WO2013066669A3 - Structures renfermant des encres à nanoparticules de silicium, matériaux de silicium densifié issus de dépôts de silicium en nanoparticules et procédés correspondants - Google Patents
Structures renfermant des encres à nanoparticules de silicium, matériaux de silicium densifié issus de dépôts de silicium en nanoparticules et procédés correspondants Download PDFInfo
- Publication number
- WO2013066669A3 WO2013066669A3 PCT/US2012/061456 US2012061456W WO2013066669A3 WO 2013066669 A3 WO2013066669 A3 WO 2013066669A3 US 2012061456 W US2012061456 W US 2012061456W WO 2013066669 A3 WO2013066669 A3 WO 2013066669A3
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- silicon
- nanoparticle
- materials
- pellets
- densified
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Ceased
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F77/00—Constructional details of devices covered by this subclass
- H10F77/30—Coatings
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02518—Deposited layers
- H01L21/02521—Materials
- H01L21/02524—Group 14 semiconducting materials
- H01L21/02532—Silicon, silicon germanium, germanium
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D62/00—Semiconductor bodies, or regions thereof, of devices having potential barriers
- H10D62/40—Crystalline structures
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02518—Deposited layers
- H01L21/02587—Structure
- H01L21/0259—Microstructure
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02518—Deposited layers
- H01L21/02587—Structure
- H01L21/0259—Microstructure
- H01L21/02601—Nanoparticles
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02612—Formation types
- H01L21/02617—Deposition types
- H01L21/0262—Reduction or decomposition of gaseous compounds, e.g. CVD
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02612—Formation types
- H01L21/02617—Deposition types
- H01L21/02623—Liquid deposition
- H01L21/02628—Liquid deposition using solutions
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/22—Diffusion of impurity materials, e.g. doping materials, electrode materials, into or out of a semiconductor body, or between semiconductor regions; Interactions between two or more impurities; Redistribution of impurities
- H01L21/2225—Diffusion sources
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/22—Diffusion of impurity materials, e.g. doping materials, electrode materials, into or out of a semiconductor body, or between semiconductor regions; Interactions between two or more impurities; Redistribution of impurities
- H01L21/225—Diffusion of impurity materials, e.g. doping materials, electrode materials, into or out of a semiconductor body, or between semiconductor regions; Interactions between two or more impurities; Redistribution of impurities using diffusion into or out of a solid from or into a solid phase, e.g. a doped oxide layer
- H01L21/2251—Diffusion into or out of group IV semiconductors
- H01L21/2254—Diffusion into or out of group IV semiconductors from or through or into an applied layer, e.g. photoresist, nitrides
- H01L21/2257—Diffusion into or out of group IV semiconductors from or through or into an applied layer, e.g. photoresist, nitrides the applied layer being silicon or silicide or SIPOS, e.g. polysilicon, porous silicon
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67098—Apparatus for thermal treatment
- H01L21/67115—Apparatus for thermal treatment mainly by radiation
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F10/00—Individual photovoltaic cells, e.g. solar cells
- H10F10/10—Individual photovoltaic cells, e.g. solar cells having potential barriers
