a highly efficient photoelectric conversion element.
図7、図8に本実施形態の太陽電池モジュール50(直列接続太陽電池)の概略断面図を示す。
本実施形態の光電変換素子20(20a~20e)は、透明基板2と、透明基板2上に設けられた透明導電膜3(3a~3e)と、透明導電膜3上に設けられたホールブロック層4(4a~4e)と、ホールブロック層4上に設けられた光電変換層5(5a~5e)と、光電変換層5上に設けられた電子ブロック層9(9a~9e)と、電子ブロック層9上に設けられた裏面電極10(10a~10e)と、光電変換層5の側部を覆うように設けられた第2バリア層22とを備え、第2バリア層22は、緻密質無機材料層である。
7 and 8 show schematic cross-sectional views of a solar cell module 50 (series-connected solar cells) according to this embodiment.
A photoelectric conversion element 20 (20a to 20e) of this embodiment includes a transparent substrate 2, a transparent conductive film 3 (3a to 3e) provided on the transparent substrate 2, a hole blocking layer 4 (4a to 4e) provided on the transparent conductive film 3, a photoelectric conversion layer 5 (5a to 5e) provided on the hole blocking layer 4, an electron blocking layer 9 (9a to 9e) provided on the photoelectric conversion layer 5, a back electrode 10 (10a to 10e) provided on the electron blocking layer 9, and a second barrier layer 22 provided to cover a side portion of the photoelectric conversion layer 5, the second barrier layer 22 being a dense inorganic material layer.
本実施形態の太陽電池モジュール50は、複数の光電変換素子20(20a~20e)と、第1端子37と、第2端子38とを備え、複数の光電変換素子20は直列接続され、直列接続された複数の光電変換素子20のうち一方の端の光電変換素子20aは第1端子37に接続し、他方の端の光電変換素子20eは第2端子38に接続する。直列接続される光電変換素子20の数は、複数であれば特に限定されない。 The solar cell module 50 of this embodiment includes a plurality of photoelectric conversion elements 20 (20a to 20e), a first terminal 37, and a second terminal 38. The plurality of photoelectric conversion elements 20 are connected in series, with the photoelectric conversion element 20a at one end of the plurality of photoelectric conversion elements 20 connected in series being connected to the first terminal 37, and the photoelectric conversion element 20e at the other end being connected to the second terminal 38. There is no particular limit to the number of photoelectric conversion elements 20 connected in series, as long as there is more than one.
透明基板2は、太陽電池モジュール50の基板である。透明基板2は、ガラス基板であってもよく、透明な有機フィルムであってもよい。このことにより、光電変換素子20の内部に光が入射することができる。透明基板2がフレキシブルな有機フィルムである場合、太陽電池モジュール50は、フレキシブル太陽電池モジュールとなる。
透明基板2となる有機フィルムの材料としては、具体的にはポリエチレンテレフタレート(PET)、ポリブチレンテレフタレート(PBT)、ポリフェニレンスルファイド(PPS)、ポリエーテルイミド(PEI)、ポリテトラフルオロエチレン(PTFE)、ポリアミドイミド(PAI)、ポリエチレンナフタレート(PEN)などが挙げられるが、要件を満たす限りこれ以外の樹脂も使用できる。透明基板2となる有機フィルムの膜厚としては、50~100μmが望ましい。
The transparent substrate 2 is a substrate of the solar cell module 50. The transparent substrate 2 may be a glass substrate or a transparent organic film. This allows light to enter the inside of the photoelectric conversion element 20. When the transparent substrate 2 is a flexible organic film, the solar cell module 50 becomes a flexible solar cell module.
Specific examples of materials for the organic film that will become the transparent substrate 2 include polyethylene terephthalate (PET), polybutylene terephthalate (PBT), polyphenylene sulfide (PPS), polyetherimide (PEI), polytetrafluoroethylene (PTFE), polyamideimide (PAI), polyethylene naphthalate (PEN), etc., but other resins can also be used as long as they satisfy the requirements. The thickness of the organic film that will become the transparent substrate 2 is preferably 50 to 100 μm.
透明基板2が透明な有機フィルムである場合、透明基板2の一方の主要面上に第1バリア層21を設けてもよい。第1バリア層21は、ガスバリア性の高い材料の層である。このことにより、空気中の水分や酸素などによる光電変換素子20(20a~20e)の内部の劣化を防止することができる。また、第1バリア層21は、絶縁体材料の層である。このことにより、リーク電流が流れることを抑制することができる。第1バリア層21の膜厚は数10~100nmとすることができる。このことにより第1バリア層21が透光性を有することができる。また、光電変換素子20の柔軟性を有することができる。第1バリア層21の材料としては、具体的には酸化ケイ素、酸化アルミニウムなどが挙げられる。第1バリア層21がガスバリア性と絶縁性と透光性を有すれば、これ以外の酸化物質や絶縁体も第1バリア層21の材料に使用できる。第1バリア層21の主な成膜方法としては、スパッタ成膜法、真空蒸着法などが挙げられる。 When the transparent substrate 2 is a transparent organic film, the first barrier layer 21 may be provided on one of the main surfaces of the transparent substrate 2. The first barrier layer 21 is a layer of a material with high gas barrier properties. This can prevent deterioration inside the photoelectric conversion element 20 (20a to 20e) due to moisture and oxygen in the air. The first barrier layer 21 is also a layer of an insulating material. This can suppress leakage current from flowing. The film thickness of the first barrier layer 21 can be several tens to 100 nm. This allows the first barrier layer 21 to have light transmissibility. In addition, the photoelectric conversion element 20 can have flexibility. Specific examples of materials for the first barrier layer 21 include silicon oxide and aluminum oxide. As long as the first barrier layer 21 has gas barrier properties, insulating properties, and light transmissivity, other oxide substances and insulators can also be used as the material for the first barrier layer 21. Main methods for forming the first barrier layer 21 include sputtering film formation and vacuum deposition.
