[go: up one dir, main page]

WO2011153674A1 - Deposition box for silicon-based thin film solar cell - Google Patents

Deposition box for silicon-based thin film solar cell Download PDF

Info

Publication number
WO2011153674A1
WO2011153674A1 PCT/CN2010/001658 CN2010001658W WO2011153674A1 WO 2011153674 A1 WO2011153674 A1 WO 2011153674A1 CN 2010001658 W CN2010001658 W CN 2010001658W WO 2011153674 A1 WO2011153674 A1 WO 2011153674A1
Authority
WO
WIPO (PCT)
Prior art keywords
plate
cathode
silicon
thin film
solar cell
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
PCT/CN2010/001658
Other languages
French (fr)
Chinese (zh)
Inventor
李毅
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shenzhen TRONY Science and Tech Dev Co Ltd
Shenzhen Trony Technology Development Co Ltd
Original Assignee
Shenzhen TRONY Science and Tech Dev Co Ltd
Shenzhen Trony Technology Development Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shenzhen TRONY Science and Tech Dev Co Ltd, Shenzhen Trony Technology Development Co Ltd filed Critical Shenzhen TRONY Science and Tech Dev Co Ltd
Priority to US13/389,800 priority Critical patent/US8297226B2/en
Priority to JP2012534523A priority patent/JP5453543B2/en
Priority to EP10852667.4A priority patent/EP2468922B1/en
Priority to KR1020127020788A priority patent/KR101337026B1/en
Publication of WO2011153674A1 publication Critical patent/WO2011153674A1/en
Anticipated expiration legal-status Critical
Ceased legal-status Critical Current

Links

Classifications

    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/22Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the deposition of inorganic material, other than metallic material
    • C23C16/24Deposition of silicon only
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10FINORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F71/00Manufacture or treatment of devices covered by this subclass
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/44Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
    • C23C16/50Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating using electric discharges
    • C23C16/505Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating using electric discharges using radio frequency discharges
    • C23C16/509Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating using electric discharges using radio frequency discharges using internal electrodes
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/44Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
    • C23C16/54Apparatus specially adapted for continuous coating
    • C23C16/545Apparatus specially adapted for continuous coating for coating elongated substrates
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32Gas-filled discharge tubes
    • H01J37/32009Arrangements for generation of plasma specially adapted for examination or treatment of objects, e.g. plasma sources
    • H01J37/32082Radio frequency generated discharge
    • H01J37/32091Radio frequency generated discharge the radio frequency energy being capacitively coupled to the plasma
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32Gas-filled discharge tubes
    • H01J37/32431Constructional details of the reactor
    • H01J37/32532Electrodes
    • H01J37/32577Electrical connecting means
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32Gas-filled discharge tubes
    • H01J37/32431Constructional details of the reactor
    • H01J37/32715Workpiece holder
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10FINORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F19/00Integrated devices, or assemblies of multiple devices, comprising at least one photovoltaic cell covered by group H10F10/00, e.g. photovoltaic modules
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10FINORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F71/00Manufacture or treatment of devices covered by this subclass
    • H10F71/121The active layers comprising only Group IV materials
    • H10F71/1215The active layers comprising only Group IV materials comprising at least two Group IV elements, e.g. SiGe
    • H10F71/1218The active layers comprising only Group IV materials comprising at least two Group IV elements, e.g. SiGe in microcrystalline form
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02EREDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
    • Y02E10/00Energy generation through renewable energy sources
    • Y02E10/50Photovoltaic [PV] energy

