[go: up one dir, main page]

WO2013183607A1 - Carrier-attached metal foil - Google Patents

Carrier-attached metal foil Download PDF

Info

Publication number
WO2013183607A1
WO2013183607A1 PCT/JP2013/065408 JP2013065408W WO2013183607A1 WO 2013183607 A1 WO2013183607 A1 WO 2013183607A1 JP 2013065408 W JP2013065408 W JP 2013065408W WO 2013183607 A1 WO2013183607 A1 WO 2013183607A1
Authority
WO
WIPO (PCT)
Prior art keywords
metal foil
carrier
resin
metal
sided
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
PCT/JP2013/065408
Other languages
French (fr)
Japanese (ja)
Inventor
倫也 古曳
晃正 森山
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
JX Nippon Mining and Metals Corp
Original Assignee
JX Nippon Mining and Metals Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by JX Nippon Mining and Metals Corp filed Critical JX Nippon Mining and Metals Corp
Priority to JP2014519990A priority Critical patent/JP6013475B2/en
Priority to KR20147037142A priority patent/KR20150024359A/en
Priority to CN201380029144.3A priority patent/CN104334345B/en
Priority to KR1020177007803A priority patent/KR20170034947A/en
Priority to KR1020197023954A priority patent/KR20190099096A/en
Publication of WO2013183607A1 publication Critical patent/WO2013183607A1/en
Anticipated expiration legal-status Critical
Ceased legal-status Critical Current

Links

Images

Classifications

    • BPERFORMING OPERATIONS; TRANSPORTING
    • B32LAYERED PRODUCTS
    • B32BLAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
    • B32B15/00Layered products comprising a layer of metal
    • B32B15/04Layered products comprising a layer of metal comprising metal as the main or only constituent of a layer, which is next to another layer of the same or of a different material
    • B32B15/08Layered products comprising a layer of metal comprising metal as the main or only constituent of a layer, which is next to another layer of the same or of a different material of synthetic resin
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B32LAYERED PRODUCTS
    • B32BLAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
    • B32B7/00Layered products characterised by the relation between layers; Layered products characterised by the relative orientation of features between layers, or by the relative values of a measurable parameter between layers, i.e. products comprising layers having different physical, chemical or physicochemical properties; Layered products characterised by the interconnection of layers
    • B32B7/04Interconnection of layers
    • B32B7/06Interconnection of layers permitting easy separation
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/0097Processing two or more printed circuits simultaneously, e.g. made from a common substrate, or temporarily stacked circuit boards
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/46Manufacturing multilayer circuits
    • H05K3/4644Manufacturing multilayer circuits by building the multilayer layer by layer, i.e. build-up multilayer circuits
    • H05K3/4682Manufacture of core-less build-up multilayer circuits on a temporary carrier or on a metal foil
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B32LAYERED PRODUCTS
    • B32BLAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
    • B32B2307/00Properties of the layers or laminate
    • B32B2307/50Properties of the layers or laminate having particular mechanical properties
    • B32B2307/582Tearability
    • B32B2307/5825Tear resistant
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B32LAYERED PRODUCTS
    • B32BLAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
    • B32B2457/00Electrical equipment
    • B32B2457/08PCBs, i.e. printed circuit boards
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2203/00Indexing scheme relating to apparatus or processes for manufacturing printed circuits covered by H05K3/00
    • H05K2203/01Tools for processing; Objects used during processing
    • H05K2203/0147Carriers and holders
    • H05K2203/0156Temporary polymeric carrier or foil, e.g. for processing or transferring
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2203/00Indexing scheme relating to apparatus or processes for manufacturing printed circuits covered by H05K3/00
    • H05K2203/02Details related to mechanical or acoustic processing, e.g. drilling, punching, cutting, using ultrasound
    • H05K2203/0264Peeling insulating layer, e.g. foil, or separating mask
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2203/00Indexing scheme relating to apparatus or processes for manufacturing printed circuits covered by H05K3/00
    • H05K2203/15Position of the PCB during processing
    • H05K2203/1536Temporarily stacked PCBs

