WO2009008041A1 - 絶縁膜材料、多層配線基板及びその製造方法、並びに、半導体装置及びその製造方法 - Google Patents
絶縁膜材料、多層配線基板及びその製造方法、並びに、半導体装置及びその製造方法 Download PDFInfo
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- WO2009008041A1 WO2009008041A1 PCT/JP2007/063586 JP2007063586W WO2009008041A1 WO 2009008041 A1 WO2009008041 A1 WO 2009008041A1 JP 2007063586 W JP2007063586 W JP 2007063586W WO 2009008041 A1 WO2009008041 A1 WO 2009008041A1
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- semiconductor device
- wiring board
- manufacturing
- insulating film
- multilayered wiring
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- C08G77/00—Macromolecular compounds obtained by reactions forming a linkage containing silicon with or without sulfur, nitrogen, oxygen or carbon in the main chain of the macromolecule
- C08G77/60—Macromolecular compounds obtained by reactions forming a linkage containing silicon with or without sulfur, nitrogen, oxygen or carbon in the main chain of the macromolecule in which all the silicon atoms are connected by linkages other than oxygen atoms
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- C08L83/16—Compositions of macromolecular compounds obtained by reactions forming in the main chain of the macromolecule a linkage containing silicon with or without sulfur, nitrogen, oxygen or carbon only; Compositions of derivatives of such polymers in which all the silicon atoms are connected by linkages other than oxygen atoms
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- C09D183/00—Coating compositions based on macromolecular compounds obtained by reactions forming in the main chain of the macromolecule a linkage containing silicon, with or without sulfur, nitrogen, oxygen, or carbon only; Coating compositions based on derivatives of such polymers
- C09D183/16—Coating compositions based on macromolecular compounds obtained by reactions forming in the main chain of the macromolecule a linkage containing silicon, with or without sulfur, nitrogen, oxygen, or carbon only; Coating compositions based on derivatives of such polymers in which all the silicon atoms are connected by linkages other than oxygen atoms
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Abstract
低誘電率で高強度な絶縁膜の形成に好適に使用可能な絶縁膜材料、配線間の寄生容量が低減可能な多層配線基板及びその効率的な製造方法、並びに、高速で信頼性の高い半導体装置及びその効率的な製造方法を提供することを目的とする。
本発明の絶縁膜材料は、下記構造式(1)で表される構造を有するポリカルボシラン化合物を少なくとも含むことを特徴とする。
ただし、前記構造式(1)中、R1は、n回の繰返しの中で、互いに同一であってもよいし異なっていてもよく、炭素数1~4の炭化水素及び芳香族炭化水素のいずれかを表す。R2は、n回の繰返しの中で、互いに同一であってもよいし異なっていてもよく、炭素数1~4の炭化水素及び芳香族炭化水素のいずれかを表す。nは、5~5,000の整数を表す。
Priority Applications (6)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| PCT/JP2007/063586 WO2009008041A1 (ja) | 2007-07-06 | 2007-07-06 | 絶縁膜材料、多層配線基板及びその製造方法、並びに、半導体装置及びその製造方法 |
| KR1020097027275A KR101158185B1 (ko) | 2007-07-06 | 2008-05-15 | 절연막 재료, 다층 배선 기판과 그 제조 방법, 및 반도체 장치와 그 제조 방법 |
| PCT/JP2008/058977 WO2009008212A1 (ja) | 2007-07-06 | 2008-05-15 | 絶縁膜材料、多層配線基板及びその製造方法、並びに、半導体装置及びその製造方法 |
| JP2009522546A JP5267460B2 (ja) | 2007-07-06 | 2008-05-15 | 絶縁膜材料、多層配線基板及びその製造方法、並びに、半導体装置及びその製造方法 |
| CN200880023571.XA CN101689412B (zh) | 2007-07-06 | 2008-05-15 | 绝缘膜材料、多层布线基板及其制造方法和半导体装置及其制造方法 |
| US12/648,804 US8580907B2 (en) | 2007-07-06 | 2009-12-29 | Insulating film material, multilayer wiring board and production method thereof, and semiconductor device and production method thereof |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| PCT/JP2007/063586 WO2009008041A1 (ja) | 2007-07-06 | 2007-07-06 | 絶縁膜材料、多層配線基板及びその製造方法、並びに、半導体装置及びその製造方法 |
