[go: up one dir, main page]

WO2015188638A1 - Procédé et système pour augmenter la capacité d'identification de matériau d'un système de rayonnement à double énergie - Google Patents

Procédé et système pour augmenter la capacité d'identification de matériau d'un système de rayonnement à double énergie Download PDF

Info

Publication number
WO2015188638A1
WO2015188638A1 PCT/CN2015/073184 CN2015073184W WO2015188638A1 WO 2015188638 A1 WO2015188638 A1 WO 2015188638A1 CN 2015073184 W CN2015073184 W CN 2015073184W WO 2015188638 A1 WO2015188638 A1 WO 2015188638A1
Authority
WO
WIPO (PCT)
Prior art keywords
dual
pulse
energy
radiation
thickness
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
PCT/CN2015/073184
Other languages
English (en)
Chinese (zh)
Inventor
王少锋
李苏祺
郑建斌
张丹
曹艳锋
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
POWERSCAN Co Ltd
Original Assignee
POWERSCAN Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by POWERSCAN Co Ltd filed Critical POWERSCAN Co Ltd
Publication of WO2015188638A1 publication Critical patent/WO2015188638A1/fr
Anticipated expiration legal-status Critical
Ceased legal-status Critical Current

Links

Images

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/083—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the radiation being X-rays
    • G01N23/087—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the radiation being X-rays using polyenergetic X-rays

