WO2021120240A1 - Automatic microorganism testing device - Google Patents
Automatic microorganism testing device Download PDFInfo
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- WO2021120240A1 WO2021120240A1 PCT/CN2019/127863 CN2019127863W WO2021120240A1 WO 2021120240 A1 WO2021120240 A1 WO 2021120240A1 CN 2019127863 W CN2019127863 W CN 2019127863W WO 2021120240 A1 WO2021120240 A1 WO 2021120240A1
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- dish
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- C—CHEMISTRY; METALLURGY
- C12—BIOCHEMISTRY; BEER; SPIRITS; WINE; VINEGAR; MICROBIOLOGY; ENZYMOLOGY; MUTATION OR GENETIC ENGINEERING
- C12M—APPARATUS FOR ENZYMOLOGY OR MICROBIOLOGY; APPARATUS FOR CULTURING MICROORGANISMS FOR PRODUCING BIOMASS, FOR GROWING CELLS OR FOR OBTAINING FERMENTATION OR METABOLIC PRODUCTS, i.e. BIOREACTORS OR FERMENTERS
- C12M23/00—Constructional details, e.g. recesses, hinges
- C12M23/02—Form or structure of the vessel
- C12M23/10—Petri dish
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- C—CHEMISTRY; METALLURGY
- C12—BIOCHEMISTRY; BEER; SPIRITS; WINE; VINEGAR; MICROBIOLOGY; ENZYMOLOGY; MUTATION OR GENETIC ENGINEERING
- C12M—APPARATUS FOR ENZYMOLOGY OR MICROBIOLOGY; APPARATUS FOR CULTURING MICROORGANISMS FOR PRODUCING BIOMASS, FOR GROWING CELLS OR FOR OBTAINING FERMENTATION OR METABOLIC PRODUCTS, i.e. BIOREACTORS OR FERMENTERS
- C12M33/00—Means for introduction, transport, positioning, extraction, harvesting, peeling or sampling of biological material in or from the apparatus
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- C—CHEMISTRY; METALLURGY
- C12—BIOCHEMISTRY; BEER; SPIRITS; WINE; VINEGAR; MICROBIOLOGY; ENZYMOLOGY; MUTATION OR GENETIC ENGINEERING
- C12M—APPARATUS FOR ENZYMOLOGY OR MICROBIOLOGY; APPARATUS FOR CULTURING MICROORGANISMS FOR PRODUCING BIOMASS, FOR GROWING CELLS OR FOR OBTAINING FERMENTATION OR METABOLIC PRODUCTS, i.e. BIOREACTORS OR FERMENTERS
- C12M41/00—Means for regulation, monitoring, measurement or control, e.g. flow regulation
- C12M41/12—Means for regulation, monitoring, measurement or control, e.g. flow regulation of temperature
Definitions
- the present invention relates to the technical field of microbial cultivation, in particular to an automatic microbial inspection equipment.
- microorganisms In the inspection of microorganisms, the microorganisms need to be cultured. After the microorganisms are cultured for a certain period of time under suitable temperature and humidity conditions, the types and numbers of microorganisms can be observed and counted. In the current microbial cultivation, automated equipment for microbial inspection is often used to realize the automation of microbial cultivation and observation.
- petri dishes Similar to the French Intel Scientific Company, in order to automate the retrieval of petri dishes, basically all petri dishes are placed on a petri dish storage turntable. When a new petri dish is placed or taken out, the equipment compartment needs to be opened. Place or remove the petri dish.
- the main purpose of the present invention is to provide an automatic microbiological inspection equipment to solve the technical problem of the long time-consuming operation of removing or placing a culture dish in the prior art automatic microbiological inspection equipment.
- the present invention provides an automatic microbiological inspection equipment, including: a cabin body, the cabin body is formed with a sample injection area, a culture area, an observation area, and a sample output area, the culture area is used to store the culture dishes; a first temperature
- the adjustment device is set in the culture area and is used to adjust the temperature in the culture area
- the imaging device is set in the observation area and is used to collect images of the petri dish
- the sampling mechanism is set in the sample area and is used to advance The sample area transports the petri dishes
- the sample ejection mechanism is set in the sample ejection area and is used to remove the petri dishes from the sample ejection area
- the carrying basket is movably set in the cabin to carry the petri dishes
- the first dish-taking mechanism is set In the cabin, it is used to place the petri dishes in the sampling area in the basket located in the sampling area
- the second dish-taking mechanism is arranged in the cabin and is used to move the basket at least in the sampling area, culture area and observation area. ;
- the sampling mechanism includes: a sampling storage basket for stacking petri dishes, the top of the sampling storage basket is provided with a sampling code relief opening, and the bottom of the sampling storage basket is provided with a sampling inlet and an operation hole;
- the sampling operation push claw is movably set in the horizontal direction, and the petri dish located at the bottom of the sampling storage basket is pushed out from the injection port through the operation hole;
- the sampling driving part is connected with the sampling operation push claw to drive Drive the sample injection operation to move the push claw.
- the sampling mechanism further includes a sampling slide, which is connected to the sampling port and is used to transport the culture dish from the sampling port to the sampling area.
- the sampling mechanism includes: a sampling storage basket for stacking petri dishes, the top of the sampling storage basket is provided with a sampling code discharge opening; the bottom plate can be raised and lowered, which is set in the sampling storage basket in a liftable manner; Lifting driving part, driving the lifting bottom plate to go up and down; sampling operation push claw, movably arranged in the horizontal direction, used to push the culture dish from the sampling code opening into the sampling storage basket, the sampling driving part, and the sampling operation
- the push claw drive connection is used to drive the push claw to move in the sample output operation.
- the sample discharging mechanism further includes a sample discharging slide plate, which is connected to the sample discharging code setting port, and is used for conveying the culture dish from the sample discharging area to the sample discharging code setting opening.
- the sample ejection slide plate is provided with an escape groove that avoids the sample ejection operation push claw.
- the first dish-taking mechanism includes: a first Y-axis guide rail, which is installed in the sampling area; a first Z-axis guide rail, which is movably installed on the first Y-axis guide rail; and a first X-axis guide rail, which can be It is movably installed on the first Z-axis guide rail; the first dish claw is movably installed on the first X-axis guide rail, and the first dish claw is used for grasping and placing the culture dish.
- the second dish-taking mechanism includes: a second X-axis guide rail, which is installed across the sample injection area and the culture area, and across the observation area and the culture area; and a second Z-axis guide rail, which is movably installed on the second On the X-axis rail; the second Y-axis rail is movably installed on the second Z-axis rail, and the second Y-axis rail spans the sampling area and the observation area; the second cuvette claw is movably installed on the second On the Y-axis guide rail, the second dish claw is used to hold and place the culture dish.
- the third dish-taking mechanism includes: a third X-axis guide rail, which is installed in the observation area; a third Z-axis guide rail, which is movably installed on the third X-axis guide rail; and a third Y-axis guide rail, which is movable It is installed on the third Z-axis guide rail and installed across the observation area and sample exit area; the third dish claw is movably installed on the third Y-axis guide rail, and the third dish claw is used to hold and place the culture dishes. .
