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WO2012142967A1 - Apparatus and method for photographing glass defects in multiple layers - Google Patents

Apparatus and method for photographing glass defects in multiple layers Download PDF

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Publication number
WO2012142967A1
WO2012142967A1 PCT/CN2012/074463 CN2012074463W WO2012142967A1 WO 2012142967 A1 WO2012142967 A1 WO 2012142967A1 CN 2012074463 W CN2012074463 W CN 2012074463W WO 2012142967 A1 WO2012142967 A1 WO 2012142967A1
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WO
WIPO (PCT)
Prior art keywords
line
camera
scan
glass
light
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
PCT/CN2012/074463
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French (fr)
Inventor
Liansheng Jiang
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
ATI-CHINA Co Ltd
ASA Corp USA
Original Assignee
ATI-CHINA Co Ltd
ASA Corp USA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by ATI-CHINA Co Ltd, ASA Corp USA filed Critical ATI-CHINA Co Ltd
Priority to CN201280018728.6A priority Critical patent/CN104081192B/en
Publication of WO2012142967A1 publication Critical patent/WO2012142967A1/en
Anticipated expiration legal-status Critical
Ceased legal-status Critical Current

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
    • G01N21/896—Optical defects in or on transparent materials, e.g. distortion, surface flaws in conveyed flat sheet or rod

Definitions

  • the present invention generally relates to the field of glass inspection which requests to photograph different defects (such as: scratches, crashes, black/white defects, lack, cracks, pin-holes, concave edges and raised edges, bubbles and smudges) on the surface, backside or/and mid- layer of glasses in high accuracy. More particularly, the invention is a consistent, stable, fast, and high accuracy glass photographing apparatus , and the method for creating the same.
  • defects such as: scratches, crashes, black/white defects, lack, cracks, pin-holes, concave edges and raised edges, bubbles and smudges
  • the technology of present invention relates to the field of machine- vision applications, involves motion control, optical, photography design, and apparatus hardware architecture ; Especially, this invention introduces a multiple camera process when each camera will take one full image for inspecting one or more defect(s) on multiple glass layer(s).
  • This invention involves an apparatus and method thereof for photographing defects (scratches, crashes, black/white defects, lack, cracks, pin-holes, concave edges and raised edges, bubbles and smudges) on multiple layers of glasses.
  • defects scratches, crashes, black/white defects, lack, cracks, pin-holes, concave edges and raised edges, bubbles and smudges
  • Multiple line- scan cameras are mounted on the apparatus introduced in this invention, each camera (lighting source is spreading line- lights from one or more angles on the camera's scan- line) shall photograph one or more types of defects on the surface or/and different layers of the glasses.
  • This invention introduces an apparatus and method there of to get clear photographs to expose scratches by using multiple lights spread from different positions and angles.
  • the line-scan camera is mounted vertically with the glass panel, and one line- light spread the first line beam on the camera's scan- line, another two line- lights spread two line beams from both sides of camera and spreading and merging the lines with the first line beam located on the camera's scan line.
  • This technique is able to get clear photo- graphs to expose scratches on all the orientations.
  • This invention introduces an apparatus and method there of to get clear photographs to expose crashes byusing one line-light spreads the line beam on the camera's scan- line on the surface of the glass panels, a line -scan camera is mounted at of glass panel vertically with the glass panel and will take . This technique is able to get clear photographs to expose crashes defects.
  • This invention introduces an apparatus and method there of to get clear photographs to expose lack defects by using one line- light mounted at backside of the glass panel which spreads the line beam on the camera's scan- line on the backside of the glass panels, a line-scan camera is mounted at top of glass panel vertically with the glass panel and will take . This technique is able to get clear photo- graphs to expose lack defects.
  • This invention introduces an apparatus and method there of to get clear photographs to expose cracks defects by using one line -light mounted at backside of the glass panel which spreads the line beam on the camera's scan- line on the backside of the glass panels, a line- scan camera is mounted at backside of glass panel vertically with the glass panel and will take . This technique is able to get clear photo -graphs to expose crack defects.
  • This invention introduces an apparatus and method there of to get clear photographs to expose pin-hole defects by using one line- light mounted at backside of the glass panel which spreads the line beam on the camera's scan- line on the backside of the glass panels, a line- scan camera is mounted at top of glass panel vertically with the glass panel and will take . This technique is able to get clear photo-graphs to expose pin-hole defects.
  • This invention introduces an apparatus and method there of to get clear photographs of concave edges and raised edges to expose defects using one line- light mounted at backside of the glass panel which spreads the line beam on the camera's scan- line on the backside of the glass panels, a line- scan camera is mounted at top of glass panel vertically with the glass panel This technique is able to get clear photo -graphs of concave edges and raised edges to expose defects.
  • This invention introduces an apparatus and method there of to get clear photographs of bubble and/or smudge to expose defects by using one line- light spreads the line beam on the camera's scan- line on the surface of the glass panels, a line- scan camera is mounted at of glass panel vertically with the glass panel and will take.
  • This invention introduces flexible hardware architectures for various glass inspecting purposes. According to total types of inspecting glass defects from the individual customer required, to design various hardware systems by mounting multiple cameras and line-lights, and each camera will photograph one or more defects on the glass. In such kind of customized hardware system, all the spots of glass defects, that customer required to inspect will be photographed.
  • All the schematic diagrams included in this invention does not figure out the distances between the cameras and the glass panels since the distances are depend on (1) Line-scan camera resolution, for instance IK, 2K, 4K, 8K, 12K or 16K line-scan cameras or larger scale area- scan cameras are popular in machine vision applications, (2) Width of glasses, and (3) Defects inspection accuracy requirements. Any selection of them will result in varies of distances between the cameras and the glass panels.
  • FIG. 1- 1 is a schematic diagram of the current invention for exposing scratches on the surface or backside of glasses.