Definitions

  • the invention discloses a solar cell technology, specifically a VHF power supply
  • silicon-based thin film solar cells use plasma enhanced chemical vapor deposition (PECVD) to obtain single-junction or multi-junction photoelectric conversion P-I-N layers, which are commonly used in the thin film solar cell manufacturing industry.
  • PECVD plasma enhanced chemical vapor deposition
  • Plasma electrodeposition is performed in the reaction chamber by an electrode plate array composed of electrode plate assemblies.
  • the RF capacitor-coupled parallel plate electrode reaction chamber is widely used for large-area deposition of thin films of amorphous silicon, amorphous silicon germanium, silicon carbide, silicon nitride, and silicon oxide.
  • Electrodes with a support frame are often referred to in the industry as “clamps”, and devices for mounting the device in a chamber for plasma chemical vapor deposition are also referred to as "deposition cassettes".
  • Silicon-based thin-film solar cells are an important branch of the solar industry, and the parallel electrode plate capacitive discharge mode is one of the core technologies in the solar cell industry.
  • 13. 56MHz RF is widely used in high-speed preparation of amorphous silicon-based thin film materials, with high production efficiency and low process cost.
  • microcrystalline and nanocrystalline silicon-based thin film materials are highly regarded by the industry.
  • the 13.56MHz RF wave-derived plasma has a small plasma concentration, a low deposition rate, a long time for depositing a film of sufficient thickness, and a large background contamination, resulting in a high impurity content of the film and poor photoelectric properties. , seriously affecting product quality and performance. How high-speed deposition becomes the key to successful service of crystalline silicon-based thin film technology.
  • VHF refers to a legal RF that has twice or more times the frequency of 13.56 MHz. In the industry, the application of more VHF is generally in the range of 27.12 ⁇ 200MHz. However, in the capacitive discharge mode, the standing wave effect and the skin effect caused by the very high frequency are very obvious, and increase as the driving frequency increases. Professor MA Lieberman of the University of California, Berkeley, conducted an in-depth study of these two effects. The results show that the critical condition of the VHF PECVD deposition film is that the free-space wavelength of the excitation frequency mentor) is much larger than the size factor (X) of the capacitive discharge electrode plate, and the skin depth ( ⁇ ) is much larger than the thickness. Factor ( ⁇ .
  • the object of the present invention is to solve the problem of discharge non-uniformity driven by a very high frequency power supply, and to provide an electrode array composed of a completely conceptually designed electrode plate assembly for a large area VHF-PECVD deposition chamber capable of obtaining a uniform electric field.
  • the present invention provides a technical solution for depositing a cartridge for achieving the above tasks: including an electrode plate assembly, a signal feeding assembly and a chamber, further comprising a cathode plate shield, the chamber being a movable cavity with a roller a chamber in which an electrode array consisting of electrode plates is mounted, the feed inlet being located in a concave circular or semi-circular surface in the central region of the back surface of the cathode plate of the electrode plate, in its circular or semi-circular feed inlet
  • the inner surface contact connecting signal feeding component is connected to the negative pole of the RF/VHF power supply signal, and is connected to the semicircular or circular end surface of the feeding signal component by surface contact, and the shielding plate of the cathode plate is provided with a through hole, the cathode plate and the cathode plate Insulating between the shields, the electrode array is at least one set of cathode plates and one anode plate;
  • a set of cathode plates and an anode plate of the deposition box refers to an effective discharge working surface of a cathode plate which is symmetrically placed by two faces of the anode plate.
  • the cathode plate is a single-sided discharge
  • the shield of the cathode plate comprises a ceramic insulating layer and a shielding layer, and the shielding cover covers the entire back surface and the side surface of the cathode plate.
  • the electrode comprises a plurality of sets of cathode plates with a shield cover and a plurality of sets of grounded anode plates to form an electrode array with a certain interval of discharge.
  • the shield also includes a shield for the RF/VHF power supply signal fed into the center of the back of the cathode plate and the sides.
  • the signal feed assembly includes a copper feed core and an insulating layer and an outer shield.
  • the signal feeding component is composed of a waist and a head, has a z-shape, a high temperature resistant ceramic edge layer at the waist, and a metal feeding core is an electric conductor composed of an RF/VHF feed line, and the other end of the electric conductor Cathode output and power supply matcher for RF/VHF power supply signals.
  • the solution of the present invention resides in a method, a signal feeding mode composed of an electrode plate assembly, a feeding assembly and a chamber, characterized in that an electrode array composed of an electrode plate is mounted in a movable roller chamber, and at least one set of electrode arrays a cathode plate and an anode plate, the feed inlet is located at the center of the back surface of the cathode plate of the electrode plate In the concave circular or semi-circular plane in the area, the surface of the circular or semi-circular surface is contacted and connected to the feeding component; the signal of the electrode plate is fed by the surface feeding method, and the one end of the component is fed into the semicircle The circular contact or the semi-circular surface feed inlet connected to the cathode plate contacts the RF/VHF power supply signal.
  • the solution feeds the RF/VHF power supply signal into the electrode plate feed inlet by a plurality of sets of feed components and electrode plate assemblies in a surface feeding manner to form an electrode array having a certain discharge pitch.
  • the feed assembly is a zigzag metal strip with a high temperature resistant ceramic insulation at the waist, and the metal feed core is an RF/VHF feed line forming an electrical conductor.
  • the other end of the conductor that feeds the component is connected to the cathode output port and the power supply matcher including the RF/VHF power supply signal.
  • the positive beneficial effect produced by the deposition box of the invention is different from the side feeding mode of the slot type cathode plate, and stable discharge with higher uniformity and larger discharge area can be obtained in the deposition box, the access capacitance is small, and the actual discharge power is obtained. Large, RF interference between the electrode plate arrays is small. It is also different from the central point feed of the cathode plate of the single-chamber deposition system. It has small access capacitance, small standing wave and skin effect, and integrated array type multi-chamber deposition, which greatly improves production efficiency.
  • the RF/VHF large-area discharge uniformity problem is solved, which is also the premise of the high-speed and high-efficiency preparation technology of the crystallized silicon-based film.
  • the present invention is applicable to large-area uniform discharge of very high frequency power supplies of any legal frequency of any power, 27. 12 MHz to 200 MHz.
  • This structure can be applied to a multi-piece deposition system, greatly increasing productivity and reducing battery cost.
  • the invention breaks through the limitations of the conventional electrode design technology, effectively eliminates the standing wave and skin effect caused by very high frequency, and achieves the industrial application level suitable for uniform discharge.
  • Figure 1 is a cross-sectional view of the deposition cartridge of the present invention.
  • Figure 2 is a schematic view of a deposition chamber of the present invention.
  • FIG. 3 is a schematic structural diagram of the signal feeding component 201 in FIG.
  • FIG. 4 is a schematic view showing the structure of the cathode plate 203 of Figure 1 of the present invention.
  • FIG. 5 is a schematic structural view of the cathode shield cover 204 of FIG.
  • Figure 6 is a schematic view showing the structure of Embodiment 1 of the present invention.
  • Figure 7 is a schematic view showing the structure of Embodiment 2 of the present invention.
  • Figure 8 is a schematic view showing the structure of Embodiment 3 of the present invention.
  • the deposition box 02 is fed by a signal feed assembly 201, an insulating shield 202, a cathode plate 203, a cathode plate shield 204, a substrate 206, an insulating strip 207, an anode plate 208, a grounded metal channel 209, and a lower
  • the rear door panel 211, the upper rear door panel 212, the gas chamber 214, the front door panel 215, the side frame 216, the wheel 218, the gas duct 220, the lower bottom plate 221, and the like are formed by vapor deposition deposition in the vacuum chamber 01.
  • the vacuum chamber 01 has a gas system inlet 101, a power system inlet 102, a vacuum chamber movable door 103, a track 104, and a vacuum system inlet 105.
  • the deposition cassette of the present invention achieves the inventive task set forth above in a face-fed manner.
  • the surface feed deposition deposition box design of the present invention does not have these problems, and can obtain problems such as uniform electric field and large-area chamber discharge, and particularly efficient use of the double-working surface of the anode plate, and at the same time, a CVD deposition box system for processing or depositing multiple sheets of glass.
  • the effective VHF surface feed mode the industrial production process can be achieved, which can meet the needs of mass production of silicon-based thin film solar cells.
  • the present invention also contributes to substantially solving the problem of uniformity and uniformity of a high-speed deposited film layer driven by a very high frequency power source.
  • the deposition cartridge 02 is placed in a vacuum chamber 01, which includes an electrode plate, a signal feed assembly, a chamber, and a cathode plate shield 204.
  • the concave portion of the cathode plate 203 of the cover 204 corresponds to a concave circular surface, the waist is flat and easy to install, and the signal feeding loss is small, and the other head is 201-3 connected to the RF /
  • the VHF power supply negative pole and the power supply matcher (not shown) are stepped, and a feed inlet having a semicircular end surface in contact with the electrode plate is formed in the deposition box of the grounding device. With insulation shielding protection (not shown).
  • the electrode plate is vertical, the cathode plate feed inlet is circular, the signal feeding assembly is flat at the waist, and the feed surface is semi-circular.
  • the vapor deposition system is mainly composed of a vapor deposition chamber, a gas system, a power system, a vacuum system, a heating system, a control system, etc.
  • the gas system is mainly provided with various required gas and gas pipelines for vapor deposition
  • the power supply system mainly provides The high-frequency or high-frequency power source that needs to be ionized into a plasma state during deposition.
  • the vacuum system mainly provides equipment and pipelines for vacuum extraction during deposition.
  • the heating system mainly heats the vapor deposition chamber, and the control system is mainly The deposition process and parameters are controlled, and the vapor deposition chamber is a device that deposits a gas on the substrate 206 and completes the coating.
  • the gas deposition chamber is mainly grounded by a vacuum chamber 01 and a deposition box 02 with a scroll wheel 218.
  • the vacuum chamber 01 is used to achieve a vacuum state, and the deposition cartridge 02 is used to effect plasma discharge, and a P-IN film layer is deposited on the substrate 206.
  • the deposition box 02 includes a cathode plate 203, a cathode plate shield 204, an insulating strip 207, an anode plate 208, a signal feeding assembly 201, a shielding layer 202, a bottom plate 221, a gas chamber 214, a grounding metal channel 209, a front door plate 215,
  • the upper rear door panel 212, the lower rear door panel 211, the side frame 216, and the wheel 218 are formed.
  • the side frame 216 is welded into a quadrangular frame by a stainless steel square.
  • the rectangular lugs 216 - 4 are fixed on the frame, and the gas chamber 214 and the lower bottom plate 221 are connected to the upper and lower sides of the side frame 216 to form a whole, in the gas chamber 214 and the lower bottom plate 221
  • a grounding metal channel 209 is connected to the opposite surface for fixing the anode plate 208 and the cathode plate 203, and the cathode plate shield 204.
  • the anode plate 208 is directly inserted into the metal channel 209.
  • the cathode plate shield 204 is in contact with the metal guide groove 209, and the insulating strip 207 is attached between the cathode plate 203 and the cathode plate shield 204 so as to be in contact with the groove.
  • the anode plate 208 and the cathode plate shield 204 are grounded by contact with the metal guide groove 209 and then with the lower base plate 221.
  • a concave circular feed inlet 203-1 In the central portion of the back of the cathode plate 203, there is a concave circular feed inlet 203-1.
  • the waist and the head of the signal feeding assembly 201 are formed in a zigzag shape, and the semicircular end face of the head and the central portion of the back of the cathode plate are concave.
  • the circular feed inlet 203-1 is in contact with the surface to feed the RF/VHF power signal to the cathode plate.
  • a hole 204-1 is formed in the middle of the corresponding feed inlet 203-1 in the middle of the cathode plate shield 204 so that the power feeding component 201 does not come into contact with the cathode plate shield 204 when it is taken out from the cathode plate 203, and the other end of the power feeding component 201 passes.
  • the hole 201-3 is connected to the power connector 205, and has a high temperature resistant ceramic insulating layer 202 at the waist to prevent contact with the cathode plate shield 204.
  • the signal feeding component 201 is copper with good conductivity, and the front door plate 215 is the substrate 206.
  • the upper hook 215-2 is hung on the mounting lug 216-1 on the side frame 216, and the lower side is inserted into the Z-shaped tab 216-2, so that a relatively closed inside the deposition box 02 is formed.
  • Space The deposition box 02 is pushed into the vacuum chamber 01 along the rail 104, so that the inlet on the gas pipe 220 fixed on the deposition box 02 and the gas system inlet 101 on the vacuum chamber 01 are docked into the nozzle inside the vacuum chamber 01, and closed.
  • the vacuum chamber movable door 103 on the vacuum chamber 01 is evacuated to a desired state by a vacuum system, and then subjected to a vapor deposition process to complete vapor deposition coating.
  • the electrode plate is vertical, the cathode plate feeding inlet is circular, the signal feeding component is flat at the waist, the feeding surface is semicircular, the cathode plate is insulated from the shielding cover, and the cathode plate shielding cover is provided with a through hole.
  • Figure 7 uses the deposition cartridge as in Example 1. Eight substrates 206 can be coated simultaneously.
  • the two cathode plates 203 share one anode plate 208, and two anode plates 208 and four cathode plates 203 constitute four pairs of electrodes, and eight substrates 206 can be simultaneously coated. Specific steps are as follows:
  • a uniform electric field of a 40.68 MHz VHF power supply can be realized, and a microcrystalline silicon film having a film thickness unevenness of about 5% can be deposited on a TC0 glass of 1640 awake X 707 mm (length X width). , the crystallinity is adjustable.
  • the electrode plate is vertical, the cathode plate feeding inlet is circular, the signal feeding component is flat at the waist, the feeding surface is semicircular, the cathode plate is insulated from the shielding cover, and the cathode plate shielding cover is provided with a through hole.
  • Figure 8 uses the deposition box as in Example 1.
  • 24 substrates 206 can be coated simultaneously.
  • the two cathode plates 203 share one anode plate 208, and six anode plates 208 and twelve cathode plates 203 constitute twelve pairs of electrodes, and 24 substrates 206 can be simultaneously coated. Specific steps are as follows:

Landscapes

  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Plasma & Fusion (AREA)
  • Materials Engineering (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • General Chemical & Material Sciences (AREA)
  • Mechanical Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Analytical Chemistry (AREA)
  • Inorganic Chemistry (AREA)
  • Chemical Vapour Deposition (AREA)

Abstract

A movable deposition box (02) for silicon-based thin film solar cell comprises an electrode array composed of at least a group of cathode plates (203) and a piece of anode plate (208) which are set in a movable chamber, wherein a feeding socket (203-1) is positioned on a circular or semicircular concave surface in the center area on the backside of the cathode plates (203), a circular or semicircular end face (201-1) of a feeding component (201) which has a flat middle part contacts the signal feeding socket (203-1) and feeds in RF/VHF power signal, the anode plate (208) is grounded, and a shield cover (204) of the cathode plate has a through-hole (204-1) and is insulated from the cathode plate (203).