- H10F10/14—Photovoltaic cells having only PN homojunction potential barriers
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F10/00—Individual photovoltaic cells, e.g. solar cells
- H10F10/10—Individual photovoltaic cells, e.g. solar cells having potential barriers
- H10F10/14—Photovoltaic cells having only PN homojunction potential barriers
- H10F10/146—Back-junction photovoltaic cells, e.g. having interdigitated base-emitter regions on the back side
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F71/00—Manufacture or treatment of devices covered by this subclass
- H10F71/121—The active layers comprising only Group IV materials
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F77/00—Constructional details of devices covered by this subclass
- H10F77/10—Semiconductor bodies
- H10F77/12—Active materials
- H10F77/122—Active materials comprising only Group IV materials
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F77/00—Constructional details of devices covered by this subclass
- H10F77/10—Semiconductor bodies
- H10F77/14—Shape of semiconductor bodies; Shapes, relative sizes or dispositions of semiconductor regions within semiconductor bodies
- H10F77/143—Shape of semiconductor bodies; Shapes, relative sizes or dispositions of semiconductor regions within semiconductor bodies comprising quantum structures
- H10F77/1433—Quantum dots
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
- Y02E10/547—Monocrystalline silicon PV cells
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
- Y02P70/00—Climate change mitigation technologies in the production process for final industrial or consumer products
- Y02P70/50—Manufacturing or production processes characterised by the final manufactured product
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- Engineering & Computer Science (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- Nanotechnology (AREA)
- Toxicology (AREA)
- Health & Medical Sciences (AREA)
- Liquid Deposition Of Substances Of Which Semiconductor Devices Are Composed (AREA)
- Photovoltaic Devices (AREA)
- Silicon Compounds (AREA)
- Recrystallisation Techniques (AREA)
- Thin Film Transistor (AREA)
- Chemical Vapour Deposition (AREA)
Abstract
Priority Applications (4)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| PH1/2014/500955A PH12014500955A1 (en) | 2011-11-01 | 2012-10-23 | Structures incorporating silicon nanoparticle inks, densified silicon materials from nanoparticle silicon deposits and corresponding methods |
| EP12846610.9A EP2774174A4 (fr) | 2011-11-01 | 2012-10-23 | Structures renfermant des encres à nanoparticules de silicium, matériaux de silicium densifié issus de dépôts de silicium en nanoparticules et procédés correspondants |
| JP2014539982A JP2015505791A (ja) | 2011-11-01 | 2012-10-23 | シリコンナノ粒子インクを内蔵する構造体、ナノ粒子シリコン堆積物から形成される高密度化シリコン材料、及び相応する方法 |
| KR20147014613A KR20150000466A (ko) | 2011-11-01 | 2012-10-23 | 실리콘 나노입자 잉크를 포함하는 구조체, 나노입자 실리콘 데파짓으로부터 얻어진 조밀화된 실리콘 물질 및 이들의 제조방법 |
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US13/286,888 US20130105806A1 (en) | 2011-11-01 | 2011-11-01 | Structures incorporating silicon nanoparticle inks, densified silicon materials from nanoparticle silicon deposits and corresponding methods |
| US13/286,888 | 2011-11-01 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| WO2013066669A2 WO2013066669A2 (fr) | 2013-05-10 |
| WO2013066669A3 true WO2013066669A3 (fr) | 2013-08-01 |
Family
ID=48171465
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| PCT/US2012/061456 Ceased WO2013066669A2 (fr) | 2011-11-01 | 2012-10-23 | Structures renfermant des encres à nanoparticules de silicium, matériaux de silicium densifié issus de dépôts de silicium en nanoparticules et procédés correspondants |
