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WO2009031461A1 - 検体分析システム、試薬調製装置および検体処理装置 - Google Patents

検体分析システム、試薬調製装置および検体処理装置 Download PDF

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Publication number
WO2009031461A1
WO2009031461A1 PCT/JP2008/065487 JP2008065487W WO2009031461A1 WO 2009031461 A1 WO2009031461 A1 WO 2009031461A1 JP 2008065487 W JP2008065487 W JP 2008065487W WO 2009031461 A1 WO2009031461 A1 WO 2009031461A1
Authority
WO
WIPO (PCT)
Prior art keywords
regent
sample
preparation
analysis system
unit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
PCT/JP2008/065487
Other languages
English (en)
French (fr)
Inventor
Takaaki Nagai
Masaharu Shibata
Kunio Ueno
Noriyuki Nakanishi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sysmex Corp
Original Assignee
Sysmex Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sysmex Corp filed Critical Sysmex Corp
Priority to CN200880024714.9A priority Critical patent/CN101743477B/zh
Priority to EP08829554.8A priority patent/EP2187219B1/en
Priority to JP2009531204A priority patent/JP5114489B2/ja
Publication of WO2009031461A1 publication Critical patent/WO2009031461A1/ja
Priority to US12/715,755 priority patent/US8082113B2/en
Anticipated expiration legal-status Critical
Ceased legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/00584—Control arrangements for automatic analysers
    • G01N35/00594—Quality control, including calibration or testing of components of the analyser
    • G01N35/00613—Quality control
    • G01N35/00663—Quality control of consumables
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/00584—Control arrangements for automatic analysers
    • G01N35/00594—Quality control, including calibration or testing of components of the analyser
    • G01N35/00613—Quality control
    • G01N35/00663—Quality control of consumables
    • G01N2035/00673—Quality control of consumables of reagents
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T436/00—Chemistry: analytical and immunological testing
    • Y10T436/25—Chemistry: analytical and immunological testing including sample preparation
    • Y10T436/25625—Dilution

Landscapes

  • Engineering & Computer Science (AREA)
  • Quality & Reliability (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Automatic Analysis And Handling Materials Therefor (AREA)
  • Investigating Or Analysing Biological Materials (AREA)
  • Accessories For Mixers (AREA)
  • Feeding, Discharge, Calcimining, Fusing, And Gas-Generation Devices (AREA)
  • Sampling And Sample Adjustment (AREA)

Abstract

　この検体分析システムは、試薬調製部と測定部とを備え、試薬調製部は、試薬調製部の状態および試薬調製の状態の少なくとも一方を検出する状態検出部と、検出された状態情報を試薬調製部の外部のコンピュータに送信する送信部とを含み、コンピュータは、受信した状態情報をディスプレイに表示するように構成されている。
PCT/JP2008/065487 2007-09-03 2008-08-29 検体分析システム、試薬調製装置および検体処理装置 Ceased WO2009031461A1 (ja)

Priority Applications (4)

Application Number Priority Date Filing Date Title
CN200880024714.9A CN101743477B (zh) 2007-09-03 2008-08-29 检体分析系统
EP08829554.8A EP2187219B1 (en) 2007-09-03 2008-08-29 Sample analysis system comprising regent preparation device and sample treating device
JP2009531204A JP5114489B2 (ja) 2007-09-03 2008-08-29 検体分析システム、試薬調製装置および検体処理装置
US12/715,755 US8082113B2 (en) 2007-09-03 2010-03-02 Sample analysis system and reagent preparation device

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2007228025 2007-09-03
JP2007-228025 2007-09-03

Related Child Applications (1)

Application Number Title Priority Date Filing Date
US12/715,755 Continuation US8082113B2 (en) 2007-09-03 2010-03-02 Sample analysis system and reagent preparation device

Publications (1)

Publication Number Publication Date
WO2009031461A1 true WO2009031461A1 (ja) 2009-03-12

Family

ID=40428780

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2008/065487 Ceased WO2009031461A1 (ja) 2007-09-03 2008-08-29 検体分析システム、試薬調製装置および検体処理装置

Country Status (5)

Country Link
US (1) US8082113B2 (ja)
EP (1) EP2187219B1 (ja)
JP (1) JP5114489B2 (ja)
CN (1) CN101743477B (ja)
WO (1) WO2009031461A1 (ja)

