WO2013161645A1 - 熱電変換材料及びその製造方法 - Google Patents
熱電変換材料及びその製造方法 Download PDFInfo
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- WO2013161645A1 WO2013161645A1 PCT/JP2013/061416 JP2013061416W WO2013161645A1 WO 2013161645 A1 WO2013161645 A1 WO 2013161645A1 JP 2013061416 W JP2013061416 W JP 2013061416W WO 2013161645 A1 WO2013161645 A1 WO 2013161645A1
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- conversion material
- thermoelectric conversion
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N10/00—Thermoelectric devices comprising a junction of dissimilar materials, i.e. devices exhibiting Seebeck or Peltier effects
- H10N10/80—Constructional details
- H10N10/85—Thermoelectric active materials
- H10N10/851—Thermoelectric active materials comprising inorganic compositions
- H10N10/852—Thermoelectric active materials comprising inorganic compositions comprising tellurium, selenium or sulfur
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N10/00—Thermoelectric devices comprising a junction of dissimilar materials, i.e. devices exhibiting Seebeck or Peltier effects
- H10N10/80—Constructional details
- H10N10/81—Structural details of the junction
- H10N10/817—Structural details of the junction the junction being non-separable, e.g. being cemented, sintered or soldered
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N10/00—Thermoelectric devices comprising a junction of dissimilar materials, i.e. devices exhibiting Seebeck or Peltier effects
- H10N10/80—Constructional details
- H10N10/85—Thermoelectric active materials
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
- B29C—SHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
- B29C39/00—Shaping by casting, i.e. introducing the moulding material into a mould or between confining surfaces without significant moulding pressure; Apparatus therefor
- B29C39/02—Shaping by casting, i.e. introducing the moulding material into a mould or between confining surfaces without significant moulding pressure; Apparatus therefor for making articles of definite length, i.e. discrete articles
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N10/00—Thermoelectric devices comprising a junction of dissimilar materials, i.e. devices exhibiting Seebeck or Peltier effects
- H10N10/01—Manufacture or treatment
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N10/00—Thermoelectric devices comprising a junction of dissimilar materials, i.e. devices exhibiting Seebeck or Peltier effects
- H10N10/10—Thermoelectric devices comprising a junction of dissimilar materials, i.e. devices exhibiting Seebeck or Peltier effects operating with only the Peltier or Seebeck effects
- H10N10/17—Thermoelectric devices comprising a junction of dissimilar materials, i.e. devices exhibiting Seebeck or Peltier effects operating with only the Peltier or Seebeck effects characterised by the structure or configuration of the cell or thermocouple forming the device
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
Definitions
- the present invention relates to a thermoelectric conversion material that performs mutual energy conversion between heat and electricity, and more particularly, to a thermoelectric conversion material having a high thermoelectric performance index using a resin substrate and a method for manufacturing the same.
- thermoelectric power generation technology that has a simple system and can be reduced in size has attracted attention as a recovery power generation technology for unused waste heat energy generated from fossil fuel resources used in buildings, factories, and the like.
- thermoelectric power generation generally has poor power generation efficiency, and various companies and research institutions are actively researching and developing power generation efficiency.
- it is essential to improve the efficiency of thermoelectric conversion materials. To achieve these, development of materials with high electrical conductivity similar to metal and low thermal conductivity comparable to glass is desired. It is rare.
- S is a Seebeck coefficient
- ⁇ electrical conductivity (reciprocal of resistivity)
- ⁇ thermal conductivity.
- thermoelectric figure of merit has not been improved significantly.
- Patent Document 1 introduces a number of very fine vacancies dispersed in the semiconductor material at intervals equal to or less than the mean free path of electrons and phonons to make it porous. Thermoelectric conversion materials with reduced thermal conductivity and increased Seebeck coefficient have been proposed.
- Patent Document 1 although the thermal conductivity is reduced, the electrical conductivity is also reduced (the resistivity is greatly increased), and the dimensionless thermoelectric figure of merit ZT (T: calculated as an absolute temperature of 300K) is obtained. Increased from 0.017 to 0.156 due to porosity, but the absolute value was far from ZT ⁇ 1, which is an index value for practical use.
- Patent Document 2 discloses that the thermoelectric conversion material is improved by nanoimprinting to produce a thin thermoelectric conversion material. However, the decrease in thermal conductivity is small and sufficient performance is achieved. Was not obtained.
- an object of the present invention is to provide a thermoelectric conversion material having a reduced thermal conductivity and an improved thermoelectric performance index, and a method for producing the same.
- the present inventors have made a curable resin as the resin substrate in a thermoelectric conversion material in which a thermoelectric semiconductor layer made of a thermoelectric semiconductor material is formed on a resin substrate having a recess.
- the inventors have found that the thermoelectric figure of merit is improved by using a composition, for example, a cured resin layer made of an energy beam curable resin composition, and completed the present invention. That is, the present invention provides the following (1) to (15).
- the resin substrate is formed by curing a resin layer made of a curable resin composition.
- Thermoelectric conversion material (2) The thermoelectric conversion material according to (1), wherein the curable resin composition is an energy ray curable resin composition. (3) The said resin substrate is obtained by making it harden
- thermoelectric conversion material The thermoelectric conversion material according to any one of (1) to (5), wherein the resin substrate has a thickness of 1 to 100 ⁇ m. (7) The thermoelectric conversion material according to any one of (1) to (6), wherein the resin substrate has a large number of independent recesses. (8) The thermoelectric conversion material according to any one of (1) to (7), wherein the shape of the recess is a columnar shape or a groove shape.
- thermoelectric conversion material according to (8), wherein the depth of the recess is 5 to 10,000 nm, the diameter or groove width of the recess is 10 to 5000 nm, and the distance between the centers of adjacent recesses is 15 to 5500 nm.
- the thermoelectric semiconductor layer is present on the upper surface of the resin substrate, and the inner bottom portion of the recess and the upper surface maintain insulation.
- the thermoelectric conversion material in any one.
- (11) The thermoelectric conversion material according to any one of (1) to (10) above, wherein the thermoelectric semiconductor layer has a thickness of 10 to 5000 nm.
- thermoelectric conversion material according to any one of (1) to (11), wherein the thermoelectric semiconductor material is a bismuth-tellurium-based thermoelectric semiconductor material or a bismuth selenide-based thermoelectric semiconductor material.
- thermoelectric conversion material is a bismuth-tellurium-based thermoelectric semiconductor material or a bismuth selenide-based thermoelectric semiconductor material.
- thermoelectric conversion material in which a thermoelectric semiconductor layer is formed on a resin substrate having recesses, wherein the protrusions are transferred from an original plate having a protrusion structure to a resin layer made of a curable resin composition. Production of a thermoelectric conversion material comprising: a resin substrate manufacturing step formed by transferring and curing a partial structure; and a film forming step of forming a thermoelectric semiconductor layer by forming a thermoelectric semiconductor material on the resin substrate Method.
- the resin substrate manufacturing step includes a resin layer forming step of forming a resin layer with the curable resin composition, the resin layer and the original plate are pressed against each other, and the convex portion of the original plate is applied to the resin layer.
- the method for producing a thermoelectric conversion material according to the above (13), comprising a transfer step of transferring the structure and a step of forming a recess by curing the resin layer and then releasing from the original plate to form a recess.
- thermoelectric conversion material having a low thermal conductivity and an improved thermoelectric figure of merit can be obtained, and high conversion efficiency can be realized.
- thermoelectric-semiconductor layer which consists of thermoelectric-semiconductor materials in the resin substrate used for this invention is shown, (a) has the thermoelectric-semiconductor layer in the upper surface of a resin substrate, and the inner bottom part of a recessed part. In this case, (b) is a cross-sectional view when the thermoelectric semiconductor layer exists only on the upper surface of the resin substrate.
- thermoelectric conversion material obtained in Example 1 and Example 2 of this invention is shown, (a) is a SEM photograph (measurement magnification 10,000 times) of the thermoelectric conversion material of Example 1, (b) is implementation.
- thermoelectric conversion material of Example 4 is a SEM photograph (measurement magnification of 10,000 times) of the thermoelectric conversion material of Example 2.
- the plane of the thermoelectric conversion material obtained in Example 3 of this invention is shown, (a) is the SEM photograph (measurement magnification of 10000 times) of the thermoelectric conversion material of the part which consists of a cylindrical pattern which is one of pattern mixes.
- (B) is the SEM photograph (measurement magnification of 10000 times) of the thermoelectric conversion material of the part which consists of a groove-like pattern of a pattern mix.
- thermoelectric conversion material of the present invention is a thermoelectric conversion material in which a thermoelectric semiconductor layer made of a thermoelectric semiconductor material is formed on a resin substrate having a recess, and the resin substrate hardens a resin layer made of a curable resin composition. It is characterized by.
- FIG. 1 is a cross-sectional view showing an example of an original plate (nanoimprint mold) used in the production method of the present invention described later.
- a predetermined convex structure 3 is formed on a substrate 2.
- the convex structure 3 is usually formed in a shape that takes into account the nanostructure obtained after transfer, although it depends on the application.
- quartz transparent on the long wavelength side from 193 nm
- the nanoimprint mold used as the original plate 1 can be produced by lithography or the like, but the production method is not particularly limited, and a known method can be used.
- a positive resist is applied to the entire surface of the base material 2 as a molding material, electron beam drawing or ultraviolet exposure is performed on the positive resist to form a predetermined resist pattern, and the obtained resist pattern is etched into an etching mask.
