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WO2016193307A1 - Circuit de lecture et procédé de lecture de capteurs résistifs en grand réseau - Google Patents

Circuit de lecture et procédé de lecture de capteurs résistifs en grand réseau Download PDF

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Publication number
WO2016193307A1
WO2016193307A1 PCT/EP2016/062381 EP2016062381W WO2016193307A1 WO 2016193307 A1 WO2016193307 A1 WO 2016193307A1 EP 2016062381 W EP2016062381 W EP 2016062381W WO 2016193307 A1 WO2016193307 A1 WO 2016193307A1
Authority
WO
WIPO (PCT)
Prior art keywords
connection lines
row
resistive
column
read
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
PCT/EP2016/062381
Other languages
English (en)
Inventor
Reza LOTFI
Roohollah YARAHMADI
Sajjad RAMAZANIAN
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Technische Universiteit Delft
Original Assignee
Technische Universiteit Delft
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Technische Universiteit Delft filed Critical Technische Universiteit Delft
Publication of WO2016193307A1 publication Critical patent/WO2016193307A1/fr
Anticipated expiration legal-status Critical
Ceased legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
    • G01L1/00—Measuring force or stress, in general
    • G01L1/20—Measuring force or stress, in general by measuring variations in ohmic resistance of solid materials or of electrically-conductive fluids; by making use of electrokinetic cells, i.e. liquid-containing cells wherein an electrical potential is produced or varied upon the application of stress
    • G01L1/22—Measuring force or stress, in general by measuring variations in ohmic resistance of solid materials or of electrically-conductive fluids; by making use of electrokinetic cells, i.e. liquid-containing cells wherein an electrical potential is produced or varied upon the application of stress using resistance strain gauges
    • G01L1/225—Measuring circuits therefor
    • G01L1/2262—Measuring circuits therefor involving simple electrical bridges
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
    • G01L1/00—Measuring force or stress, in general
    • G01L1/20—Measuring force or stress, in general by measuring variations in ohmic resistance of solid materials or of electrically-conductive fluids; by making use of electrokinetic cells, i.e. liquid-containing cells wherein an electrical potential is produced or varied upon the application of stress
    • G01L1/22—Measuring force or stress, in general by measuring variations in ohmic resistance of solid materials or of electrically-conductive fluids; by making use of electrokinetic cells, i.e. liquid-containing cells wherein an electrical potential is produced or varied upon the application of stress using resistance strain gauges
    • G01L1/2268—Arrangements for correcting or for compensating unwanted effects