Country Status (7)
| Country | Link |
|---|---|
| US (2) | US20130105806A1 (fr) |
| EP (1) | EP2774174A4 (fr) |
| JP (1) | JP2015505791A (fr) |
| KR (1) | KR20150000466A (fr) |
| PH (1) | PH12014500955A1 (fr) |
| TW (1) | TW201334197A (fr) |
| WO (1) | WO2013066669A2 (fr) |
Families Citing this family (26)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI442587B (zh) * | 2011-11-11 | 2014-06-21 | Hon Hai Prec Ind Co Ltd | 外殼面板及使用該外殼面板的電子設備 |
| US8822262B2 (en) * | 2011-12-22 | 2014-09-02 | Sunpower Corporation | Fabricating solar cells with silicon nanoparticles |
| CN103247519B (zh) * | 2013-04-26 | 2016-01-20 | 京东方科技集团股份有限公司 | 低温多晶硅薄膜、薄膜晶体管、其制备方法及显示面板 |
| WO2014189886A1 (fr) * | 2013-05-24 | 2014-11-27 | Nanogram Corporation | Encres imprimables possédant des nanoparticules à base de silicium/germanium ayant des solvants à base d'alcool à viscosité élevée |
| US20150050816A1 (en) * | 2013-08-19 | 2015-02-19 | Korea Atomic Energy Research Institute | Method of electrochemically preparing silicon film |
| US9536632B2 (en) * | 2013-09-27 | 2017-01-03 | Sunpower Corporation | Mechanically deformed metal particles |
| US8999742B1 (en) * | 2013-12-10 | 2015-04-07 | Nthdegree Technologies Worldwide Inc. | Silicon microsphere fabrication |
| US10164255B2 (en) * | 2014-05-29 | 2018-12-25 | Kabushiki Kaisha Toyota Jidoshokki | Silicon material and negative electrode of secondary battery |
| WO2015182124A1 (fr) * | 2014-05-29 | 2015-12-03 | 株式会社豊田自動織機 | Matériau de silicium et électrode négative de pile secondaire |
| US9633843B2 (en) * | 2014-06-25 | 2017-04-25 | Global Wafers Co., Ltd | Silicon substrates with compressive stress and methods for production of the same |
| WO2016047615A1 (fr) * | 2014-09-24 | 2016-03-31 | 京セラ株式会社 | Dispositif et module de conversion photoélectrique |
| KR20170033951A (ko) * | 2015-09-17 | 2017-03-28 | 한국생산기술연구원 | 나노결정 박막이 형성된 태양전지 및 그 제조방법 |
| CN105806859B (zh) * | 2015-12-18 | 2020-11-03 | 中南大学 | 一种在非晶固体材料中表征有序度的方法 |
| US10593818B2 (en) * | 2016-12-09 | 2020-03-17 | The Boeing Company | Multijunction solar cell having patterned emitter and method of making the solar cell |
| CN109037250B (zh) * | 2017-06-12 | 2021-11-05 | 上海耕岩智能科技有限公司 | 一种影像侦测显示装置、器件及其制备方法 |
| KR102473123B1 (ko) | 2017-07-26 | 2022-12-01 | 고쿠리츠겐큐가이하츠호진 산교기쥬츠소고겐큐쇼 | 구조체, 그 적층체, 그 제조 방법 및 제조 장치 |
| JP7170509B2 (ja) * | 2018-11-12 | 2022-11-14 | キヤノン株式会社 | 半導体装置及びその製造方法、表示装置、光電変換装置、電子機器、照明装置並びに移動体 |
| US11404270B2 (en) | 2018-11-30 | 2022-08-02 | Texas Instruments Incorporated | Microelectronic device substrate formed by additive process |
| US10910465B2 (en) | 2018-12-28 | 2021-02-02 | Texas Instruments Incorporated | 3D printed semiconductor package |
| US10861715B2 (en) | 2018-12-28 | 2020-12-08 | Texas Instruments Incorporated | 3D printed semiconductor package |
| WO2020142282A2 (fr) * | 2018-12-31 | 2020-07-09 | Dow Silicones Corporation | Composition de soins personnels, procédé de préparation de la composition et procédé de traitement impliquant la composition |
| KR102341502B1 (ko) * | 2019-07-01 | 2021-12-21 | 김태현 | 애완동물용 배변 훈련장치 |
| KR20220106156A (ko) | 2019-11-27 | 2022-07-28 | 코닝 인코포레이티드 | 반도체 소자 제조용 유리 웨이퍼 |
| CN111053298B (zh) * | 2019-12-20 | 2022-03-15 | 深圳麦克韦尔科技有限公司 | 柔性发热体及其制造方法和柔性发热组件及气溶胶产生器 |
| GB202020732D0 (en) * | 2020-12-30 | 2021-02-10 | Rec Solar Pte Ltd | Solar cell |
| CN114639744A (zh) * | 2022-03-29 | 2022-06-17 | 通威太阳能(眉山)有限公司 | 太阳能电池及其制备方法 |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH10247737A (ja) * | 1997-03-05 | 1998-09-14 | Sanyo Electric Co Ltd | 機能性薄膜及び光起電力素子 |