- the automatic microbial inspection equipment further includes: a second temperature adjustment device, which is arranged in the observation area and is used to adjust the temperature in the observation area; and the controller is respectively connected to the first temperature adjustment device and the second temperature adjustment device.
- the device is electrically connected and used to control the temperature of the observation area to be the same as the temperature of the culture area.
- the sampling mechanism when in use, the petri dish that needs to be cultured and tested is directly put into the sampling mechanism, the sampling mechanism can transport the petri dish to the sampling area, and then the first dish taking mechanism can transfer the sampling area Place the culture dish in the basket located in the sampling area, and the second dish picking mechanism will move the basket to the culture area for culture. After culturing for a period of time, the second dish picking mechanism moves the basket to the observation area, and the third dish picking mechanism moves the petri dish in the basket in the observation area to the imaging device for image acquisition.
- the petri dish needs to continue culturing and image acquisition , Then put the petri dish back into the basket in the observation area, and then move the basket to the culture area by the second dish-taking mechanism to continue culturing; if the petri dish has completed all the cultivation and image acquisition work, the third dish-taking mechanism will The petri dish in the basket in the observation area moves to the sample exit area, and the sample exit mechanism removes the petri dish from the sample exit area. In the end, the operator only needs to remove all the tested petri dishes from the sampling organization.
- the automatic placement and removal of the petri dishes is realized, which is convenient for the operator to quickly remove or place the petri dishes of the automatic microbial inspection equipment, which improves the work efficiency; in addition, the operator can also close the cabin faster, Reduce the influence on the temperature in the cabin and ensure the validity of the experiment.
- Fig. 1 shows a three-dimensional schematic diagram of an embodiment of an automatic microbial inspection device according to the present invention
- FIG. 2 shows a schematic diagram of the three-dimensional structure of the cabin door of the embodiment of the automatic microbial inspection equipment of FIG. 1 without the cabin body;
- Fig. 3 shows a schematic top view of the structure of the automatic microbial inspection equipment of Fig. 2;
- Fig. 4 shows a schematic structural diagram of a sampling mechanism of the automatic microbial inspection equipment of Fig. 1;
- Figure 5 shows a schematic front view of the structure of the sample introduction mechanism of Figure 4.
- FIG. 6 shows a schematic diagram of the structure of the sampling mechanism of the automatic microbial inspection equipment of FIG. 1;
- FIG. 7 shows a schematic diagram of the front structure of the sample dispensing mechanism of FIG. 6.
- FIGS 1, 2 and 3 show an embodiment of the automatic microbiological inspection equipment of the present invention.
- the automatic microbiological inspection equipment includes a cabin 10, an imaging device 20, a sampling mechanism 30, a sampling mechanism 40, a basket 50, and a second A dish-taking mechanism 60, a second dish-taking mechanism 70, and a third dish-taking mechanism 80.
- a sample injection area a, a culture area b, an observation area c, and a sample discharge area d are formed in the cabin 10, and the culture area b is used for storing culture dishes.
- the first temperature adjusting device is provided in the culture area b, and is used to adjust the temperature in the culture area b.
- the imaging device 20 is arranged in the observation area c and is used for image collection of the petri dish.
- the sampling mechanism 30 is arranged in the sampling area a, and is used to transport the culture dish to the sampling area a.
- the sampling mechanism 40 is arranged in the sampling area d, and is used to remove the culture dish from the sampling area d.
- the basket 50 is movably arranged in the cabin 10 and used to carry a culture dish.
- the first dish-taking mechanism 60 is arranged in the cabin 10 and is used to place the petri dishes in the sample injection area a in the basket 50 located in the sample injection area a.
- the second dish-taking mechanism 70 is arranged in the cabin 10 and is used to move the basket 50 at least in the sample injection area a, the culture area b, and the observation area c.
- the third dish taking mechanism 80 is arranged in the cabin 10, and is used to move the petri dish in the basket 50 of the observation area c to the imaging device 20, and is also used to move the petri dish after image collection to the sample exit area d.
- the culture dish that needs to be cultured and tested is directly put into the sampling mechanism 30, and the sampling mechanism 30 can transport the culture dish to the sampling area a, and then the first dish taking mechanism 60 can Place the petri dish in the sample injection area a in the basket 50 located in the sample injection area a, and the second dish-taking mechanism 70 will move the basket 50 to the culture area b for culturing.
- the second dish-taking mechanism 70 moves the basket 50 to the observation area c
- the third dish-taking mechanism 80 moves the petri dish in the basket 50 of the observation area c to the imaging device 20 for image acquisition.
- the dishes need to continue to be cultured and image collected, and then put the culture dishes back into the basket 50 in the observation area c, and then the second dish picking mechanism 70 moves the basket 50 to the culture area b to continue the culture; if the culture dishes have completed all the cultures , Image collection work, the third dish taking mechanism 80 moves the petri dish in the basket 50 in the observation area c to the sample exit area d, and the sample exit mechanism 40 takes the petri dish from the sample exit area d. In the end, the operator only needs to remove all the tested petri dishes from the sampling mechanism 40.
- the automatic placement and removal of the petri dish is realized, which is convenient for the operator to quickly remove or place the petri dish of the automatic microbial inspection equipment, which improves the work efficiency; in addition, the operator can also close the cabin faster 10 , Reduce the influence on the temperature in the cabin 10, and ensure the validity of the experiment.
- the cabin body 10 includes a bottom cabin and a cabin door that can be opened on the bottom cabin, and the imaging device 20, the dish-taking mechanism, the temperature adjustment device and the controller are all arranged in On the bottom compartment, the petri dishes can be taken and placed after the hatch is opened.
- the sampling mechanism 30 includes a sampling storage basket 31, a sampling operation push claw 32, and a sampling drive 33.
- the sampling storage basket 31 is used for stacking.
- the top of the sample storage basket 31 is provided with a sample inlet 311
- the bottom of the sample storage basket 31 is provided with a sample inlet 312 and an operation hole 313, and the sample injection operation push claw 32 is movably arranged in the horizontal direction.
- the petri dish located at the bottom of the sample injection storage basket 31 is pushed out from the sample inlet 312 through the operating hole 313.
- the sampling driving member 33 is drivingly connected with the sampling operation push claw 32 for driving the sampling operation push claw 32 to move.
- the petri dishes When in use, the petri dishes are placed in the sample storage basket 31 sequentially from the sample entry code setting port 311, and the sample driving member 33 drives the sample operation push claw 32 to move each time, and the bottom of the sample storage basket 31 can be moved.
- the petri dish is pushed out from the injection port 312, and the petri dish located on the petri dish will fall down and wait for the push claw 32 to push the petri dish out of the injection port 312 again.
- the sample injection driving member 33 is composed of a motor screw nut mechanism, the motor and the nut member are drivingly connected and fixedly arranged, the screw member is connected with the sample injection operation push claw 32, and the screw Driven by the nut member, the sampling operation push claw 32 is driven to move.