Description

一种硅基薄膜太阳能电池的沉积盒 技术领域  Deposition box of silicon-based thin film solar cell

本发明公幵一种太阳能电池技术, 确切的说一种由甚高频电源 The invention discloses a solar cell technology, specifically a VHF power supply

(27. 12MHz~100MHz ) 驱动的硅基薄膜太阳能电池的沉积盒。 (27. 12MHz~100MHz) Deposition box for driven silicon-based thin film solar cells.

背景技术 Background technique

目前,硅基薄膜太阳能电池,采用等离子体增强化学气相沉积技术(PECVD) 获取单结或多结的光电转换 P-I-N膜层,在薄膜太阳能电池制造行业通用这种 射频电容耦合平行电极板反应室。由电极板组件构成电极板阵列在反应室内进 行等离子体化学气相沉积。 射频电容藕合平行板电极反应室广泛应用于非晶 硅、 非晶硅锗、 碳化硅、 氮化硅、 氧化硅等材料薄膜的大面积沉积。 行业内通 常把具有支撑框架的电极称为 "夹具", 将该装置安装在腔室内进行等离子体 化学气相沉积的装置又称为 "沉积盒"。 硅基薄膜太阳能电池是太阳能行业的 一个重要分支,所采用的平行电极板容性放电模式是太阳能电池行业的核心技 术之一。13. 56MHz射频广泛应用于非晶硅基薄膜材料的高速制备,生产效率高、 工艺成本低。 随着太阳能市场对硅基薄膜技术要求不断提高, 微晶、 纳米晶硅 基薄膜材料受到行业高度关注。但是在微晶工艺环境下, 13. 56MHz射频波衍生 的等离子体浓度小,沉积速率低,沉积足够厚度薄膜所需时间长,背景污染大, 从而制备出的薄膜杂质含量高, 光电学性能差, 严重影响产品品质性能。 如何 高速沉积成为晶化硅基薄膜技术能够成功服务于产业的关键。  At present, silicon-based thin film solar cells use plasma enhanced chemical vapor deposition (PECVD) to obtain single-junction or multi-junction photoelectric conversion P-I-N layers, which are commonly used in the thin film solar cell manufacturing industry. Plasma electrodeposition is performed in the reaction chamber by an electrode plate array composed of electrode plate assemblies. The RF capacitor-coupled parallel plate electrode reaction chamber is widely used for large-area deposition of thin films of amorphous silicon, amorphous silicon germanium, silicon carbide, silicon nitride, and silicon oxide. Electrodes with a support frame are often referred to in the industry as "clamps", and devices for mounting the device in a chamber for plasma chemical vapor deposition are also referred to as "deposition cassettes". Silicon-based thin-film solar cells are an important branch of the solar industry, and the parallel electrode plate capacitive discharge mode is one of the core technologies in the solar cell industry. 13. 56MHz RF is widely used in high-speed preparation of amorphous silicon-based thin film materials, with high production efficiency and low process cost. As the solar market demands for silicon-based thin film technology continues to increase, microcrystalline and nanocrystalline silicon-based thin film materials are highly regarded by the industry. However, in the microcrystalline process environment, the 13.56MHz RF wave-derived plasma has a small plasma concentration, a low deposition rate, a long time for depositing a film of sufficient thickness, and a large background contamination, resulting in a high impurity content of the film and poor photoelectric properties. , seriously affecting product quality and performance. How high-speed deposition becomes the key to successful service of crystalline silicon-based thin film technology.

甚高频指频率为 13. 56MHz的两倍或者更高倍的合法射频。 在行业内, 应 用较多的甚高频一般为 27. 12〜200MHz的范围。 然而, 在容性放电模式中, 甚 高频引发的驻波效应和趋肤效应非常明显, 而且随着驱动频率的增加而增强。 美国加州大学 Berkeley分校的 M. A. Lieberman教授对这两种效应做了深 入研究。研究结果表明, 甚高频 PECVD沉积均勾薄膜的临界条件在于激发频率 的自由空间波长 ( „)远大于容性放电电极板腔室尺寸因子(X ) ,趋肤深度( δ ) 远大于容厚因子 ( η。) 以放电面积 lm2为例, 60MHz的激发频率下, λ X , δ ^ τ。 因此在此激发频率下, 趋肤和驻波效应非常明显, 导致 lm2电极板上 放电极不均匀。所以如何实现甚高频驱动的均匀大面积放电是晶化硅基薄膜技 术亟待解决的技术难题之一, 这引起了行业的极大兴趣。 2003 年, 美国专利 2003/0150562A1 公开了平板电容耦合放电中利用磁镜改善甚高频造成的电场 不均匀性。 中国专利 200710150227. 4, 200710150228. 9, 200710150229. 3, 公 开了甚高频电极的三种设计,通过甚高频信号的不同馈入形式,获得均匀电场。 但现存在的问题是: 1 ) VHF-PECVD反应室电极设计结构复杂; 2) 仍需要继续 改进的理由是生产中经常对反应室及电极不断的清洗、装卸都会造成异形电极 变形; 3 ) 现有专利中的多点馈入结构接触面积较小, 要求各个馈入点路径对 称, 馈入点之间的连接导体与阴极板之间不能有接触, 准确的说连接导体需要 与阴极板之间隔离屏蔽才能实现有效放电。 这些结构设计的实际要求比较苛 刻, 决定放电均匀程度的因素太多, 而且不能满足生产中拆洗等实际需求。 因 此在行业设备中, 单点馈入为主流结构设计, 但是由于驻波和趋肤效应, 单点 馈入结构不能满足馈入高频频率提升的要求。 为此, 需要对现有沉积夹具和电 极朝实用性方面作进一步开发和改进,面对当前市场需求, 使质量提高, 成本 降低。同时,对于处理或沉积多片玻璃的 CVD沉积盒体系,也是一个发展趋势。 因此, 对于能满足大批量生产, 采用有效甚高频馈入模式的工业化产品开发和 设计, 对产业发展具有重要的实际意义。 VHF refers to a legal RF that has twice or more times the frequency of 13.56 MHz. In the industry, the application of more VHF is generally in the range of 27.12~200MHz. However, in the capacitive discharge mode, the standing wave effect and the skin effect caused by the very high frequency are very obvious, and increase as the driving frequency increases. Professor MA Lieberman of the University of California, Berkeley, conducted an in-depth study of these two effects. The results show that the critical condition of the VHF PECVD deposition film is that the free-space wavelength of the excitation frequency („) is much larger than the size factor (X) of the capacitive discharge electrode plate, and the skin depth (δ) is much larger than the thickness. Factor ( η . ) Taking the discharge area lm 2 as an example, at the excitation frequency of 60 MHz, λ X , δ ^ τ. Therefore, at this excitation frequency, the skin and standing wave effects are very obvious, resulting in the electrode on the lm 2 electrode plate. It is not uniform. Therefore, how to realize uniform large-area discharge driven by VHF is one of the technical problems to be solved in the crystallization of silicon-based thin film technology, which has aroused great interest in the industry. In 2003, US Patent 2003/0150562A1 discloses a flat plate. In the capacitive coupling discharge, the magnetic field is used to improve the electric field non-uniformity caused by the very high frequency. Chinese Patent 200710150227. 4, 200710150228. 9, 200710150229. 3, discloses three designs of VHF electrodes, which are different by VHF signals. Feeding the form to obtain a uniform electric field. However, the existing problems are: 1) The electrode design structure of the VHF-PECVD reaction chamber is complicated; 2) The reason for continuing improvement is in production. Constantly cleaning and loading the reaction chamber and the electrode will cause deformation of the deformed electrode; 3) The contact area of the multi-point feed structure in the prior patent is small, and the path of each feed point is required to be symmetrical, and the connection conductor between the feed points There must be no contact with the cathode plate. Accurately, the connection conductor needs to be shielded from the cathode plate to achieve effective discharge. The practical requirements of these structural designs are harsh, and the factors determining the uniformity of discharge are too many, and cannot meet the requirements in production. Therefore, in industrial equipment, single-point feeding is the mainstream structure design, but due to the standing wave and skin effect, the single-point feeding structure can not meet the requirements of feeding high-frequency frequency boost. Existing deposition fixtures and electrodes have been further developed and improved in terms of practicality, and in the face of current market demands, quality is improved and costs are reduced. At the same time, a CVD deposition box system for processing or depositing multiple sheets of glass is also a development trend. For industrial products that can meet the high-volume production and adopt the effective VHF feed mode And design has important practical significance to the industry.

发明内容 本发明目的旨在解决甚高频电源驱动的放电不均匀性问题, 而提供一种可. 获得均匀电场的大面积 VHF-PECVD沉积室使用一种全新概念设计的电极板组件 构成的电极阵列, 以适用于产业化的大面积 VHF-PECVD电极板多片阵列。 Summary of the invention The object of the present invention is to solve the problem of discharge non-uniformity driven by a very high frequency power supply, and to provide an electrode array composed of a completely conceptually designed electrode plate assembly for a large area VHF-PECVD deposition chamber capable of obtaining a uniform electric field. A multi-chip array of large-area VHF-PECVD electrode plates suitable for industrialization.

