WO2023185199A1 - Spectral confocal measurement device - Google Patents
Spectral confocal measurement device Download PDFInfo
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- WO2023185199A1 WO2023185199A1 PCT/CN2023/071125 CN2023071125W WO2023185199A1 WO 2023185199 A1 WO2023185199 A1 WO 2023185199A1 CN 2023071125 W CN2023071125 W CN 2023071125W WO 2023185199 A1 WO2023185199 A1 WO 2023185199A1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/02—Details
Definitions
- the present application relates to the technical field of optical shift measurement, and in particular to a spectral confocal measurement device.
- the spectral confocal sensor is a non-contact displacement sensor based on wavelength shift modulation. Because its measurement accuracy reaches the submicron or even nanometer level, it is not sensitive to object tilt, surface texture, etc., and it also has strong resistance to stray light. , which has quickly become a hot spot in current research and is widely used in fields such as film thickness measurement, precision positioning, and precision instrument manufacturing.
- the spectral confocal measurement system uses a light source to illuminate the surface of the object to be measured, and a CCD industrial camera or spectrometer detects the reflected spectral information to determine the peak wavelength focused on the object surface, thereby obtaining the surface of the object to be measured. Axial distance information.
- the principle is to use a dispersive lens group to cause the light source light to be dispersed after being focused by the dispersive lens group, forming a continuous monochromatic light focus on the optical axis with different distances from the dispersive lens group, thus establishing a wavelength and Based on the linear relationship of the axial distance, the corresponding position information is obtained by using the spectral information reflected by the surface of the object to be measured.
- Figure 1 shows an existing spectral confocal measurement device.
- Light is emitted from the light source 1', enters the coupling part 2', and then passes to the sampling part 3', and then is projected to the measured object 4'.
- the reflected light carrying measurement information is formed on the surface and then returns to the coupling part 2' along the original optical path. After part or all of the reflected light passes through the spectroscopic part 5', it is finally converted into an electrical signal by the sensing part 6', so as to Parse and obtain position measurement results.
- This kind of measurement device uses single-point spectral confocal detection, and can only obtain height information of one object point at a time.
- the reflected light returns to the light aperture in the opposite direction along the incident light path, causing stray light to appear in the spectrum received by the light aperture, thereby reducing the signal-to-noise ratio of the device and affecting the measurement accuracy.
- One purpose of this application is to provide a spectral confocal measurement device to improve sampling efficiency, improve signal-to-noise ratio, and ultimately improve measurement accuracy.
- the present application provides a spectral confocal measurement device, which includes a light source component for emitting incident light, an optical sampling part and a measurement part connected to the light source component, characterized in that: the optical sampling part includes A light entrance aperture, a light exit aperture and a dispersion lens group, the light source assembly and the optical sampling part are configured so that the incident light enters the first side of the dispersion lens group from the light entrance aperture in the form of a linear light source And focused on different measurement surfaces of the object to be measured, the second side of the dispersion lens group outputs reflected light, and the reflected light enters the measurement part through the light outlet to obtain the measurement result, wherein the first side There is no overlap with the second side.
- the light exit hole and the light entrance hole are the same light hole, and the light hole is located between the light source assembly and the dispersion lens group.
- the light source assembly includes a light source, a first optical fiber group, optical fiber couplers respectively connected to the first optical fiber group, and a first linear optical fiber bundler.
- the first linear optical fiber bundler is located at A side between the light hole and the light source is used to allow the incident light to enter the dispersive lens group in the form of a linear light source.
- the light hole is a slit or a pin hole.
- the reflected light enters the measurement part in the form of a linear light source.
- a second optical fiber group and a second linear optical fiber bundler are provided between the optical hole and the measurement part, and the reflected light passes through the optical hole, the second optical fiber group and the second optical fiber bundle.
- a linear optical fiber bundle enters the measurement section.
- the plurality of optical fibers of the first optical fiber group are linearly arranged in the first linear optical fiber bundler; or the multiple optical fibers of the second optical fiber group are arranged in the second linear optical fiber bundler. Arranged in a linear format.
- the light source assembly includes a light source and a focusing lens group located between the light source and the light aperture.
- the light emitted by the light source is a point light source or a linear light source.
- the first side of the dispersive lens group is the left or right side
- the second side of the dispersive lens is the right side or left side that is opposite to and does not overlap the first side.
- the first side of the dispersive lens group is the central area
- the second side of the dispersive lens group is the surrounding area that does not overlap the central area; or the first side of the dispersive lens group is the surrounding area.
- the second side of the dispersive lens group is a central area that does not overlap with the surrounding areas.
- the optical sampling part further includes a reflector located above the dispersion lens group, and the light entrance hole is located in the light source assembly. and the dispersion lens group, and the light exit hole is located between the reflector and the measurement part.
- the measurement part includes:
- a spectrometer for receiving and processing the reflected light from the optical sampling part
- a processor for calculating measurements based on the electrical signals from the sensor.
- the optical splitter includes:
- a collimating mirror used to collimate and refract the reflected light from the optical sampling part
- a focusing mirror is used to focus the diffracted reflected light onto the sensor.
- the incident light of the spectral confocal measurement device of the present application enters the first side of the dispersive lens group from the optical hole in the form of a line light source and focuses on different measurement surfaces of the object to be measured.
- the second side that does not overlap with the first side outputs reflected light, and the reflected light enters the measurement part through the light hole to obtain the measurement result.
- a line light source is used for spectral confocal detection, and a confocal line is obtained at one time Position information and height information of all points on the lens, so the sampling efficiency is greatly improved; moreover, light is incident from the first side of the dispersive lens group and reflected from the second side of the dispersive lens group.
