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WO2016095829A1 - 电容内部爆炸检测装置 - Google Patents

电容内部爆炸检测装置 Download PDF

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Publication number
WO2016095829A1
WO2016095829A1 PCT/CN2015/097678 CN2015097678W WO2016095829A1 WO 2016095829 A1 WO2016095829 A1 WO 2016095829A1 CN 2015097678 W CN2015097678 W CN 2015097678W WO 2016095829 A1 WO2016095829 A1 WO 2016095829A1
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Prior art keywords
capacitor
resistor
internal explosion
processor
detecting device
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French (fr)
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唐元安
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Shenzhen Zhongnengda Automation Equipment Co Ltd
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Shenzhen Zhongnengda Automation Equipment Co Ltd
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/12Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing

Definitions

  • the invention relates to a capacitor internal explosion detecting device.
  • the electrode foil will produce burrs when trimming, and the electrolyte or electrolytic paper will contain impurities. This will cause the capacitor to charge during the charging process.
  • the voltage is applied, the amount of electricity in the capacitor is discharged by the burr and the tip of the electrode foil, and is consumed in a large amount in an instant, and there is a danger of internal explosion. If the internal explosion is large, the blasted casing may endanger personal safety. If the internal explosion is small, it is not known from the appearance of the capacitor that it is potentially dangerous, even if it is through conventional capacity or leakage.
  • the flash will suddenly flash when the voltage rises to the breakdown point, and the electrolyte at the flash point will be evaporated by high temperature. Then the electrolyte in the normal part is absorbed by the dried electrolytic paper and repeated. Flashing, the internal pressure of the capacitor will increase, and the capacitor will explode at any time after multiple flashes.
  • the finished capacitors must undergo an aging process before leaving the factory.
  • the aging process is the first charging of the capacitors.
  • the aging takes a long time, ranging from more than one hour to several tens of hours, and is carried out in a high temperature environment.
  • the capacitor aging box and the fully automatic aging machine only perform resistance current limiting charging on the capacitor during the aging process, and do not have the function of detecting and detecting the implosion flash. Therefore, it is possible to make the capacitor with internal explosion risk be regarded as compliance.
  • the capacitor is shipped.
  • the present invention is directed to providing a capacitor internal explosion detecting device that can solve the above technical problems.
  • the present invention adopts the following technical solutions:
  • a capacitor internal explosion detecting device comprising a voltage change detecting unit and a processor U9;
  • the voltage change detecting unit is configured to detect a voltage change value of the capacitor Cx to be aged, and compare the voltage change value with a preset voltage change threshold, and send a voltage abrupt signal to the voltage change value when the voltage change value is greater than the voltage change threshold.
  • a processor U9 the processor U9 is configured to output the signal according to the voltage abrupt signal A prompt signal indicating the internal explosion of the capacitor.
  • the internal explosion detecting device of the capacitor further comprises a current sampling unit; the current sampling unit is configured to detect a current of the capacitor Cx to be aged to generate a current sampling signal, and the processor U9 is further configured to receive the current sampling of the current sampling unit in real time. A signal to detect a current sampling signal that has abrupt changes.
  • the internal explosion detecting device of the capacitor further comprises a constant current adjusting unit; the constant current adjusting unit is configured to adjust a current of the capacitor Cx to be aged to a preset constant current value.
  • the internal explosion detecting device further includes a voltage sampling unit for detecting a voltage of the capacitor to be aged to generate a voltage sampling signal; the processor U9 is further configured to receive the voltage sampling signal in real time to detect a sudden voltage signal.
  • the capacitor internal explosion detecting device further comprises a rectifier bridge stack U1, and the positive terminal of the DC charging power source VCC is connected to the negative terminal of the DC charging power source VCC through the AC terminal of the capacitor Cx and the rectifier bridge U1;
  • the voltage change detecting unit comprises a resistor R3, a capacitor C2, a resistor R4, an integrated operational amplifier U2A, a resistor R5, a capacitor C5 and a resistor R12; the DC output terminal V+ of the rectifier bridge U1 is grounded through a resistor R3, a capacitor C2 and a resistor R4 in sequence.