  • FIG. 1-2 is additional schematic diagram of FIG 1-1 to figure out the conjunction angle between camera scan-line and light- line.
  • FIG. 1-3 is additional schematic diagram of FIG 1-1 to show the merged lighting beams that spreads on the camera scan line.
  • FIG. 2- 1 is a schematic diagram of the current invention for exposing crashes on the glasses.
  • FIG. 2-2 is additional schematic diagram of FIG 2-1 to figure out the conjunction angle between camera scan-line and light- line.
  • FIG. 2-3 is additional schematic diagram of FIG 2-1 to show the lighting beam that spreads on the camera scan- line.
  • FIG. 3- 1 is a schematic diagram of the current invention for exposing black/white defects on the glasses.
  • FIG. 3-2 is additional schematic diagram of FIG 3-1 to figure out the conjunction angle between camera scan-line and light- line.
  • FIG. 3-3 is additional schematic diagram of FIG 3-1 to show the lighting beam that spreads on the camera scan- line.
  • FIG. 4- 1 is a schematic diagram of the current invention for exposing lack defects on the glasses.
  • FIG. 4-2 is additional schematic diagram of FIG 4-1 to figure out the conjunction angle between camera scan-line and light- line.
  • FIG. 2-3 is additional schematic diagram of FIG 4-1 to show the lighting beam that spreads on the camera scan- line.
  • FIG. 5-1 is a schematic diagram of the current invention for exposing cracks on the glasses.
  • FIG. 5-2 is additional schematic diagram of FIG 5-1 to figure out the conjunction angle between camera scan-line and light- line.
  • FIG. 5-3 is additional schematic diagram of FIG 2-1 to show the lighting beam that spreads on the camera scan- line.
  • FIG. 6- 1 is a schematic diagram of the current invention for exposing pin- holes on the glasses.
  • FIG. 6-2 is additional schematic diagram of FIG 6-1 to figure out the conjunction angle between camera scan-line and light- line.
  • FIG. 6-3 is additional schematic diagram of FIG 6-1 to show the lighting beam that spreads on the camera scan- line.
  • FIG. 7-1 is a schematic diagram of the current invention for exposing concave edges and raised edges on the glasses.
  • FIG. 7-2 is additional schematic diagram of FIG 7-1 to figure out the conjunction angle between camera scan-line and light- line.
  • FIG. 7-3 is additional schematic diagram of FIG 7-1 to show the lighting beam that spreads on the camera scan- line.
  • FIG. 8- 1 is a schematic diagram of the current invention for exposing bubbles and smudges on the glasses.
  • FIG. 8-2 is additional schematic diagram of FIG 8-1 to figure out the conjunction angle between camera scan-line and light- line.
  • FIG. 8-3 is additional schematic diagram of FIG 8-1 to show the lighting beam that spreads on the camera scan- line.
  • FIG. 9 is a sample device hardware architecture schematic diagram, which photographs the mobile phone glasses before the silk printing.
  • FIG. 10 is a sample device hardware architecture schematic diagram, which photographs the mobile phone glasses after the silk printing.
  • this invention introduces an apparatus for photographing the defects including but not limit to scratches, cracks, concave and raised edges, bubbles and smudges on the surface, backside or/and mid- layer of glass(es);
  • the mechanism of the apparatus associated with photography involves a conveyor, one or more line-scan or area-scan camera(s), one or more line-light(s) or area-light(s), and one or more normal lens(for low accuracy) or micro- lens(f or high accuracy) depending on accuracy of inspection requirements.
  • the conveyor can be roller conveyor, air floating conveyor or any other type of conveyor; the selected conveyor for line-scan camera must leave enough gaps for line- scanning, the light source is a oblong light source (oblong line- light(s) source or oblong area-light(s) source); the lens is the normal lens or micro- lens ; and the computer is for devices (conveyor, camera, lighting source) controls and for glass image acquisitions. Since the techniques of conveyor, camera and lens is beyond this invention, and will not describe more in details.
  • This invention also introduces flexible and expendable photographing hardware architectures according to customer inspecting defects requirements and speed requirements.
  • the requested photographing spots of defects include scratches, cracks, concave and raised edges, bubbles and smudges on the surface, backside or/and mid- layer of glasses
  • to construct such kind of inspection system weset two line -scan cameras and six line- lights for exposing scratches on surface and backside of glasses, another three line-scan cameras and three line- lights shall be involved for exposing cracks, concave and raised edges, bubbles and smudges.
  • FIG.9 is a schematic diagram illustrating a sample hardware configuration for exposing mobile phone glass before silk printing
  • the iPad front panel glass inspection shall be constructed the same way for photography.
  • FIG. 10 is a schematic diagram illustrating a sample hardware configuration for inspecting mobile phone glass after silk printing.
  • FIG. 1- 1 is a schematic diagram illustrating the hardware configuration for scratch inspection according to the present invention
  • FIG. 1-2 is a schematic diagram illustrating the camera- light angle is about 70 ° -80 ° according to FIG. 1- 1.
  • the line- light (5) spreads the first line beam on (10) the camera's scan- line (6), another two line- lights (3 & 4) spread two line beams (8 & 9) from both sides of the camera (2), the angle of line beams (8 & 9) and camera's scan- line (6) is about 20 ° -30 ° for exposing the scratches in +/- 30 ° of orientation from glass panel moving direction
  • 1-3 is an optical path diagram illustrating how three points (left- edge -point, mid-point and right- edge -point on camera's scan line [6]) are illuminated by lights in many directions from line- lights (3, 4 & 5) as shown in FIG 1-1.
  • any point on camera's scan line (6) will be spread by lights from various directions from the three line- lights (3, 4 & 5), it will guarantee all the scratches (in any orientation) be exposed, when the line- scan camera (2) photographs line by line and make a clear scratch picture.