本发明为实现以上任务提出沉积盒的技术解决方案: 包括电极板组件、 信 号馈入组件和腔室, 其特征在于还包括阴极板屏蔽罩, 所说的腔室是一个带滚 轮的活动式腔室, 该腔室内安装由电极板构成的电极阵列, 馈入口位于电极板 的阴极板背面中心区域内的下凹的圆形或半圆形面内,在其圆形或半圆形的馈 入口内面接触连接信号馈入组件接射频 /甚高频功率电源信号的负极, 以面接 触连接馈入信号组件的半圆形或圆形端面, 阴极板的屏蔽罩上开有通孔, 阴极 板与屏蔽罩之间绝缘, 所说的电极阵列至少一组阴极板和一块阳极板;  The present invention provides a technical solution for depositing a cartridge for achieving the above tasks: including an electrode plate assembly, a signal feeding assembly and a chamber, further comprising a cathode plate shield, the chamber being a movable cavity with a roller a chamber in which an electrode array consisting of electrode plates is mounted, the feed inlet being located in a concave circular or semi-circular surface in the central region of the back surface of the cathode plate of the electrode plate, in its circular or semi-circular feed inlet The inner surface contact connecting signal feeding component is connected to the negative pole of the RF/VHF power supply signal, and is connected to the semicircular or circular end surface of the feeding signal component by surface contact, and the shielding plate of the cathode plate is provided with a through hole, the cathode plate and the cathode plate Insulating between the shields, the electrode array is at least one set of cathode plates and one anode plate;

解决方案所述沉积盒所说的一组阴极板和一块阳极板,是指由阳极板的两 个面分别朝向对称放置的阴极板的有效放电工作面。 阴极板是单面放电, 阴极 板的屏蔽罩包括陶瓷绝缘层、 屏蔽层, 屏蔽罩覆盖整个阴极板背面和侧面。  Solution A set of cathode plates and an anode plate of the deposition box refers to an effective discharge working surface of a cathode plate which is symmetrically placed by two faces of the anode plate. The cathode plate is a single-sided discharge, and the shield of the cathode plate comprises a ceramic insulating layer and a shielding layer, and the shielding cover covers the entire back surface and the side surface of the cathode plate.

所说的电极由多套带屏蔽罩的阴极板与多套接地的阳极板,构成一定间距 放电的电极阵列。  The electrode comprises a plurality of sets of cathode plates with a shield cover and a plurality of sets of grounded anode plates to form an electrode array with a certain interval of discharge.

屏蔽罩, 还包括射频 /甚高频功率电源信号馈入至阴极板背面的中心位置 及四周侧面的屏蔽。 信号馈入组件包括铜质馈入芯体和绝缘层和外表屏蔽层。  The shield also includes a shield for the RF/VHF power supply signal fed into the center of the back of the cathode plate and the sides. The signal feed assembly includes a copper feed core and an insulating layer and an outer shield.

所说信号馈入组件由腰部和头部构成, 外形呈 Z字形, 腰部有耐高温陶瓷 绝.缘层, 金属馈入芯是射频 /甚高频馈线构成的导电体, 其导电体的另一端接 射频 /甚高频功率电源信号的阴极输出口和功率电源匹配器。  The signal feeding component is composed of a waist and a head, has a z-shape, a high temperature resistant ceramic edge layer at the waist, and a metal feeding core is an electric conductor composed of an RF/VHF feed line, and the other end of the electric conductor Cathode output and power supply matcher for RF/VHF power supply signals.

本发明的解决方案在于方法, 一种由电极板组件、 馈入组件和腔室构成的 信号馈入模式, 其特征在于活动式滚轮腔室内安装由电极板构成的电极阵列, 电极阵列至少一组阴极板和一块阳极板,馈入口位于电极板的阴极板背面中心 区域内的下凹的圆形或半圆形面内,在其圆形或半圆形面内面接触连接馈入组 件; 电极板的信号以面馈入方式馈入, 馈入组件的一端半圆形面接触连接阴极 板的圆形或半圆形面馈入口, 馈入射频 /甚高频功率电源信号。 The solution of the present invention resides in a method, a signal feeding mode composed of an electrode plate assembly, a feeding assembly and a chamber, characterized in that an electrode array composed of an electrode plate is mounted in a movable roller chamber, and at least one set of electrode arrays a cathode plate and an anode plate, the feed inlet is located at the center of the back surface of the cathode plate of the electrode plate In the concave circular or semi-circular plane in the area, the surface of the circular or semi-circular surface is contacted and connected to the feeding component; the signal of the electrode plate is fed by the surface feeding method, and the one end of the component is fed into the semicircle The circular contact or the semi-circular surface feed inlet connected to the cathode plate contacts the RF/VHF power supply signal.

方案由多套馈入组件和电极板组件以面馈入方式将射频 /甚高频功率电源 信号馈入到电极板馈入口, 形成具有一定放电间距的电极阵列。  The solution feeds the RF/VHF power supply signal into the electrode plate feed inlet by a plurality of sets of feed components and electrode plate assemblies in a surface feeding manner to form an electrode array having a certain discharge pitch.

所说的馈入组件是一个呈 z字形的金属带, 腰部有耐高温陶瓷绝缘层, 金 属馈入芯是射频 /甚高频馈线构成导电体。  The feed assembly is a zigzag metal strip with a high temperature resistant ceramic insulation at the waist, and the metal feed core is an RF/VHF feed line forming an electrical conductor.

馈入组件的导电体另一端接射频 /甚高频功率电源信号在内的阴极输出口 和功率电源匹配器。  The other end of the conductor that feeds the component is connected to the cathode output port and the power supply matcher including the RF/VHF power supply signal.

本发明沉积盒所产生的积极有益效果, 区别于插槽式阴极板侧面馈入方 式,在沉积盒内能够获得更高均匀度和更大放电面积的稳定放电,接入电容小, 实际放电功率大, 电极板阵列之间射频干扰小。 也区别于单室沉积系统的阴极 板中心点式馈入, 接入电容小、 驻波和趋肤效应小, 集成阵列式多室沉积, 极大提高生产效率。 因此, 通过优化甚高频电源馈入形式、 电极板的结构, 解 决射频 /甚高频大面积放电均匀性问题, 也是晶化硅基薄膜高速高效制备技术 的前提。 本发明适用于任何功率、 27. 12MHz~200MHz区间任何法定频率的甚高 频电源的大面积均匀放电。这种结构能够适用于多片沉积系统, 大大提高产率 和降低了电池成本。 该发明突破常规电极设计技术的限制, 有效的消赊了甚高 频引发的驻波和趋肤效应, 达到适用于均匀放电的工业化应用水平。  The positive beneficial effect produced by the deposition box of the invention is different from the side feeding mode of the slot type cathode plate, and stable discharge with higher uniformity and larger discharge area can be obtained in the deposition box, the access capacitance is small, and the actual discharge power is obtained. Large, RF interference between the electrode plate arrays is small. It is also different from the central point feed of the cathode plate of the single-chamber deposition system. It has small access capacitance, small standing wave and skin effect, and integrated array type multi-chamber deposition, which greatly improves production efficiency. Therefore, by optimizing the VHF power supply feed form and the structure of the electrode plate, the RF/VHF large-area discharge uniformity problem is solved, which is also the premise of the high-speed and high-efficiency preparation technology of the crystallized silicon-based film. The present invention is applicable to large-area uniform discharge of very high frequency power supplies of any legal frequency of any power, 27. 12 MHz to 200 MHz. This structure can be applied to a multi-piece deposition system, greatly increasing productivity and reducing battery cost. The invention breaks through the limitations of the conventional electrode design technology, effectively eliminates the standing wave and skin effect caused by very high frequency, and achieves the industrial application level suitable for uniform discharge.

图. 1、 是本发明沉积盒剖视图。 Figure 1. is a cross-sectional view of the deposition cartridge of the present invention.

图 2、 是本发明沉积盒腔室示意图。 Figure 2 is a schematic view of a deposition chamber of the present invention.

图 3、 图 1中信号馈入组件 201结构示意图。 FIG. 3 is a schematic structural diagram of the signal feeding component 201 in FIG.

图 4、 是本发明图 1中阴极板 203结构示意图。 图 5、 是图 1中阴极板屏蔽罩 204结构示意图。 Figure 4 is a schematic view showing the structure of the cathode plate 203 of Figure 1 of the present invention. FIG. 5 is a schematic structural view of the cathode shield cover 204 of FIG.

图 6、 是本发明实施例 1结构示意图。 Figure 6 is a schematic view showing the structure of Embodiment 1 of the present invention.

图 7、 是本发明实施例 2结构示意图。 Figure 7 is a schematic view showing the structure of Embodiment 2 of the present invention.

图 8、 是本发明实施例 3结构示意图。 Figure 8 is a schematic view showing the structure of Embodiment 3 of the present invention.

