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WO2011132393A1 - Dispositif d'imagerie et procédé de correction de ses caractéristiques de température - Google Patents

Dispositif d'imagerie et procédé de correction de ses caractéristiques de température Download PDF

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Publication number
WO2011132393A1
WO2011132393A1 PCT/JP2011/002232 JP2011002232W WO2011132393A1 WO 2011132393 A1 WO2011132393 A1 WO 2011132393A1 JP 2011002232 W JP2011002232 W JP 2011002232W WO 2011132393 A1 WO2011132393 A1 WO 2011132393A1
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WIPO (PCT)
Prior art keywords
photoelectric conversion
characteristic
conversion characteristic
imaging
logarithmic
Prior art date
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Ceased
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PCT/JP2011/002232
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English (en)
Japanese (ja)
Inventor
幸一 掃部
哲也 片桐
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Konica Minolta Opto Inc
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Konica Minolta Opto Inc
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Priority to JP2012511538A priority Critical patent/JPWO2011132393A1/ja
Publication of WO2011132393A1 publication Critical patent/WO2011132393A1/fr
Anticipated expiration legal-status Critical
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    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/50—Control of the SSIS exposure
    • H04N25/57—Control of the dynamic range
    • H04N25/571—Control of the dynamic range involving a non-linear response
    • H04N25/573—Control of the dynamic range involving a non-linear response the logarithmic type
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/50—Control of the SSIS exposure
    • H04N25/57—Control of the dynamic range
    • H04N25/571—Control of the dynamic range involving a non-linear response
    • H04N25/575—Control of the dynamic range involving a non-linear response with a response composed of multiple slopes
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70—SSIS architectures; Circuits associated therewith
    • H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70—SSIS architectures; Circuits associated therewith
    • H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors
    • H04N25/78—Readout circuits for addressed sensors, e.g. output amplifiers or A/D converters

Definitions

  • the present invention relates to an imaging apparatus and a temperature characteristic correction method for the imaging apparatus, and more particularly to an imaging apparatus using an imaging element having a plurality of different photoelectric conversion characteristics and a temperature characteristic correction method for the imaging apparatus.
  • a linear logarithmic conversion type imaging device having a photoelectric conversion characteristic in which two characteristics of a linear characteristic and a logarithmic characteristic are switched according to the amount of incident light is known.
  • This image sensor can achieve both high sensitivity and a wide dynamic range.
  • the MOS transistor that constitutes the pixel of the image sensor As a result, output errors due to variations in the characteristics of photodiodes and photodiodes increase, and the position of the inflection point changes with temperature.
  • Patent Document 1 the correction value for each pixel including the temperature coefficient is stored, and the output value of each pixel is corrected based on the correction value, so that the output values of all the pixels can be matched.
  • a signal processing apparatus is disclosed.
  • the image signal output from the image sensor is converted into digital data by an analog-to-digital converter and calculated, but the analog-to-digital converter itself also has temperature characteristics, and the dynamic range changes depending on the temperature characteristics. Therefore, it is necessary to correct the temperature characteristics of the analog-digital converter.
  • the present invention has been made in view of the above circumstances, and provides an imaging apparatus capable of always capturing an image with a predetermined dynamic range regardless of the temperature characteristics of the photoelectric conversion characteristics of the imaging element, and a temperature characteristic correction method for the imaging apparatus.
  • the purpose is to do.
  • An imaging apparatus has an imaging optical system that forms a subject image, and a photoelectric conversion characteristic that switches to a plurality of different characteristics according to the amount of incident light, and the subject that is imaged by the imaging optical system
  • An image pickup apparatus including an image pickup device that picks up an image and outputs an image pickup signal, based on a photoelectric conversion characteristic detection unit that detects a photoelectric conversion characteristic of the image pickup device and a detection result of the photoelectric conversion characteristic detection unit And a photoelectric conversion characteristic correction unit that corrects the photoelectric conversion characteristic of the image sensor so as to approach the reference photoelectric conversion characteristic.
  • the temperature characteristic correction method includes an imaging optical system that forms a subject image, and a photoelectric conversion characteristic that switches to a plurality of different characteristics according to the amount of incident light.
  • a temperature characteristic correction method for an image pickup apparatus including an image pickup device that picks up an image of a subject imaged and outputs an image pickup signal, the photoelectric conversion characteristic detection step for detecting the photoelectric conversion characteristic of the image pickup device; And a photoelectric conversion characteristic correction step of correcting the photoelectric conversion characteristic of the image sensor so as to approach a reference photoelectric conversion characteristic based on a detection result of the photoelectric conversion characteristic detection step.
  • FIG. 12 is a schematic diagram illustrating a problem to be solved by the imaging device according to the embodiment of the present invention.
  • FIG. 12A illustrates temperature characteristics of photoelectric conversion characteristics of the image sensor
  • FIG. 12B illustrates analog / digital.
  • the temperature characteristic of the A / D conversion characteristic of the conversion part (hereinafter referred to as A / D) is shown.
  • the image sensor according to the present invention has a photoelectric conversion characteristic (hereinafter referred to as a linear log characteristic) in which two characteristics of a linear characteristic and a logarithmic characteristic are switched according to the amount of incident light.
  • the horizontal axis of the graph represents the imaging surface illuminance L of the image sensor on the logarithmic axis, and the vertical axis represents the output voltage VL of the image sensor on the linear axis.
