WO2010001529A1 - ワークの切断方法 - Google Patents
ワークの切断方法 Download PDFInfo
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- WO2010001529A1 WO2010001529A1 PCT/JP2009/002516 JP2009002516W WO2010001529A1 WO 2010001529 A1 WO2010001529 A1 WO 2010001529A1 JP 2009002516 W JP2009002516 W JP 2009002516W WO 2010001529 A1 WO2010001529 A1 WO 2010001529A1
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- workpiece
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B28—WORKING CEMENT, CLAY, OR STONE
- B28D—WORKING STONE OR STONE-LIKE MATERIALS
- B28D5/00—Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor
- B28D5/04—Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor by tools other than rotary type, e.g. reciprocating tools
- B28D5/045—Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor by tools other than rotary type, e.g. reciprocating tools by cutting with wires or closed-loop blades
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B27/00—Other grinding machines or devices
- B24B27/06—Grinders for cutting-off
- B24B27/0633—Grinders for cutting-off using a cutting wire
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B28—WORKING CEMENT, CLAY, OR STONE
- B28D—WORKING STONE OR STONE-LIKE MATERIALS
- B28D5/00—Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor
- B28D5/0058—Accessories specially adapted for use with machines for fine working of gems, jewels, crystals, e.g. of semiconductor material
- B28D5/0082—Accessories specially adapted for use with machines for fine working of gems, jewels, crystals, e.g. of semiconductor material for supporting, holding, feeding, conveying or discharging work
- B28D5/0088—Accessories specially adapted for use with machines for fine working of gems, jewels, crystals, e.g. of semiconductor material for supporting, holding, feeding, conveying or discharging work the supporting or holding device being angularly adjustable
Definitions
- the present invention relates to a cutting method for cutting a workpiece into a wafer shape with a wire saw.
- a wire saw presses a workpiece against a wire array spirally wound between a plurality of wire guides (grooved rollers), and places free abrasive grains in oily or water-soluble coolant at the contact portion between the workpiece and the wire.
- By supplying mixed slurry-like abrasive liquid it is a device that cuts a large number of wafers by the grinding action of loose abrasive grains. Specifically, during the reciprocating travel of the wire row, cutting is performed by scraping the workpiece at the bottom of the groove while pressing the free abrasive grains in the supplied abrasive liquid against the back of the wire groove (work cutting groove) with each wire. To do.
- the workpiece is cut into a wafer shape by free abrasive grains being rubbed against the back of the wire groove (work cutting groove) by the reciprocating wire. Due to the friction generated at this time, the cutting part generates heat, the workpiece is thermally expanded during cutting, and the wire guide is caused by frictional heat with the wire, frictional heat generated at the bearing part that supports the wire guide, etc. Due to thermal expansion, the relative position between the wire array spirally wound around the wire guide and the workpiece was changed during cutting.
- Japanese Patent Application Laid-Open No. 8-323741 discloses that a main roller (wire guide) bearing is circulated to circulate cooling water.
- a method for controlling the axial extension of the (wire guide) is disclosed.
- Japanese Patent No. 3734018 discloses a method of controlling the temperature of the workpiece by supplying a temperature control medium to the workpiece.
- the measures disclosed in the above patent document suppress the axial extension of the wire guide and the thermal expansion of the workpiece, and the relative position between the wire row spirally wound around the wire guide and the workpiece is being cut. Although the warp of the cut wafer was slightly improved by preventing the change to, the amount of improvement was not sufficient.
- an object of the present invention is to provide a cutting method capable of cutting a workpiece with a wire saw with high accuracy to obtain a good Warp-shaped wafer.
- the present invention presses a cylindrical workpiece held by a workpiece holder against a wire row formed by a wire wound spirally between a plurality of wire guides,
- the axial direction of the workpiece is inclined with respect to the plane formed by the wire row Cutting the workpiece, wherein the workpiece is cut after the inclination of the workpiece is inclined so that the side away from the wire row plane is the side extending in the axial direction of the wire guide.
- the workpiece in order to cause the bending due to these two factors to occur in opposite directions, the workpiece is inclined by being inclined so that the side away from the wire row plane is the side extending in the axial direction of the wire guide.
- the curve of the cutting trajectory due to the above two factors is offset and a linear cutting can be performed.