Definitions

  • the present invention relates to a metal foil with a carrier. More specifically, the present invention relates to a metal foil with a carrier used in the production of a single-sided or two-layer multilayer board or an ultra-thin coreless substrate used for a printed wiring board.
  • a typical example of a multilayer laminate is a printed circuit board.
  • a printed circuit board uses a dielectric material called “prepreg” obtained by impregnating a synthetic resin plate, a glass plate, a glass nonwoven fabric, paper or the like with a synthetic resin as a basic constituent material.
  • prepreg a dielectric material obtained by impregnating a synthetic resin plate, a glass plate, a glass nonwoven fabric, paper or the like with a synthetic resin as a basic constituent material.
  • a sheet such as copper or copper alloy foil having electrical conductivity is bonded to the side facing the prepreg.
  • the laminated body thus assembled is generally called a CCL (Copper Clad Laminate) material.
  • the surface of the copper foil in contact with the prepreg is usually a mat surface in order to increase the bonding strength.
  • a foil made of aluminum, nickel, zinc or the like may be used instead of the copper or copper alloy foil. Their thickness is about 5 to 200 ⁇ m. This commonly used CCL (Copper Cla
  • Patent Document 1 proposes a metal foil with a carrier composed of a synthetic resin plate-shaped carrier and a metal foil that is mechanically peelably adhered to at least one surface of the carrier. Describes that it can be used for the assembly of printed wiring boards. It was shown that the peel strength between the plate-like carrier and the metal foil is preferably 1 gf / cm to 1 kgf / cm. According to the metal foil with a carrier, since the copper foil is supported over the entire surface by the synthetic resin, generation of wrinkles on the copper foil during lamination can be prevented. In addition, since the metal foil with carrier is in close contact with the synthetic resin without gaps, when the surface of the metal foil is plated or etched, it can be put into the chemical solution for plating or etching. .
  • the linear expansion coefficient of the synthetic resin is at the same level as the copper foil that is a constituent material of the substrate and the prepreg after polymerization, the circuit is not misaligned, resulting in fewer defective products, It has the outstanding effect that a yield can be improved.
  • the copper foil with a carrier described in Patent Document 1 is an epoch-making invention that greatly contributes to the reduction of the manufacturing cost by simplifying the manufacturing process of the printed circuit board and increasing the yield, but the board for the specific application of the metal foil with the carrier There is no mention of a configuration that takes into account temporary adhesion between the carrier and the metal foil and subsequent peeling, and there remains room for improvement.
  • the present invention seeks a useful condition for allowing the plate-like carrier and the metal foil to be peeled in close contact with each other, and further provides a metal foil with a carrier capable of intentional peeling at the interface between the metal foil and the plate-like carrier. The issue is to provide.
  • the present inventors have inadvertently placed the metal foil and the plate carrier between the metal foil and the plate carrier by setting the peel strength between them to a certain range. It has been found that no peeling occurs and intentional peeling is possible, and the present invention has been completed.
  • the present invention is as follows.
  • the metal foil with a carrier whose peeling strength of metal foil and a plate-shaped carrier after at least 1 heating is 10 gf / cm or more and 200 gf / cm or less.
  • the resin-made plate-shaped carrier is a metal foil with a carrier according to (1) or (2), which is a prepreg.
  • the plate-like carrier and the metal foil constituting the metal foil with the carrier have the following formula:
  • R 1 is an alkoxy group or a halogen atom
  • R 2 is a hydrocarbon group selected from the group consisting of an alkyl group, a cycloalkyl group and an aryl group, or one or more hydrogen atoms are halogen atoms
  • Any one of these hydrocarbon groups substituted by R 3 and R 4 are each independently a halogen atom, an alkoxy group, or a hydrocarbon group selected from the group consisting of an alkyl group, a cycloalkyl group, and an aryl group Or any one of these hydrocarbon groups in which one or more hydrogen atoms are replaced by halogen atoms.
  • a resin is laminated on at least one metal foil side of the metal foil with a carrier according to any one of (1) to (7), and then the resin or the metal foil is repeatedly laminated one or more times.
  • a method for producing a multilayer metal-clad laminate comprising: (9) A resin is laminated on at least one metal foil side of the metal foil with a carrier according to any one of (1) to (7), and then a resin, a single-sided or double-sided metal-clad laminate, or (1) to ( 7)
  • a method for producing a multilayer metal-clad laminate comprising laminating a metal foil with a carrier according to any one of 1) or a metal foil repeatedly one or more times.
  • the multilayer metal-clad laminate further comprising a step of peeling and separating the plate-like carrier and metal foil of the metal foil with carrier.
  • a manufacturing method of a board (11) The method for producing a multilayer metal-clad laminate comprising the step of removing a part or all of the separated and separated metal foil by etching in the production method according to (10). (12) A multilayer metal-clad laminate obtained by the production method according to any one of (8) to (11). (13) A method for manufacturing a buildup substrate, comprising a step of forming one or more buildup wiring layers on at least one metal foil side of the metal foil with carrier according to any one of (1) to (7).
  • a resin is laminated on at least one metal foil side of the metal foil with a carrier according to any one of (1) to (7), and then a resin, a single-sided or double-sided wiring board, a single-sided or double-sided metal-clad laminate, (1)
  • a single-sided or double-sided wiring board In the method for manufacturing a buildup board according to (15), a single-sided or double-sided wiring board, a single-sided or double-sided metal-clad laminate, a metal foil with a carrier, a plate-like carrier with a metal foil with a carrier, or a resin
  • substrate which further includes the process of drilling a hole in and carrying out conductive plating to the side and bottom face of the said hole.
  • the metal foil constituting the single-sided or double-sided wiring board, the metal foil constituting the single-sided or double-sided metal-clad laminate, and the metal with carrier which further includes performing the process of forming wiring in at least 1 of the metal foil which comprises foil once or more.
  • (22) The method for manufacturing a buildup wiring board according to (21), further comprising a step of removing a part or all of the metal foil adhered to the plate carrier by etching.
  • (23) A build-up wiring board obtained by the manufacturing method according to (21) or (22).
  • (24) A method for producing a printed circuit board, comprising a step of producing a build-up substrate by the production method according to any one of (13) to (20).
  • (25) A method for producing a printed circuit board, comprising a step of producing a build-up wiring board by the production method according to (21) or (22).
  • the present invention it is possible to provide a metal foil with a carrier that does not cause inadvertent peeling between the metal foil and the plate-like carrier and can be intentionally peeled off. .
  • CCL An example of the configuration of CCL is shown.
  • the structural example of the metal foil with a carrier which concerns on this invention is shown.
  • the assembly example of the multilayer CCL using the copper foil with a carrier which concerns on this invention (The form which copper foil joined on both surfaces of the resin board) is shown.
  • a metal foil with a carrier comprising a resin-made plate-like carrier and a metal foil that is detachably adhered to one or both sides, preferably both sides of the carrier.
  • a metal foil with a carrier according to the present invention is shown in FIGS.
  • the metal foil 11 with a carrier in which the metal foil 11a is detachably adhered to both surfaces of a resin-made plate carrier 11c is shown at the beginning of FIG.
  • the plate-like carrier 11c and the metal foil 11a are bonded together using a silane compound 11b described later.
  • the metal foil with a carrier of the present invention has a structure in which the metal foil and the resin are finally separated and can be easily peeled off. In this respect, since the CCL is not peeled off, the structure and function are completely different.
  • the metal foil with carrier used in the present invention must be peeled off eventually, it is inconvenient that the adhesiveness is excessively high, but the plate-like carrier and the metal foil are chemicals such as plating performed in the printed circuit board manufacturing process. Adhesiveness that does not peel in the processing step is necessary.
  • the peel strength of the plate-like carrier is preferably 10 gf / cm or more, more preferably 30 gf / cm or more, and even more preferably 50 gf / cm or more, while it is 200 gf / cm or less.
  • it is 150 gf / cm or less, and more preferably 80 gf / cm or less.
  • the peel strength after heating at 220 ° C. was described above in both 3 hours and 6 hours, or both 6 hours and 9 hours from the viewpoint of being able to cope with various lamination numbers. It is preferable to satisfy the range, and it is further preferable that all peel strengths after 3 hours, 6 hours, and 9 hours satisfy the above-described range.
  • the peeling strength between the metal foil and the plate-like carrier is set in such a range so that the peeling does not occur at the time of transportation or processing in the manufacturing process. It can be easily peeled off manually after the heat treatment, that is, mechanically peeled off.
  • the copper foil with a carrier of the present invention can be used for applications that are used without passing through many heat processing steps, such as a shield material formed by applying mesh processing.
  • the peel strength between the metal foil and the plate-like carrier is preferably 10 gf / cm or more, and preferably 30 gf / cm. More preferably, it is more preferably 50 gf / cm or more, while it is preferably 200 gf / cm or less, more preferably 150 gf / cm or less, and 80 gf / cm or less. Even more preferred.
  • the peel strength is measured in accordance with a 90 degree peel strength measuring method defined in JIS C6481.
  • the resin that serves as the plate-like carrier is not particularly limited, and phenol resin, polyimide resin, epoxy resin, natural rubber, pine resin, and the like can be used, but a thermosetting resin is preferable.
  • a prepreg can also be used. The prepreg before being bonded to the metal foil is preferably in a B-stage state.
  • the linear expansion coefficient of the prepreg (C stage) is 12 to 18 ( ⁇ 10 ⁇ 6 / ° C.), 16.5 ( ⁇ 10 ⁇ 6 / ° C.) of the copper foil as the constituent material of the substrate, or 17 of the SUS press plate .3 ( ⁇ 10 ⁇ 6 / ° C.) is advantageous in that it is difficult to cause circuit misalignment due to a phenomenon (scaling change) in which the substrate size before and after pressing differs from that at the time of design. Furthermore, as a synergistic effect of these merits, it becomes possible to produce a multilayer ultra-thin coreless substrate.
  • the prepreg used here may be the same as or different from the prepreg constituting the circuit board.
  • the plate-like carrier preferably has a high glass transition temperature Tg from the viewpoint of maintaining the peel strength after heating in an optimum range, for example, a glass transition temperature Tg of 120 to 320 ° C., preferably 170 to 240 ° C. .
  • the glass transition temperature Tg is a value measured by DSC (differential scanning calorimetry).
  • the thermal expansion coefficient of the resin is within + 10% and ⁇ 30% of the thermal expansion coefficient of the metal foil. As a result, it is possible to effectively prevent circuit misalignment due to the difference in thermal expansion between the metal foil and the resin, thereby reducing the occurrence of defective products and improving the yield.
  • the thickness of the plate-like carrier is not particularly limited and may be rigid or flexible. However, if it is too thick, it will adversely affect the heat distribution during hot pressing, while if it is too thin, it will bend and will not flow through the printed wiring board manufacturing process. Therefore, it is usually 5 ⁇ m or more and 1000 ⁇ m or less, preferably 50 ⁇ m or more and 900 ⁇ m or less, and more preferably 100 ⁇ m or more and 400 ⁇ m or less.
  • the metal foil copper or copper alloy foil is a typical one, but foil of aluminum, nickel, zinc or the like can also be used. In the case of copper or copper alloy foil, electrolytic foil or rolled foil can be used.
  • the metal foil generally has a thickness of 1 ⁇ m or more, preferably 5 ⁇ m or more, and 400 ⁇ m or less, preferably 120 ⁇ m or less, considering use as a wiring of a printed circuit board.
  • metal foils having the same thickness may be used, or metal foils having different thicknesses may be used.
  • the metal foil used may be subjected to various surface treatments.
  • metal plating for the purpose of imparting heat resistance Ni plating, Ni—Zn alloy plating, Cu—Ni alloy plating, Cu—Zn alloy plating, Zn plating, Cu—Ni—Zn alloy plating, Co—Ni alloy plating, etc.
  • Chromate treatment including the case where one or more alloy elements such as Zn, P, Ni, Mo, Zr and Ti are contained in the chromate treatment solution
  • Chromate treatment for imparting rust prevention and discoloration resistance, surface roughness (For example, copper electrodeposition grains, Cu—Ni—Co alloy plating, Cu—Ni—P alloy plating, Cu—Co alloy plating, Cu—Ni alloy plating, Cu—Co alloy plating, And copper alloy plating such as Cu—As alloy plating and Cu—As—W alloy plating).
  • the roughening treatment not only affects the peel strength between the metal foil and the plate carrier, but also the chromate treatment has a great influence.
  • Chromate treatment is important from the viewpoint of rust prevention and discoloration resistance, but since it tends to significantly increase the peel strength, it is also meaningful as a means for adjusting the peel strength.
  • the matte surface (M surface) of the electrolytic copper foil is used as an adhesive surface with the resin, and surface treatment such as roughening treatment is performed.
  • the adhesive strength is improved by the chemical and physical anchoring effects.
  • various binders are added to increase the adhesive strength with the metal foil.
  • the surface roughness of the bonded surface is JIS B 0601: in order to adjust the peel strength between the metal foil and the plate-like carrier to the preferred range described above.
  • the ten-point average roughness (Rz jis) of the metal foil surface measured according to 2001 it is preferably 3.5 ⁇ m or less, more preferably 3.0 ⁇ m or less.
  • Rz jis ten-point average roughness
  • the metal foil When electrolytic copper foil is used as the metal foil, it is possible to use either a glossy surface (shiny surface, S surface) or a rough surface (matte surface, M surface) by adjusting to such a surface roughness. However, it is easier to adjust the surface roughness by using the S-plane.
  • the ten-point average roughness (Rz jis) of the surface of the metal foil that does not contact the carrier is preferably 0.4 m ⁇ or more and 10.0 ⁇ m or less.
  • the surface treatment for improving the peel strength such as roughening treatment is not performed on the bonding surface of the metal foil with the resin.
  • the binder for improving the adhesive force with metal foil is not added in resin.
  • the peel strength is adjusted by using a silane compound represented by the following formula, or a hydrolysis product thereof, or a condensate of the hydrolysis product (hereinafter simply referred to as a silane compound) alone or in combination. Also good. This is because by sticking the plate-like carrier and the metal foil together using the silane compound, the adhesiveness is appropriately lowered and the peel strength can be easily adjusted to the above-described range.
  • R 1 is an alkoxy group or a halogen atom
  • R 2 is a hydrocarbon group selected from the group consisting of an alkyl group, a cycloalkyl group and an aryl group, or one or more hydrogen atoms are halogen atoms
  • Any one of these hydrocarbon groups substituted by R 3 and R 4 are each independently a halogen atom, an alkoxy group, or a hydrocarbon group selected from the group consisting of an alkyl group, a cycloalkyl group, and an aryl group Or any one of these hydrocarbon groups in which one or more hydrogen atoms are replaced by halogen atoms.
  • the silane compound must have at least one alkoxy group.
  • a hydrocarbon group selected from the group consisting of an alkyl group, a cycloalkyl group, and an aryl group in the absence of an alkoxy group, or any one of these hydrocarbons in which one or more hydrogen atoms are substituted with a halogen atom
  • a substituent is comprised only by group, there exists a tendency for the adhesiveness of a plate-shaped carrier and metal foil surface to fall too much.
  • the silane compound is a hydrocarbon group selected from the group consisting of an alkyl group, a cycloalkyl group, and an aryl group, or any one of these hydrocarbon groups in which one or more hydrogen atoms are substituted with a halogen atom.
  • the alkoxy group according to the present invention includes an alkoxy group in which one or more hydrogen atoms are substituted with halogen atoms.
  • the silane compound has three alkoxy groups and the hydrocarbon group (a hydrocarbon group in which one or more hydrogen atoms are substituted with a halogen atom). It is preferable to have one).
  • both R 3 and R 4 are alkoxy groups.
  • Alkoxy groups include, but are not limited to, methoxy, ethoxy, n- or iso-propoxy, n-, iso- or tert-butoxy, n-, iso- or neo-pentoxy, n-hexoxy Group, cyclohexyloxy group, n-heptoxy group, n-octoxy group and the like, straight chain, branched or cyclic carbon number of 1-20, preferably carbon number of 1-10, more preferably carbon number of 1- 5 alkoxy groups.
  • the halogen atom include a fluorine atom, a chlorine atom, a bromine atom, and an iodine atom.
  • alkyl group examples include, but are not limited to, methyl group, ethyl group, n- or iso-propyl group, n-, iso- or tert-butyl group, n-, iso- or neo-pentyl group, and n-hexyl.
  • cycloalkyl group examples include, but are not limited to, a cyclopropyl group, a cyclobutyl group, a cyclopentyl group, a cyclohexyl group, a cycloheptyl group, a cyclooctyl group, and the like, which have 3 to 10 carbon atoms, preferably 5 to 7 carbon atoms.
  • An alkyl group is mentioned.
  • the aryl group includes a phenyl group, a phenyl group substituted with an alkyl group (eg, tolyl group, xylyl group), 1- or 2-naphthyl group, anthryl group, etc., having 6 to 20, preferably 6 to 14 carbon atoms.
  • an alkyl group eg, tolyl group,
  • one or more hydrogen atoms may be substituted with a halogen atom, and may be substituted with, for example, a fluorine atom, a chlorine atom, or a bromine atom.
  • Examples of preferred silane compounds include methyltrimethoxysilane, ethyltrimethoxysilane, n- or iso-propyltrimethoxysilane, n-, iso- or tert-butyltrimethoxysilane, n-, iso- or neo-pentyl.
  • propyltrimethoxysilane, methyltriethoxysilane, hexyltrimethoxysilane, phenyltriethoxysilane, and decyltrimethoxysilane are preferable from the viewpoint of availability.
  • the metal foil with carrier can be manufactured by bringing a plate-like carrier and metal foil into close contact with each other by hot pressing. For example, after applying the silane compound to the bonding surface of the metal foil and / or the plate-like carrier as necessary, the B-stage resin plate-like carrier is hot to the bonding surface of the metal foil. It can be manufactured by press lamination.
  • the silane compound can be used in the form of an aqueous solution.
  • Alcohols such as methanol and ethanol can be added in order to increase the solubility in water.
  • the addition of alcohol is particularly effective when a highly hydrophobic silane compound is used.
  • the stirring time after the silane compound is dissolved in water can be, for example, 1 to 100 hours, and typically 1 to 30 hours. Of course, there is a method of using without stirring.
  • the concentration of the silane compound in the aqueous solution of the silane compound can be 0.01 to 10.0% by volume, and typically 0.1 to 5.0% by volume.
  • the pH of the aqueous solution of the silane compound is not particularly limited and can be used on either the acidic side or the alkaline side.
  • it can be used at a pH in the range of 3.0 to 10.0.
  • the pH is preferably in the range of 5.0 to 9.0, which is near neutral, and more preferably in the range of 7.0 to 9.0. .
  • the surface of the metal foil or resin was measured with a scanning electron microscope or the like equipped with XPS (X-ray photoelectron spectrometer), EPMA (electron beam microanalyzer), EDX (energy dispersive X-ray analysis). If detected, it can be inferred that a silane compound is present on the surface of the metal foil or resin.
  • XPS X-ray photoelectron spectrometer
  • EPMA electron beam microanalyzer
  • EDX energy dispersive X-ray analysis
  • this invention provides the use of the metal foil with a carrier mentioned above.
  • a multilayer metal comprising laminating a resin on at least one metal foil side of the above-described metal foil with carrier, and then laminating the resin or the metal foil repeatedly one or more times, for example, 1 to 10 times.
  • a method for producing a tension laminate is provided.
  • the resin is laminated on the metal foil side of the metal foil with carrier described above, and then the resin, single-sided or double-sided metal-clad laminate, or metal foil with carrier of the present invention, or metal foil is used once or more, for example, 1
  • a method for producing a multilayer metal-clad laminate comprising repeatedly laminating 10 times.
  • the above-described method for producing a multilayer metal-clad laminate can further include a step of peeling and separating the plate-like carrier and metal foil of the metal foil with carrier.
  • the method may further include a step of removing a part or the whole of the metal foil by etching after the plate-like carrier and the metal foil are separated from each other.
  • the resin is laminated on the metal foil side of the metal foil with carrier, and then the resin, single-sided or double-sided wiring board, single-sided or double-sided metal-clad laminate, or metal foil with carrier of the present invention, or metal foil.
  • a method for manufacturing a build-up substrate which includes repeatedly laminating at least once, for example, 1 to 10 times.
  • a method for manufacturing a buildup board including a step of laminating one or more buildup wiring layers on the metal foil side of the metal foil with carrier described above.
  • the build-up wiring layer can be formed by using at least one of a subtractive method, a full additive method, and a semi-additive method.
  • the subtractive method is a method of forming a conductor pattern by selectively removing unnecessary portions of metal foil on a metal-clad laminate or a wiring board (including a printed wiring board and a printed circuit board) by etching or the like. Point to.
  • the full additive method is a method of forming a conductor pattern by electroless plating and / or electrolytic plating without using a metal foil for the conductor layer.
  • the semi-additive method is an electroless method on a seed layer made of metal foil, for example. In this method, a conductor pattern is formed by using metal deposition and electrolytic plating, etching, or a combination thereof, and then an unnecessary seed layer is removed by etching.
  • a single-sided or double-sided wiring board, a single-sided or double-sided metal-clad laminate, a metal foil with a carrier, a plate-like carrier with a metal foil with a carrier, or a resin may further include conducting conductive plating on the side surface and the bottom surface of the hole.
  • the step of forming wiring on at least one of the metal foil constituting the single-sided or double-sided wiring board, the metal foil constituting the single-sided or double-sided metal-clad laminate, and the metal foil constituting the metal foil with carrier is performed once. It can further include performing the above.
  • the manufacturing method of the build-up board may further include a step of bringing a metal foil into close contact with one surface on the surface on which the wiring is formed, and further laminating the carrier side of the metal foil with a carrier according to the present invention. . Moreover, it is possible to further include a step of laminating a metal foil with a carrier according to the present invention in which a resin is laminated on the surface on which the wiring is formed and the metal foil is adhered to both sides of the resin.
  • the “surface on which the wiring is formed” means a portion where wiring is formed on the surface that appears every time a buildup is performed, and the buildup substrate includes both a final product and an intermediate product.
  • the manufacturing method of the build-up substrate may further include a step of peeling and separating the plate-like carrier of the metal foil with carrier and the metal foil.
  • each layer can be laminated
  • This thermocompression bonding may be performed every time one layer is stacked, may be performed after being laminated to some extent, or may be performed collectively at the end.
  • a resin as an insulating layer, a two-layer circuit board, a resin as an insulating layer are stacked in order, and the metal foil side is in contact with the resin plate on it, Furthermore, a buildup board
  • substrate can be manufactured by laminating
  • a resin or conductor layer as an insulating layer is provided on at least one metal foil side of the metal foil with a carrier in which the metal foil is adhered to both surfaces or one surface of the resinous plate-like carrier 11c. Are laminated in order.
  • a step of half-etching the entire surface of the metal foil to adjust the thickness may be included.
  • Electroless plating is performed on the entire surface or a part of the substrate to form an interlayer connection, and further electrolytic plating is performed as necessary.
  • a plating resist may be formed in advance on each portion of the metal foil where electroless plating or electrolytic plating is unnecessary before performing each plating.
  • the surface of the metal foil may be chemically roughened in advance.
  • the plating resist When a plating resist is used, the plating resist is removed after plating. Next, a circuit is formed by removing unnecessary portions of the metal foil and the electroless plating portion and the electrolytic plating portion by etching. Thereby, a build-up substrate is obtained.
  • the steps from the lamination of the resin and the copper foil to the circuit formation may be repeated a plurality of times to form a multilayer build-up substrate.
  • the resin side of the metal foil of the metal foil with a carrier in which the metal foil is adhered to one side of the present invention may be contacted and laminated, or a resin plate is once laminated. Later, one metal foil of the metal foil with a carrier in which the metal foil is adhered to both surfaces of the present invention may be brought into contact with each other and laminated.
  • a prepreg containing a thermosetting resin can be suitably used as the resin plate used for manufacturing the build-up substrate.
  • a resin as an insulating layer such as a prepreg or a photosensitive layer is formed on the exposed surface of a metal foil of a laminate obtained by laminating a metal foil such as a copper foil on one or both sides of the plate carrier of the present invention. Laminating resin. Thereafter, a via hole is formed at a predetermined position of the resin.
  • the via hole can be formed by laser processing. After the laser processing, desmear treatment for removing smear in the via hole is preferably performed.
  • the resin in the via hole forming portion can be removed by a photolithography method.
  • electroless plating is performed on the bottom and side surfaces of the via holes, the entire surface or a part of the resin to form interlayer connections, and further electrolytic plating is performed as necessary.
  • a plating resist may be formed in advance on each portion of the resin where electroless plating or electrolytic plating is unnecessary before performing each plating. Further, when the adhesion between electroless plating, electrolytic plating, plating resist and resin is insufficient, the surface of the resin may be chemically roughened in advance.
  • the plating resist is removed after plating. Next, an unnecessary portion of the electroless plating portion or the electrolytic plating portion is removed by etching to form a circuit. Thereby, a build-up substrate is obtained.
  • the steps from resin lamination to circuit formation may be repeated a plurality of times to form a multilayered build-up substrate. Further, the outermost surface of this build-up substrate is laminated by contacting the resin side of the laminate in which the metal foil is closely attached to one side of the present invention, or the resin side of the metal foil with a carrier having the metal foil closely attached to one side. Alternatively, after laminating the resin once, one metal foil of the laminate in which the metal foil is adhered to both surfaces of the present invention, or one metal foil of the metal foil with a carrier in which the metal foil is adhered to both surfaces May be laminated in contact with each other.
  • the wiring is formed on the surface through the plating process and / or the etching process, and further, the build-up wiring is separated and separated between the carrier resin and the copper foil.
  • the board is completed.
  • Wiring may be formed on the peeling surface of the metal foil after peeling and separation, or the entire surface of the metal foil may be removed by etching to form a build-up wiring board.
  • a printed circuit board is completed by mounting electronic components on the build-up wiring board. Moreover, a printed circuit board can be obtained even if an electronic component is mounted directly on a coreless buildup substrate before resin peeling.
  • Example 1 A plurality of electrolytic copper foils (thickness 12 ⁇ m) were prepared, and nickel-zinc (Ni—Zn) alloy plating treatment and chromate (Cr—Zn) were performed on the shiny (S) surface of each electrolytic copper foil under the following conditions. (Chromate) treatment, the ten-point average roughness (measured in accordance with JIS B 0601: 2001) of the bonded surface (here, S surface) is 1.5 ⁇ m, and the resin is Mitsubishi Gas Chemical Co., Ltd. A company-prepared prepreg (BT resin) was bonded to the S surface of the electrolytic copper foil and hot-pressed at 190 ° C. for 100 minutes to prepare a copper foil with a carrier.
  • BT resin company-prepared prepreg
  • Nickel-zinc alloy plating Ni concentration 17g / L (added as NiSO 4 ) Zn concentration 4g / L (added as ZnSO 4 ) pH 3.1 Liquid temperature 40 °C Current density 0.1-10A / dm 2 Plating time 0.1 to 10 seconds
  • an aqueous solution of a silane compound is applied to the S surface using a spray coater, and then the copper foil surface is dried in air at 100 ° C., and then bonded to a prepreg. went.
  • Table 1 shows the type of silane compound, the stirring time from when the silane compound is dissolved in water to before application, the concentration of the silane compound in the aqueous solution, the alcohol concentration in the aqueous solution, and the pH of the aqueous solution. Show.
  • the types of copper foil bonding surfaces, surface treatment conditions and surface roughness Rz jis, silane compound usage conditions, prepreg types, and copper foil and prepreg lamination conditions are as shown in Table 1. is there.
  • Treatment liquid 3-glycidoxypropyltrimethoxysilane 0.9 volume% aqueous solution pH 5.0 to 9.0 Stirred at room temperature for 12 hours
  • Treatment method After applying the treatment liquid using a spray coater, the treated surface is dried in air at 100 ° C. for 5 minutes.
  • Example 19 to 20> A copper foil with a carrier shown in Table 3 was prepared in the same procedure as in Experimental Example 1 using a silane compound as a copper foil and a resin (prepreg). Further, heat treatment was performed under the conditions shown in Table 3. Evaluation similar to Experimental example 1 was performed about the copper foil with a carrier obtained in this way. The results are shown in Tables 3 and 4.
  • the S surface was used as the bonding surface of the copper foil, and the surface was chromated under the above-described conditions.
  • the surface roughness Rz cis of the copper foil, the type of prepreg, the use conditions of the silane compound for the surface treatment of the prepreg, and the lamination conditions of the copper foil and the prepreg are as shown in Table 3.
  • a 100 ⁇ m diameter hole penetrating the copper foil on the surface of the four-layer copper-clad laminate and the insulating layer (cured prepreg) thereunder was drilled using a laser processing machine.
  • electroless copper plating on the copper foil surface on the copper foil with carrier exposed at the bottom of the hole, the side surface of the hole, and the copper foil on the surface of the four-layer copper-clad laminate, and copper plating by electrolytic copper plating The electrical connection was formed between the copper foil on the copper foil with a carrier and the copper foil on the surface of the four-layer copper-clad laminate.
  • a part of the copper foil on the surface of the four-layer copper-clad laminate was etched using a ferric chloride-based etchant to form a circuit. In this way, a four-layer buildup substrate was obtained.
  • the two-layer build-up wiring boards were obtained by peeling off and separating the plate-like carrier of the copper foil with carrier and the copper foil.
  • the copper foil that was in close contact with the plate-like carrier on the two sets of two-layer build-up wiring boards was etched to form a wiring to obtain two sets of two-layer build-up wiring boards.
  • the resin was destroyed at the time of build-up during the peeling operation of the copper foil in the carrier-attached copper foil, or the resin remained on the copper foil surface without being peeled off.
  • the resin was peeled off without being destroyed during the copper foil peeling operation in the carrier-added copper foil during build-up, but the copper foil was removed without peeling operation. Sometimes peeled off.

Landscapes

  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Laminated Bodies (AREA)
  • Non-Metallic Protective Coatings For Printed Circuits (AREA)
  • Parts Printed On Printed Circuit Boards (AREA)

Description

キャリア付金属箔Metal foil with carrier

 本発明は、キャリア付金属箔に関する。より詳細には、プリント配線板に使用される片面若しくは2層以上の多層積層板又は極薄のコアレス基板の製造において用いられるキャリア付金属箔に関する。 The present invention relates to a metal foil with a carrier. More specifically, the present invention relates to a metal foil with a carrier used in the production of a single-sided or two-layer multilayer board or an ultra-thin coreless substrate used for a printed wiring board.

 多層積層体の代表的な例は、プリント回路板である。一般に、プリント回路板は、合成樹脂板、ガラス板、ガラス不織布、紙などの基材に合成樹脂を含浸させて得た「プリプレグ(Prepreg)」と称する誘電材を、基本的な構成材料としている。また、プリプレグと相対する側には電気伝導性を持った銅又は銅合金箔等のシートが接合されている。このように組み立てられた積層物を、一般にCCL(Copper Clad Laminate)材と呼んでいる。銅箔のプリプレグと接する面は、接合強度を高めるためにマット面とすることが通常である。銅又は銅合金箔の代わりに、アルミニウム、ニッケル、亜鉛などの箔を使用する場合もある。これらの厚さは5~200μm程度である。この一般的に用いられるCCL(Copper Clad Laminate)材を図1に示す。 A typical example of a multilayer laminate is a printed circuit board. Generally, a printed circuit board uses a dielectric material called “prepreg” obtained by impregnating a synthetic resin plate, a glass plate, a glass nonwoven fabric, paper or the like with a synthetic resin as a basic constituent material. . Further, a sheet such as copper or copper alloy foil having electrical conductivity is bonded to the side facing the prepreg. The laminated body thus assembled is generally called a CCL (Copper Clad Laminate) material. The surface of the copper foil in contact with the prepreg is usually a mat surface in order to increase the bonding strength. A foil made of aluminum, nickel, zinc or the like may be used instead of the copper or copper alloy foil. Their thickness is about 5 to 200 μm. This commonly used CCL (Copper Clad Laminate) material is shown in FIG.

