WO2021060189A1 - Probe for measuring connector and method of measuring connector - Google Patents

Abstract

This probe (101) for measuring a connector is connected to a connector to be measured. A plurality of probe parts (10) each have an outer conductor (12) and central conductors (11A-11H) in contact with a signal terminal. A plunger (2) comprises: insertion holes (H) into which the probe parts (10) are to be respectively inserted; and a ground conductor part (20) in contact with the ground terminal of the connector to be measured. The central conductors (11A-11H) are held in a state of being insulated from the outer conductor (12) such that the central conductors can protrude from a main surface (MS) of the plunger (2). The ground conductor part (20) has a protrusion part protruding in a protrusion direction of the central conductors (11A-11H) and a direction along the main surface (MS) between central conductors (11A-11B) of probe parts (10) adjacent on one side thereof and central conductors (11A-11H) of probe parts (10) adjacent on the other side thereof, among the plurality of probe parts (10).

Description

Connector measurement probe and connector measurement method

The present invention relates to a connector measuring probe and a connector measuring method for inspecting an electronic device provided with the connector by connecting to a connector forming a part of a path such as an electric signal, a voltage, and a current.

Patent Document 1 discloses a probe that abuts on a plurality of connectors provided on a circuit board or the like of an electronic device and simultaneously measures a signal transmitted at a plurality of locations of the electronic device. By using such a probe, contact between probes due to the arrangement of a plurality of probes can be avoided, and measurement becomes easy even if the circuit board is miniaturized and has a high density.

International Publication No. 2016/072193

In the probe shown in Patent Document 1, when a plurality of coaxial connectors are lined up, if the density is increased and the distance between the terminals is further narrowed, interference between the signal terminals may become apparent. Further, when a multi-pole connector or the like is used as an object to be measured, the structure is such that the terminals are not shielded. Alternatively, the shield structure is only formed when the connector is fitted to the other party's connector, and the shield structure may not be formed when the connector is not connected to the other party's connector. In both cases, isolation between signal terminals becomes a problem.

In this way, in a connector measurement probe that abuts a plurality of signal electrodes and measures them at the same time, the signal paths may interfere with each other and correct measurement may not be possible.

Therefore, an object of the present invention is to provide a connector measurement probe and a connector measurement method in which the isolation between signal paths is enhanced.

The connector measurement probe as an example of the present disclosure is a measurement probe for a connector to be measured having a plurality of signal terminals and a plurality of ground terminals, and a plurality of probes having a coaxial structure each having a central conductor in contact with the signal terminal. A conductive plunger having a portion, an insertion hole for inserting the probe portion, and a ground conductor portion in contact with the ground terminal is provided, and the central conductor is covered from the main surface of the plunger. The ground conductor portion is configured to be projectable toward the measurement connector, and the ground conductor portion is centered on the main surface between one adjacent probe portion and the other probe portion among the plurality of probe portions. It is characterized by having a protruding portion that protrudes in the protruding direction of the conductor.

Further, the method of measuring a connector as an example in the present disclosure is a method of measuring a connector having a plurality of signal terminals and a ground terminal by using a measuring probe, and the measuring probe is a method of measuring a connector. A plurality of probe portions each having a central conductor, an insertion hole for inserting the probe portions, and a conductive plunger having a ground conductor portion are provided, and the central conductor is the main surface of the plunger. The ground conductor portion is configured to project from the connector to the connector to be measured, and the ground conductor portion is formed on the main surface between one adjacent probe portion and the other probe portion of the plurality of probe portions. The connector to be measured is measured by having a protruding portion protruding in the protruding direction of the central conductor, bringing the central conductor into contact with the signal terminal, and contacting the ground conductor portion with the ground terminal. It is characterized by.

With the above structure, the adjacent center conductor of the probe portion is shielded by the ground conductor portion.

According to the present invention, a connector measurement probe having high isolation between signal paths can be obtained. In addition, the connector can be measured with high isolation between signal paths.

FIG. 1 is a perspective view of the connector measurement probe 101 according to the first embodiment. FIG. 2 is a plan view of the connector measurement probe 101. FIG. 3 is a perspective view of the connector 301 to be measured. FIG. 4 is a plan view of the connector 301 to be measured. FIG. 5 is a partial vertical sectional view of the connector 301 to be measured with the connector measurement probe 101 attached. FIG. 6 is a partial cross-sectional view of the connector 301 to be measured with the connector measurement probe 101 attached. FIG. 7 (A) is a diagram showing the reflection characteristics and isolation characteristics of the connector measurement probe 101 according to the present embodiment, and FIG. 7 (B) is a diagram showing the reflection characteristics and isolation characteristics of the connector measurement probe 101 as a comparative example. It is a figure which shows the isolation characteristic. FIG. 8 is a perspective view of the connector measurement probe 102 according to the second embodiment. FIG. 9 is a plan view of the connector measuring probe 102. FIG. 10A is a perspective view of the connector measurement probe 103 according to the third embodiment. FIG. 10B is a perspective view of the connector to be measured by the connector measurement probe 103. FIG. 11A is a cross-sectional view of the connector measurement probe 103 and the connector 303 to be measured. FIG. 11B is a cross-sectional view of the connector measuring probe 103 in contact with the connector 303 to be measured. FIG. 12A is a plan view showing an example of a region where the ground conductor portion 20 is formed in the connector measurement probe 103. FIG. 12B is a plan view of the connector 303 to be measured. 13 (A), 13 (B), and 13 (C) are plan views showing an example of the formation position of the ground conductor portion 20. FIG. 14 is a perspective view of the connector measurement probe 104 according to the fourth embodiment. FIG. 15A is a cross-sectional view of the connector measurement probe 105 and the connector to be measured 305 according to the fifth embodiment. FIG. 15B is a cross-sectional view of the connector measuring probe 105 in contact with the connector 305 to be measured. FIG. 16A is a cross-sectional view of the connector measurement probe 106 and the connector to be measured 306 according to the sixth embodiment. FIG. 16B is a cross-sectional view of the connector measuring probe 106 in contact with the connector 306 to be measured. FIG. 17 is a perspective view of the connector measurement probe 107 according to the seventh embodiment. FIG. 18A is a plan view of the connector measurement probe 107 according to the seventh embodiment, and FIG. 18B is a cross-sectional view of the connector measurement probe 107. FIG. 19 is a perspective view of the connector measurement probe 108 according to the eighth embodiment. FIG. 20A is a plan view of the connector measurement probe 108 according to the eighth embodiment, and FIG. 20B is a cross-sectional view of the connector measurement probe 108 in contact with the connector 308 to be measured. Is. 21 (A) is a plan view of the connector measurement probe 109 according to the ninth embodiment, and FIG. 21 (B) is a cross-sectional view of the connector measurement probe 109 in contact with the connector to be measured 309. Is. FIG. 22 is a perspective view of the connector 310 to be measured according to the tenth embodiment. FIG. 23A is a cross-sectional view of the connector measurement probe 110 and the connector to be measured 310. FIG. 23B shows a state in which the connector measurement probe 110 is attached to the connector 310 to be measured.