- the substrate 2 is wet or dry etched, finally the resist residue is removed, and the convex structure 3 is formed to manufacture the nanoimprint mold.
- a commercial item can also be used for the nanoimprint mold. Commercial products are commercially available from, for example, NTT-AT.
- the convex structure 3 of the original 1 there are various shapes of the convex structure 3 of the original 1 and it is not particularly limited. For example, the following shapes are mentioned, which are used as appropriate according to the application.
- A) Dot shape the shape of the convex portion is a dot shape such as a circle, an ellipse, or a polygon.
- B) Line shape the shape of the convex portion is a line shape such as a straight line or a curved line).
- C Pattern mix shape (mixed dot shape and line shape).
- the pattern of the original 1 used by this invention should just be independent in convex parts, and may be bent not only a straight line. In addition, the arrangement may or may not be continuous or regular.
- FIG. 2 is a cross-sectional view showing an example of a resin substrate used in the present invention.
- the resin substrate 4 having the recess 6 is formed on the support 5.
- the resin substrate 4 is obtained by, for example, transferring the original plate 1 having the convex structure 3 to a resin layer made of a curable resin composition, curing, and releasing the mold. It can be obtained by being transferred as an inverted pattern of the convex structure 3 of the original 1.
- the curable resin composition only needs to have insulating properties and be curable, and examples thereof include an energy ray curable resin and a thermosetting resin as a main component. Among them, from the point that heat resistance is high, deformation is not caused by heat, and low thermal conductivity can be maintained, the curable resin composition is an energy ray curable resin composition mainly composed of an energy ray curable resin. Preferably there is.
- the thermal conductivity of the resin substrate 4 can be reduced, and the thermoelectric performance index of the thermoelectric conversion material can be improved.
- the energy beam curable resin composition is not particularly limited.
- a resin containing a (meth) acrylic acid ester copolymer having an energy beam curable group in the side chain or 2) an energy beam.
- examples include those containing a polymer having no curability and energy ray curable monomers and / or oligomers, and 3) those containing energy ray curable monomers and / or oligomers as main components.
- thermoelectric conversion material By using a resin composition containing such a copolymer, a relatively thick resin layer can be formed, so that a resin substrate having excellent heat resistance can be obtained.
- the obtained resin substrate is used. Even when the thermoelectric conversion material is driven at a high temperature for a long time, it is difficult for the resin substrate to be thermally deformed, and it is possible to suppress a decrease in thermoelectric performance.
- the energy ray curable resin composition may be referred to as 1) a (meth) acrylic acid ester copolymer having an energy ray curable group in the side chain (hereinafter referred to as “energy ray curable copolymer”). ) Will be described.
- (meth) acrylic acid in the present specification means both acrylic acid and methacrylic acid.
- the (meth) acrylic acid ester copolymer having an energy ray-curable group in the side chain As the (meth) acrylic acid ester copolymer having an energy ray-curable group in the side chain, the (meth) acrylic copolymer (m1) having a functional group-containing monomer unit and the functional group are reacted. It is obtained by reacting with an unsaturated group-containing compound (m2) having a substituent capable of forming a covalent bond.
- a resin composition containing such a copolymer a resin substrate having adhesiveness can be formed.For example, without using an adhesive layer, the resin substrate is directly connected to various devices such as a photoelectric conversion device, Can be attached to walls or buildings.
- the (meth) acrylic copolymer (m1) is composed of a structural unit derived from a functional group-containing monomer and a structural unit derived from a (meth) acrylic acid ester monomer or a derivative thereof.
- the functional group-containing monomer of the (meth) acrylic copolymer (m1) includes, for example, a polymerizable double bond and a functional group such as a hydroxyl group, a carboxyl group, an amino group, a substituted amino group, and an epoxy group.
- a monomer having in the molecule, a hydroxyl group-containing unsaturated compound and a carboxyl group-containing unsaturated compound are preferably used.
- the hydroxyl group-containing unsaturated compound includes hydroxyl group-containing (meth) acrylates such as 2-hydroxyethyl acrylate, 2-hydroxyethyl methacrylate, 2-hydroxypropyl acrylate, 2-hydroxybutyl acrylate, 2-hydroxybutyl methacrylate and the like.
- hydroxyl group-containing (meth) acrylates such as 2-hydroxyethyl acrylate, 2-hydroxyethyl methacrylate, 2-hydroxypropyl acrylate, 2-hydroxybutyl acrylate, 2-hydroxybutyl methacrylate and the like.
- carboxyl group-containing unsaturated compound include ethylenically unsaturated carboxylic acids such as acrylic acid, methacrylic acid, and itaconic acid. These may be used alone or in combination of two or more.
- the (meth) acrylic acid ester monomer constituting the (meth) acrylic copolymer (m1) includes benzylalkyl (meth) acrylate, cycloalkyl (meth) acrylate, and an alkyl group having 1 to 18 carbon atoms.
- Alkyl (meth) acrylates, etc. are used, and among these, alkyl (meth) acrylates having an alkyl group with 1 to 18 carbon atoms are preferably used.
- alkyl (meth) acrylate having an alkyl group having 1 to 18 carbon atoms include methyl (meth) acrylate, ethyl (meth) acrylate, propyl (meth) acrylate, n-butyl (meth) acrylate, Isobutyl (meth) acrylate, t-butyl (meth) acrylate, pentyl (meth) acrylate, hexyl (meth) acrylate, cyclohexyl (meth) acrylate, 2-ethylhexyl (meth) acrylate, isooctyl (meth) acrylate, decyl (meth) Examples include acrylate, dodecyl (meth) acrylate, myristyl (meth) acrylate, palmityl (meth) acrylate, stearyl (meth) acrylate, and among these, methyl (meth) acrylate and
- the (meth) acrylic copolymer (m1) can be obtained by copolymerizing a functional group-containing monomer as described above with a (meth) acrylic acid ester monomer or a derivative thereof by a known method. In addition to these monomers, other monomers may be copolymerized in a small amount (for example, 10% by mass or less, preferably 5% by mass or less).
- Other monomers include vinyl esters such as vinyl acetate and vinyl propionate; olefins such as ethylene, propylene and isobutylene; halogenated olefins such as vinyl chloride and vinylidene chloride; styrenes such as styrene and ⁇ -methylstyrene Monomers; Diene monomers such as butadiene, isoprene and chloroprene; Nitrile monomers such as acrylonitrile and methacrylonitrile; and acrylamides such as acrylamide, N-methylacrylamide and N, N-dimethylacrylamide. These can be used alone or in combination of two or more.
- the structural unit derived from the functional group-containing monomer is usually 3 to 100% by mass, preferably 5 to 40% by mass, particularly preferably 10 to 30% by mass.
- the structural unit derived from a (meth) acrylic acid ester monomer or derivative thereof is usually contained in a proportion of 0 to 97% by mass, preferably 60 to 95% by mass, particularly preferably 70 to 90% by mass. It becomes.
- the unsaturated group-containing compound (m2) needs to be appropriately selected according to the type of functional group of the functional group-containing monomer that the (meth) acrylic copolymer (m1) has. Therefore, for example, when the functional group of the functional group-containing monomer of the (meth) acrylic copolymer (m1) is a hydroxy group, an amino group, or a substituted amino group, the unsaturated group-containing compound (m2) has As the substituent, an isocyanate group or an epoxy group is preferable. When the functional group is a carboxyl group, the substituent is preferably an isocyanate group, an aziridinyl group, an epoxy group or an oxazoline group, and further has a functional group.
- the substituent is preferably an amino group, a carboxyl group or an aziridinyl group.
- One such substituent is included for each molecule of the unsaturated group-containing compound (m2).
- the unsaturated group-containing compound (m2) for example, methacryloyloxyethyl isocyanate, methacryloyl isocyanate, meta-isopropenyl- ⁇ , ⁇ -dimethylbenzyl isocyanate, allyl isocyanate; diisocyanate compound or poly Acrylyl monoisocyanate compound obtained by reaction of isocyanate compound with hydroxyethyl (meth) acrylate; obtained by reaction of diisocyanate compound or polyisocyanate compound, polyol compound and hydroxyethyl (meth) acrylate Acryloyl monoisocyanate compound; glycidyl (meth) acrylate; (meth) acrylic acid, 2- (1-aziridinyl
- the unsaturated group-containing compound (m2) is usually 20 to 100 equivalents, preferably 40 to 95 equivalents, particularly preferably 60 to 90 equivalents per 100 equivalents of the functional group-containing monomer of the (meth) acrylic copolymer (m1). Used in equivalent proportions.
- the reaction temperature, time, solvent, catalyst, etc. are appropriately selected according to the combination of the functional group and the substituent. Do it. From the above, the functional group present in the side chain in the (meth) acrylic copolymer (m1) reacts with the substituent in the unsaturated group-containing compound (m2), and the unsaturated group becomes (meth) acrylic.
- a (meth) acrylic acid ester copolymer introduced into the side chain in the system copolymer (m1) and having an energy ray-curable group in the side chain can be obtained.
- the weight average molecular weight (Mw) of the (meth) acrylic acid ester copolymer having an energy ray-curable group in the side chain is preferably 100,000 or more, more preferably 200,000 to 2,500,000. In view of heat resistance, it is particularly preferably 500,000 to 1,500,000.