Cited By (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101564545A (zh) * 2008-04-25 2009-10-28 富士胶片株式会社 内窥镜清洗消毒装置及内窥镜清洗消毒装置的消毒液调制方法
JP2010230626A (ja) * 2009-03-30 2010-10-14 Sysmex Corp 試薬調製装置および検体処理システム
JP2010230541A (ja) * 2009-03-27 2010-10-14 Sysmex Corp 試薬調製装置および検体処理システム
JP2010236916A (ja) * 2009-03-30 2010-10-21 Sysmex Corp 試薬調製装置および検体処理システム
JP2010236993A (ja) * 2009-03-31 2010-10-21 Sysmex Corp 試薬調製装置および検体処理システム
EP2233929A3 (en) * 2009-03-27 2010-12-29 Sysmex Corporation Reagent preparing apparatus and sample analyzer
CN102135477A (zh) * 2010-01-26 2011-07-27 希森美康株式会社 试剂调制装置
JP2011153867A (ja) * 2010-01-26 2011-08-11 Sysmex Corp 試薬調製装置
CN102356318A (zh) * 2009-03-18 2012-02-15 希森美康株式会社 样本分析装置
US8906302B2 (en) 2009-02-26 2014-12-09 Sysmex Corporation Reagent preparing device, specimen measuring device and reagent preparing method
US9164021B2 (en) 2009-02-26 2015-10-20 Sysmex Corporation Reagent preparing device, specimen processing system and reagent preparing method
JP2017015418A (ja) * 2015-06-29 2017-01-19 東ソー株式会社 試薬調製装置および検体分析装置
CN114930173A (zh) * 2020-01-06 2022-08-19 株式会社日立高新技术 电解质分析装置

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5553705B2 (ja) * 2010-08-04 2014-07-16 シスメックス株式会社 試薬調製装置
EP2682755B1 (en) * 2011-03-04 2019-02-27 Hitachi High-Technologies Corporation Analysis device
WO2014010184A1 (ja) * 2012-07-09 2014-01-16 富士フイルム株式会社 呈色測定装置および方法
EP3321690B1 (en) * 2015-08-26 2021-03-03 Hitachi High-Tech Corporation Automatic analysis device
CN110741257B (zh) * 2017-06-30 2023-10-20 深圳迈瑞生物医疗电子股份有限公司 样本分析仪及其驱动方法
CN109212247A (zh) * 2017-06-30 2019-01-15 深圳迈瑞生物医疗电子股份有限公司 供液装置、样本分析仪及供液装置的供液方法
JP6768118B1 (ja) 2019-06-18 2020-10-14 シスメックス株式会社 検体測定方法及び検体測定装置
US20240044929A1 (en) * 2020-11-30 2024-02-08 Beckman Coulter, Inc. Mixing heater setpoint change

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH06265555A (ja) * 1993-03-15 1994-09-22 Hitachi Sci Syst:Kk 自動化学分析装置
JPH0862852A (ja) * 1995-01-30 1996-03-08 Hitachi Plant Eng & Constr Co Ltd 現像原液の希釈装置
JPH0933538A (ja) * 1995-07-19 1997-02-07 Toa Medical Electronics Co Ltd 試薬調製装置およびその方法
JPH117324A (ja) * 1997-06-18 1999-01-12 Nomura Micro Sci Co Ltd 希薄溶液の製造方法および装置
JP2006071649A (ja) * 2001-12-05 2006-03-16 Sysmex Corp 生体試料分析装置
JP2007205763A (ja) * 2006-01-31 2007-08-16 Toshiba Medical Systems Corp 自動分析装置、キャリーオーバーチェック方法、キャリーオーバーチェックプログラム及びキャリーオーバーチェックキット

Family Cites Families (8)

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US2800056A (en) * 1947-07-30 1957-07-23 Jr Henry F Atherton Automatic aircraft rocket launcher
JP2612459B2 (ja) 1987-12-24 1997-05-21 横河電機株式会社 試薬自動調製装置
JP3288067B2 (ja) 1992-04-16 2002-06-04 株式会社東芝 自動化学分析装置
JP3630780B2 (ja) * 1995-07-25 2005-03-23 東芝プラントシステム株式会社 保護継電器の試験装置
JP2000266763A (ja) 1999-03-18 2000-09-29 Hitachi Ltd 自動分析装置
US7185288B2 (en) * 2003-07-18 2007-02-27 Dade Behring Inc. Operator interface module segmented by function in an automatic clinical analyzer
JP4832121B2 (ja) * 2006-03-10 2011-12-07 シスメックス株式会社 分析システム
JP5162177B2 (ja) * 2007-07-31 2013-03-13 シスメックス株式会社 粒子分析装置及び粒子分析方法