- the wafer can be cut into a good warp shape.
- a special device or the like since the effect of the present invention can be exhibited only by inclining the workpiece axis in the direction set in the present invention, a special device or the like is unnecessary, and good cutting can be performed at low cost.
- the inclination angle of the workpiece in the axial direction according to the cutting locus of the workpiece cut in advance.
- the wire trajectory can be grasped by the cutting trajectory of the workpiece that has been cut in advance, the wire guide elongation amount and the extending direction, or the curvature of the cutting trajectory can be grasped. By doing so, an effective inclination angle can be set.
- the tilt angle of the workpiece in the axial direction it is preferable to adjust the tilt angle of the workpiece in the axial direction to an absolute value of 0.003 to 0.2 degrees.
- the inclination of the workpiece in the axial direction is adjusted by inclining a work holder for holding the work, or is adjusted by the inclination of a member inserted between the work and the work holder, Or it is preferable to adjust by inclining the workpiece holding part to which the workpiece holder is attached.
- a special device is not necessary for carrying out the present invention, and the tilt can be easily adjusted. According to the method, it is possible to cut a good warp-shaped wafer at a low cost. Of course, these methods may be used in combination.
- the workpiece is tilted and cut in the direction defined in the present invention, thereby reversing the curvature of the workpiece cutting locus caused by the axial extension of the wire guide.
- the workpiece can be cut linearly by generating a curvature of the cutting trajectory in the direction and canceling the curvature due to two factors.
- the cutting is started from the position where the wire is intentionally shifted, and the bending of the cutting trajectory due to the force of the wire returning to the original position during the cutting is performed. It is generated in the direction opposite to the extending side of the guide in the axial direction.
- the inventors have cut the workpiece in a slightly inclined state at the time of cutting in addition to the heat-induced curvature at the time of cutting as described above. Then, at the cutting start part of the workpiece, the wire starts to cut into the workpiece after sliding on the surface of the cylindrical workpiece in the axial direction, and then the position of the wire returns to the position before the skidding with the progress of cutting. As a result, it was found that the curvature of the cutting locus occurred.
- the inventors of the present invention intentionally slid the wire sideways on the side of the wire guide that extends in the axial direction by cutting the workpiece in an axial direction with respect to the wire row plane, and cutting the wire guide. Since the wire guide extends in the axial direction before the wire returns to the original position during cutting, the position of the wire by the extended wire guide and the cutting position of the workpiece become the same position, and the cutting is not curved.
- the present invention has been completed by finding that it is possible to cancel the curvature of the cutting locus due to two factors.
- FIG. 1 is a side view (A) showing a state in which a workpiece is tilted and held on a wire saw device and a diagram (B) showing a cutting trajectory thereof as an example of an embodiment of a workpiece cutting method of the present invention.
- FIG. 6 is an explanatory diagram showing the influence on the cutting locus due to the inclination of the workpiece in the axial direction.
- FIG. 7 is an explanatory diagram showing the influence on the cutting trajectory of the workpiece due to the axial extension of the wire guide.
- FIG. 4 is a schematic view showing an example of a wire saw device to which the cutting method of the present invention can be applied.
- FIG. 5 is an explanatory diagram when cutting a workpiece with a wire saw device. Since the cutting method of the present invention does not require a special device or the like other than the part for holding the workpiece, a conventional wire saw device can be basically used.
- a wire 13 for cutting the workpiece 14 one end side is fixed, a wire guide 12 for winding the wire 13, a drive motor 11 for driving the wire guide 12, and tension is applied to the wire 13.
- a mechanism 10 for holding and feeding the workpiece 14 to be cut, and a slurry nozzle 16 for supplying slurry at the time of cutting Further, as shown in FIG. 5, a workpiece holding unit 17 and a workpiece holder 18 are attached to the workpiece feeding mechanism 10, and a slice base 19 is inserted between the workpiece 14 to be cut and the workpiece holder 18. Yes.
- the axial direction of the workpiece 14 is set with respect to the plane formed by the wire row 13 as shown in FIG.
- the work 14 is cut after being inclined such that the side away from the plane of the wire row 13 is the side extending in the axial direction of the wire guide 12.
- the two curvatures are offset and the cutting proceeds linearly.