- the weight average molecular weight in this specification was measured by gel permeation chromatography (GPC method) using the molecular weight of standard polystyrene.
- the curable resin composition preferably further contains a photopolymerization initiator in addition to the energy beam curable copolymer.
- a photopolymerization initiator By containing a photopolymerization initiator, the polymerization curing time and the amount of light irradiation can be reduced when photocuring after forming a resin layer made of an energy ray curable resin composition.
- the photopolymerization initiator is not particularly limited.
- 1-hydroxy-cyclohexyl-phenyl ketone 2-hydroxy-2-methyl-1-phenyl-propan-1-one, 2-methyl-1- (4 -Methylthiophenyl) -2-morpholinopropan-1-one, 2-benzyl-2-dimethylamino-1- (4-morpholinophenyl) -1-butanone, bis (2,4,6-trimethylbenzoyl)- Phenylphosphine oxide, 4-phenylbenzophenone, 4-phenoxybenzophenone, 4,4′-diphenylbenzophenone, 4,4′-diphenoxybenzophenone, benzophenone, acetophenone, benzoin, benzoin methyl ether, benzoin ethyl ether, benzoin isopropyl ether, Benzoin Sobutyl ether, benzoin benzoic acid, methyl benzoin benzoate, benzoin dimethyl ketal, 2,4-diethylthioxan
- 1-hydroxy-cyclohexyl-phenyl ketone is preferably used from the viewpoints of good reactivity with the energy rays to be used, optimum reaction rate, and progress of the reaction to the deep part of the resin layer. These may be used alone or in combination of two or more.
- the photopolymerization initiator is preferably used in an amount in the range of 0.1 to 10 parts by mass, particularly 0.5 to 5 parts by mass with respect to 100 parts by mass of the energy beam curable copolymer.
- the curable resin composition may appropriately contain other components in addition to the energy beam curable copolymer and the photopolymerization initiator.
- other components include a thermoplastic resin component, an energy ray-curable monomer and / or oligomer component described later, a crosslinking agent, and other additives.
- thermoplastic resin component examples include polyacrylic acid ester, polyester, polyurethane, polycarbonate, and polyolefin.
- a polyfunctional compound having reactivity with the functional group of the energy ray curable copolymer or the like can be used.
- examples of such polyfunctional compounds include isocyanate compounds, epoxy compounds, amine compounds, melamine compounds, aziridine compounds, hydrazine compounds, aldehyde compounds, oxazoline compounds, metal alkoxide compounds, metal chelate compounds, metal salts, ammonium salts. And reactive phenol resins.
- additives examples include ultraviolet absorbers, plasticizers, fillers, antioxidants, tackifiers, pigments, dyes, coupling agents, and organic fine particles.
- the blending amount of the other components mentioned above is preferably 0 to 50 parts by weight, particularly 1 to 20 parts by weight, based on 100 parts by weight of the energy ray curable copolymer. It is preferable that
- the energy beam curable resin composition contains 2) a polymer having no energy beam curability and an energy beam curable monomer and / or oligomer
- polymer in the present specification means both a homopolymer and a copolymer.
- Examples of the polymer having no energy ray curability include acrylic resins, polysulfone resins, polyarylate resins, polycarbonate resins, polyester resins, polyurethane resins, polyolefin resins, polyimide resins, and the like.
- acrylic resins polysulfone resins, polyarylate resins, polycarbonate resins, polyester resins, polyurethane resins, polyolefin resins, polyimide resins, and the like.
- an acrylic resin, a polysulfone resin, a polyarylate resin, a polycarbonate resin, or a polyimide resin is preferable.
- the polymer which does not have energy beam curability may be used individually by 1 type, and may use 2 or more types together.
- the acrylic resin is preferably a (meth) acrylic acid ester copolymer.
- the (meth) acrylic acid ester copolymer is composed of a structural unit derived from a functional group-containing monomer and a structural unit derived from a (meth) acrylic acid ester monomer or a derivative thereof.
- Examples of the structural unit derived from the functional group-containing monomer and the structural unit derived from the (meth) acrylic acid ester monomer or derivative thereof include those exemplified for the above-mentioned acrylic copolymer (m1).
- Examples of the energy ray curable monomer and / or oligomer include pentaerythritol tri (meth) acrylate, pentaerythritol tetra (meth) acrylate, trimethylolpropane tri (meth) acrylate, 1,4-butanediol di ( Examples include meth) acrylate, 1,6-hexanediol di (meth) acrylate, polyethylene glycol di (meth) acrylate, polyurethane oligo (meth) acrylate, polyester oligo (meth) acrylate, and tricyclodecane dimethanol diacrylate. These energy ray curable monomers and / or oligomers may be used alone or in combination of two or more.
- the blending ratio of the polymer having no energy beam curable property and the energy beam curable monomer and / or oligomer is such that the energy beam curable monomer and / or the amount of the polymer not having energy beam curable property is 100 parts by mass.
- the amount is preferably 5 to 200 parts by mass of the oligomer, more preferably 10 to 150 parts by mass, and particularly preferably 25 to 100 parts by mass.
- the above-mentioned photopolymerization initiator, crosslinking agent and other additives can be blended.
- the energy beam curable resin composition contains 3) an energy beam curable monomer and / or oligomer as a main component will be described.
- Examples of the energy ray curable monomer and / or oligomer include those exemplified as the energy ray curable monomer and / or oligomer described above. Such energy ray curable monomers and / or oligomers may be used alone or in combination of two or more. In this case, the above-described photopolymerization initiator and other additives can be blended.
- the film thickness of the resin substrate 4 is determined in consideration of the depth of the concave pattern to be formed, etc., and is preferably 1 to 100 ⁇ m, more preferably 5 to 50 ⁇ m. If the film thickness is within this range, the mechanical strength can be ensured and the thermal conductivity is sufficiently lowered, which is preferable.
- the resin substrate 4 preferably has a large number of independent recesses 6. Since it consists of many independent recessed parts 6, since heat conductivity fully falls, it is preferable.
- the shape of the recess 6 is not particularly limited, and is, for example, a columnar shape such as a cylindrical shape or a prismatic shape; an inverted conical shape such as an inverted cone or an inverted pyramid; an inverted frustum shape such as an inverted pyramid or an inverted truncated cone; a groove shape or the like And a combination of these may be used.
- a columnar shape such as a cylindrical shape or a prismatic shape
- an inverted conical shape such as an inverted cone or an inverted pyramid
- an inverted frustum shape such as an inverted pyramid or an inverted truncated cone
- a groove shape or the like a combination of these may be used.
- the shape of the concave 6 of the resin substrate 4 is obtained as the above-described reversal pattern corresponding to the original 1.
- the shape of the recess 6 is cylindrical, the opening of the recess 6 is circular, and when the shape of the recess 6 is a groove, the opening
- the depth of the recess 6 is preferably 5 to 10000 nm, more preferably 10 to 10000 nm, and still more preferably 50 to 300 nm. It is preferable from a viewpoint that the independent recessed part is maintained as the depth is 5 nm or more. It is preferable that the thickness be 10,000 nm or less because the Seebeck coefficient is sufficiently expressed from the viewpoint of thickness dependence of the Seebeck coefficient of the thermoelectric conversion material to be deposited. In the present invention, the depth of the recess 6 is the depth between the upper surface of the resin substrate and the inner bottom of the recess.
- the diameter or the groove width of the recess 6 is preferably 10 to 5000 nm, more preferably 10 to 300 nm.
- the diameter or the groove width of the recess 6 is 10 nm or more, for example, after the thermoelectric semiconductor material is deposited by vapor deposition or the like, the recess is not blocked by the thermoelectric semiconductor layer, and the independent recess is maintained. Therefore, it is preferable that the thickness is 5000 nm or less because the mechanical strength of the thermoelectric conversion material can be secured and further a sufficient reduction in thermal conductivity is expected.
- the interval at which the recesses 6 are arranged is preferably 15 to 5500 nm, more preferably 100 to 3000 nm, and further preferably 200 to 1500 nm. .
- the distance is 15 nm or more, it becomes longer than the mean free path of electrons, and it becomes difficult to become an electron scattering factor. If it is 5500 nm or less, it becomes shorter than the mean free path of phonons and tends to be a phonon scattering factor, so that the thermal conductivity can be reduced, which is preferable.
- the angle between a line substantially parallel to the wall surface in the recess 6 and a normal line standing on the resin substrate is preferably within ⁇ 15 °, more preferably within ⁇ 10 °.
- the angle formed with the normal line is within ⁇ 15 °, for example, when a thermoelectric semiconductor material such as p-type bismuth telluride is formed, it is difficult for p-type bismuth telluride to adhere to the wall surface inside the recess 6. It is preferable at the point which can maintain property.
- the angle formed by the center line penetrating the concave portion 6 in the thickness direction of the resin substrate 4 and the normal line standing on the resin substrate can be measured by a SEM cross-sectional photograph or the like.
- FIG. 3 shows an example of a cross section after a thermoelectric semiconductor layer made of a thermoelectric semiconductor material is formed on the resin substrate used in the present invention.
- FIG. 3A shows a thermoelectric semiconductor layer on the upper surface of the resin substrate and the inner bottom of the recess.
- (B) is a cross-sectional view when the thermoelectric semiconductor layer exists only on the upper surface of the resin substrate.
- the thermoelectric semiconductor layers 9 and 10 used in the thermoelectric conversion material of the present invention are layers made of a thermoelectric semiconductor material and are formed on the resin substrate 4.
