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WO2012117731A1 - Manufacturing method for photoelectric converter - Google Patents

Manufacturing method for photoelectric converter Download PDF

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Publication number
WO2012117731A1
WO2012117731A1 PCT/JP2012/001401 JP2012001401W WO2012117731A1 WO 2012117731 A1 WO2012117731 A1 WO 2012117731A1 JP 2012001401 W JP2012001401 W JP 2012001401W WO 2012117731 A1 WO2012117731 A1 WO 2012117731A1
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WO
WIPO (PCT)
Prior art keywords
substrate
cbd
photoelectric conversion
drum
surface treatment
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
PCT/JP2012/001401
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French (fr)
Japanese (ja)
Inventor
河野 哲夫
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Fujifilm Corp
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Fujifilm Corp
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Filing date
Publication date
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Publication of WO2012117731A1 publication Critical patent/WO2012117731A1/en
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    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10FINORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F77/00Constructional details of devices covered by this subclass
    • H10F77/10Semiconductor bodies
    • H10F77/12Active materials
    • H10F77/126Active materials comprising only Group I-III-VI chalcopyrite materials, e.g. CuInSe2, CuGaSe2 or CuInGaSe2 [CIGS]
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C18/00Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating
    • C23C18/16Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating by reduction or substitution, e.g. electroless plating
    • C23C18/1601Process or apparatus
    • C23C18/1603Process or apparatus coating on selected surface areas
    • C23C18/1605Process or apparatus coating on selected surface areas by masking
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C18/00Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating
    • C23C18/16Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating by reduction or substitution, e.g. electroless plating
    • C23C18/52Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating by reduction or substitution, e.g. electroless plating using reducing agents for coating with metallic material not provided for in a single one of groups C23C18/32 - C23C18/50
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02EREDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
    • Y02E10/00Energy generation through renewable energy sources
    • Y02E10/50Photovoltaic [PV] energy
    • Y02E10/541CuInSe2 material PV cells
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02PCLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
    • Y02P70/00Climate change mitigation technologies in the production process for final industrial or consumer products
    • Y02P70/50Manufacturing or production processes characterised by the final manufactured product

