WO2016158221A1 - マイクロ分光分析用試料台の作製方法 - Google Patents
マイクロ分光分析用試料台の作製方法 Download PDFInfo
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- WO2016158221A1 WO2016158221A1 PCT/JP2016/056993 JP2016056993W WO2016158221A1 WO 2016158221 A1 WO2016158221 A1 WO 2016158221A1 JP 2016056993 W JP2016056993 W JP 2016056993W WO 2016158221 A1 WO2016158221 A1 WO 2016158221A1
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- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/34—Microscope slides, e.g. mounting specimens on microscope slides
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N1/00—Sampling; Preparing specimens for investigation
- G01N1/28—Preparing specimens for investigation including physical details of (bio-)chemical methods covered elsewhere, e.g. G01N33/50, C12Q
- G01N1/30—Staining; Impregnating ; Fixation; Dehydration; Multistep processes for preparing samples of tissue, cell or nucleic acid material and the like for analysis
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B05—SPRAYING OR ATOMISING IN GENERAL; APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05D—PROCESSES FOR APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05D1/00—Processes for applying liquids or other fluent materials
- B05D1/18—Processes for applying liquids or other fluent materials performed by dipping
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N1/00—Sampling; Preparing specimens for investigation
- G01N1/28—Preparing specimens for investigation including physical details of (bio-)chemical methods covered elsewhere, e.g. G01N33/50, C12Q
- G01N1/286—Preparing specimens for investigation including physical details of (bio-)chemical methods covered elsewhere, e.g. G01N33/50, C12Q involving mechanical work, e.g. chopping, disintegrating, compacting, homogenising
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N1/00—Sampling; Preparing specimens for investigation
- G01N1/28—Preparing specimens for investigation including physical details of (bio-)chemical methods covered elsewhere, e.g. G01N33/50, C12Q
- G01N1/34—Purifying; Cleaning
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/01—Arrangements or apparatus for facilitating the optical investigation
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/255—Details, e.g. use of specially adapted sources, lighting or optical systems
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/24—Base structure
- G02B21/26—Stages; Adjusting means therefor
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
- G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
- G01N2021/3595—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light using FTIR
Definitions
- the present invention relates to a method for producing a sample stage for microspectral analysis.
- micro-spectroscopic analysis using a microscopic FTIR is an effective technique for qualitative analysis of minute and minute organic substances.
- a normal FTIR spectrum cannot be obtained unless the thickness of the sample to be measured is in an optimal state, and therefore, sample preparation for obtaining a normal FTIR spectrum is important.
- a solvent is formed on a fluororesin thin film attached to an infrared reflecting member of a sample stage. A pinhole serving as a condensation nucleus of the solution containing the sample was formed, and the pinhole was measured by microscopic FTIR to obtain component information on the solute of a small amount of dilute solution.
- the thickness of the agglomerated nuclei is thick, and the obtained FTIR spectrum is saturated as a whole, and it is attached to the points and members that greatly hinder the spectrum analysis performed to qualify the components.
- the disadvantage is that the fluororesin thin film is easily broken.
- the present invention has the following configuration. That is, (1) an optical material is immersed in a solution obtained by dissolving a perfluoroalkyl polyether group-containing silane compound represented by the following structural formula (I) having water repellency or oil repellency in a solvent, and the optical material is heated after the immersion. Then, the optical material is washed, and the surface of the optical material is modified to be water-repellent or oil-repellent.
- a method for producing a sample stage for micro-spectral analysis using an optical material
- a is an integer from 1 to 30
- b is an integer from 1 to 10
- c is an integer from 1 to 20
- d is an integer from 1 to 10
- e is an integer from 1 to 20
- h is an integer from 0 to 10
- G is an integer from 0 to 20
- n is an integer from 1 to 320
- the sum of m and p is 3.
- the solvent contains at least one selected from alcohols, ketones, ethers, aldehydes, amines, fatty acids, esters and nitriles, and the solvent is fluorine-modified.
- the surface of the optical material on the modified side has a region where the solution can be stored inside, which is closed by a straight line or a curve having a line width of 1 to 1000 ⁇ m.
- a groove having a width of 0.01 to 1 mm and a depth of 0.001 to 0.1 mm, or a diameter of 0.01 to 1 mm and a depth of 0.1 mm is formed on the surface of the optical material that has been modified.
- a plate capable of easily forming a thin film made of a perfluoroalkyl ether group having desired water repellency and oil repellency on the surface of an optical material can be done accurately.
- a perfluoroalkyl polyether group-containing silane compound represented by the following structural formula (I) is preferably exemplified.
