WO2022136188A1 - Microsystème électromécanique - Google Patents
Microsystème électromécanique Download PDFInfo
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- WO2022136188A1 WO2022136188A1 PCT/EP2021/086648 EP2021086648W WO2022136188A1 WO 2022136188 A1 WO2022136188 A1 WO 2022136188A1 EP 2021086648 W EP2021086648 W EP 2021086648W WO 2022136188 A1 WO2022136188 A1 WO 2022136188A1
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- WO
- WIPO (PCT)
- Prior art keywords
- electromechanical
- deformable membrane
- free zone
- deformable
- cavity
- Prior art date
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Classifications
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B81—MICROSTRUCTURAL TECHNOLOGY
- B81B—MICROSTRUCTURAL DEVICES OR SYSTEMS, e.g. MICROMECHANICAL DEVICES
- B81B3/00—Devices comprising flexible or deformable elements, e.g. comprising elastic tongues or membranes
- B81B3/0035—Constitution or structural means for controlling the movement of the flexible or deformable elements
- B81B3/0051—For defining the movement, i.e. structures that guide or limit the movement of an element
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B81—MICROSTRUCTURAL TECHNOLOGY
- B81B—MICROSTRUCTURAL DEVICES OR SYSTEMS, e.g. MICROMECHANICAL DEVICES
- B81B3/00—Devices comprising flexible or deformable elements, e.g. comprising elastic tongues or membranes
- B81B3/0035—Constitution or structural means for controlling the movement of the flexible or deformable elements
- B81B3/0037—For increasing stroke, i.e. achieve large displacement of actuated parts
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B81—MICROSTRUCTURAL TECHNOLOGY
- B81C—PROCESSES OR APPARATUS SPECIALLY ADAPTED FOR THE MANUFACTURE OR TREATMENT OF MICROSTRUCTURAL DEVICES OR SYSTEMS
- B81C1/00—Manufacture or treatment of devices or systems in or on a substrate
- B81C1/00015—Manufacture or treatment of devices or systems in or on a substrate for manufacturing microsystems
- B81C1/00341—Processes for manufacturing microsystems not provided for in groups B81C1/00023 - B81C1/00261
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- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B26/00—Optical devices or arrangements for the control of light using movable or deformable optical elements
- G02B26/004—Optical devices or arrangements for the control of light using movable or deformable optical elements based on a displacement or a deformation of a fluid
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B26/00—Optical devices or arrangements for the control of light using movable or deformable optical elements
- G02B26/08—Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the direction of light
- G02B26/0816—Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the direction of light by means of one or more reflecting elements
- G02B26/0833—Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the direction of light by means of one or more reflecting elements the reflecting element being a micromechanical device, e.g. a MEMS mirror, DMD
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B26/00—Optical devices or arrangements for the control of light using movable or deformable optical elements
- G02B26/08—Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the direction of light
- G02B26/0816—Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the direction of light by means of one or more reflecting elements
- G02B26/0833—Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the direction of light by means of one or more reflecting elements the reflecting element being a micromechanical device, e.g. a MEMS mirror, DMD
- G02B26/0858—Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the direction of light by means of one or more reflecting elements the reflecting element being a micromechanical device, e.g. a MEMS mirror, DMD the reflecting means being moved or deformed by piezoelectric means
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N30/00—Piezoelectric or electrostrictive devices
- H10N30/20—Piezoelectric or electrostrictive devices with electrical input and mechanical output, e.g. functioning as actuators or vibrators
- H10N30/204—Piezoelectric or electrostrictive devices with electrical input and mechanical output, e.g. functioning as actuators or vibrators using bending displacement, e.g. unimorph, bimorph or multimorph cantilever or membrane benders
- H10N30/2047—Membrane type
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B81—MICROSTRUCTURAL TECHNOLOGY
- B81B—MICROSTRUCTURAL DEVICES OR SYSTEMS, e.g. MICROMECHANICAL DEVICES
- B81B2201/00—Specific applications of microelectromechanical systems
- B81B2201/04—Optical MEMS
- B81B2201/042—Micromirrors, not used as optical switches
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B81—MICROSTRUCTURAL TECHNOLOGY
- B81B—MICROSTRUCTURAL DEVICES OR SYSTEMS, e.g. MICROMECHANICAL DEVICES
- B81B2203/00—Basic microelectromechanical structures
- B81B2203/01—Suspended structures, i.e. structures allowing a movement
- B81B2203/0127—Diaphragms, i.e. structures separating two media that can control the passage from one medium to another; Membranes, i.e. diaphragms with filtering function
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B81—MICROSTRUCTURAL TECHNOLOGY
- B81C—PROCESSES OR APPARATUS SPECIALLY ADAPTED FOR THE MANUFACTURE OR TREATMENT OF MICROSTRUCTURAL DEVICES OR SYSTEMS
- B81C2201/00—Manufacture or treatment of microstructural devices or systems
- B81C2201/01—Manufacture or treatment of microstructural devices or systems in or on a substrate
- B81C2201/0101—Shaping material; Structuring the bulk substrate or layers on the substrate; Film patterning
- B81C2201/0128—Processes for removing material
- B81C2201/013—Etching
- B81C2201/0132—Dry etching, i.e. plasma etching, barrel etching, reactive ion etching [RIE], sputter etching or ion milling
Definitions
- the present invention relates to the field of microelectromechanical systems. For example, it finds a particularly advantageous application in the actuation or displacement of objects, including over relatively large distances.
- the invention also finds application in the field of detection by contact. It can thus be implemented to produce sensors.
- microsystems that allow this.
- microsystems When these microsystems are actuators, their performance is evaluated in particular on the following parameters: the amplitude of the displacement, the force deployed and the precision of the displacement generated.
- microsystems When these microsystems are sensors, their performance is evaluated in particular on the following parameters: the ability to capture movement over a large amplitude.
- microsystems are actuators or sensors, we research that they offer good performance in terms of size, energy consumption and ability to work in frequency.
- An object of the present invention is to provide a micro-electromechanical system which has improved performance compared to existing solutions, at least for one of the parameters mentioned above, or which has a better compromise regarding at least two of the parameters mentioned above.
- a microelectromechanical system comprising: a. at least one electromechanical transducer comprising a movable part between a position of equilibrium, without stress, and a position out of equilibrium, under stress, b. at least one deformable membrane, c. a deformable cavity delimited by walls.
- At least a part of the deformable membrane forms at least a part of a first wall taken from among said walls of the cavity.
- the cavity is configured to hermetically contain a deformable medium capable of maintaining a substantially constant volume under the action of a change in external pressure exerted on the deformable medium through one of the walls of the cavity.
- the mobile part of the electromechanical transducer is configured so that its movement is a function of said change in external pressure or, conversely, that its movement induces a change in external pressure.
- Said at least part of the deformable membrane has at least one zone free to deform according to said change in external pressure.
- the microelectromechanical system is also such that said at least one free zone is configured to cooperate with an external member so that its deformation induces, or is induced by, a movement of the external member.
- a surface of the free zone of the deformable membrane is twice smaller than a surface of the mobile part of the electromechanical transducer.
