Classifications

• • G—PHYSICS
  • G01—MEASURING; TESTING
  • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
  • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
  • G01T1/02—Dosimeters
• • A—HUMAN NECESSITIES
  • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
  • A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
  • A61B6/00—Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
  • A61B6/42—Arrangements for detecting radiation specially adapted for radiation diagnosis
  • A61B6/4266—Arrangements for detecting radiation specially adapted for radiation diagnosis characterised by using a plurality of detector units
• • G—PHYSICS
  • G01—MEASURING; TESTING
  • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
  • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
  • G01T1/16—Measuring radiation intensity
  • G01T1/24—Measuring radiation intensity with semiconductor detectors
  • G01T1/244—Auxiliary details, e.g. casings, cooling, damping or insulation against damage by, e.g. heat, pressure or the like

Definitions

• the present invention relates to the field of image detection technology, and in particular to a flat panel detector for dose detection verification and an image detecting apparatus using the same.
• the current digital image detecting device for point dose detection verification installs an ionization chamber detector or a semiconductor dose probe on several positions fixed on the flat panel detector, and the number of probes is also limited, so that the resolution of the measurement is It is then constrained, causing the user to be unable to measure the dose in any area of the flat panel detector.
• Cionization chamber detectors such a setting allows the user to only measure the dose in the middle or surrounding areas of the flat panel detector. If the dose measurement in other areas is required, then it cannot be performed unless the other is manufactured and replaced.
• the flat panel detectors that meet the needs of the measurement area are used for measurement. Such replacement not only makes the operation troublesome, but also greatly increases the cost of the user. Summary of the invention
• the object of the present invention is to provide a flat panel detector capable of performing dose detection verification on any area of a flat panel detector without using a manufacturing and replacing another set of flat panel detectors, and an image detecting apparatus using the same, which is simple in operation And will not add too much cost to the user.
• a flat panel detector for dose detection verification comprising a detector body, characterized in that: the detector body is provided with a plurality of arranged in a grid form socket.
• the above sockets are arranged in a matrix form.
• At least one socket is further disposed at a center position of an area surrounded by at least four sockets.
• the sockets described above are arranged in a cross-hatched form.
• At least one socket is further disposed at a central position of the area surrounded by at least three sockets.
• An image detecting device for dose detection verification comprising at least one ionization chamber detector or a semiconductor dose probe, characterized in that: the digital image detecting device further comprises a flat panel detector as described above, or the ionization chamber detector described above or The semiconductor dose probe is detachably mounted in the socket of the flat panel detector.
• the above socket is provided with a power socket, and the ionization chamber detector or the semiconductor dose probe is provided with a signal transmission module for transmitting data to the external receiving device through the wireless signal network.
• the above socket is provided with a power socket and a signal transmission module for transmitting data to the external receiving device through the wireless signal network.
• the ionization chamber detector or the semiconductor dose probe is provided with a power socket and a signal transmission module for transmitting data to the external receiving device via the wireless signal network.
• the ionization chamber detector or the semiconductor dose probe described above is mounted in the socket by means of a screw connection or a snap connection.
• the beneficial effects of the above technical solution are as follows:
• the ionization chamber detector or the semiconductor dose probe can be arranged arbitrarily on the flat panel detector, specifically, the sockets arranged in a plurality of forms on the flat panel detector, the ionization chamber
• the detector or the semiconductor dose probe is detachably disposed in the sockets instead of the original ionization chamber detector or the semiconductor dose probe at a fixed position on the flat panel detector, so that the number and position of the probes can be Freely configurable to meet the needs of dose measurement at any position and at various resolutions. It can be used to measure the dose on any area of the flat panel detector without the need to replace the flat panel detector.
• the manufacturing cost is low and only needs to be measured according to the measurement.
• the power supply and the signal transmission module in the device can be set in various manners, such as being disposed in the probe or the socket at the same time, or being respectively disposed in the probe or the socket, and the setting manner is flexible.
• Figure 1 is a schematic view showing the structure of a flat panel detector for dose detection verification in the first embodiment of the present invention.
• Fig. 2 is a view showing the configuration of an image detecting apparatus for dose detection verification of the present invention in the first embodiment.
• Fig. 3 is a schematic view showing the structure of the flat panel detector for dose detection verification of the present invention in the first embodiment.
• Fig. 4 is a schematic view showing the structure of a flat panel detector for dose detection verification of the present invention in the third embodiment.
• Figure 5 is a schematic view showing the structure of a flat panel detector for dose detection verification of the present invention in Example 4. detailed description
• a flat panel detector for dose detection verification in this embodiment includes a detector body 1 , and a plurality of sockets 2 arranged in a matrix form are further disposed on the detector body 1 . It is distributed around the circumference and the middle of the detector body 1.