<< First Embodiment >>
FIG. 1 is a perspective view of the connector measurement probe 101 according to the first embodiment. FIG. 2 is a plan view of the connector measurement probe 101. The connector measurement probe 101 is a measurement probe for a connector to be measured having a plurality of signal terminals and a plurality of ground terminals. FIG. 3 is a perspective view of the connector 301 to be measured, and FIG. 4 is a plan view thereof.

The connector 301 to be measured shown in FIGS. 3 and 4 is composed of an insulating member 30 and a plurality of terminals and electrodes supported by the insulating member 30. Specifically, it includes eight signal terminals 31, eight ground terminals 32, and an outer conductor 33. In this example, the signal terminals 31 and the ground terminals 32 are alternately arranged in the X-axis direction. Further, two rows of four signal terminals 31 and four ground terminals 32 are formed.

The connector 301 to be measured is mounted on a circuit board of an electronic device. The signal terminal 31 of the connector 301 to be measured is connected to, for example, a transmission line for a high frequency signal in the millimeter wave band. Alternatively, these signal terminals 31 are a part of a high frequency signal transmission line.

The connector measuring probe 101 shown in FIGS. 1 and 2 is connected to the measuring device via a plurality of coaxial cables or multi-core cables. The tip of the connector measurement probe 101 is inserted and removed in the Z-axis direction with respect to the connector 301 to be measured. With the tip of the connector measuring probe 101 inserted into the connector 301 to be measured (insulated state), the predetermined characteristics of the electronic device are measured by the measuring device.

The connector measurement probe 101 includes eight probe portions 10 and a plunger 2 that holds these probe portions 10. Each probe portion 10 has a central conductor 11A to 11H, an outer conductor 12, and an insulator portion 13, respectively. The central conductors 11A to 11H of the probe portion 10 are held by the outer conductor 12 in a state of being insulated by the insulator portion 13.

Plunger 2 is made of stainless steel, for example, and has conductivity. The plunger 2 has an insertion hole H for inserting each of the probe portions 10. Since the outer conductor 12 of the probe portion 10 is in contact with the inner surface of the insertion hole H, the outer conductor 12 of the probe portion 10 and the plunger 2 are electrically conductive.

The probe portion 10 is held by the insulator portion 13 in a state where the tips of the central conductors 11A to 11H can protrude from the main surface MS of the plunger 2. The rear ends of the central conductors 11A to 11H are coil springs and are urged toward the tip. Therefore, the tips of the central conductors 11A to 11H come into contact with the signal terminals of the connector to be measured with a load corresponding to the repulsive force of the coil spring.

The plunger 2 includes two first and second ground conductor portions 20 that are in contact with the ground terminal of the connector to be measured. The ground conductor portion 20 is a conductor continuously formed on the main surface MS along a row of a plurality of probe portions 10. The ground conductor portion 20 has protruding portions 21A to projecting between the center conductors 11A to 11H of one of the plurality of probe portions 10 adjacent to each other and the center conductors 11A to 11H of the other probe portion 10. Has 21J.

In this example, the ground conductor portion 20 is integrated with the plunger 2. That is, the ground conductor portion 20 is an integral part of the plunger 2. For example, the ground conductor portion 20 is formed so as to protrude from the main surface of the plunger 2 by a machined method. The ground conductor portion 20 may be processed separately and adhered to the plunger 2 via a conductive adhesive or the like. Further, the ground conductor portion 20 may be assembled separately and fitted to the main surface of the plunger 2. The ground conductor portion 20 is not limited to two rows. For example, there may be three or more rows.

Although not shown, the plunger 2 including the ground conductor portion 20 is electrically connected to a ground such as an external conductor surrounding the core wire of a coaxial cable or a multi-core cable or a ground of a measuring device.

Further, the ground conductor portion 20 includes surrounding portions 22A to 22H located at positions that partially surround the periphery of the plurality of central conductors 11A to 11H when viewed from the protruding direction (Z-axis direction) of the central conductors 11A to 11H. In the example shown in FIG. 2, each of the eight surrounding portions 22A to 22H has a concave shape, and these surrounding portions 22A to 22H surround the eight central conductors 11A to 11H.

As shown in FIG. 2, the plurality of probe portions 10 are arranged along the first row C1 and the second row C2, which are parallel to each other.

The first ground conductor portion 20 has a plurality of protrusions 21A to 21E and a plurality of surrounding portions 22A to 22D formed between the plurality of protrusions 21A to 21E, and the second ground conductor portion 20 has a plurality of protrusions 21A to 22D. 21F to 21J and a plurality of surrounding portions 22E to 22H formed between the plurality of projecting portions 21F to 21J. When viewed in the direction perpendicular to the first row and the second row on the main surface MS, the plurality of protruding portions 21A to 21D of the first ground conductor portion 20 are the plurality of surrounding portions 22E to 22H of the second ground conductor portion 20. Facing. Further, the plurality of projecting portions 21F to 21I of the second ground conductor portion 20 face the plurality of surrounding portions 22A to 22D of the first ground conductor portion 20.

