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WO2018196303A1 - Procédé et appareil d'étalonnage de projecteur fondés sur une projection multidirectionnelle - Google Patents

Procédé et appareil d'étalonnage de projecteur fondés sur une projection multidirectionnelle Download PDF

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Publication number
WO2018196303A1
WO2018196303A1 PCT/CN2017/107275 CN2017107275W WO2018196303A1 WO 2018196303 A1 WO2018196303 A1 WO 2018196303A1 CN 2017107275 W CN2017107275 W CN 2017107275W WO 2018196303 A1 WO2018196303 A1 WO 2018196303A1
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Prior art keywords
target
projector
calibration
feature point
phase
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Ceased
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PCT/CN2017/107275
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English (en)
Chinese (zh)
Inventor
彭翔
张雅琴
刘晓利
杨洋
蔡泽伟
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Shenzhen University
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Shenzhen University
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/002—Measuring arrangements characterised by the use of optical techniques for measuring two or more coordinates
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/2433—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures for measuring outlines by shadow casting

Definitions

  • the invention belongs to the field of optical measurement technology, and in particular relates to a projector calibration method and device for multi-directional projection.
  • the calibration technology of 3D imaging system is a very important step in 3D imaging.
  • the projector calibration technology in 3D digital imaging is a method for estimating the fixed internal parameters of the projector in 3D imaging system.
  • the projector calibration technology is 3D imaging technology provides important 3D imaging conditions, and better calibration techniques and methods provide better imaging conditions for 3D imaging.
  • three-dimensional imaging systems can be divided into two categories, one is a three-dimensional imaging system consisting of a single camera and a single projector, and the other is a system consisting of a dual camera and a single projector.
  • the first type of system has a simple structure, fast measurement speed, and high measurement efficiency, but its imaging system must involve calibration of the camera and projector.
  • the calibration technology of the camera has been developed more maturely, but the projector is not.
  • the biggest difficulty is that the projector is not an imaging device and therefore cannot capture images. How to accurately acquire the coordinates of the feature points in the image coordinate system of the projector is to be solved. A big problem.
  • the phase method is commonly used to calibrate the projector.
  • the phase method is specifically: projecting the phase coded map to the target plane, and using phase demodulation technology to obtain the phase of the target feature point, and then obtaining the corresponding projector image coordinate system. coordinate of.
  • This method considers nonlinear distortion and does not need to use the calibration result of the camera; however, on the one hand, the method has the problem of inaccurate image extraction of feature points; on the other hand, the three-dimensional world coordinate X of the target feature point is As a known quantity input, the deviation between it and its real coordinates (due to various factors such as the target is not ideal plane, three-dimensional point printing error, etc.) will introduce systematic errors and reduce the reliability of the calibration result.
  • the invention provides a multi-directional projection projector calibration method and device, aiming at solving the inaccurate extraction of feature points and the deviation between the three-dimensional world coordinates of the target feature points and the real values by using the phase method for calibration.
  • the introduction of systematic errors makes the calibration results more accurate.
  • the invention provides a projector calibration method for multi-directional projection, the projector calibration method is applied to a projector calibration system, the projector calibration system comprises: a projector, a camera and a target, the camera is located in the Above the target, and the optical axis of the camera is perpendicular to the plane of the target; the projector calibration method includes:
  • Step S1 using the projector to sequentially project a preset calibration pattern to the target plane in N specified orientations preset around the target, and collecting the target information map by using the camera in each specified orientation;
  • Step S2 performing feature point extraction on the target information map in each specified azimuth to obtain the position of the target feature point in the camera image coordinate system, and obtaining the phase distribution of the target information map by using the phase demodulation technique, combined with the target feature
  • the initial calibration parameters include: N external reference ⁇ 1 , ⁇ 2 ⁇ ⁇ N composed of a projector and a target, and a projector internal parameter ⁇ ;