  • the non-inverting terminal of the integrated operational amplifier U2A is connected between the capacitor C2 and the resistor R4; the inverting terminal of the integrated operational amplifier U2A is connected to the PWM signal output terminal PB2 of the processor through the resistor R12, and is also grounded through the capacitor C5.
  • the current sampling unit comprises a resistor R8, a resistor R9, a capacitor C3 and an analog-to-digital converter U8;
  • the constant current regulating unit comprises a field effect transistor Q1, an integrated operational amplifier U2B, a resistor R11 and a capacitor C4; and a rectifier bridge stack U1
  • the DC output terminal V+ is connected to the drain of the FET Q1, the source of the FET Q1 is grounded through the resistor R8, and is also grounded through the resistor R9 and the capacitor C3 in turn;
  • the input terminal of the analog-to-digital converter U8 +IN is connected to the capacitor C3 and the resistor
  • the output terminal DOUT of the analog-to-digital converter U8 is connected to the input terminal PD6 of the processor U9, the enable terminal CS of the analog-to-digital converter U8 is connected to the output terminal PD7 of the processor U9; the gate connection of the field effect transistor Q1 is integrated.
  • the output end of the operational amplifier U2B, the non-inverting terminal of the integrated operational amplifier U2B is grounded through the capacitor C4, and is also connected to the PWM signal output terminal PB1 of the processor U9 through the resistor R11; the inverting terminal of the integrated operational amplifier U2B is connected to the resistor R8 and the resistor R9. between.
  • the voltage sampling unit comprises a resistor R1, a resistor R2, a capacitor C1 and an analog-to-digital converter U7; the DC output terminal V+ of the rectifier bridge U1 is grounded through a resistor R1 and a resistor R2 in sequence, and the capacitor C1 and the resistor R2 are connected in parallel;
  • the input terminal +IN of the converter U7 is connected between the resistor R1 and the resistor R2, and the output terminal DOUT of the analog-to-digital converter U7 is connected to the input terminal PD6 of the processor U9, and the analog-to-digital converter U7
  • the enable terminal CS is connected to the output terminal PB0 of the processor U9.
  • the internal explosion detecting device of the capacitor further comprises a serial port communication unit for communicating with a host computer; the serial port communication unit is connected to the processor U9; the processor U9 is further configured to pass the sampling current signal The serial communication unit is sent to the upper computer for storage to further generate a current curve.
  • the internal explosion detecting device of the capacitor further comprises a serial port communication unit for communicating with a host computer; the serial port communication unit is connected to the processor U9; the processor U9 is further configured to pass the sampled voltage signal The serial communication unit is sent to the upper computer for storage to further generate a voltage curve.
  • the processor U9 can also receive a voltage change threshold setting command and a current threshold setting command from the upper computer through the serial port communication unit.
  • the above invention can quickly and accurately detect a capacitance in which an internal explosion or flash fire occurs in a capacitor aging process.
  • FIG. 1 is a circuit diagram of a preferred embodiment of a capacitive internal explosion detecting device of the present invention.
  • the present invention relates to a capacitor internal explosion detecting apparatus, and a preferred embodiment thereof includes a voltage change detecting unit and a processor U9.
  • the voltage change detecting unit is configured to detect a voltage change value of the capacitor to be aged, and compare the voltage change value with a preset voltage change threshold, and send a voltage abrupt signal to the process when the voltage change value is greater than the voltage change threshold Device.
  • the processor U9 is configured to output a prompt signal for prompting an internal explosion of the capacitor according to the voltage abrupt signal.
  • the internal explosion detecting device of the capacitor further includes a rectifier bridge stack U1.
  • the positive terminal of the DC charging power source VCC is connected to the negative terminal of the DC charging power source VCC through the AC terminal of the capacitor Cx and the rectifier bridge U1.
  • the DC charging power source VCC, the capacitor to be aged Cx and the rectifier bridge stack U1 constitute a charging circuit of the capacitor Cx to be aged.
