WO2009136647A1 - ポジ型感光性樹脂組成物、硬化膜、保護膜及び絶縁膜、並びにそれを用いた半導体装置及び表示体装置 - Google Patents
ポジ型感光性樹脂組成物、硬化膜、保護膜及び絶縁膜、並びにそれを用いた半導体装置及び表示体装置 Download PDFInfo
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/085—Photosensitive compositions characterised by adhesion-promoting non-macromolecular additives
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08L—COMPOSITIONS OF MACROMOLECULAR COMPOUNDS
- C08L77/00—Compositions of polyamides obtained by reactions forming a carboxylic amide link in the main chain; Compositions of derivatives of such polymers
- C08L77/06—Polyamides derived from polyamines and polycarboxylic acids
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- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09D—COATING COMPOSITIONS, e.g. PAINTS, VARNISHES OR LACQUERS; FILLING PASTES; CHEMICAL PAINT OR INK REMOVERS; INKS; CORRECTING FLUIDS; WOODSTAINS; PASTES OR SOLIDS FOR COLOURING OR PRINTING; USE OF MATERIALS THEREFOR
- C09D177/00—Coating compositions based on polyamides obtained by reactions forming a carboxylic amide link in the main chain; Coating compositions based on derivatives of such polymers
- C09D177/06—Polyamides derived from polyamines and polycarboxylic acids
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/022—Quinonediazides
- G03F7/0226—Quinonediazides characterised by the non-macromolecular additives
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/075—Silicon-containing compounds
- G03F7/0751—Silicon-containing compounds used as adhesion-promoting additives or as means to improve adhesion
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/075—Silicon-containing compounds
- G03F7/0755—Non-macromolecular compounds containing Si-O, Si-C or Si-N bonds
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/26—Processing photosensitive materials; Apparatus therefor
- G03F7/40—Treatment after imagewise removal, e.g. baking
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- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08G—MACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
- C08G77/00—Macromolecular compounds obtained by reactions forming a linkage containing silicon with or without sulfur, nitrogen, oxygen or carbon in the main chain of the macromolecule
- C08G77/60—Macromolecular compounds obtained by reactions forming a linkage containing silicon with or without sulfur, nitrogen, oxygen or carbon in the main chain of the macromolecule in which all the silicon atoms are connected by linkages other than oxygen atoms
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08L—COMPOSITIONS OF MACROMOLECULAR COMPOUNDS
- C08L2203/00—Applications
- C08L2203/20—Applications use in electrical or conductive gadgets
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08L—COMPOSITIONS OF MACROMOLECULAR COMPOUNDS
- C08L83/00—Compositions of macromolecular compounds obtained by reactions forming in the main chain of the macromolecule a linkage containing silicon with or without sulfur, nitrogen, oxygen or carbon only; Compositions of derivatives of such polymers
- C08L83/16—Compositions of macromolecular compounds obtained by reactions forming in the main chain of the macromolecule a linkage containing silicon with or without sulfur, nitrogen, oxygen or carbon only; Compositions of derivatives of such polymers in which all the silicon atoms are connected by linkages other than oxygen atoms
Definitions
- the present invention relates to a positive photosensitive resin composition, a cured film, a protective film, an insulating film, and a semiconductor device and a display device using the same.
- polyimide resins having excellent heat resistance and excellent electrical and mechanical properties have been used for surface protective films and interlayer insulating films of semiconductor devices.
- polybenzoxazole resin which is considered to have good moisture resistance reliability, has begun to be used.
- a photosensitive resin composition has been developed that allows a part of the relief pattern forming process to be simplified by imparting photosensitivity to the resin itself.
- a positive type photosensitive resin composition composed of a polybenzoxazole precursor that can be developed with an alkaline aqueous solution and a diazoquinone compound as a photosensitizer has been developed with further improvements from the viewpoint of safety. (See Patent Document 1).
- the production of the relief pattern of the positive photosensitive resin composition will be described from the development mechanism.
- the exposed part (hereinafter exposed part) and the unexposed part (hereinafter unexposed part) I can do it.
- the diazoquinone compound present in this unexposed area is Insoluble and interacts with the resin to become more resistant to aqueous solutions.
- the diazoquinone compound present in the exposed area undergoes a chemical change by the action of actinic radiation, becomes soluble in an alkaline aqueous solution, and promotes dissolution of the resin. Then, by utilizing the difference in solubility between the exposed portion and the unexposed portion and dissolving and removing the exposed portion, a relief pattern of only the unexposed portion can be produced.
- Patent Document 1 Japanese Patent Publication No. 1 4 6 8 6 2 Summary of Invention
- the present invention has been made in view of the above circumstances, and the object of the present invention is to provide adhesion between the coating film and the substrate after the development process and adhesion between the cured film and the substrate after the humidity treatment. Another object of the present invention is to provide a positive-type photosensitive resin composition that is excellent in storage stability. It is another object of the present invention to provide a cured film, a protective film, an insulating film, and a semiconductor device and a display device using the cured film that have excellent adhesion to a substrate after humidity treatment.
- Alkali-soluble resin (A), photosensitizer (B), and general formula (1) A positive-type photosensitive resin composition comprising the key compound (c) shown.
- R 3 is a hydroxyl group, mono-O—R 5 , an alkyl group, an acyloxy group, or a cycloalkyl group, which may be the same or different.