图 1-8中, 沉积盒 02由信号馈入组件 201, 绝缘屏蔽层 202, 阴极板 203, 阴极板屏蔽罩 204, 基片 206, 绝缘条 207, 阳极板 208, 接地金属导槽 209, 下后门板 211,上后门板 212,气体腔 214,前门板 215,侧框架 216,车轮 218, 气体管道 220, 下底板 221等构成在真空室 01气相沉积沉积。 真空室 01内有 气体系统接入口 101, 电源系统接入口 102, 真空室活动门 103, 轨道 104, 真 空系统接入口 105。  In Figure 1-8, the deposition box 02 is fed by a signal feed assembly 201, an insulating shield 202, a cathode plate 203, a cathode plate shield 204, a substrate 206, an insulating strip 207, an anode plate 208, a grounded metal channel 209, and a lower The rear door panel 211, the upper rear door panel 212, the gas chamber 214, the front door panel 215, the side frame 216, the wheel 218, the gas duct 220, the lower bottom plate 221, and the like are formed by vapor deposition deposition in the vacuum chamber 01. The vacuum chamber 01 has a gas system inlet 101, a power system inlet 102, a vacuum chamber movable door 103, a track 104, and a vacuum system inlet 105.

本发明的沉积盒以面馈入方式实现了以上提出的发明任务。克服了现有多 点馈入对晶化硅基薄膜 VHF-PECVD沉积技术难以克服的诸多问题,如反应室电 极结构复杂; 电极易变形、 接触面积较小; 各馈入点之间路径距离要求完全对 称以及完全屏蔽等。 而本发明的面馈入沉积盒设计不存在这些问题, 能获取均 匀电场大面积腔室放电等问题, 尤其高效利用阳极板双工作面, 同时, 对于处 理或沉积多片玻璃的 CVD沉积盒体系, 采用有效甚高频面馈入模式, 取得了工 业化生产可操作工艺, 能够满足硅基薄膜太阳能电池大批量生产的需要。  The deposition cassette of the present invention achieves the inventive task set forth above in a face-fed manner. Overcoming many problems that the existing multi-point feeding is difficult to overcome by the VHF-PECVD deposition technology of the crystallized silicon-based film, such as the complex electrode structure of the reaction chamber; the electrode is easy to deform and the contact area is small; the path distance between each feeding point Requires complete symmetry and complete shielding. However, the surface feed deposition deposition box design of the present invention does not have these problems, and can obtain problems such as uniform electric field and large-area chamber discharge, and particularly efficient use of the double-working surface of the anode plate, and at the same time, a CVD deposition box system for processing or depositing multiple sheets of glass. With the effective VHF surface feed mode, the industrial production process can be achieved, which can meet the needs of mass production of silicon-based thin film solar cells.

本发明贡献还在于基本解决了甚高频电源驱动的高速沉积膜层的均匀性 和一致性问题。 沉积盒 02放置在真空室 01内, 沉积盒 02包括电极板、 信号 馈入组件、腔室和阴极板屏蔽罩 204。平行电极板的阴极板 203和阳极板 208, 馈入口 203-1是圆形,信号馈入组件 201呈阶梯状包括腰部和一端面 201-1是 半圆形与馈入口 203-1位于具有屏蔽罩 204的阴极板 203中间区域下凹的圆面 对应, 其腰部扁平便于安装, 信号馈入损耗少, 另一个头是 201-3连接射频 / 甚高频功率电源负极和功率电源匹配器 (未画出), 呈阶梯状, 其一端面呈半 圆形与电极板面接触连接的馈入口构成电极板组件在接地装置的沉积盒内,均 具有绝缘屏蔽保护装置 (未画出)。 The present invention also contributes to substantially solving the problem of uniformity and uniformity of a high-speed deposited film layer driven by a very high frequency power source. The deposition cartridge 02 is placed in a vacuum chamber 01, which includes an electrode plate, a signal feed assembly, a chamber, and a cathode plate shield 204. The cathode plate 203 and the anode plate 208 of the parallel electrode plate, the feed inlet 203-1 is circular, the signal feeding assembly 201 is stepped including a waist portion and an end surface 201-1 is semicircular with the feed inlet 203-1 located at the shield The concave portion of the cathode plate 203 of the cover 204 corresponds to a concave circular surface, the waist is flat and easy to install, and the signal feeding loss is small, and the other head is 201-3 connected to the RF / The VHF power supply negative pole and the power supply matcher (not shown) are stepped, and a feed inlet having a semicircular end surface in contact with the electrode plate is formed in the deposition box of the grounding device. With insulation shielding protection (not shown).

具体实施方式 detailed description

实施例 1 : Example 1

电极板为立式, 阴极板馈入口为圆形, 信号馈入组件腰部扁平, 馈入面为 半圆形。  The electrode plate is vertical, the cathode plate feed inlet is circular, the signal feeding assembly is flat at the waist, and the feed surface is semi-circular.

结合图 1-6说明本实施例工作原理。 沉积盒 02中, 两个阴极板 203共用 一个阳极板 208。 气相沉积系统主要由气相沉积室、 气体系统、 电源系统、 真 空系统、 加热系统、 控制系统等组成, 气体系统 ^主要是提供气相沉积的各种所 需气体和气体管路, 电源系统主要是提供沉积时所需要的电离成等离子体状态 的高频或甚高频电源, 真空系统主要是提供沉积时抽取真空状态用设备及管 路, 加热系统主要是给气相沉积室加热, 控制系统主要是对沉积过程及参数进 行控制, 而气相沉积室是实现将气体沉积在基片 206上并完成镀膜的装置。气 体沉积室主要由真空室 01、带滚动轮 218的沉积盒 02接地。真空室 01用来实 现真空状态, 沉积盒 02用来实现等离子放电, 将 P- I-N膜层沉积在基片 206 上。 沉积盒 02包括阴极板 203、 阴极板屏蔽罩 204、 绝缘条 207、 阳极板 208、 信号馈入组件 201、 屏蔽层 202、 下底板 221、气体腔 214、接地金属导槽 209、 前门板 215、 上后门板 212、 下后门板 211、 侧框架 216、 车轮 218、 组成。 侧 框架 216由不锈钢方通焊接成四边形框架, 在框架上固定有矩形挂耳 216 - 4, 将气体腔 214与下底板 221连接在侧框架 216上下两边成一整体,在气体腔 214 与下底板 221相对面上相对应位置上连接有接地金属导槽 209, 用来固定阳极 板 208和阴极板 203、 阴极板屏蔽罩 204, 阳极板 208直接插入金属导槽 209 内并与槽接触, 使阴极板屏蔽罩 204与金属导槽 209接触, 阴极板 203与阴极 板屏蔽罩 204之间加装绝缘条 207使其不能接触。阳极板 208和阴极板屏蔽罩 204通过与金属导槽 209接触再与下底板 221接触实现接地。 在阴极板 203背 部中心区域有下凹的圆形馈入口 203-1, 信号馈入组件 201腰部和头部构成外 形呈 Z 字形状, 其头部半圆形端面与阴极板背部中心区域下凹的圆形馈入口 203-1 面接触连接馈入射频 /甚高频电源信号至阴极板。 在阴极板屏蔽罩 204 中间相应馈入口 203-1位置开有孔 204- 1,使得电源馈入组件 201从阴极板 203 引出时不与阴极板屏蔽罩 204接触, 电源馈入组件 201另一端通过孔 201- 3与 电源接头 205相连接,腰部有耐高温陶瓷绝缘层 202,以防与阴极板屏蔽罩 204 接触, 信号馈入组件 201为导电性良好的铜, 前门板 215在将基片 206装入沉 积盒 02内后, 将其上边的挂钩 215-2挂在侧框架 216上的挂耳 216-1上, 下 边插入 Z形插片 216-2内, 使得沉积盒 02内部形成一个较为密闭的空间。 将 沉积盒 02沿轨道 104推入真空室 01内, 使沉积盒 02上固定的气体管道 220 上入口与真空室 01上的气体系统接入口 101伸入真空室 01内部的管口对接, 关好真空室 01上的真空室活动门 103,通过真空系统先抽真空到理想状态,再 进行通气沉积工艺, 完成气相沉积镀膜。 The working principle of this embodiment will be described with reference to Figs. In the deposition cartridge 02, the two cathode plates 203 share one anode plate 208. The vapor deposition system is mainly composed of a vapor deposition chamber, a gas system, a power system, a vacuum system, a heating system, a control system, etc., and the gas system is mainly provided with various required gas and gas pipelines for vapor deposition, and the power supply system mainly provides The high-frequency or high-frequency power source that needs to be ionized into a plasma state during deposition. The vacuum system mainly provides equipment and pipelines for vacuum extraction during deposition. The heating system mainly heats the vapor deposition chamber, and the control system is mainly The deposition process and parameters are controlled, and the vapor deposition chamber is a device that deposits a gas on the substrate 206 and completes the coating. The gas deposition chamber is mainly grounded by a vacuum chamber 01 and a deposition box 02 with a scroll wheel 218. The vacuum chamber 01 is used to achieve a vacuum state, and the deposition cartridge 02 is used to effect plasma discharge, and a P-IN film layer is deposited on the substrate 206. The deposition box 02 includes a cathode plate 203, a cathode plate shield 204, an insulating strip 207, an anode plate 208, a signal feeding assembly 201, a shielding layer 202, a bottom plate 221, a gas chamber 214, a grounding metal channel 209, a front door plate 215, The upper rear door panel 212, the lower rear door panel 211, the side frame 216, and the wheel 218 are formed. The side frame 216 is welded into a quadrangular frame by a stainless steel square. The rectangular lugs 216 - 4 are fixed on the frame, and the gas chamber 214 and the lower bottom plate 221 are connected to the upper and lower sides of the side frame 216 to form a whole, in the gas chamber 214 and the lower bottom plate 221 A grounding metal channel 209 is connected to the opposite surface for fixing the anode plate 208 and the cathode plate 203, and the cathode plate shield 204. The anode plate 208 is directly inserted into the metal channel 209. The cathode plate shield 204 is in contact with the metal guide groove 209, and the insulating strip 207 is attached between the cathode plate 203 and the cathode plate shield 204 so as to be in contact with the groove. The anode plate 208 and the cathode plate shield 204 are grounded by contact with the metal guide groove 209 and then with the lower base plate 221. In the central portion of the back of the cathode plate 203, there is a concave circular feed inlet 203-1. The waist and the head of the signal feeding assembly 201 are formed in a zigzag shape, and the semicircular end face of the head and the central portion of the back of the cathode plate are concave. The circular feed inlet 203-1 is in contact with the surface to feed the RF/VHF power signal to the cathode plate. A hole 204-1 is formed in the middle of the corresponding feed inlet 203-1 in the middle of the cathode plate shield 204 so that the power feeding component 201 does not come into contact with the cathode plate shield 204 when it is taken out from the cathode plate 203, and the other end of the power feeding component 201 passes. The hole 201-3 is connected to the power connector 205, and has a high temperature resistant ceramic insulating layer 202 at the waist to prevent contact with the cathode plate shield 204. The signal feeding component 201 is copper with good conductivity, and the front door plate 215 is the substrate 206. After being loaded into the deposition box 02, the upper hook 215-2 is hung on the mounting lug 216-1 on the side frame 216, and the lower side is inserted into the Z-shaped tab 216-2, so that a relatively closed inside the deposition box 02 is formed. Space. The deposition box 02 is pushed into the vacuum chamber 01 along the rail 104, so that the inlet on the gas pipe 220 fixed on the deposition box 02 and the gas system inlet 101 on the vacuum chamber 01 are docked into the nozzle inside the vacuum chamber 01, and closed. The vacuum chamber movable door 103 on the vacuum chamber 01 is evacuated to a desired state by a vacuum system, and then subjected to a vapor deposition process to complete vapor deposition coating.