- the electromechanical microsystem as introduced above is thus capable of moving the external member or of sensing a movement of this member, and this while having, in an easily adjustable manner depending on the intended applications, a sufficient capacity in terms of movement amplitude and/or sufficient capacity in terms of force deployed and/or movement capture capacity over a sufficient amplitude and/or sufficient capacity to work in frequency and/or a size compatible with the targeted applications, and/ or reduced energy consumption.
- the proposed solution allows the microelectromechanical system to form a so-called long-travel actuator, that is to say typically allowing movement of the external member over a stroke length of at least 30 ⁇ m, or even 100 pm.
- the proposed solution allows the microelectromechanical system to form a so-called large displacement sensor, typically allowing to capture a displacement whose amplitude is at least 30 pm, or even 100 pm.
- the free zone of the deformable membrane is configured to cooperate with the external organ via a finger, also referred to as a pin, fixed to said free zone.
- a finger also referred to as a pin
- the pin is fixed in contact with said free zone and more precisely in contact with an external face of the free zone.
- the pin is formed at the same time as the free zone of the deformable membrane is exposed. According to this latter preference, it is advantageously simpler to obtain the pin, and any risk of tearing of the deformable membrane is thus avoided, unlike a case in which the pin would be deposited, and more particularly added, on the membrane deformable.
- Another aspect of the invention relates to an opto-electromechanical system or microsystem comprising at least one electromechanical microsystem as introduced above and at least one optical microsystem.
- microelectromechanical system as introduced above, comprising, or even being limited to, ordinary deposition and etching steps in microelectronics.
- the microelectromechanical system can in fact be manufactured by ordinary microelectronics means, which gives its manufacturer all the advantages deriving from the use of these means, including great latitude in terms of dimensioning, adhesion energy between the different deposits, the thickness of the different deposits, the extent of etching, etc.
- the method for manufacturing the microelectromechanical system comprises the following steps: has. a step of forming, on a substrate, at least a portion of at least one electromechanical transducer, then b. a step of deposition of the deformable membrane, then c. a step of forming an open cavity on the deformable membrane, then d. a step of filling with the deformable medium and closing the cavity, and e. a step of etching the substrate to form a front face (FAV) of the microelectromechanical system.
- FAV front face
- FIG. 1A is a block diagram of a cross-sectional view of a micro-electromechanical system according to a first embodiment of the invention.
- FIG. 1B is a block diagram of a sectional view of a micro-electromechanical system according to a second embodiment of the invention.
- Figure 1C shows a top view of the first and second embodiments of the invention illustrated in Figures 1A and 1B.
- FIG. 2A schematically represents a sectional view of a micro-electromechanical system according to a third embodiment of the invention.
- FIG. 2B schematically represents a sectional view of a micro-electromechanical system according to a fourth embodiment of the invention.
- FIGS. 3A to 9A schematically represent steps of an example of a method for producing a microelectromechanical system as illustrated in FIG. 2A.
- FIGS. 3B to 9B schematically represent steps of an example of a method for producing a microelectromechanical system as illustrated in FIG. 2B.
- FIG. 10 schematically represents an opto-electromechanical microsystem comprising four microelectromechanical systems according to one embodiment of the invention.
- FIGS. 11 A and 11 B each schematically represent an opto-electro-mechanical microsystem according to one embodiment of the invention.
- the free zone is free to deform elastically according to said change in external pressure.
- microelectromechanical system as introduced above is preferably free of optical element, such as a lens, in particular with variable focal length.
- the free zone of the deformable membrane is configured to cooperate with the external organ via a pin, the latter can present the following optional characteristics which can possibly be used in combination or alternatively.
- the pin is attached to the center of the free zone of the deformable membrane. In this way, it is ensured that the movement of the pin is a translation movement perpendicular to the plane in which the wall of the cavity is inscribed, which is partly formed by the deformable membrane, when the membrane is not distorted.
- the pawn extends mainly in a longitudinal direction.
- the longitudinal direction of the pin is substantially perpendicular to a plane (xy) in which mainly extends an outer face of the membrane when the membrane is not deformed.
- the pin may have a cylindrical shape.
- the pin does not have a cylindrical shape. It may have a curved shape for example.
- the pawn has a first end by which it rests on the free zone and a second end opposite the first end.
- the pin extends between the first end and the second end mainly in a longitudinal direction.
- the pawn has a curved shape or extends in several different directions.
- the free zone has a central portion extending from a center of the free zone and a peripheral portion arranged around the central portion.
- the pawn rests with its first end on the central portion of the free zone.
- the pin can be configured to cooperate with the external member via a guide integral with the external member, so as to allow automatic positioning of the external member on the pin.
- the pin is configured to be able to be secured to the external member by gluing or magnetism.
- the adhesion energy of the pion on the free zone of the deformable membrane is greater than that of the pion on the external organ.
- a connection, possibly removable, of the pin and the external member is provided which is largely adjustable in terms of retaining force.
- At least part of the electromechanical transducer forms part of the wall of the cavity which is partly formed by the deformable membrane.
- the microelectromechanical system according to this characteristic has a non-through structure, leaving the other walls of the cavity free so as to be able to perform other functions therein or so as to allow them to remain inert, for an increased integration capacity in particular in an opto-electro-mechanical microsystem.
- the electromechanical transducer extends directly over the deformable membrane, that is to say the electromechanical transducer is directly in contact with the deformable membrane.
- the electromechanical transducer extends indirectly over the deformable membrane, that is to say that at least one element or an intermediate layer is placed between the electromechanical transducer and the deformable membrane.
- the electromechanical transducer entirely surrounds the free zone of the deformable membrane.
- the electromechanical transducer takes on an annular shape, the circular center of which defines the extent of the free zone of the deformable membrane.
- the electromechanical transducer can be configured such that a movement of its movable part from its equilibrium position to its non-equilibrium position induces an increase in the external pressure acting on the deformable medium and the deformable membrane can be configured such that an increase in the external pressure acting on the deformable medium induces a deformation of the free zone of the deformable membrane tending to move the external organ away from the cavity (more precisely to move it away from a fixed wall of the cavity such as the wall opposite the wall formed in part by the membrane).
- the micro-electromechanical system is thus configured so as to induce a displacement of the external organ in a first direction, corresponding to a distance of the external organ with respect to the cavity.
- the electromechanical transducer can be configured so that a movement of its movable part from its equilibrium position to its non-equilibrium position induces a reduction in the external pressure acting on the deformable medium and the deformable membrane.
- the deformable membrane can be configured so that a decrease in the external pressure acting on the deformable medium induces a deformation of the free zone of the deformable membrane tending to bring the external organ closer to the cavity (more precisely to bring it closer to a fixed wall of the cavity such as the wall opposite the wall formed in part by the membrane).
- the microelectromechanical system is thus configured so as to induce a displacement of the external organ in a second direction, this second direction tending to bring the external organ closer to the cavity.
- At least the mobile part of the electromechanical transducer can be integral with a zone of the deformable membrane adjacent to the free zone of the deformable membrane, so that a movement of the mobile part of the electromechanical transducer, including a movement inducing the approximation of the external organ with respect to the cavity, induces a corresponding movement of said zone of the deformable membrane adjacent to its free zone.