- R 4 is a hydroxyl group, a carboxyl group, or a chromatography 0- 1 5 or over .00- R 5, identical or different.
- h is 0-8 integer
- i is an integer of 0 to 8.
- R 5 is an organic group having 1 to 15 carbon atoms, where when there are a plurality of R 3 s , they may be different or the same, and when R 3 has no hydroxyl group, R 4 is at least one.
- D in formula (3-5) is one CH 2 —, one CH (CH 3 ) one, one C (CH 3 ) 2 —, — O—, — S—, 1 S 0 2 —, 1 C0_, 1 NHCO—, 1 C (CF 3 ) 2 — or a single bond
- E in formula (3-6) is 1 CH 2 _, -CH (CH 3 )
- R 6 is an alkyl group, an alkoxy group, an acyloxy group, or a cycloalkyl group, and may be the same or different. It is an integer from 1 to 3.
- the key of the key compound (C) represented by the general formula (1) is an alkylene group having 6 to 8 carbon atoms, according to any one of [1] to [3] Positive photosensitive resin composition.
- the — of the key compound (C) represented by the general formula (1) is a structure represented by the general formula (4) [1] to [4]
- the positive photosensitive resin composition t according to any one of
- R 7 is an alkyl group, an alkoxy group, an acyloxy group or a cycloalkyl group, and may be the same or different.
- J is an integer of 0 to 4.
- Z is Single bond, 1 CH 2 —,-CH (CH 3 ) or 1 C (CH 3 ) 2 —.
- R ⁇ — of the key compound (C) represented by the general formula (1) is one or more of the structures represented by the formula (5) [ [1] The positive photosensitive resin composition according to any one of [5].
- a protective film comprising the cured film according to [8].
- [1 1] A semiconductor device comprising the cured film according to [8].
- a positive photosensitive resin composition having excellent adhesion between a coating film after a development process and a substrate and excellent adhesion between a cured film after humidity treatment and the substrate and excellent storage stability. be able to.
- the positive photosensitive resin composition of the present invention comprises an alkali-soluble resin (A), a photosensitive agent (B), and a key compound (C) represented by the general formula (1). It is a resin composition.
- the silicon compound (C) represented by the general formula (1) is an alkylene group having 6 to 8 carbon atoms.
- one of the key compounds (C) represented by the general formula (1) is one or two of the structures represented by the formula (5). More than a seed.
- the cured film of the present invention is composed of a cured product of the positive photosensitive resin composition described above.
- the protective film and the insulating film of the present invention are composed of the cured film described above.
- the semiconductor device and the display device of the present invention have the cured film described above.
- the alkali-soluble resin (A) according to the present invention is not particularly limited, and examples thereof include acrylic resins such as a talesol-type novolak resin, a hydroxystyrene resin, a methacrylic acid resin, and a methacrylic ester resin.
- examples thereof include cyclic resins, cyclic olefin-based resins containing hydroxyl groups, strong hydroxyl groups, polyamide-based resins, and the like.
- polyamide resin is preferable from the viewpoints of excellent heat resistance and good mechanical properties. Specifically, it has at least one of a polybenzoxazole structure and a polyimide structure, and has a main chain or a side chain.
- Examples thereof include a resin having a hydroxyl group, a carboxyl group, an ether group or an ester group, a resin having a polybenzoxazole precursor structure, a resin having a polyimide precursor structure, and a resin having a polyamic acid ester structure.
- Examples of such a polyamide resin include a polyamide resin having a repeating unit represented by the general formula (2).
- R 3 is a hydroxyl group, _0_R 5 , alkyl group, acyloxy group or cycloalkyl group, which may be the same or different.
- R 4 is a hydroxyl group, carboxyl A group, _0—R 5 or one COO—R 5 , which may be the same or different, h is an integer from 0 to 8, i is an integer from 0 to 8.
- R 5 is a carbon number from 1 to 1 5 is a organic group. here, if there are a plurality of R 3, if no hydroxyl groups as may. R 3 be the same or different, respectively, R 4 is one at least is to be a carboxyl group In addition, when R 4 has no carboxyl group, at least one R 3 must be a hydroxyl group.
- R 5 is an organic group of from 1 1 to 5 carbon atoms It is a group. If necessary, a hydroxyl group or a carboxyl group may be protected with R 5 .
- R 5 examples include formyl group, methyl group, ethyl group, propyl group, isopropyl group, tertiary butyl group, tertiary butoxycarbonyloprenole group, phenyl group, benzyl group, tetrahydrofuranyl group, tetrahydrobiranyl group. Etc.
- Examples of X in the general formula (2) include aromatic rings such as benzene ring and naphthalene ring, heterocyclic skeletons such as bisphenol skeleton, pyrrole skeleton and furan skeleton, and siloxane skeletons.
- aromatic rings such as benzene ring and naphthalene ring
- heterocyclic skeletons such as bisphenol skeleton, pyrrole skeleton and furan skeleton
- siloxane skeletons A preferred structure is represented by the formula (6).
- X may be one type or two or more types.
- A is one CH 2 —,-CH (CH 3 ) one,-C (CH 3 ) 2 —, one O—, — S—, _ S ⁇ 2 —, 1 CO—, 1 NHCO—, — C (CF 3 ) 2 — or a single bond
- R 8 is selected from an alkyl group, an alkyl ester group, an alkyl ether group, a benzyl ether group and a halogen atom. one are shown, if R 8 have multiple, respectively Re R 8 Waso may be the same or different.
