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WO2017018690A1 - Mold cleaning compound and method for cleaning semiconductor packaging mold - Google Patents

Mold cleaning compound and method for cleaning semiconductor packaging mold Download PDF

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Publication number
WO2017018690A1
WO2017018690A1 PCT/KR2016/007537 KR2016007537W WO2017018690A1 WO 2017018690 A1 WO2017018690 A1 WO 2017018690A1 KR 2016007537 W KR2016007537 W KR 2016007537W WO 2017018690 A1 WO2017018690 A1 WO 2017018690A1
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WO
WIPO (PCT)
Prior art keywords
acid
mold
cleaning compound
mold cleaning
rubber
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
PCT/KR2016/007537
Other languages
French (fr)
Korean (ko)
Inventor
이성율
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fine Chemical Co Ltd
Original Assignee
Fine Chemical Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fine Chemical Co Ltd filed Critical Fine Chemical Co Ltd
Priority to CN201680025521.XA priority Critical patent/CN107580609A/en
Priority to BR112017028154A priority patent/BR112017028154A2/en
Priority to JP2017555748A priority patent/JP2018514416A/en
Publication of WO2017018690A1 publication Critical patent/WO2017018690A1/en
Anticipated expiration legal-status Critical
Ceased legal-status Critical Current

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Classifications

    • BPERFORMING OPERATIONS; TRANSPORTING
    • B29WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
    • B29CSHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
    • B29C33/00Moulds or cores; Details thereof or accessories therefor
    • B29C33/70Maintenance
    • B29C33/72Cleaning
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/28Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection
    • H01L23/29Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the material, e.g. carbon
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/28Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection
    • H01L23/31Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the arrangement or shape

Definitions

  • the technology disclosed herein relates to a mold cleaning compound and a method for cleaning a semiconductor packaging mold. More particularly, the present invention relates to a mold cleaning compound and a method for cleaning a semiconductor packaging mold, which can clean the semiconductor packaging mold easily and efficiently.
  • Highly integrated semiconductor devices produced by highly developed semiconductor thin film technology are very sensitive to external environments such as humidity and temperature, and have poor shock resistance to withstand external shocks.
  • the semiconductor device is packaged to enable signal input and output of an external device.
  • such semiconductor devices include a die attach process for attaching a semiconductor chip to a lead frame, a wire bonding process for electrically connecting the semiconductor chip and the lead frame, and protecting the electrically connected wire. It is packaged through a molding process and the like.
  • EMC epoxy compound
  • Molding of the semiconductor chip is made by compressing the EMC in powder form. Specifically, in the molding process, the powder-formed EMC is filled into the upper mold and the lower mold having a cavity formed therein according to a thickness of a desired package, and after the molding process is finished, contaminants are stacked in the mold. In addition, the surface of the EMC is stained by the contaminants, resulting in poor appearance, or the molding itself sticks to the mold surface, making continuous work difficult.
  • the contaminants include residues of epoxy resins and various oxidized waxes.
  • the EMC consists of a mixture of various additives such as curing agents, binders, colorants, etc. in addition to epoxy resins, in order to satisfy various physical properties such as moldability, heat resistance, moisture resistance, and adhesiveness. Solid waste) is the mainstream. Accordingly, in the post-semiconductor step, the mold is cleaned at least once or twice a day regularly.
  • a typical method of cleaning the mold is sheet cleaning using a thermosetting resin or rubber-based mold cleaning compound sheet, specifically, inserting the mold cleaning compound sheet between the semiconductor molds to which heat is applied. And repeatedly compressed to remove contaminants in the mold.
  • the mold cleaning compound sheet has a flat plate shape and is supplied with a knife to be easily torn, and a user tears a sheet having a suitable thickness and length and applies it to a mold to be cleaned, even if a knife is put in the rubber. It is difficult to break smoothly because it is not easily broken and stretches, and there are various types of semiconductor packaging molds, so even if you stack several sheets with several thicknesses and lengths, you can not match countless mold types and you have to inject some excess amount than necessary.
  • the sheet has a disadvantage in that work loss is severe and workability is poor, such as stacking a sheet on a thick mold.
  • high viscosity materials such as modified epoxy resins are used as molding materials, and molds are also used in ultra-thin or matrix shapes, and thus, contamination in molds is increasing.
  • semiconductor packaging has been largely developed in press molding, single cavity transfer molding, multi-cavity transfer molding, injection molding, or the like, that is, in the direction of improving productivity and precision.
  • the present inventors pour the mold cleaning compound into the pot of the molding machine in the transfer molding, and when the press is closed, it is transferred to the inside of the mold (gate) through the runner at the port, so that the cleaning of the entire section becomes possible, and the cleaning compound even during injection molding Is injected into the molding machine's hopper, and not only the injection machine cylinder, nozzle, and even the entire mold are cleaned at once, but also the exact amount can be transferred or ejected to reduce the loss of materials and the room temperature stickiness of the rubber.
  • the technique disclosed herein has an object to provide a mold cleaning compound capable of cleaning the semiconductor packaging mold.
  • the compound provides a spherical or cylindrical mold cleaning compound.
  • It provides a cleaning method of a semiconductor packaging mold comprising the step of taking out the compound cleaned by the impurity adsorption.
  • the step of pouring and injecting the above-described mold cleaning compound into the hopper (Hopper) of the injection molding machine is completed the sealing process
  • Adsorbing impurities while the supplied mold cleaning compound delivers the entire mold at once including the cylinder and the nozzle of the injection machine
  • It provides a cleaning method of a semiconductor packaging mold comprising the step of removing the compound cleaned by the impurity adsorption from a mold.
  • the technique disclosed herein replaces the existing sheet cleaning method and provides a mold cleaning compound that can clean the semiconductor packaging mold easily and efficiently, and supplies the entire section of the mold at a time by supplying it to the mold of the transfer molding or the injection molding to be cleaned. Cleaning, but not only eliminate the room temperature stickiness of the rubber, but also to solve the entanglement in the cleaning compound and to provide a cleaning method for the semiconductor packaging mold with improved workability and cleaning performance.
  • the mold cleaning compound according to one embodiment of the technology disclosed herein is a cleaning compound of a semiconductor packaging mold, and the compound may be spherical or cylindrical.
  • the spherical or cylindrical shape is provided as a substitute for a conventional mold cleaning compound sheet, and is provided in spherical or cylindrical form instead of a sheet form, and thus a content required without loss of compound regardless of the type and thickness of a mold requiring cleaning. It has the advantage of providing as much.
  • sphere is a spherical or atypical spherical, unless otherwise specified, and may be a pellet of 30 mm or less in diameter, or 1 to 30 mm in diameter (in the spherical sphere, the diameter means the average diameter).
  • the spherical shape may be preferably 2 to 20mm in diameter.
  • the diameter is less than 1mm may be undesirable in terms of workability because it imparts an excessive number of filling on the lower mold of the mold to be cleaned during the operation, when the diameter exceeds 30mm to achieve in the technology disclosed herein compared to the existing sheet cleaning method It may not be desirable to fine control the amount used.
  • cylindrical may be pellets of regular or atypical cross-section, having a diameter of 30 mm or less and a height of 30 mm or less, or a diameter of 1 to 30 mm and a height of 1 to 30 mm. Where diameter is the mean diameter.
  • the cylindrical shape may have a diameter of 2 to 20 mm, a height of 2 to 20 mm, and more preferably, a diameter of 2 to 10 mm and a height of 2 to 20 mm.
  • the diameter is less than 1mm, since the number of filling on the lower mold of the mold to be cleaned during operation may be undesirable in terms of workability, when the diameter exceeds 30mm to achieve in the technology disclosed herein compared to the existing sheet cleaning method It may not be desirable to fine control the amount used.
  • the compound preferably includes a crosslinkable base material and a peroxide crosslinking agent, because the crosslinking with the peroxide crosslinking agent increases the overall strength, thereby increasing the adsorption power of the solid residue of the compound.
  • the crosslinkable main material may be a rubber or room temperature tackiness reducing agent alone, and room temperature tackiness reducing agent in consideration of the property of sticking by room temperature stickiness (adhesiveness) of rubber itself when processing rubber into spherical or cylindrical shape described above. It can also mix and use.
  • the room temperature adhesiveness reducing agent may be used a kind that can be crosslinked with a peroxide-based crosslinking agent, for example, may be a crosslinkable thermoplastic rubber or a crosslinkable resin having a DSC melting point of 140 ° C. or less alone or in combination.
  • the crosslinkable thermoplastic rubbers are those which can be crosslinked with a peroxide crosslinking agent, such as styrene-butadiene-styrene block (SBS), styrene-ethylene-butadiene-styrene block (SEBS), and styrene-ethylene-propylene-styrene block (SEPS).
  • SBS styrene-butadiene-styrene block
  • SEBS styrene-ethylene-butadiene-styrene block
  • SEPS styrene-ethylene-propylene-styrene block
  • styrene-butadiene-based block copolymers such as styrene-isoprene-styrene block (SIS), polybutadiene-based thermoplastic rubber (12-PB), chlorinated polyethylene rubber (CPE), and polyolefin-based thermoplastic elastomer (TPO) It may be one or more selected from.
  • the crosslinkable resin may also be crosslinked with a peroxide crosslinking agent, and at the same time, the DSC melting point may be 140 ° C. or less, or 35 to 140 ° C., and may be at least one selected from ethylene polymer and ethylene copolymer. For example, if it is less than 35 degrees Celsius, crosslinkable resin may melt
  • the ethylene polymer may be, for example, low density polyethylene (LDPE), linear low density polyethylene (LLDPE), medium density polyethylene (MDPE), high density polyethylene (HDPE), or the like.
  • LDPE low density polyethylene
  • LLDPE linear low density polyethylene
  • MDPE medium density polyethylene
  • HDPE high density polyethylene
  • the ethylene copolymer is i) ethylene, and ii) C 3 -C 10 alpha olefins, C 1 -C 12 alkyl esters of C 3 -C 20 monocarboxylic acids, unsaturated C 3 -C 20 mono or dicarboxylic acids, unsaturated C 4 It may be a copolymer of at least one ethylenically unsaturated monomer selected from anhydrides of —C 8 dicarboxylic acids and vinyl esters of saturated C 2 -C 18 carboxylic acids or an ionomer of the copolymer.
  • ethylene copolymers include ethylene vinyl acetate (Ethylene Vinylacetate, EVA), ethylene butyl acrylate (Ethylene Butylacrylate, EBA), ethylene methacrylate (Ethylene Methacrylate), ethylene ethyl acrylate (Ethylene Ethylacerylate, EEA), ethylene Methyl methacrylate (Ethylene Methylmethacrylate, EMMA), ethylene butene copolymer (Ethylene Butene Copolymer, EB-Co), ethylene octene copolymer (Ethylene Octene Copolymer, EO-Co) and the like.
  • the room temperature tack reducing agent may be included in at least 5 wt%, up to 100 wt% of the total components constituting the crosslinking agent main body.
  • the room temperature tackiness reducing agent is included in 5 to 40 wt%, or 5 to 20 wt% of the total components constituting the crosslinking agent main body can exhibit an effect of reducing the room temperature tack of the rubber.
  • crosslinkable thermoplastic rubber and crosslinkable resin can be used individually or in mixture.
  • the rubber may be a natural rubber, a synthetic rubber, or a mixture thereof, and particularly, the rubber may be a kind crosslinkable with a peroxide crosslinking agent.
  • the natural rubber may be general natural rubber or modified natural rubber.
  • the natural rubber contains cis-1,4-polyisoprene as a main component as polyisoprene, but may also contain trans-1,4-polyisoprene depending on the required properties. Therefore, in the natural rubber, in addition to the natural rubber mainly containing cis-1,4-polyisoprene, natural rubber including trans-1,4-isoprene, such as balata, which is a kind of rubber of South American Sapotagua. It may include.
  • the modified natural rubber is epoxidized natural rubber (ENR). Deproteinized natural rubber (DPNR), hydrogenated natural rubber, and the like.
  • the natural rubber may be crepe rubber, sheet rubber, skim rubber, or the like, but is not limited thereto.
  • the synthetic rubber is styrene-butadiene rubber (SBR), butadiene rubber (BR), acrylonitrile-butadiene rubber (NBR), ethylene-propylene rubber (EPR), ethylene-propylene diene rubber (EPDM), isobutylene-isoprene It may be at least one selected from the group comprising rubber (IIR) and silicone rubber.
  • the peroxide-based crosslinking agent has a peroxide functional group and uses a kind capable of peroxide crosslinking of both the rubber and the room temperature tackifier, and the content thereof is 0.5 to 10 parts by weight, or 1 based on 100 parts by weight of the crosslinkable base material. It may be from 5 parts by weight, by reinforcing the rubber and room temperature adhesiveness reducing agent together in the above range can reinforce the strength and increase the adsorption power of the solid residue during cleaning.
  • the peroxide crosslinking agent is, for example, 1,1-bis (t-butylperoxy) -3,3,5-trimethyl cyclohexane, 1,1-bis (t-butylperoxy) cyclohexane, t-butyl Peroxy maleic acid, t-butylperoxylate, t-butylperoxy-3,3,5-trimethylhexanoate, cyclohexanone peroxide, t-butylperoxy aryl carbonate, t-butylperoxy isopropyl Carbonate, 2,5-dimethyl-2,5-di (benzoylperoxy) hexane, 2,2-bis (t-butylperoxy) octane, t-butylperoxy acetate, 2,2-bis (t-butyl Peroxy) butane, t-butylperoxybenzoate, n-butyl-4,4-bis (t-butylperoxy) vale
  • it may further include one or more additives of a detergent, a tax aid and an adsorbent.
  • an amino alcohol salt prepared by reacting (neutralizing) an amino alcohol or an amino alcohol with an organic or inorganic acid may be used.
  • the amino alcohol salt By using the amino alcohol salt, the amino alcohol is fixed as a salt during cleaning to prevent volatilization of the amino alcohol, and decomposes into amino alcohol at a normal mold cleaning temperature (165 ° C. or higher and 200 ° C. or lower), thereby providing a predetermined mold cleaning effect.
  • the said amino alcohol salt may mix
  • the amino alcohol is, for example, monoethanol amine, diethanol amine, triethanolamine, N-methyl ethanolamine, N, N-dimethyl ethanolamine, N, N-dibutyl ethanolamine, N, N-diethyl ethanolamine, At least one selected from the group consisting of N-methyl-N, N-diethanol amine, 2-amino-2-methyl propanol, 3-amino propanol and 2-amino propanol, preferably monoethanol amine, di It may be at least one selected from the group consisting of ethanol amine, 2-amino-2-methyl propanol, 3-amino propanol and 2-amino propanol.
  • the organic acid may be, for example, formic acid, acetic acid, propionic acid, butyric acid, isobutyric acid, gilacetic acid, isogilic acid, pivalic acid, crotonic acid, caproic acid, caprylic acid, capric acid, lauric acid, myristic acid, and palmitic acid.
  • the inorganic acid may be, for example, hydrochloric acid or acetic acid.
  • the cleaning agent may be used in an amount of 1.0 to 30 parts by weight, or 3.0 to 25 parts by weight based on 100 parts by weight of the crosslinkable base material, and may provide sufficient mold cleaning effect within this range, and may also provide mold cleaning compound after mold cleaning. When taken out from the mold, it does not break or remain clean.
  • the detail information aid is, for example, at least one selected from the group consisting of ethylene glycol, diethylene glycol, triethylene glycol, propylene glycol, dipropylene glycol, glycol ethers, and glycol esters, wherein 100 parts by weight of the crosslinkable base material As a reference, it can be used in 1.0 to 30 parts by weight, or 3.0 to 25 parts by weight, within this range can provide a sufficient mold cleaning effect without the problem that excess glycols remain in the mold representation.
  • the adsorbent is one or more selected from the group consisting of carbon black, silica, activated alumina, activated carbon, magnesium oxide, titanium oxide, magnesium carbonate, calcium carbonate, bentonite and diatomaceous earth, based on 100 parts by weight of the crosslinkable base material. It can be used in the range of 10 to 90 parts by weight, or 20 to 70 parts by weight, and within this range, the solid residues, which are contaminants, are well peeled off from the mold surface. Since the phenomenon which remains in a mold is common, sufficient reinforcement can be provided.
  • the mold cleaning compound is not only excellent in scorch property, cleaning adsorption power, cleaning property, detergent suitability, but also can provide easy properties such as underwater pelletizing, dry cross-sectional cutting pelletizing, underwater strand pelletizing.
  • the mold cleaning compound according to one embodiment of the technology disclosed herein may be further contained in a range in which a crosslinking aid such as a softener such as stearic acid or ethylene bis stearamide and zinc oxide does not adversely affect the reaction as necessary.
  • a crosslinking aid such as a softener such as stearic acid or ethylene bis stearamide and zinc oxide
  • the softener 0.1 to 5 parts by weight, or may be further included in the range of 0.1 to 3 parts by weight
  • the crosslinking aid may be further included in the range of 0.5 to 8 parts by weight, or 3 to 7 parts by weight.
  • the cleaning method of the transfer mold using the mold cleaning compound according to the technology disclosed herein instead of the existing sheet cleaning method may be performed as follows, for example:
  • the mold cleaning compound is poured into the port of the transfer molding machine where the sealing process is completed, and the press is closed.
  • the use content of the compound here can be optimized by the skilled person for various mold shapes.
  • the supplied mold cleaning compound is transferred from the pot through the runner into the mold to adsorb impurities.
  • the pressurization may be carried out under heating conditions of at least 165 ° C., up to 200 ° C.
  • pellets provides the benefits of not only transferring the correct amount but also reducing the loss of material.
  • the compound cleaned by the impurity adsorption is taken out from the mold. At this time, a clean takeout can be performed without any residue over the entire section of the mold.
  • the cleaning method of the injection mold using the cleaning compound disclosed herein may be performed as follows, for example:
  • the mold cleaning compound is poured into a hopper of an injection molding machine where the sealing process is completed and injected.
  • the use content of the compound here can be optimized by the skilled person for various mold shapes.
  • the supplied mold cleaning compound delivers the cylinder, nozzle, and even the entire mold of the injection molding machine at once to adsorb impurities.
  • the pressurization may be performed under heating conditions of 165 ° C. or more and a maximum of 200 ° C.
  • the use of pellets provides the benefits of not only injecting the correct amount but also reducing the loss of material.
  • the compound cleaned by the impurity adsorption is taken out from the mold. At this time, a clean takeout can be performed without any residue over the entire section of the mold.
  • Rubber 1 high sheath-butadiene rubber
  • Rubber 2 synthetic rubber: ethylene-propylene-diene rubber (EPDM)
  • Thermoplastic Rubber 1 Styrene-Butadiene Block Copolymer (LG Ghem, LG401: Styrene 20wt%, Density 0.93 kg / cc, Hardness 57 Shore A)
  • Thermoplastic rubber 2 Polybutadiene-based thermoplastic rubber (12-PB) (JSR, RB820: Density: 0.91 g / cc, DSC melting point 95 ° C)
  • Thermoplastic Rubber 1 Thermoplastic Polyurethane (TPU) (Dongsung Hi-Chem, 5075A: Hardness 75 Shore A, Softening Point 75 °C)
  • crosslinkability / non-crosslinkability is based on the presence or absence of crosslinkability with the peroxide crosslinking agent.
  • Tax preparation Diethylene glycol
  • Adsorbent Hydrated Silica Zeosil 45
  • a crosslinkable (or noncrosslinkable) thermoplastic rubber and a crosslinkable (or noncrosslinkable) resin are mixed and mixed for 5 minutes in a kneader having a capacity of 1 L as a pressure-sensitive adhesive reducing agent. It was. 60 parts by weight of adsorbent, 20 parts by weight of detergent, 20 parts by weight of cross-linking agent (DCP), 1.0 parts by weight of stearic acid softener, 1.0 parts by weight of stearic acid softener and 5.0 parts by weight of zinc oxide as zinc cross-linking aid after mixing After addition and further mixing for 1 minute, the reaction was terminated and a total of 15 sheet-like mixtures were obtained in Open Mill.
  • DCP cross-linking agent
  • Underwater Cutting When cutting underwater, it is not possible to get tangled in the die, or even if it is cut, cool it after cutting and put it in a bag, put it in a bag, put it in a 40 °C oven, press it with a 1kg weight, and put it on the plate for 24 hours. If there was, it evaluated as bad (X).
  • Dry Face Cutting When dry face cutting, sprinkle talc powder so that the pellets do not get tangled, then put 30g into a bag, put it in a 40 °C oven, press it with a 1kg weight, and take it out for 24 hours. If stuck together, it evaluated as bad (X).
  • Scorch characteristics The melt index of each cleaning compound was measured at 130 ° C. and 10.0 Kg. When the measured value was less than 10 g / 10 min, the scorch property was evaluated as poor (X).
  • Desorption power 10cm X 10cm X 5mm molds with holes 1mm in diameter x 2mm in height are arranged in the transfer molding machine at the bottom, and the cleaning compound is poured into the pot of 70g molding machine and pressed for 10 minutes at 175 °C. After vulcanization, the mold was demolded, and if the mold was completely demolded, it was evaluated as good ( ⁇ ), and if it was stuck in one hole, it was regarded as bad (X).
  • Detergent suitability Machinability is marked as good if at least one of the two underwater cutting sections is suitable, and not suitable if both are bad. Scorching, detergency, and detergency were all good and good.
  • spherical or cylindrical pellets are prepared by cutting underwater or cutting in section, and have scorch characteristics, cleaning adsorption, cleaning and suitability. In terms of both, it was preferred. ⁇
  • the mold cleaning compound of the technique disclosed in the present specification effectively solves the entanglement of pellets during underwater cutting and cross-section cutting according to the use of a room temperature tackifier, and has a scorch property, a cleaning adsorption power, a cleaning property and a cleaning agent. This has the advantage of providing excellent improvement in terms of suitability.
  • Example 3 As a further experimental example, the same process as in Example 1 was repeated except that the composition according to Table 3 was applied in Example 1, and the results of underwater cutting and cross-section cutting, pellet shape and physical properties were measured together with Table 3 below. Indicated.