实施例 2: Example 2:

电极板为立式, 阴极板馈入口为圆形, 信号馈入组件腰部扁平, 馈入面为 半圆形, 阴极板与屏蔽罩绝缘, 阴极板屏蔽罩上开有通孔。  The electrode plate is vertical, the cathode plate feeding inlet is circular, the signal feeding component is flat at the waist, the feeding surface is semicircular, the cathode plate is insulated from the shielding cover, and the cathode plate shielding cover is provided with a through hole.

图 7使用沉积盒同实施例 1。 可同时镀膜 8片基片 206。 2个阴极板 203 共用 1个阳极板 208, 由 2个阳极板 208与 4个阴极板 203组成 4对电极, 可 同时镀膜 8片基片 206。 具体步骤如下:  Figure 7 uses the deposition cartridge as in Example 1. Eight substrates 206 can be coated simultaneously. The two cathode plates 203 share one anode plate 208, and two anode plates 208 and four cathode plates 203 constitute four pairs of electrodes, and eight substrates 206 can be simultaneously coated. Specific steps are as follows:

a)将 8块带有 600nm厚透明导电膜的玻璃基片 206( 1640隱 X 707mmX 3腿) 放置于沉积盒 02中的基片位置, 膜面朝外, 玻璃面朝电极板。 a) 8 glass substrates with a 600 nm thick transparent conductive film (1640 hidden X 707mmX 3 legs) Placed in the substrate in the deposition box 02 with the film facing outward and the glass facing the electrode plate.

b)打开真空室活动门 103, 将沉积盒 02沿轨道 104推入真空室 01内, 关 好真空室 01的真空室活动门 103。  b) Opening the vacuum chamber movable door 103, pushing the deposition box 02 into the vacuum chamber 01 along the rail 104, and closing the vacuum chamber movable door 103 of the vacuum chamber 01.

c ) 真空抽到 5. 0 X l(T4Pa之后, 通入氩气, 当腔内压力达到 60Pa时, 打 开 40. 68MHz甚高频电源, 以 400W功率放电清洗腔室 2分钟, 关闭电源。 c) Vacuum pumped to 5. 0 X l (T 4 Pa, argon gas is introduced, when the pressure in the chamber reaches 60Pa, open the 40.68MHz VHF power supply, clean the chamber with 400W power for 2 minutes, turn off the power .

d) 之后抽高真空至 5. 0 X l(TPa左右, 用氩气清洗两次。  d) After pumping a high vacuum to 5. 0 X l (about TPa, wash twice with argon.

e ) 按照 5slpm通入混和气 (硅烷加氢气), 当腔内气压达到 60Pa, 打开 40. 68MHz甚高频电源, 以 400W功率放电, 沉积微晶硅本征层 40分钟。  e) According to 5slpm, enter the mixed gas (silane plus hydrogen). When the pressure in the chamber reaches 60Pa, turn on the 40.68MHz VHF power supply, discharge at 400W, and deposit the microcrystalline silicon intrinsic layer for 40 minutes.

f) 关闭电源, 抽高真空。  f) Turn off the power and draw a high vacuum.

g) 充入氮气至大气压, 打开真空室活动门 103, 推出沉积盒 02, 在室温 中冷却 TC0玻璃。  g) Fill with nitrogen to atmospheric pressure, open the vacuum chamber movable door 103, push out the deposition box 02, and cool the TC0 glass at room temperature.

采用这种馈入形式,可以实现 40. 68MHz甚高频电源的均匀电场,在 1640醒 X 707mm (长 X宽) 的 TC0玻璃上能够沉积膜厚不均匀度为 5%左右的微晶硅薄 膜, 微晶度可调。  With this feeding form, a uniform electric field of a 40.68 MHz VHF power supply can be realized, and a microcrystalline silicon film having a film thickness unevenness of about 5% can be deposited on a TC0 glass of 1640 awake X 707 mm (length X width). , the crystallinity is adjustable.

实施例 3: Example 3:

电极板为立式, 阴极板馈入口为圆形, 信号馈入组件腰部扁平, 馈入面为 半圆形, 阴极板与屏蔽罩绝缘, 阴极板屏蔽罩上开有通孔。  The electrode plate is vertical, the cathode plate feeding inlet is circular, the signal feeding component is flat at the waist, the feeding surface is semicircular, the cathode plate is insulated from the shielding cover, and the cathode plate shielding cover is provided with a through hole.

图 8使用沉积盒同实施例 1。 可同时镀膜 24片基片 206。 2个阴极板 203 共用 1个阳极板 208, 由 6个阳极板 208与 12个阴极板 203组成 12对电极, 可同时镀膜 24片基片 206。 具体步骤如下:  Figure 8 uses the deposition box as in Example 1. 24 substrates 206 can be coated simultaneously. The two cathode plates 203 share one anode plate 208, and six anode plates 208 and twelve cathode plates 203 constitute twelve pairs of electrodes, and 24 substrates 206 can be simultaneously coated. Specific steps are as follows:

a)将 24块带有 600nm厚透明导电膜的玻璃基片 206( 1640mm X 707mm X 3mm) 放置于沉积盒 02中的基片位置, 膜面朝外, 玻璃面朝电极板。  a) Four glass substrates 206 (1640 mm X 707 mm X 3 mm) with a 600 nm thick transparent conductive film were placed in the substrate position in the deposition cartridge 02 with the film facing outward and the glass facing the electrode plate.

b)打开真空室活动门 103, 将沉积盒 02沿轨道 104推入真空室 01内, 关 好真空室 01的真空室活动门 103。 b) opening the vacuum chamber movable door 103, pushing the deposition box 02 along the rail 104 into the vacuum chamber 01, closing The vacuum chamber movable door 103 of the vacuum chamber 01 is good.

c ) 真空抽到 5. 0 X 10— 4Pa之后, 通入氩气, 当腔内压力达到 60Pa时, 打 开 40. 68MHz甚高频电源, 以 400W功率放电清洗腔室 2分钟, 关闭电源。 c) After the vacuum is pumped to 5. 0 X 10— 4 Pa, argon gas is introduced. When the pressure in the chamber reaches 60 Pa, the 40.68 MHz VHF power supply is turned on, and the chamber is cleaned by 400 W power for 2 minutes to turn off the power.

d) 之后抽高真空至 5. 0 X 10—4Pa左右, 用氩气清洗两次。 After high pumping d) to a vacuum of about 5. 0 X 10- 4 Pa, washed twice with argon.

e ) 按照 5slpm通入混和气 (硅垸加氢气), 当腔内气压达到 60Pa, 打开 40. 68MHz甚高频电源, 以 400W功率放电, 沉积微晶硅本征层 40分钟。  e) According to 5slpm, enter the mixed gas (silicon germanium and hydrogen). When the gas pressure in the chamber reaches 60Pa, turn on the 40.68MHz VHF power supply, discharge at 400W, and deposit the microcrystalline silicon intrinsic layer for 40 minutes.

f) 关闭电源, 抽高真空。  f) Turn off the power and draw a high vacuum.

g) 充入氮气至大气压, 打开真空室活动门 103, 推出沉积盒 02, 在室温 中冷却 TC0玻璃。  g) Fill with nitrogen to atmospheric pressure, open the vacuum chamber movable door 103, push out the deposition box 02, and cool the TC0 glass at room temperature.