  • the voltage change detecting unit includes a resistor R3, a capacitor C2, a resistor R4, an integrated operational amplifier U2A, a resistor R5, a capacitor C5, and a resistor R12.
  • the DC output terminal V+ of the rectifier bridge stack U1 is grounded through a resistor R3, a capacitor C2 and a resistor R4 in sequence.
  • the non-inverting terminal of the integrated operational amplifier U2A is connected between the capacitor C2 and the resistor R4.
  • the inverting terminal of the integrated operational amplifier U2A is connected to the PWM signal output terminal PB2 of the processor through a resistor R12, and is also grounded through a capacitor C5.
  • the capacitor Cx to be aging explodes or flashes during the charging process, it will consume a large amount of time, so that the voltage of the capacitor Cx to be aged is greatly reduced instantaneously. Since the output voltage of the DC charging power source VCC is constant, the output of the rectifier bridge U1 is output. The DC voltage will increase substantially instantaneously, and the calculus circuit composed of resistor R3 and capacitor C2 transmits the voltage change value to the integrated operational amplifier U2A.
  • the processor U9 outputs a first PWM signal of a preset duty ratio, and the first PWM signal is converted into an analog voltage change threshold by an integrating circuit composed of a resistor R12 and a capacitor C5, and then sent to the integrated operational amplifier U2A.
  • the integrated operational amplifier U2A compares the voltage change value with the voltage change threshold, and outputs a high level signal to the first input terminal PB7 of the processor U9 when the voltage change value is greater than the voltage change threshold.
  • the processor U9 outputs a prompt signal for prompting an internal explosion of the capacitor according to the high level signal.
  • the magnitude of the voltage change threshold can be changed correspondingly to adjust the detection sensitivity of the voltage change detecting unit.
  • the cue signal for prompting an internal explosion of the capacitor may be a signal that drives the speaker or/and the LED to operate.
  • the voltage change detecting unit comprises a Zener diode D2, which is connected in parallel with the resistor R4 for clamping the instantaneously varying voltage to prevent the voltage from being too high and damaging the integrated operational amplifier U2A.
  • the capacitor internal explosion detecting device further includes a current sampling unit and a constant current adjusting unit.
  • the current sampling unit is configured to detect a current of the capacitor Cx to be aged to generate a current sampling signal
  • the processor U9 is further configured to receive a current sampling signal of the current sampling unit in real time to detect a sudden current sampling signal; thus, The aging capacitor implosion is judged twice.
  • the constant current adjusting unit is configured to adjust the current of the capacitor Cx to be a preset constant current value to limit the charging current when the capacitor is imploded or flashed.
  • the current sampling unit includes a resistor R8, a resistor R9, a capacitor C3, and an analog to digital converter U8.
  • the constant current regulating unit includes a field effect transistor Q1, an integrated operational amplifier U2B, a resistor R11, and a capacitor C4.
  • the DC output terminal V+ of the rectifier bridge stack U1 is connected to the drain of the FET Q1, and the source of the FET Q1 is grounded through the resistor R8, and is also grounded through the resistor R9 and the capacitor C3 in sequence.
  • the input terminal +IN of the analog-to-digital converter U8 is connected between the capacitor C3 and the resistor R9, the output terminal DOUT of the analog-to-digital converter U8 is connected to the input terminal PD6 of the processor U9, and the enable terminal CS of the analog-to-digital converter U8 is connected to the processor.
  • the output of the U9 is PD7.
  • the gate of the FET Q1 is connected to the output of the integrated operational amplifier U2B, and the in-phase of the integrated operational amplifier U2B The terminal is grounded through the capacitor C4, and is also connected to the PWM signal output terminal PB1 of the processor U9 through the resistor R11.
  • the inverting terminal of the integrated operational amplifier U2B is connected between the resistor R8 and the resistor R9.
  • the DC power from the rectifier bridge stack U1 is subjected to analog-to-digital conversion by an analog-to-digital converter U8 through an integrating circuit composed of a capacitor C3 and a resistor R9, and the sampling current signal is sent to the processor U9.