  • a reference photoelectric conversion characteristic PC 0 indicated by a solid line in the graph is a photoelectric conversion characteristic at a reference temperature, for example, a temperature T 0 at the time of preliminary measurement, and shows a linear characteristic in the low illuminance area A1 and a logarithmic characteristic in the high illuminance area A2. Indicates. Linear characteristic inflection point Pt 0 is switched point with logarithmic characteristic, the output voltage of the illuminance Lpt 0 is Vpt 0.
  • the photoelectric conversion characteristic PCh at a high temperature has an offset due to (1) an output voltage rising on the low illuminance side with respect to the reference photoelectric conversion characteristic PC 0 as indicated by a broken line in the graph, and (2) inflection point Pth is moved to the low illuminance side, it is increased from (3) the slope of the slope of the reference photoelectric conversion characteristic PC 0 of the logarithmic characteristic. Accordingly, the width of the output voltage VL becomes narrower than the range of the imaging surface illuminance L that can be photoelectrically converted, and the contrast of the image is lowered.
  • the photoelectric conversion characteristic PCl at a low temperature is as follows: (1) the output voltage decreases on the low illuminance side and a negative offset occurs, and (2) the inflection point Ptl is high. Go to illuminance, it has decreased from (3) the slope of the slope of the reference photoelectric conversion characteristic PC 0 of the logarithmic characteristic. Accordingly, the scope of the imaging surface illuminance L can be converted photoelectrically, i.e. dynamic range, it is narrowed with respect to the reference photoelectric conversion characteristic PC 0.
  • the offset Vos is caused by an increase in dark current due to temperature, and is an inherent phenomenon that occurs in the entire imaging device.
  • the movement of the inflection point Pt in (2) is caused by a decrease in the potential of the transfer gate due to temperature, and is a phenomenon inherent to the linear log characteristics.
  • the change in the slope of the logarithmic characteristic in (3) is because the theoretical formula of the slope of the logarithmic transformation includes the term (kBT / q) (kB is the Boltzmann constant, T is the absolute temperature, and q is the elementary charge of electrons)
  • the slope is proportional to the absolute temperature T, which is a phenomenon unique to the logarithmic conversion characteristic.
  • the temperature characteristics (1) to (3) are the same temperature characteristics in all the pixels 31a of the image sensor 3, and the same correction can be performed in all the pixels 31a.
  • the high-order bits are converted in a successive approximation type as a high-speed A / D converter.
  • An A / D converter called a column type that converts lower-order bits including redundant bits by an integral type is used. This type of A / D converter is described in detail in, for example, Japanese Patent Application Laid-Open No. 2008-244716.
  • a reference A / D conversion characteristic AD 0 indicated by a solid line in the graph is an A / D conversion characteristic at a reference temperature, for example, a temperature T 0 at the time of preliminary measurement, and the input voltage Vin Shows a linear A / D conversion characteristic.
  • a / D conversion characteristic ADh at high temperature as indicated by the broken line in the graph, the reference A / D conversion characteristic AD 0, (4) the output ADout value low side of the input voltage Vin is increased Te offset (hereinafter referred to as AD offset) occurs, has increased (5) slope of the a / D conversion characteristic (hereinafter, referred to as AD inclination) than the reference a / D conversion characteristic AD 0. Therefore, the input range of the A / D conversion, i.e., A / D converter dynamic range of, narrowed with respect to the reference A / D conversion characteristic AD 0.
  • the output ADout value (4) low side of input voltage Vin negative AD offset occurs becomes smaller, and smaller than (5) AD slope reference a / D conversion characteristic AD 0. Therefore, the output width becomes narrower than the input range where A / D conversion is possible, and the contrast of the image is lowered.
  • the causes of the change in the AD offset in (4) and the A / D slope in (5) are allowed for the temperature characteristics of the capacitor used in the successive approximation conversion method for converting the upper bits and the A / D conversion. This is due to the fact that the potential of the capacitor is in an unsaturated state due to the short period of time required for the capacitor. In other words, this is an error that occurs due to the capacitance of the capacitor increasing and the unsaturated state increasing at a high temperature, and the capacitor capacitance decreasing and the unsaturated state decreasing at a low temperature.
  • (1) and (2) are corrected in an analog manner before A / D conversion
  • (3) , (4) and (5) are digitally corrected after A / D conversion to solve the problem.
  • FIG. 1 is a block diagram illustrating an example of a configuration of an imaging apparatus according to an embodiment of the present invention.
  • an imaging apparatus 1 includes an imaging optical system 2, an imaging element 3, an image processing unit 4, a control unit 5, a storage unit 6, a display unit 7, an interface unit (hereinafter referred to as an I / F unit) 8, and the like. Composed.
  • the display unit 7 and the I / F unit 8 are not essential.
  • the imaging optical system 2 is composed of a lens or the like, and forms an image of a subject on the imaging surface of the imaging device 3 disposed on the optical axis 21.
  • the image pickup device 3 is arranged so that the image pickup surface is located at the image formation position on the optical axis 21 of the image pickup optical system 2, and photoelectrically converts the subject image formed by the image pickup optical system 2 to generate an analog image pickup signal. Output.
  • the image pickup device 3 includes an A / D converter, and the image pickup device 3 performs A / D conversion of the image pickup signal and outputs it as digital image pickup data 3s. To do.
  • the A / D converter is not necessarily built in the image sensor 3 and may be provided separately between the image sensor 3 and the image processor 4.
  • the image processing unit 4 performs image processing on the image data 3s output from the image sensor 3 and outputs image data 4s under the control of the control unit 5 described later.