  • FIG. 2-1 is a schematic diagram illustrating the hardware configuration for silk print defect inspection apparatus according to the present invention.
  • FIG. 2-2 is a schematic diagram illustrating the camera- light angle according to FIG. 2- 1.
  • FIG. 2-3 is an optical path diagram illustrating how three points (left- edge - point, mid-point and right-edge-point on camera's scan- line [6]) are illuminated by lights in many directions from line -light (3) as shown in FIG 2-1.
  • any point on camera's scan- line (6) will be spread by lights from various directions from the line- lights (3), it will guarantee all the silk print defects (in any orientation) be exposed, when the line- scan camera (2) photographs line by line and make a clear silk print defect picture.
  • the camera and light-beam angle is about 70° -80 °? Because keeping the line- light (3) enough vertically will make the line beam (5) spreading deeply since the silk printing staff is thicker relatively in micro-photographing.
  • This invention introduces an apparatus and method there of to get clear
  • FIG. 3- 1 is a schematic diagram illustrating the hardware configuration for black/white defects inspection apparatus to the present invention
  • FIG. 3-2 is a schematic diagram illustrating the camera and light- beam angle is about 80° - 100° according to FIG. 3-1.
  • the line-scan camera (2) is mounted on the top of glass panel (1) vertically with the glass panel(l), and one line- light (3) is mounted on the backside of glass panel in parallel with camera's scan- line (6), and spreads light beam(5) with the camera's scan- line (6).
  • FIG. 3- 1 is a schematic diagram illustrating the hardware configuration for black/white defects inspection apparatus to the present invention
  • FIG. 3-2 is a schematic diagram illustrating the camera and light- beam angle is about 80° - 100° according to FIG. 3-1.
  • the line-scan camera (2) is mounted on the top of glass panel (1) vertically with the glass panel(l)
  • one line- light (3) is mounted on the backside of glass panel in parallel with camera's scan- line (6), and spreads light beam(5)
  • 3-3 is an optical path diagram illustrating how three points (left- edge -point, mid- point and right -edge -point on camera's scan- line [6]) are illuminated by lights in many directions from line- light (3) as shown in FIG 3-1.
  • any point on camera's scan- line (6) will be spread by lights from various directions from the line- light (3), when the light beam (5) pass through the glass panel (1), the black/white defects will block the part of light beam (5), different defect' s color (black or white) or layer will result in various shape and gray- scale on the photograph; therefore all the black/white defects pass through the light beam (5) and be exposed.
  • the line-scan camera (2) photographs line by line and makes a clear black/white defects picture.
  • FIG. 4- 1 is a schematic diagram illustrating the hardware configuration for lacks inspection apparatus according to the present invention and FIG. 4-2 is a schematic diagram illustrating the camera and light-beam angle is about 80° - 100 ° according to FIG. 4-1.
  • the line-scan camera (2) is mounted on the top of glass panel (1) vertically with the glass panel(l), and one line-light (3) is mounted on the backside of glass panel in parallel with camera's scan- line (6), and spreads light beam(5) with the camera's scan- line (6).
  • FIG. 4-1 is a schematic diagram illustrating the hardware configuration for lacks inspection apparatus according to the present invention
  • FIG. 4-2 is a schematic diagram illustrating the camera and light-beam angle is about 80° - 100 ° according to FIG. 4-1.
  • the line-scan camera (2) is mounted on the top of glass panel (1) vertically with the glass panel(l), and one line-light (3) is mounted on the backside of glass panel in parallel with camera's scan- line (6), and spreads light beam(5)
  • 4-3 is an optical path diagram illustrating how three points (left- edge -point, mid- point and right -edge -point on camera's scan- line [6]) are illuminated by lights in many directions from line- light (3) as shown in FIG 4-1.
  • any point on camera's scan- line (6) will be spread by lights from various directions from the line- light (3), when the light beam (5) pass through the glass panel (1), will also pass through the lacks and lacks will be exposed.
  • the line- scan camera (2) photographs line by line and makes a clear lacks picture.
  • FIG. 5-1 is a schematic diagram illustrating the hardware configuration for crack inspection apparatus according to the present invention
  • FIG. 5-2 is a schematic diagram illustrating the camera and light- beam angle is about 70° ⁇ 80 ° according to FIG. 5- 1.
  • the line- scan camera (2) is mounted on the backside of glass panel (1) vertically with the glass panel(l), and one line- light (3) is mounted on the backside of glass panel in parallel with camera's scan line (6), and spreads light beam (5) merging with the camera's scan- line (6).
  • FIG. 5-1 is a schematic diagram illustrating the hardware configuration for crack inspection apparatus according to the present invention
  • FIG. 5-2 is a schematic diagram illustrating the camera and light- beam angle is about 70° ⁇ 80 ° according to FIG. 5- 1.
  • the line- scan camera (2) is mounted on the backside of glass panel (1) vertically with the glass panel(l)
  • one line- light (3) is mounted on the backside of glass panel in parallel with camera's scan line (6), and spreads light beam (5) merging
  • 5-3 is an optical path diagram illustrating how three points (left -edge -point, mid-point and right- edge -point on camera's scan- line [6]) are illuminated by lights in many directions from line- light (3) as shown in FIG 5- 1. Obviously any point on camera' s scan line (6) will be spread by lights from various directions from the line- light (3), when the light beam (5) pass through the glass panel (1), will also pass through the cracks and crack's edges will be exposed clearly. And the line- scan camera (2) photographs line by line and makes a clear crack picture.
  • FIG. 6-1 is a schematic diagram illustrating the hardware configuration for pin- hole inspection apparatus according to the present invention
  • FIG. 6-2 is a schematic diagram illustrating the camera and light-beam angle is about 80° ⁇ 100 ° according to FIG. 6-1.