  • step S4 the initial calibration parameter and the three-dimensional world coordinate X are optimized by a beam adjustment method to obtain a final calibration parameter.
  • the preset N specified orientations need to be satisfied: the calibration pattern projected by the projector in the preset N specified orientations is focused on the target plane.
  • the preset calibration pattern includes: a plurality of sinusoidal phase shift diagrams and a plurality of Gray code maps;
  • the target information map includes: a plurality of phase shift maps containing target information and a plurality of targets Gray code map of the information.
  • the precise phase based on the target feature points Obtaining a sub-pixel coordinate x i corresponding to the target feature point in the projector image coordinate system, including:
  • the sub-pixel coordinates x i corresponding to the target feature points are calculated by the following formula
  • the beam adjustment method is specifically: assuming that there are M target feature points in each specified orientation, and the initial calibration parameters and the target feature points are minimized by minimizing the objective function.
  • the objective function is:
  • x ij represents the sub-pixel coordinates obtained by image processing of the jth target feature point in the target information map of the i-th orientation
  • the present invention also provides a multi-directional projection projector calibration device, the projector calibration device being applied to a projector calibration system, the projector calibration system comprising: a projector, a camera and a target, the camera is located at the Above the target, and the optical axis of the camera is perpendicular to the plane of the target; the projector calibration device includes:
  • a projection acquisition module configured to use the projector to sequentially project a preset calibration pattern to a target plane in N specified orientations preset around the target, and collect the target information map by using the camera in each specified orientation;
  • the initial calibration parameters include: N external reference ⁇ 1 , ⁇ 2 ⁇ ⁇ N composed of a projector and a target, and a projector internal parameter ⁇ ;
  • an optimization module configured to optimize the initial calibration parameter and the three-dimensional world coordinate X by using a beam adjustment method to obtain a final calibration parameter.
  • the preset N specified orientations need to be satisfied: the calibration pattern projected by the projector in the preset N specified orientations is focused on the target plane.
  • the preset calibration pattern includes: a plurality of sinusoidal phase shift diagrams and a plurality of Gray code maps;
  • the target information map includes: a plurality of phase shift maps containing target information and a plurality of targets Gray code map of the information.
  • the feature point information acquiring module includes:
  • the precise phase determining module is configured to perform feature point extraction on the target information map in each specified azimuth to obtain a position of the target feature point in the camera image coordinate system, and obtain a phase distribution of the target information map by using a phase demodulation technique. Combine the position of the target feature point with the phase distribution of the target information map, and obtain the precise phase of the target feature point through sub-pixel interpolation calculation.
  • a sub-pixel determination module configured to calculate a sub-pixel coordinate x i corresponding to the target feature point according to a mapping relationship between sub-pixel coordinates and a phase of the target feature point in the projector image coordinate system ;
  • the objective function is:
  • x ij represents the sub-pixel coordinates obtained by image processing of the jth target feature point in the target information map of the i-th orientation
  • the present invention has the beneficial effects that the multi-azimuth projection projector calibration method and apparatus provided by the present invention are based on a phase method, and on the one hand, projections are respectively performed in N specified orientations by a projector, and The camera optical axis is perpendicular to the target plane to collect the target information map, so that the feature point image extraction is more accurate; on the other hand, the invention adopts the beam adjustment method to take the three-dimensional world coordinate X of the target feature point as the to-be-optimized
  • the variables are optimized to eliminate the systematic error introduced by the deviation between the 3D world coordinate X of the target feature point and its real coordinates, and adjust X to a higher reliability value during beam adjustment optimization, thus The calibration results are more accurate.
  • FIG. 1 is a schematic diagram of hardware modules in a projector calibration system according to an embodiment of the present invention
  • FIG. 2 is a schematic flow chart of a multi-directional projection projector calibration method according to an embodiment of the present invention
  • FIG. 3 is a diagram of a 11*9 circular marker point target according to an embodiment of the present invention.
  • FIG. 4 is a sub-pixel coordinate diagram of a target feature point in a camera image coordinate system in a specified orientation according to an embodiment of the present invention