Publications (1)
| Publication Number | Publication Date |
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| WO2009008041A1 true WO2009008041A1 (ja) | 2009-01-15 |
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Family Applications (2)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| PCT/JP2007/063586 Ceased WO2009008041A1 (ja) | 2007-07-06 | 2007-07-06 | 絶縁膜材料、多層配線基板及びその製造方法、並びに、半導体装置及びその製造方法 |
| PCT/JP2008/058977 Ceased WO2009008212A1 (ja) | 2007-07-06 | 2008-05-15 | 絶縁膜材料、多層配線基板及びその製造方法、並びに、半導体装置及びその製造方法 |
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| Application Number | Title | Priority Date | Filing Date |
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| PCT/JP2008/058977 Ceased WO2009008212A1 (ja) | 2007-07-06 | 2008-05-15 | 絶縁膜材料、多層配線基板及びその製造方法、並びに、半導体装置及びその製造方法 |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US8580907B2 (ja) |
| KR (1) | KR101158185B1 (ja) |
| CN (1) | CN101689412B (ja) |
| WO (2) | WO2009008041A1 (ja) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2014227516A (ja) * | 2013-05-24 | 2014-12-08 | 富士通株式会社 | ポリカルボシラン系樹脂、回路基板、半導体装置、ポリカルボシラン系樹脂を製造する方法及び回路基板を製造する方法 |
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| WO2010065459A2 (en) * | 2008-12-02 | 2010-06-10 | Arizona Board Of Regents, For And On Behalf Of Arizona State University | Method of etching organosiloxane dielectric material and semiconductor device thereof |
| US9601530B2 (en) | 2008-12-02 | 2017-03-21 | Arizona Board Of Regents, A Body Corporated Of The State Of Arizona, Acting For And On Behalf Of Arizona State University | Dual active layer semiconductor device and method of manufacturing the same |
| US9721825B2 (en) | 2008-12-02 | 2017-08-01 | Arizona Board Of Regents, A Body Corporate Of The State Of Arizona, Acting For And On Behalf Of Arizona State University | Method of providing a flexible semiconductor device and flexible semiconductor device thereof |
| US9991311B2 (en) | 2008-12-02 | 2018-06-05 | Arizona Board Of Regents On Behalf Of Arizona State University | Dual active layer semiconductor device and method of manufacturing the same |
| WO2010065457A2 (en) * | 2008-12-02 | 2010-06-10 | Arizona Board Of Regents, For And On Behalf Of Arizona State University | Method of providing a semiconductor device with a dielectric layer and semiconductor device thereof |
| TW201117262A (en) | 2009-05-29 | 2011-05-16 | Univ Arizona | Method of providing a flexible semiconductor device at high temperatures and flexible semiconductor device thereof |
| WO2012021196A2 (en) | 2010-05-21 | 2012-02-16 | Arizona Board Of Regents, For And On Behalf Of Arizona State University | Method for manufacturing electronic devices and electronic devices thereof |
| WO2012021197A2 (en) | 2010-05-21 | 2012-02-16 | Arizona Board Of Regents, For And On Behalf Of Arizona State University | Method of manufacturing electronic devices on both sides of a carrier substrate and electronic devices thereof |
| CN103178001B (zh) * | 2011-12-21 | 2016-06-01 | 中芯国际集成电路制造(上海)有限公司 | 处理多孔超低介电常数层的方法 |
| US9368439B2 (en) * | 2012-11-05 | 2016-06-14 | Nvidia Corporation | Substrate build up layer to achieve both finer design rule and better package coplanarity |