- the incident and reflected optical paths do not overlap or are inverse. Thereby filtering the reflected light of non-focused wavelengths on the surface of the measured object, so that the spectral purity of the emitted light can be improved, thus improving the signal-to-noise ratio of the device and improving the measurement accuracy.
- Figure 1 is a schematic structural diagram of a traditional spectral confocal measurement device.
- Figure 2 is a schematic structural diagram of the first embodiment of the spectral confocal measurement device of the present application.
- Figure 3 is a schematic structural diagram of a second embodiment of the spectral confocal measurement device of the present application.
- Figure 4 is a schematic diagram of the arrangement of the optical fiber group of the spectral confocal measurement device of the present application.
- Figure 5 is a schematic diagram of the connection between the second optical fiber group, the second linear optical fiber bundler and the measurement part of the spectral confocal measurement device of the present application.
- Figure 6 is a schematic structural diagram of a third embodiment of the spectral confocal measurement device of the present application.
- Figure 7 is a schematic structural diagram of the fourth embodiment of the spectral confocal measurement device of the present application.
- the spectral confocal measurement device 200 of the present application includes a light source component 210 , an optical sampling part 220 , and a measurement part 230 .
- the light source component 210 is used to emit a broad spectrum light beam with a certain wavelength range as incident light.
- the optical sampling part 220 includes an optical hole 221 for input and output light, and a dispersion lens group 222 for realizing dispersion of the light source.
- the light source assembly 210 and the optical sampling part 220 are configured so that the incident light enters the first side of the dispersive lens group 222 from the optical hole 221 in the form of a linear light source and focuses on different measurement surfaces of the object to be measured.
- the third side of the dispersive lens group 222 Reflected light is output from both sides, and the reflected light enters the measurement part 230 through the light hole 221 to obtain the measurement result.
- first side and second side are two non-overlapping areas on the dispersion lens group, which can be the opposite left and right sides, or the center. area and surrounding area. In this embodiment, it can be understood as the left and right sides of the figure.
- the non-overlapping two side areas allow incident light and reflected light to pass through respectively to ensure that the incident light path and reflected light path passing through the dispersion lens group are completely different and do not overlap at all.
- the light exit hole and the light entrance hole are the same light hole 221, but this is not limited in other embodiments.
- the light source assembly 210 is encapsulated by the housing 210 a, which includes a light source 211 , a first optical fiber group 212 , an optical fiber coupler 213 respectively connected to the first optical fiber group 212 and a first wire. shaped optical fiber bundler 214.
- the first linear optical fiber bundler 214 is located between the optical hole 221 and the light source 211 to allow the incident light to enter one side of the dispersion lens group 222 in the form of a linear light source.
- the light source 211 can be a wide spectrum white light LED light source, coupled to the first linear fiber bundler 214 and the first fiber group 212 through a fiber coupler 213 to integrate the incident light into a linear shape.
- first linear optical fiber bundlers 214 are respectively provided at both ends of the first optical fiber group 212, and the plurality of optical fibers of the first optical fiber group 212 are linearly arranged in the first linear optical fiber bundler 214 (refer to Figure 4) , so that the incident light enters one side of the dispersion lens group 222 through the light hole 221 in the form of a linear light source.
- at least one optical fiber may be provided in the first optical fiber group 212, or multiple optical fibers may be closely arranged in a linear or rectangular shape.
- the optical sampling part 220 is enclosed by a housing 220 a and includes an optical hole 221 for input and output light, and a dispersion lens group 222 for realizing light source dispersion.
- the optical hole 221 is provided on the housing 220a, and the dispersion lens group 222 is provided within the housing 220a.
- the light hole 221 serves as a light entrance hole and a light exit hole at the same time, and is respectively connected to the interfaces of the external first linear fiber bundler 214 and the second linear fiber bundler 261 to allow incident light and reflected light to pass through.
- the shape of the housing 220a of the optical sampling part 220 can be set according to actual needs and is not limited.
- the light hole 221 can be implemented by a slit or a pin hole. It is preferred to adopt the form of slits to better filter out stray light.
- the light source assembly 210 reflects the measurement beam through the light source 211 and couples it to the first linear optical fiber bundler 214 through the optical fiber coupler 213.
- the light propagates in the optical fiber.
- the first linear optical fiber bundler is at the other end of the optical fiber group.
- 214 becoming a uniform linear light source; the measurement beam enters the inside of the housing of the optical sampling part 220 through the optical hole 221, and passes through the first side of the dispersion lens group 222 (the left side as shown in Figure 2, that is, the light only passes through One side enters the dispersion lens group 222), and is illuminated from the illumination surface measuring surface S provided at the front end of the housing.
- the dispersive lens group 222 is a lens involved in the spectral confocal sensor and produces axial chromatic aberration. Specifically, the dispersion lens group 222 focuses the light incident on the optical sampling part 220 at a focus position corresponding to the wavelength on the optical axis, so that the light beams of different wavelengths contained in the corresponding light source are converged to different focus positions.
- the light source includes continuous visible light beams in a certain wavelength range. For example, the three color light beams of red, green and blue are separated from each other and emitted from the illumination surface of the housing to the surface to be measured S. It should be noted that light of other colors and other wavelengths may also be emitted. .
- the measurement beam is reflected by the surface S to be measured, passes through the dispersion lens group 222, and is emitted from the second side of the dispersion lens group 222 (i.e., the right side shown in Figure 2). Only the light focused on the surface of the object to be measured can pass through.
- the hole 221 propagates in the second optical fiber group 262 of the second linear bundler 261 (combined with FIG. 5 ), and the reflected light is collected into the measurement part 230 in the form of a linear light source.
