WO2019199033A1 - Thermosetting resin composite for metal clad laminate and metal clad laminate - Google Patents
Thermosetting resin composite for metal clad laminate and metal clad laminate Download PDFInfo
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- WO2019199033A1 WO2019199033A1 PCT/KR2019/004223 KR2019004223W WO2019199033A1 WO 2019199033 A1 WO2019199033 A1 WO 2019199033A1 KR 2019004223 W KR2019004223 W KR 2019004223W WO 2019199033 A1 WO2019199033 A1 WO 2019199033A1
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- thermosetting resin
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- 0 CCC(C(CC)(CC)C1=CC=CC(C)(*)C=C1)C1=CC=CC(C)(*(C)*(C)N)C=C1 Chemical compound CCC(C(CC)(CC)C1=CC=CC(C)(*)C=C1)C1=CC=CC(C)(*(C)*(C)N)C=C1 0.000 description 2
Classifications
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- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08J—WORKING-UP; GENERAL PROCESSES OF COMPOUNDING; AFTER-TREATMENT NOT COVERED BY SUBCLASSES C08B, C08C, C08F, C08G or C08H
- C08J5/00—Manufacture of articles or shaped materials containing macromolecular substances
- C08J5/24—Impregnating materials with prepolymers which can be polymerised in situ, e.g. manufacture of prepregs
- C08J5/241—Impregnating materials with prepolymers which can be polymerised in situ, e.g. manufacture of prepregs using inorganic fibres
- C08J5/244—Impregnating materials with prepolymers which can be polymerised in situ, e.g. manufacture of prepregs using inorganic fibres using glass fibres
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08G—MACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
- C08G59/00—Polycondensates containing more than one epoxy group per molecule; Macromolecules obtained by polymerising compounds containing more than one epoxy group per molecule using curing agents or catalysts which react with the epoxy groups
- C08G59/18—Macromolecules obtained by polymerising compounds containing more than one epoxy group per molecule using curing agents or catalysts which react with the epoxy groups ; e.g. general methods of curing
- C08G59/40—Macromolecules obtained by polymerising compounds containing more than one epoxy group per molecule using curing agents or catalysts which react with the epoxy groups ; e.g. general methods of curing characterised by the curing agents used
- C08G59/50—Amines
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08G—MACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
- C08G59/00—Polycondensates containing more than one epoxy group per molecule; Macromolecules obtained by polymerising compounds containing more than one epoxy group per molecule using curing agents or catalysts which react with the epoxy groups
- C08G59/18—Macromolecules obtained by polymerising compounds containing more than one epoxy group per molecule using curing agents or catalysts which react with the epoxy groups ; e.g. general methods of curing
- C08G59/40—Macromolecules obtained by polymerising compounds containing more than one epoxy group per molecule using curing agents or catalysts which react with the epoxy groups ; e.g. general methods of curing characterised by the curing agents used
- C08G59/50—Amines
- C08G59/56—Amines together with other curing agents
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08J—WORKING-UP; GENERAL PROCESSES OF COMPOUNDING; AFTER-TREATMENT NOT COVERED BY SUBCLASSES C08B, C08C, C08F, C08G or C08H
- C08J5/00—Manufacture of articles or shaped materials containing macromolecular substances
- C08J5/24—Impregnating materials with prepolymers which can be polymerised in situ, e.g. manufacture of prepregs
- C08J5/249—Impregnating materials with prepolymers which can be polymerised in situ, e.g. manufacture of prepregs characterised by the additives used in the prepolymer mixture
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08L—COMPOSITIONS OF MACROMOLECULAR COMPOUNDS
- C08L33/00—Compositions of homopolymers or copolymers of compounds having one or more unsaturated aliphatic radicals, each having only one carbon-to-carbon double bond, and only one being terminated by only one carboxyl radical, or of salts, anhydrides, esters, amides, imides or nitriles thereof; Compositions of derivatives of such polymers
- C08L33/04—Homopolymers or copolymers of esters
- C08L33/06—Homopolymers or copolymers of esters of esters containing only carbon, hydrogen and oxygen, which oxygen atoms are present only as part of the carboxyl radical
- C08L33/08—Homopolymers or copolymers of acrylic acid esters
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08L—COMPOSITIONS OF MACROMOLECULAR COMPOUNDS
- C08L33/00—Compositions of homopolymers or copolymers of compounds having one or more unsaturated aliphatic radicals, each having only one carbon-to-carbon double bond, and only one being terminated by only one carboxyl radical, or of salts, anhydrides, esters, amides, imides or nitriles thereof; Compositions of derivatives of such polymers
- C08L33/18—Homopolymers or copolymers of nitriles
- C08L33/20—Homopolymers or copolymers of acrylonitrile
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- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08L—COMPOSITIONS OF MACROMOLECULAR COMPOUNDS
- C08L47/00—Compositions of homopolymers or copolymers of compounds having one or more unsaturated aliphatic radicals, at least one having two or more carbon-to-carbon double bonds; Compositions of derivatives of such polymers
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08L—COMPOSITIONS OF MACROMOLECULAR COMPOUNDS
- C08L63/00—Compositions of epoxy resins; Compositions of derivatives of epoxy resins
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- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08L—COMPOSITIONS OF MACROMOLECULAR COMPOUNDS
- C08L67/00—Compositions of polyesters obtained by reactions forming a carboxylic ester link in the main chain; Compositions of derivatives of such polymers
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08L—COMPOSITIONS OF MACROMOLECULAR COMPOUNDS
- C08L79/00—Compositions of macromolecular compounds obtained by reactions forming in the main chain of the macromolecule a linkage containing nitrogen with or without oxygen or carbon only, not provided for in groups C08L61/00 - C08L77/00
- C08L79/04—Polycondensates having nitrogen-containing heterocyclic rings in the main chain; Polyhydrazides; Polyamide acids or similar polyimide precursors
- C08L79/08—Polyimides; Polyester-imides; Polyamide-imides; Polyamide acids or similar polyimide precursors
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K1/00—Printed circuits
- H05K1/02—Details
- H05K1/03—Use of materials for the substrate
Definitions
- the present application is the Korean Patent Application No. 10-2018-0041697 dated April 10, 2018, Korea Patent Application No. 10-2018-0071076 dated June 20, 2018, Korea Patent Application No. 10-2019 dated March 28, 2019 -0036079, and the benefit of priority based on Korean Patent Application No. 10-2019-0036078 filed March 28, 2019, all the contents disclosed in the documents of the relevant Korean patent applications are incorporated as part of this specification.
- the present invention relates to a thermosetting resin composite and a metal foil laminate for a metal foil laminate, and more particularly, has excellent flowability in the prepreg stage or the semi-cured state, can realize low glass transition temperature, modulus, low thermal expansion rate, and whip
- the present invention relates to a thermosetting resin composite for a metal foil laminate and a metal foil laminate including the same.
- Copper clad laminate used in the conventional printed circuit board is a prepreg by impregnating the substrate of the glass fiber (Gl ass Fabr ic) in the varnish of the thermosetting resin and then semi-cured, it is heated together with the copper foil It is prepared by pressing.
- the prepreg is used again to construct a circuit pattern on the copper foil laminate and to build up thereon.
- the semiconductor package is also required to be thin, and at the same time, the necessity of thinning a printed circuit board for a semiconductor package is increasing.
- This warpage phenomenon is a phenomenon in which the printed circuit board does not become rolled back through a high temperature process such as reflow. Deepen.
- the present invention provides a thermosetting resin composite for a metal foil laminate for a semiconductor package which has excellent flowability in a prepreg stage or a semi-cured state, can realize low glass transition temperature, modulus, low thermal expansion rate, and minimize warpage. It is to provide.
- the present invention is to provide a metal foil laminate comprising the thermosetting resin composite for the metal foil laminate.
- thermosetting resin composite for metal foil laminated plates whose thermal stress factor of following General formula 1 is 25 Mpa or less is provided.
- the thermal stress factor, storage modulus and thermal expansion coefficient are respectively defined or measured in the range of 30 ° C to 260 ° C.
- thermosetting resin composite for metal foil laminated plates which has a sheet shape; And a metal foil formed on at least one surface of the thermosetting resin composite for the metal foil laminate.
- thermosetting resin composite and a metal foil laminate for a metal foil laminate according to a specific embodiment of the present invention will be described in detail.
- thermosetting resin composite for a metal foil laminate having a thermal stress factor of 25 Mpa or less.
- the thermal stress factor, storage modulus and thermal expansion coefficient are values defined or measured in the range of 30 ° C to 260 ° C, respectively.
- warpage of the semiconductor package occurs due to the difference in thermal expansion between the semiconductor chip and the printed circuit board in the thinning process of the semiconductor package, and this warpage phenomenon is intensified through high temperature processes such as reflow. In order to improve this, only a method of lowering the thermal expansion coefficient of the substrate is known.
- thermosetting resin composite for metal foil laminate and metal foil laminate formed by curing it the thermal stress factor defined by the general formula 1 in the temperature range of 30 ° C to 260 C
- thermosetting resin composite for a metal foil laminate having a value of 25 Mpa or less, or 10 to 25 Mpa, or 12 to 21 Mpa can prevent warpage.
- the thermal stress factor (Thermal Stress? & 01) of the general formula 1 is a numerical value obtained by multiplying the coefficient of thermal expansion and storage modulus at each temperature in units of 1 ° C from 30 to 2601: and then adds them together.
- the coefficient of thermal expansion at each temperature is related to the strain of the thermosetting resin composite for metal foil laminates
- the storage modulus at each temperature is related to the ratio of strain to strain (stress or stress) of the thermosetting resin composite for metal foil laminates. do.
- the value of the product of the coefficient of thermal expansion and the storage modulus at each temperature is related to the strain (stress or stress) of the t-curable resin composite for the metal foil laminate, and accordingly, in units of TC from 30 ° C to 260 ° C.
- the thermal stress factor of the general formula 1 which is a value obtained by multiplying the coefficient of thermal expansion and the storage modulus at each temperature and adding them together, represents the total strain (stress or stress) from 30 ° C to 260 ° C. Since printed wiring boards made of a thermosetting resin composite for laminated boards exhibit strain (stress or stress) applied to a semiconductor package. 2019/199033 1 »(: 1 ⁇ 1 ⁇ 2019/004223
- the warp of the semiconductor package 3 ⁇ 3 ⁇ 6) is directly or indirectly factor showing.
- thermosetting resin composite for the metal foil laminate of the embodiment may be formed by curing the prepreg.
- the resultant obtained by etching the copper foil layer of a copper foil laminated board can be called "the thermosetting resin composite for metal foil laminated boards.” This is formed by curing at high temperature the prepreg obtained by hot air drying the thermosetting resin composition as described above.
- the thermosetting resin composite for metal foil laminates has a thermal stress factor of 25 1 ⁇ 3 or less, or 10 to 10, in the temperature range of 30 ° to 260 ° ( : Can bend accordingly
- thermosetting resin composite for metal foil laminates having the same or lower thermal expansion coefficient as the thermosetting resin composite for metal foil laminates of the above embodiment the thermal stress factor value defined by the general formula (1) is When the condition was not satisfied, it was confirmed that the semiconductor package manufactured by using the same produced relatively high warpage.
- the storage elastic modulus at 30 ° 0 and 180 ° ( : of the thermosetting resin composite for metal foil laminates may be 16 ⁇ ⁇ 1 or less, respectively, specifically the storage elastic modulus at 30 ⁇ of the thermosetting resin composite for metal foil laminates is 12 And the storage modulus at 180 ⁇ of the thermosetting resin composite for the metal foil laminate is 7 Gpa to have.
- thermosetting resin composite for the metal foil laminate It has a low storage modulus of less than below, and thus may have a relatively low thermal stress factor at the same coefficient of thermal expansion, so that the warpage of the semiconductor package may have a relatively low characteristic at a low temperature range such as 30 ⁇ and 180 ° (:). .
- thermosetting resin composite material for the metal foil-clad laminate on
- thermosetting resin composite for the metal foil laminate is described above at 260 °.
- thermosetting resin composite for the metal foil laminate is described above at 260 °.
- the warpage of the semiconductor package is low in the temperature range from 30 ° C to 260 ° C.
- the thermal expansion coefficient of the thermosetting resin composite for the metal foil laminate may be 12 ppm / ° C. or less, or 5 to 12 mM / ° C, or 10 ⁇ m / ° C or less, or 4 to 10 ppm / ° C.
- the thermosetting resin composite for the metal foil laminate has a low coefficient of thermal expansion, the thermal stress factor of the general formula 1 is 25 Mpa or less, the semiconductor package manufactured by using the thermosetting resin composite for the metal foil laminate Only relatively low levels of warpage can be seen.
- the thermosetting resin composite for the metal foil laminate may include a thermosetting resin composition and a fiber substrate.
- thermosetting resin composition 1) sulfone group; Carbonyl group; Halogen group; An alkyl group having 1 to 20 carbon atoms which is substituted or unsubstituted with a nitro group, cyano group or halogen group; An aryl group having 6 to 20 carbon atoms or unsubstituted or substituted with a nitro, cyano or halogen group; A heteroaryl group having 2 to 30 carbon atoms unsubstituted or substituted with a nitro group, cyano group, or halogen group; And an alkylene group having 1 to 20 carbon atoms unsubstituted or substituted with a nitro group, cyano group, or halogen group; an amine compound including at least one functional group selected from the group consisting of: 2) thermosetting resins, 3) thermoplastic resins, and 4 ) May contain inorganic fillers.
- thermosetting resin composition may have a glass transition temperature of 230 ° C or less.
- thermosetting resin composition may contain the above-mentioned amine compound including the strong electron withdrawing group It exhibits a relatively low reactivity as included, thereby making it possible to easily control the curing reaction of the thermosetting resin composition.
- the thermosetting resin composition includes the thermosetting resin content in an amount of 400 parts by weight or less based on 100 parts by weight of the amine compound, and induces the thermosetting resin to be uniformly curable to a sufficient level without the influence of the filler charged in a high content. to, and can improve the reliability of the final product to be produced, it can increase mechanical properties such as toughness (toughness) also has a glass transition temperature of 230 ° (: can be reduced to less than a.
- thermosetting resin content in an amount of 400 parts by weight or less with respect to 100 parts by weight of the amine curing agent, when the amine curing agent is added in a relatively excessive amount, the flowability and moldability due to excessive curing of the thermosetting resin decreases There was.
- thermosetting resin even when an excessive amount of a specific amine curing agent having reduced reactivity, including the electron withdrawing group ( ⁇ 3 ⁇ 4) as described above, is added, an increase in the curing rate of the thermosetting resin is suppressed due to a decrease in the reactivity of the curing agent. It is possible to exhibit high flowability even during long-term storage in the resin composition for semiconductor packages or in the prepreg state obtained therefrom, thereby having excellent moldability.
- the thermosetting resin composition is 400 parts by weight or less, or 150 parts by weight to 400 parts by weight, or 180 parts by weight to 300 parts by weight, or 180 parts by weight to 290 parts by weight based on 100 parts by weight of the amine curing agent. Or 190 parts by weight to 290 parts by weight.
- the thermosetting resin mixture content is also 400 parts by weight or less, or 150 parts by weight to 400 parts by weight, or 180 parts by weight of 300 parts by weight, based on 100 parts by weight of the amine curing agent mixture, Or 180 parts by weight to 290 parts by weight, or 190 parts by weight to 290 parts by weight.
- thermosetting resin When the content of the thermosetting resin is excessively increased to more than 400 parts by weight based on 100 parts by weight of the amine curing agent, it is difficult to uniformly cure the thermosetting resin to a more sufficient level due to the increase of the curing density and the effect of the filler charged at a high content.
- the reliability of the product being manufactured may be reduced, Mechanical properties such as toughness can also be reduced.
- thermosetting resin composition may satisfy the equivalent ratio of 1.4 or more, or 1.4 to 2.5, or 1.45 to 2.5, or 1.45 to 2. 1, or 1.45 to 1.8, or 1.49 to 1.75.
- Equivalence ratio total active hydrogen equivalents contained in the amine curing agent / total curable functional group equivalents contained in the thermosetting resin More specifically, in Equation 1, the total active hydrogen equivalents contained in the amine curing agent is the total amount of the amine curing agent
- the weight (unit: g) means the unit weight of the active hydrogen of the amine curing agent (g / eq).
- the value obtained by dividing the weight (unit: g) by the unit equivalent of active hydrogen (g / eq) for each compound is obtained, and the sum thereof is contained in the amine curing agent of Equation 1 above.
- the total equivalent active hydrogen equivalent can be obtained.
- the active hydrogen contained in the amine curing agent refers to a hydrogen atom contained in the amino group (-N3 ⁇ 4) present in the amine curing agent, and the active hydrogen may form a cured structure through reaction with the curable functional group of the thermosetting resin.
- the total curable functional group equivalent contained in the thermosetting resin means a value obtained by dividing the total weight (unit: g) of the thermosetting resin by the unit equivalent (g / eq) of the curable functional group of the thermosetting resin. do.
- thermosetting resin is a mixture of two or more kinds
- the value obtained by dividing the weight (unit: g) by the unit equivalent (g / eq) of the curable functional group for each compound is obtained, and the sum thereof is contained in the thermosetting resin of Equation 1 above.
- the total curable functional group equivalent can be obtained.
- the curable functional group contained in the thermosetting resin means a functional group that forms a cured structure through reaction with active hydrogen of the amine curing agent, and the type of the curable functional group may also vary according to the thermosetting resin type.
- the curable functional group contained in the epoxy resin may be epoxy, 2019/199033 1 »(: 1 ⁇ 1 ⁇ 2019/004223
- the curable functional group contained in the bismaleimide resin may be a maleimide group.
- thermosetting resin composition satisfies that the equivalent ratio calculated by Equation (1) is equal to or greater than 1.4, wherein the amine curing agent of a sufficient level is contained so that the curable functional groups contained in all the thermosetting resins can cause a curing reaction. Means. Therefore, when the equivalent ratio calculated by Equation 1 in the thermosetting resin composition is reduced to less than 1.4, it is difficult to uniformly cure the thermosetting resin to a more sufficient level under the influence of the filler charged in a high content, the final product The reliability of can be reduced, mechanical properties also have the disadvantage that can be reduced.
- the amine compound may be a sulfone group; Carbonyl group; Halogen group; An alkyl group having 1 to 20 carbon atoms unsubstituted or substituted with a nitro group, cyano group, or halogen group; An aryl group having 6 to 20 carbon atoms unsubstituted or substituted with a nitro group, cyano group, or halogen group; A heteroaryl group having 2 to 30 carbon atoms unsubstituted or substituted with a nitro group, cyano group, or halogen group; And an alkylene group having 1 to 20 carbon atoms unsubstituted or substituted with a nitro group, cyano group, or halogen group; an aromatic amine compound containing at least one functional group selected from the group consisting of 2 to 5 amine groups have.