- a is an integer from 1 to 30
- b is an integer from 1 to 10
- c is an integer from 1 to 20
- d is an integer from 1 to 10
- e is an integer from 1 to 20
- h is an integer from 0 to 10
- G is an integer from 0 to 20
- n is an integer from 1 to 320.
- the sum of m and p is 3.
- Examples of the solvent in the present invention include alcohols, ketones, ethers, aldehydes, amines, fatty acids, esters and nitriles, and fluorine-modified solvents are preferable. Further, fluorine-modified ethers and fluorine-modified alcohols are preferable, and ethers and alcohols having 2 to 20 carbon atoms are most preferable.
- the solution concentration of a solution obtained by dissolving a compound having water repellency and oil repellency in a solvent is preferably 0.001 to 10% by mass, more preferably 0.01 to 1% by mass.
- a coating method can also be employed for modification, and in that case, dip coating or spin coating is exemplified.
- the optical material in the present invention a material that absorbs less infrared light is preferable, and silicon, germanium, sapphire, calcium fluoride, barium fluoride, zinc selenide, and diamond are exemplified. Of these, silicon is preferable. If the surface of the optical material to be processed is previously polished and mirror-finished, the present invention has an effect that it can be carried out easily and accurately.
- the optical material is immersed in the liquid, and the immersed optical material is heated and dried.
- heating the optical material means maintaining at 80 to 150 ° C. for 30 minutes to 3 hours. Furthermore, it is preferable to maintain at 90 to 110 ° C. for 30 minutes to 1 hour.
- a concentration operation can be performed simply and accurately.
- the surface is pre-polished and finished to a mirror surface, and the surface on the side where the solution sample is concentrated is closed by a straight line or a curve having a line width of 1 to 1000 ⁇ m, and has an area where the solution can be stored inside.
- the area of the region is preferably 0.001 to 10 mm 2 , more preferably 0.001 to 0.1 mm 2 .
- the line has a convex part height and the convex part height is 0.001 to 1 ⁇ m, or the line has a concave part depth and the concave part depth is 0.001 to 1 ⁇ m.
- the region can be drawn with a material harder than the optical material.
- a silane compound containing a perfluoroalkyl polyether group As a compound having water repellency or oil repellency, a silane compound containing a perfluoroalkyl polyether group
- ethyl nonafluorobutyl ether 0.1% by mass that is, DS-5210TH (manufactured by Harvest Co., Ltd.) was used.
- the silicon after immersion was dried by heating at 100 ° C. for 1 hour. After drying, the remaining DS-5210H was removed by washing with DS-TH (manufactured by Harvest Co., Ltd.).
- the curve in FIG. 4 is an FTIR spectrum when infrared spectroscopic analysis by a transmission method is performed using a sample obtained by concentrating 100 ng (nanogram) of dibutyl adipate on water-repellent treated silicon
- the curve in FIG. 2 shows an FTIR spectrum when infrared spectroscopic analysis is performed by a reflection method using a sample obtained by concentrating 100 ng of dibutyl adipate on a fluororesin thin film attached to an infrared reflecting member.
- a rectangular region (0.028 mm 2 ) having a line width of 10 ⁇ m, a long side of 280 ⁇ m, and a short side of 100 ⁇ m was produced on the surface-modified surface with a diamond pen (D point pen manufactured by Ogura Seiki Seiki Kogyo).
- a diamond pen D point pen manufactured by Ogura Seiki Seiki Kogyo.
- the portion of this line was measured with a surface roughness meter (Dektak manufactured by Bruker), the concave portion was 200 nm and the convex portion was 600 nm.
- the curve in FIG. 7 shows the infrared spectroscopic analysis of soybean oil by the transmission method, in which a solution of 1000 ng of soybean oil in 5 ⁇ L of chloroform was dropped on the silicon and the chloroform was volatilized and then concentrated in the rectangular area. It is a FTIR spectrum at the time. From FIG. 7, a good spectrum equivalent to that of FIG. 9 was obtained in all regions of 700 to 4000 cm ⁇ 1 .
- the surface is polished in advance to finish the mirror surface, and silicon having a groove having a width of 0.1 mm and a depth of 0.005 mm is immersed in the above solution on the surface on which the solution sample is concentrated. Heat drying at 100 ° C. for 1 hour. After drying, the remaining DS-5210H was removed by washing with DS-TH (manufactured by Harvest Co., Ltd.).