  • the control unit 5 includes, for example, a CPU and a calculation memory.
  • the control unit 5 controls the operation of the imaging device 1 according to a program stored in a storage unit 6 described later, and the imaging device 1 is connected via the I / F unit 8. Communicates with connected external systems.
  • the image sensor 3, the image processing unit 4, and the control unit 5 will be described in detail with reference to FIG.
  • the storage unit 6 includes a ROM, a RAM, and the like, stores a program that defines the operation of the CPU that constitutes the control unit 5, and image data 4 s output from the image processing unit 4 under the control of the control unit 5. Are stored and output, and adjustment data and the like relating to each part of the imaging apparatus 1 are stored and output.
  • the display unit 7 displays an image stored in the storage unit 6 and information related to the image under the control of the control unit 5.
  • the I / F unit 8 performs communication between the imaging device 1 and an external system under the control of the control unit 5.
  • FIG. 2 is a block diagram illustrating an example of the configuration of the image sensor 3, the image processing unit 4, and the control unit 5.
  • the image sensor 3 includes a pixel unit 31, a monitor pixel unit 32, a temperature sensor 33, a vertical scanning circuit 34, an A / D conversion unit 35, a horizontal shift register 36, an output amplifier 37, an offset shift unit 38, and an A / D. It consists of a D input switching unit 39 and the like.
  • the pixel unit 31 has a photoelectric conversion characteristic of a linear log characteristic as described above. Imaging data 3 s is output from the imaging device 3 toward the image processing unit 4. Details of the internal configuration of the image sensor 3 will be described with reference to FIGS.
  • the image processing unit 4 performs image processing on the image data 3s output from the image sensor 3 or outputs the image data 4s to the control unit 5 as it is without performing any processing.
  • the control unit 5 controls the operation of the entire imaging apparatus 1 such as controlling the operation of the imaging device 3 to output the imaging data 3 s and storing the image data 4 s output from the image processing unit 4 in the storage unit 6. .
  • Control unit 5 the other, a correction value for detecting the A / D conversion characteristic of AD with the use temperature environment of the A / D converter 35 of the image pickup element 3, close to the reference A / D conversion characteristic AD 0
  • the photoelectric conversion characteristic PC under the operating temperature environment of the A / D conversion correction value calculation unit 51 to be calculated and the pixel unit 31 of the image pickup device 3 is detected, and a correction value for approximating the reference photoelectric conversion characteristic PC 0 is calculated.
  • a photoelectric conversion correction value calculation unit 52 a photoelectric conversion correction value calculation unit 52.
  • the A / D input switching unit 39 and the A / D conversion correction value calculation unit 51 function as an A / D conversion characteristic detection unit in the present invention
  • the monitor pixel unit 32 and the photoelectric conversion correction value calculation unit 52 It functions as a photoelectric conversion characteristic detector in the present invention
  • the A / D offset correction unit 41 and the A / D inclination correction unit 42 function as an A / D conversion characteristic correction unit in the present invention.
  • control unit 5 adjusts the temperature deviation of the offset due to the temperature characteristic of the photoelectric conversion characteristic PC of the image sensor 3 to the reference photoelectric conversion characteristic PC 0 and the temperature characteristic of the photoelectric conversion characteristic PC of the image sensor 3.
  • the image sensor 3 uses the output of the inflection point control unit 54 that brings the deviation of the inflection point Pt caused to approach the inflection point Pt 0 of the reference photoelectric conversion characteristic PC 0 and the temperature sensor 33 built in the image sensor 3.
  • the temperature detection part 55 which detects the temperature of this is provided.
  • the offset shift unit 38 and the offset control unit 53 function as an offset correction unit in the present invention
  • the vertical scanning circuit 34 and the inflection point control unit 54 function as an inflection point correction unit in the present invention.
  • the logarithmic characteristic correction unit 43, the offset shift unit 38 and the offset control unit 53, the vertical scanning circuit 34, and the inflection point control unit 54 function as a photoelectric conversion characteristic correction unit in the present invention.
  • FIG. 3 and 4 are block diagrams showing an example of the internal configuration of the image sensor 3.
  • FIG. 3 shows the pixel unit 31, the monitor pixel unit 32, the temperature sensor 33, and the vertical scanning circuit 34
  • FIG. 4 shows the A / D.
  • a conversion unit 35, a horizontal shift register 36, an output amplifier 37, an offset shift unit 38, and an A / D input switching unit 39 are shown.
  • the pixel unit 31 includes pixels 31 a and the like arranged in a two-dimensional matrix of m rows and n columns (m and n are positive integers) on the image pickup surface of the image pickup device 3. 2 subjects the image of the subject formed on the optical axis 21 to photoelectric conversion and outputs an imaging signal.
  • FIG. 5 shows the configuration of the pixel 31a and the photoelectric conversion characteristics.
  • FIG. 5 is a schematic diagram showing an example of the configuration and characteristics of the pixel 31a.
  • FIG. 5A shows an example of the circuit configuration of the pixel 31a
  • FIG. 5B shows the photoelectric conversion characteristics of the pixel 31a.
  • the pixel 31a includes a photodiode PD, a transfer transistor Q1, a reset transistor Q2, a floating diffusion FD, an output transistor Q3, a selection transistor Q4, and the like.
  • PVDD and PVSS are power supply potentials of the pixel 31a.
  • the row selection signal ⁇ VSEN is output from the vertical scanning circuit 34 and the selection transistor Q4 is turned on, so that the potential of the floating diffusion FD in the reset state becomes the vertical of the pixel 31a via the output transistor Q3.