- the warp of the wafer to be cut can be improved simply by tilting and holding it by the method of the present invention without using a special apparatus or the like. it can.
- the inclination angle of the workpiece in the axial direction according to the cutting locus of the workpiece cut in advance. In this way, since the cutting direction of the cutting locus and the degree thereof can be examined based on the cutting locus of the workpiece that has been cut in advance, the inclination angle can be easily set, and more efficient at the next cutting. Can be cut well. Therefore, it is preferable to cut the product after cutting the dummy workpiece in advance and examining the locus.
- FIG. 2 is a view showing the cutting trajectory of the workpiece by adjusting the workpiece tilt angle to 0.003 degrees, that is, by slightly tilting it with respect to the wire row plane and holding the workpiece to measure the shape of the cut wafer.
- the cutting locus shown in FIG. 2 it can be seen that the cutting locus is curved toward the scale 0 of the wafer position at the beginning of cutting. For this reason, it turns out that the axial direction of a wire guide is extended toward the scale 0 side of a horizontal axis (wafer position).
- the inclination angle of the workpiece can be further set so that the side of the scale 0 on the horizontal axis (the side on which the axial direction of the wire guide extends) is away from the wire row plane.
- the tilt angle of the workpiece 14 in the axial direction is preferable to adjust to an absolute value of 0.003 to 0.2 degrees.
- the inclination angle in such a range, it is possible to more effectively prevent the workpiece cutting locus from being curved, and to obtain a better Warp-shaped wafer. it can.
- Example 1 First, using a wire saw apparatus shown in FIG. 4, a silicon ingot (workpiece) having a diameter of 300 mm and an axial length of 300 mm was cut under the cutting conditions shown in Table 1.
- the slurry supply temperature was controlled to be constant at 23 ° C. from the start of cutting to the end of cutting.
- the workpiece was fixed by adhering and fixing a resin slice base on the upper surface of the metal workpiece holder, and further adhering and fixing the workpiece on the resin slice base.
- the metal workpiece holder, resin slice base and workpiece integrated by fixing these are turned upside down so that the workpiece holder is positioned above and the workpiece is fishing. With the posture held down, the work holder was fixedly held by the work holding portion of the wire saw device (see FIG. 5).
- the shape accuracy of the work holder and the resin-made slice base and the work holder, the resin-made slice base and the workpiece are adjusted so that the work plate surface and the work axis are parallel to each other. Adhesion was performed by adjusting the parallelism.
- the workpiece bonded to the workpiece holder is slightly tilted and fixed to the wire saw device, and the inclination angle between the surface formed by the wire row and the workpiece axis is measured.
- the result of the wire guide extending in the axial direction is the wire row plane It was tilted 0.003 degrees (11 seconds) away from the side.
- FIG. 2 shows the Warp shape of the cross section in the workpiece feed direction extracted from the Warp measurement data, with the first, fifth, tenth,... It can be seen that the curvature of the cutting trajectory at the beginning of cutting is relatively suppressed.
- the workpiece axis is made relatively parallel to the surface formed by the wire row, the side slip of the wire does not occur at the cutting start portion, and the cutting trajectory caused by the deviation of the wire is prevented.
- warp deterioration due to bending was suppressed, the cutting locus was still bent due to the elongation in the wire guide axis direction.
- the axial extension of the wire guide is determined based on the one end surface of the wire guide (on the horizontal axis scale 280 side) from the cutting locus shown in FIG. It turns out that it has generate
- the inclination of the workpiece axis is adjusted so that the side away from the wire row plane is the wire guide.
- the workpiece was held as shown in FIG. 1A with an inclination of 0.1 degree so as to be on the side extending in the axial direction.
- a silicon ingot having a diameter of 300 mm and an axial length of 300 mm was cut in the same manner as in Example 1 except for the inclination angle.
- the inclination of the workpiece axis was adjusted by inclining the thickness of the workpiece holder in the longitudinal direction.
- the warp shape of the cross section in the workpiece feeding direction is extracted from the warp measurement data of the wafer after cutting, and every fifth piece after the first piece, the fifth piece, the tenth piece, and so on. This is shown in FIG.
