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WO2018174906A1 - Atténuation de saturation de circuit photodétecteur pour impulsions magnéto-optiques de haute intensité - Google Patents

Atténuation de saturation de circuit photodétecteur pour impulsions magnéto-optiques de haute intensité Download PDF

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Publication number
WO2018174906A1
WO2018174906A1 PCT/US2017/024168 US2017024168W WO2018174906A1 WO 2018174906 A1 WO2018174906 A1 WO 2018174906A1 US 2017024168 W US2017024168 W US 2017024168W WO 2018174906 A1 WO2018174906 A1 WO 2018174906A1
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WO
WIPO (PCT)
Prior art keywords
optical
switch
magneto
photocomponent
center material
Prior art date
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Ceased
Application number
PCT/US2017/024168
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English (en)
Inventor
Kenneth Michael JACKSON
Gregory Scott Bruce
Wilbur Lew
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Lockheed Martin Corp
Original Assignee
Lockheed Corp
Lockheed Martin Corp
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Filing date
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Application filed by Lockheed Corp, Lockheed Martin Corp filed Critical Lockheed Corp
Priority to PCT/US2017/024168 priority Critical patent/WO2018174906A1/fr
Publication of WO2018174906A1 publication Critical patent/WO2018174906A1/fr
Anticipated expiration legal-status Critical
Ceased legal-status Critical Current

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
    • G01R33/032—Measuring direction or magnitude of magnetic fields or magnetic flux using magneto-optic devices, e.g. Faraday or Cotton-Mouton effect
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/20—Arrangements or instruments for measuring magnetic variables involving magnetic resonance
    • G01R33/28—Details of apparatus provided for in groups G01R33/44 - G01R33/64
    • G01R33/32—Excitation or detection systems, e.g. using radio frequency signals
    • G01R33/323—Detection of MR without the use of RF or microwaves, e.g. force-detected MR, thermally detected MR, MR detection via electrical conductivity, optically detected MR
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/20—Arrangements or instruments for measuring magnetic variables involving magnetic resonance
    • G01R33/60—Arrangements or instruments for measuring magnetic variables involving magnetic resonance using electron paramagnetic resonance

Definitions

  • Magneto-optical defect center materials such as diamonds, Silicon Carbide (SiC), etc. can have sensitivity for magnetic field measurement and enable fabrication of small magnetic sensors.
  • the sensing capabilities of magneto-optical defect center material e.g., a diamond nitrogen vacancy (DNV)) sensors may be maintained at room temperature and atmospheric pressure.
  • Magneto-optical defect center material sensing allows measurement of 3-D vector magnetic fields.
  • the application of a high power laser to increase the optical source output power can result in saturation of the photodetector circuit and the photodetector which, thereby, decreases the speed at which the magneto-optical defect center material can "reset" to a maximum polarization between an excited triplet state and a ground state.
  • Some embodiments relate to a system that may comprise: a magneto-optical defect center material, a first optical excitation source configured to provide a first optical excitation to the magneto-optical defect center material, a second optical excitation source configured to provide a second optical excitation to the magneto-optical defect center material, and an optical detection circuit comprising a photocomponent, the optical detection circuit configured to activate a switch between a disengaged state and an engaged state, receive, via the second optical excitation source, a light signal comprising a high intensity signal provided by the second optical excitation source, and cause at least one of the photocomponent or the optical detection circuit to operate in a non-saturated state responsive to the activation of the switch.
  • Some embodiments relate to an apparatus that may comprise at least one processor and at least one memory storing computer program code, the at least one memory and the computer program code configured to, with the processor, cause the apparatus to at least: activate a switch between a disengaged state and an engaged state, receive, via a second optical excitation source, a light signal comprising a high intensity signal provided by the second optical excitation source, wherein the second optical excitation source is configured to provide optical excitation to a magneto-optical defect center material, and cause at least one of a photocomponent or an optical detection circuit to operate in a non-saturated state responsive to the activation of the switch.
  • the controller may be configured to: activate a switch between a disengaged state and an engaged state, and activate an optical excitation source configured to provide optical excitation to a magneto-optical defect center material responsive to the activation of the switch, wherein the switch is configured to cause at least one of a photocomponent or an optical detection circuit to operate in a non-saturated state.