Definitions

  • the present invention relates to a method of reading out a large array of resistive sensors having m column connection lines and n row connection lines, each of a plurality of resistive sensors being connected between an associated one of the m column connection lines and an associated one of the n row connection lines.
  • the present invention relates to a read-out circuit for a large array of resistive sensors having m column connection lines and n row connection lines, each of a plurality of resistive sensors being connected between an associated one of the m column connection lines and an associated one of the n row connection lines.
  • the present invention seeks to provide a low complexity solution for a read-out circuit for large-array resistive sensors, having improved performance over prior art circuitry with regard to sensitivity of error sources related to the measurement circuit used (e.g. operational amplifiers).
  • a method according to the preamble defined above is provided further comprising, measuring a sensor value of a single one of the plurality of resistive sensors by:
  • the present invention relates to a read-out circuit for a large array of resistive sensors as defined in the preamble above, the read-out circuit comprising a measurement circuit (e.g. an operational amplifier based circuit) providing an output signal, m column switches each connected to one of the m column connection lines and to either ground or a supply voltage, and n row switches each connected to one of the n row connection lines and to either ground or the measurement circuit.
  • a measurement circuit e.g. an operational amplifier based circuit
  • m column switches each connected to one of the m column connection lines and to either ground or a supply voltage
  • n row switches each connected to one of the n row connection lines and to either ground or the measurement circuit.
  • Fig. 1 shows a circuit diagram of a read-out circuit for an exemplary 4x4 array of resistive sensors, according to an embodiment of the present invention
  • Fig. 2 shows a circuit diagram of a read-out circuit according to an embodiment of the present invention for a generic m x n resistive sensor array.
  • a high-accuracy yet simple read-out circuit architecture is proposed wherein the problems caused by several main non-ideality sources and errors are overcome. In this way, not only the accuracy of the read-out circuit is increased but also its complexity and therefore cost is reduced.
  • Fig. 1 shows a circuit diagram of a read-out circuit for an exemplary 4x4 array of resistive sensors Rmn, according to an embodiment of the present invention.
  • the present invention read-out circuit is especially suited for a large array of resistive sensors having m column connection lines and n row connection lines (m and n being positive integers), each of a plurality of resistive sensors Rmn being connected between an associated one of the m column connection lines and an associated one of the n row connection lines.
  • the read-out circuit itself comprises a measurement circuit 5 providing an output signal V 0 , m column switches SWcm each connected to one of the m column connection lines and to either ground or a supply voltage V CC , and n row switches SWRD each connected to one of the n row connection lines and to either ground or the measurement circuit.
  • the switches SWc m and SWRD are operated for measuring a second sensor value of the single resistive sensor R23 from the plurality of resistive sensors Rmn, i.e. the second column switch SWc2 is connected to a supply voltage Vcc and the third row switch SWR 3 is connected to the measurement circuit 5.
  • the ratio of the maximum measurable resistance to the minimum measurable resistance is increased (i.e. the dynamic range), and this is achieved simultaneously with a reduced complexity of the read-out circuit.
  • the measurement circuit 5 comprises a simple feedback circuit with an operational amplifier 6 (opamp) and a feedback resistor Rf connected between the opamp output and its positive input.
  • the negative input of the opamp 6 is connected to ground, and the positive input to the instantaneous
  • the present invention embodiments work as follows: using a double-sampling scheme, the digitized version of the output of the circuit for the case when the input switch (i.e. SWc3 in Fig. 1) is connected to Vcc (second sensor value) is subtracted from that obtained when the input is grounded (first sensor value). The subtraction result is therefore, an error-free value which is much less dependent on the offset voltage and the input current of the opamp 6.
  • Fig. 2 shows a circuit diagram of a read-out circuit according to an embodiment of the present invention for a generic m x n resistive sensor array.
  • m column switches SWcm are connected to the respective m column connection lines of the array
  • n row switches SWRD are connected the respective n row connection lines of the array.
  • connecting the measurement circuit 5 to the row connection line associated with the single one resistive sensor is implemented using a row switch SWRD
  • connecting the column connection line associated with the single one resistive sensor to a supply voltage is implemented using a column switch SWcm.
  • the row and column switches may be actual hardware switches, controlled switches, semiconductor switches, etc.
  • the row and column switches SWRD, SWcm are controlled or actuated using a control unit 7.
  • the read-out circuitry comprises a control unit 7 connected to each of the m column switches SWcm and each of the n row switches SWRD.
  • the control unit 7 can then be used to provide proper control and timing of all switches, e.g. for determining the actual sensor value of each of the plurality of resistive sensors by subsequently connecting the associated ones of the m column connection lines and n row connection lines.
  • the entire array of resistive sensors Rmn can be read out with improvement of sensitivity for the opamp inherent error sources in this array read-out circuit.
  • control unit 7 is connected to the measurement circuit 5 for receiving the output signal V 0 thereof, and the control unit 7 is further arranged to execute the method steps of any one of method embodiments as described above.
  • the first sensor value and second sensor value are stored and subsequently processed. This can e.g. be achieved by adding processing circuitry (e.g. data processor, memory, input signal digitization, etc.) to the control unit 7.
  • the large arrays of resistive sensors as discussed above have a wide range of applications from medical to industrial, and the present invention method embodiments and read-out circuit embodiments may equally be applied in these applications.
  • An example is textile sensors which are becoming smarter. In wearing biomedical devices, another booming application field is emerging.
  • Other examples include, but are not limited to Barefoot Pressure Analysis; In-Shoe Planar Pressure Analysis; Seating & Positioning Pressure Analysis; Human Joint Analysis; Animal Gait Analysis; Body Pressure Mapping (Seating & Mattress); Occlusal Analysis (Dentistry); Tire Footprint Pressure Measurement; Wiper Force Measurement; Grip Pressure Measurement.

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Force Measurement Appropriate To Specific Purposes (AREA)
  • Analogue/Digital Conversion (AREA)

Abstract

L'invention concerne un circuit de lecture et un procédé de lecture d'un grand réseau de capteurs résistifs ayant m lignes de connexion en colonnes et n lignes de connexion en rangée. Chacun d'une pluralité de capteurs résistifs (Rmn) est connecté entre l'une des m lignes de connexion en colonne et l'une des n lignes de connexion en rangée. La mesure d'une valeur de capteur d'un seul des capteurs résistifs (Rmn) est réalisée par connexion du circuit de mesure (5) à la ligne de connexion en rangée associé audit un seul capteur résistif, mise à la terre toutes les lignes de connexion en colonne et mesure d'une première valeur de capteur, connexion d'une ligne de connexion en colonne associée audit un seul capteur résistif à une tension d'alimentation et mesure d'une seconde valeur de capteur, et détermination de la valeur de capteur dudit un seul capteur résistif en soustrayant la première valeur de capteur et la seconde valeur de capteur.
PCT/EP2016/062381 2015-06-01 2016-06-01 Circuit de lecture et procédé de lecture de capteurs résistifs en grand réseau Ceased WO2016193307A1 (fr)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
NL2014896 2015-06-01
NL2014896A NL2014896B1 (en) 2015-06-01 2015-06-01 Read-out circuit and method for reading out large-array resistive sensors.