  • the line-scan camera (2) is mounted on the top of glass panel (1) vertically with the glass panel(l), and one line- light (3) is mounted on the backside of glass panel in parallel with camera's scan line (6), and spreads light beam (5) with the camera's scan- line (6).
  • FIG. 6-3 is an optical path diagram illustrating how three points (left- edge -point, mid -point and right-edge-point on camera' s scan- line [6]) are illuminated by lights in many directions from line- light (3) as shown in FIG 6-1.
  • any point on camera' s scan line (6) will be spread by lights from various directions from the line- light (3), when the light beam (5) pass through the glass panel (1), will also pass through the pin-hole and pin-hole will be exposed. And the line- scan camera (2) photographs line by line and makes a clear pin-hole picture.
  • FIG. 7-1 is a schematic diagram illustrating the hardware configuration for concave and raised edge inspection apparatus according to the present invention
  • FIG. 7-2 is a schematic diagram illustrating the camera and light- beam angle is about 70° ⁇ 80 ° according to FIG. 7- 1.
  • the line- scan camera (2) is mounted on the backside of glass panel (1) vertically with the glass panel(l), and one line- light (3) is mounted on the backside of glass panel (1) in parallel with camera's scan line (6), and spreads light beam (5) merging with the camera' s scan- line (6).
  • FIG. 7-1 is a schematic diagram illustrating the hardware configuration for concave and raised edge inspection apparatus according to the present invention
  • FIG. 7-2 is a schematic diagram illustrating the camera and light- beam angle is about 70° ⁇ 80 ° according to FIG. 7- 1.
  • the line- scan camera (2) is mounted on the backside of glass panel (1) vertically with the glass panel(l)
  • one line- light (3) is mounted on the backside of glass panel (1) in parallel with camera'
  • FIG 7-3 is an optical path diagram illustrating how three points (left -edge -point, mid-point and right- edge -point on camera's scan- line [6]) are illuminated by lights in many directions from line- light (3) as shown in FIG 7-1. Obviously any point on camera's scan- line (6) will be spread by lights from various directions from the line- light (3), and concave and raised edge will be exposed clearly. And the line-scan camera (2) photographs line by line and makes a clear concave and raised edge.
  • FIG. 8- 1 is a schematic diagram illustrating the hardware configuration for bubble and smudge inspectio n apparatus according to the present invention
  • FIG. 8-2 is a schematic diagram illustrating the camera- light angle is about 70 ° ⁇ 80 ° according to FIG. 2-1
  • FIG. 8-3 is an optical path diagram illustrating how three points (left -edge -point, mid-point and right- edge -point on camera's scan- line [6]) are illuminated by lights in many directions from line- light (3) as shown in FIG 8- 1.
  • any point on camera' s scan line (6) will be spread by lights from various directions from the line- light (3), it will guarantee all the bubble and smudge defects (in any orientation) be exposed, when the line-scan camera (2) photographs line by line and make a clear bubble and smudge defect picture.

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Abstract

The invention teaches a new apparatus and method to photograph glasses in multiple layers for taking high quality photo images with scratch, crash, black/white defect, lack, crack, pin-hole, concave edge and raised edge, bubble and smudge defects on the surface-layer, backside-layer or/and mid-layer of the glasses. The invention also introduces flexible and expendable photographing hardware architecture that will match various customers inspecting defects requirements and speed requirements.

Description

APPARATUS AND METHOD FOR PHOTOGRAPHING GLASS DEFECTS IN MULTIPLE LAYERS
Description
BACKGROUND OF THE INVENTION
[0001] 1. Technical Field of the Invention
[0002] The present invention generally relates to the field of glass inspection which requests to photograph different defects (such as: scratches, crashes, black/white defects, lack, cracks, pin-holes, concave edges and raised edges, bubbles and smudges) on the surface, backside or/and mid- layer of glasses in high accuracy. More particularly, the invention is a consistent, stable, fast, and high accuracy glass photographing apparatus , and the method for creating the same.
[0003] The technology of present invention relates to the field of machine- vision applications, involves motion control, optical, photography design, and apparatus hardware architecture ; Especially, this invention introduces a multiple camera process when each camera will take one full image for inspecting one or more defect(s) on multiple glass layer(s).
[0004] 2. Descrption of the Related Art
[0005] Glass inspection is applied in many fields, especially in the field of mobile phone display panel, iPad window panel and flat-panel display manufactures. Since difficultly to take high quality images on different defects (scratches, crashes, black/white defects, lack, cracks, pin-holes, concave edges and raised edges, bubbles and smudges) on the surface, backside or/and mid- layer of glasses, therefore in the world, no full automatic glass inspection system provide high qua lity inspection solution, thus the method in most of these glass manufactures still uses human manual inspections and which relatively is not stable and accrued because of human errors from human's feeling, emotion and tiredness.
[0006] Many inventors intend to create the glass photographing apparatus, and none of them have a general solution to photograph all the different defects by a single apparatus.
[0007] Most of glass photography devices use multiple area scanning cameras for high accuracy photography, but this technique is restricted at its mechanical mounting space when photographing small size glasses such as mobile phone glass panel. This invention uses multiple line-scanning cameras with micro-lens to walk around space limit problem. [0008] The glass photography for scratches is the most difficulty technique in this invention, so far none of any inventor provides a method to have good solution of photographing glass scratches since it is difficultly to take a clear photo - graphs to show scratches toward all the orientations. For instants, some inventors are able to take clear vertical photo- graphs to expose scratches on glasses but not on horizon direction, and some of inventors are able to take clear horizon scratch photo -graphs on glasses but not vertical direction This invention introduces a method to get clear photo-graphs to expose scratches on all the orientations using multiple lights spread from different positions and various angles.
[0009] Most of machine -vision applications take one photo- graph for image process and inspection. This invention introduces a method to take multiple photo- images for each glass panel, with multi-taking based upon image process and inspection, results in fast and multiple layered glass inspections.