- R 9 represents one selected hydrogen atom, alkyl group, from alkyl glycol ester Moto ⁇ Pi halogen atom.
- k is an integer of 0 to 4.
- R 10 , R! R 2 and R 3 are organic groups. —As shown in general formula (2), 0 to 8 R 3 are bonded to X (in formula (6), R 3 is omitted).
- the structure represented by the formula (7) is preferable because the heat resistance and mechanical properties are particularly excellent.
- Equation (7)
- E in formula (7-6) is _ CH 2 _,-CH ( CH 3 ) — or 1 C (CH 3 ) 2 —.
- R 6 is any one of an alkyl group, an alkoxy group, an acyl group, and a cycloalkyl group, and may be the same or different.
- R 14 represents one selected from an alkyl group, an alkyl ester group, and a halogen atom, and may be the same or different from each other.
- g is an integer of 1 to 3, and 1 is an integer of 0 to 4.
- the structure represented by the formula (3) is particularly preferable.
- Polyamide resin having a repeating unit represented by the general formula (2) X if R 3 is attached to X, X to which R 3 is attached
- the structure represented by the formula (3) by combining with the key compound (C) represented by the general formula (1), the adhesion between the cured film after humidity treatment and the substrate is increased. be able to.
- D in the formula (3-5) is one CH 2 _, one CH (CH 3 ) one,-C (CH 3 ) 2 —, — O— , 1 S—, — S 0 2 —, 1 CO—, 1 NHCO—, — C (CF 3 ) 2 — or a single bond
- E in formula (3-6) is 1 CH 2 —, 1 CH (CH 3 ) — or 1 C (CH 3 ) 2 —
- R 6 is an alkyl group, an alkoxy group, an acyloxy group, or an alkyl group, which may be the same or different
- G is an integer from 1 to 3.
- Y is an organic group, and examples thereof include those similar to X.
- an aromatic ring such as a benzene ring and a naphthalene ring, a bisphenol skeleton, and the like.
- Y is It can be one type or two or more types.
- Equation (8)
- R 15 represents an alkyl group, aralkyl kill ester group, alkyl ether group, one selected from the benzyl ether group and a halogen atom
- R 15 is When there are a plurality of R 15 s , they may be the same or different 6 represents one selected from a hydrogen atom, an alkyl group, an alkyl ester group and a halogen atom
- A represents one CH 2 —, one CH (CH 3 ) One, one C (CH 3 ) 2 —, one O—, one S—, — S ⁇ 2 —, one CO—, one NHCO—, one C (CF 3 ) 2 —, or a single bond. is 0 It is an integer of ⁇ 4.
- R 17 , 1 18 and 1 19 are organic groups. )
- preferred structures include those represented by the formula (9) or the formula (10) in terms of particularly excellent heat resistance and mechanical characteristics.
- R 2 is selected from an alkyl group, an alkyl ester group, an alkyl ether group, a benzyl ether group, and a halogen atom.
- R 21 represents one selected from a hydrogen atom or an organic group having 1 to 15 carbon atoms, and n is an integer of 0 to 4.
- the structure represented by the formula (11) is particularly preferable. (If R 4 is bonded to Y, Y R 4 is engaged binding) made of Polyamide resins Y having a repeating unit represented by the general formula (2) force, represented by the formula (1 1) In the case of such a structure, the adhesion between the cured film after humidity treatment and the substrate can be enhanced by combining with the silicon compound (C) represented by the general formula (1).
- R 2 is selected from an alkyl group, an alkyl ester group, an alkyl ether group, a benzyl ether group, and a halogen atom.
- R 21 represents one selected from a hydrogen atom or an organic group having 1 to 15 carbon atoms, and n is an integer from 0 to 4.
- the polyamide resin having a repeating unit represented by the above general formula (2) is a polymer having a molecular chain in which the repeating unit represented by the general formula (2) is repeated as a main chain.
- the repeating units represented by the general formula (2) present in each of the polyamide-based resins having the repeating unit represented by the general formula (2) may all have the same structure, or the general formula ( The repeating unit represented by the general formula (2) present in each of the polyamide-based resins having the repeating unit represented by 2) is different within the structure represented by the general formula (2). It may be a structure.
- the main chain of the polyamide resin having the repeating unit represented by the general formula (2) is composed of X, R 3 , h, Y, R 4 and i all having the same repeating unit
- the main chain of the polyamide-based resin having the repeating unit represented by the general formula (2) may be composed of a combination of repeating units having different X, R 3 , h, Y, R and i. Good.
- the polyamide resin having the repeating unit represented by the general formula (2) may be one kind or a combination of two or more kinds.
- the polyamide resin having a repeating unit represented by the general formula (2) is an amino group at the end of the main chain consisting of repeating repeating units represented by the general formula (2), and the amino group is an alkenyl group. It is preferably capped as an amide using an acid anhydride containing an aliphatic group or cyclic compound group having at least one group or alkynyl group. This improves the storage stability.
- Examples of such a group derived from an acid anhydride containing an aliphatic group or a cyclic compound group having at least one alkenyl group or alkynyl group after reacting with an amino group include, for example, formula (1 2) or a group represented by the formula (1 3). These may be one type or two or more types.