As shown in FIG. 2, the protruding portion 21 also protrudes in the direction along the main surface MS (Y-axis direction), and protrudes between the adjacent central conductors of the probe portions 10 of the first row C1. The extension lines of the portions 21A, 21B, 21C, and 21D in the protruding direction along the main surface MS intersect the central conductors 11E to 11H of the probe portion 10 of the second row C2, respectively. For example, in FIG. 2, a straight line extending from the first row C1 in the second row C2 direction and having an arrowhead at the tip is the main of the protruding portion 21C between the adjacent central conductors of the probe portions 10 of the first row C1. It is an extension line in the protruding direction along the surface MS. This extension line intersects the central conductor 11F of the probe portion 10 of the second row C2. This relationship is the same even if the first column C1 and the second column C2 are exchanged. For example, a straight line extending from the second row C2 in the direction of the first row C1 with an arrowhead at the tip is along the main surface MS of the protruding portion 21G between the adjacent central conductors of the probe portions 10 of the second row C2. It is an extension of the protruding direction. This extension line intersects the central conductor 11C of the probe portion 10 of the first row C1.

Further, not only the entire plurality of central conductors 11A to 11H are surrounded by a plurality of surrounding portions 22A to 22H, but also the central conductors 11A to 11H each have protruding portions (protruding portions) on both side portions in the X-axis direction. It is also surrounded by two protrusions of 21A to 21J). Furthermore, it is also surrounded by the protrusions of the opposing rows. For example, the central conductor 11F is surrounded by the surrounding portion 22F, the protruding portions 21G and 21H, and the protruding portion 21C. Similarly, for example, the central conductor 11C is surrounded by a surrounding portion 22C, a protruding portion 21C, 21D and a protruding portion 21G.

With the connector measurement probe 101 attached to the connector 301 to be measured, the engaging portion 23 of the connector measurement probe 101 engages with the engaging portion 33E (FIG. 3) of the connector 301 to be measured. By this engagement, the mating state of the connector measurement probe 101 with respect to the connector 301 to be measured is ensured.

The ground conductor portion 20 has contact portions Ei and Eo in contact with the ground terminal 32 of the connector 301 to be measured. The contact portion Ei is in contact with the inner surface of the connector 301 to be measured near the center of the ground terminal 32, and the contact portion Eo is in contact with the inner surface of the connector 301 to be measured closer to the outside of the ground terminal 32.

FIG. 5 is a partial vertical cross-sectional view of the connector 301 to be measured with the connector measurement probe 101 attached. FIG. 6 is a partial cross-sectional view of the connector 301 to be measured with the connector measurement probe 101 attached. FIG. 5 is a part of a cross section at the YY portion in FIG. Further, the height of the cross section of FIG. 6 corresponds to the SS portion in FIG.

With the connector measurement probe 101 attached to the connector 301 to be measured, the tip of the central conductor 11C of the probe portion 10 of the connector measurement probe 101 abuts on the upper surface of the signal terminal 31 of the connector 301 to be measured and electrically. Be connected. Further, the contact portions Ei and Eo of the ground conductor portion 20 of the connector measurement probe 101 are in contact with the ground terminal 32 of the connector 301 to be measured and are electrically connected.

FIG. 7 (A) is a diagram showing the reflection characteristics and isolation characteristics of the connector measurement probe 101 according to the present embodiment, and FIG. 7 (B) is a diagram showing the reflection characteristics and isolation characteristics of the connector measurement probe 101 as a comparative example. It is a figure which shows the isolation characteristic. The connector measurement probe as a comparative example does not include the protrusions 21A to 21J shown in FIGS. 1 and 2.

In FIGS. 7 (A) and 7 (B), the reflection characteristic RL1 is the reflection loss in the probe portions 10 other than both ends among the eight probe portions 10 shown in FIGS. 1 and 2, and the reflection characteristic RL2 is Of the eight probe portions 10 shown in FIGS. 1 and 2, the reflection loss at the probe portions 10 at both ends. Further, the isolation ISO-C is the isolation between the adjacent probe portions 10 as seen from the connector 301 side to be measured, and the isolation ISO-P is the isolation between the adjacent probe portions 10 as seen from the connector measurement probe 101 side. Is the isolation at.

With the connector measurement probe as a comparative example, only a reflection loss characteristic of about -5 dB was obtained at 55 GHz. In addition, only probe-to-probe isolation characteristics of -13 dB or less are obtained at 55 GHz.

On the other hand, according to the connector measurement probe 101 of the present embodiment, a reflection loss characteristic of −20 dB or less is obtained in a frequency band of 55 GHz or less. Further, an isolation characteristic between probes of −40 dB or less is obtained in a frequency band of 55 GHz or less.

According to the present embodiment, with the connector measurement probe 101 mounted on the connector 301 to be measured, the electromagnetic field between the center conductors 11A to 11H is caused by the protruding portions 21A to 21J of the ground conductor portion 20 of the connector measurement probe 101. A global shield is made. Further, the central conductors 11A to 11H are surrounded by the surrounding portions 22A to 22H and the protruding portions 21A to 21J, so that the area not surrounded by the ground conductor is formed in the state where the connector measurement probe 101 is attached to the connector 301 to be measured. It becomes shorter and impedance matching is ensured. That is, it is possible to perform measurement in a low reflection state where impedance matching is ensured. Further, since the central conductors 11A to 11H are surrounded by the surrounding portions 22A to 22H and the protruding portions 21A to 21J, an electromagnetic field shield is provided with the outside.

<< Second Embodiment >>
In the second embodiment, a connector measurement probe having a different shape of the ground conductor portion from the example shown in the first embodiment is shown.

FIG. 8 is a perspective view of the connector measurement probe 102 according to the second embodiment. FIG. 9 is a plan view of the connector measuring probe 102. Similar to the connector measurement probe 101 shown above, the connector measurement probe 102 is also a measurement probe for a connector to be measured having a plurality of signal terminals and a plurality of ground terminals.

The connector measurement probe 102 includes eight probe portions 10 and a plunger 2 that holds these probe portions 10. Each probe portion 10 has a central conductor 11, an outer conductor 12, and an insulator portion 13, respectively. The central conductor 11 of the probe portion 10 is held by the outer conductor 12 in a state of being insulated by the insulator portion 13. The attachment structure of the probe portion 10 to the plunger 2 is as shown in the first embodiment.

