WO2021106620A1 - Heat dissipation chip - Google Patents
Heat dissipation chip Download PDFInfo
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- WO2021106620A1 WO2021106620A1 PCT/JP2020/042390 JP2020042390W WO2021106620A1 WO 2021106620 A1 WO2021106620 A1 WO 2021106620A1 JP 2020042390 W JP2020042390 W JP 2020042390W WO 2021106620 A1 WO2021106620 A1 WO 2021106620A1
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- electrode
- heat
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/34—Arrangements for cooling, heating, ventilating or temperature compensation ; Temperature sensing arrangements
- H01L23/40—Mountings or securing means for detachable cooling or heating arrangements ; fixed by friction, plugs or springs
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K1/00—Printed circuits
- H05K1/02—Details
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K7/00—Constructional details common to different types of electric apparatus
- H05K7/20—Modifications to facilitate cooling, ventilating, or heating
Definitions
- This disclosure relates to a heat dissipation chip for dissipating heat on a circuit.
- Patent Document 1 describes that in an electronic circuit having a transistor, a relatively large impedance is provided between a copper foil pattern to which a collector of the transistor is connected and a ground line or a power supply line.
- a configuration is disclosed in which a circuit component (resistor, capacitor, coil) to be provided is arranged to form a heat dissipation path for heat generated by a transistor.
- Patent Document 1 When a circuit component such as a resistor, a capacitor, or a coil is used as a heat dissipation path as in JP-A-2001-68877 (Patent Document 1), these are used in order not to impair the electrical characteristics of the electronic circuit. It is necessary to increase the impedance of circuit components. However, even when a component having a high impedance is used, the resistance component may cause not a little self-heating, or the switching loss of the transistor may increase due to the charging / discharging of the capacitor.
- the present disclosure has been made to solve the above-mentioned problems, and the purpose of the present disclosure is to dissipate heat on the circuit without giving an electrical influence to the circuit.
- the heat dissipation chip is used to dissipate heat from the circuit board.
- the heat radiating chip includes an insulating member and a first electrode and a second electrode.
- the insulating member has a rectangular parallelepiped shape and includes a first main surface and a second main surface facing each other, and first to fourth side surfaces connecting the first main surface and the second main surface.
- the first electrode and the second electrode are formed at opposite ends of the insulating member.
- the first side surface and the second side surface face each other, and the third side surface and the fourth side surface face each other.
- the first electrode is formed on the entire surface of the first side surface, a part of the first main surface, and a part of the second main surface.
- the second electrode is formed on the entire surface of the second side surface, a part of the first main surface, and a part of the second main surface.
- the first electrode and the second electrode have a substantially C shape.
- the first side surface has a rectangular shape with a long side and a short side.
- the aspect ratio indicated by the length of the long side to the length of the short side is greater than 1.
- the first electrode and the second electrode are not formed on the third side surface and the fourth side surface.
- the insulating member is formed of a ceramic material containing alumina, aluminum nitride, silicon nitride, or silicon carbide, or a compound containing them.
- the thermal conductivity of the insulating member is greater than 2 W / m ⁇ K.
- heat dissipation chip by arranging the heat dissipation chip formed of the insulating member in the circuit, heat can be transferred to other parts of the circuit board (for example, the ground electrode) via the heat dissipation chip. it can. Therefore, heat can be dissipated without affecting the circuit electrically.
- FIG. 1 is an example of an electronic circuit in which a heat radiating chip according to an embodiment is arranged. It is a perspective view of the heat dissipation chip according to an embodiment. It is a top view of the heat dissipation chip of FIG. It is a side view of the heat dissipation chip of FIG. It is a figure which shows the electronic circuit of the comparative example 1.
- FIG. It is an external view of the diode in the circuit of FIG. It is a plan perspective view of the diode of FIG. It is a figure for demonstrating heat dissipation by a heat dissipation chip in the circuit of FIG. This is an example of temperature distribution simulation in the circuit of Comparative Example 1.
- FIG. 1 is a diagram showing an example of an electronic circuit 100 in which a heat radiating chip 130 according to the present embodiment is arranged.
- the electronic circuit 100 includes an integrated circuit (LSI) 105, capacitors C1 and C2, a diode D1, an inductor L1, and a heat dissipation chip 130.
- the LSI 105 includes a control circuit 110 and a switching element SW1.
- the electronic circuit 100 is a chopper-type step-down DC / DC converter that steps down the power supply voltage from the DC power source PS and supplies it to the load 120.
- the capacitor C1 is connected between the positive electrode terminal and the negative electrode terminal of the DC power supply PS.
- the capacitor C1 smoothes the DC voltage from the DC power supply PS and supplies it to the electronic circuit 100.
- the switching element SW1 and the diode D1 are connected in series between the positive electrode terminal and the negative electrode terminal (GND) of the DC power supply PS.
- the switching element SW1 is, for example, a field effect transistor (MOSFET), the drain of which is connected to the positive electrode terminal of the DC power supply PS, and the source of which is connected to the cathode of the diode D1.
- the diode D1 is, for example, a Schottky diode, and the anode is connected to the negative electrode terminal of the DC power supply PS.
- connection node TS
- GND negative electrode terminal
- the control circuit 110 is driven by a DC voltage from the DC power supply PS and outputs a control signal to the gate of the switching element SW1.
- the switching element SW1 is controlled by a control signal from the control circuit 110, and is switched between conducting and non-conducting.
- the control circuit 110 when the switching element SW1 is put into a conductive state, the diode D1 is put into a non-conducting state, and conversely, when the switching element SW1 is put into a non-conducting state, the diode D1 is put into a conductive state. That is, the switching element SW1 and the diode D1 complementarily switch between conduction and non-conduction. Then, by adjusting the duty of the switching element SW1, the DC voltage supplied to the load 120 can be adjusted.
- the heat dissipation chip 130 is connected in parallel with the diode D1.
- the electronic components may generate heat by performing the switching operation.
- the Schottky barrier diode used as the diode D1 has the characteristics that the forward voltage characteristic is low and the switching characteristic is fast as compared with a general PN junction diode, while a large current flows in the forward direction. Therefore, the calorific value tends to increase. Further, since the Schottky barrier diode has a relatively large leakage current, the temperature of the circuit around the element also rises when the heat generated by the element increases. Then, not only the diode D1 but also other elements such as the control circuit 110 or the switching element SW1 may be caused to deteriorate the characteristics and the life.
- the heat dissipation chip 130 is connected in parallel to the diode D1 that generates a large amount of heat. As will be described later, the heat dissipation chip 130 can efficiently transfer the heat generated by the diode D1 to the ground electrode of the substrate on which the electronic circuit 100 is formed.
- FIG. 2 is a perspective view of the heat radiating chip 130 in FIG.