Definitions

  • the invention relates to the field of radiation imaging technology, and particularly relates to a method and system for improving the material recognition capability of a dual energy radiation system.
  • dual energy technology can determine the equivalent atomic number Z of the measured object, which can help identify drugs, explosives, special nuclear materials and so on.
  • dual energy ray systems use alternating dual energy X-ray radiation sources with a single pulse dose difference between the two energies.
  • Research and analysis show that when the low energy ray pulse penetrates the measured object with a certain thickness, the relative error of the radiation dose detected by the detector becomes larger. As the thickness of the material increases, the ability of the dual energy system to identify the material significantly deteriorates.
  • the present invention provides a method and system for improving the material recognition capability of a dual-energy radiation system, optimizing the radiation pulse number ratio or pulse dose ratio of the dual-energy radiation source, thereby improving the material identification capability of the dual energy system.
  • the invention provides a method for improving the material recognition capability of a dual energy radiation system, comprising: step one, determining the atomic number and thickness of the material to be detected; and step two, calculating the number of pulses according to the atomic number and the thickness according to the following formula ratio;
  • the lower corners 1 and 2 respectively represent data corresponding to high energy pulse radiation and low energy pulse radiation
  • I is the dose of radiation pulse radiation when no material is blocked
  • t is the thickness of the material
  • Z is the atomic number of the material
  • ⁇ (t, z ) is the attenuation coefficient of the material
  • the pulse number ratio of the dual energy radiation system is adjusted to the pulse number ratio calculated according to the formula.
  • the atomic number and thickness of the detected material are determined according to the dual energy radiation image of the detected material obtained by the dual energy radiation system.
  • the present invention also provides a dual-energy radiation system based on the above method for improving the material recognition capability of a dual-energy radiation system, comprising: a dual-energy radiation source, a radiation detector, a dual-energy image acquisition device, an algorithm module, and a control module;
  • the dual-energy radiation source emits a dual-energy radiation beam, and performs dual-energy scanning on the detected material;
  • the radiation detector receives the dual-energy radiation beam, converts the dual-energy radiation beam into a digital signal, and transmits it to the dual-energy image acquisition device;
  • dual-energy image acquisition The device generates a dual-energy radiation image according to the received digital signal;
  • the algorithm module calculates a pulse number ratio according to the atomic number and the thickness according to the formula; and the control module controls the pulse calculated by the dual-energy radiation source according to the algorithm module
  • the quantity ratio is a dual energy radiation beam.
  • Figure 1 is a flow diagram of sample based adjustment prior to scanning operation, in accordance with one embodiment of the present invention.
  • FIG. 2 is a flow chart based on sample conditioning prior to scanning operation, in accordance with another embodiment of the present invention.
  • FIG. 3 is a block diagram showing the structure of a dual energy radiation imaging system according to an embodiment of the present invention.
  • FIG. 4 is a flow chart of real-time adjustment during a scan operation in accordance with one embodiment of the present invention.
  • Figure 5 is a schematic illustration of the state of the dual energy radiation pulse dose ratio of the present invention based on the embodiment of Figure 4.
  • FIG. 6 is a block diagram showing the structure of a dual energy radiation imaging system according to another embodiment of the present invention.
  • Figure 7 is a flow diagram based on sample conditioning prior to scanning operation, in accordance with one embodiment of the present invention.
  • Figure 8 is a schematic illustration of the state of the dual energy radiation pulse dose ratio of the present invention based on the embodiment of Figure 7.
  • Figure 9 is a flow diagram of a multi-method adjustment of the number or dose ratio of dual energy radiation pulses in accordance with one embodiment of the present invention.
  • Figure 10 is a flow diagram of a multi-method adjustment of the number or dose ratio of dual energy radiation pulses in accordance with another embodiment of the present invention.
  • the total dose of the radiation beam emitted by the dual-energy radiation source is a determined value, and the total number of radiation pulses is also a determined value.
  • the present invention treats the high-energy ray pulse and the low-energy ray pulse separately. It is composed of several sub-ray pulses, and the pulse number ratio refers to the ratio of the number of high-energy ray pulses and low-energy ray pulses, and the pulse-to-dose ratio refers to the ratio of the doses of the high-energy ray pulse and the low-energy ray pulse.
  • the pulse ratio or dose ratio of the system can be adjusted by adjusting the time between the two energy rays.
  • FIG. 1 is a flow chart showing a method for improving the material identification capability of a dual energy radiation system of the present invention, including:
  • S103 determining whether the detected data is consistent with the test sample according to the scan detection result, if the detected type is different from the first type or the detected thickness is different from the first thickness, the detected data is inconsistent with the test sample, and executing S104; If the detected type is the first type and the detected thickness is the first thickness, the detected data is consistent with the test sample, and S105 is performed;
