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WO2011147760A1 - Identification d'objets - Google Patents

Identification d'objets Download PDF

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Publication number
WO2011147760A1
WO2011147760A1 PCT/EP2011/058318 EP2011058318W WO2011147760A1 WO 2011147760 A1 WO2011147760 A1 WO 2011147760A1 EP 2011058318 W EP2011058318 W EP 2011058318W WO 2011147760 A1 WO2011147760 A1 WO 2011147760A1
Authority
WO
WIPO (PCT)
Prior art keywords
signal
scanning
time
μιη
radiation
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
PCT/EP2011/058318
Other languages
German (de)
English (en)
Inventor
Markus Gerigk
Andreas BÄCKER
Thomas Birsztejn
Ralf IMHÄUSER
Christian Roth
Walter Speth
Simon Vougioukas
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Bayer AG
Original Assignee
Bayer Technology Services GmbH
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Bayer Technology Services GmbH filed Critical Bayer Technology Services GmbH
Priority to EP11720545.0A priority Critical patent/EP2577622A1/fr
Publication of WO2011147760A1 publication Critical patent/WO2011147760A1/fr
Anticipated expiration legal-status Critical
Ceased legal-status Critical Current

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Classifications

    • G—PHYSICS
    • G07—CHECKING-DEVICES
    • G07D—HANDLING OF COINS OR VALUABLE PAPERS, e.g. TESTING, SORTING BY DENOMINATIONS, COUNTING, DISPENSING, CHANGING OR DEPOSITING
    • G07D7/00—Testing specially adapted to determine the identity or genuineness of valuable papers or for segregating those which are unacceptable, e.g. banknotes that are alien to a currency
    • G07D7/20—Testing patterns thereon
    • G07D7/2008—Testing patterns thereon using pre-processing, e.g. de-blurring, averaging, normalisation or rotation
    • G—PHYSICS
    • G07—CHECKING-DEVICES
    • G07D—HANDLING OF COINS OR VALUABLE PAPERS, e.g. TESTING, SORTING BY DENOMINATIONS, COUNTING, DISPENSING, CHANGING OR DEPOSITING
    • G07D7/00—Testing specially adapted to determine the identity or genuineness of valuable papers or for segregating those which are unacceptable, e.g. banknotes that are alien to a currency
    • G07D7/20—Testing patterns thereon
    • G07D7/202—Testing patterns thereon using pattern matching
    • G07D7/2033—Matching unique patterns, i.e. patterns that are unique to each individual paper