- FIG. 3 is a plan view when the heat radiating chip 130 is viewed from the Z-axis direction of FIG. 2
- FIG. 4 is a side view of the heat radiating chip 130 when the heat radiating chip 130 is viewed from the X-axis direction of FIG.
- the heat radiating chip 130 includes an insulating member 140 having a rectangular parallelepiped shape, and first electrodes 151 and second electrodes 152 formed at both ends of the insulating member 140.
- the insulating member 140 includes a first main surface 1411 and a second main surface 1412, and first to fourth side surfaces connecting the two main surfaces.
- the first main surface 1411 and the second main surface 1412 are planes parallel to the XY plane in the figure, and the first side surface 1421 and the second side surface 1422 are planes parallel to the ZX plane in the figure.
- the third side surface 4123 and the fourth side surface 1424 are planes parallel to the YZ plane in the figure.
- the first electrode 151 is formed on the entire surface of the first side surface 1421 of the insulating member 140 and on the ends of the first main surface 1411 and the second main surface 1412 on the first side surface 1421 side. Further, the second electrode 152 is formed on the entire surface of the second side surface 1422 of the insulating member 140 and on the ends of the first main surface 1411 and the second main surface 1412 on the second side surface 1422 side. As shown in FIG. 4, when the heat radiation chip 130 is viewed in a plan view from the normal direction (that is, the X-axis direction) of the third side surface 1423, the first electrode 151 and the second electrode 152 have a substantially C shape. doing. In other words, the first electrode 151 and the second electrode 152 are not formed on the second side surface 1422 and the fourth side surface 1424.
- the first electrode 151 and the second electrode 152 are formed at the ends of the large insulating member extending in the X-axis direction in the Y-axis direction in FIG. 2, for example, by plating, and then Y.
- the first electrode 151 and the second electrode 152 have a substantially C shape.
- a method of dicing or splitting with a belt is adopted for cutting into individual heat radiating chips 130. Therefore, the second side surface 1422 and the fourth side surface 1424 along the Y axis of the heat radiating chip 130 are not smooth surfaces, but unevenness due to cutting marks or burrs is generated.
- the first electrode 151 and the second electrode 152 may be formed of a plurality of layers using the same material or different materials.
- the electrode is formed by subjecting an internal electrode formed of copper paste on the insulating member 140 to nickel plating, and further plating the nickel plating with solder.
- the aspect ratio (LX / LZ) indicated by the length of the long side with respect to the short side. ) Is greater than 1.
- the size of the heat radiating chip 130 is formed to be the same size as other electronic components (resistors, coils, capacitors, etc.) arranged on the electronic circuit board. Therefore, the heat radiating chip 130 can be arranged on the circuit together with other electronic components in the process of mounting various electronic components on the substrate.
- Insulating member 140 such as alumina, aluminum nitride, silicon nitride, ceramic materials such as silicon carbide or is formed by compounds containing them, 1.0 ⁇ 10 3 [ ⁇ ⁇ m] or more volume resistivity Has. Further, the insulating member 140 has a thermal conductivity of 2 W / m ⁇ K or more. As described above, in the heat radiating chip 130, the insulating member 140 having high resistance and high heat transfer property has a shape sandwiched between the first electrode 151 and the second electrode 152. Therefore, by connecting the first electrode 151 and the second electrode 152 to the conductive path in the electronic circuit, the heat of the conductive path can be transferred without affecting the electrical characteristics of the electronic circuit.
- FIG. 5 is a diagram showing the electronic circuit 100 # of Comparative Example 1.
- the electronic circuit 100 # has a configuration in which the heat radiating chip 130 in the electronic circuit 100 of FIG. 1 is not provided, and other elements are the same as those of the electronic circuit 100.
- the effect of the heat radiating chip 130 will be described by comparing the electronic circuit 100 of FIG. 1 and the electronic circuit 100 # of FIG.
- FIG. 6 is an example of an external view of the diode D1 in FIGS. 1 and 5.
- FIG. 7 is a perspective perspective view of the diode D1 of FIG.
- the diode D1 is a Schottky diode having a so-called TO (Top Outline) system package, and the cathode electrode 20 and the anode electrode 30 formed in the package 10 are The substrate 40 on which the diode body is formed is included.
- the substrate 40 is arranged on the cathode electrode 20.
- the substrate 40 is electrically connected to the cathode electrode 20 by an electrode pad (not shown) formed on the lower surface of the substrate 40.
- the substrate 40 and the anode electrode 30 are electrically connected by wire bonding 50.
- a part of the cathode electrode 20 and the anode electrode 30 protrudes to the outside of the package 10 for connecting to the circuit board.
- the Schottky barrier diode has the characteristics that the forward voltage characteristic is low and the switching characteristic is fast as compared with a general PN junction diode, but it generates heat because a large current flows in the forward direction. The amount tends to be large.
- the substrate 40 that generates heat and the anode electrode 30 are connected by a wire bonding 50 having a narrow line width, so that the substrate is connected. The heat generated in 40 is not easily transferred to the anode electrode 30, and the heat tends to stay on the cathode electrode 20 side.
- FIG. 8 is a diagram for explaining a specific arrangement of the heat dissipation chip 130 on the substrate of the electronic circuit and heat dissipation by the heat dissipation chip.
- FIG. 8A in the upper row is an example of arrangement of electronic components in the electronic circuit 100 # of Comparative Example 1
- FIG. 8B in the lower row is an arrangement of electronic components in the electronic circuit 100 of the present embodiment. This is an example.
- the cathode of the diode D1 is connected to the electrode TS which is a connection node between the switching element SW1 and the inductor L1, and the anode is connected to the ground electrode TG which is the ground potential GND.
- the ground electrode often has a relatively large area even in the substrate, but as shown in FIG. 8, the electrode TS to which the cathode is connected is isolated from other electrodes on the substrate. In many cases, the area of the electrode tends to be smaller than that of the ground electrode TG.
- the heat generated by the diode D1 stays in the cathode electrode 20 of the diode D1 and the electrode TS connected to the cathode electrode 20. Then, not only the diode D1 but also the switching element SW1 and the control circuit 110 around the diode D1 may rise in temperature, which may cause deterioration or malfunction of these devices.
- the heat dissipation chip 130 is connected in parallel with the diode D1. Therefore, the heat generated in the diode D1 can be transferred from the electrode TS to the ground electrode TG through the heat dissipation chip 130 in addition to the path of the wire bonding 50 inside the diode D1 (arrow in FIG. 8B). AR1). Therefore, the heat generated by the diode D1 is suppressed from staying in the electrode TS, and the influence on the diode D1 and the surrounding equipment can be reduced.
- FIG. 9 to 10 are diagrams showing temperature distributions when a temperature simulation is performed when a DC / DC converter is operated in the electronic circuit 100 # of Comparative Example 1 and the electronic circuit 100 of the present embodiment. ..
- FIG. 9 is a simulation example of the electronic circuit 100 # in the modified example.