- particularly preferred groups include a group represented by the formula (14).
- a group derived from an acid anhydride containing an aliphatic group or a cyclic compound group having at least one alkenyl group or alkynyl group after reacting with an amino group is a group represented by the formula (14): Especially, the storage stability is improved.
- the terminal acid in the polyamide resin having a repeating unit represented by the general formula (2) is an aliphatic group having at least one alkenyl group or alkynyl group. It may be capped as an amide using an amine derivative containing a group or a cyclic compound group.
- the polyamide-based resin having a repeating unit represented by the general formula (2) according to the present invention has at least one of the side chain and the terminal of the polyamide-based resin having a repeating unit represented by the general formula (2). It may have a group containing a nitrogen-containing cyclic structure. This improves adhesion to metal wiring (especially copper wiring).
- Examples of the group having the nitrogen-containing cyclic structure include, for example, 1- (5- 1 H-triazol) methylamino group, 3- (1 H-pyrazol) amino group, 4- (1 H-pyrazol) amino group, 5- ( 1 H-pyrazol) amino group, 1 1 (3 — 1 H-pyrazol) methylamino group, 1 1 (4-1 H-virazol) methylamino group, 1-(5-1 H-pyrazol) methylamino group, (1 H-tetrazol-5-yl) amino group, 1- (1H-tetrazol-5-yl) methyl-amino group, 3- (1H-tetrazol-5-yl) benzenamino group and the like. Of these, it is shown by the formula (15) Groups are preferred. When the group of the nitrogen-containing cyclic structure is a group represented by the formula (15), the adhesion to copper and copper alloy metal wiring is improved.
- Examples of the photosensitizer (B) according to the present invention include estenoles of a phenol compound and 1,2-naphthoquinone-1,2-diadi-5-sulfonic acid or 1,2-naphthoquinone-1,2-diazido-4-sulfonic acid. Can be mentioned. Specifically, ester compounds represented by the formulas (16) to (19) are listed.
- the photosensitizer (B) may be one type or a combination of two or more types.
- Q is selected from a hydrogen atom and any one of structures represented by formula (20) and formula (21).
- at least one of Q of each compound is a structure represented by formula (20) or formula (21).
- the content of the photosensitizer (B) according to the present invention is preferably from 1 to 50 parts by weight, particularly preferably from 10 to 40 parts by weight, based on 100 parts by weight of the alkali-soluble resin (A).
- the content of the photosensitive agent (B) is in the above range, the sensitivity is particularly excellent.
- the key compound (C) according to the present invention is a key compound represented by the general formula (1).
- the positive photosensitive resin composition contains the silicon compound (C) represented by the general formula (1)
- the adhesion between the coating film after the development process and the substrate and the cured film after the humidity treatment and Adhesion test in accordance with JISD 0 2 0 2 after humidity treatment performed after the heat treatment process (described later) because the fine adhesion of the relief pattern is not seen in the development process due to improved adhesion to the substrate
- the silicon compound (C) represented by the general formula (1) has a high affinity with the alkali-soluble resin (A).
- the alkoxysilane group interacts with the substrate, it is considered that the adhesion between the coating film and the substrate after the development process and the adhesion between the cured film and the substrate are improved.
- the positive photosensitive resin composition containing the silicon compound (c) represented by the general formula (1) is excellent in storage stability when left at room temperature. This is thought to be because the key compound (C) represented by the general formula (1) has a hydrophobic structure.
- Examples of the alkylene group having 5 to 30 carbon atoms related to R in the general formula (1) include a pentylene group, a hexylene group, a heptylene group, an octylene group, a nonylene group, a decylene group, an undecylene group, and a dodecylene group. Of these, a hexylene group, a heptylene group and an octylene group having 6 to 8 carbon atoms are preferred. If the number of carbon atoms in the general formula (1) is less than the above range, the hydrophilicity is too strong and the affinity with the alkaline aqueous solution is high. , Adhesion in the developing process is lowered.
- the organic group having at least one aromatic ring in the general formula (1) is not particularly limited, but one example is the structure represented by the general formula (4). It is done.
- R 7 is an alkyl group, an alkoxy group, an acyloxy group or a cycloalkyl group, and may be the same or different.
- J is an integer of 0 to 4.
- Z is Single bond, _CH 2 —,-CH (CH 3 ) or C (CH 3 ) 2 —
- the adhesion between the coating film and the substrate after the development process and the adhesion between the cured film after the humidity treatment and the substrate are high, and the storage stability is excellent.
- One or more of the structures represented by formula (5) are particularly preferred.
- R 2 in the general formula (1) is an alkyl group having 1 to 10 carbon atoms, and is not particularly limited, but is a methyl group, an ethyl group, a propyl group, an isopropyl group, a butyl group, or a secondary ptyl group.
- a methyl group or an ethyl group is preferred.
- the content of the key compound (C) represented by the general formula (1) is not particularly limited, but it is 0.05 to 50 to 100 parts by weight of the alkali-soluble resin (A). Part by weight is preferred, and 0.1 to 20 parts by weight is particularly preferred.
- the content of the key compound (C) represented by the general formula (1) is within the above range, the adhesion between the coating film and the substrate after the development process and the cured film and substrate after the humidity treatment are reduced.
- the storage stability of the positive photosensitive resin composition can be increased.