- the method for forming the thermoelectric semiconductor material is not particularly limited.
- thermoelectric semiconductor layer By forming a thermoelectric semiconductor material on the resin substrate 4 by flash vapor deposition, vacuum arc vapor deposition, screen printing, coating, or the like, a thermoelectric semiconductor layer can be formed, and the thermoelectric conversion material of the present invention can be obtained. .
- the thermoelectric semiconductor layer is provided that the insulation between the thermoelectric semiconductor layer 9 on the inner bottom portion 7 of the recess 6 and the thermoelectric semiconductor layer 10 on the upper surface 8 of the resin substrate 4 is maintained. As shown in FIG. 3 (a), it may be present on the upper surface 8 of the resin substrate 4 and the inner bottom portion 7 of the concave portion 6, and it may be present on the inner bottom portion 7 of the concave portion 6 as shown in FIG.
- thermoelectric semiconductor layer is present on the upper surface 8 of the resin substrate 4 and the inner bottom portion 7 of the recess 6 because it is easy to form a thermoelectric semiconductor layer while maintaining insulation between the inner bottom portion 7 and the upper surface 8. It is preferable.
- the film thickness of the thermoelectric semiconductor layer 10 is preferably 5 to 5000 nm, more preferably 10 to 1000 nm, and still more preferably 50 to 250 nm. When the film thickness of the thermoelectric semiconductor layer 10 is within the above range, the inner bottom portion 7 and the upper surface 8 are not continuous layers, the insulation can be maintained, the thermoelectric semiconductor layer can be formed, the material cost can be reduced, and the productivity can be reduced.
- the film thickness of the thermoelectric semiconductor layer 9 at the inner bottom 7 of the recess 6 is preferably 5 to 200 nm, more preferably 5 to 100 nm. If the film thickness in the inner bottom portion 7 is within the above range, the recess 6 is not filled with the thermoelectric semiconductor layer, and the recess 6 is maintained, which is preferable.
- thermoelectric semiconductor materials include p-type bismuth telluride, n-type bismuth telluride, bismuth-tellurium-based thermoelectric semiconductor materials such as Bi 2 Te 3, telluride-based thermoelectric semiconductor materials such as GeTe and PbTe, and antimony-tellurium-based thermoelectric semiconductor materials.
- thermoelectric semiconductor materials SiGe and other silicon-germanium thermoelectric semiconductor materials, Bi 2 Se 3 and other bismuth selenide thermoelectric semiconductor materials, ⁇ -FeSi 2 , silicide-based thermoelectric semiconductor materials such as CrSi 2 , MnSi 1.73 and Mg 2 Si, oxide-based thermoelectric semiconductor materials, and Heusler materials such as FeVA1, FeVA1Si and FeVTiAl.
- thermoelectric performance p-type bismuth telluride, n-type bismuth telluride, bismuth-tellurium-based thermoelectric semiconductor materials such as Bi 2 Te 3 , and bismuth selenide-based thermoelectric semiconductor materials such as Bi 2 Se 3 are preferable.
- the carrier is a hole and the Seebeck coefficient is a positive value
- Bi X Te 3 Sb 2-X is preferable.
- X is preferably 0 ⁇ X ⁇ 0. .6, and more preferably 0.4 ⁇ X ⁇ 0.6. It is preferable that X is greater than 0 and less than or equal to 0.6 because the Seebeck coefficient and electrical conductivity are increased, and the characteristics as a p-type thermoelectric conversion material are maintained.
- the carrier is an electron and the Seebeck coefficient is a negative value, and Bi 2 Te 3-y Se y is preferable.
- Y is preferably 0 ⁇ Y ⁇ 3. Yes, more preferably 0.1 ⁇ Y ⁇ 2.7. It is preferable that Y is greater than 0 and less than or equal to 3 because the Seebeck coefficient and electrical conductivity are increased, and the characteristics as an n-type thermoelectric conversion material are maintained.
- thermoelectric semiconductor material can be used alone, but is preferably used in pairs.
- a plurality of pairs may be electrically connected in series via electrodes, and thermally connected in parallel via an insulator such as ceramics, and used as thermoelectric conversion elements for power generation and cooling. it can.
- the method for producing a thermoelectric conversion material of the present invention is a method for producing a thermoelectric conversion material obtained by forming a thermoelectric semiconductor material on a resin substrate having a concave portion, from a master having a convex portion structure, to a curable resin composition.
- a resin layer forming step of forming a resin layer with a curable resin composition the resin layer and the original plate having the convex structure are pressed against each other, and the resin layer is subjected to pressurization. It is preferable to include a transfer step of transferring the convex structure of the original plate to form a concave portion, and a concave portion forming step of curing the resin layer and then releasing from the original plate to form a concave portion.
- FIG. 4 is an explanatory view showing an example of the resin substrate manufacturing process according to the manufacturing method of the present invention in the order of processes.
- the upper diagram is a cross-sectional view of the original, and the lower diagram is a support. It is sectional drawing after forming a resin layer with a curable resin composition on a body
- (b) is a sectional view showing a hardening process after pressurization and transfer
- (c) after hardening a resin layer
- the resin layer forming step is performed by, for example, applying a coating material made of a curable resin composition on the support 12 to form a resin.
- This is a step of forming the layer 13.
- the support 12 is not particularly limited as long as the resin layer 13 is uniformly formed and does not affect the decrease in the electrical conductivity and the increase in the thermal conductivity of the thermoelectric conversion material.
- Examples of the support 12 include a film, glass, a silicon substrate, and the like.
- a support body may peel finally.
- the support is preferably a release sheet obtained by subjecting a film surface such as PET (polyethylene terephthalate) to a release treatment with a known release agent (for example, silicone resin).
- a film surface such as PET (polyethylene terephthalate)
- a known release agent for example, silicone resin
- the resin layer 13 is formed on the release treatment surface side of the release sheet that is the support 12.
- the method for forming the resin layer include knife coating, bar coating, lip coating, spin coating, roll coating, dip coating, die coating, and gravure coating, and are not particularly limited.
- (1) -2 Transfer Process As shown in FIG. 4A, the transfer process is performed by pressing the resin layer 13 obtained in (1) -1 and the original plate 11 having a convex structure so as to face each other. As shown in b), the structure of the original 11 is transferred to the resin layer 13 to obtain a resin layer 15 having a recess.
- the transfer method a known method can be used. For example, it is preferable that the resin layer 13 and the nanoimprint mold that is the original plate 11 are made to face each other and close to each other, and then the pressure is appropriately adjusted to perform the pressurization to sufficiently transfer the convex structure of the original plate to the resin layer 13. .
- (1) -3 Recessed part forming step In the recessed part forming step, as shown in FIG. 4B, the resin layer 15 having the recessed parts transferred by (1) -2 is cured, and as shown in FIG. In this step, the resin substrate 16 having a recess is formed by releasing from the original plate 11.
- an original beam 11 is used by using an energy beam irradiation device. A method of irradiating the resin layer 15 with the energy rays 14 from the side or the support 12 side to cure the resin layer 15 can be mentioned.
- the energy beam is not particularly limited, and examples thereof include an electron beam, a ⁇ ray, and an ultraviolet ray.
- the resin layer 15 is cured by irradiating with ultraviolet light emitted from a high-pressure mercury lamp or the like to cure the resin layer 15. 16 is preferably formed.
- the energy ray source is not particularly limited, and examples thereof include a high pressure mercury lamp, a metal halide lamp, a carbon arc lamp, and a xenon lamp.
- the resin substrate 16 having a recess whose depth, diameter, width, and other predetermined shapes are accurately controlled can be manufactured.
- the film forming process is a process for forming a thermoelectric semiconductor layer by forming a thermoelectric semiconductor material on the resin substrate 16 obtained in the resin substrate manufacturing process.
- the film forming method is not particularly limited, but a flash vapor deposition method or a vacuum arc vapor deposition method is preferably used.
- the flash vapor deposition method is a method in which the film-formation material in the form of particles is continuously supplied to a crucible or a boat-type heater that is preheated to the boiling point of the material or the like, and the material is instantaneously evaporated. This is a method of forming a film.
- the material evaporates instantaneously. Therefore, when depositing an alloy composed of two or more elements having different vapor pressures, a vapor deposition source as a vapor deposition material is fixed on the heater and vapor deposition is performed. Compared to the vapor deposition method, the composition ratio can be kept more constant.
- the flash vapor deposition method is more preferable because the straightness of the material at the time of vapor deposition is high and the material is difficult to be vapor deposited on the wall surface in the recess.
- thermoelectric performance evaluation of the thermoelectric conversion material produced by the Example and the comparative example was performed by calculating a thermal conductivity, a Seebeck coefficient, and an electrical conductivity with the following method.
- A Thermal conductivity The 3 ⁇ method was used to measure the thermal conductivity.
- B Seebeck coefficient One end of the prepared sample was heated, a temperature difference generated between both ends of the sample was measured using a chromel-alumel thermocouple, and a thermoelectromotive force was measured from an electrode adjacent to the thermocouple installation position. Specifically, the distance between both ends of the sample for measuring the temperature difference and the electromotive force is 25 mm, one end is kept at 20 ° C., and the other end is heated from 25 ° C. to 50 ° C.