Definitions

  • the present invention relates to a method for producing a compound semiconductor photoelectric conversion element.
  • a photoelectric conversion element including a photoelectric conversion layer and an electrode connected to the photoelectric conversion layer is used for applications such as solar cells.
  • Si-based solar cells using bulk single crystal Si or polycrystalline Si, or thin-film amorphous Si have been mainstream, but research and development of Si-independent compound semiconductor solar cells has been made. ing.
  • Known compound semiconductor solar cells include bulk systems such as GaAs systems and thin film systems such as CIS or CIGS systems composed of group Ib elements, group IIIb elements, and group VIb elements.
  • CIS and CIGS are collectively referred to as “CI (G) S”.
  • a CdS buffer layer and an environmental load are generally placed between a photoelectric conversion layer and a translucent conductive layer (transparent electrode) formed thereon.
  • a ZnS buffer layer not containing Cd is provided.
  • the buffer layer plays a role such as (1) prevention of recombination of photogenerated carriers, (2) band discontinuous matching, (3) lattice matching, and (4) coverage of the surface irregularities of the photoelectric conversion layer.
  • the surface irregularity of the photoelectric conversion layer is relatively large, and the film formation by the CBD (Chemical Bath Deposition) method, which is a liquid phase method, is particularly necessary because the condition (4) above must be satisfied satisfactorily. Is preferred.
  • Patent Documents 1 to 4 propose a process for forming a buffer layer using a CBD method.
  • Patent Documents 1 to 3 disclose a so-called batch type (single-wafer type) film forming method in which an inflexible substrate such as a glass substrate is immersed in a reaction solution containing a raw material compound for a buffer layer.
  • Patent Document 4 discloses a so-called roll-to-roll (Roll) roll that uses a supply roll obtained by winding a flexible substrate in a roll shape and a take-up roll for winding a film-formed substrate in a roll shape.
  • Roll roll-to-roll
  • the manufacturing apparatus described in Patent Document 4 is configured so that the substrate is immersed in the CBD reaction solution with the front and back surfaces thereof exposed, and is transported through the reaction solution, and is dissolved in the CBD reaction solution.
  • the CBD is continuously applied after protecting the end surface or back surface of the substrate. The law cannot be enforced.
  • the present invention has been made in view of the above circumstances, and includes a step of forming a buffer layer without dissolving the substrate, and a step before and after the buffer layer, even if the substrate includes a portion that dissolves in the CBD reaction solution.
  • An object of the present invention is to provide a method for manufacturing a photoelectric conversion element that can realize high productivity.
  • the method for producing a photoelectric conversion element of the present invention includes a laminated structure of a buffer layer and a light-transmitting conductive layer on the photoelectric conversion semiconductor layer of a flexible substrate including a lower electrode and a photoelectric conversion semiconductor layer.
  • a surface treatment step of immersing the photoelectric conversion semiconductor layer surface in a surface treatment liquid having A post-surface treatment water washing step of washing the substrate that has been surface-treated in the surface treatment liquid with water; A post-surface treatment water removal step for removing water adhering to the substrate in the post-surface treatment water washing step;
  • a reaction tank filled with a CBD reaction solution that immerses a part of the drum that closely supports the substrate, the end of the substrate that is closely supported by the drum, and the drum Using a CBD film forming apparatus having a protective member that protects the CBD reaction liquid by overlapping a portion where the substrate does not adhere, and a portion of the end of the substrate and the drum that does not adhere to the drum by
  • the method for producing a photoelectric conversion element of the present invention it is preferable to perform heat treatment for heat-treating the substrate at 150 ° C. or more and 250 ° C. or less after the post-CBD drying step.
  • the substrate is heated to a temperature equal to or higher than the predetermined film formation temperature in the CBD step before the CBD step.
  • the substrate is heated directly by the heater, or the surface treatment solution used in the surface treatment step, the water used in the post-surface treatment water washing step, and the heated solution.
  • a method using indirect heating by immersing the substrate in the substrate can be applied.
  • the substrate examples include an anodized substrate in which an anodized film mainly composed of Al 2 O 3 is formed on at least one surface side of an Al base material mainly composed of Al, and an Fe material mainly composed of Fe.
  • An anodized film mainly composed of Al 2 O 3 is formed on at least one surface side of a base material on which an Al film composed mainly of Al is formed on at least one surface side of an Fe material containing bismuth as a main component It is preferable to use a substrate provided with any one of the anodized substrates.
  • CBD reaction solution In a mixed solution at room temperature in which water is mixed with component (Z) that is at least one zinc source, component (S) that is at least one sulfur source, component (C) that is at least one citric acid compound
  • component (N) At least one component (N) selected from the group consisting of ammonia and ammonium salts is mixed at room temperature
  • the concentration of the component (C) is 0.001 to 0.25M
  • the concentration of the component (N) is 0.001 to 0.40 M
  • a Zn compound layer is preferably formed as the buffer layer.
  • the surface treatment liquid is preferably an aqueous solution containing a compound having a cyano group or an amino group.
  • potassium cyanide is preferable.
  • the compound having an amino group is preferably at least one selected from ethylenediamine, diethylenetriamine, triethylenetetramine, tetraethylenepentamine, and pentaethylenehexamine.
  • the back surface of the substrate is brought into close contact with the drum, and the end portion of the substrate and the portion of the drum where the substrate does not adhere are overlapped by a protective member and protected from the CBD reaction liquid. Since the substrate is immersed in the CBD reaction solution, even if the substrate contains a component that dissolves in the CBD reaction solution, a buffer film is formed by the CBD method without eluting such a component from the substrate. Is possible.
  • a process before and after the formation of a buffer layer is clearly established from the surface treatment of the photoelectric conversion semiconductor layer to the cleaning after the formation of the buffer layer and the cleaning liquid removal treatment, and high photoelectric conversion is achieved.
  • An efficient photoelectric conversion element can be manufactured with high productivity.
  • FIG. 1 It is a schematic sectional drawing which shows the layer structure of the photoelectric conversion element produced with the manufacturing method of this invention. It is a schematic perspective view which shows the CBD film-forming apparatus used with the manufacturing method of this invention. It is a schematic sectional drawing of the CBD film-forming apparatus shown in FIG. It is a schematic sectional drawing which shows one Embodiment of the protection member which protects a board
  • FIG. 1 is a schematic cross-sectional view showing a layer structure of a photoelectric conversion element manufactured by the manufacturing method of the present invention.
  • FIG. 1 only one photoelectric conversion element (cell) of an integrated solar cell is shown to show the layer structure of the photoelectric conversion element, but the manufacturing method of the present invention is an integration with a large number of photoelectric conversion elements. It is suitable for manufacturing a solar cell.
  • the photoelectric conversion element 101 includes a lower electrode 20, a photoelectric conversion semiconductor layer 30 that generates hole / electron pairs by light absorption, a buffer layer 40, and a window layer 50 on a substrate 10.
  • a light-transmissive conductive layer (transparent electrode) 60 and an upper electrode (grid electrode) 70 are sequentially stacked.
  • FIG. 2 is a schematic perspective view showing the CBD film forming apparatus
  • FIG. 3 is a schematic cross-sectional view of the CBD film forming apparatus shown in FIG.
  • the reaction vessel is illustrated as being transparent.
  • the CBD film forming apparatus 1 shown in FIGS. 2 and 3 includes a drum 3 that closely supports a long flexible substrate A, and a CBD reaction solution 4 that immerses a part of the drum 3 that closely supports the substrate A.
  • the member 6 is provided with a drive unit (not shown) for causing the substrate A, which is brought into close contact with the drum 3 in accordance with the peripheral speed of the drum 3, and the protective member 6 to co-run in the CBD reaction solution 4.
  • a take-up roll 12 is provided, and feed rolls 13 and 14 are provided between the take-up roll 11 and the drum 3, and between the take-up roll 12 and the drum 3, respectively.
  • a winding roll 15 for winding the protective member 6 in a roll shape is provided between the drum 3 and the feed roll 13, and a winding for winding the protective member 6 between the drum 3 and the feed roll 14.
  • Each roll 16 is provided.
  • the protective member 6 fed from the unwinding roll 15 can overlap the short-side end portion of the substrate A and the portion of the drum 3 where the substrate A does not adhere.
  • Each of the winding rolls 12 and 16 is provided with a drive unit (not shown), and the substrate A and the protective member 6 which are brought into close contact with the drum 3 in accordance with the peripheral speed of the drum 3 (synchronized) are subjected to a CBD reaction. It can be made to co-run in the liquid 4.
  • the drive units provided on the take-up rolls 12 and 16 drive the take-up rolls 12 and 16, respectively, and the substrate A and the protective member 6 after the CBD thin film is formed on the take-up rolls 12 and 16, respectively.
  • the winding rolls 12 and 16 are simply rotatable and have a function of feeding out the substrate A and the protective member 6, and are controlled by separate driving units downstream thereof.
  • positioned may be sufficient.
  • the drum 3 itself is simply rotatable, and the drum 3 is transported in a state where only one surface of the substrate A is immersed in the CBD reaction solution 4 by driving the driving unit described above.
  • the drum 3 may be provided with a drive source and rotate itself.
  • FIG. 4 is a schematic sectional view showing an embodiment of a protective member for protecting the substrate.
  • the protection member 6 can overlap the short-side end portion of the long substrate A and the portion of the drum 3 where the substrate A does not adhere. By overlapping in this way, the CBD reaction solution 4 does not enter and contact the back surface (side in close contact with the drum 3) and the end surface of the substrate A, and the substrate A is temporarily dissolved in the CBD reaction solution. Even if a component containing such a component is included, a CBD thin film can be formed without eluting such a component from the substrate A.
  • the protective member 6 is preferably made of a material such as Viton rubber or silicon rubber in order to ensure adhesion to the substrate A. Alternatively, even if the entire protective member 6 is not made of such a material, a mode in which a material having adhesiveness is applied to at least the side in close contact with the substrate A may be adopted.
  • the drum 3 is configured to be able to closely support the substrate A on the drum 3 by magnetism.
  • a permanent magnet which itself has the property of a magnet and can attract a magnetic material such as iron
  • the substrate A may be a magnetic material. In this case, the substrate A can be tightly supported on the drum 3 by magnetism.
  • a metal plate 7 (magnetic metal plate such as SUS316) that is a magnetic material is further overlapped on the protective member 6.
  • the substrate A can be magnetically closely supported on the drum 3 (in FIG. 5, the same components as those in FIG. 4 are given the same reference numerals, and description thereof will be omitted unless particularly required).
  • the metal plate 7 may be fixed by a holding spring 8 as shown in FIG.
  • this presser spring 8 is provided in multiple places over the perimeter of the drum 3, in the part in which the drum 3 is immersed in the reaction liquid, as shown in the upper figure of FIG. After being pressed from above and separated from the reaction solution, control is performed so as to leave the metal plate 7 as shown in the lower diagram of FIG.
  • a pressure drum 9 that presses the protective member 6 against the drum 3 may be provided. It is preferable that a plurality of the pressure drums 9 are provided at the opposing portions of the drum 3 immersed in the reaction solution.
  • the drum 3 includes a heating unit that heats the substrate A that is closely supported from the back surface.
  • the CBD reaction solution is heated to perform the reaction, but by heating the substrate A from the back surface, film formation with less variation in film thickness can be performed.
  • the temperature of the substrate is equal to or higher than the temperature of the CBD reaction solution.
  • the heating means include a mode in which a heater is provided in the drum 3 and a mode in which a medium (for example, water or oil) heated in the drum is circulated.
  • the substrate A is protected by the protective member 6 unwound from the unwinding roll 15 before being immersed in the reaction liquid 4, and the protective member 6 is unwound by the take-up roll 16 after being detached from the reaction liquid 4.
  • the protective member 6 may be provided in advance on the long substrate A wound around the unwinding roll 11 in a roll shape.
  • the protective member 6 may protect the end of the long substrate A in the short direction from both sides.
  • the portion of the drum 3 where the substrate A is in close contact is formed as a convex portion as shown in FIG.
  • a portion where the substrate A is in close contact may be formed as a convex portion, and a concave portion may be provided in advance in a part of the drum 3 on which the protective member 6 travels so as not to meander the substrate A.
  • a plurality of protective members 6 as shown in FIG. 10 may be provided over the entire length of the substrate A from the beginning on the long substrate A wound around the unwinding roll 11 in a roll shape.
  • a state where one protective member 6 is arranged is shown.
  • L 1 the width of the long substrate ⁇ L 2 and L 2 ⁇ the width of the drum.
  • L 3 of the protection member 6 is preferably set to a length equal to or less than the circumference in the drum rotation direction.
  • a flexible substrate A comprising the lower electrode 20 and the photoelectric conversion semiconductor layer 30 after the lower electrode 20 and the photoelectric conversion semiconductor layer 30 are sequentially formed on the substrate 10.
  • the surface of the photoelectric conversion semiconductor layer 30 is immersed in a surface treatment solution (surface treatment step), and the substrate A subjected to the surface treatment in the surface treatment solution is washed with water (water treatment step after surface treatment) and after the surface treatment.
  • the water adhering to the substrate A is removed in the water washing step (water removal step after the surface treatment), and the substrate A is not in close contact with the end portion of the substrate A and the drum 3 by the protective member 6 using the CBD film forming apparatus 1 described above.
  • the buffer layer 40 is formed on the photoelectric conversion semiconductor layer 30 in the reaction solution 4 (CBD process), and the substrate A after the buffer layer 40 is formed is immersed in the cleaning liquid and cleaned (post-CBD cleaning process). The cleaning liquid adhering to the substrate A is removed (post-CBD cleaning liquid removing step).
  • the flexible substrate A used in the manufacturing method of the present invention is a flexible substrate in which the lower electrode 20 and the photoelectric conversion semiconductor layer 30 are formed in advance on the substrate 10.
  • substrate 10 contains the component which melt
  • a substrate containing a metal, a metal oxide, a metal hydroxide or the like capable of forming a complex ion with a hydroxide ion is used. This effect can be obtained, and more specifically, it can be effectively applied to a substrate containing Al.
  • the substrate 10 is an anodized substrate in which an anodized film containing Al 2 O 3 as a main component is formed on at least one surface side of an Al base material containing Al as a main component, and Fe as a main component.
  • the main component of the photoelectric conversion semiconductor layer 30 is not particularly limited and is preferably a compound semiconductor having at least one chalcopyrite structure because high conversion efficiency is obtained.
  • the Ib group element, the IIIb group element, and the VIb group More preferably, it is at least one compound semiconductor composed of an element.
  • Cu 2 ZnSnS 4, Cu 2 ZnSnSe 4, Cu 2 ZnSn (S, Se) may be a four.
  • the film thickness of the photoelectric conversion semiconductor layer is not particularly limited, and is preferably 1.0 ⁇ m to 4.0 ⁇ m, particularly preferably 1.5 ⁇ m to 3.5 ⁇ m.
  • the surface treatment liquid for example, an ammonia-containing aqueous solution, a compound-containing aqueous solution having a cyano group or an amino group can be used.
  • KCN potassium cyanide
  • the compound having an amino group contained in the surface treatment liquid is preferably a compound having at least two amino groups in one molecule (hereinafter also simply referred to as an amino group-containing compound).
  • an amino group-containing compound ethylenediamine (EDA ), Diethylenetriamine (DETA), triethylenetetramine (TETA), tetraethylenepentamine (TEPA), or pentaethylenehexamine (PEHA), and these may be used alone, Two or more types may be appropriately mixed and used.
  • amino group-containing compounds are contained in the surface treatment solution in an amount of 1 to 30% by mass, preferably 5 to 25% by mass, and more preferably 10 to 20% by mass.
  • Hydrogen peroxide is preferably contained in the surface treatment solution in an amount of 0.01% by mass to 10% by mass, preferably 0.05% by mass to 8% by mass, and more preferably 0.1% by mass to 5% by mass.
  • the surface treatment liquid can be prepared by dissolving the amino group-containing compound and hydrogen peroxide in water.
  • the time for bringing the photoelectric conversion semiconductor layer into contact with the surface treatment liquid depends on the concentration of the surface treatment liquid, but is preferably about several seconds to several tens of minutes.
  • the buffer layer it is preferable to form the buffer layer within 60 minutes after this surface treatment, and it is more preferable to form the buffer layer within 10 minutes.
  • “within 60 minutes after the surface treatment” means a time immediately after the completion of the surface treatment, and it is preferable to start the CBD step within 60 minutes including the water washing step and the drying step after the surface treatment.
  • the substrate A is washed with water.
  • the temperature of water is preferably 20 ° C. or higher.
  • the water washing method may be a method of immersing in a water tank and washing with water or shower washing.
  • washing water pure water, ion exchange water, industrial water, or the like can be used.
  • the film forming temperature (deposition temperature) of the constituent material of the buffer layer described later is preferably 70 ° C. or higher.
  • the substrate A is immersed before the substrate A is immersed in the reaction tank 5 filled with the CBD reaction liquid 4. It is preferable to warm A to a temperature equal to or higher than the film formation temperature.
  • the preheating of the substrate may be further provided with a preheating step in addition to the above steps and heated by a heater or the like.
  • a preheating step in addition to the above steps and heated by a heater or the like.
  • the surface treatment step, the post-surface treatment water washing step, and the post-surface treatment water are performed as follows. It is preferable to carry out simultaneously in the removal step or the like.
  • the ammonia-containing aqueous solution or the amine compound-containing aqueous solution used as the surface treatment liquid is heated, and the substrate is preheated simultaneously with the surface treatment by immersing the substrate in the heated aqueous solution.
  • the substrate can be preheated simultaneously with the water washing by heating the water and immersing the substrate in the heated water.
  • preheating with a heater may be performed.
  • the temperature may be set gradually higher so that the temperature is equal to or higher than the film formation temperature immediately before the CBD process. It may be made to become. Moreover, you may perform a heating only after a water washing process, or in a water removal process.
  • the substrate temperature is preferably equal to or higher than the film formation temperature immediately before being immersed in the CBD reaction solution.
  • CBD process After the surface treatment of the photoelectric conversion semiconductor layer, a buffer layer is formed on the photoelectric conversion semiconductor layer of the substrate that has been washed and removed with water.
  • the buffer layer 40 is formed on the photoelectric conversion semiconductor layer 30 in the reaction vessel 5 of the CBD film forming apparatus 1.
  • the protective member 6 wound in a roll shape is simultaneously fed from the unwinding roll 15, and the short-side end of the substrate A that is closely supported by the drum 3, and the drum 3 are overlapped so that the protective member 6 can prevent the CBD reaction liquid 4 from contacting the back surface and the end surface of the substrate A.
  • a part of the drum 3, for example, the center of the drum 3 is immersed in the CBD reaction solution 4 in the reaction tank 5.
  • the liquid level of the CBD reaction liquid 4 in the reaction tank 5 is at a position lower than the position where the substrate A and the protective member 6 that overlaps the substrate A start to contact.
  • the driving unit of the CBD device 1 is driven, and the substrate A and the protective member 6 that are in close contact with the drum 3 in synchronism with the peripheral speed of the drum 3 are caused to co-run in the CBD reaction solution 4, so A buffer layer is formed on one surface that is not in close contact, that is, on the surface of the photoelectric conversion semiconductor layer. Since the reaction solution contacts only the photoelectric conversion semiconductor layer surface of the substrate A on which the buffer layer is deposited, even if the substrate contains a component that dissolves in the CBD reaction solution, such a component is eluted from the substrate. It is possible to form the buffer layer without causing it. Further, since the CBD reaction solution 4 does not enter the back surface of the substrate A (the side in close contact with the drum 3), it is possible to suppress the formation of a buffer layer on the back surface of the substrate A.
  • the CBD method uses a general formula [M (L) i ] m + ⁇ M n + + iL (where M is a metal element such as Cd, Zn, In, Sn, L is a ligand, m, n, i: positive number
  • M is a metal element such as Cd, Zn, In, Sn
  • L is a ligand
  • m, n, i positive number
  • Examples of the CBD reaction liquid include those containing a metal (M) source such as Cd or Zn and a sulfur source. Thereby, a buffer layer of CdS, ZnS, Zn (S, O), Zn (S, O, OH) can be formed.
  • a sulfur source a compound containing sulfur, for example, thiourea (CS (NH 2 ) 2 ), thioacetamide (C 2 H 5 NS), thiosemicarbazide, thiourethane, diethylamine, triethanolamine, etc. may be used. it can.
  • the sulfur source a Cd compound (for example, cadmium sulfate, cadmium acetate, cadmium nitrate, cadmium chloride, and a hydrate thereof), ammonia water or ammonium salt (for example, CH 3 COONH 4 , A mixed solution of NH 4 Cl, NH 4 I and (NH 4 ) 2 SO 4 or the like) can be used as a reaction solution.
  • a Cd compound for example, cadmium sulfate, cadmium acetate, cadmium nitrate, cadmium chloride, and a hydrate thereof
  • ammonia water or ammonium salt for example, CH 3 COONH 4 ,
  • a mixed solution of NH 4 Cl, NH 4 I and (NH 4 ) 2 SO 4 or the like can be used as a reaction solution.
  • the reaction temperature is preferably 70 to 95 ° C.
  • the reaction time may be about 5 to 60 minutes.
  • CdS is a suitable material for the buffer layer, but Cd is highly toxic and is not preferable in terms of environmental load.
  • the buffer layer 40 is more preferably a Cd-free metal compound, for example, a Zn compound layer mainly composed of Zn (S, O) and / or Zn (S, O, OH).
  • the buffer layer 40 is a Zn compound layer mainly composed of Zn (S, O) and / or Zn (S, O, OH), at least one component (Z) as a zinc source, at least one A component (S) that is a sulfur source of the component, a component (C) that is at least one citric acid compound, a component (N) that is at least one selected from the group consisting of ammonia and an ammonium salt, and water.
  • concentration of the component (C) is 0.001 to 0.25M
  • the concentration of the component (N) is 0.001 to 0.40M
  • the pH before starting the reaction is 9.0 to 12.0M. It is preferable to use a reaction solution that is
  • the component (Z) is not particularly limited, and preferably contains at least one selected from the group consisting of zinc sulfate, zinc acetate, zinc nitrate, zinc chloride, zinc carbonate, and hydrates thereof.
  • the concentration of component (Z) is not particularly limited and is preferably 0.001 to 0.5M.
  • the component (S) is not particularly limited, and preferably contains thiourea.
  • the concentration of component (S) is not particularly limited and is preferably 0.01 to 1.0M.
  • Component (C) is a component that functions as a complex-forming agent and the like, and a complex is easily formed by optimizing the type and concentration of component (C).
  • component (C) which is at least one kind of citric acid compound
  • a complex is more easily formed than in a reaction solution that does not use a citric acid compound, crystal growth by the CBD reaction is well controlled, and the base is covered well. Thus, a stable film can be formed.
  • Component (C) is not particularly limited, and preferably contains sodium citrate and / or a hydrate thereof.
  • the concentration of component (C) is 0.001 to 0.25M. If the concentration of the component (C) is within this range, the complex is formed satisfactorily, and a film that satisfactorily covers the base can be stably formed. When the concentration of component (C) exceeds 0.25M, a stable aqueous solution in which the complex is well formed is obtained, but on the other hand, the progress of the precipitation reaction on the substrate is slow or the reaction does not proceed at all. There is.
  • the concentration of component (C) is preferably 0.001 to 0.1M.
  • Component (N) is a component that functions as a pH adjuster or the like, but is also a component that functions as a complexing agent or the like.
  • the ammonium salt suitable for use as the component (N) is not particularly limited, and examples thereof include NH 4 OH.
  • the concentration of component (N) is 0.001 to 0.40M.
  • the solubility and supersaturation degree of metal ions can be adjusted by adjusting the pH with the component (N). If the concentration of component (N) is within the range of 0.001 to 0.40M, the reaction rate is fast, and film formation is carried out at a practical production rate without providing a fine particle layer formation step before the film formation step. can do. When the concentration of the component (N) exceeds 0.40 M, the reaction rate becomes slow, and it is necessary to devise such as adding a fine particle layer before the film forming step.
  • the concentration of component (N) is preferably 0.01 to 0.30M.
  • the pH of the reaction solution before starting the reaction is 9.0 to 12.0.
  • the decomposition reaction of the component (S) such as thiourea does not proceed, or even if it proceeds, the precipitation reaction does not proceed.
  • the decomposition reaction of thiourea is as follows. The decomposition reaction of thiourea is described in J. Electrochem. Soc., Vol. 141, No. 1, January 1994, and Journal of Crystal Growth 299 (2007) 136-141. SC (NH 2 ) 2 + OH ⁇ ⁇ SH ⁇ + CH 2 N 2 + H 2 O, SH - + OH ⁇ ⁇ S 2 + + H 2 O.
  • the pH of the reaction solution before the start of the reaction exceeds 12.0, the effect that the component (N) that also functions as a complexing agent or the like makes a stable solution increases, and the precipitation reaction does not proceed or proceeds. It will be very slow.
  • the pH of the reaction solution before starting the reaction is preferably 9.5 to 11.5.
  • the pH of the reaction solution before starting the reaction usually does not require special pH adjustment such as using a pH adjuster other than the component (N). Is in the range of 9.0 to 12.0.
  • the pH after completion of the reaction of the reaction solution is not particularly limited.
  • the pH of the reaction solution after completion of the reaction is preferably 7.5 to 11.0.
  • the pH of the reaction solution after completion of the reaction is less than 7.5, it means that the reaction does not proceed, and it is meaningless when considering efficient production.
  • the pH of the reaction solution after completion of the reaction is more than 11.0, the decomposition of thiourea is promoted, but since most of the zinc ions are stabilized as ammonium complexes, the progress of the precipitation reaction may be remarkably slowed.
  • the pH of the reaction solution after completion of the reaction is more preferably 9.5 to 10.5.
  • the pH of the reaction solution after the start of the reaction is usually in the range of 7.5 to 11.0 without special pH adjustment such as using a pH adjusting agent other than the component (N). .
  • the reaction temperature is 70 to 95 ° C. If the reaction temperature is less than 70 ° C., the reaction rate becomes slow, and the thin film does not grow, or even if the thin film is grown, it is difficult to obtain a desired thickness (for example, 50 nm or more) at a practical reaction rate. When the reaction temperature exceeds 95 ° C., generation of bubbles and the like increases in the reaction solution, which adheres to the film surface and makes it difficult to grow a flat and uniform film. Furthermore, when the reaction is carried out in an open system, a concentration change due to evaporation of the solvent or the like occurs, making it difficult to maintain stable thin film deposition conditions.
  • the reaction temperature is preferably 80 to 90 ° C.
  • the reaction time is not particularly limited. Although the reaction time depends on the reaction temperature, for example, the base can be satisfactorily covered in 10 to 60 minutes, and a layer having a sufficient thickness as a buffer layer can be formed.
  • the reaction solution is aqueous.
  • the pH of the reaction solution is not a strong acid condition.
  • the pH of the reaction solution may be 11.0 to 12.0, but the reaction can be carried out under mild pH conditions of less than 11.0.
  • the reaction temperature is not so high. Therefore, the environmental load is small and the damage to the substrate can be kept small.
  • the buffer layer 40 When the buffer layer 40 is formed, colloidal solid matter may adhere to the surface of the buffer layer 40. If this colloidal solid is left as it is, it may not be possible to maintain high resistance at the buffer layer coating and improve the conversion efficiency of the solar cell. In addition, when this colloidal solid is a protrusion, if a light-transmitting conductive layer is formed thereon, it may be peeled off along with the protrusion during the film forming process or after film formation. . Therefore, after the buffer layer is formed by the CBD process, the surface of the buffer layer is cleaned.
  • the cleaning liquid it is preferable to use pure water, ion exchange water, industrial water, or a solution obtained by adding an additive having a colloid removing effect to water.
  • the temperature of the cleaning liquid is preferably 20 ° C. to 40 ° C.
  • the cleaning method may be performed by immersing in a water tank or shower cleaning.
  • the cleaning liquid adhering to the cleaned substrate is removed by spraying dry air or nitrogen on the front and back surfaces of the substrate.
  • the temperature is 150 ° C. to 250 ° C., preferably 170 ° C. It is preferable to provide a heat treatment process (annealing process) in which heating is performed at 210 ° C. for 5 minutes to 60 minutes.
  • the heating atmosphere is not particularly limited in air or vacuum.
  • the heating means is not particularly limited, but heating using a commercially available oven, electric furnace, vacuum oven or the like is preferable.
  • the window layer 50 is an intermediate layer that captures light.
  • the window layer 50 is not particularly limited as long as it has a light-transmitting property for taking in light, but i-ZnO or the like is preferable as the composition in consideration of the band gap.
  • the thickness of the window layer 50 is not particularly limited, and is preferably 10 nm to 2 ⁇ m, and more preferably 15 to 200 nm.
  • the method for forming the window layer 50 is not particularly limited, but a sputtering method or an MOCVD method is suitable.
  • the buffer layer 40 is manufactured by the liquid phase method, it is also preferable to use the liquid phase method in order to simplify the manufacturing process.
  • the window layer 50 is not essential, and there is a photoelectric conversion element without the window layer 50.
  • the translucent conductive layer 60 is a layer that captures light and functions as an electrode that is paired with the lower electrode 20 and through which charges generated in the photoelectric conversion semiconductor layer 30 flow.
  • the composition of the translucent conductive layer 60 is not particularly limited, and n-ZnO such as ZnO: Al, ZnO: Ga, and ZnO: B is preferable.
  • the film thickness of the translucent conductive layer 60 is not particularly limited and is preferably 50 nm to 2 ⁇ m.
  • the film forming method of the translucent conductive layer 60 is not particularly limited, but the sputtering method and the MOCVD method are suitable as with the window layer. On the other hand, in order to simplify the manufacturing process, it is also preferable to use a liquid phase method.
  • the upper electrode 70 is provided on the translucent conductive layer 60.
  • the main component of the upper electrode 70 is not particularly limited, and examples thereof include Al.
  • the thickness of the upper electrode 70 is not particularly limited and is preferably 0.1 to 3 ⁇ m.
  • the upper electrode is provided in a cell serving as a power extraction end among cells connected in series.
  • the manufacturing process of the photoelectric conversion element described above may include other processes than the processes described above.
  • a patterning process for integration such as a scribing process of the lower electrode, a scribing process after forming the photoelectric conversion layer, a scribing process after forming the buffer layer and the transparent conductive layer, and one module when using a long substrate
  • An integrated photoelectric conversion device integrated solar cell
  • the buffer layer can be formed without dissolving the substrate components.
  • the manufacturing process before and after the buffer layer forming step for manufacturing a highly efficient photoelectric conversion element has been clarified. It becomes possible to manufacture with high productivity.
  • the method for producing a photoelectric conversion element of the present invention continuously rolls from the surface treatment process of the photoelectric conversion semiconductor layer 30 to the post-CBD cleaning liquid removal process when a long flexible substrate is used as the substrate 10. ⁇ It can be done by the to-roll method.
  • the roll-to-roll method In the roll-to-roll method, a flexible substrate wound in a roll shape is drawn out, and intermittently or continuously conveyed, and a process until winding up by a winding roll is performed. Since it is possible to batch-process long substrates of the order, it is preferable because it can be easily mass-produced. Comparing the roll-to-roll method with the single-wafer method that transports individually separated substrates for each process, the single-wafer method requires the provision of a substrate loading and unloading unit for each process.
  • the scale of the equipment for each process tends to be large, but in the roll-to-roll method, the base material flows intermittently or continuously between the processes, so the processes can be connected to each other, and the work involved in transporting the base material Reduction and downsizing of the device are possible.
  • FIG. 11 shows a schematic configuration of the manufacturing apparatus 100.
  • the manufacturing apparatus 100 includes a surface treatment process and a surface treatment between the unwinding roll 11 and the CBD reaction tank 5 of the CBD apparatus 1 shown in FIG. Zones a to c for performing a post-water washing process and a post-surface treatment water removal process are provided, and further, a post-CBD cleaning is performed between the CBD reaction tank 5 and the take-up roll 12, which is the zone d for performing the CBD process. Zones e and f for performing each step of the process and the post-CBD cleaning liquid removal process are provided.
  • the substrate A after the photoelectric conversion semiconductor layer is formed (the component shown by A in FIG. 1 is elongated) is wound around the unwinding roll 11 in a roll shape, After the surface treatment of A, water washing and water removal (drying) are performed, and then a buffer layer is formed, and further washing and cleaning liquid removal (drying) are performed, and the film is taken up by the take-up roll 12.
  • the substrate A unwound from the unwinding roll 11 is guided by a guide roll (feeding-out roll) 35 and transported to the zone of each process.
  • the plurality of guide rolls 35 are appropriately disposed at locations where adjustment of the transport direction of the substrate A is necessary.
  • the ones arranged on the film formation surface side of the substrate are rolls that can support the substrate only by the edge portion of the substrate so as not to damage the film formation surface. is there.
  • the surface treatment process zone a is provided with a drum 23 similar to the drum 3 of the CBD device, and a liquid tank 25 filled with a surface treatment liquid 24 in which the drum is immersed, and the substrate A is a photoelectric conversion semiconductor. It is immersed in the surface treatment liquid 24 in a state of being in close contact with the drum 23 so that the layer 30 becomes the surface.
  • a first water tank 27 filled with pure water 26 is provided in the post-surface treatment rinsing process zone b.
  • the substrate A is washed with water by being conveyed in the pure water 26 of the first water tank 27 along the guide roll 35.
  • the post-surface treatment water removal step zone c is provided with a blower 31 that blows dry air onto the front and back surfaces of the substrate A.
  • a blower 31 that blows dry air onto the front and back surfaces of the substrate A.
  • dry air is blown onto the substrate, and the substrate is washed with water. Water adhering to the front and back is removed.
  • the CBD device 1 is provided, and the buffer layer 40 is formed on the photoelectric conversion semiconductor layer 30 in the reaction tank 5 of the CBD device 1.
  • a second water tank 29 filled with the cleaning liquid 28 is provided in the post-CBD cleaning process zone e.
  • the substrate A is cleaned by being conveyed in the cleaning liquid 28 of the second water tank 29 along the guide roll 35.
  • the post-CBD cleaning liquid removal process zone f is provided with a blower 32 that blows dry air onto the front and back surfaces of the substrate A.
  • a blower 32 that blows dry air onto the front and back surfaces of the substrate A.
  • dry air is sprayed onto the substrate, and the substrate and buffer are cleaned after cleaning. The cleaning liquid adhering to the layer surface is removed.
  • the manufacturing apparatus 100 shown in FIG. 11 does not have a zone for performing the annealing process of the buffer layer 40 after the CBD process, but the annealing process is performed after the cleaning liquid removing process zone f and before the winding roll 12.
  • a process zone may be provided.
  • the manufacturing method of the present invention can be continuously performed in a roll-to-roll manner, and the production efficiency can be improved.
  • Photoelectric conversion elements were produced as Examples 1 to 4 and Comparative Examples 1 to 3 by combining the following substrates and processes.
  • Table 1 shows the presence / absence of each step, the combination of conditions, and the evaluation results in each example.
  • a substrate having the following structure was used in common with all the examples and comparative examples.
  • As a flexible substrate an anodized substrate in which an aluminum anodic oxide film (AAO) is formed on an Al surface on a stainless steel (SUS) -Al composite base material is used, and a soda lime glass layer (SLG layer) is further formed on the AAO surface.
  • each layer was SUS (over 100 ⁇ m), Al (30 ⁇ m), AAO (20 ⁇ m), SLG (0.2 ⁇ m), Mo (0.8 ⁇ m), CIGS (1.8 ⁇ m).
  • the SLG layer and the Mo electrode layer were formed by sputtering, and the CIGS layer was formed by a three-stage method which is a kind of multi-source deposition method. (Board protection)
  • the subsequent steps were performed in a state where the back surface and the edge of the substrate were protected by a protective member for protecting the reaction solution.
  • a 10% aqueous solution of potassium cyanide (KCN) was used as the surface treatment solution.
  • a reaction vessel containing a surface treatment solution was prepared, and the surface of the CIGS layer was immersed in a KCN aqueous solution at room temperature for 3 minutes to remove impurities from the CIGS layer surface.
  • the substrate was fixed to the contact drum and heated until the substrate temperature reached 95 ° C. by heater heating from the back side of the substrate.
  • CBD process ⁇ Preparation of CBD reaction solution> Zinc sulfate aqueous solution (0.18 [M]) as aqueous solution (I) of component (Z), thiourea aqueous solution (thiourea 0.30 [M]) as aqueous solution (II) of component (S), component (C) Aqueous solution of trisodium citrate (0.18 [M]) was prepared as an aqueous solution (III), and aqueous ammonia (0.30 [M]) was prepared as an aqueous solution (IV) of component (N).
  • aqueous solutions I, II, and III are mixed in the same volume, zinc sulfate 0.06 [M], thiourea 0.10 [M], trisodium citrate 0.06 [M].
  • the mixed solution was completed, and this mixed solution and 0.30 [M] aqueous ammonia were mixed in equal volumes to obtain a CBD reaction solution.
  • the aqueous solution (IV) was added last. In order to obtain a transparent reaction solution, it is important to add the aqueous solution (IV) last.
  • the pH of the obtained CBD reaction solution was 10.3.
  • CBD condition 1 The substrate was immersed in a CBD reaction solution whose temperature was adjusted to 90 ° C., and deposition was performed for 30 minutes.
  • CBD reaction solution The substrate was immersed in a CBD reaction solution at room temperature, and the CBD reaction solution in which the substrate was immersed was heated to 90 ° C. during 30 minutes, and then maintained at 90 ° C. for 30 minutes for precipitation.
  • CBD CBD
  • Annealing treatment was performed in air at 200 ° C. for 1 hour.
  • the thickness of the buffer layer is evaluated at the stage where the buffer layer is formed on the CIGS layer or when the photoelectric conversion element is manufactured.
  • FIB focused ion beam
  • AM pseudo sunlight of Mass
  • the examples and comparative examples prepared by bringing the substrate into close contact with the drum and overlapping the ends with a protective material as in the present invention are buffer layers without eluting the Al contained in the substrate.
  • a protective material as in the present invention is buffer layers without eluting the Al contained in the substrate.
  • elution of Al was confirmed in Comparative Example 3 in which the end face of the substrate was in contact with the reaction solution. Therefore, according to the production method of the present invention, even if the substrate contains a component that dissolves in the CBD reaction solution, it is possible to form a film without eluting such a component from the substrate.
  • the buffer layer had a larger deposition thickness compared to Example 3 in which the CBD process was performed under the same conditions without performing the substrate heating. It was confirmed that the time required to obtain the film thickness can be shortened by heating the substrate before the CBD process. Furthermore, it was also confirmed that the conversion efficiency is greatly improved by performing the annealing treatment after the CBD process.