  • the noise signal 31n is output to the common vertical signal line 31b for each column.
  • the transfer signal ⁇ TX of the transfer transistor Q1 is set to a predetermined potential
  • the light of the subject image incident on the pixel 31a is photoelectrically converted by the photodiode PD to become a photocurrent Ip, and is floated through the transfer transistor Q1. Accumulated in the diffusion FD.
  • the accumulation of the photocurrent Ip in the floating diffusion FD is a linear characteristic.
  • the imaging surface illuminance L is high, a potential obtained by logarithmically converting the photocurrent Ip is generated in the floating diffusion FD due to the subthreshold characteristic of the transfer transistor Q1.
  • the switching point between the linear characteristic and the logarithmic characteristic, that is, the value Lpt of the photocurrent Ip that becomes the inflection point Pt can be arbitrarily set by setting the transfer signal ⁇ TX of the transfer transistor Q1.
  • the transfer transistor Q 1 This can be done by controlling the transfer signal ⁇ TX.
  • the row selection signal ⁇ VSEN is output from the vertical scanning circuit 34 and the selection transistor Q4 is turned on, so that the potential in the imaging state of the floating diffusion FD is supplied to the pixel signal 31p via the output transistor Q3 to the vertical signal line 31b. Is output as
  • CDS correlated double sampling
  • the photoelectric conversion characteristics are shown in FIG.
  • the horizontal axis of the graph represents the imaging surface illuminance L on the logarithmic axis
  • the vertical axis represents the output voltage VL on the linear axis.
  • the output voltage VL is linear with respect to the imaging surface illuminance L, and is higher than the imaging surface illuminance Lpt at the inflection point Pt.
  • the output voltage VL is logarithmic with respect to the imaging surface illuminance L.
  • the monitor pixel unit 32 (an example of a photoelectric conversion characteristic detection pixel) includes a monitor pixel 32a for monitoring the temperature characteristic of the photoelectric conversion characteristic of the pixel unit 31 and the like.
  • the monitor pixel 32 a is provided with n pixels for one horizontal row adjacent to the region of the pixel portion 31 on the imaging surface of the imaging device 3, but is not limited thereto. It is sufficient if at least one pixel is provided, and several rows may be provided.
  • An example of the configuration of the monitor pixel 32a is shown in FIG.
  • the monitor pixel 32a has a constant current source ID for supplying a current Id having a predetermined current value independent of temperature in parallel with the photodiode PD of the pixel 31a. Further, at least the photodiode PD is shielded from light so that only the dark current is generated without generating the photocurrent Ip. The rest of the configuration is the same as that of the pixel 31a.
  • the current Id having a predetermined current value that does not depend on the temperature can be created by using a known circuit as a band gap circuit, for example.
  • the driving method of the monitor pixel 32a is the same as the driving method of the pixel 31a. The difference is that the constant current Id corresponding to the photocurrent Ip is transferred by setting the transfer signal ⁇ TX of the transfer transistor Q1 to a predetermined potential. The point is that it is accumulated in the floating diffusion FD via the transistor Q1.
  • the temperature sensor 33 is composed of a diode and a constant current circuit, for example, and outputs a forward voltage Vf of the diode to the output line 33b.
  • the temperature detection unit 55 described with reference to FIG. 2 can detect the temperature by detecting a change from the value of the diode forward voltage Vf under the reference temperature.
  • the temperature sensor 33 is preferably provided in the vicinity of the A / D conversion unit 35, and by doing so, the temperature of the A / D conversion unit 35 can be accurately detected.
  • the vertical scanning circuit 34 supplies the three drive signals (row reset signal ⁇ RST, transfer signal ⁇ TX, and row selection signal ⁇ VSEN) described in the above-described operation of the pixel 31a to each row of the pixel unit 31 and the monitor pixel unit 32. Then, each row of the pixel unit 31 and, if necessary, the monitor pixel unit 32 are sequentially scanned to perform an imaging operation and a photoelectric conversion characteristic detection operation.
  • the offset shift unit 38 generates a pixel signal 31p or noise signal 31n output from each pixel 31a to the vertical signal line 31b based on the offset correction value ⁇ output from the offset control unit 53 of the control unit 5.
  • the offset is corrected and the corrected pixel signal 38p or the corrected noise signal 38n is output. Thereby, it is possible to make the offset value of the pixel 31a to the offset value of the reference photoelectric conversion characteristic PC 0.
  • the A / D input switching unit 39 switches the input of the A / D conversion unit 35 to the correction pixel signal 38p or the correction noise signal 38n, which is the output of the offset shift unit 38, and the reference voltage 39v, and the temperature.
  • a reference voltage circuit 39b that outputs a reference voltage 39v that is a predetermined potential that does not depend on the reference voltage.
  • the switch 39a is set on the output side of the offset shift unit 38 in the imaging state, and is switched to the reference voltage 39v side when measuring the A / D conversion characteristics of the A / D conversion unit 35. Switching of the switch 39a is controlled by a switching signal 39h output from the A / D conversion correction value calculation unit 51 of the control unit 5.
  • the value of the reference voltage 39v output from the reference voltage circuit 39b is controlled by the reference potential switching signal 39j output from the A / D conversion correction value calculation unit 51 of the control unit 5.
  • the A / D converter 35 includes a total of (n + 1) A / D converters (n in the figure) including n provided for each column of the pixel unit 31 and one provided at the output of the temperature sensor 33. And the like, and outputs an A / D conversion signal 35s.