- the sampling mechanism 30 further includes a sampling slide 34, which is connected to the sampling port 312, and is used to transport the culture from the sampling port 312 to the sampling area a. Dish.
- the sampling slide 34 can transport the petri dish to the sampling area a more smoothly.
- the sample ejection mechanism 40 includes a sample storage basket 41, a liftable bottom plate 42, a lifting drive 43, a sample ejection push claw 44, and a sample drive. 45.
- the sample storage basket 41 is used for stacking petri dishes.
- the sample storage basket 41 is provided with a sample code setting port 411 at the top.
- the liftable bottom plate 42 is set up in the sample storage basket 41 so as to be lifted and lowered.
- the lift drive 43 can be driven.
- the lifting bottom plate 42 is raised and lowered, and the sample ejection operation push claw 44 is movably arranged in the horizontal direction, and is used to push the culture dish from the sample output code setting port 411 into the sample output storage basket 41.
- the sample output driving member 45 and the sample output operation push claw 44 drive connection, used to drive the sample operation push claw 44 to move.
- the sample output driving member 45 drives out
- the sample operation push pawl 44 moves to push the culture dish from the sample delivery code opening 411 to the elevating bottom plate 42 in the sample storage basket 41, and then the elevating drive member 43 drives the elevating bottom plate 42 to drop to a certain position, and the sample drive member 45 again
- the sample ejection operation push pawl 44 is driven to place another petri dish pushing stack on the petri dish until the sample ejection storage basket 41 yards full of the petri dish.
- the sample output driving member 45 is also composed of a motor screw nut mechanism, the motor and the nut member are drivingly connected and fixedly arranged, the screw member is connected with the sample output operation push claw 44, and the screw member is driven by the nut member.
- the sample ejection operation push claw 44 moves.
- the lifting driving member 43 may adopt an electric cylinder or a linear motor.
- the sample discharging mechanism 40 further includes a sample discharging slide 46, which is connected to the sample discharging code setting out port 411, and is used for conveying the petri dish from the sample discharging area d to the sample discharging code setting port 411.
- the sampling slide 46 can move the petri dish from the sampling area d to the sampling storage basket 41 more smoothly.
- the sampling slide 46 is provided with an avoiding groove 461 that avoids the sampling operation push pawl 44 to prevent the sampling slide 46 from affecting the movement of the sampling operation push pawl 44.
- the first dish-taking mechanism 60 includes a first Y-axis guide rail 61, a first Z-axis guide rail 62, a first X-axis guide rail 63, and a first dish-catching mechanism Claw 64
- the first Y-axis guide rail 61 is installed in the sampling area a
- the first Z-axis guide rail 62 is movably installed on the first Y-axis guide rail 61
- the first X-axis guide rail 63 is movably installed on the first Z-axis
- the first dish taking claw 64 is movably installed on the first X-axis guide rail 63
- the first dish taking claw 64 is used to hold and place the culture dish.
- the first claw taking claw 64 moves along the X-axis direction on the first X-axis guide rail 63
- the first X-axis guide rail 63 moves along the Z-axis direction on the first Z-axis guide rail 62
- the first Z-axis guide rail 62 The first Y-axis guide rail 61 moves along the Y-axis direction, so that the first dish-taking claw 64 can move freely in the space where the first dish-taking mechanism 60 is located.
- the second dish-taking mechanism 70 includes a second X-axis guide rail 71, a second Z-axis guide rail 72, a second Y-axis guide rail 73, and a second dish-catching claw 74, and the second X-axis guide rail 71 spans the sampling area.
- the second Z-axis guide 72 is movably installed on the second X-axis guide 71
- the second Y-axis guide 73 is movably installed on the second Z
- the second Y-axis guide rail 73 spans the sampling area a and the observation area c
- the second dish-taking claw 74 is movably installed on the second Y-axis guide rail 73
- the second dish-taking claw 74 is used for grasping Put the petri dish.
- the second dish claw 74 moves along the Y-axis on the second Y-axis guide rail 73
- the second Y-axis guide rail 73 moves along the Z-axis on the second Z-axis guide rail 72
- the second Z-axis guide rail 72 is on the second Z-axis guide rail 72.
- the two X-axis guide rails 71 move along the X-axis, so as to realize the free movement of the second dish-catching claw 74 in the space where the second dish-catching mechanism 70 is located.
- the second X-axis guide rail 71 and the second Z-axis guide rail 72 are both arranged in parallel, and the second dish-taking mechanism 70 is similar to the gantry crane structure. , Making the grab and place basket 50 more stable.
- the third dish-taking mechanism 80 includes a third X-axis guide rail 83, a third Z-axis guide rail 82, a third Y-axis guide 81, and a third dish-catching claw 84, and the third X-axis guide rail 83 is installed in the observation area c.
- the third Z-axis guide 82 is movably installed on the third X-axis guide 83, and the third Y-axis guide 81 is movably installed on the third Z-axis guide 82, and spans the observation area c and the sample area d Installation, the third dish taking claw 84 is movably installed on the third Y-axis guide rail 81, and the third dish taking claw 84 is used to hold and place the culture dish.
- the third claw 84 moves along the Y-axis on the third Y-axis guide 81, the third Y-axis guide 81 is the same along the Z-axis on the third Z-axis guide 82, and the third Z-axis guide 82 is on the first
- the three X-axis guides 83 move along the X axis, so that the third cuvette taking claw 84 can move freely in the space where the third cuvette taking mechanism 80 is located.
- the top of the basket 50 has a magnetic component
- the claws of the above-mentioned retrieval basket 50 may be an electromagnet matched with the magnetic component.
- the automatic microbial inspection equipment further includes a second temperature adjustment device and a controller.
- the second temperature adjustment device is arranged in the observation area c and is used to adjust the temperature in the observation area c.
- the controller is respectively electrically connected with the first temperature adjustment device and the second temperature adjustment device, and is used to control the temperature of the observation area c to be the same as the temperature of the culture area b. In this way, the temperature of the observation area c can be controlled to be the same as the temperature of the culture area b, avoiding abnormal production of microorganisms in the petri dish caused by abnormal temperature in the observation area c.
- the temperature in the observation area c is controlled to be the same as the temperature of the culture area b, and the petri dish is transferred to different areas at the same temperature to avoid fogging or condensation of water droplets on the petri dish, and to ensure the validity of the experiment.
- the temperature adjustment device includes a refrigeration element and a heating element, the refrigeration element is used for cooling, and the heating element is used for heating.
- the cooling element can cool the culture space to reduce the temperature of the culture space, and the heating element can heat the culture space to increase the temperature of the culture space.
- the temperature of the culture space can be maintained at the above two components.
- the refrigeration element is a semiconductor refrigeration element, and specifically, a Peltier element can be selected to cooperate with a fan.
- the heating element is an electric heating element, and the electric heating element can be an electric heating tube or a heat radiating element for heating.