- the curve in FIG. 8 is an FTIR spectrum when infrared spectroscopic analysis is performed by a transmission method using a sample obtained by concentrating 1000 ng of soybean oil on water-repellent treated silicon. All curves of 700 to 4000 cm ⁇ 1 are shown. In the region, a good spectrum equivalent to that in FIG. 9 was obtained.
- Modification part 2 Optical material 3: Sample 4: Detector 5: Infrared ray 6: Surface modification part 9: Concave part 10: Convex part 16: Groove
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- Molecular Biology (AREA)
- Biomedical Technology (AREA)
- Engineering & Computer Science (AREA)
- Optics & Photonics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
- Materials Applied To Surfaces To Minimize Adherence Of Mist Or Water (AREA)
Abstract
Description
(1)撥水性または撥油性を有する下記構造式(I)で表わされるパーフルオロアルキルポリエーテル基含有シラン化合物を溶媒に溶解してなる液に光学材料を浸漬させ、浸漬後に光学材料を加熱し、次いで光学材料を洗浄して、光学材料の表面が撥水性または撥油性に改質されていること
を特徴とする光学材料を用いたマイクロ分光分析用試料台の作製方法、
(2)前記光学材料が、シリコン、ゲルマニウム、サファイア、フッ化カルシウム、フッ化バリウム、セレン化亜鉛、およびダイヤモンドから選ばれる1種以上を含む(1)に記載のマイクロ分光分析用試料台の作製方法、
(3)前記溶媒が、アルコール類、ケトン類、エーテル類、アルデヒド類、アミン類、脂肪酸類、エステル類およびニトリル類から選ばれる1種以上を含むものであり、かつ、該溶媒はフッ素変性されたものである(1)または(2)に記載のマイクロ分光分析用試料台の作製方法、
(4)さらに先端径が2~10μmの針を使用して試料を押しつぶすことを特徴とする(1)~(3)のいずれかに記載のマイクロ分光分析用試料台の作製方法、である。
(5)さらに前記光学材料の改質されている側の表面に、線の幅が1~1000μmである直線または曲線で閉じた、内側に溶液を溜めることのできる領域を有し、該領域の面積が0.001~10mm2であることを特徴とする(1)~(4)のいずれかに記載のマイクロ分光分析用試料台の作製方法、である。
(6)前記領域の該線が凸部高さを有し、その凸部高さが0.001~1μmであることを特徴とする(1)~(5)に記載のマイクロ分光分析用試料台の作製方法、である。
(7)前記領域の該線が凹部深さを有し、その凹部深さが0.001~1μmである(1)~(6)に記載のマイクロ分光分析用試料台の作製方法、である。
(8)さらに前記光学材料の改質されている側の表面に、幅0.01~1mmかつ深さ0.001~0.1mmの溝、または、直径0.01~1mmかつ深さ0.001~0.1mmの凹みがあることを特徴とする(1)~(7)のいずれかに記載のマイクロ分光分析用試料台の作製方法、である。
なお、本発明において、改質にコーティング法も採用でき、その場合は、ディップコートまたはスピンコートが例示される。 本発明における光学材料として、赤外線の吸収が少ない材料が好ましく、シリコン、ゲルマニウム、サファイア、フッ化カルシウム、フッ化バリウム、セレン化亜鉛、およびダイヤモンドが例示される。なかでもシリコンが好ましい。処理対象である光学材料の表面を予め研磨して鏡面仕上げをしておくと、本発明において、簡便、かつ正確に行うことができるという効果を有する。
2:光学材料
3:試料
4:検出器
5:赤外線
6:表面改質部
9:凹部
10:凸部
16:溝
Claims (8)
- 前記光学材料が、シリコン、ゲルマニウム、サファイア、フッ化カルシウム、フッ化バリウム、セレン化亜鉛、およびダイヤモンドから選ばれる1種以上を含む請求項1に記載のマイクロ分光分析用試料台の作製方法。
- 前記溶媒が、アルコール類、ケトン類、エーテル類、アルデヒド類、アミン類、脂肪酸類、エステル類およびニトリル類から選ばれる1種以上を含むものであり、かつ、該溶媒はフッ素変性されたものである請求項1または2に記載のマイクロ分光分析用試料台の作製方法。
- さらに先端径が2~10μmの針を使用して試料を押しつぶすことを特徴とする請求項1~3のいずれかに記載のマイクロ分光分析用試料台の作製方法。
- 前記光学材料の改質されている側の表面に、線の幅が1~1000μmである直線または曲線で閉じた、内側に溶液を溜めることのできる領域を有し、該領域の面積が0.001~10mm2である請求項1~4のいずれかに記載のマイクロ分光分析用試料台の作製方法。
- 前記領域の該線が凸部高さを有し、その凸部高さが0.001~1μmである請求項1~5のいずれかに記載のマイクロ分光分析用試料台の作製方法。
- 前記領域の該線が凹部深さを有し、その凹部深さが0.001~1μmである請求項1~6のいずれかに記載のマイクロ分光分析用試料台の作製方法。
- 前記光学材料の改質されている側の表面に、幅0.01~1mmかつ深さ0.001~0.1mmの溝、または、直径0.01~1mmかつ深さ0.001~0.1mmの凹みがある請求項1~7のいずれかに記載のマイクロ分光分析用試料台の作製方法。
Priority Applications (4)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201680009345.0A CN107430059B (zh) | 2015-04-02 | 2016-03-07 | 显微光谱分析用试样台的制作方法 |
| US15/562,985 US20180111156A1 (en) | 2015-04-02 | 2016-03-07 | Method of fabricating sample stage for microspectrometric analysis |