- thermoelectric conversion materials produced in the examples and comparative examples were measured for the surface resistance value of the sample by a four-terminal method using a surface resistance measuring device (manufactured by Mitsubishi Chemical Corporation, trade name: Loresta GP MCP-T600). Measurements were made and the electrical conductivity was calculated.
- Example 1 Preparation of energy ray-curable resin composition 62 parts by mass of butyl acrylate, 10 parts by mass of methyl methacrylate and 28 parts by mass of 2-hydroxyethyl acrylate are polymerized in ethyl acetate to obtain an acrylic having a hydroxyl group as a functional group. An ethyl acetate solution of the copolymer (solid content concentration 40% by mass) was obtained.
- the coating agent was applied onto the release treatment surface of the release sheet with a knife coater and dried at 90 ° C. for 1 minute to form a 10 ⁇ m thick resin layer.
- Nanoimprint mold (semi-custom mold “NIM-100UD” manufactured by NTT-AT Co., Ltd., original plate having resin layer and convex portions, dot shape, convex shape: cylindrical, diameter: 100 nm, adjacent The distance between the centers of the convex parts to be opposed: 1000 nm) is opposed to each other and brought into close contact with each other, and then closely contacted so that bubbles do not enter between the mold and the resin.
- the mask aligner (Mikasa Co., Ltd., Model No .: MA-10) was used and irradiated with ultraviolet light at 3.6 J. After irradiation, the resin layer was peeled off from the nanoimprint mold to produce a resin substrate on which a desired recess formed on the support was formed. The thickness of the resin substrate was 10 ⁇ m.
- thermoelectric semiconductor layer A p-type bismuth telluride (Bi 0.4 Te 3 Sb 1.6 ) film is formed as a thermoelectric conversion material on the resin substrate obtained as described above by flash vapor deposition.
- the thermoelectric conversion material of Example 1 was produced.
- Fig.5 (a) is a SEM photograph which shows the plane of the thermoelectric conversion material obtained in Example 1 of this invention. As shown to Fig.5 (a), it turns out that the resin substrate has many independent cylindrical recessed parts.
- the film thickness of the formed thermoelectric semiconductor layer (Bi 0.4 Te 3 Sb 1.6 ) on the surface of the resin substrate was 100 nm. Table 1 shows the results of thermoelectric performance evaluation.
- thermoelectric conversion material was produced in the same manner as in Example 1.
- FIG.5 (b) is a SEM photograph which shows the plane of the thermoelectric conversion material obtained in Example 2 of this invention. As shown in FIG.5 (b), it turns out that the resin substrate has many independent groove-shaped recessed parts. The thickness of the resin substrate was 10 ⁇ m, and the film thickness of the formed thermoelectric semiconductor layer (Bi 0.4 Te 3 Sb 1.6 ) on the resin substrate surface was 200 nm.
- thermoelectric conversion material was prepared in the same manner as in Example 1 except that the interval: 1000 nm) was used.
- 6 (a) and 6 (b) are SEM photographs showing the plane of the thermoelectric conversion material obtained in Example 3 of the present invention.
- the resin substrate has a large number of independent cylindrical recesses (FIG. 6A) and groove-like recesses (FIG. 6B). I understand that.
- the thickness of the resin substrate was 10 ⁇ m, and the film thickness of the thermoelectric semiconductor layer (Bi 0.4 Te 3 Sb 1.6 ) on the surface of the resin substrate was 100 nm.
- thermoelectric conversion material was produced in the same manner as in Example 1 except that the following energy beam curable resin composition was used as the energy beam curable resin composition.
- the thickness of the resin substrate was 10 ⁇ m
- the film thickness of the thermoelectric semiconductor layer (Bi 0.4 Te 3 Sb 1.6 ) on the surface of the resin substrate was 100 nm.
- (Preparation of energy ray curable resin composition) 95 parts by mass of butyl acrylate, 5 parts by mass of 2-hydroxyethyl acrylate, and 0.1 part by mass of azobisisobutyronitrile as an initiator were added to a mixed solvent of 175 parts by mass of ethyl acetate and 25 parts by mass of toluene.
- thermoelectric conversion material was produced in the same manner as in Example 1 except that the following energy beam curable resin composition was used as the energy beam curable resin composition.
- the thickness of the resin substrate was 10 ⁇ m
- the film thickness of the thermoelectric semiconductor layer (Bi 0.4 Te 3 Sb 1.6 ) on the surface of the resin substrate was 100 nm.
- thermoelectric conversion material was produced in the same manner as in Example 1 except that the following energy beam curable resin composition was used as the energy beam curable resin composition.
- the thickness of the resin substrate was 10 ⁇ m, and the thickness of Bi 0.4 Te 3 Sb 1.6 on the surface of the resin substrate was 100 nm.
- a solution containing polyimide which is a polymer having no energy ray curability (Nissan Chemical Co., Ltd., Sunever 150) is diluted with butyl cellosolve to prepare a 15% by mass solution.