- microelectromechanical system as introduced above may further comprise a plurality of deformable membranes and/or a plurality of free zones per deformable membrane and/or a plurality of electromechanical transducers.
- the mobile part of the electromechanical transducer may have a surface at least twice greater than a surface of the free zone of the deformable membrane.
- the surface of the mobile parts of the transducers is at least 5 times, even 10 times, even 20 times greater than the surface of the free zone 121 of the deformable membrane, or even the surface of the free zones of the deformable membrane. The greater the surface of the transducer relative to the surface of the free zone 121 of the deformable membrane, or even to the surface of the free zones of the deformable membrane, the greater the deformation amplitude will be.
- the deformable membrane is preferably configured so that its free zone is capable of deforming with an amplitude of at least 50 ⁇ m, or even at least 100 ⁇ m, or even at least 1000 ⁇ m, in a direction perpendicular to the plane in which it stretches mainly when it is at rest. Without tearing and/or without significant wear, the micro-electromechanical system thus offers the ability to satisfy many and various applications requiring a large clearance, the latter being defined, where applicable, by technical field concerned.
- the micro electromechanical system may further comprise at least one lateral stop configured to guide the movement of the external member and/or to engage a non-moving part of an electromechanical transducer.
- the lateral abutment is supported by the wall of the cavity which is partly formed by the deformable membrane.
- said at least one lateral stop extends opposite the cavity.
- the microelectromechanical system can also have the following optional characteristics which can optionally be used in combination or alternatively.
- the pin can extend from the free zone of the deformable membrane beyond said at least one lateral stop.
- the pin can extend from the free zone of the deformable membrane below said at least one lateral stop.
- microelectromechanical system offers a satisfactory adaptability to a wide variety of external organs and applications.
- the microelectromechanical system may further comprise a so-called low abutment supported by the wall of the cavity opposite the free zone of the deformable membrane, said low abutment extending into the cavity towards the free zone. It has a shape and dimensions configured to limit the deformation of the free zone of the deformable membrane so as to protect the deformable membrane, and more particularly its free zone, in particular from possible tearing, during a transfer or a bonding of the external organ. Furthermore, the so-called low abutment can be shaped to limit the contact surface between the membrane and the wall of the cavity opposite the free zone of the deformable membrane. Alternatively or cumulatively, the bottom stop can be shaped so as to limit the contact surface between the membrane and the wall of the cavity opposite the free zone of the deformable membrane. This prevents the membrane from adhering to this wall.
- the electromechanical transducer may be a piezoelectric transducer, preferably comprising a PZT-based piezoelectric material.
- the electromechanical transducer may be a statically operated transducer.
- the electromechanical transducer can be a transducer with vibratory operation at at least one resonance frequency, said at least one resonance frequency being preferably less than 100 kHz, and even more preferably less than 1 kHz.
- the deformable medium hermetically contained in the cavity may comprise at least one fluid, preferably liquid.
- the fluid has a compressibility of between 10' 9 and 10' 1 ° Pa' 1 at 20°C, for example of the order of 10' 1 ° Pa' 1 at 20°C, without these values being limiting.
- Said at least one optical microsystem of the opto-electro-mechanical system as introduced above may comprise at least one mirror also referred to as a micromirror, preferably based on silicon.
- the opto-electro-mechanical system is configured so that the movement of the mobile part of the electromechanical transducer causes a movement of the at least one mirror.
- the opto-electro-mechanical system can comprise a plurality of micro-electromechanical systems each having a free zone arranged opposite a part of the same optical micro-system, such as a mirror.
- the micro electromechanical system cooperates with the mirror at the level of a zone which is not at the center of the mirror but for example in a corner of the mirror. We thus obtain an opto-electro-mechanical system or microsystem benefiting from a large capacity for adapting its optical orientation.
- electromechanical microsystem means a system comprising at least one mechanical element and at least one electromechanical transducer made on a micrometric scale with microelectronic means.
- the mechanical element can be moved (actuated) by a force generated by the electromechanical transducer.
- the latter can be powered by electrical voltages produced with neighboring electronic circuits.
- the electromechanical transducer can pick up a movement of the element mechanical ; the microelectromechanical system then acts as a sensor.
- a “microsystem” is a system whose external dimensions are less than 1 centimeter (10' 2 meters) and preferably less than 1 millimeter (10' 3 meters).
- an electromechanical transducer acts as an interface between the mechanical and electrical domains.
- electromechanical transducer means both a piezoelectric transducer and a thermal transducer, the latter playing an interface role between the mechanical and thermal domains.
- An electromechanical transducer may include a moving part between a position of equilibrium, out of stress, and a position out of equilibrium, under stress. When the transducer is piezoelectric, the stress is of an electrical nature. When the transducer is thermal, the stress is thermal in nature.
- this center is defined geometrically by considering it to be the center of a cavity presenting an undeformed free zone of the deformable membrane.
- a parameter “substantially equal/greater/less than” a given value is meant that this parameter is equal/greater/less than the given value, to plus or minus 20%, or even 10%, close to this value.
- a parameter “substantially between” two given values means that this parameter is at least equal to the smallest given value, to plus or minus 20%, or even 10%, close to this value, and at most equal to the smallest value. large given value, plus or minus 20%, or even 10%, close to this value.
- FIGS. 1A and 1B are block diagrams of a sectional view or of a section of a microelectromechanical system 1 according to first and second embodiments of the invention.
- an electromechanical transducer 11 In each of Figures 1A and 1B are illustrated an electromechanical transducer 11, a deformable membrane 12 and a cavity 13 configured to hermetically contain a deformable medium 14.
- Each of these principle diagrams can represent a structure with rotational or revolution symmetry about an axis perpendicular and centered with respect to the section of the deformable membrane as illustrated, or a structure extending, by example in a substantially invariant manner, perpendicular to the sectional view illustrated and symmetrically with respect to a perpendicular plane and centered with respect to the section of the deformable membrane as illustrated.
- each of these illustrations schematically represents an embodiment of the microelectromechanical system according to the invention which has a non-through structure.
- the electromechanical transducer 11 and the deformable membrane 12 are both located on the front face FAV of the microelectromechanical system 1.
- This type of structure is particularly advantageous insofar as the rear face FAR of the microelectromechanical system 1 can participate only passively, and in particular without becoming deformed, in the function of actuator and/or sensor of the microelectromechanical system 1.
- the rear face FAR of a microelectromechanical system 1 with a non-through structure according to invention can in particular constitute a face via which the micro electromechanical system 1 can easily be mounted on a support (referenced 32 in FIGS. 11 A and 11 B) and/or can constitute a face via which the micro electromechanical system can easily be further functionalized.
- the invention is not limited to microelectromechanical systems with a non-through structure.
- the invention also relates to so-called through-structure microelectromechanical systems 1 in which the electromechanical transducer 11 and the deformable membrane 12 are arranged on separate walls of the cavity 13 between them, whether these walls are adjacent or opposed to each other.
- the electromechanical transducer 11 comprises at least one movable part 111.