  • Each A / D converter 35a is, for example, a 14-bit A / D converter that converts the upper 4 bits in a successive approximation type and converts the lower 11 bits including 1 redundant bit in an integral type.
  • Each A / D converter 35a has a CDS function that takes the difference between the corrected pixel signal 38p, which is the output of the offset shift unit 38, and the corrected noise signal 38n, and noise after the difference is taken is canceled.
  • the captured image signal 31s is A / D converted.
  • the horizontal shift register 36 converts the A / D conversion signal 35 s for one row of the pixel unit 31 into serial data and outputs it as imaging data 3 s through the output amplifier 37.
  • FIG. 7 is a main routine of a flowchart showing a first example of the operation of the imaging apparatus according to the embodiment of the present invention
  • FIGS. 8 and 9 are subroutines of FIG.
  • the imaging apparatus 1 captures a moving image
  • the A / D conversion characteristic AD and the photoelectric conversion characteristic PC of the imaging apparatus 1 are set to the vertical block of the moving image capturing operation every predetermined time. Detect during the ranking period.
  • the timer timing starts in step S11.
  • step S13 it is confirmed whether or not the timer value is greater than or equal to a predetermined time.
  • the predetermined time is a period for detecting the A / D conversion characteristic AD and the photoelectric conversion characteristic PC of the imaging apparatus 1, and may be appropriately determined according to the application.
  • step S13; No When the measured value of the timer is smaller than the predetermined time (step S13; No), the process proceeds to step S27 and a normal imaging operation is performed.
  • step S13; Yes When the time value of the timer is greater than or equal to the predetermined time (step S13; Yes), in step S15, it is confirmed whether or not the timing of the imaging operation of the imaging device 1 is the vertical blanking period. When it is not the vertical blanking period (step S15; No), the process proceeds to step S27, and a normal imaging operation is performed.
  • step S17 “A / D conversion characteristic detection subroutine” shown in FIG. 8 is executed.
  • step S171 the A / D conversion correction value calculation unit 51 of the control unit 5 outputs (n + 1) switches 39a of the A / D input switching unit 39 of the image sensor 3 from the reference voltage circuit 39b. Is switched to the reference voltage 39v side.
  • step S172 the reference voltage 39v is set to the first reference potential V1 and input to the (n + 1) A / D converters 35a of the A / D converter 35.
  • step S173 the first reference potential V1 is A / D converted to obtain (n + 1) first A / D converted values A1.
  • the reference voltage 39v is set to the second reference potential V2 in step S174, and (n + 1) second A / D conversion values A2 are obtained in step S175.
  • the straight line connecting the above two data (V1, A1) and (V2, A2) is the current A / D conversion characteristic AD of each A / D converter 35a.
  • step S176 the reference A / D conversion characteristic AD 0 for each A / D converter 35a is read.
  • the reference A / D conversion characteristic AD 0 is represented by data of at least (V1, A1 0 ) and (V2, A2 0 ) at least two points measured in advance by performing each operation from step S173 to step S175. in reference characteristic of the a / D converter 35a, it is the temperature T 0 at the time of measurement that have been stored in the storage unit 6.
  • step S177 by using the A / D conversion characteristic AD with the reference A / D conversion characteristic AD 0, the correction value is calculated.
  • FIG. 10 is a graph showing a method of calculating a temperature correction value according to the embodiment of the present invention.
  • the current A / D conversion characteristic AD is translated (subtracted) by the A / D offset correction value ⁇ . Later, it is necessary to multiply the inclination ⁇ by the A / D inclination correction value ⁇ to convert it to the inclination ⁇ .
  • the A / D offset correction value ⁇ and the A / D inclination correction value ⁇ are as follows.
  • step S178 the A / D offset correction value ⁇ and the A / D inclination correction value ⁇ of each of the (n + 1) A / D converters 35a are stored in the storage unit 6.
  • step S 179 the (n + 1) switches 39 a of the A / D input switching unit 39 of the image sensor 3 are switched to the output side of the offset shift unit 38 by the A / D conversion correction value calculation unit 51 of the control unit 5.
  • the imaging state is set, and the process returns to step S17 in FIG.
  • step S17 “A / D conversion characteristic detection subroutine” functions as an A / D conversion characteristic detection step in the present invention.
  • step S19 photoelectric conversion characteristic detection subroutine” shown in FIG. 9 is executed.
  • the parameter k is set to 0 (zero) in step S191.
  • step S192 1 is added to the parameter k.
  • step S193 the kth current Ik is supplied as a current Id having a predetermined current value independent of temperature to all the monitor pixels 32a.
  • step S194 the kth current Ik is photoelectrically converted in the monitor pixel 32a.
  • a / D conversion is performed by the A / D converter 35 to obtain a kth photoelectric conversion output Bk.
  • step S195 the A / D offset correction unit 41 of the image processing unit 4 translates the kth photoelectric conversion output Bk by the A / D offset correction value ⁇ calculated in step S17, so that A / D offset correction is performed. Is given.
  • step S196 the A / D inclination correction unit 42 of the image processing unit 4 converts the A / D inclination correction value ⁇ calculated in step S17 into the k-th photoelectric conversion subjected to A / D offset correction.
  • a / D inclination correction is performed, and a k-th corrected photoelectric conversion output Bk2 is generated.