- spatially relative terms can be used here, such as “above”, “above”, “above the surface”, “above”, etc., to describe as shown in the figure Shows the spatial positional relationship between one device or feature and other devices or features. It should be understood that the spatially relative terms are intended to encompass different orientations in use or operation in addition to the orientation of the device described in the figure. For example, if the device in the drawing is turned upside down, then a device described as “above other devices or structures” or “above other devices or structures” will then be positioned as “below the other devices or structures” or “on Under other devices or structures”. Thus, the exemplary term “above” may include both orientations “above” and “below”. The device can also be positioned in other different ways (rotated by 90 degrees or in other orientations), and the relative description of the space used here will be explained accordingly.
- orientation words such as “front, back, up, down, left, right", “horizontal, vertical, vertical, horizontal” and “top, bottom”, etc. indicate the orientation Or positional relationship is usually based on the position or positional relationship shown in the drawings, which is only for the convenience of describing the present invention and simplifying the description. Unless otherwise stated, these positional words do not indicate or imply the pointed device or element It must have a specific orientation or be constructed and operated in a specific orientation, so it cannot be understood as a limitation of the protection scope of the present invention; the orientation word “inside and outside” refers to the inside and outside relative to the contour of each component itself.
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Abstract
Description
本发明涉及微生物培养技术领域,具体而言,涉及一种微生物自动检验设备。The present invention relates to the technical field of microbial cultivation, in particular to an automatic microbial inspection equipment.
在微生物的检验中需要对微生物进行培养,微生物在合适的温度和湿度条件下培养一定培养时间后,才能观察和统计微生物的类型和数量。在目前的微生物的培养中,常常用到微生物检验自动化设备,实现对微生物培养、观察的自动化。In the inspection of microorganisms, the microorganisms need to be cultured. After the microorganisms are cultured for a certain period of time under suitable temperature and humidity conditions, the types and numbers of microorganisms can be observed and counted. In the current microbial cultivation, automated equipment for microbial inspection is often used to realize the automation of microbial cultivation and observation.
类似于法国的英特科学公司,为了实现培养皿调取的自动化,基本所有的培养皿都是放置在一个培养皿储存转盘上,在放置新的培养皿或者取出时,都需要打开设备舱,进行放置或者取出培养皿。Similar to the French Intel Scientific Company, in order to automate the retrieval of petri dishes, basically all petri dishes are placed on a petri dish storage turntable. When a new petri dish is placed or taken out, the equipment compartment needs to be opened. Place or remove the petri dish.
长时间操作取出或放置培养皿,一方面会使得实验效率低下,另一方面也会导致设备舱内的温度在一段时间内出现异常,影响实验的有效进行。Operating for a long time to take out or place the petri dish will on the one hand make the experiment inefficient, on the other hand, it will also cause the temperature in the equipment compartment to be abnormal for a period of time, which will affect the effective conduct of the experiment.
发明内容Summary of the invention
本发明的主要目的在于提供一种微生物自动检验设备,以解决现有技术中的微生物检验自动化设备存在的取出或放置培养皿的操作耗时长的技术问题。The main purpose of the present invention is to provide an automatic microbiological inspection equipment to solve the technical problem of the long time-consuming operation of removing or placing a culture dish in the prior art automatic microbiological inspection equipment.
为了实现上述目的,本发明提供了一种微生物自动检验设备,包括:舱体,舱体内形成有进样区、培养区、观察区和出样区,培养区用于存放培养皿;第一温度调节装置,设置在培养区中,用于调节培养区中的温度;成像装置,设置在观察区中,用于对培养皿进行图像采集;进样机构,设置在进样区,用于向进样区输送培养皿;出样机构,设置在出样区,用于从出样区取走培养皿;提篮,可移动地设置在舱体内,用于承载培养皿;第一取皿机构,设置在舱体内,用于将进样区的培养皿放置在位于进样区的提篮内;第二取皿机构,设置在舱体内,用于移动提篮至少在进样区、培养区和观察区移动;第三取皿机构,设置在舱体内,用于将观察区的提篮中的培养皿移动至成像装置处,还用于将图像采集完的培养皿移动到出样区。In order to achieve the above object, the present invention provides an automatic microbiological inspection equipment, including: a cabin body, the cabin body is formed with a sample injection area, a culture area, an observation area, and a sample output area, the culture area is used to store the culture dishes; a first temperature The adjustment device is set in the culture area and is used to adjust the temperature in the culture area; the imaging device is set in the observation area and is used to collect images of the petri dish; the sampling mechanism is set in the sample area and is used to advance The sample area transports the petri dishes; the sample ejection mechanism is set in the sample ejection area and is used to remove the petri dishes from the sample ejection area; the carrying basket is movably set in the cabin to carry the petri dishes; the first dish-taking mechanism is set In the cabin, it is used to place the petri dishes in the sampling area in the basket located in the sampling area; the second dish-taking mechanism is arranged in the cabin and is used to move the basket at least in the sampling area, culture area and observation area. ; The third dish-taking mechanism is set in the cabin and is used to move the petri dish in the basket in the observation area to the imaging device, and is also used to move the petri dish after the image has been collected to the sample exit area.
在一个实施方式中,进样机构包括:进样存放篮,用于码放培养皿,进样存放篮的顶部开设有进样码放口,进样存放篮的底部开设有进样口以及操作孔;进样操作推爪,沿水平方向可移动地设置,通过操作孔推动位于进样存放篮的底部的培养皿从进样口推出;进样驱动件,与进样操作推爪驱动连接,用于驱动进样操作推爪移动。In one embodiment, the sampling mechanism includes: a sampling storage basket for stacking petri dishes, the top of the sampling storage basket is provided with a sampling code relief opening, and the bottom of the sampling storage basket is provided with a sampling inlet and an operation hole; The sampling operation push claw is movably set in the horizontal direction, and the petri dish located at the bottom of the sampling storage basket is pushed out from the injection port through the operation hole; the sampling driving part is connected with the sampling operation push claw to drive Drive the sample injection operation to move the push claw.
在一个实施方式中,进样机构还包括进样滑板,进样滑板与进样口相连,用于从进样口向进样区输送培养皿。In one embodiment, the sampling mechanism further includes a sampling slide, which is connected to the sampling port and is used to transport the culture dish from the sampling port to the sampling area.
在一个实施方式中,出样机构包括:出样存放篮,用于码放培养皿,出样存放篮的顶部开设有出样码放口;可升降底板,可升降地设置在出样存放篮中;升降驱动件,驱动可升降底板升降;出样操作推爪,沿水平方向可移动地设置,用于将培养皿从出样码放口推入出样存放篮中出样驱动件,与出样操作推爪驱动连接,用于驱动出样操作推爪移动。In one embodiment, the sampling mechanism includes: a sampling storage basket for stacking petri dishes, the top of the sampling storage basket is provided with a sampling code discharge opening; the bottom plate can be raised and lowered, which is set in the sampling storage basket in a liftable manner; Lifting driving part, driving the lifting bottom plate to go up and down; sampling operation push claw, movably arranged in the horizontal direction, used to push the culture dish from the sampling code opening into the sampling storage basket, the sampling driving part, and the sampling operation The push claw drive connection is used to drive the push claw to move in the sample output operation.