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Abstract

[Problem] To establish the processes carried out before and after buffer layer deposition in a photoelectric converter manufacturing method using a flexible substrate. [Solution] The surface of a photoelectric conversion semiconductor layer of a substrate (A) is immersed in a surface treatment solution (24), and after being surface treated the substrate (A) is rinsed, and then the water is removed. The substrate (A) is adhered to a drum (3) in a manner such that the photoelectric conversion semiconductor layer (30) forms the surface, and with the section in which the end of the substrate (A) and the substrate of the drum (3) are not adhered overlapped by a protection member (6) and protected from a CBD reaction solution (4), part of the substrate (A) is immersed in the CBD reaction solution (4) by immersing part of the drum (3) in the CBD reaction solution (4), a buffer layer (40) is deposited on the photoelectric conversion semiconductor layer (30), and then the substrate (A) is further rinsed and the rinsing solution is removed.

Description

光電変換素子の製造方法Method for manufacturing photoelectric conversion element

 本発明は、化合物半導体系光電変換素子の製造方法に関するものである。 The present invention relates to a method for producing a compound semiconductor photoelectric conversion element.

 光電変換層とこれに導通する電極とを備えた光電変換素子が、太陽電池等の用途に使用されている。従来、太陽電池においては、バルクの単結晶Siまたは多結晶Si、あるいは薄膜のアモルファスSiを用いたSi系太陽電池が主流であったが、Siに依存しない化合物半導体系太陽電池の研究開発がなされている。化合物半導体系太陽電池としては、GaAs系等のバルク系と、Ib族元素とIIIb族元素とVIb族元素とからなるCISあるいはCIGS系等の薄膜系とが知られている。CI(G)Sは、一般式Cu1-zIn1-xGaxSe2-yy(式中、0≦x≦1,0≦y≦2,0≦z≦1)で表される化合物半導体であり、x=0のときがCIS系、x>0のときがCIGS系である。以下、CISとCIGSとを合わせて「CI(G)S」と表記する。 A photoelectric conversion element including a photoelectric conversion layer and an electrode connected to the photoelectric conversion layer is used for applications such as solar cells. Conventionally, in the case of solar cells, Si-based solar cells using bulk single crystal Si or polycrystalline Si, or thin-film amorphous Si have been mainstream, but research and development of Si-independent compound semiconductor solar cells has been made. ing. Known compound semiconductor solar cells include bulk systems such as GaAs systems and thin film systems such as CIS or CIGS systems composed of group Ib elements, group IIIb elements, and group VIb elements. CI (G) S is represented by the general formula Cu 1-z In 1-x Ga x Se 2-y S y (where 0 ≦ x ≦ 1, 0 ≦ y ≦ 2, 0 ≦ z ≦ 1). When x = 0, it is a CIS system, and when x> 0, it is a CIGS system. Hereinafter, CIS and CIGS are collectively referred to as “CI (G) S”.

 CI(G)S系等の従来の薄膜系光電変換素子においては一般に、光電変換層とその上に形成される透光性導電層(透明電極)との間にCdSバッファ層や、環境負荷を考慮してCdを含まないZnSバッファ層が設けられている。バッファ層は、(1)光生成キャリアの再結合の防止、(2)バンド不連続の整合、(3)格子整合、および(4)光電変換層の表面凹凸のカバレッジ等の役割を担っており、CI(G)S系等では光電変換層の表面凹凸が比較的大きく、特に上記(4)の条件を良好に充たす必要性から、液相法であるCBD(Chemical Bath Deposition)法による成膜が好ましい。 In conventional thin-film photoelectric conversion elements such as CI (G) S, a CdS buffer layer and an environmental load are generally placed between a photoelectric conversion layer and a translucent conductive layer (transparent electrode) formed thereon. In consideration, a ZnS buffer layer not containing Cd is provided. The buffer layer plays a role such as (1) prevention of recombination of photogenerated carriers, (2) band discontinuous matching, (3) lattice matching, and (4) coverage of the surface irregularities of the photoelectric conversion layer. In the case of CI (G) S, etc., the surface irregularity of the photoelectric conversion layer is relatively large, and the film formation by the CBD (Chemical Bath Deposition) method, which is a liquid phase method, is particularly necessary because the condition (4) above must be satisfied satisfactorily. Is preferred.

 特許文献1~4等にはCBD法を用いたバッファ層の形成プロセスが提案されている。特許文献1~3には、ガラス基板等の非可撓性基板をバッファ層の原料化合物を含む反応液に浸漬する、いわゆるバッチ式(枚葉方式)の成膜方法が開示されている。一方、特許文献4には、可撓性基板をロール状に巻回してなる供給ロールと、成膜済の基板をロール状に巻回する巻取りロールとを用いるいわゆるロール・トゥ・ロール(Roll to Roll)方式の成膜方法を実現するための製造装置が提案されている。 Patent Documents 1 to 4 propose a process for forming a buffer layer using a CBD method. Patent Documents 1 to 3 disclose a so-called batch type (single-wafer type) film forming method in which an inflexible substrate such as a glass substrate is immersed in a reaction solution containing a raw material compound for a buffer layer. On the other hand, Patent Document 4 discloses a so-called roll-to-roll (Roll) roll that uses a supply roll obtained by winding a flexible substrate in a roll shape and a take-up roll for winding a film-formed substrate in a roll shape. A manufacturing apparatus for realizing a film formation method of “to Roll” method has been proposed.

国際公開2008/120306号パンフレットInternational Publication 2008/120306 Pamphlet 特許4549570号公報Japanese Patent No. 4549570 特表2008-510310号公報Special table 2008-510310 特開2003-124487号公報JP 2003-124487 A

 CBD法で所定の厚みのバッファ層を成膜するためには相応の時間を要し、バッファ層の成膜工程が工程全体での律速工程の一つとなっており、生産性向上が必要とされている。 Appropriate time is required to form a buffer layer having a predetermined thickness by the CBD method, and the film formation process of the buffer layer is one of the rate-determining processes in the entire process, so that productivity improvement is required. ing.

 生産性の向上の観点からはロール・トゥ・ロール方式の成膜方法が好ましい。
 しかしながら、上記特許文献4に記載の製造装置は、基板を、その表裏が剥き出しのままの状態でCBD反応液中に浸漬させて反応液中を搬送させるよう構成されており、CBD反応液に溶解してしまうような部分を含む基板(例えば、基板端面や基板裏面など溶解しうる成分が露出している場合を含む)の場合、基板の端面や裏面の保護を行った上で連続的にCBD法を実施することはできない。
From the viewpoint of improving productivity, a roll-to-roll film forming method is preferable.
However, the manufacturing apparatus described in Patent Document 4 is configured so that the substrate is immersed in the CBD reaction solution with the front and back surfaces thereof exposed, and is transported through the reaction solution, and is dissolved in the CBD reaction solution. In the case of a substrate including such a portion (including a case where a soluble component such as a substrate end surface or a substrate back surface is exposed), the CBD is continuously applied after protecting the end surface or back surface of the substrate. The law cannot be enforced.

 また、可撓性基板を用いた光電変換素子の製造方法における、バッファ層形成工程前後の製造プロセスについても十分に確立されているとは言えない。 Also, it cannot be said that the manufacturing process before and after the buffer layer forming step in the method for manufacturing a photoelectric conversion element using a flexible substrate has been sufficiently established.

 本発明は上記事情に鑑みなされたものであり、CBD反応液に溶解してしまうような部分を含む基板であっても基板を溶解させることなくバッファ層を形成する工程およびバッファ層前後の工程を含む、高生産性を実現することができる光電変換素子の製造方法を提供することを目的とするものである。 The present invention has been made in view of the above circumstances, and includes a step of forming a buffer layer without dissolving the substrate, and a step before and after the buffer layer, even if the substrate includes a portion that dissolves in the CBD reaction solution. An object of the present invention is to provide a method for manufacturing a photoelectric conversion element that can realize high productivity.

 本発明の光電変換素子の製造方法は、下部電極と光電変換半導体層とを備えてなる可撓性を有する基板の前記光電変換半導体層上に、バッファ層と透光性導電層との積層構造を有する光電変換素子の製造方法において、
 前記光電変換半導体層面を表面処理液中に浸漬する表面処理工程、
 前記表面処理液中において表面処理がなされた前記基板を水で水洗する表面処理後水洗工程、
 前記表面処理後水洗工程において前記基板に付着した水を除去する表面処理後水除去工程、
 前記基板を密着支持するドラムと、前記基板を密着支持するドラムの一部を浸漬するCBD反応液で満たされた反応槽と、前記ドラムに密着支持された前記基板の端部および前記ドラムのうち前記基板が密着しない部分をオーバーラップして前記CBD反応液から保護する保護部材とを有するCBD成膜装置を用い、前記保護部材により前記基板の端部および前記ドラムのうち前記基板が密着しない部分がオーバーラップされた前記基板を密着支持した前記ドラムの一部を前記反応槽内の前記CBD反応液に浸漬させることにより、前記基板の一部を前記CBD反応液に浸漬させ、所定の成膜温度に温調した該CBD反応液中で前記光電変換半導体層上にバッファ層を成膜するCBD工程、
 前記バッファ層が形成された後の前記基板を洗浄液中に浸漬して洗浄するCBD後洗浄工程、および、
 前記CBD後洗浄工程において前記基板に付着した洗浄液を除去するCBD後洗浄液除去工程を含み、
 上記各工程を、この順に行うことを特徴とする。
The method for producing a photoelectric conversion element of the present invention includes a laminated structure of a buffer layer and a light-transmitting conductive layer on the photoelectric conversion semiconductor layer of a flexible substrate including a lower electrode and a photoelectric conversion semiconductor layer. In the manufacturing method of the photoelectric conversion element having
A surface treatment step of immersing the photoelectric conversion semiconductor layer surface in a surface treatment liquid;
A post-surface treatment water washing step of washing the substrate that has been surface-treated in the surface treatment liquid with water;
A post-surface treatment water removal step for removing water adhering to the substrate in the post-surface treatment water washing step;
Of the drum that closely supports the substrate, a reaction tank filled with a CBD reaction solution that immerses a part of the drum that closely supports the substrate, the end of the substrate that is closely supported by the drum, and the drum Using a CBD film forming apparatus having a protective member that protects the CBD reaction liquid by overlapping a portion where the substrate does not adhere, and a portion of the end of the substrate and the drum that does not adhere to the drum by the protective member A part of the drum that tightly supports the substrate on which the substrate is overlapped is immersed in the CBD reaction solution in the reaction tank, so that a part of the substrate is immersed in the CBD reaction solution, and a predetermined film formation is performed. A CBD step of forming a buffer layer on the photoelectric conversion semiconductor layer in the CBD reaction solution adjusted to a temperature;
A post-CBD cleaning step of immersing and cleaning the substrate after the buffer layer is formed; and
A post-CBD cleaning liquid removing step of removing the cleaning liquid adhering to the substrate in the post-CBD cleaning step;
The above steps are performed in this order.

 本発明の光電変換素子の製造方法においては、前記CBD後乾燥工程の後に、前記基板を150℃以上250℃以下で加熱処理する加熱処理を行うことが好ましい。 In the method for producing a photoelectric conversion element of the present invention, it is preferable to perform heat treatment for heat-treating the substrate at 150 ° C. or more and 250 ° C. or less after the post-CBD drying step.

 さらに、前記CBD工程の前に、前記基板を該CBD工程における前記所定の成膜温度以上の温度まで加熱することが好ましい。 Furthermore, it is preferable that the substrate is heated to a temperature equal to or higher than the predetermined film formation temperature in the CBD step before the CBD step.

 ここで、前記基板を加熱する方法としては、ヒーターによる前記基板への直接加熱、あるいは表面処理工程で用いられる表面処理液、表面処理後水洗工程で用いられる水を加熱して、加熱された液中に前記基板を浸すことによる間接加熱による方法などを適用することができる。 Here, as a method of heating the substrate, the substrate is heated directly by the heater, or the surface treatment solution used in the surface treatment step, the water used in the post-surface treatment water washing step, and the heated solution. A method using indirect heating by immersing the substrate in the substrate can be applied.

 前記基板としては、Alを主成分とするAl基材の少なくとも一方の面側にAl23を主成分とする陽極酸化膜が形成された陽極酸化基板、Feを主成分とするFe材の少なくとも一方の面側にAlを主成分とするAl材が複合された複合基材の少なくとも一方の面側にAl23を主成分とする陽極酸化膜が形成された陽極酸化基板、およびFeを主成分とするFe材の少なくとも一方の面側にAlを主成分とするAl膜が成膜された基材の少なくとも一方の面側にAl23を主成分とする陽極酸化膜が形成された陽極酸化基板のうちいずれか1つの陽極酸化基板を備えてなるものを用いることが好ましい。 Examples of the substrate include an anodized substrate in which an anodized film mainly composed of Al 2 O 3 is formed on at least one surface side of an Al base material mainly composed of Al, and an Fe material mainly composed of Fe. An anodized substrate in which an anodized film mainly composed of Al 2 O 3 is formed on at least one surface of a composite base material in which an Al material mainly composed of Al is composited on at least one surface; and Fe An anodized film mainly composed of Al 2 O 3 is formed on at least one surface side of a base material on which an Al film composed mainly of Al is formed on at least one surface side of an Fe material containing bismuth as a main component It is preferable to use a substrate provided with any one of the anodized substrates.

 前記CBD反応液として、
 少なくとも1種の亜鉛源である成分(Z)、少なくとも1種の硫黄源である成分(S)、少なくとも1種のクエン酸化合物である成分(C)と水が混合された室温の混合液中に、アンモニア及びアンモニウム塩からなる群より選ばれた少なくとも1種である成分(N)を室温で混合して、
 前記成分(C)の濃度が0.001~0.25Mであり、
 前記成分(N)の濃度が0.001~0.40Mであり、
 反応開始前のpHが9.0~12.0であるCBD反応液を用いることが好ましい。
As the CBD reaction solution,
In a mixed solution at room temperature in which water is mixed with component (Z) that is at least one zinc source, component (S) that is at least one sulfur source, component (C) that is at least one citric acid compound In addition, at least one component (N) selected from the group consisting of ammonia and ammonium salts is mixed at room temperature,
The concentration of the component (C) is 0.001 to 0.25M;
The concentration of the component (N) is 0.001 to 0.40 M;
It is preferable to use a CBD reaction solution having a pH of 9.0 to 12.0 before the start of the reaction.

 前記CBD工程が、前記基板を、70~95℃の前記成膜温度に温調した前記CBD反応液に浸漬した後、該成膜温度でZn(S,O)及び/又はZn(S,O,OH)を主成分とするZn化合物層を前記バッファ層として成膜する工程であることが好ましい。 In the CBD step, after the substrate is immersed in the CBD reaction solution adjusted to the film formation temperature of 70 to 95 ° C., Zn (S, O) and / or Zn (S, O) is formed at the film formation temperature. , OH) as a main component, a Zn compound layer is preferably formed as the buffer layer.

 前記表面処理液が、シアノ基あるいはアミノ基を有する化合物を含有水溶液であることが好ましい。 The surface treatment liquid is preferably an aqueous solution containing a compound having a cyano group or an amino group.

 前記シアノ基を有する化合物としては、シアン化カリウムが好ましい。 As the compound having a cyano group, potassium cyanide is preferable.

 前記アミノ基を有する化合物としては、エチレンジアミン、ジエチレントリアミン、トリエチレンテトラミン、テトラエチレンペンタミン、ペンタエチレンヘキサミンの中から選ばれる少なくとも1つであることが好ましい。 The compound having an amino group is preferably at least one selected from ethylenediamine, diethylenetriamine, triethylenetetramine, tetraethylenepentamine, and pentaethylenehexamine.