  • the integrated potential signal is sent to the integrated operational amplifier U2B.
  • the PWM signal output terminal PB2 of the processor U9 outputs a second PWM signal of a preset duty ratio, and the second PWM signal is converted into an analog potential threshold by an integrating circuit composed of a resistor R11 and a capacitor C4, and the integrated operational amplifier U2B will The integrated potential signal is compared with the current threshold.
  • the integrated operational amplifier U2B When the current signal is greater than the current threshold, the integrated operational amplifier U2B outputs a low-level signal, causing the FET Q1 to be turned off, thereby disconnecting the rectifier bridge stack U1 from the current sampling unit.
  • the resistor R8, the resistor R9 and the capacitor C3 form a discharge loop, and the voltage of the resistor R9 becomes small until the potential signal of the inverting terminal of the integrated operational amplifier U2B is less than the potential threshold, and the output terminal of the integrated operational amplifier U2B outputs a high level signal, so that The field effect transistor Q1 is turned on, and the rectifier bridge stack U1 and the current sampling unit are turned on again.
  • the current of the capacitor aging capacitor Cx is dynamically adjusted to a preset constant current value to limit the charging current when the capacitor is imploded or flashed.
  • the capacitor internal explosion detecting device further includes a voltage sampling unit for detecting the voltage of the capacitor Cx to be aged to generate a voltage sampling signal.
  • the processor U9 is further configured to receive the voltage sampling signal in real time to detect that a sudden voltage signal is generated. In this way, the second judgment of the aging capacitor implosion can be performed.
  • the voltage sampling unit includes a resistor R1, a resistor R2, a capacitor C1, and an analog to digital converter U7.
  • the DC output terminal V+ of the rectifier bridge stack U1 is grounded through the resistor R1 and the resistor R2 in sequence, and the capacitor C1 and the resistor R2 are connected in parallel.
  • the input terminal +IN of the analog-to-digital converter U7 is connected between the resistor R1 and the resistor R2, the output terminal DOUT of the analog-to-digital converter U7 is connected to the input terminal PD6 of the processor U9, and the enable terminal CS of the analog-to-digital converter U7 is connected to the processor.
  • the output of P9 is UB.
  • the processor U9 controls the analog-to-digital converter U7 and the analog-to-digital converter U8 to alternately operate in turn to read the sampled voltage signal and the sampled current signal through the input terminal PD6, respectively.
  • the capacitor internal explosion detecting device further includes a serial port communication unit 10 for communicating with a host computer.
  • the serial port communication unit 10 is connected to the processor U9.
  • the processor U9 is further configured to send the sampling current signal and the sampling voltage signal to the host computer through the serial communication unit for storage to further generate a voltage curve and a current curve. In this way, the staff can intuitively know the possibility of capacitor implosion through the voltage curve and the current curve.
  • the processor U9 can also receive the voltage change threshold setting command and the current threshold setting command from the upper computer through the serial port communication unit 10, according to the voltage change threshold setting command and the current threshold setting command corresponding setting.
  • the duty ratio of the PWM signal and the second PWM signal thereby adjusting the voltage change threshold of the voltage change adjustment unit and adjusting the current threshold of the constant current adjustment unit.
  • the prior art generally implements threshold adjustment by changing hardware settings such as adjusting resistance values.
  • the present invention can conveniently and quickly adjust the threshold without changing hardware, and the cost is low.