| US10279959B2 (en) | 2012-12-11 | 2019-05-07 | Versum Materials Us, Llc | Alkoxysilylamine compounds and applications thereof |
| US10381224B2 (en) | 2014-01-23 | 2019-08-13 | Arizona Board Of Regents On Behalf Of Arizona State University | Method of providing an electronic device and electronic device thereof |
| WO2017034645A2 (en) | 2015-06-09 | 2017-03-02 | ARIZONA BOARD OF REGENTS, a body corporate for THE STATE OF ARIZONA for and on behalf of ARIZONA STATE UNIVERSITY | Method of providing an electronic device and electronic device thereof |
| WO2015156891A2 (en) | 2014-01-23 | 2015-10-15 | Arizona Board Of Regents, Acting For And On Behalf Of Arizona State University | Method of providing a flexible semiconductor device and flexible semiconductor device thereof |
| JP2017518638A (ja) | 2014-05-13 | 2017-07-06 | アリゾナ・ボード・オブ・リージェンツ・フォー・アンド・オン・ビハーフ・オブ・アリゾナ・ステイト・ユニバーシティArizona Board Of Regents For And On Behalf Of Arizona State University | 電子デバイスを提供する方法およびその電子デバイス |
| TWI659035B (zh) * | 2014-07-10 | 2019-05-11 | L'air Liquide, Societe Anonyme Pour L'etude Et L'exploitation Des Procedes Georges Claude | 經烷胺基取代之碳矽烷前驅物 |
| US10446582B2 (en) | 2014-12-22 | 2019-10-15 | Arizona Board Of Regents On Behalf Of Arizona State University | Method of providing an imaging system and imaging system thereof |
| US9741742B2 (en) | 2014-12-22 | 2017-08-22 | Arizona Board Of Regents, A Body Corporate Of The State Of Arizona, Acting For And On Behalf Of Arizona State University | Deformable electronic device and methods of providing and using deformable electronic device |
| CN105990315B (zh) * | 2015-01-27 | 2019-01-29 | 中芯国际集成电路制造(上海)有限公司 | 金属互连结构及其制作方法 |
| TWI724141B (zh) | 2016-03-23 | 2021-04-11 | 法商液態空氣喬治斯克勞帝方法硏究開發股份有限公司 | 形成含矽膜之組成物及其製法與用途 |
| KR102069659B1 (ko) * | 2017-08-31 | 2020-01-23 | 해성디에스 주식회사 | 반도체 패키지 기판 제조방법 및 이를 이용하여 제조된 반도체 패키지 기판 |
| TWI833730B (zh) * | 2018-02-21 | 2024-03-01 | 日商東京威力科創股份有限公司 | 多層配線之形成方法及記憶媒體 |
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- 2008-05-15 WO PCT/JP2008/058977 patent/WO2009008212A1/ja not_active Ceased
- 2008-05-15 KR KR1020097027275A patent/KR101158185B1/ko not_active Expired - Fee Related
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Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2005159032A (ja) * | 2003-11-26 | 2005-06-16 | Jsr Corp | 絶縁膜およびその形成方法、絶縁膜形成用組成物ならびに絶縁膜を有する積層体およびその形成方法 |
| WO2005108516A1 (ja) * | 2004-05-11 | 2005-11-17 | Jsr Corporation | 絶縁膜形成用組成物およびその製造方法、ならびにシリカ系絶縁膜およびその形成方法 |
| WO2005108469A1 (ja) * | 2004-05-11 | 2005-11-17 | Jsr Corporation | 有機シリカ系膜の形成方法、有機シリカ系膜、配線構造体、半導体装置、および膜形成用組成物 |
| JP2006117917A (ja) * | 2004-09-22 | 2006-05-11 | Jsr Corp | ポリカルボシランおよびその製造方法 |
| JP2006111741A (ja) * | 2004-10-15 | 2006-04-27 | Jsr Corp | 表面疎水化用組成物、表面疎水化方法、半導体装置およびその製造方法 |
| WO2007055097A1 (ja) * | 2005-11-11 | 2007-05-18 | Jsr Corporation | ポリカルボシランおよびその製造方法、塗布用シリカ系組成物、およびシリカ系膜 |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2014227516A (ja) * | 2013-05-24 | 2014-12-08 | 富士通株式会社 | ポリカルボシラン系樹脂、回路基板、半導体装置、ポリカルボシラン系樹脂を製造する方法及び回路基板を製造する方法 |
Also Published As
| Publication number | Publication date |
|---|---|
| CN101689412A (zh) | 2010-03-31 |
| CN101689412B (zh) | 2015-10-14 |
| WO2009008212A1 (ja) | 2009-01-15 |
| KR101158185B1 (ko) | 2012-06-19 |
| US8580907B2 (en) | 2013-11-12 |
| US20100140807A1 (en) | 2010-06-10 |
| KR20100012092A (ko) | 2010-02-05 |
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