 本発明の光電変換素子の製造方法は、ドラムに基板裏面を密着させ、基板の端部と、ドラムのうち基板が密着しない部分とを保護部材によりオーバーラップしてCBD反応液から保護した状態で、基板をCBD反応液中に浸漬させるので、基板がCBD反応液に溶解してしまう成分を含むものであっても、基板からこのような成分を溶出させることなくCBD法によるバッファの成膜を行うことが可能である。 In the method for producing a photoelectric conversion element of the present invention, the back surface of the substrate is brought into close contact with the drum, and the end portion of the substrate and the portion of the drum where the substrate does not adhere are overlapped by a protective member and protected from the CBD reaction liquid. Since the substrate is immersed in the CBD reaction solution, even if the substrate contains a component that dissolves in the CBD reaction solution, a buffer film is formed by the CBD method without eluting such a component from the substrate. Is possible.

 本発明の光電変換素子の製造方法によれば、光電変換半導体層の表面処理からバッファ層成膜後の洗浄および洗浄液除去処理までの、バッファ層形成前後のプロセスを明確に確立し、高い光電変換効率の光電変換素子を生産性よく製造することができる。 According to the method for manufacturing a photoelectric conversion element of the present invention, a process before and after the formation of a buffer layer is clearly established from the surface treatment of the photoelectric conversion semiconductor layer to the cleaning after the formation of the buffer layer and the cleaning liquid removal treatment, and high photoelectric conversion is achieved. An efficient photoelectric conversion element can be manufactured with high productivity.

本発明の製造方法で作製される光電変換素子の層構成を示す概略断面図である。It is a schematic sectional drawing which shows the layer structure of the photoelectric conversion element produced with the manufacturing method of this invention. 本発明の製造方法で用いられるCBD成膜装置を示す概略斜視図である。It is a schematic perspective view which shows the CBD film-forming apparatus used with the manufacturing method of this invention. 図2に示すCBD成膜装置の概略断面図である。It is a schematic sectional drawing of the CBD film-forming apparatus shown in FIG. 基板を保護する保護部材の一実施の形態を示す概略断面図である。It is a schematic sectional drawing which shows one Embodiment of the protection member which protects a board | substrate. 基板を保護する保護部材の別の実施の形態を示す概略断面図である。It is a schematic sectional drawing which shows another embodiment of the protection member which protects a board | substrate. 基板を保護する保護部材のさらに別の実施の形態を示す概略断面図である。It is a schematic sectional drawing which shows another embodiment of the protection member which protects a board | substrate. 基板を保護する保護部材のさらに別の実施の形態を示す概略断面図である。It is a schematic sectional drawing which shows another embodiment of the protection member which protects a board | substrate. 基板を保護する保護部材のさらに別の実施の形態を示す概略断面図である。It is a schematic sectional drawing which shows another embodiment of the protection member which protects a board | substrate. 基板を保護する保護部材のさらに別の実施の形態を示す概略断面図である。It is a schematic sectional drawing which shows another embodiment of the protection member which protects a board | substrate. 基板を保護する保護部材のさらに別の実施の形態を示す概略断面図である。It is a schematic sectional drawing which shows another embodiment of the protection member which protects a board | substrate. 本発明の製造方法を実施するための製造装置概略構成を示す概略断面図である。It is a schematic sectional drawing which shows schematic structure of the manufacturing apparatus for enforcing the manufacturing method of this invention.

 以下、図面を参照して本発明の光電変換素子の製造方法について説明する。
 図1は、本発明の製造方法によって製造される光電変換素子の層構成を示す概略断面図である。図1においては、光電変換素子の層構成を示すため、集積化太陽電池の1つ光電変換素子(セル)のみを示しているが、本発明の製造方法は多数の光電変換素子を備えた集積化太陽電池の製造に適するものである。
Hereinafter, the manufacturing method of the photoelectric conversion element of this invention is demonstrated with reference to drawings.
FIG. 1 is a schematic cross-sectional view showing a layer structure of a photoelectric conversion element manufactured by the manufacturing method of the present invention. In FIG. 1, only one photoelectric conversion element (cell) of an integrated solar cell is shown to show the layer structure of the photoelectric conversion element, but the manufacturing method of the present invention is an integration with a large number of photoelectric conversion elements. It is suitable for manufacturing a solar cell.

 光電変換素子101は、図1に示されるように、基板10上に、下部電極20と光吸収により正孔・電子対を発生する光電変換半導体層30と、バッファ層40と、窓層50と、透光性導電層(透明電極)60と、上部電極(グリッド電極)70とが順次積層された素子である。 As shown in FIG. 1, the photoelectric conversion element 101 includes a lower electrode 20, a photoelectric conversion semiconductor layer 30 that generates hole / electron pairs by light absorption, a buffer layer 40, and a window layer 50 on a substrate 10. A light-transmissive conductive layer (transparent electrode) 60 and an upper electrode (grid electrode) 70 are sequentially stacked.

 まず、本発明の光電変換素子において用いられるCBD成膜装置の一実施形態を説明する。図2はCBD成膜装置を示す概略斜視図、図3は図2に示すCBD成膜装置の概略断面図である。なお、図2において反応槽は透明なものとして図示している。図2および図3に示すCBD成膜装置1は、長尺な可撓性を有する基板Aを密着支持するドラム3と、基板Aを密着支持するドラム3の一部を浸漬するCBD反応液4で満たされた反応槽5と、ドラム3に密着支持された基板Aの短手方向端部と、ドラム3のうち基板Aが密着しない部分とをオーバーラップしてCBD反応液4から保護する保護部材6と、ドラム3の周速に合わせてドラム3に密着させた基板Aと保護部材6をCBD反応液4中で共走行させる駆動部(図示せず)とを備えてなる。 First, an embodiment of a CBD film forming apparatus used in the photoelectric conversion element of the present invention will be described. 2 is a schematic perspective view showing the CBD film forming apparatus, and FIG. 3 is a schematic cross-sectional view of the CBD film forming apparatus shown in FIG. In FIG. 2, the reaction vessel is illustrated as being transparent. The CBD film forming apparatus 1 shown in FIGS. 2 and 3 includes a drum 3 that closely supports a long flexible substrate A, and a CBD reaction solution 4 that immerses a part of the drum 3 that closely supports the substrate A. Protection that protects from the CBD reaction liquid 4 by overlapping the reaction tank 5 filled with 1, the short-side end of the substrate A that is closely supported by the drum 3, and the portion of the drum 3 where the substrate A does not adhere The member 6 is provided with a drive unit (not shown) for causing the substrate A, which is brought into close contact with the drum 3 in accordance with the peripheral speed of the drum 3, and the protective member 6 to co-run in the CBD reaction solution 4.

 さらに、ドラム3の上流側には基板Aをロール状に巻回する巻出しロール11が、下流側にはドラム3から送りだされた基板Aの片面にCBD薄膜が形成された後の基板Aを巻き取る巻取りロール12が設けられ、巻出しロール11とドラム3の間、巻取りロール12とドラム3の間には、それぞれ送出しロール13および14が設けられている。また、ドラム3と送出しロール13の間には、保護部材6をロール状に巻回する巻出しロール15が、ドラム3と送出しロール14の間には、保護部材6を巻き取る巻取りロール16がそれぞれ設けられている。そして、巻出しロール15から送りだされた保護部材6によって、基板Aの短手方向端部と、ドラム3のうち基板Aが密着しない部分とをオーバーラップできるようになっている。巻取りロール12および16にはそれぞれ駆動部(図示せず)が設けられており、ドラム3の周速に合わせて(同期させて)ドラム3に密着させた基板Aと保護部材6をCBD反応液4中で共走行させることができるようになっている。 Further, an unwinding roll 11 for winding the substrate A in a roll shape on the upstream side of the drum 3, and the substrate A after the CBD thin film is formed on one side of the substrate A fed from the drum 3 on the downstream side. A take-up roll 12 is provided, and feed rolls 13 and 14 are provided between the take-up roll 11 and the drum 3, and between the take-up roll 12 and the drum 3, respectively. Further, a winding roll 15 for winding the protective member 6 in a roll shape is provided between the drum 3 and the feed roll 13, and a winding for winding the protective member 6 between the drum 3 and the feed roll 14. Each roll 16 is provided. The protective member 6 fed from the unwinding roll 15 can overlap the short-side end portion of the substrate A and the portion of the drum 3 where the substrate A does not adhere. Each of the winding rolls 12 and 16 is provided with a drive unit (not shown), and the substrate A and the protective member 6 which are brought into close contact with the drum 3 in accordance with the peripheral speed of the drum 3 (synchronized) are subjected to a CBD reaction. It can be made to co-run in the liquid 4.

 なお、ここでは巻取りロール12および16に設けられた駆動部が巻取りロール12および16のそれぞれを駆動して、CBD薄膜形成後の基板Aおよび保護部材6が巻取りロール12および16にそれぞれ巻取られる態様について説明しているが、巻取りロール12および16は単に回転自在な構成で、基板Aおよび保護部材6を送り出すだけの機能を有し、その下流にそれぞれ別の駆動部で制御された巻取りロールが配置されている構成であってもよい。また、ドラム3そのものは単に回転自在な構成となっており、上記で説明した駆動部を駆動することによってドラム3は、基板Aの一方の面のみをCBD反応液4に浸漬した状態で搬送するようになっているが、ドラム3に駆動源が設けられていてそれ自身が回転するものであってもよい。 Here, the drive units provided on the take-up rolls 12 and 16 drive the take-up rolls 12 and 16, respectively, and the substrate A and the protective member 6 after the CBD thin film is formed on the take-up rolls 12 and 16, respectively. Although the winding mode is described, the winding rolls 12 and 16 are simply rotatable and have a function of feeding out the substrate A and the protective member 6, and are controlled by separate driving units downstream thereof. The structure by which the wound winding roll was arrange | positioned may be sufficient. Further, the drum 3 itself is simply rotatable, and the drum 3 is transported in a state where only one surface of the substrate A is immersed in the CBD reaction solution 4 by driving the driving unit described above. However, the drum 3 may be provided with a drive source and rotate itself.

 図4は基板を保護する保護部材の一実施の形態を示す概略断面図である。図4に示すように、保護部材6は長尺な基板Aの短手方向端部と、ドラム3のうち基板Aが密着しない部分とをオーバーラップできるようになっている。このようにオーバーラップすることにより基板Aの裏面(ドラム3に密着している側)および端面にはCBD反応液4が侵入、接触することがなく、仮に基板AがCBD反応液に溶解してしまう成分を含むものであっても、基板Aからこのような成分を溶出させることなくCBD薄膜を形成することが可能である。 FIG. 4 is a schematic sectional view showing an embodiment of a protective member for protecting the substrate. As shown in FIG. 4, the protection member 6 can overlap the short-side end portion of the long substrate A and the portion of the drum 3 where the substrate A does not adhere. By overlapping in this way, the CBD reaction solution 4 does not enter and contact the back surface (side in close contact with the drum 3) and the end surface of the substrate A, and the substrate A is temporarily dissolved in the CBD reaction solution. Even if a component containing such a component is included, a CBD thin film can be formed without eluting such a component from the substrate A.

 保護部材6は基板Aに対する密着性を確保するために、バイトンゴムやシリコンゴムのような素材からなることが好ましい。あるいは保護部材6全体がそのような材質からなるものでなくても、少なくとも基板Aに密着する側に粘着性を有する材質が塗布された態様としてもよい。 The protective member 6 is preferably made of a material such as Viton rubber or silicon rubber in order to ensure adhesion to the substrate A. Alternatively, even if the entire protective member 6 is not made of such a material, a mode in which a material having adhesiveness is applied to at least the side in close contact with the substrate A may be adopted.

 基板Aとオーバーラップさせる保護部材6との水密性をより向上させるために、ドラム3は、基板Aを磁気によりドラム3に密着支持することが可能なように構成されていることが好ましい。例えば、それ自身が磁石の性質を持ち、鉄などの磁性体をひきつけることが可能な永久磁石をドラム3の内部であって基板Aが密着する部分に配置すれば、基板Aが磁性体であれば、基板Aをドラム3に磁気により密着支持することができる。 In order to further improve the watertightness of the protective member 6 that overlaps the substrate A, it is preferable that the drum 3 is configured to be able to closely support the substrate A on the drum 3 by magnetism. For example, if a permanent magnet, which itself has the property of a magnet and can attract a magnetic material such as iron, is disposed inside the drum 3 at a portion where the substrate A is in close contact, the substrate A may be a magnetic material. In this case, the substrate A can be tightly supported on the drum 3 by magnetism.

 また、基板Aが磁性体でない場合であっても、図5に示すように、保護部材6の上に磁性体である金属板7(磁性を有する金属板、例えばSUS316等)をさらにオーバーラップすれば、同様に基板Aをドラム3に磁気により密着支持することができる(なお、図5において図4と同じ構成要素には同じ番号を付し、それらについての説明は特に必要のない限り省略する(以下、他の図面においても同様))。この場合、図6に示すように金属板7を押さえバネ8により固定するようにしてもよい。なお、この押さえバネ8はドラム3の全周に亘って複数箇所に設けられているが、ドラム3が反応液に浸漬している部分においては図6の上図に示すように金属板7を上から押さえ、反応液から離脱した後には、図6の下図に示すように金属板7から離れるように制御されるものである。 Further, even when the substrate A is not a magnetic material, as shown in FIG. 5, a metal plate 7 (magnetic metal plate such as SUS316) that is a magnetic material is further overlapped on the protective member 6. In the same manner, the substrate A can be magnetically closely supported on the drum 3 (in FIG. 5, the same components as those in FIG. 4 are given the same reference numerals, and description thereof will be omitted unless particularly required). (Hereinafter, the same applies to other drawings). In this case, the metal plate 7 may be fixed by a holding spring 8 as shown in FIG. In addition, although this presser spring 8 is provided in multiple places over the perimeter of the drum 3, in the part in which the drum 3 is immersed in the reaction liquid, as shown in the upper figure of FIG. After being pressed from above and separated from the reaction solution, control is performed so as to leave the metal plate 7 as shown in the lower diagram of FIG.

 さらに、別の態様として、図7に示すように、保護部材6をドラム3に圧接させるような加圧ドラム9が設けられている態様としてもよい。この加圧ドラム9は反応液に浸漬しているドラム3の対向する部分に、複数箇所設けられていることが好ましい。 Furthermore, as another aspect, as shown in FIG. 7, a pressure drum 9 that presses the protective member 6 against the drum 3 may be provided. It is preferable that a plurality of the pressure drums 9 are provided at the opposing portions of the drum 3 immersed in the reaction solution.

 ドラム3は、密着支持した基板Aを裏面から加熱する加熱手段を備えていることが好ましい。通常、CBD反応液は加温をして反応を行うが、基板Aを背面から加熱することによって、より膜厚のばらつきがない成膜を行うことができる。この際、基板の温度をCBD反応液の液温と同じか、それ以上にしておくことが好ましい。基板の温度をCBD反応液の液温以上にしておくことにより、基板上での析出を優先的に進行させることが可能になる。また、そのときに反応液の温度を低くしても基板上での析出が進行する場合には、反応液中でのコロイド状固形物の発生が抑えられる方向になるので、反応液を長時間使用し続けたりすることが可能となる。加熱手段としてはドラム3内にヒーターを備える態様、ドラム内に加熱した媒体(例えば、水やオイル)を循環させる態様等を好ましく挙げることができる。 It is preferable that the drum 3 includes a heating unit that heats the substrate A that is closely supported from the back surface. Normally, the CBD reaction solution is heated to perform the reaction, but by heating the substrate A from the back surface, film formation with less variation in film thickness can be performed. At this time, it is preferable that the temperature of the substrate is equal to or higher than the temperature of the CBD reaction solution. By keeping the temperature of the substrate equal to or higher than the temperature of the CBD reaction solution, it is possible to preferentially advance the deposition on the substrate. In addition, if precipitation on the substrate proceeds even if the temperature of the reaction solution is lowered at that time, the generation of colloidal solids in the reaction solution will be suppressed. It can be used continuously. Preferred examples of the heating means include a mode in which a heater is provided in the drum 3 and a mode in which a medium (for example, water or oil) heated in the drum is circulated.

 なお、上記では反応液4に浸漬する前に巻出しロール15から巻き出された保護部材6によって基板Aが保護され、反応液4から離脱した後には、保護部材6は巻取りロール16によって巻き取られる態様を例にとって説明したが、巻出しロール11にロール状に巻回されている長尺な基板Aに予め保護部材6が設けられている態様としてもよい。例えば、図8や9に示すように保護部材6は長尺な基板Aの短手方向端部を両面から保護するようなものであってもよい。この場合には、基板Aとオーバーラップさせる保護部材6との水密性を確保するために、図8に示すようにドラム3の基板Aが密着する部分を凸部としたり、あるいは図9に示すように基板Aが密着する部分を凸部にするとともに、基板Aを蛇行させないようにするために保護部材6が走行するドラム3の一部にあらかじめ凹部を設けたりしておいてもよい。 In the above, the substrate A is protected by the protective member 6 unwound from the unwinding roll 15 before being immersed in the reaction liquid 4, and the protective member 6 is unwound by the take-up roll 16 after being detached from the reaction liquid 4. Although the mode to be taken has been described as an example, the protective member 6 may be provided in advance on the long substrate A wound around the unwinding roll 11 in a roll shape. For example, as shown in FIGS. 8 and 9, the protective member 6 may protect the end of the long substrate A in the short direction from both sides. In this case, in order to ensure watertightness between the substrate A and the protective member 6 to be overlapped, the portion of the drum 3 where the substrate A is in close contact is formed as a convex portion as shown in FIG. 8, or as shown in FIG. As described above, a portion where the substrate A is in close contact may be formed as a convex portion, and a concave portion may be provided in advance in a part of the drum 3 on which the protective member 6 travels so as not to meander the substrate A.

 また、巻出しロール11にロール状に巻回されている長尺な基板Aに最初から図10に示すような保護部材6を基板Aの全長にわたって複数配置してもよい。なお、図では保護部材6の配置を視認しやすくするために保護部材6を1枚配置した状態を示している。この場合、L1<長尺基板の幅<L2であり、L2≦ドラムの幅である。なお、この場合の保護部材6のL3はドラム回転方向の円周以下の長さとすることが好ましい。 Further, a plurality of protective members 6 as shown in FIG. 10 may be provided over the entire length of the substrate A from the beginning on the long substrate A wound around the unwinding roll 11 in a roll shape. In addition, in the figure, in order to make it easy to visually recognize the arrangement of the protective member 6, a state where one protective member 6 is arranged is shown. In this case, L 1 <the width of the long substrate <L 2 and L 2 ≦ the width of the drum. In this case, L 3 of the protection member 6 is preferably set to a length equal to or less than the circumference in the drum rotation direction.