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH06265555A (ja) * 1993-03-15 1994-09-22 Hitachi Sci Syst:Kk 自動化学分析装置
JPH0862852A (ja) * 1995-01-30 1996-03-08 Hitachi Plant Eng & Constr Co Ltd 現像原液の希釈装置
JPH0933538A (ja) * 1995-07-19 1997-02-07 Toa Medical Electronics Co Ltd 試薬調製装置およびその方法
JPH117324A (ja) * 1997-06-18 1999-01-12 Nomura Micro Sci Co Ltd 希薄溶液の製造方法および装置
JP2006071649A (ja) * 2001-12-05 2006-03-16 Sysmex Corp 生体試料分析装置
JP2007205763A (ja) * 2006-01-31 2007-08-16 Toshiba Medical Systems Corp 自動分析装置、キャリーオーバーチェック方法、キャリーオーバーチェックプログラム及びキャリーオーバーチェックキット

Cited By (22)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101564545A (zh) * 2008-04-25 2009-10-28 富士胶片株式会社 内窥镜清洗消毒装置及内窥镜清洗消毒装置的消毒液调制方法
US9164021B2 (en) 2009-02-26 2015-10-20 Sysmex Corporation Reagent preparing device, specimen processing system and reagent preparing method
US8906302B2 (en) 2009-02-26 2014-12-09 Sysmex Corporation Reagent preparing device, specimen measuring device and reagent preparing method
CN102356318A (zh) * 2009-03-18 2012-02-15 希森美康株式会社 样本分析装置
US10054605B2 (en) 2009-03-18 2018-08-21 Sysmex Corporation Sample analyzer
US9250255B2 (en) 2009-03-18 2016-02-02 Sysmex Corporation Sample analyzer
CN102356318B (zh) * 2009-03-18 2014-02-19 希森美康株式会社 样本分析装置
CN101846691B (zh) * 2009-03-27 2013-05-08 希森美康株式会社 试剂调制装置以及检体分析装置
US9207250B2 (en) 2009-03-27 2015-12-08 Sysmex Corporation Reagent preparing device, reagent preparing method and specimen processing system
EP2233930A3 (en) * 2009-03-27 2017-08-09 Sysmex Corporation Reagent preparing device and reagent preparing method
JP2010230541A (ja) * 2009-03-27 2010-10-14 Sysmex Corp 試薬調製装置および検体処理システム
EP2233929A3 (en) * 2009-03-27 2010-12-29 Sysmex Corporation Reagent preparing apparatus and sample analyzer
JP2010236916A (ja) * 2009-03-30 2010-10-21 Sysmex Corp 試薬調製装置および検体処理システム
US8894932B2 (en) 2009-03-30 2014-11-25 Sysmex Corporation Reagent preparing device and specimen processing system
JP2010230626A (ja) * 2009-03-30 2010-10-14 Sysmex Corp 試薬調製装置および検体処理システム
JP2010236993A (ja) * 2009-03-31 2010-10-21 Sysmex Corp 試薬調製装置および検体処理システム
US10161950B2 (en) 2009-03-31 2018-12-25 Sysmex Corporation Reagent preparing device, reagent preparing method, and specimen processing system
JP2011153867A (ja) * 2010-01-26 2011-08-11 Sysmex Corp 試薬調製装置
CN102135477A (zh) * 2010-01-26 2011-07-27 希森美康株式会社 试剂调制装置
JP2011153848A (ja) * 2010-01-26 2011-08-11 Sysmex Corp 試薬調製装置
JP2017015418A (ja) * 2015-06-29 2017-01-19 東ソー株式会社 試薬調製装置および検体分析装置
CN114930173A (zh) * 2020-01-06 2022-08-19 株式会社日立高新技术 电解质分析装置

Also Published As

Publication number Publication date
US8082113B2 (en) 2011-12-20
CN101743477B (zh) 2014-06-18
CN101743477A (zh) 2010-06-16
EP2187219A1 (en) 2010-05-19
US20100161243A1 (en) 2010-06-24
EP2187219A4 (en) 2017-10-11
EP2187219B1 (en) 2020-02-26
JP5114489B2 (ja) 2013-01-09
JPWO2009031461A1 (ja) 2010-12-16

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