Definitions

  • the invention relates to the technical field of secure identification and authentication of objects based on characteristic features of the surface of the object.
  • the subject of the present invention is a method for producing an identification feature for an article.
  • BC d'Agraives et al. disclose a method for identifying an article by its surface structure (Surface Topography, A remearkable method for the identification of seals or structures in general, 3rd Annual Symposium of Esarda of Düsseldorf, 1981, Poster 8.13, Proceedings pages 403-409).
  • the GB2097979A disclosure describes a method of identifying objects based on surface features.
  • the surface features are detected in a selected surface area of the object to be identified.
  • "meaningful, random singularities of the profile are counted in the form of bumps and measured their heights and distances.
  • Disclosure WO2000 / 65541A discloses a method and apparatus for authenticating an item based on intrinsic physical features, particularly topographical information.
  • the disclosure WO2003 / 087991A2 discloses methods and an apparatus for authenticating objects based on the three-dimensional surface structure.
  • WO05 / 088533A1 a method is described in which a surface area of an object is scanned with coherent radiation and by means of photodetectors the differently scattered rays at different locations of the surface at different angles are detected.
  • the detected scattered radiation is characteristic of a variety of different materials and is very difficult to mimic, as it is due to random manufacturing.
  • paper-like objects have a manufacturing fiber structure that is unique to each manufactured object.
  • the scattering data on the individual objects can be described as a characteristic fingerprint of the Be stored in a database to identify the item at a later date and / or to be able to authenticate. For this purpose, the object is measured again and the scatter data is compared with the stored fingerprint.
  • optical scanning of a surface is performed by moving a focused laser beam across the surface (or moving the surface relative to the focused laser beam) and, during movement at a constant measurement frequency, intensity values of the detected scattered radiation at one or more photodetectors Function of time to be detected.
  • An intensity-time signal obtained in this way is impractical as an identification feature since a different signal would result when scanning at a different speed. A direct comparison of recorded at different speeds signals is therefore not possible.
  • a signal which represents the sampling information as a function of the location of the sampling would have the advantage of being independent of the sampling rate and possibly occurring during the sampling speed fluctuations.
  • the scanning signal is not detected directly as a function of the location. Rather, an additional signal is determined separately from the sampling signal as a function of time (measurement frequency), which links the time (measurement frequency) to the location. This is usually done by means of so-called mechanical, optical or magnetic encoder.
  • markers with a constant spacing of 300 microns are used to transform the intensity-time signal into an intensity-local signal (see WO05 / 088533A1 page 23). These markers are optically detected with a separate photodetector. Since the constant measuring frequency (sampling rate) and the distance of the markings are known, the location at which the focused scanning beam was located can be determined at any time. This makes it possible to transform the time-dependent scanning signal with the aid of the coder into a time-independent intensity-location signal.
  • the intensity-location signal (possibly after further conversions, filtering and / or data reductions) can be used as a characteristic fingerprint of the surface for later identification and / or authentication.
  • the conversion of the intensity-time signal into an intensity-local signal using an optical encoder described in WO05 / 088533A1 has the disadvantage that markings have to be applied to the surface. Further, in WO05 / 088533A1, an additional photodetector is used to detect the marks and to make a conversion.
  • the time-dependent sampling signal already carries all information about the conversion.
  • the subject of the present invention is therefore a method for producing an identification feature of an article, comprising at least the following steps:
  • An object is understood to mean any solid body.
  • the surface of the body separates it from the surrounding medium (mostly air).
  • an identification feature is meant a characteristic of the object information that can be used for identification and / or authentication of the subject.
  • the identifier is virtually a fingerprint of the item.
  • the identifying feature is information derived by optical methods from the characteristic surface structure of the article.
  • the identification feature is preferably storable and machinable.
  • storable is meant that the identifier can be taken up again at a later date, for example for comparison purposes.
  • machine processing is meant that the identifier can be machine read and subjected to various computational and / or memory operations with a machine.
  • Identification is understood to mean a process that serves to uniquely recognize an object.
  • Authentication is the process of verifying (verifying) an alleged identity.
  • the authentication of objects is the statement that they are authentic - that is, they are unchanged, not copied and / or not faked originals.
  • steps (a) to (c) a scan is made of a surface area of the object for which an identification feature is to be generated.
