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WO2015114093A3 - Beleuchtungseinrichtung insbesondere zur fourier-ptychographie - Google Patents

Beleuchtungseinrichtung insbesondere zur fourier-ptychographie Download PDF

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Publication number
WO2015114093A3
WO2015114093A3 PCT/EP2015/051924 EP2015051924W WO2015114093A3 WO 2015114093 A3 WO2015114093 A3 WO 2015114093A3 EP 2015051924 W EP2015051924 W EP 2015051924W WO 2015114093 A3 WO2015114093 A3 WO 2015114093A3
Authority
WO
WIPO (PCT)
Prior art keywords
illumination device
fourier ptychography
ptychography
fourier
light
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
PCT/EP2015/051924
Other languages
English (en)
French (fr)
Other versions
WO2015114093A2 (de
Inventor
Lars STOPPE
Christoph HUSEMANN
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Carl Zeiss AG
Original Assignee
Carl Zeiss AG
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Carl Zeiss AG filed Critical Carl Zeiss AG
Publication of WO2015114093A2 publication Critical patent/WO2015114093A2/de
Publication of WO2015114093A3 publication Critical patent/WO2015114093A3/de
Anticipated expiration legal-status Critical
Ceased legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/36—Microscopes arranged for photographic purposes or projection purposes or digital imaging or video purposes including associated control and data processing arrangements
    • G02B21/365—Control or image processing arrangements for digital or video microscopes
    • G02B21/367—Control or image processing arrangements for digital or video microscopes providing an output produced by processing a plurality of individual source images, e.g. image tiling, montage, composite images, depth sectioning, image comparison
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/06—Means for illuminating specimens
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B26/00—Optical devices or arrangements for the control of light using movable or deformable optical elements
    • G02B26/08—Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the direction of light
    • G02B26/0816—Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the direction of light by means of one or more reflecting elements
    • G02B26/0833—Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the direction of light by means of one or more reflecting elements the reflecting element being a micromechanical device, e.g. a MEMS mirror, DMD

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Microscoopes, Condenser (AREA)

Abstract

Es wird eine Beleuchtungseinrichtung sowie eine Mikroskopvorrichtung für eine derartige Beleuchtungseinrichtung und ein entsprechendes Verfahren bereitgestellt. Mittels einer Auswahleinrichtung (24) kann ein Teil eines Lichtes einer Lichtquelle (20) ausgewählt werden, um ein Objekt (27) aus einer gewünschten Richtung zu beleuchten.
PCT/EP2015/051924 2014-01-31 2015-01-30 Beleuchtungseinrichtung insbesondere zur fourier-ptychographie Ceased WO2015114093A2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE102014101219.4 2014-01-31
DE102014101219.4A DE102014101219A1 (de) 2014-01-31 2014-01-31 Beleuchtungseinrichtung zur Fourier-Ptychographie

Publications (2)

Publication Number Publication Date
WO2015114093A2 WO2015114093A2 (de) 2015-08-06
WO2015114093A3 true WO2015114093A3 (de) 2015-09-24

Family

ID=52434828

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/EP2015/051924 Ceased WO2015114093A2 (de) 2014-01-31 2015-01-30 Beleuchtungseinrichtung insbesondere zur fourier-ptychographie

Country Status (2)