- the amine compound may include one or more compounds selected from the group consisting of the following Chemical Formulas 1 to 3.
- urine is a sulfone group, a carbonyl group, or an alkylene group having 1 to 10 carbon atoms
- 3 ⁇ 4 to 3 ⁇ 4 are each independently a nitro group, cyano group, hydrogen atom, halogen group, alkyl group having 1 to 6 carbon atoms, and carbon number.
- a heteroaryl group having 2 to 20 carbon atoms Independently a hydrogen atom, a halogen group, an alkyl group of 1 to 6 carbon atoms, an aryl group of 6 to 15 carbon atoms, or a heteroaryl group of 2 to 20 carbon atoms, II may be an integer of 1 to 10.
- the alkylene group having 1 to 10 carbon atoms, the alkyl group having 1 to 6 carbon atoms, the aryl group having 6 to 15 carbon atoms, and the heteroaryl group having 2 to 20 carbon atoms are each independently selected from the group consisting of nitro group, cyano group and halogen group It may be substituted with the above functional groups.
- 1 to 3 ⁇ 4 are each independently a nitro group, 2019/199033 1 »(: 1 ⁇ 1 ⁇ 2019/004223
- a cyano group, a hydrogen atom, a halogen group, an alkyl group having 1 to 6 carbon atoms, an aryl group having 6 to 15 carbon atoms, or a heteroaryl group having 2 to 20 carbon atoms And 3 ⁇ 4 'are each independently a hydrogen atom, a halogen group, an alkyl group of 1 to 6 carbon atoms, an aryl group of 6 to 15 carbon atoms, or a heteroaryl group of 2 to 20 carbon atoms, the alkyl group of 1 to 6 carbon atoms, 6 to 6 carbon atoms
- the aryl group of 15 and the heteroaryl group having 2 to 20 carbon atoms may each be independently substituted with one or more functional groups selected from the group consisting of nitro groups, cyano groups, and halogen groups.
- the alkyl group is a monovalent functional group derived from alkane (13 ⁇ 4116), and is, for example, linear, branched or cyclic, methyl, ethyl, propyl, isobutyl, Acebutyl, pentyl, nuclear chamber and the like. At least one hydrogen atom included in the alkyl group may be substituted with each substituent.
- the alkylten group is a divalent functional group derived from alkane (13 ⁇ 411 ⁇ 2), and is, for example, linear, branched or cyclic, methylene group, ethylene group, propylten group, isobutyltene group, It may be a la butylten group, a pentylten group, a nuclear silane group and the like.
- One or more hydrogen atoms contained in the alkylene group may be substituted with the same substituents as in the case of the alkyl group, respectively.
- the aryl group is a monovalent functional group derived from arene), and may be, for example, monocyclic or polycyclic.
- the monocyclic aryl group may be a phenyl group, a bar 0 phenyl group, terphenyl group, stilbenyl group and the like, but is not limited thereto.
- the polycyclic aryl group include naphthyl group, anthryl group, phenanthryl group, pyrenyl group, perrylenyl group, chrysenyl group, fluorenyl group, and the like, but are not limited thereto. At least one hydrogen atom of such an aryl group may be each substituted with the same substituent as in the alkyl group.
- the heteroaryl group is a heterocyclic group containing 0, N or 3 as a hetero atom, and the carbon number is not particularly limited, but may be 2 to 30 carbon atoms.
- heterocyclic groups include thiophene group, furan group, pyrrole group, imidazole group, thiazole group, oxazole group, oxadiazole group, triazole group, pyridyl group, bipyridyl group, triazine group, acridil group, pyridazine group , Quinolinyl group, isoquinoline group, indole group, carbazole group, benzoxazole group, benzoimidazole group, benzothiazole group, benzocarbazole group, benzothiophene group , 02019/199033 1 »(: 1 ⁇ 1 ⁇ 2019/004223
- Dibenzothiophene group benzofuranyl group, dibenzofuran group and the like, but are not limited thereto.
- At least one hydrogen atom of such a heteroaryl group may be each substituted with a substituent as in the alkyl group.
- substituted means that another functional group is bonded to a hydrogen atom in the compound, and the position to be substituted is not limited to a position where a hydrogen atom is substituted, that is, a position where a substituent may be substituted.
- the substituents may be the same or different from each other.
- Formula 1 may include a compound represented by the following Formula 1-1.
- Chemical Formula 2 may include a compound represented by Chemical Formula 2-1. 2019/199033 1 1/10 ⁇ 019/004223
- the information about! 11 includes the above-described information in Chemical Formula 2.
- Chemical Formula 2-1 examples include 2,2 ', 3,3', 5,5 ', 6,6'-
- Chemical Formula 3 may include a compound represented by Chemical Formula 3-1.
- thermosetting resin composition may include an amine compound, a thermosetting resin, a thermoplastic resin, and an inorganic filler. 2019/199033 1 »(: 1/10 ⁇ 019/004223
- the content of the components is not particularly limited, the above-described components may be included in consideration of the physical properties of the final product manufactured from the thermosetting resin composition, and the content ratio between these components is as described below.
- the thermosetting resin may include an epoxy resin.
- the epoxy resin those used in the thermosetting resin composition for a semiconductor package can be used without limitation, and the type thereof is not limited, and bisphenol show type epoxy resin, phenol novolac epoxy resin, phenyl aralkyl epoxy resin, tetra It may be at least one selected from the group consisting of phenyl ethane epoxy resin, naphthalene epoxy resin, biphenyl epoxy resin, dicyclopentadiene epoxy resin, and a mixture of dicyclopentadiene epoxy resin and naphthalene epoxy resin.
- the epoxy resin is a bisphenol-type epoxy resin represented by the formula (5), a novolak-type epoxy resin represented by the formula (6), a phenyl aralkyl-based epoxy resin represented by the formula (7), tetraphenyl represented by the formula (8) 1 selected from the group consisting of an ethane type epoxy resin, a naphthalene type epoxy resin represented by Formulas 9 and 10, a biphenyl type epoxy resin represented by Formula 11, and a dicyclopentadiene type epoxy resin represented by Formula 12: More than one species can be used.
- II is 0 or an integer from 1 to 50.
- the epoxy resin of Formula 5 may be a bisphenol show type epoxy resin, a bisphenol I 7 type epoxy resin, a bisphenol type epoxy resin, or a bisphenol type epoxy resin, respectively, according to the type of urine.
- the novolak-type epoxy resin of Formula 6 may be a phenol novolak-type epoxy resin or cresol novolak-type epoxy resin, respectively, depending on the type of I?
- II is 0 or an integer from 1 to 50.
- thermosetting 'resins are bismaleimide resins, cyanate ester resins and bismaleimide-can be further comprising at least one resin selected from the group consisting of a triazine resin.
- the bismaleimide resin is usually a thermosetting resin for a semiconductor package 2019/199033 1 »(: 1 ⁇ 1 ⁇ 2019/004223
- the bismaleimide resin is a diphenylmethane bismaleimide resin represented by the following formula (13), a phenylene type bismaleimide resin represented by the following formula (14), and a bisphenol show diphenyl ether represented by the following formula (15). It may be at least one selected from the group consisting of a bismaleimide resin and a bismaleimide resin composed of an oligomer of diphenylmethane bismaleimide and phenylmethane type maleimide resin represented by the following formula (16).
- 3 ⁇ 4 and 3 ⁇ 4 are each independently (: 3 ⁇ 4 or 3 ⁇ 43 ⁇ 4).
- II is 0 or an integer from 1 to 50.
- the cyanate-based resins include cyanate ester resins, and those commonly used in thermosetting resin compositions for semiconductor packages may be used without limitation, and the type thereof is not limited.
- the cyanate ester resin is a novolac cyanate resin represented by the following formula (17), a dicyclopentadiene type cyanate resin represented by the following formula (18), and a bisphenol type cyanate resin represented by the following formula (19). And some triazineized prepolymers thereof, and these may be used alone or in combination of two or more thereof.
- II is 0 or an integer from 1 to 50.
- the cyanate resin of Formula 19 may be bisphenol A type cyanate resin, bisphenol E type cyanate resin, bisphenol F type cyanate resin, or bisphenol M type cyanate resin, respectively, according to the type of urine. .
- the bismaleimide-triazine resin may be exemplified as the bismaleimide resin, and the bismaleimide-triazine resin may be used without limitation in the thermosetting resin composition for a semiconductor package.
- the thermoplastic resin has the effect of increasing the toughness (Toughness) after curing of the prepreg, and may serve to reduce the warpage of the semiconductor package by lowering the coefficient of thermal expansion and elastic modulus.
- a (meth) acrylate type polymer is mentioned.
- Examples of the (meth) acrylate-based polymer are not particularly limited, and for example, an acrylic ester containing a repeating unit derived from a (meth) acrylate monomer and a repeating unit derived from a (meth) acrylonitrile. 2019/199033 1 »(: 1 ⁇ 1 ⁇ 2019/004223
- the (meth) acrylate-based polymer is a monomer such as butyl acrylate, ethyl acrylate, acrylonitrile, methyl methacrylate, glycidyl methacrylate in the range of 1 to 40% by weight ( Relative to the total weight of the entire monomer).
- the (meth) acrylate-based polymer may have a weight average molecular weight of 500, 000 to 1,000, 000. If the weight average molecular weight of the (meth) acrylate-based polymer is too small, it may be technically disadvantageous after curing because the effect is decreased in increasing the toughness of the thermosetting resin composite for the metal foil laminate or decreasing the thermal expansion and elastic modulus. In addition, when the weight average molecular weight of the (meth) acrylate-based polymer is too large, the flowability of the prepreg can be reduced.
- the thermoplastic resin may determine the content used in consideration of the use and properties of the final product, for example, the thermosetting resin composition for a semiconductor package includes 10 to 200 parts by weight of the thermoplastic resin relative to 100 parts by weight of the thermosetting resin. can do.
- the thermosetting resin composition may include the amine compound described above, and may further include an additional curing agent other than the amine compound. More specifically, the thermosetting resin composition is selected from the group consisting of a second amine compound, an acid anhydride resin, a bismaleimide resin, a cyanate resin, a phenol novolak resin and a benzoxazine resin different from the amine compound. It may further comprise one or more curing agents.
- the thermosetting resin composition may include an inorganic filler.
- the inorganic filler can be used in the thermosetting resin composition for the semiconductor package usually without limitation, and specific examples include silica, aluminum trihydroxide, magnesium hydroxide, molybdenum oxide, zinc molybdate, zinc borate , Zinc stannate , Alumina, Clay, kaolin, talc, calcined kaolin, calcined talc, mica, short glass fiber, glass fine powder and hollow glass, and may be one or more selected from the group consisting of these.
- the thermosetting resin composition may include 30 to 300 parts by weight, or 30 to 200 parts by weight, or 50 to 150 parts by weight of the inorganic filler relative to a total of 100 parts by weight of the thermosetting resin, the thermoplastic resin, and the amine compound. If the content of the inorganic filler is too small, the coefficient of thermal expansion is increased, so that warpage intensifies during the reflow process, and the rigidity of the printed circuit board is reduced. In addition, when the surface-treated filler is used, the packing density may be increased by using a small size of the nano particle size and a large size of the micro particle size to increase the packing density.
- the inorganic filler may include two or more inorganic fillers having different average particle diameters. Specifically, at least one of the two or more inorganic fillers may be an inorganic filler having an average particle diameter of 0.1 m to 100 _, and the other one may be an inorganic filler having an average particle diameter of 1 nm to 90.
- the inorganic filler having an average particle diameter of 1 nm to 90 ran may be 1 part by weight to 30 parts by weight based on 100 parts by weight of the inorganic filler having an average particle diameter of 0.1 m to 100 ran.
- the inorganic filler may use silica surface-treated with a silane coupling agent from the viewpoint of improving moisture resistance and dispersibility.
- a method of dry or wet treatment of silica particles using a silane cudling agent as a surface treatment agent may be used.
- the silica may be surface-treated by a wet method using 0.01 to 1 part by weight of the silane coupling agent based on 100 parts by weight of the silica particles.
- the silane coupling agent may include amino such as 3-aminopropyltriethoxysilane, N-phenyl-3-aminopropyltrimethoxysilane and N-2-aminoethyl) -3 aminopropyltrimethoxysilane.
- Vinyl benzylaminoethyl) -3 cationic silane coupling agent such as 3-aminopropyltrimethoxysilane hydrochloride and phenyl silane coupling agent, and the silane coupling agent may be used alone, or at least two silanes as necessary. Coupling agents can be used in combination.
- the silane compound is an aromatic amino silane or
- (Meth) acrylsilane may be included, and as the inorganic filler having an average particle diameter of 0.1 _ to 100 !, silica having an aromatic amino silane treated may be used, and the average particle diameter of 11 to 90 11 As the inorganic filler, silica treated with (meth) acryl silane can be used.
- the aromatic amino silane-treated silica include 205 (1 ' 0 (111 6 ( ⁇ 3)), and the specific example of the (meth) acryl silane-treated silica is shown in Show0413 (g). Can be mentioned.
- the said (meth) acryl was used by the meaning containing all acryl or methacryl.
- the thermosetting resin composition may be used as a solution by adding a solvent as necessary.
- the additive solvent is not particularly limited as long as it shows good solubility in the resin component, and alcohol, ether, ketone, amide, aromatic hydrocarbon, ester, and nitrile may be used. Or you may use the mixed solvent which used 2 or more types together.
- the content of the solvent is not particularly limited as long as the resin composition may be impregnated into the glass fiber during prepreg manufacture.
- thermosetting resin composition may further include various high molecular compounds such as other thermosetting resins, thermoplastic resins and oligomers and elastomers thereof, other flame retardant compounds or additives, so long as the properties inherent in the resin composition are not impaired. These are not particularly limited as long as they are selected from those commonly used.
- the additives include UV absorbers, antioxidants, photopolymerization initiators, optical brighteners, photosensitizers, pigments, dyes, thickeners, lubricants, antifoaming agents, dispersants, leveling agents, and brightening agents.
- the thermosetting resin composite for a metal foil laminate means that the thermosetting resin composition for a semiconductor package is impregnated into a fiber substrate in a cured state.
- the fiber base is not particularly limited in kind, but may be a polyamide resin fiber such as a glass fiber base, a polyamide resin fiber, an aromatic polyamide resin fiber, a polyester resin fiber, an aromatic polyester resin fiber, a wholly aromatic polyester, etc.
- Synthetic fiber base kraft paper, cotton linter paper, linter and kraft pulp composed of woven or nonwoven fabrics mainly composed of polyester resin fibers such as resin fibers, polyimide resin fibers, polybenzoxazole fibers, and fluorine resin fibers
- Paper substrates based on honcho paper and the like may be used, and glass fiber substrates are preferably used.
- the glass fiber substrate can improve the strength of the prepreg, lower the absorption rate, and reduce the coefficient of thermal expansion.
- the glass fiber substrate may be selected from glass substrates used for various printed circuit board materials. Examples thereof include, but are not limited to, glass fibers such as E glass, D glass, S glass, T glass, NE glass and L glass, and Q glass. If desired, the glass-based material may be selected depending on the intended use or performance. Glass-based forms are typically woven, nonwoven, roving, chopped strand mats or surfacing mats. The thickness of the glass base material is not particularly limited, and about 0.01 to 0.3 mm may be used. Of these materials, glass fiber materials are more preferred in terms of strength and water absorption properties.
- the method for preparing the prepreg is not particularly limited and may be prepared by a method well known in the art.
- the method of manufacturing the prepreg may be an impregnation method, a coating method using various coaters, a spray injection method, or the like.
- the fiber substrate is varnished 2019/199033 1 »(: 1 ⁇ 1 ⁇ 2019/004223
- Prepreg can be prepared by impregnation.
- the solvent for the resin varnish is not particularly limited as long as it can be mixed with the resin component and has good solubility.
- Specific examples thereof include ketones such as acetone, methyl ethyl ketone, methyl isobutyl ketone and cyclonuxanone, aromatic hydrocarbons such as benzene, toluene and xylene, and amides such as dimethylformamide and dimethylacetamide, methylcello Solv, aliphatic alcohols such as butyl cellosolve.
- the solvent used is volatilized by 80% by weight or more.
- the temperature at the time of drying is about 80 To 200 ° 0, the time is not particularly limited in balance with the gelation time of the varnish.
- the varnish impregnation amount is preferably such that the resin solid content of the varnish is about 30 to 80% by weight based on the total amount of the resin solid content of the varnish and the base material.
- the metal foil is copper foil; Aluminum foil; A composite foil having a three-layer structure including nickel, nickel-phosphorus, nickel-tin alloy, nickel-iron alloy, lead, or lead-tin alloy as an intermediate layer, and including copper layers having different thicknesses on both surfaces thereof; Or the composite foil of the two-layered structure which combined aluminum and copper foil.
- the metal foil may be a copper foil or an aluminum foil, and a metal having a thickness of about 2 to 200 — may be used, but the thickness thereof is preferably about 2 to 35.
- copper foil is used as said metal foil.
- nickel, nickel-phosphorus, nickel-tin alloy, nickel-iron alloy, lead, lead-tin alloy, or the like may be used as an intermediate layer.
- the metal laminated plate containing the thermosetting resin composite for metal foil laminated plates thus manufactured can be used for manufacture of single-sided, double-sided, or multilayer printed circuit boards.
- the metal foil laminate may be processed to fabricate a single-sided or double-sided or multilayer printed circuit board, and the circuit processing may be performed by a general single-sided, double-sided or multilayer printed circuit board manufacturing process.
- thermosetting resin for a metal foil laminate for a semiconductor package which has excellent flowability in a prepreg stage or a semi-cured state, can realize low glass transition temperature and modulus, low thermal expansion rate, and minimize warp large size seedling phenomenon.
- a metal foil laminate comprising a composite and the thermosetting resin composite for the metal foil laminate may be provided.
- each component was added to methyl ethyl ketone according to the solid content of 40% and mixed, and then stirred at room temperature at a rate of 400 days for 1 day to prepare a resin composition for a semiconductor package of Example and Comparative Example (resin Varnish) was prepared.
- the specific composition of the resin composition prepared in Example is as shown in Table 1 below
- the specific composition of the resin composition prepared in Comparative Example is as shown in Table 2 below.
- thermosetting resin composites for metal foil laminates and copper foil laminates After impregnating the resin composition (resin varnish) for the semiconductor package prepared in 13_ glass fiber (T-gl ass # 1010, manufactured by Ni ttobo Co., Ltd.), hot-air dried at a temperature of 170 ° C for 2-5 minutes. A prepreg of 18 // m was prepared. After the two prepregs prepared above were laminated, copper foil (thickness 12 sun), manufactured by Mi tsui) was placed on both sides thereof, and laminated, and cured for 100 minutes under conditions of 220 ° C. and 35 kg / cuf. Laminates were prepared.
