[go: up one dir, main page]

WO2010054625A3 - Method and device for determining the position, radius and/or deviation in form of an annular structure - Google Patents

Method and device for determining the position, radius and/or deviation in form of an annular structure Download PDF

Info

Publication number
WO2010054625A3
WO2010054625A3 PCT/DE2009/001561 DE2009001561W WO2010054625A3 WO 2010054625 A3 WO2010054625 A3 WO 2010054625A3 DE 2009001561 W DE2009001561 W DE 2009001561W WO 2010054625 A3 WO2010054625 A3 WO 2010054625A3
Authority
WO
WIPO (PCT)
Prior art keywords
annular structure
sector
sectors
deviation
radius
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
PCT/DE2009/001561
Other languages
German (de)
French (fr)
Other versions
WO2010054625A2 (en
Inventor
Klaus Schertler
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Airbus Defence and Space GmbH
Original Assignee
EADS Deutschland GmbH
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by EADS Deutschland GmbH filed Critical EADS Deutschland GmbH
Priority to US13/128,791 priority Critical patent/US8670635B2/en
Priority to EP09795307.9A priority patent/EP2356413B1/en
Publication of WO2010054625A2 publication Critical patent/WO2010054625A2/en
Publication of WO2010054625A3 publication Critical patent/WO2010054625A3/en
Anticipated expiration legal-status Critical
Ceased legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G01J3/45—Interferometric spectrometry
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/60—Analysis of geometric attributes
    • G06T7/62—Analysis of geometric attributes of area, perimeter, diameter or volume
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/60—Analysis of geometric attributes
    • G06T7/66—Analysis of geometric attributes of image moments or centre of gravity
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
    • G01S17/00—Systems using the reflection or reradiation of electromagnetic waves other than radio waves, e.g. lidar systems
    • G01S17/88—Lidar systems specially adapted for specific applications
    • G01S17/95—Lidar systems specially adapted for specific applications for meteorological use
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02A—TECHNOLOGIES FOR ADAPTATION TO CLIMATE CHANGE
    • Y02A90/00—Technologies having an indirect contribution to adaptation to climate change
    • Y02A90/10—Information and communication technologies [ICT] supporting adaptation to climate change, e.g. for weather forecasting or climate simulation

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Geometry (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Theoretical Computer Science (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Image Analysis (AREA)
  • Instruments For Measurement Of Length By Optical Means (AREA)
  • Length-Measuring Devices Using Wave Or Particle Radiation (AREA)

Abstract

The invention relates to a method for the image processing of intensity images having an annular structure in order to measure the position, deviation in form and/or the radius of said annular structure, in particular for evaluating interferograms and/or for the exact localisation of objects. To permit an exact, universally applicable measurement, the following steps are proposed according to the invention: a) definition of N sectors of the intensity image, each sector having sector tips lying at a common sector origination point within the annular structure, N being a natural number, where N>1; b) detection of a distance of an intensity extremum from the respective sector tip of each sector in at least one group of sectors in order to obtain a distance vector containing the distances of all sectors in at least the group of sectors; c) carrying out a Fourier transform of the distance vector; and d) determination of d1) a centre of the annular structure and/or d2) a radius of the annular structure and/or d3) a deviation of the annular structure from a circular form using the first Fourier vector obtained as a result of the Fourier transform. The invention also relates to a device for carrying out said method.
PCT/DE2009/001561 2008-11-12 2009-11-09 Method and device for determining the position, radius and/or deviation in form of an annular structure Ceased WO2010054625A2 (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
US13/128,791 US8670635B2 (en) 2008-11-12 2009-11-09 Method and device for determining the position, radius and/or shape deviation of a ring structure
EP09795307.9A EP2356413B1 (en) 2008-11-12 2009-11-09 Method and device for determining the position, radius and/or deviation in form of an annular structure

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE102008056869A DE102008056869B3 (en) 2008-11-12 2008-11-12 Method for image processing of intensity images having annular structure for determining position, involves defining sectors of intensity images with sector vertex on sector origin point which lies in annular structure
DE102008056869.4 2008-11-12

Publications (2)

Publication Number Publication Date
WO2010054625A2 WO2010054625A2 (en) 2010-05-20
WO2010054625A3 true WO2010054625A3 (en) 2010-07-08

Family

ID=41152930

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/DE2009/001561 Ceased WO2010054625A2 (en) 2008-11-12 2009-11-09 Method and device for determining the position, radius and/or deviation in form of an annular structure

Country Status (4)

Country Link
US (1) US8670635B2 (en)
EP (1) EP2356413B1 (en)
DE (1) DE102008056869B3 (en)
WO (1) WO2010054625A2 (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102009021557B4 (en) 2009-05-15 2016-08-04 Airbus Defence and Space GmbH Method for determining at least one movement quantity of a rotating shaft, wave examination and / or monitoring device for its implementation and use thereof
CN112347825B (en) * 2019-08-09 2023-08-22 杭州海康威视数字技术股份有限公司 Method and system for adjusting car body surround view model