透明導電膜3(3a~3e)は、透明基板2上(又は第1バリア層21上)に設けられ、光電変換素子20(20a~20e)の光起電力により生じる電流を取り出すための電極である。透明導電膜3は、例えば、アルミニウムドープ酸化亜鉛(AZO)、インジウム亜鉛酸化物(IZO)、ガリウムドープ酸化亜鉛(GZO)、フッ素ドーピングされた酸化錫(FTO)、インジウム錫酸化物(ITO)等の導電性透明材料から構成される。
透明導電膜3のシート抵抗が10Ω/sq以下であるのことが好ましく、透明導電膜3の光の透過率が30%以上であることが好ましい。透明導電膜3の形成方法としては、スパッタ成膜方法、真空蒸着方法などが挙げられる。
The transparent conductive film 3 (3a to 3e) is provided on the transparent substrate 2 (or on the first barrier layer 21) and is an electrode for extracting a current generated by the photovoltaic power of the photoelectric conversion element 20 (20a to 20e). The transparent conductive film 3 is made of a conductive transparent material such as aluminum-doped zinc oxide (AZO), indium zinc oxide (IZO), gallium-doped zinc oxide (GZO), fluorine-doped tin oxide (FTO), indium tin oxide (ITO), or the like.
The transparent conductive film 3 preferably has a sheet resistance of 10 Ω/sq or less, and a light transmittance of 30% or more. Examples of a method for forming the transparent conductive film 3 include a sputtering method and a vacuum deposition method.
透明基板2上に複数の光電変換素子20が設けられている場合、透明基板2上に形成された透明導電膜3は、光電変換素子20ごとに分割されている。例えば、図7に示した太陽電池モジュール50は5つの光電変換素子20a~20eを含むため、透明導電膜3は分割され、5つの透明導電膜3a~3eが形成されている。隣接する2つの透明導電膜3を分割する溝は、光電変換層5などで満たされていてもよい。 When multiple photoelectric conversion elements 20 are provided on the transparent substrate 2, the transparent conductive film 3 formed on the transparent substrate 2 is divided for each photoelectric conversion element 20. For example, the solar cell module 50 shown in FIG. 7 includes five photoelectric conversion elements 20a to 20e, so the transparent conductive film 3 is divided to form five transparent conductive films 3a to 3e. The grooves that divide two adjacent transparent conductive films 3 may be filled with a photoelectric conversion layer 5 or the like.
透明基板2である有機フィルムには、太陽電池モジュール50の第1端子37が形成されており、第1端子37の一部が有機フィルム(透明基板2)と第1バリア層21を貫通し、直列接続した光電変換素子20a~20eの端の光電変換素子20aの透明導電膜3aに接触又は電気的に接続している。この第1端子37を用いて、太陽電池モジュール50の光起電力により生じる電流を取り出すことができる。第1端子37の材料としては、SnZn系の半田ペーストが挙げられる。要件を満たす限りこれ以外の導電ペースト、電極材料も使用できる。 The first terminal 37 of the solar cell module 50 is formed on the organic film that is the transparent substrate 2, and a part of the first terminal 37 penetrates the organic film (transparent substrate 2) and the first barrier layer 21, and is in contact with or electrically connected to the transparent conductive film 3a of the end photoelectric conversion element 20a of the serially connected photoelectric conversion elements 20a to 20e. This first terminal 37 can be used to extract the current generated by the photovoltaic power of the solar cell module 50. An example of the material for the first terminal 37 is a SnZn-based solder paste. Other conductive pastes and electrode materials can also be used as long as they meet the requirements.
ホールブロック層4は、光電変換層5における光励起により生成した電子を透明導電膜3に輸送する層である。従って、ホールブロック層4は、光電変換層5で生成した電子がホールブロック層4に容易に移動することができ、ホールブロック層4の電子が容易に透明導電膜3に移動できるような材料からなる。また、ホールブロック層4は、光電変換層5内部のペロブスカイト化合物結晶7を配向成長させるためのシード層であってもよい。このことにより、光電変換層5に含まれるペロブスカイト化合物結晶7の品質を向上させることができる。ホールブロック層4は、例えば、酸化チタン(TiO2)層である。また、この酸化チタン層に含まれる酸化チタンの表面には、TiN層又はTiO2-xNx層が形成されていてもよい。 The hole blocking layer 4 is a layer that transports electrons generated by photoexcitation in the photoelectric conversion layer 5 to the transparent conductive film 3. Therefore, the hole blocking layer 4 is made of a material that allows electrons generated in the photoelectric conversion layer 5 to easily move to the hole blocking layer 4 and allows electrons in the hole blocking layer 4 to easily move to the transparent conductive film 3. The hole blocking layer 4 may also be a seed layer for oriented growth of the perovskite compound crystals 7 inside the photoelectric conversion layer 5. This can improve the quality of the perovskite compound crystals 7 contained in the photoelectric conversion layer 5. The hole blocking layer 4 is, for example, a titanium oxide (TiO 2 ) layer. A TiN layer or a TiO 2-x N x layer may be formed on the surface of the titanium oxide contained in the titanium oxide layer.
例えば、透明導電膜3上に、ホールブロック層4となるシード層として多孔質酸化チタン層のTiO2の表面を窒素プラズマによる表面改質処理することで、TiO2の表面に5~30nmの膜厚のTiN(NaCl構造)層が形成されていてもよい。
TiO2(ルチル構造)とTiN(NaCl構造)の格子定数の整合性が比較的よく、TiO2で構成されるTiO2層とTiNで構成されるTiN層との間には欠陥の少ない良好な界面が形成される。前記界面付近で、混晶物質TiO2-xNxが形成されることで、格子定数が連続的に変化し、界面欠陥の発生を抑止することができる。TiN層は窒素プラズマによる表面改質処理後に大気に曝されると表面に再酸化層が厚さ数nm形成されるが、形成したTiO2層が薄いため格子定数の構造緩和が起こらず、下地のTiN層の格子定数が維持される。
For example, a TiN (NaCl structure) layer having a thickness of 5 to 30 nm may be formed on the surface of the TiO 2 of the porous titanium oxide layer on the transparent conductive film 3 as a seed layer to be the hole blocking layer 4 by subjecting the surface of the TiO 2 to a surface modification treatment using nitrogen plasma.