- FIG. 1B there is almost no curvature of the cutting locus particularly at the initial stage of cutting, and the average value of Warp of the whole wafer is improved from that obtained by slightly tilting in the first embodiment. It was 3 ⁇ m.
- the workpiece axis is inclined 0.05 degrees (3 minutes) in the direction opposite to that of the first and second embodiments with respect to the surface formed by the wire row.
- a silicon ingot having a diameter of 300 mm and an axial length of 300 mm was cut under the same conditions as in Examples 1 and 2.
- the tilt angle of the workpiece axis was determined by examining the tilt angle after bonding multiple times when the workpiece holder and the workpiece were bonded without adjusting the tilt angle, and the maximum value was adopted.
- FIG. 3 (B) shows the Warp shape of the cross section in the workpiece feed direction extracted from the Warp measurement data for the first sheet, the fifth sheet, the tenth sheet, and the fifth sheet and every fifth sheet.
- the present invention is not limited to the above embodiment.
- the above-described embodiment is an exemplification, and the present invention has substantially the same configuration as the technical idea described in the claims of the present invention, and any device that exhibits the same function and effect is the present invention. It is included in the technical scope of the invention.
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- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Processing Of Stones Or Stones Resemblance Materials (AREA)
- Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
Abstract
Description
本発明では、この二つの要因による湾曲を互いに逆向きに生じさせるように、ワークの傾斜を、ワイヤ列平面から離れる側がワイヤガイドの軸方向に伸びる側になるように傾斜させて切断することで、上記二つの要因による切断軌跡の湾曲が相殺されて直線的な切断を行うことができる。これにより、Warp形状の良好なウェーハに切断することができる。
また、ワーク軸を本発明で設定した方向に傾斜させるだけで本発明の効果を発揮することができるため、特別な装置等は不要であり、低コストで良好な切断を行うことができる。
このように、予め切断したワークの切断軌跡によって、装置特性によるワイヤガイドの伸び量や伸びる方向、又は、切断軌跡の湾曲の大きさを把握することができるため、これを用いて次の切断をすることにより効果的な傾斜角度を設定することができる。
このような傾斜角度の範囲に調整することで、より効果的に切断軌跡の湾曲を防止することができ、Warp形状の良好なウェーハにすることができる。
このように、上記のような方法でワークの軸方向の傾斜を調整することで、本発明の実施のために特別な装置は不要であり、容易に傾斜を調整することができるため、簡便な方法によって低コストで良好なWarp形状のウェーハに切断することができる。
もちろん、これらの方法は組み合わせて用いてもよい。
尚、図1は本発明のワークの切断方法の実施態様の一例として、ワイヤソー装置にワークを傾斜させて保持した状態を表す側面図(A)と、その切断軌跡を表す図(B)である。
また、図6は、ワークの軸方向の傾斜による切断軌跡への影響を表す説明図である。図7は、ワイヤガイドの軸方向の伸びによるワークの切断軌跡への影響を表す説明図である。
本発明の切断方法は、ワークを保持する部分以外は特別な装置等は不要であるため、ワイヤソー装置としては、基本的には従来のものを使用することができる。
また、図5に示すように、ワーク送り機構10には、ワーク保持部17、ワークホルダ18が取り付けられており、切断するワーク14とワークホルダ18との間にはスライスベース19が挿入されている。
