WO2017183757A1 - Mesh-type contact pin for testing electrical terminal - Google Patents

Abstract

The present invention relates to a contact pin for testing an electrical terminal mounted on a printed circuit board, etc. The present invention provides a contact pin comprising: a substrate, which is made of a single material, and which is subjected to a press working and then rolled up; and an upper contact terminal, a lower contact terminal, and a mesh-type spring, which are integrally manufactured with the substrate. Therefore, each of the upper contact terminal, the lower contact terminal, and the mesh-type spring can be manufactured in various forms. Further, the contact pin has a simple structure, which simplifies the manufacturing process and thus reduces the manufacturing cost, and may have an improved straightness, distortion characteristic, and electrical characteristic.

Description

Mesh contact pins for electrical terminal testing

The present invention relates to an electrical terminal test contact pin for testing an electrical terminal mounted on a printed circuit board, and the like, in detail, it is composed of a single component, the mesh type for electrical terminal test that can reduce the manufacturing cost by eliminating the assembly process Contact pins.

Pogo pins, commonly called spring pins, are used for testing in the semiconductor and IT fields. These pogo pins are probes used for testing of inspection targets such as semiconductor wafers / packages, LCD modules, camera modules, and image sensors.

1 is a diagram illustrating a general pogo pin.

Referring to FIG. 1, the pogo pin 10 generally includes a spring 13 providing an elastic force between the upper probe 11, the lower probe 12, and the upper and lower probes 11 and 12, and an upper portion. The body 14 includes a lower end of the probe 11, an upper end of the lower probe 12, and a spring 13 therein.

2 is a cross-sectional view of a socket for inspecting a semiconductor package using a general pogo pin.

Referring to FIG. 2, a socket 1 for inspecting a semiconductor package generally includes a plurality of pogo pins 10 and an insulating body 20 in which a plurality of pogo pins 10 are received at predetermined intervals.

The pogo pin 10 has an upper probe 11 protruding upward of the insulating main body 20, and a lower probe 12 protruding downward of the insulating main body 20. At this time, the interval between the pogo pin 10 is the interval between the external terminal (2a) of the semiconductor package 2 in contact with the upper probe 11, and the contact pad (3) of the test board (3) in contact with the lower probe (12) Housed so as to have the same spacing as 3a).

When the semiconductor package 2 is pressed for the semiconductor package inspection, the external terminals 2a of the semiconductor package 2 are in contact with the upper probe 11 of the pogo pin 10, and the lower probe 12 is connected to the test board. The contact pad 3a of (3) is contacted, and the upper probe 11 and the lower probe 12 are elastically supported by the spring 13 inside the pogo pin 10 so as to be tested with the semiconductor package 2. The semiconductor package can be inspected by electrically connecting the board 3.

However, general pogo pins are manufactured by separately manufacturing the upper probe, the lower probe, the spring and the body by using MCT machining or CNC machining, and then assembling them. Cylindrical machining using MCT machining or CNC machining has various forms due to its characteristics. There is a difficulty in producing the upper probe, the lower probe, the spring and the body having, and in particular, the work is troublesome because these parts need to be reassembled after processing for each part.

In order to solve this problem, the Republic of Korea Patent No. 10-1577396 (Registration Date: 2015.12.08.) Has been proposed a contact pin for the electrical terminal test simplified the manufacturing process. Republic of Korea Patent No. 10-1577396 is proposed by the applicant, not separately manufactured by fabricating the upper probe, the lower probe, the spring and the body constituting the pogo pin through the processing after the assembly, respectively, As one plate is processed and manufactured integrally, the assembly process is omitted, thus simplifying the manufacturing process.

However, the contact pin according to the prior art proposed in Korean Patent No. 10-1577396 has an inner body, a first pillar, an upper contact end, a third pillar, a lower contact end, the upper contact end and the lower contact end. Including a spring member integrally connected therebetween, and one connection member integrally connecting one end of the inner body and the inner surface of the second pillar body has a complicated structure and a complicated manufacturing process.

Accordingly, the present invention has been proposed to solve the problems of the prior art, and is composed of a single component, the structure is simple, and the electric terminal test mesh that can reduce the manufacturing cost by simplifying the manufacturing process by eliminating the complicated assembly process Type contact pins.

The present invention according to one aspect for achieving the above object is an upper contact end; Bottom contact end; And a spring formed integrally between the upper contact end and the lower contact end to interconnect the upper contact end and the lower contact end, wherein a plurality of holes are formed to form a mesh. Provides meshed contact pins.

Preferably, the upper contact end, the lower contact end and the spring may be produced by rolling or folding a press-formed plate after pressing a flat plate of a single material.

Preferably, the spring and the lower contact end may further comprise a holder member integrally connected between the spring and the lower contact end.

Preferably, the upper contact end and the lower contact end may be formed in a symmetrical structure.

Preferably, the lower contact end may be formed in a bar shape.