- Example 1 In Example 1, without using the nanoimprint mold, the resin layer was cured to produce a resin substrate having no recess, and this resin substrate was used, except that this resin substrate was used. A Bi 0.4 Te 3 Sb 1.6 alloy was flash-deposited to form a thermoelectric semiconductor layer, thereby producing a thermoelectric conversion material. The thickness of the resin substrate was 10 ⁇ m, and the thickness of the thermoelectric semiconductor layer (Bi 0.4 Te 3 Sb 1.6 ) on the resin substrate surface was 100 nm. Table 1 shows the results of thermoelectric performance evaluation.
- thermoelectric conversion materials of Examples 1 to 6 have a significantly lower thermal conductivity and a higher dimensionless thermoelectric figure of merit ZT compared to the thermoelectric conversion material of Comparative Example 1 using a resin substrate in which no recess is formed. A value was obtained.
- thermoelectric conversion material of the present invention is used as a thermoelectric conversion element that performs mutual energy conversion between heat and electricity and is incorporated into a module. Specifically, because it is a highly efficient thermoelectric conversion material, the heat from various combustion furnaces such as factories, waste combustion furnaces, cement combustion furnaces, automobile combustion gas exhaust heat, and electronic equipment exhaust heat are converted into electricity. Application to the purpose of conversion is conceivable.
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Description
また、特許文献2には、ナノインプリント法により、熱電変換材料を細線状に作製することで、熱電性能指数を向上させる旨の開示がなされているが、熱伝導率の低下が小さく、十分な性能が得られていなかった。
すなわち、本発明は、以下の(1)~(15)を提供するものである。
(1)凹部を有する樹脂基板に、熱電半導体材料からなる熱電半導体層が形成された熱電変換材料において、該樹脂基板が、硬化型樹脂組成物からなる樹脂層を、硬化してなることを特徴とする熱電変換材料。
(2)前記硬化型樹脂組成物が、エネルギー線硬化型樹脂組成物である請求項(1)に記載の熱電変換材料。
(3)前記樹脂基板が、凸部を有する原版と前記エネルギー線硬化型樹脂組成物からなる樹脂層とを対向させ加圧、エネルギー線照射することにより硬化して得られる上記(2)に記載の熱電変換材料。
(4)前記エネルギー線硬化型樹脂組成物が、側鎖にエネルギー線硬化性基を有する(メタ)アクリル酸エステル共重合体を含有する上記(2)又は(3)に記載の熱電変換材料。
(5)前記エネルギー線硬化型樹脂組成物が、エネルギー線硬化性を有しない重合体と、エネルギー線硬化型のモノマー及び/又はオリゴマーとを含有する上記(2)又は(3)に記載の熱電変換材料。
(6)前記樹脂基板の膜厚が、1~100μmである上記(1)~(5)のいずれかに記載の熱電変換材料。
(7)前記樹脂基板が、独立した多数の凹部を有する上記(1)~(6)のいずれかに記載の熱電変換材料。
(8)前記凹部の形状が、円柱状又は溝状である上記(1)~(7)のいずれかに記載の熱電変換材料。
(9)前記凹部の深さが5~10000nm、前記凹部の直径又は溝幅が10~5000nm、及び隣接する凹部の中心間の間隔が15~5500nmである(8)に記載の熱電変換材料。
(10)前記熱電半導体層が、前記樹脂基板の上面に存在し、かつ凹部の内底部と、該上面とは絶縁性を維持していることを特徴とする上記(1)~(9)のいずれかに記載の熱電変換材料。
(11)前記熱電半導体層の膜厚が10~5000nmである上記(1)~(10)のいずれかに記載の熱電変換材料。
(12)前記熱電半導体材料が、ビスマス-テルル系熱電半導体材料またはビスマスセレナイド系熱電半導体材料である上記(1)~(11)のいずれかに記載の熱電変換材料。
(13)凹部を有する樹脂基板に、熱電半導体層を成膜してなる熱電変換材料の製造方法であって、凸部構造を有する原版から、硬化型樹脂組成物からなる樹脂層に、前記凸部構造を転写、硬化してなる樹脂基板作製工程と、前記樹脂基板上に熱電半導体材料を成膜して熱電半導体層を形成する成膜工程とを含むことを特徴とする熱電変換材料の製造方法。
(14)前記樹脂基板作製工程が、前記硬化型樹脂組成物により樹脂層を形成する樹脂層形成工程、該樹脂層と前記原版とを対向し加圧し、該樹脂層に該原版の前記凸部構造を転写する転写工程、及び該樹脂層を硬化し、その後、該原版から離型し、凹部を形成する凹部形成工程を含む上記(13)に記載の熱電変換材料の製造方法。
(15)前記成膜工程が、フラッシュ蒸着法による上記(13)に記載の熱電変換材料の製造方法。
本発明の熱電変換材料は、凹部を有する樹脂基板に、熱電半導体材料からなる熱電半導体層が形成された熱電変換材料において、該樹脂基板が、硬化型樹脂組成物からなる樹脂層を、硬化してなることを特徴とする。
本発明で用いる凸部構造を有する原版について、ナノインプリントモールドを用いた場合について説明する。
図1は、後述する本発明の製造方法に用いる原版(ナノインプリントモールド)の一例を示す断面図である。原版1には、基材2上に所定の凸部構造3が形成されている。前記凸部構造3は、用途により異なるが、通常、転写後に得られるナノ構造を考慮した形状で形成されている。前記基材2としては、特に限定されないが、一般的に、加工精度、耐久性等の観点から石英(193nmより長波長側で透明)が用いられる。
前記原版1として用いたナノインプリントモールドは、リソグラフィ等で作製することが可能であるが、作製方法は特に限定されず、公知の方法を用いることができる。例えば、モールド材料となる基材2全面にポジ型レジストを塗布し、前記ポジ型レジストに電子線描画又は紫外線露光等を行って、所定のレジストパターンを形成し、得られたレジストパターンをエッチングマスクとして、基材2をウェット又はドライエッチングし、最後にレジスト残渣を除去し、凸部構造3を形成することでナノインプリントモールドを製造する。
また、前記ナノインプリントモールドは、市販品を用いることもできる。市販品としては、例えば、NTT-AT社等から市販されている。
が挙げられ、用途に応じて、適宜使用される。
(A)ドット形状(凸部の形状が円、楕円、多角形等のドット形状)。
(B)ライン形状(凸部の形状が直線、曲線等のライン形状)。
(C)パターンミックス形状(ドット形状とライン形状等の混在したもの)。
なお、本発明で使用する原版1のパターンは、凸部同士が独立していればよく、直線のみならず、曲がっていてもよい。また、並び方に関しては、連続性や規則性があっても、なくてもよい。
本発明で用いる樹脂基板について説明する。
図2は、本発明に用いた樹脂基板の一例を示す断面図である。
凹部6を有する樹脂基板4は、支持体5上に形成されている。樹脂基板4は、例えば、凸部構造3を有する前記原版1を用い、硬化型樹脂組成物からなる樹脂層に転写させ、硬化、離型することにより得られ、この場合、凹部6は、前記原版1の凸部構造3の反転パターンとして転写されることにより得ることができる。
例えば、ヒドロキシル基含有不飽和化合物としては、2-ヒドロキシエチルアクリレート、2-ヒドロキシエチルメタクリレート、2-ヒドロキシプロピルアクリレート、2-ヒドロキシブチルアクリレート、2-ヒドロキシブチルメタクリレート等のヒドロキシル基含有(メタ)アクリレートが挙げられる。また、カルボキシル基含有不飽和化合物としては、アクリル酸、メタクリル酸、イタコン酸等のエチレン性不飽和カルボン酸が挙げられる。これらは単独で又は2種以上を組み合わせて用いられる。
(メタ)アクリル系共重合体(m1)は、上記のような官能基含有モノマーと、(メタ)アクリル酸エステルモノマー又はその誘導体とを公知の方法で共重合することにより得ることができるが、これらモノマーの他にも少量(例えば10質量%以下、好ましくは5質量%以下)の割合で、他のモノマーが共重合されてもよい。
上記から、不飽和基含有化合物(m2)としては、例えば、メタクリロイルオキシエチルイソシアナート、メタクリロイルイソシアナート、メタ-イソプロペニル-α,α-ジメチルベンジルイソシアナート、アリルイソシアナート;ジイソシアナート化合物又はポリイソシアナート化合物と、ヒドロキシエチル(メタ)アクリレートとの反応により得られるアクリロイルモノイソシアナート化合物;ジイソシアナート化合物又はポリイソシアナート化合物と、ポリオール化合物と、ヒドロキシエチル(メタ)アクリレートとの反応により得られるアクリロイルモノイソシアナート化合物;グリシジル(メタ)アクリレート;(メタ)アクリル酸、2-(1-アジリジニル)エチル(メタ)アクリレート、2-ビニル-2-オキサゾリン、2-イソプロペニル-2-オキサゾリン等が挙げられる。
なお、前記不飽和基含有化合物(m2)には、エネルギー線重合性の炭素-炭素二重結合が、1分子毎に1~5個、好ましくは1~2個含まれる。
以上から、(メタ)アクリル系共重合体(m1)中の側鎖に存在する官能基と、不飽和基含有化合物(m2)中の置換基とが反応し、不飽和基が(メタ)アクリル系共重合体(m1)中の側鎖に導入され、側鎖にエネルギー線硬化性基を有する(メタ)アクリル酸エステル共重合体を得ることができる。
例えば、凹部6の形状が円柱状の場合、凹部6の開口部は円形となり、また、凹部6の形状が溝状の場合、凹部6の開口部は線状となる。
図3は、本発明に用いた樹脂基板に熱電半導体材料からなる熱電半導体層を形成した後の断面の一例を示し、(a)は樹脂基板の上面及び凹部の内底部に熱電半導体層が存在している場合、(b)は樹脂基板の上面にのみ熱電半導体層が存在している場合の断面図である。