The plunger 2 includes eight ground conductors 20 in contact with the ground terminal of the connector to be measured. As shown in FIG. 9, the ground conductor portion 20 has a Z-axis direction between the center conductor 11 of one of the plurality of probe portions 10 adjacent to each other and the center conductor 11 of the other probe portion 10. It has a protruding portion 21 that protrudes from the surface.

As shown in FIG. 9, the plurality of probe portions 10 are arranged along the first row C1 and the second row C2 parallel to each other.

As shown in FIG. 9, the protruding portion 21 also protrudes in the Y-axis direction along the main surface MS, and among the probe portions 10 of the first row C1, the protruding portion 21 is located between adjacent central conductors. The extension line in the protruding direction along the main surface MS intersects the central conductor 11 of the probe portion 10 of the second row C2, respectively. That is, in FIG. 9, the straight line extending from the first row C1 toward the second row C2 with the tip arrowhead is the main of the protruding portion 21 between the adjacent central conductors of the probe portion 10 of the first row C1. It is an extension line in the protruding direction along the surface MS. This extension line intersects the central conductor 11 of the probe portion 10 of the second row C2. This relationship is the same even if the first column C1 and the second column C2 are exchanged. For example, a straight line extending from the second row C2 in the direction of the first row C1 with an arrowhead at the tip is along the main surface MS of the protruding portion 21 between the adjacent central conductors of the probe portions 10 of the second row C2. It is an extension of the protruding direction. This extension line intersects the central conductor 11 of the probe portion 10 of the first row C1.

The ground conductor portion 20 has contact portions Ei and Eo in contact with the ground terminal 32 of the connector 301 to be measured (FIGS. 3 and 4). The contact portion Ei is in contact with the inner surface of the connector 301 to be measured near the center of the ground terminal 32, and the contact portion Eo is in contact with the inner surface of the connector 301 to be measured closer to the outside of the ground terminal 32.

According to the second embodiment, with the connector measurement probe 102 mounted on the connector 301 to be measured, the protrusion 21 of the ground conductor portion 20 of the connector measurement probe 102 between the central conductors 11 adjacent to each other. An electromagnetic shield is made.

<< Third Embodiment >>
In the third embodiment, a connector measurement probe having a different shape of the ground conductor portion from the examples shown so far will be described.

FIG. 10A is a perspective view of the connector measurement probe 103 according to the third embodiment. FIG. 10B is a perspective view of the connector to be measured by the connector measurement probe 103.

The connector measurement probe 103 includes two probe portions 10 and a plunger 2 that holds these probe portions 10. Each probe portion 10 has a central conductor 11 and an insulator portion 13, respectively. The central conductor 11 of the probe portion 10 is held by the plunger 2 in a state of being insulated by the insulator portion 13.

The connector 303 to be measured is composed of an insulating member 30, a signal terminal 31 supported by the insulating member 30, and a ground terminal 32. One coaxial connector is composed of one signal terminal 31, one ground terminal 32, and an insulating member 30 that supports them. In this example, the connector 303 to be measured is composed of two coaxial connectors.

The connector 303 to be measured is mounted on a circuit board of an electronic device. The signal terminal 31 and the ground terminal 32 of the connector 303 to be measured are connected to, for example, a high-frequency signal transmission line.

The connector measurement probe 103 shown in FIGS. 10 (A) and 10 (B) is connected to the measuring device via two cables. In the example shown in FIGS. 10 (A) and 10 (B), the center conductor 11 of the two probe portions 10 and the signal terminal 31 of the coaxial connector are arranged so as to be aligned in the X-axis direction, and the connector measurement probe is provided. The tip of 103 is in contact with the connector 303 to be measured in the Z-axis direction. A predetermined characteristic of the electronic device is measured by the measuring device in a state where the tip of the connector measuring probe 103 is in contact with the connector 303 to be measured.

Plunger 2 is, for example, a stainless steel molded body and has conductivity. The plunger 2 has an insertion hole H for inserting each of the probe portions 10.

The probe portion 10 is held by the insulator portion 13 in a state where the tip of the central conductor 11 can protrude from the main surface MS of the plunger 2. The rear end of the central conductor 11 is a coil spring, which is urged in the tip direction (Z-axis direction). Therefore, the tip of the central conductor 11 comes into contact with the signal terminal 31 of the connector to be measured with a load corresponding to the repulsive force of the coil spring.

The plunger 2 includes a ground conductor portion 20 in contact with the ground terminal of the connector to be measured. The ground conductor portion 20 has a protruding portion that protrudes from the main surface MS of the plunger 2 by a predetermined dimension in the protruding direction (Z-axis direction) of the central conductor 11 of the two probe portions 10. In this example, the entire ground conductor portion 20 is a protruding portion.

FIG. 11A is a cross-sectional view of the connector measurement probe 103 and the connector to be measured 303. FIG. 11B is a cross-sectional view of the connector measuring probe 103 in contact with the connector 303 to be measured.

As shown in FIGS. 11A and 11B, the short side of the ground conductor portion 20 of the connector measurement probe 103 is in a state where the connector measurement probe 103 is in contact with the connector 303 to be measured. The vicinity of the center abuts on the ground terminal 32 of the connector 303 to be measured. The parts circled in FIG. 11B are these contact portions. A tapered guide portion 24 is formed on the outer peripheral portion of the lower surface of the plunger 2. Therefore, when the connector measurement probe 103 is brought into contact with the connector 303 to be measured, the guide portion 24 slides on the ground terminal 32 of the connector to be measured, and the position of the connector measurement probe 103 with respect to the connector 303 to be measured is a specified position. It is decided to. Further, the guide portion 24 causes the central axis of the central conductor 11 of the connector measurement probe 103 and the central axis of the signal terminal 31 of the connector 303 to be measured in the XY plane (extension direction of the central conductor 11) by the guide action. Align in a plane perpendicular to.

Further, in a state where the connector measurement probe 103 is in contact with the connector 303 to be measured, the guide portion 24 shields the periphery of the connection portion between the connector 303 to be measured and the connector measurement probe 103. Electromagnetic field interference inside and outside is suppressed.