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5613013A (en) * 1994-05-13 1997-03-18 Reticula Corporation Glass patterns in image alignment and analysis
US20040027537A1 (en) * 2002-05-24 2004-02-12 Sarver Edwin J. Continuous two-dimensional corneal topography target
WO2004092767A1 (en) * 2003-04-10 2004-10-28 Eads Deutschland Gmbh Method for detecting wind speeds using a doppler-lidar system, especially on aeroplanes, and doppler-lidar system
DE102006030399B3 (en) * 2006-06-29 2007-12-27 Eads Deutschland Gmbh Two-dimensional Fabry Perot interferogram`s circular radius detecting method for detecting gusts, involves selecting transformation such that intensity extrema existing in intensity distribution appears equidistant in intensity vector

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5159474A (en) * 1986-10-17 1992-10-27 E. I. Du Pont De Nemours And Company Transform optical processing system
US5151822A (en) * 1986-10-17 1992-09-29 E. I. Du Pont De Nemours And Company Transform digital/optical processing system including wedge/ring accumulator
US7376075B1 (en) * 2003-09-26 2008-05-20 Conexant Systems, Inc. Circular constellations with coherent gain/differential phase and pilots
US7969650B2 (en) * 2005-04-28 2011-06-28 The Board Of Trustees Of The University Of Illinois Multiplex near-field microscopy with diffractive elements
FR2902526B1 (en) * 2006-06-16 2008-09-12 Agence Spatiale Europeenne INTERFEROMETER RADIOMETER
DE102006029539B4 (en) * 2006-06-26 2009-08-27 Astrium Gmbh Lossless compression method for interferograms

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5613013A (en) * 1994-05-13 1997-03-18 Reticula Corporation Glass patterns in image alignment and analysis
US20040027537A1 (en) * 2002-05-24 2004-02-12 Sarver Edwin J. Continuous two-dimensional corneal topography target
WO2004092767A1 (en) * 2003-04-10 2004-10-28 Eads Deutschland Gmbh Method for detecting wind speeds using a doppler-lidar system, especially on aeroplanes, and doppler-lidar system
DE102006030399B3 (en) * 2006-06-29 2007-12-27 Eads Deutschland Gmbh Two-dimensional Fabry Perot interferogram`s circular radius detecting method for detecting gusts, involves selecting transformation such that intensity extrema existing in intensity distribution appears equidistant in intensity vector

Also Published As

Publication number Publication date
EP2356413A2 (en) 2011-08-17
WO2010054625A2 (en) 2010-05-20
EP2356413B1 (en) 2015-01-07
US8670635B2 (en) 2014-03-11
US20110262042A1 (en) 2011-10-27
DE102008056869B3 (en) 2009-11-12

Similar Documents

Publication Publication Date Title
EP2515073A3 (en) Method and system for locating a laser vibrometer during non-contact scanning
EP2626726A3 (en) Methods and systems for correction of streamer-depth bias in marine seismic surveys
AU2012382625B2 (en) Rolling wheel deflectometer
WO2011016892A3 (en) Range imaging lidar
MX2017015182A (en) Method and device for inspection of crankshaft.
DE502005004109D1 (en) PROCESS FOR DETERMINING THE POSITION AND RELATIVE SHIFTING OF AN OBJECT IN THE SPACE
WO2009077539A3 (en) Method for processing a three-dimensional image of the surface of a tyre so that it can be used to inspect the said surface
EP2911093A3 (en) Method and device for detecting straight line
WO2005029193A3 (en) Interferometric analysis of surfaces.
FI20155171A7 (en) Container inspection arrangement, method, equipment and software
ATE458180T1 (en) METHOD FOR DETERMINING THE AXIS OF ROTATION OF A VEHICLE WHEEL
TW200730796A (en) Interferometer and method for measuring characteristics of optically unresolved surface features
EP2636493A3 (en) Information processing apparatus and information processing method
EP2546638A3 (en) Clustering of multi-modal data
WO2016034428A3 (en) Method of measuring a property of a target structure, inspection apparatus, lithographic system and device manufacturing method
BR112014007577A2 (en) blanket inspection calibration system and related methods
WO2012146358A3 (en) Scanning method for a large-size scanner system using a stitching process
WO2015100403A3 (en) Method and apparatus for precise determination of a position of a target on a surface
EP2227030A3 (en) Methods and systems for image registration
WO2013132081A3 (en) Lithography system and method for processing a target, such as a wafer
WO2012156462A3 (en) Method for generating and evaluating an image
WO2004088589A8 (en) Volume measurements in 3d datasets
EP4332890A3 (en) Methods and systems for the quantitative measurement of internal defects in as-cast steel products
DK2052360T3 (en) Method and electron microscope to measure the similarity of two-dimensional images
TW200510690A (en) 3D and 2D measurement system and method with increased sensitivity and dynamic range

Legal Events

Date Code Title Description
121 Ep: the epo has been informed by wipo that ep was designated in this application

Ref document number: 09795307

Country of ref document: EP

Kind code of ref document: A2

WWE Wipo information: entry into national phase

Ref document number: 2009795307

Country of ref document: EP

WWE Wipo information: entry into national phase

Ref document number: 13128791

Country of ref document: US