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Measurement Of Resistance Or Impedance (AREA)

Abstract

电容内部爆炸检测装置,其包括电压变化检测单元和处理器U9;该电压变化检测单元用于检测待老化电容C X的电压变化值,并将该电压变化值与预设的电压变化阈值进行比对,在该电压变化值大于电压变化阈值时,发送电压突变信号至处理器U9;处理器U9用于根据该电压突变信号输出用于提示电容内部爆炸的提示信号。该检测装置可在电容待老化工序中快速准确地检测出发生内部爆炸或闪火的电容。

Description

电容内部爆炸检测装置 技术领域
本发明涉及一种电容内部爆炸检测装置。
背景技术
电容器在生产过程中有时会存在一些工艺问题,例如,电极箔在切边时会产生毛刺,电解液或电解纸含有杂质;如此,将会导致电容在充电的过程中,随着充电电压达到击穿电压,电容器内的电量通过毛刺与电极箔的尖端进行放电,瞬间大量消耗,将会存在内部爆炸的危险。若内部爆炸程度较大,炸开的外壳有可能会危及人身安全。若内部爆炸程度较小,从电容器外观无法获知其存在潜在危险,即使通过常规的容量或漏电均可能无法检测出。对于电解液中含有杂质的产品,在电压上升到击穿点时会突然闪火,闪火点的电解液也会因此被高温蒸发,随后正常部位的电解液被干涸的电解纸吸收而发生重复闪火,电容器内部压力会随之增大,多次闪火后电容器随时都会爆炸。
成品电容器在出厂前均要经过老化工序,老化工序是电容器第一次充电,老化所需要的时间较长,从一个多小时到几十个小时不等,且在高温环境下进行,而传统的电容器老化箱以及全自动老化机在老化过程中只对电容器进行电阻限流充电,不具备发现和检测内爆闪火的功能,如此,将有可能使得存在内部爆炸风险的电容器被当作合规电容器出厂。
发明内容
针对现有技术的不足,本发明旨在于提供一种可解决上述技术问题的电容内部爆炸检测装置。
为实现上述目的,本发明采用如下技术方案:
一种电容内部爆炸检测装置,其包括电压变化检测单元和处理器U9;
该电压变化检测单元用于检测待老化电容Cx的电压变化值,并将该电压变化值与预设的电压变化阈值进行比对,在该电压变化值大于电压变化阈值时,发送电压突变信号至处理器U9;处理器U9用于根据该电压突变信号输出用于 提示电容内部爆炸的提示信号。
优选地,该电容内部爆炸检测装置还包括电流采样单元;该电流采样单元用于检测待老化电容Cx的电流,以生成电流采样信号,该处理器U9还用于实时接收电流采样单元的电流采样信号,以检测发生突变的电流采样信号。
优选地,该电容内部爆炸检测装置还包括恒流调节单元;该恒流调节单元用于调节待老化电容Cx的电流为预设恒定电流值。
优选地,该电容内部爆炸检测装置还包括一电压采样单元,用于检测待老化电容的电压,以生成电压采样信号;该处理器U9还用于实时接收该电压采样信号,以检测发生突变电压信号。
优选地,电容内部爆炸检测装置还包括一整流桥堆U1,一直流充电电源VCC的正极端通过待老化电容Cx和整流桥堆U1的交流端连接直流充电电源VCC的负极端;
该电压变化检测单元包括电阻R3、电容C2、电阻R4、集成运放U2A、电阻R5、电容C5和电阻R12;该整流桥堆U1的直流输出端V+依次通过电阻R3、电容C2和电阻R4接地;集成运放U2A的同相端连接于电容C2和电阻R4之间;集成运放U2A的反相端通过电阻R12连接处理器的PWM信号输出端PB2,还通过电容C5接地。