The lattice constants of TiO2 (rutile structure) and TiN (NaCl structure) are relatively well matched, and a good interface with few defects is formed between the TiO2 layer made of TiO2 and the TiN layer made of TiN. The mixed crystal material TiO2 -xNx is formed near the interface, which changes the lattice constant continuously and suppresses the occurrence of interface defects. When the TiN layer is exposed to the atmosphere after surface modification treatment with nitrogen plasma, a reoxidation layer is formed on the surface to a thickness of several nm, but since the formed TiO2 layer is thin, structural relaxation of the lattice constant does not occur, and the lattice constant of the underlying TiN layer is maintained.
第1バリア層21で被覆された有機フィルム(透明基板2)上に透明導電膜3が形成された後、有機フィルム(透明基板2)上に光電変換素子20a~20eを分離形成するために、レーザースクライブにより、透明導電膜に切り込み(L1)を入れる。用いるレーザーの波長としては、赤外領域のものが望ましい。透明導電膜に切り込み(L1)を入れ、透明導電膜3a~3eが形成される。第1バリア層21には切り込みは入らない。
例えば、レーザースクライブにより切り込み(L1)を入れた透明基板2上にペロブスカイト化合物結晶7を形成し光電変換層5を形成することができる。
After the transparent conductive film 3 is formed on the organic film (transparent substrate 2) covered with the first barrier layer 21, in order to separate and form the photoelectric conversion elements 20a to 20e on the organic film (transparent substrate 2), a cut (L1) is made in the transparent conductive film by laser scribing. The wavelength of the laser used is preferably in the infrared region. The cut (L1) is made in the transparent conductive film, and the transparent conductive films 3a to 3e are formed. No cut is made in the first barrier layer 21.
For example, the photoelectric conversion layer 5 can be formed by forming the perovskite compound crystal 7 on the transparent substrate 2 having a notch (L1) made thereon by laser scribing.
ペロブスカイト化合物は、正方晶系の基本単位格子を有している。この単位格子は、各頂点に配置された有機基(有機分子)Aと、体心に配置された金属原子Bと、各面心に配置されたハロゲン原子Xとを備えており、一般式A-B-X3によって表される。
光電変換層5を形成するための塗布法に用いる有機溶剤(塗布液に含まれる)としては、例えばトルエン、キシレン、メシチレン、テトラリン、ジフェニルメタン、ジメトキシベンゼン、ジクロルベンゼンなどの芳香族炭化水素類;ジクロロメタン、ジクロロエタン、テトラクロロプロパンなどのハロゲン化炭化水素;テトラヒドロフラン(THF)、ジオキサン、ジベンジルエーテル、ジメトキシメチルエーテル、1,2-ジメトキシエタン等のエーテル類;メチルエチルケトン、シクロヘキサノン、アセトフェノン、イソホロンなどのケトン類;安息香酸メチル、酢酸エチル、酢酸ブチルなどのエステル類;ジフェニルスルフィドなどの含イオウ溶剤;ヘキサフロオロイソプロパノールなどのフッ素系溶剤;N,N-ジメチルホルムアミド、N,N-ジメチルアセトアミド、ジメチルスルホキシドなどの非プロトン性極性溶剤;メタノール、エタノール、イソプロパノールなどのアルコール類;エチレングルコール、ジエチレングリコールモノメチルエーテルなどのグライム系溶剤;などが挙げられ、これらは単独または混合溶剤として使用できる。これらの溶剤に、水が混入していてもよい。これらの溶剤の中でも、地球環境に対する配慮から、非ハロゲン系有機溶剤が好適に用いられる。
また、これとは別に、塗布液は、酸化防止剤、粘弾性調整剤、防腐剤、硬化触媒などの添加剤を含んでもよい。
塗布方法は特に限定されないが、例えば、浸漬塗布法、スプレー塗布法、スライドホッパー塗布法等が好ましい。
Perovskite compounds have a basic tetragonal unit cell, which has an organic group (organic molecule) A at each vertex, a metal atom B at the body center, and a halogen atom X at each face center, and is represented by the general formula A-B- X3 .
Examples of organic solvents (contained in the coating solution) used in the coating method for forming the photoelectric conversion layer 5 include aromatic hydrocarbons such as toluene, xylene, mesitylene, tetralin, diphenylmethane, dimethoxybenzene, and dichlorobenzene; halogenated hydrocarbons such as dichloromethane, dichloroethane, and tetrachloropropane; ethers such as tetrahydrofuran (THF), dioxane, dibenzyl ether, dimethoxymethyl ether, and 1,2-dimethoxyethane; ketones such as methyl ethyl ketone, cyclohexanone, acetophenone, and isophorone; esters such as methyl benzoate, ethyl acetate, and butyl acetate; sulfur-containing solvents such as diphenyl sulfide; fluorine-based solvents such as hexafluoroisopropanol; aprotic polar solvents such as N,N-dimethylformamide, N,N-dimethylacetamide, and dimethylsulfoxide; alcohols such as methanol, ethanol, and isopropanol; and glyme-based solvents such as ethylene glycol and diethylene glycol monomethyl ether. These solvents may be mixed with water. Among these solvents, non-halogenated organic solvents are preferably used in consideration of the global environment.
In addition to this, the coating liquid may contain additives such as an antioxidant, a viscoelasticity modifier, a preservative, and a curing catalyst.
The coating method is not particularly limited, but for example, a dip coating method, a spray coating method, a slide hopper coating method, etc. are preferable.
光電変換層5が形成された後、隣接する2つの光電変換素子20(20a~20e)のうち一方の光電変換素子20の透明導電膜3を、他方の光電変換素子20の電子ブロック層9及び裏面電極10に接続するために、レーザースクライブにより、光電変換層5の一部に切り込み(L2)を入れる。用いるレーザーの波長としては、可視光領域のものが望ましい。例えば、光電変換層5に切り込み(L2)を入れ、光電変換層5a~5eが形成される。このレーザースクライブでは、光電変換層5が除去されるが、透明導電膜3及び第1バリア層21は除去されない。 After the photoelectric conversion layer 5 is formed, a cut (L2) is made in part of the photoelectric conversion layer 5 by laser scribing in order to connect the transparent conductive film 3 of one of two adjacent photoelectric conversion elements 20 (20a to 20e) to the electron block layer 9 and back electrode 10 of the other photoelectric conversion element 20. The wavelength of the laser used is preferably in the visible light region. For example, the cut (L2) is made in the photoelectric conversion layer 5, and the photoelectric conversion layers 5a to 5e are formed. With this laser scribing, the photoelectric conversion layer 5 is removed, but the transparent conductive film 3 and the first barrier layer 21 are not removed.