- thermosetting resin composition for semiconductor packages the prepreg, the thermosetting resin composite for metal foil laminated sheets, and the copper foil laminated sheets obtained by the Example and the comparative example>
- thermosetting resin composition for a semiconductor package the prepreg, the thermosetting resin composite for a metal foil laminated sheet, and the copper foil laminated sheet obtained by the said Example and the comparative example were measured by the following method, and the result is shown in Table 3.
- CTE Coefficient of thermal expansion
- the test piece was produced in MD direction, and it heated up at 30 degrees (: to 260 degrees (:) up to 30 degrees using TMA (TA Instruments, Q400). After measuring at a rate of 10 ° C / min, the measured value in the range of 50 ° C to 150 ° C was recorded as the coefficient of thermal expansion.
- thermosetting resin composite for metal foil laminated sheets which is formed by curing the prepreg obtained by hot air drying the thermosetting resin composition as described above.
- the test piece (thermosetting resin composite for metal foil laminated sheets) was produced in MD direction, and it was 5 degrees in tension mode using DMA (TA Instruments, Q800).
- the peak temperature of tan del ta was measured as the glass transition temperature by measuring from 25 ° C. to 300 ° C. under an elevated temperature condition of C / min. 3.
- test piece thermosetting resin composite for metal foil laminated boards
- storage modulus was measured from 25 ° C to 300 ° C at a temperature rise of / min.
- the prepregs obtained in the above examples and comparative examples are placed on both sides of the circuit pattern (pattern height 7 m, residual ratio 50%), and copper foil (thickness 12 / zm,
- the printed wiring board was manufactured (thickness 90 *).
- a semiconductor package (14.5mm x 14.5mm x 390um) was manufactured by mounting a semiconductor chip (11.5mm x 11.5mm x thickness 80um) on the manufactured printed wiring board.
- the warpage was measured on the basis of the Shadow Moire measurement theory using a warpage measuring device (Therm0ire PS100 by AKR0METRIX). Warpage measures the semiconductor package from 30 ° C. to 260 ° C. and thereafter When cooled to 30 ° C, the difference between the maximum value and the minimum value of the warpage was obtained, and the warpage of the semiconductor package was evaluated based on the following criteria.
- thermosetting resin composition for semiconductor packages and physical properties of thermosetting resin composites for metal foil laminates of Examples (per unit)
- Acrylic rubber B (Mw 800,000): PARACR0N KG_3015P (Negami chemical industrial Co., LTD)
- the total active hydrogen equivalent of DDS is the total weight in g divided by the unit equivalent of active hydrogen in DDS (62 g / eq),
- the total active hydrogen equivalent of TFB is the total weight (g) of TFB divided by the unit equivalent of active hydrogen (80 g / eq) of TFB,
- the total active hydrogen equivalent of DDM is the total weight of DDM divided by the unit equivalent of DDM (49.5 g / eq),
- the total epoxy equivalent of the XD-1000 is the total weight (g) of the XD-1000 divided by the epoxy unit equivalent (253 g / eq) of the XD-1000.
- the total epoxy equivalent of NC-3000H is the total weight (g) of NC-3000H divided by the epoxy unit equivalent (290 g / eq) of NC-3000H.
- the total epoxy equivalent of HP-6000 is the total weight of HP-6000 divided by the epoxy equivalent of HP-6000 (250 g / eq).
- the total maleimide equivalent of BMI-2300 is the total weight (g) of BMI-2300 divided by the maleimide equivalent of BMI-2300 (179 g / eq).
- the thermosetting resin composite for a metal foil laminate formed from a prepreg containing an amine compound having an electron attracting (Electron Withdrawing Group, CTG) as in Example has a glass transition temperature of 230 ° C or less, It was confirmed that the circuit pattern fillability was excellent while having a low coefficient of thermal expansion of 10 ppm / ° C or less.
- thermosetting resin of 290 parts by weight or less relative to 100 parts by weight of the amine compound having an electron draw (EWG) as in the embodiment, and the equivalent ratio of the equivalent amine compound equivalent ratio based on the thermosetting resin equivalent satisfies 1.4 or more
- the amount of the inorganic additive is added in an amount of 150 parts by weight in an amount of 50 parts by weight based on 100 parts by weight of the total amount of the thermosetting resin, the thermoplastic resin and the amine compound, the thermal properties bonded to the semiconductor packaging, excellent low thermal expansion properties, flowability and It was confirmed that mechanical properties can be secured.
- thermosetting resin composites for metal foil laminates obtained in the examples is 21 Mpa or less, and the semiconductor package manufactured using the thermosetting resin composites for metal foil laminates having such thermal stress factors is relatively As a result, only low levels of warpage were found.
- thermosetting resin composites for metal foil laminates obtained in the comparative examples is greater than 25 Mpa, and the semiconductor package manufactured by using the thermosetting resin composites for metal foil laminates having such a high thermal stress factor is relatively high. It was confirmed that high whip occurred.
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Abstract
Description
【발명의 설명】 [Explanation of invention]
【발명의 명칭】 [Name of invention]
금속박 적층판용 열경화성 수지 복합체 및 금속박 적층판 Thermosetting resin composite and metal foil laminate for metal foil laminate
【기술분야】 Technical Field
관련 출원 (들)과의 상호 인용 Cross Citation with Related Application (s)
본 출원은 2018년 4월 10일자 한국특허출원 제 10-2018-0041697호, 2018년 6월 20일자 한국특허출원 제 10-2018-0071076 호, 2019년 3월 28일자 한국특허출원 제 10-2019-0036079호, 및 2019년 3월 28일자 한국특허출원 제 10-2019-0036078호에 기초한 우선권의 이익을 주장하며, 해당 한국 특허 출원들의 문헌에 개시된 모든 내용은 본 명세서의 일부로서 포함된다. The present application is the Korean Patent Application No. 10-2018-0041697 dated April 10, 2018, Korea Patent Application No. 10-2018-0071076 dated June 20, 2018, Korea Patent Application No. 10-2019 dated March 28, 2019 -0036079, and the benefit of priority based on Korean Patent Application No. 10-2019-0036078 filed March 28, 2019, all the contents disclosed in the documents of the relevant Korean patent applications are incorporated as part of this specification.
본 발명은 금속박 적층판용 열경화성 수지 복합체 및 금속박 적층판에 관한 것으로, 보다 상세하게는 프리프레그 단계 또는 반경화 상태에서 우수한 흐름성을 가지며 낮은 유리 전이 온도 및 모듈러스, 낮은 열팽창률을 구현할 수 있으며 휩 (Warpage) 현상을 최소화할 수 있는 금속박 적층판용 열경화성 수지 복합체 및 이를 포함한 금속박 적층판에 관한 것이다. The present invention relates to a thermosetting resin composite and a metal foil laminate for a metal foil laminate, and more particularly, has excellent flowability in the prepreg stage or the semi-cured state, can realize low glass transition temperature, modulus, low thermal expansion rate, and whip The present invention relates to a thermosetting resin composite for a metal foil laminate and a metal foil laminate including the same.
【발명의 배경이 되는 기술】 [Technique to become background of invention]
종래의 인쇄회로기판에 사용되는 동박적층판 (copper clad laminate)은 유리 섬유 (Gl ass Fabr i c)의 기재를 상기 열경화성 수지의 바니시에 함침한 후 반경화시키면 프리프레그가 되고, 이를 다시 동박과 함께 가열 가압하여 제조한다. 이러한 동박 적층판에 회로 패턴을 구성하고 이 위에 빌드업 (bui ld-up)을 하는 용도로 프리프레그가 다시 사용되게 된다. 최근 전자 기기, 통신기기, 개인용 컴퓨터, 스마트폰 등의 고성능화, 박형화, 경량화가 가속되면서 반도체 패키지 또한 박형화가 요구됨에 따라, 동시에 반도체 패키지용 인쇄회로기판도 박형화의 필요성이 커지고 있다. 그러나, 박형화 과정에서 인쇄회로기판의 강성아 감소하는 문제가 발생함과 동시에, 칩과 인쇄회로기판간 열팽창률 차이로 인해 반도체 패키지의 휨 (Warpage) 문제가 발생하고 있다. 이러한 휨 현상은 리플로우와 같은 고온 공정을 거치면서 인쇄회로기판이 원복이 되자 않는 현상으로 더 심화된다. Copper clad laminate used in the conventional printed circuit board is a prepreg by impregnating the substrate of the glass fiber (Gl ass Fabr ic) in the varnish of the thermosetting resin and then semi-cured, it is heated together with the copper foil It is prepared by pressing. The prepreg is used again to construct a circuit pattern on the copper foil laminate and to build up thereon. Recently, as the performance, thickness, and light weight of electronic devices, communication devices, personal computers, and smart phones are accelerated, the semiconductor package is also required to be thin, and at the same time, the necessity of thinning a printed circuit board for a semiconductor package is increasing. However, in the thinning process, the rigidity of the printed circuit board decreases, and the warpage problem of the semiconductor package occurs due to the difference in thermal expansion coefficient between the chip and the printed circuit board. This warpage phenomenon is a phenomenon in which the printed circuit board does not become rolled back through a high temperature process such as reflow. Deepen.
이에, 휨 현상을 개선하기 위해 기판의 열팽창률을 낮추는 기술에 대한 연구가 진행되고 있으며, 예를 들어 프리프레그에 필러를 고함량으로 충진하는 기술이 제안되고 있으나, 단순히 프리프레그에 필러를 고함량으로 충진하기만하는 경우프리프레그의 흐름성이 감소하는 한계가 있었다. 【발명의 내용】 Accordingly, researches on lowering the thermal expansion coefficient of a substrate have been conducted to improve the warpage phenomenon. For example, a technique of filling a prepreg with a high content of a filler has been proposed, but simply a high content of a filler in the prepreg is proposed. There was a limit to decrease the flow of prepreg when only filling with. [Content of invention]
【해결하고자 하는 과제】 Problem to be solved
본 발명은 프리프레그 단계 또는 반경화 상태에서 우수한 흐름성을 가지며 낮은 유리 전이 온도 및 모듈러스, 낮은 열팽창률을 구현할 수 있으며 휩 (Warpage) 현상을 최소화할 수 있는 반도체 패키지용 금속박 적층판용 열경화성 수지 복합체를 제공하기 위한 것이다. The present invention provides a thermosetting resin composite for a metal foil laminate for a semiconductor package which has excellent flowability in a prepreg stage or a semi-cured state, can realize low glass transition temperature, modulus, low thermal expansion rate, and minimize warpage. It is to provide.
또한, 본 발명은 상기 금속박 적층판용 열경화성 수지 복합체를 포함하는 금속박 적층판을 제공하기 위한 것이다. In addition, the present invention is to provide a metal foil laminate comprising the thermosetting resin composite for the metal foil laminate.
【과제의 해결 수단】 [Measures of problem]
본 명세서에서는, 하기 일반식 1의 열응력인자가 25 Mpa 이하인 금속박 적층판용 열경화성 수지 복합체가 제공된다. In this specification, the thermosetting resin composite for metal foil laminated plates whose thermal stress factor of following General formula 1 is 25 Mpa or less is provided.
[일반식 1] [General formula 1]
열응력인자(Thermal Stress Factor) Thermal Stress Factor
=J "[저장탄성률(Storage Modulus) * 열팽창계수] dT = J " [Storage Modulus * Thermal Expansion Coefficient] dT
상기 일반식 1에서, 상기 열응력인자, 저장탄성률 및 열팽창계수는 각각 30°C내지 260°C의 범위에서 정의되거나 측정되는 값이다. In the general formula 1, the thermal stress factor, storage modulus and thermal expansion coefficient are respectively defined or measured in the range of 30 ° C to 260 ° C.
또한, 본 명세서에서는, 시트 형상을 갖는 상기 금속박 적층판용 열경화성 수지 복합체; 및 상기 금속박 적층판용 열경화성 수지 복합체의 적어도 일면에 형성된 금속박;을포함하는 금속박 적층판이 제공된다. Moreover, in this specification, the said thermosetting resin composite for metal foil laminated plates which has a sheet shape; And a metal foil formed on at least one surface of the thermosetting resin composite for the metal foil laminate.
이하 발명의 구체적인 구현예에 따른 금속박 적층판용 열경화성 수지 복합체 및 금속박 적층판에 대하여 보다상세하게 설명하기로 한다. 발명의 일 구현예에 따르면, 하기 일반식 1의 열응력인자가 25 Mpa 이하인 금속박 적층판용 열경화성 수지 복합체가 제공된다. Hereinafter, a thermosetting resin composite and a metal foil laminate for a metal foil laminate according to a specific embodiment of the present invention will be described in detail. According to one embodiment of the invention, there is provided a thermosetting resin composite for a metal foil laminate having a thermal stress factor of 25 Mpa or less.
[일반식 1] 열응력인자 (Thermal Stress Factor) [General formula 1] Thermal Stress Factor
'[[저장탄성률 (Storage Modulus) * 열팽창계수] dT [[Storage Modulus * Thermal Expansion Coefficient] dT
상기 일반식 1에서, 상기 열응력인자, 저장탄성률 및 열팽창계수는 각각 30°C 내지 260°C의 범위에서 정의되거나측정되는 값이다. 상술한 바와 같이, 반도체 패키지의 박형화 과정에서 반도체 칩과 인쇄회로기판간 열팽창률 차이로 인해 반도체 패키지의 휨 (Warpage) 문제가 발생하며, 이러한 휨 현상은 리플로우와 같은 고온 공정을 거치면서 보다 심화되는데, 이를 개선하기 위해서 기판의 열팽창률을 낮추는 방법만이 알려진 있는상태이다. In Formula 1, the thermal stress factor, storage modulus and thermal expansion coefficient are values defined or measured in the range of 30 ° C to 260 ° C, respectively. As described above, warpage of the semiconductor package occurs due to the difference in thermal expansion between the semiconductor chip and the printed circuit board in the thinning process of the semiconductor package, and this warpage phenomenon is intensified through high temperature processes such as reflow. In order to improve this, only a method of lowering the thermal expansion coefficient of the substrate is known.
이에 본 발명자들은 프리프레그와 이를 경화하여 형성되는 금속박 적층판용 열경화성 수지 복합체와 금속박 적층판에 대한 계속적인 연구를 진행하여, 30°C 내지 260 C의 온도 범위에서 상기 일반식 1로 정의되는 열응력인자값이 25 Mpa 이하, 또는 10 내지 25 Mpa, 또는 12 내지 21 Mpa인 금속박 적층판용 열경화성 수지 복합체가 휨 (Warpage) 발생을 방지할 수 있다는 점을 실험을 통하여 확인하고 발명을 완성하였다. The present inventors continue to study the prepreg and the thermosetting resin composite for metal foil laminate and metal foil laminate formed by curing it, the thermal stress factor defined by the general formula 1 in the temperature range of 30 ° C to 260 C Experiments confirmed that the thermosetting resin composite for a metal foil laminate having a value of 25 Mpa or less, or 10 to 25 Mpa, or 12 to 21 Mpa can prevent warpage.
보다 구체적으로, 상기 일반식 1의 열응력인자 (Thermal Stress ?& 01 )는 30 에서 2601:까지 1°C 단위로 각 온도에서의 열팽창계수와 저장탄성률을 곱한후 모두 합하여 얻어지는 수치이다. More specifically, the thermal stress factor (Thermal Stress? & 01) of the general formula 1 is a numerical value obtained by multiplying the coefficient of thermal expansion and storage modulus at each temperature in units of 1 ° C from 30 to 2601: and then adds them together.
각각의 온도에서의 열팽창계수는 금속박 적층판용 열경화성 수지 복합체의 변형률과 관련이 되며, 각각의 온도에서의 저장탄성율은 금속박 적층판용 열경화성 수지 복합체의 변형력 (응력 또는 Stress)에 대한 변형률의 비와 관련이 된다. 그리고, 이와 같은 각각의 온도에서의 열팽창계수와 저장탄성률을 곱한 값은 금속박 적층판용 t경화성 수지 복합체의 변형력 (응력 또는 Stress)과 관련이 되며 , 이에 따라 30°C에서 260°C까지 TC단위로 각 온도에서의 열팽창계수와 저장탄성률을 곱한 후 모두 합하여 얻어지는 수치인 상기 일반식 1의 열응력인자 (Thermal Stress Factor)는 30°C에서 260°C까지의 총 변형력 (응력 또는 Stress)을 나타내며 금속박 적층판용 열경화성 수지 복합체로 제조된 프린트배선판이 반도체패키지에 가하는 변형력 (응력 또는 Stress)을 나타내기 때문에 2019/199033 1»(:1^1{2019/004223 The coefficient of thermal expansion at each temperature is related to the strain of the thermosetting resin composite for metal foil laminates, and the storage modulus at each temperature is related to the ratio of strain to strain (stress or stress) of the thermosetting resin composite for metal foil laminates. do. In addition, the value of the product of the coefficient of thermal expansion and the storage modulus at each temperature is related to the strain (stress or stress) of the t-curable resin composite for the metal foil laminate, and accordingly, in units of TC from 30 ° C to 260 ° C. The thermal stress factor of the general formula 1, which is a value obtained by multiplying the coefficient of thermal expansion and the storage modulus at each temperature and adding them together, represents the total strain (stress or stress) from 30 ° C to 260 ° C. Since printed wiring boards made of a thermosetting resin composite for laminated boards exhibit strain (stress or stress) applied to a semiconductor package. 2019/199033 1 »(: 1 ^ 1 {2019/004223
반도체 패키지의 휨 3印3§6)을 직접 또는 간접적으로 보여주는 인자가 된다. The warp of the semiconductor package 3印3 §6) is directly or indirectly factor showing.
상술한 바와 같이, 상기 구현예의 금속박 적층판용 열경화성 수지 복합체는 프리프레그를 경화하여 형성될 수 있다. 예를 들어 동박 적층판의 동박층을 에칭하여 얻어진 결과물을 "금속박 적층판용 열경화성 수지 복합체"라고 칭할 수 있다. 이는 상술한 바와 같이 열경화성 수지 조성물을 열풍 건조하여 얻어진 프리프레그가고온에서 경화하여 형성된 것이다. 이러한 금속박 적층판용 열경화성 수지 복합체는 30°〔 내지 260° (:의 온도 범위에서 상기 일반식 1로 정의되는 열응력인자값이 25 1切3 이하, 또는 10 내지 수 있으며, 이에 따라 휨As described above, the thermosetting resin composite for the metal foil laminate of the embodiment may be formed by curing the prepreg. For example, the resultant obtained by etching the copper foil layer of a copper foil laminated board can be called "the thermosetting resin composite for metal foil laminated boards." This is formed by curing at high temperature the prepreg obtained by hot air drying the thermosetting resin composition as described above. The thermosetting resin composite for metal foil laminates has a thermal stress factor of 25 1 切 3 or less, or 10 to 10, in the temperature range of 30 ° to 260 ° ( : Can bend accordingly
(¾ 1 용6) 현상을 최소화할수 있다. (¾ 1 for 6) Minimize the phenomenon.