 特許文献1には、合成樹脂製の板状キャリアと、該キャリアの少なくとも一方の面に、機械的に剥離可能に密着させた金属箔からなるキャリア付金属箔が提案され、このキャリア付金属箔はプリント配線板の組み立てに供することができる旨記載されている。そして、板状キャリアと金属箔の剥離強度は、1gf/cm~1kgf/cmであることが望ましいことを示した。当該キャリア付金属箔によれば、合成樹脂で銅箔を全面に亘って支持するので、積層中に銅箔に皺の発生を防止できる。また、このキャリア付金属箔は、金属箔と合成樹脂が隙間なく密着しているので、金属箔表面を鍍金又はエッチングする際に、これを鍍金又はエッチング用の薬液に投入することが可能となる。更に、合成樹脂の線膨張係数は、基板の構成材料である銅箔及び重合後のプリプレグと同等のレベルにあることから、回路の位置ずれを招くことがないので、不良品発生が少なくなり、歩留りを向上させることができるという優れた効果を有する。 Patent Document 1 proposes a metal foil with a carrier composed of a synthetic resin plate-shaped carrier and a metal foil that is mechanically peelably adhered to at least one surface of the carrier. Describes that it can be used for the assembly of printed wiring boards. It was shown that the peel strength between the plate-like carrier and the metal foil is preferably 1 gf / cm to 1 kgf / cm. According to the metal foil with a carrier, since the copper foil is supported over the entire surface by the synthetic resin, generation of wrinkles on the copper foil during lamination can be prevented. In addition, since the metal foil with carrier is in close contact with the synthetic resin without gaps, when the surface of the metal foil is plated or etched, it can be put into the chemical solution for plating or etching. . Furthermore, since the linear expansion coefficient of the synthetic resin is at the same level as the copper foil that is a constituent material of the substrate and the prepreg after polymerization, the circuit is not misaligned, resulting in fewer defective products, It has the outstanding effect that a yield can be improved.

特開2009-272589号公報JP 2009-272589 A

 特許文献1に記載のキャリア付き銅箔は、プリント回路板の製造工程を簡素化及び歩留まりアップにより製造コスト削減に大きく貢献する画期的な発明であるが、キャリア付金属箔の特定用途における板状キャリアと金属箔の一時的な密着及びその後の剥離を考慮した構成については言及がなく、改良の余地が残されている。 The copper foil with a carrier described in Patent Document 1 is an epoch-making invention that greatly contributes to the reduction of the manufacturing cost by simplifying the manufacturing process of the printed circuit board and increasing the yield, but the board for the specific application of the metal foil with the carrier There is no mention of a configuration that takes into account temporary adhesion between the carrier and the metal foil and subsequent peeling, and there remains room for improvement.

 例えば、あまり多くの加熱加工の工程を経ずに利用される用途、例えばメッシュ加工を施して形成するシールド材などの用途では、密着している金属箔と合成樹脂とが剥離操作をする前に不用意に剥離せず、かつ、剥離操作を行う際に金属箔と合成樹脂との界面にて意図的に剥離できることが重要である。すなわち、不用意な剥離を避けるべく、両者の剥離強度を過度に上げすぎると、今度は金属箔と合成樹脂とを剥離させるときに、樹脂部分の破壊が起こり、金属箔の表面に樹脂分が残存する場合があり、好ましいことではない。 For example, in applications that are used without going through too many heat processing steps, such as shield materials that are formed by applying mesh processing, before the metal foil and the synthetic resin are in close contact with each other It is important that it does not peel carelessly and can be intentionally peeled off at the interface between the metal foil and the synthetic resin when performing a peeling operation. That is, in order to avoid inadvertent peeling, if the peel strength of both is excessively increased, this time, when the metal foil and the synthetic resin are peeled, the resin portion is destroyed, and the resin content is on the surface of the metal foil. It may remain and is not preferred.

 そこで、本発明は板状キャリアと金属箔を剥離可能に密着させるのに有用な条件を探求し、更に金属箔と板状キャリアとの界面での意図的な剥離が可能なキャリア付き金属箔を提供することを課題とする。 Therefore, the present invention seeks a useful condition for allowing the plate-like carrier and the metal foil to be peeled in close contact with each other, and further provides a metal foil with a carrier capable of intentional peeling at the interface between the metal foil and the plate-like carrier. The issue is to provide.

 本発明者等は、上記の課題について鋭意研究した結果、金属箔と板状キャリアとの間の剥離強度を一定の範囲とすることにより、金属箔と板状キャリアとの間において、不用意な剥離が生じることがなく、かつ、意図的な剥離が可能になることを見出して、本発明を完成させるに至った。 As a result of earnest research on the above-mentioned problems, the present inventors have inadvertently placed the metal foil and the plate carrier between the metal foil and the plate carrier by setting the peel strength between them to a certain range. It has been found that no peeling occurs and intentional peeling is possible, and the present invention has been completed.

 すなわち、本発明は、以下のとおりである。
(1)樹脂製の板状キャリアと、該キャリアの少なくとも一方の面に、剥離可能に密着させた金属箔からなるキャリア付金属箔であって、220℃で3時間、6時間または9時間のうちの少なくとも一つの加熱後における、金属箔と板状キャリアとの剥離強度が、10gf/cm以上200gf/cm以下であるキャリア付金属箔。
(2)樹脂製の板状キャリアが熱硬化性樹脂を含む(1)に記載のキャリア付金属箔。
(3)前記樹脂製の板状キャリアは、プリプレグである(1)または(2)に記載のキャリア付金属箔。
(4)前記樹脂製の板状キャリアは、120~320℃のガラス転移温度Tgを有する(2)または(3)に記載のキャリア付金属箔。
(5)前記金属箔の前記キャリアと接する側表面の十点平均粗さ(Rz jis)が、3.5μm以下である(1)~(4)のいずれかに記載のキャリア付金属箔。
(6)前記加熱前における前記金属箔と前記板状キャリアとの剥離強度が、10gf/cm以上200gf/cm以下である(1)~(5)のいずれかに記載のキャリア付金属箔。
(7)キャリア付き金属箔を構成する板状キャリアと金属箔は次式:
That is, the present invention is as follows.
(1) A metal foil with a carrier made of a resin-made plate-like carrier and a metal foil that is detachably adhered to at least one surface of the carrier, and is 220 ° C. for 3 hours, 6 hours, or 9 hours. The metal foil with a carrier whose peeling strength of metal foil and a plate-shaped carrier after at least 1 heating is 10 gf / cm or more and 200 gf / cm or less.
(2) The metal foil with a carrier according to (1), wherein the resin plate-like carrier contains a thermosetting resin.
(3) The resin-made plate-shaped carrier is a metal foil with a carrier according to (1) or (2), which is a prepreg.
(4) The metal plate with a carrier according to (2) or (3), wherein the resinous plate-shaped carrier has a glass transition temperature Tg of 120 to 320 ° C.
(5) The metal foil with a carrier according to any one of (1) to (4), wherein a ten-point average roughness (Rz jis) of a side surface in contact with the carrier of the metal foil is 3.5 μm or less.
(6) The metal foil with a carrier according to any one of (1) to (5), wherein a peel strength between the metal foil and the plate-like carrier before the heating is 10 gf / cm or more and 200 gf / cm or less.
(7) The plate-like carrier and the metal foil constituting the metal foil with the carrier have the following formula:

Figure JPOXMLDOC01-appb-C000002
Figure JPOXMLDOC01-appb-C000002

(式中、R1はアルコキシ基またはハロゲン原子であり、R2はアルキル基、シクロアルキル基及びアリール基よりなる群から選択される炭化水素基であるか、一つ以上の水素原子がハロゲン原子で置換されたこれら何れかの炭化水素基であり、R3及びR4はそれぞれ独立にハロゲン原子、またはアルコキシ基、またはアルキル基、シクロアルキル基及びアリール基よりなる群から選択される炭化水素基であるか、一つ以上の水素原子がハロゲン原子で置換されたこれら何れかの炭化水素基である。)
に示すシラン化合物、その加水分解生成物、該加水分解生成物の縮合体を単独で又は複数組み合わせて用いて貼り合わせてなる(1)~(6)のいずれかに記載のキャリア付金属箔。
(8)(1)~(7)のいずれかに記載のキャリア付金属箔の少なくとも一つの金属箔側に対して、樹脂を積層し、次いで樹脂又は金属箔を1回以上繰り返して積層することを含む多層金属張積層板の製造方法。
(9)(1)~(7)のいずれかに記載のキャリア付金属箔の少なくとも一つの金属箔側に樹脂を積層し、次いで樹脂、片面あるいは両面金属張積層板、または(1)~(7)のいずれかに記載のキャリア付金属箔、または金属箔を1回以上繰り返して積層することを含む多層金属張積層板の製造方法。
(10)(8)または(9)に記載の多層金属張積層板の製造方法において、前記キャリア付金属箔の板状キャリアと金属箔とを剥離して分離する工程を更に含む多層金属張積層板の製造方法。
(11)(10)に記載の製造方法において、剥離して分離した金属箔の一部または全部をエッチングにより除去する工程を含む多層金属張積層板の製造方法。
(12)(8)~(11)のいずれかに記載の製造方法により得られる多層金属張積層板。
(13)(1)~(7)のいずれかに記載キャリア付金属箔の少なくとも一つの金属箔側に、ビルドアップ配線層を一層以上形成する工程を含むビルドアップ基板の製造方法。
(14)ビルドアップ配線層はサブトラクティブ法又はフルアディティブ法又はセミアディティブ法の少なくとも一つを用いて形成される(13)に記載のビルドアップ基板の製造方法。
(15)(1)~(7)のいずれかに記載のキャリア付き金属箔の少なくとも一つの金属箔側に樹脂を積層し、次いで樹脂、片面あるいは両面配線基板、片面あるいは両面金属張積層板、(1)~(7)のいずれかに記載のキャリア付金属箔又は金属箔を1回以上繰り返して積層することを含むビルドアップ基板の製造方法。
(16)(15)に記載のビルドアップ基板の製造方法において、片面あるいは両面配線基板、片面あるいは両面金属張積層板、キャリア付金属箔の金属箔、キャリア付金属箔の板状キャリア、又は樹脂に穴を開け、当該穴の側面および底面に導通めっきをする工程を更に含むビルドアップ基板の製造方法。
(17)(15)または(16)に記載のビルドアップ基板の製造方法において、前記片面あるいは両面配線基板を構成する金属箔、片面あるいは両面金属張積層板を構成する金属箔、及びキャリア付金属箔を構成する金属箔の少なくとも一つに配線を形成する工程を1回以上行うことを更に含むビルドアップ基板の製造方法。
(18)配線形成された表面の上に、片面に金属箔を密着させた(1)~(7)のいずれかに記載のキャリア付金属箔の樹脂板側を接触させて積層する工程を含む(15)~(17)のいずれかに記載のビルドアップ基板の製造方法。
(19)配線形成された表面の上に、樹脂を積層し、当該樹脂に両面に金属箔を密着させた(1)~(7)のいずれかに記載のキャリア付金属箔の一方の金属箔を接触させて積層する工程を更に含む(15)~(17)のいずれかに記載のビルドアップ基板の製造方法。
(20)前記樹脂の少なくとも一つがプリプレグであることを特徴とする(15)~(19)のいずれかに記載のビルドアップ基板の製造方法。
(21)(13)~(20)のいずれかに記載のビルドアップ基板の製造方法において、前記キャリア付金属箔の板状キャリアと金属箔とを剥離して分離する工程を更に含むビルドアップ配線板の製造方法。
(22)(21)に記載のビルドアップ配線板の製造方法において、板状キャリアと密着していた金属箔の一部または全部をエッチングにより除去する工程を更に含むビルドアップ配線板の製造方法。
(23)(21)または(22)に記載の製造方法により得られるビルドアップ配線板。
(24)(13)~(20)のいずれかに記載の製造方法によりビルドアップ基板を製造する工程を含むプリント回路板の製造方法。
(25)(21)または(22)に記載の製造方法によりビルドアップ配線板を製造する工程を含むプリント回路板の製造方法。
Wherein R 1 is an alkoxy group or a halogen atom, and R 2 is a hydrocarbon group selected from the group consisting of an alkyl group, a cycloalkyl group and an aryl group, or one or more hydrogen atoms are halogen atoms Any one of these hydrocarbon groups substituted by R 3 and R 4 are each independently a halogen atom, an alkoxy group, or a hydrocarbon group selected from the group consisting of an alkyl group, a cycloalkyl group, and an aryl group Or any one of these hydrocarbon groups in which one or more hydrogen atoms are replaced by halogen atoms.)
The metal foil with a carrier according to any one of (1) to (6), wherein the silane compound, the hydrolysis product thereof, and the condensate of the hydrolysis product shown in the above are used alone or in combination.
(8) A resin is laminated on at least one metal foil side of the metal foil with a carrier according to any one of (1) to (7), and then the resin or the metal foil is repeatedly laminated one or more times. A method for producing a multilayer metal-clad laminate comprising:
(9) A resin is laminated on at least one metal foil side of the metal foil with a carrier according to any one of (1) to (7), and then a resin, a single-sided or double-sided metal-clad laminate, or (1) to ( 7) A method for producing a multilayer metal-clad laminate comprising laminating a metal foil with a carrier according to any one of 1) or a metal foil repeatedly one or more times.
(10) In the method for producing a multilayer metal-clad laminate according to (8) or (9), the multilayer metal-clad laminate further comprising a step of peeling and separating the plate-like carrier and metal foil of the metal foil with carrier. A manufacturing method of a board.
(11) The method for producing a multilayer metal-clad laminate comprising the step of removing a part or all of the separated and separated metal foil by etching in the production method according to (10).
(12) A multilayer metal-clad laminate obtained by the production method according to any one of (8) to (11).
(13) A method for manufacturing a buildup substrate, comprising a step of forming one or more buildup wiring layers on at least one metal foil side of the metal foil with carrier according to any one of (1) to (7).
(14) The buildup wiring layer manufacturing method according to (13), wherein the buildup wiring layer is formed using at least one of a subtractive method, a full additive method, and a semi-additive method.
(15) A resin is laminated on at least one metal foil side of the metal foil with a carrier according to any one of (1) to (7), and then a resin, a single-sided or double-sided wiring board, a single-sided or double-sided metal-clad laminate, (1) A method for producing a build-up substrate, comprising repeatedly laminating a metal foil with a carrier or a metal foil according to any one of (7) at least once.
(16) In the method for manufacturing a buildup board according to (15), a single-sided or double-sided wiring board, a single-sided or double-sided metal-clad laminate, a metal foil with a carrier, a plate-like carrier with a metal foil with a carrier, or a resin The manufacturing method of the buildup board | substrate which further includes the process of drilling a hole in and carrying out conductive plating to the side and bottom face of the said hole.
(17) In the method for manufacturing a buildup board according to (15) or (16), the metal foil constituting the single-sided or double-sided wiring board, the metal foil constituting the single-sided or double-sided metal-clad laminate, and the metal with carrier The manufacturing method of the buildup board | substrate which further includes performing the process of forming wiring in at least 1 of the metal foil which comprises foil once or more.
(18) including a step of contacting and laminating the resin plate side of the metal foil with carrier according to any one of (1) to (7), wherein the metal foil is adhered to one surface on the surface on which the wiring is formed. (15) The method for manufacturing a build-up substrate according to any one of (17) to (17).
(19) One metal foil of the metal foil with a carrier according to any one of (1) to (7), wherein a resin is laminated on the surface on which the wiring is formed, and the metal foil is adhered to both sides of the resin. (15) The method for manufacturing a buildup substrate according to any one of (15) to (17), further including a step of laminating the layers.
(20) The method for manufacturing a buildup substrate according to any one of (15) to (19), wherein at least one of the resins is a prepreg.
(21) The buildup wiring according to any one of (13) to (20), further comprising a step of peeling and separating the plate-like carrier and the metal foil of the metal foil with carrier. A manufacturing method of a board.
(22) The method for manufacturing a buildup wiring board according to (21), further comprising a step of removing a part or all of the metal foil adhered to the plate carrier by etching.
(23) A build-up wiring board obtained by the manufacturing method according to (21) or (22).
(24) A method for producing a printed circuit board, comprising a step of producing a build-up substrate by the production method according to any one of (13) to (20).
(25) A method for producing a printed circuit board, comprising a step of producing a build-up wiring board by the production method according to (21) or (22).

 本発明によれば、金属箔と板状キャリアとの間において、不用意な剥離が生じることがなく、かつ、意図的な剥離が可能となるキャリア付金属箔を提供することができるようになる。 According to the present invention, it is possible to provide a metal foil with a carrier that does not cause inadvertent peeling between the metal foil and the plate-like carrier and can be intentionally peeled off. .

CCLの一構成例を示す。An example of the configuration of CCL is shown. 本発明に係るキャリア付金属箔の一構成例を示す。The structural example of the metal foil with a carrier which concerns on this invention is shown. 本発明に係るキャリア付銅箔(樹脂板の両面に銅箔が接合した形態)を利用した多層CCLの組み立て例を示す。The assembly example of the multilayer CCL using the copper foil with a carrier which concerns on this invention (The form which copper foil joined on both surfaces of the resin board) is shown.

