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WO2010104289A3 - Unité sonde pour essai de panneau - Google Patents

Unité sonde pour essai de panneau Download PDF

Info

Publication number
WO2010104289A3
WO2010104289A3 PCT/KR2010/001399 KR2010001399W WO2010104289A3 WO 2010104289 A3 WO2010104289 A3 WO 2010104289A3 KR 2010001399 W KR2010001399 W KR 2010001399W WO 2010104289 A3 WO2010104289 A3 WO 2010104289A3
Authority
WO
WIPO (PCT)
Prior art keywords
panel
probe unit
tcp
block
probe
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
PCT/KR2010/001399
Other languages
English (en)
Other versions
WO2010104289A2 (fr
Inventor
Yi Bin Ihm
Nam Jung Her
Jun Soo Cho
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
PRO-2000 Co Ltd
Original Assignee
PRO-2000 Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Family has litigation
First worldwide family litigation filed litigation Critical https://patents.darts-ip.com/?family=42645952&utm_source=google_patent&utm_medium=platform_link&utm_campaign=public_patent_search&patent=WO2010104289(A3) "Global patent litigation dataset” by Darts-ip is licensed under a Creative Commons Attribution 4.0 International License.
Application filed by PRO-2000 Co Ltd filed Critical PRO-2000 Co Ltd
Priority to JP2011553939A priority Critical patent/JP2012519867A/ja
Priority to CN2010800114318A priority patent/CN102348990A/zh
Publication of WO2010104289A2 publication Critical patent/WO2010104289A2/fr
Publication of WO2010104289A3 publication Critical patent/WO2010104289A3/fr
Anticipated expiration legal-status Critical
Ceased legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06772—High frequency probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2855—Environmental, reliability or burn-in testing
    • G01R31/2872—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation
    • G01R31/2879—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation related to electrical aspects, e.g. to voltage or current supply or stimuli or to electrical loads
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2884—Testing of integrated circuits [IC] using dedicated test connectors, test elements or test circuits on the IC under test
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Environmental & Geological Engineering (AREA)
  • Measuring Leads Or Probes (AREA)
  • Toxicology (AREA)
  • Health & Medical Sciences (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Liquid Crystal (AREA)
  • Devices For Indicating Variable Information By Combining Individual Elements (AREA)
  • Coupling Device And Connection With Printed Circuit (AREA)

Abstract

L'invention concerne une unité sonde pour l'essai de panneaux. L'unité sonde comprend un bloc protocole de contrôle de transmission (TCP) et une carte de circuit imprimé souple (FPCB). Le bloc TCP est monté sur la partie inférieure d'un manipulateur monté sur une extrémité d'une base de sonde, ledit bloc TCP comprenant des fils conducteurs de sonde présentant le même pas que celui des fils conducteurs correspondants du panneau et qui sont en contact avec les fils conducteurs du panneau et utilisés pour l'essai du panneau. La FPCB est électriquement connectée à une extrémité arrière du bloc TCP et transmet un signal d'essai au panneau par l'intermédiaire du bloc TCP.
PCT/KR2010/001399 2009-03-10 2010-03-05 Unité sonde pour essai de panneau Ceased WO2010104289A2 (fr)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2011553939A JP2012519867A (ja) 2009-03-10 2010-03-05 パネルテストのためのプローブユニット
CN2010800114318A CN102348990A (zh) 2009-03-10 2010-03-05 用于测试面板的探测装置

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
KR10-2009-0020494 2009-03-10
KR20090020494 2009-03-10
KR1020090097521A KR100972049B1 (ko) 2009-03-10 2009-10-14 패널 테스트를 위한 프로브 유닛
KR10-2009-0097521 2009-10-14

Publications (2)

Publication Number Publication Date
WO2010104289A2 WO2010104289A2 (fr) 2010-09-16
WO2010104289A3 true WO2010104289A3 (fr) 2011-01-06

Family

ID=42645952

Family Applications (2)

Application Number Title Priority Date Filing Date
PCT/KR2010/001399 Ceased WO2010104289A2 (fr) 2009-03-10 2010-03-05 Unité sonde pour essai de panneau
PCT/KR2010/001438 Ceased WO2010104303A2 (fr) 2009-03-10 2010-03-08 Unité sonde pour essai de panneau

Family Applications After (1)

Application Number Title Priority Date Filing Date
PCT/KR2010/001438 Ceased WO2010104303A2 (fr) 2009-03-10 2010-03-08 Unité sonde pour essai de panneau

Country Status (5)

Country Link
JP (2) JP2012519867A (fr)
KR (1) KR100972049B1 (fr)
CN (2) CN102348990A (fr)
TW (2) TWI482972B (fr)
WO (2) WO2010104289A2 (fr)