- the latter is configured to move or be moved between at least two positions.
- a first of these positions is an equilibrium position reached and maintained when the electromechanical transducer 11 is not stressed, whether for example by an electric current supplying it or by a force forcing its movable part out of its position. 'balance.
- a second position of the mobile part 111 of the electromechanical transducer 11 is reached when the electromechanical transducer 11 is stressed, whether for example by an electric current supplying it or by a force forcing its mobile part out of its equilibrium position.
- the electromechanical transducer 11 can be maintained in one or the other of the first and second positions described above, and thus exhibit a binary behavior, or can moreover be maintained in any intermediate position between its position of equilibrium and its position of greatest deformation, or greatest deflection, relative to equilibrium.
- the electromechanical transducer 11 is preferably a piezoelectric transducer. More particularly, the electromechanical transducer 11 comprises at least one piezoelectric material mechanically coupled to another element, referred to as a support or a beam. The term beam in no way limits the shape of this element.
- a piezoelectric material has the property of constraining itself when an electric field is applied to it. By constraining itself, it deforms. Mechanically associated with the support, the piezoelectric material drives the support with it and then moves the latter. The area of the support capable of moving corresponds to the moving part 111. It is this property of movement which is used to form an actuator.
- a piezoelectric material becomes electrically polarized.
- the support is moved, it deforms the piezoelectric material which induces an electric current. It is this property that is used to form a sensor.
- the electromechanical microsystem 1 can function as an actuator and/or as a sensor.
- an actuator it can make it possible to move an external member 2 upwards, as illustrated in FIG. 1A, or downwards, as illustrated in FIG. 1B.
- a sensor it can make it possible to capture a displacement, in particular a vertical displacement, of the external member 2.
- the electromechanical transducer 11 is even more preferably a piezoelectric transducer comprising a piezoelectric material based on PZT (Lead Titanium-Zirconate).
- the mobile part 111 of the electromechanical transducer 11 is capable, under stress, of moving with a more significant displacement (due to the piezoelectric coefficient d31) than with a large number of other piezoelectric materials.
- the electromechanical transducer 11 can be a piezoelectric transducer (non-ferroelectric) based on a material capable of allowing its mobile part 111 to move in opposite directions relative to its position of equilibrium, for example depending on the polarity of its power supply.
- a material is for example a material based on aluminum nitride (AIN).
- the electromechanical transducer 11 may be or include a thermal transducer
- the deformable membrane 12 can be based on a polymer, and is preferably based on PDMS (for polydimethylsiloxane).
- the properties of the deformable membrane 12, in particular its thickness, its surface and its shape, can be configured to confer on the deformable membrane 12, and more particularly on a zone 121 of this membrane which is free to deform, an ability to expected stretch, in particular depending on the intended application.
- the cavity 13 as illustrated in particular in FIGS. 1A and 1B more particularly has walls 131, 132, 133 hermetically containing the deformable medium 14.
- the wall 132 of the cavity 13 constitutes the rear face FAR of the microsystem electromechanical 1.
- the wall 131 opposite the wall 132 is formed at least in part by at least a part of the deformable membrane 12.
- the wall 131 is deformable.
- the wall 131 is subsequently referred to as the first wall. It is located at the front face FAV of the microelectromechanical system 1.
- At least one side wall 133 joins the walls 131 and 132 between them.
- the hermeticity of the cavity 13 may require that the deformable membrane 12 itself be even impermeable, or made impermeable, in particular at the level of its free zone 121.
- the first wall 131 of the cavity is preferably entirely formed or covered by at least the deformable membrane 12 and/or b.
- the electromechanical transducer 11 extends to its full extent on the deformable membrane 12, being in direct or indirect contact with the latter.
- the walls 132, 133 remain fixed when the membrane 12 deforms.
- the deformable medium 14 is itself capable of maintaining a substantially constant volume under the action of a change in external pressure. In other words, it may be an incompressible or weakly compressible medium, the deformation of which preferably requires little energy. It is for example a liquid.
- any change in external pressure exerted on the deformable medium 14 can be compensated by a deformation, substantially proportional, of the deformable membrane 12, and more particularly of its free zone 121, and/or by a displacement of the movable part 111 of the electromechanical transducer 11.
- this compensation is more particularly linked to a conversion of the change in external pressure exerted on the deformable medium 14 into a stretching of the deformable membrane 12 or a relaxation of the deformable membrane 12 already stretched. It is recalled that the deformable medium 14 is incompressible and that these constraints are therefore carried out with conservation of the volume of the cavity 13.
- any deformation of the deformable membrane 12 be elastic, and not plastic, to guarantee the return to the same state of least stretching, or of maximum relaxation, of the deformable membrane 12 whenever she is no longer constrained.
- the deformable medium 14 can more particularly comprise at least one fluid, preferably liquid.
- the parameters of the liquid will be adapted according to the targeted applications. This ensures that any change in external pressure exerted on the deformable medium 14 induces a substantially proportional deformation of the free zone 121 of the deformable membrane 12.
- the fluid may consist of, or be based on, a liquid, such as oil or may be made of, or based on, a polymer. According to one example, the fluid is based on or consists of glycerin. This ensures, in addition to a substantially proportional deformation of the membrane 12, the ability of the deformable medium 14 to occupy in particular the volume created by stretching the free zone 121 of the deformable membrane 12 opposite from the center of the cavity 13.
- the micro electromechanical system 1 is configured so that the movement of the electromechanical transducer 11 is a function of the change in external pressure exerted on the deformable medium 14, to perform the function of actuator of the micro electromechanical system 1, and conversely, to perform the sensor function of the microelectromechanical system 1. More particularly, when the microelectromechanical system 1 plays the role of actuator, the electromechanical transducer 11 is acted upon so as to exert a change of external pressure on the deformable medium 14 and induce by- there the deformation of the deformable membrane 12. Conversely, when the microelectromechanical system 1 acts as a sensor, the deformation of the membrane 12 exerts a change in external pressure on the deformable medium 14 which induces a displacement of the mobile part 111 of the transducer electromechanical 11.
- the microelectromechanical system 1 is such that the free zone 121 of the deformable membrane 12 is configured to cooperate with an external member 2. In this way, the deformation of the free zone 121 induces, or is induced by a movement of the external member 2. It is therefore via the free zone 121 of the deformable membrane 12 that the microelectromechanical system 1 moves the external member 2 or picks up a movement of the member external 2. Thus, when the micro electromechanical system 1 plays the role of actuator, the activation of the electromechanical transducer 11 deforms the membrane 12 which moves the member 2.
- the micro electromechanical system 1 plays the role of sensor, a pressing an external member 2 on the membrane 12 or pulling the membrane 12 by an external member 2 deforms the membrane 12, which moves the electromechanical transducer 11 then ultimately generates a signal.
- the signal generated can be a function of the displacement of the external member 2, and in particular of its amplitude of displacement, it is preferable that the surface of the free zone 121 be greater than the surface of the mobile part 111 of the transducer. electromechanical 11 which is in contact with the deformable membrane 12.