  • the scanning of a surface area is carried out optically, that is using at least one source of electromagnetic radiation and at least one detector for electromagnetic radiation (also referred to as a photodetector).
  • the radiation may be coherent or non-coherent.
  • the radiation is preferably non-coherent if disturbing interference phenomena such as speckle patterns are to be avoided.
  • electromagnetic radiation from the range of visible light or from the infrared range (380 nm to 2.5 ⁇ ) is used.
  • the electromagnetic radiation may be poly- or monochromatic; preferably it is monochromatic.
  • a surface area of an object is scanned.
  • Part of the radiation reflected by the surface is detected by means of at least one photodetector.
  • the detected signals contain information about the surface structure of the object.
  • the surface structure of an article is unique and can be used to identify and / or authenticate the article.
  • Surface structure is the three-dimensional structure of the surface of an object understood (topography).
  • topography The terms surface texture and topography are used synonymously here.
  • a surface profile is the profile that results from the (imaginary) intersection of a surface of an object with a given plane (see, for example, DIN EN ISO 4287: 1998, Figure 2).
  • the known method of dynamic laser focusing can be used (see, for example, Weinblatt fur Textilmaschinefabrikation, ISSN0043-7131, Volume 117, April 1989, No. 7, pages 271 to 274).
  • a laser is focused onto the surface by means of a lens.
  • the lens can by means of a servomotor be moved perpendicular to the surface (in the z-direction).
  • a sensor detects the respective z-position of the lens in a focused position and thus provides the topography information while the sample is moved through an xy-table under the lens.
  • FIG. 1 shows schematically how the scanning of a surface area can also be performed with the aid of a scanning beam.
  • Figure 1 shows the surface 1 of an article as well as an arrangement comprising a source of electromagnetic radiation 2 and a plurality of detectors 5 for electromagnetic radiation.
  • the surface 1 is shown greatly enlarged for reasons of clarity in comparison to the radiation source 2 and the detectors 5.
  • a scanning beam 3 can be sent to the surface 1 of the object.
  • the object is moved relative to the array of radiation source and detectors (indicated by the thick black arrow).
  • the scanning beam passes over the surface.
  • the scanning beam is reflected by the surface in accordance with the law of reflection.
  • the reflected radiation 4 passes into one of the detectors. In this way, the surface can be scanned and a scanning signal recorded.
  • CCD complementary metal-oxide-semiconductor
  • the irradiation (scanning) of the surface can take place at an arbitrary angle of almost 0 ° (if reflection still occurs) up to 90 ° relative to the mean surface level.
  • the detection of the reflected radiation can also be carried out at an arbitrary angle of almost 0 ° to 90 ° relative to the mean surface level.
  • the determination of a characteristic fingerprint does not have to cover the complete surface structure during the scan.
  • the surface texture of many objects is so rich in features that a fraction of it suffices for identification and / or authentication.
  • the scan is taken along a single, preferably straight line. This means that the scanning beam is guided once in one direction (along a single line) over the surface of an object to pick up a scanning signal. Scanning along a single line can be much faster than scanning along multiple lines, for example, parallel to each other.
  • the direction of movement of the scan should be chosen so that it is not perpendicular to the waviness of the surface, since otherwise no correlation between the location and time of the scan can be made.
  • the direction of the ripple can be determined empirically.
  • FIG. 2 A region 7 of a surface 1 of an object is irradiated by means of a source of electromagnetic radiation 2. Part of the reflected radiation 4 is picked up by a detector to pick up a scanning signal. The object is moved relative to the radiation source and detector assembly (represented by the thick black arrow).
  • the longer extension is transverse to the direction of movement.
  • the problem of positioning is solved. Instead of a thin line (having a width corresponding to the extension of the dot-shaped beam profile), a wide area (having a width corresponding to the longer extension of the line-shaped beam profile) is scanned. This wide range can be found correspondingly easier in a later scan.
  • the scanning with a linear beam profile according to Figure 2 corresponds to an averaging over a plurality of scanning signals, resulting from the sampling with a point-shaped beam profile along a plurality of closely spaced and parallel lines.
  • a linear beam profile is defined here as follows: Usually, the intensity in the cross-sectional center of the radiation is highest and decreases toward the outside. The intensity can decrease evenly in all directions - in this case there is a round cross-sectional profile. In all other cases there is at least one direction in which the intensity gradient is greatest and at least one direction in which the intensity gradient is smallest.
  • the beam width is understood to mean the distance from the center of the cross-sectional profile in the direction of the smallest intensity gradient, at which the intensity has dropped to half of its value in the center.
  • the beam thickness is understood to be the distance from the center of the cross-sectional profile in the direction of the highest intensity gradient, at which the intensity has dropped to half of its value in the center.
  • a linear beam profile refers to a beam profile in which the beam width is greater than the beam thickness by a factor of more than 10.