采用这种馈入形式,可以实现 40. 68MHz甚高频电源的均匀电场,在 1640mm X 707mm (长 X宽) 的 TC0玻璃上能够沉积膜厚不均匀度为 4. 8%左右的微晶硅 薄膜。  8%左右的微晶硅。 With this type of feed, a uniform electric field of 40. 68MHz VHF power supply can be achieved, on the TC0 glass of 1640mm X 707mm (length X width) can deposit microcrystalline silicon with a film thickness unevenness of about 4.0% film.

以上结合附图对本发明的实施例作了详细说明,但是本发明并不限于上述 实施例, 尤其是馈入组件及阴极板的形状, 在本领域普通技术人员所具备的知 识范围内, 还可以在不脱离本发明宗旨的前提下作出各种变化。  The embodiments of the present invention have been described in detail above with reference to the accompanying drawings, but the present invention is not limited to the above embodiments, and particularly, the shape of the feed assembly and the cathode plate can be within the knowledge of those skilled in the art. Various changes are made without departing from the spirit of the invention.

Claims

1、一种硅基薄膜太阳能电池的沉积盒, 包括电极板组件、信号馈入组件禾 0空 室, 其特征在于还包括阴极板屏蔽罩, 所说的腔室是一个带滚轮的活动式腔室, 该腔室内安装由电极板构成的电极阵列, 馈入口位于电极板组件的阴极板背面中 心区域内下凹的圆形或半圆形面内, 在其圆形或半圆形的馈入口内面接触连接的 信号馈入组件接射频 /甚高频功率电源信号的负极, A deposition box for a silicon-based thin film solar cell, comprising an electrode plate assembly, a signal feed assembly, and a vacuum chamber, further comprising a cathode plate shield, wherein the chamber is a movable chamber with a roller a chamber in which an electrode array composed of electrode plates is mounted, the feed inlet being located in a concave circular or semi-circular surface in a central region of the back surface of the cathode plate of the electrode plate assembly, in a circular or semi-circular feed inlet thereof The signal feeding component of the inner surface contact connection is connected to the negative pole of the RF/VHF power supply signal. 所说的信号馈入组件其端面是半圆形或圆形;  The signal feeding component has a semicircular or circular end face; 所说的阴极板的屏蔽罩上幵有通孔,  The shielding plate of the cathode plate has a through hole. 阴极板与屏蔽罩之间绝缘;  Insulation between the cathode plate and the shield; 所说的电极阵列至少一组阴极板和一块阳极板。  The electrode array has at least one set of cathode plates and one anode plate. 2、根据权利要求 1所述的一种硅基薄膜太阳能电池的沉积盒,其特征在于所 说的一组阴极板和一块阳极板, 由阳极板的两个面分别朝向对称放置的阴极板的 有效放电工作面。  2. A deposition box for a silicon-based thin film solar cell according to claim 1, wherein said set of cathode plates and an anode plate are respectively oriented from the two faces of the anode plate toward the symmetrically placed cathode plates. Effective discharge of the working surface. 3、 根据权利要求 1 所述的一种硅基薄膜太阳能电池的沉积盒, 其特征在于 所说的信号馈入组件包括铜质馈入芯体和绝缘层和外表屏蔽层。  3. A deposition cassette for a silicon-based thin film solar cell according to claim 1, wherein said signal feed assembly comprises a copper feed core and an insulating layer and an outer shield. 4、 根据权利要求 1 所述的一种硅基薄膜太阳能电池的沉积盒, 其特征在于 所说的阴极板是单面放电, 阴极板的屏蔽罩包括陶瓷绝缘层、 屏蔽层, 屏蔽罩 覆盖整个阴极板背面和侧面。  4. A deposition box for a silicon-based thin film solar cell according to claim 1, wherein said cathode plate is a single-sided discharge, and the shield of the cathode plate comprises a ceramic insulating layer and a shielding layer, and the shielding cover covers the entire The back and sides of the cathode plate. 5、 根据权利要求 1-4中任意一项所述的一种硅基薄膜太阳能电池的沉积盒, 其特征在于所说的电极是由多套带屏蔽罩的阴极板与多套接地的阳极板, 构成 一定间距放电的电极阵列。  The deposition box of a silicon-based thin film solar cell according to any one of claims 1 to 4, wherein the electrode is composed of a plurality of cathode plates with a shield and a plurality of grounded anode plates. , an electrode array that constitutes a certain interval of discharge. 6、 根据权利要求 5所述的一种硅基薄膜太阳能电池的沉积盒, 其特征在于 所说的阴极板屏蔽罩, 还包括射频 /甚高频电源功率信号馈入至阴极板背面的中 心位置及四周侧面的屏蔽。  6. A deposition box for a silicon-based thin film solar cell according to claim 5, wherein said cathode plate shield further comprises a RF/VHF power signal fed to a center of the back of the cathode plate. And shielding around the sides. 7、 根据权利要求 5所述的一种硅基薄膜太阳能电池的沉积盒, 其特征在于 所说的信号馈入组件由腰部和头部构成外形呈 Z字形状, 腰部有陶瓷绝缘层,:. 金属馈入芯是射频 /甚高频馈线构成导电体。 7. A deposition cassette for a silicon-based thin film solar cell according to claim 5, wherein The signal feeding component is formed in a zigzag shape by a waist and a head, and has a ceramic insulating layer at the waist. The metal feeding core is an RF/VHF feeder to form an electric conductor. 8、 根据权利要求 1 所述的一种硅基薄膜太阳能电池的沉积盒, 其特征在手 所说的信号馈入组件的另一端接射频 /甚高频功率电源信号的阴极输出口和功 率电源匹配器。  8. A deposition box for a silicon-based thin film solar cell according to claim 1, characterized in that a cathode output port and a power source of the RF/VHF power supply signal are connected to the other end of the signal feeding component of the hand. Matcher. 9、一种硅基薄膜太阳能电池的沉积盒的信号馈入方法, 由电极板组件、馈入 组件在腔室的信号馈入模式, 其特征在于带有活动式滚轮的腔室内安装由电极板 组件构成的电极阵列, 电极阵列至少一组阴极板和一块阳极板;  9. A signal feeding method for a deposition box of a silicon-based thin film solar cell, wherein a signal feeding mode of the electrode plate assembly and the feeding assembly in the chamber is characterized in that the chamber with the movable roller is mounted by the electrode plate An electrode array composed of components, an electrode array of at least one set of cathode plates and an anode plate; 馈入口位于电极板的阴极板背面中心区域内的下凹的圆形或半圆形面内, 在 其口内面接触连接馈入组件;  The feed inlet is located in a concave circular or semi-circular surface in the central region of the back surface of the cathode plate of the electrode plate, and is in contact with the feed-in assembly at its inner surface; 信号馈入模式是面馈入;  The signal feed mode is a face feed; 馈入组件的一端半圆形或圆形面接触连接阴极板的圆形或半圆形面馈入口; 馈入射频 /甚高频功率电源信号;  a semicircular or circular surface of the feed assembly contacts the circular or semi-circular surface feed inlet of the cathode plate; feeding RF/VHF power supply signals; 电极板的阴极板屏蔽罩和阳极板接地。  The cathode plate shield and the anode plate of the electrode plate are grounded. 10、 根据权利要求 9所述的一种硅基薄膜太阳能电池的沉积盒的信号馈入方 法, 其特征在于所说电极由多套馈入组件和电极板组件以面馈入方式将射频 /甚 高频功率电源信号馈入到电极板馈入口, 形成具有一定放电间距的电极阵列。  10. A signal feeding method for a deposition box of a silicon-based thin film solar cell according to claim 9, wherein said electrode is fed by a plurality of sets of feeding components and electrode plate assemblies in a plane feeding manner. The high frequency power supply signal is fed to the electrode plate feed inlet to form an electrode array having a certain discharge pitch. 11、 根据权利要求 9所述的一种硅基薄膜太阳能电池的沉积盒的信号馈入方 法, 其特征在于所说的 Z字形馈入组件腰部有陶瓷绝缘层, 金属馈入芯是射频 / 甚高频馈线构成导电体。  11. A signal feeding method for a deposition box of a silicon-based thin film solar cell according to claim 9, wherein said zigzag feeding member has a ceramic insulating layer at the waist, and the metal feeding core is RF/very The high frequency feed line constitutes an electrical conductor. 12、 根据权利要求 11所述的一种硅基薄膜太阳能电池的沉积盒的信号馈入 方法, 其特征在于所说的馈入组件的导电体另一端接射频 /甚高频功率电源信号 的阴极输出口和功率电源匹配器。  12 . The signal feeding method of a deposition box of a silicon-based thin film solar cell according to claim 11 , wherein the other end of the electrical conductor of the feeding component is connected to a cathode of an RF/VHF power supply signal. Output port and power supply matcher.
PCT/CN2010/001658 2010-06-11 2010-10-21 Deposition box for silicon-based thin film solar cell Ceased WO2011153674A1 (en)

Priority Applications (4)