  • Some embodiments relate to a method that may comprise: activating a switch between a disengaged state and an engaged state, receiving, via a second optical excitation source, a light signal comprising a high intensity signal provided by the second optical excitation source, wherein the second optical excitation source is configured to provide optical excitation to a magneto-optical defect center material, and causing at least one of a photocomponent or an optical detection circuit to operate in a non-saturated state responsive to the activation of the switch.
  • Figure 1 illustrates an orientation of an NV center in a diamond lattice.
  • Figure 2 illustrates an energy level diagram with energy levels of spin states for an NV center.
  • Figure 3 is a schematic block diagram of some embodiments of a circuit saturation mitigation system.
  • Figure 4 is a schematic block diagram of some embodiments of an optical detection circuit.
  • Figure 5 is a schematic block diagram of some embodiments of system for a circuit saturation mitigation system.
  • Figure 6a is a diagram of the power output of a low intensity light signal according to some embodiments.
  • Figure 6b is a diagram of the power output of a high intensity light signal according to some embodiments.
  • Figure 6c is a diagram of the voltage output according to some embodiments.
  • Figure 6d is a diagram of the voltage output according to some embodiments.
  • Figure 7 is a diagram of the voltage output of an optical detection circuit according to some embodiments.
  • Figure 8 is a diagram of the voltage output of an optical detection circuit according to some embodiments.
  • Some embodiments disclosed herein relate to a system including a magneto-optical defect center material, a first optical excitation source configured to provide a first optical excitation to the magneto-optical defect center material, a second optical excitation source configured to provide a second optical excitation to the magneto-optical defect center material, and an optical detection circuit.
  • the optical detection circuit which includes a photocomponent, (e.g., a photodetector) may be configured to activate a switch between a disengaged state and an engaged state, receive, via the second optical excitation source, a light signal including a high intensity signal provided by the second optical excitation source, and cause at least one of the photocomponent or the optical detection circuit to operate in a non-saturated state responsive to the activation of the switch.
  • the second optical excitation source rapidly illuminates the magneto-optical defect center material with light to re-polarize the magneto-optical defect center material without loss of sensitivity.
  • NV center its electronic structure, and optical and RF interaction
  • the nitrogen vacancy (NV) center in a magneto-optical defect center material comprises a substitutional nitrogen atom in a lattice site adjacent a carbon vacancy as shown in Figure 1.
  • the NV center may have four orientations, each corresponding to a different crystallographic orientation of the diamond lattice.
  • the NV center may exist in a neutral charge state or a negative charge state.
  • the neutral charge state uses the nomenclature NV0, while the negative charge state uses the nomenclature NV, which is adopted in this description.
  • the NV center has a number of electrons including three unpaired electrons, one from each of the three carbon atoms adjacent to the vacancy, and a pair of electrons between the nitrogen and the vacancy.
  • the NV center which is in the negatively charged state, also includes an extra electron.
  • the optical transitions between the ground state 3 A 2 and the excited triplet 3 E are predominantly spin conserving, meaning that the optical transitions are between initial and final states which have the same spin.
  • a photon of red light may be emitted with a photon energy corresponding to the energy difference between the energy levels of the transitions.
  • the circuit saturation mitigation system 300 includes a first optical excitation source 310, second optical excitation source 315, a magneto- optical defect center material 305, a RF excitation source 320, and an optical detection circuit 340.
  • the first and second optical excitation sources 310, 315 direct or otherwise provide optical excitation to the magneto-optical defect center material 305.
  • the RF excitation source 320 provides RF radiation to the magneto-optical defect center material 305.
  • Light from the magneto- optical defect center material e.g., diamonds, Silicon Carbide (SiC), etc.
  • the circuit saturation mitigation system may instead employ different magneto-optical defect center materials, with a plurality of magneto-optical defect centers.
  • Magneto-optical defect center materials include, but are not limited to, diamonds, Silicon Carbide (SiC) and other materials with nitrogen, boron, or other defect centers.
  • the electronic spin state energies of the magneto-optical defect centers shift with magnetic field, and the optical response, such as fluorescence, for the different spin states may not be the same for all of the different spin states.
  • the magnetic field may be determined based on optical excitation, and possibly RF excitation, in a corresponding way to that described above with magneto-optical defect center material.
  • the RF excitation source 320 may take the form of a microwave coil.
  • the first and second optical excitation sources 310, 315 may take the form of a laser (e.g., a high power laser, low power laser, etc.), light emitting diode, etc. for example, which emits light in the green (e.g., a light signal having a wavelength Wl such that the color is green).