在一个实施方式中,出样机构还包括出样滑板,出样滑板与出样码放口相连,用于从出样区向出样码放口输送培养皿。In one embodiment, the sample discharging mechanism further includes a sample discharging slide plate, which is connected to the sample discharging code setting port, and is used for conveying the culture dish from the sample discharging area to the sample discharging code setting opening.
在一个实施方式中,出样滑板上开设有避让出样操作推爪的避让槽。In one embodiment, the sample ejection slide plate is provided with an escape groove that avoids the sample ejection operation push claw.
在一个实施方式中,第一取皿机构包括:第一Y轴导轨,安装在进样区;第一Z轴导轨,可移动地安装在第一Y轴导轨上;第一X轴导轨,可移动地安装在第一Z轴导轨上;第一取皿爪,可移动地安装在第一X轴导轨上,第一取皿爪用于抓放培养皿。In one embodiment, the first dish-taking mechanism includes: a first Y-axis guide rail, which is installed in the sampling area; a first Z-axis guide rail, which is movably installed on the first Y-axis guide rail; and a first X-axis guide rail, which can be It is movably installed on the first Z-axis guide rail; the first dish claw is movably installed on the first X-axis guide rail, and the first dish claw is used for grasping and placing the culture dish.
在一个实施方式中,第二取皿机构包括:第二X轴导轨,横跨进样区和培养区以及横跨观察区和培养区安装;第二Z轴导轨,可移动地安装在第二X轴导轨上;第二Y轴导轨,可移动地安装在第二Z轴导轨上,第二Y轴导轨横跨进样区和观察区;第二取皿爪,可移动地安装在第二Y轴导轨上,第二取皿爪用于抓放培养皿。In one embodiment, the second dish-taking mechanism includes: a second X-axis guide rail, which is installed across the sample injection area and the culture area, and across the observation area and the culture area; and a second Z-axis guide rail, which is movably installed on the second On the X-axis rail; the second Y-axis rail is movably installed on the second Z-axis rail, and the second Y-axis rail spans the sampling area and the observation area; the second cuvette claw is movably installed on the second On the Y-axis guide rail, the second dish claw is used to hold and place the culture dish.
在一个实施方式中,第三取皿机构包括:第三X轴导轨,安装在观察区;第三Z轴导轨,可移动地安装在第三X轴导轨上;第三Y轴导轨,可移动地安装在第三Z轴导轨上,并横跨观察区和出样区安装;第三取皿爪,可移动地安装在第三Y轴导轨上,第三取皿爪用于抓放培养皿。In one embodiment, the third dish-taking mechanism includes: a third X-axis guide rail, which is installed in the observation area; a third Z-axis guide rail, which is movably installed on the third X-axis guide rail; and a third Y-axis guide rail, which is movable It is installed on the third Z-axis guide rail and installed across the observation area and sample exit area; the third dish claw is movably installed on the third Y-axis guide rail, and the third dish claw is used to hold and place the culture dishes. .
在一个实施方式中,所微生物自动检验设备还包括:第二温度调节装置,设置在观察区中,用于调节观察区中的温度;控制器,分别与第一温度调节装置和第二温度调节装置电连接,用于控制观察区的温度与培养区的温度相同。In one embodiment, the automatic microbial inspection equipment further includes: a second temperature adjustment device, which is arranged in the observation area and is used to adjust the temperature in the observation area; and the controller is respectively connected to the first temperature adjustment device and the second temperature adjustment device. The device is electrically connected and used to control the temperature of the observation area to be the same as the temperature of the culture area.
应用本发明的技术方案,在使用时将需要培养检测的培养皿直接放入进样机构,进样机构就可以将培养皿输送到进样区,之后第一取皿机构就可以将进样区的培养皿放置在位于进样区的提篮内,第二取皿机构就会将提篮移动到培养区进行培养。培养一段时间后,第二取皿机构再将提篮移动至观察区,第三取皿机构将观察区的提篮中的培养皿移动至成像装置处进行图像采集,如果培养皿需要继续培养、图像采集,再将培养皿放回至观察区的提篮中,再由第二取皿机构将该提篮移动到培养区继续培养;如果培养皿完成了全部培养、图像采集工作,则第三取皿机构将观察区的提篮中的培养皿移动至出样区,出样机构则从出样区取走培养皿。最终,操作人员只需要从出样机构上取走所有检测完的培养皿即可。这样一来,就实现了培养皿的自动化放置和取出,便于操作人员快速对微生物自动检验设备进行培养皿取出或放置工作,提高了工作效率;此外,操作人员也可以较快的关闭舱体,减少对舱体内温度的影响,保证实验有效性。Applying the technical solution of the present invention, when in use, the petri dish that needs to be cultured and tested is directly put into the sampling mechanism, the sampling mechanism can transport the petri dish to the sampling area, and then the first dish taking mechanism can transfer the sampling area Place the culture dish in the basket located in the sampling area, and the second dish picking mechanism will move the basket to the culture area for culture. After culturing for a period of time, the second dish picking mechanism moves the basket to the observation area, and the third dish picking mechanism moves the petri dish in the basket in the observation area to the imaging device for image acquisition. If the petri dish needs to continue culturing and image acquisition , Then put the petri dish back into the basket in the observation area, and then move the basket to the culture area by the second dish-taking mechanism to continue culturing; if the petri dish has completed all the cultivation and image acquisition work, the third dish-taking mechanism will The petri dish in the basket in the observation area moves to the sample exit area, and the sample exit mechanism removes the petri dish from the sample exit area. In the end, the operator only needs to remove all the tested petri dishes from the sampling organization. In this way, the automatic placement and removal of the petri dishes is realized, which is convenient for the operator to quickly remove or place the petri dishes of the automatic microbial inspection equipment, which improves the work efficiency; in addition, the operator can also close the cabin faster, Reduce the influence on the temperature in the cabin and ensure the validity of the experiment.
除了上面所描述的目的、特征和优点之外,本发明还有其它的目的、特征和优点。下面将参照图,对本发明作进一步详细的说明。In addition to the objectives, features, and advantages described above, the present invention has other objectives, features, and advantages. Hereinafter, the present invention will be described in further detail with reference to the drawings.