- FIG. 10 shows a simulation example when two heat radiating chips 130 are used, and
- FIG. 11 shows a simulation example when four heat radiating chips 130 are used.
- the left figure (a) shows the arrangement of electronic components on the substrate
- the right figure (b) shows the temperature distribution.
- the temperature distribution is shown by contour lines, and the high temperature portion is hatched. The higher the hatching concentration, the higher the temperature.
- the positions of electronic components (LSI, diode, inductor) on the substrate are indicated by broken lines.
- the calculation is performed with the ambient temperature Ta as 25.2 ° C., and the temperature Tj of the portion of the substrate 40 in the diode D1 is also shown.
- the portion having the highest temperature is the portion of the substrate 40 of the diode D1, and the temperature is 58.5 ° C.
- the substrate 40 and the anode electrode 30 are connected by wire bonding 50 having a narrow line width, heat is not transferred much from the substrate 40, and the temperature rise is small.
- the heat dissipation chip 130 When the heat dissipation chip 130 is arranged between the electrode TS and the ground electrode TG as shown in FIGS. 10 and 11, the area of the high temperature region in the diode D1 is smaller than that in Comparative Example 1 of FIG. You can see that. Further, the shape is such that contour lines project from the position where the heat radiating chip 130 is arranged toward the left ground electrode TG (region RG1 in FIGS. 10 and 11), and the heat from the electrode TS is radiated from the heat radiating chip. It can be seen that it is diffused to the ground electrode TG through 130. As a result, the temperature Tj of the portion of the substrate 40 is lowered to 57.3 ° C. in the case of FIG. 10 and to 56.7 ° C. in the case of FIG. 11.
- ⁇ ja 52.9 ° C./W
- ⁇ ja 51.0 ° C./W
- the number of heat radiating chips 130 to be arranged is appropriately selected according to the heat generation state in the circuit and the temperature specifications of each element and the circuit.
- the electronic circuit can be formed. It is possible to efficiently dissipate heat without affecting the electrical characteristics. Further, by forming the heat-dissipating chip in the same size as other electronic components mounted on the circuit board, the heat-dissipating chip can be arranged in the mounting process of other electronic components, so that a member such as a heat sink is separately arranged. It does not require an additional process and can suppress an increase in manufacturing cost as compared with the case where it is used.
- FIG. 12 is a circuit diagram of a modified example in which the heat radiating chips 230 and 240 according to the present embodiment are applied to a boost type DC / DC converter.
- FIG. 13 is a circuit diagram of the DC / DC converter of Comparative Example 2 in which the heat dissipation chips 230 and 240 are not arranged.
- the electronic circuits 200 and 200 # include an integrated circuit (LSI) 205, capacitors C3 and C4, a diode D2, and an inductor L2.
- the LSI 205 includes a control circuit 210 and a switching element SW2.
- the electronic circuits 200 and 200 # are chopper-type step-up DC / DC converters that boost the power supply voltage from the DC power supply PS and supply it to the load 120.
- the capacitor C3 is connected between the positive electrode terminal and the negative electrode terminal of the DC power supply PS.
- the capacitor C3 smoothes the DC voltage from the DC power supply PS and supplies it to the electronic circuits 200 and 200 #.
- the inductor L2 and the switching element SW2 are connected in series between the positive electrode terminal and the negative electrode terminal (ground potential GND) of the DC power supply PS.
- One end of the inductor L2 is connected to the positive electrode terminal of the DC power supply PS.
- the switching element SW1 is, for example, a MOSFET, the drain is connected to the other end of the inductor L2, and the source is connected to the negative electrode terminal (GND) of the DC power supply PS.
- the diode D2 is, for example, a Schottky diode, the anode is connected to the connection node (TS) between the inductor L2 and the switching element SW2, and the cathode is connected to the load 220.
- the load 220 is connected between the other end of the diode D2 and the negative electrode terminal (ground potential GND) of the DC power supply PS.
- the capacitor C4 is connected in parallel with the load 120 to smooth the output voltage supplied to the load 220.
- the control circuit 210 is driven by a DC voltage from the DC power supply PS and outputs a control signal to the gate of the switching element SW2.
- the switching element SW2 is controlled by a control signal from the control circuit 210, and is switched between conducting and non-conducting.
- the control circuit 210 when the switching element SW2 is in the conductive state, the diode D2 is in the non-conducting state, and conversely, when the switching element SW2 is in the non-conducting state, the diode D2 is in the conductive state. That is, the switching element SW2 and the diode D2 are complementary to each other to switch between conduction and non-conduction. Then, by adjusting the duty of the switching element SW2, the DC voltage supplied to the load 220 can be adjusted.
- the heat radiating chip 230 is connected in parallel to the switching element SW2, and the heat radiating chip 240 is further connected in parallel to the capacitor C4.
- FIG. 14 is a diagram for explaining a specific arrangement of heat dissipation chips on the substrate of the electronic circuit in the modified example and heat dissipation by the heat dissipation chips.
- FIG. 14 (a) in the upper row is an example of arrangement of electronic components in the electronic circuit 200 # of Comparative Example 2
- FIG. 14 (b) in the lower row is an arrangement of electronic components in the electronic circuit 200 of the present embodiment. This is an example.
- the diode D2 heat is mainly generated in the substrate arranged on the electrode on the cathode side, so that the output electrode Vout connected to the cathode of the diode D2 Heat is transferred to the diode. Since the output electrode Vout is also connected to the load 220, if the heat transferred to the output electrode Vout can be appropriately diffused in the circuit on the load 220 side, heat retention in the output electrode Vout is unlikely to occur.
- the heat dissipation chip 240 is arranged between the output electrode Vout and the ground electrode TG, whereby the heat of the output electrode Vout is transferred to the ground electrode TG (arrow AR3 in FIG. 14). ).
- the electrode TS to which the inductor L2, the switching element SW2, and the diode D2 are connected is formed in a manner isolated from other electrodes on the substrate. Similar to the diode D2, the switching element SW2 also tends to generate heat because it can switch between conducting and non-conducting in the switching operation. As shown in FIG. 14, when the switching element SW2 is formed of the TO system package like the diode D2, the substrate on which the transistor is formed is arranged on the drain electrode connected to the electrode TS. In this case, as described with reference to FIGS. 6 and 7, heat tends to stay on the electrode TS side.
- the heat radiating chip 230 is also arranged between the electrode TS and the ground electrode TG. As a result, the heat accumulated on the electrode TS side can be transferred to the ground electrode TG (arrow AR2 in FIG. 14).
- an insulating member is formed between the heat generating portion on the circuit board and the electrode having a relatively low temperature and high heat dissipation efficiency such as a ground electrode.
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Abstract
Description
本開示は、回路上の熱を放熱するための放熱チップに関する。 This disclosure relates to a heat dissipation chip for dissipating heat on a circuit.