- the cooperation between the free zone 121 of the deformable membrane 12 and the external member 2 can be achieved via a finger, also designated pin 122, which is fixed on the free zone 121.
- a finger also designated pin 122
- pin can be interchanged.
- pawn is not limited to parts of constant section and a fortiori to cylindrical parts.
- the pin 122 can be more particularly fixed at the center of the free zone 121 of the deformable membrane 12, or more generally symmetrically with respect to the extent of the free zone 121 of the membrane deformable 12. In this way, the pin 122 is moved, by the elastic deformation of the free zone 121, in a controlled direction, substantially vertical, and is not, or only slightly, inclined with respect to the vertical during its movements .
- the lateral movement of the pin 122 is thus advantageously limited.
- the external member 2 can be structured so as to include a guide by which the external member 2 is intended to cooperate with the pin 122. This guide can also contribute to opposing an inclination of the piece 122 during its movements. We will see later that the limitations thus reached in terms of lateral displacement of the pin 122 can be further reinforced by the presence of at least one lateral abutment 15 extending from a part of the wall 131 situated outside the free zone 121 of the deformable membrane 12.
- a sticking or a magnetization of the pin 122 on the external member 2 can make it possible to secure between them the pin 122 and the external member 2.
- the adhesion energy of the pin 122 on the free zone 121 of the deformable membrane 12 is preferably greater than that of the pin 122 on the external member 2.
- This adhesion energy can thus be estimated or measured, it is easy to obtain by bonding, for example using an ad hoc resin, or by magnetization, for example a joining which is of a lower energy. than the energy with which the pin 122 is secured to the deformable membrane 12. It is therefore understood that the securing between the pin 122 and the external member 2 is thus largely adjustable in terms of retaining force.
- This modularity can make it possible in particular to make the connection between the pin 122 and the external member 2 removable, for example to allow the same electromechanical microsystem 1 according to the invention to be arranged successively with several external members 2 with each of which it would be united, then dissociated.
- the electromechanical transducer 11 can form part of the first wall 131 of the cavity 13.
- the electromechanical transducer 11 and the deformable membrane 12 are thus placed on the same side of the cavity 13
- the structures exhibiting this characteristic are advantageously non-through, as mentioned above.
- the membrane 12 has an internal face 12i configured to be in contact with the deformable medium 14 and an external face 12e.
- the inner face 12i forms part of the first wall 131 of the cavity 13.
- the inner face 12i of the membrane 12 forms the entire first wall 131 of the cavity 13.
- the electromechanical transducer 11, more precisely the movable part 111 of the latter has an internal face 11 i facing, and preferably in contact with the external face 12e of the membrane 12.
- the electromechanical transducer 11 also has an external face 11e, opposite the internal face 11i, and facing the outside of the microelectromechanical system 1.
- the face internal 11 i of the electromechanical transducer 11 is preferably entirely in contact with the external face 12e of the membrane 12. Provision may be made for one or more intermediate layers to be arranged between the external face 12e of the membrane 12 and the internal face 11 i of the electromechanical transducer.
- the microelectromechanical system 1 is configured so that the movement of the mobile part 111 of the electromechanical transducer 11 causes a displacement of the membrane 12 and therefore of the wall 131 which encloses the medium 14.
- the electromechanical transducer 11 extends over the deformable membrane 12 defining the free zone 121 of the deformable membrane 12, and b. the deformable membrane 12 separates the electromechanical transducer 11, preferably over its entire extent, from the deformable medium 14.
- the electromechanical transducer 11 can advantageously be integral with the deformable membrane 12 on a zone 123 located outside the free zone 121, and more particularly on a zone 123 adjacent to the free zone 121, so that any movement of the part 111 of the electromechanical transducer 11 induces, in particular on this zone 123, a stretching of the deformable membrane 12.
- a zone 123 located outside the free zone 121, and more particularly on a zone 123 adjacent to the free zone 121, so that any movement of the part 111 of the electromechanical transducer 11 induces, in particular on this zone 123, a stretching of the deformable membrane 12.
- FIG. 1C illustrates the partial covering of the deformable membrane 12 by the electromechanical transducer 11.
- the electromechanical transducer 11 there takes the form of a ring of radial extent denoted R2 and defines a free zone 121 circular of radius noted R1.
- the electromechanical transducer 11 is not limited to an annular shape, but can take other shapes, and in particular an oblong or oval shape, a triangular shape, a rectangular shape, etc. defining a corresponding plurality of shapes of the free zone 121 of the deformable membrane 12. This illustration applies in particular to a structure with rotational or rotational symmetry.
- the electromechanical transducer 11 is a piezoelectric transducer comprising a piezoelectric material based on PZT
- the mobile part 111 of the electromechanical transducer 11 has a surface at least 2 times greater than the surface of the free zone 121 of the deformable membrane 12.
- the deformable membrane 12 is therefore configured so that its free zone 121 is capable of deforming with an amplitude at least 50 ⁇ m, about 100 ⁇ m, or even several hundred ⁇ m.
- 1C is at least 5 times, even 10 times, even 20 times greater than the surface of the free zone 121 of the deformable membrane 12 illustrated on the same figure.
- the measurements given above by way of example correspond to a surface of the mobile part 111 of the electromechanical transducer 11 nineteen times greater than the surface of the free zone 121 of the deformable membrane 12.
- the deformable membrane 12 is preferably configured so that its free zone 121 is capable of deforming with an amplitude of less than 1 mm.
- the amplitude of deformation of the free zone 121 is measured in a direction perpendicular to the plane in which the outer face 12e of the membrane 12 mainly extends at rest.
- the microelectromechanical system 1 allows hydraulic amplification of the actuation and thus offers the ability to satisfy many and various applications requiring a large clearance.
- the microelectromechanical system 1 illustrated in FIG. 1A can be defined as an actuator with large upward travel and the microelectromechanical system 1 illustrated in FIG. 1B can be defined as an actuator with large downward travel.
- the electromechanical transducer 11 may more particularly comprise a support 305, also designated beam 305, and a piezoelectric element 302 based on PZT, the latter being configured to induce a deflection of the support 305.
- the term beam 305 does not limit the shape of support 305. In this example, beam 305 forms a ring.
- the thickness of the piezoelectric element 302 can be substantially equal to 0.5 ⁇ m and the thickness of the beam 305 is for example between a few ⁇ m and several tens of ⁇ m, for example 5 ⁇ m.
- the radius R1 of the free zone 121 of the deformable membrane 12 can be substantially equal to 100 ⁇ m and the radial extent R2 of the electromechanical transducer 11 (typically its radius if it is circular) can be substantially equal to 350 ⁇ m.
- the references R1 and R2 are illustrated in FIG. 1C.
- the mobile part 111 of the electromechanical transducer 11 can be moved or deflected with an amplitude for example substantially equal to 15 ⁇ m while being traversed by an electric voltage for example substantially equal to 10 V for a thickness of beam 305 of 1 of the order of 5 ⁇ m and a PZT thickness of the order of 1 ⁇ m.