상기 구현예의 금속박 적층판용 열경화성 수지 복합체와 동등 수준 또는 보다 낮은 수준의 열팽창계수를 갖는 이전의 금속박 적층판용 열경화성 수지 복합체라고 하여도 상기 일반식 1로 정의되는 열응력인자값이 조건을 만족하지 않는 경우, 이를 이용하여 제조된 반도체 패키지는 상대적으로 높은 휨이 발생한다는 점이 확인되었다. Even if the thermosetting resin composite for metal foil laminates having the same or lower thermal expansion coefficient as the thermosetting resin composite for metal foil laminates of the above embodiment, the thermal stress factor value defined by the general formula (1) is When the condition was not satisfied, it was confirmed that the semiconductor package manufactured by using the same produced relatively high warpage.
한편, 상기 금속박 적층판용 열경화성 수지 복합체의 30°0 및 180° (:에서의 저장 탄성율이 각각 16 ?å1이하일 수 있으며 , 구체적으로 상기 금속박 적층판용 열경화성 수지 복합체의 30^ 에서의 저장 탄성율은 12 수 있고, 상기 금속박 적층판용 열경화성 수지 복합체의 180^ 에서의 저장 탄성율은 7 Gpa내지 있다. On the other hand, the storage elastic modulus at 30 ° 0 and 180 ° ( : of the thermosetting resin composite for metal foil laminates may be 16 ~ å1 or less, respectively, specifically the storage elastic modulus at 30 ^ of the thermosetting resin composite for metal foil laminates is 12 And the storage modulus at 180 ^ of the thermosetting resin composite for the metal foil laminate is 7 Gpa to have.
상기 금속박 적층판용 열경화성 수지 복합체의 30^ 및 180 와 같이 상대적으로 낮은 온도 범위에서 이하의 낮은 저장 탄성율을 갖는데, 이에 따라 동일 열팽창계수에서 상대적으로 낮은 열응력인자를 가질 수 있으므로 30^ 및 180° (:와 같이 낮은 온도 범위에서 반도체패키지의 휨이 상대적으로 낮은특징을 가질 수 있다. In the relatively low temperature range, such as 30 ^ and 180 of the thermosetting resin composite for the metal foil laminate It has a low storage modulus of less than below, and thus may have a relatively low thermal stress factor at the same coefficient of thermal expansion, so that the warpage of the semiconductor package may have a relatively low characteristic at a low temperature range such as 30 ^ and 180 ° (:). .
또한, 상기 금속박 적층판용 열경화성 수지 복합체의 260° (:에서의 In addition, 260 ° (in the thermosetting resin composite material for the metal foil-clad laminate: on
있다. 상기 금속박 적층판용 열경화성 수지 복합체가 260°〔에서 상술한 저장 탄성율을 가짐에 따라서, 이에 따라 동일 열팽창계수에서 상대적으로 낮은 열응력인자를 가질 수 있으므로 260OC에서 반도체패키지의 휨이 상대적으로 낮은 특징을 가질 수 있다. have. The thermosetting resin composite for the metal foil laminate is described above at 260 °. Thus in having a storage modulus, and thus can have a relatively low thermal stress factor at the same coefficient of thermal expansion it may have a warpage of the semiconductor package characterized by relatively low at 260 C O.
즉, 30°C에서 260°C까지 온도 범위에서 상대적으로 낮은 열응력인자(Thermal Stress Factor)를 가질 수 있으므로, 30°C에서 260°C까지 온도 범위에서 반도체패키지의 휨 (warpage)이 낮은 특징을 가질 수 있다. That is, since it may have a relatively low thermal stress factor in the temperature range from 30 ° C to 260 ° C, the warpage of the semiconductor package is low in the temperature range from 30 ° C to 260 ° C Can have
상기 금속박 적층판용 열경화성 수지 복합체의 열팽창계수는 12 ppm/°C이하, 또는 5 내지 12 抑m/°C, 또는 10 抑m/°C이하, 또는 4 내지 10ppm/°C일 수 있다. 상술한 바와 같이, 상기 금속박 적층판용 열경화성 수지 복합체는 낮은 열팽창계수를 가지면서, 상술한 일반식 1의 열응력인자가 25 Mpa 이하이여서, 상기 금속박 적층판용 열경화성 수지 복합체를 이용하여 제조된 반도체 패키지는 상대적으로 낮은 수준의 휨 (Warpage)만을 나타낼 수 있다. 한편, 상기 금속박 적층판용 열경화성 수지 복합체는 열경화성 수지 조성물 및 섬유 기재를 포함할 수 있다. The thermal expansion coefficient of the thermosetting resin composite for the metal foil laminate may be 12 ppm / ° C. or less, or 5 to 12 mM / ° C, or 10 µm / ° C or less, or 4 to 10 ppm / ° C. As described above, the thermosetting resin composite for the metal foil laminate has a low coefficient of thermal expansion, the thermal stress factor of the general formula 1 is 25 Mpa or less, the semiconductor package manufactured by using the thermosetting resin composite for the metal foil laminate Only relatively low levels of warpage can be seen. On the other hand, the thermosetting resin composite for the metal foil laminate may include a thermosetting resin composition and a fiber substrate.
보다 구체적으로, 상기 열경화성 수지 조성물은, 1) 술폰기; 카보닐기; 할로겐기; 니트로기, 시아노기 또는 할로겐기로 '치환 또는 비치환된 탄소수 1 내지 20의 알킬기; 니트로기, 시아노기 또는 할로겐기로 치환 또는 비치환된 탄소수 6 내지 20와 아릴기; 니트로기, 시아노기 또는 할로겐기로 치환 또는 비치환된 탄소수 2 내지 30의 헤테로아릴기; 및 니트로기, 시아노기 또는 할로겐기로 치환 또는 비치환된 탄소수 1 내지 20의 알킬텐기;로 이루어진 군에서 선택된 1종 이상의 작용기를 1이상 포함한 아민 화합물, 2) 열경화성 수지, 3) 열가소성 수지, 및 4) 무기 충진제를 포함할수 있다. More specifically, the thermosetting resin composition, 1) sulfone group; Carbonyl group; Halogen group; An alkyl group having 1 to 20 carbon atoms which is substituted or unsubstituted with a nitro group, cyano group or halogen group; An aryl group having 6 to 20 carbon atoms or unsubstituted or substituted with a nitro, cyano or halogen group; A heteroaryl group having 2 to 30 carbon atoms unsubstituted or substituted with a nitro group, cyano group, or halogen group; And an alkylene group having 1 to 20 carbon atoms unsubstituted or substituted with a nitro group, cyano group, or halogen group; an amine compound including at least one functional group selected from the group consisting of: 2) thermosetting resins, 3) thermoplastic resins, and 4 ) May contain inorganic fillers.
또한, 상기 열경화성 수지 조성물은 230°C 이하의 유리 전이 온도를 가질 수 있다. In addition, the thermosetting resin composition may have a glass transition temperature of 230 ° C or less.
상기 열경화성 수지 조성물이 상술한 강력한 전자 끌개 작용기 (Electron Withdrawing Group , 묘방이를 포함한 아민 화합물을 포함함에 따라서 상대적으로 낮아진 반응성을 나타내며, 이에 따라 상기 열경화성 수지 조성물의 경화 반응을 용이하게 제어할수 있게 한다. The thermosetting resin composition may contain the above-mentioned amine compound including the strong electron withdrawing group It exhibits a relatively low reactivity as included, thereby making it possible to easily control the curing reaction of the thermosetting resin composition.
특히, 상기 열경화성 수지 조성물은 상기 아민 화합물 100 중량부에 대하여 상기 열경화성 수지 함량을 400 중량부 이하로 포함하여, 높은 함량으로 투입된 필러에 의한 영향없이 열경화성 수지가 보다 충분한 수준으로 균일하게 경화 가능하도록 유도하여, 최종 제조되는 제품의 신뢰성이 향상될 수 있고, 인성 (Toughness)와 같은 기계적 물성 또한 증가시킬 수 있으며, 유리전이온도 230° (:로 이하로 낮출 수 있다. Particularly, the thermosetting resin composition includes the thermosetting resin content in an amount of 400 parts by weight or less based on 100 parts by weight of the amine compound, and induces the thermosetting resin to be uniformly curable to a sufficient level without the influence of the filler charged in a high content. to, and can improve the reliability of the final product to be produced, it can increase mechanical properties such as toughness (toughness) also has a glass transition temperature of 230 ° (: can be reduced to less than a.
종래에는 상기 아민 경화제 100 중량부에 대하여 상기 열경화성 수지 함량을 400 중량부 이하로 포함시키는 것과 같이, 아민 경화제를 상대적으로 과량으로 첨가시 열경화성 수지의 과도한 경화로 인해 흐름성 및 성형성이 감소하는 한계가 있었다. Conventionally, as including the thermosetting resin content in an amount of 400 parts by weight or less with respect to 100 parts by weight of the amine curing agent, when the amine curing agent is added in a relatively excessive amount, the flowability and moldability due to excessive curing of the thermosetting resin decreases There was.
그러나, 상술한 바와 같이 전자 끌개 작용기 (Electron Withdrawing Group, 別¾)를 포함하여 반응성이 감소한 특정 아민 경화제를 과량으로 첨가하더라도, 경화제의 반응성 감소로 인해, 열경화성 수지의 경화속도가 급격히 상승하는 것을 억제할 수 있어, 반도체 패키지용 수지 조성물이나 이로부터 얻어지는 프라프레그 상태에서의 장기간 보관시에도 높은 흐름성을 나타내어 우수한성형성을 가질 수 있다. However, even when an excessive amount of a specific amine curing agent having reduced reactivity, including the electron withdrawing group (別 ¾) as described above, is added, an increase in the curing rate of the thermosetting resin is suppressed due to a decrease in the reactivity of the curing agent. It is possible to exhibit high flowability even during long-term storage in the resin composition for semiconductor packages or in the prepreg state obtained therefrom, thereby having excellent moldability.
상기 열경화성 수지 조성물은, 상기 아민 경화제 100 중량부에 대하여 상기 열경화성 수지 함량을 400 중량부 이하, 또는 150 중량부 내지 400 중량부, 또는 180 중량부 내지 300 중량부, 또는 180 중량부 내지 290 중량부, 또는 190 중량부 내지 290 중량부일 수 있다. 상기 아민 경화제 또는 열경화성 수지가 2종 이상의 혼합물인 경우, 아민 경화제 혼합물 100 중량부에 대하여 열경화성 수지 혼합물 함량 또한 400 중량부 이하, 또는 150 중량부 내지 400 중량부, 또는 180 중량부 내자 300 중량부, 또는 180 중량부 내지 290중량부, 또는 190 중량부 내지 290 중량부일 수 있다. The thermosetting resin composition is 400 parts by weight or less, or 150 parts by weight to 400 parts by weight, or 180 parts by weight to 300 parts by weight, or 180 parts by weight to 290 parts by weight based on 100 parts by weight of the amine curing agent. Or 190 parts by weight to 290 parts by weight. When the amine curing agent or the thermosetting resin is a mixture of two or more kinds, the thermosetting resin mixture content is also 400 parts by weight or less, or 150 parts by weight to 400 parts by weight, or 180 parts by weight of 300 parts by weight, based on 100 parts by weight of the amine curing agent mixture, Or 180 parts by weight to 290 parts by weight, or 190 parts by weight to 290 parts by weight.
상기 아민 경화제 100 중량부에 대하여 상기 열경화성 수지 함량을 400 중량부 초과로 지나치게 증가할 경우, 경화밀도의 증가 및 고함량으로 투입된 필러의 영향으로 열경화성 수지가 보다 충분한 수준까지 균일하게 경화되기 어려워, 최종 제조되는 제품의 신뢰성이 감소할 수 있고, 인성 (Toughness)와 같은 기계적 물성 또한 감소될 수 있다. When the content of the thermosetting resin is excessively increased to more than 400 parts by weight based on 100 parts by weight of the amine curing agent, it is difficult to uniformly cure the thermosetting resin to a more sufficient level due to the increase of the curing density and the effect of the filler charged at a high content. The reliability of the product being manufactured may be reduced, Mechanical properties such as toughness can also be reduced.
한편, 상기 열경화성 수지 조성물은 하기 수학식 1로 계산되는 당량비가 1.4 이상, 또는 1.4 내지 2.5, 또는 1.45 내지 2.5 , 또는 1.45 내지 2. 1 , 또는 1.45내지 1.8 , 또는 1.49 내지 1.75임을 만족할 수 있다. On the other hand, the thermosetting resin composition may satisfy the equivalent ratio of 1.4 or more, or 1.4 to 2.5, or 1.45 to 2.5, or 1.45 to 2. 1, or 1.45 to 1.8, or 1.49 to 1.75.
[수학식 1] [Equation 1]
당량비 = 상기 아민 경화제에 함유된 총 활성수소 당량 / 상기 열경화성 수지에 함유된 총 경화성 작용기 당량 보다 구체적으로, 상기 수학식 1에서, 상기 아민 경화제에 함유된 총 활성수소 당량은, 상기 아민 경화제의 총 중량 (단위: g)을 상기 아민 경화제의 활성수소 단위당량 (g/eq)로 나눈 값을 의미한다. Equivalence ratio = total active hydrogen equivalents contained in the amine curing agent / total curable functional group equivalents contained in the thermosetting resin More specifically, in Equation 1, the total active hydrogen equivalents contained in the amine curing agent is the total amount of the amine curing agent The weight (unit: g) means the unit weight of the active hydrogen of the amine curing agent (g / eq).
상기 아민 경화제가 2종 이상의 혼합물인 경우, 각각의 화합물 별로 중량 (단위:g)을 활성수소 단위당량 (g/eq)로 나눈 값을 구하고, 이를 합한 값으로 상기 수학식 1의 아민 경화제에 함유된 총 활성수소 당량을 구할 수 있다. When the amine curing agent is a mixture of two or more kinds, the value obtained by dividing the weight (unit: g) by the unit equivalent of active hydrogen (g / eq) for each compound is obtained, and the sum thereof is contained in the amine curing agent of Equation 1 above. The total equivalent active hydrogen equivalent can be obtained.
상기 아민 경화제에 함유된 활성수소는, 아민 경화제에 존재하는 아미노기 (-N¾)에 포함된 수소원자를 의미하며, 상기 활성수소가 열경화성 수지의 경화성 작용기와의 반응을 통해 경화구조를 형성할수 있다. The active hydrogen contained in the amine curing agent refers to a hydrogen atom contained in the amino group (-N¾) present in the amine curing agent, and the active hydrogen may form a cured structure through reaction with the curable functional group of the thermosetting resin.
또한, 상기 수학식 1에서, 상기 열경화성 수지에 함유된 총 경화성 작용기 당량은, 상기 열경화성 수지의 총 중량 (단위: g)을 상기 열경화성 수지의 경화성 작용기 단위당량 (g/eq)로 나눈 값을 의미한다. In addition, in Equation 1, the total curable functional group equivalent contained in the thermosetting resin means a value obtained by dividing the total weight (unit: g) of the thermosetting resin by the unit equivalent (g / eq) of the curable functional group of the thermosetting resin. do.
상기 열경화성 수지가 2종 이상의 혼합물인 경우, 각각의 화합물 별로 중량 (단위:g)을 경화성 작용기 단위당량 (g/eq)로 나눈 값을 구하고, 이를 합한 값으로 상기 수학식 1의 열경화성 수지에 함유된 총 경화성 작용기 당량을 구할수 있다. When the thermosetting resin is a mixture of two or more kinds, the value obtained by dividing the weight (unit: g) by the unit equivalent (g / eq) of the curable functional group for each compound is obtained, and the sum thereof is contained in the thermosetting resin of Equation 1 above. The total curable functional group equivalent can be obtained.
상기 열경화성 수지에 함유된 경화성 작용기는, 상기 아민 경화제의 활성수소와의 반응을 통해 경화구조를 형성하는 작용기를 의미하며, 상기 열경화성 수지 종류에 따라 경화성 작용기의 종류 또한 달라질 수 있다 . 예를 들어, 상기 열경화성 수지로 에폭시 수지를 사용할 경우, 상기 에폭시 수지에 함유된 경화성 작용기는 에폭시가가 될 수 있고, 상기 2019/199033 1»(:1^1{2019/004223 The curable functional group contained in the thermosetting resin means a functional group that forms a cured structure through reaction with active hydrogen of the amine curing agent, and the type of the curable functional group may also vary according to the thermosetting resin type. For example, when using an epoxy resin as the thermosetting resin, the curable functional group contained in the epoxy resin may be epoxy, 2019/199033 1 »(: 1 ^ 1 {2019/004223
열경화성 수지로 비스말레이미드수지를 사용할 경우, 상기 비스말레이미드 수지에 함유된 경화성 작용기는 말레이미드기가 될 수 있다. When the bismaleimide resin is used as the thermosetting resin, the curable functional group contained in the bismaleimide resin may be a maleimide group.
즉, 상기 열경화성 수지 조성물이 상기 수학식 1로 계산되는 당량비가 1 .4 이상을 만족한다는 것은, 모든 열경화성 수지에 함유된 경화성 작용기가 경화반응을 일으킬 수 있을 정도로 충분한 수준의 아민 경화제가 함유되어있음을 의미한다. 따라서, 상기 열경화성 수지 조성물에서 상기 수학식 1로 계산되는 당량비가 1 .4 미만으로 감소하는 경우, 고함량으로 투입된 필러의 영향으로 열경화성 수지가 보다 충분한 수준까지 균일하게 경화되기 어려워, 최종 제조되는 제품의 신뢰성이 감소할 수 있고, 기계적 물성 또한 감소할 수 있는 단점이 있다. 상기 아민 화합물은 술폰기; 카보닐기 ; 할로겐기; 니트로기, 시아노기 또는 할로겐기로 치환 또는 비치환된 탄소수 1 내지 20의 알킬기; 니트로기, 시아노기 또는 할로겐기로 치환 또는 비치환된 탄소수 6 내지 20의 아릴기; 니트로기, 시아노기 또는 할로겐기로 치환 또는 비치환된 탄소수 2 내지 30의 헤테로아릴기; 및 니트로기, 시아노기 또는 할로겐기로 치환 또는 비치환된 탄소수 1 내지 20의 알킬렌기;로 이루어진 군에서 선택된 1종 이상의 작용기를 1 이상 포함하고, 2 내지 5개의 아민기를 포함하는 방향족 아민 화합물일 수 있다. That is, the thermosetting resin composition satisfies that the equivalent ratio calculated by Equation (1) is equal to or greater than 1.4, wherein the amine curing agent of a sufficient level is contained so that the curable functional groups contained in all the thermosetting resins can cause a curing reaction. Means. Therefore, when the equivalent ratio calculated by Equation 1 in the thermosetting resin composition is reduced to less than 1.4, it is difficult to uniformly cure the thermosetting resin to a more sufficient level under the influence of the filler charged in a high content, the final product The reliability of can be reduced, mechanical properties also have the disadvantage that can be reduced. The amine compound may be a sulfone group; Carbonyl group; Halogen group; An alkyl group having 1 to 20 carbon atoms unsubstituted or substituted with a nitro group, cyano group, or halogen group; An aryl group having 6 to 20 carbon atoms unsubstituted or substituted with a nitro group, cyano group, or halogen group; A heteroaryl group having 2 to 30 carbon atoms unsubstituted or substituted with a nitro group, cyano group, or halogen group; And an alkylene group having 1 to 20 carbon atoms unsubstituted or substituted with a nitro group, cyano group, or halogen group; an aromatic amine compound containing at least one functional group selected from the group consisting of 2 to 5 amine groups have.