特開2001-68877号公報(特許文献1)には、トランジスタを有する電子回路において、トランジスタのコレクタが接続される銅箔パターンと、グランドラインあるいは電源ラインのとの間に、比較的大きなインピーダンスを有する回路部品(抵抗,コンデンサ,コイル)を配置することで、トランジスタで発生した熱の放熱経路を形成する構成が開示されている。 Japanese Patent Application Laid-Open No. 2001-68877 (Patent Document 1) describes that in an electronic circuit having a transistor, a relatively large impedance is provided between a copper foil pattern to which a collector of the transistor is connected and a ground line or a power supply line. A configuration is disclosed in which a circuit component (resistor, capacitor, coil) to be provided is arranged to form a heat dissipation path for heat generated by a transistor.
特開2001-68877号公報(特許文献1)のように、抵抗、コンデンサ、あるいはコイルなどの回路部品を放熱経路として用いた場合、電子回路の電気特性を損なわないようにするために、これらの回路部品のインピーダンスを高くすることが必要となる。しかしながら、たとえ高いインピーダンスの部品を使用した場合でも、抵抗成分により少なからず自己発熱が生じたり、コンデンサの充放電のためにかえってトランジスタのスイッチング損失が増加したりする場合がある。 When a circuit component such as a resistor, a capacitor, or a coil is used as a heat dissipation path as in JP-A-2001-68877 (Patent Document 1), these are used in order not to impair the electrical characteristics of the electronic circuit. It is necessary to increase the impedance of circuit components. However, even when a component having a high impedance is used, the resistance component may cause not a little self-heating, or the switching loss of the transistor may increase due to the charging / discharging of the capacitor.
本開示は、上記のような課題を解決するためになされたものであって、その目的は、回路への電気的な影響を与えることなく、回路上の熱を放熱することである。 The present disclosure has been made to solve the above-mentioned problems, and the purpose of the present disclosure is to dissipate heat on the circuit without giving an electrical influence to the circuit.
本開示に係る放熱チップは、回路基板の熱を放熱するために用いられる。放熱チップは、絶縁部材と、第1電極および第2電極とを備える。絶縁部材は、直方体形状を有し、対向する第1主面および第2主面と、第1主面および第2主面をつなぐ第1~第4側面とを含む。第1電極および第2電極は、絶縁部材の対向する端部に形成される。絶縁部材において、第1側面と第2側面とが対向し、第3側面と第4側面とが対向している。第1電極は、第1側面の全面、第1主面の一部、および第2主面の一部に形成されている。第2電極は、第2側面の全面、第1主面の一部、および第2主面の一部に形成されている。第3側面の法線方向から放熱チップを平面視すると、第1電極および第2電極は、略C字形状を有している。 The heat dissipation chip according to the present disclosure is used to dissipate heat from the circuit board. The heat radiating chip includes an insulating member and a first electrode and a second electrode. The insulating member has a rectangular parallelepiped shape and includes a first main surface and a second main surface facing each other, and first to fourth side surfaces connecting the first main surface and the second main surface. The first electrode and the second electrode are formed at opposite ends of the insulating member. In the insulating member, the first side surface and the second side surface face each other, and the third side surface and the fourth side surface face each other. The first electrode is formed on the entire surface of the first side surface, a part of the first main surface, and a part of the second main surface. The second electrode is formed on the entire surface of the second side surface, a part of the first main surface, and a part of the second main surface. When the heat radiating chip is viewed in a plan view from the normal direction of the third side surface, the first electrode and the second electrode have a substantially C shape.
好ましくは、第1側面は、長辺および短辺を有する長方形の形状を有している。短辺の長さに対する長辺の長さで示されるアスペクト比は、1より大きい。 Preferably, the first side surface has a rectangular shape with a long side and a short side. The aspect ratio indicated by the length of the long side to the length of the short side is greater than 1.
好ましくは、第3側面および第4側面には、第1電極および第2電極が形成されていない。 Preferably, the first electrode and the second electrode are not formed on the third side surface and the fourth side surface.
好ましくは、絶縁部材は、アルミナ、窒化アルミニウム、窒化ケイ素、または炭化ケイ素を含むセラミック系材料、あるいは、それらを含む化合物で形成される。 Preferably, the insulating member is formed of a ceramic material containing alumina, aluminum nitride, silicon nitride, or silicon carbide, or a compound containing them.
好ましくは、絶縁部材の熱伝導率は、2W/m・Kよりも大きい。 Preferably, the thermal conductivity of the insulating member is greater than 2 W / m · K.
本開示に従う放熱チップによれば、絶縁部材により形成された放熱チップを回路に配置することにより、放熱チップを介して、回路基板の他の部分(たとえば、接地電極)に熱を伝達することができる。そのため、回路に対して電気的な影響を与えることなく放熱を行なうことができる。 According to the heat dissipation chip according to the present disclosure, by arranging the heat dissipation chip formed of the insulating member in the circuit, heat can be transferred to other parts of the circuit board (for example, the ground electrode) via the heat dissipation chip. it can. Therefore, heat can be dissipated without affecting the circuit electrically.
以下、本開示の実施の形態について、図面を参照しながら詳細に説明する。なお、図中同一または相当部分には同一符号を付してその説明は繰り返さない。 Hereinafter, embodiments of the present disclosure will be described in detail with reference to the drawings. The same or corresponding parts in the drawings are designated by the same reference numerals, and the description thereof will not be repeated.
図1は、本実施の形態に従う放熱チップ130が配置された電子回路100の一例を示す図である。図1を参照して、電子回路100は、集積回路(LSI)105と、コンデンサC1,C2と、ダイオードD1と、インダクタL1と、放熱チップ130とを備える。LSI105は、制御回路110と、スイッチング素子SW1とを含む。電子回路100は、チョッパ型の降圧型DC/DCコンバータであり、直流電源PSからの電源電圧を降圧して負荷120へ供給する。
FIG. 1 is a diagram showing an example of an
コンデンサC1は、直流電源PSの正極端子と負極端子との間に接続される。コンデンサC1は、直流電源PSからの直流電圧を平滑化して電子回路100に供給する。
The capacitor C1 is connected between the positive electrode terminal and the negative electrode terminal of the DC power supply PS. The capacitor C1 smoothes the DC voltage from the DC power supply PS and supplies it to the
スイッチング素子SW1およびダイオードD1は、直流電源PSの正極端子と負極端子(GND)との間に直列接続される。スイッチング素子SW1は、たとえば電界効果トランジスタ(MOSFET)であり、ドレインが直流電源PSの正極端子に接続され、ソースがダイオードD1のカソードに接続される。ダイオードD1は、たとえばショットバリアキーダイオードであり、アノードが直流電源PSの負極端子に接続される。 The switching element SW1 and the diode D1 are connected in series between the positive electrode terminal and the negative electrode terminal (GND) of the DC power supply PS. The switching element SW1 is, for example, a field effect transistor (MOSFET), the drain of which is connected to the positive electrode terminal of the DC power supply PS, and the source of which is connected to the cathode of the diode D1. The diode D1 is, for example, a Schottky diode, and the anode is connected to the negative electrode terminal of the DC power supply PS.