  • S105 Determine a current pulse number ratio or a pulse dose ratio as a scan operation ratio of the dual energy radiation source.
  • a double-energy scan is performed on the test sample with iron having a thickness of t 1 . If the thickness obtained by the scan is not t 1 , or the material displayed by the scan is not iron, the image is usually unclear on the dual-energy image. There are many pixel impurities, indicating that the current system has low recognition ability for the sample. In order to improve the recognition ability of the system for the iron material with thickness t 1 , adjust the time of the two energy radiation beams of the dual energy radiation source, change the pulse number ratio or the dose ratio of the system, re-scan the sample, and observe the scanning image effect.
  • the scan results of the dual-energy system are consistent with the properties of the sample itself, indicating that the dual-energy system has the best recognition ability for the iron material having the thickness t 1 , and the present invention refers to the state of the dual-energy system as the “best material”. Identify status.”
  • the adjusted dual energy system is good enough to recognize the thickness of t 1 thickness.
  • the system works in the best material identification state, if there is t 1 thickness of iron in the detected object.
  • the system can be well identified to avoid misdetection and missed detection.
  • the pulse quantity ratio or the dose ratio of the dual energy radiation source is adjusted to achieve the optimal material identification state, and in addition, the method of the present invention can also use the system criterion to judge the double Whether the system can achieve the best material identification state, and achieve the adjustment of the pulse number ratio or the dose ratio.
  • the attenuation value of the dual-energy ray-penetrating substance is related to the atomic number of the substance, and the detected data is compared with the existing data to determine the type of the substance to be tested.
  • T(E, t, Z) is the transparency of high and low energy rays, and its physical meaning is the dose of the ray after the energy of E and the dose of 1 is passed through a material having an atomic number Z of thickness t.
  • the system needs to be calibrated to obtain T(E, t, Z) values of materials of different thickness under two energy pulse conditions. After calibration, different energy and different materials can be formed. For T values of different thicknesses, fitting the thickness t gives the T value of the material at all thicknesses.
  • the essence of dual-energy material recognition is to find the minimum of the following formula:
  • the present invention uses equation (2) as a system criterion for material identification of a dual energy system, and adjusts the pulse number ratio or pulse dose ratio of the system.
  • the system calculates whether the formula (2) reaches the minimum value according to the dual-energy scan result of the sample to be tested. If the minimum value is not reached, adjust the pulse ratio or the dose ratio until the formula (2) is reached. The minimum value, the corresponding pulse number ratio or dose ratio is the best material identification state of the dual energy system.
  • the present invention further provides a dual-energy radiation imaging system 100, as shown in the structural block diagram of FIG. 3, comprising: a dual-energy radiation source 10, a radiation detector 12, a dual-energy image acquisition device 14, a determination processing module 16, and an adjustment. a processing module 18, a control module 20, and a storage module 22; wherein
  • the dual-energy radiation source 10 emits a dual-energy radiation beam to perform dual-energy scanning, wherein the high-energy radiation beam and the low-energy radiation beam alternately exit the beam;
  • the radiation detector 12 receives the dual energy radiation beam, converts the dual energy radiation beam into a digital signal, and sends it to the dual energy image acquisition device 14;
  • the dual-energy image acquiring device 14 generates a dual-energy radiation image according to the received digital signal.
  • the dual-energy radiation beam passes through the object, the dose of the radiation changes accordingly, and the dual-energy image acquiring device 14 generates a double according to the change.
  • Can image and can obtain the thickness, atomic number and other information of the detected object, if the image is clear enough to indicate that the recognition effect is good;
  • the determination processing module 16 determines whether the detected data is consistent with the test sample according to the scan detection result included in the dual-energy radiation image. If the determination result is inconsistent, the determination processing module 16 sends the determination result to the adjustment processing module 18; if the determination result is consistent , the judgment processing module 16 sends the judgment result to the storage module 22;
  • the adjustment processing module 18 adjusts the pulse quantity ratio or the pulse dose ratio of the dual energy radiation source 10, and sends the adjustment result to the control module 20;
  • the control module 20 controls the dual-energy radiation source 10 to cause the dual-energy radiation source 10 to emit a dual-energy radiation beam according to the adjustment result of the adjustment processing module 18;
  • the storage module 22 stores the pulse number ratio or the pulse dose ratio of the current dual-energy radiation source 10 as the scan job ratio corresponding to the test sample according to the determination result of the determination processing module 16.
  • the determining processing module 16 ′ may also be configured to determine whether the system criterion (ie, formula (2)) reaches a minimum value according to the scan detection result included in the dual-energy radiation image, and if the minimum value is not reached, the determining processing module 16' sends the determination result to the adjustment processing module 18; if the minimum value is reached, the determination processing module 16' sends the determination result to the storage module 22.