図3に示すように、本発明の熱電変換材料に用いる熱電半導体層9及び10は、熱電半導体材料からなる層であり、樹脂基板4に形成される。
熱電半導体材料を形成する方法は、特に限定されない。例えば、樹脂基板4に、熱電半導体材料をフラッシュ蒸着法、真空アーク蒸着法、スクリーン印刷、塗布等により成膜することにより、熱電半導体層を形成し、本発明の熱電変換材料を得ることができる。
熱電変換材料の熱伝導率を低下させるため、熱電半導体層は、凹部6の内底部7の熱電半導体層9と樹脂基板4の上面8の熱電半導体層10との絶縁性が維持されていれば、図3(a)のように、樹脂基板4の上面8と凹部6の内底部7に存在していてもよく、又図3(b)のように、凹部6の内底部7に存在せず、樹脂基板4の上面8にのみに存在していてもよい。なかでも、内底部7と、上面8との絶縁性を維持しつつ、熱電半導体層を形成し易いという点から、熱電半導体層は、樹脂基板4の上面8と凹部6の内底部7に存在していることが好ましい。熱電半導体層10の膜厚は、好ましくは、5~5000nmであり、より好ましくは10~1000nm、さらに好ましくは50~250nmである。熱電半導体層10の膜厚が上記範囲内であれば、内底部7と上面8とが連続した層とならず絶縁性を維持でき、熱電半導体層を形成でき、かつ材料コストを削減でき生産性が向上するという点で好ましい。
また、前記凹部6の内底部7における、熱電半導体層9の膜厚は、好ましくは、5~200nmであり、より好ましくは、5~100nmである。内底部7における膜厚が上記範囲内であれば、凹部6が熱電半導体層で埋まらず、凹部6が維持され好ましい。
これらの中でも、熱電性能の点から、p型ビスマステルライド、n型ビスマステルライド、Bi2Te3等のビスマス-テルル系熱電半導体材料、Bi2Se3等のビスマスセレナイド系熱電半導体材料が好ましい。
上記p型ビスマステルライドは、キャリアが正孔であり、ゼーベック係数が正値であるものであり、BiXTe3Sb2-Xが好ましいが、この場合、Xは、好ましくは0<X≦0.6であり、より好ましくは0.4<X≦0.6である。Xが0より大きく0.6以下であるとゼーベック係数と電気伝導率が大きくなり、p型熱電変換材料としての特性が維持されるので好ましい。
本発明の熱電変換材料の製造方法は、凹部を有する樹脂基板に、熱電半導体材料を成膜してなる熱電変換材料の製造方法であって、凸部構造を有する原版から、硬化型樹脂組成物からなる樹脂層に、前記凸部構造を転写、硬化してなる樹脂基板作製工程と、前記樹脂基板上に熱電半導体材料を成膜して熱電半導体層を形成する成膜工程とを含むことを特徴とする。
さらに詳述すると、樹脂基板作製工程は、硬化型樹脂組成物により樹脂層を形成する樹脂層形成工程、該樹脂層と前記凸部構造を有する原版とを対向し加圧し、該樹脂層に該原版の該凸部構造を転写させ、凹部とする転写工程、及び該樹脂層を硬化し、その後、該原版から離型し、凹部を形成する凹部形成工程を含むことが好ましい。
まず、本発明の製造方法について説明する。
図4は、本発明の製造方法に従った樹脂基板作製工程の一例を工程順に示す説明図を示し、(a)において、上図が原版の断面図、下図が支持体に硬化型樹脂組成物により樹脂層を形成した後の断面図であり、(b)は加圧、転写後の硬化の工程を示す断面図であり、(c)は樹脂層を硬化後、離型により得られた樹脂基板の断面図である。
(1)-1 樹脂層形成工程
樹脂層を形成する工程は、図4(a)に示すように、例えば、硬化型樹脂組成物からなる塗布材を、支持体12上に塗布して、樹脂層13を形成する工程である。
前記支持体12は、樹脂層13が均一に形成され、かつ熱電変換材料の電気伝導率の低下、熱伝導率の増加に影響を及ぼさないものであれば、特に制限されない。支持体12としては、例えば、フィルム、ガラス、シリコン基板等が挙げられる。なお、後述のように硬化して得られる樹脂基板が自立性を有していれば、最終的に支持体は剥離されてもよい。支持体が剥離される場合は、支持体としては、PET(ポリエチレンテレフタレート)等のフィルム面に、公知の剥離剤(例えば、シリコーン樹脂)で離型処理を施した剥離シートが好ましい。この場合、樹脂層13は、支持体12である剥離シートの離型処理面側に形成する。
樹脂層の形成方法としては、例えば、ナイフコート、バーコート、リップコート、スピンコート、ロールコート、ディップコート、ダイコート、グラビアコート等が挙げられ、特に制限されない。
転写工程は、図4(a)のように、(1)-1で得られた樹脂層13と凸部構造を有する原版11とを対向させ加圧し、図4(b)に示すように、樹脂層13に原版11の構造を転写し、凹部有する樹脂層15を得る工程である。
前記転写方法としては、公知の方法を使用することができる。例えば、樹脂層13と原版11であるナノインプリントモールドとを対向、近接させ、その後、圧力等を適宜調整して加圧を行い、原版の凸部構造を十分に樹脂層13に転写することが好ましい。
凹部形成工程は、図4(b)のように、(1)-2により転写された凹部を有する樹脂層15を硬化し、図4(c)のように、原版11から離型して凹部を有する樹脂基板16を形成する工程である。
樹脂層15を硬化させる方法としては、具体的には、硬化型樹脂組成物がエネルギー線硬化型樹脂組成物である場合は、上記の転写工程において、エネルギー線照射装置を使用して、原版11側または支持体12側から樹脂層15に対してエネルギー線14を照射し、樹脂層15を硬化させる方法が挙げられる。
前記エネルギー線は特に限定されないが、電子線、γ線、紫外線等が挙げられる。エネルギー線硬化型樹脂組成物中に、例えば、光重合開始剤を使用した場合には、高圧水銀灯等から発する紫外光を照射し、所定のエネルギーを与え、前記樹脂層15を硬化させ、樹脂基板16を形成させることが好ましい。前記エネルギー線源は特に限定されないが、高圧水銀灯、メタルハライド灯、カーボンアーク灯、キセノン灯等が挙げられる。
成膜工程は、前記樹脂基板作製工程で得られた樹脂基板16に、熱電半導体材料を成膜して熱電半導体層を形成する工程である。ここで、成膜方法としては、特に限定されないが、フラッシュ蒸着法もしくは真空アーク蒸着法が好ましく用いられる。
フラッシュ蒸着法とは、粒子状にした成膜材料を、例えば、材料の沸点以上に予め加熱したるつぼ、又はボート型ヒータに、連続的に少量ずつ供給して、瞬間的に材料を蒸発させ、成膜する方法である。このようなプロセスで蒸着すると、瞬時に材料が蒸発するため、特に蒸気圧の異なる2種類以上の元素からなる合金を蒸着する場合、蒸着材料である蒸着源をヒータ上に固定し、加熱蒸着する蒸着法に比べ、組成比をより一定に保つことができる。
また、材料の飛散、未蒸発物の残留等がなく、材料を効率良く利用でき、製造コスト的にも好ましい。また、フラッシュ蒸着法では、蒸着時の材料の直進性が高く、凹部内の壁面に材料が蒸着されにくくなるためより好ましい。
(a)熱伝導率
熱伝導率の測定には3ω法を用いた。
(b)ゼーベック係数
作製した試料の一端を加熱して、試料の両端に生じる温度差をクロメル-アルメル熱電対を使用し測定し、熱電対設置位置に隣接した電極から熱起電力を測定した。具体的には、温度差と起電力を測定する試料の両端間距離を25mmとし、一端を20℃に保ち、他端を25℃から50℃まで1℃刻みで加熱し、その際の熱起電力を測定して、傾きからゼーベック係数を算出した。なお、熱電対及び電極の設置位置は、薄膜の中心線に対し、互いに対称の位置にあり、熱電対と電極の距離は1mmである。
(c)電気伝導率
実施例及び比較例で作製した熱電変換材料を、表面抵抗測定装置(三菱化学社製、商品名:ロレスタGP MCP-T600)により、四端子法で試料の表面抵抗値を測定し、電気伝導率を算出した。
(1)エネルギー線硬化型樹脂組成物の調製
ブチルアクリレート62質量部、メチルメタクリレート10質量部及び2-ヒドロキシエチルアクリレート28質量部とを酢酸エチル中で重合させて、官能基にヒドロキシル基を有するアクリル系共重合体の酢酸エチル溶液(固形分濃度40質量%)を得た。次に、得られたアクリル系共重合体の酢酸エチル溶液250質量部に、酢酸エチル100質量部と、置換基にイソシアナート基を有する不飽和基含有化合物であるメタクリロイルオキシエチルイソシアナート30質量部(アクリル系共重合体の2-ヒドロキシエチルアクリレート100当量に対し80.5当量)と、触媒としてジブチル錫ジラウレート0.12質量部とを添加し、窒素雰囲気下、室温で24時間重合させて、側鎖にエネルギー線硬化性基を有する(メタ)アクリル酸エステル共重合体を得た。得られたエネルギー線硬化型樹脂の重量平均分子量(Mw)は、600,000であった。
前記樹脂層と凸部を有する原版であるナノインプリントモールド(NTT-AT社製、セミカスタムモールド「NIM-100UD」、ドット形状、凸部形状:円柱、直径:100nm、隣接する凸部の中心間の間隔:1000nm)とを対向させ、近接し、密着させた後、モールドと樹脂間に気泡が入らないように密着させ、剥離シート側からマスクアライナー(ミカサ株式会社製、型番:MA-10)を使用し、紫外光を3.6Jを照射した。照射後、前記ナノインプリントモールドから樹脂層を剥がし,支持体上に形成された所望の凹部が形成された樹脂基板を作製した。樹脂基板の厚さは10μmであった。
前記で得られた樹脂基板上に、フラッシュ蒸着法で、熱電変換材料として、p型ビスマステルライド(Bi0.4Te3Sb1.6)を成膜することにより、熱電半導体層を形成し、実施例1の熱電変換材料を作製した。
図5(a)は本発明の実施例1で得られた熱電変換材料の平面を示すSEM写真である。図5(a)に示すように、樹脂基板が、独立した多数の円柱状の凹部を有していることがわかる。成膜した熱電半導体層(Bi0.4Te3Sb1.6)の樹脂基板表面の膜厚は100nmであった。熱電性能評価結果を表1に示す。
原版として、ナノインプリントモールド(NTT-AT社製、セミカスタムモールド「NIM-150UL」、ライン形状、凸部形状:ライン状、ライン幅:150nm、ラインの中心間の間隔:1000nm)を使用した以外は、実施例1と同様に熱電変換材料を作製した。図5(b)は本発明の実施例2で得られた熱電変換材料の平面を示すSEM写真である。図5(b)に示すように、樹脂基板が、独立した多数の溝状の凹部を有していることがわかる。樹脂基板の厚さは10μm、成膜した熱電半導体層(Bi0.4Te3Sb1.6)の樹脂基板表面の膜厚は200nmであった。
原版として、ナノインプリントモールド(NTT-AT社製、「NIM-PH350」、パターンミックス形状、凸部形状:円柱及びライン状、凸部幅:直径650nm及びライン幅350nm、隣接する凸部の中心間の間隔:1000nm)を使用した以外は、実施例1と同様に熱電変換材料を作製した。図6(a)及び(b)は本発明の実施例3で得られた熱電変換材料の平面を示すSEM写真である。図6(a)及び(b)に示すように、樹脂基板が、独立した多数の円柱状の凹部(図6(a))及び溝状の凹部(図6(b))を有していることがわかる。樹脂基板の厚さは10μm、樹脂基板表面の熱電半導体層(Bi0.4Te3Sb1.6)の膜厚は100nmであった。
エネルギー線硬化型樹脂組成物として、下記のエネルギー線硬化型樹脂組成物を用いた以外は、実施例1と同様にして、熱電変換材料を作製した。樹脂基板の厚さは10μm、樹脂基板表面の熱電半導体層(Bi0.4Te3Sb1.6)の膜厚は100nmであった。
(エネルギー線硬化型樹脂組成物の調製)
ブチルアクリレート95質量部、2-ヒドロキシエチルアクリレート5質量部、及び開始剤としてアゾビスイソブチロニトリル0.1質量部を酢酸エチル175質量部とトルエン25質量部の混合溶媒中に添加し、65℃17時間攪拌することにより、重量平均分子量68万(分子量分布=5.3、分子量200万以上の成分12.2質量%)のアクリル酸エステル共重合体溶液を得た。これに酢酸エチルを加えて濃度30%に調製した。