- this light path control method only the light beam with a specific wavelength located on the confocal line can pass through the measurement surface and enter the dispersion lens group 222 and finally enter the measurement part 230 (imaging system) through the optical hole 221.
- the non-compliant light beam cannot enter the measurement part, so it is effective. Reduce the interference of other reflection wavelengths outside the confocal line, making the test more sensitive and improving the measurement accuracy.
- light may be incident from the right side of the dispersive lens group 222 and emitted from the left side of the dispersive lens group 222 .
- the measurement part 230 includes a spectrometer 240, a sensor 250, and a processor (not shown).
- the spectrometer 240 is used to receive and process the reflected light from the optical sampling part 220.
- the sensor 250 is used to convert the reflected light from the spectrometer 240 into an electrical signal.
- the processor is used to calculate the measurement result based on the electrical signal from the sensor 250. .
- the beam splitter 240 includes a collimating mirror 241 , a diffraction grating 242 , and a focusing mirror 243 .
- the collimator 241 causes the measurement beam emitted from the light exit hole to be substantially collimated and irradiated onto the diffraction grating 242 .
- the diffraction grating 242 diffracts the substantially collimated irradiated measurement beam.
- the focusing mirror 243 images the diffracted light diffracted by the diffraction grating 242 on sensor 250.
- +1st order diffracted light is imaged on sensor 250, but other diffracted light, such as -1st order diffracted light, may also be imaged.
- the specific structure of the diffraction grating 242 is not limited.
- the focusing mirror 243 is a lens with small chromatic aberration, and can image the diffracted light on the sensor 250 regardless of the wavelength of the measurement light.
- the specific structure of the sensor 250 is not limited. For example, a CMOS line sensor or an area array CCD line sensor can be used.
- the sensor 250 converts the measurement light into an electrical signal and transmits it to the processor. Based on the received signal (including X direction and Y direction), the processor can calculate the position information and height information of the object to be measured. As a result, this device can obtain the position information and height information of all points on a confocal line at one time, and only needs to perform one-dimensional scanning to obtain the position and height information of the entire measured object surface, thereby achieving efficient sampling.
- the specific calculation method can refer to the existing technology and will not be described in detail here.
- FIG. 3 shows the second embodiment of the spectral confocal measurement device 300 of the present application.
- the difference between the device in this embodiment and the first embodiment lies in the light source assembly 310.
- the light source assembly 310 includes a light source 311 and a focusing lens group 312 located between the light source 311 and the optical hole 211 .
- the light source 311 may be a point light source or a linear light source, such as an LED light source, a laser, or other light sources such as mercury vapor. Specifically, the light source 311 emits a continuous visible light beam including different wavelengths from a blue wavelength range to a red wavelength range as a measurement light beam.
- the focused light After the measurement beam passes through the focusing lens group 312, the focused light enters the optical hole 211 in the form of a linear light source and then enters the dispersion lens group 212.
- Other optical paths, light measurement, etc. are the same as those in the first embodiment and will not be described again here.
- Figure 6 shows the third embodiment of the spectral confocal measurement device 600 of the present application.
- the main difference between the device in this embodiment and the first and second embodiments lies in the incident light path and reflection light path of light passing through the dispersion lens group.
- the incident light emitted by the light source assembly 610 enters the central area of the dispersion lens group 622 from the optical hole 621 in the form of a linear light source (the dotted line refers to the incident light path) and converges on different measurement surfaces of the object to be measured.
- the surrounding area of the lens group 622 outputs reflected light (the solid line indicates the outgoing light path), and the reflected light enters the measurement part 630 through the optical hole 621 to obtain the measurement result.
- the light source component 610 and the measurement part 630 can be selected from the first embodiment, the second embodiment, or the modifications of the first and second embodiments according to the actual situation.
- Linear optical fibers can also be used to transmit and/or receive light.
- the positions of the light source assembly 610 and the measurement part 630 in this embodiment can be replaced, that is, the incident light path passes through the surrounding area of the dispersion lens 622 (indicated by the solid line), and the outgoing light path It is the central area (indicated by the dotted line) passing through the dispersion lens group 622.
- Figure 7 shows the fourth embodiment of the spectral confocal measurement device 700 of the present application.
- the light entrance hole 721 and the light exit hole 721' are different light holes and are respectively arranged at different positions of the dispersion lens group 722.
- the optical sampling part also includes a reflecting mirror 725 located above the dispersion lens group 722 .
- the light entrance hole 721 is located between the light source assembly 710 and the dispersion lens group 722, and the light exit hole 721' is located between the reflector 725 and the measurement part 730.
- the incident light emitted by the light source assembly 710 enters the surrounding area of the dispersion lens group 722 from the light entrance hole 721 in the form of a linear light source (the solid line refers to the incident light path) and converges on different measurement surfaces of the object to be measured.
- the central area of the dispersive lens group 722 outputs reflected light (the dotted line indicates the output light path), and the reflected light passes through the light exit hole 721' through the reflector 725 and enters the measurement part 730 to obtain the measurement result.
- the light source component 710 and the measurement part 730 can be selected from the first embodiment, the second embodiment, or the modifications of the first and second embodiments according to the actual situation.
- Linear optical fibers can also be used to transmit and/or receive light.
- the positions of the light source assembly 710 and the measurement part 730 in this embodiment can be replaced, that is, the incident light path passes through the central area of the dispersion lens 722 (indicated by the dotted line), and the outgoing light path is Passing through the surrounding area of the dispersion lens group 722 (indicated by the solid line).
- the incident light of the spectral confocal measurement device of the present application enters the first side of the dispersive lens group from the light entrance hole in the form of a linear light source and converges on different measurement surfaces of the object to be measured.