  • the beam width is greater than the beam thickness by a factor of more than 50, more preferably by a factor of more than 80.
  • the beam thickness is in the range of the mean groove width of a profile element of the present surface (for the definition of the average groove width, see DIN EN ISO 4287: 1998).
  • the beam thickness is usually in the range of 20 ⁇ to 100 ⁇ .
  • the jet thickness is preferably in the range of 30 ⁇ to 80 ⁇ , more preferably in the range of 40 ⁇ to 70 ⁇ , most preferably in the range of 50 ⁇ to 60 ⁇ .
  • the beam width is preferably in the range of 2 mm to 6 mm, particularly preferably in the range of 3 mm to 5 mm. As explained above, the beam width is to find a compromise between signal-to-noise ratio and positioning accuracy.
  • Optical elements are used for beam shaping and focusing.
  • lenses, diaphragms, diffractive optical elements and the like are referred to as optical elements.
  • the scanning device and the object whose surface is to be scanned are preferably moved at a constant distance relative to each other.
  • the beam width is transverse to the direction of movement.
  • the angle between the direction of movement and the direction of the beam width is preferably between 10 ° and 90 °, more preferably between 45 ° and 90 °, most preferably between 70 ° and 90 °.
  • the movement may be continuous at a constant rate, accelerating or decelerating, or discontinuous, i. e.g. gradually.
  • the movement is carried out at a constant speed.
  • the radiation intensity incident on at least one detector is detected as a function of time.
  • measuring signals are recorded and updated at a constant measuring frequency.
  • the scanning signals mentioned in steps (d) and (e) of the method according to the invention can be one and the same scanning signal; However, it is also conceivable that the scanning signals mentioned in steps (d) and (e) are different scanning signals.
  • a scanning signal is generated in step (c) by means of a detector. From this sampling signal, a ripple function is extracted in step (d). Then, the ripple function in step (e) is used to generate a time independent signal from the same sample signal.
  • step (c) two scanning signals are detected by means of two different detectors. From one of the sample signals a ripple function is determined, which is then applied to the other sample signal to generate a time independent signal.
  • the different scanning signals are signals of differently reflected radiation, i. in one case of directly reflected radiation and in the other case of diffused radiation.
  • the directly reflected radiation is particularly suitable for generating a ripple function, while the diffusely scattered radiation is particularly suitable for generating an identification feature.
  • step (d) of the method according to the invention a filtering of a time-dependent scanning signal for determining a time-dependent ripple function takes place.
  • a plurality of objects in the surface profiles in addition to the known fine structures that can be used for identification and / or authentication, characteristic, longer-wave structures. These can be used to correlate between time and place of the scan.
  • shape deviations are divided into six orders. The division into different orders of the shape deviation is based on the knowledge that the shape deviations of different orders have (and can) different origins.
  • a shape deviation 1st order is referred to as a shape deviation and as possible causes of causes deflection and guide errors are specified in the machine tools.
  • a 2nd-order shape deviation is referred to as waviness, and possible sources of origin are vibrations during production.
  • a Shape deviation 3rd, 4th and 5th order is referred to as roughness and as possible causes of origin of the tool-cutting edge shape, the feed, chip formation, crystallization processes, chemical agents and corrosion are specified.
  • This approach is based on the model concept that a surface profile can be described from the superimposition of sine waves of different amplitude, wavelength and phase. Accordingly, the different shape deviations according to DIN EN ISO 4287: 1998 assigned wavelength bands.
  • the present invention is based on the discovery that in a multiplicity of different objects there are wavelength bands in the surface profile which have characteristic, recurring structure which can be used to transform a time-dependent into a location-dependent signal. Besides, there are wavelength bands in the surface profile that have a characteristic structure that can be used as a fingerprint of an object.
  • the structures suitable for transformation lie in a longer wavelength range than the structures that can be used for identification.
  • the structures suitable for the transformation are referred to here as a ripple function, since they often result in the sense of DIN EN ISO 4760 from a shape deviation of the second order, which is referred to as waviness.
  • the terms undulation and ripple function in the sense of the present invention are not restricted to the terms of DIN EN ISO 4760.
  • the term ripple should also not be understood to mean only periodic structures below. Instead, the ripple function in the scanning signal is characterized by structures which, on average, occur at specific intervals, which are characteristic of the respective object.
  • Step (d) is for extracting the ripple function from the sampling signal.
  • One possibility of extraction is the application of profile filters described in the standards DIN EN ISO 4287: 1998 and DIN EN ISO 11562: 1997.
  • a profile filter separates the profile into long-wave and short-wave components.
  • the phase-correct Gauss filter defined in DIN EN ISO 11562: 1997 has established itself in the field of surface metrology and can also be used in step (d) of the method according to the invention.