  • the first and second optical excitation sources 310, 315 induces fluorescence in the red (e.g., the wavelength W2), which corresponds to an electronic transition from the excited state to the ground state.
  • Light from the magneto-optical defect center material 305 may be directed through an optical filter to filter out light in the excitation band (e.g., in the green), and to pass light in the red fluorescence band, which in turn may be detected by the optical detection circuit 340.
  • the circuit saturation mitigation system 300 further includes the optical detection circuit 340.
  • the optical detection circuit 340 includes a
  • the optical detection circuit 340 may be configured to receive, via the photocomponent 420, a first optical excitation provided by the first optical excitation source 310 (e.g., a low power laser).
  • the first optical excitation source 310 may provide the first optical excitation to the magneto-optical defect center material 305.
  • the first optical excitation may include a light signal configured to provide a continuous optical illumination (e.g., a low intensity light signal 610 as illustrated in Figure 6a) of the magneto- optical defect center material 305.
  • the low power laser may continuously illuminate the magneto-optical defect center material 305 for a period of time. Accordingly, the
  • photocomponent 420 receives the first optical excitation (e.g., a light signal that provides the continuous optical illumination) provided by the first optical excitation source 310 over the period of time.
  • the photocomponent 420 receives the induced fluorescence provided by the magneto-optical defect center material 305.
  • the optical detection circuit 340 may be configured to receive, via the photocomponent 420, a light signal provided via the second optical excitation source 315 (e.g., a high power laser).
  • the second optical excitation source 315 may provide a light signal configured to operate according to or otherwise provide a pulsed optical illumination 620 (as illustrated in Figure 6b) to the magneto-optical defect center material 305.
  • the high power laser may provide a high intensity pulsed illumination to the magneto-optical defect center material 305 for a predetermined period of time (e.g., a predetermined period of time that may be less than the period of time during which the first optical detection circuit illuminates the magneto-optical defect center material).
  • the photocomponent 420 receives the second optical excitation (e.g., via a light signal that provides the high intensity pulsed illumination) provided by the second optical excitation source 315 during the predetermined period of time.
  • the photocomponent 420 converts the light signal received into current (A) or voltage (V).
  • the optical detection circuit 340 includes a switch 410.
  • the switch 410 may be disposed in the feedback path to control the output voltage, transimpedence gain, and/or the flow of current, to reduce distortion, etc., of the optical detection circuit 340 and/or the photocomponent 420.
  • the switch 410 may take the form of a speed switch, relay, proximity switch, or any other switch configured to detect or otherwise sense optical or magnetic motion.
  • the switch 410 e.g., a high speed relay
  • reduces the load e.g., the amount of electrical power utilized or consumed
  • the photocomponent 420 e.g., a photodetector
  • the switch 410 includes electronic circuits configured to move between an engaged state (e.g., a state during which the switch may be turned on or may be otherwise closed) and a disengaged state (e.g., a state during which the switch may be turned off or may be otherwise open).
  • an engaged state e.g., a state during which the switch may be turned on or may be otherwise closed
  • a disengaged state e.g., a state during which the switch may be turned off or may be otherwise open.
  • the switch 410 may activate or otherwise move between the engaged state and disengaged state responsive to a light signal (e.g., a high intensity light signal) or magnetic field sensed.
  • a light signal e.g., a high intensity light signal
  • the switch 410 may activate in response to a command generated via at least one of a controller (e.g., the controller 550 shown in Figure 5 as described herein below) or an on-board diagnostics system (OBDS).
  • OBDS on-board diagnostics system
  • the flow of current or voltage may be uninterrupted, while the flow of current or voltage may be interrupted in the disengaged state.
  • the switch 410 moves from the disengaged state (e.g., the flow of current or voltage may be interrupted) to the engaged state (e.g., the flow of current or voltage may be uninterrupted) and, thereby, turns on or may be otherwise closed.
  • the disengaged state e.g., the flow of current or voltage may be interrupted
  • the engaged state e.g., the flow of current or voltage may be uninterrupted
  • the switch 410 may be disengaged or otherwise deactivated via at least one of the controller (e.g., the controller 550 shown in Figure 5 as described herein below) or the on-board diagnostics system.
  • the switch 410 moves from the engaged state (e.g., the flow of current or voltage may be uninterrupted) to the disengaged state (e.g., the flow of current or voltage may be interrupted) and, thereby, turns off or may be otherwise opened.