[0010] On normal machine vision applications, the photographing hardware usually is fixed, and is not easier to modify. This invention introduces flexible hardware architectures for various glass inspecting purposes.
[0011] There are two methods to take photo- image on glasses; one is fixing glasses and move cameras; the other is moving glasses that this invention uses.
[0012] To support the method of this invention, multi- tasking photographing, image processing and inspection techniques software must be programmed for real-time apparatus control, photography, image process and image inspection.
SUMMARY OF THE INVENTION
[0013] This invention involves an apparatus and method thereof for photographing defects (scratches, crashes, black/white defects, lack, cracks, pin-holes, concave edges and raised edges, bubbles and smudges) on multiple layers of glasses. Multiple line- scan cameras are mounted on the apparatus introduced in this invention, each camera (lighting source is spreading line- lights from one or more angles on the camera's scan- line) shall photograph one or more types of defects on the surface or/and different layers of the glasses.
[0014] This invention introduces an apparatus and method there of to get clear photographs to expose scratches by using multiple lights spread from different positions and angles. The line-scan camera is mounted vertically with the glass panel, and one line- light spread the first line beam on the camera's scan- line, another two line- lights spread two line beams from both sides of camera and spreading and merging the lines with the first line beam located on the camera's scan line. This technique is able to get clear photo- graphs to expose scratches on all the orientations.
[0015] This invention introduces an apparatus and method there of to get clear photographs to expose crashes byusing one line-light spreads the line beam on the camera's scan- line on the surface of the glass panels, a line -scan camera is mounted at of glass panel vertically with the glass panel and will take . This technique is able to get clear photographs to expose crashes defects.
[0016] This invention introduces an apparatus and method there of to get clear photographs to expose lack defects by using one line- light mounted at backside of the glass panel which spreads the line beam on the camera's scan- line on the backside of the glass panels, a line-scan camera is mounted at top of glass panel vertically with the glass panel and will take . This technique is able to get clear photo- graphs to expose lack defects.
[0017] This invention introduces an apparatus and method there of to get clear photographs to expose cracks defects by using one line -light mounted at backside of the glass panel which spreads the line beam on the camera's scan- line on the backside of the glass panels, a line- scan camera is mounted at backside of glass panel vertically with the glass panel and will take . This technique is able to get clear photo -graphs to expose crack defects.
[0018] This invention introduces an apparatus and method there of to get clear photographs to expose pin-hole defects by using one line- light mounted at backside of the glass panel which spreads the line beam on the camera's scan- line on the backside of the glass panels, a line- scan camera is mounted at top of glass panel vertically with the glass panel and will take . This technique is able to get clear photo-graphs to expose pin-hole defects.
[0019] This invention introduces an apparatus and method there of to get clear photographs of concave edges and raised edges to expose defects using one line- light mounted at backside of the glass panel which spreads the line beam on the camera's scan- line on the backside of the glass panels, a line- scan camera is mounted at top of glass panel vertically with the glass panel This technique is able to get clear photo -graphs of concave edges and raised edges to expose defects.
[0020] This invention introduces an apparatus and method there of to get clear photographs of bubble and/or smudge to expose defects by using one line- light spreads the line beam on the camera's scan- line on the surface of the glass panels, a line- scan camera is mounted at of glass panel vertically with the glass panel and will take.
[0021] This invention introduces flexible hardware architectures for various glass inspecting purposes. According to total types of inspecting glass defects from the individual customer required, to design various hardware systems by mounting multiple cameras and line-lights, and each camera will photograph one or more defects on the glass. In such kind of customized hardware system, all the spots of glass defects, that customer required to inspect will be photographed.
BRIEF DESCRIPTION OF DRAWINGS
[0022] All the schematic diagrams included in this invention does not figure out the distances between the cameras and the glass panels since the distances are depend on (1) Line-scan camera resolution, for instance IK, 2K, 4K, 8K, 12K or 16K line-scan cameras or larger scale area- scan cameras are popular in machine vision applications, (2) Width of glasses, and (3) Defects inspection accuracy requirements. Any selection of them will result in varies of distances between the cameras and the glass panels.
[0023] FIG. 1- 1 is a schematic diagram of the current invention for exposing scratches on the surface or backside of glasses.
[0024] FIG. 1-2 is additional schematic diagram of FIG 1-1 to figure out the conjunction angle between camera scan-line and light- line.
[0025] FIG. 1-3 is additional schematic diagram of FIG 1-1 to show the merged lighting beams that spreads on the camera scan line.
[0026] FIG. 2- 1 is a schematic diagram of the current invention for exposing crashes on the glasses.
[0027] FIG. 2-2 is additional schematic diagram of FIG 2-1 to figure out the conjunction angle between camera scan-line and light- line.
[0028] FIG. 2-3 is additional schematic diagram of FIG 2-1 to show the lighting beam that spreads on the camera scan- line.
[0029] FIG. 3- 1 is a schematic diagram of the current invention for exposing black/white defects on the glasses.
[0030] FIG. 3-2 is additional schematic diagram of FIG 3-1 to figure out the conjunction angle between camera scan-line and light- line.
[0031] FIG. 3-3 is additional schematic diagram of FIG 3-1 to show the lighting beam that spreads on the camera scan- line.
[0032] FIG. 4- 1 is a schematic diagram of the current invention for exposing lack defects on the glasses.
[0033] FIG. 4-2 is additional schematic diagram of FIG 4-1 to figure out the conjunction angle between camera scan-line and light- line.
[0034] FIG. 2-3 is additional schematic diagram of FIG 4-1 to show the lighting beam that spreads on the camera scan- line.
[0035] FIG. 5-1 is a schematic diagram of the current invention for exposing cracks on the glasses.
[0036] FIG. 5-2 is additional schematic diagram of FIG 5-1 to figure out the conjunction angle between camera scan-line and light- line.