  • the corrected photoelectric conversion output from which the temperature characteristic of the A / D conversion characteristic AD is removed can be obtained by steps S195 and S196, a more accurate temperature characteristic of the photoelectric conversion characteristic is detected and corrected in step S198 and subsequent steps. be able to.
  • step S197 it is confirmed whether parameter k ⁇ 4. Until the parameter k is equal to 4, the operations from step S192 to S196 are repeated four times.
  • the first current I1 is a current value slightly larger than the photocurrent Ip at the minimum illuminance of the pixel 31a
  • the second current I2 is photoelectric conversion of the pixel 31a in the entire use temperature range of the imaging device 1.
  • the current value is a little smaller than the maximum value of the photocurrent Ip whose characteristic is a linear characteristic.
  • the current linear characteristic of the photoelectric conversion characteristic PC is detected using the first current I1 and the second current I2.
  • the third current I3 is a current value slightly larger than the minimum value of the photocurrent Ip in which the photoelectric conversion characteristic of the pixel 31a becomes a logarithmic characteristic in the entire use temperature range of the imaging device 1, and the fourth current I4. Is a current value slightly smaller than the photocurrent Ip at the maximum illuminance of the pixel 31a. Using the third current I3 and the fourth current I4, the logarithmic characteristic of the current photoelectric conversion characteristic PC is detected.
  • step S198 the reference photoelectric conversion characteristic PC 0 of each monitor pixel 32a is read out.
  • the value of the reference photoelectric conversion characteristic PC 0 is measured in advance by performing the operations of steps S192 to S196, and is at least (I1, B1 0 ), (I2, B2 0 ), (I3, B3 0 ), and (I4, B4 0 at the reference characteristics of each monitor pixel 32a represented by data of four points), in which is stored in the storage unit 6 as the temperature T 0 at the time of measurement.
  • step S199 by using the current correction photoelectric conversion characteristic PC2 and the reference photoelectric conversion characteristic PC 0 that temperature characteristics have been corrected A / D converter 35, the correction value is calculated.
  • the linear characteristic LN 0 of the reference photoelectric conversion characteristic PC 0 is set as follows.
  • ⁇ and ⁇ are output values at a current I 0 (zero) that is sufficiently smaller than the first current I 1 of the linear characteristic LN 0 of the reference photoelectric conversion characteristic PC 0 and the linear characteristic LNh of the current corrected photoelectric conversion characteristic PC 2. It is. Therefore, the output values B1 0 and B2 0 of the linear characteristic LN 0 for the first current I1 and the second current I2, and the output values B12 and B22 of the linear characteristic LNh for the first current I1 and the second current I2 Is expressed as follows.
  • ⁇ , ⁇ , and ⁇ are as follows.
  • the offset correction value ⁇ is expressed by the following equation.
  • the offset correction value ⁇ does not supply the current Id having a predetermined current value that does not depend on the temperature, and the current photoelectric conversion characteristic output and the reference photoelectric in the state where only the dark current from the photodiode PD flows. A difference from the output of the conversion characteristic may be used.
  • the logarithmic characteristic area place the logarithmic characteristic LOGh of logarithmic characteristic LOG 0 and the current correction photoelectric conversion characteristic PC2 of the reference photoelectric conversion characteristic PC 0 as follows.
  • ⁇ is an output value of the logarithmic characteristic LOG 0 at the photocurrent Ipt 0 giving the inflection point Pt 0 of the reference photoelectric conversion characteristic PC 0 .
  • [psi is also the output value of the logarithmic characteristic LOGh current correction photoelectric conversion characteristic PC2 of photocurrent Ipt 0. Therefore, the third current I3, the output value B3 0, B4 0 of the logarithmic characteristic LOG 0 for the fourth current I4, the third current I3, and the output value B32, B42 of the fourth logarithmic characteristic LNh for current I4 of Is expressed as follows.
  • the inflection point correction value ⁇ is expressed as follows.
  • the logarithmic characteristic inclination correction value ⁇ is expressed as follows.
  • step S200 the offset correction value ⁇ , the inflection point correction value ⁇ , and the logarithmic characteristic slope correction value ⁇ calculated in step S199 are stored in the storage unit 6, and the process returns to step S19 in FIG.
  • step S19 “photoelectric conversion characteristic detection subroutine” functions as a photoelectric conversion characteristic detection step in the present invention.
  • step S21 the timer is reset and the timer starts again.
  • step S23 the offset of the pixel signal 31p or the noise signal 31n output from each pixel 31a of the pixel unit 31 is corrected by the offset shift unit 38 based on the offset correction value ⁇ calculated in step S19. Next, the corrected offset value is held until the offset correction value 38h is changed.
  • step S23 functions as an offset correction step in the present invention.
  • step S25 the potential of the transfer signal ⁇ TX of the transfer transistor Q1 during imaging output from the vertical scanning circuit 34 is controlled based on the inflection point correction value ⁇ calculated in step S19, thereby the pixel unit 31.
  • step S25 functions as an inflection point correction step in the present invention.
  • step S27 imaging is performed with the corrected offset value and the corrected transfer signal ⁇ TX, and imaging data 3s is output from the imaging device 3.
  • step S29 the A / D offset correction unit 41 of the image processing unit 4 translates the imaging data 3s by the A / D offset correction value ⁇ calculated in step S17 and performs A / D offset correction. Imaging data 3so is generated. Next, the current A / D offset correction value ⁇ is held until the A / D offset correction value ⁇ is changed.
  • step S31 the A / D inclination correction unit 42 of the image processing unit 4 multiplies the image data 3so subjected to A / D offset correction by the A / D inclination correction value ⁇ calculated in step S17.