- the key compound (C) represented by the general formula (1) is not particularly limited.
- the key compound in the case where is an alkylene group having 5 to 30 carbon atoms in the general formula (1) examples include bis (trimethoxysilyl) hexane, bis (triethoxysilyl) hexane, bis (trimethoxysilyl) octane, bis (trimethoxysilyl) octane, and bis (trimethoxy).
- Silyl) decane bis (trie 1, xylylyl) decane, etc.
- the chemical compound (C) in the case where is an organic group having at least one aromatic ring Bis (trimethoxysilyl) benzene, bis (trioxysilyl) benzene, bis (trioxysilyl) biphenyl, bis (trimethoxysilyl) biphenyl, methylenebis (toluene) And isopropylidenebis (trimethoxysilyl) benzene, isopropylidenebis (trimethoxysilyl) benzene, and isopropylidenebis (trimethoxysilyl) benzene.
- bis (trimmer) is excellent in the adhesion between the coating film and the substrate after the imaging process, the adhesion between the cured film and the substrate after the humidity treatment, and the storage stability of the positive photosensitive resin composition.
- Toxisilyl) hexane, bis (triethoxysilyleno) hexane, bis (trimethoxysilyl) biphenyl, and bis (triethoxysilyl) biphenyl are preferred.
- the key compound (C) represented by the general formula (1) may be one kind or a combination of two or more kinds.
- the positive photosensitive resin composition of the present invention is a compound having a phenolic hydroxyl group for the purpose of improving the scum at the time of patterning with high sensitivity.
- a specific structure of the compound (D) having a phenolic hydroxyl group includes a compound represented by the formula (2 2). These may be one kind or a combination of two or more kinds.
- the content of the compound (D) having a phenolic hydroxyl group is not particularly limited, but is preferably 1 to 30 parts by weight, and 1 to 20 parts by weight with respect to 100 parts by weight of the alkali-soluble resin (A). Is particularly preferred.
- the content of the compound having a phenolic hydroxyl group (D) is within the above range, the occurrence of scum during development is suppressed, and the sensitivity is improved by promoting the solubility of the exposed area.
- the positive photosensitive resin composition of the present invention may be an acrylic, silicone, fluorine, bule, etc. leveling agent, or a key compound (C) represented by the general formula (1) if necessary.
- Other additives such as a silane coupling agent may be contained.
- silane coupling agent examples include 3-glycidoxypropyltrimethyoxysilane, 3-glycidoxypropylmethylgertoxysilane, 3-dalididoxypropyltriethyoxysilane, and p-stilyltrimethyl.
- 3-isocyanate propyltriethoxysilane and a silane coupling agent obtained by reacting a silicon compound having an amino group with an acid dianhydride or an acid anhydride, and the like. Absent.
- the amino compound having an amino group related to the silane-powered coupling agent is not particularly limited, and examples thereof include 3-aminopropyltrimethoxysilane, N- (2-aminoethyl) 13-aminopropyltrimethoxysilane, Examples include 3-aminopropylmethyldimethoxysilane, N- (2-aminoethyl) -1-3-aminopropyltriethoxysilane, and 3-aminopropyltriethoxysilane.
- the acid anhydride related to the silane coupling agent is not particularly limited, and examples thereof include maleic anhydride, maleic anhydride, cyano maleic anhydride, cytoconic acid, and phthalic anhydride. Can be mentioned.
- the acid anhydrides may be used alone or in combination of two or more.
- the acid dianhydride according to the silane coupling agent is not particularly limited. For example, pyromellitic acid dianhydride, benzene monoanhydride
- the storage stability of the positive photosensitive resin composition is Bis (3,4-dicarboxyphenyl) ether dianhydride, which increases the adhesion between the coating film and the substrate after the development process and the adhesion between the cured film after humidity treatment and the substrate such as a silicon wafer.
- the positive photosensitive resin composition of the present invention is used in the form of a varnish by dissolving these components in a solvent.
- Solvents include N-methyl-2-pyrrolidone, ⁇ -butarate rataton, ⁇ , ⁇ -dimethylacetamide, dimethino ksunoreoxide, diethylene glycol dimethino ether, diethylene glycol / legetic ether, diethylene glycol Koi / Resipit / Rye Tenole, Propylene Glycole Monomethinoleate Tenole, Dipropylene Glycol Monomethyl Ether, Propylene Daricol Monomethyl Ether Acetate, Methyl Lactate, Lactyl Ethyl Lactate, Butyl Lactate, Methyl 1, 1, 3-Butylene Glycol Nole Examples include acetate, 1,3-butyleneglycolone 3-monomethy / leetenore, methyl pyruvate, ethyl pyruvate,
- the usage method of the positive photosensitive resin composition of this invention is demonstrated.
- the composition is applied to a suitable support (substrate), for example, a silicon wafer, a ceramic substrate, an aluminum substrate or the like.
- a suitable support for example, a silicon wafer, a ceramic substrate, an aluminum substrate or the like.
- the final film thickness after curing is 0.1 to 30 m. If the film thickness is below the lower limit value, it will be difficult to fully function as a protective surface film of the semiconductor element. If the upper limit value is exceeded, it will be difficult to obtain a fine processing pattern. Takes a long time and the throughput decreases.
- Application methods include spin coating using a spinner, spray coating using a spray coater, dipping, printing, roll coating, and the like.