[0037] FIG. 5-3 is additional schematic diagram of FIG 2-1 to show the lighting beam that spreads on the camera scan- line.
[0039] FIG. 6- 1 is a schematic diagram of the current invention for exposing pin- holes on the glasses.
[0040] FIG. 6-2 is additional schematic diagram of FIG 6-1 to figure out the conjunction angle between camera scan-line and light- line.
[0041] FIG. 6-3 is additional schematic diagram of FIG 6-1 to show the lighting beam that spreads on the camera scan- line.
[0042] FIG. 7-1 is a schematic diagram of the current invention for exposing concave edges and raised edges on the glasses.
[0043] FIG. 7-2 is additional schematic diagram of FIG 7-1 to figure out the conjunction angle between camera scan-line and light- line.
[0044] FIG. 7-3 is additional schematic diagram of FIG 7-1 to show the lighting beam that spreads on the camera scan- line.
[0045] FIG. 8- 1 is a schematic diagram of the current invention for exposing bubbles and smudges on the glasses.
[0046] FIG. 8-2 is additional schematic diagram of FIG 8-1 to figure out the conjunction angle between camera scan-line and light- line.
[0047] FIG. 8-3 is additional schematic diagram of FIG 8-1 to show the lighting beam that spreads on the camera scan- line.
[0048] FIG. 9 is a sample device hardware architecture schematic diagram, which photographs the mobile phone glasses before the silk printing.
[0049] FIG. 10 is a sample device hardware architecture schematic diagram, which photographs the mobile phone glasses after the silk printing.
DETAILED DESCRIPTION OF THE INVENTION
[0050] Additionally, this invention introduces an apparatus for photographing the defects including but not limit to scratches, cracks, concave and raised edges, bubbles and smudges on the surface, backside or/and mid- layer of glass(es); the mechanism of the apparatus associated with photography involves a conveyor, one or more line-scan or area-scan camera(s), one or more line-light(s) or area-light(s), and one or more normal lens(for low accuracy) or micro- lens(f or high accuracy) depending on accuracy of inspection requirements. The conveyor can be roller conveyor, air floating conveyor or any other type of conveyor; the selected conveyor for line-scan camera must leave enough gaps for line- scanning, the light source is a oblong light source (oblong line- light(s) source or oblong area-light(s) source); the lens is the normal lens or micro- lens ; and the computer is for devices (conveyor, camera, lighting source) controls and for glass image acquisitions. Since the techniques of conveyor, camera and lens is beyond this invention, and will not describe more in details.
[0051] This invention also introduces flexible and expendable photographing hardware architectures according to customer inspecting defects requirements and speed requirements. For instance, to inspect the mobile phone glasses before silk-printing, the requested photographing spots of defects include scratches, cracks, concave and raised edges, bubbles and smudges on the surface, backside or/and mid- layer of glasses, to construct such kind of inspection system, weset two line -scan cameras and six line- lights for exposing scratches on surface and backside of glasses, another three line-scan cameras and three line- lights shall be involved for exposing cracks, concave and raised edges, bubbles and smudges. FIG.9 is a schematic diagram illustrating a sample hardware configuration for exposing mobile phone glass before silk printing The iPad front panel glass inspection shall be constructed the same way for photography.
[0052] As another instance, after silk -printing, the mobile phone glass maker will request to photograph spots to expose defects include scratches, silk print defect, black/white defects, lack, cracks, pin-holes, concave and raised edges, bubbles and smudges on the surface, backside or/and mid- layer of glasses, this comprehensive inspection will request up to eight line -scan cameras and twelve line- lights. Mainly setup more cameras and line- lights will raise the productivities of the glass inspection FIG. 10 is a schematic diagram illustrating a sample hardware configuration for inspecting mobile phone glass after silk printing.
[0053] This invention introduces an apparatus and method thereof to get clear scratches) photographs using multiple lights spread from different positions and angles. FIG. 1- 1 is a schematic diagram illustrating the hardware configuration for scratch inspection according to the present invention, and FIG. 1-2 is a schematic diagram illustrating the camera- light angle is about 70 ° -80 ° according to FIG. 1- 1. The line- light (5) spreads the first line beam on (10) the camera's scan- line (6), another two line- lights (3 & 4) spread two line beams (8 & 9) from both sides of the camera (2), the angle of line beams (8 & 9) and camera's scan- line (6) is about 20 ° -30 ° for exposing the scratches in +/- 30 ° of orientation from glass panel moving direction This structure of line- lights (3, 4 & 5), that results in spreading and merging the two line beams (8, 9) with the line beam (10) on the entire camera's scan- line (6). FIG. 1-3 is an optical path diagram illustrating how three points (left- edge -point, mid-point and right- edge -point on camera's scan line [6]) are illuminated by lights in many directions from line- lights (3, 4 & 5) as shown in FIG 1-1. Obviously any point on camera's scan line (6) will be spread by lights from various directions from the three line- lights (3, 4 & 5), it will guarantee all the scratches (in any orientation) be exposed, when the line- scan camera (2) photographs line by line and make a clear scratch picture. Without line- lights (3 and/or 4) in FIG-1, it' s not able to expose scratches in +/- 30 ° of orientation from glass panel moving direction; and without line- lights (5) in FIG- 1, it' s not able to expose scratches in +/- 30 ° of orientation from camera's scan- line (6). In FIG. 1-2, why the camera and light-beam angle is about 70 ° -80 °? Because keeping the line-light (5) enough vertically will make the line beam (10) spreading deeply into scratches for exposing deeper scratches.