裏面電極10(10a~10e)は、光電変換層5上に設けられ、光電変換素子20(20a~20e)の光電変換層5の光起電力により生じる電流を取り出すための電極である。裏面電極10は、例えば、仕事関数が5eV以上の金属膜である。裏面電極10が仕事関数の深い(5eV以上)金属で構成されることで、光電変換層5と裏面電極10の界面では、ホールの流れがスムーズになるバンド構造の曲がりが発生する。裏面電極10の材料としては、例えば、Ni、Pt、Pd等の金属が挙げられる。裏面電極10の膜厚としては、50nm~150nmが望ましい。光電変換層5又は裏面電極10は、スパッタ成膜法や真空蒸着法などにより形成することができる。 The back electrode 10 (10a to 10e) is provided on the photoelectric conversion layer 5 and is an electrode for extracting a current generated by the photovoltaic power of the photoelectric conversion layer 5 of the photoelectric conversion element 20 (20a to 20e). The back electrode 10 is, for example, a metal film with a work function of 5 eV or more. By making the back electrode 10 out of a metal with a deep work function (5 eV or more), a bending of the band structure occurs at the interface between the photoelectric conversion layer 5 and the back electrode 10, which makes the flow of holes smooth. Examples of materials for the back electrode 10 include metals such as Ni, Pt, and Pd. The film thickness of the back electrode 10 is preferably 50 nm to 150 nm. The photoelectric conversion layer 5 or the back electrode 10 can be formed by a sputtering deposition method, a vacuum deposition method, or the like.
裏面電極10が形成された後、透明基板2上の隣接する光電変換素子20a~20eの直列接続回路に形成するために、レーザースクライブにより、電子ブロック層9と裏面電極10の一部に切り込み(L3)を入れる。また、後述する第2バリア層22をバリスタ31として機能させるために、ホールブロック層4、光電変換層5、電子ブロック層9及び裏面電極10に切り込み(L4)を入れる。用いるレーザーの波長としては、紫外領域のものが望ましい。例えば、電子ブロック層9及び裏面電極10に切り込み(L3)を入れ、電子ブロック層9a~9e及び裏面電極10a~10eが形成される。また、バリスタ31を形成するための切り込み(L4)を形成することができる。なお、切り込み(L3)を入れた部分がバリスタ31として機能する場合、切り込み(L4)は省略可能である。 After the back electrode 10 is formed, a cut (L3) is made in a part of the electron blocking layer 9 and the back electrode 10 by laser scribing in order to form a series connection circuit of adjacent photoelectric conversion elements 20a to 20e on the transparent substrate 2. In addition, in order to make the second barrier layer 22 described later function as a varistor 31, a cut (L4) is made in the hole blocking layer 4, the photoelectric conversion layer 5, the electron blocking layer 9, and the back electrode 10. The wavelength of the laser used is preferably in the ultraviolet region. For example, the cut (L3) is made in the electron blocking layer 9 and the back electrode 10 to form the electron blocking layers 9a to 9e and the back electrodes 10a to 10e. In addition, a cut (L4) for forming the varistor 31 can be made. Note that if the part with the cut (L3) functions as the varistor 31, the cut (L4) can be omitted.
第2バリア層22は、緻密質無機材料層であり、光電変換層5(5a~5e)の側部を覆うように設けられる。また、第2バリア層22は光電変換層5の周縁全体を覆うように設けることができる。また、第2バリア層22は裏面電極10の上面を覆うように設けることができる。この第2バリア層22により、光電変換層5に水分(水蒸気など)が侵入することを抑制することができ、光電変換素子20が劣化することを抑制することができる。また、第2バリア層22が緻密質無機材料層であるため、第2バリア層22のバリア機能が紫外線、温度変化などにより低下することを抑制することができる。また、光電変換層5を第2バリア層22、透明導電膜3、透明基板2などで完全にコーティングすることで、水蒸気に対するバリア特性を改善することができる。 The second barrier layer 22 is a dense inorganic material layer and is provided so as to cover the side of the photoelectric conversion layer 5 (5a to 5e). The second barrier layer 22 can be provided so as to cover the entire periphery of the photoelectric conversion layer 5. The second barrier layer 22 can be provided so as to cover the upper surface of the back electrode 10. This second barrier layer 22 can prevent moisture (such as water vapor) from entering the photoelectric conversion layer 5, and can prevent the photoelectric conversion element 20 from deteriorating. In addition, because the second barrier layer 22 is a dense inorganic material layer, it is possible to prevent the barrier function of the second barrier layer 22 from being reduced by ultraviolet rays, temperature changes, etc. In addition, by completely coating the photoelectric conversion layer 5 with the second barrier layer 22, the transparent conductive film 3, the transparent substrate 2, etc., the barrier properties against water vapor can be improved.
また、第2バリア層22は、バリスタ特性を示す材料から構成されてもよい。また、第2バリア層22は、第2バリア層22と光電変換層5とが並列接続となるように透明導電膜3及び裏面電極10と接続するように設けることができる。バリスタ特性とは、ある一定電圧で急に電流が流れ出す電圧-電流特性(電流非直線性)である。バリスタ特性を示す材料は、バリスタ素子に使用できる材料であれば特に限定されない。
第2バリア層22の厚さは、例えば、30nm以上100nm以下とすることができる。
第2バリア層22は、レーザースクライブ後の裏面電極10上に形成される。また、第2バリア層22は、切り込み(L3)を満たすように形成することができる。このことにより、光電変換層5の周縁及び上面を第2バリア層22で覆うことができる。また、第2バリア層22は、切り込み(L4)を満たすように形成することができる。このことにより、第2バリア層22が、第2バリア層22と光電変換層5とが並列接続となるように透明導電膜3及び裏面電極10と接続することができる。
The second barrier layer 22 may be made of a material that exhibits varistor characteristics. The second barrier layer 22 can be provided so as to be connected to the transparent conductive film 3 and the back electrode 10 so that the second barrier layer 22 and the photoelectric conversion layer 5 are connected in parallel. The varistor characteristics are voltage-current characteristics (current nonlinearity) in which a current suddenly starts to flow at a certain constant voltage. There are no particular limitations on the material that exhibits the varistor characteristics as long as it is a material that can be used in a varistor element.