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  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
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  • Moulds For Moulding Plastics Or The Like (AREA)

Abstract

Provided are: a mold cleaning compound, which is a compound for cleaning a semiconductor packaging mold and has a spheroidal or cylindrical shape; and a mold cleaning method using the same.

Description

몰드 클리닝 컴파운드 및 반도체 패키징 금형의 클리닝 방법How to clean mold cleaning compound and semiconductor packaging mold

본 명세서에 개시된 기술은 몰드 클리닝 컴파운드 및 반도체 패키징 금형의 클리닝 방법에 관한 것이다. 보다 상세하게는 간편하고 효율적으로 반도체 패키징 금형을 클리닝할 수 있는 몰드 클리닝 컴파운드 및 반도체 패키징 금형의 클리닝 방법에 관한 것이다.The technology disclosed herein relates to a mold cleaning compound and a method for cleaning a semiconductor packaging mold. More particularly, the present invention relates to a mold cleaning compound and a method for cleaning a semiconductor packaging mold, which can clean the semiconductor packaging mold easily and efficiently.

고도로 발전된 반도체 박막 기술에 의해 생산된 고집적 반도체 소자는 습도, 온도 등의 외부 환경에 매우 민감하게 반응하고, 또한 외부 충격을 견디는 내충격성이 양호하지 못하므로, 반도체 소자를 보호함과 동시에 반도체 소자와 외부 기기의 신호 입출력이 가능하도록 반도체 소자를 패키징하게 된다. Highly integrated semiconductor devices produced by highly developed semiconductor thin film technology are very sensitive to external environments such as humidity and temperature, and have poor shock resistance to withstand external shocks. The semiconductor device is packaged to enable signal input and output of an external device.

통상적으로, 이러한 반도체 소자는 리드 프레임에 반도체 칩을 어태치하는 다이 어태치(die attach) 공정, 반도체 칩과 리드 프레임을 전기적으로 연결하는 와이어 본딩(wire bonding) 공정, 전기적으로 연결된 와이어를 보호하기 위한 몰딩(molding) 공정 등을 거쳐 패키징된다.Typically, such semiconductor devices include a die attach process for attaching a semiconductor chip to a lead frame, a wire bonding process for electrically connecting the semiconductor chip and the lead frame, and protecting the electrically connected wire. It is packaged through a molding process and the like.

상기 공정중 몰딩 공정에서는 주로 에폭시 몰딩 컴파운드(Epoxy compound, 이하 EMC라 한다) 등의 플라스틱 부재를 이용한다. 상기 EMC는 반도체 칩을 봉지시켜 반도체 회로를 외부의 충격 및 오염 물질로부터 보호하는 역할을 하는 플라스틱 재료로서 반도체의 생산성 및 신뢰성에 중대한 영향을 미치므로 반도체 제조 공정에서 큰 비중을 차지하고 있다. In the molding process, plastic members such as epoxy compound (hereinafter referred to as EMC) are mainly used. The EMC is a plastic material that encapsulates a semiconductor chip and protects the semiconductor circuit from external shocks and contaminants. Therefore, the EMC has a large weight in the semiconductor manufacturing process because it significantly affects the productivity and reliability of the semiconductor.