- the mobile part 111 of the electromechanical transducer 11, and more generally the electromechanical transducer 11, may not be flat, but may on the contrary present a deflection, called at equilibrium, which does not This detracts nothing, in terms of amplitude, from the displacement or deflection capacity of the electrically powered electromechanical transducer 11.
- the invention is however not limited to the different specific values given above which can be widely adapted, depending on the intended application, in particular to find a compromise between stretching factor and expected deformation amplitude of the free zone. 121 of the deformable membrane 12.
- the electromechanical transducer 11 can advantageously be a vibratory operating transducer. Its resonance frequency is then preferably less than 100 kHz, and even more preferably less than 1 kHz. The vibratory dynamics thus obtained can make it possible to achieve greater clearances than in static operation, in particular by exploiting the related resonance phenomenon or reducing the consumption of the microelectromechanical system for a given clearance.
- the microelectromechanical system 1 may further comprise one or more lateral stops 15 supported by the first wall 131 of the cavity 13.
- Each lateral stop 15 extends more particularly opposite the cavity 13.
- each lateral stop 15 extends from a non-moving part of the electromechanical transducer 11.
- Each lateral stop 15 can also have an action of maintaining in position a non-moving part of the electromechanical transducer 11, said non-moving part being complementary to the moving part 111 of the electromechanical transducer 11.
- At least one spacer 306 can extend in the cavity 13 or by constituting part of the side wall 133 of the cavity 13.
- Such a spacer 306 makes it possible to sandwich, together with the abutment or each lateral abutment 15, the non-moving part of the electromechanical transducer 11, for example on a at least part of its outer circumference, so as to reinforce the holding in position of this non-moving part.
- the holding action of the non-moving part of the electromechanical transducer 11 can more particularly be ensured by its engagement between the two lateral stops 15, and in particular that located towards a part central microsystem 1, and the spacer 306, as shown in Figures 2A and 2B, which materializes the side wall 133 of the cavity 13; in this sense, the spacer 306 preferably extends towards the central part of the microsystem 1 at least up to the right of the surface of the lateral abutment 15 closest to the central part of the microsystem 1, in the same way as which is illustrated in Figures 1A and 1B.
- At least one lateral stop 15 can also be configured to allow guiding and the self-positioning of the external member 2 on the micro electromechanical system 1. It further contributes to limiting, or even eliminating, the risk of tearing off the deformable membrane 12 during the transfer of the external member 2 to the micro electromechanical system 1. Note here that, depending on the extent of the external member 2, at least one lateral stop 15 can also play the role of high stop limiting the approach of the external member 2 towards the microelectromechanical system 1.
- This feature can also make it possible to induce a separation of the pin 122 and the external member 2 between them by pulling the pin 122 into a lower position than that possibly reached by the external member 2 because the latter abuts on the top of the lateral abutment 15.
- the lateral abutment 15 has an abutment surface configured to stop the movement of the member 2.
- the microelectromechanical system 1 is configured so that when the movement of the member 2 is stopped in its movement, in a given direction, by the lateral stop 15, the pin 122 can continue its movement, in this same direction.
- Piece 122 thus dissociates itself from component 2.
- the microelectromechanical system 1 may further comprise one or more so-called low stops 16 supported by the wall 132 of the cavity 13 which is opposite the wall 131 formed at least in part by the deformable membrane 12 and extending in the cavity 13 towards the free zone 121 of the membrane 12.
- This lower stop 16 preferably has a shape and dimensions configured to limit the deformation of the free zone 121 of the membrane 12 so as to protect the membrane 12, and more particularly its free zone 121, from a possible tearing, in particular during the transfer of the external member 2 to the microelectromechanical system 1.
- the bottom stop 16 can be shaped so as to limit the contact surface between the membrane 12 and the wall 132 of the cavity 13 opposite the free zone 121 of the deformable membrane 12. This prevents the membrane 12 from adhering and sticking to this wall 132.
- FIGS. 2A and 2B More specific embodiments of the invention than those described above are illustrated in FIGS. 2A and 2B in which the same references as in FIGS. 1A and 1B refer to the same objects.
- each electromechanical transducer 11 illustrated comprises a beam 305 and a piezoelectric material 302 configured to deform the beam 305 when an electric current passes through it.
- FIG. 2A A comparison between Figures 2A and 2B shows that the piezoelectric material 302 can be located on either side of a neutral fiber of the assembly constituting the electromechanical transducer 11. It is thanks to this alternative that a ferroelectric piezoelectric material whose deformation is preferably independent of the polarization of the electric current flowing through it nevertheless makes it possible to deform the beam 305 in one direction or in the other.
- the piezoelectric material 302 is located under the beam 305, and therefore under the neutral fiber of the assembly, that is to say that it is located between the beam 305 and the membrane 12
- an electric voltage is applied to the piezoelectric material 302
- it retracts and drags the beam 305 with it. 12 which is linked to the beam 305.
- the free zone 121 of the membrane 12 moves upwards, then bringing with it the upward movement of the pin 122.
- Another end 305b of the beam 302 preferably remains fixed.
- This other end 305b is, for example, integral with a fixed wall of the cavity 13 which consists of the spacer 306 and/or of the lateral stop 15 located opposite one another.
- the piezoelectric material 302 is located above the beam 305, that is to say the beam 305 is located between the piezoelectric material 302 and the membrane 12.
- a voltage is applied to the material piezoelectric 302 it retracts and drags the beam 305 with it.
- a free end 305a of the beam then flexes upwards, pulling with it part of the zone 123 of the membrane 12 which is linked to the beam 305.
- the free zone 121 of the membrane moves downwards, then bringing with it the downward movement of the pin 122. This scenario corresponds to that illustrated in FIG. 1B.
- the side stops 15 and the bottom stops 16, and / or their section can take different shapes, and in particular a parallelepipedal shape, a frustoconical shape, a substantially pyramidal shape, etc.
- the mobile part 111 of the electromechanical transducer 11 can be defined by the extent of the piezoelectric material 302 relative to the extent of the beam 305.
- FIGS. 2A and 2B access openings for electrical connection electrodes are shown.
- these openings form vias 17.
- the vias 17 pass through the entire thickness of the beam 305 and the entire thickness between the lateral stops 15.
- 2A and 2B can each form a ring and provide between them a via 17 itself taking the shape of a ring; alternatively, the lateral stops 15 can also form a single ring in the thickness of which at least one via 17, for example of cylindrical shape, would be formed.
- the thickness e 30 s of the beam 302 is measured in a direction perpendicular to the plane in which the faces 12e and 12i of the membrane 12 mainly extend at rest.
- the thickness e 30 5 is referenced in FIGS. 2A and 2B.
- FIGS. 2A and 2B more particularly illustrate third and fourth embodiments of the invention which have been obtained by deposition and etching steps which can be qualified as ordinary in the field of microelectronics. More particularly, the micro electromechanical system 1 according to the third embodiment illustrated in FIG. 2A was obtained by the succession of steps illustrated by FIGS. 3A, 4A, 5A, 6A, 7A, 8A and 9A and the micro electromechanical system 1 according to the fourth embodiment illustrated in FIG. 2B has been obtained by the succession of steps illustrated by FIGS. 3B, 4B, 5B, 6B, 7B, 8B and 9B. Thus, two manufacturing methods are illustrated which each lead to one of the micro-electromechanical systems 1 illustrated in FIGS. 2A and 2B.