The thickness of the second barrier layer 22 can be, for example, not less than 30 nm and not more than 100 nm.
The second barrier layer 22 is formed on the back electrode 10 after laser scribing. The second barrier layer 22 can be formed so as to fill the notch (L3). This allows the periphery and upper surface of the photoelectric conversion layer 5 to be covered with the second barrier layer 22. The second barrier layer 22 can be formed so as to fill the notch (L4). This allows the second barrier layer 22 to be connected to the transparent conductive film 3 and the back electrode 10 such that the second barrier layer 22 and the photoelectric conversion layer 5 are connected in parallel.
第2バリア層22の一部が、バリスタ素子構造として光電変換層5に対して並列接続されることで、バイパスダイオード(第2バリア層22のバリスタ)を一体的に備えた光電変換素子20を実現できる。これにより、低コストでモジュール上での影による発電効率の低下を抑止することができる。
第2バリア層22は、例えば、主な材料として酸化亜鉛(ZnO)を含み、添加材料として酸化ケイ素、酸化アルミニウム、酸化チタンなどを含むことができる。透明導電膜3と裏面電極10との間の第2バリア層22のバリスタ特性(I=KVα、K:素子固有定数、α:電圧非直線係数)は、α=20~60で、屈曲点電圧が2V以上であることが望ましい。
A part of the second barrier layer 22 is connected in parallel to the photoelectric conversion layer 5 as a varistor element structure, thereby realizing a photoelectric conversion element 20 integrally provided with a bypass diode (varistor of the second barrier layer 22). This makes it possible to prevent a decrease in power generation efficiency due to shadowing on the module at low cost.
The second barrier layer 22 may contain, for example, zinc oxide (ZnO) as a main material, and may contain, as additive materials, silicon oxide, aluminum oxide, titanium oxide, etc. The varistor characteristics (I=KVα, K: element-specific constant, α: voltage nonlinearity coefficient) of the second barrier layer 22 between the transparent conductive film 3 and the rear electrode 10 are preferably α=20 to 60, with a bending point voltage of 2 V or more.
裏面基板24は、第2バリア層22の上部に配置される基板であり、光電変換層5は透明基板2と裏面基板24との間に位置する。裏面基板24は、太陽電池モジュール50の基板であってもよい。裏面基板24は、ガラス基板であってもよく、透明な有機フィルムであってもよく、不透明な有機フィルムであってもよい。
裏面基板24が有機フィルムである場合、裏面基板24の一方の主要面上に第3バリア層23を設けてもよい。第3バリア層23は、ガスバリア性の高い材料の層である。このことにより、空気中の水分や酸素などによる光電変換素子20(20a~20e)の内部の劣化を防止することができる。また、第3バリア層23は、絶縁体材料の層である。このことにより、リーク電流が流れることを抑制することができる。第3バリア層23の膜厚は数10~100nmとすることができる。第3バリア層23の材料としては、具体的には酸化ケイ素、酸化アルミニウムなどが挙げられる。
The rear substrate 24 is a substrate disposed on the upper part of the second barrier layer 22, and the photoelectric conversion layer 5 is located between the transparent substrate 2 and the rear substrate 24. The rear substrate 24 may be a substrate of the solar cell module 50. The rear substrate 24 may be a glass substrate, a transparent organic film, or an opaque organic film.
When the rear substrate 24 is an organic film, a third barrier layer 23 may be provided on one of the main surfaces of the rear substrate 24. The third barrier layer 23 is a layer of a material with high gas barrier properties. This can prevent deterioration inside the photoelectric conversion element 20 (20a to 20e) due to moisture or oxygen in the air. The third barrier layer 23 is also a layer of an insulating material. This can suppress the flow of leakage current. The film thickness of the third barrier layer 23 can be several tens to 100 nm. Specific examples of materials for the third barrier layer 23 include silicon oxide and aluminum oxide.
裏面基板24である有機フィルムには、太陽電池モジュール50の第2端子38が形成されており、第2端子38の一部が有機フィルム(裏面基板24)と第3バリア層23を貫通し、直列接続した光電変換素子20a~20eの端の光電変換素子20eの裏面電極10eに接触又は第2バリア層22を介して接続している。第1端子37及び第2端子38を用いて、太陽電池モジュール50の光起電力により生じる電流を取り出すことができる。第2端子38の材料としては、SnZn系の半田ペーストが挙げられる。要件を満たす限りこれ以外の導電ペースト、電極材料も使用できる。 The second terminal 38 of the solar cell module 50 is formed on the organic film that is the rear substrate 24, and a part of the second terminal 38 penetrates the organic film (rear substrate 24) and the third barrier layer 23, and is in contact with the rear electrode 10e of the end photoelectric conversion element 20e of the photoelectric conversion elements 20a to 20e connected in series or is connected via the second barrier layer 22. The first terminal 37 and the second terminal 38 can be used to extract the current generated by the photovoltaic power of the solar cell module 50. The second terminal 38 can be made of a SnZn-based solder paste. Other conductive pastes and electrode materials can also be used as long as they meet the requirements.