  • Roughness, waviness and primary profile equipment use three Gaussian filters with the same transmission characteristics but different wavelengths: ⁇ - ⁇ defines the transition from roughness to proportions with even shorter wavelengths present on the surface.
  • c -profile filter defines the transition from roughness to waviness ⁇ - ⁇ defines the transition from waviness to proportions with even longer ones Wavelengths that are present on the surface.
  • the ripple profile is the profile created by successively applying the ⁇ and c profile filters to the primary profile (see DIN EN ISO 4287: 1998).
  • the ripple function in a plurality of objects can be extracted from the time-varying sample signal by using two profile filters (Xf and ⁇ - ⁇ ).
  • step (e) the ripple function is used to convert a time-dependent sample signal to a time-independent signal.
  • one possibility for converting the time-dependent scanning signal into a time-independent signal is to stretch and / or compress the determined ripple function in sections along the time axis such that two adjacent extrema (maxima or minima) are at a constant distance from each other.
  • the result is a corrected, periodic ripple function.
  • the time-dependent scanning signal is to be stretched and / or compressed in sections in the same way along the time axis.
  • the time-dependent signal is projected onto the periodic structure of the corrected ripple function.
  • the result is a time-independent scanning signal.
  • This is preferably normalized by e.g. the distance of two extrema in the corrected ripple function an arbitrary value of e.g. 100 and divides the segmental stretched and / or compressed, former time axis of the sample signal into units of 100 * number of periods in the corrected ripple function.
  • time-independent scanning signal is generated from the time-dependent scanning signal in an analogous manner as described above, these are largely identical except for measurement errors and positioning inaccuracies, even if the later scan is performed with a another speed is done than the earlier scan.
  • the identification feature can then be generated from the preferably normalized, time-independent scanning signal.
  • the described procedure is also successful when an article has a ripple that is not strictly periodic.
  • a marking on the object is used as trigger for the beginning of the scanning.
  • the scanning beam is guided over the surface of the object and a part of the radiation reflected by the surface is detected by means of a photodetector.
  • the mark on the surface of the object causes a change in the signal picked up by the photodetector. This signal change initiates the acquisition of the sample signal, i. from the occurrence of the signal change, the time-dependent sampling signal is recorded.
  • the marking may, for example, be a sharp change in contrast which results, for example, from a transition of a black print to a white print. Due to the high absorption of the black printing, the intensity of the reflected radiation arriving at the photodetector is low. In the transition from black printing to white printing, the intensity of the reflected radiation increases abruptly, which can be used as a trigger to trigger the recording of the scanning signal.
  • markers already present on the article are used.
  • markers already present on the article for example, optical codes (barcode, matrix code), logos, fonts but also edges are suitable.
  • the preferably standardized, time-independent scanning signal can be used directly as an identification feature. In this case, that will Identification feature of the preferably normalized, time-independent sampling signal in step (f equated.
  • the identification feature in step (f) is generated from the time-independent sampling signal by various mathematical methods such as filtering and / or background subtraction. These mathematical methods eliminate as far as possible random or systematic fluctuations that can result from individual measurements. It is conceivable to remove the ripple function in the time-independent sampling signal by means of corresponding profile filters so that as far as possible only the characteristic structures for identification remain.
  • the identification feature can be linked to the article. Such a link is typically made on the first scan of an item. The first scan to generate a first identifier is also referred to herein as registration.
  • a characteristic fingerprint is generated, which can be used in the form of preferably storable and machine processable data as a unique identifier for the object.
  • the link in step (g) can be physical or virtual.
  • the identification feature can be printed on the article or introduced into the article, for example in the form of an optical code (barcode, matrix code, OCR text or the like). It is also conceivable to associate the article with a sticker which contains the identification feature stored.
  • an electronic data carrier to the object such as an RFID chip on which the identification feature is stored, is conceivable.
  • a unique number assigned to the respective object is linked to the identification feature in a database.
  • the identifier may include this number in a header (metadata at the beginning of a file). The link ensures that there is a clear and unambiguous association between the identification feature and the object.
  • the identification feature clearly indicates the associated item.
  • an identifier of the item may be re-generated. This second identifier can be used to identify and authenticate the item. Details can be the following Applications are: WO09 / 097975A1, WO09 / 097974A1, WO09 / 097979A1 and WO09 / 097980A1.
  • Figure 1 (a), (b): Schematic representation for the optical scanning of a surface