상기 반도체 칩의 몰딩은 파우더 형태의 EMC를 압축하여 이루어진다. 구체적으로, 상기 몰딩 공정에서는 원하는 패키지의 두께에 맞추어 내부에 캐비티(cavity)가 형성된 상부 금형과 하부 금형 내부로 상기 파우더 형태의 EMC가 채워지는데, 상기 몰딩 공정이 종료된 후 몰드 내부에 오염물이 적층하게 되고, 상기 오염물에 의해 EMC의 표면이 얼룩으로 더러워져 외관불량을 야기하거나, 성형물 자체가 몰드 표면에 달라붙게 되어 연속적인 작업이 어렵다. Molding of the semiconductor chip is made by compressing the EMC in powder form. Specifically, in the molding process, the powder-formed EMC is filled into the upper mold and the lower mold having a cavity formed therein according to a thickness of a desired package, and after the molding process is finished, contaminants are stacked in the mold. In addition, the surface of the EMC is stained by the contaminants, resulting in poor appearance, or the molding itself sticks to the mold surface, making continuous work difficult.

상기 오염물로는 에폭시 수지의 잔류물이나 산화된 여러 가지 왁스 등이 대표적이다. 또한, 상기 EMC는 성형성, 내열성, 내습성, 접착성 등의 다양한 물성을 충족시키기 위해, 에폭시 수지 외에 경화제, 결합제, 착색제 등의 다양한 첨가제가 혼합된 혼합물로 이루어져 이러한 첨가제도 오염물(soils, 이하 고형분 찌꺼기라 한다)의 주류를 이루고 있다. 이에 따라, 반도체 후공정에서는 하루에 적어도 1회 또는 2회 이상 정기적으로 몰드를 청소하고 있다. Representatives of the contaminants include residues of epoxy resins and various oxidized waxes. In addition, the EMC consists of a mixture of various additives such as curing agents, binders, colorants, etc. in addition to epoxy resins, in order to satisfy various physical properties such as moldability, heat resistance, moisture resistance, and adhesiveness. Solid waste) is the mainstream. Accordingly, in the post-semiconductor step, the mold is cleaned at least once or twice a day regularly.

몰드를 청소하는 대표적인 방법은 열경화성 수지 또는 고무를 베이스로 한 몰드 클리닝 컴파운드 시트를 이용하는 시트 클리닝(Sheet Cleaning)을 진행하는 것으로, 구체적으로는 열이 가해져 있는 반도체 성형 몰드 사이에 몰드 클리닝 컴파운드 시트를 투입하고, 반복적으로 압착(compression)하여 몰드 내의 오염물을 제거한다. 상기 몰드 클리닝 컴파운드 시트는 평판 형태를 갖고 잘 찢어지도록 칼금을 넣어 공급되고, 사용자는 적당한 두께와 길이의 시트를 찢어서 세정 대상 금형에 적용하게 되는데, 고무에 칼금이 넣어져있더라도 미가류 고무의 특성상 당길 때 잘 안 끊기고 늘어나는 성질이 있어 매끄럽게 끊기 어렵고, 반도체 패키징 몰드의 종류가 다양하므로 몇 가지 두께와 길이를 갖는 시트를 몇 장씩 적층하더라도 무수한 몰드 종류를 맞출 수 없는데다 필요보다 어느 정도 과량을 투입할 수밖에 없으므로 시트 손실이 심하고, 두꺼운 금형에 시트를 적층하여야 하는 등 작업성이 불량한 단점을 갖는다. A typical method of cleaning the mold is sheet cleaning using a thermosetting resin or rubber-based mold cleaning compound sheet, specifically, inserting the mold cleaning compound sheet between the semiconductor molds to which heat is applied. And repeatedly compressed to remove contaminants in the mold. The mold cleaning compound sheet has a flat plate shape and is supplied with a knife to be easily torn, and a user tears a sheet having a suitable thickness and length and applies it to a mold to be cleaned, even if a knife is put in the rubber. It is difficult to break smoothly because it is not easily broken and stretches, and there are various types of semiconductor packaging molds, so even if you stack several sheets with several thicknesses and lengths, you can not match countless mold types and you have to inject some excess amount than necessary. The sheet has a disadvantage in that work loss is severe and workability is poor, such as stacking a sheet on a thick mold.

또한, 반도체 제품의 고집적화, 박형화 등의 다변화 추세에 따라 몰딩 재료로서 변성 에폭시 수지 등의 점도 높은 재료가 사용되고, 몰드 또한 초박형 혹은 매트릭스형 등이 사용되므로, 몰드 내의 오염도가 심해지고 있다. In addition, in accordance with the trend of diversification such as high integration and thinning of semiconductor products, high viscosity materials such as modified epoxy resins are used as molding materials, and molds are also used in ultra-thin or matrix shapes, and thus, contamination in molds is increasing.

또한, 반도체 패키징은 크게 프레스 성형, 싱글 캐비티 트랜스퍼 성형, 멀티 캐비티 트랜스터 성형, 인젝션 성형 등으로, 즉 생산성과 정밀성을 향상시키는 방향으로 발전되고 있다. In addition, semiconductor packaging has been largely developed in press molding, single cavity transfer molding, multi-cavity transfer molding, injection molding, or the like, that is, in the direction of improving productivity and precision.

최근에는 상기 트랜스퍼 성형과 인젝션 성형이 혼용되고 있으며, 각 금형의 클리닝을 위하여 고무를 시트 형태로 적용하고 있다. 이 경우 고무에 칼금을 넣더라도 미가류 고무의 당기면 잘 안 끊기고 늘어나는 특성상 매끄럽게 끊기 어렵고, 몇 가지 두께와 길이의 시트만으로는 무수한 금형 사이즈를 맞출 수 없어 과량의 고무 투입이 불가피하므로 재료 손실이 심하며, 심지어 두꺼운 금형은 몇 장씩 겹치게 되는 등 작업성도 불량하였다. 이뿐 아니라 트랜스퍼 성형시 금형 내부만 세정할 뿐 트랜스퍼 성형기의 포트(Pot)와 게이트(Gate), 러너(Runner) 등의 청소는 불가능하고, 인젝션 성형시에도 인젝션 실린더 내부와 노즐의 청소는 불가능하였다.Recently, the above transfer molding and injection molding are mixed, and rubber is applied in sheet form for cleaning each mold. In this case, even if a rubber is put into the rubber, the uncured rubber is not easily broken and stretched, and it is difficult to break smoothly.In addition, a few thicknesses and lengths of sheets cannot fit a myriad of mold sizes. The thick mold was also poor in workability, such as overlapping several sheets. In addition, only the inside of the mold was cleaned during the transfer molding, and cleaning of the pot, gate, and runner of the transfer molding machine was impossible, and the injection cylinder and the nozzle could not be cleaned even during injection molding.

따라서, 상술한 단점을 극복하고 클리닝 특성을 효율성있고 간편하게 향상시킬 대체 몰드 클리닝 컴파운드의 개발 필요성이 꾸준히 제기되고 있다. Therefore, there is a constant need to develop an alternative mold cleaning compound that overcomes the above disadvantages and improves the cleaning properties efficiently and simply.

[선행기술문헌] [ Prior Art Document ]

[특허문헌] [ Patent Literature ]

유럽특허등록 제0 687 539 B1호European Patent Registration No. 0 687 539 B1

이에 본 발명자는 트랜스퍼 성형에서 몰드 클리닝 컴파운드를 성형기의 포트(Pot)에 붓고 프레스를 닫으면 포트에서 러너를 통하여 금형 내부(게이트)로 전달되므로 전 구간의 청소가 가능해지고, 인젝션 성형시에도 상기 클리닝 컴파운드를 성형기의 호퍼(Hopper)에 부어 사출하면 사출기 실린더와 노즐, 나아가 금형 전부가 일시에 청소될 뿐 아니라, 정확한 양을 트랜스퍼 또는 사출해낼 수 있어 재료의 손실도 줄일 수 있고, 고무의 상온 끈적거림도 해결할 수 있는 연구를 계속하고, 본 명세서에 개시된 기술을 완성하기에 이르렀다. Therefore, the present inventors pour the mold cleaning compound into the pot of the molding machine in the transfer molding, and when the press is closed, it is transferred to the inside of the mold (gate) through the runner at the port, so that the cleaning of the entire section becomes possible, and the cleaning compound even during injection molding Is injected into the molding machine's hopper, and not only the injection machine cylinder, nozzle, and even the entire mold are cleaned at once, but also the exact amount can be transferred or ejected to reduce the loss of materials and the room temperature stickiness of the rubber. Continued research has been possible to complete the technology disclosed herein.

즉, 본 명세서에 개시된 기술은 반도체 패키징 금형을 클리닝할 수 있는 몰드 클리닝 컴파운드를 제공하는데 그 목적이 있다. In other words, the technique disclosed herein has an object to provide a mold cleaning compound capable of cleaning the semiconductor packaging mold.

또한, 본 명세서에 개시된 기술은 상기 몰드 클리닝 컴파운드를 사용하여 간편하고 효율적으로 반도체 패키징 금형을 클리닝하는 방법을 제공하는데 그 목적이 있다. It is also an object of the present disclosure to provide a method for cleaning a semiconductor packaging mold simply and efficiently using the mold cleaning compound.

상기 해결하고자 하는 과제를 달성하기 위한 일 구현예에 따르면, 반도체 패키징 금형의 클리닝 컴파운드로서, 상기 컴파운드는 구상 또는 원통상인 몰드 클리닝 컴파운드를 제공한다. According to one embodiment for achieving the problem to be solved, as a cleaning compound of the semiconductor packaging mold, the compound provides a spherical or cylindrical mold cleaning compound.

본 명세서에 개시된 기술의 다른 구현예에 따르면, 상술한 몰드 클리닝 컴파운드를 봉지 공정이 완료된 트랜스퍼 성형기의 포트에 붓고 프레스를 닫는 단계; According to another embodiment of the technology disclosed herein, the step of pouring the above-mentioned mold cleaning compound into the port of the transfer molding machine where the sealing process is completed and closing the press;

공급된 몰드 클리닝 컴파운드가 포트로부터 러너를 통하여 금형 내부로 전달되면서 불순물을 흡착시키는 단계; 및 Adsorbing impurities while the supplied mold cleaning compound is transferred from the port to the mold through the runner; And

상기 불순물 흡착으로 클리닝된 컴파운드를 취출하는 단계를 포함하는 반도체 패키징 금형의 클리닝 방법을 제공한다. It provides a cleaning method of a semiconductor packaging mold comprising the step of taking out the compound cleaned by the impurity adsorption.

본 명세서에 개시된 기술의 또 다른 구현예에 따르면, 상술한 몰드 클리닝 컴파운드를 봉지 공정이 완료된 인젝션 성형기의 호퍼(Hopper)에 붓고 사출하는 단계; According to another embodiment of the technology disclosed herein, the step of pouring and injecting the above-described mold cleaning compound into the hopper (Hopper) of the injection molding machine is completed the sealing process;

공급된 몰드 클리닝 컴파운드가 사출기의 실린더와 노즐을 포함하여 금형 전부를 일시에 전달되면서 불순물을 흡착시키는 단계; 및Adsorbing impurities while the supplied mold cleaning compound delivers the entire mold at once including the cylinder and the nozzle of the injection machine; And

상기 불순물 흡착으로 클리닝된 컴파운드를 몰드로부터 취출하는 단계를 포함하는 반도체 패키징 금형의 클리닝 방법을 제공한다. It provides a cleaning method of a semiconductor packaging mold comprising the step of removing the compound cleaned by the impurity adsorption from a mold.

본 명세서에 개시된 기술은 기존 시트 클리닝 방법을 대체하고 간편하고 효율적으로 반도체 패키징 금형을 클리닝할 수 있는 몰드 클리닝 컴파운드와, 이를 클리닝 대상 트랜스퍼 성형 혹은 인젝션 성형의 몰드에 공급함으로써 몰드의 전 구간을 일시에 클리닝하되, 고무의 상온 끈적거림을 해소할 뿐 아니라 클리닝 컴파운드 내 엉킴을 해결하고 작업성과 클리닝 성능이 개선된 반도체 패키징 금형을 클리닝 방법을 제공하는 효과가 있다.The technique disclosed herein replaces the existing sheet cleaning method and provides a mold cleaning compound that can clean the semiconductor packaging mold easily and efficiently, and supplies the entire section of the mold at a time by supplying it to the mold of the transfer molding or the injection molding to be cleaned. Cleaning, but not only eliminate the room temperature stickiness of the rubber, but also to solve the entanglement in the cleaning compound and to provide a cleaning method for the semiconductor packaging mold with improved workability and cleaning performance.

이하, 본 명세서에 개시된 기술에 대해 상세하게 설명한다.Hereinafter, the technique disclosed in this specification is explained in full detail.