- the dispersive lens group does not overlap the first side of the dispersive lens group.
- the second side of one side outputs reflected light, and the reflected light enters the measurement part through the light outlet to obtain the measurement result.
- the spectral confocal detection is performed using a line light source, and the measurements of all points on a confocal line are obtained at one time.
- the sampling efficiency is greatly improved; moreover, light is incident from the first side of the dispersive lens group and reflected from the second side of the dispersive lens group.
- the incident light path and the reflection light path do not overlap or are inverse, thus filtering the target
- the reflected light of non-focused wavelengths on the surface of the measuring object improves the spectral purity of the emitted light, thereby improving the signal-to-noise ratio of the device and improving the measurement accuracy.
- the device has a simple structure and reduces production costs.
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Abstract
Description
本申请涉及一种光学位移测量技术领域,尤其涉及一种光谱共焦测量装置。The present application relates to the technical field of optical shift measurement, and in particular to a spectral confocal measurement device.
近年来,随着精密制造业的飞速发展,对测量技术的要求也大大提高。光谱共焦传感器为一种基于波长位移调制的非接触式位移传感器,由于其测量精度达到亚微米、甚至纳米级别,且对物体倾斜、表面纹理等不敏感,还具有较强的抗杂散光能力,其迅速成为当前研究的热点,广泛应用于薄膜厚度测量、精密定位、精密仪器制造等领域。In recent years, with the rapid development of precision manufacturing, the requirements for measurement technology have also greatly increased. The spectral confocal sensor is a non-contact displacement sensor based on wavelength shift modulation. Because its measurement accuracy reaches the submicron or even nanometer level, it is not sensitive to object tilt, surface texture, etc., and it also has strong resistance to stray light. , which has quickly become a hot spot in current research and is widely used in fields such as film thickness measurement, precision positioning, and precision instrument manufacturing.
基于光谱共焦技术的光谱共焦测量系统使用光源照射到被测物体表面,由CCD工业相机或光谱仪等探测反射回来的光谱信息,确定聚焦在物体表面的峰值波长,从而获得待测物体表面的轴向距离信息。其原理是利用色散透镜组,使光源光线在经过色散透镜组聚焦后发生色散,在光轴上形成连续的,且到色散透镜组的距离互不相同的单色光焦点,从而建立起波长与轴向距离的线形关系,再利用经待测物体表面反射后的光谱信息得到相应的位置信息。The spectral confocal measurement system based on spectral confocal technology uses a light source to illuminate the surface of the object to be measured, and a CCD industrial camera or spectrometer detects the reflected spectral information to determine the peak wavelength focused on the object surface, thereby obtaining the surface of the object to be measured. Axial distance information. The principle is to use a dispersive lens group to cause the light source light to be dispersed after being focused by the dispersive lens group, forming a continuous monochromatic light focus on the optical axis with different distances from the dispersive lens group, thus establishing a wavelength and Based on the linear relationship of the axial distance, the corresponding position information is obtained by using the spectral information reflected by the surface of the object to be measured.
图1展示一种现有的光谱共焦测量装置,从光源1’发射光,进入耦合部2’后传递到采样部3’,再投射到被测物4’,在被测物4’的表面形成载有测量信息的反射光后沿着原有的光路反向返回耦合部2’,其中部分或全部反射光经过分光部5’后,最终由传感部6’转换成电信号,以解析获取位置测量结果。该种测量装置采用单点光谱共焦检测,一次只能得到一个物点的高度信息。如要获得整个面上的位置和高度信息则需要在两个方向上扫描,导致采样效率低。而且,反射光是沿着入射的光路反向返回入光孔,导致入光孔接收的光谱出现杂光,从而导致降低装置的信噪比,影响测量精度。Figure 1 shows an existing spectral confocal measurement device. Light is emitted from the light source 1', enters the coupling part 2', and then passes to the sampling part 3', and then is projected to the measured object 4'. The reflected light carrying measurement information is formed on the surface and then returns to the coupling part 2' along the original optical path. After part or all of the reflected light passes through the spectroscopic part 5', it is finally converted into an electrical signal by the sensing part 6', so as to Parse and obtain position measurement results. This kind of measurement device uses single-point spectral confocal detection, and can only obtain height information of one object point at a time. If you want to obtain the position and height information of the entire surface, you need to scan in two directions, resulting in low sampling efficiency. Moreover, the reflected light returns to the light aperture in the opposite direction along the incident light path, causing stray light to appear in the spectrum received by the light aperture, thereby reducing the signal-to-noise ratio of the device and affecting the measurement accuracy.
因此,亟待一种改进的光谱共焦测量装置,以克服以上缺陷。Therefore, an improved spectral confocal measurement device is urgently needed to overcome the above defects.
申请内容Application content
本申请的一个目的在于提供一种光谱共焦测量装置,以提高采样效率,提高信噪比,最终提高测量精度。One purpose of this application is to provide a spectral confocal measurement device to improve sampling efficiency, improve signal-to-noise ratio, and ultimately improve measurement accuracy.
为了实现上述目的,本申请提供一种光谱共焦测量装置,包括用于发出入射光的光源组件、与所述光源组件连接的光学采样部及测量部,其特征在于:所述光学采样部包括入光孔、出光孔以及色散透镜组,所述光源组件和所述光学采样部被配置以使得所述入射光以线光源的形式从所述入光孔进入所述色散透镜组的第一侧并聚于待测物体的不同的测量表面,所述色散透镜组的第二侧输出反射光,所述反射光通过所述出光孔进入所述测量部以获得测量结果,其中所述第一侧和所述第二侧不存在重叠。In order to achieve the above object, the present application provides a spectral confocal measurement device, which includes a light source component for emitting incident light, an optical sampling part and a measurement part connected to the light source component, characterized in that: the optical sampling part includes A light entrance aperture, a light exit aperture and a dispersion lens group, the light source assembly and the optical sampling part are configured so that the incident light enters the first side of the dispersion lens group from the light entrance aperture in the form of a linear light source And focused on different measurement surfaces of the object to be measured, the second side of the dispersion lens group outputs reflected light, and the reflected light enters the measurement part through the light outlet to obtain the measurement result, wherein the first side There is no overlap with the second side.