- the desired pattern shape is irradiated with actinic radiation.
- actinic radiation X-rays, electron beams, ultraviolet rays, visible rays, and the like are used, but those having a wavelength of 20 to 500 nm are preferable.
- a relief pattern is obtained by dissolving and removing the irradiated portion with a developer.
- Examples of the developer include sodium hydroxide, potassium hydroxide, sodium carbonate, sodium silicate, sodium metasilicate, aqueous alkalis such as ammonia water, primary amines such as ethylamine and n-propylamine, jetylamine, Secondary amines such as di-propylamine, tertiary amines such as triethylamine, methyljetylamine, alcohol amines such as dimethylethanolamine, triethanolamine, tetramethylammonium hydroxide, tetraethylammoni Aqueous solutions of quaternary ammonium salts such as umhydroxide, etc., and aqueous solutions to which water-soluble organic solvents such as methanol and alcohols such as ethanol and surfactants are added in an appropriate amount are suitable. Used for. As a developing method, a method such as spray, nozzle, dipping, or ultrasonic can be applied.
- the relief pattern formed by development is rinsed. Use distilled water as the rinse solution.
- the coating film is heat-treated to form an oxazole ring, an imide ring, or an oxazole ring and an imidazole ring in the alkali-soluble resin (A) in the resin composition, and the resin composition is cured. Perform the process to obtain the final pattern (cured film) with high heat resistance.
- the heat treatment temperature is preferably from 180 ° C. to 3800 ° C., more preferably from 200 ° C. to 35 ° C.
- the cured film of the present invention that is, the cured film composed of the cured product of the positive photosensitive resin composition of the present invention
- the cured film which is a cured product of the positive photosensitive resin composition of the present invention, is used not only for semiconductor devices such as semiconductor elements but also for display device devices such as TFT type liquid crystal and organic EL, and interlayer insulation for multilayer circuits. It is also useful as a force percoat for films, flexible copper-clad plates, solder resist films, and liquid crystal alignment films.
- Examples of semiconductor device applications include the positive type of the present invention described above on a semiconductor element.
- An insulating film such as an interlayer insulating film formed by forming a cured film of the positive photosensitive resin composition of the present invention on a circuit formed on an element, an ⁇ -ray blocking film, a planarizing film, a protrusion (resin post ) And partition walls.
- Examples of the display device application include a protective film formed by forming a cured film of the positive photosensitive resin composition of the present invention on a display element, an insulating film for a TF ⁇ element or a color filter, or flattening. Examples thereof include a film, a protrusion for an MV vertical liquid crystal display device, a partition wall for an organic EL element cathode, and the like.
- the positive photosensitive resin composition layer of the present invention patterned on the substrate on which the display element and the color filter are formed is formed by the above method. It is a method. High transparency is required for display device applications, especially for insulating films and flattening films. However, by introducing a post-exposure process before the positive photosensitive resin composition layer of the present invention is cured, it is transparent. A resin layer having excellent properties can also be obtained, which is more preferable in practical use.
- Phenol represented by the formula (Q-1) 1 5.82 g (0.025 mol) and triethylamine 8.40 g (0.08 3 mol) were thermometer, stirrer, feedstock inlet, dry nitrogen gas The solution was placed in a four-necked separable flask equipped with an introduction tube, and tetrahydrofuran 1 35 g was added and dissolved. After cooling the reaction solution to 10 ° C or lower, add 22.30 g (0.08 3 mol) of 1,2-naphthoquinone-2-diazide 4-senophoninolectride to tetrahydro Dorofuran beat gradually drops as not to exceed 1 0 D C with 1 00 g.
- the mixture was filtered through a Teflon (registered trademark) filter having a pore diameter of 0.2 m to obtain a positive photosensitive resin composition.
- the positive photosensitive resin composition was applied onto a silicon wafer using a spin coater, and pre-betaged at 120 ° C. for 4 minutes on a hot plate to obtain a coating film having a film thickness of about 1 1.
- a mask made by Toppan Printing Co., Ltd. (test chart No. 1: left and removed patterns with a width of 0.88 to 50 ⁇ m are drawn) and an i-line stepper ( Using Nikon Corporation 4 4 2 5 ⁇ ), change the exposure in steps of 20 m J / cm 2 from 2 0 m JZ cm 2 to 1 5 60 m J / cm 2 Irradiated.
- the exposed area was dissolved by developing the unexposed film for 1.5 to 2.5 ⁇ m. After removing, it was rinsed with pure water for 10 seconds. After the development process, the area where the mask opening diameter is 3 ⁇ m (3 W m line) in the area where the exposure is greater than 100 m J / cm 2 to 30 OmjZ cm 2 than the exposure where the pattern was formed The presence or absence was confirmed. After the development process, E is the exposure dose where the aperture width is 10 nm at the part where the mask aperture diameter is 10 / im (10 ⁇ line).
- the film was cured by heat treatment at 150 ° C / 30 minutes + 3 20 ° C / 30 minutes at an oxygen concentration of 1, O 2 Oppm or less, and a cured film was obtained.
- This sample was subjected to a humidity treatment (pressure cooker) test; 1 25 ° C., 100%, 0.2 MPa, and continuously treated for 24 hours, and then evaluated in accordance with JIS D 0 202. As a result, the number of peeled grids was zero. Considering that even if one of the 100 grids is peeled off, it is a practical problem, it was confirmed that the film exhibits good adhesion even after humidity treatment.