裏面電極10上などに第2バリア層22を形成した後、第2バリア層22にラミネートシート35を介して、第2端子38が形成された有機フィルム(裏面基板24)を張り合わせて、加熱ラミネートすることで、複数の光電変換素子20a~20eが直列接続した太陽電池モジュール50が完成する。なお、第2バリア層22と裏面基板24とでサンドウィッチされるラミネートシート35の第2端子38が位置する箇所については、穴開け加工される。このため、ラミネート時に第2端子38と第2バリア層22が良好に接続する。このことにより、裏面電極10eと第2端子38の間でバリスタが形成される。発電時は高電圧が裏面電極10eと第2端子38の間に印可されるため、そのバリスタ特性から電流の取り出しの障害には成らない。また、裏面電極10eと第2端子38とが接触してもよい。
ラミネートシート35としては、一般的なラミネート材でもよく、ラミネート温度が130℃以下で防水性の高い樹脂フィルムが望ましい。
図8は、太陽電池モジュール50に含まれる1つの光電変換素子20の概略断面図と、光電変換素子20の等価回路とを重ね合わせた図であり、図9は、太陽電池モジュール50の等価回路である。
図8に示すように、ホールブロック層4、光電変換層5及び電子ブロック層9は電流源32とダイオード33で表すことができる。また、L4の切れ込み中の第2バリア層22がバリスタ31で表され、このバリスタ31は、光電変換層5と並列接続となるように透明導電膜3及び裏面電極10に接続している。
After forming the second barrier layer 22 on the back electrode 10, etc., an organic film (back substrate 24) on which the second terminal 38 is formed is attached to the second barrier layer 22 via a laminate sheet 35, and then heat-laminated to complete a solar cell module 50 in which a plurality of photoelectric conversion elements 20a to 20e are connected in series. Note that a hole is drilled at the location of the second terminal 38 of the laminate sheet 35 sandwiched between the second barrier layer 22 and the back substrate 24. Therefore, the second terminal 38 and the second barrier layer 22 are well connected during lamination. As a result, a varistor is formed between the back electrode 10e and the second terminal 38. Since a high voltage is applied between the back electrode 10e and the second terminal 38 during power generation, the varistor characteristics do not impede current extraction. In addition, the back electrode 10e and the second terminal 38 may come into contact with each other.
The laminate sheet 35 may be a general laminate material, and is preferably a resin film that has a high waterproof property and can be laminated at a temperature of 130° C. or less.
FIG. 8 is a diagram in which a schematic cross-sectional view of one photoelectric conversion element 20 included in a solar cell module 50 and an equivalent circuit of the photoelectric conversion element 20 are superimposed, and FIG. 9 is an equivalent circuit of the solar cell module 50.
8, the hole blocking layer 4, the photoelectric conversion layer 5 and the electron blocking layer 9 can be represented by a current source 32 and a diode 33. The second barrier layer 22 in the notch of L4 is represented by a varistor 31, which is connected to the transparent conductive film 3 and the back electrode 10 so as to be connected in parallel with the photoelectric conversion layer 5.
光電変換素子の作製
図1に示したような光電変換素子1~34を作製した。
ヨウ化メチルアミン(1.14M)、ヨウ化鉛(1.2M)、5-アミノ吉草酸よう化水素酸塩(0.06M)、シリカ粒子(フィラー粒子)、γ-ブチロラクトン(溶剤)を混合し攪拌することによりフィラー粒子を含むペロブスカイト化合物前駆体溶液を調製した。
また、平均粒径が10nm、20nm、30nm、40nm、50nm、60nm又は70nmであるシリカ粒子を用いてペロブスカイト化合物前駆体溶液1~7を調製し、ペロブスカイト化合物前駆体溶液におけるシリカ粒子の分散性の評価を行った。評価結果を表1に示す。この結果から、平均粒径が50nm以下であるシリカ粒子を用いてペロブスカイト化合物前駆体溶液を調製することにより、前駆体溶液中でシリカ粒子を均一に分散できることがわかった。また、光電変換素子1~34の作製では、平均粒径が10nmであるシリカ粒子を用いた。
Manufacture of Photoelectric Conversion Devices Photoelectric conversion devices 1 to 34 as shown in FIG. 1 were manufactured.
Methylamine iodide (1.14 M), lead iodide (1.2 M), 5-aminovaleric acid hydroiodide (0.06 M), silica particles (filler particles), and γ-butyrolactone (solvent) were mixed and stirred to prepare a perovskite compound precursor solution containing filler particles.
Furthermore, perovskite compound precursor solutions 1 to 7 were prepared using silica particles having an average particle size of 10 nm, 20 nm, 30 nm, 40 nm, 50 nm, 60 nm, or 70 nm, and the dispersibility of the silica particles in the perovskite compound precursor solutions was evaluated. The evaluation results are shown in Table 1. From these results, it was found that by preparing a perovskite compound precursor solution using silica particles having an average particle size of 50 nm or less, the silica particles can be uniformly dispersed in the precursor solution. Furthermore, in the production of photoelectric conversion elements 1 to 34, silica particles having an average particle size of 10 nm were used.
透明基板2及び透明導電膜3には、フッ素ドープ酸化スズ膜を有するガラス基板を用いた。まず、スプレー熱分解法を用いてフッ素ドープ酸化スズ膜上に酸化チタン緻密質層(ホールブロック層4)を形成した。次に、酸化チタンのペーストを酸化チタン緻密質層上に塗布し乾燥させることにより酸化チタン多孔質層(ホールブロック層4)を形成した。 A glass substrate having a fluorine-doped tin oxide film was used for the transparent substrate 2 and the transparent conductive film 3. First, a titanium oxide dense layer (hole blocking layer 4) was formed on the fluorine-doped tin oxide film using a spray pyrolysis method. Next, a titanium oxide paste was applied onto the titanium oxide dense layer and dried to form a titanium oxide porous layer (hole blocking layer 4).
次に、図6に示したような塗工装置を用いて酸化チタン多孔質層上に、調製したペロブスカイト化合物前駆体溶液を塗工し、塗工膜を乾燥させることにより光電変換層5を形成した。塗工膜が乾燥する際にフィラー粒子が図1のように偏在し反射領域6が形成される。 Next, the prepared perovskite compound precursor solution was applied onto the titanium oxide porous layer using a coating device such as that shown in Figure 6, and the coating film was dried to form the photoelectric conversion layer 5. When the coating film dries, the filler particles become unevenly distributed as shown in Figure 1, forming the reflective region 6.
Cu2O粉末(電子ブロック材料)をイソプロピルアルコールに分散させた分散液を、スピンコート法を用いて光電変換層5上に塗布し、塗布膜を乾燥させることにより電子ブロック層9を形成した。光電変換素子21~26では、電子ブロック層9の厚さは、30nm、50nm、70nm、80nm、90nm又は110nmとした。その他の光電変換素子では、電子ブロック層9の厚さを70nmとした。
次に、真空蒸着法により、電子ブロック層9上にNi蒸着膜(裏面電極10)を形成した。
このようにして複数の光電変換素子を作製した。
A dispersion liquid in which Cu2O powder (electron blocking material) was dispersed in isopropyl alcohol was applied onto the photoelectric conversion layer 5 by spin coating, and the applied film was dried to form the electron blocking layer 9. In the photoelectric conversion elements 21 to 26, the thickness of the electron blocking layer 9 was 30 nm, 50 nm, 70 nm, 80 nm, 90 nm, or 110 nm. In the other photoelectric conversion elements, the thickness of the electron blocking layer 9 was 70 nm.