  • the system criterion ie, formula (2)
  • the above-mentioned debugging process can be performed on test samples of different thicknesses and different material types, and the parameters for storing the best material identification state corresponding to each sample are recorded (ie, the pulse quantity ratio or dose of the debugged dual-energy radiation source) Ratio), in the subsequent screening of a series of detected objects, the system can switch between the corresponding optimal material identification states according to different detected property parameters (thickness and atomic number) acquired in real time, and can be performed. Identification of a variety of materials, high recognition ability.
  • S112 adjusting a current pulse quantity ratio or a dose ratio of the system, and controlling the dual energy radiation source to alternately output high and low energy pulses according to the adjusted ratio;
  • the above-mentioned n kinds of analytes may select a dual-energy material to identify the test materials used for calibration.
  • the high- and low-energy pulse ratio or dose ratio of the dual-energy radiation source can be adjusted in real time during the scanning process.
  • the operation process is as follows:
  • S122 selecting a corresponding optimal pulse quantity ratio or a pulse dose ratio for the attribute parameter of the current detected object based on the record of the material obtained in the previous stage and the corresponding pulse quantity ratio or the dose ratio;
  • S123 Control the ratio of the number of radiation pulses to be output or the dose ratio according to the ratio selected by S122.
  • the present invention proposes to obtain the optimal working ratio of the dual energy system by calculation, and to reasonably distribute the high energy ray and the low energy ray.
  • the number of pulses or dose is the system that quickly reaches the optimal material identification state.
  • the derivation process of the calculation formula of the optimal distribution ratio of the number of pulses and the dose is described below.
  • I 1 and I 2 are doses of high and low energy radiation pulses, respectively, when no material is blocked.
  • ⁇ I 1 (t, Z) and ⁇ I 2 (t, Z) are the standard deviations of the ray pulse dose after the high and low energy ray pulses pass through a material having a thickness t and an atomic number Z. Ignoring the difference in detection efficiency between different detectors, the process of ray and matter follows the binomial distribution:
  • the total dose of the radiation beam emitted by the dual-energy radiation source is a determined value, and the total radiation pulse number is also a determined value, and the high-energy or low-energy radiation pulse is regarded as composed of several sub-ray pulses, assuming a scanning detection process
  • the total number of pulses of the two energy rays is 2N, wherein the number of pulses of the high energy ray is Nk, the dose is I 1 , the number of pulses of the low energy ray is N+k, and the dose is I 2 (that is, the pulse of high and low energy rays)
  • the quantity ratio is Nk:N+k, and the dose ratio is I 1 :I 2 ).
  • Nk:N+k is the optimal distribution ratio of the number of pulses of the two energy rays of the dual energy source. According to the ratio, the alternating dual-energy radiation source output radiation pulse is controlled, and the system is in the best material identification state, and the recognition capability of the thickness of the iron material is the best.
  • the optimal distribution ratio I 1 : I 2 of the pulse doses of the two energy rays of the dual energy source is obtained. Similar to the formula (7), the dual-energy system operating in the optimal dose ratio state has the best ability to recognize the thickness of the iron material, and the dual-energy radiation image has the best effect.
  • the ray pulse of the radiation source is regarded as a number of sub-ray pulses, different energies
  • the pulse number ratio problem of the ray can be converted into a pulse dose ratio problem, so the conclusion about the pulse number ratio problem also applies to the pulse dose ratio problem.
  • Varian's M9A accelerator has a 9MeV ray half-value layer of about 30.5mm iron, a 6MeV ray half-value layer of about 28mm iron, and a mass thickness of 40g/cm.
  • the iron ratio of 2 according to formula (8), the optimum material identification state of the 9/6 MeV radiation dose ratio is about 1.0658:1.
  • the optimum identification mass for iron is about 22.2 g/cm 2 .
  • the optimum dose ratio of the 9/6 MeV rays ranges from 0.9208:1 to 1.6756:1.
  • Varian's M3A accelerator has a 1.2 MeV ray half-value layer of about 16.5 mm and a 3 MeV ray half-value layer of about 23.1 mm.
  • the thickness of the iron to be identified is in the range of 1 g/cm 2 to 70 g/cm 2
  • the optimum dose ratio of the 3/1.2 MeV rays ranges from 0.7272:1 to 2.7748:1.
  • the system can be adjusted to the most in real time during the formal scan inspection by using formula (7) or (8).
  • Good material identification status flexible control of the system's ability to recognize different materials.
  • Figure 4 shows the real-time adjustment of the high energy, low energy pulse ratio or dose ratio of the dual energy radiation source during the scanning process.
  • S201 acquiring dual-energy image data in real time when the dual-energy system is working, and obtaining attribute parameters (thickness, atomic number, and attenuation coefficient of the detected object) of the current detected object based on the dual-energy image data;
  • S203 Control the ratio of the number of radiation pulses to be output or the dose ratio according to the ratio calculated by S202. In this way, the dual energy system is quickly adjusted to the optimal material identification state.
  • FIG. 5 is a schematic diagram of real-time adjustment of a dual-energy radiation pulse dose state in an embodiment of the present invention.
  • the measured object (t 1 , Z 1 ) is changed to (t 2 , Z 2 ) at a certain time.