优选地,该电流采样单元包括电阻R8、电阻R9、电容C3和模数转换器U8;该恒流调节单元包括场效应管Q1、集成运放U2B、电阻R11和电容C4;整流桥堆U1的直流输出端V+连接场效应管Q1的漏极,场效应管Q1的源极通过电阻R8接地,还依次通过电阻R9和电容C3接地;模数转换器U8的输入端+IN连接电容C3和电阻R9之间,模数转换器U8的输出端DOUT连接处理器U9的输入端PD6,模数转换器U8的使能端CS连接处理器U9的输出端PD7;场效应管Q1的栅极连接集成运放U2B的输出端,集成运放U2B的同相端通过电容C4接地,还通过电阻R11连接处理器U9的PWM信号输出端PB1;集成运放U2B的反相端连接于电阻R8和电阻R9之间。
优选地,该电压采样单元包括电阻R1、电阻R2、电容C1和模数转换器U7;整流桥堆U1的直流输出端V+依次通过电阻R1和电阻R2接地,电容C1和电阻R2并联;模数转换器U7的输入端+IN连接电阻R1和电阻R2之间,模数转换器U7的输出端DOUT连接处理器U9的输入端PD6,模数转换器U7的 使能端CS连接处理器U9的输出端PB0。
优选地,该电容内部爆炸检测装置还包括用于与一上位机进行通信的串行口通信单元;该串行口通信单元连接处理器U9;该处理器U9还用于将采样电流信号通过该串行通信单元发送至上位机进行存储,以进一步生成电流曲线。
优选地,该电容内部爆炸检测装置还包括用于与一上位机进行通信的串行口通信单元;该串行口通信单元连接处理器U9;该处理器U9还用于将采样电压信号通过该串行通信单元发送至上位机进行存储,以进一步生成电压曲线。
优选地,该处理器U9还可通过该串行口通信单元接收来自该上位机的电压变化阈值设定指令和电流阈值设定指令。
上述发明可在电容待老化工序中快速准确地检测出发生内部爆炸或闪火的电容。
附图说明
图1为本发明电容内部爆炸检测装置的较佳实施方式的电路图。
具体实施方式
下面将结合附图以及具体实施方式,对本发明做进一步描述:
请参见图1,本发明涉及一种电容内部爆炸检测装置,其较佳实施方式包括电压变化检测单元和处理器U9。
该电压变化检测单元用于检测待老化电容的电压变化值,并将该电压变化值与预设的电压变化阈值进行比对,在该电压变化值大于电压变化阈值时,发送电压突变信号至处理器。
处理器U9用于根据该电压突变信号输出用于提示电容内部爆炸的提示信号。
本实施例中,电容内部爆炸检测装置还包括一整流桥堆U1,一直流充电电源VCC的正极端通过待老化电容Cx和整流桥堆U1的交流端连接直流充电电源VCC的负极端。直流充电电源VCC、待老化电容Cx和整流桥堆U1构成一待老化电容Cx的充电回路。
该电压变化检测单元包括电阻R3、电容C2、电阻R4、集成运放U2A、电阻R5、电容C5和电阻R12。
该整流桥堆U1的直流输出端V+依次通过电阻R3、电容C2和电阻R4接地。集成运放U2A的同相端连接于电容C2和电阻R4之间。集成运放U2A的反相端通过电阻R12连接处理器的PWM信号输出端PB2,还通过电容C5接地。
当待老化电容Cx在充电过程出现内爆或闪火时会瞬间消耗自身大量,使得待老化电容Cx的电压瞬间大幅度降低,由于直流充电电源VCC的输出电压恒定,则整流桥堆U1所输出的直流电压将瞬间大幅度增大,电阻R3和电容C2组成的微积分电路将电压变化值传输至集成运放U2A。处理器U9输出一预设占空比的第一PWM信号,该第一PWM信号通过电阻R12和电容C5组成的积分电路转换为模拟量的电压变化阈值,进而输送至集成运放U2A。集成运放U2A将电压变化值与电压变化阈值进行比较,在电压变化值大于电压变化阈值时输出高电平信号至处理器U9的第一输入端PB7。处理器U9根据该高电平信号输出用于提示电容内部爆炸的提示信号。
其中,通过设置第一PWM信号的占空比即可对应改变电压变化阈值的大小,以调节电压变化检测单元的检测灵敏度。该用于提示电容内部爆炸的提示信号可为驱动扬声器或/和发光二极管工作的信号。
该电压变化检测单元包括稳压二极管D2,该稳压二极管D2与电阻R4并联连接,用于对瞬间变化的电压进行钳位,防止电压过高损坏集成运放U2A。