インダクタL1の一方端は、スイッチング素子SW1とダイオードD1との間の接続ノード(TS)に接続される。負荷120は、インダクタL1の他方端と直流電源PSの負極端子(GND)との間に接続される。コンデンサC2は、負荷120と並列に接続され、負荷120に供給される出力電圧を平滑化する。
One end of the inductor L1 is connected to a connection node (TS) between the switching element SW1 and the diode D1. The
制御回路110は、直流電源PSからの直流電圧により駆動され、スイッチング素子SW1のゲートに制御信号を出力する。スイッチング素子SW1は、制御回路110からの制御信号によって制御され、導通と非導通とが切換えられる。制御回路110による制御によって、スイッチング素子SW1が導通状態とされるとダイオードD1が非導通状態となり、逆にスイッチング素子SW1が非導通状態とされるとダイオードD1が導通状態となる。すなわち、スイッチング素子SW1とダイオードD1とは相補的に導通と非導通とが切換えられる。そして、スイッチング素子SW1のデューティを調整することによって、負荷120へ供給される直流電圧を調整することができる。
The
さらに、実施の形態における電子回路100においては、ダイオードD1に並列に放熱チップ130が接続されている。
Further, in the
このような電子回路100においては、スイッチング動作を行なうとことによって電子部品が発熱し得る。特に、ダイオードD1として使用されるショットキーバリアダイオードは、一般的なPN接合のダイオードと比較して順方向電圧特性が低く、スイッチング特性が早いという特徴を有する一方で、順方向に大きな電流が流れるために発熱量が大きくなる傾向にある。また、ショットキーバリアダイオードは、比較的リーク電流が大きいため、素子の発熱が大きくなると素子周辺の回路の温度も上昇してしまう。そうすると、ダイオードD1だけでなく、制御回路110あるいはスイッチング素子SW1などの他の要素の特性劣化および寿命低下の要因になり得る。
In such an
本実施の形態の電子回路100においては、上述のように、発熱の大きいダイオードD1に放熱チップ130が並列接続されている。この放熱チップ130によって、後述するように、ダイオードD1で発生した熱を電子回路100が形成される基板の接地電極に効率よく伝達することができる。
In the
次に、図2~図4を用いて、放熱チップ130の詳細について説明する。図2は図1における放熱チップ130の斜視図である。図3は図2のZ軸方向から放熱チップ130を見たときの平面図であり、図4は図2のX軸方向から放熱チップ130を見たときの側面図である。
Next, the details of the
図2~図4を参照して、放熱チップ130は、直方体形状を有する絶縁部材140と、絶縁部材140の両端に形成された第1電極151および第2電極152とを備える。絶縁部材140は、第1主面1411および第2主面1412と、2つの主面をつなぐ第1~第4側面とを含む。第1主面1411および第2主面1412は、図のXY平面に平行な面であり、第1側面1421および第2側面1422は、図のZX平面に平行な面である。第3側面4123および第4側面1424は、図のYZ平面に平行な面である。
With reference to FIGS. 2 to 4, the
第1電極151は、絶縁部材140の第1側面1421の全面と、第1主面1411および第2主面1412の第1側面1421側の端部に形成される。また、第2電極152は、絶縁部材140の第2側面1422の全面と、第1主面1411および第2主面1412の第2側面1422側の端部に形成される。図4に示されるように、放熱チップ130を第3側面1423の法線方向(すなわち、X軸方向)から平面視した場合に、第1電極151および第2電極152は略C字形状を有している。言い換えれば、第1電極151および第2電極152は、第2側面1422および第4側面1424には形成されていない。
The
放熱チップ130の製造工程においては、図2におけるX軸方向に延在する大きな絶縁部材のY軸方向の端部に第1電極151および第2電極152をたとえばメッキ処理にて形成し、その後Y軸方向に沿って切断することによって、個々の放熱チップ130が形成される。そのため、放熱チップ130をX軸方向から平面視した場合に、第1電極151および第2電極152は略C字形状となる。個々の放熱チップ130への切断は、ダイシング、あるいは、ベルトを用いて割る手法が採用される。そのため、放熱チップ130のY軸に沿った第2側面1422および第4側面1424は、平滑な面ではなく、切断痕あるいはバリなどによる凹凸が生じる。
In the manufacturing process of the
なお、第1電極151および第2電極152は、同じ材料あるいは異なる材料を用いた複数の層で形成されていてもよい。一例として、電極は、絶縁部材140上に銅ペーストで形成された内部電極にニッケルメッキを施し、さらに、当該ニッケルメッキ上にはんだメッキを施すことによって形成される。
The
放熱チップ130のX軸に沿った長辺の長さをLXとし、Z軸に沿った短辺の長さをLZとすると、短辺に対する長辺の長さで示されるアスペクト比(LX/LZ)は1よりも大きい。また、放熱チップ130のサイズは、電子回路基板に配置される他の電子部品(抵抗,コイル,コンデンサなど)と同程度の大きさに形成される。そのため、放熱チップ130は、基板上への各種電子部品の実装工程において、他の電子部品とともに回路上に配置することができる。
Assuming that the length of the long side along the X axis of the
絶縁部材140は、たとえばアルミナ、窒化アルミニウム、窒化ケイ素、炭化ケイ素などのセラミック系材料、あるいは、それらを含む化合物で形成されており、1.0×103[Ω・m]以上の体積抵抗率を有する。また、絶縁部材140は、2W/m・K以上の熱伝導率を有する。このように、放熱チップ130においては、高抵抗かつ高伝熱性を有する絶縁部材140が第1電極151および第2電極152で挟まれた形状を有している。そのため、第1電極151および第2電極152を電子回路における導電経路に接続することによって、電子回路の電気特性に影響を与えることなく、導電経路の熱を伝達することができる。
Insulating
図5は、比較例1の電子回路100#を示す図である。電子回路100#においては、図1の電子回路100における放熱チップ130が設けられない構成となっており、その他の要素については電子回路100と同様である。以下、図1の電子回路100と図5の電子回路100#の比較により、放熱チップ130による効果について説明する。
FIG. 5 is a diagram showing the
図6は、図1および図5におけるダイオードD1の外観図の一例である。また、図7は、図6のダイオードD1の平面透視図である。図6および図7を参照して、ダイオードD1は、いわゆるTO(Top Outline)系のパッケージを有するショットバリアキーダイオードであり、パッケージ10内に形成された、カソード電極20と、アノード電極30と、ダイオード本体が形成される基板40とを含む。
FIG. 6 is an example of an external view of the diode D1 in FIGS. 1 and 5. Further, FIG. 7 is a perspective perspective view of the diode D1 of FIG. With reference to FIGS. 6 and 7, the diode D1 is a Schottky diode having a so-called TO (Top Outline) system package, and the
基板40は、カソード電極20上に配置されている。基板40は、基板40の下面に形成された電極パッド(図示せず)によって、カソード電極20と電気的に接続されている。一方、基板40とアノード電極30とは、ワイヤーボンディング50により電気的に接続されている。カソード電極20およびアノード電極30の一部は、回路基板に接続するためにパッケージ10の外部に突出している。
The substrate 40 is arranged on the
上述のように、ショットキーバリアダイオードは、一般的なPN接合のダイオードと比較して順方向電圧特性が低く、スイッチング特性が早いという特徴を有する一方で、順方向に大きな電流が流れるために発熱量が大きくなる傾向にある。しかしながら、図6および図7のようなTO系のパッケージを有するショットキーバリアダイオードの場合、発熱が生じる基板40とアノード電極30とは、線幅の狭いワイヤーボンディング50によって接続されているため、基板40で発生した熱はアノード電極30には伝達されにくく、カソード電極20側に熱が滞留しやすい。
As described above, the Schottky barrier diode has the characteristics that the forward voltage characteristic is low and the switching characteristic is fast as compared with a general PN junction diode, but it generates heat because a large current flows in the forward direction. The amount tends to be large. However, in the case of a Schottky barrier diode having a TO-based package as shown in FIGS. 6 and 7, the substrate 40 that generates heat and the