  • the dose of the subsequent radiation pulse is adjusted immediately.
  • the high energy pulse dose is increased, the low energy pulse dose is correspondingly weakened, and the total dose of the high and low energy pulses is not changed.
  • the advantage of this treatment is that while the system improves material identification, the boundary dose of the system does not change, ie the area of radiation protection does not change.
  • the present invention also provides a dual-energy radiation system 300, which has a block diagram as shown in FIG. a dual-energy radiation source 30, a radiation detector 32, a dual-energy image acquisition device 34, an algorithm module 36, and a control module 38;
  • the dual-energy radiation source 30 emits a dual-energy radiation beam, and performs dual-energy scanning on the detected material;
  • the radiation detector 32 receives the dual energy radiation beam, converts the dual energy radiation beam into a digital signal, and sends it to the dual energy image acquisition device 34;
  • the dual-energy image acquisition device 34 generates a dual-energy radiation image based on the received digital signal
  • the algorithm module 36 calculates the pulse number ratio or the dose ratio according to the formula (7) or (8) based on the atomic number and thickness of the detected object;
  • the control module 38 controls the dual energy radiation source 30 to emit a dual energy radiation beam in accordance with the pulse dose ratio calculated by the algorithm module 36.
  • S301 determining a detection object of interest and related parameters (thickness, atomic number, and attenuation coefficient);
  • S302 Calculate an optimal pulse quantity ratio according to formula (7) based on the object parameter, or calculate an optimal pulse dose ratio according to formula (8);
  • the dose state of the dual-energy radiation pulse based on the formula (7) or (8) in the embodiment of the present invention, wherein the horizontal axis is time, the vertical axis is pulse dose, H is a high energy pulse, and L is a low energy pulse.
  • the dose of 9MeV high-energy pulse is about 3 times that of the 6MeV low-energy pulse.
  • Fig. 3(a) shows the conventional alternate dual energy pulse dose
  • Fig. 3(b) shows the case where the high and low energy pulse ratio is 2:3.
  • Figure 3(c) shows the case where the high and low energy pulse dose ratio is 1:1.
  • the ratio of high to low energy pulses is typically 1:1. After the adjustment of the present invention, the ratio of high and low energy pulses is no longer 1:1, the dose is properly distributed, and the system material identification capability is rapidly and greatly improved.
  • the embodiment of FIG. 7 can be further optimized, as shown in FIG.
  • the formula (7) or (8) to calculate the optimal pulse ratio or dose ratio
  • scan the sample according to the optimal ratio and then observe whether the scanned image is ideal, if not ideal, the scan result and the sample itself. The parameters are inconsistent.
  • the system pulse ratio or dose ratio can be further adjusted until the best image effect is obtained. If the scanned image is ideal and can meet the usage requirements, calculate it by using formula (7) or (8). The optimal ratio does not require further adjustment.
  • the algorithm and criterion for dual energy material identification can determine the material type of the detected object by comparing the results of detecting the thickness of the same material by two energy rays.
  • the criterion of the method is:
  • m is the type of material
  • t is the thickness of the material
  • Z i is the atomic number of the ith material
  • Tol i (Z i ) is the tolerance set by the material identification algorithm.
  • the dual energy identification problem is converted to compare the thicknesses of the i-th material measured by the two energies, if the thicknesses are equal (ie Or make Less than the tolerance Tol i (Z i ), the equation (10) holds, and the material to be detected is considered to be the i-th material having a thickness t; otherwise, it is compared with the i+1th material.
  • the ratio or dose ratio is such that the following equation (11) obtains a minimum value, and the corresponding pulse number ratio or dose ratio allows the system to operate in an optimal material identification state:
  • the pulse number ratio or the dose ratio of the dual energy system can also be adjusted by calculating whether or not the equation (11) reaches a minimum value.
  • the pulse quantity ratio or the dose ratio can be adjusted for the dual energy system of the present invention, and the corresponding pulse number ratio or dose when the formula (2) or the formula (11) reaches a minimum value.
  • the ratio is optimal and the system achieves the best material identification status.
  • the system criterion (2) or the formula (11) can be used instead of the step 404 in the embodiment of FIG. 9 to observe whether the radiation image achieves the best recognition effect, as shown in FIG. 10, using the formula (7). Or (8) after calculating the optimal pulse number ratio or dose ratio, whether the formula (2) or the formula (11) reaches a minimum value, thereby further adjusting the system pulse number ratio or the dose ratio.
  • the dual energy system in combination with the actual situation, can be adjusted in the range of high and low energy pulse dose ratios ranging from 0.7:1 to 3:1, and a better adjustment effect can be obtained.
  • embodiments of the present invention can adjust the radiation pulse number ratio or dose ratio of the dual-energy radiation source for different materials, and obtain the optimal material identification state of the system corresponding to different materials, and the system is before the formal scanning. Set to the best material identification status, or switch the working state of the system in real time during work, it can realize dual-energy recognition of a certain material or multiple materials, and the material recognition ability is high. By using the invention to detect material materials of interest, a better dual-energy radiation image can be obtained, and the detection and recognition capability is strong.