According to the above structure, between the center conductors 11 of the adjacent probe portions 10 and between the signal terminals 31 of the adjacent coaxial connectors are shielded by the ground conductor portion 20. Further, since the outer edge of the lower surface of the plunger 2 projects in the projecting direction of the central conductor 11 due to the formation of the guide portion 24, the outer edge of the lower surface of the plunger 2 shields between the connector measurement probe 103 and the outside thereof. To do.

In this example, the ground conductor portion 20 is in contact with the ground terminal 32 of the connector 303 to be measured, but the configuration may not be in contact with the ground terminal 32. Since the protruding portion of the ground conductor portion 20 exists between the central conductors 11 of the adjacent probe portions 10 in this way, interference between the central conductors 11 of the adjacent probe portions 10 can be suppressed. However, if the protruding portion of the ground conductor portion 20 is brought into contact with the ground terminal 32, the interference suppression effect is higher because the central conductors 11 of the adjacent probe portions 10 can be physically blocked.

In FIGS. 10 (A), 10 (B), 11 (A), and 11 (B), the width of the ground conductor portion 20 in the Y-axis direction is wider than the width of the insulator portion 13, and X An example is shown in which the width in the axial direction is substantially the entire width of the distance between the two probe portions 10, but the formation range of the ground conductor portion 20 is not limited to this.

FIG. 12A is a plan view showing an example of the formation region of the ground conductor portion 20 in the connector measurement probe 103. The broken line in FIG. 12A indicates a region suitable for forming the ground conductor portion 20. FIG. 12B is a plan view of the connector 303 to be measured, and the broken line in the drawing indicates the formation of the ground conductor portion 20 in a state where the connector measurement probe 103 is in contact with the connector 303 to be measured. Indicates a suitable area. The range surrounded by the broken line in FIGS. 12A and 12B is not the outline of the ground conductor portion 20, and if the ground conductor portion 20 exists in this region, the ground conductor portion 20 exerts a shielding effect. Shows the range.

As a premise, the state where the ground conductor portion 20 exists at a position that hinders the contact between the center conductor 11 of the probe portion 10 and the signal terminal 31 of the connector 303 to be measured is excluded.

As shown in FIGS. 12A and 12B, the width of the formation region of the ground conductor portion 20 in the arrangement direction (X-axis direction) of the central conductor 11 of the connector measurement probe 103 is the adjacent connector to be measured. It is the width between the outer edges of the signal terminals 31 of. Further, the width of the formation region of the ground conductor portion 20 in the orthogonal direction (Y-axis direction) with respect to the arrangement direction (X-axis direction) of the central conductor 11 of the connector measurement probe 103 is the width of the ground terminal 32 of the connector to be measured. ..

If the ground conductor portion 20 is present in the region shown by the broken line in FIG. 12 (A), the ground conductor portion 20 shields between the center conductors 11 of the adjacent probe portions 10 and the signal terminals 31 of the adjacent coaxial connectors. Will be done.

Although FIG. 11B shows an example in which the two short sides of the ground conductor portion 20 abut on the ground terminals 32 of the two connectors to be measured, only one short side abuts on the ground terminal 32. Even in this case, there is a shielding effect between the central conductors 11 of the adjacent probe portions 10 and between the signal terminals 31 of the adjacent coaxial connectors.

13 (A), 13 (B), and 13 (C) are plan views showing an example of the formation position of the ground conductor portion 20. In these figures, the broken line is the proper formation region of the ground conductor portion 20 like the broken line shown in FIG. 12 (B). In the example of FIG. 13A, the ground conductor portion 20 comes into contact with one of the ground terminals 32 of the two ground terminals 32 of the connector 303 to be measured. In the examples of FIGS. 13B and 13C, the ground conductor portion 20 comes into contact with the two ground terminals 32 of the connector 303 to be measured. In particular, in the example of FIG. 13C, the ground conductor portion 20 is formed at a position extending over a line passing between the two signal terminals 31.

It is preferable that the ground conductor portion 20 is formed in an appropriate region indicated by a broken line, but it is more preferable that the ground conductor portion 20 is formed on a straight line between the signal terminals 31, that is, close to a straight line between the central conductors 11. Further, it is more preferable that the ground conductor portion 20 contacts not only one ground terminal 32 but also both ground terminals 32. Further, the wider the width W of the ground conductor portion 20 with respect to the straight line between the signal terminals 31, that is, in the direction orthogonal to the straight line between the central conductors 11, the higher the isolation between the signal paths.

<< Fourth Embodiment >>
In the fourth embodiment, a connector measurement probe having a different shape of the ground conductor portion from the examples shown so far will be described.

FIG. 14 is a perspective view of the connector measurement probe 104 according to the fourth embodiment. The configuration of the connector to be measured by the connector measurement probe 104 is as shown in FIG. 10 (B).

The connector measurement probe 104 includes two probe portions 10 and a plunger 2 that holds these probe portions 10. Each probe portion 10 has a central conductor 11 and an insulator portion 13, respectively. The central conductor 11 of the probe portion 10 is held by the plunger 2 in a state of being insulated by the insulator portion 13.

Plunger 2 is, for example, a stainless steel molded body and has conductivity. The plunger 2 has an insertion hole H for inserting each of the probe portions 10.

The probe portion 10 is held by the insulator portion 13 in a state where the tip of the central conductor 11 can protrude from the main surface MS of the plunger 2. The rear end of the central conductor 11 is a coil spring, which is urged in the tip direction (Z-axis direction).

The plunger 2 includes two ground conductor portions 20 in contact with the ground terminal of the connector to be measured. The ground conductor portion 20 has a protruding portion that protrudes from the main surface MS of the plunger 2 by a predetermined dimension in the protruding direction (Z-axis direction) of the central conductor 11 of the two probe portions 10. In this example, the entire ground conductor portion 20 is a protruding portion.

As shown in this embodiment, there may be a plurality of ground conductor portions 20 between adjacent central conductors 11. In this way, by separating the ground conductor portion 20 (protruding portion) for each ground terminal (ground terminal 32 shown in FIG. 10B) of the connector to be measured, which is the contact destination, the ground conductor with respect to the ground terminal 32 The contact pressure of the portion 20 (protruding portion) can be easily increased.