一方、ワイヤガイドは切断が進むと熱を持ち軸方向に伸びるため、そのワイヤガイドから出ているワイヤも同じ方向に移動して、ワークの切断軌跡がワイヤガイドの伸びる側に向かって湾曲するようになる(図7参照)。
本発明では、このような二つの要因による湾曲が互いに逆方向になるように傾斜を調整しているため、二つの湾曲は相殺されて、切断が直線的に進行する。これにより、切断されるウェーハのWarpの改善を、特別な装置等を用いることなく本発明の方法で傾斜させて保持するのみで達成することができるため、低コストで良好な切断を行うことができる。
このように、予め切断したワークの切断軌跡により、切断軌跡の湾曲している向きや、その度合いを調べることができるため、傾斜角度を容易に設定することができ、次の切断時により効率的に良好な切断を行うことができる。従って、予めダミーのワークを切断して軌跡を調べた後、製品の切断をするのが好ましい。
図2に示す切断軌跡において、切断初期にウェーハ位置の目盛0の方に向かって切断軌跡が湾曲しているのがわかる。このため、ワイヤガイドの軸方向は、横軸(ウェーハ位置)の目盛0の側に向って伸びていることがわかる。
これにより、ワークの傾斜を、横軸の目盛0の側(ワイヤガイドの軸方向が伸びる側)をワイヤ列平面から離れる側になるようにさらに傾斜角度を設定することができる。
ワイヤガイドの伸び等を考慮すると、このような範囲で傾斜角度を調整することで、ワークの切断軌跡の湾曲をより効果的に防止することができ、より良好なWarp形状のウェーハにすることができる。
このように、特別な装置を用いること無く、簡便な方法でワークの傾斜を調整することができるため低コストで良好な切断を行うことができる。
まず、図4に示すワイヤソー装置を用い、表1に示す切断条件で直径300mm、軸方向の長さ300mmのシリコンインゴット(ワーク)を切断した。スラリ供給温度は切断開始から切断終了まで23℃で一定となるように制御した。
そのワークホルダに接着したワークをわずかに傾けてワイヤソー装置に固定保持して、ワイヤ列によって形成される面とワーク軸との傾斜角度を測定した結果はワイヤガイドの軸方向に伸びる側がワイヤ列平面から離れる側に0.003度(11秒)傾いていた。
実施例1では、ワイヤ列によって形成される面に対して、ワーク軸を比較的平行に近くしたことにより、切断開始部でワイヤの横滑りが発生することがなくなり、ワイヤのずれ起因の切断軌跡の湾曲によるWarp悪化は抑制されていたが、依然ワイヤガイド軸方向の伸びによる切断軌跡の湾曲がみられていた。
上記実施例1に使用したワイヤソー装置では、図2に示す切断軌跡より、ワイヤガイドの軸方向の伸びは、ワイヤガイドの一方の端面(図2の横軸目盛280側)を基準位置として、もう一方の端面の方向(図2の横軸目盛0側)に向かって発生していることがわかる。
なお、単結晶シリコンウェーハでは、品質項目としてウェーハの面方位の規格があるため、本発明のようにワーク軸を意図的に傾斜させて切断を行った場合には、切断されたウェーハの面方位がワーク軸を傾斜させた分だけずれることが懸念されるが、これについては、ワーク軸を傾斜させる分だけワークの方位を事前にずらしておくことで影響を排除することが可能である。
図3(A)に示すように、ワイヤ列によって形成される面に対して、ワーク軸を0.05度(3分)実施例1、2とは逆の向きに傾斜している以外は、実施例1、2と同様の条件で直径300mm、軸方向の長さ300mmのシリコンインゴットを切断した。ワーク軸の傾斜角度は、ワークホルダとワークの傾斜角度を調整せずに接着した場合の接着後の傾斜角度を複数回調査し、最大値を採用した。
ワークの傾斜により切断開始部でのワイヤの横滑りが発生して、ワイヤガイドの軸方向の伸びによる湾曲と同じ方向に湾曲が生じたため、ワークの切断軌跡が大きく湾曲し、Warpの悪化を引き起こしている。
Claims (6)
- 複数のワイヤガイド間に螺旋状に巻回されたワイヤによって形成されるワイヤ列に、ワークホルダに保持された円柱状のワークを押圧し、前記ワークとワイヤとの接触部にスラリを供給しながら前記ワイヤを走行させることによって、前記ワークをウェーハ状に切断する切断方法において、前記ワイヤ列によって形成される平面に対して前記ワークの軸方向を傾斜させて切断するものであって、前記ワークの傾斜を、前記ワイヤ列平面から離れる側が、前記ワイヤガイドの軸方向に伸びる側になるように傾斜させてから切断することを特徴とするワークの切断方法。
- 前記ワークの軸方向の傾斜角度を、予め切断したワークの切断軌跡に依って設定することを特徴とする請求項1に記載のワークの切断方法。
- 前記ワークの軸方向の傾斜角度を、絶対値で0.003~0.2度に調整することを特徴とする請求項1又は請求項2に記載のワークの切断方法。
- 前記ワークの軸方向の傾斜を、前記ワークを保持するためのワークホルダを傾斜させることによって調整することを特徴とする請求項1乃至請求項3のいずれか一項に記載のワークの切断方法。
- 前記ワークの軸方向の傾斜を、前記ワークとワークホルダの間に挿入する部材の傾斜によって調整することを特徴とする請求項1乃至請求項4のいずれか一項に記載のワークの切断方法。
- 前記ワークの軸方向の傾斜を、前記ワークホルダが取り付けられたワーク保持部を傾斜させることによって調整することを特徴とする請求項1乃至請求項5のいずれか一項に記載のワークの切断方法。
Priority Applications (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US12/990,985 US8146581B2 (en) | 2008-06-30 | 2009-06-04 | Method for slicing workpiece |
| DE112009001446.1T DE112009001446B4 (de) | 2008-06-30 | 2009-06-04 | Verfahren zum Zerschneiden eines Werkstücks |