  • the switch 410 in the feedback path prevents the optical detection circuit 340 and/or the photocomponent 420 from experiencing a delay when returning to the level of voltage output prior to the application of the second optical excitation source 315 (e.g., the high power laser) since the optical detection circuit 340 and/or the photocomponent 420 are in a non-saturated state as described with reference to Figure 6c.
  • the repolarization time and/or the reset time corresponding to the magneto-optical defect center material 305 may be reduced resulting in the operability of the photocomponent 420 and/or the optical detection circuit 340 at a higher bandwidth without signal attenuation.
  • a delay occurs when the photocomponent 420 and/or the optical detection circuit 340 begins to return to the level of voltage output prior to the application of the second optical excitation source 315 when the photocomponent 420 and/or the optical detection circuit 340 may be saturated.
  • the optical detection circuit 340 further includes an amplifier 430 configured to amplify the voltage provided by the photocomponent 420.
  • the amplifier may take the form of an operational amplifier, fully differential amplifier, negative feedback amplifier, instrumentation amplifier, isolation amplifier, or other amplifier.
  • the photocomponent 420, switch 410, resistor 440, or a combination thereof may be coupled to the inverting input terminal (-) of the amplifier 430 (e.g., an operational amplifier).
  • the switch 410 and the resister 440 may be coupled to the output voltage (Vout) of the amplifier 430 as illustrated.
  • the optical detection circuit 340 may be configured to cause, via the switch 410, at least one of the photocomponent 420 or the optical detection circuit 340 to operate in a non-saturated state responsive to the activation of the switch 410. Accordingly, the amplifier 430 receives the current or voltage provided via the photocomponent 420.
  • the switch 410 may be parallel to the resistor 440 such that in the engaged state (e.g., when the switch is closed or otherwise turned on) the switch 410 shorts out the resistor 440 which shutters or otherwise limits the output resistance in the transimpedence gain (e.g., the degree to which the current output via the photodetector translates to Vout) such that the resistance of the switch may be at or near 0 ⁇ .
  • the switch 410 in the engaged state (e.g., when the switch is closed or otherwise turned on) the switch 410 shorts out the resistor 440 which shutters or otherwise limits the output resistance in the transimpedence gain (e.g., the degree to which the current output via the photodetector translates to Vout) such that the resistance of the switch may be at or near 0 ⁇ .
  • the gain of the amplifier 430 expresses a gain at or near 0 which causes the output voltage Vout to be at or near 0V for the current (e.g., a variable amount of input current) or voltage received or otherwise provided by the photocomponent 420 (e.g., the photodector).
  • the optical detection circuit 340 operates in a non-saturated state due to the gain of the amplifier 430 (e.g., the operational amplifier) expressing a gain at or near 0.
  • the optical detection circuit 340 may be configured such that the output voltage Vout may be equal to the input voltage received via the amplifier 430.
  • the output voltage may be within a predetermined output range such as between a minimum voltage level and a maximum voltage level.
  • the minimum voltage level and the maximum voltage level may be based on the voltage rails of the amplifier 430 (e.g., the operational amplifier, transimpedance/gain circuit, etc). For example, if the amplifier 430 has voltage rails of +10V and -10V, the output of the amplifier 430 may not exceed +10V or go below -10V. Accordingly, the switch 410 may be configured to keep the measured levels within the predetermined output range.
  • the predetermined output range may be +-15V, +-5V, +-3.3V, etc.
  • the resister 440 which establishes the transimpedance gain associated with the amplifier 430 may be included in the feedback path of the optical detection circuit 340, the optical detection circuit 340 (e.g., the amplifier 430) operates in the non-saturated state.
  • the switch 410 may be further configured to reduce a load (e.g., the load impedance) corresponding to the photocomponent 420.
  • a load e.g., the load impedance
  • the switch 410 causes the load impedence of the photocomponent 420 to decrease (e.g., to equal a value at or near 0 ohms ( ⁇ )) such that the photocomponent 420 can operate in a non-saturated state.
  • the load (e.g., the load impedance) corresponding to the photocomponent 420 may express a direct relationship with the state of saturation (e.g., saturated state or non- saturated state) of the optical detection circuit 340 and/or the photocomponent 420 in that the higher the load impedence, the greater the amount of saturation of the optical detection circuit 340 and/or the photocomponent 420.
  • the photocomponent 420 can receive an increased amount of light at higher intensities.