  • a / D inclination correction is performed, and A / D corrected imaging data 3sad is generated.
  • a / D conversion characteristic AD matches the reference A / D conversion characteristic AD 0.
  • the current A / D inclination correction value is held until the A / D inclination correction value is changed.
  • step S33 the logarithmic characteristic correction unit 43 of the image processing unit 4 performs logarithmic characteristic inclination correction on the A / D-corrected imaging data 3sad using the logarithmic characteristic inclination correction value ⁇ calculated in step S19. Data 4s is generated.
  • Step S33 functions as a logarithmic characteristic correction step in the present invention.
  • Steps S23, S25 and S33 function as a photoelectric conversion characteristic correction step in the present invention.
  • step S35 the image data 4s is stored in the storage unit 6.
  • step S37 it is confirmed whether or not imaging is to be ended. If not (step S37; No), the process returns to step S13 and the above-described operations are repeated. When the process ends (step S37; Yes), the process ends as it is.
  • steps S11, S13, S15, and S21 may be omitted, and steps S17 to S37 may be performed in accordance with the release operation.
  • FIG. 11 is a main routine of a flowchart showing a second example of the operation of the embodiment of the imaging apparatus.
  • the A / D conversion characteristic AD and the photoelectric conversion characteristic PC of the image pickup apparatus 1 are not detected every predetermined time as in the first example, but the temperature of the image pickup device 3 is the last time. This is detected when the temperature changes from the temperature at the time of detection by a predetermined value or more.
  • step S15 it is confirmed whether or not the timing of the imaging operation of the imaging apparatus 1 is the vertical blanking period. If it is not the vertical blanking period (step S15; No), the process proceeds to step S27.
  • step S15 If it is the vertical blanking period (step S15; Yes), the temperature of the image sensor 3 is detected by the temperature sensor 33 built in the image sensor 3 and the temperature detector 55 of the controller 5 in step S41.
  • step S43 it is confirmed whether or not the difference between the temperature of the image sensor 3 detected in step S41 and the temperature at the previous detection, that is, whether the temperature change of the image sensor 3 is greater than or equal to a predetermined value.
  • the predetermined value of the temperature change may be appropriately determined from the allowable value of the temperature characteristic of the A / D conversion characteristic and the photoelectric conversion characteristic.
  • step S43; No When the temperature change is smaller than the predetermined value (step S43; No), the process proceeds to step S27.
  • step S43; Yes When the temperature change is greater than or equal to the predetermined value (step S43; Yes), the process proceeds to step S17 “A / D conversion characteristic detection subroutine”. Subsequent operations are the same as those in the first example, and a description thereof will be omitted.
  • the temperature of the image sensor 3 is detected every predetermined time by combining the first example and the second example, and the temperature of the image sensor 3 changes by a predetermined value or more from the temperature at the previous detection.
  • the A / D conversion characteristic AD and the photoelectric conversion characteristic PC of the imaging device 1 may be detected.
  • the imaging device As described above, according to the embodiment of the present invention, it has a photoelectric conversion characteristic that switches to a plurality of different characteristics according to the amount of incident light, and captures a subject image formed by the imaging optical system.
  • the imaging apparatus including the imaging element that outputs the imaging signal, the photoelectric conversion characteristic detection unit that detects the photoelectric conversion characteristic of the imaging element, and the photoelectric conversion characteristic of the imaging element based on the detection result of the photoelectric conversion characteristic detection unit
  • An image pickup apparatus and an image pickup device that can always take an image in a predetermined dynamic range regardless of the temperature characteristic of the photoelectric conversion property of the image pickup element A method for correcting temperature characteristics of an apparatus can be provided.
  • the imaging apparatus has an imaging optical system that forms a subject image and a photoelectric conversion characteristic that switches to a plurality of different characteristics according to the amount of incident light, and the subject image formed by the imaging optical system
  • An image pickup apparatus including an image pickup device that picks up an image and outputs an image pickup signal, based on a photoelectric conversion characteristic detection unit that detects a photoelectric conversion characteristic of the image pickup device, and a detection result of the photoelectric conversion characteristic detection unit,
  • a photoelectric conversion characteristic correction unit configured to correct the photoelectric conversion characteristic of the image sensor so as to approach the reference photoelectric conversion characteristic;
  • the photoelectric conversion characteristic of the image sensor is detected, and based on the detection result, the photoelectric conversion characteristic of the image sensor is corrected so as to approach the reference photoelectric conversion characteristic. Therefore, it is always possible to capture an image with a predetermined dynamic range regardless of the temperature characteristics of the photoelectric conversion characteristics of the image sensor.
  • the imaging element includes a photoelectric conversion characteristic detection pixel, and the photoelectric conversion characteristic detection unit supplies a current having a predetermined current value to the photoelectric conversion characteristic detection pixel, and the photoelectric conversion characteristic of the imaging element is detected. It is preferable to detect the conversion characteristics.
  • the photoelectric conversion characteristic is detected by supplying a predetermined current to the photoelectric conversion detection pixel. Therefore, the photoelectric conversion characteristics can be detected without depending on the ambient temperature.
  • the photoelectric conversion characteristic detector detects the photoelectric conversion characteristic of the image sensor every time a predetermined time elapses.
  • a temperature detection unit for detecting the temperature of the image sensor is provided, and the photoelectric conversion characteristic detection unit is configured to detect the image sensor when a detection result of the temperature detection unit changes by a predetermined value or more from a previous detection result. It is preferable to detect the photoelectric conversion characteristics.