• the sockets 2 are preferably arranged in an equidistant arrangement, but may also be arranged in an unequal arrangement, which needs to be determined according to specific needs;
• the cross-sectional shape of the socket 2 is preferably set to be circular, but It may also be set as a rectangle, a diamond or other shape, and the diameter should be determined according to the diameter of the ionization chamber detector or the semiconductor dose probe 3 inserted therein, that is, slightly larger than the diameter of the ionization chamber detector or the semiconductor dose probe 3.
• an image detecting device for dose detection verification in this embodiment includes at least one ionization chamber detector or semiconductor dose probe 3, and a flat panel detector as described above, wherein the ionization chamber detector or the semiconductor dose probe 3 is detachably mounted in the socket 2 of the flat panel detector, and Install it in the socket 1 that needs to be measured as needed, and increase or decrease the number as needed.
• the socket 2 is provided with a power socket 4 for supplying power to the ionization chamber detector or the semiconductor dose probe 3.
• the ionization chamber detector or the semiconductor dose probe 3 is provided with a signal transmission module (not shown). It can be used to transmit data to an external receiving device over a wireless signal network.
• the above-mentioned ionization chamber detector or semiconductor dose probe 3 is installed in the above-mentioned socket 2 by means of screw connection or snap connection, and other installation methods that can be used in the prior art can be used as long as the ionization chamber detector or semiconductor is convenient. Disassembly and assembly of the dose probe 3 is sufficient.
• socket 2 arranged in a matrix form in the embodiment 1, the center position of the area surrounded by each of the four sockets 2 is also set.
• the socket 2 of the present embodiment has a higher density of arrangement than that of the embodiment 1, and satisfies the need for more position and higher resolution dose measurement.
• the sockets 2 are arranged on the detector body 1 in a cross-hatched manner, which also spreads around the circumference and the middle of the detector body 1.
• the position of the socket is different from that of the first embodiment, and can satisfy the need for another position when the ionization chamber detector or the semiconductor dose probe 3 is installed.
• each of the three or four sockets 1 is surrounded by an area.
• a socket 2 is also provided at the center of the position, and one or more sockets 2 are also provided at a central position of the area surrounded by more than four sockets 2.
• the socket 2 is denser in arrangement than in Example 3, meeting the need for more position and higher resolution dose measurement.
• the power socket 4 and the signal transmission module are both disposed in the socket 1 described above, and the power socket 4 is used for the ionization chamber detector or the semiconductor dose probe.
• the signal transmission module is connected to the ionization chamber detector or the semiconductor dose probe 3, and can be used to transmit data to the external receiving device through the wireless signal network.
• the power source and the signal transmission module are disposed in the ionization chamber detector or the semiconductor dose probe 3, and the ionization chamber detector or the semiconductor dose probe 3 passes.
• the power supply is self-powered, no external power supply is required, and it is more convenient to use.
• the internal signal transmission module can transmit data to the external receiving device through the wireless signal network.
• an ionization chamber detector or a semiconductor dose probe 3 is mounted on the socket 1 in the corresponding area on the flat panel detector, and then the flat panel detector obtains MV-level ⁇ -rays under MV-level energy irradiation.
• the image by converting the correspondence between the gray value and the dose value, displaying the MV irradiation dose in the digital image, and simultaneously illuminating the MV level energy on the ionization chamber detector or the semiconductor dose probe 3 on the flat panel detector
• the ionization chamber detector or the semiconductor dose probe 3 detects the MV energy of the corresponding region received, and records the higher precision dose detection result.
• the doctor or physicist checks the gray value obtained by the flat panel detector through the exact dose value obtained by the ionization chamber detector or the semiconductor dose probe (contrast processing, Ca 1 ibra t ion) and converts it into a dose value.
• Adding different prosthesis/phantoms (Phantom) to the flat panel detector can obtain different gray values after transmitting the prosthesis, and can also check and convert the entire arrival range of the gray value and obtain real-time. The dose value of the entire dynamic process.
• the beneficial effects of the above technical solution are as follows:
• the ionization chamber detector or the semiconductor dose probe 3 can be arranged arbitrarily on the flat panel detector, specifically, the sockets 2 arranged in a plurality of forms are arranged on the flat panel detector.
• Ionization chamber detector or semiconductor dose The probe 3 is detachably disposed in the socket 2 instead of the original ionization chamber detector or the semiconductor dose probe 3 at a fixed position on the flat panel detector, so that the number and position of the probe can be freely configured. Therefore, it can meet the requirements of dose measurement at any position and various resolutions. It can be applied to the measurement of the dose on any area of the flat panel detector. It does not need to replace the flat panel detector. The manufacturing cost is low, and it only needs to be used according to the measurement requirements.
• the ionization chamber detector or the semiconductor dose probe 3 can be installed in the corresponding socket 2, and is easy to operate.
• the power supply and the signal transmission module in the device can be set in various manners, such as being disposed in the probe or the socket 2 at the same time, or respectively disposed in the probe or the socket 2, and the setting manner is flexible.

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Citations (9)

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• 2012
  • 2012-10-09 CN CN201210379141.XA patent/CN103713308A/zh active Pending
  • 2012-11-20 WO PCT/CN2012/084888 patent/WO2014056274A1/fr not_active Ceased

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