可选地,所述出光孔和所述入光孔为同一光孔,所述光孔位于所述光源组件和所述色散透镜组之间。Optionally, the light exit hole and the light entrance hole are the same light hole, and the light hole is located between the light source assembly and the dispersion lens group.
作为一个优选实施例,所述光源组件包括光源、第一光纤组、分别与所述第一光纤组连接的光纤耦合器以及第一线形光纤集束器,所述第一线形光纤集束器位于所述光孔和所述光源之间用以使所述入射光以线光源的形式进入所述色散透镜组的一侧。As a preferred embodiment, the light source assembly includes a light source, a first optical fiber group, optical fiber couplers respectively connected to the first optical fiber group, and a first linear optical fiber bundler. The first linear optical fiber bundler is located at A side between the light hole and the light source is used to allow the incident light to enter the dispersive lens group in the form of a linear light source.
可选地,所述光孔为狭缝或销孔。Optionally, the light hole is a slit or a pin hole.
较佳地,所述反射光以线光源的形式进入所述测量部。Preferably, the reflected light enters the measurement part in the form of a linear light source.
较佳地,所述光孔和所述测量部之间设有第二光纤组和第二线形光纤集束器,所述反射光通过所述光孔和所述第二光纤组和所述第二线形光纤集束器进入所述测量部。Preferably, a second optical fiber group and a second linear optical fiber bundler are provided between the optical hole and the measurement part, and the reflected light passes through the optical hole, the second optical fiber group and the second optical fiber bundle. A linear optical fiber bundle enters the measurement section.
较佳地,所述第一光纤组的多条光纤在所述第一线形光纤集束器中以线形排列;或所述第二光纤组的多条光纤在所述第二线形光纤集束器中以线形排列。Preferably, the plurality of optical fibers of the first optical fiber group are linearly arranged in the first linear optical fiber bundler; or the multiple optical fibers of the second optical fiber group are arranged in the second linear optical fiber bundler. Arranged in a linear format.
作为另一优选实施例,所述光源组件包括光源以及位于所述光源和所述光孔之间的聚焦透镜组。As another preferred embodiment, the light source assembly includes a light source and a focusing lens group located between the light source and the light aperture.
可选地,所述光源发出的光为点光源或线光源。Optionally, the light emitted by the light source is a point light source or a linear light source.
可选地,所述色散透镜组的第一侧为左侧或右侧,相应地,所述色散透镜的第二侧为相反于且不重叠于所述第一侧的右侧或左侧。Optionally, the first side of the dispersive lens group is the left or right side, and accordingly, the second side of the dispersive lens is the right side or left side that is opposite to and does not overlap the first side.
可选地,所述色散透镜组的第一侧为中心区域,所述色散透镜组的第二侧为不重叠于所述中心区域的四周区域;或所述色散透镜组的第一侧为四周区域,所述色散透镜组的第二侧为不重叠于所述四周区域的中心区域。Optionally, the first side of the dispersive lens group is the central area, and the second side of the dispersive lens group is the surrounding area that does not overlap the central area; or the first side of the dispersive lens group is the surrounding area. area, the second side of the dispersive lens group is a central area that does not overlap with the surrounding areas.
较佳地,所述出光孔和所述入光孔为不同位置的光孔,所述光学采样部还包括位于所述色散透镜组的上方的反射镜,所述入光孔位于所述光源组件和所述色散透镜组之间,所述出光孔位于所述反射镜和所述测量部之间。Preferably, the light exit hole and the light entrance hole are light holes in different positions, the optical sampling part further includes a reflector located above the dispersion lens group, and the light entrance hole is located in the light source assembly. and the dispersion lens group, and the light exit hole is located between the reflector and the measurement part.
较佳地,所述测量部包括:Preferably, the measurement part includes:
分光器,用于接收并处理来自所述光学采样部的所述反射光;A spectrometer for receiving and processing the reflected light from the optical sampling part;
传感器,用于将来自所述分光器的所述反射光转换成电信号;以及a sensor for converting the reflected light from the beam splitter into an electrical signal; and
处理器,用于根据来自所述传感器的所述电信号计算测量结果。A processor for calculating measurements based on the electrical signals from the sensor.
较佳地,分光器包括:Preferably, the optical splitter includes:
准直镜,用于将来自所述光学采样部的所述反射光准直折射;A collimating mirror, used to collimate and refract the reflected light from the optical sampling part;
衍射光栅,用于使来自所述准直镜的所述反射光发生衍射;以及a diffraction grating for diffracting the reflected light from the collimating mirror; and
聚焦镜,用于将衍射后的所述反射光聚焦到所述传感器。A focusing mirror is used to focus the diffracted reflected light onto the sensor.