Although FIG. 14 shows an example in which two ground conductor portions 20 are provided, one ground conductor portion 20 may be provided. Even when the ground conductor portion 20 comes into contact with one of the ground terminals 32, there is a shielding effect between the center conductors 11 of the adjacent probe portions 10 and between the signal terminals 31 of the adjacent coaxial connectors.

<< Fifth Embodiment >>
In the fifth embodiment, the connector measurement probe characterized by the contact structure between the ground terminal of the connector to be measured and the ground conductor portion of the connector measurement probe will be described.

FIG. 15A is a cross-sectional view of the connector measurement probe 105 and the connector to be measured 305 according to the fifth embodiment. FIG. 15B is a cross-sectional view of the connector measuring probe 105 in contact with the connector 305 to be measured. The configuration of the connector 305 to be measured is the same as that of the connector 303 to be measured shown in FIG. 10 (B).

The schematic structure of the ground conductor portion 20 of the connector measuring probe 105 is as shown in FIG. 10 (A), but the short side thereof has an inclined surface whose width expands in the direction from the tip portion to the base portion of the protruding portion. .. That is, the tapered portion 20T is formed on the short side. A tapered portion 32T is formed on the outer edge of the connector 305 to be measured near the upper surface of the ground terminal 32. That is, the cross-sectional shape of the tapered portion 32T is tapered.

As shown in FIGS. 15A and 15B, the short side of the ground conductor portion 20 of the connector measurement probe 105 is in a state where the connector measurement probe 105 is in contact with the connector 305 to be measured. The tapered portion 20T near the center comes into contact with the tapered portion 32T of the ground terminal 32 of the connector 305 to be measured. The parts circled in FIG. 15B are these contact portions.

Although FIGS. 15 (A) and 15 (B) show an example in which the two tapered portions 20T of the ground conductor portion 20 abut on the tapered portions 32T of the two ground terminals 32 of the connector 305 to be measured, respectively. The structure may be such that one of the tapered portions 20T of the ground conductor portion 20 abuts on one of the ground terminals 32.

According to this embodiment, since the contact area between the ground terminal 32 of the connector 305 to be measured and the ground conductor portion 20 of the connector measurement probe 105 becomes large, the distance between the center conductors 11 of the adjacent probe portions 10 and the adjacent coaxial cable The shielding effect between the signal terminals 31 of the connector is enhanced. Further, the connector measurement probe 105 can be easily aligned with the connector 305 to be measured.

<< 6th Embodiment >>
In the sixth embodiment, the connector measurement probe characterized by the contact structure between the ground terminal of the connector to be measured and the ground conductor portion of the connector measurement probe will be described.

FIG. 16A is a cross-sectional view of the connector measurement probe 106 and the connector to be measured 306 according to the sixth embodiment. FIG. 16B is a cross-sectional view of the connector measuring probe 106 in contact with the connector 306 to be measured. The configuration of the connector 306 to be measured is the same as that of the connector 303 to be measured shown in FIG. 10 (B).

The schematic structure of the ground conductor portion 20 of the connector measurement probe 106 is as shown in FIG. 10 (A), but its short side is in contact with the two ground terminals 32 of the connector 306 to be measured.

Although FIGS. 16A and 16B show an example in which the two side surfaces of the ground conductor portion 20 abut on the outer surfaces of the two ground terminals 32 of the connector 306 to be measured, one of the grounds is used. The structure may be such that one side surface of the ground conductor portion 20 abuts on the terminal 32.

According to the present embodiment, since the contact area between the ground terminal 32 of the connector 306 to be measured and the ground conductor portion 20 of the connector measurement probe 106 becomes large, the distance between the center conductors 11 of the adjacent probe portions 10 and the adjacent coaxial cable The shielding effect between the signal terminals 31 of the connector is enhanced. Further, the connector measurement probe 106 can be easily aligned with the connector 306 to be measured.

<< Seventh Embodiment >>
In the seventh embodiment, the connector measurement probe characterized by the structure of the ground conductor portion of the connector measurement probe with respect to the ground terminal of the connector to be measured will be described.

FIG. 17 is a perspective view of the connector measurement probe 107 according to the seventh embodiment. FIG. 18A is a plan view of the connector measurement probe 107 according to the seventh embodiment, and FIG. 18B is a cross-sectional view of the connector measurement probe 107. The structure of the connector to be measured (not shown) is as shown in FIGS. 10 (B) and 15 (A).

The connector measurement probe 107 includes two probe portions 10 and a plunger 2 that holds these probe portions 10. Each probe portion 10 has a central conductor 11 and an insulator portion 13, respectively. The central conductor 11 of the probe portion 10 is held by the plunger 2 in a state of being insulated by the insulator portion 13.

A ground conductor portion 20 is formed on the main surface MS of the connector measurement probe 107. Unlike the ground conductor portion 20 shown in FIG. 10A, a part of the ground conductor portion 20 surrounds the central conductor 11 of the probe portion 10 in the circumferential direction over a predetermined length. In this example, the main surface MS is formed in a semicircular shape when viewed in the vertical direction so as to surround the main surface MS by half a circumference. Further, a tapered portion 20T is formed in the semicircular portion of the ground conductor portion 20. With the connector measurement probe 107 in contact with the connector to be measured, the tapered portion 20T of the semicircular portion of the ground conductor portion 20 of the connector measurement probe 107 is the tapered portion of the ground terminal 32 of the connector to be measured (FIG. 15). It comes into contact with the tapered portion 32T) appearing in (A).

According to the present embodiment, the contact area between the ground terminal of the connector to be measured and the ground conductor portion 20 of the connector measurement probe 107 becomes large, so that between the center conductors 11 of the adjacent probe portions 10 and the adjacent coaxial connector. The shielding effect between the signal terminals 31 is enhanced. Further, since a wider range around the signal terminal of the connector to be measured and the central conductor 11 of the probe is surrounded by the ground conductor portion 20, the shielding effect is further enhanced, and the isolation between the signal paths is effectively enhanced. ..

In the present embodiment, since the tapered portion 20T of the ground conductor portion 20 has a semicircular shape along the ground terminal of the connector to be measured, the tapered portion 20T of the ground conductor portion 20 and the ground terminal of the connector to be measured Is guided in the direction along the main surface MS. Therefore, the above guide is performed even without the guide portion 24 as shown in FIG. 10 (A).

