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WO2009025210A1 - Method and apparatus for inspecting defect of laminated film - Google Patents

Method and apparatus for inspecting defect of laminated film Download PDF

Info

Publication number
WO2009025210A1
WO2009025210A1 PCT/JP2008/064484 JP2008064484W WO2009025210A1 WO 2009025210 A1 WO2009025210 A1 WO 2009025210A1 JP 2008064484 W JP2008064484 W JP 2008064484W WO 2009025210 A1 WO2009025210 A1 WO 2009025210A1
Authority
WO
WIPO (PCT)
Prior art keywords
film
separator
main body
laminated film
inspection
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
PCT/JP2008/064484
Other languages
French (fr)
Japanese (ja)
Inventor
Hiromichi Ohashi
Kosuke Sato
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nitto Denko Corp
Original Assignee
Nitto Denko Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from JP2008207125A external-priority patent/JP2009069142A/en
Application filed by Nitto Denko Corp filed Critical Nitto Denko Corp
Priority to US12/376,276 priority Critical patent/US8045151B2/en
Priority to CN2008800008472A priority patent/CN101548177B/en
Publication of WO2009025210A1 publication Critical patent/WO2009025210A1/en
Anticipated expiration legal-status Critical
Ceased legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8914—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the material examined

Landscapes

  • Engineering & Computer Science (AREA)
  • Textile Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)

Abstract

A method for inspecting defects of a laminated film is provided with a first inspection step of inspecting existence of defects on the surface of a film main body from which a protection film is removed; a separator removing step of removing a separator from the laminated film after inspection; a second inspection step wherein existence of defects on the film main body in the vertical posture is inspected, while guiding the film main body, from which the separator is removed, to a film feeding path to the vertical direction, and inspection data is stored; a separator attaching step and a protection film attaching step for attaching the rear surface and the front surface of the inspected film main body, respectively; and a film recovery step of rolling up the inspected laminated film whereupon the protection film and the separator are attached.
PCT/JP2008/064484 2007-08-23 2008-08-12 Method and apparatus for inspecting defect of laminated film Ceased WO2009025210A1 (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
US12/376,276 US8045151B2 (en) 2007-08-23 2008-08-12 Laminated film defect inspection method and laminated film defect inspection device
CN2008800008472A CN101548177B (en) 2007-08-23 2008-08-12 Method and apparatus for inspecting defect of laminated film

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
JP2007-217251 2007-08-23
JP2007217251 2007-08-23
JP2008-207125 2008-08-11
JP2008207125A JP2009069142A (en) 2007-08-23 2008-08-11 Defect inspection method and apparatus for laminated film

Publications (1)

Publication Number Publication Date
WO2009025210A1 true WO2009025210A1 (en) 2009-02-26

Family

ID=40378116

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2008/064484 Ceased WO2009025210A1 (en) 2007-08-23 2008-08-12 Method and apparatus for inspecting defect of laminated film

Country Status (1)

Country Link
WO (1) WO2009025210A1 (en)

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP2325007A1 (en) * 2009-10-13 2011-05-25 Nitto Denko Corporation Method and system for continuously manufacturing liquid-crystal display element
JP2011237423A (en) * 2010-05-10 2011-11-24 Dongwoo Fine-Chem Co Ltd System and method for determining quality of polarization film textile stuff
US8277587B2 (en) 2008-04-15 2012-10-02 Nitto Denko Corporation Continuous method and system for manufacturing liquid-crystal display elements
CN102809842A (en) * 2009-04-10 2012-12-05 日东电工株式会社 Method of manufacturing image display device and method for manufacturing optical display unit
WO2021172089A1 (en) * 2020-02-28 2021-09-02 日東電工株式会社 Optically transmissive laminate inspection method
CN113960050A (en) * 2021-10-21 2022-01-21 邵东智能制造技术研究院有限公司 Automatic detection equipment for shading film

Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH05107149A (en) * 1991-10-18 1993-04-27 Nitto Denko Corp Optical inspection separator
JPH08113422A (en) * 1994-10-12 1996-05-07 Nitto Denko Corp Standard size cutting and feeding device for adhesive elastic body
JPH08300489A (en) * 1996-01-19 1996-11-19 Nitto Denko Corp Seal tape guide mechanism and seal tape automatic sticking device using the same
JP2003149164A (en) * 2001-11-15 2003-05-21 Nippon Spindle Mfg Co Ltd Transparent or translucent film examining method and peeling device
JP2003231214A (en) * 2002-10-22 2003-08-19 Teijin Ltd Release film
JP2004029204A (en) * 2002-06-24 2004-01-29 Hitachi Chem Co Ltd Optical sheet protecting adhesive film
JP2004149293A (en) * 2002-10-31 2004-05-27 Ishii Hyoki Corp Peeling method, peeling device, peeling / sticking method and peeling / sticking device
WO2008047712A1 (en) * 2006-10-17 2008-04-24 Nitto Denko Corporation Optical member adhering method, and apparatus using the method

Patent Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH05107149A (en) * 1991-10-18 1993-04-27 Nitto Denko Corp Optical inspection separator
JPH08113422A (en) * 1994-10-12 1996-05-07 Nitto Denko Corp Standard size cutting and feeding device for adhesive elastic body
JPH08300489A (en) * 1996-01-19 1996-11-19 Nitto Denko Corp Seal tape guide mechanism and seal tape automatic sticking device using the same
JP2003149164A (en) * 2001-11-15 2003-05-21 Nippon Spindle Mfg Co Ltd Transparent or translucent film examining method and peeling device
JP2004029204A (en) * 2002-06-24 2004-01-29 Hitachi Chem Co Ltd Optical sheet protecting adhesive film
JP2003231214A (en) * 2002-10-22 2003-08-19 Teijin Ltd Release film
JP2004149293A (en) * 2002-10-31 2004-05-27 Ishii Hyoki Corp Peeling method, peeling device, peeling / sticking method and peeling / sticking device
WO2008047712A1 (en) * 2006-10-17 2008-04-24 Nitto Denko Corporation Optical member adhering method, and apparatus using the method

Cited By (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8277587B2 (en) 2008-04-15 2012-10-02 Nitto Denko Corporation Continuous method and system for manufacturing liquid-crystal display elements
CN102809842A (en) * 2009-04-10 2012-12-05 日东电工株式会社 Method of manufacturing image display device and method for manufacturing optical display unit
CN102809842B (en) * 2009-04-10 2013-12-04 日东电工株式会社 Method of manufacturing image display device
US8821674B2 (en) 2009-04-10 2014-09-02 Nitto Denko Corporation Optical film material roll and method for manufacturing image display device using thereof
EP2325007A1 (en) * 2009-10-13 2011-05-25 Nitto Denko Corporation Method and system for continuously manufacturing liquid-crystal display element
US7976657B2 (en) 2009-10-13 2011-07-12 Nitto Denko Corporation Method and system for continuously manufacturing liquid-crystal display element
JP2011237423A (en) * 2010-05-10 2011-11-24 Dongwoo Fine-Chem Co Ltd System and method for determining quality of polarization film textile stuff
WO2021172089A1 (en) * 2020-02-28 2021-09-02 日東電工株式会社 Optically transmissive laminate inspection method
JP2021135219A (en) * 2020-02-28 2021-09-13 日東電工株式会社 Inspection method of light permeable laminate
JP7451227B2 (en) 2020-02-28 2024-03-18 日東電工株式会社 Inspection method for optically transparent laminates
CN113960050A (en) * 2021-10-21 2022-01-21 邵东智能制造技术研究院有限公司 Automatic detection equipment for shading film

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