| US20090071539A1 (en) * | 2007-09-18 | 2009-03-19 | Yong Woo Choi | Solar cell manufactured using amorphous and nanocrystalline silicon composite thin film, and process for manufacturing the same |
| JP2010067802A (ja) * | 2008-09-11 | 2010-03-25 | Seiko Epson Corp | 光電変換装置、電子機器、光電変換装置の製造方法および電子機器の製造方法 |
| KR20110057844A (ko) * | 2009-11-25 | 2011-06-01 | 주식회사 티지솔라 | 미세 입자가 형성된 적층형 태양전지 |
Family Cites Families (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4486943A (en) * | 1981-12-16 | 1984-12-11 | Inmos Corporation | Zero drain overlap and self aligned contact method for MOS devices |
| US4503601A (en) * | 1983-04-18 | 1985-03-12 | Ncr Corporation | Oxide trench structure for polysilicon gates and interconnects |
| JPH0282575A (ja) * | 1988-09-19 | 1990-03-23 | Toshiba Corp | 半導体装置およびその製造方法 |
| US7341907B2 (en) * | 2005-04-05 | 2008-03-11 | Applied Materials, Inc. | Single wafer thermal CVD processes for hemispherical grained silicon and nano-crystalline grain-sized polysilicon |
| US20080230782A1 (en) * | 2006-10-09 | 2008-09-25 | Homer Antoniadis | Photoconductive devices with enhanced efficiency from group iv nanoparticle materials and methods thereof |
| WO2008061131A2 (fr) * | 2006-11-15 | 2008-05-22 | Innovalight, Inc. | Procédé permettant de fabriquer un film mince de nanoparticules densifiées comprenant un ensemble de pores bouchés |
| US20090229664A1 (en) * | 2008-03-17 | 2009-09-17 | Nanopv Technologies Inc. | Method of manufacturing nanocrystalline photovoltaic devices |
| US7923368B2 (en) * | 2008-04-25 | 2011-04-12 | Innovalight, Inc. | Junction formation on wafer substrates using group IV nanoparticles |
| US20100047476A1 (en) * | 2008-08-21 | 2010-02-25 | Maa Jer-Shen | Silicon Nanoparticle Precursor |
| US20100154861A1 (en) * | 2008-12-23 | 2010-06-24 | Formfactor, Inc. | Printed solar panel |
| US8138070B2 (en) * | 2009-07-02 | 2012-03-20 | Innovalight, Inc. | Methods of using a set of silicon nanoparticle fluids to control in situ a set of dopant diffusion profiles |
| US8912083B2 (en) * | 2011-01-31 | 2014-12-16 | Nanogram Corporation | Silicon substrates with doped surface contacts formed from doped silicon inks and corresponding processes |
-
2011
- 2011-11-01 US US13/286,888 patent/US20130105806A1/en not_active Abandoned
-
2012
- 2012-10-23 PH PH1/2014/500955A patent/PH12014500955A1/en unknown
- 2012-10-23 KR KR20147014613A patent/KR20150000466A/ko not_active Withdrawn
- 2012-10-23 WO PCT/US2012/061456 patent/WO2013066669A2/fr not_active Ceased
- 2012-10-23 JP JP2014539982A patent/JP2015505791A/ja active Pending
- 2012-10-23 EP EP12846610.9A patent/EP2774174A4/fr not_active Withdrawn
- 2012-11-01 TW TW101140598A patent/TW201334197A/zh unknown
-
2014
- 2014-02-07 US US14/175,561 patent/US20140151706A1/en not_active Abandoned
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH10247737A (ja) * | 1997-03-05 | 1998-09-14 | Sanyo Electric Co Ltd | 機能性薄膜及び光起電力素子 |
| US20090071539A1 (en) * | 2007-09-18 | 2009-03-19 | Yong Woo Choi | Solar cell manufactured using amorphous and nanocrystalline silicon composite thin film, and process for manufacturing the same |
| JP2010067802A (ja) * | 2008-09-11 | 2010-03-25 | Seiko Epson Corp | 光電変換装置、電子機器、光電変換装置の製造方法および電子機器の製造方法 |
| KR20110057844A (ko) * | 2009-11-25 | 2011-06-01 | 주식회사 티지솔라 | 미세 입자가 형성된 적층형 태양전지 |
Also Published As
| Publication number | Publication date |
|---|---|
| EP2774174A2 (fr) | 2014-09-10 |
| EP2774174A4 (fr) | 2015-07-29 |
| US20130105806A1 (en) | 2013-05-02 |
| TW201334197A (zh) | 2013-08-16 |
| US20140151706A1 (en) | 2014-06-05 |
| WO2013066669A2 (fr) | 2013-05-10 |
| KR20150000466A (ko) | 2015-01-02 |
| JP2015505791A (ja) | 2015-02-26 |
| PH12014500955A1 (en) | 2014-06-30 |
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