본 명세서에 개시된 기술의 일 구현예에 따른 몰드 클리닝 컴파운드는, 반도체 패키징 금형의 클리닝 컴파운드로서, 상기 컴파운드는 구상 또는 원통상일 수 있다. The mold cleaning compound according to one embodiment of the technology disclosed herein is a cleaning compound of a semiconductor packaging mold, and the compound may be spherical or cylindrical.

상기 구상 또는 원통상은 기존 몰드 클리닝 컴파운드 시트 대체재로서 제공되는 것으로, 시트 형태 대신 구상 또는 원통상의 형태로 제공함에 따라 클리닝을 필요로 하는 몰드의 타입, 두께 등에 구애받지 않고 컴파운드의 손실 없이 필요한 함량만큼을 제공할 수 있는 잇점을 갖는다. The spherical or cylindrical shape is provided as a substitute for a conventional mold cleaning compound sheet, and is provided in spherical or cylindrical form instead of a sheet form, and thus a content required without loss of compound regardless of the type and thickness of a mold requiring cleaning. It has the advantage of providing as much.

상기 용어 “구상”은 달리 특정하지 않는 한, 정형 또는 비정형의 구상이고, 직경이 30mm 이하, 혹은 직경이 1 내지 30mm의 펠렛일 수 있다(상기 비정형의 구상에서 직경은 평균 직경을 의미한다). 상기 구상은 바람직하게는 직경이 2 내지 20mm인 것일 수 있다. The term “sphere” is a spherical or atypical spherical, unless otherwise specified, and may be a pellet of 30 mm or less in diameter, or 1 to 30 mm in diameter (in the spherical sphere, the diameter means the average diameter). The spherical shape may be preferably 2 to 20mm in diameter.

상기 직경이 1mm 미만에서는 작업시 클리닝 대상 몰드의 하부 금형상에 과도한 충진횟수를 부여하게 되므로 작업성 측면에서 바람직하지 않을 수 있고, 30mm 초과시엔 기존 시트 클리닝 방법 대비 본 명세서에 개시된 기술에서 달성하고자 하는 미세한 사용량 조절을 도모할 수 없어 역시 바람직하지 않을 수 있다. If the diameter is less than 1mm may be undesirable in terms of workability because it imparts an excessive number of filling on the lower mold of the mold to be cleaned during the operation, when the diameter exceeds 30mm to achieve in the technology disclosed herein compared to the existing sheet cleaning method It may not be desirable to fine control the amount used.

상기 용어 “원통상”은 달리 특정하지 않는 한, 그 단면이 정형 또는 비정형의 원형이고, 지름이 30mm 이하이고 높이가 30mm 이하, 혹은 지름이 1 내지 30mm이고 높이가 1 내지 30mm의 펠렛일 수 있다(여기서 비정형일 때 지름은 평균 지름을 의미한다). 상기 원통상은 바람직하게는 상기 지름이 2 내지 20mm이고, 높이가 2 내지 20mm일 수 있고, 보다 바람직하게는, 지름이 2 내지 10mm이고 높이가 2 내지 20mm일 수 있다.The term “cylindrical”, unless otherwise specified, may be pellets of regular or atypical cross-section, having a diameter of 30 mm or less and a height of 30 mm or less, or a diameter of 1 to 30 mm and a height of 1 to 30 mm. Where diameter is the mean diameter. Preferably, the cylindrical shape may have a diameter of 2 to 20 mm, a height of 2 to 20 mm, and more preferably, a diameter of 2 to 10 mm and a height of 2 to 20 mm.

상기 직경이 1mm 미만에서는 작업시 클리닝 대상 몰드의 하부 금형 상에 과도한 충진 횟수를 부여하게 되므로 작업성 측면에서 바람직하지 않을 수 있고, 30mm 초과시엔 기존 시트 클리닝 방법 대비 본 명세서에 개시된 기술에서 달성하고자 하는 미세한 사용량 조절을 도모할 수 없어 역시 바람직하지 않을 수 있다. When the diameter is less than 1mm, since the number of filling on the lower mold of the mold to be cleaned during operation may be undesirable in terms of workability, when the diameter exceeds 30mm to achieve in the technology disclosed herein compared to the existing sheet cleaning method It may not be desirable to fine control the amount used.

상기 컴파운드는 가교성 주재와 퍼옥사이드계 가교제를 포함하는 것이 바람직한데, 이는 퍼옥사이드계 가교제로 가교시켜 전체 강도를 올림으로써 컴파운드의 고형분 찌꺼기의 흡착력을 높일 수 있기 때문이다. The compound preferably includes a crosslinkable base material and a peroxide crosslinking agent, because the crosslinking with the peroxide crosslinking agent increases the overall strength, thereby increasing the adsorption power of the solid residue of the compound.

상기 가교성 주재는 고무 또는 상온 점착성 저감제를 단독 사용할 수 있으며, 고무를 상술한 구상 또는 원통상으로 가공시 고무 자체가 갖는 상온 끈적거림(점착성)에 의해 달라붙는 특성을 고려하여 상온 점착성 저감제를 배합하여 사용할 수도 있다. The crosslinkable main material may be a rubber or room temperature tackiness reducing agent alone, and room temperature tackiness reducing agent in consideration of the property of sticking by room temperature stickiness (adhesiveness) of rubber itself when processing rubber into spherical or cylindrical shape described above. It can also mix and use.

상기 상온 점착성 저감제는 퍼옥사이드계 가교제로 가교될 수 있는 종류들을 사용할 수 있고, 일례로 가교성 열가소성 고무 또는 DSC 융점이 140℃ 이하인 가교성 수지를 단독 또는 복합 혼합한 것일 수 있다. The room temperature adhesiveness reducing agent may be used a kind that can be crosslinked with a peroxide-based crosslinking agent, for example, may be a crosslinkable thermoplastic rubber or a crosslinkable resin having a DSC melting point of 140 ° C. or less alone or in combination.

여기서 가교성 열가소성 고무는 퍼옥사이드계 가교제로 가교될 수 있는 종류들로서, 스티렌-부타디엔-스티렌 블록(SBS), 스티렌-에틸렌-부타디엔-스티렌 블록(SEBS), 스티렌-에틸렌-프로필렌-스티렌 블록(SEPS), 스티렌-이소프렌-스티렌 블록(SIS) 등의 스티렌-부타디엔계 블록 공중합체, 폴리부타디엔계 열가소성 고무(12-PB), 클로린화 폴리에틸렌 고무(CPE) 및 폴리올레핀계 열가소성 엘라스토머(TPO)로 이루어진 그룹으로부터 선택되는 1종 이상일 수 있다. Here, the crosslinkable thermoplastic rubbers are those which can be crosslinked with a peroxide crosslinking agent, such as styrene-butadiene-styrene block (SBS), styrene-ethylene-butadiene-styrene block (SEBS), and styrene-ethylene-propylene-styrene block (SEPS). ), A group consisting of styrene-butadiene-based block copolymers such as styrene-isoprene-styrene block (SIS), polybutadiene-based thermoplastic rubber (12-PB), chlorinated polyethylene rubber (CPE), and polyolefin-based thermoplastic elastomer (TPO) It may be one or more selected from.

여기서 가교성 수지 또한 퍼옥사이드계 가교제로 가교될 수 있고, 동시에 DSC 융점이 140℃ 이하, 혹은 35 내지 140℃ 범위를 갖는 수지로서, 에틸렌 중합체 및 에틸렌 공중합체 중에서 선택된 1종 이상일 수 있다. 일례로 35도씨 미만이면 뜨거운 여름에 조성물 중 가교성 수지가 녹아 전체 조성물 컴파운드가 보관 중 펠렛끼리 들러붙을 우려가 있다.Here, the crosslinkable resin may also be crosslinked with a peroxide crosslinking agent, and at the same time, the DSC melting point may be 140 ° C. or less, or 35 to 140 ° C., and may be at least one selected from ethylene polymer and ethylene copolymer. For example, if it is less than 35 degrees Celsius, crosslinkable resin may melt | dissolve in a composition in hot summer, and the whole composition compound may stick together pellets during storage.

여기서 에틸렌 중합체는 일례로 저밀도 폴리에틸렌(LDPE), 선형 저밀도 폴리에틸렌(LLDPE), 중밀도 폴리에틸렌(MDPE), 고밀도 폴리에틸렌(HDPE) 등일 수 있다. The ethylene polymer may be, for example, low density polyethylene (LDPE), linear low density polyethylene (LLDPE), medium density polyethylene (MDPE), high density polyethylene (HDPE), or the like.

여기서 에틸렌 공중합체는 i) 에틸렌, 및 ii) C3-C10 알파 올레핀, C3-C20 모노카르복시산의 C1-C12 알킬 에스테르, 불포화 C3-C20 모노 또는 디카르복시산, 불포화 C4-C8 디카르복시산의 무수물 및 포화 C2-C18 카르복시산의 비닐 에스테르 중에서 선택된 1종 이상의 에틸렌성 불포화 단량체의 공중합체이거나 그 공중합체의 이오노머(ionomer)일 수 있다. Wherein the ethylene copolymer is i) ethylene, and ii) C 3 -C 10 alpha olefins, C 1 -C 12 alkyl esters of C 3 -C 20 monocarboxylic acids, unsaturated C 3 -C 20 mono or dicarboxylic acids, unsaturated C 4 It may be a copolymer of at least one ethylenically unsaturated monomer selected from anhydrides of —C 8 dicarboxylic acids and vinyl esters of saturated C 2 -C 18 carboxylic acids or an ionomer of the copolymer.

상기 에틸렌 공중합체는 구체적인 예로, 에틸렌 비닐아세테이트(Ethylene Vinylacetate, EVA), 에틸렌 부틸아크릴레이트(Ethylene Butylacrylate, EBA), 에틸렌 메타크릴레이트(Ethylene Methacrylate), 에틸렌 에틸아크릴레이트(Ethylene Ethylacerylate, EEA), 에틸렌 메틸메타크릴레이트(Ethylene Methylmethacrylate, EMMA), 에틸렌 부텐 공중합체(Ethylene Butene Copolymer, EB-Co), 에틸렌 옥텐 공중합체(Ethylene Octene Copolymer, EO-Co) 등을 들 수 있다. Specific examples of the ethylene copolymers include ethylene vinyl acetate (Ethylene Vinylacetate, EVA), ethylene butyl acrylate (Ethylene Butylacrylate, EBA), ethylene methacrylate (Ethylene Methacrylate), ethylene ethyl acrylate (Ethylene Ethylacerylate, EEA), ethylene Methyl methacrylate (Ethylene Methylmethacrylate, EMMA), ethylene butene copolymer (Ethylene Butene Copolymer, EB-Co), ethylene octene copolymer (Ethylene Octene Copolymer, EO-Co) and the like.

상기 상온 점착성 저감제는 상기 가교제 주재를 구성하는 전체 성분의 최소 5 wt% 이상, 최대 100 wt%로 포함될 수 있다. The room temperature tack reducing agent may be included in at least 5 wt%, up to 100 wt% of the total components constituting the crosslinking agent main body.

상기 상온 점착성 저감제는 상기 가교제 주재를 구성하는 전체 성분의 5 내지 40 wt%, 혹은 5 내지 20 wt%로 포함되는 경우 고무의 상온 점착성 저감 효과를 발휘할 수 있다. When the room temperature tackiness reducing agent is included in 5 to 40 wt%, or 5 to 20 wt% of the total components constituting the crosslinking agent main body can exhibit an effect of reducing the room temperature tack of the rubber.

나아가 상기 가교성 열가소성 고무와 가교성 수지는 단독 또는 혼합하여 사용할 수 있다.Furthermore, the said crosslinkable thermoplastic rubber and crosslinkable resin can be used individually or in mixture.

상기 고무는 천연 고무, 합성 고무 또는 이들의 혼합물일 수 있고, 특히 퍼옥사이드계 가교제로 가교가능한 종류라면 바람직하다. The rubber may be a natural rubber, a synthetic rubber, or a mixture thereof, and particularly, the rubber may be a kind crosslinkable with a peroxide crosslinking agent.