[0054] This invention introduces an apparatus and method thereof to get clear silk print defect photographs using one light FIG. 2-1 is a schematic diagram illustrating the hardware configuration for silk print defect inspection apparatus according to the present invention. FIG. 2-2 is a schematic diagram illustrating the camera- light angle according to FIG. 2- 1. FIG. 2-3 is an optical path diagram illustrating how three points (left- edge - point, mid-point and right-edge-point on camera's scan- line [6]) are illuminated by lights in many directions from line -light (3) as shown in FIG 2-1. Obviously any point on camera's scan- line (6) will be spread by lights from various directions from the line- lights (3), it will guarantee all the silk print defects (in any orientation) be exposed, when the line- scan camera (2) photographs line by line and make a clear silk print defect picture. In FIG. 2-2, why the camera and light-beam angle is about 70° -80 °? Because keeping the line- light (3) enough vertically will make the line beam (5) spreading deeply since the silk printing staff is thicker relatively in micro-photographing.
[0055] This invention introduces an apparatus and method there of to get clear
black/white defect photographs using one light FIG. 3- 1 is a schematic diagram illustrating the hardware configuration for black/white defects inspection apparatus to the present invention; and FIG. 3-2 is a schematic diagram illustrating the camera and light- beam angle is about 80° - 100° according to FIG. 3-1. The line-scan camera (2) is mounted on the top of glass panel (1) vertically with the glass panel(l), and one line- light (3) is mounted on the backside of glass panel in parallel with camera's scan- line (6), and spreads light beam(5) with the camera's scan- line (6). FIG. 3-3 is an optical path diagram illustrating how three points (left- edge -point, mid- point and right -edge -point on camera's scan- line [6]) are illuminated by lights in many directions from line- light (3) as shown in FIG 3-1. Obviously any point on camera's scan- line (6) will be spread by lights from various directions from the line- light (3), when the light beam (5) pass through the glass panel (1), the black/white defects will block the part of light beam (5), different defect' s color (black or white) or layer will result in various shape and gray- scale on the photograph; therefore all the black/white defects pass through the light beam (5) and be exposed. And the line-scan camera (2) photographs line by line and makes a clear black/white defects picture.
[0056] This invention introduces an apparatus and method there of to get clear lacks (special case of silk print defects) photographs using one light FIG. 4- 1 is a schematic diagram illustrating the hardware configuration for lacks inspection apparatus according to the present invention and FIG. 4-2 is a schematic diagram illustrating the camera and light-beam angle is about 80° - 100 ° according to FIG. 4-1. The line-scan camera (2) is mounted on the top of glass panel (1) vertically with the glass panel(l), and one line-light (3) is mounted on the backside of glass panel in parallel with camera's scan- line (6), and spreads light beam(5) with the camera's scan- line (6). FIG. 4-3 is an optical path diagram illustrating how three points (left- edge -point, mid- point and right -edge -point on camera's scan- line [6]) are illuminated by lights in many directions from line- light (3) as shown in FIG 4-1. Obviously any point on camera's scan- line (6) will be spread by lights from various directions from the line- light (3), when the light beam (5) pass through the glass panel (1), will also pass through the lacks and lacks will be exposed. And the line- scan camera (2) photographs line by line and makes a clear lacks picture.
[0057] This invention introduces an apparatus and method thereof to get clear crack photographs using one light. FIG. 5-1 is a schematic diagram illustrating the hardware configuration for crack inspection apparatus according to the present invention and FIG. 5-2 is a schematic diagram illustrating the camera and light- beam angle is about 70° ~ 80 ° according to FIG. 5- 1. The line- scan camera (2) is mounted on the backside of glass panel (1) vertically with the glass panel(l), and one line- light (3) is mounted on the backside of glass panel in parallel with camera's scan line (6), and spreads light beam (5) merging with the camera's scan- line (6). FIG. 5-3 is an optical path diagram illustrating how three points (left -edge -point, mid-point and right- edge -point on camera's scan- line [6]) are illuminated by lights in many directions from line- light (3) as shown in FIG 5- 1. Obviously any point on camera' s scan line (6) will be spread by lights from various directions from the line- light (3), when the light beam (5) pass through the glass panel (1), will also pass through the cracks and crack's edges will be exposed clearly. And the line- scan camera (2) photographs line by line and makes a clear crack picture.
[0058] This invention introduces an apparatus and method there of to get clear pin-hole photographs using one light. FIG. 6-1 is a schematic diagram illustrating the hardware configuration for pin- hole inspection apparatus according to the present invention and FIG. 6-2 is a schematic diagram illustrating the camera and light-beam angle is about 80° ~ 100 ° according to FIG. 6-1. The line-scan camera (2) is mounted on the top of glass panel (1) vertically with the glass panel(l), and one line- light (3) is mounted on the backside of glass panel in parallel with camera's scan line (6), and spreads light beam (5) with the camera's scan- line (6). FIG. 6-3 is an optical path diagram illustrating how three points (left- edge -point, mid -point and right-edge-point on camera' s scan- line [6]) are illuminated by lights in many directions from line- light (3) as shown in FIG 6-1.
Obviously any point on camera' s scan line (6) will be spread by lights from various directions from the line- light (3), when the light beam (5) pass through the glass panel (1), will also pass through the pin-hole and pin-hole will be exposed. And the line- scan camera (2) photographs line by line and makes a clear pin-hole picture.
[0059] This invention introduces an apparatus and method there of to get clear concave and raised edge photographs using one light. FIG. 7-1 is a schematic diagram illustrating the hardware configuration for concave and raised edge inspection apparatus according to the present invention and FIG. 7-2 is a schematic diagram illustrating the camera and light- beam angle is about 70° ~ 80 ° according to FIG. 7- 1. The line- scan camera (2) is mounted on the backside of glass panel (1) vertically with the glass panel(l), and one line- light (3) is mounted on the backside of glass panel (1) in parallel with camera's scan line (6), and spreads light beam (5) merging with the camera' s scan- line (6). FIG. 7-3 is an optical path diagram illustrating how three points (left -edge -point, mid-point and right- edge -point on camera's scan- line [6]) are illuminated by lights in many directions from line- light (3) as shown in FIG 7-1. Obviously any point on camera's scan- line (6) will be spread by lights from various directions from the line- light (3), and concave and raised edge will be exposed clearly. And the line-scan camera (2) photographs line by line and makes a clear concave and raised edge.