Landscapes

  • Health & Medical Sciences (AREA)
  • Toxicology (AREA)
  • Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Length-Measuring Devices Using Wave Or Particle Radiation (AREA)

Abstract

L'invention concerne un procédé permettant d'augmenter la capacité d'identification de matériau d'un système de rayonnement à double énergie et le système de rayonnement à double énergie. Le procédé consiste à : étape 1, déterminer le numéro atomique et l'épaisseur d'un matériau à inspecter ; étape 2, calculer un rapport de nombre d'impulsions ou un rapport de dose d'impulsion sur la base du numéro atomique et de l'épaisseur du matériau à inspecter ; et, étape 3, ajuster le rapport du nombre d'impulsions ou le rapport de dose d'impulsion du système de rayonnement à double énergie sur les rapports calculés. L'utilisation du procédé permet d'effectuer rapidement l'acquisition de l'état d'identification optimale du matériau du système de rayonnement à double énergie ; une inspection par balayage étant effectuée dans cet état, la capacité d'identification du matériau du système à double énergie est sensiblement améliorée.
PCT/CN2015/073184 2014-06-09 2015-02-16 Procédé et système pour augmenter la capacité d'identification de matériau d'un système de rayonnement à double énergie Ceased WO2015188638A1 (fr)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
CN201410252245.3A CN105277578B (zh) 2014-06-09 2014-06-09 一种提高双能辐射系统材料识别能力的方法及系统
CN201410252245.3 2014-06-09

Publications (1)

Publication Number Publication Date
WO2015188638A1 true WO2015188638A1 (fr) 2015-12-17

Family

ID=54832860

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/CN2015/073184 Ceased WO2015188638A1 (fr) 2014-06-09 2015-02-16 Procédé et système pour augmenter la capacité d'identification de matériau d'un système de rayonnement à double énergie

Country Status (2)

Country Link
CN (1) CN105277578B (fr)
WO (1) WO2015188638A1 (fr)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN119223400A (zh) * 2024-12-02 2024-12-31 上海云鱼智能科技有限公司 一种放射性物料实时料种识别设备及方法

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN113281821B (zh) * 2021-07-09 2023-10-13 同方威视技术股份有限公司 检查系统及方法
CN118534514B (zh) * 2024-06-11 2024-11-15 北京海阳博创科技股份有限公司 一种用于辐射剂量测量的自动识别与测量方法和系统

Citations (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1126316A (zh) * 1995-06-23 1996-07-10 哈尔滨工业大学 二组分物质各组分含量的联合在线测量方法及所用装置
CN1245605A (zh) * 1996-12-09 2000-02-23 艾利森公司 在一个单独信道上的异步全双工通信
US20050094765A1 (en) * 2002-02-06 2005-05-05 L-3 Communications Security And Detection Systems Corporation Delaware Method and apparatus for transmitting information about a target object between a prescanner and a ct scanner
WO2006053279A2 (fr) * 2004-11-12 2006-05-18 Scantech Holdings, Llc Systeme d'inspection non intrusive de conteneurs utilisant le rayonnement diffuse vers l'avant
CN101118224A (zh) * 2006-08-02 2008-02-06 通用电气家园保护有限公司 用于识别物质的系统和方法
CN101382505A (zh) * 2008-09-25 2009-03-11 中北大学 一种x射线成像装置和方法
US20090086906A1 (en) * 2007-09-28 2009-04-02 Clayton James E Radiation scanning with photon tagging
CN201266183Y (zh) * 2008-07-16 2009-07-01 清华大学 一种测量物质有效原子序数的装置
CN102053096A (zh) * 2010-11-04 2011-05-11 公安部第一研究所 双能量x射线安全检查设备的材料校准系统及校准方法
CN102884422A (zh) * 2010-02-25 2013-01-16 拉皮斯坎系统股份有限公司 用以确定物质的原子序数的、高能量x射线的基于光谱学的检查系统和方法

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE10062214B4 (de) * 2000-12-13 2013-01-24 Smiths Heimann Gmbh Vorrichtungen zur Durchleuchtung von Objekten
CN101210971A (zh) * 2006-12-31 2008-07-02 同方威视技术股份有限公司 一种放射性物质射线能区识别方法及射线能区探测系统
CN101266216A (zh) * 2007-03-14 2008-09-17 清华大学 标定双能ct系统的方法和图像重建方法
CN102175698B (zh) * 2007-11-15 2013-09-04 同方威视技术股份有限公司 物质识别系统中创建分类曲线的方法和设备
CN103604819B (zh) * 2013-11-25 2016-03-30 东北大学 一种利用双能透射及低能散射进行物质识别的装置及方法