| CN2009801207849A CN102056712B (zh) | 2008-06-30 | 2009-06-04 | 工件切断方法 |
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2008-171057 | 2008-06-30 | ||
| JP2008171057A JP5007706B2 (ja) | 2008-06-30 | 2008-06-30 | ワークの切断方法 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| WO2010001529A1 true WO2010001529A1 (ja) | 2010-01-07 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| PCT/JP2009/002516 Ceased WO2010001529A1 (ja) | 2008-06-30 | 2009-06-04 | ワークの切断方法 |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US8146581B2 (ja) |
| JP (1) | JP5007706B2 (ja) |
| KR (1) | KR101552895B1 (ja) |
| CN (1) | CN102056712B (ja) |
| DE (1) | DE112009001446B4 (ja) |
| WO (1) | WO2010001529A1 (ja) |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| JP6132621B2 (ja) * | 2013-03-29 | 2017-05-24 | Sumco Techxiv株式会社 | 半導体単結晶インゴットのスライス方法 |
| DE102014208187B4 (de) | 2014-04-30 | 2023-07-06 | Siltronic Ag | Verfahren zum gleichzeitigen Trennen einer Vielzahl von Scheiben mit besonders gleichmäßiger Dicke von einem Werkstück |
| KR101616470B1 (ko) * | 2015-01-16 | 2016-04-29 | 주식회사 엘지실트론 | 잉곳 절단 장치 |
| EP3402612B1 (en) * | 2016-01-14 | 2023-09-13 | Mectron Engineering Company, Inc. | Eddy current system for workpiece inspection |
| CN107457924B (zh) * | 2017-08-30 | 2019-03-22 | 宁晋松宫电子材料有限公司 | 一种多晶硅切片方法 |
| DE102018221922A1 (de) * | 2018-12-17 | 2020-06-18 | Siltronic Ag | Verfahren zur Herstellung von Halbleiterscheiben mittels einer Drahtsäge, Drahtsäge und Halbleiterscheibe aus einkristallinem Silizium |
| CN109531844B (zh) * | 2019-01-23 | 2020-11-13 | 福建北电新材料科技有限公司 | 多线切割装置、多线切割方法及其用途 |
| CN110871507B (zh) * | 2019-12-04 | 2021-11-23 | 焦作市通发电子产品有限公司 | 一种晶体的斜度切割方法及定位夹具 |
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- 2009-06-04 US US12/990,985 patent/US8146581B2/en active Active
- 2009-06-04 WO PCT/JP2009/002516 patent/WO2010001529A1/ja not_active Ceased
- 2009-06-04 CN CN2009801207849A patent/CN102056712B/zh active Active
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| JP2002337137A (ja) * | 2001-05-16 | 2002-11-27 | Nippei Toyama Corp | ワーク装着方法及びワイヤソー及び支持プレート |
Also Published As
| Publication number | Publication date |
|---|---|
| KR101552895B1 (ko) | 2015-09-14 |
| DE112009001446B4 (de) | 2020-04-23 |
| CN102056712B (zh) | 2012-10-24 |
| JP5007706B2 (ja) | 2012-08-22 |
| CN102056712A (zh) | 2011-05-11 |
| US8146581B2 (en) | 2012-04-03 |
| JP2010005773A (ja) | 2010-01-14 |
| US20110059679A1 (en) | 2011-03-10 |
| DE112009001446T5 (de) | 2011-07-14 |
| KR20110043544A (ko) | 2011-04-27 |
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