 本発明に係るキャリア付金属箔の一実施形態においては、樹脂製の板状キャリアと該キャリアの片面又は両面、好ましくは両面に剥離可能に密着させた金属箔とからなるキャリア付金属箔を準備する。本発明に係るキャリア付金属箔の一構成例を図2および図3に示す。特に、図3の最初のところには、樹脂製の板状キャリア11cの両面に、金属箔11aを剥離可能に密着させたキャリア付き金属箔11が示されている。板状キャリア11cと金属箔11aとは、後述するシラン化合物11bを用いて貼り合わせられている。 In one embodiment of a metal foil with a carrier according to the present invention, a metal foil with a carrier comprising a resin-made plate-like carrier and a metal foil that is detachably adhered to one or both sides, preferably both sides of the carrier, is prepared. To do. One structural example of the metal foil with a carrier according to the present invention is shown in FIGS. In particular, the metal foil 11 with a carrier in which the metal foil 11a is detachably adhered to both surfaces of a resin-made plate carrier 11c is shown at the beginning of FIG. The plate-like carrier 11c and the metal foil 11a are bonded together using a silane compound 11b described later.

 構造的には、図1に示したCCLと類似しているが、本発明のキャリア付金属箔では、金属箔と樹脂が最終的に分離されるもので、容易に剥離できる構造を有する。この点、CCLは剥離させるものではないので、構造と機能は、全く異なるものである。 Although structurally similar to the CCL shown in FIG. 1, the metal foil with a carrier of the present invention has a structure in which the metal foil and the resin are finally separated and can be easily peeled off. In this respect, since the CCL is not peeled off, the structure and function are completely different.

 本発明で使用するキャリア付金属箔はいずれ剥がさなければならないので過度に密着性が高いのは不都合であるが、板状キャリアと金属箔とは、プリント回路板作製過程で行われるめっき等の薬液処理工程において剥離しない程度の密着性は必要である。 Since the metal foil with carrier used in the present invention must be peeled off eventually, it is inconvenient that the adhesiveness is excessively high, but the plate-like carrier and the metal foil are chemicals such as plating performed in the printed circuit board manufacturing process. Adhesiveness that does not peel in the processing step is necessary.

 また、多層プリント配線板の製造過程では、積層プレス工程やデスミア工程で加熱処理することが多い。そのため、キャリア付き金属箔が受ける熱履歴は、積層数が多くなるほど厳しくなる。従って、特に多層プリント配線板への適用を考える上では、所要の熱履歴を経た後にも、金属箔と板状キャリアとの剥離強度が先述した範囲にあることが望ましい。 Also, in the process of manufacturing a multilayer printed wiring board, heat treatment is often performed in a lamination press process or a desmear process. Therefore, the heat history that the metal foil with a carrier receives becomes severer as the number of laminated layers increases. Therefore, when considering application to a multilayer printed wiring board in particular, it is desirable that the peel strength between the metal foil and the plate-like carrier is in the above-described range even after passing through a required thermal history.

 従って、本発明の一実施形態においては、多層プリント配線板の製造過程における加熱条件を想定した、例えば220℃で3時間、6時間または9時間のうちの少なくとも一つの加熱後における、金属箔と板状キャリアの剥離強度が、10gf/cm以上であることが好ましく、30gf/cm以上であることがより好ましく、50gf/cm以上であることが一層好ましい一方で、200gf/cm以下であることが好ましく、150gf/cm以下であることがより好ましく、80gf/cm以下であることが一層好ましい。 Therefore, in one embodiment of the present invention, assuming the heating conditions in the manufacturing process of the multilayer printed wiring board, for example, the metal foil after at least one heating at 220 ° C. for 3 hours, 6 hours, or 9 hours The peel strength of the plate-like carrier is preferably 10 gf / cm or more, more preferably 30 gf / cm or more, and even more preferably 50 gf / cm or more, while it is 200 gf / cm or less. Preferably, it is 150 gf / cm or less, and more preferably 80 gf / cm or less.

 220℃での加熱後の剥離強度については、多彩な積層数に対応可能であるという観点から、3時間後および6時間後の両方、または6時間および9時間後の両方において剥離強度が上述した範囲を満たすことが好ましく、3時間、6時間および9時間後の全ての剥離強度が上述した範囲を満たすことが更に好ましい。 Regarding the peel strength after heating at 220 ° C., the peel strength was described above in both 3 hours and 6 hours, or both 6 hours and 9 hours from the viewpoint of being able to cope with various lamination numbers. It is preferable to satisfy the range, and it is further preferable that all peel strengths after 3 hours, 6 hours, and 9 hours satisfy the above-described range.

 このように、多層プリント配線板の製造工程における加熱処理後に、金属箔と板状キャリアの剥離強度をこのような範囲とすることによって、当該製造工程における搬送時や加工時に剥離することない一方で、加熱処理後に人手で容易に剥がす、すなわち機械的に剥がすことができる。 As described above, after the heat treatment in the manufacturing process of the multilayer printed wiring board, the peeling strength between the metal foil and the plate-like carrier is set in such a range so that the peeling does not occur at the time of transportation or processing in the manufacturing process. It can be easily peeled off manually after the heat treatment, that is, mechanically peeled off.

 さらに、本発明のキャリア付銅箔は、あまり多くの加熱加工の工程を経ずに利用される用途、例えばメッシュ加工を施して形成するシールド材などの用途にも用いることが可能である。 Furthermore, the copper foil with a carrier of the present invention can be used for applications that are used without passing through many heat processing steps, such as a shield material formed by applying mesh processing.

 この観点から、上述した多層プリント配線板の製造過程における加熱処理の前のキャリア付金属箔において、金属箔と板状キャリアとの剥離強度は、10gf/cm以上であることが好ましく、30gf/cm以上であることがより好ましく、50gf/cm以上であることが一層好ましい一方で、200gf/cm以下であることが好ましく、150gf/cm以下であることがより好ましく、80gf/cm以下であることが一層好ましい。金属箔と板状キャリアの剥離強度をこのような範囲とすることによって、搬送時や加工時に剥離することない一方で、人手で容易に剥がすことができる。 From this viewpoint, in the metal foil with a carrier before the heat treatment in the manufacturing process of the multilayer printed wiring board described above, the peel strength between the metal foil and the plate-like carrier is preferably 10 gf / cm or more, and preferably 30 gf / cm. More preferably, it is more preferably 50 gf / cm or more, while it is preferably 200 gf / cm or less, more preferably 150 gf / cm or less, and 80 gf / cm or less. Even more preferred. By setting the peel strength of the metal foil and the plate-like carrier in such a range, it can be easily peeled off manually, while being not peeled off during transport or processing.

 本発明において、剥離強度はJIS C6481に規定される90度剥離強度測定方法に準拠して測定する。 In the present invention, the peel strength is measured in accordance with a 90 degree peel strength measuring method defined in JIS C6481.

 以下、このような剥離強度を実現するための各材料の具体的構成要件について説明する。 Hereinafter, specific constituent requirements of each material for realizing such peel strength will be described.

 板状キャリアとなる樹脂としては、特に制限はないが、フェノール樹脂、ポリイミド樹脂、エポキシ樹脂、天然ゴム、松脂等を使用することができるが、熱硬化性樹脂であることが好ましい。また、プリプレグを使用することもできる。金属箔と貼り合わせ前のプリプレグはBステージの状態にあるものがよい。プリプレグ(Cステージ)の線膨張係数は12~18(×10-6/℃)と、基板の構成材料である銅箔の16.5(×10-6/℃)、またはSUSプレス板の17.3(×10-6/℃)とほぼ等しいことから、プレス前後の基板サイズが設計時のそれとは異なる現象(スケーリング変化)による回路の位置ずれが発生し難い点で有利である。更に、これらのメリットの相乗効果として多層の極薄コアレス基板の生産も可能になる。ここで使用するプリプレグは、回路基板を構成するプリプレグと同じ物であっても異なる物であってもよい。 The resin that serves as the plate-like carrier is not particularly limited, and phenol resin, polyimide resin, epoxy resin, natural rubber, pine resin, and the like can be used, but a thermosetting resin is preferable. A prepreg can also be used. The prepreg before being bonded to the metal foil is preferably in a B-stage state. The linear expansion coefficient of the prepreg (C stage) is 12 to 18 (× 10 −6 / ° C.), 16.5 (× 10 −6 / ° C.) of the copper foil as the constituent material of the substrate, or 17 of the SUS press plate .3 (× 10 −6 / ° C.) is advantageous in that it is difficult to cause circuit misalignment due to a phenomenon (scaling change) in which the substrate size before and after pressing differs from that at the time of design. Furthermore, as a synergistic effect of these merits, it becomes possible to produce a multilayer ultra-thin coreless substrate. The prepreg used here may be the same as or different from the prepreg constituting the circuit board.

 この板状キャリアは、高いガラス転移温度Tgを有することが加熱後の剥離強度を最適な範囲に維持する観点で好ましく、例えば120~320℃、好ましくは170~240℃のガラス転移温度Tgである。なお、ガラス転移温度Tgは、DSC(示差走査熱量測定法)により測定される値とする。 The plate-like carrier preferably has a high glass transition temperature Tg from the viewpoint of maintaining the peel strength after heating in an optimum range, for example, a glass transition temperature Tg of 120 to 320 ° C., preferably 170 to 240 ° C. . The glass transition temperature Tg is a value measured by DSC (differential scanning calorimetry).

 また、樹脂の熱膨張率が、金属箔の熱膨張率の+10%、-30%以内であることが望ましい。これによって、金属箔と樹脂との熱膨張差に起因する回路の位置ずれを効果的に防止することができ、不良品発生を減少させ、歩留りを向上させることができる。 Also, it is desirable that the thermal expansion coefficient of the resin is within + 10% and −30% of the thermal expansion coefficient of the metal foil. As a result, it is possible to effectively prevent circuit misalignment due to the difference in thermal expansion between the metal foil and the resin, thereby reducing the occurrence of defective products and improving the yield.

 板状キャリアの厚みは特に制限はなく、リジッドでもフレキシブルでもよいが、厚すぎるとホットプレス中の熱分布に悪影響がでる一方で、薄すぎると撓んでしまいプリント配線板の製造工程を流れなくなることから、通常5μm以上1000μm以下であり、50μm以上900μm以下が好ましく、100μm以上400μm以下がより好ましい。 The thickness of the plate-like carrier is not particularly limited and may be rigid or flexible. However, if it is too thick, it will adversely affect the heat distribution during hot pressing, while if it is too thin, it will bend and will not flow through the printed wiring board manufacturing process. Therefore, it is usually 5 μm or more and 1000 μm or less, preferably 50 μm or more and 900 μm or less, and more preferably 100 μm or more and 400 μm or less.

 金属箔としては、銅又は銅合金箔が代表的なものであるが、アルミニウム、ニッケル、亜鉛などの箔を使用することもできる。銅又は銅合金箔の場合、電解箔又は圧延箔を使用することができる。金属箔は、限定的ではないが、プリント回路基板の配線としての使用を考えると、1μm以上、好ましくは5μm以上、および400μm以下、好ましくは120μm以下の厚みを有するのが一般的である。板状キャリアの両面に金属箔を貼り付ける場合、同じ厚みの金属箔を用いても良いし、異なる厚みの金属箔を用いても良い。 As the metal foil, copper or copper alloy foil is a typical one, but foil of aluminum, nickel, zinc or the like can also be used. In the case of copper or copper alloy foil, electrolytic foil or rolled foil can be used. Although not limited, the metal foil generally has a thickness of 1 μm or more, preferably 5 μm or more, and 400 μm or less, preferably 120 μm or less, considering use as a wiring of a printed circuit board. When metal foil is affixed on both surfaces of the plate-like carrier, metal foils having the same thickness may be used, or metal foils having different thicknesses may be used.

 使用する金属箔には各種の表面処理が施されていてもよい。例えば、耐熱性付与を目的とした金属めっき(Niめっき、Ni-Zn合金めっき、Cu-Ni合金めっき、Cu-Zn合金めっき、Znめっき、Cu-Ni-Zn合金めっき、Co-Ni合金めっきなど)、防錆性や耐変色性を付与するためのクロメート処理(クロメート処理液中にZn、P、Ni、Mo、Zr、Ti等の合金元素を1種以上含有させる場合を含む)、表面粗度調整のための粗化処理(例:銅電着粒やCu-Ni-Co合金めっき、Cu-Ni-P合金めっき、Cu-Co合金めっき、Cu-Ni合金めっき、Cu-Co合金めっき、Cu-As合金めっき、Cu-As-W合金めっき等の銅合金めっきによるもの)が挙げられる。粗化処理が金属箔と板状キャリアの剥離強度に影響を与えることはもちろん、クロメート処理も大きな影響を与える。クロメート処理は防錆性や耐変色性の観点から重要であるが、剥離強度を有意に上昇させる傾向が見られるので、剥離強度の調整手段としても意義がある。 The metal foil used may be subjected to various surface treatments. For example, metal plating for the purpose of imparting heat resistance (Ni plating, Ni—Zn alloy plating, Cu—Ni alloy plating, Cu—Zn alloy plating, Zn plating, Cu—Ni—Zn alloy plating, Co—Ni alloy plating, etc. ), Chromate treatment (including the case where one or more alloy elements such as Zn, P, Ni, Mo, Zr and Ti are contained in the chromate treatment solution) for imparting rust prevention and discoloration resistance, surface roughness (For example, copper electrodeposition grains, Cu—Ni—Co alloy plating, Cu—Ni—P alloy plating, Cu—Co alloy plating, Cu—Ni alloy plating, Cu—Co alloy plating, And copper alloy plating such as Cu—As alloy plating and Cu—As—W alloy plating). The roughening treatment not only affects the peel strength between the metal foil and the plate carrier, but also the chromate treatment has a great influence. Chromate treatment is important from the viewpoint of rust prevention and discoloration resistance, but since it tends to significantly increase the peel strength, it is also meaningful as a means for adjusting the peel strength.

 従来のCCLでは、樹脂と銅箔のピール強度が高いことが望まれるので、例えば、電解銅箔のマット面(M面)を樹脂との接着面とし、粗化処理等の表面処理を施すことによって化学的および物理的アンカー効果による接着力向上が図られている。また、樹脂側においても、金属箔との接着力をアップするために各種バインダーが添加される等している。前述したように、本発明においてはCCLとは異なり、金属箔と樹脂は最終的に剥離する必要があるので、過度に剥離強度が高いのは不利である。 In conventional CCL, since it is desired that the peel strength between the resin and the copper foil is high, for example, the matte surface (M surface) of the electrolytic copper foil is used as an adhesive surface with the resin, and surface treatment such as roughening treatment is performed. Thus, the adhesive strength is improved by the chemical and physical anchoring effects. On the resin side, various binders are added to increase the adhesive strength with the metal foil. As described above, in the present invention, unlike the CCL, since the metal foil and the resin need to be finally peeled, it is disadvantageous that the peel strength is excessively high.

 そこで、本発明に係るキャリア付金属箔の好ましい一実施形態においては、金属箔と板状キャリアの剥離強度を先述した好ましい範囲に調節するため、貼り合わせ面の表面粗度を、JIS B 0601:2001に準拠して測定した金属箔表面の十点平均粗さ(Rz jis)で表して、3.5μm以下、更に3.0μm以下とすることが好ましい。但し、表面粗度を際限なく小さくするのは手間がかかりコスト上昇の原因となるので、0.1μm以上とするのが好ましく、0.3μm以上とすることがより好ましい。金属箔として電解銅箔を使用する場合、このような表面粗度に調整すれば、光沢面(シャイニー面、S面)及び粗面(マット面、M面)の何れを使用することも可能であるが、S面を用いた方が上記表面粗度への調整が容易である。一方で、前記金属箔の前記キャリアと接しない側の表面の十点平均粗さ(Rz jis)は、0.4mμ以上10.0μm以下であることが好ましい。 Therefore, in a preferred embodiment of the metal foil with a carrier according to the present invention, the surface roughness of the bonded surface is JIS B 0601: in order to adjust the peel strength between the metal foil and the plate-like carrier to the preferred range described above. Expressed by the ten-point average roughness (Rz jis) of the metal foil surface measured according to 2001, it is preferably 3.5 μm or less, more preferably 3.0 μm or less. However, reducing the surface roughness indefinitely takes time and increases costs, so it is preferably 0.1 μm or more, and more preferably 0.3 μm or more. When electrolytic copper foil is used as the metal foil, it is possible to use either a glossy surface (shiny surface, S surface) or a rough surface (matte surface, M surface) by adjusting to such a surface roughness. However, it is easier to adjust the surface roughness by using the S-plane. On the other hand, the ten-point average roughness (Rz jis) of the surface of the metal foil that does not contact the carrier is preferably 0.4 mμ or more and 10.0 μm or less.

 また、本発明に係るキャリア付金属箔の好ましい一実施形態においては、金属箔の樹脂との貼り合わせ面に対しては、粗化処理等剥離強度向上のための表面処理は行わない。また、本発明に係るキャリア付金属箔の好ましい一実施形態においては、樹脂中には、金属箔との接着力をアップするためのバインダーは添加されていない。 In a preferred embodiment of the metal foil with a carrier according to the present invention, the surface treatment for improving the peel strength such as roughening treatment is not performed on the bonding surface of the metal foil with the resin. Moreover, in preferable one Embodiment of metal foil with a carrier which concerns on this invention, the binder for improving the adhesive force with metal foil is not added in resin.