Application Number Priority Date Filing Date Title
US13/389,800 US8297226B2 (en) 2010-06-11 2010-10-21 Deposition box for silicon-based thin film solar cell
JP2012534523A JP5453543B2 (en) 2010-06-11 2010-10-21 Deposition box for silicon-based thin film solar cells
EP10852667.4A EP2468922B1 (en) 2010-06-11 2010-10-21 Deposition box for silicon-based thin film solar cell
KR1020127020788A KR101337026B1 (en) 2010-06-11 2010-10-21 Deposition box for silicon-based thin film solar cell

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
CN201010198688.0 2010-06-11
CN2010101986880A CN101880868B (en) 2010-06-11 2010-06-11 Deposition box for silicon-based film solar cells

Publications (1)

Publication Number Publication Date
WO2011153674A1 true WO2011153674A1 (en) 2011-12-15

Family

ID=43053004

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/CN2010/001658 Ceased WO2011153674A1 (en) 2010-06-11 2010-10-21 Deposition box for silicon-based thin film solar cell

Country Status (6)

Country Link
US (1) US8297226B2 (en)
EP (1) EP2468922B1 (en)
JP (1) JP5453543B2 (en)
KR (1) KR101337026B1 (en)
CN (1) CN101880868B (en)
WO (1) WO2011153674A1 (en)

Families Citing this family (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101882647B (en) * 2010-06-11 2012-01-25 深圳市创益科技发展有限公司 Movable holder for silicon-based film solar cells
CN101880868B (en) * 2010-06-11 2012-03-07 深圳市创益科技发展有限公司 Deposition box for silicon-based film solar cells
CN101859801B (en) * 2010-06-11 2013-02-20 深圳市创益科技发展有限公司 Discharge electrode plate array for thin film solar cell settling
CN101882646B (en) * 2010-06-11 2012-01-25 深圳市创益科技发展有限公司 Deposition clamp of film solar cell
CN101857953B (en) * 2010-06-11 2012-04-18 深圳市创益科技发展有限公司 Surface feed-in electrode for thin film solar cell deposition
CN102888596B (en) * 2011-07-22 2015-09-02 北京北方微电子基地设备工艺研究中心有限责任公司 Chamber device and there is the apparatus for processing plasma of this chamber device
HUP1100436A2 (en) * 2011-08-15 2013-02-28 Ecosolifer Ag Gas flow system for using in reaction chamber
CN102277562B (en) * 2011-08-15 2013-05-08 深圳市创益科技发展有限公司 Multi-stage plasma enhanced chemical vapor deposition (PECVD) equipment for thin-film solar batteries
CN103167716A (en) * 2011-12-19 2013-06-19 亚树科技股份有限公司 vertical plasma generator
US20130286567A1 (en) * 2012-01-10 2013-10-31 Hzo, Inc. Apparatuses, systems and methods for protecting electronic device assemblies
CN103458599B (en) * 2013-09-24 2017-02-01 南方科技大学 Low-temperature plasma processing device and method
CN104593749B (en) * 2015-02-11 2017-01-18 南开大学 Method for shielding interference in vacuum cavity of PECVD system during glow discharge
CN105206924A (en) * 2015-09-24 2015-12-30 广东博纬通信科技有限公司 Super broadband dual polarized antenna unit and multifrequency array antenna thereof
CN110029328B (en) * 2019-05-22 2024-06-18 上海稷以科技有限公司 Box-type electrode for improving deposition uniformity of front and back planes
CN110419562B (en) * 2019-09-02 2022-08-16 四川长虹电器股份有限公司 Radio frequency unfreezing device capable of changing area of access parallel plate
US12442083B2 (en) * 2019-12-04 2025-10-14 Jiangsu Favored Nanotechnology Co., LTD Electrode support, supporting structure, support, film coating apparatus, and application
WO2021142098A1 (en) * 2020-01-09 2021-07-15 Nordson Corporation Workpiece support system for plasma treatment and method of using the same
CN119446874B (en) * 2023-08-01 2025-11-11 北京北方华创微电子装备有限公司 Semiconductor process chamber and semiconductor process equipment

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20030150562A1 (en) 2000-09-12 2003-08-14 Quon Bill H. Apparatus and method to control the uniformity of plasma by reducing radial loss
CN101245450A (en) * 2007-02-14 2008-08-20 北京行者多媒体科技有限公司 Method for single-chamber large-batch film coating of movable plasma box
WO2009050958A1 (en) * 2007-10-17 2009-04-23 Masayoshi Murata High frequency plasma cvd apparatus, high frequency plasma cvd method and semiconductor thin film manufacturing method
CN101857953A (en) * 2010-06-11 2010-10-13 深圳市创益科技发展有限公司 Surface-fed electrodes for thin film solar cell deposition
CN101859801A (en) * 2010-06-11 2010-10-13 深圳市创益科技发展有限公司 Array of discharge electrode plates for deposition of thin film solar cells

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4576830A (en) * 1984-11-05 1986-03-18 Chronar Corp. Deposition of materials
JP2616760B2 (en) * 1985-04-08 1997-06-04 株式会社 半導体エネルギー研究所 Plasma gas phase reactor
DE4428136A1 (en) * 1994-08-09 1996-02-15 Leybold Ag In-line vacuum coating plant,
JP2004128159A (en) 2002-10-01 2004-04-22 Mitsubishi Heavy Ind Ltd Device and method for producing high frequency plasma
JP2004288984A (en) 2003-03-24 2004-10-14 Sharp Corp Film forming apparatus and film forming method
JP4623422B2 (en) * 2005-03-17 2011-02-02 富士電機システムズ株式会社 Plasma processing equipment
JP4788504B2 (en) * 2006-07-12 2011-10-05 富士電機株式会社 Power supply structure for plasma processing equipment
JP5119830B2 (en) * 2007-09-26 2013-01-16 富士電機株式会社 Plasma device
CN100567567C (en) * 2007-11-19 2009-12-09 南开大学 Large-area VHF-PECVD reaction chamber back-fed parallel-plate power electrode capable of obtaining uniform electric field
CN101880868B (en) * 2010-06-11 2012-03-07 深圳市创益科技发展有限公司 Deposition box for silicon-based film solar cells
CN201756586U (en) * 2010-06-11 2011-03-09 深圳市创益科技发展有限公司 Solar battery deposition box
CN101882647B (en) * 2010-06-11 2012-01-25 深圳市创益科技发展有限公司 Movable holder for silicon-based film solar cells
CN101882646B (en) * 2010-06-11 2012-01-25 深圳市创益科技发展有限公司 Deposition clamp of film solar cell

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20030150562A1 (en) 2000-09-12 2003-08-14 Quon Bill H. Apparatus and method to control the uniformity of plasma by reducing radial loss
CN101245450A (en) * 2007-02-14 2008-08-20 北京行者多媒体科技有限公司 Method for single-chamber large-batch film coating of movable plasma box
WO2009050958A1 (en) * 2007-10-17 2009-04-23 Masayoshi Murata High frequency plasma cvd apparatus, high frequency plasma cvd method and semiconductor thin film manufacturing method
CN101857953A (en) * 2010-06-11 2010-10-13 深圳市创益科技发展有限公司 Surface-fed electrodes for thin film solar cell deposition
CN101859801A (en) * 2010-06-11 2010-10-13 深圳市创益科技发展有限公司 Array of discharge electrode plates for deposition of thin film solar cells

Non-Patent Citations (2)

* Cited by examiner, † Cited by third party
Title
See also references of EP2468922A4
XUE, JUNMING ET AL.: "Large Area Si-Based Thin Films Deposited By VHF-PECVD", ACTA ENERGIAE SOLARIS SINICA, vol. 28, no. 11, November 2007 (2007-11-01), pages 1227 - 1232, XP008154282 *

Also Published As

Publication number Publication date
KR20120107008A (en) 2012-09-27
EP2468922A1 (en) 2012-06-27
US8297226B2 (en) 2012-10-30
JP2013508545A (en) 2013-03-07
JP5453543B2 (en) 2014-03-26
CN101880868A (en) 2010-11-10
EP2468922B1 (en) 2014-12-10
US20120142138A1 (en) 2012-06-07
CN101880868B (en) 2012-03-07
EP2468922A4 (en) 2013-05-29
KR101337026B1 (en) 2013-12-05

Similar Documents

Publication Publication Date Title
WO2011153674A1 (en) Deposition box for silicon-based thin film solar cell
EP2469611B1 (en) Movable jig for silicon-based thin film solar cell
CN101882646B (en) Deposition clamp of film solar cell
CN101857953B (en) Surface feed-in electrode for thin film solar cell deposition
US8525417B2 (en) Discharge electrode array for thin-film solar cell deposition
CN201756586U (en) Solar battery deposition box
CN201756584U (en) Discharge electrode member for deposition of solar battery
CN201756585U (en) Solar battery deposition fixture
CN201780981U (en) Movable fixture for solar battery

Legal Events

Date Code Title Description
121 Ep: the epo has been informed by wipo that ep was designated in this application

Ref document number: 10852667

Country of ref document: EP

Kind code of ref document: A1

WWE Wipo information: entry into national phase

Ref document number: 13389800

Country of ref document: US

WWE Wipo information: entry into national phase

Ref document number: 2010852667

Country of ref document: EP

WWE Wipo information: entry into national phase

Ref document number: 2012534523

Country of ref document: JP

ENP Entry into the national phase

Ref document number: 20127020788

Country of ref document: KR

Kind code of ref document: A

NENP Non-entry into the national phase

Ref country code: DE