构成本发明的一部分的说明书附图用来提供对本发明的进一步理解,本发明的示意性实施例及其说明用于解释本发明,并不构成对本发明的不当限定。在附图中:The accompanying drawings constituting a part of the present invention are used to provide a further understanding of the present invention. The exemplary embodiments and descriptions of the present invention are used to explain the present invention, and do not constitute an improper limitation of the present invention. In the attached picture:
图1示出了根据本发明的微生物自动检验设备的实施例的立体结构示意图;Fig. 1 shows a three-dimensional schematic diagram of an embodiment of an automatic microbial inspection device according to the present invention;
图2示出了图1的微生物自动检验设备的实施例省去舱体的舱门的立体结构示意图;2 shows a schematic diagram of the three-dimensional structure of the cabin door of the embodiment of the automatic microbial inspection equipment of FIG. 1 without the cabin body;
图3示出了图2的微生物自动检验设备的俯视结构示意图;Fig. 3 shows a schematic top view of the structure of the automatic microbial inspection equipment of Fig. 2;
图4示出了图1的微生物自动检验设备的进样机构的结构示意图;Fig. 4 shows a schematic structural diagram of a sampling mechanism of the automatic microbial inspection equipment of Fig. 1;
图5示出了图4的进样机构的主视结构示意图;Figure 5 shows a schematic front view of the structure of the sample introduction mechanism of Figure 4;
图6示出了图1的微生物自动检验设备的出样机构的结构示意图;FIG. 6 shows a schematic diagram of the structure of the sampling mechanism of the automatic microbial inspection equipment of FIG. 1;
图7示出了图6的出样机构的主视结构示意图。FIG. 7 shows a schematic diagram of the front structure of the sample dispensing mechanism of FIG. 6.
需要说明的是,在不冲突的情况下,本发明中的实施例及实施例中的特征可以相互组合。下面将参考附图并结合实施例来详细说明本发明。It should be noted that the embodiments of the present invention and the features in the embodiments can be combined with each other if there is no conflict. Hereinafter, the present invention will be described in detail with reference to the drawings and in conjunction with the embodiments.
为了使本技术领域的人员更好地理解本发明方案,下面将结合本发明实施例中的附图,对本发明实施例中的技术方案进行清楚、完整地描述,显然,所描述的实施例仅仅是本发明一部分的实施例,而不是全部的实施例。基于本发明中的实施例,本领域普通技术人员在没有做出创造性劳动前提下所获得的所有其他实施例,都应当属于本发明保护的范围。In order to enable those skilled in the art to better understand the solutions of the present invention, the technical solutions in the embodiments of the present invention will be described clearly and completely in conjunction with the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only It is a part of the embodiments of the present invention, but not all the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those of ordinary skill in the art without creative work shall fall within the protection scope of the present invention.
需要说明的是,本发明的说明书和权利要求书及上述附图中的术语“第一”、“第二”等是用于区别类似的对象,而不必用于描述特定的顺序或先后次序。应该理解这样使用的术语在适当情况下可以互换,以便这里描述的本发明的实施例。此外,术语“包括”和“具有”以及他们的任何变形,意图在于覆盖不排他的包含,例如,包含了一系列步骤或单元的过程、方法、系统、产品或设备不必限于清楚地列出的那些步骤或单元,而是可包括没有清楚地列出的或对于这些过程、方法、产品或设备固有的其它步骤或单元。It should be noted that the terms “first” and “second” in the description and claims of the present invention and the above-mentioned drawings are used to distinguish similar objects, and not necessarily used to describe a specific sequence or sequence. It should be understood that the terms used in this way are interchangeable under appropriate circumstances in order to facilitate the embodiments of the present invention described herein. In addition, the terms "including" and "having" and any variations of them are intended to cover non-exclusive inclusions. For example, a process, method, system, product, or device that includes a series of steps or units is not necessarily limited to those clearly listed. Those steps or units may include other steps or units that are not clearly listed or are inherent to these processes, methods, products, or equipment.
需要注意的是,这里所使用的术语仅是为了描述具体实施方式,而非意图限制根据本申请的示例性实施方式。如在这里所使用的,除非上下文另外明确指出,否则单数形式也意图包括复数形式,此外,还应当理解的是,当在本说明书中使用术语“包含”和/或“包括”时,其指明存在特征、步骤、操作、器件、组件和/或它们的组合。It should be noted that the terms used here are only for describing specific embodiments, and are not intended to limit the exemplary embodiments according to the present application. As used herein, unless the context clearly indicates otherwise, the singular form is also intended to include the plural form. In addition, it should also be understood that when the terms "comprising" and/or "including" are used in this specification, they indicate There are features, steps, operations, devices, components, and/or combinations thereof.
图1、图2和图3示出了本发明的微生物自动检验设备的实施例,该微生物自动检验设备包括舱体10、成像装置20、进样机构30、出样机构40、提篮50、第一取皿机构60、第二取皿机构70和第三取皿机构80。舱体10内形成有进样区a、培养区b、观察区c和出样区d,培养区b用于存放培养皿。第一温度调节装置设置在培养区b中,用于调节培养区b中的温 度。成像装置20设置在观察区c中,用于对培养皿进行图像采集。进样机构30设置在进样区a,用于向进样区a输送培养皿。出样机构40设置在出样区d,用于从出样区d取走培养皿。提篮50可移动地设置在舱体10内,用于承载培养皿。第一取皿机构60设置在舱体10内,用于将进样区a的培养皿放置在位于进样区a的提篮50内。第二取皿机构70设置在舱体10内,用于移动提篮50至少在进样区a、培养区b和观察区c移动。第三取皿机构80设置在舱体10内,用于将观察区c的提篮50中的培养皿移动至成像装置20处,还用于将图像采集完的培养皿移动到出样区d。Figures 1, 2 and 3 show an embodiment of the automatic microbiological inspection equipment of the present invention. The automatic microbiological inspection equipment includes a
应用本发明的技术方案,在使用时将需要培养检测的培养皿直接放入进样机构30,进样机构30就可以将培养皿输送到进样区a,之后第一取皿机构60就可以将进样区a的培养皿放置在位于进样区a的提篮50内,第二取皿机构70就会将提篮50移动到培养区b进行培养。培养一段时间后,第二取皿机构70再将提篮50移动至观察区c,第三取皿机构80将观察区c的提篮50中的培养皿移动至成像装置20处进行图像采集,如果培养皿需要继续培养、图像采集,再将培养皿放回至观察区c的提篮50中,再由第二取皿机构70将该提篮50移动到培养区b继续培养;如果培养皿完成了全部培养、图像采集工作,则第三取皿机构80将观察区c的提篮50中的培养皿移动至出样区d,出样机构40则从出样区d取走培养皿。最终,操作人员只需要从出样机构40上取走所有检测完的培养皿即可。这样一来,就实现了培养皿的自动化放置和取出,便于操作人员快速对微生物自动检验设备进行培养皿取出或放置工作,提高了工作效率;此外,操作人员也可以较快的关闭舱体10,减少对舱体10内温度的影响,保证实验有效性。Applying the technical solution of the present invention, when in use, the culture dish that needs to be cultured and tested is directly put into the