Next, a Ni vapor deposition film (rear electrode 10) was formed on the electron blocking layer 9 by vacuum deposition.
In this manner, a plurality of photoelectric conversion elements were fabricated.
電流-電圧特性の測定
作製した複数の光電変換素子の電流-電圧特性の測定を行い、短絡電流Jsc及び開放電圧Vocを算出した。
表2に、光電変換層の厚さBに対する反射領域の厚さAの比(A/B)を変化させた光電変換素子1~7の短絡電流Jscの評価を示す。光電変換素子1~7では、ペロブスカイト化合物前駆体溶液の調製におけるシリカ粒子の混合量を調整することにより、A/Bを変化させた。また、光電変換層の厚さは、800nmとした。
また、表2では、短絡電流が22mA/cm2以上であった光電変換素子の評価を「◎」で示し、短絡電流が22mA/cm2未満21mA/cm2以上であった光電変換素子の評価を「〇」で示し、短絡電流が21mA/cm2未満20mA/cm2以上であった光電変換素子の評価を「△」で示した。また、表3、表4、表5でも同様である。
表2に示した結果から、反射領域の厚さを、光電変換層の厚さの0.04倍以上0.3倍以下とすることにより、光電変換素子の短絡電流を大きくすることができることがわかった。
Measurement of current-voltage characteristics The current-voltage characteristics of the produced photoelectric conversion elements were measured, and the short-circuit current Jsc and the open-circuit voltage Voc were calculated.
Table 2 shows the evaluation of the short-circuit current Jsc of photoelectric conversion elements 1 to 7 in which the ratio (A/B) of the thickness A of the reflective region to the thickness B of the photoelectric conversion layer was changed. In photoelectric conversion elements 1 to 7, A/B was changed by adjusting the amount of silica particles mixed in the preparation of the perovskite compound precursor solution. The thickness of the photoelectric conversion layer was 800 nm.
In Table 2, photoelectric conversion elements having a short-circuit current of 22 mA/ cm2 or more are evaluated with "◎", photoelectric conversion elements having a short-circuit current of less than 22 mA/ cm2 and 21 mA/ cm2 or more are evaluated with "◯", and photoelectric conversion elements having a short-circuit current of less than 21 mA/ cm2 and 20 mA/ cm2 or more are evaluated with "△". The same is true for Tables 3, 4, and 5.
From the results shown in Table 2, it was found that the short-circuit current of the photoelectric conversion element can be increased by setting the thickness of the reflective region to be 0.04 to 0.3 times the thickness of the photoelectric conversion layer.
表3に、反射領域の厚さを変化させた光電変換素子8~14の短絡電流Jscの評価を示す。光電変換素子8~14では、ペロブスカイト化合物前駆体溶液の調製におけるシリカ粒子の混合量を調整することにより、反射領域の厚さを変化させた。また、光電変換層の厚さは、800nmとした。表3に示した結果から、反射領域の厚さを40nm以上150nm以下とすることにより、光電変換素子の短絡電流を大きくすることができることがわかった。 Table 3 shows an evaluation of the short-circuit current Jsc of photoelectric conversion elements 8 to 14 with different thicknesses of the reflective region. In photoelectric conversion elements 8 to 14, the thickness of the reflective region was changed by adjusting the amount of silica particles mixed in the preparation of the perovskite compound precursor solution. The thickness of the photoelectric conversion layer was also set to 800 nm. From the results shown in Table 3, it was found that the short-circuit current of the photoelectric conversion element can be increased by setting the thickness of the reflective region to 40 nm or more and 150 nm or less.
表4に、光電変換層に含まれるすべてのフィラー粒子のうち反射領域に偏在するフィラー粒子の割合(偏在割合)を変化させた光電変換素子15~20の短絡電流Jscの評価を示す。光電変換素子15~20では、フィラー粒子の粒径及び乾燥(結晶化)速度を制御することにより、偏在割合を変化させた。また、光電変換層の厚さは、800nmとした。
表4に示した結果から反射領域に偏在するフィラー粒子の割合を50wt%以上とすることにより、光電変換素子の短絡電流を大きくすることができることがわかった。
Table 4 shows the evaluation of the short-circuit current Jsc of photoelectric conversion elements 15 to 20 in which the ratio (uneven distribution ratio) of filler particles unevenly distributed in the reflective region among all the filler particles contained in the photoelectric conversion layer was changed. In photoelectric conversion elements 15 to 20, the uneven distribution ratio was changed by controlling the particle size and drying (crystallization) speed of the filler particles. The thickness of the photoelectric conversion layer was set to 800 nm.
From the results shown in Table 4, it was found that the short-circuit current of the photoelectric conversion element can be increased by setting the ratio of the filler particles unevenly distributed in the reflective region to 50 wt % or more.
表5に、電子ブロック層の厚さを変化させた光電変換素子21~26の短絡電流Jscの評価を示す。表5に示した結果から、電子ブロック層の厚さを50nm以上100nm以下とすることにより、光電変換素子の短絡電流を大きくすることができることがわかった。 Table 5 shows an evaluation of the short-circuit current Jsc of photoelectric conversion elements 21 to 26 with different thicknesses of the electron blocking layer. The results shown in Table 5 show that the short-circuit current of the photoelectric conversion element can be increased by setting the thickness of the electron blocking layer to 50 nm or more and 100 nm or less.