[0060] This invention introduces an apparatus and method thereof to get clear bubble and smudge photographs using one light FIG. 8- 1 is a schematic diagram illustrating the hardware configuration for bubble and smudge inspectio n apparatus according to the present invention; and FIG. 8-2 is a schematic diagram illustrating the camera- light angle is about 70 ° ~ 80 ° according to FIG. 2-1. FIG. 8-3 is an optical path diagram illustrating how three points (left -edge -point, mid-point and right- edge -point on camera's scan- line [6]) are illuminated by lights in many directions from line- light (3) as shown in FIG 8- 1. Obviously any point on camera' s scan line (6) will be spread by lights from various directions from the line- light (3), it will guarantee all the bubble and smudge defects (in any orientation) be exposed, when the line-scan camera (2) photographs line by line and make a clear bubble and smudge defect picture.

Claims

1. An apparatus for photographing glass(es), comprising: at least one camera, at least one lighting source, at least one computer and/or a conveyor.
2. The apparatus for photographing glass(es) of claim 1, wherein the camera is a line- scan camera or area- scan camera.
3. The apparatus for photographing glass(es) of claim 1, wherein the light source is an oblong light source, including oblong line- light(s) source or oblong area- light(s) source.
4. The apparatus for photographing glass(es) of claim 1, the camera is mounted on the topside of the glass(es) or on the bottom of backside of glass, the distance between the camera and the conveyor is between 50- 1500mm, one or more oblong lights mounted at any position surrounding the camera, and every light source spreads over the entire camera's scanning area.
5. A method for photographing glass(es) to expose defects by using the apparatus of claim 1-4, comprising: design the angle between the glass and the light source and the angle between the glass and the camera based on the type of the defects, wherein the defects include but not limit to scratches, cracks, concave and raised edges, bubbles and smudges on the surface, backside or/and mid- layer of the glass(es).
6. The method for photographing glass(es) to expose defects of claim 5, wherein the purpose is to expose scratches of the glass(es) :
the camera is a line- scan camera, the line- scan camera is mounted vertically with the conveyor, and one line- light spread the first line beam on the camera's scan- line, another two line- lights spread two line beams from both sides of camera and spreading and merging the lines with the first line beam located on the camera's scan- line;
the angle camera- line and every light beam is 70 ° -80 ° ;
the line-light (5) spreads the first line beam on (10) the camera's scan- line (6), another two line- lights (3 & 4) spread two line beams (8 & 9) from both sides of the camera (2), the angle of line beams (8 & 9) and camera's scan- line (6) is 20 °
-30 ° for exposing the scratches in +/- 30 ° of orientation from conveyor moving direction
7. The method for photographing glass(es) to expose defects of claim 5, wherein the purpose is to expose silk print defect by using one light source, the angle between the camera- line and the light beam is 70 ° ~80 °
8. The method for photographing glass(es) to expose defects of claim 5, wherein the purpose is to expose black/white defect photographs using one light, the line- scan camera (2) is mounted on the top of glass panel (1) vertically with the glass panel(l), and one line-light (3) is mounted on the backside of glass panel in parallel with camera's scan- line (6), and spreads light beam (5) with the camera's scan- line (6) ;
the camera and light-beam angle is about 80 ° - 100 °.
9. The method for photographing glass(es) to expose defects of claim 5, wherein the purpose is to expose lack defects of the glass(es) by using one light source: the line- light mounted at backside of the conveyor which spreads the line beam on the camera's scan- line on the backside of the conveyors, the line- scan camera is mounted at top of conveyor vertically with the conveyor;
the camera- line and light- beam angle is 80 ° ~ 100 °.
10. The method for photographing glass(es) to expose defects of claim 5, wherein the purpose is to expose cracks defects of the glass(es), the line- light mounted at backside of the conveyor which spreads the line beam on the camera's scan- line on the backside of the conveyors, the line- scan camera is mounted at backside of conveyor vertically with the conveyor;
the camera- line and light- beam angle is about 70 ° ~ 80 °.
11. The method for photographing glass(es) to expose defects of claim 5, wherein the purpose is to expose pin-hole defects of the glass(es), the line- light mounted at backside of the conveyor which spreads the line beam on the camera's scan- line on the backside of the conveyors, the line- scan camera is mounted at top of conveyor vertically with the conveyor;
the camera- line and light- beam angle is about 80 ° ~ 100 °.
12. The method for photographing glass(es) to expose defects of claim 5, wherein the purpose is to expose concave edges and raised edges defects of the glass(es), the line- light mounted at backside of the conveyor which spreads the line beam on the camera's scan- line on the backside of the conveyors, a line- scan camera is mounted at top of conveyor vertically with the conveyor;
the camera- line and light- beam angle is about 70 ° ~ 80 °.
13. The method for photographing glass(es) to expose defects of claim 5, wherein the purpose is to expose bubble and smudge defects of the glass(es) by using one line- light spreads the line beam on the camera's scan- line on the surface of the glass panels, a line- scan camera is mounted at of glass panel vertically with the conveyor;
the camera- line and light- beam angle is about 70 ° ~ 80 °.
14. A method for construing a flexible and expendable photographing hardware
structure, which includes a conveyor, one or more camera(s) with lens mounted, and light source(s) as claimed in claim 2, 3 or 4; and every camera photographs an image for exposing one or more type(s) of defect(s), the set of total types of exposed defects shall cover all the customer required types of defects.
PCT/CN2012/074463 2011-04-21 2012-04-20 Apparatus and method for photographing glass defects in multiple layers Ceased WO2012142967A1 (en)

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