 剥離強度の調節は、次式に示すシラン化合物、またはその加水分解生成物質、または該加水分解生成物質の縮合体(以下、単にシラン化合物と記述する)を単独でまたは複数混合して使用してもよい。当該シラン化合物を用いて板状キャリアと金属箔を貼り合わせることで、適度に密着性が低下し、剥離強度を上述した範囲に調節しやすくなるからである。 The peel strength is adjusted by using a silane compound represented by the following formula, or a hydrolysis product thereof, or a condensate of the hydrolysis product (hereinafter simply referred to as a silane compound) alone or in combination. Also good. This is because by sticking the plate-like carrier and the metal foil together using the silane compound, the adhesiveness is appropriately lowered and the peel strength can be easily adjusted to the above-described range.

Figure JPOXMLDOC01-appb-C000003
Figure JPOXMLDOC01-appb-C000003

(式中、R1はアルコキシ基またはハロゲン原子であり、R2はアルキル基、シクロアルキル基及びアリール基よりなる群から選択される炭化水素基であるか、一つ以上の水素原子がハロゲン原子で置換されたこれら何れかの炭化水素基であり、R3及びR4はそれぞれ独立にハロゲン原子、またはアルコキシ基、またはアルキル基、シクロアルキル基及びアリール基よりなる群から選択される炭化水素基であるか、一つ以上の水素原子がハロゲン原子で置換されたこれら何れかの炭化水素基である。) Wherein R 1 is an alkoxy group or a halogen atom, and R 2 is a hydrocarbon group selected from the group consisting of an alkyl group, a cycloalkyl group and an aryl group, or one or more hydrogen atoms are halogen atoms Any one of these hydrocarbon groups substituted by R 3 and R 4 are each independently a halogen atom, an alkoxy group, or a hydrocarbon group selected from the group consisting of an alkyl group, a cycloalkyl group, and an aryl group Or any one of these hydrocarbon groups in which one or more hydrogen atoms are replaced by halogen atoms.)

 当該シラン化合物はアルコキシ基を少なくとも一つ有していることが必要である。アルコキシ基が存在せずに、アルキル基、シクロアルキル基及びアリール基よりなる群から選択される炭化水素基であるか、一つ以上の水素原子がハロゲン原子で置換されたこれら何れかの炭化水素基のみで置換基が構成される場合、板状キャリアと金属箔表面の密着性が低下し過ぎる傾向がある。また、当該シラン化合物はアルキル基、シクロアルキル基及びアリール基よりなる群から選択される炭化水素基であるか、一つ以上の水素原子がハロゲン原子で置換されたこれら何れかの炭化水素基を少なくとも一つ有していることが必要である。当該炭化水素基が存在しない場合、板状キャリアと金属箔表面の密着性が上昇する傾向があるからである。なお、本願発明に係るアルコキシ基には一つ以上の水素原子がハロゲン原子に置換されたアルコキシ基も含まれるものとする。 The silane compound must have at least one alkoxy group. A hydrocarbon group selected from the group consisting of an alkyl group, a cycloalkyl group, and an aryl group in the absence of an alkoxy group, or any one of these hydrocarbons in which one or more hydrogen atoms are substituted with a halogen atom When a substituent is comprised only by group, there exists a tendency for the adhesiveness of a plate-shaped carrier and metal foil surface to fall too much. The silane compound is a hydrocarbon group selected from the group consisting of an alkyl group, a cycloalkyl group, and an aryl group, or any one of these hydrocarbon groups in which one or more hydrogen atoms are substituted with a halogen atom. It is necessary to have at least one. This is because when the hydrocarbon group does not exist, the adhesion between the plate-like carrier and the metal foil surface tends to increase. The alkoxy group according to the present invention includes an alkoxy group in which one or more hydrogen atoms are substituted with halogen atoms.

 板状キャリアと金属箔の剥離強度を上述した範囲に調節する上では、当該シラン化合物はアルコキシ基を三つ、上記炭化水素基(一つ以上の水素原子がハロゲン原子で置換された炭化水素基を含む)を一つ有していることが好ましい。これを上の式でいえば、R3及びR4の両方がアルコキシ基ということになる。 In adjusting the peel strength between the plate-like carrier and the metal foil to the above-mentioned range, the silane compound has three alkoxy groups and the hydrocarbon group (a hydrocarbon group in which one or more hydrogen atoms are substituted with a halogen atom). It is preferable to have one). In terms of the above formula, both R 3 and R 4 are alkoxy groups.

 アルコキシ基としては、限定的ではないが、メトキシ基、エトキシ基、n-又はiso-プロポキシ基、n-、iso-又はtert-ブトキシ基、n-、iso-又はneo-ペントキシ基、n-ヘキソキシ基、シクロヘキシソキシ基、n-ヘプトキシ基、及びn-オクトキシ基等の直鎖状、分岐状、又は環状の炭素数1~20、好ましくは炭素数1~10、より好ましくは炭素数1~5のアルコキシ基が挙げられる。
 ハロゲン原子としては、フッ素原子、塩素原子、臭素原子およびヨウ素原子が挙げられる。
Alkoxy groups include, but are not limited to, methoxy, ethoxy, n- or iso-propoxy, n-, iso- or tert-butoxy, n-, iso- or neo-pentoxy, n-hexoxy Group, cyclohexyloxy group, n-heptoxy group, n-octoxy group and the like, straight chain, branched or cyclic carbon number of 1-20, preferably carbon number of 1-10, more preferably carbon number of 1- 5 alkoxy groups.
Examples of the halogen atom include a fluorine atom, a chlorine atom, a bromine atom, and an iodine atom.

 アルキル基としては、限定的ではないが、メチル基、エチル基、n-又はiso-プロピル基、n-、iso-又はtert-ブチル基、n-、iso-又はneo-ペンチル基、n-ヘキシル基、n-オクチル基、n-デシル基等の直鎖状又は分岐状の炭素数1~20、好ましくは炭素数1~10、より好ましくは炭素数1~5のアルキル基が挙げられる。 Examples of the alkyl group include, but are not limited to, methyl group, ethyl group, n- or iso-propyl group, n-, iso- or tert-butyl group, n-, iso- or neo-pentyl group, and n-hexyl. A linear or branched alkyl group having 1 to 20, preferably 1 to 10 carbon atoms, more preferably 1 to 5 carbon atoms, such as a group, n-octyl group and n-decyl group.

 シクロアルキル基としては、限定的ではないが、シクロプロピル基、シクロブチル基、シクロペンチル基、シクロヘキシル基、シクロへプチル基、シクロオクチル基等の炭素数3~10、好ましくは炭素数5~7のシクロアルキル基が挙げられる。 Examples of the cycloalkyl group include, but are not limited to, a cyclopropyl group, a cyclobutyl group, a cyclopentyl group, a cyclohexyl group, a cycloheptyl group, a cyclooctyl group, and the like, which have 3 to 10 carbon atoms, preferably 5 to 7 carbon atoms. An alkyl group is mentioned.

 アリール基としては、フェニル基、アルキル基で置換されたフェニル基(例:トリル基、キシリル基)、1-又は2-ナフチル基、アントリル基等の炭素数6~20、好ましくは6~14のアリール基が挙げられる。 The aryl group includes a phenyl group, a phenyl group substituted with an alkyl group (eg, tolyl group, xylyl group), 1- or 2-naphthyl group, anthryl group, etc., having 6 to 20, preferably 6 to 14 carbon atoms. An aryl group is mentioned.

 これらの炭化水素基は一つ以上の水素原子がハロゲン原子で置換されてもよく、例えば、フッ素原子、塩素原子、又は臭素原子で置換されることができる。 In these hydrocarbon groups, one or more hydrogen atoms may be substituted with a halogen atom, and may be substituted with, for example, a fluorine atom, a chlorine atom, or a bromine atom.

 好ましいシラン化合物の例としては、メチルトリメトキシシラン、エチルトリメトキシシラン、n-又はiso-プロピルトリメトキシシラン、n-、iso-又はtert-ブチルトリメトキシシラン、n-、iso-又はneo-ペンチルトリメトキシシラン、ヘキシルトリメトキシシラン、オクチルトリメトキシシラン、デシルトリメトキシシラン、フェニルトリメトキシシラン;アルキル置換フェニルトリメトキシシラン(例えば、p-(メチル)フェニルトリメトキシシラン)、メチルトリエトキシシラン、エチルトリエトキシシラン、n-又はiso-プロピルトリエトキシシラン、n-、iso-又はtert-ブチルトリエトキシシラン、ペンチルトリエトキシシラン、ヘキシルトリエトキシシラン、オクチルトリエトキシシラン、デシルトリエトキシシラン、フェニルトリエトキシシラン、アルキル置換フェニルトリエトキシシラン(例えば、p-(メチル)フェニルトリエトキシシラン)、(3,3,3-トリフルオロプロピル)トリメトキシシラン、及びトリデカフルオロオクチルトリエトキシシラン、メチルトリクロロシラン、ジメチルジクロロシラン、トリメチルクロロシラン、フェニルトリクロロシラン、トリメチルフルオロシラン、ジメチルジブロモシラン、ジフェニルジブロモシラン、これらの加水分解生成物、及びこれらの加水分解生成物の縮合体などが挙げられる。これらの中でも、入手の容易性の観点から、プロピルトリメトキシシラン、メチルトリエトキシシラン、ヘキシルトリメトキシシラン、フェニルトリエトキシシラン、デシルトリメトキシシランが好ましい。 Examples of preferred silane compounds include methyltrimethoxysilane, ethyltrimethoxysilane, n- or iso-propyltrimethoxysilane, n-, iso- or tert-butyltrimethoxysilane, n-, iso- or neo-pentyl. Trimethoxysilane, hexyltrimethoxysilane, octyltrimethoxysilane, decyltrimethoxysilane, phenyltrimethoxysilane; alkyl-substituted phenyltrimethoxysilane (eg, p- (methyl) phenyltrimethoxysilane), methyltriethoxysilane, ethyl Triethoxysilane, n- or iso-propyltriethoxysilane, n-, iso- or tert-butyltriethoxysilane, pentyltriethoxysilane, hexyltriethoxysilane, octyltriethoxy Silane, decyltriethoxysilane, phenyltriethoxysilane, alkyl-substituted phenyltriethoxysilane (eg, p- (methyl) phenyltriethoxysilane), (3,3,3-trifluoropropyl) trimethoxysilane, and trideca Fluorooctyltriethoxysilane, methyltrichlorosilane, dimethyldichlorosilane, trimethylchlorosilane, phenyltrichlorosilane, trimethylfluorosilane, dimethyldibromosilane, diphenyldibromosilane, their hydrolysis products, and condensates of these hydrolysis products Etc. Among these, propyltrimethoxysilane, methyltriethoxysilane, hexyltrimethoxysilane, phenyltriethoxysilane, and decyltrimethoxysilane are preferable from the viewpoint of availability.

 キャリア付金属箔は板状キャリアと金属箔をホットプレスで密着させて製造可能である。例えば、金属箔及び/又は板状キャリアの貼り合わせ面に必要に応じて前記シラン化合物を塗工した上で、金属箔の貼り合わせ面に対して、Bステージの樹脂製の板状キャリアをホットプレス積層することで製造可能である。 The metal foil with carrier can be manufactured by bringing a plate-like carrier and metal foil into close contact with each other by hot pressing. For example, after applying the silane compound to the bonding surface of the metal foil and / or the plate-like carrier as necessary, the B-stage resin plate-like carrier is hot to the bonding surface of the metal foil. It can be manufactured by press lamination.

 シラン化合物は水溶液の形態で使用することができる。水への溶解性を高めるためにメタノールやエタノールなどのアルコールを添加することもできる。アルコールの添加は特に疎水性の高いシラン化合物を使用するときに有効である。シラン化合物の水溶液は、撹拌することでアルコキシ基の加水分解が促進され、撹拌時間が長いと加水分解生成物の縮合が促進される。一般には、十分な撹拌時間を経て加水分解および縮合が進んだシラン化合物を用いた方が金属箔と板状キャリアの剥離強度は低下する傾向にある。従って、撹拌時間の調整によって剥離強度を調整可能である。限定的ではないが、シラン化合物を水に溶解させた後の撹拌時間としては例えば1~100時間とすることができ、典型的には1~30時間とすることができる。当然ながら、撹拌せずに用いる方法もある。 The silane compound can be used in the form of an aqueous solution. Alcohols such as methanol and ethanol can be added in order to increase the solubility in water. The addition of alcohol is particularly effective when a highly hydrophobic silane compound is used. By stirring the aqueous solution of the silane compound, hydrolysis of the alkoxy group is promoted, and when the stirring time is long, condensation of the hydrolysis product is promoted. In general, the peel strength between the metal foil and the plate carrier tends to decrease when a silane compound that has undergone hydrolysis and condensation after a sufficient stirring time has been used. Therefore, the peel strength can be adjusted by adjusting the stirring time. Although not limited, the stirring time after the silane compound is dissolved in water can be, for example, 1 to 100 hours, and typically 1 to 30 hours. Of course, there is a method of using without stirring.

 シラン化合物の水溶液中のシラン化合物の濃度は高い方が金属箔と板状キャリアの剥離強度は低下する傾向にあり、シラン化合物の濃度調整によって剥離強度を調整可能である。限定的ではないが、シラン化合物の水溶液中の濃度は0.01~10.0体積%とすることができ、典型的には0.1~5.0体積%とすることができる。 The higher the concentration of the silane compound in the aqueous solution of the silane compound, the lower the peel strength between the metal foil and the plate carrier, and the peel strength can be adjusted by adjusting the concentration of the silane compound. Although not limited, the concentration of the silane compound in the aqueous solution can be 0.01 to 10.0% by volume, and typically 0.1 to 5.0% by volume.

 シラン化合物の水溶液のpHは特に制限はなく、酸性側でもアルカリ性側でも利用できる。例えば3.0~10.0の範囲のpHで使用できる。特段のpH調整が不要であるという観点から中性付近である5.0~9.0の範囲のpHとするのが好ましく、7.0~9.0の範囲のpHとするのがより好ましい。 The pH of the aqueous solution of the silane compound is not particularly limited and can be used on either the acidic side or the alkaline side. For example, it can be used at a pH in the range of 3.0 to 10.0. From the standpoint that no special pH adjustment is required, the pH is preferably in the range of 5.0 to 9.0, which is near neutral, and more preferably in the range of 7.0 to 9.0. .

 キャリア付金属箔を製造するためのホットプレスの条件としては、板状キャリアとしてプリプレグを使用する場合、圧力30~40kg/cm2、プリプレグのガラス転移温度よりも高い温度でホットプレスすることが好ましい。 As conditions for hot pressing for producing a metal foil with a carrier, when a prepreg is used as a plate-like carrier, it is preferable to perform hot pressing at a pressure of 30 to 40 kg / cm 2 and a temperature higher than the glass transition temperature of the prepreg. .

 なお、金属箔または樹脂の表面をXPS(X線光電子分光装置)、EPMA(電子線マイクロアナライザ)、EDX(エネルギー分散型X線分析)を備えた走査電子顕微鏡等の機器で測定し、Siが検出されれば、金属箔または樹脂の表面にシラン化合物が存在すると推察することができる。 The surface of the metal foil or resin was measured with a scanning electron microscope or the like equipped with XPS (X-ray photoelectron spectrometer), EPMA (electron beam microanalyzer), EDX (energy dispersive X-ray analysis). If detected, it can be inferred that a silane compound is present on the surface of the metal foil or resin.

 さらに、別の観点から、本発明は、上述したキャリア付金属箔の用途を提供する。
 第一に、上述したキャリア付金属箔の少なくとも一つの金属箔側に対して、樹脂を積層し、次いで樹脂又は金属箔を1回以上、例えば1~10回繰り返して積層することを含む多層金属張積層板の製造方法が提供される。
Furthermore, from another viewpoint, this invention provides the use of the metal foil with a carrier mentioned above.
First, a multilayer metal comprising laminating a resin on at least one metal foil side of the above-described metal foil with carrier, and then laminating the resin or the metal foil repeatedly one or more times, for example, 1 to 10 times. A method for producing a tension laminate is provided.

 第二に、上述したキャリア付金属箔の金属箔側に樹脂を積層し、次いで樹脂、片面あるいは両面金属張積層板、または本発明のキャリア付金属箔、または金属箔を1回以上、例えば1~10回繰り返して積層することを含む多層金属張積層板の製造方法が提供される。 Second, the resin is laminated on the metal foil side of the metal foil with carrier described above, and then the resin, single-sided or double-sided metal-clad laminate, or metal foil with carrier of the present invention, or metal foil is used once or more, for example, 1 There is provided a method for producing a multilayer metal-clad laminate comprising repeatedly laminating 10 times.

 上記の多層金属張積層板の製造方法においては、前記キャリア付金属箔の板状キャリアと金属箔を剥離して分離する工程を更に含むことができる。 The above-described method for producing a multilayer metal-clad laminate can further include a step of peeling and separating the plate-like carrier and metal foil of the metal foil with carrier.

 さらに、前記板状キャリアと金属箔を剥離して分離した後、金属箔の一部または全部をエッチングにより除去する工程を更に含むことができる。 Further, the method may further include a step of removing a part or the whole of the metal foil by etching after the plate-like carrier and the metal foil are separated from each other.

 第四に、上述したキャリア付金属箔の金属箔側に樹脂を積層し、次いで樹脂、片面あるいは両面配線基板、片面あるいは両面金属張積層板、または本発明のキャリア付金属箔、または金属箔を1回以上、例えば1~10回繰り返して積層することを含むビルドアップ基板の製造方法が提供される。 Fourth, the resin is laminated on the metal foil side of the metal foil with carrier, and then the resin, single-sided or double-sided wiring board, single-sided or double-sided metal-clad laminate, or metal foil with carrier of the present invention, or metal foil. Provided is a method for manufacturing a build-up substrate, which includes repeatedly laminating at least once, for example, 1 to 10 times.