表6に、光電変換層の厚さを変化させた光電変換素子27~34の開放電圧Vocの評価を示す。光電変換層の厚さは、ペロブスカイト化合物前駆体溶液の塗工量を変化させることにより調整した。表6では、開放電圧が1.3V以上であった光電変換素子の評価を「◎」で示し、開放電圧が1.3V未満1.2V以上であった光電変換素子の評価を「〇」で示し、開放電圧が1.2V未満1.1V以上であった光電変換素子の評価を「△」で示した。
表6に示した結果から、光電変換層の厚さを500nm以上1μm以下とすることにより、光電変換素子の開放電圧を大きくすることができることがわかった。
Table 6 shows the evaluation of the open circuit voltage Voc of photoelectric conversion elements 27 to 34 in which the thickness of the photoelectric conversion layer was changed. The thickness of the photoelectric conversion layer was adjusted by changing the coating amount of the perovskite compound precursor solution. In Table 6, photoelectric conversion elements in which the open circuit voltage was 1.3 V or more were evaluated with "◎", photoelectric conversion elements in which the open circuit voltage was less than 1.3 V and 1.2 V or more were evaluated with "◯", and photoelectric conversion elements in which the open circuit voltage was less than 1.2 V and 1.1 V or more were evaluated with "△".
From the results shown in Table 6, it was found that the open circuit voltage of the photoelectric conversion element can be increased by setting the thickness of the photoelectric conversion layer to be 500 nm or more and 1 μm or less.
本開示の実施形態に係る光電変換素子及び太陽電池モジュールは、メガソーラーシステムのような太陽光発電システム、太陽電池、及び小型携帯機器用の電源等に利用できる。 The photoelectric conversion element and solar cell module according to the embodiments of the present disclosure can be used in solar power generation systems such as mega solar systems, solar cells, and power sources for small portable devices.
2:透明基板 3、3a~3e:透明導電膜 4、4a~4e:ホールブロック層 5、5a~5e:光電変換層 6:反射領域 7:ペロブスカイト化合物結晶 8:フィラー粒子 9、9a~9e:電子ブロック層 10、10a~10e:裏面電極 11:表面被覆層 12:コア粒子 20、20a~20e:光電変換素子 21:第1バリア層 22:第2バリア層 23:第3バリア層 24:裏面基板 31:バリスタ 32:電流源 33:ダイオード 35:ラミネートシート 37:第1端子 38:第2端子 50:太陽電池モジュール 2: Transparent substrate 3, 3a-3e: Transparent conductive film 4, 4a-4e: Hole blocking layer 5, 5a-5e: Photoelectric conversion layer 6: Reflection area 7: Perovskite compound crystal 8: Filler particles 9, 9a-9e: Electron blocking layer 10, 10a-10e: Back electrode 11: Surface coating layer 12: Core particles 20, 20a-20e: Photoelectric conversion element 21: First barrier layer 22: Second barrier layer 23: Third barrier layer 24: Back substrate 31: Varistor 32: Current source 33: Diode 35: Laminate sheet 37: First terminal 38: Second terminal 50: Solar cell module
Claims (14)
前記光電変換層は、ペロブスカイト化合物結晶と、フィラー粒子とを含み、
前記光電変換層は、前記フィラー粒子が偏在している反射領域を含み、
前記反射領域は、前記電子ブロック層に隣接して配置されていることを特徴とする光電変換素子。 a transparent substrate, a transparent conductive film provided on the transparent substrate, a hole blocking layer provided on the transparent conductive film, a photoelectric conversion layer provided on the hole blocking layer, an electron blocking layer provided on the photoelectric conversion layer, and a back electrode provided on the electron blocking layer;
The photoelectric conversion layer includes a perovskite compound crystal and a filler particle,
the photoelectric conversion layer includes a reflective region in which the filler particles are unevenly distributed,
The photoelectric conversion element, wherein the reflective region is disposed adjacent to the electron blocking layer.
前記表面被覆層の材料は、前記ペロブスカイト化合物結晶で生じた電子をブロックし前記ペロブスカイト化合物結晶で生じたホールを前記電子ブロック層へ輸送するような電子ブロック材料である請求項1に記載の光電変換素子。 The filler particles have a surface coating layer,
2. The photoelectric conversion element according to claim 1, wherein the material of the surface coating layer is an electron blocking material that blocks electrons generated in the perovskite compound crystal and transports holes generated in the perovskite compound crystal to the electron blocking layer.
前記電子ブロック層の厚さは、50nm以上100nm以下である請求項1に記載の光電変換素子。 the electron blocking layer is disposed adjacent the reflective region;
2. The photoelectric conversion element according to claim 1, wherein the electron blocking layer has a thickness of 50 nm to 100 nm.
複数の光電変換素子は集積化されている太陽電池モジュール。 A photoelectric conversion element according to any one of claims 1 to 12,
A solar cell module in which multiple photoelectric conversion elements are integrated.
前記塗工ステップにより形成された塗膜を乾燥させる乾燥ステップとを含み、
前記乾燥ステップにおいて、前記塗工ステップにおける塗工面と反対側から前記透明基板を加熱することを特徴とする光電変換素子の製造方法。 a coating step of coating a coating liquid containing a perovskite compound and filler particles on a hole blocking layer provided on a transparent substrate;
A drying step of drying the coating film formed by the coating step,
A method for producing a photoelectric conversion element, comprising: heating the transparent substrate from a side opposite to the coated surface in the coating step in the drying step.
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| HAZEGHI FARZANEH; MOZAFFARI SAMANEH; GHORASHI SEYED MOHAMMAD BAGHER: "Metal organic framework–derived core-shell CuO@NiO nanosphares as hole transport material in perovskite solar cell", JOURNAL OF SOLID STATE ELECTROCHEMISTRY, SPRINGER, BERLIN,, DE, vol. 24, no. 6, 24 May 2020 (2020-05-24), DE , pages 1427 - 1438, XP037166871, ISSN: 1432-8488, DOI: 10.1007/s10008-020-04643-w * |
| LIU ZHILIANG, LI QINGCHENG; CHEN KUN; CUI YUYING; INTEMANN JEREMY J.; LENG SHIFENG; CUI MINGHUAN; QIN CHAOCHAO; FEI LINFENG; YAO K: "Tailoring carrier dynamics in inverted mesoporous perovskite solar cells with interface-engineered plasmonics", JOURNAL OF MATERIALS CHEMISTRY A, ROYAL SOCIETY OF CHEMISTRY, GB, vol. 9, no. 4, 2 February 2021 (2021-02-02), GB , pages 2394 - 2403, XP093173717, ISSN: 2050-7488, DOI: 10.1039/D0TA10242C * |
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|---|---|
| JPWO2024111643A1 (en) | 2024-05-30 |
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