 本発明の光電変換素子の製造方法は、基板10上に下部電極20と光電変換半導体層30とを順次形成した後、下部電極20と光電変換半導体層30とを備えてなる可撓性基板Aの光電変換半導体層30の表面を表面処理液中に浸漬し(表面処理工程)、表面処理液中において表面処理がなされた基板Aを水で水洗し(表面処理後水洗工程)、表面処理後水洗工程において基板Aに付着した水を除去し(表面処理後水除去工程)、上述のCBD成膜装置1を用いて保護部材6により基板Aの端部およびドラム3のうち基板Aが密着しない部分がオーバーラップされた基板Aを密着支持したドラム3の一部を反応槽5内のCBD反応液4に浸漬させることにより、基板Aの一部をCBD反応液4に浸漬させ、所定の成膜温度に温調したCBD反応液4中で光電変換半導体層30上にバッファ層40を成膜し(CBD工程)、バッファ層40が形成された後の基板Aを洗浄液中に浸漬して洗浄し(CBD後洗浄工程)、基板Aに付着した洗浄液を除去する(CBD後洗浄液除去工程)ものである。 In the method for producing a photoelectric conversion element of the present invention, a flexible substrate A comprising the lower electrode 20 and the photoelectric conversion semiconductor layer 30 after the lower electrode 20 and the photoelectric conversion semiconductor layer 30 are sequentially formed on the substrate 10. The surface of the photoelectric conversion semiconductor layer 30 is immersed in a surface treatment solution (surface treatment step), and the substrate A subjected to the surface treatment in the surface treatment solution is washed with water (water treatment step after surface treatment) and after the surface treatment. The water adhering to the substrate A is removed in the water washing step (water removal step after the surface treatment), and the substrate A is not in close contact with the end portion of the substrate A and the drum 3 by the protective member 6 using the CBD film forming apparatus 1 described above. A part of the drum 3 that closely supports and supports the overlapping substrate A is immersed in the CBD reaction solution 4 in the reaction tank 5, so that a part of the substrate A is immersed in the CBD reaction solution 4 to obtain a predetermined composition. CBD temperature controlled to membrane temperature The buffer layer 40 is formed on the photoelectric conversion semiconductor layer 30 in the reaction solution 4 (CBD process), and the substrate A after the buffer layer 40 is formed is immersed in the cleaning liquid and cleaned (post-CBD cleaning process). The cleaning liquid adhering to the substrate A is removed (post-CBD cleaning liquid removing step).

 本発明の製造方法に用いられる基板および各製造工程について順に説明する。 The substrate used in the manufacturing method of the present invention and each manufacturing process will be described in order.

(基板)
 本発明の製造方法において用いられる可撓性基板Aは、基板10上に下部電極20および光電変換半導体層30が予め形成されてなる可撓性を有する基板である。
(substrate)
The flexible substrate A used in the manufacturing method of the present invention is a flexible substrate in which the lower electrode 20 and the photoelectric conversion semiconductor layer 30 are formed in advance on the substrate 10.

 基板10は、可撓性を有するものであれば特に制限はないが、本発明の製造方法で用いられるCBD成膜装置においては、基板がCBD反応液に溶解してしまう成分を含むものであっても、基板からこのような成分を溶出させることがないという効果があるため、水酸化物イオンと錯イオンを形成しうる金属、金属酸化物、金属水酸化物等を含む基板を用いた場合にその効果を得ることができ、より詳細にはAlを含む基板に効果的に適用できる。 Although there will be no restriction | limiting in particular if the board | substrate 10 has flexibility, In the CBD film-forming apparatus used with the manufacturing method of this invention, the board | substrate contains the component which melt | dissolves in a CBD reaction liquid. However, since there is an effect that such a component is not eluted from the substrate, when a substrate containing a metal, a metal oxide, a metal hydroxide or the like capable of forming a complex ion with a hydroxide ion is used. This effect can be obtained, and more specifically, it can be effectively applied to a substrate containing Al.

 具体的には、基板10は、Alを主成分とするAl基材の少なくとも一方の面側にAl23を主成分とする陽極酸化膜が形成された陽極酸化基板、Feを主成分とするFe材の少なくとも一方の面側にAlを主成分とするAl材が複合された複合基材の少なくとも一方の面側にAl23を主成分とする陽極酸化膜が形成された陽極酸化基板、および、Feを主成分とするFe材の少なくとも一方の面側にAlを主成分とするAl膜が成膜された基材の少なくとも一方の面側にAl23を主成分とする陽極酸化膜が形成された陽極酸化基板のうちいずれか1つの陽極酸化基板であることが好ましい。 Specifically, the substrate 10 is an anodized substrate in which an anodized film containing Al 2 O 3 as a main component is formed on at least one surface side of an Al base material containing Al as a main component, and Fe as a main component. Anodization in which an anodized film mainly composed of Al 2 O 3 is formed on at least one surface side of a composite base material in which an Al material composed mainly of Al is formed on at least one surface side of the Fe material Al 2 O 3 is the main component on at least one surface side of the substrate and the base material on which an Al film having an Al main component is formed on at least one surface side of the Fe material containing Fe as the main component It is preferable that any one of the anodized substrates on which the anodized film is formed.

 光電変換半導体層30の主成分としては特に制限されず、高い変換効率が得られることから、少なくとも1種のカルコパイライト構造の化合物半導体であることが好ましく、Ib族元素とIIIb族元素とVIb族元素とからなる少なくとも1種の化合物半導体であることがより好ましい。 The main component of the photoelectric conversion semiconductor layer 30 is not particularly limited and is preferably a compound semiconductor having at least one chalcopyrite structure because high conversion efficiency is obtained. The Ib group element, the IIIb group element, and the VIb group More preferably, it is at least one compound semiconductor composed of an element.

 光電変換半導体層30の主成分としては、
CuおよびAgからなる群より選択された少なくとも1種のIb族元素と、
Al,GaおよびInからなる群より選択された少なくとも1種のIIIb族元素と、
S,Se,およびTeからなる群から選択された少なくとも1種のVIb族元素とからなる少なくとも1種の化合物半導体であることが好ましい。
As a main component of the photoelectric conversion semiconductor layer 30,
At least one group Ib element selected from the group consisting of Cu and Ag;
At least one group IIIb element selected from the group consisting of Al, Ga and In;
It is preferably at least one compound semiconductor comprising at least one VIb group element selected from the group consisting of S, Se, and Te.

 上記化合物半導体としては、
CuAlS2,CuGaS2,CuInS2
CuAlSe2,CuGaSe2
AgAlS2,AgGaS2,AgInS2
AgAlSe2,AgGaSe2,AgInSe2
AgAlTe2,AgGaTe2,AgInTe2
Cu(In,Al)Se2,Cu(In,Ga)(S,Se)2
Cu1-zIn1-xGaxSe2-yy(式中、0≦x≦1,0≦y≦2,0≦z≦1)(CI(G)S),
Ag(In,Ga)Se2,およびAg(In,Ga)(S,Se)2等が挙げられる。
 また、Cu2ZnSnS4,CuZnSnSe4,Cu2ZnSn(S,Se)4であってもよい。
 光電変換半導体層の膜厚は特に制限されず、1.0μm~4.0μmが好ましく、1.5μm~3.5μmが特に好ましい。
As the compound semiconductor,
CuAlS 2 , CuGaS 2 , CuInS 2 ,
CuAlSe 2 , CuGaSe 2 ,
AgAlS 2 , AgGaS 2 , AgInS 2 ,
AgAlSe 2 , AgGaSe 2 , AgInSe 2 ,
AgAlTe 2 , AgGaTe 2 , AgInTe 2 ,
Cu (In, Al) Se 2 , Cu (In, Ga) (S, Se) 2 ,
Cu 1-z In 1-x Ga x Se 2-y S y (where 0 ≦ x ≦ 1, 0 ≦ y ≦ 2, 0 ≦ z ≦ 1) (CI (G) S),
Examples include Ag (In, Ga) Se 2 and Ag (In, Ga) (S, Se) 2 .
Further, Cu 2 ZnSnS 4, Cu 2 ZnSnSe 4, Cu 2 ZnSn (S, Se) may be a four.
The film thickness of the photoelectric conversion semiconductor layer is not particularly limited, and is preferably 1.0 μm to 4.0 μm, particularly preferably 1.5 μm to 3.5 μm.

(表面処理工程)
 基板Aの少なくとも光電変換半導体層30の表面が表面処理液24中に浸漬され、光電変換半導体層30の表面に対し表面処理液による不純物除去等の表面処理を行う。
(Surface treatment process)
At least the surface of the photoelectric conversion semiconductor layer 30 of the substrate A is immersed in the surface treatment liquid 24, and surface treatment such as impurity removal by the surface treatment liquid is performed on the surface of the photoelectric conversion semiconductor layer 30.

 表面処理液としては、例えば、アンモニア含有水溶液、シアノ基あるいはアミノ基を有する化合物含有水溶液を用いることができる。 As the surface treatment liquid, for example, an ammonia-containing aqueous solution, a compound-containing aqueous solution having a cyano group or an amino group can be used.

 表面処理液に含まれるシアノ基を有する化合物としてはシアン化カリウム(KCN)が好ましい。一方、KCNは致死性の化合物であり安全上問題があるため、アミノ基を有する化合物を用いることがより好ましい。 As the compound having a cyano group contained in the surface treatment liquid, potassium cyanide (KCN) is preferable. On the other hand, since KCN is a lethal compound and has a safety problem, it is more preferable to use a compound having an amino group.

 表面処理液に含まれるアミノ基を有する化合物は、一分子中に少なくとも二つのアミノ基を有する化合物(以下、単にアミノ基含有化合物ともいう)であることが好ましく、具体的には、エチレンジアミン(EDA)、ジエチレントリアミン(DETA)、トリエチレンテトラミン(TETA)、テトラエチレンペンタミン(TEPA)、ペンタエチレンヘキサミン(PEHA)の中から選ばれる少なくとも1つであることが好ましく、これらは単独で用いても、2種類以上を適宜混合して用いてもよい。 The compound having an amino group contained in the surface treatment liquid is preferably a compound having at least two amino groups in one molecule (hereinafter also simply referred to as an amino group-containing compound). Specifically, ethylenediamine (EDA ), Diethylenetriamine (DETA), triethylenetetramine (TETA), tetraethylenepentamine (TEPA), or pentaethylenehexamine (PEHA), and these may be used alone, Two or more types may be appropriately mixed and used.

 これらのアミノ基含有化合物は表面処理液中に1質量%~30質量%、好ましくは5質量%~25質量%、さらには10質量%~20質量%含まれることが好ましい。
 過酸化水素は表面処理液中に0.01質量%~10質量%、好ましくは0.05質量%~8質量%、さらには0.1質量%~5質量%含まれることが好ましい。
 表面処理液は上記アミノ基含有化合物と過酸化水素を水に溶解することにより調製することができる。
These amino group-containing compounds are contained in the surface treatment solution in an amount of 1 to 30% by mass, preferably 5 to 25% by mass, and more preferably 10 to 20% by mass.
Hydrogen peroxide is preferably contained in the surface treatment solution in an amount of 0.01% by mass to 10% by mass, preferably 0.05% by mass to 8% by mass, and more preferably 0.1% by mass to 5% by mass.
The surface treatment liquid can be prepared by dissolving the amino group-containing compound and hydrogen peroxide in water.

 光電変換半導体層と表面処理液を接触させる時間は表面処理液の濃度にもよるが、概ね数秒~十数分程度とすることが好ましい。 The time for bringing the photoelectric conversion semiconductor layer into contact with the surface treatment liquid depends on the concentration of the surface treatment liquid, but is preferably about several seconds to several tens of minutes.

 光電変換半導体層30の成膜後の表面には、不純物、例えばCI(G)S系の光電変換半導体層の場合にはセレン化銅や硫化銅等の不純物が残存している可能性が高いが、上記のような光電変換半導体層30の表面処理(不純物除去)を行うことによって、光電変換素子の光電変換効率の面内のばらつきを小さくして変換効率を高めることができる。 There is a high possibility that impurities such as copper selenide and copper sulfide remain on the surface of the photoelectric conversion semiconductor layer 30 after film formation in the case of a CI (G) S-based photoelectric conversion semiconductor layer. However, by performing the surface treatment (impurity removal) of the photoelectric conversion semiconductor layer 30 as described above, the in-plane variation of the photoelectric conversion efficiency of the photoelectric conversion element can be reduced and the conversion efficiency can be increased.

 なお、この表面処理後、60分以内に前記バッファ層を成膜することが好ましく、10分以内にバッファ層を成膜することがより好ましい。ここで「表面処理後、60分以内」とは、表面処理終了直後からの時間を意味し、表面処理後の水洗工程や乾燥工程を含んで60分以内にCBD工程を開始することが好ましい。 In addition, it is preferable to form the buffer layer within 60 minutes after this surface treatment, and it is more preferable to form the buffer layer within 10 minutes. Here, “within 60 minutes after the surface treatment” means a time immediately after the completion of the surface treatment, and it is preferable to start the CBD step within 60 minutes including the water washing step and the drying step after the surface treatment.

(表面処理後水洗工程)
 表面処理工程後、基板Aを水により水洗する。水の温度は20℃以上が好ましい。ここでは、水洗方法は、水槽中に浸漬させて水洗するものであっても、シャワー洗浄であってもよい。水洗水としては、純水、イオン交換水、工業用水などを使用することができる。
(Water washing process after surface treatment)
After the surface treatment process, the substrate A is washed with water. The temperature of water is preferably 20 ° C. or higher. Here, the water washing method may be a method of immersing in a water tank and washing with water or shower washing. As washing water, pure water, ion exchange water, industrial water, or the like can be used.

(表面処理後水除去工程)
 水洗後、基板に水が付着したままCBD工程の反応液に基板を浸漬させると、反応液の濃度が薄まるため、CBD工程前に反応液の濃度を薄めない程度に水を除去する。具体的には、基板Aに付着している水を、ドライエアーあるいは窒素を基板表裏面に吹き付けることにより除去する。なお、このとき、温風を吹き付けるようにしてもよい。
(Water removal process after surface treatment)
After rinsing with water, if the substrate is immersed in the reaction solution of the CBD process while water is attached to the substrate, the concentration of the reaction solution decreases. Therefore, the water is removed to the extent that the concentration of the reaction solution does not decrease before the CBD process. Specifically, the water adhering to the substrate A is removed by blowing dry air or nitrogen on the front and back surfaces of the substrate. At this time, warm air may be blown.

 なお、次工程であるCBD工程において、後述するバッファ層の構成物質の成膜温度(析出温度)は70℃以上であることが好ましいとされている。このため、CBD工程において、予め成膜温度に温調されたCBD反応液中に基板を浸漬させる場合には、CBD反応液4で満たされた反応槽5に基板Aを浸漬させる前に、基板Aを成膜温度以上の温度に温めておくことが好ましい。予め基板を温める(プレ加熱する)ことにより、CBD反応液に浸漬された際に、バッファ層の成膜温度に温調されている反応液の温度低下を抑制することができ、製造工程におけるタイムロスを低減することができる。 In the CBD process, which is the next process, the film forming temperature (deposition temperature) of the constituent material of the buffer layer described later is preferably 70 ° C. or higher. For this reason, in the CBD process, when the substrate is immersed in the CBD reaction liquid that has been temperature-controlled in advance, the substrate A is immersed before the substrate A is immersed in the reaction tank 5 filled with the CBD reaction liquid 4. It is preferable to warm A to a temperature equal to or higher than the film formation temperature. By preheating (preheating) the substrate, when immersed in the CBD reaction solution, it is possible to suppress the temperature drop of the reaction solution adjusted to the film formation temperature of the buffer layer, and time loss in the manufacturing process Can be reduced.

 基板のプレ加熱は、上記工程にさらに別途プレ加熱工程を備え、ヒーター等により加熱するようにしてもよいが、例えば、以下のようにして表面処理工程、表面処理後水洗工程、表面処理後水除去工程等において同時に行うことが好ましい。 The preheating of the substrate may be further provided with a preheating step in addition to the above steps and heated by a heater or the like. For example, the surface treatment step, the post-surface treatment water washing step, and the post-surface treatment water are performed as follows. It is preferable to carry out simultaneously in the removal step or the like.

 表面処理工程において、表面処理液として用いられるアンモニア含有水溶液あるいはアミン化合物含有水溶液を加熱し、加熱した水溶液中に基板を浸すことにより、表面処理と同時に基板のプレ加熱を行うことができる。
 表面処理後水洗工程において、水を加熱し、加熱した水中に基板を浸すことにより、水洗と同時に基板のプレ加熱を行うことができる。
 また、表面処理後水除去工程において、ヒーターによるプレ加熱を行うようにしてもよい。
In the surface treatment step, the ammonia-containing aqueous solution or the amine compound-containing aqueous solution used as the surface treatment liquid is heated, and the substrate is preheated simultaneously with the surface treatment by immersing the substrate in the heated aqueous solution.
In the water washing step after the surface treatment, the substrate can be preheated simultaneously with the water washing by heating the water and immersing the substrate in the heated water.
In the post-surface treatment water removal step, preheating with a heater may be performed.

 表面処理工程、水洗工程、水除去工程において、徐々に温度を高く設定し、CBD工程直前に成膜温度以上の温度とするようにしてもよいし、表面処理工程から成膜温度以上の温度となるようにしてもよい。また、加熱は水洗工程以降、あるいは水除去工程においてのみ行ってもよい。いずれにしても、CBD工程において、CBD反応液に浸漬される直前に、基板温度が成膜温度以上であることが好ましい。 In the surface treatment process, the water washing process, and the water removal process, the temperature may be set gradually higher so that the temperature is equal to or higher than the film formation temperature immediately before the CBD process. It may be made to become. Moreover, you may perform a heating only after a water washing process, or in a water removal process. In any case, in the CBD process, the substrate temperature is preferably equal to or higher than the film formation temperature immediately before being immersed in the CBD reaction solution.

(CBD工程)
 光電変換半導体層の表面処理後、水洗、水除去がなされた基板の光電変換半導体層上に、バッファ層の成膜を行う。ここでは、CBD成膜装置1の反応槽5中において光電変換半導体層30上へのバッファ層40の成膜がなされる。
(CBD process)
After the surface treatment of the photoelectric conversion semiconductor layer, a buffer layer is formed on the photoelectric conversion semiconductor layer of the substrate that has been washed and removed with water. Here, the buffer layer 40 is formed on the photoelectric conversion semiconductor layer 30 in the reaction vessel 5 of the CBD film forming apparatus 1.

 CBD成膜装置1の動作について図2および図3を参照して説明する。基板Aをドラム3に密着支持させる際に、同時に巻出しロール15からロール状に巻回された保護部材6を送りだして、ドラム3に密着支持された基板Aの短手方向端部と、ドラム3のうち基板Aが密着しない部分とを、保護部材6によって基板Aの裏面および端面へのCBD反応液4の接触を阻止することができるようにオーバーラップさせる。ドラム3はその一部、例えばドラム中心までが反応槽5内のCBD反応液4に浸漬されている。このとき、反応槽5内のCBD反応液4の液面は、基板Aと基板Aをオーバーラップする保護部材6とが接触し始める位置よりも低い位置にある。 The operation of the CBD film forming apparatus 1 will be described with reference to FIGS. When the substrate A is closely supported by the drum 3, the protective member 6 wound in a roll shape is simultaneously fed from the unwinding roll 15, and the short-side end of the substrate A that is closely supported by the drum 3, and the drum 3 are overlapped so that the protective member 6 can prevent the CBD reaction liquid 4 from contacting the back surface and the end surface of the substrate A. A part of the drum 3, for example, the center of the drum 3 is immersed in the CBD reaction solution 4 in the reaction tank 5. At this time, the liquid level of the CBD reaction liquid 4 in the reaction tank 5 is at a position lower than the position where the substrate A and the protective member 6 that overlaps the substrate A start to contact.