보다 구체적으로, 상기 아민 화합물은 하기 화학식 1 내지 3으로 이루어진 군에서 선택된 1종 이상의 화합물을 포함할 수 있다. More specifically, the amine compound may include one or more compounds selected from the group consisting of the following Chemical Formulas 1 to 3.
[화학식 1] [Formula 1]
상기 화학식 1에서, 뇨는 술폰기, 카보닐기, 또는 탄소수 1 내지 10의 알킬렌기이며, ¾ 내지 ¾는 각각 독립적으로 니트로기, 시아노기, 수소원자, 할로겐기, 탄소수 1 내지 6의 알킬기, 탄소수 6 내지 15의 아릴기, 또는 2019/199033 1»(:1^1{2019/004223 In Formula 1, urine is a sulfone group, a carbonyl group, or an alkylene group having 1 to 10 carbon atoms, and ¾ to ¾ are each independently a nitro group, cyano group, hydrogen atom, halogen group, alkyl group having 1 to 6 carbon atoms, and carbon number. Aryl groups of 6 to 15, or 2019/199033 1 »(: 1 ^ 1 {2019/004223
탄소수 2 내지 20의 헤테로아릴기이고, 독립적으로 수소원자, 할로겐기, 탄소수 1 내지 6의 알킬기, 탄소수 6 내지 15의 아릴기, 또는 탄소수 2 내지 20의 헤테로아릴기이며, II은 1 내지 10의 정수일 수 있다. A heteroaryl group having 2 to 20 carbon atoms, Independently a hydrogen atom, a halogen group, an alkyl group of 1 to 6 carbon atoms, an aryl group of 6 to 15 carbon atoms, or a heteroaryl group of 2 to 20 carbon atoms, II may be an integer of 1 to 10.
상기 탄소수 1 내지 10의 알킬렌기, 탄소수 1 내지 6의 알킬기, 탄소수 6 내지 15의 아릴기, 및 탄소수 2 내지 20의 헤테로아릴기는 각각 독립적으로 니트로기, 시아노기 및 할로겐기로 이루어진 군에서 선택된 1종 이상의 작용기로 치환될 수 있다. The alkylene group having 1 to 10 carbon atoms, the alkyl group having 1 to 6 carbon atoms, the aryl group having 6 to 15 carbon atoms, and the heteroaryl group having 2 to 20 carbon atoms are each independently selected from the group consisting of nitro group, cyano group and halogen group It may be substituted with the above functional groups.
[화학식 2] [Formula 2]
상기 화학식 2에서, 내지 는 각각 독립적으로 니트로기, 시아노기, 수소원자, 할로겐기, 탄소수 1 내지 6의 알킬기, 탄소수 6 내지 15의 아릴기, 또는 탄소수 2 내지 20의 헤테로아릴기이고, 및 요4 '는 각각 독립적으로 수소원자, 할로겐기, 탄소수 1 내지 6의 알킬기, 탄소수 6 내지 15의 아릴기 , 또는 탄소수 2 내지 20의 헤테로아릴기이며, 01은 1 내지 10의 정수이고, 상기 탄소수 1 내지 6의 알킬기, 탄소수 6 내지 15의 아릴기, 및 탄소수 2 내지 20의 헤테로아릴기는 각각 독립적으로 니트로기, 시아노기 및 할로겐기로 이루어진 군에서 선택된 1종 이상의 작용기로 치환될 수 있다. In Formula 2, to are each independently a nitro group, a cyano group, a hydrogen atom, a halogen group, an alkyl group of 1 to 6 carbon atoms, an aryl group of 6 to 15 carbon atoms, or a heteroaryl group of 2 to 20 carbon atoms, And 4 ′ each independently represent a hydrogen atom, a halogen group, an alkyl group having 1 to 6 carbon atoms, an aryl group having 6 to 15 carbon atoms, or a heteroaryl group having 2 to 20 carbon atoms, 01 is an integer of 1 to 10, and The alkyl group having 1 to 6 carbon atoms, the aryl group having 6 to 15 carbon atoms, and the heteroaryl group having 2 to 20 carbon atoms may be independently substituted with at least one functional group selected from the group consisting of nitro group, cyano group and halogen group.
[화학식 3] [Formula 3]
상기 화학식 3에서, 1 내지 ¾는 각각 독립적으로 니트로기, 2019/199033 1»(:1^1{2019/004223 In Chemical Formula 3, 1 to ¾ are each independently a nitro group, 2019/199033 1 »(: 1 ^ 1 {2019/004223
시아노기, 수소원자, 할로겐기, 탄소수 1 내지 6의 알킬기, 탄소수 6 내지 15의 아릴기, 또는 탄소수 2 내지 20의 헤테로아릴기이고, 및 ¾ '는 각각 독립적으로 수소원자, 할로겐기, 탄소수 1 내지 6의 알킬기, 탄소수 6 내지 15의 아릴기, 또는 탄소수 2 내지 20의 헤테로아릴기이며, 상기 탄소수 1 내지 6의 알킬기 , 탄소수 6 내지 15의 아릴기, 및 탄소수 2 내지 20의 헤테로아릴기는 각각 독립적으로 니트로기, 시아노기 및 할로겐기로 이루어진 군에서 선택된 1종 이상의 작용기로 치환될 수 있다. 상기 알킬기는, 알케인( 1¾116)으로부터 유래한 1가의 작용기로, 예를 들어, 직쇄형, 분지형 또는 고리형으로서, 메틸, 에틸, 프로필, 이소부틸, 아卜부틸, 펜틸, 핵실 등이 될 수 있다. 상기 알킬기에 포함되어 있는 하나 이상의 수소 원자는 각각 치환기로 치환가능하다. A cyano group, a hydrogen atom, a halogen group, an alkyl group having 1 to 6 carbon atoms, an aryl group having 6 to 15 carbon atoms, or a heteroaryl group having 2 to 20 carbon atoms, And ¾ 'are each independently a hydrogen atom, a halogen group, an alkyl group of 1 to 6 carbon atoms, an aryl group of 6 to 15 carbon atoms, or a heteroaryl group of 2 to 20 carbon atoms, the alkyl group of 1 to 6 carbon atoms, 6 to 6 carbon atoms The aryl group of 15 and the heteroaryl group having 2 to 20 carbon atoms may each be independently substituted with one or more functional groups selected from the group consisting of nitro groups, cyano groups, and halogen groups. The alkyl group is a monovalent functional group derived from alkane (1¾116), and is, for example, linear, branched or cyclic, methyl, ethyl, propyl, isobutyl, Acebutyl, pentyl, nuclear chamber and the like. At least one hydrogen atom included in the alkyl group may be substituted with each substituent.
상기 알킬텐기는, 알케인( 1¾1½)으로부터 유래한 2가의 작용기로, 예를 들어, 직쇄형, 분지형 또는 고리형으로서, 메틸렌기, 에틸렌기, 프로필텐기, 이소부틸텐기, 라 부틸텐기, 펜틸텐기, 핵실렌기 등이 될 수 있다. 상기 알킬렌기에 포함되어 있는 하나 이상의 수소 원자는 각각 상기 알킬기의 경우와 마찬가지의 치환기로 치환가능하다. 상기 아릴기는 아렌 )으로부터 유래한 1가의 작용기로, 예를 들어, 단환식 또는 다환식일 수 있다. 구체적으로, 단환식 아릴기로는 페닐기, 바0ᅵ페닐기, 터페닐기, 스틸베닐기 등이 될 수 있으나, 이에 한정되는 것은 아니다. 다환식 아릴기로는 나프틸기, 안트릴기, 페난트릴기, 파이레닐기, 페릴레닐기, 크라이세닐기, 플루오레닐기 등이 돨 수 있으나, 이에 한정되는 것은 아니다. 이러한 아릴기 중 하나 이상의 수소 원자는 각각 상기 알킬기의 경우와 마찬가지의 치환기로 치환가능하다. The alkylten group is a divalent functional group derived from alkane (1¾1½), and is, for example, linear, branched or cyclic, methylene group, ethylene group, propylten group, isobutyltene group, It may be a la butylten group, a pentylten group, a nuclear silane group and the like. One or more hydrogen atoms contained in the alkylene group may be substituted with the same substituents as in the case of the alkyl group, respectively. The aryl group is a monovalent functional group derived from arene), and may be, for example, monocyclic or polycyclic. Specifically, the monocyclic aryl group may be a phenyl group, a bar 0 phenyl group, terphenyl group, stilbenyl group and the like, but is not limited thereto. Examples of the polycyclic aryl group include naphthyl group, anthryl group, phenanthryl group, pyrenyl group, perrylenyl group, chrysenyl group, fluorenyl group, and the like, but are not limited thereto. At least one hydrogen atom of such an aryl group may be each substituted with the same substituent as in the alkyl group.
상기 헤테로아릴기는 이종원자로 0, N 또는 3를 포함하는 헤테로 고리기로서, 탄소수는 특별히 한정되지 않으나 탄소수 2 내지 30일 수 있다. 헤테로 고리기의 예로는 티오펜기, 퓨란기 , 피롤기, 이미다졸기, 티아졸기, 옥사졸기 , 옥사디아졸기, 트리아졸기, 피리딜기, 비피리딜기, 트리아진기, 아크리딜기 , 피리다진기, 퀴놀리닐기 , 이소퀴놀린기, 인돌기, 카바졸기, 벤조옥사졸기 , 벤조이미다졸기, 벤조티아졸기, 벤조카바졸기, 벤조티오펜기, 02019/199033 1»(:1^1{2019/004223 The heteroaryl group is a heterocyclic group containing 0, N or 3 as a hetero atom, and the carbon number is not particularly limited, but may be 2 to 30 carbon atoms. Examples of heterocyclic groups include thiophene group, furan group, pyrrole group, imidazole group, thiazole group, oxazole group, oxadiazole group, triazole group, pyridyl group, bipyridyl group, triazine group, acridil group, pyridazine group , Quinolinyl group, isoquinoline group, indole group, carbazole group, benzoxazole group, benzoimidazole group, benzothiazole group, benzocarbazole group, benzothiophene group , 02019/199033 1 »(: 1 ^ 1 {2019/004223
디벤조티오펜기, 벤조퓨라닐기 및 디벤조퓨란기 등이 있으나, 이들에만 한정되는 것은 아니다. 이러한 헤테로아릴기 중 하나 이상의 수소 원자는 각각상기 알킬기의 경우와마찬가지의 치환기로 치환가능하다. Dibenzothiophene group, benzofuranyl group, dibenzofuran group and the like, but are not limited thereto. At least one hydrogen atom of such a heteroaryl group may be each substituted with a substituent as in the alkyl group.
상기 "치환"이라는 용어는 화합물 내의 수소 원자 대신 다른 작용기가 결합하는 것을 의미하며, 치환되는 위치는 수소 원자가 치환되는 위치 즉, 치환기가 치환 가능한 위치라면 한정되지 않으며, 2 이상 치환되는 경우, 2 이상의 치환기는서로 동일하거나상이할 수 있다. The term "substituted" means that another functional group is bonded to a hydrogen atom in the compound, and the position to be substituted is not limited to a position where a hydrogen atom is substituted, that is, a position where a substituent may be substituted. The substituents may be the same or different from each other.
보다 구체적으로; 상기 화학식 1은 하기 화학식 1-1로 표시되는 화합물을포함할수 있다. More specifically; Formula 1 may include a compound represented by the following Formula 1-1.
[화학식 1-1] [Formula 1-1]
, , II에 대한 내용은상기 화학식 1에서 상술한 내용을 포함한다. , And about II, including the above information, in formula (I).
상기 화학식 1-1의 구체적인 예로는. 4,4'-(1 11^110( 131161¾^1 Specific examples of the formula 1-1. 4,4 '-(1 11 ^ 110 (131161¾ ^ 1
IV는 각각 독립적으로 수소원자이며, II은 1 이다.), 4,4'- 근 11101'01)1'매크1½-2,2-(1 1 1 ½(화학식 1〜1에서 \는 perfluoropropane-2, 2-(1171 , X! 내지 X IV, ¾ 및 ¾'는 각각 독립적으로 수소원자이며, 은 1 이다.), 4,4’-(2,2,2-|;1 11101061:1131½- (화학식 1-1에서 X는 2,2,2- 11101,061:113116-1,1- 71, , ¾ 및 ¾’는 각각 독립적으로 수소원자이며, II은 1 이다.) 등을 들 수 있다. IV is each independently a hydrogen atom, II is 1.), 4,4'- Near 11101'01) 1 'Macro 1½-2,2- (1 1 1 ½ (wherein 1 is 1) 2, 2- (1171, X ! To X IV , ¾, and ¾ 'are each independently a hydrogen atom, and is 1.), 4,4'-(2,2,2- |; 1 11101061: 1131½- (wherein X is 2,2 in Formula 1-1) , 2- 11101,061: 113116-1,1- 71, , ¾ and ¾ 'are each independently a hydrogen atom, and II is 1).
또한, 상기 화학식 2는 하기 화학식 2-1로 표시되는 화합물을 포함할 수 있다. 2019/199033 1 1/10公019/004223 In addition, Chemical Formula 2 may include a compound represented by Chemical Formula 2-1. 2019/199033 1 1/10 公 019/004223
[화학식 2-1] [Formula 2-1]
!11에 대한 내용은 상기 화학식 2에서 상술한 내용을 포함한다. The information about! 11 includes the above-described information in Chemical Formula 2.
상기 화학식 2-1의 구체적인 예로는 2,2' ,3,3' ,5,5' ,6,6'- Specific examples of Chemical Formula 2-1 include 2,2 ', 3,3', 5,5 ', 6,6'-
◦ 크군 1110101 1)1161171-4,4|-(1 11^116 (화학식 2-1에서 내지 ¾은 할로겐으로 플루오르기, ¾, ¾ 및 ¾’는 각각 독립적으로 수소원자이며, 은 1 이다.), 2,2’- 3( 1 01'011161上3,1)1)^116]¾1-4,41- 3111 ½ ( 2 및 7은 각각 트리플루오로메틸기이며 , 및 ¾’는 각각 독립적으로 수소원자이며, m은 1 이다.) 등을 들 수 있다. ◦ Large 1110101 1) 1161171-4,4 | -(1 11 ^ 116 (In formula 2-1 to ¾ is halogen, fluorine group , ¾ , ¾ and ¾ 'are each independently a hydrogen atom, is 1), 2,2'- 3 (1 01'011161上3,1) 1) ^ 116] ¾1-4,4 1 -. 3111 ½ (2 And 7 are each trifluoromethyl group, And ¾ 'are each independently a hydrogen atom, m is 1).
또한, 상기 화학식 3는 하기 화학식 3-1로 표시되는 화합물을 포함할 수 있다. In addition, Chemical Formula 3 may include a compound represented by Chemical Formula 3-1.
[화학식 3-1] [Formula 3-1]
대한 내용은 상기 화학식 3에서 상술한 내용을 포함한다. Information on the above includes the above-described information in Chemical Formula 3.
상기 화학식 3_1의 구체적인 예로는 2,3,5,6아61;대£111이"056]126]16-1,4- ½ (화학식 3-1에서 1 내지 ¾는 할로겐으로 플루오르기, ¾, ¾’, ¾ 및 ¾'는 각각 독립적으로 수소원자이다.)등을 들 수 있다. 상기 열경화성 수지 조성물은 아민 화합물, 열경화성 수지 , 열가소성 수지, 및 무기 충진제를 포함할 수 있다. 2019/199033 1»(:1/10公019/004223 Specific examples of the formula (3_1) is 2,3,5,6a 61; £ 111 is "056 ] 1 26 ] 1 6-1,4- ½ (In formula 3-1, 1 to ¾ is a halogen fluorine group , ¾ , ¾ ' , ¾, and ¾' are each independently a hydrogen atom.) The thermosetting resin composition may include an amine compound, a thermosetting resin, a thermoplastic resin, and an inorganic filler. 2019/199033 1 »(: 1/10 公 019/004223
상기 성분의 함량이 크게 한정되는 것은 아니나, 상기 열경화성 수지 조성물로부터 제조되는 최종 제품의 물성 등을 고려하여 상술한 성분들을 포함할 수 있으며, 이들 성분간의 함량 비율 등은 후술하는 바와 같다. Although the content of the components is not particularly limited, the above-described components may be included in consideration of the physical properties of the final product manufactured from the thermosetting resin composition, and the content ratio between these components is as described below.
상기 열경화성 수지는 에폭시 수지를 포함할 수 있다. 상기 에폭시 수지로는 통상 반도체 패키지용 열경화성 수지 조성물에 사용되는 것을 제한 없이 사용 할 수 있으며, 그 종류가 한정되지는 않으며, 비스페놀 쇼 형 에폭시 수지, 페놀 노볼락 에폭시 수지, 페닐 아랄킬계 에폭시 수지, 테트라페닐 에탄 에폭시 수지 , 나프탈렌계 에폭시 수지 , 바이페닐계 에폭시 수지 , 디시클로펜타디엔 에폭시 수지, 및 디시클로펜타디엔계 에폭시 수지와 나프탈렌계 에폭시 수지의 혼합물로 이루어진 군에서 선택된 1종 이상일 수 있다. The thermosetting resin may include an epoxy resin. As the epoxy resin, those used in the thermosetting resin composition for a semiconductor package can be used without limitation, and the type thereof is not limited, and bisphenol show type epoxy resin, phenol novolac epoxy resin, phenyl aralkyl epoxy resin, tetra It may be at least one selected from the group consisting of phenyl ethane epoxy resin, naphthalene epoxy resin, biphenyl epoxy resin, dicyclopentadiene epoxy resin, and a mixture of dicyclopentadiene epoxy resin and naphthalene epoxy resin.