図8は、電子回路の基板上における具体的な放熱チップ130の配置と、放熱チップによる放熱を説明するための図である。図8において、上段の図8(a)は比較例1の電子回路100#における電子部品の配置例であり、下段の図8(b)は本実施の形態の電子回路100における電子部品の配置例である。
FIG. 8 is a diagram for explaining a specific arrangement of the
電子回路100,100#においては、ダイオードD1のカソードはスイッチング素子SW1とインダクタL1との接続ノードである電極TSに接続されており、アノードは接地電位GNDである接地電極TGに接続されている。一般的に、接地電極は基板内においても比較的大きな面積を有することが多いが、カソードが接続される電極TSについては、図8に示されるように、基板上において他の電極から孤立した態様で形成される場合が多く、接地電極TGと比較すると電極の面積が小さくなる傾向にある。そのため、比較例1の電子回路100#においては、ダイオードD1で発生した熱は、ダイオードD1のカソード電極20とそれに接続される電極TSに滞留してしまう。そうすると、ダイオードD1だけでなく、その周囲のスイッチング素子SW1および制御回路110の温度上昇を引き起こし、これらの機器の劣化あるいは誤動作の要因になるおそれがある。
In the
一方、本実施の形態の電子回路100においては、ダイオードD1と並列に放熱チップ130が接続されている。そのため、ダイオードD1で発生した熱は、ダイオードD1内部のワイヤーボンディング50の経路に加えて、電極TSから放熱チップ130を通って接地電極TGへと伝達することができる(図8(b)の矢印AR1)。したがって、ダイオードD1によって生じる熱が電極TSに滞留することが抑制され、ダイオードD1および周囲の機器への影響を低減することができる。
On the other hand, in the
図9~図10は、比較例1の電子回路100#および本実施の形態の電子回路100において、DC/DCコンバータを動作させた場合の温度シミュレーションを行なったときの温度分布を示す図である。図9は変形例における電子回路100#のシミュレーション例である。図10は2つの放熱チップ130を用いた場合のシミュレーション例を示しており、図11は4つの放熱チップ130を用いた場合のシミュレーション例を示している。
9 to 10 are diagrams showing temperature distributions when a temperature simulation is performed when a DC / DC converter is operated in the
図9~図11においては、左図(a)に基板上の電子部品の配置が示されており、右図(b)に温度分布が示されている。なお、右図(b)においては、温度分布が等高線で示されており、そのうち温度の高い部分についてはハッチングが施されている。ハッチングの濃度が濃いほど温度が高いことを示している。また、右図(b)においては、基板上の電子部品(LSI,ダイオード,インダクタ)の位置が破線で示されている。シミュレーションにおいては、周囲温度Taを25.2℃として計算を行なっており、ダイオードD1内の基板40の部分の温度Tjについても示されている。 In FIGS. 9 to 11, the left figure (a) shows the arrangement of electronic components on the substrate, and the right figure (b) shows the temperature distribution. In the figure on the right (b), the temperature distribution is shown by contour lines, and the high temperature portion is hatched. The higher the hatching concentration, the higher the temperature. Further, in the right figure (b), the positions of electronic components (LSI, diode, inductor) on the substrate are indicated by broken lines. In the simulation, the calculation is performed with the ambient temperature Ta as 25.2 ° C., and the temperature Tj of the portion of the substrate 40 in the diode D1 is also shown.
図9の比較例1のシミュレーションにおいては、温度が最も高くなっている部分は、ダイオードD1の基板40の部分であり、その温度は58.5℃となっている。上述のように、基板40とアノード電極30とは線幅の細いワイヤーボンディング50によって接続されているため、基板40から熱があまり伝達されておらず、温度上昇は小さい。
In the simulation of Comparative Example 1 in FIG. 9, the portion having the highest temperature is the portion of the substrate 40 of the diode D1, and the temperature is 58.5 ° C. As described above, since the substrate 40 and the
図10および図11のように、電極TSと接地電極TGとの間に放熱チップ130を配置した場合には、ダイオードD1における温度の高い領域の面積が図9の比較例1に比べて小さくなっていることがわかる。さらに、放熱チップ130が配置された位置から左側の接地電極TGの部分(図10,11の領域RG1)に向けて等高線が張り出すような形状をしており、電極TSからの熱が放熱チップ130を通って接地電極TGへと拡散されていることがわかる。これにより、基板40の部分の温度Tjは、図10の場合には57.3℃に低下しており、図11の場合には56.7℃に低下している。
When the
熱抵抗で比較した場合には、図9の比較例ではθja=52.9℃/Wであったものが、図10の場合にはθja=51.0℃/Wと約3.6%低減されており、さらに図11の場合にはθja=50.0℃/Wと約5.5%低減されている。なお、放熱チップ130の配置数については、回路における発熱状態と、各素子および回路の温度仕様に応じて適宜選択される。
When compared in terms of thermal resistance, in the comparative example of FIG. 9, θja = 52.9 ° C./W, but in the case of FIG. 10, θja = 51.0 ° C./W, which is a reduction of about 3.6%. Further, in the case of FIG. 11, θja = 50.0 ° C./W, which is a reduction of about 5.5%. The number of
以上のように、回路基板上の発熱部位と、接地電極のような比較的温度が低く放熱効率の高い電極との間に、絶縁部材で形成された放熱チップを配置することによって、電子回路の電気特性に対して影響を与えることなく効率的に放熱を行なうことが可能となる。また、当該放熱チップを、回路基板上に実装する他の電子部品と同程度のサイズで形成することによって、他の電子部品の実装工程において放熱チップを配置できるので、ヒートシンクなどの部材を別途配置するような場合に比べて追加のプロセスを必要とせず、製造コストの増加を抑制することができる。 As described above, by arranging the heat dissipation chip formed of the insulating member between the heat generating portion on the circuit board and the electrode having a relatively low temperature and high heat dissipation efficiency such as the ground electrode, the electronic circuit can be formed. It is possible to efficiently dissipate heat without affecting the electrical characteristics. Further, by forming the heat-dissipating chip in the same size as other electronic components mounted on the circuit board, the heat-dissipating chip can be arranged in the mounting process of other electronic components, so that a member such as a heat sink is separately arranged. It does not require an additional process and can suppress an increase in manufacturing cost as compared with the case where it is used.