 ここでCBD装置1の駆動部を駆動し、ドラム3の周速に同期させてドラム3に密着させた基板Aと保護部材6をCBD反応液4中で共走行させ、基板Aのドラム3に密着していない片表面、すなわち光電変換半導体層表面にバッファ層を形成させる。反応液は、バッファ層が析出する基板Aの光電変換半導体層表面にしか接触しないため、基板がCBD反応液に溶解してしまう成分を含むものであっても、基板からこのような成分を溶出させることなくバッファ層を形成することが可能である。また、基板Aの裏面(ドラム3に密着している側)にはCBD反応液4が侵入することがないので、基板Aの裏面にバッファ層が形成されるのを抑制することもできる。 Here, the driving unit of the CBD device 1 is driven, and the substrate A and the protective member 6 that are in close contact with the drum 3 in synchronism with the peripheral speed of the drum 3 are caused to co-run in the CBD reaction solution 4, so A buffer layer is formed on one surface that is not in close contact, that is, on the surface of the photoelectric conversion semiconductor layer. Since the reaction solution contacts only the photoelectric conversion semiconductor layer surface of the substrate A on which the buffer layer is deposited, even if the substrate contains a component that dissolves in the CBD reaction solution, such a component is eluted from the substrate. It is possible to form the buffer layer without causing it. Further, since the CBD reaction solution 4 does not enter the back surface of the substrate A (the side in close contact with the drum 3), it is possible to suppress the formation of a buffer layer on the back surface of the substrate A.

 次に、CBD法の詳細について説明する。CBD法は、一般式 [M(L)i] m+ ⇔Mn++iL(式中、MはCd、Zn、In、Sn等の金属元素、Lは配位子、m,n,i:正数を各々示す。)で表されるような平衡によって過飽和条件となる濃度とpHを有する金属イオン溶液を反応液として用い、金属イオンMの錯体を形成させることで、安定した環境で適当な速度で基板上に金属化合物薄膜を析出させる方法である。 Next, details of the CBD method will be described. The CBD method uses a general formula [M (L) i ] m + ⇔M n + + iL (where M is a metal element such as Cd, Zn, In, Sn, L is a ligand, m, n, i: positive number By using as a reaction solution a metal ion solution having a concentration and a pH that are in a supersaturated condition due to an equilibrium as represented by the following formula, a complex of metal ions M is formed at an appropriate rate in a stable environment. In this method, a metal compound thin film is deposited on a substrate.

 CBD反応液としては、例えばCdまたはZnのような金属(M)源と硫黄源を含むものを挙げることができる。これによって、CdS、ZnS、Zn(S,O)、Zn(S,O,OH)のバッファ層を形成することができる。硫黄源としては硫黄を含有する化合物、例えばチオ尿素(CS(NH22)、チオアセトアミド(C25NS)の他、チオセミカルバジド、チオウレタン、ジエチルアミン、トリエタノールアミン等を用いることができる。 Examples of the CBD reaction liquid include those containing a metal (M) source such as Cd or Zn and a sulfur source. Thereby, a buffer layer of CdS, ZnS, Zn (S, O), Zn (S, O, OH) can be formed. As the sulfur source, a compound containing sulfur, for example, thiourea (CS (NH 2 ) 2 ), thioacetamide (C 2 H 5 NS), thiosemicarbazide, thiourethane, diethylamine, triethanolamine, etc. may be used. it can.

 CdSバッファ層の場合には、上記硫黄源と、Cd化合物(例えば硫酸カドミウム、酢酸カドミウム、硝酸カドミウム、塩化カドミウムおよびこれらの水和物等)と、アンモニア水あるいはアンモニウム塩(例えばCH3COONH4、NH4Cl、NH4Iおよび(NH42SO4等)との混合溶液を反応液として用いることができる。 In the case of the CdS buffer layer, the sulfur source, a Cd compound (for example, cadmium sulfate, cadmium acetate, cadmium nitrate, cadmium chloride, and a hydrate thereof), ammonia water or ammonium salt (for example, CH 3 COONH 4 , A mixed solution of NH 4 Cl, NH 4 I and (NH 4 ) 2 SO 4 or the like) can be used as a reaction solution.

 かかる方法では、反応温度は、70℃~95℃とすることが好ましい。反応時間は5~60分程度とすればよい。CdSは、バッファ層として好適な材料であるが、Cdは毒性が強く環境負荷の点では好ましくない。従ってバッファ層40としては、Cd不含有の金属化合物、例えば、Zn(S,O)及び/又はZn(S,O,OH)を主成分とするZn化合物層がより好ましい。 In such a method, the reaction temperature is preferably 70 to 95 ° C. The reaction time may be about 5 to 60 minutes. CdS is a suitable material for the buffer layer, but Cd is highly toxic and is not preferable in terms of environmental load. Accordingly, the buffer layer 40 is more preferably a Cd-free metal compound, for example, a Zn compound layer mainly composed of Zn (S, O) and / or Zn (S, O, OH).

 バッファ層40がZn(S,O)及び/又はZn(S,O,OH)を主成分とするZn化合物層である場合は、少なくとも1種の亜鉛源である成分(Z)、少なくとも1種の硫黄源である成分(S)、少なくとも1種のクエン酸化合物である成分(C)、アンモニア及びアンモニウム塩からなる群より選ばれた少なくとも1種である成分(N)、及び水を含有し、かつ、成分(C)の濃度が0.001~0.25Mであり、成分(N)の濃度が0.001~0.40Mであり、反応開始前のpHが9.0~12.0である反応液を用いるのが好ましい。 When the buffer layer 40 is a Zn compound layer mainly composed of Zn (S, O) and / or Zn (S, O, OH), at least one component (Z) as a zinc source, at least one A component (S) that is a sulfur source of the component, a component (C) that is at least one citric acid compound, a component (N) that is at least one selected from the group consisting of ammonia and an ammonium salt, and water. And the concentration of the component (C) is 0.001 to 0.25M, the concentration of the component (N) is 0.001 to 0.40M, and the pH before starting the reaction is 9.0 to 12.0M. It is preferable to use a reaction solution that is

 成分(Z)としては特に制限されず、硫酸亜鉛、酢酸亜鉛、硝酸亜鉛、塩化亜鉛、炭酸亜鉛、及びこれらの水和物からなる群より選ばれた少なくとも1種を含むことが好ましい。
 成分(Z)の濃度は特に制限されず、0.001~0.5Mが好ましい。
The component (Z) is not particularly limited, and preferably contains at least one selected from the group consisting of zinc sulfate, zinc acetate, zinc nitrate, zinc chloride, zinc carbonate, and hydrates thereof.
The concentration of component (Z) is not particularly limited and is preferably 0.001 to 0.5M.

 成分(S)としては特に制限されず、チオ尿素を含むことが好ましい。
 成分(S)の濃度は特に制限されず、0.01~1.0Mが好ましい。
The component (S) is not particularly limited, and preferably contains thiourea.
The concentration of component (S) is not particularly limited and is preferably 0.01 to 1.0M.

 成分(C)は錯形成剤等として機能する成分であり、成分(C)の種類と濃度を好適化することで、錯体が形成されやすくなる。
 少なくとも1種のクエン酸化合物である成分(C)を用いることで、クエン酸化合物を用いない反応液よりも錯体が形成されやすく、CBD反応による結晶成長が良好に制御され、下地を良好に被覆する膜を安定的に成膜することができる。
Component (C) is a component that functions as a complex-forming agent and the like, and a complex is easily formed by optimizing the type and concentration of component (C).
By using component (C), which is at least one kind of citric acid compound, a complex is more easily formed than in a reaction solution that does not use a citric acid compound, crystal growth by the CBD reaction is well controlled, and the base is covered well. Thus, a stable film can be formed.

 成分(C)としては特に制限されず、クエン酸ナトリウム及び/又はその水和物を含むことが好ましい。成分(C)の濃度は0.001~0.25Mとする。成分(C)の濃度がこの範囲内であれば錯体が良好に形成され、下地を良好に被覆する膜を安定的に成膜することができる。成分(C)の濃度が0.25M超では、錯体が良好に形成された安定な水溶液となるが、その反面、基板上への析出反応の進行が遅くなったり、反応が全く進行しなくなる場合がある。成分(C)の濃度は好ましくは0.001~0.1Mである。 Component (C) is not particularly limited, and preferably contains sodium citrate and / or a hydrate thereof. The concentration of component (C) is 0.001 to 0.25M. If the concentration of the component (C) is within this range, the complex is formed satisfactorily, and a film that satisfactorily covers the base can be stably formed. When the concentration of component (C) exceeds 0.25M, a stable aqueous solution in which the complex is well formed is obtained, but on the other hand, the progress of the precipitation reaction on the substrate is slow or the reaction does not proceed at all. There is. The concentration of component (C) is preferably 0.001 to 0.1M.

 成分(N)はpH調整剤等として機能する成分であるが、錯形成剤等として機能する成分でもある。成分(N)として用いて好適なアンモニウム塩としては特に制限されず、NHOH等が挙げられる。
 成分(N)の濃度は0.001~0.40Mとする。成分(N)によってpHを調整して、金属イオンの溶解度や過飽和度を調整することができる。成分(N)の濃度が0.001~0.40Mの範囲内であれば反応速度が速く、成膜工程の前に微粒子層形成工程を設けなくても実用的な生産速度で成膜を実施することができる。成分(N)の濃度が0.40M超では反応速度が遅くなり、成膜工程の前に微粒子層を付けるなどの工夫が必要となる。成分(N)の濃度は好ましくは0.01~0.30Mである。
Component (N) is a component that functions as a pH adjuster or the like, but is also a component that functions as a complexing agent or the like. The ammonium salt suitable for use as the component (N) is not particularly limited, and examples thereof include NH 4 OH.
The concentration of component (N) is 0.001 to 0.40M. The solubility and supersaturation degree of metal ions can be adjusted by adjusting the pH with the component (N). If the concentration of component (N) is within the range of 0.001 to 0.40M, the reaction rate is fast, and film formation is carried out at a practical production rate without providing a fine particle layer formation step before the film formation step. can do. When the concentration of the component (N) exceeds 0.40 M, the reaction rate becomes slow, and it is necessary to devise such as adding a fine particle layer before the film forming step. The concentration of component (N) is preferably 0.01 to 0.30M.

 反応開始前の反応液のpHは9.0~12.0とする。
 反応液の反応開始前のpHが9.0未満では、チオ尿素等の成分(S)の分解反応が進行しないか、進行しても極めてゆっくりであるため、析出反応が進行しない。チオ尿素の分解反応は下記の通りである。チオ尿素の分解反応については、J. Electrochem. Soc., Vol.141, No.1, January 1994, 及びJournal of Crystal Growth 299 (2007) 136-141等に記載されている。
SC(NH
+ OH- ⇔ SH- + CH2 + HO、
SH
+ OH ⇔S2- + HO。
 反応液の反応開始前のpHが12.0超では、錯形成剤等としても機能する成分(N)が安定な溶液を作る効果が大きくなり、析出反応が進行しないか、あるいは進行しても極めて遅い進行となってしまう。反応液の反応開始前のpHは好ましくは9.5~11.5である。
The pH of the reaction solution before starting the reaction is 9.0 to 12.0.
When the pH of the reaction solution before the start of reaction is less than 9.0, the decomposition reaction of the component (S) such as thiourea does not proceed, or even if it proceeds, the precipitation reaction does not proceed. The decomposition reaction of thiourea is as follows. The decomposition reaction of thiourea is described in J. Electrochem. Soc., Vol. 141, No. 1, January 1994, and Journal of Crystal Growth 299 (2007) 136-141.
SC (NH 2 ) 2
+ OH ⇔ SH + CH 2 N 2 + H 2 O,
SH -
+ OH ⇔S 2 + + H 2 O.
When the pH of the reaction solution before the start of the reaction exceeds 12.0, the effect that the component (N) that also functions as a complexing agent or the like makes a stable solution increases, and the precipitation reaction does not proceed or proceeds. It will be very slow. The pH of the reaction solution before starting the reaction is preferably 9.5 to 11.5.

 成分(N)の濃度が0.001~0.40Mであれば、成分(N)以外のpH調整剤を用いるなどの特段のpH調整をしなくても、通常反応開始前の反応液のpHは9.0~12.0の範囲内となる。 If the concentration of the component (N) is 0.001 to 0.40 M, the pH of the reaction solution before starting the reaction usually does not require special pH adjustment such as using a pH adjuster other than the component (N). Is in the range of 9.0 to 12.0.

 反応液の反応終了後のpHは特に制限されない。反応液の反応終了後のpHは7.5~11.0であることが好ましい。反応液の反応終了後のpHが7.5未満では、反応が進行しない期間を含んでいたことになり、効率的な製造を考えると無意味である。また、緩衝作用のあるアンモニアが入っていた系でこれだけのpH低下があった場合には、アンモニアが加熱工程で過剰に揮発している可能性が高く、製造上の改善が必要であると考えられる。反応液の反応終了後のpHが11.0超では、チオ尿素の分解は促進されるが、亜鉛イオンの多くがアンモニウム錯体として安定になるため、析出反応の進行が著しく遅くなる場合がある。反応液の反応終了後のpHはより好ましくは9.5~10.5である。
 上記反応液では、成分(N)以外のpH調整剤を用いるなどの特段のpH調整をしなくても、通常反応開始後の反応液のpHは7.5~11.0の範囲内となる。
The pH after completion of the reaction of the reaction solution is not particularly limited. The pH of the reaction solution after completion of the reaction is preferably 7.5 to 11.0. When the pH of the reaction solution after completion of the reaction is less than 7.5, it means that the reaction does not proceed, and it is meaningless when considering efficient production. In addition, if there is such a pH drop in a system containing ammonia that has a buffering effect, it is highly possible that ammonia has volatilized excessively in the heating process, and it is considered that manufacturing improvements are necessary. It is done. When the pH of the reaction solution after completion of the reaction is more than 11.0, the decomposition of thiourea is promoted, but since most of the zinc ions are stabilized as ammonium complexes, the progress of the precipitation reaction may be remarkably slowed. The pH of the reaction solution after completion of the reaction is more preferably 9.5 to 10.5.
In the above reaction solution, the pH of the reaction solution after the start of the reaction is usually in the range of 7.5 to 11.0 without special pH adjustment such as using a pH adjusting agent other than the component (N). .

 反応温度は70~95℃とする。反応温度が70℃未満では反応速度が遅くなり、薄膜が成長しない、あるいは薄膜成長しても実用的な反応速度で所望の厚み(例えば50nm以上)を得るのが難しくなる。反応温度が95℃超では、反応液中で気泡等の発生が多くなり、それが膜表面に付着したりして平坦で均一な膜が成長しにくくなる。さらに、反応が開放系で実施される場合には、溶媒の蒸発等による濃度変化などが生じ、安定した薄膜析出条件を維持することが難しくなる。反応温度は好ましくは80~90℃である。 The reaction temperature is 70 to 95 ° C. If the reaction temperature is less than 70 ° C., the reaction rate becomes slow, and the thin film does not grow, or even if the thin film is grown, it is difficult to obtain a desired thickness (for example, 50 nm or more) at a practical reaction rate. When the reaction temperature exceeds 95 ° C., generation of bubbles and the like increases in the reaction solution, which adheres to the film surface and makes it difficult to grow a flat and uniform film. Furthermore, when the reaction is carried out in an open system, a concentration change due to evaporation of the solvent or the like occurs, making it difficult to maintain stable thin film deposition conditions. The reaction temperature is preferably 80 to 90 ° C.

 反応時間は特に制限されない。反応時間は反応温度にもよるが、例えば10~60分間で、下地を良好に被覆し、バッファ層として充分な厚みの層を成膜することができる。 The reaction time is not particularly limited. Although the reaction time depends on the reaction temperature, for example, the base can be satisfactorily covered in 10 to 60 minutes, and a layer having a sufficient thickness as a buffer layer can be formed.

 また、上記反応液は水系である。反応液のpHは強酸条件ではない。反応液のpHは11.0~12.0でもよいが、11.0未満の穏やかなpH条件でも反応を実施することができる。反応温度もそれ程高温を必須としない。したがって、環境負荷が少なく、基板へのダメージも小さく抑えられる。 Moreover, the reaction solution is aqueous. The pH of the reaction solution is not a strong acid condition. The pH of the reaction solution may be 11.0 to 12.0, but the reaction can be carried out under mild pH conditions of less than 11.0. The reaction temperature is not so high. Therefore, the environmental load is small and the damage to the substrate can be kept small.

(CBD後洗浄工程)
 バッファ層40の成膜時にはバッファ層40の表面にコロイド状固形物が付着する場合がある。このコロイド状固形物をそのままの状態にしておくと、バッファ層被覆部での高抵抗を保持し、太陽電池の変換効率を向上させることができなくなることがある。また、このコロイド状固形物が突起であったりした場合に、この上に透光性導電層を形成すると、その製膜の過程や製膜後にその突起物と共に剥離してしまうようなこともある。よって、CBD工程によるバッファ層の成膜後、バッファ層表面の洗浄を行う。
 洗浄液としては、純水の他、イオン交換水、工業用水、あるいは水にコロイド除去効果のある添加剤を添加した溶液などを用いるのが好ましい。洗浄液の温度は20℃~40℃が好ましい。洗浄方法は、水槽中に浸漬させて行ってもよいし、シャワー洗浄であってもよい。
(Cleaning process after CBD)
When the buffer layer 40 is formed, colloidal solid matter may adhere to the surface of the buffer layer 40. If this colloidal solid is left as it is, it may not be possible to maintain high resistance at the buffer layer coating and improve the conversion efficiency of the solar cell. In addition, when this colloidal solid is a protrusion, if a light-transmitting conductive layer is formed thereon, it may be peeled off along with the protrusion during the film forming process or after film formation. . Therefore, after the buffer layer is formed by the CBD process, the surface of the buffer layer is cleaned.
As the cleaning liquid, it is preferable to use pure water, ion exchange water, industrial water, or a solution obtained by adding an additive having a colloid removing effect to water. The temperature of the cleaning liquid is preferably 20 ° C. to 40 ° C. The cleaning method may be performed by immersing in a water tank or shower cleaning.