与现有技术相比,本申请的光谱共焦测量装置的入射光以线光源的形式从光孔进入色散透镜组的第一侧并聚于待测物体的不同的测量表面,色散透镜组的不重叠于第一侧的第二侧输出反射光,反射光通过光孔进入测量部而获得测量结果,也就是说,采用线光源的方式进行光谱共焦检测,一次性获得了一条共焦线上所有点的位置信息和高度信息,因此采样效率大大提高;而且,光从色散透镜组的第一侧入射,从色散透镜组的第二侧反射,入射和反射光路不重叠也不相逆,从而过滤被测物表面非聚焦波长的反射光线,使得射出的光线的光谱纯净度得以提高,从而提高装置的信噪比,提高测量精度。Compared with the prior art, the incident light of the spectral confocal measurement device of the present application enters the first side of the dispersive lens group from the optical hole in the form of a line light source and focuses on different measurement surfaces of the object to be measured. The second side that does not overlap with the first side outputs reflected light, and the reflected light enters the measurement part through the light hole to obtain the measurement result. In other words, a line light source is used for spectral confocal detection, and a confocal line is obtained at one time Position information and height information of all points on the lens, so the sampling efficiency is greatly improved; moreover, light is incident from the first side of the dispersive lens group and reflected from the second side of the dispersive lens group. The incident and reflected optical paths do not overlap or are inverse. Thereby filtering the reflected light of non-focused wavelengths on the surface of the measured object, so that the spectral purity of the emitted light can be improved, thus improving the signal-to-noise ratio of the device and improving the measurement accuracy.
通过以下的描述并结合附图,本申请将变得更加清晰,这些附图用于解释本申请的实施例。The present application will become clearer through the following description in conjunction with the accompanying drawings, which are used to explain embodiments of the present application.
图1为传统的光谱共焦测量装置的结构示意图。Figure 1 is a schematic structural diagram of a traditional spectral confocal measurement device.
图2为本申请光谱共焦测量装置的第一实施例的结构示意图。Figure 2 is a schematic structural diagram of the first embodiment of the spectral confocal measurement device of the present application.
图3为本申请光谱共焦测量装置的第二实施例的结构示意图。Figure 3 is a schematic structural diagram of a second embodiment of the spectral confocal measurement device of the present application.
图4为本申请光谱共焦测量装置的光纤组的排列示意图。Figure 4 is a schematic diagram of the arrangement of the optical fiber group of the spectral confocal measurement device of the present application.
图5为本申请光谱共焦测量装置的第二光纤组、第二线形光纤集束器和测量部的连接示意图。Figure 5 is a schematic diagram of the connection between the second optical fiber group, the second linear optical fiber bundler and the measurement part of the spectral confocal measurement device of the present application.
图6为本申请光谱共焦测量装置的第三实施例的结构示意图。Figure 6 is a schematic structural diagram of a third embodiment of the spectral confocal measurement device of the present application.
图7为本申请光谱共焦测量装置的第四实施例的结构示意图。Figure 7 is a schematic structural diagram of the fourth embodiment of the spectral confocal measurement device of the present application.
下面将参考附图阐述本申请几个不同的最佳实施例,其中不同图中相同的标号代表相同的部件。如上所述,本申请的实质在于提供一种改进的光谱共焦测量装置,以提高采样效率、提高测量精度、降低生产成本。Several different preferred embodiments of the present application will be described below with reference to the accompanying drawings, wherein the same reference numerals in different figures represent the same components. As mentioned above, the essence of this application is to provide an improved spectral confocal measurement device to improve sampling efficiency, improve measurement accuracy, and reduce production costs.
请参考图2,本申请的光谱共焦测量装置200的一个实施例包括光源组件210、光学采样部220、测量部230。该光源组件210用于射出具有一定波长范围的宽光谱光束以作为入射光。光学采样部220包括供入光和出光的光孔221以及用于实现光源色散的色散透镜组222。光源组件210和光学采样部220被配置以使得入射光以线光源的形式从光孔221进入色散透镜组222的第一侧并聚于待测物体的不同的测量表面,色散透镜组222的第二侧输出反射光,反射光通过光孔221进入测量部230以获得测量结果。Please refer to FIG. 2 . One embodiment of the spectral
需注意的是,本说明书中所指的“第一侧”和“第二侧”,为色散透镜组上的不存在重叠的两个区域,可为相对的左、右侧,也可为中心区域和四周区域。本实施例中可理解为图示的左侧和右侧。不重叠之两侧区域,分别供入射光和反射光通过,以保证穿过色散透镜组的入射光路和反射光路完全不同且完全不重叠。It should be noted that the "first side" and "second side" referred to in this specification are two non-overlapping areas on the dispersion lens group, which can be the opposite left and right sides, or the center. area and surrounding area. In this embodiment, it can be understood as the left and right sides of the figure. The non-overlapping two side areas allow incident light and reflected light to pass through respectively to ensure that the incident light path and reflected light path passing through the dispersion lens group are completely different and do not overlap at all.