여기서 천연 고무는 일반 천연고무 또는 변성 천연고무일 수 있다. 상기 천연고무는 폴리이소프렌으로서 시스-1,4-폴리이소프렌을 주성분으로 포함하지만, 요구 특성에 따라서는 트란스-1,4-폴리이소프렌을 포함할 수도 있다. 따라서 상기 천연고무에는 시스-1,4-폴리이소프렌을 주체로 포함하는 천연고무 외에, 남미산 사포타과의 고무의 일종인 발라타 등, 트란스-1,4-이소프렌을 주체로 포함하는 천연고무도 포함할 수 있다. 상기 변성 천연고무는 에폭시화 천연고무(ENR). 탈단백 천연고무(DPNR), 수소화 천연고무 등을 들 수 있다. 상기 천연고무는 크레이프 고무(crepe rubber), 시트 고무(sheet rubber), 스킴 고무(skim rubber) 등일 수 있고, 이에 한정되지 않는다. Herein, the natural rubber may be general natural rubber or modified natural rubber. The natural rubber contains cis-1,4-polyisoprene as a main component as polyisoprene, but may also contain trans-1,4-polyisoprene depending on the required properties. Therefore, in the natural rubber, in addition to the natural rubber mainly containing cis-1,4-polyisoprene, natural rubber including trans-1,4-isoprene, such as balata, which is a kind of rubber of South American Sapotagua. It may include. The modified natural rubber is epoxidized natural rubber (ENR). Deproteinized natural rubber (DPNR), hydrogenated natural rubber, and the like. The natural rubber may be crepe rubber, sheet rubber, skim rubber, or the like, but is not limited thereto.

상기 합성 고무는 스티렌-부타디엔 고무(SBR), 부타디엔 고무(BR), 아크릴로니트릴-부타디엔 고무(NBR), 에틸렌-프로필렌 고무(EPR), 에틸렌-프로필렌 디엔 고무(EPDM), 이소부틸렌-이소프렌 고무(IIR) 및 실리콘 고무를 포함하는 그룹으로부터 선택된 1종 이상일 수 있다. The synthetic rubber is styrene-butadiene rubber (SBR), butadiene rubber (BR), acrylonitrile-butadiene rubber (NBR), ethylene-propylene rubber (EPR), ethylene-propylene diene rubber (EPDM), isobutylene-isoprene It may be at least one selected from the group comprising rubber (IIR) and silicone rubber.

상기 퍼옥사이드계 가교제는 퍼옥사이드 작용기를 갖고 상기 고무와 상온 점착성 저감제를 모두 퍼옥사이드 가교시킬 수 있는 종류를 사용하며, 그 함량은 가교성 주재 100 중량부 기준으로 0.5 내지 10 중량부, 혹은 1 내지 5 중량부일 수 있고, 상기 범위 내에서 고무와 상온 점착성 저감제를 함께 가교함에 따라 강도를 보강하고 클리닝시 고형분 찌꺼기의 흡착력을 높일 수 있다. The peroxide-based crosslinking agent has a peroxide functional group and uses a kind capable of peroxide crosslinking of both the rubber and the room temperature tackifier, and the content thereof is 0.5 to 10 parts by weight, or 1 based on 100 parts by weight of the crosslinkable base material. It may be from 5 parts by weight, by reinforcing the rubber and room temperature adhesiveness reducing agent together in the above range can reinforce the strength and increase the adsorption power of the solid residue during cleaning.

상기 퍼옥사이드계 가교제는 일례로, 1,1-비스(t-부틸퍼옥시)-3,3,5-트리메틸 사이클로헥산, 1,1-비스(t-부틸퍼옥시)사이클로헥산, t-부틸퍼옥시 말레산, t-부틸퍼옥시레이트, t-부틸퍼옥시-3,3,5-트리메틸헥사노에이트, 시클로헥사논 퍼옥사이드, t-부틸퍼옥시 아릴 카보네이트, t-부틸퍼옥시 이소프로필 카보네이트, 2,5-디메틸-2,5-디(벤조일퍼옥시)헥산, 2,2-비스(t-부틸퍼옥시)옥탄, t-부틸퍼옥시 아세테이트, 2,2-비스(t-부틸퍼옥시)부탄, t-부틸퍼옥시벤조에이트, n-부틸-4,4-비스(t-부틸퍼옥시)발레레이트, 디-t-부틸퍼옥시 이소프탈레이트, 메틸에틸케톤 퍼옥사이드, 디쿠밀 퍼옥사이드, 2,5-디메틸-2,5-디(t-부틸퍼옥시)헥산, α,α'-비스(t-부틸퍼옥시-m-이소프로필) 벤젠, t-부틸 쿠밀 퍼옥사이드, 디-이소프로필벤젠 하이드로퍼옥사이드, 디-t-부틸 퍼옥사이드 및 2,5-디메틸-2,5-디(t-부틸퍼옥시)헥산으로 구성되는 그룹으로부터 선택된 1종 이상일 수 있다. The peroxide crosslinking agent is, for example, 1,1-bis (t-butylperoxy) -3,3,5-trimethyl cyclohexane, 1,1-bis (t-butylperoxy) cyclohexane, t-butyl Peroxy maleic acid, t-butylperoxylate, t-butylperoxy-3,3,5-trimethylhexanoate, cyclohexanone peroxide, t-butylperoxy aryl carbonate, t-butylperoxy isopropyl Carbonate, 2,5-dimethyl-2,5-di (benzoylperoxy) hexane, 2,2-bis (t-butylperoxy) octane, t-butylperoxy acetate, 2,2-bis (t-butyl Peroxy) butane, t-butylperoxybenzoate, n-butyl-4,4-bis (t-butylperoxy) valerate, di-t-butylperoxy isophthalate, methylethylketone peroxide, dicumyl Peroxide, 2,5-dimethyl-2,5-di (t-butylperoxy) hexane, α, α'-bis (t-butylperoxy-m-isopropyl) benzene, t-butyl cumyl peroxide, Di-isopropylbenzene hydroperoxide, di-t-butyl peroxide and 2,5-di It may be at least one selected from the group consisting of methyl-2,5-di (t-butylperoxy) hexane.

나아가 세정제, 세정보조제 및 흡착제 중 1 이상의 첨가제를 더 포함할 수 있다. Furthermore, it may further include one or more additives of a detergent, a tax aid and an adsorbent.

상기 세정제는 일례로, 아미노 알콜 또는 아미노 알콜과 유기산 또는 무기산을 반응(중화)시켜 조제된 아미노 알콜염을 사용할 수 있다. 아미노 알콜염으로 함으로써, 클리닝 도중 아미노 알콜은 염으로서 고정되어 아미노 알콜의 휘발이 방지될 뿐 아니라 통상의 몰드 클리닝 온도(165℃ 이상、최대 200℃ 이하)에서 아미노 알콜로 분해하여 소정의 몰드 클리닝 효과를 발휘할 수 있다. 상기 아미노 알콜염은 미리 염으로서 제조한 것을 배합하여도 좋고, 아미노 알콜과 유기산 또는 무기산을 단독 배합해 반응시킴으로써 아미노 알콜염으로서 제조할 수도 있다. As the cleaning agent, for example, an amino alcohol salt prepared by reacting (neutralizing) an amino alcohol or an amino alcohol with an organic or inorganic acid may be used. By using the amino alcohol salt, the amino alcohol is fixed as a salt during cleaning to prevent volatilization of the amino alcohol, and decomposes into amino alcohol at a normal mold cleaning temperature (165 ° C. or higher and 200 ° C. or lower), thereby providing a predetermined mold cleaning effect. Can exert. The said amino alcohol salt may mix | blend what was previously prepared as a salt, and can also manufacture it as an amino alcohol salt by mixing and reacting an amino alcohol, an organic acid, or an inorganic acid individually.

여기서 아미노 알콜은, 일례로 모노에탄올 아민, 디에탄올 아민, 트리에탄올아민, N-메틸 에탄올아민, N,N-디메틸 에탄올아민, N,N-디부틸 에탄올아민, N,N-디에틸 에탄올아민, N-메틸-N,N-디에탄올 아민, 2-아미노-2-메틸 프로판올, 3-아미노 프로판올 및 2-아미노 프로판올로 구성되는 그룹으로부터 선택한 적어도 1종이며, 바람직하게는, 모노에탄올 아민, 디에탄올 아민, 2-아미노-2-메틸 프로판올, 3-아미노 프로판올 및 2-아미노 프로판올로 이루어진 그룹으로부터 선택된 1종 이상일 수 있다. Wherein the amino alcohol is, for example, monoethanol amine, diethanol amine, triethanolamine, N-methyl ethanolamine, N, N-dimethyl ethanolamine, N, N-dibutyl ethanolamine, N, N-diethyl ethanolamine, At least one selected from the group consisting of N-methyl-N, N-diethanol amine, 2-amino-2-methyl propanol, 3-amino propanol and 2-amino propanol, preferably monoethanol amine, di It may be at least one selected from the group consisting of ethanol amine, 2-amino-2-methyl propanol, 3-amino propanol and 2-amino propanol.

여기서 유기산은 일례로 포름산, 초산, 프로피온산, 낙산, 이소낙산, 길초산, 이소길초산, 피발산, 크로톤산, 카프로산, 카프릴산, 카프린산, 라우린산, 미리스틴산, 팔미트산, 스테아린산, 옥살산, 말론산, 호박산, 주석산, 글루타르산, 아디프산(adipic acid), 피멜산, 수베르산(suberic acid), 아데라인산, 세바스산, 안식향산, 프탈산 및 이소프탈산 중에서 선택된 1종 이상일 수 있다. The organic acid may be, for example, formic acid, acetic acid, propionic acid, butyric acid, isobutyric acid, gilacetic acid, isogilic acid, pivalic acid, crotonic acid, caproic acid, caprylic acid, capric acid, lauric acid, myristic acid, and palmitic acid. Selected from acids, stearic acid, oxalic acid, malonic acid, succinic acid, tartaric acid, glutaric acid, adipic acid, pimelic acid, suberic acid, aderic acid, sebacic acid, benzoic acid, phthalic acid and isophthalic acid It may be one or more.

여기서 무기산은 일례로, 염산 또는 초산을 이용할 수 있다. The inorganic acid may be, for example, hydrochloric acid or acetic acid.

상기 세정제는 상기 가교성 주재 100 중량부 기준으로, 1.0 내지 30 중량부, 혹은 3.0 내지 25 중량부로 사용할 수 있고, 이 범위 내에서 충분한 몰드 클리닝 효과를 제공할 뿐 아니라, 몰드 클리닝 후 몰드 클리닝 컴파운드를 몰드로부터 취출시 끊어지거나 잔류하지 않고 깨끗하게 떼어진다. The cleaning agent may be used in an amount of 1.0 to 30 parts by weight, or 3.0 to 25 parts by weight based on 100 parts by weight of the crosslinkable base material, and may provide sufficient mold cleaning effect within this range, and may also provide mold cleaning compound after mold cleaning. When taken out from the mold, it does not break or remain clean.

상기 세정보조제는 일례로, 에틸렌글리콜, 디에틸렌글리콜, 트리에틸렌 글리콜, 프로필렌 글리콜, 디프로필렌글리콜, 글리콜 에테르, 및 글리콜 에스테르로 구성되는 그룹으로부터 선택되는 1종 이상으로서, 상기 가교성 주재 100 중량부 기준으로, 1.0 내지 30 중량부, 혹은 3.0 내지 25 중량부로 사용할 수 있고, 이 범위 내에서 과잉의 글리콜류가 몰드 표현에 남는 문제 없이 충분한 금형 세정 효과를 제공할 수 있다. The detail information aid is, for example, at least one selected from the group consisting of ethylene glycol, diethylene glycol, triethylene glycol, propylene glycol, dipropylene glycol, glycol ethers, and glycol esters, wherein 100 parts by weight of the crosslinkable base material As a reference, it can be used in 1.0 to 30 parts by weight, or 3.0 to 25 parts by weight, within this range can provide a sufficient mold cleaning effect without the problem that excess glycols remain in the mold representation.

상기 흡착제는 카본 블랙, 실리카, 활성 알루미나, 활성 탄소, 마그네슘 옥사이드, 티타늄 옥사이드, 마그네슘 카보네이트, 칼슘 카보네이트, 벤토나이트 및 규조토로 구성되는 그룹으로부터 선택되는 1종 이상으로서, 상기 가교성 주재 100 중량부 기준으로, 10 내지 90 중량부, 혹은 20 내지 70 중량부 범위 내로 사용할 수 있고, 이 범위 내에서 오염물인 고형분 찌꺼기를 몰드 표면으로부터 잘 벗겨낼 뿐 아니라, 몰드 클리닝후 컴파운드의 취출시 복잡한 형상의 몰드에서는 도중에 몰드에 잔류하는 현상이 흔하므로 충분한 보강성을 부여할 수 있다. The adsorbent is one or more selected from the group consisting of carbon black, silica, activated alumina, activated carbon, magnesium oxide, titanium oxide, magnesium carbonate, calcium carbonate, bentonite and diatomaceous earth, based on 100 parts by weight of the crosslinkable base material. It can be used in the range of 10 to 90 parts by weight, or 20 to 70 parts by weight, and within this range, the solid residues, which are contaminants, are well peeled off from the mold surface. Since the phenomenon which remains in a mold is common, sufficient reinforcement can be provided.