Country Link
DE (1) DE102014101219A1 (de)
WO (1) WO2015114093A2 (de)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102014109687B4 (de) 2014-07-10 2020-03-19 Carl Zeiss Microscopy Gmbh Positionsbestimmung eines Objekts im Strahlengang einer optischen Vorrichtung
DE102014110302B3 (de) 2014-07-22 2015-09-03 Carl Zeiss Ag Verfahren und Vorrichtung zum Abbilden eines Objekts
DE102014112242A1 (de) 2014-08-26 2016-03-03 Carl Zeiss Ag Phasenkontrast-Bildgebung
DE102014113258A1 (de) 2014-09-15 2016-03-17 Carl Zeiss Ag Verfahren zum Erzeugen eines Ergebnisbilds und optische Vorrichtung
US10394011B2 (en) 2015-09-16 2019-08-27 Technion Research And Development Foundation Ltd. Ptychography system
DE102015122712B4 (de) 2015-12-23 2023-05-04 Carl Zeiss Microscopy Gmbh Vorrichtung und Verfahren zur Bildaufnahme
DE102016108079A1 (de) * 2016-05-02 2017-11-02 Carl Zeiss Microscopy Gmbh Artefaktreduktion bei der winkelselektiven beleuchtung
DE102019108677A1 (de) 2019-04-03 2020-10-08 Carl Zeiss Jena Gmbh Vorrichtungen zum Erzeugen von Leuchtverteilungen mit Lichtwellenleitern
KR102882926B1 (ko) * 2021-11-05 2025-11-07 한국전자통신연구원 소형 폼팩터 광학 시스템의 3d 광학 현미경 장치
DE102022130975A1 (de) * 2022-11-23 2024-05-23 Carl Zeiss Microscopy Gmbh Lokalisierung von verschmutzungen in mikroskopiesystemen

Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5022743A (en) * 1987-03-27 1991-06-11 The Board Of Trustees Of The Leland Stanford Junior University Scanning confocal optical microscope
US5065008A (en) * 1989-10-18 1991-11-12 Fuji Photo Film Co., Ltd. Scanning microscope and scanning mechanism for the same
EP1150154A1 (de) * 2000-04-26 2001-10-31 Cobra electronic GmbH Anordnung und Verfahren zur ringförmigen Beleuchtung, insbesondere zur Auflichtbeleuchtung bei Mikroskopen
US6461030B1 (en) * 1999-03-01 2002-10-08 Mitutoyo Corporation Illuminator for optical measuring instrument
US20040190132A1 (en) * 2003-03-19 2004-09-30 Axel Laschke Control unit for mixed light illumination, especially for microscopy
US20070188856A1 (en) * 1997-10-29 2007-08-16 Motic China Group Co., Ltd. Apparatus and methods relating to spatially light modulated microscopy
DE202009014694U1 (de) * 2009-10-30 2010-02-25 Kratzer, Martin Elektronische Polarisationsumschaltung bei der automatischen Restschmutzanalyse zur Identifizierung von metallischen Partikeln

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5022743A (en) * 1987-03-27 1991-06-11 The Board Of Trustees Of The Leland Stanford Junior University Scanning confocal optical microscope
US5065008A (en) * 1989-10-18 1991-11-12 Fuji Photo Film Co., Ltd. Scanning microscope and scanning mechanism for the same
US20070188856A1 (en) * 1997-10-29 2007-08-16 Motic China Group Co., Ltd. Apparatus and methods relating to spatially light modulated microscopy
US6461030B1 (en) * 1999-03-01 2002-10-08 Mitutoyo Corporation Illuminator for optical measuring instrument
EP1150154A1 (de) * 2000-04-26 2001-10-31 Cobra electronic GmbH Anordnung und Verfahren zur ringförmigen Beleuchtung, insbesondere zur Auflichtbeleuchtung bei Mikroskopen
US20040190132A1 (en) * 2003-03-19 2004-09-30 Axel Laschke Control unit for mixed light illumination, especially for microscopy
DE202009014694U1 (de) * 2009-10-30 2010-02-25 Kratzer, Martin Elektronische Polarisationsumschaltung bei der automatischen Restschmutzanalyse zur Identifizierung von metallischen Partikeln

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
GUOAN ZHENG ET AL: "Wide-field, high-resolution Fourier ptychographic microscopy", NATURE PHOTONICS, vol. 7, no. 9, 28 July 2013 (2013-07-28), pages 739 - 745, XP055181687, ISSN: 1749-4885, DOI: 10.1038/nphoton.2013.187 *

Also Published As

Publication number Publication date
DE102014101219A1 (de) 2015-08-06
WO2015114093A2 (de) 2015-08-06

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