本实施例中,该电容内部爆炸检测装置还包括电流采样单元和恒流调节单元。该电流采样单元用于检测待老化电容Cx的电流,以生成电流采样信号,该处理器U9还用于实时接收电流采样单元的电流采样信号,以检测发生突变的电流采样信号;如此,可对待老化电容内爆进行二次判断。该恒流调节单元用于调节待老化电容Cx的电流为预设恒定电流值,以在电容器内爆或闪火时限制充电电流。
该电流采样单元包括电阻R8、电阻R9、电容C3和模数转换器U8。该恒流调节单元包括场效应管Q1、集成运放U2B、电阻R11和电容C4。
整流桥堆U1的直流输出端V+连接场效应管Q1的漏极,场效应管Q1的源极通过电阻R8接地,还依次通过电阻R9和电容C3接地。模数转换器U8的输入端+IN连接电容C3和电阻R9之间,模数转换器U8的输出端DOUT连接处理器U9的输入端PD6,模数转换器U8的使能端CS连接处理器U9的输出端PD7。场效应管Q1的栅极连接集成运放U2B的输出端,集成运放U2B的同相 端通过电容C4接地,还通过电阻R11连接处理器U9的PWM信号输出端PB1。集成运放U2B的反相端连接于电阻R8和电阻R9之间。
来自整流桥堆U1的直流电通过电容C3和电阻R9组成的积分电路后通过模数转换器U8进行模数转换,再将采样电流信号输送至处理器U9。同时,积分后的电势信号输送至集成运放U2B。处理器U9的PWM信号输出端PB2输出一预设占空比的第二PWM信号,该第二PWM信号通过电阻R11和电容C4组成的积分电路转换为模拟量的电势阈值,集成运放U2B将积分后的电势信号与电流阈值进行比对,在电流信号大于电流阈值时,集成运放U2B输出低电平信号,使得场效应管Q1截止,从而使得整流桥堆U1与电流采样单元之间断开,电阻R8、电阻R9和电容C3构成一放电回路,电阻R9的电压变小,直至集成运放U2B的反相端的电势信号小于电势阈值,集成运放U2B的输出端输出高电平信号,使得场效应管Q1导通,整流桥堆U1与电流采样单元再次导通。如此,动态调节待老化电容Cx的电流为预设恒定电流值,以在电容器内爆或闪火时限制充电电流。
本实施例中,该电容内部爆炸检测装置还包括一电压采样单元,用于检测待老化电容Cx的电压,以生成电压采样信号。该处理器U9还用于实时接收该电压采样信号,以检测发生突变电压信号。如此,可对待老化电容内爆进行二次判断。
该电压采样单元包括电阻R1、电阻R2、电容C1和模数转换器U7。整流桥堆U1的直流输出端V+依次通过电阻R1和电阻R2接地,电容C1和电阻R2并联。模数转换器U7的输入端+IN连接电阻R1和电阻R2之间,模数转换器U7的输出端DOUT连接处理器U9的输入端PD6,模数转换器U7的使能端CS连接处理器U9的输出端PB0。
处理器U9控制模数转换器U7和模数转换器U8轮流交替工作,以通过输入端PD6分别读取采样电压信号和采样电流信号。
该电容内部爆炸检测装置还包括用于与一上位机进行通信的串行口通信单元10。该串行口通信单元10连接处理器U9。该处理器U9还用于将采样电流信号和采样电压信号通过该串行通信单元发送至上位机进行存储,以进一步生成电压曲线和电流曲线。如此,工作人员可通过电压曲线和电流曲线直观地获知电容内爆的可能性。
该处理器U9还可通过该串行口通信单元10接收来自该上位机的电压变化阈值设定指令和电流阈值设定指令,以根据电压变化阈值设定指令和电流阈值设定指令对应设置第一PWM信号和第二PWM信号的占空比,进而调节电压变化调节单元的电压变化阈值和调节恒流调节单元的电流阈值。现有技术一般通过改变硬件设置如调节阻值来实现阈值调节,本发明无需改变硬件即可方便快速地调节阈值,成本低。
对于本领域的技术人员来说,可根据以上描述的技术方案以及构思,做出其它各种相应的改变以及变形,而所有的这些改变以及变形都应该属于本发明权利要求的保护范围之内。

Claims (10)

  1. 一种电容内部爆炸检测装置,其特征在于:其包括电压变化检测单元和处理器;