(CBD後洗浄液除去工程)
 その後、洗浄後の基板に付着している洗浄液を、ドライエアーあるいは窒素を基板表裏面に吹き付けることにより除去する。
(After CBD cleaning liquid removal step)
Thereafter, the cleaning liquid adhering to the cleaned substrate is removed by spraying dry air or nitrogen on the front and back surfaces of the substrate.

 なお、バッファ層がZnS、Zn(S,O)、Zn(S,O,OH)である場合には、上記CBD後洗浄液除去工程の後、150℃~250℃の温度、好ましくは170℃~210℃の温度で、5分~60分加熱を行う加熱処理工程(アニール処理工程)を設けることが好ましい。加熱雰囲気は大気中、真空中など特に限定しない。加熱手段は特に限定されないが、市販のオーブン、電気炉、真空オーブン等を利用した加熱が好ましい。 When the buffer layer is made of ZnS, Zn (S, O), Zn (S, O, OH), after the post CBD cleaning liquid removing step, the temperature is 150 ° C. to 250 ° C., preferably 170 ° C. It is preferable to provide a heat treatment process (annealing process) in which heating is performed at 210 ° C. for 5 minutes to 60 minutes. The heating atmosphere is not particularly limited in air or vacuum. The heating means is not particularly limited, but heating using a commercially available oven, electric furnace, vacuum oven or the like is preferable.

 バッファ層40を形成後、必要に応じて窓層(保護層)50を成膜する。窓層50は、光を取り込む中間層である。窓層50としては、光を取り込む透光性を有していれば特に制限されないが、その組成としてはバンドギャップを考慮すれば、i-ZnO等が好ましい。窓層50の膜厚は特に制限されず、10nm~2μmが好ましく、15~200nmがより好ましい。窓層50の成膜方法は、特に制限されないが、スパッタ法やMOCVD法が適している。一方で、バッファ層40を液相法により製造するため、製造プロセスを簡易にするためには液相法を用いることも好ましい。窓層50は必須ではなく、窓層50のない光電変換素子もある。 After forming the buffer layer 40, a window layer (protective layer) 50 is formed as necessary. The window layer 50 is an intermediate layer that captures light. The window layer 50 is not particularly limited as long as it has a light-transmitting property for taking in light, but i-ZnO or the like is preferable as the composition in consideration of the band gap. The thickness of the window layer 50 is not particularly limited, and is preferably 10 nm to 2 μm, and more preferably 15 to 200 nm. The method for forming the window layer 50 is not particularly limited, but a sputtering method or an MOCVD method is suitable. On the other hand, since the buffer layer 40 is manufactured by the liquid phase method, it is also preferable to use the liquid phase method in order to simplify the manufacturing process. The window layer 50 is not essential, and there is a photoelectric conversion element without the window layer 50.

 窓層50を形成後、窓層50上に透光性導電層60を設ける。透光性導電層60は、光を取り込むと共に、下部電極20と対になって、光電変換半導体層30で生成された電荷が流れる電極として機能する層である。透光性導電層60の組成としては特に制限されず、ZnO:Al、ZnO:Ga、ZnO:B等のn-ZnO等が好ましい。透光性導電層60の膜厚は特に制限されず、50nm~2μmが好ましい。
 透光性導電層60の成膜方法としては特に制限されないが、窓層と同様、スパッタ法やMOCVD法が適している。一方で、製造プロセスを簡易にするためには液相法を用いることも好ましい。
After the window layer 50 is formed, the translucent conductive layer 60 is provided on the window layer 50. The translucent conductive layer 60 is a layer that captures light and functions as an electrode that is paired with the lower electrode 20 and through which charges generated in the photoelectric conversion semiconductor layer 30 flow. The composition of the translucent conductive layer 60 is not particularly limited, and n-ZnO such as ZnO: Al, ZnO: Ga, and ZnO: B is preferable. The film thickness of the translucent conductive layer 60 is not particularly limited and is preferably 50 nm to 2 μm.
The film forming method of the translucent conductive layer 60 is not particularly limited, but the sputtering method and the MOCVD method are suitable as with the window layer. On the other hand, in order to simplify the manufacturing process, it is also preferable to use a liquid phase method.

 透光性導電層60を形成後、透光性導電層60上に上部電極70を設ける。上部電極70の主成分としては特に制限されず、Al等が挙げられる。上部電極70の膜厚は特に制限されず、0.1~3μmが好ましい。 After forming the translucent conductive layer 60, the upper electrode 70 is provided on the translucent conductive layer 60. The main component of the upper electrode 70 is not particularly limited, and examples thereof include Al. The thickness of the upper electrode 70 is not particularly limited and is preferably 0.1 to 3 μm.

 なお、多数の光電変換素子(セル)が集積化されてなる集積化太陽電池においては、上部電極は直列接続されたセルのうち、電力取出し端となるセルに設けられている。 In an integrated solar cell in which a large number of photoelectric conversion elements (cells) are integrated, the upper electrode is provided in a cell serving as a power extraction end among cells connected in series.

 なお、上述の光電変換素子の製造工程には、勿論、上記説明した工程以外の他の工程を含むことができる。例えば、下部電極のスクライブ処理、光電変換層形成後のスクライブ処理、バッファ層および透明導電層形成後のスクライブ処理等の集積化のためのパターニング工程、長尺な基板を用いた場合には1モジュールに切断する切断処理工程などを加えることにより、集積化光電変換装置(集積化太陽電池)を製造することができる。また必要に応じてカバーガラス、保護フィルム等を取りつけてもよい。 Of course, the manufacturing process of the photoelectric conversion element described above may include other processes than the processes described above. For example, a patterning process for integration such as a scribing process of the lower electrode, a scribing process after forming the photoelectric conversion layer, a scribing process after forming the buffer layer and the transparent conductive layer, and one module when using a long substrate An integrated photoelectric conversion device (integrated solar cell) can be manufactured by adding a cutting process step or the like. Moreover, you may attach a cover glass, a protective film, etc. as needed.

 本発明の製造方法によれば、CBD反応液に溶解してしまうような部分を含む基板(例えば、基板端面や基板裏面など溶解しうる成分が露出している場合を含む)を用いた場合でも、基板裏面をドラム3に密着させ、さらに基板端面を保護部材6により保護した上で連続的にCBD法を実施するので、基板成分を溶解させることなくバッファ層の成膜を行うことができる。 According to the production method of the present invention, even when a substrate including a portion that dissolves in the CBD reaction solution (for example, when a soluble component such as a substrate end surface or a substrate back surface is exposed) is used. Since the back surface of the substrate is brought into close contact with the drum 3 and the end surface of the substrate is further protected by the protective member 6 and the CBD method is continuously performed, the buffer layer can be formed without dissolving the substrate components.

 また、可撓性を有する基板を用いた光電変換素子の製造方法において、高効率な光電変換素子を製造するためのバッファ層形成工程前後の製造プロセスを明確にしたので高効率な光電変換素子を高い生産性で製造することが可能となる。 In addition, in the method for manufacturing a photoelectric conversion element using a flexible substrate, the manufacturing process before and after the buffer layer forming step for manufacturing a highly efficient photoelectric conversion element has been clarified. It becomes possible to manufacture with high productivity.

 本発明の光電変換素子の製造方法は、基板10として可撓性を有する長尺な基板を用いる場合には、光電変換半導体層30の表面処理工程からCBD後洗浄液除去工程までを連続的にロール・トゥ・ロール方式で行うことができる。 The method for producing a photoelectric conversion element of the present invention continuously rolls from the surface treatment process of the photoelectric conversion semiconductor layer 30 to the post-CBD cleaning liquid removal process when a long flexible substrate is used as the substrate 10.・ It can be done by the to-roll method.

 ロール・トゥ・ロール方式では、ロール状に巻かれた可撓性基板を繰り出して、間欠的あるいは連続的に搬送しながら、巻取りロールにより巻き取られるまでの間のプロセスを実施するので、kmオーダの長尺基板を一括処理することが可能であるため、簡易に量産が可能であり好ましい。ロール・トゥ・ロール方式と、個別に切り離された基材を工程毎に搬送する枚葉方式とを比較すると、枚葉方式では、それぞれの工程に基材の搬入部、搬出部を設ける必要があり、工程毎の装置規模が大きくなりやすいが、ロール・トゥ・ロール方式では、基材は各工程間を間欠的あるいは連続的に流れるため各工程を互いに連結でき、基材搬送に伴う作業の削減や装置の小型化が可能となる。 In the roll-to-roll method, a flexible substrate wound in a roll shape is drawn out, and intermittently or continuously conveyed, and a process until winding up by a winding roll is performed. Since it is possible to batch-process long substrates of the order, it is preferable because it can be easily mass-produced. Comparing the roll-to-roll method with the single-wafer method that transports individually separated substrates for each process, the single-wafer method requires the provision of a substrate loading and unloading unit for each process. Yes, the scale of the equipment for each process tends to be large, but in the roll-to-roll method, the base material flows intermittently or continuously between the processes, so the processes can be connected to each other, and the work involved in transporting the base material Reduction and downsizing of the device are possible.

 本発明の製造方法をロール・トゥ・ロール方式で実施するための製造装置の一例を説明する。図11は、製造装置100の概略構成を示すものであり、製造装置100は、図3に示したCBD装置1の巻出しロール11とCBD反応槽5との間に、表面処理工程、表面処理後水洗工程、表面処理後水除去工程の各工程を行うゾーンa~cが設けられ、さらに、CBD工程を行うゾーンdであるCBD反応槽5と巻取りロール12との間に、CBD後洗浄工程、CBD後洗浄液除去工程の各工程を行うゾーンe、fが設けられた構成となっている。 An example of a manufacturing apparatus for carrying out the manufacturing method of the present invention by a roll-to-roll method will be described. FIG. 11 shows a schematic configuration of the manufacturing apparatus 100. The manufacturing apparatus 100 includes a surface treatment process and a surface treatment between the unwinding roll 11 and the CBD reaction tank 5 of the CBD apparatus 1 shown in FIG. Zones a to c for performing a post-water washing process and a post-surface treatment water removal process are provided, and further, a post-CBD cleaning is performed between the CBD reaction tank 5 and the take-up roll 12, which is the zone d for performing the CBD process. Zones e and f for performing each step of the process and the post-CBD cleaning liquid removal process are provided.

 製造装置100において、光電変換半導体層を成膜後の基板A(図1のAで示す構成部分が長尺となったもの)が、巻出しロール11にロール状に巻回されており、基板Aの表面処理の後、水洗、水除去(乾燥)をし、次いでバッファ層を成膜した後、さらに洗浄、洗浄液除去(乾燥)を実施して巻取りロール12により巻き取られる。 In the manufacturing apparatus 100, the substrate A after the photoelectric conversion semiconductor layer is formed (the component shown by A in FIG. 1 is elongated) is wound around the unwinding roll 11 in a roll shape, After the surface treatment of A, water washing and water removal (drying) are performed, and then a buffer layer is formed, and further washing and cleaning liquid removal (drying) are performed, and the film is taken up by the take-up roll 12.

 製造装置100において、巻出しロール11から巻き出された基板Aは、ガイドロール(送り出しロール)35により導かれて各工程のゾーンに搬送される。複数のガイドロール35は、基板Aの搬送方向の調整が必要な箇所に適宜配置されている。なお、ガイドロール35、13、14のうち、基板の各層成膜面側に配置されているものは、成膜表面を傷つけないように基板のエッジ部のみで基板を支持可能な構成のロールである。 In the manufacturing apparatus 100, the substrate A unwound from the unwinding roll 11 is guided by a guide roll (feeding-out roll) 35 and transported to the zone of each process. The plurality of guide rolls 35 are appropriately disposed at locations where adjustment of the transport direction of the substrate A is necessary. Of the guide rolls 35, 13, and 14, the ones arranged on the film formation surface side of the substrate are rolls that can support the substrate only by the edge portion of the substrate so as not to damage the film formation surface. is there.

 表面処理工程ゾーンaには、CBD装置のドラム3と同様のドラム23と、該ドラムが浸漬される表面処理液24で満たされた液槽25とが備えられており、基板Aは光電変換半導体層30が表面となるようにドラム23に密着された状態で表面処理液24に浸漬される。 The surface treatment process zone a is provided with a drum 23 similar to the drum 3 of the CBD device, and a liquid tank 25 filled with a surface treatment liquid 24 in which the drum is immersed, and the substrate A is a photoelectric conversion semiconductor. It is immersed in the surface treatment liquid 24 in a state of being in close contact with the drum 23 so that the layer 30 becomes the surface.

 表面処理後水洗工程ゾーンbには、純水26で満たされた第1の水槽27が備えられている。基板Aはガイドロール35に沿って第1の水槽27の純水26中を搬送されることにより水洗される。 In the post-surface treatment rinsing process zone b, a first water tank 27 filled with pure water 26 is provided. The substrate A is washed with water by being conveyed in the pure water 26 of the first water tank 27 along the guide roll 35.

 表面処理後水除去工程ゾーンcには基板Aの表裏面にドライエアーを吹き付けるブロワー31が備えられており、表面処理後水除去工程ゾーンcにおいて、ドライエアーが基板に吹き付けられて、水洗後に基板表裏に付着している水が除去される。 The post-surface treatment water removal step zone c is provided with a blower 31 that blows dry air onto the front and back surfaces of the substrate A. In the post-surface treatment water removal step zone c, dry air is blown onto the substrate, and the substrate is washed with water. Water adhering to the front and back is removed.

 CBD工程ゾーンdにはCBD装置1が備えられており、CBD装置1の反応槽5中において光電変換半導体層30上へのバッファ層40の形成がなされる。 In the CBD process zone d, the CBD device 1 is provided, and the buffer layer 40 is formed on the photoelectric conversion semiconductor layer 30 in the reaction tank 5 of the CBD device 1.

 CBD後洗浄工程ゾーンeには、洗浄液28で満たされた第2の水槽29が備えられている。基板Aはガイドロール35に沿って第2の水槽29の洗浄液28中を搬送されることにより洗浄される。 In the post-CBD cleaning process zone e, a second water tank 29 filled with the cleaning liquid 28 is provided. The substrate A is cleaned by being conveyed in the cleaning liquid 28 of the second water tank 29 along the guide roll 35.

 CBD後洗浄液除去工程ゾーンfには基板Aの表裏面にドライエアーを吹き付けるブロワー32が備えられており、CBD後洗浄液除去工程ゾーンfにおいて、ドライエアーが基板に吹き付けられて、洗浄後に基板およびバッファ層表面に付着している洗浄液が除去される。 The post-CBD cleaning liquid removal process zone f is provided with a blower 32 that blows dry air onto the front and back surfaces of the substrate A. In the post-CBD cleaning liquid removal process zone f, dry air is sprayed onto the substrate, and the substrate and buffer are cleaned after cleaning. The cleaning liquid adhering to the layer surface is removed.

 図11に示す製造装置100にはCBD工程の後、バッファ層40のアニール処理工程を行うためのゾーンを設けていないが、洗浄液除去工程ゾーンfの後、巻取りロール12の前に、アニール処理工程ゾーンを設けてもよい。 The manufacturing apparatus 100 shown in FIG. 11 does not have a zone for performing the annealing process of the buffer layer 40 after the CBD process, but the annealing process is performed after the cleaning liquid removing process zone f and before the winding roll 12. A process zone may be provided.

 上記の製造装置によれば、本発明の製造方法をロール・トゥ・ロール方式で各工程を連続して行うことができ、生産効率の向上を図ることができる。 According to the above-described manufacturing apparatus, the manufacturing method of the present invention can be continuously performed in a roll-to-roll manner, and the production efficiency can be improved.

 本発明に係る実施例及び比較例について説明する。
 以下に示す基板及び各工程を組み合わせて、実施例1~4及び比較例1~3として光電変換素子を作製した。それぞれの例における各工程の有無、条件の組み合わせ、および評価結果を表1に示す。
Examples and comparative examples according to the present invention will be described.
Photoelectric conversion elements were produced as Examples 1 to 4 and Comparative Examples 1 to 3 by combining the following substrates and processes. Table 1 shows the presence / absence of each step, the combination of conditions, and the evaluation results in each example.

(基板)
 基板は全実施例、比較例に共通して下記構成のものを用いた。
 可撓性を有する基板として、ステンレス(SUS)-Al複合基材上のAl表面にアルミニウム陽極酸化膜(AAO)が形成された陽極酸化基板を用い、さらにAAO表面にソーダライムガラス層(SLG層)及び下部電極としてMo電極層、光電変換半導体層としてCu(In0.7Ga0.3)Se2層(CIGS層)が形成された基板を用いた。各層の膜厚は、SUS(100μm超),Al(30μm),AAO(20μm),SLG(0.2μm),Mo(0.8μm),CIGS(1.8μm)であった。SLG層およびMo電極層はスパッタ法により成膜し、CIGS層は多元蒸着法の一種である3段階法により成膜した。
(基板保護)
 本実施例1~4、および比較例1、2については、基板の裏面および端部を反応液から保護するための保護部材により保護した状態で後の工程を行った。
(substrate)
A substrate having the following structure was used in common with all the examples and comparative examples.
As a flexible substrate, an anodized substrate in which an aluminum anodic oxide film (AAO) is formed on an Al surface on a stainless steel (SUS) -Al composite base material is used, and a soda lime glass layer (SLG layer) is further formed on the AAO surface. ) And a substrate on which a Mo electrode layer was formed as a lower electrode and a Cu (In 0.7 Ga 0.3 ) Se 2 layer (CIGS layer) was formed as a photoelectric conversion semiconductor layer. The film thickness of each layer was SUS (over 100 μm), Al (30 μm), AAO (20 μm), SLG (0.2 μm), Mo (0.8 μm), CIGS (1.8 μm). The SLG layer and the Mo electrode layer were formed by sputtering, and the CIGS layer was formed by a three-stage method which is a kind of multi-source deposition method.
(Board protection)
For Examples 1 to 4 and Comparative Examples 1 and 2, the subsequent steps were performed in a state where the back surface and the edge of the substrate were protected by a protective member for protecting the reaction solution.

(表面処理工程)
 CIGS層の表面処理にはシアン化カリウム(KCN)10%水溶液を表面処理液として用いた。表面処理液の入った反応槽を用意し、CIGS層の表面を室温にて3分間、KCN水溶液に浸漬させてCIGS層表面の不純物除去を行った。
(Surface treatment process)
For the surface treatment of the CIGS layer, a 10% aqueous solution of potassium cyanide (KCN) was used as the surface treatment solution. A reaction vessel containing a surface treatment solution was prepared, and the surface of the CIGS layer was immersed in a KCN aqueous solution at room temperature for 3 minutes to remove impurities from the CIGS layer surface.

(表面処理後水洗工程)
 表面処理工程後、純水による十分な水洗を行った。
(Water washing process after surface treatment)
After the surface treatment step, sufficient washing with pure water was performed.

(表面処理後水除去工程)
 水洗後ドライエアー吹き付けによる水除去を行った。
(Water removal process after surface treatment)
After washing with water, water was removed by blowing dry air.