구체적으로, 상기 에폭시 수지는 하기 화학식 5로 표시되는 비스페놀형 에폭시 수지, 하기 화학식 6로 표시되는 노볼락형 에폭시 수지, 하기 화학식 7로 표시되는 페닐 아랄킬계 에폭시 수지, 하기 화학식 8로 표시되는 테트라페닐에탄형 에폭시 수지, 하기 화학식 9과 10으로 표시되는 나프탈렌형 에폭시 수지, 하기 화학식 11로 표시되는 바이페닐형 에폭시 수지, 및 하기 화학식 12로 표시되는 디시클로펜타디엔형 에폭시 수지로 이루어진 군에서 선택된 1종 이상을 사용할 수 있다. Specifically, the epoxy resin is a bisphenol-type epoxy resin represented by the formula (5), a novolak-type epoxy resin represented by the formula (6), a phenyl aralkyl-based epoxy resin represented by the formula (7), tetraphenyl represented by the formula (8) 1 selected from the group consisting of an ethane type epoxy resin, a naphthalene type epoxy resin represented by Formulas 9 and 10, a biphenyl type epoxy resin represented by Formula 11, and a dicyclopentadiene type epoxy resin represented by Formula 12: More than one species can be used.
[화학식 5] [Formula 5]
2019/199033 1»(그1^1{2019/004223 2019/199033 1 »(1 ^ 1 {2019/004223
II은 0또는 1 내지 50의 정수이다. II is 0 or an integer from 1 to 50.
보다 구체적으로, 상기 화학식 5의 에폭시 수지는 요의 종류에 따라, 각각 비스페놀 쇼형 에폭시 수지, 비스페놀 I7형 에폭시 수지, 비스페놀 형 에폭시 수지 , 또는 비스페놀 형 에폭시 수지일 수 있다. More specifically, the epoxy resin of Formula 5 may be a bisphenol show type epoxy resin, a bisphenol I 7 type epoxy resin, a bisphenol type epoxy resin, or a bisphenol type epoxy resin, respectively, according to the type of urine.
[화학식 6] [Formula 6]
은 0또는 1 내지 50의 정수이다. Is 0 or an integer from 1 to 50.
보다 구체적으로, 상기 화학식 6의 노볼락형 에폭시 수지는 I?의 종류에 따라, 각각 페놀 노볼락형 에폭시 수지 또는 크레졸 노볼락형 에폭시 수지일 수 있다. More specifically, the novolak-type epoxy resin of Formula 6 may be a phenol novolak-type epoxy resin or cresol novolak-type epoxy resin, respectively, depending on the type of I?
[화학식 7] [Formula 7]
2019/199033 1»(그1^1{2019/004223 2019/199033 1 »(1 ^ 1 {2019/004223
[화학식 9] [Formula 9]
상기 화학식 11에서, In Chemical Formula 11,
II은 0또는 1 내지 50의 정수이다. II is 0 or an integer from 1 to 50.
[화학식 12] [Formula 12]
상기 화학식 12에서, II은 0또는 1 내지 5◦의 정수이다. 한편, 상기 열경화성 '수지는 비스말레이미드 수지, 시아네이트 에스터 수지 및 비스말레이미드-트리아진 수지로 이루어진 군으로부터 선택되는 1종 이상의 수지를 더 포함할수 있다. In Formula 12, II is 0 or an integer of 1 to 5 ◦. On the other hand, the thermosetting 'resins are bismaleimide resins, cyanate ester resins and bismaleimide-can be further comprising at least one resin selected from the group consisting of a triazine resin.
상기 비스말레이미드 수지는 통상 반도체 패키지용 열경화성 수지 2019/199033 1»(:1^1{2019/004223 The bismaleimide resin is usually a thermosetting resin for a semiconductor package 2019/199033 1 »(: 1 ^ 1 {2019/004223
조성물에 사용되는 것을 제한 없이 사용 할 수 있으며, 그 종류가 한정되지는 않는다. 바람직한 일례를 들면, 상기 비스말레이미드 수지는 하기 화학식 13으로 표시되는 디페닐메탄형 비스말레이미드 수지, 하기 화학식 14로 표시되는 페닐렌형 비스말레이미드 수지, 하기 화학식 15로 표시되는 비스페놀 쇼형 디페닐 에테르 비스말레이미드 수지, 및 하기 화학식 16으로 표시되는 디페닐메탄형 비스말레이미드 및 페닐메탄형 말레이미드 수지의 올리고머로 구성된 비스말레이미드 수지로 이루아진 군에서 선택된 1종 이상일 수 있다. Anything used in the composition can be used without limitation, and the kind thereof is not limited. As a preferred example, the bismaleimide resin is a diphenylmethane bismaleimide resin represented by the following formula (13), a phenylene type bismaleimide resin represented by the following formula (14), and a bisphenol show diphenyl ether represented by the following formula (15). It may be at least one selected from the group consisting of a bismaleimide resin and a bismaleimide resin composed of an oligomer of diphenylmethane bismaleimide and phenylmethane type maleimide resin represented by the following formula (16).
[화학식 13] [Formula 13]
상기 화학식 13에서, In Chemical Formula 13,
¾ 및 ¾는 각각독립적으로, (:¾또는 ¾¾이다. ¾ and ¾ are each independently (: ¾ or ¾¾).
[화학식 14] [Formula 14]
[화학식 16] 2019/199033 1»(그1^112019/004223 [Formula 16] 2019/199033 1 » (1 ^ 112019/004223
상기 화학식 16에서, In Chemical Formula 16,
II은 0또는 1 내지 50의 정수이다. II is 0 or an integer from 1 to 50.
또한, 상기 시아네이트계 수지의 구체적인 예로 시아네이트 에스터 수지를 들 수 있으며 , 통상 반도체 패키지용 열경화성 수지 조성물에 사용되는 것을 제한 없이 사용 할 수 있으며, 그 종류가 한정되지는 않는다. 바람직한 일례를 들면 , 상기 시아네이트 에스터 수지는 하기 화학식 17로 표시되는 노볼락형 시아네이트 수지, 하기 화학식 18로 표시되는 디시클로펜타디엔형 시아네이트 수지, 하기 화학식 19로 표시되는 비스페놀형 시아네이트 수지 및 이들의 일부 트리아진화된 프리폴리머를 들 수 있고, 이들은 단독 혹은 2종 이상혼합하여 사용할수 있다. In addition, specific examples of the cyanate-based resins include cyanate ester resins, and those commonly used in thermosetting resin compositions for semiconductor packages may be used without limitation, and the type thereof is not limited. As a preferable example, the cyanate ester resin is a novolac cyanate resin represented by the following formula (17), a dicyclopentadiene type cyanate resin represented by the following formula (18), and a bisphenol type cyanate resin represented by the following formula (19). And some triazineized prepolymers thereof, and these may be used alone or in combination of two or more thereof.
[화학식 17] [Formula 17]
상기 화학식 17에서, In Chemical Formula 17,
II은 0또는 1 내지 50의 정수이다. II is 0 or an integer from 1 to 50.
[화학식 1到 [Formula 1 到
상기 화학식 18에서, In Chemical Formula 18,
은 0 또는 1 내지 50의 정수이다. Is 0 or an integer from 1 to 50.
[화학식 19] [Formula 19]
보다 구체적으로, 상기 화학식 19의 시아네이트 수지는 요의 종류에 따라, 각각 비스페놀 A형 시아네이트 수지, 비스페놀 E형 시아네이트 수지, 비스페놀 F형 시아네이트 수지 , 또는 비스페놀 M형 시아네이트 수지일 수 있다. More specifically, the cyanate resin of Formula 19 may be bisphenol A type cyanate resin, bisphenol E type cyanate resin, bisphenol F type cyanate resin, or bisphenol M type cyanate resin, respectively, according to the type of urine. .
그리고, 상기 비스말레이미드 수지로는 비스말레이미드-트리아진 수지 등을 들 수 있고, 상기 비스말레이미드-트리아진 수지는 통상 반도체 패키지용 열경화성 수지 조성물에 사용되는 것을 제한 없이 사용 할 수 있으며, 그 종류가 한정되지는 않는다. 한편, 상기 열가소성 수지는 프리프레그의 경화 후, 인성(Toughness)을 증가시키는 효과가 있으며, 열팽창계수 및 탄성률을 낮게 하여 반도체 패키지의 휨(Warpage)를 완화시키는 역할을 할 수 있다. 상기 열가소성 수지의 구체적인 예로는 (메트)아크릴레이트계 고분자를 들 수 있다. The bismaleimide-triazine resin may be exemplified as the bismaleimide resin, and the bismaleimide-triazine resin may be used without limitation in the thermosetting resin composition for a semiconductor package. Kind is not limited. On the other hand, the thermoplastic resin has the effect of increasing the toughness (Toughness) after curing of the prepreg, and may serve to reduce the warpage of the semiconductor package by lowering the coefficient of thermal expansion and elastic modulus. As a specific example of the said thermoplastic resin, a (meth) acrylate type polymer is mentioned.
상기 (메트)아크릴레이트계 고분자의 예가 크게 한정되는 것은 아니며, 예를 들어 (메트)아크릴레이트계 단량체 유래의 반복단위와 (메트)아크릴로니트릴 유래의 반복 단위가 포함되는 아크릴산 에스테르 2019/199033 1»(:1^1{2019/004223 Examples of the (meth) acrylate-based polymer are not particularly limited, and for example, an acrylic ester containing a repeating unit derived from a (meth) acrylate monomer and a repeating unit derived from a (meth) acrylonitrile. 2019/199033 1 »(: 1 ^ 1 {2019/004223
공중합체; 또는 부타디엔 유래의 반복 단위가 포함되는 아크릴산 에스테르 공중합체일 수 있다. 예를 들어, 상기 (메트)아크릴레이트계 고분자는 부틸아크릴레이트, 에틸아크릴레이트 , 아크릴로니트릴, 메틸메타크릴레이트 , 글리시딜메타크릴레이트 등의 단량체를 각각 1 내지 40중량%의 범위내(단량체 전체의 총 중량 대비)에서 사용하여 공중한 공중합체 일 수 있다. Copolymers; Or it may be an acrylic ester copolymer containing a repeating unit derived from butadiene. For example, the (meth) acrylate-based polymer is a monomer such as butyl acrylate, ethyl acrylate, acrylonitrile, methyl methacrylate, glycidyl methacrylate in the range of 1 to 40% by weight ( Relative to the total weight of the entire monomer).
상기 (메트)아크릴레이트계 고분자는 500 , 000 내지 1 , 000 , 000의 중량평균분자량을 가질 수 있다. 상기 (메트)아크릴레이트계 고분자의 중량평균분자량이 너무 작으면, 경화 후, 금속박 적층판용 열경화성 수지 복합체의 인성奸아 근 증가나 열팽창률 및 탄성률 감소에 효과가 감소하여 기술적으로 불리할 수 있다. 또한, 상기 (메트)아크릴레이트계 고분자의 중량평균분자량이 너무 크면, 프리프레그의 흐름성을 감소시킬 수 있다. The (meth) acrylate-based polymer may have a weight average molecular weight of 500, 000 to 1,000, 000. If the weight average molecular weight of the (meth) acrylate-based polymer is too small, it may be technically disadvantageous after curing because the effect is decreased in increasing the toughness of the thermosetting resin composite for the metal foil laminate or decreasing the thermal expansion and elastic modulus. In addition, when the weight average molecular weight of the (meth) acrylate-based polymer is too large, the flowability of the prepreg can be reduced.
상기 열가소성 수지는 최종 제품의 용도 및 특성 등을 고려하여 사용되는 함량을 결정할 수 있으며, 예를 들어 상기 반도체 패키지용 열경화성 수지 조성물은 상기 열경화성 수지 100 중량부에 대하여 상기 열가소성 수지 10 내지 200 중량부를 포함할 수 있다. 한편, 상기 열경화성 수지 조성물은 상술한 아민 화합물을 포함할 수 있으며, 상기 아민 화합물 이외의 추가적인 경화제를 더 포함할 수도 있다. 보다 구체적으로, 상기 열경화성 수지 조성물은 상기 아민 화합물과 상이한 제 2의 아민 화합물, 산무수물계 수지, 비스말레이미드 수지, 시아네이트계 수지, 페놀 노볼락 수지 및 벤즈옥사진 수지로 이루어진 군에서 선택되는 1종 이상의 경화제를 더 포함할 수 있다. 상기 열경화성 수지 조성물은 무기 충진제를 포함할 수 있다. The thermoplastic resin may determine the content used in consideration of the use and properties of the final product, for example, the thermosetting resin composition for a semiconductor package includes 10 to 200 parts by weight of the thermoplastic resin relative to 100 parts by weight of the thermosetting resin. can do. Meanwhile, the thermosetting resin composition may include the amine compound described above, and may further include an additional curing agent other than the amine compound. More specifically, the thermosetting resin composition is selected from the group consisting of a second amine compound, an acid anhydride resin, a bismaleimide resin, a cyanate resin, a phenol novolak resin and a benzoxazine resin different from the amine compound. It may further comprise one or more curing agents. The thermosetting resin composition may include an inorganic filler.
상기 무기 충진제는 통상 반도체 패키지용 열경화성 수지 조성물에 사용되는 것을 제한 없이 사용 할 수 있으며, 구체적인 예로는 실리카, 알루미늄 트리하이드록사이드 , 마그네슘 하이드록사이드, 몰리브데늄 옥사이드, 징크 몰리브데이트, 징크 보레이트, 징크 스타네이트, 알루미나, 클레이, 카올린, 탈크, 소성 카올린, 소성 탈크, 마이카, 유리 단섬유, 글라스 미세 파우더 및 중공 글라스를 들 수 있으며 이들로 이루어진 군에서 선택된 1종 이상일 수 있다. The inorganic filler can be used in the thermosetting resin composition for the semiconductor package usually without limitation, and specific examples include silica, aluminum trihydroxide, magnesium hydroxide, molybdenum oxide, zinc molybdate, zinc borate , Zinc stannate , Alumina, Clay, kaolin, talc, calcined kaolin, calcined talc, mica, short glass fiber, glass fine powder and hollow glass, and may be one or more selected from the group consisting of these.
상기 열경화성 수지 조성물은 상기 열경화성 수지, 열가소성 수지 및 아민 화합물의 총합 100중량부 대비 무기 충진제 30 내지 300중량부, 또는 30 내지 200중량부, 또는 50 내지 150중량부를 포함할 수 있다. 상기 무기 충진제의 함량이 너무 작으면 열팽창계수가 증가하여 리플로우 (ref low) 공정시 휨 현상이 심화되며, 인쇄회로기판의 강성이 감소하는 문제가 있다. 또한, 상기 표면 처리된 충진제를 사용시, 나노 입경의 작은 사이즈와 마이크로 입경의 큰 사이즈를 함께 사용하여 팩킹 밀도 (packing dens i ty)를 높여 충진률을높일 수 있다. The thermosetting resin composition may include 30 to 300 parts by weight, or 30 to 200 parts by weight, or 50 to 150 parts by weight of the inorganic filler relative to a total of 100 parts by weight of the thermosetting resin, the thermoplastic resin, and the amine compound. If the content of the inorganic filler is too small, the coefficient of thermal expansion is increased, so that warpage intensifies during the reflow process, and the rigidity of the printed circuit board is reduced. In addition, when the surface-treated filler is used, the packing density may be increased by using a small size of the nano particle size and a large size of the micro particle size to increase the packing density.
상기 무기 충진제는 평균 입경이 상이한 2종 이상의 무기 충진제를 포함할 수 있다. 구체적으로, 상기 2종 이상의 무기 충진제 중 적어도 1종이 평균 입경이 0.1 m 내지 100 _인 무기 충진제이고, 다른 1종이 평균 입경이 1 nm 내지 90 인 무기 충진제일 수 있다. The inorganic filler may include two or more inorganic fillers having different average particle diameters. Specifically, at least one of the two or more inorganic fillers may be an inorganic filler having an average particle diameter of 0.1 m to 100 _, and the other one may be an inorganic filler having an average particle diameter of 1 nm to 90.
상기 평균 입경이 0.1 m 내지 100 인 무기 충진제 100 중량부에 대하여 상기 평균 입경이 1 nm 내지 90 ran인 무기 충진제 함량이 1 중량부 내지 30 중량부일 수 있다. The inorganic filler having an average particle diameter of 1 nm to 90 ran may be 1 part by weight to 30 parts by weight based on 100 parts by weight of the inorganic filler having an average particle diameter of 0.1 m to 100 ran.
상기 무기 충진제는 내습성, 분산성을 향상시키는 관점에서 실란 커플링제로 표면 처리된 실리카를 사용할수 있다. The inorganic filler may use silica surface-treated with a silane coupling agent from the viewpoint of improving moisture resistance and dispersibility.
상기 무기 중진제를 표면 처리하는 방법은, 실란 커들링제를 표면 처리제로 이용하여 실리카 입자를 건식 또는 습식으로 처리하는 방법이 사용될 수 있다. 예를 들어 , 실리카 입자 100 중량부를 기준으로 0.01 내지 1 중량부의 실란 커플링제를 사용하여 습식방법으로 실리카를 표면처리하여 사용할수 있다. As the method for surface treatment of the inorganic neutralizing agent, a method of dry or wet treatment of silica particles using a silane cudling agent as a surface treatment agent may be used. For example, the silica may be surface-treated by a wet method using 0.01 to 1 part by weight of the silane coupling agent based on 100 parts by weight of the silica particles.
구체적으로 , 상기 실란 커플링제로는 3 -아미노프로필트리에톡시실란, N-페닐- 3 -아미노프로필트리메톡시실란 및 N-2- 아미노에틸)- 3- 아미노프로필트리메톡시실란과 같은 아미노실란 커플링제, 3 - 글리시독시프로필트리메톡시실란과 같은 에폭시 실란커플링제, 3 - 메타크릴옥시프로필 트리메톡시실란과 같은 비닐 실란커플링제, N-2-(N- \¥0 2019/199033 1>(:1'/100019/004223 Specifically, the silane coupling agent may include amino such as 3-aminopropyltriethoxysilane, N-phenyl-3-aminopropyltrimethoxysilane and N-2-aminoethyl) -3 aminopropyltrimethoxysilane. Silane coupling agent, epoxy silane coupling agent such as 3-glycidoxypropyltrimethoxysilane, vinyl silane coupling agent such as 3-methacryloxypropyl trimethoxysilane, N-2- (N- \ ¥ 0 2019/199033 1 > (: 1 '/ 100019/004223
비닐벤질아미노에틸)- 3 -아미노프로필트리메톡시실란 하이드로클로라이드와 같은 양이온 실란커플링제 및 페닐 실란커플링제를 들 수 있으며 , 실란 커플링제는 단독으로 사용될 수 있으며 , 또는 필요에 따라 적어도 두 개의 실란 커플링제를 조합하여 사용할 수 있다 . Vinyl benzylaminoethyl) -3 cationic silane coupling agent such as 3-aminopropyltrimethoxysilane hydrochloride and phenyl silane coupling agent, and the silane coupling agent may be used alone, or at least two silanes as necessary. Coupling agents can be used in combination.