상기 몰드 클리닝 컴파운드는 스코치성, 세정 흡착력, 세정성, 세정제 적합성이 모두 우수할 뿐 아니라 수중 펠렛타이징, 건식 단면 절삭 펠렛타이징, 수중 스트랜드 펠렛타이징이 모두 용이한 특성을 제공할 수 있다. The mold cleaning compound is not only excellent in scorch property, cleaning adsorption power, cleaning property, detergent suitability, but also can provide easy properties such as underwater pelletizing, dry cross-sectional cutting pelletizing, underwater strand pelletizing.

본 명세서에 개시된 기술의 일 구현예에 따른 몰드 클리닝 컴파운드는 필요에 따라 스테아린산 또는 에틸렌 비스스테아라미드와 같은 연화제, 산화아연 등의 가교조제가 반응에 악영향을 미치지 않는 범위 내에서 더 함유될 수 있다. 일례로, 상기 고분자 기재 100 중량부에 대하여, 상기 연화제는 0.1 내지 5 중량부, 혹은 0.1 내지 3 중량부 범위 내로 더 포함될 수 있고, 상기 가교조제는 0.5 내지 8 중량부, 혹은 3 내지 7 중량부 범위 내로 더 포함될 수 있다. The mold cleaning compound according to one embodiment of the technology disclosed herein may be further contained in a range in which a crosslinking aid such as a softener such as stearic acid or ethylene bis stearamide and zinc oxide does not adversely affect the reaction as necessary. For example, with respect to 100 parts by weight of the polymer substrate, the softener 0.1 to 5 parts by weight, or may be further included in the range of 0.1 to 3 parts by weight, and the crosslinking aid may be further included in the range of 0.5 to 8 parts by weight, or 3 to 7 parts by weight.

기존의 시트 클리닝 방법 대신 본 명세서에 개시된 기술에 따른 몰드 클리닝 컴파운드를 사용한 트랜스터 몰드의 클리닝 방법은 일례로 다음과 같이 수행될 수 있다:The cleaning method of the transfer mold using the mold cleaning compound according to the technology disclosed herein instead of the existing sheet cleaning method may be performed as follows, for example:

우선, 상기 몰드 클리닝 컴파운드를 봉지 공정이 완료된 트랜스퍼 성형기의 포트에 붓고 프레스를 닫는다. 여기서 컴파운드의 사용 함량은 다양한 몰드 형상에 대하여 숙련된 기술자에 의해 최적화될 수 있다.First, the mold cleaning compound is poured into the port of the transfer molding machine where the sealing process is completed, and the press is closed. The use content of the compound here can be optimized by the skilled person for various mold shapes.

공급된 몰드 클리닝 컴파운드가 포트로부터 러너를 통하여 금형 내부로 전달되면서 불순물을 흡착시킨다. 여기서 가압은 165℃ 이상, 최대 200℃의 가온 조건하에 수행할 수 있다. The supplied mold cleaning compound is transferred from the pot through the runner into the mold to adsorb impurities. The pressurization may be carried out under heating conditions of at least 165 ° C., up to 200 ° C.

특히, 펠렛 형태로 사용함으로써 정확한 양을 트랜스퍼할 뿐 아니라 재료의 손실도 줄이는 잇점을 함께 제공하게 된다. In particular, the use of pellets provides the benefits of not only transferring the correct amount but also reducing the loss of material.

상기 불순물 흡착으로 클리닝된 컴파운드를 몰드로부터 취출한다. 이때 몰드의 전 구간에 걸쳐 어떠한 잔류물도 없이 깨끗한 취출을 수행할 수 있다.The compound cleaned by the impurity adsorption is taken out from the mold. At this time, a clean takeout can be performed without any residue over the entire section of the mold.

나아가, 본 명세서에 개시된 클리닝 컴파운드를 사용한 인젝션 몰드의 클리닝 방법은 일례로 다음과 같이 수행될 수 있다:Furthermore, the cleaning method of the injection mold using the cleaning compound disclosed herein may be performed as follows, for example:

우선, 상기 몰드 클리닝 컴파운드를 봉지 공정이 완료된 인젝션 성형기의 호퍼(Hopper)에 붓고 사출한다. 여기서 컴파운드의 사용 함량은 다양한 몰드 형상에 대하여 숙련된 기술자에 의해 최적화될 수 있다. First, the mold cleaning compound is poured into a hopper of an injection molding machine where the sealing process is completed and injected. The use content of the compound here can be optimized by the skilled person for various mold shapes.

공급된 몰드 클리닝 컴파운드가 사출기의 실린더와 노즐, 나아가 금형 전부를 일시에 전달되면서 불순물을 흡착시킨다. 여기서 가압은 165℃ 이상, 최대 200℃의 가온 조건하에 수행한 것일 수 있다. 특히, 펠렛 형태로 사용함으로써 정확한 양을 사출할 뿐 아니라 재료의 손실도 줄이는 잇점을 함께 제공하게 된다. The supplied mold cleaning compound delivers the cylinder, nozzle, and even the entire mold of the injection molding machine at once to adsorb impurities. In this case, the pressurization may be performed under heating conditions of 165 ° C. or more and a maximum of 200 ° C. In particular, the use of pellets provides the benefits of not only injecting the correct amount but also reducing the loss of material.

상기 불순물 흡착으로 클리닝된 컴파운드를 몰드로부터 취출한다. 이때 몰드의 전 구간에 걸쳐 어떠한 잔류물도 없이 깨끗한 취출을 수행할 수 있다.The compound cleaned by the impurity adsorption is taken out from the mold. At this time, a clean takeout can be performed without any residue over the entire section of the mold.

이하 본 명세서에 개시된 기술을 다양한 실시예를 통하여 설명하고자 하나 본 명세서에 개시된 기술의 기술적 사상이 하기 실시예에 의해 국한되는 것은 아니다.Hereinafter, the technology disclosed herein will be described through various embodiments, but the technical spirit of the technology disclosed herein is not limited to the following embodiments.

[실시예]EXAMPLE

<실시예 1-7, 비교예 1-6><Example 1-7, Comparative Example 1-6>

고무 원료Rubber raw material

고무1(천연 고무): 하이 시스-부타디엔 러버Rubber 1 (natural rubber): high sheath-butadiene rubber

고무2(합성 고무): 에틸렌-프로필렌-디엔 고무(EPDM)Rubber 2 (synthetic rubber): ethylene-propylene-diene rubber (EPDM)

상온 점착성 저감제 원료Room Temperature Tackifier

가교성* 열가소성 고무1: 스티렌-부타디엔계 블록 공중합체(LG Ghem, LG401: 스티렌 20wt%, 밀도 0.93 kg/cc, 경도 57 Shore A)Crosslinkability * Thermoplastic Rubber 1: Styrene-Butadiene Block Copolymer (LG Ghem, LG401: Styrene 20wt%, Density 0.93 kg / cc, Hardness 57 Shore A)

가교성* 열가소성 고무2: 폴리부타디엔계 열가소성 고무(12-PB) (JSR, RB820: 밀도: 0.91g/cc, DSC 융점 95℃)Crosslinkability * Thermoplastic rubber 2: Polybutadiene-based thermoplastic rubber (12-PB) (JSR, RB820: Density: 0.91 g / cc, DSC melting point 95 ° C)

비가교성* 열가소성 고무1: 열가소성 폴리우레탄(TPU) (동성하이켐, 5075A: 경도 75 Shore A, 연화점 75℃)Non-crosslinkable * Thermoplastic Rubber 1: Thermoplastic Polyurethane (TPU) (Dongsung Hi-Chem, 5075A: Hardness 75 Shore A, Softening Point 75 ℃)

가교성* 수지1: 에틸렌비닐아세테이트(EVA) (Hanhwa Chem, EVA 1317: 비닐 아세테이트 21wt%, MI 2.5, DSC 융점 81℃)Crosslinkability * Resin 1: Ethylene vinyl acetate (EVA) (Hanhwa Chem, EVA 1317: 21 wt% vinyl acetate, MI 2.5, DSC melting point 81 ° C.)

가교성* 수지2: 고밀도 폴리에틸렌(HDPE) (LG Chem, BE0350: 밀도: 0.96 g/cc, DSC 융점 134℃)Crosslinkability * Resin 2: High Density Polyethylene (HDPE) (LG Chem, BE0350: Density: 0.96 g / cc, DSC Melting Point 134 ° C)

가교성* 수지3: 에틸렌 프로필렌 공중합체 (LyondellbaseII, CA02A: 경도 75 Shore A, DSC 융점 141℃)Crosslinkability * Resin 3: Ethylene Propylene Copolymer (Lyondellbase II, CA02A: Hardness 75 Shore A, DSC Melting Point 141 ° C)

비가교성* 수지1: 랜덤 프로필렌 공중합체 (LG Chem, SEETEC R6400: DSC 융점 134℃)Uncrosslinked * Resin 1: Random propylene copolymer (LG Chem, SEETEC R6400: DSC melting point 134 ° C)

*상기 가교성/비가교성은 퍼옥사이드계 가교제와의 가교성 유무에 기초한다. * The crosslinkability / non-crosslinkability is based on the presence or absence of crosslinkability with the peroxide crosslinking agent.

첨가제additive

DCP: 디큐밀 퍼옥사이드 가교제DCP: Dicumyl Peroxide Crosslinker

세정제: 2-아미노-2-메틸-1-프로판올Detergent: 2-amino-2-methyl-1-propanol

세정보조제: 디에틸렌 글리콜Tax preparation: Diethylene glycol

흡착제: 수화 실리카(Hydrated Silica) Zeosil 45Adsorbent: Hydrated Silica Zeosil 45

<몰드 클리닝 컴파운드 제조(실시예 1-7, 비교예 1-6)><Mold Cleaning Compound Preparation (Example 1-7, Comparative Example 1-6)>

하기 표 1,2에 개시한 조성에 따라 용량 1L의 니더(Kneader)에 고무와 상온 점착성 저감제로서 가교성(혹은 비가교성) 열가소성 고무, 가교성(혹은 비가교성) 수지를 배합하고 5분간 혼합하였다. 혼합 후 상기 가교성 주재 100 중량부에 대하여 흡착제 60 중량부, 세정제 20 중량부, 세정보조제 20 중량부, 가교제(DCP) 2.0 중량부, 스테아린산 연화제 1.0 중량부 및 아연화 가교조제로서 산화아연 5.0 중량부를 추가투입하고 1분 동안 더 혼합한 뒤 반응을 종결하고, Open Mill에서 총 15종의 시트상 혼합물을 수득하였다.According to the composition shown in Tables 1 and 2, a crosslinkable (or noncrosslinkable) thermoplastic rubber and a crosslinkable (or noncrosslinkable) resin are mixed and mixed for 5 minutes in a kneader having a capacity of 1 L as a pressure-sensitive adhesive reducing agent. It was. 60 parts by weight of adsorbent, 20 parts by weight of detergent, 20 parts by weight of cross-linking agent (DCP), 1.0 parts by weight of stearic acid softener, 1.0 parts by weight of stearic acid softener and 5.0 parts by weight of zinc oxide as zinc cross-linking aid after mixing After addition and further mixing for 1 minute, the reaction was terminated and a total of 15 sheet-like mixtures were obtained in Open Mill.

수득된 시트상 혼합물에 대하여 다음과 같은 펠렛타이징 실험을 수행하고 측정 결과를 하기 표 1,2에 함께 정리하였다.The following pelletizing experiment was performed on the obtained sheet-like mixture, and the measurement results are summarized together in Tables 1 and 2 below.

수중 절삭(Underwater Cutting): 수중 절삭시 다이에서 엉켜 절삭이 안 되거나, 절삭이 되더라도 절삭후 냉각시켜 30g을 봉투에 넣고 40℃ 오븐에 넣어 1kg 추로 누른 채 24시간 재치후 꺼냈을 때 구상 펠렛끼리 달라붙어있으면 불량(X)으로 평가하였다. Underwater Cutting : When cutting underwater, it is not possible to get tangled in the die, or even if it is cut, cool it after cutting and put it in a bag, put it in a bag, put it in a 40 ℃ oven, press it with a 1kg weight, and put it on the plate for 24 hours. If there was, it evaluated as bad (X).

건식 단면 절삭(Dry Face Cutting): 건식 단면절삭(Dry Face Cutting)시 펠렛끼리 엉키지 않도록 탈크 분말을 뿌린 다음 30g을 봉투에 넣고 40℃ 오븐에 넣어 1kg 추로 누른 채 24시간 재치후 꺼냈을 때 원통상 펠렛끼리 달라붙어 있으면 불량(X)으로 평가하였다. Dry Face Cutting : When dry face cutting, sprinkle talc powder so that the pellets do not get tangled, then put 30g into a bag, put it in a 40 ℃ oven, press it with a 1kg weight, and take it out for 24 hours. If stuck together, it evaluated as bad (X).