Publications (1)

Publication Number Publication Date
WO2016193307A1 true WO2016193307A1 (fr) 2016-12-08

Family

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Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/EP2016/062381 Ceased WO2016193307A1 (fr) 2015-06-01 2016-06-01 Circuit de lecture et procédé de lecture de capteurs résistifs en grand réseau

Country Status (2)

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NL (1) NL2014896B1 (fr)
WO (1) WO2016193307A1 (fr)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN109059969A (zh) * 2018-08-13 2018-12-21 中国科学院电子学研究所 一种阻性传感阵列读出电路以及测量方法
WO2019170483A1 (fr) * 2018-03-05 2019-09-12 Kuka Deutschland Gmbh Mesure de variatons mécaniques
CN112903151A (zh) * 2021-01-25 2021-06-04 华东师范大学 一种适用于薄膜压力传感器阵列的解耦方法及其应用
CN115562066A (zh) * 2022-09-21 2023-01-03 上海机电工程研究所 实测图像数据注入电阻阵的图像仿真方法及系统
DE102024102067A1 (de) 2024-01-24 2025-07-24 Brose Antriebstechnik GmbH & Co. Kommanditgesellschaft, Berlin Messvorrichtung und Messverfahren

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20050200732A1 (en) 2004-03-15 2005-09-15 Boon Keat Tan System and method for canceling dark photocurrent in a color sensor circuit
US20050207234A1 (en) 2004-03-22 2005-09-22 International Business Machines Corporation Offset compensation in local-probe data storage devices
US20130088247A1 (en) 2011-10-05 2013-04-11 Industrial Technology Research Institute Readout apparatus and readout method for sensor array

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20050200732A1 (en) 2004-03-15 2005-09-15 Boon Keat Tan System and method for canceling dark photocurrent in a color sensor circuit
US20050207234A1 (en) 2004-03-22 2005-09-22 International Business Machines Corporation Offset compensation in local-probe data storage devices
US20130088247A1 (en) 2011-10-05 2013-04-11 Industrial Technology Research Institute Readout apparatus and readout method for sensor array

Non-Patent Citations (2)

* Cited by examiner, † Cited by third party
Title
AKAVIA KANIEL: "Substractor eliminates op-amp offset, common mode errors", ELECTRONICS, vol. 51, no. 8, 1 April 1978 (1978-04-01), pages 135 - 137, XP001625250
AKAVIA KANIEL: "Subtractor eliminates op-amp offset, common-mode errors", ELECTRONICS,, vol. 51, no. 8, 1 April 1978 (1978-04-01), pages 135 - 137, XP001625250 *

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2019170483A1 (fr) * 2018-03-05 2019-09-12 Kuka Deutschland Gmbh Mesure de variatons mécaniques
CN111819416A (zh) * 2018-03-05 2020-10-23 库卡德国有限公司 对机械变化的测量
US11549855B2 (en) 2018-03-05 2023-01-10 Kuka Deutschland Gmbh Measuring mechanical changes
CN109059969A (zh) * 2018-08-13 2018-12-21 中国科学院电子学研究所 一种阻性传感阵列读出电路以及测量方法
CN112903151A (zh) * 2021-01-25 2021-06-04 华东师范大学 一种适用于薄膜压力传感器阵列的解耦方法及其应用
CN115562066A (zh) * 2022-09-21 2023-01-03 上海机电工程研究所 实测图像数据注入电阻阵的图像仿真方法及系统
DE102024102067A1 (de) 2024-01-24 2025-07-24 Brose Antriebstechnik GmbH & Co. Kommanditgesellschaft, Berlin Messvorrichtung und Messverfahren
WO2025157842A1 (fr) * 2024-01-24 2025-07-31 Brose Antriebstechnik GmbH & Co. Kommanditgesellschaft, Berlin Dispositif de mesure et procédé de mesure

Also Published As

Publication number Publication date
NL2014896A (en) 2016-12-12
NL2014896B1 (en) 2017-01-31

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