보다 구체적으로, 상기 실란 화합물은 방향족 아미노 실란 또는 More specifically, the silane compound is an aromatic amino silane or
(메트)아크릴실란을 포함할 수 있으며, 상기 평균 입경이 0. 1 _ 내지 100 !!인 무기 충진제로는 방향족 아미노 실란이 처리된 실리카를 사용할 수 있고, 상기 평균 입경이 1 1패 내지 90 11이인 무기 충진제로는 (메트)아크릴 실란이 처리된 실리카를 사용할 수 있다. 상기 방향족 아미노 실란이 처리된 실리카의 구체적인 예로는 205( 1'0 (111 6(±3사)를 들 수 있고, 상기 (메트)아크릴실란이 처리된 실리카의 구체적인 예로는 쇼0413 ( 사)를 들 수 있다. 상기 (메트)아크릴은 아크릴 또는 메타크릴을 모두 포함하는 의미로 사용되었다. 그리고, 상기 프리프레그 제조 과정에서 상기 열경화성 수지 조성물은 필요에 따라 용제를 첨가하여 용액으로 사용할 수 있다. 상가 용제로는 수지 성분에 대해 양호한 용해성을 나타내는 것이면 그 종류가 특별히 한정되지 않으며, 알코올계, 에테르계, 케톤계, 아미드계, 방향족 탄화수소계, 에스테르계, 니트릴계 등을 사용할 수 있고, 이들은 단독 또는 2종 이상 병용한 혼합 용제를 이용할 수도 있다. 또한 상기 용매의 함량은 프리프레그 제조시 유리섬유에 수지 조성물을 함침할 수 있는 정도면 특별히 한정되지 않는다. (Meth) acrylsilane may be included, and as the inorganic filler having an average particle diameter of 0.1 _ to 100 !!, silica having an aromatic amino silane treated may be used, and the average particle diameter of 11 to 90 11 As the inorganic filler, silica treated with (meth) acryl silane can be used. Specific examples of the aromatic amino silane-treated silica include 205 (1 ' 0 (111 6 (± 3)), and the specific example of the (meth) acryl silane-treated silica is shown in Show0413 (g). Can be mentioned. The said (meth) acryl was used by the meaning containing all acryl or methacryl. In the prepreg manufacturing process, the thermosetting resin composition may be used as a solution by adding a solvent as necessary. The additive solvent is not particularly limited as long as it shows good solubility in the resin component, and alcohol, ether, ketone, amide, aromatic hydrocarbon, ester, and nitrile may be used. Or you may use the mixed solvent which used 2 or more types together. In addition, the content of the solvent is not particularly limited as long as the resin composition may be impregnated into the glass fiber during prepreg manufacture.
또한 상기 열경화성 수지 조성물은 , 수지 조성물 고유의 특성을 손상시키지 않는 한, 기타 열경화성 수지, 열가소성 수지 및 이들의 올리고머 및 엘라스토머와 같은 다양한 고분자 화합물, 기타 난연성 화합물 또는 첨가제를 더 포함할 수도 있다. 이들은 통상적으로 사용되는 것으로부터 선택되는 것이라면 특별히 한정하지 않는다. In addition, the thermosetting resin composition may further include various high molecular compounds such as other thermosetting resins, thermoplastic resins and oligomers and elastomers thereof, other flame retardant compounds or additives, so long as the properties inherent in the resin composition are not impaired. These are not particularly limited as long as they are selected from those commonly used.
예를 들어 첨가제로는 자외선흡수제, 산화방지제, 광중합개시제, 형광증백제, 광증감제, 안료, 염료, 증점제, 활제, 소포제 , 분산제, 레벨링제, 광택제 등이 았、고, 목적에 부합되도록 혼합하여 사용하는 것도 가능하다. 상기 금속박 적층판용 열경화성 수지 복합체는 상기 반도체 패키지용 열경화성 수지 조성물이 경화 상태로 섬유 기재에 함침되어 있는 것을 의미한다. For example, the additives include UV absorbers, antioxidants, photopolymerization initiators, optical brighteners, photosensitizers, pigments, dyes, thickeners, lubricants, antifoaming agents, dispersants, leveling agents, and brightening agents. To use It is possible. The thermosetting resin composite for a metal foil laminate means that the thermosetting resin composition for a semiconductor package is impregnated into a fiber substrate in a cured state.
상기 섬유 기재는 그 종류가 특별히 한정되지는 않으나, 유리 섬유 기재, 폴리아미드 수지 섬유, 방향족 폴리아미드 수지 섬유 등의 폴리아미드계 수지 섬유, 폴리에스테르 수지 섬유, 방향족 폴리에스테르 수지 섬유, 전 방향족 폴리에스테르 수지 섬유 등의 폴리에스테르계 수지 섬유, 폴리이미드 수지 섬유, 폴리벤족사졸 섬유, 불소 수지 섬유 등을 주성분으로 하는 직포 또는 부직포로 구성되는 합성 섬유 기재, 크래프트지, 코튼 린터지, 린터와 크래프트 펄프의 혼초지 등을 주성분으로 하는 종이 기재 등이 사용될 수 있으며, 바람직하게 유리 섬유 기재를 사용한다. 상기 유리 섬유 기재는 프리프레그의 강도가 향상되고 흡수율을 내릴 수 있으며, 또 열팽창 계수를 작게 할수 있다. The fiber base is not particularly limited in kind, but may be a polyamide resin fiber such as a glass fiber base, a polyamide resin fiber, an aromatic polyamide resin fiber, a polyester resin fiber, an aromatic polyester resin fiber, a wholly aromatic polyester, etc. Synthetic fiber base, kraft paper, cotton linter paper, linter and kraft pulp composed of woven or nonwoven fabrics mainly composed of polyester resin fibers such as resin fibers, polyimide resin fibers, polybenzoxazole fibers, and fluorine resin fibers Paper substrates based on honcho paper and the like may be used, and glass fiber substrates are preferably used. The glass fiber substrate can improve the strength of the prepreg, lower the absorption rate, and reduce the coefficient of thermal expansion.
상기 유리 섬유 기재는 다양한 인쇄회로기판 물질용으로 사용되는 유리기재로부터 선택될 수 있다. 이들의 예로서는, E 글라스, D 글라스, S 글라스, T 글라스, NE 글라스 및 L 글라스, Q 글라스와 같은 유리 섬유를 포함하나 이에 한정되는 것은 아니다. 필요에 따라서 의도된 용도 또는 성능에 따라, 상기 유리기재 물질을 선택할 수 있다. 유리기재 형태는 전형적으로 직포, 부직포, 로빙 (roving) , 잘개 다진 스트랜드 매트 (chopped strand mat ) 또는 서페이싱 매트 (surfacing mat )이다. 상기 유리기재 기재의 두께는 특별히 한정되지 않지만, 약 0.01 내지 0.3mm 등을 사용할 수 있다. 상기 물질 중, 유리 섬유 물질이 강도 및 수분 흡수 특성 면에서 더욱 바람직하다. The glass fiber substrate may be selected from glass substrates used for various printed circuit board materials. Examples thereof include, but are not limited to, glass fibers such as E glass, D glass, S glass, T glass, NE glass and L glass, and Q glass. If desired, the glass-based material may be selected depending on the intended use or performance. Glass-based forms are typically woven, nonwoven, roving, chopped strand mats or surfacing mats. The thickness of the glass base material is not particularly limited, and about 0.01 to 0.3 mm may be used. Of these materials, glass fiber materials are more preferred in terms of strength and water absorption properties.
또한 상기 프리프레그를 제조하는 방법은 특별히 한정되지 않으며, 이 분야에 잘 알려진 방법에 의해 제조될 수 있다. 예를 들면, 상기 프리프레그의 제조방법은 함침법, 각종 코터를 이용하는 코팅법, 스프레이 분사법 등을 이용할수 있다. In addition, the method for preparing the prepreg is not particularly limited and may be prepared by a method well known in the art. For example, the method of manufacturing the prepreg may be an impregnation method, a coating method using various coaters, a spray injection method, or the like.
상기 함침법의 경우 바니시를 제조한후, 상기 섬유 기재를 바니시에 2019/199033 1»(:1^1{2019/004223 In the case of the impregnation method, after the varnish is manufactured, the fiber substrate is varnished 2019/199033 1 »(: 1 ^ 1 {2019/004223
함침하는 방법으로프리프레그를 제조할 수 있다. Prepreg can be prepared by impregnation.
즉, 상기 프리프레그의 제조 조건 등은 특별히 제한하는 것은 아니지만, 상기 반도체 패키지용 열경화성 수지 조성물에 용제를 첨가한 바니시 상태로 사용하는 것이 바람직하다. 상기 수지 바니시용 용제는 상기 수지 성분과 혼합 가능하고 양호한 용해성을 갖는 것이라면 특별히 한정하지 않는다. 이들의 구체적인 예로는, 아세톤, 메틸 에틸 케톤, 메틸이소부틸 케톤 및 시클로핵사논과 같은 케톤, 벤젠, 톨루엔 및 자일렌과 같은 방향족 하이드로카본 , 및 디메틸포름아미드 및 디메틸아세트아미드와 같은 아미드, 메틸셀로솔브, 부틸셀로솔브 같은 알리파틱 알코올등이 있다. That is, although the manufacturing conditions, etc. of the said prepreg are not specifically limited, It is preferable to use it in the varnish state which added the solvent to the said thermosetting resin composition for semiconductor packages. The solvent for the resin varnish is not particularly limited as long as it can be mixed with the resin component and has good solubility. Specific examples thereof include ketones such as acetone, methyl ethyl ketone, methyl isobutyl ketone and cyclonuxanone, aromatic hydrocarbons such as benzene, toluene and xylene, and amides such as dimethylformamide and dimethylacetamide, methylcello Solv, aliphatic alcohols such as butyl cellosolve.
또한, 상기 프리프레그로 제조시, 사용된 용제가 80 중량% 이상 휘발하는 것이 바람직하다. 이 때문에, 제조 방법이나 건조 조건 등도 제한은 없고, 건조시의 온도는 약 80 내지 200 °0 , 시간은 바니시의 겔화 시간과의 균형으로 특별히 제한은 없다. 또한, 바니시의 함침량은 바니시의 수지 고형분과 기재의 총량에 대하여 바니시의 수지 고형분이 약 30 내지 80중량%가 되도록 하는 것이 바람직하다. 또한, 발명의 다른 구현예에 따르면, 시트 형상을 갖는 상술한 금속박 적층판용 열경화성 수지 복합체; 및 상기 금속박 적층판용 열경화성 수지 복합체의 적어도 일면에 형성된 금속박;을 포함하는 금속박 적층판이 제공될 수 있다. In addition, when the prepreg is prepared, it is preferable that the solvent used is volatilized by 80% by weight or more. For this reason, there is no restriction | limiting in manufacturing method, drying conditions, etc., The temperature at the time of drying is about 80 To 200 ° 0, the time is not particularly limited in balance with the gelation time of the varnish. The varnish impregnation amount is preferably such that the resin solid content of the varnish is about 30 to 80% by weight based on the total amount of the resin solid content of the varnish and the base material. In addition, according to another embodiment of the invention, the above-mentioned thermosetting resin composite for a metal foil laminate having a sheet shape; And a metal foil formed on at least one surface of the thermosetting resin composite for the metal foil laminate.
상기 금속박은 동박; 알루미늄박; 니켈, 니켈-인, 니켈-주석 합금, 니켈-철 합금, 납 또는 납-주석 합금을 중간층으로 하고, 이 양면에 서로 다른 두께의 구리층을 포함하는 3층 구조의 복합박; 또는 알루미늄과 동박을 복합한 2층구조의 복합박을 포함한다. The metal foil is copper foil; Aluminum foil; A composite foil having a three-layer structure including nickel, nickel-phosphorus, nickel-tin alloy, nickel-iron alloy, lead, or lead-tin alloy as an intermediate layer, and including copper layers having different thicknesses on both surfaces thereof; Or the composite foil of the two-layered structure which combined aluminum and copper foil.
바람직한 일예에 따르면, 상기 금속박은 동박이나 알루미늄박이 이용되고, 약 2 내지 200 _의 두께를 갖는 것을 사용할 수 있지만, 그 두께가 약 2 내지 35 !인 것이 바람직하다. 바람직하게, 상기 금속박으로는 동박을 사용한다. 또한, 상기 금속박으로서 니켈, 니켈-인, 니켈-주석 합금, 니켈-철 합금, 납, 또는 납-주석 합금 등을 중간층으로 \¥0 2019/199033 According to a preferred embodiment, the metal foil may be a copper foil or an aluminum foil, and a metal having a thickness of about 2 to 200 — may be used, but the thickness thereof is preferably about 2 to 35. Preferably, copper foil is used as said metal foil. Further, as the metal foil, nickel, nickel-phosphorus, nickel-tin alloy, nickel-iron alloy, lead, lead-tin alloy, or the like may be used as an intermediate layer. \ ¥ 0 2019/199033
하고, 이의 양면에 0.5 내지 15 !의 구리층과 10 내지 300 _의 구리층을 설치한, 3층 구조의 복합박 또는 알루미늄과 동박을 복합한 2층 구조 복합박을사용할수도 있다. It is also possible to use a three-layered composite foil or a two-layered composite foil in which aluminum and copper foil are provided on both surfaces thereof with a copper layer of 0.5 to 15! And a copper layer of 10 to 300 _.
이렇게 제조된 금속박 적층판용 열경화성 수지 복합체를 포함하는 금속 적층판은 단면 또는 양면 또는 다층 인쇄 회로 기판의 제조에 사용할 수 있다. 상기 금속박 적층판을 회로 가공하여 단면 또는 양면 또는 다층 인쇄회로기판을 제조할 수 있으며 , 상기 회로 가공은 일반적인 단면, 양면 또는 다층 인쇄 회로 기판 제조 공정에서 행해지는 방법을 적용할 수 있다. The metal laminated plate containing the thermosetting resin composite for metal foil laminated plates thus manufactured can be used for manufacture of single-sided, double-sided, or multilayer printed circuit boards. The metal foil laminate may be processed to fabricate a single-sided or double-sided or multilayer printed circuit board, and the circuit processing may be performed by a general single-sided, double-sided or multilayer printed circuit board manufacturing process.
【발명의 효과】 【Effects of the Invention】
본 발명에 따르면, 프리프레그 단계 또는 반경화 상태에서 우수한 흐름성을 가지며, 낮은 유리 전이 온도 및 모듈러스, 낮은 열팽창률을 구현할 수 있으며 휨 크대크묘 현상을 최소화할 수 있는 반도체 패키지용 금속박 적층판용 열경화성 수지 복합체와, 상기 금속박 적층판용 열경화성 수지 복합체를 포함하는 금속박 적층판이 제공될 수 있다. According to the present invention, a thermosetting resin for a metal foil laminate for a semiconductor package which has excellent flowability in a prepreg stage or a semi-cured state, can realize low glass transition temperature and modulus, low thermal expansion rate, and minimize warp large size seedling phenomenon. A metal foil laminate comprising a composite and the thermosetting resin composite for the metal foil laminate may be provided.
【발명을실시하기 위한구체적인 내용】 [Specific contents for carrying out invention]
발명을 하기의 실시예에서 보다 상세하게 설명한다. 단, 하기의 실시예는 본 발명을 예시하는 것일 뿐, 본 발명의 내용이 하기의 실시예에 의하여 한정되는 것은 아니다. <실시예 및 비교예 : 반도체 패키지용 열경화성 수지 조성물, 프리프레그, 금속박적층판용 열경화성 수지 복합체 및 동박적층판> The invention is explained in more detail in the following examples. However, the following examples are merely to illustrate the invention, but the content of the present invention is not limited by the following examples. <Examples and Comparative Examples: Thermosetting Resin Composition for Semiconductor Package, Prepreg, Thermosetting Resin Composite and Copper Foil Laminating Plate>
(1) 반도체 패키지용 열경화성 수지 조성물의 제조 (1) Preparation of thermosetting resin composition for semiconductor package
하기 표 1 및 표 2의 조성에 따라, 각 성분을 메틸에틸케톤에 고형분 40%에 맞추어 투입하여 혼합한 후, 400 께 속도로 하루동안 상온 교반하여 실시예 및 비교예의 반도체 패키지용 수지 조성물 (수지 바니시 )를 제조하였다. 구체적으로 상기 실시예에서 제조된 수지 조성물의 구체적인 조성은 하기 표 1에 기재된 바와 같고, 상기 비교예에서 제조된 수지 조성물의 구체적인 조성은 하기 표 2에 기재된 바와 같다. According to the composition of Table 1 and Table 2, each component was added to methyl ethyl ketone according to the solid content of 40% and mixed, and then stirred at room temperature at a rate of 400 days for 1 day to prepare a resin composition for a semiconductor package of Example and Comparative Example (resin Varnish) was prepared. Specifically, the specific composition of the resin composition prepared in Example is as shown in Table 1 below, and the specific composition of the resin composition prepared in Comparative Example is as shown in Table 2 below.
(2) 프리프레그, 금속박 적층판용 열경화성 수지 복합체 및 동박 적층판의 제조 상기 제조된 반도체 패키지용 수지 조성물(수지 바니시)을 두께 13_의 유리 섬유(Ni ttobo사 제조, T-gl ass #1010)에 함침시킨 후, 170 °C의 온도에서 2~5분간 열풍 건조하여 18//m의 프리프레그를 제조하였다. 상기에서 제조된 프리프레그 2매를 적층한후, 그 양면에 동박 (두께 12썬], Mi tsui사 제조)을 위치시켜 적층하고, 220 °C 및 35 kg/cuf의 조건으로 100분간 경화시켜 동박 적층판을 제조하였다. (2) Preparation of prepregs, thermosetting resin composites for metal foil laminates and copper foil laminates After impregnating the resin composition (resin varnish) for the semiconductor package prepared in 13_ glass fiber (T-gl ass # 1010, manufactured by Ni ttobo Co., Ltd.), hot-air dried at a temperature of 170 ° C for 2-5 minutes. A prepreg of 18 // m was prepared. After the two prepregs prepared above were laminated, copper foil (thickness 12 sun), manufactured by Mi tsui) was placed on both sides thereof, and laminated, and cured for 100 minutes under conditions of 220 ° C. and 35 kg / cuf. Laminates were prepared.