결과 수득된 펠렛에 대하여 이하의 시험 방식에 따라 측정한 물성 측정 결과를 하기 표 1,2에 정리하였다. Results The physical properties measured according to the following test methods for the obtained pellets are summarized in Tables 1 and 2 below.

<시험방식><Test Method>

스코치 (Scorch) 특성: 각 클리닝 컴파운드의 용융지수를 130℃, 10.0Kg 조건으로 측정하였으며, 측정치가 10g/10min 미만일 때 스코치성이 불량한 것(X)으로 평가하였다. Scorch characteristics : The melt index of each cleaning compound was measured at 130 ° C. and 10.0 Kg. When the measured value was less than 10 g / 10 min, the scorch property was evaluated as poor (X).

세정흡착력: 바닥에 직경 1mm x 높이 2mm의 구멍이 가로세로 5mm 간격으로 배열된 10cm X 10cm X 5mm 사이즈 금형을 트랜스퍼 성형기에 장착하고, 클리닝 컴파운드를 70g 성형기의 포트에 붓고 가압하여 175℃에서 10분간 가류시킨 뒤 탈형하였으며, 완전히 탈형되면 우수(○)로, 구멍에 한 개라도 안 빠지고 박혀 있으면 불량(X)으로 평가하였다. Desorption power : 10cm X 10cm X 5mm molds with holes 1mm in diameter x 2mm in height are arranged in the transfer molding machine at the bottom, and the cleaning compound is poured into the pot of 70g molding machine and pressed for 10 minutes at 175 ℃. After vulcanization, the mold was demolded, and if the mold was completely demolded, it was evaluated as good (○), and if it was stuck in one hole, it was regarded as bad (X).

세정성: 10cm X 10cm X 5mm의 금형을 트랜스퍼 성형기에 장착하고 EMC(Epoxy Molding Compound)로 10회 성형 후 실시예 비교예의 조성물로 청소를 하여 청소하고 빼낸 세정제 조성물 성형품의 색깔과 청소된 금형의 표면의 색깔을 육안으로 관찰하고 성형품이 금형의 때로 많이 오염되고 금형의 표면이 깨끗할수록 우수(O) 그 반대의 경우를 불량(X)으로 평가하였다. Cleanability : The mold of 10cm X 10cm X 5mm is mounted on the transfer molding machine After cleaning 10 times with EMC (Epoxy Molding Compound), cleaning and removing the cleaning composition with the composition of the comparative example. The color of the molded product and the color of the surface of the cleaned mold were visually observed. The cleaner the surface of, the better (O) and vice versa were evaluated as bad (X).

세정제 적합성: 절삭성은 수중절삭 단면절삭 둘 중 한가지라도 양호하면 적합, 둘 다 불량이면 부적합으로 표시하였다. 스코치성, 세정흡착력과 세정성이 모두 양호하면 적합, 한가지라도 불량하면 부적합으로 표기하였다. Detergent suitability : Machinability is marked as good if at least one of the two underwater cutting sections is suitable, and not suitable if both are bad. Scorching, detergency, and detergency were all good and good.

실시예 구분Example Classification 1One 2 3 4 5 6 고무1**Rubber 1 ** 4040 4040 4040 4040 4545 4545 3030 고무2**Rubber 2 ** 4040 4040 4040 4040 4545 4545 3030 가교성열가소성고무1**Crosslinkable Thermoplastic Rubber 1 ** 2020 1010 가교성열가소성고무2**Crosslinkable Thermoplastic Rubber 2 ** 2020 비가교성열가소성고무1**Non-crosslinked thermoplastic rubber 1 ** 가교성수지1**Crosslinkable Resin 1 ** 2020 1010 4040 가교성수지2**Crosslinkable Resin 2 ** 2020 가교성수지3**Crosslinkable Resin 3 ** 비가교성수지1**Non-crosslinked resin 1 ** 스테아린산***Stearic Acid *** 1.01.0 1.01.0 1.01.0 1.01.0 1.01.0 1.01.0 1.01.0 아연화***Galvanized *** 5.05.0 5.05.0 5.05.0 5.05.0 5.05.0 5.05.0 5.05.0 DCP***DCP *** 2.02.0 2.02.0 2.02.0 2.02.0 2.02.0 2.02.0 2.02.0 세정제***detergent*** 2020 2020 2020 2020 2020 2020 2020 세정보조제***Tax Information Determination *** 2020 2020 2020 2020 2020 2020 2020 흡착제***absorbent*** 6060 6060 6060 6060 6060 6060 6060 수중 절삭Underwater cutting XX XX 단면 절삭Section cutting 스코치성Scotch Castle 세정 흡착력Cleaning adsorption 세정성Detergency 세정제 적합성Cleaner compatibility

(***의 함량은 **의 함량 총 100 중량부 기준으로 한 중량부이다.)(The content of *** is based on 100 parts by weight of the total content of **.)

비교예 구분Comparative example 1One 2 3 4 5 6 고무1**Rubber 1 ** 100100 5050 4040 4040 4040 고무2**Rubber 2 ** 100100 5050 4040 4040 4040 가교성열가소성고무1**Crosslinkable Thermoplastic Rubber 1 ** 가교성열가소성고무2**Crosslinkable Thermoplastic Rubber 2 ** 비가교성열가소성고무1**Non-crosslinked thermoplastic rubber 1 ** 2020 가교성수지1**Crosslinkable Resin 1 ** 가교성수지2**Crosslinkable Resin 2 ** 가교성수지3**Crosslinkable Resin 3 ** 2020 비가교성수지1**Non-crosslinked resin 1 ** 2020 스테아린산***Stearic Acid *** 1.01.0 1.01.0 1.01.0 1.01.0 1.01.0 1.01.0 아연화***Galvanized *** 5.05.0 5.05.0 5.05.0 5.05.0 5.05.0 5.05.0 DCP***DCP *** 2.02.0 2.02.0 2.02.0 2.02.0 2.02.0 2.02.0 세정제***detergent*** 2020 2020 2020 2020 2020 2020 세정보조제***Tax Information Determination *** 2020 2020 2020 2020 2020 2020 흡착제***absorbent*** 6060 6060 6060 6060 6060 6060 수중 절삭Underwater cutting XX XX XX XX 단면 절삭Section cutting XX XX XX 스코치성Scotch Castle XX 세정 흡착력Cleaning adsorption XX XX 세정성Detergency XX XX 세정제 적합성Cleaner compatibility XX XX XX XX XX XX

(***의 함량은 **의 함량 총 100 중량부 기준으로 한 중량부이다.)(The content of *** is based on 100 parts by weight of the total content of **.)

상기 표 1 및 2에서 보듯이, 본 명세서에 개시된 기술에 따른 실시예 1 내지 7에서는 수중 절삭 또는 단면 절삭에 의해 구상 또는 원통상의 펠릿을 제조하며, 스코치 특성, 세정 흡착력, 세정성, 세정제 적합성 면에서 모두 바람직하였다. ·As shown in Tables 1 and 2, in Examples 1 to 7 according to the technology disclosed in the present disclosure, spherical or cylindrical pellets are prepared by cutting underwater or cutting in section, and have scorch characteristics, cleaning adsorption, cleaning and suitability. In terms of both, it was preferred. ·

반면, 가교성 열가소성 고무 또는 가교성 수지와 같은 상온 점착성 저감제를 전혀 사용하지 않은 비교예 1 내지 4, 6에서는 세정제 적합성 면에서 모두 바람직하지 않았고, 세정 흡착력과 세정성 측면에서도 일부 바람직하지 않았다. On the other hand, in Comparative Examples 1 to 4 and 6 in which no room temperature tackifiers such as crosslinkable thermoplastic rubber or crosslinkable resin were used at all, they were not preferable in terms of detergent suitability, and some were not preferable in terms of cleaning adsorption and cleaning properties.

또한, 가교성 수지를 사용하더라도 DSC 융점이 140℃를 초과한 비교예 5에서는 스코치성과 세정제 적합성이 바람직하지 않은 것을 확인하였다. Moreover, even when using a crosslinkable resin, it confirmed that the scorch property and detergent suitability were not preferable in the comparative example 5 which DSC melting | fusing point exceeded 140 degreeC.

따라서 상기 표 1, 2의 결과로부터 본 명세서에 개시된 기술의 몰드 클리닝 컴파운드는 상온 점착성 저감제의 사용에 따라 수중 절삭, 단면 절삭시 펠렛의 엉킴을 효과적으로 해결하고, 스코치 특성, 세정 흡착력, 세정성과 세정제 적합성 측면에서 탁월한 개선을 제공하는 장점이 있다. Therefore, from the results of Tables 1 and 2, the mold cleaning compound of the technique disclosed in the present specification effectively solves the entanglement of pellets during underwater cutting and cross-section cutting according to the use of a room temperature tackifier, and has a scorch property, a cleaning adsorption power, a cleaning property and a cleaning agent. This has the advantage of providing excellent improvement in terms of suitability.

<추가 실험예 1 내지 3>Additional Experimental Examples 1 to 3

추가 실험예로서, 상기 실시예 1에서 하기 표 3에 따른 조성을 적용한 것을 제외하고는 실시예 1과 동일한 공정을 반복하고 수중 절삭과 단면 절삭 가부, 펠렛의 형상 및 물성 측정 결과를 하기 표 3에 함께 나타내었다. As a further experimental example, the same process as in Example 1 was repeated except that the composition according to Table 3 was applied in Example 1, and the results of underwater cutting and cross-section cutting, pellet shape and physical properties were measured together with Table 3 below. Indicated.

추가 실험예 구분Additional Experiment Example 1One 2 33 고무1**Rubber 1 ** 4848 4848 고무2**Rubber 2 ** 4848 4848 가교성열가소성고무1**Crosslinkable Thermoplastic Rubber 1 ** 44 가교성열가소성고무2**Crosslinkable Thermoplastic Rubber 2 ** 비가교성열가소성고무1**Non-crosslinked thermoplastic rubber 1 ** 가교성수지1**Crosslinkable Resin 1 ** 44 100100 가교성수지2**Crosslinkable Resin 2 ** 가교성수지3**Crosslinkable Resin 3 ** 비가교성수지1**Non-crosslinked resin 1 ** 스테아린산***Stearic Acid *** 1.01.0 1.01.0 1.01.0 아연화***Galvanized *** 5.05.0 5.05.0 5.05.0 DCP***DCP *** 2.02.0 2.02.0 2.02.0 세정제***detergent*** 2020 2020 2020 세정보조제***Tax Information Determination *** 2020 2020 2020 흡착제***absorbent*** 6060 6060 4040 수중 절삭Underwater cutting XX XX OO 단면 절삭Section cutting XX XX OO 스코치성Scotch Castle 세정 흡착력Cleaning adsorption 세정성Detergency 세정제 적합성Cleaner compatibility XX XX

(***의 함량은 **의 함량 총 100 중량부 기준으로 한 중량부이다.)(The content of *** is based on 100 parts by weight of the total content of **.)

상기 표 3에서 보듯이, 추가 실험예의 경우 상온 점착성 저감제를 사용하더라도 충분한 함량을 적용하지 않으면 수중 절삭, 단면 절삭과 세정제 적합성 측면에서 바람직하지 않은 결과를 보였고, 공중합체 가교성수지-1을 단독 사용한 경우 바람직한 결과를 보이는 것을 추가로 확인할 수 있었다. As shown in Table 3, in the case of the additional experimental example, even if the room temperature tackiness reducing agent is used, it is undesirable in terms of underwater cutting, cross-sectional cutting and suitability of the detergent, if sufficient content is not applied, and the copolymer crosslinkable resin-1 alone When used, it was further confirmed that the desired results were shown.