  • a direct relationship may be expressed between the amount of saturation and the repolarization time (e.g., the reset time) of the magneto-optical defect center material 305. For example, when the saturation of the photocomponent 420 and/or the optical detection circuit 340 may be reduced, the repolarization time may be reduced such that the magneto-optical defect center material 305 may be reset quickly at higher light intensities.
  • FIG. 5 is a schematic diagram of a system 500 for a circuit saturation mitigation system according to some embodiments.
  • the system 500 includes first and second optical light sources 310, which direct optical light to a magneto-optical defect center material 305.
  • An RF excitation source 320 provides RF radiation to the magneto-optical defect center material 305.
  • the system 500 may include a magnetic field generator 570 that generates a magnetic field, which may be detected at the magneto-optical defect center material 305, or the magnetic field generator 570 may be external to the system 500.
  • the magnetic field generator 570 may provide a biasing magnetic field.
  • the system 500 further includes a controller 550 arranged to receive a light detection signal from the optical detection circuit 340 and to control the optical light sources 310, 315, the RF excitation source 320, the switch 410, and the magnetic field generator 570.
  • the controller may be a single controller, or multiple controllers. For a controller including multiple controllers, each of the controllers may perform different functions, such as controlling different components of the system 500.
  • the magnetic field generator 570 may be controlled by the controller 550 via an amplifier.
  • the RF excitation source 320 may include a microwave coil or coils, for example.
  • the controller 550 may be arranged to receive a light detection signal via the optical detection circuit 340, activate the switch 410 based on the light detection signal received, and to control the optical light sources 310, 315, the RF excitation source 320, the switch 410, and the magnetic field generator 570.
  • the controller 550 may include a processor 552 and memory 554, in order to control the operation of the optical light sources 310, 315, the RF excitation source 320, the switch 410, and the magnetic field generator 570.
  • the memory 554 which may include a non-transitory computer readable medium, may store instructions to allow the operation of the optical light sources 310, 315, the RF excitation source 320, the switch 410, and the magnetic field generator 570 to be controlled. That is, the controller 550 may be programmed or otherwise operable via programmable instructions to provide control.
  • FIGs 6C and 6D illustrate the output of voltage V of the photocomponent (e.g., the photodetector).
  • the controller Initially the controller generates a command to activate the switch to operate in the engaged state (e.g., turns the switch on). The controller then generates a command to activate or otherwise apply the second optical light source to the magneto-optical defect center material. Responsive to the receipt of the light signal (e.g., the high power light signal) by the photocomponent, the output of voltage by the photocomponent may be rapidly (e.g., without delay) decreased to 0V at time tO due to the reduction of the load impedence and the non- saturated state of the photocomponent as described herein with reference to Figures 3 and 4.
  • the light signal e.g., the high power light signal
  • the increase in the bandwidth achieved as result of the decrease in the delay to return to the previous output voltage may be at least twice (2x) the bandwidth achieved without the decrease in the delay to return to the previous output voltage.
  • a high intensity signal at a short or otherwise minimal duration may cause the photocomponent to become saturated.
  • the saturation time is independent of the sample rate such that the bandwidth increase may be significant.
  • the cycle of time pulsed may demonstrate or otherwise express a 10% improvement. If the pulse rate is 10 ⁇ , the cycle of time pulsed may demonstrate or otherwise express an improvement that is at least twice (2x) the cycle of time pulsed without the decrease in the delay.
  • the voltage output V of the photocomponent rapidly (e.g., without delay) returns at time tO to the level of voltage output V prior to the application of the second optical excitation source as a result of the photocomponent in the non-saturated state (e.g., there may be no saturation to recover from which results in no delay).
  • the repolarization time e.g., without delay
  • the photocomponent operates at a higher bandwidth without signal attenuation.
  • the controller does not generate a command to activate the switch to operate in the engaged state (e.g., the switch remains turned off or is not included in the optical detection circuit).
  • the controller generates a command to activate or otherwise apply the second optical light source to the magneto-optical defect center material
  • the photocomponent receives the light signal (e.g., the high power light signal).
  • the output of voltage V provided by the photocomponent increases at time tO due to the increase of the load impedence such that the photocomponent moves to a saturated state.
  • the output voltage (Vout as shown in Figure 4) of the amplifier approaches or otherwise reaches (e.g., hits) the rail of the amplifier (e.g., saturates the amplifier) which distorts the output voltage Vout.