| EP16772105.9A EP3279639B1 (en) | 2015-04-02 | 2016-03-07 | Method of fabricating sample stage for microspectrometric analysis |
| KR1020177022013A KR101824948B1 (ko) | 2015-04-02 | 2016-03-07 | 마이크로 분광 분석용 시료대의 제작 방법 |
Applications Claiming Priority (6)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2015075594A JP5870439B1 (ja) | 2015-04-02 | 2015-04-02 | マイクロ分光分析用試料台の作製方法 |
| JP2015-075594 | 2015-04-02 | ||
| JP2015211480A JP6519444B2 (ja) | 2015-10-28 | 2015-10-28 | マイクロ分光分析用試料台の作製方法 |
| JP2015-211480 | 2015-10-28 | ||
| JP2015238183A JP2017106727A (ja) | 2015-12-07 | 2015-12-07 | マイクロ分光分析用試料台の作製方法 |
| JP2015-238183 | 2015-12-07 |
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| WO2016158221A1 true WO2016158221A1 (ja) | 2016-10-06 |
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| Application Number | Title | Priority Date | Filing Date |
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| PCT/JP2016/056993 Ceased WO2016158221A1 (ja) | 2015-04-02 | 2016-03-07 | マイクロ分光分析用試料台の作製方法 |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US20180111156A1 (ja) |
| EP (1) | EP3279639B1 (ja) |
| KR (1) | KR101824948B1 (ja) |
| CN (1) | CN107430059B (ja) |
| WO (1) | WO2016158221A1 (ja) |
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| JP2008203020A (ja) * | 2007-02-19 | 2008-09-04 | Toppan Printing Co Ltd | マイクロ分光分析方法 |
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| JP2706920B2 (ja) * | 1992-09-28 | 1998-01-28 | 株式会社堀場製作所 | 光学材料の表面処理方法 |
| JP3977929B2 (ja) | 1998-07-17 | 2007-09-19 | 株式会社堀場製作所 | 顕微赤外分析において用いる試料の形成用具 |
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2016
- 2016-03-07 US US15/562,985 patent/US20180111156A1/en not_active Abandoned
- 2016-03-07 KR KR1020177022013A patent/KR101824948B1/ko active Active
- 2016-03-07 CN CN201680009345.0A patent/CN107430059B/zh active Active
- 2016-03-07 WO PCT/JP2016/056993 patent/WO2016158221A1/ja not_active Ceased
- 2016-03-07 EP EP16772105.9A patent/EP3279639B1/en active Active
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| JPH063267A (ja) * | 1992-06-20 | 1994-01-11 | Horiba Ltd | 有機化合物の検出方法およびその装置 |
| JP2008203020A (ja) * | 2007-02-19 | 2008-09-04 | Toppan Printing Co Ltd | マイクロ分光分析方法 |
| JP2010175338A (ja) * | 2009-01-28 | 2010-08-12 | Kanagawa Acad Of Sci & Technol | 質量分析法に用いられる試料ターゲットおよびその製造方法、並びに当該試料ターゲットを用いた質量分析装置 |
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| Title |
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Also Published As
| Publication number | Publication date |
|---|---|
| EP3279639A1 (en) | 2018-02-07 |
| KR101824948B1 (ko) | 2018-02-02 |
| EP3279639B1 (en) | 2020-04-15 |
| CN107430059B (zh) | 2019-03-26 |
| EP3279639A4 (en) | 2018-09-05 |
| KR20170097220A (ko) | 2017-08-25 |
| US20180111156A1 (en) | 2018-04-26 |
| CN107430059A (zh) | 2017-12-01 |
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