Claims (20)

반도체 패키징 금형의 클리닝 컴파운드로서, 상기 컴파운드는 구상 또는 원통상인 것인 몰드 클리닝 컴파운드. A cleaning compound for semiconductor packaging molds, wherein the compound is spherical or cylindrical. 제1 항에 있어서, The method of claim 1, 상기 구상의 몰드 클리닝 컴파운드는 정형 또는 비정형의 구상이고, 직경이 30mm 이하의 펠렛인 몰드 클리닝 컴파운드. The spherical mold cleaning compound is a spherical or atypical spherical shape, the mold cleaning compound is a pellet of 30mm or less in diameter. 제1 항에 있어서,The method of claim 1, 상기 원통상의 몰드 클리닝 컴파운드는 그 단면이 정형 또는 비정형의 원형이고, 지름이 30mm 이하이고 높이가 30mm 이하의 펠렛인 몰드 클리닝 컴파운드.The cylindrical mold cleaning compound is a mold cleaning compound whose cross section is a regular or atypical circular shape and has a diameter of 30 mm or less and a pellet of 30 mm or less in height. 제1 항에 있어서, The method of claim 1, 상기 컴파운드는 가교성 주재와 퍼옥사이드계 가교제를 포함하는 몰드 클리닝 컴파운드. The compound is a mold cleaning compound comprising a crosslinkable base material and a peroxide crosslinking agent. 제4 항에 있어서, The method of claim 4, wherein 상기 가교성 주재는 고무 또는 상온 점착성 저감제를 단독 혹은 복합 혼합한 것인 몰드 클리닝 컴파운드. The crosslinkable main material is a mold cleaning compound in which a rubber or a room temperature tackifier is mixed singly or in combination. 제5 항에 있어서, The method of claim 5, 상기 상온 점착성 저감제는 가교성 열가소성고무 또는 DSC 융점이 140℃ 이하인 가교성 수지를 단독 또는 복합 혼합한 것인 몰드 클리닝 컴파운드.The said room temperature adhesiveness reducing agent is a mold cleaning compound which mixes crosslinkable thermoplastic rubber or crosslinkable resin whose DSC melting | fusing point is 140 degrees C or less individually or in combination. 제6 항에 있어서, The method of claim 6, 상기 가교성 열가소성 고무는 스티렌-부타디엔계 블록 공중합체, 폴리부타디엔계 열가소성 고무(12-PB), 클로린화 폴리에틸렌 고무(CPE) 및 폴리올레핀계 열가소성 엘라스토머(TPO)로 이루어진 그룹으로부터 선택되는 1종 이상인 몰드 클리닝 컴파운드. The crosslinkable thermoplastic rubber is at least one mold selected from the group consisting of styrene-butadiene-based block copolymers, polybutadiene-based thermoplastic rubbers (12-PB), chlorinated polyethylene rubbers (CPEs), and polyolefin-based thermoplastic elastomers (TPOs). Cleaning compound. 제6 항에 있어서, The method of claim 6, 상기 가교성 수지는 DSC 융점이 140℃ 이하 범위를 갖는 에틸렌 (공)중합체인 몰드 클리닝 컴파운드. The crosslinkable resin is a mold cleaning compound wherein the DSC melting point is an ethylene (co) polymer having a range of 140 ° C. or lower. 제5 항에 있어서, The method of claim 5, 상기 상온 점착성 저감제는 상기 가교제 주재를 구성하는 전체 성분의 5 내지 100wt%인 몰드 클리닝 컴파운드. The room temperature tack reducing agent is a mold cleaning compound of 5 to 100wt% of the total components constituting the crosslinking agent main body. 제5 항에 있어서, The method of claim 5, 상기 고무는 스티렌-부타디엔 고무(SBR), 부타디엔 고무(BR), 아크릴로니트릴-부타디엔 고무(NBR), 에틸렌-프로필렌 고무(EPR), 에틸렌-프로필렌 디엔 고무(EPDM), 이소부틸렌-이소프렌 고무(IIR) 및 실리콘 고무를 포함하는 그룹으로부터 선택된 1종 이상인 몰드 클리닝 컴파운드. The rubber is styrene-butadiene rubber (SBR), butadiene rubber (BR), acrylonitrile-butadiene rubber (NBR), ethylene-propylene rubber (EPR), ethylene-propylene diene rubber (EPDM), isobutylene-isoprene rubber At least one mold cleaning compound selected from the group consisting of (IIR) and silicone rubber. 제4 항에 있어서, The method of claim 4, wherein 상기 퍼옥사이드계 가교제는 가교성 주재 100 중량부 기준으로 0.5 내지 10 중량부인 몰드 클리닝 컴파운드. The peroxide-based crosslinking agent is 0.5 to 10 parts by weight based on 100 parts by weight of the crosslinking base material mold cleaning compound. 제4 항에 있어서, The method of claim 4, wherein 상기 퍼옥사이드계 가교제는 1,1-비스(t-부틸퍼옥시)-3,3,5-트리메틸 사이클로헥산, 1,1-비스(t-부틸퍼옥시)사이클로헥산, t-부틸퍼옥시 말레산, t-부틸퍼옥시레이트, t-부틸퍼옥시-3,3,5-트리메틸헥사노에이트, 시클로헥사논 퍼옥사이드, t-부틸퍼옥시 아릴 카보네이트, t-부틸퍼옥시 이소프로필 카보네이트, 2,5-디메틸-2,5-디(벤조일퍼옥시)헥산, 2,2-비스(t-부틸퍼옥시)옥탄, t-부틸퍼옥시 아세테이트, 2,2-비스(t-부틸퍼옥시)부탄, t-부틸퍼옥시벤조에이트, n-부틸-4,4-비스(t-부틸퍼옥시)발레레이트, 디-t-부틸퍼옥시 이소프탈레이트, 메틸에틸케톤 퍼옥사이드, 디쿠밀 퍼옥사이드, 2,5-디메틸-2,5-디(t-부틸퍼옥시)헥산, α,α'-비스(t-부틸퍼옥시-m-이소프로필) 벤젠, t-부틸 쿠밀 퍼옥사이드, 디-이소프로필벤젠 하이드로퍼옥사이드, 디-t-부틸 퍼옥사이드 및 2,5-디메틸-2,5-디(t-부틸퍼옥시)헥산으로 구성되는 그룹으로부터 선택된 1종 이상인 몰드 클리닝 컴파운드. The peroxide crosslinking agent is 1,1-bis (t-butylperoxy) -3,3,5-trimethyl cyclohexane, 1,1-bis (t-butylperoxy) cyclohexane, t-butylperoxy male Acid, t-butylperoxylate, t-butylperoxy-3,3,5-trimethylhexanoate, cyclohexanone peroxide, t-butylperoxy aryl carbonate, t-butylperoxy isopropyl carbonate, 2 , 5-dimethyl-2,5-di (benzoylperoxy) hexane, 2,2-bis (t-butylperoxy) octane, t-butylperoxy acetate, 2,2-bis (t-butylperoxy) Butane, t-butylperoxybenzoate, n-butyl-4,4-bis (t-butylperoxy) valerate, di-t-butylperoxy isophthalate, methylethylketone peroxide, dicumyl peroxide, 2,5-dimethyl-2,5-di (t-butylperoxy) hexane, α, α'-bis (t-butylperoxy-m-isopropyl) benzene, t-butyl cumyl peroxide, di-iso Propylbenzene hydroperoxide, di-t-butyl peroxide and 2,5-dimethyl-2,5- At least one mold cleaning compound selected from the group consisting of di (t-butylperoxy) hexane. 제4 항에 있어서, The method of claim 4, wherein 나아가 세정제, 세정보조제 및 흡착제 중 1 이상의 첨가제를 더 포함하는 몰드 클리닝 컴파운드. Furthermore, the mold cleaning compound further contains one or more additives of a detergent, a detergent, and an adsorbent. 제13 항에 있어서, The method of claim 13, 상기 세정제는 아미노 알콜 또는 아미노 알콜과 유기산 또는 무기산을 반응시켜 조제된 아미노 알콜염이고, 상기 가교성 주재 100 중량부 기준으로, 1.0 내지 30 중량부인 몰드 클리닝 컴파운드. The cleaning agent is an amino alcohol salt prepared by reacting an amino alcohol or an amino alcohol with an organic or inorganic acid, and based on 100 parts by weight of the crosslinkable base material, 1.0 to 30 parts by weight of the mold cleaning compound. 제14 항에 있어서, The method of claim 14, 상기 아미노 알콜은, 모노에탄올 아민, 디에탄올 아민, 트리에탄올아민, N-메틸 에탄올아민, N,N-디메틸 에탄올아민, N,N-디부틸 에탄올아민, N,N-디에틸 에탄올아민, N-메틸-N,N-디에탄올 아민, 2-아미노-2-메틸 프로판올, 3-아미노 프로판올, 및 2-아미노 프로판올로 이루어진 그룹으로부터 선택된 1종 이상인 몰드 클리닝 컴파운드. The amino alcohol is monoethanol amine, diethanol amine, triethanolamine, N-methyl ethanolamine, N, N-dimethyl ethanolamine, N, N-dibutyl ethanolamine, N, N-diethyl ethanolamine, N- At least one mold cleaning compound selected from the group consisting of methyl-N, N-diethanol amine, 2-amino-2-methyl propanol, 3-amino propanol, and 2-amino propanol. 제14 항에 있어서, The method of claim 14, 상기 유기산은 포름산, 초산, 프로피온산, 낙산, 이소낙산, 길초산, 이소길초산, 피발산, 크로톤산, 카프로산, 카프릴산, 카프린산, 라우린산, 미리스틴산, 팔미트산, 스테아린산, 옥살산, 말론산, 호박산, 주석산, 글루타르산, 아디프산(adipic acid), 피멜산, 수베르산(suberic acid), 아데 라인산, 세바스산, 안식향산, 프탈산 및 이소프탈산으로 이루어진 그룹으로부터 선택된 1종 이상이고, The organic acid is formic acid, acetic acid, propionic acid, butyric acid, isobutyric acid, gil acetic acid, isogil acetic acid, pivalic acid, crotonic acid, caproic acid, caprylic acid, capric acid, lauric acid, myristic acid, palmitic acid, Group consisting of stearic acid, oxalic acid, malonic acid, succinic acid, tartaric acid, glutaric acid, adipic acid, pimelic acid, suberic acid, adeline acid, sebacic acid, benzoic acid, phthalic acid and isophthalic acid At least one selected from 상기 무기산은 염산 또는 초산인 몰드 클리닝 컴파운드. And said inorganic acid is hydrochloric acid or acetic acid. 제13 항에 있어서, The method of claim 13, 상기 세정보조제는 에틸렌글리콜, 디에틸렌글리콜, 트리에틸렌 글리콜, 프로필렌 글리콜, 디프로필렌글리콜, 글리콜 에테르 및 글리콜 에스테르로 구성되는 그룹으로부터 선택되는 1종 이상으로서, 상기 가교성 주재 100 중량부 기준으로, 1.0 내지 30 중량부인 몰드 클리닝 컴파운드. The fine preparation is one or more selected from the group consisting of ethylene glycol, diethylene glycol, triethylene glycol, propylene glycol, dipropylene glycol, glycol ethers and glycol esters, based on 100 parts by weight of the crosslinkable host, based on 1.0 part To 30 parts by weight of the mold cleaning compound. 제13 항에 있어서, The method of claim 13, 상기 흡착제는 카본 블랙, 실리카, 활성 알루미나, 활성 탄소, 마그네슘 옥사이드, 티타늄 옥사이드, 마그네슘 카보네이트, 칼슘 카보네이트, 벤토나이트 및 규조토로 구성되는 그룹으로부터 선택되는 1종 이상으로서, 상기 가교성 주재 100 중량부 기준으로, 10 내지 90 중량부인 몰드 클리닝 컴파운드. The adsorbent is one or more selected from the group consisting of carbon black, silica, activated alumina, activated carbon, magnesium oxide, titanium oxide, magnesium carbonate, calcium carbonate, bentonite and diatomaceous earth, based on 100 parts by weight of the crosslinkable base material. , 10 to 90 parts by weight of the mold cleaning compound. 제1 항 내지 제18 항 중 어느 한 항의 몰드 클리닝 컴파운드를 봉지 공정이 완료된 트랜스퍼 성형기의 포트에 붓고 프레스를 닫는 단계; Pouring the mold cleaning compound of any one of claims 1 to 18 into a port of the transfer molding machine where the sealing process is completed, and closing the press; 공급된 몰드 클리닝 컴파운드가 포트로부터 러너를 통하여 금형 내부로 전달되면서 불순물을 흡착시키는 단계; 및 Adsorbing impurities while the supplied mold cleaning compound is transferred from the port to the mold through the runner; And 상기 불순물 흡착으로 클리닝된 컴파운드를 취출하는 단계를 포함하는 반도체 패키징 금형의 클리닝 방법 The cleaning method of the semiconductor packaging mold comprising the step of taking out the compound cleaned by the impurity adsorption. 제1 항 내지 제18 항 중 어느 한 항의 몰드 클리닝 컴파운드를 봉지 공정이 완료된 인젝션 성형기의 호퍼(Hopper)에 붓고 사출하는 단계; Pouring and injecting the mold cleaning compound of any one of claims 1 to 18 into a hopper of an injection molding machine in which an encapsulation process is completed; 공급된 몰드 클리닝 컴파운드가 사출기의 실린더와 노즐을 포함하여 금형 전부로 일시에 전달되면서 불순물을 흡착시키는 단계; 및Adsorbing impurities while the supplied mold cleaning compound is temporarily delivered to the entire mold including the cylinder and the nozzle of the injection machine; And 상기 불순물 흡착으로 클리닝된 컴파운드를 몰드로부터 취출하는 단계를 포함하는 반도체 패키징 금형의 클리닝 방법. Removing the compound cleaned by the impurity adsorption from a mold.
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