(基板のプレ加熱)
 基板を密着ドラムに固定し、基板裏面からのヒーター加熱によって基板の温度が95℃となるまで加熱した。
(Pre-heating the substrate)
The substrate was fixed to the contact drum and heated until the substrate temperature reached 95 ° C. by heater heating from the back side of the substrate.

(CBD工程)
 <CBD反応液の調製>
 成分(Z)の水溶液(I)として硫酸亜鉛水溶液(0.18[M])、成分(S)の水溶液(II)としてチオ尿素水溶液(チオ尿素0.30[M])、成分(C)の水溶液(III)としてクエン酸三ナトリウム水溶液(0.18[M])、及び成分(N)の水溶液(IV)としてアンモニア水(0.30[M])をそれぞれ調製した。次に、これらの水溶液のうち、I,II,IIIを同体積ずつ混合して、硫酸亜鉛0.06[M],チオ尿素0.10[M],クエン酸三ナトリウム0.06[M]となる混合溶液を完成させ、この混合溶液と,0.30[M]のアンモニア水を同体積ずつを混合してCBD反応液を得た。水溶液(I)~(IV)を混合する際には、水溶液(IV)を最後に添加するようにした。透明な反応液とするには、水溶液(IV)を最後に添加することが重要である。得られたCBD反応液のpHは10.3であった。
(CBD process)
<Preparation of CBD reaction solution>
Zinc sulfate aqueous solution (0.18 [M]) as aqueous solution (I) of component (Z), thiourea aqueous solution (thiourea 0.30 [M]) as aqueous solution (II) of component (S), component (C) Aqueous solution of trisodium citrate (0.18 [M]) was prepared as an aqueous solution (III), and aqueous ammonia (0.30 [M]) was prepared as an aqueous solution (IV) of component (N). Next, among these aqueous solutions, I, II, and III are mixed in the same volume, zinc sulfate 0.06 [M], thiourea 0.10 [M], trisodium citrate 0.06 [M]. The mixed solution was completed, and this mixed solution and 0.30 [M] aqueous ammonia were mixed in equal volumes to obtain a CBD reaction solution. When mixing the aqueous solutions (I) to (IV), the aqueous solution (IV) was added last. In order to obtain a transparent reaction solution, it is important to add the aqueous solution (IV) last. The pH of the obtained CBD reaction solution was 10.3.

 <CBD条件1>
 基板を90℃に温調したCBD反応液中に浸漬させ、30分間析出を行った。
<CBD condition 1>
The substrate was immersed in a CBD reaction solution whose temperature was adjusted to 90 ° C., and deposition was performed for 30 minutes.

 <CBD条件2>
 基板を室温のCBD反応液中に浸漬させ、基板を浸漬させたCBD反応液を30分間の間に90℃まで昇温させ、その後90℃で30分間維持して析出を行った。
<CBD condition 2>
The substrate was immersed in a CBD reaction solution at room temperature, and the CBD reaction solution in which the substrate was immersed was heated to 90 ° C. during 30 minutes, and then maintained at 90 ° C. for 30 minutes for precipitation.

(CBD後洗浄工程)
 CBD工程によるバッファ層析出後、洗浄液として純水を用いて十分な洗浄を行った。
(Cleaning process after CBD)
After the buffer layer was deposited by the CBD process, it was sufficiently cleaned using pure water as a cleaning liquid.

(CBD後洗浄液除去工程)
 洗浄後ドライエアー吹き付けによる洗浄液の除去を行った。
(After CBD cleaning liquid removal step)
After cleaning, the cleaning liquid was removed by blowing dry air.

(アニール処理)
 空気中で200℃1時間のアニール処理を行った。
(Annealing treatment)
Annealing treatment was performed in air at 200 ° C. for 1 hour.

(実施例および比較例の素子形成)
 バッファ層上にAlドープ導電性酸化亜鉛薄膜をスパッタ法により成膜した後、上部電極としてAl電極を蒸着法により形成し、その後、スクライブ処理を行って切り出した30mm×30mmの基板上に、光電変換素子(単セルの太陽電池、受光面積が0.516cm2)を8個作製した。
 表1に示す各実施例、比較例毎に8個のセルを作製した。
(Element formation of examples and comparative examples)
After forming an Al-doped conductive zinc oxide thin film on the buffer layer by sputtering, an Al electrode is formed as an upper electrode by vapor deposition, and then a scribe process is performed on a 30 mm × 30 mm substrate cut out. Eight converter elements (single cell solar cell, light receiving area 0.516 cm 2 ) were produced.
Eight cells were produced for each example and comparative example shown in Table 1.

 (評価方法)
 各実施例および比較例について、CBD反応液へのAl溶解量、バッファ層膜厚、光電変換効率の測定を行い評価した。
(Evaluation methods)
About each Example and the comparative example, the amount of Al dissolution to a CBD reaction liquid, the buffer layer film thickness, and the photoelectric conversion efficiency were measured and evaluated.

<CBD反応液へのAl溶解量の測定>
 各実施例および比較例において、バッファ層析出後のCBD反応液2.5mLを25mLメスフラスコでメスアップ(10倍希釈)し、SPS3000
ICP発光分光分析装置を用いてAl濃度を測定した(定量下限値:Al(<1ppm))。なお、測定結果は各サンプルについて2回ずつ測定を行い、得られた値の平均値で算出した。
<Measurement of Al dissolution amount in CBD reaction solution>
In each example and comparative example, 2.5 mL of CBD reaction solution after buffer layer deposition was diluted with a 25 mL volumetric flask (10-fold dilution), and SPS3000.
The Al concentration was measured using an ICP emission spectroscopic analyzer (lower limit of quantification: Al (<1 ppm)). In addition, the measurement result was measured twice for each sample, and the average value of the obtained values was calculated.

<バッファ層の膜厚測定>
 実施例1~4、比較例1~3の方法で作製したサンプルについて、それぞれCIGS層上にバッファ層を形成した段階で、あるいは光電変換素子を作製した段階で、バッファ層の膜厚を評価するために、サンプル表面に保護膜を形成した後に収束イオンビーム(FIB)加工を行ってバッファ層の断面出しを行い、その断面についてSEM観察を実施した。この断面SEM像から合計35箇所について膜厚計測を行った。表1には、膜厚測定値の平均値を示している。
<Measurement of buffer layer thickness>
For the samples prepared by the methods of Examples 1 to 4 and Comparative Examples 1 to 3, the thickness of the buffer layer is evaluated at the stage where the buffer layer is formed on the CIGS layer or when the photoelectric conversion element is manufactured. For this purpose, after forming a protective film on the sample surface, focused ion beam (FIB) processing was performed to extract the cross section of the buffer layer, and SEM observation was performed on the cross section. The film thickness was measured at a total of 35 locations from this cross-sectional SEM image. Table 1 shows the average value of the film thickness measurement values.

<光電変換効率の測定>
 各実施例および比較例につき各8個のセルそれぞれについて光電変換効率を測定した。表1には各実施例、比較例について行った8個のセルについての光電変換効率の平均値を示している。
 作製した各セルについて、ソーラーシュミレーターを用いて、Air
Mass(AM)=1.5、100mW/cm2の擬似太陽光の条件下でエネルギー変換効率を測定した。なお、本測定は光照射を30分行った後に、実施した。なお、比較例3については、基板の溶解が大きく、製品として不備であると共に、変換効率が低いと予想されることから、光電変換効率を測定していない。
<Measurement of photoelectric conversion efficiency>
The photoelectric conversion efficiency was measured for each of eight cells for each example and comparative example. Table 1 shows average values of photoelectric conversion efficiencies for eight cells obtained for each of the examples and comparative examples.
About each produced cell, using a solar simulator, Air
The energy conversion efficiency was measured under conditions of pseudo sunlight of Mass (AM) = 1.5 and 100 mW / cm 2 . In addition, this measurement was implemented after performing light irradiation for 30 minutes. In Comparative Example 3, the photoelectric conversion efficiency was not measured because the dissolution of the substrate was large, the product was incomplete, and the conversion efficiency was expected to be low.

Figure JPOXMLDOC01-appb-T000001
Figure JPOXMLDOC01-appb-T000001

 表1から明らかなように、本発明のように基板をドラムに密着させ、端部を保護材によりオーバーラップして作製した実施例および比較例は基板に含まれるAlを溶出させることなくバッファ層を形成することができた。一方で、基板の端面が反応液に接触する比較例3ではAlの溶出が確認された。従って、本発明の製造方法によれば、基板がCBD反応液に溶解してしまう成分を含むものであっても、基板からこのような成分を溶出させることなく膜形成することが可能である。 As can be seen from Table 1, the examples and comparative examples prepared by bringing the substrate into close contact with the drum and overlapping the ends with a protective material as in the present invention are buffer layers without eluting the Al contained in the substrate. Could be formed. On the other hand, elution of Al was confirmed in Comparative Example 3 in which the end face of the substrate was in contact with the reaction solution. Therefore, according to the production method of the present invention, even if the substrate contains a component that dissolves in the CBD reaction solution, it is possible to form a film without eluting such a component from the substrate.

 バッファ層を形成しなかった比較例2は変換効率が非常に低く、また、CIGS層の表面処理をしなかった比較例1場合も変換効率は表面処理をした場合と比較すると低いことが明らかである。 In Comparative Example 2 in which the buffer layer was not formed, the conversion efficiency was very low, and in Comparative Example 1 in which the CIGS layer was not surface-treated, it was clear that the conversion efficiency was lower than that in the case of surface treatment. is there.

 また、CBD工程の前に基板加熱を行った実施例1、2は、基板加熱を行わず同じ条件でCBD工程がなされた実施例3と比較して、バッファ層の析出厚みが厚く、同等の成膜厚みを得るために要する時間はCBD工程の前に基板加熱をすることにより、短縮できることが確認された。さらに、CBD工程後にアニール処理を行うことにより大幅に変換効率が向上することも確認された。 In addition, in Examples 1 and 2 in which the substrate was heated before the CBD process, the buffer layer had a larger deposition thickness compared to Example 3 in which the CBD process was performed under the same conditions without performing the substrate heating. It was confirmed that the time required to obtain the film thickness can be shortened by heating the substrate before the CBD process. Furthermore, it was also confirmed that the conversion efficiency is greatly improved by performing the annealing treatment after the CBD process.

Claims (10)

 下部電極と光電変換半導体層とを備えてなる可撓性を有する基板の前記光電変換半導体層上に、バッファ層と透光性導電層との積層構造を有する光電変換素子の製造方法において、
 前記光電変換半導体層面を表面処理液中に浸漬する表面処理工程、
 前記表面処理液中において表面処理がなされた前記基板を水で水洗する表面処理後水洗工程、
 前記表面処理後水洗工程において前記基板に付着した水を除去する表面処理後水除去工程、
 前記基板を密着支持するドラムと、前記基板を密着支持するドラムの一部を浸漬するCBD反応液で満たされた反応槽と、前記ドラムに密着支持された前記基板の端部および前記ドラムのうち前記基板が密着しない部分をオーバーラップして前記CBD反応液から保護する保護部材とを有するCBD成膜装置を用い、前記保護部材により前記基板の端部および前記ドラムのうち前記基板が密着しない部分がオーバーラップされた前記基板を密着支持した前記ドラムの一部を前記反応槽内の前記CBD反応液に浸漬させることにより、前記基板の一部を前記CBD反応液に浸漬させ、所定の成膜温度に温調した該CBD反応液中で前記光電変換半導体層上にバッファ層を成膜するCBD工程、
 前記バッファ層が形成された後の前記基板を洗浄液中に浸漬して洗浄するCBD後洗浄工程、および、
 前記CBD後洗浄工程において前記基板に付着した洗浄液を除去するCBD後洗浄液除去工程を含み、
 上記各工程を、この順に行うことを特徴とする光電変換素子の製造方法。
In the method for producing a photoelectric conversion element having a laminated structure of a buffer layer and a light-transmitting conductive layer on the photoelectric conversion semiconductor layer of a flexible substrate comprising a lower electrode and a photoelectric conversion semiconductor layer,
A surface treatment step of immersing the photoelectric conversion semiconductor layer surface in a surface treatment liquid;
A post-surface treatment water washing step of washing the substrate that has been surface-treated in the surface treatment liquid with water;
A post-surface treatment water removal step for removing water adhering to the substrate in the post-surface treatment water washing step;
Of the drum that closely supports the substrate, a reaction tank filled with a CBD reaction solution that immerses a part of the drum that closely supports the substrate, the end of the substrate that is closely supported by the drum, and the drum Using a CBD film forming apparatus having a protective member that protects the CBD reaction liquid by overlapping a portion where the substrate does not adhere, and a portion of the end of the substrate and the drum that does not adhere to the drum by the protective member A part of the drum that tightly supports the substrate on which the substrate is overlapped is immersed in the CBD reaction solution in the reaction tank, so that a part of the substrate is immersed in the CBD reaction solution, and a predetermined film formation is performed. A CBD step of forming a buffer layer on the photoelectric conversion semiconductor layer in the CBD reaction solution adjusted to a temperature;
A post-CBD cleaning step of immersing and cleaning the substrate after the buffer layer is formed; and
A post-CBD cleaning liquid removing step of removing the cleaning liquid adhering to the substrate in the post-CBD cleaning step;
A method for manufacturing a photoelectric conversion element, wherein the above steps are performed in this order.
 前記CBD後洗浄液除去工程の後に、前記基板を150℃以上250℃以下で加熱処理する加熱処理を行うことを特徴とする請求項1記載の光電変換素子の製造方法。 The method for manufacturing a photoelectric conversion element according to claim 1, wherein after the post-CBD cleaning liquid removing step, heat treatment is performed by heat-treating the substrate at 150 ° C to 250 ° C.  前記CBD工程の前に、前記基板を該CBD工程における前記所定の成膜温度以上の温度まで加熱することを特徴とする請求項1または2記載の光電変換素子の製造方法。 3. The method for manufacturing a photoelectric conversion element according to claim 1, wherein the substrate is heated to a temperature equal to or higher than the predetermined film formation temperature in the CBD step before the CBD step.  前記基板を加熱する方法が、ヒーターによる該基板への直接加熱、あるいは表面処理工程で用いられる表面処理液、表面処理後水洗工程で用いられる水を加熱して、加熱された液中に前記基板を浸すことによる間接加熱によるものであることを特徴とする請求項3記載の光電変換素子の製造方法。 The method of heating the substrate is such that the substrate is directly heated by a heater, or the surface treatment liquid used in the surface treatment step, the water used in the post-surface treatment water washing step is heated, and the substrate is placed in the heated liquid. The method for producing a photoelectric conversion element according to claim 3, wherein the photoelectric conversion element is by indirect heating by dipping.  前記基板として、Alを主成分とするAl基材の少なくとも一方の面側にAl23を主成分とする陽極酸化膜が形成された陽極酸化基板、Feを主成分とするFe材の少なくとも一方の面側にAlを主成分とするAl材が複合された複合基材の少なくとも一方の面側にAl23を主成分とする陽極酸化膜が形成された陽極酸化基板、およびFeを主成分とするFe材の少なくとも一方の面側にAlを主成分とするAl膜が成膜された基材の少なくとも一方の面側にAl23を主成分とする陽極酸化膜が形成された陽極酸化基板のうちいずれか1つの陽極酸化基板を備えてなるものを用いることを特徴とする請求項1から4のいずれか1項記載の光電変換素子の製造方法。 As the substrate, an anodized substrate in which an anodized film mainly composed of Al 2 O 3 is formed on at least one surface side of an Al base material mainly composed of Al, and at least an Fe material mainly composed of Fe An anodized substrate having an anodized film mainly composed of Al 2 O 3 formed on at least one surface side of a composite base material in which an Al material composed mainly of Al is compounded on one surface side, and Fe An anodic oxide film mainly composed of Al 2 O 3 is formed on at least one surface side of the base material on which an Al film composed mainly of Al is formed on at least one surface side of the Fe material having the main component. 5. The method for manufacturing a photoelectric conversion element according to claim 1, wherein a substrate provided with any one of the anodized substrates is used.  前記CBD反応液が、
 少なくとも1種の亜鉛源である成分(Z)、少なくとも1種の硫黄源である成分(S)、少なくとも1種のクエン酸化合物である成分(C)と水が混合された室温の混合液中に、アンモニア及びアンモニウム塩からなる群より選ばれた少なくとも1種である成分(N)を室温で混合して、
 前記成分(C)の濃度が0.001~0.25Mであり、
 前記成分(N)の濃度が0.001~0.40Mであり、
 反応開始前のpHが9.0~12.0であるCBD反応液であることを特徴とする請求項1から5のいずれか1項記載の光電変換素子の製造方法。
The CBD reaction solution is
In a mixed solution at room temperature in which water is mixed with component (Z) that is at least one zinc source, component (S) that is at least one sulfur source, component (C) that is at least one citric acid compound In addition, at least one component (N) selected from the group consisting of ammonia and ammonium salts is mixed at room temperature,
The concentration of the component (C) is 0.001 to 0.25M;
The concentration of the component (N) is 0.001 to 0.40 M;
6. The method for producing a photoelectric conversion element according to claim 1, wherein the photoelectric conversion element is a CBD reaction solution having a pH of 9.0 to 12.0 before the start of the reaction.
 前記CBD工程が、前記基板を、70~95℃の前記成膜温度に温調した前記CBD反応液に浸漬した後、該成膜温度でZn(S,O)及び/又はZn(S,O,OH)を主成分とするZn化合物層を前記バッファ層として成膜する工程であることを特徴とする請求項1から6のいずれか1項記載の光電変換素子の製造方法。 In the CBD step, after the substrate is immersed in the CBD reaction solution adjusted to the film formation temperature of 70 to 95 ° C., Zn (S, O) and / or Zn (S, O) is formed at the film formation temperature. , OH) as a main component, forming a Zn compound layer as the buffer layer is a process for producing a photoelectric conversion element according to any one of claims 1 to 6.  前記表面処理液が、シアノ基あるいはアミノ基を有する化合物を含有水溶液であることを特徴とする請求項1から7のいずれか1項記載の光電変換素子の製造方法。 The method for producing a photoelectric conversion element according to any one of claims 1 to 7, wherein the surface treatment liquid is an aqueous solution containing a compound having a cyano group or an amino group.  前記シアノ基を有する化合物が、シアン化カリウムであることを特徴とする請求項8記載の光電変換素子の製造方法。 The method for producing a photoelectric conversion element according to claim 8, wherein the compound having a cyano group is potassium cyanide.  前記アミノ基を有する化合物が、エチレンジアミン、ジエチレントリアミン、トリエチレンテトラミン、テトラエチレンペンタミン、ペンタエチレンヘキサミンの中から選ばれる少なくとも1つであることを特徴とする請求項8記載の光電変換素子の製造方法。 The method for producing a photoelectric conversion element according to claim 8, wherein the compound having an amino group is at least one selected from ethylenediamine, diethylenetriamine, triethylenetetramine, tetraethylenepentamine, and pentaethylenehexamine. .
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