如图所示,在本实施例的技术方案中,舱体10包括底舱和可打开地设置在底舱上的舱门,成像装置20、取皿机构、温度调节装置和控制器都设置在底舱上,舱门打开后可以往取放培养皿。As shown in the figure, in the technical solution of this embodiment, the
如图4和图5所示,在本实施例的技术方案中,进样机构30包括进样存放篮31、进样操作推爪32以及进样驱动件33,进样存放篮31用于码放培养皿,进样存放篮31的顶部开设有进样码放口311,进样存放篮31的底部开设有进样口312以及操作孔313,进样操作推爪32沿水平方向可移动地设置,通过操作孔313推动位于进样存放篮31的底部的培养皿从进样口312推出。进样驱动件33与进样操作推爪32驱动连接,用于驱动进样操作推爪32移动。在使用时,培养皿从进样码放口311依次码放在进样存放篮31中,进样驱动件33驱动进样操作推爪32每次动作,就可以将位于进样存放篮31最底部的培养皿从进样口312推出,位于该培养皿之上的培养皿就会落下等待推爪32再次将培养皿从进样口312推出。As shown in Figures 4 and 5, in the technical solution of this embodiment, the
可选的,在本实施例的技术方案中,进样驱动件33由电机丝杠螺母机构组成,电机和螺母件驱动相连并固定设置,丝杠件与进样操作推爪32相连,丝杠件在螺母件的驱动下带动进样操作推爪32移动。Optionally, in the technical solution of this embodiment, the sample
更为优选的,在本实施例的技术方案中,进样机构30还包括进样滑板34,进样滑板34与进样口312相连,用于从进样口312向进样区a输送培养皿。通过进样滑板34可以更为顺畅地将培养皿输送至进样区a。More preferably, in the technical solution of this embodiment, the
如图6和图7所示,在本实施例的技术方案中,出样机构40包括出样存放篮41、可升降底板42、升降驱动件43、出样操作推爪44和出样驱动件45,出样存放篮41用于码放培养皿,出样存放篮41的顶部开设有出样码放口411,可升降底板42可升降地设置在出样存放篮41中,升降驱动件43驱动可升降底板42升降,出样操作推爪44沿水平方向可移动地设置,用于将培养皿从出样码放口411推入出样存放篮41中,出样驱动件45与出样操作推爪44驱动连接,用于驱动出样操作推爪44移动。在使用时,如图3所示,每当有第三取皿机构80将观察区c的提篮50中的培养皿移动至出样区d的圆形虚线部分,出样驱动件45则驱动出样操作推爪44移动,推动培养皿从出样码放口411移动到出样存放篮41内的可升降底板42,之后升降驱动件43驱动可升降底板42下降一定位置,出样驱动件45再驱动出样操作推爪44将另一个培养皿推动码放到该培养皿之上,直至出样存放篮41码放满培养皿。As shown in Figures 6 and 7, in the technical solution of this embodiment, the
可选的,出样驱动件45也是由电机丝杠螺母机构组成,电机和螺母件驱动相连并固定设置,丝杠件与出样操作推爪44相连,丝杠件在螺母件的驱动下带动出样操作推爪44移动。可选的,升降驱动件43可以采用电缸或者直线电机。Optionally, the sample
更为优选的,出样机构40还包括出样滑板46,出样滑板46与出样码放口411相连,用于从出样区d向出样码放口411输送培养皿。通过出样滑板46可以更为顺畅地将培养皿从出样区d移动到出样存放篮41。相对应的,如图6所示,出样滑板46上开设有避让出样操作推爪44的避让槽461,以避免出样滑板46影响出样操作推爪44的移动。More preferably, the
如图1和图2所示,在本实施例的技术方案中,第一取皿机构60包括第一Y轴导轨61、第一Z轴导轨62、第一X轴导轨63和第一取皿爪64,第一Y轴导轨61安装在进样区a,第一Z轴导轨62可移动地安装在第一Y轴导轨61上,第一X轴导轨63可移动地安装在第一Z轴导轨62上,第一取皿爪64可移动地安装在第一X轴导轨63上,第一取皿爪64用于抓放培养皿。在使用时,第一取皿爪64在第一X轴导轨63上沿X轴方向移动,第一X轴导轨63在第一Z轴导轨62上沿Z轴方向移动,第一Z轴导轨62在第一Y轴导轨61上沿Y轴方向移动,从而实现第一取皿爪64在第一取皿机构60所处空间内自由移动。As shown in Figures 1 and 2, in the technical solution of this embodiment, the first dish-taking
可选的,第二取皿机构70包括第二X轴导轨71、第二Z轴导轨72、第二Y轴导轨73和第二取皿爪74,第二X轴导轨71横跨进样区a和培养区b以及横跨观察区c和培养区b安装,第二Z轴导轨72可移动地安装在第二X轴导轨71上,第二Y轴导轨73可移动地安装在第二Z轴导轨72上,第二Y轴导轨73横跨进样区a和观察区c,第二取皿爪74可移动地安装在第二Y轴导轨73上,第二取皿爪74用于抓放培养皿。在使用时,第二取皿爪74在第二Y轴导轨73上沿Y轴移动,第二Y轴导轨73在第二Z轴导轨72上沿Z轴移动,第二Z轴导轨72在第二X轴导轨71上沿X轴移动,从而实现第二取皿爪74第二取皿机构70所处空间内自由移动。优选的,如图2所示,在本实施例的技术方案中,第二X轴导轨71和第二Z轴导轨72均为两根,分别平行设置,第二取皿机构70类似于龙门吊结构,使得抓放提篮50更加稳定。Optionally, the second dish-taking
可选的,第三取皿机构80包括第三X轴导轨83、第三Z轴导轨82、第三Y轴导轨81和第三取皿爪84,第三X轴导轨83安装在观察区c,第三Z轴导轨82可移动地安装在第三 X轴导轨83上,第三Y轴导轨81可移动地安装在第三Z轴导轨82上,并横跨观察区c和出样区d安装,第三取皿爪84可移动地安装在第三Y轴导轨81上,第三取皿爪84用于抓放培养皿。在使用时,第三取皿爪84在第三Y轴导轨81上沿Y轴移动,第三Y轴导轨81在第三Z轴导轨82上沿Z轴一样,第三Z轴导轨82在第三X轴导轨83上沿X轴移动,使得第三取皿爪84可以在第三取皿机构80所在空间内自由移动。Optionally, the third dish-taking
作为一种可选的实施方式,在本实施例的技术方案中,提篮50的顶部具有磁性部件,上述的调取提篮50的取皿爪可以是与磁性部件相配合的电磁铁。As an optional implementation, in the technical solution of this embodiment, the top of the
更为优选的,在本实施例的技术方案中,所微生物自动检验设备还包括第二温度调节装置和控制器,第二温度调节装置设置在观察区c中,用于调节观察区c中的温度,控制器分别与第一温度调节装置和第二温度调节装置电连接,用于控制观察区c的温度与培养区b的温度相同。这样一来,可以将观察区c的温度控制在与培养区b的温度相同,避免在观察区c由于温度异常所造成的培养皿中的微生物生产异常的情况。此外,还有一个至关重要的原因是,当培养区b与观察区c中的温度不同时,处于低温下的培养皿一旦拿到了处于较高温度的观察区c后,培养皿上就会起雾、甚至凝结水滴,成像装置20图像采集到的图像信息在后续的图像计算过程中就很容易将水滴或者水雾计算为菌落,进而容易出现误差,降低实验有效性。在本发明的技术方案中,将观察区c的温度控制在与培养区b的温度相同,培养皿在相同温度的不同区域转移就可以避免培养皿上起雾或者凝结水滴,保证实验有效性。More preferably, in the technical solution of this embodiment, the automatic microbial inspection equipment further includes a second temperature adjustment device and a controller. The second temperature adjustment device is arranged in the observation area c and is used to adjust the temperature in the observation area c. For the temperature, the controller is respectively electrically connected with the first temperature adjustment device and the second temperature adjustment device, and is used to control the temperature of the observation area c to be the same as the temperature of the culture area b. In this way, the temperature of the observation area c can be controlled to be the same as the temperature of the culture area b, avoiding abnormal production of microorganisms in the petri dish caused by abnormal temperature in the observation area c. In addition, another important reason is that when the temperature in the culture area b is different from that in the observation area c, once the petri dish at a low temperature is taken to the observation area c at a higher temperature, the petri dish will be Fogging or even condensation of water droplets, the image information collected by the image of the