需注意的是,在本实施例中,出光孔和入光孔为同一个光孔221,但在其他实施例并不受此限制。具体地,在图2的实施例中,光源组件210由壳体210a封装,其包括光源211、第一光纤组212、分别与所述第一光纤组212连接的光 纤耦合器213以及第一线形光纤集束器214。该所述第一线形光纤集束器214位于光孔221和光源211之间用以使入射光以线光源的形式进入色散透镜组222的一侧。优选地,该光源211可为宽光谱白光LED光源,通过光纤耦合器213耦合到第一线形光纤集束器214和第一光纤组212中,以将入射光整合成线形。更具体地,第一光纤组212的两端分别设置第一线形光纤集束器214,第一光纤组212的多条光纤在第一线形光纤集束器214中以线形排列(参考图4),从而使得入射光以线光源的形式通过光孔221进入色散透镜组222的一侧。可选地,第一光纤组212内可设置至少一根光纤,或多根光纤紧密排列成线形或矩形。It should be noted that in this embodiment, the light exit hole and the light entrance hole are the same
如图2所示,光学采样部220由壳体220a封装,包括供入光和出光的光孔221以及用于实现光源色散的色散透镜组222。具体地,光孔221设置在壳体220a上,色散透镜组222设于壳体220a之内。该光孔221同时作为入光孔和出光孔,分别与外部的第一线形光纤集束器214、第二线形光纤集束器261的接口相连以供入射光和反射光通过。光学采样部220的壳体220a形状可依照实际需求而设定,并不受限制。可选地,光孔221可选用狭缝或销孔来实现。优选采用狭缝的形式,以更好地滤除杂散光。As shown in FIG. 2 , the
具体地,光源组件210通过光源211将测量光束反射并通过光纤耦合器213耦合到第一线形光纤集束器214,光线在光纤中传播,在光纤组的另一端的第一线形光纤集束器214射出,成均匀的线光源;该测量光束通过光孔221进入光学采样部220的壳体内部,穿过色散透镜组222的第一侧(如图2所示的左侧,即光线仅从一侧进入色散透镜组222),并且从壳体的前端设置的照射面测量表面S照射。色散透镜组222为针对光谱共焦传感器所涉及的透镜且产生轴向色像差。具体地,色散透镜组222使入射到光学采样部220的光会聚在光轴上与波长相对应的聚焦位置处,因此对应光源中所包含的不同波长的光束被会聚到不同的聚焦位置。光源中包括一定波长范围的连续可见光束,例如红绿蓝三个颜色的光束彼此分离,并且从壳体的照射面向待测表面S射出,应当注意的是,也可能射出其他颜色其他波长的光。Specifically, the
测量光束经过待测表面S反射经过色散透镜组222,从色散透镜组的222的第二侧(即图2所示的右侧)射出,只有聚焦到被测物表面的光才能够透过 光孔221在第二线形集束器261的第二光纤组262中传播(结合图5),反射光以线光源的形式被收集进入测量部230。此种光路控制方式,只有位于共焦线上特定波长的光束才能经过测量表面进入色散透镜组222最后经由光孔221进入测量部230(成像系统),不符合的光束无法进入测量部,因此有效减小共焦线外其它反射波长的干扰,使测试灵敏度更高,测量精度提高。当然,在其他实施例中,光线可以从色散透镜组222的右侧入射,从色散透镜组222的左侧射出。The measurement beam is reflected by the surface S to be measured, passes through the
具体地,在一个实施例中,测量部230包括分光器240、传感器250及处理器(未示出)。该分光器240用于接收并处理来自光学采样部220的反射光,传感器250用于将来自分光器240的反射光转换成电信号,处理器则用于根据来自传感器250的电信号计算测量结果。Specifically, in one embodiment, the
作为一个优选实施例,如图2所示,该分光器240包括准直镜241、衍射光栅242、聚焦镜243。准直镜241使得从出光孔射出的测量光束大致准直地照射到衍射光栅242上,衍射光栅242使大致准直照射的测量光束发生衍射,聚焦镜243使由衍射光栅242衍射的衍射光成像在传感器250上。通常,使+1阶衍射光在传感器250上成像,但也可以对例如-1阶衍射光等的其它衍射光进行成像。应当注意的是,衍射光栅242的具体结构不受限制。应当注意的是,聚焦镜243是色像差小的透镜,并且能够与测量光的波长无关地使衍射光成像在传感器250上。As a preferred embodiment, as shown in FIG. 2 , the
传感器250的具体结构并不受限制,例如可使用CMOS线传感器或面阵CCD线传感器等,传感器250将测量光转换成电信号,并传送至处理器。基于接收到的信号(包括X方向和Y方向),处理器可计算待测物体的位置信息和高度信息。由此,本装置可一次性获得一条共焦线上所有点的位置信息和高度信息,只需要再进行一维的扫描就可获得整个被测物体表面的位置和高度信息,从而实现高效的采样。具体的计算方法可参考现有技术,在此不详述。The specific structure of the
图3展示了本申请光谱共焦测量装置300的第二实施例。本实施例中的装置与第一实施例的区别在于光源组件310。该光源组件310包括光源311以及位于光源311和光孔211之间的聚焦透镜组312。该光源311可为点光源或线光源, 例如LED光源、激光或例如汞蒸汽等等其他光源。具体地,该光源311射出包括具有从蓝色波长范围到红色波长范围的不同波长的连续可见光束来作为测量光束。测量光束通过聚焦透镜组312后,聚焦光以线光源形式进入光孔211继而进入到色散透镜组212中。其他光路以及光线测量等与第一实施例相同,在此不赘述。Figure 3 shows the second embodiment of the spectral
图6展示了本申请光谱共焦测量装置600的第三实施例。本实施例中的装置与第一实施例、第二实施例的主要区别在于光线穿过色散透镜组的入射光路和反射光路。本实施例中,光源组件610发出的入射光以线光源的形式从光孔621进入色散透镜组622的中心区域(虚线所指为入射光路)并聚于待测物体的不同的测量表面,色散透镜组622的四周区域输出反射光(实线所指为出射光路),反射光通过光孔621进入测量部630以获得测量结果。其中,光源组件610和测量部630可依照实际情况选用第一实施例、第二实施例或第一、第二实施例之变形形式。同样可以采用线性光纤进行发射和/或接收光线。Figure 6 shows the third embodiment of the spectral
另外,在另一个实施例中,可将本实施例中的光源组件610和测量部630的位置置换,即,入射光路为穿过色散透镜622的四周区域(实线所指),出射光路为穿过色散透镜组622的中心区域(虚线所指)。In addition, in another embodiment, the positions of the
图7展示了本申请光谱共焦测量装置700的第四实施例。与以上实施例不同的是,入光孔721和出光孔721’为不同的光孔,分别设置在色散透镜组722的不同位置。为了保证光的正确导向,光学采样部还包括位于色散透镜组722上方的反射镜725。入光孔721位于光源组件710和色散透镜组722之间,出光孔721’位于反射镜725和测量部730之间。本实施例中,光源组件710发出的入射光以线光源的形式从入光孔721进入色散透镜组722的四周区域(实线所指为入射光路)并聚于待测物体的不同的测量表面,色散透镜组722的中心区域输出反射光(虚线所指为出射光路),反射光通过反射镜725穿过出光孔721’进入测量部730以获得测量结果。其中,光源组件710和测量部730可依照实际情况选用第一实施例、第二实施例或第一、第二实施例之变形形式。同样可以采用线性光纤进行发射和/或接收光线。Figure 7 shows the fourth embodiment of the spectral
另外,在另一个实施例中,可将本实施例中的光源组件710和测量部730的位置置换,即,入射光路为穿过色散透镜722的中心区域(虚线所指),出射光路为穿过色散透镜组722的四周区域(实线所指)。In addition, in another embodiment, the positions of the