Families Citing this family (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100972049B1 (ko) * 2009-03-10 2010-07-22 주식회사 프로이천 패널 테스트를 위한 프로브 유닛
KR101039338B1 (ko) 2010-01-25 2011-06-08 주식회사 코디에스 극 미세피치 검사용 프로브유닛
KR101020624B1 (ko) 2010-07-20 2011-03-09 주식회사 코디에스 가압부재를 구비한 프로브 유닛의 제조방법
KR101043818B1 (ko) * 2010-08-18 2011-06-22 주식회사 프로이천 액정패널 테스트를 위한 프로브 유닛
KR101020625B1 (ko) 2010-10-07 2011-03-09 주식회사 코디에스 필름타입 프로브유닛 및 그의 제조방법
KR101039336B1 (ko) 2010-10-08 2011-06-08 주식회사 코디에스 필름타입 프로브유닛
KR101158762B1 (ko) 2010-10-19 2012-06-22 주식회사 코디에스 필름타입 프로브유닛 및 그의 제조방법
KR101057594B1 (ko) 2010-11-26 2011-08-18 주식회사 코디에스 Ｆｐｄ 검사용 프로브유닛
KR101063184B1 (ko) 2010-11-26 2011-09-07 주식회사 코디에스 Ｃｏｇ패널 검사용 프로브유닛
KR101177514B1 (ko) 2010-11-26 2012-08-27 주식회사 코디에스 Ｃｏｇ패널 검사용 프로브유닛
KR101242372B1 (ko) 2012-08-28 2013-03-25 (주)메리테크 패널 테스트용 글라스 범프 타입 프로브 블록
KR101970782B1 (ko) * 2018-07-13 2019-04-19 주식회사 케이피에스 유기 발광 다이오드 패널 검사용 프로브 장치
CN109283368A (zh) * 2018-10-29 2019-01-29 大族激光科技产业集团股份有限公司 柔性显示面板测试装置
KR102098653B1 (ko) * 2019-09-19 2020-04-10 주식회사 프로이천 프로브 블록
DE112020000048T5 (de) 2019-12-18 2022-06-02 Advantest Corporation Automatisierte prüfeinrichtung zum prüfen eines oder mehrerer prüfobjekte undverfahren zum betreiben einer automatisierten prüfeinrichtung
TWI797552B (zh) * 2020-02-06 2023-04-01 日商愛德萬測試股份有限公司 用於測試一或多個受測裝置之自動測試設備及用於操作自動測試設備的方法

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH09127542A (ja) * 1995-10-27 1997-05-16 Nec Corp 液晶表示装置及びその検査方法
JPH10221371A (ja) * 1997-02-07 1998-08-21 Mitsubishi Materials Corp コンタクトプローブおよびその製造方法と前記コンタクトプローブを備えたプローブ装置
JPH1164382A (ja) * 1997-08-12 1999-03-05 Mitsubishi Materials Corp プローブヘッド
KR100212276B1 (ko) * 1996-06-13 1999-08-02 윤종용 정전기 방전 수단을 가지는 액정 패널, 액정 패널검사용 프루브장치 및 검사방법
KR100314874B1 (ko) * 1999-01-26 2001-11-23 가부시키가이샤 니혼 마이크로닉스 프로브 장치
KR100720378B1 (ko) * 2005-04-13 2007-05-22 주식회사 코디에스 액정 디스플레이 패널 검사용 프로브 유니트

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2707119B2 (ja) * 1988-10-18 1998-01-28 株式会社日本マイクロニクス 基板用プローブ
JP3076600B2 (ja) * 1990-11-20 2000-08-14 株式会社日本マイクロニクス 表示パネル用プローバ
JP3187855B2 (ja) * 1991-03-27 2001-07-16 株式会社日本マイクロニクス 表示パネル用プローバ
JP2617080B2 (ja) * 1993-06-04 1997-06-04 株式会社東京カソード研究所 多ピン接触子およびその製造方法
JP2668653B2 (ja) * 1994-05-17 1997-10-27 日東精工株式会社 導通接触端子
JP3602630B2 (ja) * 1995-12-14 2004-12-15 株式会社日本マイクロニクス プローブユニット
JPH10221137A (ja) * 1997-02-10 1998-08-21 Tokimec Inc 極低温用超音波流量計プローブ取付治具
JP3035275B2 (ja) * 1997-10-13 2000-04-24 松下電器産業株式会社 集積回路素子のプローブ装置
JP2006284362A (ja) * 2005-03-31 2006-10-19 Nhk Spring Co Ltd コンタクトプローブ
JP2007003207A (ja) * 2005-06-21 2007-01-11 Yamaha Corp プローブユニット及びその製造方法
JP2007139712A (ja) * 2005-11-22 2007-06-07 Nhk Spring Co Ltd プローブホルダおよびプローブユニット
JP4789686B2 (ja) * 2006-04-05 2011-10-12 株式会社ユニオンアロー・テクノロジー マイクロプローブガイドを用いるマイクロプローブユニット及び千鳥配置型マイクロプローブユニット
KR100972049B1 (ko) * 2009-03-10 2010-07-22 주식회사 프로이천 패널 테스트를 위한 프로브 유닛

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH09127542A (ja) * 1995-10-27 1997-05-16 Nec Corp 液晶表示装置及びその検査方法
KR100212276B1 (ko) * 1996-06-13 1999-08-02 윤종용 정전기 방전 수단을 가지는 액정 패널, 액정 패널검사용 프루브장치 및 검사방법
JPH10221371A (ja) * 1997-02-07 1998-08-21 Mitsubishi Materials Corp コンタクトプローブおよびその製造方法と前記コンタクトプローブを備えたプローブ装置
JPH1164382A (ja) * 1997-08-12 1999-03-05 Mitsubishi Materials Corp プローブヘッド
KR100314874B1 (ko) * 1999-01-26 2001-11-23 가부시키가이샤 니혼 마이크로닉스 프로브 장치
KR100720378B1 (ko) * 2005-04-13 2007-05-22 주식회사 코디에스 액정 디스플레이 패널 검사용 프로브 유니트

Also Published As

Publication number Publication date
TWI482972B (zh) 2015-05-01
JP5746060B2 (ja) 2015-07-08
WO2010104289A2 (fr) 2010-09-16
CN102348991B (zh) 2014-05-07
TW201100810A (en) 2011-01-01
WO2010104303A3 (fr) 2011-01-06
TW201037321A (en) 2010-10-16
CN102348991A (zh) 2012-02-08
JP2012519868A (ja) 2012-08-30
KR100972049B1 (ko) 2010-07-22
WO2010104303A2 (fr) 2010-09-16
JP2012519867A (ja) 2012-08-30
CN102348990A (zh) 2012-02-08

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