Preferably, the spring includes an upper spring and a lower spring, and between the upper spring and the lower spring may further comprise a holder member integrally connected with the same material as the upper spring and the lower spring. .

Preferably, the upper contact end, the lower contact end and the spring may be all formed of a single material such as beryllium cooper (BeCu), or formed integrally with a release material made of one plate.

As described above, according to the present invention, by pressing the base material of a single material, either by rolling or folding the upper contact end, the lower contact end and the mesh type spring by providing a contact pin integrally manufactured by the upper contact end, the The lower contact stage and the mesh spring can be manufactured in various forms, and the structure is simple, which can simplify the manufacturing process and reduce the manufacturing cost, as well as improve the straightness, twisting and electrical properties.

1 is a cross-sectional view of a typical pogo pin.

Figure 2 is a cross-sectional view of a socket for semiconductor package inspection using a typical pogo pin.

3 illustrates a meshed contact pin for testing an electrical terminal according to an embodiment of the present invention.

4 is a plan view from above of the contact pin shown in FIG. 3;

5 is a view illustrating another shape of the mesh type contact pin for electrical terminal test according to an embodiment of the present invention.

6 to 8 are views for explaining the manufacturing process of the contact pin shown in FIG.

FIG. 9 is a front view illustrating a modification of the contact pin shown in FIG. 3. FIG.

FIG. 10 is a front view illustrating another modified example of the contact pin shown in FIG. 3. FIG.

The present invention is the upper contact end; Bottom contact end; And a spring integrally formed between the upper contact end and the lower contact end to interconnect the upper contact end and the lower contact end, wherein a plurality of holes are formed to form a mesh; It is to provide a mesh type contact pin for an electrical terminal test comprising a.

Advantages and features of the present invention, and methods for achieving them will be apparent with reference to the embodiments described below in detail with the accompanying drawings. However, the present invention is not limited to the embodiments disclosed below, but may be implemented in various different forms. And it is provided to completely inform the scope of the invention to those of ordinary skill in the art, the invention is defined only by the scope of the claims. In addition, when it is determined that related arts and the like in the description of the present invention may obscure the gist of the present invention, detailed description thereof will be omitted, and like reference numerals in the drawings refer to like elements.

3 is a view illustrating a mesh type contact pin for an electrical terminal test according to an exemplary embodiment of the present invention, and FIG. 4 is a plan view of an upper contact end of the contact pin illustrated in FIG. 3. 3 (a) is a front view of the contact pin, and (b) is a side view of the contact pin.

3 and 4, the mesh type contact pin 30 for an electrical terminal test according to an embodiment of the present invention includes an upper contact end 31, a lower contact end 32, and an upper contact end 31. And a mesh-shaped spring 33 interconnecting the lower contact end 32 and having a plurality of holes 33a formed therein. At this time, the upper contact end 31, the lower contact end 32 and the spring 33 is produced in a tubular shape rolled up and then rolled flat base material (plate material) to the desired shape.

As described above, the contact pin 30 according to the embodiment of the present invention is punched to have a shape corresponding to the upper contact end 31, the lower contact end 32, and the spring 33 by pressing a base material of a single material. After it is rolled up or folded, it is possible to manufacture the upper contact end 31, the lower contact end 32 and the spring 33 in various forms, respectively, and because the internal body is not necessary, the structure is simple and the manufacturing process is simplified. The manufacturing cost can be reduced. In addition, by forming a plurality of holes (33a) using a press in the site where the spring is to be formed, through this to produce a mesh-type spring 33 can improve the straightness, twisting and electrical properties.

In the present invention, the shape of the hole 33a may be formed in a circle, an ellipse or a polygon having three or more vertices, and the sizes thereof may be the same or different from each other. At this time, the shape, number and size of the holes 33a may be appropriately selected in consideration of the characteristics of the spring 33.

The contact pin 30 according to the embodiment of the present invention may be manufactured in various shapes on a plane when the disc is punched to form a desired shape and then rolled or folded to form a tubular shape. As such, the upper contact end 31 and the lower contact end 32 are integrally connected to each other by the spring 33 as the single base material is manufactured by press working. Accordingly, the lower contact end 32 contacts the electrical terminal to be tested to transmit a signal of the electrical terminal to the test diagnostic apparatus through the upper contact end 31. In some cases, the reverse may be used.

FIG. 5 is a view illustrating another shape of a mesh type contact pin for an electrical terminal test according to an exemplary embodiment of the present invention, wherein the top contact end of the contact pin is viewed from above.

4 and 5, the contact pin 30 according to an embodiment of the present invention after punching the plate to form a desired shape, and in the process of rolling or folding, as shown in FIG. As described above, one side portion and the other side portion of the disc may be formed in a circle 30a, a rectangle 30b, a circle 30c, or the like. In addition, it may be manufactured to have various shapes. Of course, the upper contact end 31 and the lower contact end 32 may also be formed in various forms. These shapes may be appropriately selected in consideration of the characteristics of the contact pin 30.