  • the photoelectric conversion characteristics are corrected only when the photoelectric conversion characteristics need to be corrected, and it is possible to prevent an unnecessary increase in the processing load of the imaging apparatus.
  • the image sensor includes a temperature sensor, and the temperature detection unit detects the temperature of the image sensor based on an output of the temperature sensor.
  • the temperature of the image sensor can be accurately detected.
  • the photoelectric conversion characteristic detection unit detects the photoelectric conversion characteristic of the imaging element during a vertical blanking period of the imaging operation.
  • the photoelectric conversion characteristic can be detected without disturbing the imaging operation.
  • the imaging element has a photoelectric conversion characteristic in which at least two characteristics of a linear characteristic and a logarithmic characteristic are switched according to the amount of incident light, and the photoelectric conversion characteristic detection unit is connected to the photoelectric conversion characteristic detection pixel.
  • the current of at least two predetermined current values is supplied to detect the linear characteristic
  • the current of at least two predetermined current values is supplied to the photoelectric conversion characteristic detecting pixel to detect the logarithmic characteristic and detect it
  • an offset correction value for bringing the offset of the linear characteristic close to the reference photoelectric conversion characteristic, and an inflection point that is a switching point between the linear characteristic and the logarithmic characteristic are An inflection point correction value for approximating the reference photoelectric conversion characteristic and a logarithmic characteristic correction value for approximating the slope of the logarithmic characteristic to the reference photoelectric conversion characteristic, and the photoelectric conversion characteristic correction unit
  • An offset correction unit that approximates the offset of the linear characteristic to the reference photoelectric conversion characteristic based on the offset
  • an offset correction value for making the detected offset of the linear characteristic of the photoelectric conversion characteristic approach the offset of the reference photoelectric conversion characteristic is obtained. Further, an inflection point correction value for obtaining the inflection point of the detected photoelectric conversion characteristic close to the inflection point of the reference photoelectric conversion characteristic is obtained. In addition, a logarithmic characteristic correction value for obtaining the slope of the logarithmic characteristic close to the slope of the reference photoelectric conversion characteristic is obtained.
  • the detected photoelectric conversion characteristic is corrected so as to approach the reference photoelectric characteristic. Therefore, the photoelectric conversion characteristic can be corrected with high accuracy in consideration of the offset of the photoelectric conversion characteristic, the inflection point, and the slope of the logarithmic characteristic.
  • the imaging device includes an A / D conversion unit that performs A / D conversion on the imaging signal, detects an A / D conversion characteristic of the A / D conversion unit in an operating temperature environment, and detects the detected A
  • An A / D conversion characteristic detecting unit for calculating an A / D correction value for bringing the / D conversion characteristic close to a predetermined reference A / D conversion characteristic, and the A / D conversion unit based on the A / D correction value.
  • An A / D conversion characteristic correction unit that brings the A / D conversion characteristic closer to the reference A / D conversion characteristic, and the A / D conversion characteristic correction unit outputs an output value from the photoelectric conversion characteristic detection pixel. Correction is performed using the A / D correction value, and the photoelectric conversion characteristic detection unit detects the linear characteristic and the logarithmic characteristic based on the output value corrected by the A / D conversion characteristic correction unit. preferable.
  • the output value from the photoelectric conversion characteristic detection pixel is corrected so that the A / D conversion characteristic approaches the reference A / D conversion characteristic, and the linear characteristic and the logarithmic characteristic are detected. Therefore, the offset correction value, the inflection point correction value, and the logarithmic characteristic correction value can be obtained so that the deviation between the reference A / D conversion characteristic and the A / D conversion characteristic is removed. As a result, the photoelectric conversion characteristics can be corrected with higher accuracy.
  • the temperature characteristic correction method according to the embodiment of the present invention has the same configuration as the photoelectric conversion characteristic.

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Abstract

Cette invention concerne un dispositif d'imagerie équipé d'un élément d'imagerie qui présente des caractéristiques de conversion photo-électrique commutant entre une pluralité de caractéristiques différentes au gré de la quantité de lumière incidente, qui représente une image d'un sujet formée dans un système d'imagerie optique et qui produit un signal d'image. Le dispositif d'imagerie est équipé d'une unité de détection de caractéristiques de conversion photo-électrique qui détecte de telles caractéristiques de l'élément d'imagerie, et d'une unité de correction de caractéristiques de conversion photo-électrique qui corrige lesdites caractéristiques de l'élément d'imagerie à partir des résultats de l'unité de détection de ces caractéristiques, ceci de telles sorte que les caractéristiques de conversion photo-électrique s'approchent des caractéristiques types de conversion photo-électrique. Le résultat est un dispositif d'imagerie capable de réaliser des images en permanence dans une plage dynamique spécifiée et un procédé permettant de corriger les caractéristiques de température du dispositif imageur.
PCT/JP2011/002232 2010-04-23 2011-04-15 Dispositif d'imagerie et procédé de correction de ses caractéristiques de température Ceased WO2011132393A1 (fr)

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JP2013183347A (ja) * 2012-03-02 2013-09-12 Konica Minolta Inc 固体撮像装置
WO2014034038A1 (fr) * 2012-08-31 2014-03-06 コニカミノルタ株式会社 Dispositif d'imagerie à semi-conducteurs
JP2018056970A (ja) * 2016-09-30 2018-04-05 キヤノン株式会社 撮像装置、撮像システムおよび移動体
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