次いで、上記で得られたアクリル酸エステル共重合体100質量部に、炭酸エステル構造を有するエネルギー線硬化性オリゴマー(日本合成化学社製、紫光UV-3210EA、重量平均分子量10,000)15質量部、1-ヒドロキシシクロヘキシルフェニルケトン(チバ・スペシャリティー・ケミカルズ社製、イルガキュア184)1.5質量部、架橋剤としてXDI系ポリイソシアナート化合物(綜研化学社製、TD-75)0.5質量部を添加し、これに酢酸エチルを加えて濃度35%となるよう調製し、エネルギー線硬化型樹脂組成物とし、樹脂層形成用の塗布剤とした。
エネルギー線硬化型樹脂組成物として、下記のエネルギー線硬化型樹脂組成物を用いた以外は、実施例1と同様にして、熱電変換材料を作製した。樹脂基板の厚さは10μm、樹脂基板表面の熱電半導体層(Bi0.4Te3Sb1.6)の膜厚は100nmであった。
(エネルギー線硬化型樹脂組成物の調製)
エネルギー線硬化性を有しない重合体であるポリエーテルスルホン系樹脂(BASF社製、ULTRASON E 2010)ペレット100質量部をジクロロメタンに溶解して15質量%溶液を調製し、次いで、トリシクロデカンジメタノールジアクリレート(新中村化学工業社製、ADCP)163質量部、(2,4,6-トリメチルベンゾイル)ジフェニルホスフィンオキサイド(BASF社製、DAROCURE TPO)3.9質量部を添加し、エネルギー線硬化型樹脂組成物とし、樹脂層形成用の塗布剤とした。
エネルギー線硬化型樹脂組成物として、下記のエネルギー線硬化型樹脂組成物を用いた以外は、実施例1と同様にして、熱電変換材料を作製した。樹脂基板の厚さは10μm、樹脂基板表面のBi0.4Te3Sb1.6の膜厚は100nmであった。
(エネルギー線硬化型樹脂組成物の調製)
エネルギー線硬化性を有しない重合体であるポリイミドを含有する溶液(日産化学株式会社製、サンエバー150)をブチルセロソルブで希釈して15質量%溶液を調製し、ポリイミド100質量部に対して、トリシクロデカンジメタノールジアクリレート(新中村化学工業社製、ADCP)163質量部、(2,4,6-トリメチルベンゾイル)ジフェニルホスフィンオキサイド〔BASF社製、DAROCURE TPO 〕3.9質量部を添加し、エネルギー線硬化型樹脂組成物とし、樹脂層形成用の塗布剤とした。
実施例1において、ナノインプリントモールドを用いず、樹脂層を硬化させて凹部を有さない樹脂基板を作製し、この樹脂基板を用いた以外は、実施例1と同様にして、樹脂基板上に、Bi0.4Te3Sb1.6合金をフラッシュ蒸着して熱電半導体層を形成し、熱電変換材料を作製した。樹脂基板の厚さは、10μm、熱電半導体層(Bi0.4Te3Sb1.6)の樹脂基板表面の膜厚は100nmであった。
熱電性能評価結果を表1に示す。
2:基材
3:凸部構造(原版の凹凸)
4、16:樹脂基板
5、12:支持体
6:凹部
7:内底部
8:樹脂基板の上面
9:熱電半導体層(内底部上)
10:熱電半導体層(基板上面上)
13:樹脂層
14:エネルギー線
15:樹脂層(転写後)
Claims (15)
- 凹部を有する樹脂基板に、熱電半導体材料からなる熱電半導体層が形成された熱電変換材料において、該樹脂基板が、硬化型樹脂組成物からなる樹脂層を、硬化してなることを特徴とする熱電変換材料。
- 前記硬化型樹脂組成物が、エネルギー線硬化型樹脂組成物である請求項1に記載の熱電変換材料。
- 前記樹脂基板が、凸部構造を有する原版と前記エネルギー線硬化型樹脂組成物からなる樹脂層とを対向させ加圧、エネルギー線照射することにより硬化して得られる請求項2に記載の熱電変換材料。
- 前記エネルギー線硬化型樹脂組成物が、側鎖にエネルギー線硬化性基を有する(メタ)アクリル酸エステル共重合体を含有する請求項2又は3に記載の熱電変換材料。
- 前記エネルギー線硬化型樹脂組成物が、エネルギー線硬化性を有しない重合体と、エネルギー線硬化型のモノマー及び/又はオリゴマーとを含有する請求項2又は3に記載の熱電変換材料。
- 前記樹脂基板の膜厚が、1~100μmである請求項1~5のいずれかに記載の熱電変換材料。
- 前記樹脂基板が、独立した多数の凹部を有する請求項1~6のいずれかに記載の熱電変換材料。
- 前記凹部の形状が、円柱状又は溝状である請求項1~7のいずれかに記載の熱電変換材料。
- 前記凹部の深さが5~10000nm、前記凹部の直径又は溝幅が10~5000nm、及び隣接する凹部の中心間の間隔が15~5500nmである請求項8に記載の熱電変換材料。
- 前記熱電半導体層が、前記樹脂基板の上面に存在し、かつ凹部の内底部と、該上面とは絶縁性を維持していることを特徴とする請求項1~9のいずれかに記載の熱電変換材料。
- 前記熱電半導体層の膜厚が10~5000nmである請求項1~10のいずれかに記載の熱電変換材料。
- 前記熱電半導体材料が、ビスマス-テルル系熱電半導体材料またはビスマスセレナイド系熱電半導体材料である請求項1~11のいずれかに記載の熱電変換材料。
- 凹部を有する樹脂基板に、熱電半導体層を成膜してなる熱電変換材料の製造方法であって、
凸部構造を有する原版から、硬化型樹脂組成物からなる樹脂層に、前記凸部構造を転写、硬化してなる樹脂基板作製工程と、
前記樹脂基板上に熱電半導体材料を成膜して熱電半導体層を形成する成膜工程
とを含むことを特徴とする熱電変換材料の製造方法。 - 前記樹脂基板作製工程が、
前記硬化型樹脂組成物により樹脂層を形成する樹脂層形成工程、
該樹脂層と前記原版とを対向し加圧し、該樹脂層に該原版の前記凸部構造を転写する転写工程、
及び該樹脂層を硬化し、その後、該原版から離型し、凹部を形成する凹部形成工程
を含む請求項13に記載の熱電変換材料の製造方法。 - 前記成膜工程が、フラッシュ蒸着法による請求項13に記載の熱電変換材料の製造方法。
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| JP2014512491A JP6181640B2 (ja) | 2012-04-27 | 2013-04-17 | 熱電変換材料及びその製造方法 |
| CN201380022128.1A CN104247063B (zh) | 2012-04-27 | 2013-04-17 | 热电转换材料及其制造方法 |
| KR1020147029622A KR102065324B1 (ko) | 2012-04-27 | 2013-04-17 | 열전 변환 재료 및 그 제조 방법 |
| US14/396,527 US10403807B2 (en) | 2012-04-27 | 2013-04-17 | Thermoelectric conversion material and method for manufacturing same |
| EP13782240.9A EP2843720B1 (en) | 2012-04-27 | 2013-04-17 | Thermoelectric conversion material and method for manufacturing same |
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| US (1) | US10403807B2 (ja) |
| EP (1) | EP2843720B1 (ja) |
| JP (1) | JP6181640B2 (ja) |
| KR (1) | KR102065324B1 (ja) |
| CN (1) | CN104247063B (ja) |
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| KR20190113120A (ko) * | 2018-03-27 | 2019-10-08 | 국민대학교산학협력단 | 자가발전형 유연 열전모듈, 이를 이용하는 물품, 및 상기 자가발전형 유연 열전모듈의 제작방법 |
| JP2021057481A (ja) * | 2019-09-30 | 2021-04-08 | リンテック株式会社 | 熱電変換素子の製造方法 |
| WO2022203086A1 (ja) * | 2021-03-26 | 2022-09-29 | リンテック株式会社 | 積層体 |
| WO2025205308A1 (ja) * | 2024-03-29 | 2025-10-02 | 三菱電機株式会社 | 電子デバイス |
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| CN104641479B (zh) | 2013-08-09 | 2016-06-15 | 琳得科株式会社 | 热电转换材料及其制造方法 |
| CA3034219C (en) | 2016-08-18 | 2023-03-21 | Seismos, Inc. | Method for evaluating and monitoring formation fracture treatment using fluid pressure waves |
| TWI608639B (zh) * | 2016-12-06 | 2017-12-11 | 財團法人工業技術研究院 | 可撓熱電結構與其形成方法 |
| KR102608780B1 (ko) * | 2018-09-11 | 2023-12-04 | 엘지이노텍 주식회사 | 열전소자 |
| CN111234688B (zh) * | 2020-03-26 | 2021-04-13 | 清华大学 | 热电材料浆料及制备方法 |
| CN112008936A (zh) * | 2020-08-21 | 2020-12-01 | 广州特种承压设备检测研究院 | 用于热压成型机的散热装置、热压成型机及散热方法 |
| ES2931217B2 (es) * | 2021-06-18 | 2024-01-03 | Univ Madrid Autonoma | Dispositivo y generador termoelectrico |
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Also Published As
| Publication number | Publication date |
|---|---|
| JP6181640B2 (ja) | 2017-08-16 |
| EP2843720A1 (en) | 2015-03-04 |
| KR20150004351A (ko) | 2015-01-12 |
| EP2843720A4 (en) | 2015-11-18 |
| US20150075578A1 (en) | 2015-03-19 |
| CN104247063A (zh) | 2014-12-24 |
| CN104247063B (zh) | 2017-08-29 |
| TWI581962B (zh) | 2017-05-11 |
| US10403807B2 (en) | 2019-09-03 |
| JPWO2013161645A1 (ja) | 2015-12-24 |
| EP2843720B1 (en) | 2017-10-18 |
| TW201347982A (zh) | 2013-12-01 |
| KR102065324B1 (ko) | 2020-01-13 |
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