In the present embodiment, since the protrusion is not formed on the outer periphery of the main surface MS of the plunger 2, a space is formed in the portion surrounded by an ellipse in FIG. 18B. Therefore, components other than the connector to be measured can be mounted on the portion of the circuit board on which the connector to be measured is mounted, which is surrounded by the ellipse.

Also in the present embodiment, as shown in FIGS. 10 (A), 11 (A), 11 (B) and the like, the outer edge of the lower surface of the plunger 2 may protrude in the protruding direction of the central conductor 11. .. Due to the structure, the outer edge of the lower surface of the plunger 2 can shield between the connector measurement probe 107 and the outside thereof.

<< Eighth Embodiment >>
In the eighth embodiment, the connector measurement probe in which the protruding position of the ground conductor portion with respect to the ground terminal of the connector to be measured is different from the examples shown so far is shown.

FIG. 19 is a perspective view of the connector measurement probe 108 according to the eighth embodiment. FIG. 20A is a plan view of the connector measurement probe 108 according to the eighth embodiment, and FIG. 20B is a cross-sectional view of the connector measurement probe 108 in contact with the connector 308 to be measured. Is. The configuration of the connector 308 to be measured is the same as that of the connector 303 to be measured shown in FIG. 10 (B).

The connector measurement probe 108 includes two probe portions 10 and a plunger 2 that holds these probe portions 10. Each probe portion 10 has a central conductor 11 and an insulator portion 13, respectively. The central conductor 11 of the probe portion 10 is held by the plunger 2 in a state of being insulated by the insulator portion 13.

Two ground conductor portions 20 are formed on the main surface MS of the connector measurement probe 108. Unlike the ground conductor portion 20 shown in FIG. 10 (A), a part of the ground conductor portion 20 is a semicircle when the main surface MS is viewed in the vertical direction so as to surround the center conductor 11 of the probe portion 10 by half a circumference. It is formed in a shape. Further, a tapered portion 20T is formed in the semicircular portion of the ground conductor portion 20. With the connector measurement probe 108 in contact with the connector 308 to be measured, the tapered portion 20T of the semicircular portion of the ground conductor portion 20 of the connector measurement probe 108 is near the tip of the ground terminal 32 of the connector 308 to be measured. It touches the inner edge.

Also in this embodiment, the space between the center conductors 11 of the adjacent probe portions 10 and the signal terminals 31 of the adjacent coaxial connectors are shielded by the ground conductor portion 20.

In addition, also in this embodiment, as in the case of the seventh embodiment, since the protruding portion is not formed on the outer periphery of the main surface MS of the plunger 2, the portion indicated by an ellipse in FIG. 20 (B) is shown. A space is formed. Therefore, a component other than the connector to be measured can be mounted on the portion of the circuit board on which the connector to be measured is mounted, which is surrounded by the ellipse.

<< Ninth Embodiment >>
In the ninth embodiment, a connector measuring probe characterized by the structure of the protruding portion of the ground conductor portion with respect to the ground terminal of the connector to be measured will be described.

21 (A) is a plan view of the connector measurement probe 109 according to the ninth embodiment, and FIG. 21 (B) is a cross-sectional view of the connector measurement probe 109 in contact with the connector to be measured 309. Is. The configuration of the connector to be measured 309 is the same as that of the connector 303 to be measured shown in FIG. 10 (B).

Two ground conductors 25 are projected on the main surface MS of the connector measurement probe 109. These ground conductor portions 25 are probe pins, and are elastically projected in the direction perpendicular to the main surface MS by an internal coil spring. As shown in FIG. 21 (B), the ground conductor portion 25 is press-fitted into the plunger 2, and the ground conductor portion 25 is arranged at a position where it abuts on the top edge of the ground terminal 32 of the connector 309 to be measured. .. The ground conductor portion 25 is electrically conductive with the plunger 2.

Although FIGS. 21 (A) and 21 (B) show an example in which the ground conductor portion 25 abuts on the top surface of the ground terminal 32, the ground conductor portion 25 abuts on the tapered portion of the ground terminal 32. May be good.

According to this embodiment, height variations (due to manufacturing accuracy, etc.) of the ground conductor portion 25 and the ground terminal 32 can also be absorbed. Also in this embodiment, the center conductors 11 of the adjacent probe portions 10 and the signal terminals 31 of the adjacent coaxial connectors are shielded by the ground conductor portion 25.

<< 10th Embodiment >>
In the tenth embodiment, the structure of the connector to be measured and the corresponding connector measurement probe different from the examples shown so far will be shown.

FIG. 22 is a perspective view of the connector 310 to be measured according to the tenth embodiment. The connector 310 to be measured is a double coaxial switch connector, and includes an insulating member 30, an opening OP, an internal terminal 34, and an external terminal 35. The bottom surface of the connector 310 to be measured is substantially rectangular, and two internal terminals 34 are formed along the two long sides thereof. This coaxial switch connector is, for example, a coaxial connector disclosed in WO 2014/013834 A1, and by inserting a connector measurement probe from the opening OP, the connection between the internal terminals is separated and the connector measurement probe is inside. It is electrically connected to the terminal.

FIG. 23 (A) is a cross-sectional view of the connector measurement probe 110 and the connector to be measured 310. FIG. 23B shows a state in which the connector measurement probe 110 is attached to the connector 310 to be measured.

The connector measurement probe 110 includes two probe portions 10 and a plunger 2 that holds these probe portions 10. Each probe portion 10 has a central conductor 11 and an insulator portion 13, respectively. The central conductor 11 of the probe portion 10 is held by the plunger 2 in a state of being insulated by the insulator portion 13. A tapered guide portion 24 is formed on the outer peripheral portion of the lower surface of the plunger 2.

The plunger 2 includes a ground conductor portion 20 in contact with the external terminal 35 of the connector 310 to be measured. The ground conductor portion 20 projects from the main surface MS of the plunger 2 in the projecting direction of the two central conductors 11.