  • the rail of the amplifier e.g., saturates the amplifier
  • the repolarization time corresponding to the magneto-optical defect center material may be increased as shown at tl + ts such that the magneto-optical defect center material may be inhibited from resetting between the excited triplet state and the ground state rapidly.
  • Figures 7-8 illustrate the voltage output of the optical detection circuit as a function of time based on a continuous optical illumination of the magneto-optical defect center material during a time interval which includes application of the second optical excitation source (here depicted as waveform SI along the trace 710).
  • the x-axis indicates time where each block equals 200 nS and the y-axis indicates voltage taken at Vout where each block equals 200mV.
  • the magneto-optical defect center material has been reset to the ground state.
  • the cycle of time e.g., a value of delay
  • the second optical excitation source e.g., the high power laser
  • the second optical excitation source e.g., the high power laser
  • the second optical excitation source e.g., the high power laser
  • the second optical excitation source e.g., the high power laser
  • 20ns e.g., 1 cycle switch on delay and 0 cycle switch off delay
  • the voltage output 720 which may be indicative of high power laser data (e.g., information relating to the high power laser) in the measured signal may be beyond a predetermined output range (e.g., between a minimum voltage level and a maximum voltage level). For example, the voltage output 720 spikes, rapidly increases, or otherwise increases beyond the predetermined output range.
  • the voltage output may be beyond the predetermined output range as a result of the propagation delay in the switch and the use of the second optical light source (e.g., the high power signal) which increases the transimpedence gain as described above with reference to Figures 3 and 4.
  • the increase in the transimpedence gain results in saturation of the optical detection circuit (e.g., the amplifier) before the switch can affect (e.g., reduce) the transimpedence gain.
  • the optical detector circuit is thereby saturated and not sensitive during the period of time illustrated at 720. This is further illustrated in Figure 6d which shows the conventional behavior of the output voltage without the use of the example embodiments described herein.
  • the second optical light source e.g., the high power light signal
  • the output of voltage V provided by the photocomponent increases between time tO and tl due to the increase of the load impedence such that the photocomponent moves to a saturated state and the voltage output 720 spikes or rapidly increases.
  • a delay in the repolarization e.g., a delay in the reset time
  • the delay in the repolarization of the magneto-optical defect center material occurs responsive to the saturated state of the photocomponent and/or the amplifier.
  • the delay in the cycle of time at which the second optical excitation source is turned on may be set to 10 cycles.
  • a continuous optical illumination of the magneto-optical defect center material is applied during the time interval which includes application of the second optical excitation source.
  • the switch When the switch is turned on, the switch shorts the resistor which results in a rapid decrease in the voltage output 810.
  • the resulting voltage output 810 of waveform SI may be at or near 0V during application of the second optical excitation source (e.g., when the switch is engaged or may be otherwise closed) due to the delay in the cycle of time which may be set to, for example, 10 cycles in Figure 8.
  • the optical detector circuit is not saturated during the period of time illustrated at 810 and the time between tO and tl illustrated in Figure 6c such that the resulting voltage output 810 no longer expresses a spike or increase beyond the predetermined output range in contrast to the voltage output 720 of Figure 7.
  • the repolarization time of the magneto-optical defect center material may be reduced and the photocomponent and/or the optical detection circuit may operate at a higher bandwidth without signal attenuation.
  • the time at which the switch is delayed and the high power reset begins may be set based on the application.
  • the dimensional variations are not limited to those included in the respective illustrations. Such dimensional variations may be increased, decreased, adjusted or otherwise scaled depending on the application of the circuit saturation mitigation system 300.

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  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Magnetic Variables (AREA)
  • Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
  • Optical Modulation, Optical Deflection, Nonlinear Optics, Optical Demodulation, Optical Logic Elements (AREA)

Abstract

L'invention concerne un système qui active un commutateur dans un état hors contact ou dans un état en contact, qui reçoit, par le biais de la seconde source d'excitation optique, un signal lumineux comprenant un signal d'intensité élevée fourni par la seconde source d'excitation optique, et qui amène le photocomposant ou le circuit de détection optique à fonctionner dans un état non saturé en réponse à l'activation du commutateur.
PCT/US2017/024168 2017-03-24 2017-03-24 Atténuation de saturation de circuit photodétecteur pour impulsions magnéto-optiques de haute intensité Ceased WO2018174906A1 (fr)

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