Patent Citations (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1126316A (zh) * 1995-06-23 1996-07-10 哈尔滨工业大学 二组分物质各组分含量的联合在线测量方法及所用装置
CN1245605A (zh) * 1996-12-09 2000-02-23 艾利森公司 在一个单独信道上的异步全双工通信
US20050094765A1 (en) * 2002-02-06 2005-05-05 L-3 Communications Security And Detection Systems Corporation Delaware Method and apparatus for transmitting information about a target object between a prescanner and a ct scanner
WO2006053279A2 (fr) * 2004-11-12 2006-05-18 Scantech Holdings, Llc Systeme d'inspection non intrusive de conteneurs utilisant le rayonnement diffuse vers l'avant
CN101118224A (zh) * 2006-08-02 2008-02-06 通用电气家园保护有限公司 用于识别物质的系统和方法
US20090086906A1 (en) * 2007-09-28 2009-04-02 Clayton James E Radiation scanning with photon tagging
CN201266183Y (zh) * 2008-07-16 2009-07-01 清华大学 一种测量物质有效原子序数的装置
CN101382505A (zh) * 2008-09-25 2009-03-11 中北大学 一种x射线成像装置和方法
CN102884422A (zh) * 2010-02-25 2013-01-16 拉皮斯坎系统股份有限公司 用以确定物质的原子序数的、高能量x射线的基于光谱学的检查系统和方法
CN102053096A (zh) * 2010-11-04 2011-05-11 公安部第一研究所 双能量x射线安全检查设备的材料校准系统及校准方法

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN119223400A (zh) * 2024-12-02 2024-12-31 上海云鱼智能科技有限公司 一种放射性物料实时料种识别设备及方法

Also Published As

Publication number Publication date
CN105277578B (zh) 2018-06-12
CN105277578A (zh) 2016-01-27

Similar Documents

Publication Publication Date Title
US10339673B2 (en) Dual-energy ray imaging methods and systems
CN103069305B (zh) 由多能量x-射线识别材料的方法
US10697908B2 (en) Metrology inspection apparatus
CN107209132A (zh) 荧光x射线分析装置
WO2015188638A1 (fr) Procédé et système pour augmenter la capacité d'identification de matériau d'un système de rayonnement à double énergie
CN110779939B (zh) 双模探测方法、控制器和系统
JP7239921B2 (ja) 陽電子消滅特性測定装置
WO2015188637A1 (fr) Système de rayonnement à double énergie et procédé pour augmenter la capacité d'identification de matériau du système de rayonnement à double énergie
JP4725350B2 (ja) 透過ｘ線測定方法
US20200271600A1 (en) Semiconductor defect inspection apparatus and semiconductor defect inspection method
US10557808B2 (en) Method and apparatus for discriminating resin
WO2017067180A1 (fr) Dispositif d'étalonnage, procédé et système utilisés pour distinguer une substance
JP6441184B2 (ja) 構造物の検査装置及びその検査方法
US9664801B2 (en) Method and device for determining the x-ray radiation attenuation caused by the object to be examined
US10697907B2 (en) Metrology measuring apparatus
JP2009281735A (ja) 液体シンチレーションカウンタ
CN113050148A (zh) 一种铀-235丰度的测量方法
JP7223420B2 (ja) 温度測定装置、温度測定方法
US12467882B2 (en) Systems and methods for monitoring output energy of a high-energy x-ray source
US9841390B2 (en) Identification of materials from a hydrogen to electron ratio
JP2020034380A (ja) γ線検出装置
JP2008518226A (ja) コンピュータ断層撮影装置及びコンピュータ断層撮影装置により対象オブジェクトを検査する方法
CN116359971A (zh) 加速器x射线能量在线检测方法、探测器及检测系统
Ostinelli et al. 351. X-ray protective clothings policy
JP6299033B2 (ja) 非破壊検査方法およびその装置

Legal Events

Date Code Title Description
121 Ep: the epo has been informed by wipo that ep was designated in this application

Ref document number: 15806672

Country of ref document: EP

Kind code of ref document: A1

NENP Non-entry into the national phase

Ref country code: DE

122 Ep: pct application non-entry in european phase

Ref document number: 15806672

Country of ref document: EP

Kind code of ref document: A1