- the viscosity (T 1) of the composition was measured with an E-type viscometer (TV-22 type 2, manufactured by Toki Sangyo). As a result, the viscosity was 9 88 mPa ⁇ s.
- the positive photosensitive resin composition was allowed to stand at room temperature, and after 20 days, the viscosity (T 2) was measured again in the same manner as described above, and the viscosity was 10 78 mPa ⁇ s.
- the viscosity increase rate was calculated by ( ⁇ (T 2)-(T 1) ⁇ / (T 1)) X 1 0 0 (%), it was 9%. Since the rate of increase in viscosity in 10 days is 10% or less, which is a practically acceptable level, it was confirmed that the positive photosensitive resin composition has good storage stability at room temperature. It was done.
- a positive photosensitive resin composition was prepared and evaluated in the same manner as in Example 1 except that the alkali-soluble resin (A-2) was used instead of the alkali-soluble resin (A-1).
- a positive photosensitive resin composition was prepared and evaluated in the same manner as in Example 2 except that the alkali-soluble resin (A-2) was used instead of the alkali-soluble resin (A-1).
- alkali-soluble resin In the synthesis of the alkali-soluble resin in Example 1, the dicarboxylic acid derivative (active ester) was reduced to ⁇ .54 mol, and instead, 4, 4 and 1,6-dioxydiphthalic anhydride was added 0.36 mol and reacted in the same manner. Then, alkali-soluble resin (A-3) was synthesized.
- a positive photosensitive resin composition was prepared and evaluated in the same manner as in Example 1 except that the alkali-soluble resin (A-3) was used instead of the alkali-soluble resin (A-1).
- the alkali-soluble resin (A-3) was used instead of the alkali-soluble resin (A-1).
- a positive-type photosensitive resin composition was prepared and evaluated in the same manner as in Example 2 except that the Al force soluble resin (A-1) was used instead of the Al force soluble resin (A-1). .
- a positive photosensitive resin composition was prepared and evaluated in the same manner as in Example 3 except that the silicon compound represented by the formula (C-1) was not used.
- Example 3 In the same manner as in Example 3, except that the key compound represented by the formula (C-1) was replaced with 10 g of the key compound represented by the formula (C-13), the positive photosensitive resin. A composition was prepared and evaluated.
- a composition was prepared and evaluated.
- Example 3 In the same manner as in Example 3, except that the key compound represented by the formula (C-1) was replaced by 10 g of the key compound represented by the formula (C-8) instead of the key compound 10 g. A composition was prepared and evaluated.
- Examples 1 to 10 showed no peeling of the coating film in the development process and the adhesion evaluation after the humidity treatment, and the adhesion to the substrate. It turns out that the nature is good. In the storage stability evaluation, 10 The daily room temperature viscosity increase rate is 10% or less, which is considered to be excellent in stability.
- Example 1 1 is E in the development process. No peeling was observed with p , but peeling was observed at locations where 150 m jZ cm 2 exposure was large. Moreover, in the adhesion evaluation after the humidity treatment, no peeling of the cured film was observed, indicating that the adhesion between the cured film and the substrate was good. Also in the storage stability evaluation, the room temperature viscosity increase rate for 10 days is 10% or less, and it is considered that the stability is also excellent. Table 1
- the positive photosensitive resin composition of the present invention has high adhesion between the coating film and the substrate after the development process, high adhesion between the cured film after humidity treatment and the substrate, and excellent storage stability. It is suitably used for semiconductor elements, surface protective films for display elements, interlayer insulating films, and the like.
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Abstract
Description
Claims
Priority Applications (5)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2009801162369A CN102016718B (zh) | 2008-05-07 | 2009-04-28 | 正型感光性树脂组合物、固化膜、保护膜和绝缘膜以及使用它们的半导体装置和显示装置 |
| EP09742771.0A EP2280309B1 (en) | 2008-05-07 | 2009-04-28 | Positive-type photosensitive resin composition, cured film, protective film, insulating film, and semiconductor device and display device each comprising the cured film |