  • FIG. 5 is a sub-pixel coordinate diagram of a target feature point in a projector image coordinate system in a specified orientation according to an embodiment of the present invention
  • FIG. 6 is a schematic diagram of a principle of a calibration model provided by an embodiment of the present invention.
  • FIG. 7 is a re-projection error diagram of the projector after initial calibration according to an embodiment of the present invention.
  • FIG. 8 is a re-projection error diagram of the projector after the adjustment is optimized according to an embodiment of the present invention.
  • FIG. 9 is a schematic block diagram of a multi-directional projection projector calibration apparatus according to an embodiment of the present invention.
  • the invention provides a multi-directional projection projector calibration method.
  • the projector calibration method is applied to a projector calibration system.
  • the projector calibration system comprises: a projector, a camera and a target.
  • the camera is positioned above the target and the optical axis of the camera is perpendicular to the plane of the target.
  • N suitable projection orientations need to be determined around the target plane such that when performing the calibration step, the projector respectively projects the calibration pattern at the preset N specified orientations;
  • it is necessary to adjust the positional relationship between the camera and the target so that the optical axis of the camera is perpendicular to the target plane, thereby ensuring that the target is imaged at the optimal shooting position of the camera.
  • the method for determining the N specified orientations is: adjusting the focal length of the projector when determining the first specified orientation, and ensuring that the projected pattern can be focused on the target plane
  • the specific operation step is: placing on the target plane A piece of white paper, adjust the projector's focus knob, so that the cast pattern can be placed on the white paper to form a clear pattern; in addition, to ensure that the target can be fully covered by the cast pattern.
  • N-1 specified orientations are determined around the target plane, and in each of the remaining specified orientations, it is necessary to ensure that the target can be completely covered by the projected pattern and within the depth of field of the projector. Among them, N ⁇ 3.
  • the positional relationship between the camera and the target is adjusted by placing the target on the test bench.
  • the camera is placed above the target, and the optical axis of the camera is placed perpendicular to the target plane, and the field of view, the aperture and the focal length of the camera are adjusted to make the target image clear; the positional relationship between the camera and the target makes the extraction target
  • the phase value of the target feature point is more accurate, and the sub-pixel position in the projector image coordinate system corresponding to the target feature point is more accurate.
  • the projector adopts DELL DLP (Digital Light Processing), model M110, standard resolution 1280*800;
  • the camera adopts IMAVISION industrial digital camera, model MER-130 -30UM, resolution 1280*1024, pixel size 5.2 ⁇ m*5.2 ⁇ m, camera lens using PENTAX industrial lens, model C1614-M.
  • Step S1 using the projector to sequentially project a preset calibration pattern to the target plane in N specified orientations preset around the target, and collecting the target information map by using the camera in each specified orientation;
  • the preset calibration pattern includes: a plurality of sinusoidal phase shift patterns and a plurality of Gray code patterns
  • the target information map includes: a plurality of phase shift maps containing target information.
  • several Gray code maps containing target information in addition, the camera collects the original target image when the projector only projects uniform illumination.
  • a 11*9 circular marker point target is used.
  • the feature point is the center of the circular pattern, and a total of 99 feature points.
  • Step S2 performing feature point extraction on the target information map in each specified azimuth to obtain the position of the target feature point in the camera image coordinate system, and obtaining the phase distribution of the target information map by using the phase demodulation technique, combined with the target feature
  • the target information map in each specified orientation is processed. Specifically, the processing is divided into three parts: one is that the target feature points are obtained by the feature point extraction in the camera.
  • the position in the image coordinate system, as shown in Fig. 4 is the position of the target feature point in the camera image coordinate system obtained under a certain orientation; the second is to obtain the phase distribution of the target information map by phase demodulation technique.
  • the third is to combine the position of the target feature point with the phase distribution of the target information map, and obtain the precise phase of the target feature point through sub-pixel interpolation calculation.