 第五に、上述したキャリア付金属箔の金属箔側に、ビルドアップ配線層を一層以上積層する工程を含むビルドアップ基板の製造方法が提供される。この際、ビルドアップ配線層はサブトラクティブ法又フルアディティブ法又はセミアディティブ法の少なくとも一つを用いて形成することができる。 Fifth, there is provided a method for manufacturing a buildup board including a step of laminating one or more buildup wiring layers on the metal foil side of the metal foil with carrier described above. At this time, the build-up wiring layer can be formed by using at least one of a subtractive method, a full additive method, and a semi-additive method.

 サブトラクティブ法とは、金属張積層板や配線基板(プリント配線板、プリント回路板を含む)上の金属箔の不要部分を、エッチングなどによって、選択的に除去して、導体パターンを形成する方法を指す。フルアディティブ法とは、導体層に金属箔を使用せず、無電解めっき又は/および電解めっきにより導体パターンを形成する方法であり、セミアディティブ法は、例えば金属箔からなるシード層上に無電解金属析出と、電解めっき、エッチング、又はその両者を併用して導体パターンを形成した後、不要なシード層をエッチングして除去することで導体パターンを得る方法である。 The subtractive method is a method of forming a conductor pattern by selectively removing unnecessary portions of metal foil on a metal-clad laminate or a wiring board (including a printed wiring board and a printed circuit board) by etching or the like. Point to. The full additive method is a method of forming a conductor pattern by electroless plating and / or electrolytic plating without using a metal foil for the conductor layer. The semi-additive method is an electroless method on a seed layer made of metal foil, for example. In this method, a conductor pattern is formed by using metal deposition and electrolytic plating, etching, or a combination thereof, and then an unnecessary seed layer is removed by etching.

 上記のビルドアップ基板の製造方法においては、片面あるいは両面配線基板、片面あるいは両面金属張積層板、キャリア付金属箔の金属箔、キャリア付金属箔の板状キャリア、又は樹脂に穴を開け、当該穴の側面および底面に導通めっきをする工程を更に含むことができる。また、前記片面あるいは両面配線基板を構成する金属箔、片面あるいは両面金属張積層板を構成する金属箔、及びキャリア付金属箔を構成する金属箔の少なくとも一つに配線を形成する工程を1回以上行うことを更に含むこともできる。 In the manufacturing method of the above build-up board, a single-sided or double-sided wiring board, a single-sided or double-sided metal-clad laminate, a metal foil with a carrier, a plate-like carrier with a metal foil with a carrier, or a resin, The method may further include conducting conductive plating on the side surface and the bottom surface of the hole. In addition, the step of forming wiring on at least one of the metal foil constituting the single-sided or double-sided wiring board, the metal foil constituting the single-sided or double-sided metal-clad laminate, and the metal foil constituting the metal foil with carrier is performed once. It can further include performing the above.

 上記のビルドアップ基板の製造方法においては、配線形成された表面の上に、片面に金属箔を密着させ、更に本発明に係るキャリア付金属箔のキャリア側を積層する工程を更に含むこともできる。また、配線形成された表面の上に、樹脂を積層し、当該樹脂に両面に金属箔を密着させた本発明に係るキャリア付金属箔を積層する工程を更に含むこともできる。
 なお、「配線形成された表面」とは、ビルドアップを行う過程で都度現れる表面に配線形成された部分を意味し、ビルドアップ基板としては最終製品のものも、その途中のものも包含する。
The manufacturing method of the build-up board may further include a step of bringing a metal foil into close contact with one surface on the surface on which the wiring is formed, and further laminating the carrier side of the metal foil with a carrier according to the present invention. . Moreover, it is possible to further include a step of laminating a metal foil with a carrier according to the present invention in which a resin is laminated on the surface on which the wiring is formed and the metal foil is adhered to both sides of the resin.
The “surface on which the wiring is formed” means a portion where wiring is formed on the surface that appears every time a buildup is performed, and the buildup substrate includes both a final product and an intermediate product.

 上記のビルドアップ基板の製造方法においては、前記キャリア付金属箔の板状キャリアと金属箔とを剥離して分離する工程を更に含むこともできる。 The manufacturing method of the build-up substrate may further include a step of peeling and separating the plate-like carrier of the metal foil with carrier and the metal foil.

 さらに、上記の板状キャリアと金属箔とを剥離して分離した後、金属箔の一部または全面をエッチングにより除去する工程を更に含むこともできる。 Furthermore, it is possible to further include a step of removing a part or the whole surface of the metal foil by etching after peeling and separating the plate-like carrier and the metal foil.

 なお、上述の多層金属張積層板の製造方法およびビルドアップ基板の製造方法において、各層同士は熱圧着を行うことにより積層させることができる。この熱圧着は、一層一層積層するごとに行ってもよいし、ある程度積層させてからまとめて行ってもよいし、最後に一度にまとめて行ってもよい。 In addition, in the manufacturing method of the above-mentioned multilayer metal-clad laminate and the manufacturing method of a buildup board, each layer can be laminated | stacked by performing thermocompression bonding. This thermocompression bonding may be performed every time one layer is stacked, may be performed after being laminated to some extent, or may be performed collectively at the end.

 以下、上述した用途の具体例として、本発明に係る樹脂板の板状キャリア11cの両面に銅箔を密着させたキャリア付銅箔11を利用したコアレスビルドアップ基板の製法を例示的に説明する。この方法では、キャリア付き銅箔11の両側にビルドアップ層16を必要数積層した後、キャリア付銅箔11から両面の銅箔を剥離する(図3参照)。 Hereinafter, as a specific example of the above-described application, a method for producing a coreless build-up board using the carrier-attached copper foil 11 in which the copper foil is adhered to both surfaces of the plate-like carrier 11c of the resin plate according to the present invention will be exemplarily described. . In this method, after the required number of buildup layers 16 are laminated on both sides of the copper foil with carrier 11, the copper foils on both sides are peeled from the copper foil with carrier 11 (see FIG. 3).

 例えば、本発明のキャリア付金属箔の金属箔側に、絶縁層としての樹脂、2層回路基板、絶縁層としての樹脂を順に重ね、その上に金属箔側が樹脂板と接触するようにして、更に本発明のキャリア付金属箔の金属箔を順に重ねることでビルドアップ基板を製造することができる。 For example, on the metal foil side of the metal foil with a carrier of the present invention, a resin as an insulating layer, a two-layer circuit board, a resin as an insulating layer are stacked in order, and the metal foil side is in contact with the resin plate on it, Furthermore, a buildup board | substrate can be manufactured by laminating | stacking the metal foil of the metal foil with a carrier of this invention in order.

 また、別の方法としては、樹脂製の板状キャリア11cの両面または片面に金属箔を密着させたキャリア付金属箔の少なくともの一つの金属箔側に対して、絶縁層としての樹脂、導体層としての金属箔を順に積層する。次に、必要に応じて金属箔の全面を、ハーフエッチングして厚みを調整する工程を含めてもよい。次に、積層した金属箔の所定位置にレーザー加工を施して金属箔と樹脂を貫通するビアホールを形成し、ビアホールの中のスミアを除去するデスミア処理を施した後、ビアホール底部、側面および金属箔の全面または一部に無電解めっきを施して層間接続を形成して、必要に応じて更に電解めっきを行う。金属箔上の無電解めっきまたは電解めっきが不要な部分にはそれぞれのめっきを行う前までに予めめっきレジストを形成おいてもよい。また、無電解めっき、電解めっき、めっきレジストと金属箔の密着性が不十分である場合には予め金属箔の表面を化学的に粗化しておいてもよい。めっきレジストを使用した場合、めっき後にめっきレジストを除去する。次に、金属箔および、無電解めっき部、電解めっき部の不要部分をエッチングにより除去することで回路を形成する。これによりビルドアップ基板が得られる。樹脂、銅箔の積層から回路形成までの工程を複数回繰り返し行ってさらに多層のビルドアップ基板としてもよい。
 さらに、このビルドアップ基板の最表面には、本発明の片面に金属箔を密着させたキャリア付金属箔の金属箔の樹脂側を接触させて積層してもよいし、一旦樹脂板を積層した後に、本発明の両面に金属箔を密着させたキャリア付金属箔の一方の金属箔を接触させて積層してもよい。
As another method, a resin or conductor layer as an insulating layer is provided on at least one metal foil side of the metal foil with a carrier in which the metal foil is adhered to both surfaces or one surface of the resinous plate-like carrier 11c. Are laminated in order. Next, if necessary, a step of half-etching the entire surface of the metal foil to adjust the thickness may be included. Next, laser processing is performed at a predetermined position of the laminated metal foil to form a via hole penetrating the metal foil and the resin, and after applying a desmear process for removing smear in the via hole, the bottom of the via hole, the side surface, and the metal foil Electroless plating is performed on the entire surface or a part of the substrate to form an interlayer connection, and further electrolytic plating is performed as necessary. A plating resist may be formed in advance on each portion of the metal foil where electroless plating or electrolytic plating is unnecessary before performing each plating. In addition, when the electroless plating, the electrolytic plating, or the adhesion between the plating resist and the metal foil is insufficient, the surface of the metal foil may be chemically roughened in advance. When a plating resist is used, the plating resist is removed after plating. Next, a circuit is formed by removing unnecessary portions of the metal foil and the electroless plating portion and the electrolytic plating portion by etching. Thereby, a build-up substrate is obtained. The steps from the lamination of the resin and the copper foil to the circuit formation may be repeated a plurality of times to form a multilayer build-up substrate.
Furthermore, on the outermost surface of this buildup substrate, the resin side of the metal foil of the metal foil with a carrier in which the metal foil is adhered to one side of the present invention may be contacted and laminated, or a resin plate is once laminated. Later, one metal foil of the metal foil with a carrier in which the metal foil is adhered to both surfaces of the present invention may be brought into contact with each other and laminated.

 ここで、ビルドアップ基板作製に用いる樹脂板としては、熱硬化性樹脂を含有するプリプレグを好適に用いることができる。 Here, a prepreg containing a thermosetting resin can be suitably used as the resin plate used for manufacturing the build-up substrate.

 また、別の方法としては、本発明の板状キャリアの片面または両面に金属箔、例えば銅箔を貼り合わせて得られる積層体の金属箔の露出表面に、絶縁層としての樹脂例えばプリプレグまたは感光性樹脂を積層する。その後、樹脂の所定位置にビアホールを形成する。樹脂として例えばプリプレグを用いる場合、ビアホールはレーザー加工により行うことができる。レーザー加工の後、このビアホールの中のスミアを除去するデスミア処理を施すとよい。また、樹脂として感光性樹脂を用いた場合、フォトリソグラフィ法によりビアホールを形成部の樹脂を除去することができる。次に、ビアホール底部、側面および樹脂の全面または一部に無電解めっきを施して層間接続を形成して、必要に応じて更に電解めっきを行う。樹脂上の無電解めっきまたは電解めっきが不要な部分にはそれぞれのめっきを行う前までに予めめっきレジストを形成おいてもよい。また、無電解めっき、電解めっき、めっきレジストと樹脂の密着性が不十分である場合には予め樹脂の表面を化学的に粗化しておいてもよい。めっきレジストを使用した場合、めっき後にめっきレジストを除去する。次に、無電解めっき部または電解めっき部の不要部分をエッチングにより除去することで回路を形成する。これによりビルドアップ基板が得られる。樹脂の積層から回路形成までの工程を複数回繰り返し行ってさらに多層のビルドアップ基板としてもよい。
 さらに、このビルドアップ基板の最表面には、本発明の片面に金属箔を密着させた積層体の樹脂側、または片面に金属箔を密着させたキャリア付金属箔の樹脂側を接触させて積層してもよいし、一旦樹脂を積層した後に、本発明の両面に金属箔を密着させた積層体の一方の金属箔、または両面に金属箔を密着させたキャリア付金属箔の一方の金属箔を接触させて積層してもよい。
As another method, a resin as an insulating layer such as a prepreg or a photosensitive layer is formed on the exposed surface of a metal foil of a laminate obtained by laminating a metal foil such as a copper foil on one or both sides of the plate carrier of the present invention. Laminating resin. Thereafter, a via hole is formed at a predetermined position of the resin. For example, when a prepreg is used as the resin, the via hole can be formed by laser processing. After the laser processing, desmear treatment for removing smear in the via hole is preferably performed. When a photosensitive resin is used as the resin, the resin in the via hole forming portion can be removed by a photolithography method. Next, electroless plating is performed on the bottom and side surfaces of the via holes, the entire surface or a part of the resin to form interlayer connections, and further electrolytic plating is performed as necessary. A plating resist may be formed in advance on each portion of the resin where electroless plating or electrolytic plating is unnecessary before performing each plating. Further, when the adhesion between electroless plating, electrolytic plating, plating resist and resin is insufficient, the surface of the resin may be chemically roughened in advance. When a plating resist is used, the plating resist is removed after plating. Next, an unnecessary portion of the electroless plating portion or the electrolytic plating portion is removed by etching to form a circuit. Thereby, a build-up substrate is obtained. The steps from resin lamination to circuit formation may be repeated a plurality of times to form a multilayered build-up substrate.
Further, the outermost surface of this build-up substrate is laminated by contacting the resin side of the laminate in which the metal foil is closely attached to one side of the present invention, or the resin side of the metal foil with a carrier having the metal foil closely attached to one side. Alternatively, after laminating the resin once, one metal foil of the laminate in which the metal foil is adhered to both surfaces of the present invention, or one metal foil of the metal foil with a carrier in which the metal foil is adhered to both surfaces May be laminated in contact with each other.

 このようにして作製されたコアレスビルドアップ基板に対しては、めっき工程及び/又はエッチング工程を経て表面に配線を形成し、更にキャリア樹脂と銅箔の間で、剥離分離させることでビルドアップ配線板が完成する。剥離分離後に金属箔の剥離面に対して、配線を形成してもよいし、金属箔全面をエッチングにより除去してビルドアップ配線板としてもよい。更に、ビルドアップ配線板に電子部品類を搭載することで、プリント回路板が完成する。また、樹脂剥離前のコアレスビルドアップ基板に直接、電子部品を搭載してもプリント回路板を得ることができる。 For the coreless build-up board manufactured in this way, the wiring is formed on the surface through the plating process and / or the etching process, and further, the build-up wiring is separated and separated between the carrier resin and the copper foil. The board is completed. Wiring may be formed on the peeling surface of the metal foil after peeling and separation, or the entire surface of the metal foil may be removed by etching to form a build-up wiring board. Furthermore, a printed circuit board is completed by mounting electronic components on the build-up wiring board. Moreover, a printed circuit board can be obtained even if an electronic component is mounted directly on a coreless buildup substrate before resin peeling.

 以下に本発明の実施例および比較例として実験例を示すが、これらの実験例は本発明及びその利点をよりよく理解するために提供するものであり、発明が限定されることを意図するものではない。 Experimental examples are shown below as examples and comparative examples of the present invention, but these experimental examples are provided for better understanding of the present invention and its advantages, and are intended to limit the invention. is not.

<実験例1>
 複数の電解銅箔(厚さ12μm)を準備し、それぞれの電解銅箔のシャイニー(S)面に対して、下記の条件によるニッケル-亜鉛(Ni-Zn)合金めっき処理およびクロメート(Cr-Znクロメート)処理を施し、貼り合わせ面(ここではS面)の十点平均粗さ(Rz jis:JIS B 0601:2001に準拠して測定)を1.5μmとした後、樹脂として三菱ガス化学株式会社製のプリプレグ(BTレジン)を当該電解銅箔のS面と貼り合わせ、190℃で100分ホットプレス加工を行って、キャリア付銅箔を作製した。
<Experimental example 1>
A plurality of electrolytic copper foils (thickness 12 μm) were prepared, and nickel-zinc (Ni—Zn) alloy plating treatment and chromate (Cr—Zn) were performed on the shiny (S) surface of each electrolytic copper foil under the following conditions. (Chromate) treatment, the ten-point average roughness (measured in accordance with JIS B 0601: 2001) of the bonded surface (here, S surface) is 1.5 μm, and the resin is Mitsubishi Gas Chemical Co., Ltd. A company-prepared prepreg (BT resin) was bonded to the S surface of the electrolytic copper foil and hot-pressed at 190 ° C. for 100 minutes to prepare a copper foil with a carrier.

 (ニッケル-亜鉛合金めっき)
  Ni濃度 17g/L(NiSO4として添加)
  Zn濃度  4g/L(ZnSO4として添加)
  pH    3.1
  液温    40℃
  電流密度  0.1~10A/dm2
  めっき時間 0.1~10秒
(Nickel-zinc alloy plating)
Ni concentration 17g / L (added as NiSO 4 )
Zn concentration 4g / L (added as ZnSO 4 )
pH 3.1
Liquid temperature 40 ℃
Current density 0.1-10A / dm 2
Plating time 0.1 to 10 seconds

 (クロメート処理)
  Cr濃度    1.4g/L(CrO3またはK2CrO7として添加)
  Zn濃度    0.01~1.0g/L(ZnSO4として添加)
  Na2SO4濃度 10g/L
  pH      4.8
  液温      55℃
  電流密度    0.1~10A/dm2
  めっき時間   0.1~10秒
(Chromate treatment)
Cr concentration 1.4g / L (added as CrO 3 or K 2 CrO 7 )
Zn concentration 0.01 to 1.0 g / L (added as ZnSO 4 )
Na 2 SO 4 concentration 10 g / L
pH 4.8
Liquid temperature 55 ℃
Current density 0.1-10A / dm 2
Plating time 0.1 to 10 seconds

 いくつかの電解銅箔については、当該S面にシラン化合物の水溶液を、スプレーコーターを用いて塗布してから、100℃の空気中で銅箔表面を乾燥させた後、プリプレグとの貼り合わせを行った。シラン化合物の使用条件について、シラン化合物の種類、シラン化合物を水中に溶解させてから塗布する前までの撹拌時間、水溶液中のシラン化合物の濃度、水溶液中のアルコール濃度、水溶液のpHを表1に示す。 For some electrolytic copper foils, an aqueous solution of a silane compound is applied to the S surface using a spray coater, and then the copper foil surface is dried in air at 100 ° C., and then bonded to a prepreg. went. Regarding the use conditions of the silane compound, Table 1 shows the type of silane compound, the stirring time from when the silane compound is dissolved in water to before application, the concentration of the silane compound in the aqueous solution, the alcohol concentration in the aqueous solution, and the pH of the aqueous solution. Show.