  • Figure 2 Schematic representation for the optical scanning of a surface with a linear beam profile
  • Figure 3 Schematic representation of a sensor according to the invention for the scanning of
  • FIG. 1 shows schematically how the scanning of a surface area can be performed with the aid of a scanning beam.
  • the figure shows the surface 1 of an article as well as an arrangement comprising a source of electromagnetic radiation 2 and a plurality of electromagnetic radiation detectors 5.
  • the surface 1 is shown greatly enlarged for reasons of clarity in comparison to the radiation source 2 and the detectors 5.
  • a scanning beam 3 can be sent to the surface 1 of the object.
  • the object is moved relative to the array of radiation source and detectors (indicated by the thick black arrow).
  • the scanning beam passes over the surface.
  • the scanning beam is reflected by the surface in accordance with the law of reflection.
  • the reflected radiation 4 passes into one of the detectors.
  • the surface structure can be determined from the scanning signal.
  • Figure 2 shows a preferred method for scanning a surface.
  • An area 7 of a surface 1 of an object is irradiated by means of a source of electromagnetic radiation 2. Part of the reflected radiation 4 is picked up by a detector to pick up a scanning signal.
  • the object is related to the arrangement of radiation source and Detector moves (represented by the thick black arrow). In the surface plane is a line-shaped beam profile, the longer extension is transverse to the direction of movement.
  • FIG. 3 shows by way of example a part of a device (sensor) for scanning a surface.
  • This sensor comprises a block 10 with a designated outer surface 15.
  • This designated outer surface - hereinafter referred to as outer surface - is directed at the scanning on the surface of the corresponding object.
  • the block 10 serves to receive all optical components of the sensor according to the invention. It has at least two passages 11, 12 which converge towards the designated outer surface.
  • the first feedthrough 11 extends at an angle ⁇ with respect to the normal 16 of the outer surface (short outer surface normal) and serves to receive the source of electromagnetic radiation.
  • a second feedthrough 12 extends at an angle ⁇ with respect to the outer surface normal 16 and serves to receive a photodetector.
  • the amounts of the angles ⁇ and ⁇ are preferably the same.
  • angles ⁇ and ⁇ are in the range of 5 ° to 90 °, preferably in the range 20 ° to 80 °, more preferably in the range 30 ° to 70 °, most preferably in the range 40 ° to 60 °.
  • one or two further passages 13, 14 are provided, which serve to receive one or two further photodetectors. These are arranged at an angle 8i and / or ⁇ 2 to the second passage 12.
  • the size of the angle ⁇ and / or e 2 is 1 ° to 20 °, preferably 5 ° to 15 °.
  • the senor is suitable for detecting both directly reflected and diffusely scattered radiation during the optical scanning of a surface.
  • the directly reflected radiation is detected by means of a detector in the bushing 12, while the diffusely scattered radiation is detected by means of two detectors in the bushings 13 and 14.
  • all bushings are in one plane to allow a compact design of the sensor.
  • the use of a block with two to four feedthroughs for receiving a radiation source and one or more photodetectors offers the advantage that the optical components can be arranged in a simple manner, but nevertheless in a defined manner relative to one another.
  • a stop is located in the passage for the laser. Against this stop, the radiation source is pushed into the bushing, so that it assumes a predetermined fixed position with respect to the block and the photodetectors.
  • the further feedthroughs for receiving photodetectors can also be provided with a stop.
  • the block can easily be e.g. be made by injection molding of plastic one or two pieces.
  • the sensor may have a housing into which the block is inserted.
  • further components are preferably introduced, e.g. the control electronics for the radiation source, signal preprocessing electronics, complete evaluation electronics and the like.
  • the housing preferably also serves to anchor a connection cable with which the sensor according to the invention can be connected to a control unit and / or a data acquisition unit for controlling the sensor and / or for detecting and further processing the characteristic reflection patterns.
  • the senor may have a window located in front of, behind or in the outer surface protecting the optical components from damage and contamination.
  • the window forms the outer surface of the sensor.
  • the window is at least partially transparent at least for the wavelength of the radiation used.
  • the sensor in Figure 3 is further characterized in that the center axes of the feedthroughs intersect at a point 18 which is outside the block at a distance of 2 to 10 mm from the outer surface.
  • the sensor according to the invention is correspondingly guided at a distance above this object, so that the focal point and intersection of the central axes lie on the surface of the object.
  • the positioning of the surface to be scanned of an object with respect to the radiation source and the photodetectors is simple and sufficiently accurate.
  • the angle of the sensor with respect to the surface of the object must become increasingly accurate be adhered to in order to detect a predetermined area of the surface, so that the requirements for positioning increase.
  • the radiation intensity decreases with increasing distance from the radiation source, so that with an increasing distance between sensor and object the correspondingly reduced radiation intensity arriving at the object would have to be compensated by a higher power of the radiation source.