- These manufacturing processes have at least in common to include: a. a step of forming what is intended to constitute at least a portion of the electromechanical transducer 11 on a substrate 200, then b. a step of deposition of the deformable membrane 12, then c. a step of forming a cavity 13 open on the deformable membrane
- the first step of this method is illustrated in Figure 3A. It consists in providing a substrate 200 on which a stack of layers extends which may successively comprise, from one side of the substrate 200: has. a first insulating layer 201, for example based on silicon oxide, which can be deposited by plasma-enhanced chemical vapor deposition (PECVD, for Plasma-Enhanced Chemical Vapor Deposition in English), b.
- PECVD plasma-enhanced chemical vapor deposition
- CVD chemical vapor deposition
- LPCVD sub-atmospheric pressure
- a structure of the SOI type for Silicon On Insulator or, in French, silicon on insulator
- a second insulating layer 203 for example based on silicon oxide and which
- the second step of the manufacturing process of the micro electromechanical system 1 as illustrated in FIG. 2A is illustrated in FIG. 4A. It includes: a. an etching of the layer 206 so as to form the upper electrode 301 of the electromechanical transducer 11, b. an etching of the layer 205 so as to form the piezoelectric elements 302 of the electromechanical transducer 11, and c. an etching of the layer 204 so as to form the lower electrode 303 of the electromechanical transducer 11.
- each of these etchings can be carried out by lithography, and preferably by plasma etching, or by wet chemical means.
- the third step of the manufacturing process of the micro electromechanical system 1 as illustrated in FIG. 2A is illustrated in FIG. 5A. It includes: a. the deposition of a passivation layer 207, for example based on silicon oxide and/or silicon nitride, which can be deposited by PECVD, b. the opening, through the passivation layer 207, of a contact recovery zone per electrode, this opening being produced for example by lithography, and preferably by plasma etching, or by wet chemical process, c. the deposition of a layer intended to constitute an electric line 304 per electrode, the layer being for example based on gold and able to be deposited by PVD, and d. an etching of the previously deposited layer so as to form an electrical line 304 per electrode, this etching being carried out for example by lithography, and preferably by plasma etching, or by wet chemical means.
- a passivation layer 207 for example based on silicon oxide and/or silicon nitride, which can be
- the fourth step of the manufacturing process of the micro electromechanical system 1 as illustrated in FIG. 2A is illustrated in FIG. 6A. It includes the deposition of a layer 208 based on a polymer and intended to constitute the deformable membrane 12.
- This layer 208 is for example deposited by spin coating.
- the polymer on the basis of which the layer 208 is formed is for example based on PDMS.
- the fifth step of the manufacturing process of the micro electromechanical system 1 as illustrated in FIG. 2A is illustrated in FIG. 7A. It comprises the formation of at least one spacer 306 intended to constitute at least a part of said at least one side wall 133 of the cavity 13.
- the formation of the spacer(s) may comprise the lamination of a photosensitive material on the basis of which the where the spacers are formed, the insolation, then the development of the photosensitive material.
- Said photosensitive material may be based on a polymer, and in particular based on Siloxane.
- the lamination of the photosensitive material may comprise the lamination of a dry film of said material.
- this step includes the deposition of glue 210 at the top of each spacer 306, this deposition possibly being carried out by screen printing or by dispensing. It comprises the fixing, for example the gluing, on the top of the spacer(s) (possibly by means of the glue 210), of a second substrate 211 which can be structured so as to comprise at least one of a vent crossing 212 and a bottom stop 16 as described above. In an alternative embodiment, depending on the nature of the spacer, the latter can play the role of glue.
- the cavity 13 is formed which is opened by at least one through vent 212.
- the seventh step of the MEMS manufacturing process 1 as shown in Figure 2A is shown in Figure 9A. It comprises the filling, preferably under vacuum, of the cavity 13 with the deformable medium 14 as described above, for example by dispensing through the through-vent 212. It also comprises the sealing of the through-vent 212 , for example by dispensing with a sealing material 213 at the mouth of each through vent 212, the sealing material 213 being for example based on an epoxy adhesive.
- An additional step makes it possible to obtain the microelectromechanical system 1 as illustrated in FIG. 2A. It comprises the etching of the substrate 200, then the etching of the layer 202 and of the insulating layers 201, 203, so as to form at least one beam 305 of the electromechanical transducer 11, to expose part of the deformable membrane 12 and to constitute all or part of the pin 122 and any lateral stops 15.
- This additional step can be performed by lithography, and preferably by plasma etching, or by wet chemical process.
- the pin 122 takes the form of a stack extending directly from the deformable membrane 12 opposite the cavity 13 by successively presenting the material of the insulating layer 201, the material constituting the beam 305, the material of the insulating layer 203 and the material constituting the substrate 200. It should also be noted that, following the steps described above for manufacturing the microsystem electromechanical unit 1 as illustrated in FIG.
- the possible lateral stops 15 each take the form of a stack extending, directly or indirectly, from the deformable membrane 12 opposite the cavity 13 by successively presenting the material of the insulating layer 201, the material constituting the beam 305, the material of the insulating layer 203 and the material constituting the substrate 200.
- the first step of this method is illustrated in Figure 3B. It consists in providing a substrate 400 on which a stack of layers extends which can comprise successively, from one side of the substrate 400: a. a first insulating layer 401, for example based on silicon oxide, which can be deposited by chemical vapor deposition assisted by PECVD, b. a layer 402 intended to constitute a so-called lower electrode, for example based on platinum and which can be deposited by PVD, vs. a layer 403 of a piezoelectric material, for example based on PZT, and which can be deposited by a sol-gel process, and d. a layer 404 intended to constitute a so-called upper electrode, for example based on platinum and which can be deposited by PVD.
- a first insulating layer 401 for example based on silicon oxide, which can be deposited by chemical vapor deposition assisted by PECVD
- a layer 402 intended to constitute a so-called lower electrode, for example based on platinum
- the second step of the manufacturing process of the micro electromechanical system 1 as illustrated in FIG. 2B is illustrated in FIG. 4B. It includes: a. an etching of the layer 404 so as to form the upper electrode 301 of the electromechanical transducer 11, b. an etching of the layer 403 so as to form the piezoelectric elements 302 of the electromechanical transducer 11, and c. an etching of the layer 402 so as to form the lower electrode 303 of the electromechanical transducer 11.
- each of these etchings can be carried out by lithography, and preferably by plasma etching, or by wet chemical means.
- the third step of the manufacturing process of the micro electromechanical system 1 as illustrated in FIG. 2B is illustrated in FIG. 5B. It includes: a. the deposition of a passivation layer 405, for example based on silicon oxide and/or silicon nitride, which can be deposited by PECVD, b. the opening, through the passivation layer 405, of a contact recovery zone by electrode, this opening being produced for example by lithography, and preferably by plasma etching, or by wet chemical means, c. the deposition of a layer intended to constitute an electric line 304 by electrode, the layer being for example based on gold and which can be deposited by PVD, d.