综上,本申请的光谱共焦测量装置入射光以线光源的形式从入光孔进入色散透镜组的第一侧并聚于待测物体的不同的测量表面,色散透镜组的不重叠于第一侧的第二侧输出反射光,反射光通过出光孔进入测量部而获得测量结果,也就是说,采用线光源的方式进行光谱共焦检测,一次性获得了一条共焦线上所有点的位置信息和高度信息,因此采样效率大大提高;而且,光从色散透镜组的第一侧入射,从色散透镜组的第二侧反射,入射光路和反射光路不重叠也不相逆,从而过滤被测物表面非聚焦波长的反射光线,使得射出的光线的光谱纯净度得以提高,从而提高装置的信噪比,提高测量精度。再且,该装置结构简单,降低生产成本。In summary, the incident light of the spectral confocal measurement device of the present application enters the first side of the dispersive lens group from the light entrance hole in the form of a linear light source and converges on different measurement surfaces of the object to be measured. The dispersive lens group does not overlap the first side of the dispersive lens group. The second side of one side outputs reflected light, and the reflected light enters the measurement part through the light outlet to obtain the measurement result. In other words, the spectral confocal detection is performed using a line light source, and the measurements of all points on a confocal line are obtained at one time. position information and height information, so the sampling efficiency is greatly improved; moreover, light is incident from the first side of the dispersive lens group and reflected from the second side of the dispersive lens group. The incident light path and the reflection light path do not overlap or are inverse, thus filtering the target The reflected light of non-focused wavelengths on the surface of the measuring object improves the spectral purity of the emitted light, thereby improving the signal-to-noise ratio of the device and improving the measurement accuracy. Furthermore, the device has a simple structure and reduces production costs.
以上所揭露的仅为本申请的较佳实施例而已,当然不能以此来限定本申请之权利范围,因此依本申请专利范围所作的等同变化,仍属本申请所涵盖的范围。The above disclosures are only preferred embodiments of the present application. Of course, they cannot be used to limit the scope of rights of the present application. Therefore, equivalent changes made according to the patent scope of the present application are still within the scope of the present application.
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| CN119642722A (en) * | 2024-12-19 | 2025-03-18 | 合肥工业大学 | Overlapping response separation and peak value positioning method for thickness measurement of ultrathin multilayer transparent material in spectral confocal |
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| US20190101375A1 (en) * | 2017-10-02 | 2019-04-04 | Omron Corporation | Confocal measurement device |
| CN110260799A (en) * | 2019-07-29 | 2019-09-20 | 海伯森技术(深圳)有限公司 | A kind of Spectral Confocal displacement sensor |
| CN110849271A (en) * | 2019-12-23 | 2020-02-28 | 海伯森技术(深圳)有限公司 | Spectral confocal measurement system and method |
| CN110887450A (en) * | 2019-12-23 | 2020-03-17 | 海伯森技术(深圳)有限公司 | Object surface three-dimensional information measuring system and method based on spectrum confocal |
| CN111879239A (en) * | 2020-06-11 | 2020-11-03 | 东莞市神州视觉科技有限公司 | Spectrum confocal measuring device and measuring method |
-
2023
- 2023-01-07 WO PCT/CN2023/071125 patent/WO2023185199A1/en not_active Ceased
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| US20120019821A1 (en) * | 2010-07-23 | 2012-01-26 | National Taipei University Of Technology | Linear chromatic confocal microscopic system |
| US20190101375A1 (en) * | 2017-10-02 | 2019-04-04 | Omron Corporation | Confocal measurement device |
| CN110260799A (en) * | 2019-07-29 | 2019-09-20 | 海伯森技术(深圳)有限公司 | A kind of Spectral Confocal displacement sensor |
| CN110849271A (en) * | 2019-12-23 | 2020-02-28 | 海伯森技术(深圳)有限公司 | Spectral confocal measurement system and method |
| CN110887450A (en) * | 2019-12-23 | 2020-03-17 | 海伯森技术(深圳)有限公司 | Object surface three-dimensional information measuring system and method based on spectrum confocal |
| CN111879239A (en) * | 2020-06-11 | 2020-11-03 | 东莞市神州视觉科技有限公司 | Spectrum confocal measuring device and measuring method |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN119224981A (en) * | 2024-12-05 | 2024-12-31 | 浙江大学 | An ultra-high precision spectral confocal measurement lens and spectral confocal displacement sensor |
| CN119642722A (en) * | 2024-12-19 | 2025-03-18 | 合肥工业大学 | Overlapping response separation and peak value positioning method for thickness measurement of ultrathin multilayer transparent material in spectral confocal |
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