(変形例)
図1においては、本実施の形態に従う放熱チップが降圧型DC/DCコンバータの電子回路に適用された場合の例について説明したが、放熱チップは他の機器に含まれる電子回路にも適用可能である。
(Modification example)
In FIG. 1, an example in which the heat radiating chip according to the present embodiment is applied to the electronic circuit of the step-down DC / DC converter has been described, but the heat radiating chip can also be applied to the electronic circuit included in other devices. is there.
図12は、本実施の形態に従う放熱チップ230,240が昇圧型のDC/DCコンバータに適用された場合の変形例の回路図である。また、図13は、放熱チップ230,240が配置されない比較例2のDC/DCコンバータにおける回路図である。
FIG. 12 is a circuit diagram of a modified example in which the
図12および図13を参照して、電子回路200,200#は、集積回路(LSI)205と、コンデンサC3,C4と、ダイオードD2と、インダクタL2とを備える。LSI205は、制御回路210と、スイッチング素子SW2とを含む。電子回路200,200#は、チョッパ型の昇圧型DC/DCコンバータであり、直流電源PSからの電源電圧を昇圧して負荷120へ供給する。
With reference to FIGS. 12 and 13, the
コンデンサC3は、直流電源PSの正極端子と負極端子との間に接続される。コンデンサC3は、直流電源PSからの直流電圧を平滑化して電子回路200,200#に供給する。
The capacitor C3 is connected between the positive electrode terminal and the negative electrode terminal of the DC power supply PS. The capacitor C3 smoothes the DC voltage from the DC power supply PS and supplies it to the
インダクタL2およびスイッチング素子SW2は、直流電源PSの正極端子と負極端子(接地電位GND)との間に直列接続される。インダクタL2の一方端は、直流電源PSの正極端子に接続される。スイッチング素子SW1は、たとえばMOSFETであり、ドレインがインダクタL2の他方端に接続され、ソースが直流電源PSの負極端子(GND)に接続される。 The inductor L2 and the switching element SW2 are connected in series between the positive electrode terminal and the negative electrode terminal (ground potential GND) of the DC power supply PS. One end of the inductor L2 is connected to the positive electrode terminal of the DC power supply PS. The switching element SW1 is, for example, a MOSFET, the drain is connected to the other end of the inductor L2, and the source is connected to the negative electrode terminal (GND) of the DC power supply PS.
ダイオードD2は、たとえばショットバリアキーダイオードであり、アノードがインダクタL2とスイッチング素子SW2との間の接続ノード(TS)に接続され、カソードが負荷220に接続される。負荷220は、ダイオードD2の他方端と直流電源PSの負極端子(接地電位GND)との間に接続される。コンデンサC4は、負荷120と並列に接続され、負荷220に供給される出力電圧を平滑化する。
The diode D2 is, for example, a Schottky diode, the anode is connected to the connection node (TS) between the inductor L2 and the switching element SW2, and the cathode is connected to the
制御回路210は、直流電源PSからの直流電圧により駆動され、スイッチング素子SW2のゲートに制御信号を出力する。スイッチング素子SW2は、制御回路210からの制御信号によって制御され、導通と非導通とが切換えられる。制御回路210による制御によって、スイッチング素子SW2が導通状態とされるとダイオードD2が非導通状態となり、逆にスイッチング素子SW2非導通状態とされるとダイオードD2が導通状態となる。すなわち、スイッチング素子SW2とダイオードD2とは相補的に導通と非導通とが切換えられる。そして、スイッチング素子SW2のデューティを調整することによって、負荷220へ供給される直流電圧を調整することができる。
The
そして、図12の電子回路200においては、スイッチング素子SW2に並列に放熱チップ230が接続され、さらにコンデンサC4に並列に放熱チップ240が接続されている。
Then, in the
図14は、変形例における電子回路の基板上における具体的な放熱チップの配置と、放熱チップによる放熱を説明するための図である。図14において、上段の図14(a)は比較例2の電子回路200#における電子部品の配置例であり、下段の図14(b)は本実施の形態の電子回路200における電子部品の配置例である。
FIG. 14 is a diagram for explaining a specific arrangement of heat dissipation chips on the substrate of the electronic circuit in the modified example and heat dissipation by the heat dissipation chips. In FIG. 14, FIG. 14 (a) in the upper row is an example of arrangement of electronic components in the
図14を参照して、実施の形態において説明したように、ダイオードD2においては、カソード側の電極に配置された基板において主に熱が発生するため、ダイオードD2のカソードに接続される出力電極Voutに熱が伝達される。出力電極Voutは負荷220にも接続されているため、負荷220側の回路において出力電極Voutに伝達された熱が適切に拡散できれば、出力電極Voutにおける熱の滞留は生じ難い。
As described in the embodiment with reference to FIG. 14, in the diode D2, heat is mainly generated in the substrate arranged on the electrode on the cathode side, so that the output electrode Vout connected to the cathode of the diode D2 Heat is transferred to the diode. Since the output electrode Vout is also connected to the
しかしながら、たとえば負荷220において出力電極Voutに接続される部分にフィルタ回路が設けられているような場合には、出力電極Voutの熱を負荷220において拡散することができずに、出力電極Voutに熱が滞留する場合が生じ得る。そのため、電子回路200においては、出力電極Voutと接地電極TGとの間に放熱チップ240が配置されており、これによって出力電極Voutの熱が接地電極TGへと伝達される(図14の矢印AR3)。
However, for example, when a filter circuit is provided in a portion of the
また、昇圧型のDC/DCコンバータの場合、インダクタL2、スイッチング素子SW2、およびダイオードD2が接続される電極TSは、基板上の他の電極から孤立した態様で形成されている。スイッチング素子SW2も、スイッチング動作において、ダイオードD2と同様に導通と非導通とが切換えられるため発熱が生じやすい。図14のように、スイッチング素子SW2がダイオードD2と同様にTO系のパッケージで形成される場合、トランジスタが形成される基板は、電極TSに接続されるドレイン電極に配置される。この場合、図6および図7で説明したように、電極TS側に熱が滞留しやすくなる。そのため、変形例の電子回路200においては、電極TSと接地電極TGとの間にも放熱チップ230が配置される。これによって、電極TS側に滞留した熱を接地電極TGに伝達することができる(図14の矢印AR2)。
Further, in the case of a step-up DC / DC converter, the electrode TS to which the inductor L2, the switching element SW2, and the diode D2 are connected is formed in a manner isolated from other electrodes on the substrate. Similar to the diode D2, the switching element SW2 also tends to generate heat because it can switch between conducting and non-conducting in the switching operation. As shown in FIG. 14, when the switching element SW2 is formed of the TO system package like the diode D2, the substrate on which the transistor is formed is arranged on the drain electrode connected to the electrode TS. In this case, as described with reference to FIGS. 6 and 7, heat tends to stay on the electrode TS side. Therefore, in the
以上のように、昇圧型のDC/DCコンバータの場合においても、回路基板上の発熱部位と、接地電極のような比較的温度が低く放熱効率の高い電極との間に、絶縁部材で形成された放熱チップを配置することによって、電子回路の電気特性に対して影響を与えることなく効率的に放熱を行なうことが可能となる。 As described above, even in the case of the boost type DC / DC converter, an insulating member is formed between the heat generating portion on the circuit board and the electrode having a relatively low temperature and high heat dissipation efficiency such as a ground electrode. By arranging the heat radiating chip, it is possible to efficiently radiate heat without affecting the electrical characteristics of the electronic circuit.