- a passivation layer 405 for example based on silicon oxide and/or silicon nitride, which can be deposited by PECVD
- the opening, through the passivation layer 405, of a contact recovery zone by electrode this opening being produced for example by lithography, and preferably by plasma etching, or by wet chemical means
- etching of the previously deposited layer so as to form an electric line 304 per electrode, this etching being carried out for example by lithography, and preferably by plasma etching, or by wet chemical means, then e. the deposition of a passivation layer 406, for example based on silicon oxide and/or silicon nitride, which can be deposited by PECVD.
- the fourth step of the manufacturing process of the micro electromechanical system 1 as illustrated in FIG. 2B is illustrated in FIG. 6B. It comprises the deposition of a layer intended to constitute the beam 305 of the electromechanical transducer 11, this layer being for example based on amorphous silicon and can be deposited by PVD. It may then comprise a step of planarization of the previously deposited layer. It then comprises an etching of the previously deposited layer so as to form at least one beam 305 of the electromechanical transducer 11. This etching being carried out for example by lithography, and preferably by plasma etching, or by wet chemical means.
- the fifth step of the manufacturing process of the micro electromechanical system 1 as illustrated in FIG. 2B is illustrated in FIG. 7B. It includes: a. the deposition of a layer 407 based on a polymer and intended to constitute the deformable membrane 12; This layer 407 is for example deposited by spin coating.
- the polymer based on which the layer 407 is made is for example based on PDMS, and b. the formation of at least one spacer 306 intended to constitute at least a part of said at least one side wall 133 of the cavity 13.
- the formation of the spacer(s) 306 may comprise the lamination of a photosensitive material from which the spacer(s) are made, the insolation, then the development of the photosensitive material.
- Said photosensitive material may be based on a polymer, and in particular based on Siloxane.
- the lamination of the photosensitive material may comprise the lamination of a dry film of said material.
- the sixth step of the manufacturing process of the micro electromechanical system 1 as illustrated in FIG. 2B is illustrated in FIG. 8B. It includes, where appropriate, the deposition of glue 408 at the top of each spacer 306. According to an optional example, this deposition can be carried out by screen printing or by dispensing. It comprises the bonding, on the top of the spacer(s) 306 (possibly by means of the glue 408), of a second substrate 411 which can be structured so as to comprise at least one of a through vent 412 and a bottom stop 16 as described above. In an alternative embodiment, depending on the nature of the spacer, the latter can play the role of glue. At the end of this sixth step, the cavity 13 is formed which is opened by at least one through vent 412.
- the seventh step of the manufacturing process of the micro electromechanical system 1 as illustrated in FIG. 2B is illustrated in FIG. 9B. It comprises the filling, preferably under vacuum, of the cavity 13 with the deformable medium 14 as described above, for example by dispensing through the at least one through vent 212. It also comprises the leaktight closure of the at least one through vent 212, for example by dispensing with a sealing material 213 at least the mouth of each through vent 212, the sealing material 213 being for example based on an epoxy glue.
- An additional step makes it possible to obtain the microelectromechanical system 1 as illustrated in FIG. 2B. It includes the etching of the substrate 400, then the etching of the insulating layer 401, so as to expose part of the deformable membrane 12 and to constitute all or part of the pin 122 and any lateral stops 15.
- This additional step can be carried out by lithography, and preferably by plasma etching, or by wet chemical means.
- the pin 122 takes the form of a stack extending directly from the deformable membrane 12 opposite the cavity 13 by successively presenting the material of the insulating layer 401 and the material constituting the substrate 400.
- the possible lateral stops 15 each take the form of a stack extending, directly or indirectly, from the beam 305 opposite the cavity 13 by successively presenting the material of the insulating layer 401 and the material constituting the substrate 400.
- FIGS. 10, 11 A and 11 B may be an opto-electro-mechanical microsystem 3.
- Each of the microsystems opto-electro-mechanical devices 3 illustrated in these figures comprises at least one micro-electro-mechanical system 1 as described above and at least one optical micro-system 31.
- Said at least one micro-electro-mechanical system 1 is preferably mounted on a support 32 of the opto-electro-mechanical micro-system electro-mechanical 3.
- Said at least one optical microsystem 31 may comprise a silicon-based micro-mirror, the surface of which is, if necessary, surmounted by at least one mirror.
- the opto-electro-mechanical microsystems 3 as illustrated each comprise four micro-electromechanical systems 1 each having a free zone 121 arranged opposite a part of the same optical microsystem 31. An opto-electromechanical microsystem is thus obtained. electro-mechanical 1 benefiting from a large adaptability of its optical orientation.
- the microelectromechanical system 1 can be arranged in a micropump, or even in a system with an array of micropumps, in a haptic system.
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Abstract
Description
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Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| EP21840605.6A EP4263419A1 (fr) | 2020-12-21 | 2021-12-17 | Microsystème électromécanique |
| US18/258,547 US20240034616A1 (en) | 2020-12-21 | 2021-12-17 | Electromechanical microsystem |
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| FR2013820 | 2020-12-21 | ||
| FR2013820A FR3118018B1 (fr) | 2020-12-21 | 2020-12-21 | Microsystème électromécanique |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| WO2022136188A1 true WO2022136188A1 (fr) | 2022-06-30 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| PCT/EP2021/086648 Ceased WO2022136188A1 (fr) | 2020-12-21 | 2021-12-17 | Microsystème électromécanique |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US20240034616A1 (fr) |
| EP (1) | EP4263419A1 (fr) |
| FR (1) | FR3118018B1 (fr) |
| WO (1) | WO2022136188A1 (fr) |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20080212161A1 (en) * | 2005-08-08 | 2008-09-04 | Commissariat A L'energie Atomique | Actuating Device Having a Flexible Diaphragm Controlled By Electrowetting |
| US20110032624A1 (en) * | 2008-04-21 | 2011-02-10 | Commissariat A L'energie Atomique Et Aux Energies Alternatives | Membrane, especially for an optical device having a deformable membrane |
-
2020
- 2020-12-21 FR FR2013820A patent/FR3118018B1/fr active Active
-
2021
- 2021-12-17 WO PCT/EP2021/086648 patent/WO2022136188A1/fr not_active Ceased
- 2021-12-17 US US18/258,547 patent/US20240034616A1/en active Pending
- 2021-12-17 EP EP21840605.6A patent/EP4263419A1/fr active Pending
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20080212161A1 (en) * | 2005-08-08 | 2008-09-04 | Commissariat A L'energie Atomique | Actuating Device Having a Flexible Diaphragm Controlled By Electrowetting |
| US20110032624A1 (en) * | 2008-04-21 | 2011-02-10 | Commissariat A L'energie Atomique Et Aux Energies Alternatives | Membrane, especially for an optical device having a deformable membrane |
Also Published As
| Publication number | Publication date |
|---|---|
| US20240034616A1 (en) | 2024-02-01 |
| FR3118018B1 (fr) | 2023-04-14 |
| FR3118018A1 (fr) | 2022-06-24 |
| EP4263419A1 (fr) | 2023-10-25 |
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