<실험예: 실시예 및 비교예에서 얻어진 반도체 패키지용 열경화성 수지 조성물, 프리프레그, 금속박 적층판용 열경화성 수지 복합체 및 동박 적층판의 물성 측정> <Experimental example: Measurement of physical properties of the thermosetting resin composition for semiconductor packages, the prepreg, the thermosetting resin composite for metal foil laminated sheets, and the copper foil laminated sheets obtained by the Example and the comparative example>
상기 실시예 및 비교예에서 얻어진 반도체 패키지용 열경화성 수지 조성물, 프리프레그, 금속박 적층판용 열경화성 수지 복합체 및 동박 적층판의 물성을 하기 방법으로 측정하였으며, 그 결과를 표 3에 나타내었다. 1. 열팽창계수 (CTE) The physical properties of the thermosetting resin composition for a semiconductor package, the prepreg, the thermosetting resin composite for a metal foil laminated sheet, and the copper foil laminated sheet obtained by the said Example and the comparative example were measured by the following method, and the result is shown in Table 3. 1. Coefficient of thermal expansion (CTE)
상기 실시예 및 비교예에서 얻어진 동박 적층판의 동박층을 에칭하여 제거한 후, MD방향으로 시험편을 제작하여, TMA(TA Instruments , Q400)를 이용하여 , 30。(:에서 260。(:까지, 승온 속도 10 °C/min조건으로 측정한후, 50 °C 에서 150 °C 범위의 측정값을 열팽창계수로 기록하였다. After etching and removing the copper foil layer of the copper foil laminated board obtained by the said Example and the comparative example, the test piece was produced in MD direction, and it heated up at 30 degrees (: to 260 degrees (:) up to 30 degrees using TMA (TA Instruments, Q400). After measuring at a rate of 10 ° C / min, the measured value in the range of 50 ° C to 150 ° C was recorded as the coefficient of thermal expansion.
이때, 동박 적층판의 동박층을 에칭하여 얻어진 결과물을 "금속박 적층판용 열경화성 수지 복합체"라고 칭하며, 이는 상술한 바와 같이 열경화성 수지 조성물을 열풍 건조하여 얻어진 프리프레그가 고온에서 경화하여 형성된 것이다. 2. 유리전이온도(Tg) At this time, the resultant obtained by etching the copper foil layer of the copper foil laminated sheet is called "the thermosetting resin composite for metal foil laminated sheets", which is formed by curing the prepreg obtained by hot air drying the thermosetting resin composition as described above. 2. Glass transition temperature (Tg)
상기 실시예 및 비교예에서 얻어진 동박 적층판의 동박층을 에칭하여 제거한 후, MD방향으로 시험편(금속박 적층판용 열경화성 수지 복합체)을 제작하고, DMA(TA Instruments , Q800)를 이용하여 인장모드로 5°C/분의 승온조건으로 25°C부터 300°C까지 측정하여 tan del ta의 피크 온도를 유리전이온도로 하였다. 3. 저장탄성률측정 (Storage Modulus) After etching and removing the copper foil layer of the copper foil laminated sheet obtained by the said Example and the comparative example, the test piece (thermosetting resin composite for metal foil laminated sheets) was produced in MD direction, and it was 5 degrees in tension mode using DMA (TA Instruments, Q800). The peak temperature of tan del ta was measured as the glass transition temperature by measuring from 25 ° C. to 300 ° C. under an elevated temperature condition of C / min. 3. Storage Modulus
상기 실시예 및 비교예에서 얻어진 동박 적층판의 동박층을 에칭하여 제거한 후, MD방향으로 시험편 (금속박 적층판용 열경화성 수지 복합체)을 제작하고, DMATA Instruments, Q800)를 이용하여 인장모드로 5。(;/분의 승온조건으로 25°C부터 300°C까지 저장탄성률을 측정하였다. After etching and removing the copper foil layer of the copper foil laminated board obtained by the said Example and the comparative example, the test piece (thermosetting resin composite for metal foil laminated boards) was produced in MD direction, and it was 5 degree (;;) in tension mode using DMATA Instruments, Q800). Storage modulus was measured from 25 ° C to 300 ° C at a temperature rise of / min.
4. 회로패턴 채움성 4. Filling of circuit pattern
상기 실시예 및 비교예에서 얻어진 프리프레그를, 회로패턴 (패턴높이 7m, 잔동률 50%)의 양면에 위치시키고, 그 위에 동박 (두께 12/zm,The prepregs obtained in the above examples and comparative examples are placed on both sides of the circuit pattern (pattern height 7 m, residual ratio 50%), and copper foil (thickness 12 / zm,
Mitsui사 제조)을 위치시켜, 220 °C 및 35 kg/cm2의 조건으로 100분간 프레스한 후, 양면의 동박을 에칭하여, 다음 기준 하에 회로패턴 채움성을 평가하였다. Mitsui Co., Ltd.) was placed, pressed for 100 minutes under conditions of 220 ° C. and 35 kg / cm 2 , and then the copper foils on both sides were etched, and the circuit pattern fillability was evaluated under the following criteria.
O : Void발생 없음 O: No void
X : Void발생 X: Void occurrence
5. 인장신율(Tensile Elongation)측정 5. Tensile Elongation Measurement
상기 실시예 및 비교예에서 얻어진 프리프레그를, 유리섬유의 MD 및 TD방향이 일치하도록 15매를 적층하여, 220 °C 및 35 kg/oif의 조건으로 100분간 프레스 한 후, IPC-TM-650 (2.4.18.3)에 따라, Universal Testing 15 sheets of the prepreg obtained in the above Examples and Comparative Examples were laminated so as to match the MD and TD directions of the glass fibers, and pressed for 100 minutes under conditions of 220 ° C and 35 kg / oif, followed by IPC-TM-650 According to (2.4.18.3), Universal Testing
MachineClnstron 3365)장비를 이용하여 MD방향의 인장신율을 측정하였다. Tensile elongation in the MD direction was measured using a MachineClnstron 3365).
6. 반도체 패키지의 휨 Ofarpage측정) 6. Measurement of warpage of semiconductor package)
상기 실시예 및 비교예에서 얻어진 동박 적층판에서 동박의 일부를 통상의 에칭법을 통해 배선을 가공하여 프린트배선판을 제조하였다 (두께 90·). 제조된 프린트배선판에 반도체칩 (11.5mm x 11.5mm x 두께 80um)을 탑재하여 반도체 패키지 (14.5mm x 14.5mm x 두께 390um)를 제조하였다. 제조된 반도체 패키지에 대하여 휨측정장치 (AKR0METRIX사 THERM0IRE PS100)을 이용하여 Shadow Moire측정이론에 근거하여 휨을 측정하였다. 휨은 상기의 반도체 패키지를 30°C에서 260°C까지 측정하고, 그 이후 30°C까지 냉각하였을 때, 휨의 최대값과 최소값의 차이로 구하였고, 다음과 같은 기준하에 반도체 패키지의 휨을 평가하였다. In the copper foil laminated sheet obtained by the said Example and the comparative example, a part of copper foil was processed through the normal etching method, and the printed wiring board was manufactured (thickness 90 *). A semiconductor package (14.5mm x 14.5mm x 390um) was manufactured by mounting a semiconductor chip (11.5mm x 11.5mm x thickness 80um) on the manufactured printed wiring board. For the semiconductor package, the warpage was measured on the basis of the Shadow Moire measurement theory using a warpage measuring device (Therm0ire PS100 by AKR0METRIX). Warpage measures the semiconductor package from 30 ° C. to 260 ° C. and thereafter When cooled to 30 ° C, the difference between the maximum value and the minimum value of the warpage was obtained, and the warpage of the semiconductor package was evaluated based on the following criteria.
O: 휨의 최대값과 최소값차이가 170um 이하 O : The difference between the maximum value and the minimum value of the warpage is 170um or less
X: 휩의 최대값과 최소값 차이가 170um 이상 X : The difference between the maximum and minimum value of whip is 170um or more
7. 열 응력 인자(Thermal Stress Factor) 계산 7. Calculation of Thermal Stress Factor
상기 얻어진 열팽창계수와 저장탄성율을 바탕으로 30°C에서 Based on the obtained thermal expansion coefficient and storage modulus at 30 ° C
260°C까지 1°C단위로 각 온도에서의 열팽창계수와 저장탄성률을 곱한 후, 모두 합하여 하기 일반식 1의 열 응력 인자(Thermal Stress Factor)을 측정(계산)하였다. After multiplying the coefficient of thermal expansion and the storage modulus at each temperature in units of 1 ° C. up to 260 ° C., all were combined to measure (calculate) the Thermal Stress Factor of the following general formula (1).
[일반식 1] [Formula 1]
열 응력 인자(Thermal Stress Factor , 단위 : MPa) Thermal Stress Factor (Unit: MPa)
. =J [저장탄성률(Storage Modulus) * 열팽창계수] dT . = J [Storage Modulus * Thermal expansion coefficient] dT
【표 1] [Table 1]
실시예의 반도체 패키지용 열경화성 수지 조성물의 조성 및 금속박 적층판용 열경화성 수지 복합체의 물성 확인 (단위: 당) Composition of thermosetting resin composition for semiconductor packages and physical properties of thermosetting resin composites for metal foil laminates of Examples (per unit)
2019/199033 1»(:1/10公019/004223 2019/199033 1 »(: 1/10 公 019/004223
【표 2】 Table 2
비교예의 반도체 패키지용 열경화성 수지 조성물와 조성 및 금속박 적층판용 열경화성 수지 복합체의 물성 확인 (단위: 용) Properties of Thermosetting Resin Compositions and Compositions for Semiconductor Packages of Comparative Examples and Thermosetting Resin Composites for Metal Foil Laminates (Unit: for)
* DDS: 4,4'-diaminodiphenyl sulfone * DDS: 4,4'-diaminodiphenyl sulfone
* TFB: 2,2'-bis(trifluoromethyl )benzidine; 2,2'- * TFB: 2,2'-bis (trifluoromethyl) benzidine; 2,2'-
Bis(trifluoromethyl )-4,4' -biphenyldiamine Bis (trifluoromethyl) -4,4 '-biphenyldiamine
* DDM: 4,4' -diaminodiphenyl methane * DDM: 4,4 '-diaminodiphenyl methane
* XD-1000: 에폭시 수지 (Nippon kayaku사) * XD-1000: epoxy resin (Nippon kayaku)
* NC-3000H: 에폭시 수지 (Nippon kayaku사) * NC-3000H: epoxy resin (Nippon kayaku)
* HP-6000: 에폭시 수지 (DIC사) * HP-6000 : Epoxy Resin (DIC Corporation)
* BM1-2300: 비스말레이미드계 수지 (DAIWA KA況I사) * BM1-2300 : Bismaleimide Resin (DAIWA KAVI)
* Acrylic rubber B(Mw 800,000): PARACR0N KG_3015P(Negami chemical industrial Co.,LTD사) * Acrylic rubber B (Mw 800,000): PARACR0N KG_3015P (Negami chemical industrial Co., LTD)
* Acrylic rubber C(Mw 600,000) : PARACR0N KG-3113(Negami chemical industrial Co.,LTD사) * Acrylic rubber C (Mw 600,000): PARACR0N KG-3113 (Negami chemical industrial Co., LTD)
* 당량비 : 하기 수학식 1을 통해 계산됨 * Equivalence Ratio: Calculated Through Equation 1
[수학식 1] [Equation 1]
열경화성 수지 대비 아민 화합물 당량비 Equivalent compound ratio of amine compound to thermosetting resin
= (DDS 의 총 활성수소 당량 + TFB의 총 활성수소 당량 + DDM의 총 활성수소 당량) / {(XD-1000의 총 에폭시 당량 + NC-3000H의 ¨ 에폭시 당량 + HP-6000의 총 에폭시 당량) + (BMI-2300의 총 말레이미드 당량)} 상기 수학식丄에서, DDS의 총 활성수소 당량은 의 총 중량(g)을 DDS의 활성수소 단위당량(62g/eq)으로 나눈 값이고, = (Total active hydrogen equivalent of DDS + total active hydrogen equivalent of TFB + total active hydrogen equivalent of DDM) / {(total epoxy equivalent of XD-1000 + ¨ epoxy equivalent of NC-3000H + total epoxy equivalent of HP-6000) + (Total maleimide equivalent of BMI-2300)} In the above formula, the total active hydrogen equivalent of DDS is the total weight in g divided by the unit equivalent of active hydrogen in DDS (62 g / eq),
TFB의 총 활성수소 당량은 TFB의 총 중량(g)을 TFB의 활성수소 단위당량(80g/eq)으로 나눈 값이고, The total active hydrogen equivalent of TFB is the total weight (g) of TFB divided by the unit equivalent of active hydrogen (80 g / eq) of TFB,
DDM의 총 활성수소 당량은 DDM의 총 중량(g)을 DDM의 활성수소 단위당량(49.5g/eq)으로 나눈 값이고, The total active hydrogen equivalent of DDM is the total weight of DDM divided by the unit equivalent of DDM (49.5 g / eq),
XD-1000의 총 에폭시 당량은 XD-1000의 총 중량(g)을 XD-1000의 에폭시 단위당량(253g/eq)으로 나눈 값이고, The total epoxy equivalent of the XD-1000 is the total weight (g) of the XD-1000 divided by the epoxy unit equivalent (253 g / eq) of the XD-1000.
NC-3000H의 총 에폭시 당량은 NC-3000H의 총 중량(g)을 NC-3000H의 에폭시 단위당량(290g/eq)으로 나눈 값이고, The total epoxy equivalent of NC-3000H is the total weight (g) of NC-3000H divided by the epoxy unit equivalent (290 g / eq) of NC-3000H.
HP-6000의 총 에폭시 당량은 HP-6000의 총 중량(g)을 HP-6000의 에폭시 단위당량(250g/eq)으로 나눈 값이고, BMI-2300의 총 말레이미드 당량은 BMI-2300의 총 중량 (g)을 BMI- 2300의 말레이미드 단위당량 ( 179g/eq)으로 나눈 값이다. 상기 표 1에 나타난 바와 같이 , 실시예와 같이 전자끌기 (Electron Wi thdrawing Group , CTG)를 갖는 아민 화합물을 포함한 프리프레그로부터 형성된 금속박 적층판용 열경화성 수지 복합체는 230°C 이하의 유리 전이 온도를 가지고, 10 ppm/°C 이하의 낮은 열팽창률을 가지면서도 우수한 회로패턴 채움성을 갖는다는 점이 확인되었다. The total epoxy equivalent of HP-6000 is the total weight of HP-6000 divided by the epoxy equivalent of HP-6000 (250 g / eq). The total maleimide equivalent of BMI-2300 is the total weight (g) of BMI-2300 divided by the maleimide equivalent of BMI-2300 (179 g / eq). As shown in Table 1, the thermosetting resin composite for a metal foil laminate formed from a prepreg containing an amine compound having an electron attracting (Electron Withdrawing Group, CTG) as in Example has a glass transition temperature of 230 ° C or less, It was confirmed that the circuit pattern fillability was excellent while having a low coefficient of thermal expansion of 10 ppm / ° C or less.
즉, 실시예와 같이 전자끌기 (Electron Wi thdrawing Group , EWG)를 갖는 아민 화합물 100 중량부 대비 290 중량부 이하의 열경화성 수지를 포함하고, 열경화성 수지 당량 기준 아민 화합물 당량비율인 당량비가 1.4 이상을 만족하면서, 무기 첨가제의 첨가량을 열경화성 수지, 열가소성 수지 및 아민 화합물의 총합 100중량부 대비 50 중량비에서 150 중량부의 무기 첨가제를 포함하는 경우, 반도체 패키징에 접합한 열적 특성, 우수한 저열팽창특성, 흐름성 및 기계적 물성을 확보할수 있음을 확인하였다. 한편, 실시예들에서 얻어진 각각의 금속박 적층판용 열경화성 수지 복합체에 대한 열 응력 인자가 21 Mpa 이하라는 점이 확인되는데, 이러한 열 응력 인자를 갖는 금속박 적층판용 열경화성 수지 복합체를 이용하여 제조된 반도체 패키지는 상대적으로 낮은 수준의 휨 (Warpage)만을 나타내는 것으로 확인되었다. That is, the thermosetting resin of 290 parts by weight or less relative to 100 parts by weight of the amine compound having an electron draw (EWG) as in the embodiment, and the equivalent ratio of the equivalent amine compound equivalent ratio based on the thermosetting resin equivalent satisfies 1.4 or more In the case where the amount of the inorganic additive is added in an amount of 150 parts by weight in an amount of 50 parts by weight based on 100 parts by weight of the total amount of the thermosetting resin, the thermoplastic resin and the amine compound, the thermal properties bonded to the semiconductor packaging, excellent low thermal expansion properties, flowability and It was confirmed that mechanical properties can be secured. On the other hand, it is confirmed that the thermal stress factor for each of the thermosetting resin composites for metal foil laminates obtained in the examples is 21 Mpa or less, and the semiconductor package manufactured using the thermosetting resin composites for metal foil laminates having such thermal stress factors is relatively As a result, only low levels of warpage were found.
이에 반해서, 비교예들에서 얻어진 각각의 금속박 적층판용 열경화성 수지 복합체에 대한 열 응력 인자가 25 Mpa 초과이며, 이러한 높은 열 응력 인자를 갖는 금속박 적층판용 열경화성 수지 복합체를 이용하여 제조된 반도체 패키지는 상대적으로높은 휩이 발생한다는 점이 확인되었다. On the contrary, the thermal stress factor of each of the thermosetting resin composites for metal foil laminates obtained in the comparative examples is greater than 25 Mpa, and the semiconductor package manufactured by using the thermosetting resin composites for metal foil laminates having such a high thermal stress factor is relatively high. It was confirmed that high whip occurred.
Claims
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| US16/764,831 US12091510B2 (en) | 2018-04-10 | 2019-04-09 | Thermosetting resin composite and metal clad laminate using the same |
| JP2020526329A JP7078215B2 (en) | 2018-04-10 | 2019-04-09 | Thermosetting resin composite for metal leaf laminated board and metal leaf laminated board |
| CN201980005842.7A CN111372997B (en) | 2018-04-10 | 2019-04-09 | Thermosetting resin composite material for metal clad laminate and metal clad laminate using same |
| EP19784661.1A EP3750957B1 (en) | 2018-04-10 | 2019-04-09 | Thermosetting resin composite for metal clad laminate and metal clad laminate |
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| KR10-2018-0071076 | 2018-06-20 | ||
| KR1020190036078A KR102245724B1 (en) | 2018-06-20 | 2019-03-28 | Thermosetting resin composite for metal clad laminate and metal clad laminate using the same |
| KR1020190036079A KR102246974B1 (en) | 2018-04-10 | 2019-03-28 | Resin composition for semiconductor package, prepreg and metal clad laminate using the same |
| KR10-2019-0036078 | 2019-03-28 | ||
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