なお、図1および図12で示したようなDC/DCコンバータ以外の電子回路(たとえば、AC/DCコンバータあるいはDC/ACコンバータなど)においても、回路基板上で熱が滞留しやすい部分に放熱チップを配置してもよい。 Even in electronic circuits other than DC / DC converters (for example, AC / DC converters or DC / AC converters) as shown in FIGS. 1 and 12, heat dissipation chips are placed on the circuit board where heat tends to accumulate. May be placed.
今回開示された実施の形態は、すべての点で例示であって制限的なものではないと考えられるべきである。本開示の範囲は、上記した実施の形態の説明ではなくて請求の範囲によって示され、請求の範囲と均等の意味および範囲内でのすべての変更が含まれることが意図される。 The embodiments disclosed this time should be considered to be exemplary in all respects and not restrictive. The scope of the present disclosure is indicated by the scope of claims rather than the description of the embodiment described above, and is intended to include all modifications within the meaning and scope equivalent to the scope of claims.
10 パッケージ、20 カソード電極、30 アノード電極、40 基板、50 ワイヤーボンディング、100,200 電子回路、110,210 制御回路、120,220 負荷、130,230,240 放熱チップ、140 絶縁部材、151,152,TG,TS,Vout 電極、1411,1412 主面、1421~1424 側面、C1~C4 コンデンサ、D1,D2 ダイオード、GND 接地電位、L1,L2 インダクタ、PS 直流電源、SW1,SW2 スイッチング素子。 10 packages, 20 cathode electrodes, 30 anode electrodes, 40 substrates, 50 wire bonding, 100,200 electronic circuits, 110,210 control circuits, 120,220 loads, 130,230,240 heat dissipation chips, 140 insulating members, 151,152 , TG, TS, Vout electrode, 1411, 1412 main surface, 1421-1424 side surface, C1 to C4 capacitor, D1, D2 diode, GND ground potential, L1, L2 inductor, PS DC power supply, SW1, SW2 switching element.
Claims (5)
直方体形状を有し、対向する第1主面および第2主面と、前記第1主面および前記第2主面をつなぐ第1~第4側面とを含む絶縁部材と、
前記絶縁部材の対向する端部に形成された第1電極および第2電極とを備え、
前記絶縁部材において、前記第1側面と前記第2側面とが対向し、前記第3側面と前記第4側面とが対向しており、
前記第1電極は、前記第1側面の全面、前記第1主面の一部、および前記第2主面の一部に形成されており、
前記第2電極は、前記第2側面の全面、前記第1主面の一部、および前記第2主面の一部に形成されており、
前記第3側面の法線方向から前記放熱チップを平面視すると、前記第1電極および前記第2電極は、略C字形状を有している、放熱チップ。 It is a heat dissipation chip for dissipating heat from the circuit board.
An insulating member having a rectangular parallelepiped shape and including the first and second main surfaces facing each other and the first to fourth side surfaces connecting the first main surface and the second main surface.
A first electrode and a second electrode formed at opposite ends of the insulating member are provided.
In the insulating member, the first side surface and the second side surface face each other, and the third side surface and the fourth side surface face each other.
The first electrode is formed on the entire surface of the first side surface, a part of the first main surface, and a part of the second main surface.
The second electrode is formed on the entire surface of the second side surface, a part of the first main surface, and a part of the second main surface.
When the heat radiating chip is viewed in a plan view from the normal direction of the third side surface, the first electrode and the second electrode have a substantially C shape.
前記短辺に沿った前記放熱チップの長さに対する前記長辺に沿った前記放熱チップの長さで示されるアスペクト比は、1より大きい、請求項1に記載の放熱チップ。 The first side surface has a rectangular shape having a long side and a short side.
The heat radiating chip according to claim 1, wherein the aspect ratio indicated by the length of the heat radiating chip along the long side to the length of the heat radiating chip along the short side is larger than 1.
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| JP2019-212616 | 2019-11-25 | ||
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Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0582715A (en) * | 1991-09-24 | 1993-04-02 | Hitachi Denshi Ltd | Chip-shaped electronic parts |
| JP2000003775A (en) * | 1998-06-12 | 2000-01-07 | Mitsubishi Materials Corp | Chip type surge absorber and method of manufacturing the same |
| JP2010267834A (en) * | 2009-05-15 | 2010-11-25 | Stanley Electric Co Ltd | Optical semiconductor device module and heat conduction chip used therefor |
| JP2017204589A (en) * | 2016-05-12 | 2017-11-16 | イリソ電子工業株式会社 | Heat dissipation chip and heat dissipation structure |
-
2020
- 2020-11-13 WO PCT/JP2020/042390 patent/WO2021106620A1/en not_active Ceased
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0582715A (en) * | 1991-09-24 | 1993-04-02 | Hitachi Denshi Ltd | Chip-shaped electronic parts |
| JP2000003775A (en) * | 1998-06-12 | 2000-01-07 | Mitsubishi Materials Corp | Chip type surge absorber and method of manufacturing the same |
| JP2010267834A (en) * | 2009-05-15 | 2010-11-25 | Stanley Electric Co Ltd | Optical semiconductor device module and heat conduction chip used therefor |
| JP2017204589A (en) * | 2016-05-12 | 2017-11-16 | イリソ電子工業株式会社 | Heat dissipation chip and heat dissipation structure |
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