  • the initial calibration parameters include: N external reference ⁇ 1 , ⁇ 2 ⁇ ⁇ N composed of a projector and a target, and a projector internal parameter ⁇ .
  • the schematic diagram of the calibration model provided by the embodiment of the present invention is shown in FIG. 6
  • the re-projection error after calibration is shown in FIG. 7;
  • the distribution and standard deviation of the re-projection error are important criteria for evaluating the calibration result, generally
  • the re-projection error of the feature points is concentrated around the origin, and the smaller the standard deviation of the re-projection errors, the more accurate the calibration result is.
  • step S4 the initial calibration parameter and the three-dimensional world coordinate X are optimized by a beam adjustment method to obtain a final calibration parameter.
  • the beam adjustment method is specifically: assuming that there are M target feature points in each specified orientation, and the initial calibration parameters and the target feature points are minimized by minimizing the objective function.
  • the objective function is:
  • x ij represents the sub-pixel coordinates obtained by image processing of the jth target feature point in the target information map of the i-th orientation
  • the re-projection error after calibration is shown in Figure 8, and Figure 7 Compared to the improvement.
  • the Reprojector Error distribution is as shown in FIG. 8, and the standard deviations in the horizontal and vertical directions are 0.02541 pixel, respectively. And 0.01926pixel; and only the initial calibration, the standard deviation of the horizontal and vertical directions are 0.11119pixel and 0.08406pixel, respectively, as shown in Figure 7; thus can be seen that the improved calibration accuracy can reach 77%.
  • a projector calibration device for multi-directional projection is described below.
  • the projector calibration device is applied to a projector calibration system.
  • the projector calibration system includes: a projector, a camera, and a target, and the camera is located at the standard Above the target, and the optical axis of the camera is perpendicular to the plane of the target;
  • the projector calibration device includes:
  • the projection acquisition module 1 is configured to sequentially project a preset calibration pattern to a target plane by using the projector in sequence with N specified presets around the target, and collect the target information map by using the camera in each specified orientation;
  • the preset N specified orientations need to be satisfied: the calibration pattern projected by the projector in the preset N specified orientations is focused on the target plane.
  • the preset calibration pattern includes: a plurality of sinusoidal phase shift diagrams and a plurality of Gray code maps;
  • the target information map includes: a plurality of phases containing target information The shift map and several Gray code maps containing the target information; in addition, the camera collects the original target map when the projector only projects uniform illumination.
  • the feature point information acquiring module 2 specifically includes: an accurate phase determining module, configured to perform feature point extraction on the target information map in each specified azimuth to obtain a position of the target feature point in the camera image coordinate system,
  • the phase demodulation technique is used to obtain the phase distribution of the target information map, the position of the target feature point and the phase distribution of the target information map are combined, and the precise phase of the target feature point is obtained through sub-pixel interpolation calculation.
  • the method further includes a sub-pixel determination module, configured to calculate a sub-pixel coordinate corresponding to the target feature point according to a mapping relationship between a sub-pixel coordinate and a phase of the target feature point in the projector image coordinate system, that is, using the following formula x i ;
  • the initial calibration parameters include: N external reference ⁇ 1 , ⁇ 2 ⁇ ⁇ N composed of a projector and a target, and a projector internal parameter ⁇ ;
  • the optimization module 4 is configured to optimize the initial calibration parameter and the three-dimensional world coordinate X by using a beam adjustment method to obtain a final calibration parameter.
  • the objective function is:
  • x ij represents the sub-pixel coordinates obtained by image processing of the jth target feature point in the target information map of the i-th orientation
  • the multi-azimuth projection projector calibration method and device provided by the invention are based on the phase method, but are superior to the general phase method.
  • the problem of inaccurate image extraction of feature points is solved; on the other hand, the target is solved.
  • the problem that there is a deviation between the three-dimensional world coordinates of the target feature points and the real value is different from the generalized optimization objective function.
  • All or part of the steps in the above embodiments are controlled by a program to control related hardware, and the program may be stored in a computer readable storage medium, such as a ROM/RAM, a magnetic disk, an optical disk, or the like. .