| JP2010511091A JP5246607B2 (ja) | 2008-05-07 | 2009-04-28 | ポジ型感光性樹脂組成物、硬化膜、保護膜及び絶縁膜、並びにそれを用いた半導体装置及び表示体装置 |
| US12/991,125 US8492469B2 (en) | 2008-05-07 | 2009-04-28 | Positive-type photosensitive resin composition, cured film, protective film, insulating film, and semiconductor device and display device including the cured film |
| US13/922,199 US20130280654A1 (en) | 2008-05-07 | 2013-06-19 | Positive-type photosensitive resin composition, cured film, protective film, insulating film, and semiconductor device and display device including the cured film |
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2008-120846 | 2008-05-07 | ||
| JP2008120846 | 2008-05-07 |
Related Child Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| US13/922,199 Continuation US20130280654A1 (en) | 2008-05-07 | 2013-06-19 | Positive-type photosensitive resin composition, cured film, protective film, insulating film, and semiconductor device and display device including the cured film |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| WO2009136647A1 true WO2009136647A1 (ja) | 2009-11-12 |
Family
ID=41264699
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| PCT/JP2009/058728 Ceased WO2009136647A1 (ja) | 2008-05-07 | 2009-04-28 | ポジ型感光性樹脂組成物、硬化膜、保護膜及び絶縁膜、並びにそれを用いた半導体装置及び表示体装置 |
Country Status (7)
| Country | Link |
|---|---|
| US (2) | US8492469B2 (ja) |
| EP (1) | EP2280309B1 (ja) |
| JP (1) | JP5246607B2 (ja) |
| KR (1) | KR101584385B1 (ja) |
| CN (1) | CN102016718B (ja) |
| TW (1) | TWI490652B (ja) |
| WO (1) | WO2009136647A1 (ja) |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2011186432A (ja) * | 2009-12-15 | 2011-09-22 | Rohm & Haas Electronic Materials Llc | フォトレジストおよびその使用方法 |
| CN102292675A (zh) * | 2009-12-28 | 2011-12-21 | 东丽株式会社 | 正型感光性树脂组合物 |
| WO2012053052A1 (ja) * | 2010-10-19 | 2012-04-26 | 住友ベークライト株式会社 | 感光性樹脂組成物および半導体装置 |
| JP2013218265A (ja) * | 2011-11-02 | 2013-10-24 | Fujifilm Corp | ポジ型感光性樹脂組成物、硬化膜の形成方法、硬化膜、液晶表示装置、および、有機el表示装置 |
Families Citing this family (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR101932449B1 (ko) * | 2011-11-02 | 2018-12-26 | 후지필름 가부시키가이샤 | 포지티브형 감광성 수지 조성물, 경화막의 형성 방법, 경화막, 액정 표시 장치, 및 유기 el 표시 장치 |
| KR101609631B1 (ko) * | 2012-12-24 | 2016-04-06 | 제일모직 주식회사 | 포지티브형 감광성 수지 조성물, 및 이를 이용한 표시 소자용 유기 절연막 및 표시 소자 |
| TW201525064A (zh) * | 2013-12-16 | 2015-07-01 | Daxin Materials Corp | 感光樹脂組成物、感光樹脂及有機發光二極體顯示元件 |
| KR20150084206A (ko) * | 2014-01-13 | 2015-07-22 | 삼성전기주식회사 | 패키지용 기판 제조방법 |
| KR102385641B1 (ko) * | 2016-09-20 | 2022-04-12 | 다이요 홀딩스 가부시키가이샤 | 포지티브형 감광성 수지 조성물, 드라이 필름, 경화물, 프린트 배선판 및 반도체 소자 |
| CN111518272B (zh) * | 2020-04-20 | 2023-11-28 | Tcl华星光电技术有限公司 | 显示面板 |
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- 2009-04-28 EP EP09742771.0A patent/EP2280309B1/en not_active Not-in-force
- 2009-04-28 CN CN2009801162369A patent/CN102016718B/zh active Active
- 2009-04-28 US US12/991,125 patent/US8492469B2/en not_active Expired - Fee Related
- 2009-04-28 KR KR1020107024727A patent/KR101584385B1/ko active Active
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Cited By (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2011186432A (ja) * | 2009-12-15 | 2011-09-22 | Rohm & Haas Electronic Materials Llc | フォトレジストおよびその使用方法 |
| JP2017201420A (ja) * | 2009-12-15 | 2017-11-09 | ローム アンド ハース エレクトロニック マテリアルズ エルエルシーRohm and Haas Electronic Materials LLC | フォトレジストおよびその使用方法 |
| JP2019194725A (ja) * | 2009-12-15 | 2019-11-07 | ローム アンド ハース エレクトロニック マテリアルズ エルエルシーRohm and Haas Electronic Materials LLC | フォトレジストおよびその使用方法 |
| JP2021184107A (ja) * | 2009-12-15 | 2021-12-02 | ローム アンド ハース エレクトロニック マテリアルズ エルエルシーRohm and Haas Electronic Materials LLC | フォトレジストおよびその使用方法 |
| CN102292675A (zh) * | 2009-12-28 | 2011-12-21 | 东丽株式会社 | 正型感光性树脂组合物 |
| WO2012053052A1 (ja) * | 2010-10-19 | 2012-04-26 | 住友ベークライト株式会社 | 感光性樹脂組成物および半導体装置 |
| JP2013218265A (ja) * | 2011-11-02 | 2013-10-24 | Fujifilm Corp | ポジ型感光性樹脂組成物、硬化膜の形成方法、硬化膜、液晶表示装置、および、有機el表示装置 |
Also Published As
| Publication number | Publication date |
|---|---|
| US20110136952A1 (en) | 2011-06-09 |
| KR20110009669A (ko) | 2011-01-28 |
| TW201001077A (en) | 2010-01-01 |
| EP2280309B1 (en) | 2016-02-24 |
| EP2280309A1 (en) | 2011-02-02 |
| US20130280654A1 (en) | 2013-10-24 |
| TWI490652B (zh) | 2015-07-01 |
| JP5246607B2 (ja) | 2013-07-24 |
| CN102016718B (zh) | 2013-10-16 |
| KR101584385B1 (ko) | 2016-01-11 |
| JPWO2009136647A1 (ja) | 2011-09-08 |
| CN102016718A (zh) | 2011-04-13 |
| US8492469B2 (en) | 2013-07-23 |
| EP2280309A4 (en) | 2011-12-28 |
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