 また、キャリア付銅箔のうちのいくつかを、当該キャリア付胴箔を対して回路形成などのさらなる加熱処理の際に熱履歴がかかることを想定して、表1に記載の条件(ここでは、220℃で3時間)の熱処理を行った。 In addition, some of the copper foils with a carrier are subjected to the conditions described in Table 1 (here, assuming that a heat history is applied to the body foil with a carrier during further heat treatment such as circuit formation) , Heat treatment at 220 ° C. for 3 hours).

 ホットプレスにより得られたキャリア付銅箔、および更に熱処理を行った後のキャリア付銅箔における、銅箔と板状キャリア(加熱後の樹脂)との剥離強度を測定した。それぞれの結果を表1に示す。 The peel strength between the copper foil and the plate-like carrier (resin after heating) in the copper foil with carrier obtained by hot pressing and the copper foil with carrier after further heat treatment was measured. The results are shown in Table 1.

 また、剥離作業性を評価するため、それぞれ単位個数当たりの人手による作業時間(時間/個)を評価した。結果を表2に示す。 Also, in order to evaluate the peeling workability, the work time (hour / piece) by hand per unit number was evaluated. The results are shown in Table 2.

<実験例2~18>
 表1に示す銅箔、樹脂(プリプレグ)および一部はシラン化合物を用いて、実験例1と同様の手順で、キャリア付銅箔を作製した。いくつかの実験例では更に表1に示した条件の熱処理を行った。それぞれについて実験例1と同様の評価を行った。結果を表1、2に示す。
<Experimental Examples 2 to 18>
Copper foil with a carrier shown in Table 1 was prepared in the same procedure as in Experimental Example 1 using a silane compound as a copper foil and a resin (prepreg). In some experimental examples, heat treatment under the conditions shown in Table 1 was further performed. Each was evaluated in the same way as in Experimental Example 1. The results are shown in Tables 1 and 2.

 なお、銅箔の貼り合わせ面の種別、表面処理の条件および表面粗さRz jis、シラン化合物の使用条件、プリプレグの種類、ならびに銅箔とプリプレグとの積層条件は、表1に示したとおりである。 The types of copper foil bonding surfaces, surface treatment conditions and surface roughness Rz jis, silane compound usage conditions, prepreg types, and copper foil and prepreg lamination conditions are as shown in Table 1. is there.

 銅箔の処理面の表面処理条件において、エポキシシラン(処理)及び粗化処理の具体的な条件は以下である。 In the surface treatment conditions of the treated surface of the copper foil, specific conditions for epoxysilane (treatment) and roughening treatment are as follows.

 (エポキシシラン処理)
 処理液:3-グリシドキシプロピルトリメトキシシラン 0.9体積%水溶液
     pH5.0~9.0
     12時間常温で攪拌したもの
 処理方法:スプレーコーターを用いて処理液を塗布後、100℃の空気中で5分間処理面を乾燥させる。
(Epoxysilane treatment)
Treatment liquid: 3-glycidoxypropyltrimethoxysilane 0.9 volume% aqueous solution pH 5.0 to 9.0
Stirred at room temperature for 12 hours Treatment method: After applying the treatment liquid using a spray coater, the treated surface is dried in air at 100 ° C. for 5 minutes.

 (粗化処理)
  Cu濃度   20g/L(CuSO4として添加)
  H2SO4濃度 50~100g/L
  As濃度   0.01~2.0g/L(亜ヒ酸として添加)
  液温     40℃
  電流密度   40~100A/dm2
  めっき時間  0.1~30秒
(Roughening treatment)
Cu concentration 20 g / L (added as CuSO 4 )
H 2 SO 4 concentration 50 ~ 100g / L
As concentration 0.01-2.0 g / L (added as arsenite)
Liquid temperature 40 ℃
Current density 40-100A / dm 2
Plating time 0.1-30 seconds

<実験例19~20>
 表3に示す銅箔、樹脂(プリプレグ)および一部はシラン化合物を用いて、実験例1と同様の手順で、キャリア付銅箔を作製した。更に表3に示した条件の熱処理を行った。こうして得られたキャリア付銅箔について実験例1と同様の評価を行った。結果を表3、4に示す。
<Experimental Examples 19 to 20>
A copper foil with a carrier shown in Table 3 was prepared in the same procedure as in Experimental Example 1 using a silane compound as a copper foil and a resin (prepreg). Further, heat treatment was performed under the conditions shown in Table 3. Evaluation similar to Experimental example 1 was performed about the copper foil with a carrier obtained in this way. The results are shown in Tables 3 and 4.

 なお、銅箔の貼り合わせ面としてS面を用いて、その表面を上述した条件でクロメート処理した。その他、銅箔の表面粗さRz jis、プリプレグの種類、プリプレグの表面処理のためのシラン化合物の使用条件、ならびに銅箔とプリプレグとの積層条件は、表3に示したとおりである。 In addition, the S surface was used as the bonding surface of the copper foil, and the surface was chromated under the above-described conditions. In addition, the surface roughness Rz cis of the copper foil, the type of prepreg, the use conditions of the silane compound for the surface treatment of the prepreg, and the lamination conditions of the copper foil and the prepreg are as shown in Table 3.

 表によれば、シラン化合物は、銅箔の表面にて処理しても、プリプレグの表面に処理しても、その後の積層体の剥離強度、加熱後の剥離強度、剥離作業性において、同等の結果が得られたことがわかる。 According to the table, even if the silane compound is treated on the surface of the copper foil or on the surface of the prepreg, the peel strength of the laminated body, the peel strength after heating, and the workability of peeling are equivalent. It turns out that the result was obtained.

Figure JPOXMLDOC01-appb-T000004
Figure JPOXMLDOC01-appb-T000004

Figure JPOXMLDOC01-appb-T000005
Figure JPOXMLDOC01-appb-T000005

Figure JPOXMLDOC01-appb-T000006
Figure JPOXMLDOC01-appb-T000006

Figure JPOXMLDOC01-appb-T000007
Figure JPOXMLDOC01-appb-T000007

Figure JPOXMLDOC01-appb-T000008
Figure JPOXMLDOC01-appb-T000008

Figure JPOXMLDOC01-appb-T000009
Figure JPOXMLDOC01-appb-T000009

Figure JPOXMLDOC01-appb-T000010
Figure JPOXMLDOC01-appb-T000010

Figure JPOXMLDOC01-appb-T000011
Figure JPOXMLDOC01-appb-T000011

Figure JPOXMLDOC01-appb-T000012
Figure JPOXMLDOC01-appb-T000012

Figure JPOXMLDOC01-appb-T000013
Figure JPOXMLDOC01-appb-T000013

(ビルドアップ配線板)
 このようにして作製したキャリア付銅箔の両側に、FR-4プリプレグ(南亜プラスティック社製)、銅箔(JX日鉱日石金属(株)製、JTC12μm(製品名))を順に重ね、3MPaの圧力で各表に示した加熱条件にてホットプレスを行い、4層銅張積層板を作製した。
(Build-up wiring board)
FR-4 prepreg (manufactured by Nanya Plastic Co., Ltd.) and copper foil (manufactured by JX Nippon Mining & Metals Co., Ltd., JTC 12 μm (product name)) are sequentially stacked on both sides of the copper foil with a carrier thus produced. A four-layer copper clad laminate was produced by hot pressing under the heating conditions shown in each table under the pressure of.

 次に、前記4層銅張積層板表面の銅箔とその下の絶縁層(硬化したプリプレグ)を貫通する直径100μmの孔をレーザー加工機を用いて空けた。続いて、前記孔の底部に露出したキャリア付き銅箔上の銅箔表面と、前記孔の側面、前記4層銅張積層板表面の銅箔上に無電解銅めっき、電気銅めっきにより銅めっきを行い、キャリア付銅箔上の銅箔と、4層銅張積層板表面の銅箔との間に電気的接続を形成した。次に、4層銅張積層板表面の銅箔の一部を塩化第二鉄系のエッチング液を用いてエッチングし、回路を形成した。このようにして、4層ビルドアップ基板を得た。 Next, a 100 μm diameter hole penetrating the copper foil on the surface of the four-layer copper-clad laminate and the insulating layer (cured prepreg) thereunder was drilled using a laser processing machine. Subsequently, electroless copper plating on the copper foil surface on the copper foil with carrier exposed at the bottom of the hole, the side surface of the hole, and the copper foil on the surface of the four-layer copper-clad laminate, and copper plating by electrolytic copper plating The electrical connection was formed between the copper foil on the copper foil with a carrier and the copper foil on the surface of the four-layer copper-clad laminate. Next, a part of the copper foil on the surface of the four-layer copper-clad laminate was etched using a ferric chloride-based etchant to form a circuit. In this way, a four-layer buildup substrate was obtained.

 続いて、前記4層ビルドアップ基板において、前記キャリア付銅箔の板状キャリアと銅箔とを剥離して分離することにより、2組の2層ビルドアップ配線板を得た。 Subsequently, in the 4-layer build-up board, the two-layer build-up wiring boards were obtained by peeling off and separating the plate-like carrier of the copper foil with carrier and the copper foil.

 続いて、前記の2組の2層ビルドアップ配線板上の、板状キャリアと密着していた方の銅箔をエッチングし配線を形成して、2組の2層ビルドアップ配線板を得た。 Subsequently, the copper foil that was in close contact with the plate-like carrier on the two sets of two-layer build-up wiring boards was etched to form a wiring to obtain two sets of two-layer build-up wiring boards. .

 各実験例とも複数の4層ビルドアップ基板を作製し、それぞれについて、ビルドアップ基板製作工程におけるキャリア付銅箔を構成するプリプレグと銅箔との密着具合を目視にて確認したところ、表1、表3において剥離強度および加熱後の剥離強度が「S」および「G」と評価された条件にて作製したキャリア付銅箔を用いたビルドアップ配線板では、ビルドアップに際してキャリア付銅箔の樹脂(板状キャリア)が破壊されずに剥離できた。ただし、「G」と評価された条件については、表1、3でも記されているようにビルドアップに際して剥離操作なしで銅箔が板状キャリアから剥がれるものもあった。
 また、「N」と評価された条件については、ビルドアップに際してキャリア付銅箔における銅箔の剥離操作のときに樹脂が破壊されたか、あるいは剥がれず銅箔表面に樹脂が残った。
 また、「-」と評価された条件については、ビルドアップに際してキャリア付銅箔における銅箔の剥離操作のときに樹脂が破壊されることなく剥がれたが、中には剥離操作なしで銅箔が剥がれることがあった。
In each experimental example, a plurality of four-layer build-up substrates were prepared, and for each, the degree of adhesion between the prepreg and the copper foil constituting the copper foil with carrier in the build-up substrate manufacturing process was confirmed visually. In the build-up wiring board using the copper foil with a carrier produced under the conditions where the peel strength and the peel strength after heating are evaluated as “S” and “G” in Table 3, the resin of the copper foil with the carrier at the time of build-up The (plate-like carrier) could be peeled without being destroyed. However, with respect to the conditions evaluated as “G”, as described in Tables 1 and 3, there were some cases where the copper foil was peeled off from the plate-shaped carrier without a peeling operation during build-up.
As for the condition evaluated as “N”, the resin was destroyed at the time of build-up during the peeling operation of the copper foil in the carrier-attached copper foil, or the resin remained on the copper foil surface without being peeled off.
As for the conditions evaluated as “-”, the resin was peeled off without being destroyed during the copper foil peeling operation in the carrier-added copper foil during build-up, but the copper foil was removed without peeling operation. Sometimes peeled off.

11  キャリア付き金属箔
11a 金属箔
11b シラン化合物
11c 板状キャリア
16  ビルドアップ層
11 Metal foil 11a with carrier 11a Metal foil 11b Silane compound 11c Plate carrier 16 Build-up layer

Claims (25)