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Projection Apparatus (AREA)
  • Transforming Electric Information Into Light Information (AREA)

Abstract

L'invention concerne un procédé d'étalonnage de projecteur fondé sur une projection multidirectionnelle se rapportant au domaine technique de la mesure optique. Le procédé comprend : étape S1, l'utilisation d'un projecteur (1) afin de projeter un motif d'étalonnage prédéfini sur un plan cible dans N directions spécifiées prédéfinies autour d'une cible (3) en séquence, et la collecte d'un graphe d'informations cible à l'aide d'une caméra (2) dans chaque direction spécifiée; étape S2, le traitement du graphe d'informations cible collecté dans chaque direction spécifiée, l'obtention d'une valeur de phase précise d'un point caractéristique cible au moyen d'un calcul puis l'obtention d'une coordonnée de sous-pixel, correspondant au point caractéristique cible, dans un système de coordonnées d'image du projecteur (1); étape S3, l'utilisation des coordonnées de sous-pixel obtenues dans le système de coordonnées d'image du projecteur (1) et d'une coordonnée du monde tridimensionnel connue X du point caractéristique cible afin d'étalonner le projecteur (1) afin d'acquérir un paramètre d'étalonnage initial; et étape S4, l'utilisation d'un réglage de faisceau afin d'optimiser le paramètre d'étalonnage initial et la coordonnée du monde tridimensionnel X afin d'obtenir un paramètre d'étalonnage final. Le procédé d'étalonnage permet d'obtenir un résultat d'étalonnage final plus précis.
PCT/CN2017/107275 2017-04-28 2017-10-23 Procédé et appareil d'étalonnage de projecteur fondés sur une projection multidirectionnelle Ceased WO2018196303A1 (fr)

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CN201710310142.1A CN107270810B (zh) 2017-04-28 2017-04-28 多方位投影的投影仪标定方法及装置

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* Cited by examiner, † Cited by third party
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CN110319852A (zh) * 2019-05-23 2019-10-11 上海机电工程研究所 基于三轴转台的屏幕投影式光学目标模拟系统校准方法
EP4001836A3 (fr) * 2020-11-11 2022-07-13 Volume Graphics GmbH Procédé mis en uvre par ordinateur permettant de déterminer une valeur d'un paramètre géométrique

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CN107270810B (zh) * 2017-04-28 2018-06-22 深圳大学 多方位投影的投影仪标定方法及装置
CN109003308B (zh) * 2018-06-27 2022-03-18 浙江大学 一种基于相位编码的特殊成像范围相机标定系统及方法
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Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1888814A (zh) * 2006-07-25 2007-01-03 深圳大学 三维主动视觉传感器的多视点姿态估计和自标定方法
US20090009658A1 (en) * 2007-07-02 2009-01-08 Richard Aufranc Calibrating a projection system
CN101763643A (zh) * 2010-01-07 2010-06-30 浙江大学 一种结构光三维扫描仪系统自动标定方法
CN101799924A (zh) * 2010-03-09 2010-08-11 哈尔滨工业大学 借助ccd照相机对投影仪进行标定的方法
CN102654391A (zh) * 2012-01-17 2012-09-05 深圳大学 基于光束平差原理的条纹投影三维测量系统及其标定方法
CN107270810A (zh) * 2017-04-28 2017-10-20 深圳大学 多方位投影的投影仪标定方法及装置

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1888814A (zh) * 2006-07-25 2007-01-03 深圳大学 三维主动视觉传感器的多视点姿态估计和自标定方法
US20090009658A1 (en) * 2007-07-02 2009-01-08 Richard Aufranc Calibrating a projection system
CN101763643A (zh) * 2010-01-07 2010-06-30 浙江大学 一种结构光三维扫描仪系统自动标定方法
CN101799924A (zh) * 2010-03-09 2010-08-11 哈尔滨工业大学 借助ccd照相机对投影仪进行标定的方法
CN102654391A (zh) * 2012-01-17 2012-09-05 深圳大学 基于光束平差原理的条纹投影三维测量系统及其标定方法
CN107270810A (zh) * 2017-04-28 2017-10-20 深圳大学 多方位投影的投影仪标定方法及装置

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110319852A (zh) * 2019-05-23 2019-10-11 上海机电工程研究所 基于三轴转台的屏幕投影式光学目标模拟系统校准方法
CN110319852B (zh) * 2019-05-23 2021-06-22 上海机电工程研究所 基于三轴转台的屏幕投影式光学目标模拟系统校准方法
EP4001836A3 (fr) * 2020-11-11 2022-07-13 Volume Graphics GmbH Procédé mis en uvre par ordinateur permettant de déterminer une valeur d'un paramètre géométrique

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