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Length Measuring Devices By Optical Means (AREA)

Abstract

L'invention se rapporte au domaine technique de l'identification et de l'authentification sûres d'objets à l'aide de caractéristiques de la surface de l'objet. La présente invention concerne un procédé pour créer une caractéristique d'identification d'un objet.
PCT/EP2011/058318 2010-05-25 2011-05-23 Identification d'objets Ceased WO2011147760A1 (fr)

Priority Applications (1)

Application Number Priority Date Filing Date Title
EP11720545.0A EP2577622A1 (fr) 2010-05-25 2011-05-23 Identification d'objets

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE102010021380.2 2010-05-25
DE102010021380A DE102010021380A1 (de) 2010-05-25 2010-05-25 Identifizierung von Gegenständen

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WO2011147760A1 true WO2011147760A1 (fr) 2011-12-01

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DE (1) DE102010021380A1 (fr)
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Publication number Priority date Publication date Assignee Title
DE102010062959A1 (de) 2010-12-13 2012-06-14 Bayer Technology Services Gmbh Positionserkennung

Citations (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2097979A (en) 1981-05-04 1982-11-10 Euratom Utilisation of surface textures as a random marking or unique identity
WO2000065541A1 (fr) 1999-04-23 2000-11-02 The Escher Group, Ltd. Authentification d'un objet basee sur une ou plusieurs images de cet objet
WO2003087991A2 (fr) 2002-04-09 2003-10-23 The Escher Group, Ltd. Systeme et procede d'authentification d'une piece par maintien de la forme tridimensionnelle
WO2005088533A1 (fr) 2004-03-12 2005-09-22 Ingenia Technology Limited Procedes, produits et appareils de verification d'authenticite
US20070165208A1 (en) * 2005-12-23 2007-07-19 Ingenia Technology Limited Optical authentication
EP1857985A1 (fr) * 2000-10-13 2007-11-21 The Governor and Company of the Bank of England Détection de support d'impression et de revêtement
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