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WO2010047523A3 - 복수의 라인패턴을 활용한 3차원 스캐닝 장치 및 방법 - Google Patents

복수의 라인패턴을 활용한 3차원 스캐닝 장치 및 방법 Download PDF

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Publication number
WO2010047523A3
WO2010047523A3 PCT/KR2009/006083 KR2009006083W WO2010047523A3 WO 2010047523 A3 WO2010047523 A3 WO 2010047523A3 KR 2009006083 W KR2009006083 W KR 2009006083W WO 2010047523 A3 WO2010047523 A3 WO 2010047523A3
Authority
WO
WIPO (PCT)
Prior art keywords
line patterns
subject
dimensional scanning
scanning
generating
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
PCT/KR2009/006083
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English (en)
French (fr)
Other versions
WO2010047523A2 (ko
Inventor
지남석
강철권
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
POSFIT Inc
Original Assignee
POSFIT Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by POSFIT Inc filed Critical POSFIT Inc
Publication of WO2010047523A2 publication Critical patent/WO2010047523A2/ko
Publication of WO2010047523A3 publication Critical patent/WO2010047523A3/ko
Anticipated expiration legal-status Critical
Ceased legal-status Critical Current

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/2513—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object with several lines being projected in more than one direction, e.g. grids, patterns
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/2518—Projection by scanning of the object
    • G01B11/2522—Projection by scanning of the object the position of the object changing and being recorded
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N13/00—Stereoscopic video systems; Multi-view video systems; Details thereof

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  • Engineering & Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Image Input (AREA)

Abstract

본 발명은 복수의 라인패턴을 활용한 3차원 스캐닝 장치에 관한 것으로서, 내부에 피사체가 위치하는 소정의 측정공간의 적어도 일부를 향해 일정한 각도 간격을 갖는 복수의 스캐닝 평면을 방사상으로 투사하는 투사수단과; 상기 피사체가 상기 복수의 스캐닝 평면과 만남으로써 상기 피사체의 표면에 형성되는 복수의 라인패턴을 촬영하는 촬영수단; 및 상기 촬영된 복수의 라인패턴으로부터 상기 피사체의 형상에 관한 3차원 데이터를 생성하는 데이터 생성수단을 포함하는 것을 특징으로 한다. 이에 의해, 3차원 스캐닝에 소요되는 시간을 단축하고, 장치의 규모 면에서도 소형화를 달성할 수 있으며, 3차원 데이터의 생성 시 사각지대의 발생을 최소화할 수 있다.
PCT/KR2009/006083 2008-10-21 2009-10-21 복수의 라인패턴을 활용한 3차원 스캐닝 장치 및 방법 Ceased WO2010047523A2 (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
KR10-2008-0102854 2008-10-21
KR1020080102854A KR100892875B1 (ko) 2008-10-21 2008-10-21 복수의 라인패턴을 활용한 3차원 스캐닝 장치 및 방법

Publications (2)

Publication Number Publication Date
WO2010047523A2 WO2010047523A2 (ko) 2010-04-29
WO2010047523A3 true WO2010047523A3 (ko) 2010-07-15

Family

ID=40757630

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/KR2009/006083 Ceased WO2010047523A2 (ko) 2008-10-21 2009-10-21 복수의 라인패턴을 활용한 3차원 스캐닝 장치 및 방법

Country Status (2)

Country Link
KR (1) KR100892875B1 (ko)
WO (1) WO2010047523A2 (ko)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101381137B1 (ko) 2012-10-24 2014-04-10 윈포시스(주) 족부 스캐너
US9158161B2 (en) 2013-10-01 2015-10-13 Kyungpook National University Industry-Academic Cooperation Foundation Pattern generator using liquid crystal and method thereof
KR101708344B1 (ko) * 2015-06-10 2017-02-20 주식회사 울프슨랩 3차원 스캐닝 시스템
CA3019747A1 (en) 2016-04-05 2017-10-12 Establishment Labs S.A. Medical imaging systems, devices, and methods

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20010070594A (ko) * 2001-05-25 2001-07-27 김종성 휴대용 스캐닝 장치 및 그에 따른 스캐닝 방법
KR20010097567A (ko) * 2000-04-24 2001-11-08 이건우 입체 물체 스캐너 및 그 스캐너를 이용한 3ｄ 이미지출력장치
JP3336200B2 (ja) * 1995-12-12 2002-10-21 シャープ株式会社 要素ホログラムパネルを有する３次元像表示装置
KR20040006747A (ko) * 2002-07-15 2004-01-24 (주) 케이앤아이테크놀로지 입체물 스캐너

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3336200B2 (ja) * 1995-12-12 2002-10-21 シャープ株式会社 要素ホログラムパネルを有する３次元像表示装置
KR20010097567A (ko) * 2000-04-24 2001-11-08 이건우 입체 물체 스캐너 및 그 스캐너를 이용한 3ｄ 이미지출력장치
KR20010070594A (ko) * 2001-05-25 2001-07-27 김종성 휴대용 스캐닝 장치 및 그에 따른 스캐닝 방법
KR20040006747A (ko) * 2002-07-15 2004-01-24 (주) 케이앤아이테크놀로지 입체물 스캐너

Also Published As

Publication number Publication date
WO2010047523A2 (ko) 2010-04-29
KR100892875B1 (ko) 2009-04-15

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