As shown in FIG. 23B, with the connector measurement probe 110 attached to the connector 310 to be measured, the central conductor 11 of the connector measurement probe 110 abuts on the internal terminal 34 in the connector 310 to be measured, and When the internal terminal 34 is pushed down, the internal terminal 34 and the internal terminal (not shown) in contact with the internal terminal 34 are separated from each other.

With the above structure, the space between the central conductors 11 of the adjacent probe portions 10 is shielded by the ground conductor portion 20.

<< Other Embodiments >>
In the first and second embodiments, a connector measurement probe having two rows of probe units 10 is exemplified for the connector 301 to be measured in which a plurality of signal terminals are arranged in two rows. Not limited to multiple columns. For example, only one row may be provided.

Further, in the first and second embodiments, a plurality of signal terminals of the connector 301 to be measured are arranged in two rows, and the arrangement pitch of the signal terminals is deviated by half a pitch between one row and the other row. The measurement target is the connector to be measured, but the same can be applied to the connector to be measured in which the arrangement pitch of the signal terminals in the adjacent row is not deviated.

Finally, the above description of the embodiment is exemplary in all respects and is not restrictive. Modifications and changes can be made as appropriate for those skilled in the art. The scope of the present invention is shown not by the above-described embodiment but by the scope of claims. Further, the scope of the present invention includes modifications from the embodiment within the scope of the claims and within the scope of the claims.

C1 ... 1st row C2 ... 2nd row Ei, Eo ... Contact part H ... Insertion hole MS ... Main surface OP ... Opening 2 ... Plunger 10 ... Probe part 11, 11A to 11H ... Central conductor 12 ... Outer conductor 13 ... Insulator Part 20 ... Ground conductor part 20T ... Tapered part 21,21A-21J ... Protruding part 22A-22H ... Enclosing part 23 ... Engaging part 24 ... Guide part 25 ... Ground conductor part 30 ... Insulating member 31 ... Signal terminal 32 ... Ground terminal 32T ... Tapered part 33 ... External conductor 33E ... Engaging part 34 ... Internal terminal 35 ... External terminal 101 to 110 ... Connector measurement probe 301, 303 to 306, 309, 310 ... Connector to be measured

Claims (16)

A measurement probe for a connector under test that has multiple signal terminals and ground terminals.
It is provided with a plurality of probe portions each having a central conductor in contact with the signal terminal, an insertion hole for inserting the probe portion, and a conductive plunger having a ground conductor portion.
The central conductor is configured to project from the main surface of the plunger toward the connector to be measured.
The ground conductor portion has a protruding portion on the main surface that protrudes in the protruding direction of the central conductor between one adjacent probe portion and the other probe portion among the plurality of probe portions. Probe for connector measurement. An outer conductor surrounding the central conductor in the insertion hole,
It has an insulating member that insulates the outer conductor and the central conductor.
A coaxial line is composed of the central conductor, the outer conductor, and the insulating member.
The connector measurement probe according to claim 1. An insulating member that insulates the central conductor and the plunger is provided in the insertion hole.
A coaxial line is composed of the central conductor, the plunger, and the insulating member.
The connector measurement probe according to claim 1. The protrusion has an inclined surface that widens in the direction from the tip to the base of the protrusion.
The connector measurement probe according to any one of claims 1 to 3. The protruding portion is movable in an elastic state in the protruding direction.
The connector measurement probe according to any one of claims 1 to 4. The width of the first direction connecting the central conductor of the adjacent probe portion and the central conductor of the other probe portion along the main surface is the first width, and the width of the first direction is along the main surface. When the width of the ground terminal in the orthogonal direction is defined as the second width, at least a part of the protruding portion exists in a rectangular region surrounded by the first width and the second width.
The connector measurement probe according to any one of claims 1 to 5. The protrusion is arranged so as to hang on a line connecting the center conductor of the adjacent probe portion and the center conductor of the other probe portion when viewed in a direction perpendicular to the main surface.
The connector measurement probe according to claim 6. The ground conductor portion is formed of a conductor continuous along the main surface.
The connector measurement probe according to any one of claims 1 to 7. The ground conductor portion includes a surrounding portion located at a position surrounding the periphery of the central conductor when viewed from the protruding direction of the central conductor.
The connector measurement probe according to any one of claims 1 to 8. The plurality of probe portions were arranged in a row.
The connector measurement probe according to any one of claims 1 to 9. The ground conductor portion is a conductor continuously formed on the main surface along the rows of the plurality of probe portions.
The ground conductor portion has a plurality of the protrusions.
The connector measurement probe according to claim 10. The columns consist of first and second columns parallel to each other.
The connector measurement probe according to claim 10 or 11. The ground conductor portion has a first ground conductor portion and a second ground conductor portion, and has a ground conductor portion.
The first ground conductor portion is a conductor continuously formed on the main surface along the first row.
The second ground conductor portion is a conductor continuously formed on the main surface along the second row.
The first ground conductor portion and the second ground conductor portion have a plurality of the protrusions and a plurality of surrounding portions formed between the plurality of protrusions.
When viewed in the direction perpendicular to the first row and the second row on the main surface, the plurality of protrusions of the first ground conductor portion face the plurality of surrounding portions of the second ground conductor portion. ing,
The connector measurement probe according to claim 12. Between the central conductors of the probe portions of the first row, the extension line of the protruding portion in the protruding direction along the main surface intersects the central conductor of the probe portion of the second row.
The connector measurement probe according to claim 12 or 13. The ground conductor portion is in contact with the ground terminal of the connector to be measured.
The connector measurement probe according to any one of claims 1 to 14. It is a measuring method of a connector that measures a connector to be measured having a plurality of signal terminals and a ground terminal using a measuring probe.
The measurement probe includes a plurality of probe portions each having a central conductor, an insertion hole for inserting the probe portions, and a conductive plunger having a ground conductor portion.
The central conductor is configured to project from the main surface of the plunger toward the connector to be measured.
The ground conductor portion has a protruding portion on the main surface that projects in the protruding direction of the central conductor between one adjacent probe portion and the other probe portion among the plurality of probe portions. ,
A method for measuring a connector for measuring a connector to be measured by bringing the central conductor into contact with the signal terminal and the ground conductor portion in contact with the ground terminal.

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