6 to 8 are views for explaining the manufacturing process of the mesh-type contact pin for electrical terminal test according to an embodiment of the present invention, Figure 6 is a view showing a plate, Figure 7 is a punching process is completed 8 is a diagram illustrating a state, and FIG. 8 is a diagram illustrating a completed contact pin.

As shown in FIG. 6, the plate | plate material A which is a flat raw material is prepared. At this time, the plate (A) may be used a variety of materials having conductivity as the conductive plate, preferably formed of a single material such as beryllium cooper (BeCu) having a conductive and elastic, or a release material consisting of a single plate It can be formed integrally.

Subsequently, as shown in FIG. 7, the plate A is punched to have a shape corresponding to the upper contact end 31, the lower contact end 32, and the spring 33, respectively, by using press working. At this time, the press working is a method of cutting the sheet material (A), the upper contact end 31 and the lower contact end 32 is cut and processed, the upper contact end 31 and the lower contact end so that a constant elastic force is applied. A plurality of holes 33a are drilled between the 32 to form a spring 33.

Subsequently, as shown in FIG. 8, the contact pin 30 may be folded or folded by folding or folding the plate A processed to have a shape corresponding to the upper contact end 31, the lower contact end 32, and the spring 33, respectively, by pressing. To complete). In this case, the contact pin 30 having a tubular structure having various shapes as shown in FIGS. 4 and 5 may be manufactured by appropriately adjusting the number and shape of the plate A while rolling or folding the plate A. FIG.

6 to 8, the contact pin 30 according to the embodiment of the present invention press-processes the base plate A as a base material to form the upper contact end 31, the lower contact end 32, and the spring 33. After manufacturing, by rolling it or folding it, it is possible to reduce the manufacturing cost because the manufacturing process is simple compared to the conventional.

Meanwhile, the contact pin of the present invention may be modified in various shapes as shown in FIGS. 9 and 10.

9 is a front view illustrating a modified example of the shape of the mesh-type contact pin for an electrical terminal test according to an embodiment of the present invention, and FIG. 10 is a mesh type for an electrical terminal test according to an embodiment of the present invention. It is a front view shown in order to demonstrate another modified example of a contact pin.

Referring to FIG. 9, the contact pin 40 according to the modified example includes an upper spring 43, a holder member 44, and a lower spring 45 between the upper contact end 41 and the lower contact end 42. It has a structure that is integrally connected.

The upper spring 43, the holder member 44 and the lower spring 45 is formed through the press working, the holder member 44 may be further coupled to the carrier member (not shown) protruding outward. At this time, since the holder member 44 is manufactured by press working, it may have various forms. For example, the cross section may have a rectangular shape or may have a cylindrical shape. And the carrier member is a member that allows easy gripping from the outside.

Referring to FIG. 10, the contact pin 50 according to another modification includes an upper contact end 51, a lower contact end 52, a spring 53, and a holder member 54. The upper contact end 51, the spring 53, and the holder member 54 include the upper contact end 41, the upper spring 43, and the holder member 44 of the contact pin 40 shown in FIG. 9. In contrast, the lower contact end 52 may have a straight bar shape so as to be directly constrained to the printed circuit board.

As described above, the technical spirit of the present invention has been described in detail in the preferred embodiments, but the above-described preferred embodiments are for the purpose of description and not of limitation. As such, those skilled in the art may understand that various embodiments are possible through the combination of the embodiments of the present invention within the scope of the technical idea of the present invention.

The present invention can be applied to the field of mesh type contact pins for electrical terminal testing, which can be made of a single component and can reduce the manufacturing cost by eliminating the assembly process.

Claims (7)

Upper contact end; Bottom contact end; And A spring formed integrally between the upper contact end and the lower contact end to interconnect the upper contact end and the lower contact end, wherein a plurality of holes are formed to form a mesh; Mesh-type contact pin for electrical terminal testing, comprising a. The method of claim 1, The upper contact end, the lower contact end and the spring is a mesh-type contact pin for electric terminal test, characterized in that after press-processing a flat plate of a single material, the press-formed plate is rolled or folded. The method of claim 1, And a holder member integrally connected between the spring and the lower contact end with the same material as the spring and the lower contact end. The method of claim 1, The upper contact end and the lower contact end is a mesh-type contact pin for the electrical terminal test, characterized in that formed in a symmetrical structure. The method of claim 1, The lower contact end is a mesh type contact pin for electric terminal test, characterized in that formed in a bar (bar) shape. The method of claim 1, The spring includes an upper spring and a lower spring, and between the upper spring and the lower spring further comprises a holder member connected integrally with the same material as the upper spring and the lower spring. Contact pins. The method of claim 1, The upper contact end, the lower contact end and the spring are all of a single material, such as beryllium cooper (BeCu), or a mesh-type contact pin for the electrical terminal test, characterized in that formed integrally with a release material consisting of one plate.

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