    该电压变化检测单元用于检测待老化电容的电压变化值,并将该电压变化值与预设的电压变化阈值进行比对,在该电压变化值大于电压变化阈值时,发送电压突变信号至处理器;处理器用于根据该电压突变信号输出用于提示电容内部爆炸的提示信号。
  2. 如权利要求1所述的电容内部爆炸检测装置,其特征在于:该电容内部爆炸检测装置还包括电流采样单元;该电流采样单元用于检测待老化电容的电流,以生成电流采样信号,该处理器还用于实时接收电流采样单元的电流采样信号,以检测发生突变的电流采样信号。
  3. 如权利要求2所述的电容内部爆炸检测装置,其特征在于:该电容内部爆炸检测装置还包括恒流调节单元;该恒流调节单元用于调节待老化电容的电流为预设恒定电流值。
  4. 如权利要求1所述的电容内部爆炸检测装置,其特征在于:该电容内部爆炸检测装置还包括一电压采样单元,用于检测待老化电容的电压,以生成电压采样信号;该处理器还用于实时接收该电压采样信号,以检测发生突变电压信号。
  5. 如权利要求1所述的电容内部爆炸检测装置,其特征在于:电容内部爆炸检测装置还包括一整流桥堆,一直流充电电源的正极端通过待老化电容和整流桥堆的交流端连接直流充电电源的负极端;
    该电压变化检测单元包括第一电阻、第一电容、第二电阻、集成运放、第三电阻、第二电容和第四电阻;该整流桥堆的直流输出端依次通过第一电阻、第一电容和第二电阻接地;集成运放的同相端连接于第一电容和第二电阻之间;集成运放的反相端通过第四电阻连接处理器的PWM信号输出端,还通过第二电容接地。
  6. 如权利要求3所述的电容内部爆炸检测装置,其特征在于:电容内部爆炸检测装置还包括一整流桥堆,一直流充电电源的正极端通过待老化电容和整流桥堆的交流端连接直流充电电源的负极端;
    该电流采样单元包括第五电阻、第六电阻、第三电容和模数转换器;该恒流调节单元包括场效应管、集成运放、第七电阻和第四电容;整流桥堆的直流输出端连接场效应管的漏极,场效应管的源极通过第五电阻接地,还依次通过第六电阻和第三电容接地;模数转换器的输入端连接第三电容和第六电阻之间,模数转换器的输出端连接处理器的输入端,模数转换器的使能端连接处理器的输出端;场效应管的栅极连接集成运放的输出端,集成运放的同相端通过第四电容接地,还通过第七电阻连接处理器的PWM信号输出端;集成运放的反相端连接于第五电阻和第六电阻之间。
  7. 如权利要求4所述的电容内部爆炸检测装置,其特征在于:电容内部爆炸检测装置还包括一整流桥堆,一直流充电电源的正极端通过待老化电容和整流桥堆的交流端连接直流充电电源的负极端;
    该电压采样单元包括第八电阻、第九电阻、第五电容和模数转换器;整流桥堆的直流输出端依次通过第八电阻和第九电阻接地,第五电容和第九电阻并联;模数转换器的输入端连接第八电阻和第九电阻之间,模数转换器的输出端连接处理器的输入端,模数转换器的使能端连接处理器的输出端。
  8. 如权利要求2所述的电容内部爆炸检测装置,其特征在于:该电容内部爆炸检测装置还包括用于与一上位机进行通信的串行口通信单元;该串行口通信单元连接处理器;该处理器还用于将采样电流信号通过该串行通信单元发送至上位机进行存储,以进一步生成电流曲线。
  9. 如权利要求7所述的电容内部爆炸检测装置,其特征在于:该电容内部爆炸检测装置还包括用于与一上位机进行通信的串行口通信单元;该串行口通信单元连接处理器;该处理器还用于将采样电压信号通过该串行通信单元发送至上位机进行存储,以进一步生成电压曲线。
  10. 如权利要求3所述的电容内部爆炸检测装置,其特征在于:该处理器还可通过该串行口通信单元接收来自该上位机的电压变化阈值设定指令和电流阈值设定指令。
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