在本实施例的技术方案中,温度调节装置包括制冷元件和制热元件,制冷元件用于对制冷,制热元件用于制热。在使用时,通过制冷元件可以对培养空间制冷以降低培养空间的温度,通过制热元件可以对培养空间制热以提高培养空间的温度,通过上述两个部件就可以将培养空间的温度维持在符合微生物培养需求的温度。作为一种可选的,制冷元件为半导体制冷件,具体的可以选择帕尔贴元件配合风扇。可选的,制热元件为电加热元件,电加热元件可以选择电加热管或者热辐射元件进行加热。In the technical solution of this embodiment, the temperature adjustment device includes a refrigeration element and a heating element, the refrigeration element is used for cooling, and the heating element is used for heating. When in use, the cooling element can cool the culture space to reduce the temperature of the culture space, and the heating element can heat the culture space to increase the temperature of the culture space. The temperature of the culture space can be maintained at the above two components. The temperature that meets the needs of microbial cultivation. As an option, the refrigeration element is a semiconductor refrigeration element, and specifically, a Peltier element can be selected to cooperate with a fan. Optionally, the heating element is an electric heating element, and the electric heating element can be an electric heating tube or a heat radiating element for heating.
除非另外具体说明,否则在这些实施例中阐述的部件和步骤的相对布置、数字表达式和数值不限制本发明的范围。同时,应当明白,为了便于描述,附图中所示出的各个部分的尺寸并不是按照实际的比例关系绘制的。对于相关领域普通技术人员已知的技术、方法和设备可能不作详细讨论,但在适当情况下,所述技术、方法和设备应当被视为授权说明书的一部分。在这里示出和讨论的所有示例中,任何具体值应被解释为仅仅是示例性的,而不是作为限制。因此,示例性实施例的其它示例可以具有不同的值。应注意到:相似的标号和字母在下面的附图中表示类似项,因此,一旦某一项在一个附图中被定义,则在随后的附图中不需要对其进行进一步讨论。Unless specifically stated otherwise, the relative arrangement of components and steps, numerical expressions and numerical values set forth in these embodiments do not limit the scope of the present invention. At the same time, it should be understood that, for ease of description, the sizes of the various parts shown in the drawings are not drawn according to actual proportional relationships. The technologies, methods, and equipment known to those of ordinary skill in the relevant fields may not be discussed in detail, but where appropriate, the technologies, methods, and equipment should be regarded as part of the authorization specification. In all examples shown and discussed herein, any specific value should be interpreted as merely exemplary, rather than as a limitation. Therefore, other examples of the exemplary embodiment may have different values. It should be noted that similar reference numerals and letters indicate similar items in the following drawings, therefore, once an item is defined in one drawing, it does not need to be further discussed in the subsequent drawings.
为了便于描述,在这里可以使用空间相对术语,如“在……之上”、“在……上方”、“在……上表面”、“上面的”等,用来描述如在图中所示的一个器件或特征与其他器件或特征的空间位置关系。应当理解的是,空间相对术语旨在包含除了器件在图中所描述的方位之外的在使用或操作中的不同方位。例如,如果附图中的器件被倒置,则描述为“在其他器件或构造上方”或“在其他器件或构造之上”的器件之后将被定位为“在其他器件或构造下方”或“在 其他器件或构造之下”。因而,示例性术语“在……上方”可以包括“在……上方”和“在……下方”两种方位。该器件也可以其他不同方式定位(旋转90度或处于其他方位),并且对这里所使用的空间相对描述作出相应解释。For ease of description, spatially relative terms can be used here, such as "above", "above", "above the surface", "above", etc., to describe as shown in the figure Shows the spatial positional relationship between one device or feature and other devices or features. It should be understood that the spatially relative terms are intended to encompass different orientations in use or operation in addition to the orientation of the device described in the figure. For example, if the device in the drawing is turned upside down, then a device described as "above other devices or structures" or "above other devices or structures" will then be positioned as "below the other devices or structures" or "on Under other devices or structures". Thus, the exemplary term "above" may include both orientations "above" and "below". The device can also be positioned in other different ways (rotated by 90 degrees or in other orientations), and the relative description of the space used here will be explained accordingly.
在本发明的描述中,需要理解的是,方位词如“前、后、上、下、左、右”、“横向、竖向、垂直、水平”和“顶、底”等所指示的方位或位置关系通常是基于附图所示的方位或位置关系,仅是为了便于描述本发明和简化描述,在未作相反说明的情况下,这些方位词并不指示和暗示所指的装置或元件必须具有特定的方位或者以特定的方位构造和操作,因此不能理解为对本发明保护范围的限制;方位词“内、外”是指相对于各部件本身的轮廓的内外。In the description of the present invention, it needs to be understood that orientation words such as "front, back, up, down, left, right", "horizontal, vertical, vertical, horizontal" and "top, bottom", etc. indicate the orientation Or positional relationship is usually based on the position or positional relationship shown in the drawings, which is only for the convenience of describing the present invention and simplifying the description. Unless otherwise stated, these positional words do not indicate or imply the pointed device or element It must have a specific orientation or be constructed and operated in a specific orientation, so it cannot be understood as a limitation of the protection scope of the present invention; the orientation word "inside and outside" refers to the inside and outside relative to the contour of each component itself.
以上所述仅为本发明的优选实施例而已,并不用于限制本发明,对于本领域的技术人员来说,本发明可以有各种更改和变化。凡在本发明的精神和原则之内,所作的任何修改、等同替换、改进等,均应包含在本发明的保护范围之内。The above are only preferred embodiments of the present invention and are not used to limit the present invention. For those skilled in the art, the present invention can have various modifications and changes. Any modification, equivalent replacement, improvement, etc. made within the spirit and principle of the present invention should be included in the protection scope of the present invention.
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| CN111518689B (en) * | 2020-04-15 | 2023-01-24 | 山东科技大学 | An intelligent colony counting incubator and counting method |
| CN115097152A (en) * | 2022-07-01 | 2022-09-23 | 厦门元谱生物科技有限公司 | Full-automatic microorganism mass spectrum workstation |
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