 樹脂製の板状キャリアと、該キャリアの少なくとも一方の面に、剥離可能に密着させた金属箔からなるキャリア付金属箔であって、220℃で3時間、6時間または9時間のうちの少なくとも一つの加熱後における、金属箔と板状キャリアとの剥離強度が、10gf/cm以上200gf/cm以下であるキャリア付金属箔。 A metal foil with a carrier made of a resin-made plate-like carrier and a metal foil that is releasably adhered to at least one surface of the carrier, and is at 220 ° C. for 3 hours, 6 hours, or 9 hours. The metal foil with a carrier whose peeling strength of metal foil and a plate-shaped carrier after one heating is 10 gf / cm or more and 200 gf / cm or less.  樹脂製の板状キャリアが熱硬化性樹脂を含む請求項1に記載のキャリア付金属箔。 The metal foil with a carrier according to claim 1, wherein the resinous plate-like carrier contains a thermosetting resin.  前記樹脂製の板状キャリアは、プリプレグである請求項1または2に記載のキャリア付金属箔。 The metal foil with a carrier according to claim 1 or 2, wherein the resinous plate-like carrier is a prepreg.  前記樹脂製の板状キャリアは、120~320℃のガラス転移温度Tgを有する請求項2または3に記載のキャリア付金属箔。 The metal foil with a carrier according to claim 2 or 3, wherein the resin plate carrier has a glass transition temperature Tg of 120 to 320 ° C.  前記金属箔の前記キャリアと接する側表面の十点平均粗さ(Rz jis)が、3.5μm以下である請求項1~4のいずれか1項に記載のキャリア付金属箔。 The metal foil with a carrier according to any one of claims 1 to 4, wherein a ten-point average roughness (Rz cis) of a side surface in contact with the carrier of the metal foil is 3.5 µm or less.  前記加熱前における前記金属箔と前記板状キャリアとの剥離強度が、10gf/cm以上200gf/cm以下である請求項1~5のいずれか1項に記載のキャリア付金属箔。 The metal foil with a carrier according to any one of claims 1 to 5, wherein a peel strength between the metal foil and the plate-like carrier before the heating is 10 gf / cm or more and 200 gf / cm or less.  キャリア付き金属箔を構成する板状キャリアと金属箔は次式:
Figure JPOXMLDOC01-appb-C000001
(式中、R1はアルコキシ基またはハロゲン原子であり、R2はアルキル基、シクロアルキル基及びアリール基よりなる群から選択される炭化水素基であるか、一つ以上の水素原子がハロゲン原子で置換されたこれら何れかの炭化水素基であり、R3及びR4はそれぞれ独立にハロゲン原子、またはアルコキシ基、またはアルキル基、シクロアルキル基及びアリール基よりなる群から選択される炭化水素基であるか、一つ以上の水素原子がハロゲン原子で置換されたこれら何れかの炭化水素基である。)
に示すシラン化合物、その加水分解生成物、該加水分解生成物の縮合体を単独で又は複数組み合わせて用いて貼り合わせてなる請求項1~6のいずれか一項に記載のキャリア付金属箔。
The plate-like carrier and metal foil that make up the metal foil with the carrier have the following formula:
Figure JPOXMLDOC01-appb-C000001
Wherein R 1 is an alkoxy group or a halogen atom, and R 2 is a hydrocarbon group selected from the group consisting of an alkyl group, a cycloalkyl group and an aryl group, or one or more hydrogen atoms are halogen atoms Any one of these hydrocarbon groups substituted by R 3 and R 4 are each independently a halogen atom, an alkoxy group, or a hydrocarbon group selected from the group consisting of an alkyl group, a cycloalkyl group, and an aryl group Or any one of these hydrocarbon groups in which one or more hydrogen atoms are replaced by halogen atoms.)
The metal foil with a carrier according to any one of claims 1 to 6, wherein the silane compound, a hydrolysis product thereof, and a condensate of the hydrolysis product shown in the above are bonded together using a single compound or a combination of plural compounds.
 請求項1~7のいずれか一項に記載のキャリア付金属箔の少なくとも一つの金属箔側に対して、樹脂を積層し、次いで樹脂又は金属箔を1回以上繰り返して積層することを含む多層金属張積層板の製造方法。 A multilayer comprising laminating a resin on at least one metal foil side of the metal foil with a carrier according to any one of claims 1 to 7, and then laminating the resin or the metal foil repeatedly one or more times. A method for producing a metal-clad laminate.  請求項1~7のいずれか一項に記載のキャリア付金属箔の少なくとも一つの金属箔側に樹脂を積層し、次いで樹脂、片面あるいは両面金属張積層板、または請求項1~7のいずれか一項に記載のキャリア付金属箔、または金属箔を1回以上繰り返して積層することを含む多層金属張積層板の製造方法。 A resin is laminated on at least one metal foil side of the metal foil with a carrier according to any one of claims 1 to 7, and then a resin, a single-sided or double-sided metal-clad laminate, or any one of claims 1 to 7 A method for producing a multilayer metal-clad laminate comprising laminating a metal foil with a carrier according to one item or the metal foil repeatedly at least once.  請求項8または9に記載の多層金属張積層板の製造方法において、前記キャリア付金属箔の板状キャリアと金属箔とを剥離して分離する工程を更に含む多層金属張積層板の製造方法。 10. The method for producing a multilayer metal-clad laminate according to claim 8 or 9, further comprising a step of peeling and separating the plate-like carrier and metal foil of the metal foil with carrier.  請求項10に記載の製造方法において、剥離して分離した金属箔の一部または全部をエッチングにより除去する工程を含む多層金属張積層板の製造方法。 11. The method for producing a multilayer metal-clad laminate according to claim 10, comprising a step of removing a part or all of the separated and separated metal foil by etching.  請求項8~11のいずれか一項に記載の製造方法により得られる多層金属張積層板。 A multilayer metal-clad laminate obtained by the production method according to any one of claims 8 to 11.  請求項1~7のいずれか一項に記載のキャリア付金属箔の少なくとも一つの金属箔側に、ビルドアップ配線層を一層以上形成する工程を含むビルドアップ基板の製造方法。 A method for manufacturing a buildup substrate, comprising a step of forming one or more buildup wiring layers on at least one metal foil side of the metal foil with a carrier according to any one of claims 1 to 7.  ビルドアップ配線層はサブトラクティブ法又はフルアディティブ法又はセミアディティブ法の少なくとも一つを用いて形成される請求項13に記載のビルドアップ基板の製造方法。 The buildup wiring layer according to claim 13, wherein the buildup wiring layer is formed using at least one of a subtractive method, a full additive method, and a semiadditive method.  請求項1~7のいずれか一項に記載のキャリア付き金属箔の少なくとも一つの金属箔側に樹脂を積層し、次いで樹脂、片面あるいは両面配線基板、片面あるいは両面金属張積層板、請求項1~7のいずれか一項に記載のキャリア付金属箔又は金属箔を1回以上繰り返して積層することを含むビルドアップ基板の製造方法。 A resin is laminated on at least one metal foil side of the metal foil with a carrier according to any one of claims 1 to 7, and then a resin, a single-sided or double-sided wiring board, a single-sided or double-sided metal-clad laminate, A method for producing a build-up substrate, comprising: laminating the metal foil with a carrier according to any one of 7 to 7 or the metal foil repeatedly one or more times.  請求項15に記載のビルドアップ基板の製造方法において、片面あるいは両面配線基板、片面あるいは両面金属張積層板、キャリア付金属箔の金属箔、キャリア付金属箔の板状キャリア、又は樹脂に穴を開け、当該穴の側面および底面に導通めっきをする工程を更に含むビルドアップ基板の製造方法。 In the manufacturing method of the buildup board | substrate of Claim 15, a hole is provided in the single-sided or double-sided wiring board, the single-sided or double-sided metal-clad laminate, the metal foil of the metal foil with carrier, the plate-like carrier of the metal foil with carrier, or the resin. A method for manufacturing a build-up substrate, further comprising the steps of opening and conducting conductive plating on the side surface and bottom surface of the hole.  請求項15または16に記載のビルドアップ基板の製造方法において、前記片面あるいは両面配線基板を構成する金属箔、片面あるいは両面金属張積層板を構成する金属箔、及びキャリア付金属箔を構成する金属箔の少なくとも一つに配線を形成する工程を1回以上行うことを更に含むビルドアップ基板の製造方法。 The method for manufacturing a buildup board according to claim 15 or 16, wherein the metal foil constituting the single-sided or double-sided wiring board, the metal foil constituting the single-sided or double-sided metal-clad laminate, and the metal constituting the metal foil with carrier A method for manufacturing a build-up substrate, further comprising performing the step of forming a wiring on at least one of the foils once or more.  配線形成された表面の上に、片面に金属箔を密着させた請求項1~7の何れか一項に記載のキャリア付金属箔の樹脂板側を接触させて積層する工程を含む請求項15~17のいずれか一項に記載のビルドアップ基板の製造方法。 The step of contacting and laminating the resin plate side of the metal foil with carrier according to any one of claims 1 to 7, wherein the metal foil is adhered to one surface on the surface on which the wiring is formed. 18. The method for manufacturing a buildup substrate according to any one of items 1 to 17.  配線形成された表面の上に、樹脂を積層し、当該樹脂に両面に金属箔を密着させた請求項1~7の何れか一項に記載のキャリア付金属箔の一方の金属箔を接触させて積層する工程を更に含む請求項15~17のいずれか一項に記載のビルドアップ基板の製造方法。 The metal foil with a carrier according to any one of claims 1 to 7, wherein a resin is laminated on the surface on which the wiring is formed, and the metal foil is adhered to both sides of the resin. The method for manufacturing a build-up substrate according to any one of claims 15 to 17, further comprising a step of laminating the layers.  前記樹脂の少なくとも一つがプリプレグであることを特徴とする請求項15~19のいずれか一項に記載のビルドアップ基板の製造方法。 The method for manufacturing a buildup substrate according to any one of claims 15 to 19, wherein at least one of the resins is a prepreg.  請求項13~20のいずれか一項に記載のビルドアップ基板の製造方法において、前記キャリア付金属箔の板状キャリアと金属箔とを剥離して分離する工程を更に含むビルドアップ配線板の製造方法。 The build-up wiring board manufacturing method according to any one of claims 13 to 20, further comprising a step of peeling and separating the plate-like carrier and the metal foil of the metal foil with carrier. Method.  請求項21に記載のビルドアップ配線板の製造方法において、板状キャリアと密着していた金属箔の一部または全部をエッチングにより除去する工程を更に含むビルドアップ配線板の製造方法。 22. The method for manufacturing a buildup wiring board according to claim 21, further comprising a step of removing a part or all of the metal foil adhered to the plate carrier by etching.  請求項21または22に記載の製造方法により得られるビルドアップ配線板。 A build-up wiring board obtained by the manufacturing method according to claim 21 or 22.  請求項13~20のいずれか一項に記載の製造方法によりビルドアップ基板を製造する工程を含むプリント回路板の製造方法。 A method for manufacturing a printed circuit board, comprising a step of manufacturing a build-up substrate by the manufacturing method according to any one of claims 13 to 20.  請求項21または22に記載の製造方法によりビルドアップ配線板を製造する工程を含むプリント回路板の製造方法。 A method for producing a printed circuit board, comprising a step of producing a build-up wiring board by the production method according to claim 21 or 22.
PCT/JP2013/065408 2012-06-04 2013-06-03 Carrier-attached metal foil Ceased WO2013183607A1 (en)

Priority Applications (5)

Application Number Priority Date Filing Date Title
JP2014519990A JP6013475B2 (en) 2012-06-04 2013-06-03 Metal foil with carrier
KR20147037142A KR20150024359A (en) 2012-06-04 2013-06-03 Carrier-attached metal foil
CN201380029144.3A CN104334345B (en) 2012-06-04 2013-06-03 Appendix body metal forming
KR1020177007803A KR20170034947A (en) 2012-06-04 2013-06-03 Carrier-attached metal foil
KR1020197023954A KR20190099096A (en) 2012-06-04 2013-06-03 Carrier-attached metal foil

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2012127566 2012-06-04
JP2012-127566 2012-06-04

Publications (1)

Publication Number Publication Date
WO2013183607A1 true WO2013183607A1 (en) 2013-12-12

Family

ID=49711999

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2013/065408 Ceased WO2013183607A1 (en) 2012-06-04 2013-06-03 Carrier-attached metal foil

Country Status (4)

Country Link
JP (1) JP6013475B2 (en)
KR (3) KR20170034947A (en)
TW (1) TWI565371B (en)
WO (1) WO2013183607A1 (en)

Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104943255A (en) * 2014-03-25 2015-09-30 Jx日矿日石金属株式会社 Surface-treated copper foil, copper-clad laminate, printed wiring board, electronic device, semiconductor package, and manufacturing method of printed wiring board
JP2015212426A (en) * 2015-08-11 2015-11-26 Jx日鉱日石金属株式会社 Surface-treated copper foil, copper-clad laminate sheet, printed wiring board, electronic apparatus, semiconductor package, production method of printed wiring board, production method of resin substrate, method of transferring surface profile of copper foil to resin substrate and resin substrate
JPWO2013183604A1 (en) * 2012-06-04 2016-02-01 Jx日鉱日石金属株式会社 Manufacturing method of multilayer printed wiring board
JPWO2013183605A1 (en) * 2012-06-04 2016-02-01 Jx日鉱日石金属株式会社 Metal foil with carrier
JPWO2013183606A1 (en) * 2012-06-04 2016-02-01 Jx日鉱日石金属株式会社 Metal foil with carrier
JP2016135924A (en) * 2016-02-29 2016-07-28 Jx金属株式会社 Surface-treated copper foil, copper-clad laminate, method for producing printed wiring board, method for producing semiconductor package and method for producing electronic apparatus
WO2017022807A1 (en) * 2015-08-03 2017-02-09 Jx金属株式会社 Printed wiring board production method, surface-treated copper foil, laminate, printed wiring board, semiconductor package, and electronic device
JP2017034216A (en) * 2015-08-03 2017-02-09 Jx金属株式会社 Printed wiring board manufacturing method, surface-treated copper foil, laminate, printed wiring board, semiconductor package, and electronic device
WO2017051897A1 (en) * 2015-09-24 2017-03-30 Jx金属株式会社 Metal foil, metal foil with mold release layer, laminate, printed wiring board, semiconductor package, electronic device and method for producing printed wiring board

Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003069173A (en) * 2001-08-27 2003-03-07 Nikko Materials Co Ltd Copper foil with water-soluble resin carrier and printed circuit board using the copper foil
WO2007135972A1 (en) * 2006-05-19 2007-11-29 Mitsui Mining & Smelting Co., Ltd. Copper foil provided with carrier sheet, method for fabricating copper foil provided with carrier sheet, surface-treated copper foil provided with carrier sheet, and copper-clad laminate using the surface-treated copper foil provided with carrier sheet
WO2008146448A1 (en) * 2007-05-23 2008-12-04 Unitika Ltd. Peelable laminate and method for producing the same
WO2009119046A1 (en) * 2008-03-26 2009-10-01 住友ベークライト株式会社 Resin sheet with copper foil, multilayer printed wiring board, method for manufacturing multilayer printed wiring board and semiconductor device
JP2009272589A (en) * 2008-05-12 2009-11-19 Nippon Mining & Metals Co Ltd Metal foil with carrier
JP5204908B1 (en) * 2012-03-26 2013-06-05 Jx日鉱日石金属株式会社 Copper foil with carrier, method for producing copper foil with carrier, copper foil with carrier for printed wiring board and printed wiring board
JP2013140856A (en) * 2011-12-28 2013-07-18 Jx Nippon Mining & Metals Corp Metal foil with carrier

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007055165A (en) * 2005-08-26 2007-03-08 Shin Etsu Chem Co Ltd Flexible copper clad laminate and manufacturing method thereof
JP4334005B2 (en) * 2005-12-07 2009-09-16 新光電気工業株式会社 Wiring board manufacturing method and electronic component mounting structure manufacturing method
JP4754402B2 (en) * 2006-05-17 2011-08-24 三井金属鉱業株式会社 Copper foil with carrier foil, method for producing copper foil with carrier foil, surface-treated copper foil with carrier foil, and copper-clad laminate using the surface-treated copper foil with carrier foil
EP2039716B1 (en) * 2006-07-07 2012-02-22 Mitsubishi Gas Chemical Company, Inc. Polyimide resin
KR101530868B1 (en) * 2007-09-11 2015-06-23 아지노모토 가부시키가이샤 Process for producing multilayer printed wiring board
JP4973519B2 (en) * 2008-01-18 2012-07-11 住友ベークライト株式会社 LAMINATED BOARD, LAMINATED MANUFACTURING METHOD, MULTILAYER PRINTED WIRING BOARD AND SEMICONDUCTOR DEVICE
JP4927963B2 (en) * 2010-01-22 2012-05-09 古河電気工業株式会社 Surface-treated copper foil, method for producing the same, and copper-clad laminate
KR20170086691A (en) * 2012-06-04 2017-07-26 제이엑스금속주식회사 Carrier-attached metal foil
CN104335688B (en) * 2012-06-04 2018-02-09 Jx日矿日石金属株式会社 The manufacture method of multi-layer printed circuit board
CN104334346B (en) * 2012-06-04 2017-05-03 Jx日矿日石金属株式会社 Carrier-attached metal foil

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003069173A (en) * 2001-08-27 2003-03-07 Nikko Materials Co Ltd Copper foil with water-soluble resin carrier and printed circuit board using the copper foil
WO2007135972A1 (en) * 2006-05-19 2007-11-29 Mitsui Mining & Smelting Co., Ltd. Copper foil provided with carrier sheet, method for fabricating copper foil provided with carrier sheet, surface-treated copper foil provided with carrier sheet, and copper-clad laminate using the surface-treated copper foil provided with carrier sheet
WO2008146448A1 (en) * 2007-05-23 2008-12-04 Unitika Ltd. Peelable laminate and method for producing the same
WO2009119046A1 (en) * 2008-03-26 2009-10-01 住友ベークライト株式会社 Resin sheet with copper foil, multilayer printed wiring board, method for manufacturing multilayer printed wiring board and semiconductor device
JP2009272589A (en) * 2008-05-12 2009-11-19 Nippon Mining & Metals Co Ltd Metal foil with carrier
JP2013140856A (en) * 2011-12-28 2013-07-18 Jx Nippon Mining & Metals Corp Metal foil with carrier
JP5204908B1 (en) * 2012-03-26 2013-06-05 Jx日鉱日石金属株式会社 Copper foil with carrier, method for producing copper foil with carrier, copper foil with carrier for printed wiring board and printed wiring board

Cited By (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPWO2013183604A1 (en) * 2012-06-04 2016-02-01 Jx日鉱日石金属株式会社 Manufacturing method of multilayer printed wiring board
JPWO2013183605A1 (en) * 2012-06-04 2016-02-01 Jx日鉱日石金属株式会社 Metal foil with carrier
JPWO2013183606A1 (en) * 2012-06-04 2016-02-01 Jx日鉱日石金属株式会社 Metal foil with carrier
TWI610599B (en) * 2014-03-25 2018-01-01 Jx Nippon Mining & Metals Corp Surface-treated copper foil, copper-clad laminate, printed wiring board, electronic device, circuit-formed substrate for semiconductor package, semiconductor package, and printed wiring board manufacturing method
JP2015183240A (en) * 2014-03-25 2015-10-22 Jx日鉱日石金属株式会社 Surface-treated copper foil, copper-clad laminate, print circuit board, electronic apparatus, circuit forming base plate for semiconductor package, semiconductor package, and method for manufacturing print circuit board
KR101902128B1 (en) * 2014-03-25 2018-09-27 제이엑스금속주식회사 Surface-treated copper foil, copper clad laminate, printed wiring board, electronic device, circuit formation substrate for semiconductor package, semicondeuctor package and process of producing printed wiring board
CN104943255A (en) * 2014-03-25 2015-09-30 Jx日矿日石金属株式会社 Surface-treated copper foil, copper-clad laminate, printed wiring board, electronic device, semiconductor package, and manufacturing method of printed wiring board
WO2017022807A1 (en) * 2015-08-03 2017-02-09 Jx金属株式会社 Printed wiring board production method, surface-treated copper foil, laminate, printed wiring board, semiconductor package, and electronic device
JP2017034216A (en) * 2015-08-03 2017-02-09 Jx金属株式会社 Printed wiring board manufacturing method, surface-treated copper foil, laminate, printed wiring board, semiconductor package, and electronic device
JP2015212426A (en) * 2015-08-11 2015-11-26 Jx日鉱日石金属株式会社 Surface-treated copper foil, copper-clad laminate sheet, printed wiring board, electronic apparatus, semiconductor package, production method of printed wiring board, production method of resin substrate, method of transferring surface profile of copper foil to resin substrate and resin substrate
WO2017051897A1 (en) * 2015-09-24 2017-03-30 Jx金属株式会社 Metal foil, metal foil with mold release layer, laminate, printed wiring board, semiconductor package, electronic device and method for producing printed wiring board
JPWO2017051897A1 (en) * 2015-09-24 2018-08-30 Jx金属株式会社 Metal foil, metal foil with release layer, laminate, printed wiring board, semiconductor package, electronic device and method for manufacturing printed wiring board
JP2016135924A (en) * 2016-02-29 2016-07-28 Jx金属株式会社 Surface-treated copper foil, copper-clad laminate, method for producing printed wiring board, method for producing semiconductor package and method for producing electronic apparatus

Also Published As

Publication number Publication date
CN104334345A (en) 2015-02-04
KR20170034947A (en) 2017-03-29
KR20190099096A (en) 2019-08-23
TWI565371B (en) 2017-01-01
KR20150024359A (en) 2015-03-06
TW201414365A (en) 2014-04-01
JP6013475B2 (en) 2016-10-25
JPWO2013183607A1 (en) 2016-02-01

Similar Documents

Publication Publication Date Title
JP6276371B2 (en) Manufacturing method of multilayer printed wiring board
JP6013475B2 (en) Metal foil with carrier
JP6687765B2 (en) Metal foil with carrier
JP6013474B2 (en) Metal foil with carrier
WO2014024878A1 (en) Metal foil with carrier
WO2014046256A1 (en) Metallic foil having carrier
JP6104261B2 (en) Metal foil with carrier
JP6327840B2 (en) Resin composition comprising a thermosetting resin and a release agent
CN104334345B (en) Appendix body metal forming

Legal Events

Date Code Title Description
121 Ep: the epo has been informed by wipo that ep was designated in this application

Ref document number: 13799941

Country of ref document: EP

Kind code of ref document: A1

ENP Entry into the national phase

Ref document number: 2014519990

Country of ref document: JP

Kind code of ref document: A

NENP Non-entry into the national phase

Ref country code: DE

ENP Entry into the national phase

Ref document number: 20147037142

Country of ref document: KR

Kind code of ref document: A

122 Ep: pct application non-entry in european phase

Ref document number: 13799941

Country of ref document: EP

Kind code of ref document: A1